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JP3289486B2 - Surface acoustic wave device and method of manufacturing electronic circuit - Google Patents
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JP3289486B2 - Surface acoustic wave device and method of manufacturing electronic circuit - Google Patents

Surface acoustic wave device and method of manufacturing electronic circuit

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Publication number
JP3289486B2
JP3289486B2 JP10963194A JP10963194A JP3289486B2 JP 3289486 B2 JP3289486 B2 JP 3289486B2 JP 10963194 A JP10963194 A JP 10963194A JP 10963194 A JP10963194 A JP 10963194A JP 3289486 B2 JP3289486 B2 JP 3289486B2
Authority
JP
Japan
Prior art keywords
acoustic wave
surface acoustic
solute
wave device
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP10963194A
Other languages
Japanese (ja)
Other versions
JPH07321584A (en
Inventor
敬三郎 倉増
俊夫 須川
宗子 高橋
真守 曽我
茂雄 生田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Panasonic Holdings Corp
Original Assignee
Panasonic Corp
Matsushita Electric Industrial Co Ltd
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Filing date
Publication date
Application filed by Panasonic Corp, Matsushita Electric Industrial Co Ltd filed Critical Panasonic Corp
Priority to JP10963194A priority Critical patent/JP3289486B2/en
Publication of JPH07321584A publication Critical patent/JPH07321584A/en
Application granted granted Critical
Publication of JP3289486B2 publication Critical patent/JP3289486B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は移動体電話や各種の通信
機器分野でフィルターや発振器として用いられる表面弾
性波素子等の圧電素子を高精度に周波数調整する為の圧
電素子の製造方法、および圧電素子を使用した電子回路
の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing a piezoelectric element for precisely adjusting the frequency of a piezoelectric element such as a surface acoustic wave element used as a filter or an oscillator in the field of mobile telephones and various communication devices, and a method of manufacturing the same. The present invention relates to a method for manufacturing an electronic circuit using a piezoelectric element.

【0002】[0002]

【従来の技術】移動体電話や各種の通信分野でフィルタ
ーや発振器として用いられる表面弾性波素子は圧電体基
板の音速と表面に形成される櫛形電極のパターン形状、
膜厚により周波数が一義的に決まる。櫛形電極のパター
ン作成は半導体技術を用いて作成でき、小型化が可能で
あることから多く使用されてきている。しかしながら、
表面弾性波素子の高周波化にともない、電極の膜厚やパ
ターン幅のばらつきによる周波数ばらつきにより歩留ま
り低下が問題となってきている。このために、従来は電
極の膜厚が厚すぎた場合、電極材料をエッチングする液
に浸漬して表面の電極を一定量ウェットエッチング除去
することで周波数調整を行っている。また、プラズマを
用いて圧電体結晶表面を一定量ドライエッチングして周
波数を調整する方法も行われている。
2. Description of the Related Art A surface acoustic wave device used as a filter or an oscillator in a mobile telephone or various communication fields has a sound velocity of a piezoelectric substrate and a pattern shape of a comb-shaped electrode formed on the surface.
The frequency is uniquely determined by the film thickness. Patterns of comb-shaped electrodes have been widely used because they can be formed using semiconductor technology and can be miniaturized. However,
With the increase in the frequency of the surface acoustic wave device, a reduction in yield due to variations in frequency due to variations in electrode film thickness and pattern width has become a problem. For this reason, conventionally, when the thickness of the electrode is too thick, the frequency is adjusted by immersing the electrode material in a solution for etching to remove a predetermined amount of the electrode on the surface by wet etching. In addition, a method of adjusting the frequency by dry-etching the surface of a piezoelectric crystal by a predetermined amount using plasma has been performed.

【0003】[0003]

【発明が解決しようとする課題】電極の表面を一定量ウ
ェットエッチング除去する方法では、エッチング除去す
る量の制御は時間による管理しかできず、液の濃度の変
動や時間制御のばらつきなどにより、逆にばらつきを大
きくするなどの問題があった。また、電極表面のエッチ
ングによる表面の荒れにより大きな電力を印加した場合
壊れやすくなることも問題としてあった。
In the method of removing a predetermined amount of the surface of the electrode by wet etching, the amount of the etching removed can be controlled only by time. There was a problem that variation was increased. Another problem is that when a large power is applied due to surface roughness due to etching of the electrode surface, the electrode surface becomes fragile.

【0004】プラズマを用いて基板である圧電体結晶表
面をドライエッチングする方法は装置が高価である点
や、エッチング量の正確な制御が困難である等の課題が
あり、本格的な実用にはなっていない。
The method of dry etching the surface of a piezoelectric crystal as a substrate using plasma has problems such as the fact that the apparatus is expensive and that it is difficult to accurately control the amount of etching. is not.

【0005】本発明は上記従来の問題点を解決し、高精
度に周波数調整する為の圧電素子の製造方法、およびそ
れを使用した電子回路の製造方法を提供することを目的
とする。
An object of the present invention is to solve the above-mentioned conventional problems and to provide a method of manufacturing a piezoelectric element for adjusting the frequency with high accuracy, and a method of manufacturing an electronic circuit using the same.

【0006】[0006]

【課題を解決するための手段】本発明は、単分子層を形
成するとそれ以上の膜成長が止まるという化学吸着膜の
特性を利用して、表面弾性波素子の周波数を所定の値に
制御するものである。
According to the present invention, the frequency of a surface acoustic wave device is controlled to a predetermined value by utilizing the characteristic of a chemically adsorbed film that the growth of a film is stopped when a monomolecular layer is formed. Things.

