JP3326682B2 - Displacement measuring device - Google Patents
Displacement measuring deviceInfo
- Publication number
- JP3326682B2 JP3326682B2 JP25775897A JP25775897A JP3326682B2 JP 3326682 B2 JP3326682 B2 JP 3326682B2 JP 25775897 A JP25775897 A JP 25775897A JP 25775897 A JP25775897 A JP 25775897A JP 3326682 B2 JP3326682 B2 JP 3326682B2
- Authority
- JP
- Japan
- Prior art keywords
- light receiving
- light
- irradiation point
- lens
- receiving element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000006073 displacement reaction Methods 0.000 title claims description 35
- 230000003287 optical effect Effects 0.000 claims description 40
- 238000003384 imaging method Methods 0.000 claims description 33
- 238000005259 measurement Methods 0.000 claims description 24
- 238000010586 diagram Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 3
- 230000004075 alteration Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 239000000057 synthetic resin Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は、光による3角測量
を利用して測定対象面の変位を測定する変位測定装置に
おいて、その変位検出精度を向上させ、測定速度を向上
させるための技術に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a displacement measuring device for measuring a displacement of a surface to be measured by using triangulation with light, and to a technique for improving the displacement detection accuracy and the measuring speed. .
【0002】[0002]
【従来の技術】光を用いて測定対象面の高さ変位(凹
凸)を測定する場合、図5に示すように、投光器5から
レーザビームを測定対象物1の表面1aに照射し、その
照射点Sの像を結像レンズ6によって受光素子7の受光
面7a上に結像させる3角測量方法による変位測定装置
が用いられている。2. Description of the Related Art When measuring the height displacement (irregularity) of a surface to be measured by using light, as shown in FIG. 5, a laser beam is irradiated from a light projector 5 onto a surface 1a of an object 1 to be measured. A displacement measuring device using a triangulation method in which the image of the point S is formed on the light receiving surface 7a of the light receiving element 7 by the image forming lens 6 is used.
【0003】この受光素子7は、受光面7a上の結像点
の縦方向の位置に対応した信号を出力するように構成さ
れており、照射点Sの高さ方向(投光器5のビームの光
軸と結像レンズ6の光軸とで形成される面内の方向)の
変位に対する結像点Kの移動軌跡に受光面7aが一致す
る角度に配置されている。The light receiving element 7 is configured to output a signal corresponding to the vertical position of the image forming point on the light receiving surface 7a, and to output the signal in the height direction of the irradiation point S (light of the beam of the projector 5). The light receiving surface 7a is arranged at an angle that coincides with the movement trajectory of the imaging point K with respect to a displacement (in-plane direction formed by the axis and the optical axis of the imaging lens 6).
【0004】この変位測定装置に対して測定対象物1を
投光器5のビームの光軸と結像レンズ6の光軸とで形成
される面と直交する方向に相対移動し、照射点SがS′
あるいはS″のように高さ方向に動くと、受光素子7の
受光面7aの結像点Kの位置がK′あるいはK″のよう
に移動して、受光素子7からの信号も結像点の変位に応
じて変化する。この信号の変化量から測定対象面の高さ
方向の変位を検出することができる。The object 1 to be measured is moved relative to the displacement measuring device in a direction orthogonal to a plane formed by the optical axis of the beam of the projector 5 and the optical axis of the imaging lens 6, and the irradiation point S is set to S. ′
Alternatively, when the light-receiving element 7 moves in the height direction as shown in S ", the position of the image-forming point K on the light-receiving surface 7a of the light-receiving element 7 moves as K 'or K", and the signal from the light-receiving element 7 also becomes the image-forming point. It changes according to the displacement of. The displacement in the height direction of the measurement target surface can be detected from the amount of change in the signal.
【0005】ところが、変位測定装置に対して測定対象
物1を相対移動する機構は、通常モータ等を駆動源とす
る低速なものであるので、測定対象物1の表面全体にわ
たって細かいピッチで測定しようとすると、測定時間が
非常に長くなってしまう。However, since the mechanism for moving the measurement object 1 relative to the displacement measuring apparatus is usually a low-speed mechanism driven by a motor or the like, the measurement is performed at a fine pitch over the entire surface of the measurement object 1. Then, the measurement time becomes very long.
