JP3266431B2 - Simple analysis method for alkali metals in high dielectric materials - Google Patents
Simple analysis method for alkali metals in high dielectric materialsInfo
- Publication number
- JP3266431B2 JP3266431B2 JP30782394A JP30782394A JP3266431B2 JP 3266431 B2 JP3266431 B2 JP 3266431B2 JP 30782394 A JP30782394 A JP 30782394A JP 30782394 A JP30782394 A JP 30782394A JP 3266431 B2 JP3266431 B2 JP 3266431B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- analysis
- alkali metals
- calibration curve
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004458 analytical method Methods 0.000 title claims description 25
- 229910052783 alkali metal Inorganic materials 0.000 title claims description 19
- 150000001340 alkali metals Chemical class 0.000 title claims description 19
- 239000003989 dielectric material Substances 0.000 title claims description 11
- 238000000034 method Methods 0.000 claims description 22
- 238000011088 calibration curve Methods 0.000 claims description 20
- 238000010521 absorption reaction Methods 0.000 claims description 18
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 claims description 16
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 claims description 16
- 238000010438 heat treatment Methods 0.000 claims description 9
- 238000004445 quantitative analysis Methods 0.000 claims description 6
- 229910002367 SrTiO Inorganic materials 0.000 claims description 4
- 150000001875 compounds Chemical class 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 21
- 239000003153 chemical reaction reagent Substances 0.000 description 16
- 239000011159 matrix material Substances 0.000 description 13
- 238000010790 dilution Methods 0.000 description 12
- 239000012895 dilution Substances 0.000 description 12
- 239000000243 solution Substances 0.000 description 12
- 238000011109 contamination Methods 0.000 description 8
- 239000012086 standard solution Substances 0.000 description 7
- 239000007789 gas Substances 0.000 description 6
- 239000012085 test solution Substances 0.000 description 6
- 229910021642 ultra pure water Inorganic materials 0.000 description 6
- 239000012498 ultrapure water Substances 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 239000004809 Teflon Substances 0.000 description 3
- 229920006362 Teflon® Polymers 0.000 description 3
- 239000002253 acid Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 229910052700 potassium Inorganic materials 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 229910052708 sodium Inorganic materials 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 238000002835 absorbance Methods 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 238000004821 distillation Methods 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000011002 quantification Methods 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 238000000889 atomisation Methods 0.000 description 1
- 238000003705 background correction Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- PSHMSSXLYVAENJ-UHFFFAOYSA-N dilithium;[oxido(oxoboranyloxy)boranyl]oxy-oxoboranyloxyborinate Chemical compound [Li+].[Li+].O=BOB([O-])OB([O-])OB=O PSHMSSXLYVAENJ-UHFFFAOYSA-N 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 239000003112 inhibitor Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は高誘電体材料中のアルカ
リ金属の分析方法に関し、詳しくはDRAMのキャパシ
タ絶縁膜等の用途に用いられる極微量のアルカリ金属を
含む高誘電体材料に応用することができるアルカリ金属
の分析方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for analyzing an alkali metal in a high dielectric material, and more particularly, to a method for analyzing a high dielectric material containing a trace amount of an alkali metal used for a capacitor insulating film of a DRAM. To an alkali metal analysis method.
【0002】[0002]
【従来の技術とその解決しようとする課題】近年、DR
AMのキャパシタ・セルの誘電体にSiO2 に替わる誘
電率の高い誘電体材料の一つとして、Ba、Sr等から
成るチタン酸塩が注目されている。この種の誘電体材料
においては、Na、K等のアルカリ金属は絶縁抵抗を低
下させること、半導体製造プロセスで製品の歩留りを低
下させる要因となる等の理由で極力低減させることが望
まれている。従って、評価方法として具体的には、原料
の段階においてサブppmオーダーのアルカリ金属を分
析できる定量法が必要とされている。2. Description of the Related Art In recent years, DR
As one of the dielectric materials having a high dielectric constant instead of SiO 2 for the dielectric of the AM capacitor cell, titanates made of Ba, Sr and the like have been attracting attention. In this type of dielectric material, it is desired that alkali metals such as Na and K reduce the insulation resistance as much as possible, for example, because they reduce the yield of products in a semiconductor manufacturing process. . Therefore, as an evaluation method, specifically, a quantitative method capable of analyzing a sub-ppm order alkali metal at a raw material stage is required.
