JP3284645B2 - Exposure apparatus and exposure method - Google Patents
Exposure apparatus and exposure methodInfo
- Publication number
- JP3284645B2 JP3284645B2 JP03015093A JP3015093A JP3284645B2 JP 3284645 B2 JP3284645 B2 JP 3284645B2 JP 03015093 A JP03015093 A JP 03015093A JP 3015093 A JP3015093 A JP 3015093A JP 3284645 B2 JP3284645 B2 JP 3284645B2
- Authority
- JP
- Japan
- Prior art keywords
- exposure
- dimming
- light
- pattern
- overlapping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
- G03F7/70475—Stitching, i.e. connecting image fields to produce a device field, the field occupied by a device such as a memory chip, processor chip, CCD, flat panel display
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、半導体や液晶の基板等
に所望のパターンを露光する装置および露光方法に関す
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus and a method for exposing a semiconductor or liquid crystal substrate to a desired pattern.
【0002】[0002]
【従来の技術】この種の露光装置では、露光対象となる
試料の大型化に対処するため、試料の露光領域を複数に
分割して各領域に応じた露光を繰り返し、最終的に所望
のパターンを合成する画面合成手法が用いられている。
この画面合成を行なう際には、パターン投影用のレチク
ルの描画誤差や投影光学系のレンズの収差、試料を位置
決めするステージの位置決め誤差等に起因する各露光領
域の境界位置でのパターンの切れ目の発生を防止するた
め、各露光領域の境界を微小量重ね合わせて露光を行な
う。しかし、露光領域を重ね合わせると、この部分が2
重露光されてパターンの継ぎ目部分の線幅が変化する。
また、画面合成を行なうと、隣接する露光領域の位置の
ずれによってパターンの継ぎ目部分に段差が発生し、デ
バイスの特性が損われることがある。さらに、画面合成
されたパターンを多層に重ね合わせる工程を複数台の露
光装置に分担させた場合、各露光装置のレンズ収差の相
違によって各層の露光領域の重ね合わせ誤差がパターン
の継ぎ目部分で不連続に変化し、特にアクティブマトリ
ックス液晶デバイスではコントラストがパターン継ぎ目
部分で断続的に変化してデバイスの品質が著しく零下す
る。2. Description of the Related Art In an exposure apparatus of this type, in order to cope with an increase in the size of a sample to be exposed, an exposure area of the sample is divided into a plurality of areas, and exposure corresponding to each area is repeated. Are synthesized using a screen combining method.
When synthesizing the screen, the pattern break at the boundary position of each exposure area due to the drawing error of the reticle for pattern projection, the aberration of the lens of the projection optical system, the positioning error of the stage for positioning the sample, etc. In order to prevent the occurrence, the exposure is performed by overlapping the boundaries of the respective exposure regions by a very small amount. However, when superimposing the exposed area, this part 2
The line width at the joint portion of the pattern changes due to the double exposure.
In addition, when screen synthesis is performed, a step may occur at a joint portion of a pattern due to a shift in the position of an adjacent exposure region, and the characteristics of the device may be impaired. Furthermore, when the process of superimposing the screen-combined pattern in multiple layers is shared by a plurality of exposure apparatuses, the overlay error of the exposure area of each layer is discontinuous at the joint of the pattern due to the difference in the lens aberration of each exposure apparatus. In particular, in the case of an active matrix liquid crystal device, the contrast is intermittently changed at a pattern joint portion, and the quality of the device is significantly reduced to zero.
【0003】以上のような画面合成上の不都合を除去す
る手段として、特公昭63−49218号公報には、レ
チクル若しくはレチクルに重ねるフィルタのパターン継
ぎ目部分に相当する位置に透過光量を減少させる減光部
を設け、パターンの重ね合わせ部分の露光量を他の部分
の露光量に略一致させるものが開示されている。As means for eliminating such inconveniences in screen synthesis, Japanese Patent Publication No. 63-49218 discloses a dimming method for reducing the amount of transmitted light at a position corresponding to a reticle or a pattern seam portion of a filter superimposed on the reticle. There is disclosed an apparatus in which a portion is provided so that an exposure amount of a superimposed portion of a pattern substantially coincides with an exposure amount of another portion.
【0004】[0004]
【発明が解決しようとする課題】しかし、上述した公報
記載の手段では次のような問題がある。まず、レチクル
自身に減光特性を持たせた場合、レチクルの製造工数が
増え、製造中にパターン欠陥が発生するおそれも高まる
などレチクルの製造工程への負担が大きくなる。一方、
レチクルと重ね合わせるフィルタを用いる場合は、フィ
ルタの着脱によってレチクルの損傷や汚染が生じるおそ
れが高くなるなどレチクルの保守管理に問題が生じる。
また、レチクルの前後には、パターンへのごみ等の異物
の付着を防止するために一定厚さのペリクルを設けるこ
とが多いので、最低でもフィルタとレチクルのパターン
とがペリクルの厚さだけ離れてしまい、パターン上にて
理想的な減光特性を得ることが困難となる。さらに、レ
チクル毎に専用のフィルタを用意する必要があり、フィ
ルタの製造や保守管理に要する手間も無視できない。However, the means described in the above publication has the following problems. First, when the reticle itself is provided with a dimming characteristic, the number of man-hours for manufacturing the reticle increases, and the risk of pattern defects during the manufacturing increases, so that the burden on the reticle manufacturing process increases. on the other hand,
When a filter to be superimposed on a reticle is used, there is a problem in reticle maintenance management, such as the risk that the reticle is damaged or contaminated by the attachment and detachment of the filter.
In addition, before and after the reticle, a pellicle of a certain thickness is often provided to prevent foreign substances such as dust from adhering to the pattern, so that at least the filter and the reticle pattern are separated by the pellicle thickness. As a result, it is difficult to obtain ideal light-reducing characteristics on the pattern. Furthermore, it is necessary to prepare a dedicated filter for each reticle, and the labor required for manufacturing and maintaining the filter cannot be ignored.
【0005】本発明の目的は、レチクル等のようなパタ
ーン転写用の部材に減光特性を持たせる必要やパターン
転写用の部材毎に異なる減光手段を用意する必要がな
く、かつパターン転写用の部材上にて理想的な減光特性
が得られる露光装置および露光方法を提供することにあ
る。SUMMARY OF THE INVENTION It is an object of the present invention to eliminate the need to provide a pattern transfer member such as a reticle with a dimming characteristic or to provide a different dimming means for each pattern transfer member. It is an object of the present invention to provide an exposure apparatus and an exposure method capable of obtaining ideal light-reducing characteristics on the above member.