【0006】このため、近年では、図6に示すような走
査型の変位測定装置を用いて、測定対象物の移動のう
ち、X軸またはY軸方向のいずれか一方のみを移動する
だけで測定できるようにしている。この走査型の変位測
定装置は、光源11から出力されるビームを振動ミラー
型等の偏向装置12によって一定角度内の範囲で偏向さ
せ、この偏向されたビームをレンズ13によってその光
軸が一平面上で平行に移動するビームにして、基準面2
上の測定対象物1の表面1aに出射し、その照射点Sを
直線的に往復走査あるいは片道走査し、その照射点Sの
像を第1の円筒面レンズ(シリンドリカルレンズ)14
および第2の円筒面レンズ15によって受光素子16の
受光面16aに結像させる。For this reason, in recent years, by using a scanning type displacement measuring device as shown in FIG. 6, measurement is performed by moving only one of the X-axis direction and the Y-axis direction among the movements of the object to be measured. I can do it. This scanning type displacement measuring device deflects a beam output from a light source 11 within a certain angle range by a deflecting device 12 such as a vibrating mirror type, and deflects the deflected beam by a lens 13 so that its optical axis is in one plane. The reference plane 2
The light is emitted to the upper surface 1a of the measurement object 1, and its irradiation point S is linearly reciprocally scanned or one-way scanned, and the image of the irradiation point S is converted into a first cylindrical lens (cylindrical lens) 14.
Then, an image is formed on the light receiving surface 16a of the light receiving element 16 by the second cylindrical lens 15.
【0007】[0007]
【発明が解決しようとする課題】しかしながら、前記し
たように受光部に円筒面レンズを用いた従来の走査型の
変位測定装置では、測定対象面が鏡面のように反射率が
高く照射点Sからの光の殆どが反射軸と平行な光の場合
には問題にならないが、測定対象面が粗で反射率が低く
照射点Sからの光が散乱して広がった場合には、受光素
子の受光面の像がぼけてしまい、測定精度が著しく低下
するという問題がある。However, in the conventional scanning displacement measuring apparatus using a cylindrical lens in the light receiving section as described above, the surface to be measured has a high reflectivity like a mirror surface and is located from the irradiation point S. This is not a problem when most of the light is light parallel to the reflection axis. However, when the light from the irradiation point S is scattered and spreads because the surface to be measured is rough and the reflectance is low, the light receiving element There is a problem that the image on the surface is blurred and the measurement accuracy is significantly reduced.
【0008】即ち、円筒面レンズは、基本的にレンズの
円筒面の周方向に対してのみ集束性を示し、他の方向に
対して集束性が無いため、図7の(a)に示すように、
照射点Sで反射、散乱した光のうち、第1の円筒面レン
ズ14の円筒面の周方向に広がった光は第1の円筒面レ
ンズ14で集束されて第2の円筒面レンズ15に入射
し、第2の円筒面レンズ15で受光素子16の受光面1
6aの幅方向の中心へ向かうように偏向されて受光面1
6a上に像Kを結ぶが、図7の(b)のように、照射点
Sで反射、散乱した光のうち、第1の円筒面レンズ14
の円筒の軸方向に広がった光は、第1の円筒面レンズ1
4では全く集束されずに広がったままで第2の円筒面レ
ンズ15へ入射するため、受光素子16の受光面16a
上の像Kは受光面16aの幅方向に延びた直線となる。That is, the cylindrical lens basically has a convergence property only in the circumferential direction of the cylindrical surface of the lens, and has no convergence property in other directions. Therefore, as shown in FIG. To
Of the light reflected and scattered at the irradiation point S, the light spread in the circumferential direction of the cylindrical surface of the first cylindrical lens 14 is focused by the first cylindrical lens 14 and enters the second cylindrical lens 15. The light receiving surface 1 of the light receiving element 16 is
The light receiving surface 1 is deflected toward the center in the width direction of the light receiving surface 6a.