【0007】より具体的には、調整する周波数に応じて
分子鎖長の異なるクロロシラン化合物よりなる化学吸着
液を用意して表面弾性波素子の少なくとも表面波が励起
される領域上に化学吸着膜を形成することで所定の周波
数を得ることを可能とするものである。
More specifically, a chemically adsorbed liquid comprising a chlorosilane compound having a different molecular chain length according to the frequency to be adjusted is prepared, and a chemically adsorbed film is formed on at least a region of the surface acoustic wave device where surface waves are excited. By forming it, it is possible to obtain a predetermined frequency.

【0008】また、分子の両端にクロロシリル基を有す
るビストリクロロシラン系誘導体よりなる化学吸着膜を
用いて、調整する周波数に応じてこの化学吸着膜を繰り
返し積層形成することで所定の周波数を得ることを可能
とするものである。また、ビストリクロロシラン系誘導
体よりなる化学吸着膜を少なくとも1層以上形成した
後、クロロシラン系化合物よりなる化学吸着膜を形成し
て所定の周波数を得ることを可能とするものである。
Further, a predetermined frequency can be obtained by repeatedly laminating the chemical adsorption film according to the frequency to be adjusted using a chemical adsorption film made of a bistrichlorosilane derivative having chlorosilyl groups at both ends of the molecule. It is possible. Further, after forming at least one layer of a chemisorption film made of a bistrichlorosilane-based derivative, a chemisorption film made of a chlorosilane-based compound is formed so that a predetermined frequency can be obtained.

【0009】[0009]

【作用】化学吸着膜は一定の分子構造を有する単分子膜
が生成するとそれ以上は膜形成が行われなくなる性質が
あるので、その溶液に浸けると、浸漬時間にかかわらず
ある一定の膜厚即ち一分子層の厚みが自然に生成され
る。分子鎖長の異なる化学吸着膜を用いるとそれぞれの
分子鎖長に応じて、長いものは厚く、短いものは薄く、
一定の膜厚の絶縁膜が形成される。従って、種々の分子
鎖長の化学吸着物質を用意し、選択的に使用することに
より、形成される膜の厚さと密度を自由に、且つ精度良
く変えることができる。表面弾性波素子の表面上の物質
の質量の大小により、その表面弾性波素子の固有周波数
がシフトする性質があるので、上記のように化学吸着膜
により、種々の厚みと密度の単分子層膜を形成すること
により、周波数の調整が精度良く可能となる。
When a monomolecular film having a certain molecular structure is formed, the film cannot be formed any more. Therefore, when the film is immersed in the solution, a certain film thickness is obtained regardless of the immersion time. The monolayer thickness is naturally generated. When using chemisorption films with different molecular chain lengths, the longer ones are thicker, the shorter ones are thinner,
An insulating film having a constant thickness is formed. Therefore, the thickness and density of the formed film can be freely and accurately changed by preparing and selectively using chemisorbed substances having various molecular chain lengths. Since the natural frequency of the surface acoustic wave device shifts depending on the mass of the substance on the surface of the surface acoustic wave device, the monolayer film of various thicknesses and densities is formed by the chemisorption film as described above. , The frequency can be adjusted with high accuracy.

【0010】さらに、ビストリクロロシラン系誘導体よ
りなる化学吸着膜は水処理により膜表面にOH基が形成
されるため積層形成が可能であり、この化学吸着膜では
一定の膜厚の整数倍で形成し、周波数を調整可能であ
る。
Furthermore, a chemically adsorbed film made of a bistrichlorosilane-based derivative can be formed into a stack because an OH group is formed on the film surface by water treatment. , The frequency is adjustable.

【0011】[0011]

【実施例】 (実施例1)第1の実施例では分子鎖長の異なる4種の
化学吸着膜を用いて周波数の調整を行った。図2は本実
施例で使用した表面弾性波素子の斜視図であり、図3は
図2のA−A′断面の表面近傍を示す図である。図に於
いて、1は圧電体基板、2はアルミニウムよりなる櫛形
電極である。図4,図5は分子量の異なる化学吸着膜3
および4を形成した断面形状を示す図である。化学吸着
膜の形成は以下の手順で行った。まず、櫛形電極を形成
したウエハ状態(多数個集合状態)の基板について周波
数を測定して目標とする周波数とのずれを求める。この
値により使用する化学吸着膜の材料を選定する。選定に
あたっては、目標とする周波数(設定周波数)とのずれ
が小さいものに対しては、分子鎖長の短い溶質を含む溶
液を選び、逆に設定周波数とのずれが大きいものに対し
ては分子鎖長の長い溶質を含む溶液を選ぶ。具体的には
クロロシランに鎖式炭化水素が結合した溶質の、分子量
の異なるものを種々溶かしたような化学吸着溶液の中か
ら適切なものを選定する。
EXAMPLES (Example 1) In the first example, the frequency was adjusted using four types of chemisorption films having different molecular chain lengths. FIG. 2 is a perspective view of the surface acoustic wave device used in the present embodiment, and FIG. 3 is a diagram showing the vicinity of the surface in the AA ′ section of FIG. In the figure, 1 is a piezoelectric substrate, and 2 is a comb-shaped electrode made of aluminum. 4 and 5 show chemical adsorption films 3 having different molecular weights.
It is a figure which shows the cross-sectional shape which formed 4 and 4. The formation of the chemical adsorption film was performed in the following procedure. First, the frequency of a substrate in a wafer state (multiple-piece state) on which comb-shaped electrodes are formed is measured to determine a deviation from a target frequency. The material of the chemical adsorption film to be used is selected based on this value. In the selection, a solution containing a solute with a short molecular chain length is selected for those with a small deviation from the target frequency (set frequency), and conversely, for those with a large deviation from the set frequency. Select a solution containing a long chain solute. Specifically, a suitable solute is selected from a chemisorption solution obtained by dissolving various types of solutes having different molecular weights, in which a chain hydrocarbon is bonded to chlorosilane.