【0003】従来、この種の分析方法としては殆ど開発
されておらず、但し誘電体材料でも温度センサーや定温
発熱体用途を対象とした分析法としては、フレーム原子
吸光分析、ICP−発光分析等が挙げられるが、これら
の方法は、試料前処理に四ホウ酸リチウムで溶融し、そ
の溶融物を塩酸で加熱溶解し測定しているために操作が
煩雑で定量下限値が高く、この種のアルカリ金属の分析
への適用は不可能である。このように、高誘電体材料中
のアルカリ金属の分析については、必要とされているサ
ブppmオーダーのアルカリ金属の分析を行う適当な方
法が開発されていないというのが現状であった。Hitherto, this type of analysis method has hardly been developed. However, as an analysis method for a dielectric material for a temperature sensor or a constant-temperature heating element, flame atomic absorption analysis, ICP-emission analysis, etc. However, these methods are melted with lithium tetraborate for sample pretreatment, and the melt is heated and dissolved with hydrochloric acid for measurement. Application to the analysis of alkali metals is not possible. As described above, at present, it has not been developed an appropriate method for analyzing a required sub-ppm order alkali metal in a high dielectric material.
【0004】[0004]
【課題を解決するための手段】本発明者らは、このよう
な現状において、バックグラウンド補正が十分可能でア
ルカリ金属の分析に高感度のフレームレス原子吸光装置
を用い、短時間でサブppmオーダーのアルカリ金属の
分析を行う方法について検討を行い、高純度の試薬が入
手しやすい塩酸および過酸化水素を試料分解剤に使用し
て、試料を完全に溶液化し、マトリックスを分離するこ
となく、標準添加検量線法による簡便な分析法を見いだ
し、本発明に到達したものである。Under such circumstances, the present inventors have used a flameless atomic absorption spectrometer which can sufficiently perform background correction and which is highly sensitive to the analysis of alkali metals, in the sub-ppm order in a short time. Investigating a method to analyze the alkali metals in the sample, using hydrochloric acid and hydrogen peroxide, for which high-purity reagents are easily available, as sample decomposers, completely dissolving the sample, and separating the standard without separating the matrix. The present inventors have found a simple analysis method using an addition calibration curve method and have reached the present invention.
【0005】すなわち、本発明は、BaTiO3 、Sr
TiO3 、(Ba,Sr)TiO3の一群から選ばれる
少なくとも一種類の化合物に、塩酸および過酸化水素を
添加し加熱溶解した後、この希釈溶液を標準添加検量線
法による平行磁場型交流ゼーマンフレームレス原子吸光
法により定量分析することを特徴とする高誘電体材料中
のアルカリ金属の簡易分析方法である。[0005] That is, the present invention relates to BaTiO 3 , Sr
Hydrochloric acid and hydrogen peroxide are added to at least one compound selected from the group consisting of TiO 3 and (Ba, Sr) TiO 3 and dissolved by heating. The diluted solution is subjected to a parallel magnetic field type AC Zeeman by a standard addition calibration method. This is a simple method for analyzing alkali metals in a high dielectric material, characterized by performing a quantitative analysis by a flameless atomic absorption method.
【0006】本発明において、ppmオーダーを越える
濃度の高いアルカリ金属の分析については、より簡単に
実施することができるのは言うまでもないので、本発明
においては、サブppmオーダーのアルカリ金属の分析
について記述する。In the present invention, it is needless to say that the analysis of alkali metals having a high concentration exceeding the order of ppm can be carried out more easily. Therefore, in the present invention, the analysis of alkali metals in the sub-ppm order will be described. I do.