【0006】[0006]
【課題を解決するための手段】一実施例を表す図面に対
応付けて説明すると、請求項1記載の露光装置は、光源
(1)からの光束により第1物体(9)のパタ−ンを第
2物体(11)に露光する露光装置であって、前述の光
束を第1物体(9)に導き、第1物体(9)を照明する
照明光学系(4,5,8)と、第2物体(11)に露光
されたパタ−ンの一部に第1物体(9)のパタ−ンの一
部が重複するように第1物体(9)の照射領域を設定す
る設定手段(6)と、照明光学系(4,5,8)に配置
され設定手段(6)が設定した第1物体(9)の照明領
域の周辺部の光量を減光する減光手段(601A,B)
とを備えている。請求項2記載の露光装置は、減光手段
(601A,B)が設定手段(6)に設けられている。
請求項3記載の露光装置は、減光手段(601A,B)
が第1物体(9)のパタ−ンのうち重複露光を行う部分
と、重複部分を行わない部分との光量がほぼ等しくなる
ように減光を行なっている。請求項4記載の露光装置
は、減光手段(601A,B)が第1物体(9)のパタ
−ンのうち重複露光を行う部分と、重複部分を行わない
部分との線幅がほぼ等しくなるように減光を行なってい
る。請求項5記載の露光装置は、減光手段(601A,
B)による減光位置を調整する減光位置調整手段(61
A,B)を備えている。請求項6記載の露光装置は、減
光手段(601A,B)が周辺部内において減光の割合
を変更している。請求項7記載の露光方法は、光源
(1)からの光束を照明光学系(4,5,8)により第
1物体(9)に導いて、第1物体(9)のパタ−ンを第
2物体(11)に露光する露光方法であって、照明光学
系(4,5,8)に減光手段(601A,B)を設け、
第2物体(11)に露光されたパタ−ンの一部に第1物
体(9)のパタ−ンの一部が重複するように第1物体
(9)の照射領域を設定し、第1物体(9)を照明する
際に、減光手段(601A,B)により第1物体(9)
の照射領域の周辺部の光量を減光している。請求項8記
載の露光方法は、第1物体のパタ−ン(9)のうち重複
露光を行う部分と、重複部分を行わない部分との光量が
ほぼ等しくなるように減光を行なっている。請求項9記
載の露光方法は、第1物体(9)のパタ−ンのうち重複
露光を行う部分と、重複部分を行わない部分との線幅が
ほぼ等しくなるように減光を行なっている。請求項10
記載の露光方法は、周辺部の減光をする減光位置を調整
している。請求項11記載の露光方法は、周辺部内にお
いて減光の割合を変更している。According to an embodiment of the present invention, a pattern of a first object (9) is formed by a light beam from a light source (1). An exposure apparatus for exposing a second object (11), comprising: an illumination optical system (4, 5, 8) for guiding the light beam to the first object (9) and illuminating the first object (9); Setting means (6) for setting the irradiation area of the first object (9) such that a part of the pattern of the first object (9) overlaps a part of the pattern exposed on the two objects (11); ) And dimming means (601A, B) arranged in the illumination optical system (4, 5, 8) for dimming the amount of light around the illumination area of the first object (9) set by the setting means (6).
And In the exposure apparatus according to the second aspect, the dimming means (601A, B) is provided in the setting means (6).
The exposure apparatus according to claim 3, wherein the dimming means (601A, B)
However, in the pattern of the first object (9), dimming is performed so that the light amount of the portion where the overlapping exposure is performed and the light amount of the portion where the overlapping portion is not performed are substantially equal. According to a fourth aspect of the present invention, in the pattern of the first object (9) in which the dimming means (601A, B) performs the overlapping exposure, the line width of the portion where the overlapping portion is not performed is substantially equal to the line width of the portion where the overlapping portion is not performed. Dimming is performed so that The exposure apparatus according to claim 5, wherein the dimming means (601A,
Dimmer position adjusting means (61) for adjusting the dimming position by B)
A, B). In the exposure apparatus according to the sixth aspect, the dimming means (601A, B) changes the dimming ratio in the peripheral portion. In the exposure method according to the present invention, the light beam from the light source (1) is guided to the first object (9) by the illumination optical system (4, 5, 8) to change the pattern of the first object (9). An exposure method for exposing two objects (11), wherein dimming means (601A, B) are provided in the illumination optical system (4, 5, 8).
The irradiation area of the first object (9) is set so that a part of the pattern of the first object (9) overlaps with a part of the pattern exposed on the second object (11). When illuminating the object (9), the first object (9) is reduced by the dimming means (601A, B).
The amount of light at the periphery of the irradiation area is reduced. In the exposure method according to the eighth aspect, the light is reduced so that the light amount of the portion where the overlapping exposure is performed and the light amount of the portion where the overlapping portion is not performed in the pattern (9) of the first object are substantially equal. In the exposure method according to the ninth aspect, the light is reduced so that the line width of the portion where the overlapping exposure is performed and the portion where the overlapping portion is not performed in the pattern of the first object (9) are substantially equal. . Claim 10
In the described exposure method, the dimming position for dimming the peripheral portion is adjusted. In the exposure method according to the eleventh aspect, the dimming ratio is changed in the peripheral portion.
【0007】[0007]
【作用】 請求項1記載の露光装置は、減光手段(60
1A,B)が設定手段(6)により設定された第1物体
(9)の照明領域の周辺部の光量を減光特性にしたがっ
て正確に減少する。請求項2記載の露光装置は、減光手
段(601A,B)が設定手段(6)に設けられてい
る。請求項3記載の露光装置は、図6に示すように、減
光手段(601A,B)により、重複露光を行う部分
と、重複部分を行わない部分との光量がほぼ等しくなっ
ている。請求項4記載の露光装置は、減光手段(601
A,B)により重複露光を行う部分と、重複部分を行わ
ない部分との線幅をほぼ等しくしている。請求項5記載
の露光装置は、減光位置調整手段(61A,B)が第1
物体(9)の大きさや第1物体(9)の照明範囲の変化
に応じて減光範囲を調整している。請求項6記載の露光
装置は、減光手段(601A,B)が周辺部内において
減光の割合を変更している。請求項7記載の露光方法
は、第1物体(9)の照明領域の周辺部の光量を正確に
減少している。請求項8記載の露光方法は、重複露光を
行う部分と、重複部分を行わない部分との光量をほぼ等
しくしている。請求項9記載の露光方法は、重複露光を
行う部分と、重複部分を行わない部分との線幅をほぼ等
しくしている。請求項10記載の露光方法は、第1物体
(9)の大きさや第1物体(9)の照明範囲の変化に応
じて周辺部の減光を行う減光位置を調整している。請求
項11記載の露光方法は、周辺部内において減光の割合
を変更している。According to the first aspect of the present invention, there is provided an exposure apparatus comprising:
1A, B) accurately reduces the light amount in the peripheral portion of the illumination area of the first object (9) set by the setting means (6) according to the dimming characteristic. In the exposure apparatus according to the second aspect, the dimming means (601A, B) is provided in the setting means (6). In the exposure apparatus according to the third aspect, as shown in FIG. 6, the light amount of the portion where the overlapping exposure is performed and the light amount of the portion where the overlapping portion is not performed are made substantially equal by the dimming means (601A and B). The exposure apparatus according to claim 4, wherein the dimming means (601)
A and B) make the line width of the portion where the overlap exposure is performed substantially equal to that of the portion where the overlap portion is not performed. In the exposure apparatus according to the fifth aspect, the dimming position adjusting means (61A, B) is the first type.
The dimming range is adjusted according to the size of the object (9) or the change in the illumination range of the first object (9). In the exposure apparatus according to the sixth aspect, the dimming means (601A, B) changes the dimming ratio in the peripheral portion. In the exposure method according to the seventh aspect, the amount of light at the periphery of the illumination area of the first object (9) is accurately reduced. In the exposure method according to the eighth aspect, the light amount of the portion where the overlapping exposure is performed is substantially equal to the light amount of the portion where the overlapping portion is not performed. In the exposure method according to the ninth aspect, the line width of the portion where the overlapping exposure is performed is substantially equal to the line width of the portion where the overlapping portion is not performed. In the exposure method according to the tenth aspect, the dimming position for dimming the peripheral portion is adjusted according to the size of the first object (9) or a change in the illumination range of the first object (9). In the exposure method according to the eleventh aspect, the dimming ratio is changed in the peripheral portion.