【0012】窒素雰囲気中でクロロシラン系化合物の溶
質を含んだ化学吸着溶液に基板を浸漬すると、電極であ
るアルミニウムの酸化物上のOH基、基板表面上のOH
基とクロロシラン系化合物が脱塩酸反応を起こし基板と
強固な結合を生じる。化学吸着膜は所定の単分子膜が形
成されるとそれ以上は反応が生じなく一定の膜厚が自動
的に作成される。その後、クロロホルム洗浄、流水洗浄
することで余分な分子や隣同士の分子間での脱塩酸反応
による結合を生じさせて分子間の強固な結合を作る。
When a substrate is immersed in a chemisorption solution containing a solute of a chlorosilane compound in a nitrogen atmosphere, OH groups on an aluminum oxide as an electrode and OH groups on a substrate surface
The group and the chlorosilane compound cause a dehydrochlorination reaction to form a strong bond with the substrate. When a predetermined monomolecular film is formed, the chemical adsorption film does not react any more and a constant film thickness is automatically formed. Thereafter, by washing with chloroform and washing with running water, extra molecules and bonds between adjacent molecules are generated by a dehydrochlorination reaction to form strong bonds between the molecules.

【0013】この結果、電極のアルミニウム表面の酸化
膜と圧電体基板の両面に化学吸着膜が形成される。これ
を図4と図5に示した。図において、それぞれの膜厚は
正確な縮尺倍率のものではなく電極の膜厚は約500n
mに対して化学吸着膜の膜厚は約1.5nm〜3nmで
ある。図1は図4で使用した化学吸着膜の分子構造と櫛
形電極との結合状態を示す図であり、図6は図5で使用
した化学吸着膜の基板及び電極との結合状態を示す図で
ある。これらの図に於いて、1は圧電体基板、2はアル
ミニウムよりなる櫛形電極、3はクロロシラン化合物よ
りなる単分子層の電気絶縁性化学吸着膜A、4は同様に
クロロシラン化合物よりなる単分子層の電気絶縁性化学
吸着膜Bを示す。さらに、図示していないが分子量の異
なる化学吸着膜C,Dも同様にして形成した。
As a result, a chemical adsorption film is formed on the oxide film on the aluminum surface of the electrode and on both surfaces of the piezoelectric substrate. This is shown in FIG. 4 and FIG. In the figure, each film thickness is not an accurate scale factor, and the film thickness of the electrode is about 500 n.
The thickness of the chemisorption film is about 1.5 nm to 3 nm with respect to m. FIG. 1 is a diagram showing the bonding state between the molecular structure of the chemisorption film used in FIG. 4 and the comb-shaped electrode, and FIG. 6 is a diagram showing the bonding state of the chemisorption film used in FIG. 5 to the substrate and the electrodes. is there. In these figures, 1 is a piezoelectric substrate, 2 is a comb-shaped electrode made of aluminum, 3 is a monolayer of electrically insulating chemisorption film A made of a chlorosilane compound, and 4 is a monolayer made of a chlorosilane compound. 2 shows an electrically insulating chemisorption film B. Further, although not shown, chemical adsorption films C and D having different molecular weights were formed in the same manner.

【0014】A,B,C,Dのもととなる溶質の分子鎖
長はA<B<C<Dの関係になっている。
The molecular chain lengths of the solutes on which A, B, C and D are based have a relationship of A <B <C <D.

【0015】図7はこのようにして形成した4種類の化
学吸着膜による周波数変化を求めた結果である。
FIG. 7 shows the results of frequency changes obtained by the four types of chemically adsorbed films thus formed.

【0016】各組成の溶液について3回ずつ絶縁膜の全
くない基板に成膜し、成膜の前の周波数f0と成膜後の
周波数fとの差(周波数変化)を表わしたものである。
各結果は白丸で表している。分子鎖長の長いものほど、
周波数変化も大きくなっているのがわかる。材料により
分子量が異なるために直線的な関係は得られないが、同
一材料を用いれば周波数変化は非常に再現性が良く、化
学吸着膜の効果が確認された。
The difference (frequency change) between the frequency f 0 before film formation and the frequency f after film formation is shown three times for each solution of each composition on a substrate without any insulating film. .
Each result is represented by a white circle. The longer the molecular chain length,
It can be seen that the frequency change is also large. Although a linear relationship cannot be obtained because the molecular weight differs depending on the material, the frequency change is very good when the same material is used, and the effect of the chemical adsorption film is confirmed.

【0017】また、図1および図6の分子構造図では各
単分子の隣合わせのSi同士が酸素によって結合されて
いるが、このような結合の存在は本発明の必要条件では
ない。Si同士の酸素による結合の具体的方法について
は実施例2にて更に詳細に述べることにする。
In the molecular structure diagrams of FIGS. 1 and 6, adjacent Si atoms of each single molecule are bonded by oxygen, but the presence of such a bond is not a necessary condition of the present invention. The specific method of bonding of Si with oxygen will be described in more detail in Example 2.

【0018】なお、上記第1の実施例において溶液とし
てクロロシラン系化合物の溶質を含んだ化学吸着溶液を
用いたが、この代りに溶質としてアルコキシシラン系化
合物を含むもの、またはクロロシラン系化合物とアルコ
キシシラン系化合物の両方を含むものを用いても同様の
効果が得られる。
In the first embodiment, a chemisorption solution containing a solute of a chlorosilane compound was used as the solution. Instead, a solution containing an alkoxysilane compound as a solute, or a chlorosilane compound and an alkoxysilane The same effect can be obtained by using a compound containing both of the system compounds.