【0007】すなわち、本発明を実施するためには、環
境からの汚染、分析容器からの汚染、試薬からの汚染を
十分考慮にいれ、これらを極力防ぐ必要がある。平行磁
場型交流ゼーマンフレームレス原子吸光装置自体の能力
は絶対検出下限で表すと、Na:0.3pg、K:0.
5pgであり、本法のように25μl採取溶液を測定す
る場合の相対検出下限は、Na:0.012ppb、
K:0.02ppbである。そこで、サンプルの分析時
には測定の段階で汚染混入量を数10pptオーダーま
で抑制する必要がある。That is, in order to carry out the present invention, it is necessary to sufficiently consider contamination from the environment, contamination from the analysis container, and contamination from the reagent, and to minimize these. The capability of the parallel magnetic field type AC Zeeman flameless atomic absorption spectrometer itself is expressed as the lower limit of absolute detection, Na: 0.3 pg, K: 0.
5 pg, and the lower limit of relative detection when measuring a 25 μl collection solution as in this method is Na: 0.012 ppb,
K: 0.02 ppb. Therefore, when analyzing the sample, it is necessary to suppress the contamination amount to several tens of ppt on the measurement stage.
【0008】まず、環境からの汚染を抑制するために
は、試料の前処理をクリーンルーム内のクリーンベンチ
を用いて行ない、平行磁場型交流ゼーマンフレームレス
原子吸光装置もクリーンルーム内に設置して使用する必
要がある。First, in order to suppress contamination from the environment, sample pretreatment is performed using a clean bench in a clean room, and a parallel magnetic field type AC Zeeman flameless atomic absorption apparatus is also installed and used in the clean room. There is a need.
【0009】次に試薬からの汚染については、精密分析
用試薬として非沸騰方式による蒸留法で精製した試薬を
使用するのが良く、塩酸および過酸化水素は、本法によ
る市販品を使用することで測定の段階で各アルカリ金属
の量をサブpptオーダーまで低下できる。Regarding contamination from the reagent, it is preferable to use a reagent purified by a non-boiling distillation method as a reagent for precision analysis, and use a commercially available hydrochloric acid and hydrogen peroxide according to this method. In the measurement stage, the amount of each alkali metal can be reduced to the order of sub-ppt.
【0010】容器からの混入については、酸による熱処
理後、酸洗浄および超純水洗浄を長時間、または繰り返
し行うことにより、分析に影響しない程度まで各アルカ
リ金属の量を除去することができる。このように、様々
な汚染源を極力抑制することにより、試薬ブランク値を
低下させることができるためにサブppmオーダーのア
ルカリ金属の分析が十分行えるものである。With respect to contamination from a container, after the heat treatment with an acid, acid washing and ultrapure water washing are performed for a long time or repeatedly, so that the amount of each alkali metal can be removed to the extent that it does not affect the analysis. As described above, by suppressing various contamination sources as much as possible, the reagent blank value can be reduced, so that the analysis of sub-ppm-order alkali metals can be sufficiently performed.
【0011】本発明に係る分析方法は、試料の溶液化、
マトリックスの妨害を回避するための測定に供する試料
量、標準添加検量線法による平行磁場型交流ゼーマンフ
レームレス原子吸光測定の各項目に分けられるが、その
項目に従って詳細に説明する。The analysis method according to the present invention comprises the steps of:
The amount of the sample to be used for the measurement to avoid the interference of the matrix and the items of the parallel magnetic field type AC Zeeman flameless atomic absorption measurement by the standard addition calibration method are described in detail according to the items.
【0012】まず試料の溶液化であるが、Na、K等の
アルカリ金属の含有量がサブppmオーダーの場合、試
料の採取量については、試料の溶解度、平行磁場型交流
ゼーマンフレームレス原子吸光装置の測定感度、測定時
のマトリックスの妨害などを考慮すると約0.5g程度
を100mlの溶媒に溶解することが望ましい。含有量
が多い場合には当然試料の採取量は少なくしてもよい。First, the solution of the sample is dissolved. When the content of alkali metals such as Na and K is on the order of sub-ppm, the amount of the sample to be collected is determined by the solubility of the sample, the parallel magnetic field type AC Zeeman flameless atomic absorption spectrometer. Considering the measurement sensitivity, interference of the matrix during measurement, etc., it is desirable to dissolve about 0.5 g in 100 ml of solvent. When the content is large, the amount of the collected sample may be small.