【0008】なお、本発明の構成を説明する上記課題を
解決するための手段と作用の項では、本発明を分かり易
くするために実施例の図を用いたが、これにより本発明
が実施例に限定されるものではない。[0008] In the means and means for solving the above-mentioned problems which explain the constitution of the present invention, the drawings of the embodiments are used to make the present invention easy to understand. However, the present invention is not limited to this.
【0009】[0009]
【実施例】以下、図1〜図9を参照して本発明の一実施
例を説明する。図1は本実施例に係る露光装置の概略構
成を示すもので、1は露光光源としての超高圧水銀ラン
プであり、その照明光は楕円鏡2で集光され、反射ミラ
ー3で反射されて波長フィルタ4に入射する。波長フィ
ルタ4は露光に必要な波長(一般にはg線やi線の波
長)のみを通過させるもので、波長フィルタ4を通過し
た照明光はフライアイインテグレータ5にて均一な照度
分布の光束にされてブラインド6に到達する。ブライン
ド6は開口Sの大きさを増減させて照明光による照射範
囲を調整するもので、その詳細は後述する。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIGS. FIG. 1 shows a schematic configuration of an exposure apparatus according to the present embodiment. Reference numeral 1 denotes an extra-high pressure mercury lamp as an exposure light source, the illumination light of which is collected by an elliptical mirror 2 and reflected by a reflection mirror 3. The light enters the wavelength filter 4. The wavelength filter 4 allows only the wavelength necessary for exposure (generally, the wavelength of g-line or i-line) to pass, and the illumination light passing through the wavelength filter 4 is converted into a light beam having a uniform illuminance distribution by the fly-eye integrator 5. To reach the blind 6. The blind 6 adjusts the irradiation range of the illumination light by increasing or decreasing the size of the opening S, and details thereof will be described later.
【0010】ブラインド6の開口Sを通過した照明光は
反射ミラー7で反射されてレンズ8に入射し、このレン
ズ8によってブラインド6の開口Sの像がレチクル9上
で結像し、レチクル9の所望範囲が照明される。レチク
ル9の照明範囲に存在するパターンの像はレンズ10に
より試料11上に結像し、これにより試料11の特定領
域がレチクル9のパターンに応じて露光される。試料1
1は半導体集積回路の製造過程であればウエハ、液晶製
造過程であればガラスプレートである。The illumination light that has passed through the opening S of the blind 6 is reflected by the reflection mirror 7 and enters the lens 8. The lens 8 forms an image of the opening S of the blind 6 on the reticle 9, and The desired area is illuminated. The image of the pattern existing in the illumination range of the reticle 9 is formed on the sample 11 by the lens 10, whereby a specific region of the sample 11 is exposed according to the pattern of the reticle 9. Sample 1
Reference numeral 1 denotes a wafer in the process of manufacturing a semiconductor integrated circuit, and a glass plate in the process of manufacturing a liquid crystal.
【0011】試料11はステージ12上に固定される。
ステージ12は互いに直交する方向へ移動可能な一対の
ブロックを重ね合わせた周知のもので、このステージ1
2により試料11の水平面内での位置が調整される。画
面合成を行なうときは、1回の露光が終了した後、レチ
クル9を交換するとともにステージ12を駆動して試料
11の別の位置を次回の露光領域に設定し、以下露光終
了毎に同様手順を繰り返して試料11の全領域を露光す
る。なお、単一または複数のレチクルに複数回分のパタ
ーンを形成し、試料11の露光領域の変更に連係してレ
チクル内の照射領域を変更し画面合成を行なうこともあ
る。13は移動鏡14によって検出したステージ12の
現在位置に基づいてステージ12を位置決めするレーザ
ー干渉計システムである。A sample 11 is fixed on a stage 12.
The stage 12 is a well-known one in which a pair of blocks movable in directions orthogonal to each other are overlapped.
2 adjusts the position of the sample 11 in the horizontal plane. When synthesizing the screen, after one exposure is completed, the reticle 9 is replaced and the stage 12 is driven to set another position of the sample 11 to the next exposure area. Is repeated to expose the entire area of the sample 11. It should be noted that a pattern may be formed a plurality of times on a single or a plurality of reticles, and an irradiation area in the reticle may be changed in conjunction with a change in the exposure area of the sample 11 to perform screen synthesis. Reference numeral 13 denotes a laser interferometer system that positions the stage 12 based on the current position of the stage 12 detected by the moving mirror 14.
【0012】図1〜図4に示すように、ブラインド6
は、L字状に屈曲する一対の羽根60A,60Bを照明
光の光路と直交させた状態で組み合わせて矩形状の開口
Sを生じさせるもので、羽根60A,60Bの位置を移
動機構61A,61Bで調整して開口Sの大きさを変化
させる。図2および図3に示すように、移動機構61
A,61Bは、羽根60A,60Bが固着される第1の
ブロック610に第2のブロック611および第3のブ
ロック612を重ね合わせたもので、サーボモータとボ
ールねじとを組み合わせた不図示の送り機構により、第
1のブロック610を案内溝y1,y2に沿って移動さ
せるとともに、第2のブロック611を案内溝x1,x
2に沿って移動させて羽根60A,60Bを照明光の光
路と直交する面内で移動させる。図3に示すように、移
動機構61A,61Bは羽根60A,60Bに対して互
いに反対側に配置され、それぞれの第3のブロック61
2は不図示のフレームにより露光装置の本体部分(不図
示)に一体に固定される。なお、図2では一方の羽根6
0A側の移動機構61Aのみを示すが、他方の羽根60
B側の移動機構61Bも同一構成である。As shown in FIG. 1 to FIG.
Is a combination of a pair of blades 60A and 60B bent in an L-shape in a state of being orthogonal to the optical path of the illumination light to generate a rectangular opening S. The positions of the blades 60A and 60B are moved by moving mechanisms 61A and 61B. To change the size of the opening S. As shown in FIG. 2 and FIG.
A and 61B are obtained by superimposing a second block 611 and a third block 612 on a first block 610 to which the blades 60A and 60B are fixed, and are a feed (not shown) combining a servo motor and a ball screw. By the mechanism, the first block 610 is moved along the guide grooves y1 and y2, and the second block 611 is moved along the guide grooves x1 and x.
2 to move the blades 60A and 60B in a plane perpendicular to the optical path of the illumination light. As shown in FIG. 3, the moving mechanisms 61A and 61B are arranged on opposite sides of the blades 60A and 60B, and each of the third blocks 61A and 61B.
2 is integrally fixed to a main body (not shown) of the exposure apparatus by a frame (not shown). In addition, in FIG.
Only the moving mechanism 61A on the 0A side is shown, but the other blade 60
The moving mechanism 61B on the B side has the same configuration.
