JP3269757B2 - Temperature compensation method for refractive index - Google Patents
Temperature compensation method for refractive indexInfo
- Publication number
- JP3269757B2 JP3269757B2 JP22503095A JP22503095A JP3269757B2 JP 3269757 B2 JP3269757 B2 JP 3269757B2 JP 22503095 A JP22503095 A JP 22503095A JP 22503095 A JP22503095 A JP 22503095A JP 3269757 B2 JP3269757 B2 JP 3269757B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- refractive index
- prism
- interface
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
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- Investigating Or Analysing Materials By Optical Means (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は屈折率の測定方法に
関し、特に、屈折率の温度補償方法に関するものであ
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for measuring a refractive index, and more particularly, to a method for temperature compensating a refractive index.
【0002】[0002]
【従来技術】ところで、一般に屈折率は物質の温度に応
じて変動するところから、所要の測定精度を確保するた
めには、試料温度を一定に保つことが必要である。2. Description of the Related Art In general, the refractive index fluctuates according to the temperature of a substance. Therefore, it is necessary to keep the sample temperature constant in order to secure required measurement accuracy.
【0003】図6は上記全反射法を適用した屈折率測定
装置の一例を示す構成図である。プリズム101の一方
に光源103、もう一方に光検出装置CCDライセンサ
107が配置され、プリズム101は恒温ブロック10
4の中に固定されている。 恒温ブロック104にはペ
ルチェ素子105が取り付けられており、プリズム10
1に内蔵された温度センサ106の検出温度に基づいて
制御回路がペルチェ素子105を制御することにより、
恒温ブロック104、プリズム101を一定の温度に制
御するようになっている。FIG. 6 is a block diagram showing an example of a refractive index measuring apparatus to which the above-mentioned total reflection method is applied. A light source 103 is arranged on one side of the prism 101, and a light detecting device CCD licensor 107 is arranged on the other side.
4 is fixed inside. The Peltier element 105 is attached to the constant temperature block 104, and the prism 10
The control circuit controls the Peltier element 105 based on the temperature detected by the temperature sensor 106 built in
The constant temperature block 104 and the prism 101 are controlled at a constant temperature.
【0004】この装置において、試料とプリズムの界面
102に試料を滴下し、プリズム背面より光を入射し、
該光を試料に全反射させることによって、該入射角と反
射角より、上記試料の屈折率が測定される。このように
試料の屈折率が測定されると、該屈折率から導き出され
る該試料の物理的、化学的な数値例えば試料中の糖濃度
(ブリックス)等が直ちに算出できることになる。In this apparatus, a sample is dropped on an interface 102 between the sample and the prism, and light is incident from the back of the prism.
By totally reflecting the light to the sample, the refractive index of the sample is measured from the incident angle and the reflection angle. When the refractive index of the sample is measured in this way, the physical and chemical values of the sample derived from the refractive index, such as the sugar concentration (Brix) in the sample, can be calculated immediately.
【0005】屈折率は温度によって変化するところか
ら、上記のように屈折率測定装置の温度コントロールが
厳密になされるが、試料温度と当該屈折率測定装置の設
定温度が異なる場合には、例えば試料を滴下した後、上
記プリズムと試料との界面の温度が平衡状態になるまで
の所定時間を待って測定が行われる。またこの方法では
時間がかかることから、屈折率測定時のプリズム温度を
測定することによって、温度補償をすることがなされて
いる。Since the refractive index changes depending on the temperature, the temperature of the refractive index measuring device is strictly controlled as described above. However, when the sample temperature is different from the set temperature of the refractive index measuring device, for example, After dropping, the measurement is performed after waiting for a predetermined time until the temperature at the interface between the prism and the sample reaches an equilibrium state. In addition, since this method takes time, temperature compensation is performed by measuring the prism temperature at the time of measuring the refractive index.
【0006】[0006]
【発明が解決しようとする課題】上記のように温度補償
をすることによって屈折率を求める方法では、測定温度
が正しい界面温度を表していることが前提となる。しか
しながら図2に示すように界面位置102と温度センサ
106の位置とは一致しない。従って温度センサ106
による測定温度が正確な界面温度を表しているとは限ら
ないことになる。In the method of obtaining the refractive index by performing the temperature compensation as described above, it is assumed that the measured temperature represents the correct interface temperature. However, as shown in FIG. 2, the interface position 102 and the position of the temperature sensor 106 do not match. Therefore, the temperature sensor 106
Will not necessarily represent the exact interface temperature.
【0007】事実、上記のようにプリズム温度の実測値
を用いて測定屈折率に温度補償を行っても、後に説明す
るように正確な屈折率とは一致しない。本発明は上記従
来の事情に鑑みて提案されたものであって、界面温度
と、温度センサによるプリズム温度の実測値が異なって
も正確な屈折率の測定ができる屈折率の温度補償方法を
提供することを目的とするものである。In fact, even if the measured refractive index is temperature-compensated using the actually measured value of the prism temperature as described above, the measured refractive index does not coincide with an accurate refractive index as described later. The present invention has been proposed in view of the above-mentioned conventional circumstances, and provides a refractive index temperature compensation method that can accurately measure a refractive index even when an interface temperature and a prism temperature measured by a temperature sensor are different. It is intended to do so.