【0013】試料が0.5gの場合、これをまず小数点
以下3桁までPFA製容器(内容積150ml)に正し
く秤りとり、20%wt塩酸30mlを加えてテフロン
製ヒーター上で加熱する。このときの加熱温度は120
〜140℃、また加熱時間は約40分がよい。加熱の過
程で一端ヘキサクロロチタン酸の黄色を呈するが、この
時点で直ちに温水を加えると容易に解ける。次に、これ
を放冷し、30%wt過酸化水素0.25mlを加えて
更に約10分間加熱する。上記の試料溶解操作におい
て、試料を完全に溶解させ、長時間溶液化を保つために
は加水分解抑制剤として過酸化水素を添加して、試料中
のチタン成分をペルオキソ錯イオンとしておく必要があ
る。これを怠ると時間の経過に伴って沈澱が生成してく
る恐れがある。次に、この溶液を超純水を用いて100
mlに定容とし、これを分析の供試液とする。When the sample is 0.5 g, it is first correctly weighed to three decimal places in a PFA container (internal volume: 150 ml), added with 30 ml of 20% wt hydrochloric acid, and heated on a Teflon heater. The heating temperature at this time is 120
~ 140 ° C, and the heating time is preferably about 40 minutes. During the heating process, hexachlorotitanic acid once shows a yellow color, but at this point it can be easily melted by adding warm water immediately. Next, this is allowed to cool, 0.25 ml of 30% wt hydrogen peroxide is added, and the mixture is further heated for about 10 minutes. In the above sample dissolving operation, in order to completely dissolve the sample and maintain the solution for a long period of time, it is necessary to add hydrogen peroxide as a hydrolysis inhibitor and to make the titanium component in the sample a peroxo complex ion. . Failure to do so may result in the formation of a precipitate over time. Next, this solution was treated with ultrapure water for 100 hours.
Make up to a constant volume in ml, and use this as the test solution for analysis.
【0014】次に、この供試液より、5μlを用いて水
で全容25μlとし、すなわち試料の1000倍希釈溶
液を、平行磁場型交流ゼーマンフレームレス原子吸光装
置で標準添加法により測定することによって、サブpp
mオーダーのNa、Kを精度良く定量分析ができる。こ
こで測定時における試料の希釈倍率と測定結果について
述べると、100000倍を越えた希釈溶液を測定した
場合、試料{(Ba,Sr)TiO3 のKを除く}の標
準添加検量線勾配は、標準溶液の検量線勾配にほぼ近づ
き、マトリックスの妨害は殆ど無くなる。しかし、これ
らの希釈倍率での測定はサブppmオーダーの分析には
測定感度不足で不可能である。また、逆に希釈倍率を低
くしていくと、すなわちマトリックス量を増やしていく
と化学干渉が認められ、負の妨害が出てきて標準添加法
の検量線勾配は低下の傾向にあり、更にバックグラウン
ドの干渉も完全に補正できず、このために標準添加法に
よる検量線は、正しく作成出来ず分析定量には使用不可
能である。次に、試料と全く同様な操作を経た試薬ブラ
ンクの希釈倍率と測定結果については、100倍以上の
希釈した溶液を測定した場合、標準添加検量線勾配は、
標準溶液の検量線勾配とほぼ一致しマトリックスの妨害
は無い。Next, from this test solution, 5 μl was used to make a total volume of 25 μl with water, that is, a 1000-fold diluted solution of the sample was measured by a standard addition method using a parallel magnetic field type AC Zeeman flameless atomic absorption apparatus. Sub pp
Quantitative analysis of m-order Na and K with high accuracy is possible. Here, the dilution ratio of the sample and the measurement result at the time of measurement are described. When a diluted solution exceeding 100,000 times is measured, the standard addition calibration curve gradient of the sample {excluding K of (Ba, Sr) TiO 3 } is as follows. The calibration curve gradient of the standard solution is almost approached, and the interference of the matrix is almost eliminated. However, measurement at these dilution rates is not possible for analysis on the order of sub-ppm due to insufficient measurement sensitivity. Conversely, when the dilution ratio is lowered, that is, when the amount of matrix is increased, chemical interference is recognized, negative interference appears, and the calibration curve gradient of the standard addition method tends to decrease. The ground interference cannot be completely corrected, and therefore the calibration curve by the standard addition method cannot be correctly created and cannot be used for analytical quantification. Next, regarding the dilution ratio and the measurement result of the reagent blank that has undergone exactly the same operation as the sample, when a solution diluted 100 times or more is measured, the standard addition calibration curve gradient is:
Almost identical with the calibration curve gradient of the standard solution, and there is no matrix interference.
