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JP3262245B2 - High voltage semiconductor rectifier - Google Patents
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JP3262245B2 - High voltage semiconductor rectifier - Google Patents

High voltage semiconductor rectifier

Info

Publication number
JP3262245B2
JP3262245B2 JP30691793A JP30691793A JP3262245B2 JP 3262245 B2 JP3262245 B2 JP 3262245B2 JP 30691793 A JP30691793 A JP 30691793A JP 30691793 A JP30691793 A JP 30691793A JP 3262245 B2 JP3262245 B2 JP 3262245B2
Authority
JP
Japan
Prior art keywords
resin
columnar
header
semiconductor rectifier
connection conductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP30691793A
Other languages
Japanese (ja)
Other versions
JPH07142675A (en
Inventor
明雄 野村
克幸 野崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP30691793A priority Critical patent/JP3262245B2/en
Publication of JPH07142675A publication Critical patent/JPH07142675A/en
Application granted granted Critical
Publication of JP3262245B2 publication Critical patent/JP3262245B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/30Die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings

Landscapes

  • Rectifiers (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明は、高圧半導体整流装置
に係わり、特に接合被覆樹脂の塗布方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a high-voltage semiconductor rectifier, and more particularly, to a method for applying a joint coating resin.

【0002】[0002]

【従来の技術】図4に基づいて説明する。図4は従来例
を示す高圧半導体整流装置の断面図である。映像機器の
制御回路等に用いられる高圧半導体整流装置(以下整流
体と称す)は6〜24kVの高い逆耐圧を必要とする
が、1個のPN接合でそのような高耐圧が得られないた
め、複数のPN接合を直列接続することが行われてい
る。すなわち、PN接合を形成した半導体基板を複数枚
はんだを介して重ねて固着し積層体を製作し、ブレード
ソーまたはワイヤソー等で賽の目状に切断して0.7〜
1mm角の柱状積層体を作製する。
2. Description of the Related Art Referring to FIG. FIG. 4 is a sectional view of a conventional high-voltage semiconductor rectifier. High-voltage semiconductor rectifiers (hereinafter referred to as rectifiers) used in control circuits of video equipment require a high reverse withstand voltage of 6 to 24 kV, but such a high withstand voltage cannot be obtained with one PN junction. , A plurality of PN junctions are connected in series. That is, a plurality of semiconductor substrates on which a PN junction has been formed are stacked and fixed via solder, to produce a laminate, and cut into a dice pattern using a blade saw or a wire saw or the like.
A 1 mm square columnar laminate is produced.

【0003】柱状積層体10は図4に示すように、ダイ
オードチップ1をはんだ2を介して複数個積層し固着さ
れたものであり、この柱状積層体10の両端に、接続導
線3の一端に形成されたヘッダー31の平坦面31aが
はんだ4を介して固着されている。この状態のものをエ
ッチング液等で洗浄後、ヘッダー31の両平坦面31a
との間にある柱状積層体10の側面に接合被覆樹脂5を
塗布し、さらにモールド樹脂6により封止し整流体を作
製している。
As shown in FIG. 4, a columnar laminated body 10 is formed by laminating a plurality of diode chips 1 via solder 2 and fixing them. The flat surface 31 a of the formed header 31 is fixed via the solder 4. After washing the ones of the state in the etching solution or the like, both the flat surface 31a of the F Dda 31
The joint coating resin 5 is applied to the side surface of the columnar laminated body 10 between them, and is further sealed with the mold resin 6 to produce a rectifying body.

【0004】[0004]

【発明が解決しようとする課題】前述の方法によれば、
整流体を高温・高圧・多湿(温度120℃、圧力2at
m、湿度100%)圧力窯内に50時間放置したのち、
逆方向の高温漏れ電流を測定して耐湿性を評価する、プ
レッシャークッカーテスト(以下P.C.Tと称す)に
おいて、接続導線とモールド樹脂との間のすき間より柱
状積層体部に水分が進入し、高温漏れ電流が規定値の
1.0μA以下にならないという問題が発生している。
According to the method described above,
High temperature, high pressure and high humidity (temperature 120 ° C, pressure 2at)
m, humidity 100%) After leaving in a pressure kiln for 50 hours,
In a pressure cooker test (hereinafter referred to as PCT) in which the high-temperature leakage current in the opposite direction is measured to evaluate the moisture resistance, moisture enters the columnar laminate through a gap between the connection conductor and the mold resin. However, there is a problem that the high-temperature leakage current does not fall below the specified value of 1.0 μA.