【0013】図1、図4および図5に示すように、羽根
60A,60Bは遮光板600A,600Bの表面にN
Dフィルタ601A,601Bを一体に取り付けたもの
で、NDフィルタ601A,601Bの開口S側の端部
は遮光板600A,600Bよりも幾らか突出させて設
けられる。図5に示すように、NDフィルタ601A,
601Bの遮光板600A,600Bからの突出部分は
遮光板600A,600Bからの突出量に比例して薄く
なる断面三角形状に形成され、これによりブラインド6
の透過率は開口S上で100%、開口Sの周縁部では開
口Sの中心位置から離れるほど比例的に減少して遮光板
600A,600Bのエッジ位置にて0%になる。ND
フィルタ601A,601Bの遮光板600A,600
Bからの突出量Lは開口Sの全周において一定とされ、
これにより開口Sの周辺部での減光特性は、NDフィル
タ601A,601Bが重なり合う開口Sの対角コーナ
部分を除く全周において等しくなっている。突出量Lの
適正寸法は後述する。なお、突出量Lは、開口Sの対向
する辺同士が等しくなっていればよい。As shown in FIGS. 1, 4 and 5, the blades 60A and 60B are provided on the surfaces of the light-shielding plates 600A and 600B.
The D filters 601A and 601B are integrally attached, and the ends of the ND filters 601A and 601B on the opening S side are provided so as to protrude slightly from the light shielding plates 600A and 600B. As shown in FIG. 5, the ND filter 601A,
The protruding portions of the light shielding plates 601B from the light shielding plates 600A and 600B are formed in a triangular cross section which becomes thinner in proportion to the amount of projection from the light shielding plates 600A and 600B.
Is 100% on the opening S, and decreases in proportion to the distance from the center of the opening S at the periphery of the opening S to become 0% at the edge positions of the light shielding plates 600A and 600B. ND
Light shielding plates 600A, 600 of filters 601A, 601B
The amount of protrusion L from B is constant over the entire circumference of the opening S,
As a result, the dimming characteristics at the periphery of the opening S are equal over the entire circumference except for the diagonal corners of the opening S where the ND filters 601A and 601B overlap. The appropriate dimension of the protrusion amount L will be described later. Note that the protrusion amount L may be such that the opposing sides of the opening S are equal.
【0014】図6はブラインド6の開口Sの大きさを適
当に定め、レチクル9のない状態で露光を行なったとき
の試料11上の露光像および露光量分布を示すものであ
る。図6(A)に示すように、露光位置を完全に分離さ
せて複数回の露光を行なうと、試料11上に結像する矩
形状の露光像P1,P2の周辺部の全周にNDフィルタ
601A,601Bによる減光領域R1,R2が現れて
この部分での露光量が減少する。図6(B)に示すよう
に、減光領域R1,R2の一辺を重ねて露光したとき
は、同図(C)に示すように、減光領域R1,R2の重
複範囲にて一方の減光量が他方の減光量の変動を補うよ
うに変化し、この結果図6(D)に示すように減光領域
R1,R2の重複範囲での合成露光量はNDフィルタ6
01A,601Bの影響を受けない部分の露光量に一致
する。FIG. 6 shows an exposure image and an exposure amount distribution on the sample 11 when the size of the opening S of the blind 6 is appropriately determined and exposure is performed without the reticle 9. As shown in FIG. 6A, when the exposure position is completely separated and exposure is performed a plurality of times, ND filters are formed on the entire periphery of the rectangular exposure images P1 and P2 formed on the sample 11. Dimming regions R1 and R2 due to 601A and 601B appear, and the exposure amount in these portions decreases. As shown in FIG. 6B, when one side of the dimming regions R1 and R2 is exposed while being overlapped, as shown in FIG. 6C, one of the dimming regions R1 and R2 overlaps in the overlapping range. The light amount changes so as to compensate for the fluctuation of the other light reduction amount. As a result, as shown in FIG. 6D, the combined exposure amount in the overlapping range of the light reduction regions R1 and R2 is reduced by the ND filter 6.
It corresponds to the exposure amount of the portion not affected by 01A and 601B.
【0015】次に本実施例の装置で画面合成を行なう手
順を説明する。図7は試料11上を4つの矩形状の露光
領域Ra〜Rdに分割してパターンPrを合成する例を
示すもので、かかる合成を行なう際には、図8に示すよ
うに露光領域Ra〜Rdに対応する4枚のレチクル9a
〜9dを順に使用する。なお、レチクル9a〜9dは、
画面合成時の重複部のみが同一のパターンを有するよう
に描画されている。レチクル9a〜9dの周囲には光の
通過を完全に阻止する透過率0%の遮光帯IBが形成さ
れる。図7には示していないが、露光領域Ra〜Rdの
境界部分は所望量重ね合わされ、ブラインド6の羽根6
0A,60Bは、NDフィルタ601A,601Bによ
る減光領域が露光領域Ra〜Rdの重複部分と一致する
ように各回の露光時に位置決めされる。Next, the procedure for synthesizing screens in the apparatus of this embodiment will be described. FIG. 7 shows an example in which the pattern Pr is synthesized by dividing the sample 11 into four rectangular exposure areas Ra to Rd. When such synthesis is performed, as shown in FIG. Four reticles 9a corresponding to Rd
To 9d are used in order. The reticles 9a to 9d are:
Only the overlapping part at the time of screen composition is drawn so as to have the same pattern. A light-shielding band IB having a transmittance of 0% is formed around the reticles 9a to 9d to completely block the passage of light. Although not shown in FIG. 7, the boundary portions of the exposure regions Ra to Rd are overlapped by a desired amount, and the blades 6 of the blind 6 are overlapped.
Positions 0A and 60B are positioned at each exposure so that the light-attenuated area by the ND filters 601A and 601B coincides with the overlapping portion of the exposure areas Ra to Rd.
【0016】すなわち、図7の左上の露光領域Raを露
光する場合、図8(A)に示すようにレチクル9aの右
辺および下辺側に位置する羽根60Aは、その減光領域
が遮光帯IBから突出するように位置決めされ、レチク
ル9aの左辺および上辺側に位置する羽根60Bは遮光
帯IB内へ完全に後退するように位置決めされる。右上
の露光領域Rbを露光するときは、図8(B)に示すよ
うに、羽根60A,60Bの減光領域がレチクル9bの
左辺および下辺側にて遮光帯IBから突出するように羽
根60A,60Bが位置決めされる。左下の露光領域R
cを露光するときは、図8(C)に示すように、羽根6
0A,60Bの減光領域がレチクル9cの右辺および上
辺側にて遮光帯IBから突出するように羽根60A,6
0Bが位置決めされる。そして、右下の露光領域Rdを
露光するときは、図8(D)に示すように、羽根60
A,60Bの減光領域がレチクル9dの左辺および上辺
側にて遮光帯IBから突出するように羽根60A,60
Bが位置決めされる。That is, when exposing the upper left exposure area Ra in FIG. 7, the blade 60A located on the right side and lower side of the reticle 9a as shown in FIG. The blade 60B positioned so as to protrude and positioned on the left side and upper side of the reticle 9a is positioned so as to completely retract into the light shielding band IB. When exposing the upper right exposure region Rb, as shown in FIG. 8B, the blades 60A, 60B are set so that the dimming regions of the blades 60A, 60B protrude from the light shielding band IB on the left side and the lower side of the reticle 9b. 60B is positioned. Lower left exposure area R
When exposing c, as shown in FIG.
The blades 60A, 60B are so set that the light-reducing areas of 0A, 60B protrude from the light-shielding band IB on the right side and the upper side of the reticle 9c.
OB is positioned. When exposing the lower right exposure region Rd, as shown in FIG.
The blades 60A, 60B are arranged such that the dimming areas of the blades A, 60B protrude from the light-shielding band IB on the left side and the upper side of the reticle 9d.
B is positioned.