【0015】図1〜図6はマトリックス量(希釈倍率:
500〜100000倍)の変化における標準添加法に
よる検量線の勾配・精度を示したものである(図1〜図
6中の試薬ブランクの希釈倍率は1000倍である)。1 to 6 show the matrix amount (dilution ratio:
5 shows the gradient and accuracy of the calibration curve by the standard addition method at a change of 500 to 100,000 times (the dilution ratio of the reagent blank in FIGS. 1 to 6 is 1000 times).
【0016】以上の結果より本法では、標準溶液の測定
時の感度は低下(標準溶液のいずれもNa:1/5、
K:1/10、相対検出下限はNa:0.06ppb、
K:0.2ppb)しているが、バックグラウンドの干
渉が完全に補正できており、検量線の相関係数も良く標
準溶液のそれに近い理由から、測定時には1000倍希
釈溶液を使用することにした。すなわち、1000倍希
釈の試薬ブランク及び試料の標準添加検量線よりサブp
pmオーダーの定量分析が可能である。From the above results, in the present method, the sensitivity at the time of the measurement of the standard solution was lowered (Na: 1/5,
K: 1/10, relative detection lower limit: Na: 0.06 ppb,
K: 0.2 ppb), but the background interference was completely corrected, and the correlation coefficient of the calibration curve was good and close to that of the standard solution. did. That is, from the standard blank calibration curve of the reagent blank and sample diluted 1000-fold,
Quantitative analysis on the order of pm is possible.
【0017】[0017]
【実施例】以下、実施例により本発明を具体的に説明す
るが、本発明は係る実施例に限定されるものではない。EXAMPLES The present invention will be described below in detail with reference to examples, but the present invention is not limited to these examples.
【0018】実施例1 1.金属標準溶液:原子吸光用標準試薬を超純水で希釈
して用いる。 2.塩酸、過酸化水素:非沸騰方式による蒸留法で精製
した試薬を用いる。 3.本発明の実施例においては比抵抗値が18MΩ/c
m(25℃)以上の超純水を全て使用。 4.試料分解容器:標線付きPFA製全容150mlを
使用。 5.加熱器:テフロンで被覆したものを使用。 6.フレームレス原子吸光装置:クラス1000以下の
クリーンルームに設置したパーキンエルマー製平行磁場
型交流ゼーマンフレームレス原子吸光装置4100型。 7.クリーンベンチ:クラス100以下の設備を使用。Embodiment 1 1. Metal standard solution: A standard reagent for atomic absorption is diluted with ultrapure water and used. 2. Hydrochloric acid, hydrogen peroxide: a reagent purified by a non-boiling distillation method is used. 3. In the embodiment of the present invention, the specific resistance value is 18 MΩ / c.
m (25 ° C) or higher. 4. Sample decomposition container: A PFA-made total volume 150 ml with a marked line is used. 5. Heater: Use one coated with Teflon. 6. Flameless atomic absorption spectrometer: Perkin-Elmer parallel magnetic alternating current Zeeman flameless atomic absorption spectrometer 4100, which is installed in a clean room of class 1000 or less. 7. Clean bench: Use equipment of class 100 or less.