【0008】[0008]
【課題を解決するための手段】プリズムと試料との界面
温度T1 と温度センサによるプリズム温度の実測値T 2
との関係は、例えば図3に示すように相関性がある。従
って、実測温度T2 より図3に示す相関関係を参照して
界面温度T1 を求め、該界面温度T1 に基づいて実測屈
折率に対して温度補償を行うようにする。[Means for Solving the Problems] The interface between the prism and the sample
Temperature T1And the measured temperature T of the prism temperature by the temperature sensor Two
Has a correlation as shown in FIG. 3, for example. Obedience
The measured temperature TTwoReferring to the correlation shown in FIG.
Interface temperature T1And the interface temperature T1Actual measurement based on
Temperature compensation is performed for the folding ratio.
【0009】これによって、試料滴下直後の温度不平衡
状態であっても正確な屈折率を求めることができる。上
記界面温度T1 は、温度と屈折率との関係が分かってい
る標準物質をプリズム上に滴下したときに測定される屈
折率より求めることができる。Thus, an accurate refractive index can be obtained even in a temperature imbalance state immediately after dropping a sample. The interface temperature T 1 can be determined from the refractive index measured when a standard substance whose relationship between the temperature and the refractive index is known is dropped on the prism.
【0010】[0010]
【実施の形態】図1は本発明の一実施例概念図であり、
図2は試料が配置される界面(プリズム界面)102と
温度センサ106との位置関係を示す概念図である。FIG. 1 is a conceptual diagram of one embodiment of the present invention.
FIG. 2 is a conceptual diagram showing a positional relationship between an interface (prism interface) 102 on which a sample is arranged and a temperature sensor 106.
【0011】まず、所定温度に設定された屈折率測定装
置のプリズム界面1に例えば0.1〜1.0mlの試料
が滴下されると、プリズムの実測温度T2 は図1に示す
ように試料の初期温度の影響を受けて変化するととも
に、時間の経過にともなって設定温度T0 に収束するこ
とになる。この実測温度T2 の変化とともに屈折率N1
も測定される。First, when, for example, 0.1 to 1.0 ml of a sample is dropped on the prism interface 1 of the refractive index measuring device set at a predetermined temperature, the measured temperature T 2 of the prism is changed as shown in FIG. Changes under the influence of the initial temperature, and converges to the set temperature T 0 with the passage of time. Along with the change in the measured temperature T 2, the refractive index N 1
Is also measured.
【0012】プリズム101の温度センサ106の位置
と試料との界面102の位置とは異なるのが普通であ
る。従って上記の実測温度T2 は界面温度T1 を正確に
は表していないので、上記実測温度T2 を用いて上記測
定された屈折率N1 を温度補償しても、得られる屈折率
Dn2 は図2に示すように屈折率の真値N0 を表してい
るとは言いがたい。The position of the temperature sensor 106 of the prism 101 and the position of the interface 102 with the sample are usually different. Accordingly, since the measured temperature T 2 does not accurately represent the interface temperature T 1 , even if the measured refractive index N 1 is temperature compensated using the measured temperature T 2 , the obtained refractive index Dn 2 is obtained. It cannot be said that represents the true value N 0 of the refractive index as shown in FIG.
【0013】一方、上記実測温度T2 より界面温度T1
を直接求めることはできない。ここで、温度と屈折率の
関係がすでに分かっている標準物質を用いれば、この屈
折率N1 より逆に界面温度T1 を求めることができる。On the other hand, from the measured temperature T 2 , the interface temperature T 1
Cannot be asked directly. Here, if a standard substance whose relationship between the temperature and the refractive index is already known is used, the interface temperature T 1 can be determined conversely to the refractive index N 1 .
【0014】このようにして得られた実測温度T2 と界
面温度T1 との関係を考察すると図3に示すように相関
関係があることが理解できる。ここで、図3では横軸に
プリズムの実測温度T2 と設定温度T0 との差を、また
縦軸に上記のようにして得られた界面温度T1 と設定温
度T0 との差を表しており、その相関関係はこの例では
直線となっている。Considering the relationship between the measured temperature T 2 and the interface temperature T 1 thus obtained, it can be understood that there is a correlation as shown in FIG. In FIG. 3, the horizontal axis represents the difference between the measured temperature T 2 of the prism and the set temperature T 0, and the vertical axis represents the difference between the interface temperature T 1 and the set temperature T 0 obtained as described above. And the correlation is a straight line in this example.
【0015】このようにして特定物質について予め実測
温度T2 と界面温度T1 との相関関係を求めておくと、
次回からは実測温度T2 が判ると図3を用いて界面温度
T1を求めることができ、界面温度T1 が判ると、上記
測定された屈折率N1 は、界面温度T1 を参照して温度
補償することが可能となり、屈折率の真値N0 を求める
ことができる。If the correlation between the actually measured temperature T 2 and the interface temperature T 1 is determined in advance for a specific substance in this way,
If the measured temperature T 2 is seen from the next time can be determined interfacial temperatures T 1 with reference to FIG. 3, when the surface temperature T 1 is known, the refractive index N 1, which is the measurement refers to the interfacial temperature T 1 of Temperature compensation, and the true value of the refractive index N 0 can be obtained.