【0017】以上の操作により、露光領域Ra〜Rdの
重複範囲では先の露光時の減光領域と後の露光時の減光
領域が図6(B)に示すように重なり合い、これらの重
複部分での合成露光量は図6(D)に示すように他の部
分と等しくなる。このため、パターンPrの露光量が均
一となり、パターンPrの継ぎ目部分でも線幅は変化し
ない。By the above operation, in the overlapping range of the exposure regions Ra to Rd, the dimming region at the time of the previous exposure and the dimming region at the time of the subsequent exposure overlap as shown in FIG. Is equal to the other portions as shown in FIG. 6 (D). For this reason, the exposure amount of the pattern Pr becomes uniform, and the line width does not change even at the joint portion of the pattern Pr.
【0018】また、以上によればパターンの継ぎ目部分
での段差も解消する。この点を図9により説明する。図
9(A)は従来方式による画面合成を示すもので、この
例では隣接する露光領域にδの位置ずれが生じると、同
じ量だけパターンPr1,Pr2の継ぎ目部分に段差が
発生する。これに対して、本実施例の場合には、図9
(B)に示すように隣接する露光領域にδの位置ずれが
生じたとしても、左右のパターンPr1,Pr2は同図
に太線で示すように滑らかに連続する。すなわち、パタ
ーンPr1,Pr2の継ぎ目部分は露光領域の減光範囲
(幅Wの範囲)に一致するので、パターンPr1,Pr
2の継ぎ目部分の各断面位置d1〜d5での露光量は同
図(C)に示すようにそれぞれのエッジに向うほど減少
する。なお、断面位置d1〜d5でのパターンPr1,
Pr2の露光量分布を示す波形は、露光領域のずれ量δ
だけ図9(C)の左右方向にずれて現れる。Further, according to the above, the step at the joint portion of the pattern is also eliminated. This will be described with reference to FIG. FIG. 9 (A) shows screen synthesis by a conventional method. In this example, if a position shift of δ occurs in an adjacent exposure area, a step is generated in a joint portion of the patterns Pr1 and Pr2 by the same amount. On the other hand, in the case of this embodiment, FIG.
As shown in (B), even if the position shift of δ occurs in the adjacent exposure area, the left and right patterns Pr1 and Pr2 continue smoothly as shown by the thick line in FIG. That is, since the joint portion between the patterns Pr1 and Pr2 coincides with the dimming range (range of the width W) of the exposure area, the patterns Pr1 and Pr2
The exposure amount at each of the cross-sectional positions d1 to d5 of the seam portion 2 decreases toward the respective edges as shown in FIG. In addition, the patterns Pr1, at the cross-sectional positions d1 to d5
The waveform indicating the exposure amount distribution of Pr2 is the deviation amount δ of the exposure region.
9C only appears in the left-right direction in FIG.
【0019】パターンPr1,Pr2が完全に重なり合
う位置での合成露光量は等しいので、図9(B)の断面
位置d1〜d5での合成露光量は図9(D)に示すよう
な分布を示し、各断面位置d1〜d5での合成露光量の
最大値はすべて等しくなる。このような露光量分布に対
して、一定の露光量Qc(図示例では最大露光量の50
%)を越えた部分が現像後も試料11に残留するように
レジスト特性を定めると、図9(E)に示すように断面
位置d1〜d5でのパターン幅は一定となり、パターン
Pr1,Pr2が図9(B)の太線のように一定幅を保
ちつつ滑らかに連続する。このようにパターンPr1,
Pr2の継ぎ目部分が滑らかに連続すると、画面合成を
何層も繰り返す場合でも、各層の継ぎ目部分での重ね合
せ誤差の不連続な変化が抑制される。このため、液晶デ
バイスの場合にも画面の継ぎ目部分でのコントラストの
不連続な変化が解消して表示品質が改善される。Since the combined exposure amounts at the positions where the patterns Pr1 and Pr2 completely overlap are equal, the combined exposure amounts at the cross-sectional positions d1 to d5 in FIG. 9B show a distribution as shown in FIG. 9D. The maximum value of the combined exposure amount at each of the cross-sectional positions d1 to d5 becomes equal. For such an exposure distribution, a constant exposure Qc (in the illustrated example, the maximum exposure 50
%), When the resist characteristics are determined so that the portions exceeding the percentage remain on the sample 11 even after development, the pattern widths at the cross-sectional positions d1 to d5 become constant as shown in FIG. As shown by the thick line in FIG. Thus, the pattern Pr1,
When the seam portion of Pr2 is smoothly continuous, discontinuous change of the overlay error at the seam portion of each layer is suppressed even when the screen synthesis is repeated many layers. For this reason, even in the case of a liquid crystal device, discontinuous change in contrast at a joint portion of a screen is eliminated, and display quality is improved.
【0020】ここで、パターンの継ぎ目部分の変化の程
度は、図9(B)から明らかなようにパターンの重複範
囲の長さWを大きく取るほど緩やかとなる。但し、余り
に重複範囲Wを大きくすると画面合成数が増えて効率が
低下することから、重複範囲の長さWは、液晶デバイス
に使用した場合に人間の目で変化を感知できない程度を
基準として設定すればよい。一般的には5〜10mm程度
に設定すれば十分である。そして、かかる長さWは図5
に示したNDフィルタ601A,601Bの突出量Lと
レンズ8,10の投影倍率によって定まる。Here, the degree of change in the joint portion of the pattern becomes gentler as the length W of the overlapping range of the pattern is increased, as is apparent from FIG. 9B. However, if the overlapping range W is too large, the number of screen composites increases and the efficiency decreases. Therefore, the length W of the overlapping range is set based on the degree that a change cannot be perceived by human eyes when used in a liquid crystal device. do it. Generally, it is sufficient to set the thickness to about 5 to 10 mm. And the length W is shown in FIG.
Are determined by the projection amount L of the ND filters 601A and 601B and the projection magnification of the lenses 8 and 10.
【0021】以上説明したように、本実施例の露光装置
によれば、減光特性を持ったNDフィルタ601A,6
01Bと試料11との間に結像用のレンズ8を介在した
ので、試料11上にNDフィルタ601A,601Bの
像を結像させて試料11上で理想的な減光特性を得るこ
とができ、パターンの継ぎ目部分における露光量を精度
良く管理して減光による効果を最大限発揮させ得る。N
Dフィルタ601A,601Bをレチクル9からレンズ
8を介して離間させたので、レチクル9に減光特性を持
たせる必要がなくなるとともに、レチクル9が損傷した
り汚染するおそれがない。さらに、移動機構61A,6
1Bによりレチクル9上での減光位置を調整できるの
で、レチクル9の大きさや露光領域の変化に応じて減光
領域を変更できる。As described above, according to the exposure apparatus of this embodiment, the ND filters 601A and 601 having the light attenuating characteristics are provided.
Since the image forming lens 8 is interposed between the sample 11B and the sample 11, the images of the ND filters 601A and 601B can be formed on the sample 11 to obtain an ideal dimming characteristic on the sample 11. In addition, the exposure amount at the joint portion of the pattern can be controlled with high precision, and the effect of the dimming can be maximized. N
Since the D filters 601A and 601B are separated from the reticle 9 via the lens 8, it is not necessary to provide the reticle 9 with a dimming characteristic, and there is no possibility that the reticle 9 is damaged or contaminated. Further, the moving mechanisms 61A, 6A
Since the dimming position on the reticle 9 can be adjusted by 1B, the dimming area can be changed in accordance with the size of the reticle 9 and a change in the exposure area.