【0005】この発明は前記の問題点に鑑みてなされた
ものであり、接続導線とモールド樹脂との間のすき間よ
り柱状積層体部に水分が進入しない構造とし、高耐湿特
性を有する高圧半導体整流装置を提供することにある。
SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems, and has a structure in which moisture does not enter the columnar laminate from a gap between a connection conductor and a molding resin, and has a high humidity resistance. It is to provide a device.

【0006】[0006]

【課題を解決するための手段】この発明によれば前述の
目的は、 PN接合を形成したダイオードチップをはん
だを介して積層した柱状積層体、該柱状積層体の端面対
角線より径の大きいヘッダーを有する接続導線の該ヘッ
ダーを柱状積層体の両端に固着し、その柱状積層体の周
域に接合被覆樹脂を塗布し、さらにエポキシ樹脂からな
モールド樹脂で封止する高圧半導体整流装置におい
て、前記接合被覆樹脂をポリイミド樹脂とし、該接合被
覆樹脂が柱状積層体からヘッダーを越えて接続導線まで
を被覆すること、または前記ヘッダーの柱状積層体固着
端部と接続導線固着端部との間の縁面距離が少なくとも
1mmであることにより達成できる。
SUMMARY OF THE INVENTION According to the present invention, there is provided a columnar laminate in which diode chips each having a PN junction are laminated via solder, and an end face pair of the columnar laminate .
The connection conductor having a header having a diameter larger than the square
Are fixed to both ends of the columnar laminated body, a joining coating resin is applied to the peripheral area of the columnar laminated body, and furthermore, an epoxy resin is used.
In a high-voltage semiconductor rectifier that is sealed with a molding resin, the bonding coating resin is a polyimide resin.
Resin covering from columnar laminate to connection conductor beyond header
Rukoto be coated or edge surface distance between the columnar laminate secured end and the connecting wire fixing end of the header, it can be achieved by at least 1 mm.

【0007】さらに接続導線は銀めっきをした導体であ
ることが有効である。
[0007] Connection lead to further, it is effective that it is a conductor in which the silver plating.

【0008】[0008]

【作用】この発明の構成によれば、柱状積層体の周域に
接合被覆樹脂を塗布し、さらにモールド樹脂で封止した
整流体において、接合被覆樹脂がポリイミド樹脂からな
り、該接合被覆樹脂が柱状積層体からヘッダーを越えて
接続導線までを被覆することとしたため、接続導線とモ
ールド樹脂との間のすき間より柱状積層体部に水分が進
入しない構造となり、高耐湿特性を有することができ
る。また、ヘッダーの柱状積層体固着端部と接続導線固
着端部との間の縁面距離が少なくとも1mmであること
としたため、接合被覆樹脂がモールド樹脂の端面よりは
み出ることなく、顧客がプリント基板に実装するとき、
接続導線の表面に不純物がないため、はんだ付け性を低
下させることがない。さらにポリイミド樹脂と銀、ある
いはポリイミド樹脂とエポキシ樹脂との密着性の良いこ
とは一般的に知られている。
According to the structure of the present invention, in the rectifier in which the joining coating resin is applied to the peripheral region of the columnar laminate and further sealed with the mold resin, the joining coating resin is made of polyimide resin.
And the bonding coating resin passes over the header from the columnar laminate.
Since was Rukoto be coated up to connecting wires, forming the structural moisture does not enter the columnar laminate portion than the gap between the connecting wire and the molding resin may have a high moisture resistance. In addition, since the edge distance between the columnar laminate fixing end of the header and the connection conductor fixing end is at least 1 mm, the bonding coating resin does not protrude from the end surface of the mold resin, and the customer can print on the printed circuit board. When implementing,
Since there is no impurity on the surface of the connection conductor, the solderability is not reduced. Further, it is generally known that the adhesion between the polyimide resin and silver or between the polyimide resin and the epoxy resin is good.