【0016】図4は試料を水、試料初期温度35℃とす
る場合の本発明の一実施例を示すものである。従来方法
のように測定温度に基づいて実測屈折率N1 の温度補償
をした場合、屈折率N2 は測定開始から1分以上経過し
ないと正確な値を得ることができないが、本発明による
と20秒程度で既に屈折率の真値N0 が得られることが
解る。FIG. 4 shows an embodiment of the present invention when the sample is water and the sample initial temperature is 35.degree. When temperature compensation of the actually measured refractive index N 1 is performed based on the measured temperature as in the conventional method, an accurate value of the refractive index N 2 cannot be obtained until one minute or more has elapsed from the start of measurement. It can be seen that the true value N 0 of the refractive index is already obtained in about 20 seconds.
【0017】更に、図5は本発明の別の実施例を示すも
のである。試料は20%濃度のショ糖溶液、試料の初期
温度は30℃である。結果は前記図4の場合と同様であ
る。FIG. 5 shows another embodiment of the present invention. The sample was a 20% sucrose solution, and the initial temperature of the sample was 30 ° C. The result is the same as in the case of FIG.
【0018】[0018]
【発明の効果】以上説明したように本発明は試料滴下直
後の試料温度が装置の設定温度と異なる場合であって
も、正確に屈折率を得ることができ、測定時間を大幅に
短縮することができる。As described above, according to the present invention, even when the sample temperature immediately after dropping the sample is different from the set temperature of the apparatus, the refractive index can be accurately obtained, and the measurement time can be greatly reduced. Can be.
【図1】本発明の実施例概念図である。FIG. 1 is a conceptual diagram of an embodiment of the present invention.
【図2】本発明の説明図である。FIG. 2 is an explanatory diagram of the present invention.
【図3】本発明の実測温度と界面温度との相関関係を示
すグラフである。FIG. 3 is a graph showing a correlation between an actually measured temperature and an interface temperature according to the present invention.
【図4】本発明の一実施例を示すグラフである。FIG. 4 is a graph showing one embodiment of the present invention.
【図5】本発明の他の実施例を示すグラフである。FIG. 5 is a graph showing another embodiment of the present invention.
【図6】本発明が適用される装置構成図である。FIG. 6 is an apparatus configuration diagram to which the present invention is applied.
【符号の説明】 101 プリズム T1 界面温度 T2 実測温度[EXPLANATION OF SYMBOLS] 101 prism T 1 interface temperature T 2 actually measured temperature
フロントページの続き (56)参考文献 特開 平6−273329(JP,A) 特開 平6−273328(JP,A) 特開 平1−170838(JP,A) 特開 昭64−68637(JP,A) 特開 昭62−12840(JP,A) (58)調査した分野(Int.Cl.7,DB名) G01N 21/00 - 21/01 G01N 21/17 - 21/61 JICSTファイル(JOIS)Continuation of the front page (56) References JP-A-6-273329 (JP, A) JP-A-6-273328 (JP, A) JP-A-1-17038 (JP, A) JP-A-64-68637 (JP) , A) JP-A-62-12840 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) G01N 21/00-21/01 G01N 21/17-21/61 JICST file (JOIS )
Claims (2)
測定方法において、 試料が滴下されるプリズムの界面温度と、プリズムの実
測温度との相関関係を予め求めておき、上記実測温度よ
り参照される界面温度に基づいて屈折率の温度補償を行
うことを特徴とする屈折率の温度補償方法。In a method of measuring a refractive index by a total reflection method using a prism, a correlation between an interface temperature of a prism onto which a sample is dropped and an actually measured temperature of the prism is determined in advance, and the correlation is referred to from the measured temperature. A temperature compensation method for a refractive index, wherein temperature compensation of a refractive index is performed based on an interface temperature.
が分かっている標準物質をプリズム上に滴下したときに
測定される屈折率より求められる請求項1に記載の屈折
率の温度補償方法。2. The temperature compensation of the refractive index according to claim 1, wherein the interface temperature is obtained from a refractive index measured when a standard substance having a known relationship between the temperature and the refractive index is dropped on the prism. Method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22503095A JP3269757B2 (en) | 1995-09-01 | 1995-09-01 | Temperature compensation method for refractive index |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22503095A JP3269757B2 (en) | 1995-09-01 | 1995-09-01 | Temperature compensation method for refractive index |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0968495A JPH0968495A (en) | 1997-03-11 |
| JP3269757B2 true JP3269757B2 (en) | 2002-04-02 |
Family
ID=16822968
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22503095A Expired - Fee Related JP3269757B2 (en) | 1995-09-01 | 1995-09-01 | Temperature compensation method for refractive index |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3269757B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3950818B2 (en) | 2003-05-29 | 2007-08-01 | アイシン精機株式会社 | Reflective terahertz spectrometer and measurement method |
-
1995
- 1995-09-01 JP JP22503095A patent/JP3269757B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0968495A (en) | 1997-03-11 |
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