【0019】(実施例2)第2の実施例では、ビストリ
クロロシラン系誘導体を用いて周波数の調整を行った。
ビストリクロロシラン系誘導体は分子構造として両端に
クロロシリル基(SiCl3−)を有しているので積層
化が可能である。本実施例では以下のようにして形成し
た。
Embodiment 2 In the second embodiment, the frequency was adjusted using a bistrichlorosilane-based derivative.
Since the bistrichlorosilane-based derivative has a chlorosilyl group (SiCl 3 −) at both ends as a molecular structure, it can be laminated. In the present embodiment, it was formed as follows.

【0020】櫛形電極が形成されたウエハ状態の圧電体
基板の表面弾性波素子の周波数を測定して目標とする値
との差異を求める。この値に基づいて積層する回数を決
める。化学吸着膜の形成は実施例1と基本的に同じであ
るが、1回形成後にさらに同一の液に浸漬して同じ膜を
積層する点が異なる。
The frequency of the surface acoustic wave element of the piezoelectric substrate in the wafer state on which the comb-shaped electrodes are formed is measured to determine the difference from the target value. The number of laminations is determined based on this value. The formation of the chemically adsorbed film is basically the same as in Example 1, except that the same film is laminated by immersing in the same liquid after forming once.

【0021】具体的な成膜方法としては以下の手順で行
った。最初にビストリクロロシラン誘導体よりなる溶質
を含む溶液中に基板を浸漬して、基板表面のOH基とビ
ストリクロロシラン誘導体に脱塩酸反応を生じさせて単
分子膜を形成させる。この後、クロロホルム洗浄により
余分な分子を除去し、さらに流水洗浄することで隣同士
の分子間でも脱塩酸反応による結合を生じさせるととも
に、単分子膜の表面のクロル基を脱塩酸反応によりOH
基に置換させる。このようにして1層の成膜が完了す
る。さらに積層する場合には単分子膜表面に前記流水洗
浄により形成されたOH基が存在するため上記と同一の
手順を繰り返すことにより、2層目以降の各単分子層を
形成する。
The specific procedure was as follows. First, the substrate is immersed in a solution containing a solute composed of a bistrichlorosilane derivative, and a OH group on the substrate surface and the bistrichlorosilane derivative undergo a dehydrochlorination reaction to form a monomolecular film. Thereafter, excess molecules are removed by washing with chloroform, and further washing with running water is performed to form a bond between adjacent molecules by a dehydrochlorination reaction, and chloro groups on the surface of the monomolecular film are subjected to OH by a dehydrochlorination reaction.
Group. Thus, the formation of one layer is completed. In the case of further laminating, since the OH groups formed by the washing with running water are present on the surface of the monomolecular film, the same procedure as above is repeated to form the second and subsequent monomolecular layers.

【0022】図8から図10は、表面弾性波素子の形成
前後の断面形状を示す。図8は形成前の状態であり、図
9は1層形成したもので、図10は2層形成したものを
示す。図11は1層形成した膜の分子構造状態を示す。
これらの図に於いて、1は圧電体基板、2はアルミニウ
ムよりなる櫛形電極、6はビスクロロシラン系誘導体よ
りなる化学吸着膜を1層形成したものであり、7は同様
に積層した2層目の化学吸着膜である。
8 to 10 show cross-sectional shapes before and after the formation of the surface acoustic wave device. 8 shows a state before formation, FIG. 9 shows a state in which one layer is formed, and FIG. 10 shows a state in which two layers are formed. FIG. 11 shows the molecular structure of the film formed in one layer.
In these figures, 1 is a piezoelectric substrate, 2 is a comb-shaped electrode made of aluminum, 6 is a one-layer chemically adsorbed film made of a bischlorosilane-based derivative, and 7 is a second layer similarly laminated. Is a chemisorption film.

【0023】本実施例では、2種類のビストリクロロシ
ラン系誘導体を用いて周波数調整の効果を確認した。
In this example, the effect of frequency adjustment was confirmed using two types of bistrichlorosilane derivatives.

【0024】図12にこの結果を示す。図の縦軸は図7
と同様に周波数変化であり、黒丸で表わされるのは一つ
の種類のビストリクロロシラン系誘導体で各積層回数に
つき3回ずつ試作をしたデータ、白丸で表わされるのは
他の種類のものでのデータである。白丸のものと黒丸の
ものとでは分子量が異なるために周波数変化割合は異な
るが、両者ともに再現性があり、且つ試験した範囲では
(特に2回目以降)積層回数に対して直線的な周波数変
化が得られた。
FIG. 12 shows the result. The vertical axis of FIG.
The frequency change is the same as the above. The black circles represent data of one type of bistrichlorosilane-based derivative prototyped three times for each lamination, and the white circles represent data for other types. is there. The frequency change ratio is different between the white circle and the black circle due to the difference in molecular weight, but both are reproducible, and within the tested range (especially after the second time), the frequency change is linear with the number of laminations. Obtained.

【0025】なお、上記第2の実施例においてビストリ
クロロシラン誘導体よりなる溶質を含む溶液を用いた
が、溶質としてこのビストリクロロシラン誘導体の代り
に、両端にアルコキシシリル基を有するビストリアルコ
キシシラン誘導体を、またはビストリクロロシラン誘導
体とビストリアルコキシシラン誘導体の両化合物を含む
溶液を用いても同様の効果が得られる。
In the second embodiment, a solution containing a solute consisting of a bistrichlorosilane derivative was used. Instead of the bistrichlorosilane derivative, a bistrialkoxysilane derivative having alkoxysilyl groups at both ends was used as the solute, or The same effect can be obtained by using a solution containing both a bistrichlorosilane derivative and a bistrialkoxysilane derivative.