7A, an image K is formed on the first cylindrical surface lens 14 of the light reflected and scattered at the irradiation point S as shown in FIG.
The light that spreads in the axial direction of the cylinder of the first cylindrical lens 1
In No. 4, since the light is incident on the second cylindrical lens 15 while being spread without being converged at all, the light receiving surface 16a of the light receiving element 16
The upper image K is a straight line extending in the width direction of the light receiving surface 16a.
【0009】しかも、照射点の像を焦点距離の短い第1
の円筒面レンズ14だけでしぼり込むようにしているた
め、その円筒面レンズ14の収差により、受光素子16
の受光面16a上の結像パターンは、図8に示すように
横長の長円状にぼやけてしまい、受光素子18から出力
される信号のS/Nが低下し、測定表面の変位を高い精
度で測定することができない。In addition, the image of the irradiation point is converted to a first image having a short focal length.
Of the light-receiving element 16 due to the aberration of the cylindrical lens 14.
The image formation pattern on the light receiving surface 16a is blurred in a horizontally long oval shape as shown in FIG. 8, the S / N of the signal output from the light receiving element 18 is reduced, and the displacement of the measurement surface is highly accurate. Can not be measured with
【0010】本発明は、この問題を解決し、被測定面が
粗く照射点からの光が広がっている場合でも、精度の高
い測定が高速に行なえる変位測定装置を提供することを
目的としている。It is an object of the present invention to solve this problem and to provide a displacement measuring device capable of performing high-accuracy measurement at high speed even when the surface to be measured is rough and light from an irradiation point is spread. .
【0011】[0011]
【課題を解決するための手段】前記目的を達成するため
に、本発明の変位測定装置は、同一平面上で所定範囲を
光軸が平行に移動するビームを測定対象面に出射して、
該測定対象面上のビームの照射点を走査する投光部と、
測定対象面上の照射点からの光を受けて該照射点の像を
受光素子の受光面上に結像させ、前記受光素子の受光面
上の光の結像位置に対応する信号を出力させる受光部と
を有し、前記受光素子から出力される信号に基づいて前
記照射点の走査方向に沿った前記測定対象面の変位を測
定する変位測定装置において、前記受光部は、外形寸法
が前記ビームの走査幅より小さく焦点距離がそれぞれ等
しい複数の球面集束型の集光レンズ部が、それぞれの光
軸を平行に且つ該光軸と直交する線上に連続した状態で
一列に並んで形成され、前記各集光レンズ部の光軸が測
定対象面上を走査される照射点に交わる向きで、該照射
点までの距離が前記焦点距離とほぼ等しくなる位置に配
置され、前記照射点からの光を前記各集光レンズ部によ
って集束するレンズアレイと、前記レンズアレイの各集
光レンズ部によって集束されたビームを前記受光素子の
受光面上に集束させて、該受光面上に測定対象面上の照
射点の像を結像させる球面集束型の結像レンズとを備え
ている。In order to achieve the above object, a displacement measuring apparatus according to the present invention emits a beam whose optical axis moves parallel to a predetermined range on the same plane to a surface to be measured.
A light projection unit that scans an irradiation point of the beam on the surface to be measured,
Receiving light from an irradiation point on the surface to be measured, forming an image of the irradiation point on the light receiving surface of the light receiving element, and outputting a signal corresponding to the light imaging position on the light receiving surface of the light receiving element. A displacement measuring device having a light receiving unit and measuring a displacement of the measurement target surface along a scanning direction of the irradiation point based on a signal output from the light receiving element, wherein the light receiving unit has an outer dimension of A plurality of spherical focusing lens units each having a focal length smaller than the scanning width of the beam are formed in a line in a state where respective optical axes are parallel and continuous on a line orthogonal to the optical axis, In the direction where the optical axis of each of the condenser lenses intersects with the irradiation point scanned on the surface to be measured, the light axis is disposed at a position where the distance to the irradiation point is substantially equal to the focal length. Which are focused by the respective condenser lens units. An array, and a spherical focusing device that focuses a beam focused by each focusing lens unit of the lens array on a light receiving surface of the light receiving element and forms an image of an irradiation point on a measurement target surface on the light receiving surface. A type imaging lens.