【0009】この発明では、接合被覆樹脂はポリイミド
樹脂であり、接続導線は導体に銀めっきをしたものであ
ること、さらにはモールド樹脂はエポキシ樹脂であるこ
ととしたため、ポリイミド樹脂と銀、あるいはポリイミ
ド樹脂とエポキシ樹脂との密着性がよくなり、整流体内
に水分などが進入するのを防止できる。
In the present invention, the joining and coating resin is a polyimide resin, the connecting conductor is a silver-plated conductor, and the molding resin is an epoxy resin. Adhesion between the resin and the epoxy resin is improved, and it is possible to prevent moisture and the like from entering the rectifier.

【0010】[0010]

【実施例】図1、図2および図3に基づいて説明をす
る。図1はこの実施例を示す整流体断面図、図2は接合
被覆樹脂を接続導線の各位置に被覆した場合の高温漏れ
電流の変化を示す説明図、図3はヘッダーの縁面距離と
高温漏れ電流の変化を示す説明図である。なお従来例と
同一の機能要素を有するものは、同一符号を付してあ
る。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An explanation will be given based on FIGS. 1, 2 and 3. FIG. FIG. 1 is a sectional view of a rectifier body showing this embodiment, FIG. 2 is an explanatory view showing a change in high-temperature leakage current when a joint coating resin is coated on each position of a connection conductor, and FIG. FIG. 9 is an explanatory diagram showing a change in leakage current. Elements having the same functional elements as in the conventional example are denoted by the same reference numerals.

【0011】PN接合を形成したダイオードチップ1の
厚さは280μmであり、はんだ2の厚さは45μmで
ある。また賽の目状に切断した柱状積層体の寸法は0.
7〜1mm角である。接合被覆樹脂を被覆する前までの
製造方法は、従来例と同じである。 〔実施例1〕 接合被覆樹脂5にポリイミド樹脂を用い、図1に示すよ
うにポリイミド樹脂をそれぞれ、A点、B点、C点、D
点およびE点まで被覆した整流体をそれぞれ複数個製作
し、P.C.T50時間後のそれぞれの高温漏れ電流を
測定した。A点迄のものは従来例のものと同一である。
B点はヘッダー31の平坦面31aの巾約半分まで接合
被覆樹脂5を被覆してある。C点ではヘッダー31の表
面全体と接続導体3の極一部まで接合被覆樹脂5を被覆
してある。D点ではモールド樹脂の端面6aまで表面全
体に接合被覆樹脂5を被覆してあり、このことは接合被
覆樹脂5の先端5aが端面6aの内側にあることを示し
ている。E点では接合被覆樹脂が完全に端面6aより突
出している。その結果を図2に示してある。これによる
とC点〜E点までポリイミド樹脂を被覆したものは、高
温漏れ電流が規定値の1.0μA以下になっていること
が判る。しかしE点までのものは顧客側で、プリント基
板実装・はんだ付け後接触不良を発生する恐れがあるた
め、ここではポリイミド樹脂被覆部がC点とD点の間に
あるものを良品とすることとした。
The thickness of the diode chip 1 in which the PN junction is formed is 280 μm, and the thickness of the solder 2 is 45 μm. The dimensions of the columnar laminate cut in a dice pattern are 0.1 mm.
It is 7 to 1 mm square. The manufacturing method before coating with the bonding coating resin is the same as the conventional example. [Example 1] A polyimide resin was used as the bonding coating resin 5, and as shown in FIG.
A plurality of rectifiers each covering up to point E and point E were manufactured. C. Each high temperature leakage current after T50 hours was measured. Those up to the point A are the same as those of the conventional example.
Point B is covered with the joining coating resin 5 to about half the width of the flat surface 31a of the header 31. At point C, the entire surface of the header 31 and a very small portion of the connection conductor 3 are covered with the joining coating resin 5. At point D, the entire surface is covered with the joining coating resin 5 up to the end surface 6a of the mold resin, which indicates that the tip 5a of the joining coating resin 5 is inside the end surface 6a. At the point E, the joining coating resin completely protrudes from the end face 6a. The result is shown in FIG. According to this, it can be seen that those coated with polyimide resin from point C to point E have a high-temperature leakage current of 1.0 μA or less, which is the specified value. However, the ones up to point E may cause poor contact after printed circuit board mounting and soldering on the customer side, so here, the one with polyimide resin coating between point C and point D should be a good product. And