【0022】本実施例では、レチクル9の照明範囲を調
整するためのブラインド6の羽根60A,60Bそのも
のにNDフィルタ601A,601Bを取り付けたが、
図10に示すように、NDフィルタ601A,601B
を羽根60A,60Bから分離し、羽根60A,60B
を移動機構61A,61Bで駆動する一方、NDフィル
タ601A,601Bを移動機構61C,61Dにより
独立に駆動してもよい。この場合、画面合成時に減光を
必要としない辺に関してNDフィルタ601A,601
Bを羽根60A,60Bで設定した照明領域から退避さ
せる。この例では、レチクル上に形成する遮光帯をND
フィルタ601A,601Bによる減光領域の幅よりも
狭く設定してレチクルを有効に利用できる。ちなみに、
NDフィルタ601A,601Bを羽根60A,60B
に組込むと、レチクル上の遮光帯はNDフィルタ601
A,601Bの遮光幅以上必要となる。なお、羽根60
A,60Bから分離させたNDフィルタ601A,60
1Bに、羽根60A,60Bと同様の遮光板600A,
600Bを設けてもよい。In this embodiment, the ND filters 601A and 601B are attached to the blades 60A and 60B of the blind 6 for adjusting the illumination range of the reticle 9.
As shown in FIG. 10 , ND filters 601A, 601B
Are separated from the blades 60A, 60B, and the blades 60A, 60B
May be driven by the moving mechanisms 61A and 61B, while the ND filters 601A and 601B may be independently driven by the moving mechanisms 61C and 61D. In this case, ND filters 601A and 601 are used for sides that do not require dimming during screen composition.
B is retracted from the illumination area set by the blades 60A and 60B. In this example, the light-shielding band formed on the reticle is ND
The reticle can be used effectively by setting it narrower than the width of the dimming region by the filters 601A and 601B. By the way,
The ND filters 601A and 601B are connected to the blades 60A and 60B.
ND filter 601
A, the light shielding width of 601B or more is required. The blade 60
ND filters 601A and 601 separated from A and 60B
1B, a light shielding plate 600A similar to the blades 60A and 60B,
600B may be provided.
【0023】図11は他の例を示すもので、ブラインド
6Aの遮光板600A,600BからNDフィルタを除
去する一方、NDフィルタのみで構成した羽根700
A,700Bと、これらの羽根700A,700Bを駆
動する不図示の移動機構を備えるNDブラインド70を
新たに設け、NDブラインド70とブラインド6Aとの
間にNDブラインド70の像をブラインド6A上に結像
させるレンズ80を設けている。羽根700A,700
Bの詳細は図1の例のNDフィルタ601A,601B
と同様であるため省略する。この例ではNDブラインド
7がブラインド6Aに対して共役な位置にあるので、ブ
ラインド6Aから減光手段を離してもレチクル9上にて
理想的な減光特性が得られる。FIG. 11 shows another example, in which the ND filter is removed from the light shielding plates 600A and 600B of the blind 6A, while the blade 700 composed of only the ND filter is provided.
A and 700B and an ND blind 70 having a moving mechanism (not shown) for driving these blades 700A and 700B are newly provided, and an image of the ND blind 70 is formed between the ND blind 70 and the blind 6A on the blind 6A. A lens 80 for imaging is provided. Blades 700A, 700
Details of B are shown in the ND filters 601A and 601B in the example of FIG.
It is omitted because it is the same as. In this example, since the ND blind 7 is at a position conjugate with the blind 6A, even if the dimming means is separated from the blind 6A, an ideal dimming characteristic can be obtained on the reticle 9.
【0024】以上の実施例と請求項との対応において、
レチクル9,9a〜9dが第1物体を、試料11が第2
物体を構成する。また、図1〜図5の実施例では、超高
圧水銀ランプ1が光源を、フィルタ4,フライアイイン
テグレータ5,レンズ8が照明光学系を、NDフィルタ
601A,601Bが減光手段を、ブラインド6が設定
手段を、ブラインド6の移動機構61A,61Bが減光
位置調整手段を構成し、図11の例では、超高圧水銀ラ
ンプ1が光源を、フィルタ4,フライアイインテグレー
タ5,レンズ80,レンズ8が照明光学系を、NDブラ
インド70が減光手段を、ブラインド6Aが設定手段
を、NDブラインド70の移動機構が減光位置調整手段
を構成する。In correspondence between the above embodiment and the claims,
Reticles 9, 9a to 9d are the first object , and sample 11 is the second object .
Construct an object . Further, in the embodiment of FIGS. 1-5, the ultra-high pressure mercury lamp 1 is a light source, a filter 4, a fly-eye in
The teigrator 5, the lens 8 set the illumination optical system, the ND filters 601A and 601B set the dimming means, and the blind 6 set
Means, moving mechanism 61A of the blind 6, 61B constitute the dimming position adjusting means, in the example of FIG. 11, an ultra-high pressure mercury lamp 1 is a light source, a filter 4, a fly-eye integrators
The lens 5, the lens 80, and the lens 8 are illumination optical systems, the ND blind 70 is dimming means, and the blind 6A is setting means.
The movement mechanism of the ND blind 70 constitutes the dimming position adjusting means.
【0025】図12および図13は、図2に示す移動機
構61Aの変形例を示すものである。この移動機構は、
羽根60Aの角部から互いに直交させて設けたブロック
613x,613yと、ブロック613x,613yの
溝614x,614yに嵌装されるローラ615x,6
15yとを有する。図13に示すように、ローラ615
x,615yはボールネジ616と螺合するナット61
7に回転自在に取り付けられている。ボールネジ616
は図12のx方向およびy方向に1本ずつ設けられ、x
方向に伸びるボールネジ616はローラ615yと、y
方向に伸びるボールネジ616はローラ615xと連結
される。618はボールネジ616を露光装置の本体F
に取り付けられる軸受け、619はサーボモータであ
り、サーボモータ619によりボールネジ616を回転
させてナット617を軸方向に移動させると、ローラ6
15x,615yが溝614x,614yと直交する方
向に移動して羽根60Aが光路と直交する面内を移動す
る。FIGS. 12 and 13 show a modification of the moving mechanism 61A shown in FIG. This moving mechanism
Blocks 613x, 613y provided orthogonal to each other from the corners of the blade 60A, and rollers 615x, 6 fitted in the grooves 614x, 614y of the blocks 613x, 613y.
15y. As shown in FIG.
x and 615y are nuts 61 to be screwed with the ball screw 616.
7 is rotatably mounted. Ball screw 616
Are provided one by one in the x direction and the y direction in FIG.
The ball screw 616 extending in the direction includes a roller 615y and y
The ball screw 616 extending in the direction is connected to the roller 615x. Reference numeral 618 denotes a ball screw 616 which is connected to the main body F of the exposure apparatus.
The bearing 619 is a servo motor. When the ball screw 616 is rotated by the servo motor 619 to move the nut 617 in the axial direction, the roller 6
15x and 615y move in a direction orthogonal to the grooves 614x and 614y, and the blade 60A moves in a plane orthogonal to the optical path.