【0012】[0012]
【発明の実施の形態】以下、図面に基づいて本発明の一
実施形態を説明する。図1および図2は、本発明の一実
施形態の変位測定装置の構成を示す図である。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. 1 and 2 are views showing the configuration of a displacement measuring device according to one embodiment of the present invention.
【0013】図1において、投光部は、光源21から出
力されるレーザビームを回転ミラー型または振動ミラー
型等の偏向装置22によって偏向し、この偏向した光を
レンズ23によって、同一平面上の所定範囲(例えば3
0mm)内を光軸が平行に移動するビームを、基準面2
上の測定対象物1の表面1aに出射して、測定対象物1
の表面1a上のビームの照射点Sを直線的(実際には被
測定対象表面の凹凸により蛇行する)に片道あるいは往
復走査する。In FIG. 1, a light projecting unit deflects a laser beam output from a light source 21 by a deflecting device 22 such as a rotating mirror type or a vibrating mirror type. A predetermined range (for example, 3
0 mm), the beam whose optical axis moves in parallel
The light is emitted to the upper surface 1a of the measurement object 1, and the measurement object 1
The beam irradiation point S on the surface 1a is scanned linearly (actually, meandering due to irregularities on the surface of the object to be measured) in a one-way or reciprocating manner.
【0014】この照射点からの光を受ける受光部は、レ
ンズアレイ25、結像レンズ26および受光素子27に
よって構成されている。The light receiving section for receiving the light from the irradiation point includes a lens array 25, an imaging lens 26, and a light receiving element 27.
【0015】レンズアレイ25は、等しい焦点距離f1
(例えば20mm)を有する複数(図1、2では5個)
の集光レンズ部25a〜25eが一列に並ぶように合成
樹脂あるいはガラスで一体成形されている。The lens array 25 has the same focal length f1
(For example, 20 mm) (5 in FIGS. 1 and 2)
Are integrally formed of synthetic resin or glass so that the condensing lens portions 25a to 25e are arranged in a line.
【0016】各集光レンズ部は、投光部から出射される
ビームの走査幅寸法(30mm)内に複数個並ぶよう
に、少なくともその並び方向に沿った幅が走査幅より短
い(例えば6mm)略矩形状の外形を有し、光軸に直交
する一方の面が球面状に形成された球面集束型のもので
あり、それぞれの光軸が平行で且つその光軸に直交する
線上に連続して一列に並ぶように側面同士を密着させた
状態で一体化されている。Each condensing lens section has a width at least along the direction in which it is arranged shorter than the scanning width (for example, 6 mm) so that a plurality of condensing lens sections are arranged within the scanning width dimension (30 mm) of the beam emitted from the light projecting section. It has a substantially rectangular outer shape, and is a spherical focusing type in which one surface orthogonal to the optical axis is formed in a spherical shape, and each optical axis is parallel and continuous on a line orthogonal to the optical axis. It is integrated in a state where the side surfaces are in close contact with each other so as to be arranged in a line.
【0017】レンズアレイ25は、各集光レンズ部の光
軸が測定対象物1の表面1a上を走査される照射点に交
わる向きで、その照射点までの距離が焦点距離f1とほ
ぼ等しくなる位置に配置されている。なお、ここで球面
集束型のレンズは、光をその光軸の周りに均等にしぼり
込むことができるレンズである。The lens array 25 has a direction in which the optical axis of each condensing lens section intersects with an irradiation point scanned on the surface 1a of the measuring object 1, and the distance to the irradiation point is substantially equal to the focal length f1. Is located in the position. Here, the spherical focusing lens is a lens that can uniformly squeeze light around its optical axis.
【0018】このため、照射点の高さ方向の変位量が焦
点距離f1に比べて格段に小さい場合、各集光レンズ部
25a〜25eは、照射点からの光をほぼ平行に集束し
て結像レンズ26へ出射する。For this reason, when the amount of displacement of the irradiation point in the height direction is much smaller than the focal length f1, the condenser lenses 25a to 25e converge and converge the light from the irradiation point almost in parallel. The light exits to the image lens 26.