【0012】なお図2に示す巾20は複数個の整流体の
高温漏れ電流を測定した結果のバラツキを示している。 〔実施例2〕 図1に示すように径大なヘッダー31の柱状積層体固着
端部31bと接続導線固着端部3aとの間の縁面距離が
1mmの接続導線3を用い、接合被覆樹脂5にポリイミ
ド樹脂を用いて、縁面距離を接合被覆樹脂5の塗布距離
に置き換えて、塗布距離0mm(従来例と同じもの)、
0.5mm、1mm(接続導線固着端部3aまで被覆し
たもの)、1.5mm、2mmの5点まで接合被覆樹脂
5を被覆した整流体をそれぞれ複数個製作し、P.C.
T50時間後のそれぞれの高温漏れ電流を測定した。そ
の結果を図3に示してある。これによると1mm(接続
導線固着端部3aまで被覆したもの)〜2mmまでポリ
イミド樹脂を被覆したものは、高温漏れ電流が規定値の
1.0μA以下になっていることが判る。
The width 20 shown in FIG. 2 shows the variation in the result of measuring the high-temperature leakage current of a plurality of rectifiers. Example 2 As shown in FIG. 1, using a connection conductor 3 having an edge surface distance of 1 mm between a columnar laminate fixing end 31 b of a large-diameter header 31 and a connection conductor fixing end 3 a, 5 using a polyimide resin, replacing the edge surface distance with the application distance of the bonding coating resin 5, and applying an application distance of 0 mm (the same as the conventional example);
A plurality of rectifiers each coated with the joint coating resin 5 at five points of 0.5 mm, 1 mm (covered to the fixed end portion 3a of the connection lead wire), 1.5 mm, and 2 mm were manufactured. C.
Each high temperature leakage current after T50 hours was measured. The result is shown in FIG. According to this, it is understood that the high-temperature leakage current of the polyimide resin coated from 1 mm (the portion covered with the connecting wire fixed end 3a) to 2 mm is not more than the specified value of 1.0 μA.

【0013】被覆の方法より見ると接続導線固着端部3
aまで被覆する方が、縁面距離を長くするために接続導
線3の一部外周まで被覆するより容易である。従って径
大なヘッダー31の柱状積層体固着端部31bと接続導
線固着端部3aとの間の縁面距離が1mmの接続導線3
を用い、接続導線固着端部3aまで被覆する方が良好で
あると判断できる。
From the viewpoint of the coating method, the connection conductor fixing end 3
Covering up to a is easier than covering up a part of the outer periphery of the connection conductor 3 in order to lengthen the edge surface distance. Therefore, the connecting wire 3 having an edge surface distance of 1 mm between the columnar laminate fixing end 31b of the large header 31 and the connecting wire fixing end 3a.
It can be determined that it is better to cover the connection conductor fixed end 3a by using.

【0014】[0014]

【発明の効果】この発明によれば、接合被覆樹脂はポリ
イミド樹脂であり、該接合被覆樹脂が柱状積層体からヘ
ッダーを越えて接続導線までを被覆することとしたた
め、整流体内に水分などが進入するのを防止でき、実施
例に記述したように高温漏れ電流が規定値の1.0μA
以下になり、耐湿性の高い整流体を得ることができる。
According to the present invention, the bonding coating resin is a polyimide resin, and the bonding coating resin is moved from the columnar laminate to the resin.
Since was Rukoto be coated until connecting wire beyond Dda, prevents moisture rectifying body that enters, 1.0 .mu.A of leakage current at high temperature is a specified value as described in Example
As described below, a rectifier having high moisture resistance can be obtained.