【0019】(操作)試料のSrTiO3 約0.5gを
小数点以下3桁までPFA製容器(内容積150ml)
に正しく秤りとり、20%wt塩酸30mlを加えてテ
フロン製ヒーター上で加熱温度120〜140℃で加熱
する。途中、黄色を呈した時点で直ちに温水約20ml
を加え、引き続き約40分間加熱を続ける。放冷後、3
0%wt過酸化水素0.25mlを加えて更に約10分
間加熱する。放冷後、超純水を加えて全容100mlと
し、供試液とする。(Operation) Approximately 0.5 g of SrTiO 3 of the sample was placed in a PFA container (internal volume 150 ml) to three decimal places.
Then, 30 ml of 20% wt hydrochloric acid is added thereto, and the mixture is heated at a heating temperature of 120 to 140 ° C. on a Teflon heater. Approximately 20 ml of warm water immediately when it turns yellow
And continue heating for about 40 minutes. After cooling, 3
Add 0.25 ml of 0% wt hydrogen peroxide and heat for about another 10 minutes. After standing to cool, ultrapure water is added to make a total volume of 100 ml, which is used as a test solution.
【0020】次に、フレームレス原子吸光装置のオート
サンプラー用各セルに供試液、5ppb標準溶液、超純
水をそれぞれ採り、オートサンプラーにセットする。こ
れらの溶液から、まず供試液5μl、超純水20μlを
チューブに自動注入し、全容25μlについて表1に示
した予め定めた測定条件でフレームレス原子吸光法にて
試料のみの吸光度を測定する。Next, a test solution, a 5 ppb standard solution, and ultrapure water are taken in each cell for the autosampler of the flameless atomic absorption spectrometer, and set in the autosampler. From these solutions, 5 μl of the test solution and 20 μl of ultrapure water are first automatically injected into a tube, and the absorbance of only the sample is measured by a flameless atomic absorption method under a predetermined measurement condition shown in Table 1 for a total volume of 25 μl.
【0021】すなわち、Naの測定条件では、乾燥1で
室温から120℃まで1秒間で昇温し、その後30秒間
120℃を保持する。この時のArガス流量は250m
l/minとする。乾燥2では、120℃から140℃
まで10秒間で昇温した後、40秒間140℃を保持
し、この時のArガス流量は250ml/minとす
る。灰化1では、140℃から400℃まで1秒間で昇
温した後、10秒間400℃を保持し、この時のArガ
ス流量は250ml/minとする。灰化2では、40
0℃から700℃まで10秒間で昇温した後、30秒間
700℃を保持し、この時のArガス流量は250ml
/minとする。原子化では、1700℃で4秒間保持
し、この時Arガスは流さない。クリーニングでは、1
700℃から2400℃まで1秒間で昇温した後、2秒
間2400℃を保持し、この時のArガス流量は250
ml/minとする。また、Kについても同じく表1に
測定条件を示した。That is, under the measurement conditions of Na, the temperature is raised from room temperature to 120 ° C. in 1 second in drying 1 and then kept at 120 ° C. for 30 seconds. The Ar gas flow rate at this time is 250 m
1 / min. In drying 2, 120 ° C to 140 ° C
After the temperature was raised for 10 seconds, the temperature was maintained at 140 ° C. for 40 seconds, and the Ar gas flow rate at this time was 250 ml / min. In incineration 1, after the temperature was raised from 140 ° C. to 400 ° C. for 1 second, the temperature was maintained at 400 ° C. for 10 seconds, and the Ar gas flow rate at this time was 250 ml / min. In incineration 2, 40
After the temperature was raised from 0 ° C. to 700 ° C. for 10 seconds, the temperature was maintained at 700 ° C. for 30 seconds, and the Ar gas flow rate at this time was 250 ml.