【0026】本発明で使用する減光手段としては、光学
的なフィルタに限らず、液晶やEC等、光量を減少させ
得るあらゆるものを用いて良い。NDフィルタによる減
光特性は開口Sの中心からの距離に比例して直線的に透
過光量を減少させる例に限らず、露光領域の重複範囲で
の合成露光量が他の部分の露光量に略一致するならば曲
線的に変化させても良い。また、レンズの焦点をずらし
てブラインドの開口のエッジ像をぼかすことでも減光が
可能である。従来のブラインドに加えて第2のブライン
ドを光軸方向にずらして設け、第2のブラインドの開口
の像をレチクル上でぼかすことで減光させてもよい。The dimming means used in the present invention is not limited to an optical filter, but may be any type that can reduce the amount of light, such as liquid crystal or EC. The dimming characteristic by the ND filter is not limited to the example in which the transmitted light amount is linearly reduced in proportion to the distance from the center of the opening S, and the combined exposure amount in the overlapping range of the exposure region is substantially equal to the exposure amount in other portions. If they match, it may be changed in a curve. The light can also be dimmed by shifting the focus of the lens and blurring the edge image of the opening of the blind. In addition to the conventional blind, a second blind may be provided shifted in the optical axis direction, and the image of the opening of the second blind may be blurred on a reticle to reduce the light.
【0027】[0027]
【発明の効果】 以上のように、請求項1記載の露光装
置は、減光手段により第1物体上にて理想的な減光特性
を得ることができる。また、減光手段を第1物体から離
間させたので第1物体自身に減光特性を必要がなく、第
1物体の損傷や汚染のおそれをなくすことができる。請
求項2記載の露光装置は、減光手段を設定手段に設けて
いるので、減光手段と設定手段とを共通の駆動手段で駆
動することができる。請求項3記載の露光装置は、減光
手段により、重複露光を行う部分と、重複部分を行わな
い部分との光量がほぼ等しくなっているので、重複露光
部での段差や重ね合わせ誤差の不連続な変化を解消する
ことができる。請求項4記載の露光装置は、減光手段に
より重複露光を行う部分と、重複部分を行わない部分と
の線幅をほぼ等しくしているので、重複露光部での段差
や重ね合わせ誤差の不連続な変化を解消することができ
る。請求項5記載の露光装置は、減光位置調整手段が減
光位置を調整しているので、第1物体の大きさや露光領
域の重複露光位置の変化に拘わらず同一の減光手段を用
いることができ、多種類の減光手段を用意する必要がな
くなって減光手段の製造や保守管理に要する手間を軽減
することができる。請求項6記載の露光装置は、減光手
段が周辺部内において減光の割合を変更することができ
る請求項7記載の露光方法は、第1物体の周辺部の光量
を正確に減少することができる。また、減光手段を第1
物体から離間させたので第1物体自身に減光特性を必要
がなく、第1物体の損傷や汚染のおそれもなくなって第
1物体の製造や保守管理の負担を軽減することができ
る。請求項8記載の露光方法は、重複露光を行う部分
と、重複部分を行わない部分との光量をほぼ等しくして
いるので、重複露光部での段差や重ね合わせ誤差の不連
続な変化を解消することができる。請求項9記載の露光
方法は、重複露光を行う部分と、重複部分を行わない部
分との線幅をほぼ等しくしているので、重複露光部での
段差や重ね合わせ誤差の不連続な変化を解消することが
できる。請求項10記載の露光方法は、第1物体の大き
さや露光領域の重複露光位置の変化に拘わらず同一の減
光手段を用いることができ、多種類の減光手段を用意す
る必要がなくなって減光手段の製造や保守管理に要する
手間を軽減することができる。請求項11記載の露光方
法は、周辺部内において減光の割合を変更することがで
きる。As described above, in the exposure apparatus according to the first aspect, ideal light-reducing characteristics can be obtained on the first object by the light-reducing means. Further, since the dimming means is separated from the first object, the first object does not need to have a dimming characteristic, and the first object can be prevented from being damaged or contaminated. In the exposure apparatus according to the second aspect, the dimming means is provided in the setting means, so that the dimming means and the setting means can be driven by a common driving means. In the exposure apparatus according to the third aspect, since the light amount of the portion where the overlapping exposure is performed and the portion where the overlapping portion is not performed are substantially equal due to the dimming means, there is no step or overlap error in the overlapping exposure portion. Continuous changes can be eliminated. In the exposure apparatus according to the fourth aspect, since the line width of the portion where the overlapping exposure is performed by the dimming means and the line width of the portion where the overlapping portion is not performed are substantially equal, there is no step or overlap error in the overlapping exposure portion. Continuous changes can be eliminated. In the exposure apparatus according to the fifth aspect, since the dimming position adjusting means adjusts the dimming position, the same dimming means is used regardless of the size of the first object or a change in the overlapping exposure position of the exposure area. Therefore, it is not necessary to prepare various types of dimming means, and the labor required for manufacturing and maintaining and managing the dimming means can be reduced. In the exposure apparatus according to the sixth aspect, the dimming means can change the ratio of the dimming in the peripheral portion. In the exposure method according to the seventh aspect, the light amount in the peripheral portion of the first object can be accurately reduced. it can. The dimming means is the first
Since the first object is separated from the object, the first object itself does not need to have a dimming property, and the first object is not likely to be damaged or contaminated, and the burden of manufacturing and maintaining the first object can be reduced. According to the exposure method of the present invention, since the light amount of the portion where the overlapping exposure is performed and the light amount of the portion where the overlapping portion is not performed are made substantially equal, the step and the discontinuous change of the overlay error in the overlapping exposure portion are eliminated. can do. In the exposure method according to the ninth aspect, the line width of the portion where the overlapping exposure is performed and the line width of the portion where the overlapping portion is not performed are substantially equal. Can be eliminated. In the exposure method according to the tenth aspect, the same dimming means can be used regardless of the size of the first object or the change in the overlapping exposure position of the exposure area, so that it is not necessary to prepare various types of dimming means. The labor required for the manufacture and maintenance of the dimming means can be reduced. In the exposure method according to the eleventh aspect, the ratio of the dimming can be changed in the peripheral portion.
【図1】本発明の一実施例に係る露光装置の概略構成を
示す図。FIG. 1 is a diagram showing a schematic configuration of an exposure apparatus according to one embodiment of the present invention.
【図2】実施例のブラインドの一方の羽根側の構成を示
す斜視図。FIG. 2 is a perspective view showing a configuration on one blade side of the blind of the embodiment.
【図3】実施例のブラインドの側面図。FIG. 3 is a side view of the blind of the embodiment.
【図4】実施例のブラインドの羽根部分の正面図。FIG. 4 is a front view of a blade portion of the blind of the embodiment.
【図5】図4のV−V線における断面と、該断面におけ
る透過率を示す図。FIG. 5 is a diagram showing a cross section taken along line VV of FIG. 4 and transmittance in the cross section.
【図6】試料11上での露光像と露光量との関係を示す
図。FIG. 6 is a diagram showing a relationship between an exposure image and an exposure amount on a sample 11;
【図7】画面合成の一例を示す図。FIG. 7 is a diagram showing an example of screen composition.
【図8】図7の画面合成を行なうときのレチクルと羽根
との位置関係を示す図。FIG. 8 is a diagram showing a positional relationship between a reticle and a blade when performing the screen combining of FIG. 7;
【図9】パターンの継ぎ目部分での段差の解消理由を説
明するための図。FIG. 9 is a diagram for explaining a reason for eliminating a step at a joint portion of a pattern.