【0026】(実施例3)第3の実施例ではビストリク
ロロシラン系誘導体とクロロシラン系化合物の両方を積
層して周波数調整を行った。具体的な方法としては以下
の通りである。図11に示す分子構造図はビストリクロ
ロシラン系誘導体を用いて1層の単分子層6を櫛形電極
2上に形成したものである。これは実施例2で述べたも
のと同じである。この形成工程を4回繰り返すことによ
り、4層までの積層を実施例2と同一の方法で行い、そ
の後さらにクロロシラン系化合物を用いて最終層の積層
を行った。この場合の化学吸着膜の形成は実施例1に示
す図6の単分子層4と同様な方法で行った。このように
して作成した表面弾性波素子は化学吸着膜の単分子層6
を1層形成してその上に化学吸着膜の単分子層4を積層
したときの周波数変化110KHzから、化学吸着膜の
単分子層6を4層積層して化学吸着膜の単分子層4を1
層積層した場合の周波数変化185KHzまでが得られ
た。本実施例では、単分子層6をビストリクロロシラン
系誘導体を用いて1層から4層まで積層しさらにクロロ
シラン系化合物により単分子層4を積層したが、この組
み合わせは特に限定されるものではなく、ビストリアル
コキシシラン系誘導体よりなる化学吸着膜に対してクロ
ロシラン系化合物よりなる化学吸着膜とする等、本実施
例の材料のみでなく各種材料を組み合わせても積層可能
である。このような各種の材料の組み合わせを用いれば
目標とする周波数を得ることが自由に行える。
(Embodiment 3) In the third embodiment, both the bistrichlorosilane-based derivative and the chlorosilane-based compound were laminated to adjust the frequency. The specific method is as follows. The molecular structure diagram shown in FIG. 11 is one in which one monolayer 6 is formed on the comb-shaped electrode 2 using a bistrichlorosilane-based derivative. This is the same as that described in the second embodiment. By repeating this forming step four times, lamination up to four layers was performed in the same manner as in Example 2, and then a final layer was further laminated using a chlorosilane-based compound. The formation of the chemical adsorption film in this case was performed in the same manner as in the monomolecular layer 4 shown in FIG. The surface acoustic wave device thus prepared is a monolayer 6 of a chemisorption film.
Is formed, and from the frequency change of 110 KHz when the monolayer 4 of the chemisorption film is laminated thereon, four monolayers 6 of the chemisorption film are laminated to form the monolayer 4 of the chemisorption film. 1
A frequency change of up to 185 KHz when the layers were stacked was obtained. In this embodiment, the monomolecular layer 6 is laminated from one to four layers using a bistrichlorosilane-based derivative, and the monomolecular layer 4 is further laminated using a chlorosilane-based compound. However, this combination is not particularly limited. It is possible to laminate not only the material of the present embodiment but also various materials in combination, such as a chemically adsorbed film made of a bistrialkoxysilane-based derivative to a chemically adsorbed film made of a chlorosilane-based compound. The target frequency can be freely obtained by using such a combination of various materials.

【0027】また、表面層にフッ素を結合した分子鎖を
多くもってくる分子構造にすることにより、化学吸着膜
表面を撥水性とする事ができ櫛形電極のアルミニウムの
腐食を防止することも可能となり、信頼性の高い表面弾
性波が得られる。
Further, by making the surface layer have a molecular structure in which a large number of fluorine-bonded molecular chains are provided, the surface of the chemically adsorbed film can be made water-repellent, and the corrosion of aluminum of the comb-shaped electrode can be prevented. Thus, a highly reliable surface acoustic wave can be obtained.

【0028】(実施例4)第4の実施例では、櫛形電極
を形成した表面弾性波素子の櫛形電極部付近を水溶性の
樹脂で覆い、その後化学吸着膜を形成した。化学吸着膜
としてはクロロシラン系化合物を用いた。化学吸着膜の
形成は実施例1と同様に行い、最後に水洗を行い水溶性
樹脂を溶かすことで樹脂上に形成された化学吸着膜をリ
フトオフにより除去した。図13はリフトオフ後の表面
弾性波素子の断面形状を示す図である。本実施例では化
学吸着膜8は櫛形電極2の間の部分のみに作成されてい
る。この場合には周波数変化は全面に形成したときより
も小さい結果となったが、リップルや挿入損失は改善さ
れた。
(Embodiment 4) In the fourth embodiment, the vicinity of a comb-shaped electrode portion of a surface acoustic wave device having a comb-shaped electrode is covered with a water-soluble resin, and then a chemical adsorption film is formed. A chlorosilane compound was used as the chemical adsorption film. The formation of the chemically adsorbed film was performed in the same manner as in Example 1. Finally, the film was washed with water and the water-soluble resin was dissolved to remove the chemically adsorbed film formed on the resin by lift-off. FIG. 13 is a diagram showing a cross-sectional shape of the surface acoustic wave device after lift-off. In the present embodiment, the chemical adsorption film 8 is formed only in the portion between the comb-shaped electrodes 2. In this case, the change in frequency was smaller than that when formed over the entire surface, but the ripple and insertion loss were improved.