/ Min. In the atomization, the temperature is maintained at 1700 ° C. for 4 seconds, and no Ar gas is supplied at this time. For cleaning, 1
After the temperature was raised from 700 ° C. to 2400 ° C. for 1 second, the temperature was maintained at 2400 ° C. for 2 seconds, and the Ar gas flow rate at this time was 250 ° C.
ml / min. Table 1 also shows measurement conditions for K.
【0022】次に、同様な方法で供試液5μlに5pp
b標準溶液を段階的に加えていき、1ppb標準添加溶
液、2ppb標準添加溶液、3ppb標準添加溶液につ
いてそれぞれの吸光度を測定し、標準添加検量線を作成
する。次に、試料と全く同様な操作を経た試薬ブランク
について、標準添加検量線を作成する。これらの検量線
より試料及び試薬ブランクの各金属量を求め、下記の
(I)式より試料中各金属の含有量(X)を算出する。Next, 5 pp was added to 5 μl of the test solution in the same manner.
b. The standard solution is added stepwise, and the absorbance of each of the 1 ppb standard addition solution, the 2 ppb standard addition solution, and the 3 ppb standard addition solution is measured, and a standard addition calibration curve is prepared. Next, a standard addition calibration curve is created for a reagent blank that has undergone exactly the same operation as the sample. The amount of each metal in the sample and the reagent blank is determined from these calibration curves, and the content (X) of each metal in the sample is calculated from the following formula (I).
【0023】(I)式: X(ppb)={試料中各金属の量(ng/ml)−試
薬ブランク中各金属の量(ng/ml)}×100×5
/試料採取量(g) 結果を表2に示した。表2は、全操作を経た試薬ブラン
ク値並びに、実際試料分析においての標準偏差値と、含
有量の異なる試料(A,B,C,D)の実施例を示した
ものである。実際試料の分析定量下限については、各測
定誤差を考慮して試料分析値/試薬ブランク分析値=3
を採用することにした。Formula (I): X (ppb) = {amount of each metal in sample (ng / ml) −amount of each metal in reagent blank (ng / ml)} × 100 × 5
/ Sample collection amount (g) The results are shown in Table 2. Table 2 shows examples of reagent blank values after all operations, standard deviation values in actual sample analysis, and samples (A, B, C, D) having different contents. Regarding the lower limit of the analysis and quantification of the actual sample, the sample analysis value / reagent blank analysis value = 3 in consideration of each measurement error.
I decided to adopt.
【0024】実施例2 SrTiO3 の代わりにBaTiO3 を使用した他は、
実施例1と全く同様の操作を行った。結果を同じく表2
に示した。Example 2 Except that BaTiO 3 was used instead of SrTiO 3 ,
The same operation as in Example 1 was performed. Table 2 also shows the results
It was shown to.
【0025】実施例3 SrTiO3 の代わりに(Ba,Sr)TiO3 を使用
した他は、実施例1と全く同様の操作を行った。結果を
同じく表2に示した。Example 3 The same operation as in Example 1 was carried out except that (Ba, Sr) TiO 3 was used instead of SrTiO 3 . The results are also shown in Table 2.
【0026】[0026]
【表1】 [Table 1]
【0027】[0027]
【表2】 [Table 2]
【0028】[0028]
【発明の効果】本発明の分析法によれば、SrTi
O3 、BaTiO3 及び(Ba,Sr)TiO3 の高誘
電体材料中のアルカリ金属につき、サブppmオーダー
の定量分析が簡単に、且つ正確に分析できるので、高誘
電体材料の製造研究を支援する上で極めて有用な分析方
法である。According to the analytical method of the present invention, SrTi
Sub-ppm quantitative analysis of alkali metals in high dielectric materials such as O 3 , BaTiO 3, and (Ba, Sr) TiO 3 can be easily and accurately analyzed, supporting research on the production of high dielectric materials. This is an extremely useful analysis method.