【図10】NDフィルタを照明範囲設定用の羽根から分
離した例を示す図。FIG. 10 is a diagram illustrating an example in which an ND filter is separated from a blade for setting an illumination range.
【図11】本発明の他の例に係る露光装置の概略構成を
示す図。FIG. 11 is a diagram showing a schematic configuration of an exposure apparatus according to another example of the present invention.
【図12】ブラインドの移動機構の変形例を示す図。FIG. 12 is a view showing a modified example of a blind moving mechanism.
【図13】図12の例におけるボールネジ周辺の構成を
示す図。FIG. 13 is a diagram showing a configuration around a ball screw in the example of FIG. 12;
1 超高圧水銀ランプ 6 ブラインド 8 レンズ 9,9a,9b,9c,9d レチクル 10 レンズ 11 試料 60A,60B 羽根 70 NDブラインド 600A,600B 羽根の遮光板 601A,601B NDフィルタ S 開口 REFERENCE SIGNS LIST 1 ultra-high pressure mercury lamp 6 blind 8 lens 9, 9a, 9b, 9c, 9d reticle 10 lens 11 sample 60A, 60B blade 70 ND blind 600A, 600B blade light shielding plate 601A, 601B ND filter S aperture
Claims (11)
ンを第2物体に露光する露光装置において、 前記光束を前記第1物体に導き、前記第1物体を照明す
る照明光学系と、前記第2物体に露光されたパタ−ンの一部に前記第1物
体のパタ−ンの一部が重複するように前記第1物体の照
射領域を設定する設定手段と、 前記照明光学系に配置され、前記設定手段が設定した前
記第1物体の照明領域の周辺部の光量を減光する減光手
段とを備えたことを特徴とする露光装置。1. A pattern of a first object formed by a light beam from a light source.
An exposure apparatus for exposing a light beam to a second object , comprising: an illumination optical system that guides the light beam to the first object and illuminates the first object; and an illumination optical system that partially exposes the pattern to the second object. First thing
The first object is illuminated so that a part of the body pattern overlaps.
Comprising setting means for setting the elevation region, disposed in the illumination optical system, a light-reducing means for reducing a light quantity periphery of the illumination region before said setting means has set <br/> Symbol first object An exposure apparatus characterized in that:
れていることを特徴とする請求項1記載の露光装置。Wherein said dimming means, an exposure apparatus according to claim 1, characterized in that provided on the setting means.
ンのうち前記重複露光を行う部分と、前記重複部分を行
わない部分との光量がほぼ等しくなるように前記減光を
行うことを特徴とする請求項1または2記載の露光装
置。3. The light reducing means according to claim 1, wherein said light reducing means comprises a pattern for said first object.
3. The exposure apparatus according to claim 1, wherein the dimming is performed so that a light amount of a portion where the overlap exposure is performed and a light amount of a portion where the overlap portion is not performed are substantially equal.
ンのうち前記重複露光を行う部分と、前記重複部分を行
わない部分との線幅がほぼ等しくなるように前記減光を
行うことを特徴とする請求項1または2記載の露光装
置。4. The method according to claim 1, wherein the dimming unit includes a pattern for the first object.
3. The exposure apparatus according to claim 1, wherein the dimming is performed such that a line width of a portion where the overlapping exposure is performed and a portion where the overlapping portion is not performed are substantially equal.
減光位置調整手段を備えたことを特徴とする請求項1〜
4のいずれか一項記載の露光装置。5. A dimming position adjusting means for adjusting a dimming position by said dimming means.
Exposure apparatus according to any one claim of 4.
前記減光の割合を変更することを特徴とする請求項1〜
5のいずれか一項記載の露光装置。6. The dimming unit according to claim 1, wherein the dimming ratio changes the dimming ratio in the peripheral portion.
Exposure apparatus according to any one claim of 5.
体に導いて、前記第1物体のパタ−ンを第2物体に露光
する露光方法において、 前記照明光学系に減光手段を設け、前記第2物体に露光されたパタ−ンの一部に前記第1物
体のパタ−ンの一部が重複するように前記第1物体の照
射領域を設定し、 前記第1物体を照明する際に、前記減光手段により前記
第1物体の照射領域の周辺部の光量を減光することを特
徴とする露光方法。7. An exposure method for guiding a light beam from a light source to a first object by an illumination optical system and exposing a pattern of the first object to a second object, wherein the illumination optical system is provided with dimming means. A part of the pattern exposed on the second object;
The first object is illuminated so that a part of the body pattern overlaps.
An exposure method comprising: setting a projection area; and illuminating the first object, the dimming unit diminishes a light amount in a peripheral portion of an irradiation area of the first object.
露光を行う部分と、前記重複部分を行わない部分との光
量がほぼ等しくなるように前記減光を行うことを特徴と
する請求項7記載の露光方法。8. The method according to claim 1, wherein, in the pattern of the first object, the dimming is performed so that a light amount of a portion where the overlapping exposure is performed and a light amount of a portion where the overlapping portion is not performed are substantially equal. Item 8. The exposure method according to Item 7 .
露光を行う部分と、前記重複部分を行わない部分との線
幅がほぼ等しくなるように前記減光を行うことを特徴と
する請求項7記載の露光方法。9. The method according to claim 1, wherein the dimming is performed so that a line width of a portion where the overlapping exposure is performed and a portion where the overlapping portion is not performed in the pattern of the first object are substantially equal. The exposure method according to claim 7 .
を調整することを特徴とする請求項7〜9のいずれか一
項記載の露光方法。10. The exposure method according to claim 7 , wherein a dimming position of the dimming of the peripheral portion is adjusted.
記減光の割合を変更することを特徴とする請求項7〜1
0のいずれか一項記載の露光方法。11. The dim light according to claim 7 , wherein the rate of the dim light is changed in the peripheral portion.
0. The exposure method according to any one of 0 .
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP03015093A JP3284645B2 (en) | 1993-02-19 | 1993-02-19 | Exposure apparatus and exposure method |
| US08/195,192 US5486896A (en) | 1993-02-19 | 1994-02-14 | Exposure apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP03015093A JP3284645B2 (en) | 1993-02-19 | 1993-02-19 | Exposure apparatus and exposure method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH06244077A JPH06244077A (en) | 1994-09-02 |
| JP3284645B2 true JP3284645B2 (en) | 2002-05-20 |
Family
ID=12295739
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP03015093A Expired - Lifetime JP3284645B2 (en) | 1993-02-19 | 1993-02-19 | Exposure apparatus and exposure method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3284645B2 (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR0143814B1 (en) * | 1995-03-28 | 1998-07-01 | 이대원 | Semiconductor exposure equipment |
| JP2000199973A (en) | 1998-11-04 | 2000-07-18 | Nikon Corp | Exposure method, exposure apparatus, and mask |
| JP2001358062A (en) * | 2000-04-11 | 2001-12-26 | Nikon Corp | Exposure method and exposure apparatus |
| JP4549519B2 (en) * | 2000-12-04 | 2010-09-22 | 大日本印刷株式会社 | Exposure apparatus and exposure method |
| KR20050068475A (en) * | 2003-12-30 | 2005-07-05 | 동부아남반도체 주식회사 | Blind of exposure device for manufacturing semiconductor |
| CN110967920A (en) * | 2018-09-28 | 2020-04-07 | 长鑫存储技术有限公司 | Double photomask and exposure method |
-
1993
- 1993-02-19 JP JP03015093A patent/JP3284645B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH06244077A (en) | 1994-09-02 |
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