【0029】(実施例5)第5の実施例では、櫛形電極
2を形成した表面弾性波素子10をチップ状態に切断し
た後、図14に示すように金属ケース14にダイボンド
し、アルミニウム線11を用いてワイヤボンド接続を行
った後に周波数を測定して目標とする周波数とのずれを
求めた。この値に基づいて化学吸着液を選定して、全体
を化学吸着液に浸漬して化学吸着膜を形成した。この場
合、金属ケースやアルミ線、接着剤等も化学吸着液に浸
されることになり、アルミ線は表面に酸化皮膜を有する
ために化学吸着膜が形成される。
(Embodiment 5) In the fifth embodiment, the surface acoustic wave device 10 on which the comb-shaped electrodes 2 are formed is cut into chips and then die-bonded to a metal case 14 as shown in FIG. After performing wire bond connection using, the frequency was measured to determine the deviation from the target frequency. A chemical adsorption solution was selected based on this value, and the whole was immersed in the chemical adsorption solution to form a chemical adsorption film. In this case, the metal case, the aluminum wire, the adhesive, and the like are also immersed in the chemical adsorption solution, and the aluminum wire has an oxide film on its surface, so that a chemical adsorption film is formed.

【0030】このようにして周波数を調整した後に、図
15に示すように蓋をシーム溶接して表面弾性波素子を
作成した。図14,図15において、1は圧電体基板、
2はアルミニウムよりなる櫛形電極で、10はこれらを
含む表面弾性波素子、11はアルミニウムワイヤ、12
は表面弾性波素子を接着する接着剤、13は外部端子、
14は金属ケース、15は蓋、16はシーム溶接部であ
る。なお、化学吸着膜は表面弾性波素子上だけでなくケ
ースやアルミニウムワイヤ上にも形成されるが図示して
いない。化学吸着膜は金属ケースにも形成されるが、シ
ーム溶接等でも特に問題は発生しなかった。これは化学
吸着膜が数nm以下と非常に薄いことによるものであ
る。本実施例では、ワイヤボンド方式による実装後に行
ったが、セラミック基板やガラス基板上にフリップチッ
プ実装を行ったものでも同様に形成できる。
After the frequency was adjusted in this manner, the lid was seam-welded to produce a surface acoustic wave device as shown in FIG. 14 and 15, reference numeral 1 denotes a piezoelectric substrate,
2 is a comb-shaped electrode made of aluminum, 10 is a surface acoustic wave element containing these, 11 is an aluminum wire, 12
Is an adhesive for bonding the surface acoustic wave element, 13 is an external terminal,
14 is a metal case, 15 is a lid, and 16 is a seam weld. The chemical adsorption film is formed not only on the surface acoustic wave device but also on the case and the aluminum wire, but is not shown. Although the chemical adsorption film was formed on the metal case, no particular problem occurred even in seam welding or the like. This is because the chemically adsorbed film is as thin as several nm or less. In the present embodiment, the mounting is performed after the mounting by the wire bonding method. However, a flip-chip mounting on a ceramic substrate or a glass substrate can be similarly formed.

【0031】このように、実装基板に実装後でも、設定
周波数とのずれに応じて調整が出来るので、単なる表面
弾性波素子のみの製造ばらつきを調整出来るのみに止ど
まらず、実装した他の部品を含めての電子回路全体とし
ての製造ばらつきに対しても精度良く調整出来るという
利点がある。
As described above, even after mounting on the mounting board, the adjustment can be made in accordance with the deviation from the set frequency. There is an advantage that it is possible to accurately adjust the manufacturing variation of the entire electronic circuit including the above components.

【0032】また、実装後の絶縁膜の形成時に、同時に
アルミニウムワイヤ上にもパッシベーション効果のある
膜が形成されるので、電子回路全体としても耐腐食性の
高いものとなる。
Further, since a film having a passivation effect is simultaneously formed on the aluminum wires when the insulating film is formed after mounting, the electronic circuit as a whole has high corrosion resistance.

【0033】[0033]

【発明の効果】以上のように本発明は単分子構造を有す
る化学吸着膜を用いることにより必要とする膜厚や密度
の膜を高精度に得ることができ周波数の調整が非常に再
現性良くできる。しかも、膜形成のための装置も安価で
あり、大量生産が可能なことから表面弾性波素子の高精
度化、低コスト化に大きな効果がある。また、電極膜の
アルミニウムの腐食防止にも大きな効果があり、表面弾
性波素子の低コスト化、高信頼性化に大きな効果があ
る。
As described above, according to the present invention, a film having a required film thickness and density can be obtained with high precision by using a chemisorption film having a monomolecular structure, and the frequency can be adjusted with very high reproducibility. it can. In addition, since the apparatus for forming the film is inexpensive and can be mass-produced, there is a great effect on improving the accuracy and cost of the surface acoustic wave device. Also, it has a great effect on preventing corrosion of aluminum in the electrode film, and has a great effect on cost reduction and high reliability of the surface acoustic wave device.

【0034】化学吸着膜は電極材料であるアルミニウム
の表面の酸化膜や基板材料であり酸化物である水晶、リ
チウムタンタレート、リチウムナイオベートと共有結合
をするので強固な密着性を有し、ディップ法で簡単に膜
形成できるために非常に低コストで作成できる。
The chemically adsorbed film has strong adhesion because it forms a covalent bond with an oxide film on the surface of aluminum, which is an electrode material, and quartz, lithium tantalate, and lithium niobate, which are oxides and substrate materials. It can be formed at very low cost because the film can be easily formed by the method.

【0035】弗素原子との結合手をもつ弗化炭素鎖(C
2nの分子鎖は、撥水性を有しているために、電極材
料であるアルミニウムの腐食を防止できる効果を有して
いる。
A fluorinated carbon chain having a bond to a fluorine atom (C
Since the molecular chain of F 2 ) n has water repellency, it has an effect of preventing corrosion of aluminum as an electrode material.