【図面の簡単な説明】[Brief description of the drawings]

【図1】この実施例を示す整流体の断面図FIG. 1 is a sectional view of a rectifier showing this embodiment.

【図2】この実施例の接合被覆樹脂を接続導線の各位置
に被覆した場合の高温漏れ電流の変化を示す説明図
FIG. 2 is an explanatory diagram showing a change in a high-temperature leakage current when the bonding coating resin of this embodiment is coated on each position of a connection conductor.

【図3】他の実施例のヘッダーの縁面距離と高温漏れ電
流の変化を示す説明図
FIG. 3 is an explanatory diagram showing changes in edge distance and high-temperature leakage current of a header according to another embodiment.

【図4】従来例を示す整流体の断面図FIG. 4 is a sectional view of a rectifier showing a conventional example.

【符号の説明】[Explanation of symbols]

1 ダイオードチップ 2 はんだ 3 接続導線 3a 接続導線固着端部 4 はんだ 5 接合被覆樹脂 5a 接合被覆樹脂先端 6 モールド樹脂 6a モールド樹脂端面 10 柱状積層体 20 巾 31 ヘッダー 31a 平坦面 31b 柱状積層体固着端部 DESCRIPTION OF SYMBOLS 1 Diode chip 2 Solder 3 Connection lead 3a Connection lead fixed end 4 Solder 5 Join coating resin 5a Bond coating resin tip 6 Mold resin 6a Mold resin end face 10 Column laminated body 20 Width 31 Header 31a Flat surface 31b Column laminated body fixed end

フロントページの続き (56)参考文献 特開 昭58−48955(JP,A) 特開 昭51−12777(JP,A)Continuation of the front page (56) References JP-A-58-48955 (JP, A) JP-A-51-12777 (JP, A)

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】PN接合を形成したダイオードチップをは
んだを介して積層した柱状積層体、該柱状積層体の端面
対角線より径の大きいヘッダーを有する接続導線の該ヘ
ッダーを柱状積層体の両端に固着し、その柱状積層体の
周域に接合被覆樹脂を塗布し、さらにエポキシ樹脂から
なるモールド樹脂で封止する高圧半導体整流装置におい
て、前記接合被覆樹脂をポリイミド樹脂とし、該接合被
覆樹脂が柱状積層体からヘッダーを越えて接続導線まで
を被覆することを特徴とする高圧半導体整流装置。
1. A columnar laminated body in which diode chips having a PN junction formed are laminated via solder, and an end face of the columnar laminated body .
To a connecting conductor having a header larger in diameter than the diagonal
Fixing a Dda across the columnar laminate, the bond coat resin is applied to the peripheral region of the columnar laminate, the more epoxy resin
In a high-voltage semiconductor rectifier, which is sealed with a molding resin, the bonding resin is a polyimide resin,
Resin covering from columnar laminate to connection conductor beyond header
High semiconductor rectifier device which is characterized that you coated.
【請求項2】請求項1記載の整流装置において、前記ヘ
ッダーの柱状積層体固着端部と接続導線固着端部との間
の縁面距離が少なくとも1mmであることを特徴とする
高圧半導体整流装置。
2. A high-voltage semiconductor rectifier according to claim 1, wherein an edge surface distance between the fixed end of the columnar laminate and the fixed end of the connection conductor of the header is at least 1 mm. .
【請求項3】請求項1または2記載の整流装置におい
て、前記接続導線は銀めっきをした導体であることを特
徴とする高圧半導体整流装置。
3. The high-voltage semiconductor rectifier according to claim 1, wherein the connection conductor is a silver-plated conductor.
JP30691793A 1993-09-20 1993-12-08 High voltage semiconductor rectifier Expired - Fee Related JP3262245B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30691793A JP3262245B2 (en) 1993-09-20 1993-12-08 High voltage semiconductor rectifier

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP23211193 1993-09-20
JP5-232111 1993-09-20
JP30691793A JP3262245B2 (en) 1993-09-20 1993-12-08 High voltage semiconductor rectifier

Publications (2)

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