【図1】フレームレス原子吸光測定時におけるSrTi
O3 中のNaの希釈倍率(マトリックス量)による標準
添加検量線の傾きの変化及びバラツキを示したものであ
る。FIG. 1 SrTi during flameless atomic absorption measurement
FIG. 3 is a graph showing changes and variations in the slope of a standard addition calibration curve depending on the dilution ratio (matrix amount) of Na in O 3 .
【図2】フレームレス原子吸光測定時におけるBaTi
O3 中のNaの希釈倍率(マトリックス量)による標準
添加検量線の傾きの変化及びバラツキを示したものであ
る。FIG. 2 shows BaTi during flameless atomic absorption measurement.
FIG. 3 is a graph showing changes and variations in the slope of a standard addition calibration curve depending on the dilution ratio (matrix amount) of Na in O 3 .
【図3】フレームレス原子吸光測定時における(Ba,
Sr)TiO3 中のNaの希釈倍率(マトリックス量)
による標準添加検量線の傾きの変化及びバラツキを示し
たものである。FIG. 3 shows (Ba,
Sr) Dilution ratio of Na in TiO 3 (matrix amount)
1 shows changes and variations in the slope of the standard addition calibration curve due to the above.
【図4】フレームレス原子吸光測定時におけるSrTi
O3 中のKの希釈倍率(マトリックス量)による標準添
加検量線の傾きの変化及びバラツキを示したものであ
る。FIG. 4 shows SrTi during flameless atomic absorption measurement
FIG. 4 shows changes and variations in the slope of a standard addition calibration curve depending on the dilution ratio (matrix amount) of K in O 3 .
【図5】フレームレス原子吸光測定時におけるBaTi
O3 中のKの希釈倍率(マトリックス量)による標準添
加検量線の傾きの変化及びバラツキを示したものであ
る。FIG. 5: BaTi during flameless atomic absorption measurement
FIG. 4 shows changes and variations in the slope of a standard addition calibration curve depending on the dilution ratio (matrix amount) of K in O 3 .
【図6】フレームレス原子吸光測定時における(Ba,
Sr)TiO3 中のKの希釈倍率(マトリックス量)に
よる標準添加検量線の傾きの変化及びバラツキを示した
ものである。FIG. 6 shows (Ba,
Sr) Changes in the slope of the standard addition calibration curve and variations in the dilution ratio (matrix amount) of K in TiO 3 are shown.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平2−91570(JP,A) Zh Anal.Khim,ロシア, Vol.47,No.5(1992),p896 −900 (58)調査した分野(Int.Cl.7,DB名) G01N 21/00 - 21/01 G01N 21/17 - 21/61 JICSTファイル(JOIS) 実用ファイル(PATOLIS) 特許ファイル(PATOLIS)──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-2-91570 (JP, A) Zh Anal. Khim, Russia, Vol. 47, No. 5 (1992), p896-900 (58) Fields investigated (Int. Cl. 7 , DB name) G01N 21/00-21/01 G01N 21/17-21/61 JICST file (JOIS) Practical file (PATOLIS) Patent file (PATOLIS)
Claims (1)
Sr)TiO3 の一群から選ばれる少なくとも一種類の
化合物に塩酸及び過酸化水素を添加し加熱溶解した後、
平行磁場型交流ゼーマンフレームレス原子吸光装置を用
いて、標準添加検量線法により定量分析することを特徴
とする高誘電体材料中のアルカリ金属の簡易分析方法。1. A method according to claim 1, wherein BaTiO 3 , SrTiO 3 , (Ba,
Sr) After adding hydrochloric acid and hydrogen peroxide to at least one compound selected from the group of TiO 3 and dissolving by heating,
A simple analysis method for alkali metals in a high-dielectric material, characterized by performing a quantitative analysis by a standard addition calibration curve method using a parallel magnetic field type AC Zeeman flameless atomic absorption spectrometer.
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| Application Number | Priority Date | Filing Date | Title |
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| JP30782394A JP3266431B2 (en) | 1994-12-12 | 1994-12-12 | Simple analysis method for alkali metals in high dielectric materials |
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