【0036】そして、各実施例においては、その周波数
を非常に高精度で調整する必要のあるSAWフィルター
用の表面弾性波素子を中心に説明したが、これに限るも
のではなく、水晶発振子等の圧電素子の表面に電極が形
成されている周波数発振器または共振器一般に本発明は
適用出来るものである。
In each of the embodiments, a description has been given mainly of a surface acoustic wave element for a SAW filter whose frequency needs to be adjusted with very high precision. However, the present invention is not limited to this, and it is not limited to this. The present invention can be generally applied to a frequency oscillator or a resonator in which an electrode is formed on the surface of the piezoelectric element.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第1の実施例における絶縁膜の分子構
造図
FIG. 1 is a diagram showing a molecular structure of an insulating film according to a first embodiment of the present invention.

【図2】本発明の第1の実施例に使用した表面弾性波素
子の斜視図
FIG. 2 is a perspective view of a surface acoustic wave device used in the first embodiment of the present invention.

【図3】図2のA−A′断面の表面近傍を示す図FIG. 3 is a view showing the vicinity of the surface of the AA ′ section in FIG. 2;

【図4】絶縁膜を形成した断面形状を示す図FIG. 4 is a diagram showing a cross-sectional shape in which an insulating film is formed.

【図5】絶縁膜を形成した断面形状を示す図FIG. 5 is a diagram showing a cross-sectional shape in which an insulating film is formed.

【図6】本発明の第1の実施例における絶縁膜の分子構
造図
FIG. 6 is a molecular structure diagram of an insulating film according to the first embodiment of the present invention.

【図7】本発明の第1の実施例の4種類の絶縁膜による
周波数変化のグラフ
FIG. 7 is a graph showing frequency changes due to four types of insulating films according to the first embodiment of the present invention.

【図8】本発明の第2の実施例における絶縁膜形成前の
断面形状を示す図
FIG. 8 is a diagram showing a cross-sectional shape before an insulating film is formed in a second embodiment of the present invention.

【図9】本発明の第2の実施例における絶縁膜を1層形
成した断面形状を示す図
FIG. 9 is a diagram showing a cross-sectional shape in which one insulating film is formed in a second embodiment of the present invention.

【図10】本発明の第2の実施例における絶縁膜を2層
形成した断面形状を示す図
FIG. 10 is a diagram showing a cross-sectional shape in which two insulating films are formed according to a second embodiment of the present invention.

【図11】本発明の第3の実施例における絶縁膜の分子
構造図
FIG. 11 is a molecular structure diagram of an insulating film according to a third embodiment of the present invention.

【図12】本発明の第2の実施例の絶縁膜積層回数と周
波数変化の関係を示すグラフ
FIG. 12 is a graph showing the relationship between the number of times of lamination of the insulating film and the frequency change in the second embodiment of the present invention

【図13】本発明の第4の実施例における絶縁膜を形成
した断面形状を示す図
FIG. 13 is a diagram showing a cross-sectional shape in which an insulating film is formed according to a fourth embodiment of the present invention.

【図14】本発明の第5の実施例における電子回路パッ
ケージの断面図
FIG. 14 is a sectional view of an electronic circuit package according to a fifth embodiment of the present invention.

【図15】本発明の第5の実施例における電子回路パッ
ケージに蓋をした断面図
FIG. 15 is a cross-sectional view showing a cover of an electronic circuit package according to a fifth embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 圧電体基板 2 櫛形電極 3,4,6,7,8 単分子層よりなる絶縁膜 DESCRIPTION OF SYMBOLS 1 Piezoelectric substrate 2 Comb-shaped electrode 3, 4, 6, 7, 8 Insulating film consisting of monolayer

───────────────────────────────────────────────────── フロントページの続き (72)発明者 曽我 真守 大阪府門真市大字門真1006番地 松下電 器産業株式会社内 (72)発明者 生田 茂雄 大阪府門真市大字門真1006番地 松下電 器産業株式会社内 (56)参考文献 特開 昭63−252212(JP,A) 特開 昭63−178615(JP,A) 特開 平5−31356(JP,A) 特開 平2−36350(JP,A) (58)調査した分野(Int.Cl.7,DB名) H03H 3/10 H03H 9/145 ──────────────────────────────────────────────────の Continued on the front page (72) Inventor Mamoru Soga 1006 Kazuma Kadoma, Osaka Prefecture Inside Matsushita Electric Industrial Co., Ltd. In-company (56) References JP-A-63-252212 (JP, A) JP-A-63-178615 (JP, A) JP-A-5-31356 (JP, A) JP-A-2-36350 (JP, A) (58) Fields surveyed (Int. Cl. 7 , DB name) H03H 3/10 H03H 9/145

Claims (10)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 圧電性を有する基板とこの基板上に設け
た電極とを備えた表面弾性波素子を、設定周波数とのず
れに応じた長さの分子鎖長の溶質を含む溶液に浸し、そ
の表面の少なくとも一部に化学吸着膜の単分子層よりな
る絶縁膜を形成して設定周波数に調整することを特徴と
する表面弾性波素子の製造方法。
1. A surface acoustic wave device comprising a substrate having piezoelectricity and electrodes provided on the substrate is immersed in a solution containing a solute having a molecular chain length corresponding to a deviation from a set frequency, A method for manufacturing a surface acoustic wave device, comprising: forming an insulating film made of a monomolecular layer of a chemically adsorbed film on at least a part of a surface thereof and adjusting the frequency to a set frequency .
【請求項2】 溶液はクロロシラン誘導体および/また
はアルコキシシラン誘導体の溶質を含むことを特徴とす
る請求項1記載の表面弾性波素子の製造方法。
2. The method for manufacturing a surface acoustic wave device according to claim 1, wherein the solution contains a solute of a chlorosilane derivative and / or an alkoxysilane derivative .
【請求項3】 分子鎖長の異なる複数のクロロシラン誘
導体および/またはアルコキシシラン誘導体の溶質を各
々含む複数の溶液を用意し、設定周波数とのずれに応じ
て個々の表面弾性波素子に用いることを特徴とする請求
項2記載の表面弾性波素子の製造方法。
3. A method for preparing a plurality of solutions each containing a solute of a plurality of chlorosilane derivatives and / or alkoxysilane derivatives having different molecular chain lengths, and using the solutions for individual surface acoustic wave devices according to a deviation from a set frequency. 3. The method for manufacturing a surface acoustic wave device according to claim 2, wherein:
【請求項4】 圧電性を有する基板とこの基板上に設け
た電極とを備えた表面弾性波素子を、一定の長さの分子
鎖長の溶質を含む溶液に浸し前記表面弾性波素子の表面
の少なくとも一部に前記溶質の誘導体の化学吸着膜の単
分子層よりなる絶縁膜を形成する工程を含み、設定周波
数とのずれに応じて前記工程の繰り返しを行うことによ
り設定周波数に調整することを特徴とする表面弾性波素
子の製造方法。
4. A surface acoustic wave device having a substrate having piezoelectricity and electrodes provided on the substrate is immersed in a solution containing a solute having a constant molecular chain length, and the surface of the surface acoustic wave device is immersed in the solution. At least part of the solute derivative chemisorption film.
A step of forming an insulating film made of a molecular layer, wherein the surface acoustic wave element is adjusted to the set frequency by repeating the above-described steps according to a deviation from the set frequency.
Child manufacturing method.
【請求項5】 溶液は分子の両端にクロロシリル基およ
び/またはアルコキシシリル基を持つ溶質を含むことを
特徴とする請求項4記載の表面弾性波素子の製造方法。
5. The method for manufacturing a surface acoustic wave device according to claim 4, wherein the solution contains a solute having a chlorosilyl group and / or an alkoxysilyl group at both ends of the molecule .
【請求項6】 圧電性を有する基板とこの基板上に設け
た電極とを備えた表面弾性波素子を実装基板に実装後、
設定周波数とのずれに応じた長さの分子鎖長の溶質を含
む溶液に浸し、前記表面弾性波素子の表面の少なくとも
一部に前記溶質の誘導体の化学吸着膜の単分子層よりな
る絶縁膜を形成して設定周波数に調整することを特徴と
する電子回路の製造方法。
6. After mounting a surface acoustic wave device including a substrate having piezoelectricity and electrodes provided on the substrate on a mounting substrate,
An insulating film made of a monomolecular layer of a chemically adsorbed film of the derivative of the solute on at least a part of the surface of the surface acoustic wave device , immersed in a solution containing a solute having a molecular chain length corresponding to a deviation from a set frequency. Forming an electronic circuit and adjusting the frequency to a set frequency.
【請求項7】 溶液はクロロシラン誘導体および/また
はアルコキシシラン誘導体の溶質を含むことを特徴とす
る請求項7記載の電子回路の製造方法。
7. The method according to claim 7, wherein the solution contains a solute of a chlorosilane derivative and / or an alkoxysilane derivative.
【請求項8】 分子鎖長の異なる複数のクロロシラン誘
導体および/またはアルコキシシラン誘導体の溶質を各
々含む複数の溶液を用意し、設定周波数とのずれに応じ
て個々の電子回路に用いることを特徴とする請求項7記
載の電子回路の製造方法。
8. A method comprising preparing a plurality of solutions each containing a solute of a plurality of chlorosilane derivatives and / or alkoxysilane derivatives having different molecular chain lengths, and using the solutions for individual electronic circuits according to a deviation from a set frequency. The method for manufacturing an electronic circuit according to claim 7.
【請求項9】 圧電性を有する基板とこの基板上に設け
た電極とを備えた表面弾性波素子を実装基板に実装後、
一定の長さの分子鎖長の溶質を含む溶液に浸し前記表面
弾性波素子の表面の少なくとも一部に前記溶質の誘導体
化学吸着膜の単分子層よりなる絶縁膜を形成する工程
を含み、設定周波数とのずれに応じて前記工程の繰り返
しを行うことにより設定周波数に調整することを特徴と
する電子回路の製造方法。
9. After mounting a surface acoustic wave device including a substrate having piezoelectricity and electrodes provided on the substrate on a mounting substrate,
The surface is immersed in a solution containing a solute of a certain length
The method includes a step of forming an insulating film made of a monomolecular layer of a chemical adsorption film of the solute derivative on at least a part of the surface of the elastic wave element , and setting by performing the above steps repeatedly according to a deviation from a set frequency. A method for manufacturing an electronic circuit, comprising adjusting a frequency.
【請求項10】 溶液は分子の両端にクロロシリル基お
よび/またはアルコキシシリル基を持つ溶質を含むこと
を特徴とする請求項9記載の電子回路の製造方法。
10. The method according to claim 9, wherein the solution contains a solute having a chlorosilyl group and / or an alkoxysilyl group at both ends of the molecule.
JP10963194A 1994-05-24 1994-05-24 Surface acoustic wave device and method of manufacturing electronic circuit Expired - Lifetime JP3289486B2 (en)

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Application Number Priority Date Filing Date Title
JP10963194A JP3289486B2 (en) 1994-05-24 1994-05-24 Surface acoustic wave device and method of manufacturing electronic circuit

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JP3289486B2 true JP3289486B2 (en) 2002-06-04

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Publication number Priority date Publication date Assignee Title
JP4852850B2 (en) * 2005-02-03 2012-01-11 セイコーエプソン株式会社 Piezoelectric vibration element, piezoelectric vibrator, piezoelectric oscillator, frequency stabilization method, and piezoelectric vibrator manufacturing method
JP2007292626A (en) * 2006-04-26 2007-11-08 Epson Toyocom Corp Liquid level detector
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