【0019】結像レンズ26は、投光部から出射される
ビームの走査幅寸法(30mm)より大きい径を有し、
光軸と直交する一方の面が球面状に形成され、焦点距離
f2が例えば80mmの球面集束型のレンズで形成され
ており、レンズアレイ25からのビームを集束して、受
光素子27の受光面27aに照射点の像を結像させる。
結像レンズ26は、その光軸がレンズアレイ25の中央
の集光レンズ部25cの光軸と一致するように配置され
ている。なお、図1、2では結像レンズ26の外形を円
形に示しているが、レンズアレイ25からの光が入射す
る範囲に対応した部分のみを切り出した形状にしてもよ
い。The imaging lens 26 has a diameter larger than the scanning width (30 mm) of the beam emitted from the light projecting unit.
One surface orthogonal to the optical axis is formed in a spherical shape, and is formed of a spherical focusing lens having a focal length f2 of, for example, 80 mm, and focuses a beam from the lens array 25 to form a light receiving surface of a light receiving element 27. An image of the irradiation point is formed on the image 27a.
The imaging lens 26 is arranged so that its optical axis coincides with the optical axis of the condensing lens portion 25c at the center of the lens array 25. Although the outer shape of the imaging lens 26 is shown as a circle in FIGS. 1 and 2, it may be a shape obtained by cutting out only a portion corresponding to a range where light from the lens array 25 is incident.
【0020】受光素子27は矩形状の受光面27aを有
し、受光面27aに照射された光の位置のうち、受光面
27aの縦方向に沿った位置に対応する信号を出力する
ように構成されている。受光面27aの横幅は、レンズ
アレイ25の各集光レンズ部25a〜25eの幅に各集
光レンズ部と結像レンズ26の焦点距離の比f2/f1
(倍率)を乗じた大きさ(例えば集光レンズ部の幅が前
記したように6mmで倍率が4のとき24mm)に予め
設定されており、受光素子27は、その受光面27aの
中心が、結像レンズ26からその焦点距離f2離れた位
置で結像レンズ26の光軸に交わり、且つ、測定対象物
1の表面1aの高さ方向の変位にともなって移動する結
像点が受光面27a上で縦方向に移動する向きで配置さ
れている。The light receiving element 27 has a rectangular light receiving surface 27a, and outputs a signal corresponding to a position along the vertical direction of the light receiving surface 27a among the positions of the light irradiated on the light receiving surface 27a. Have been. The lateral width of the light receiving surface 27a is equal to the width of each of the condenser lenses 25a to 25e of the lens array 25 and the ratio f2 / f1 of the focal length of each of the condenser lenses and the imaging lens 26.
The magnification is multiplied by (magnification) (for example, as described above, the width of the condensing lens portion is 6 mm and the magnification is 4 when the width is 24 mm). The center of the light receiving surface 27a of the light receiving element 27 is An imaging point which intersects the optical axis of the imaging lens 26 at a position away from the imaging lens 26 by a focal distance f2 and moves with the displacement of the surface 1a of the measurement object 1 in the height direction is a light receiving surface 27a. It is arranged so that it moves vertically in the upper direction.
【0021】なお、投光部からのビームの光軸と受光部
のレンズアレイ25の光軸とは、受光量を確保するため
に、基準面2の法線をはさんで等しい角度、即ち正反射
の向きとなるように予め設定されている。Note that the optical axis of the beam from the light projecting section and the optical axis of the lens array 25 of the light receiving section have the same angle, ie, positive angle, across the normal of the reference plane 2 in order to secure the amount of received light. The direction is set in advance so as to be the direction of reflection.
【0022】次のこの変位測定装置の動作を図3、図4
に基づいて説明する。図3は受光部を結像レンズ26の
光軸と直交する向きで上からみた図、図4は受光部を結
像レンズ26の光軸が水平となる向きで側方から見た図
である。Next, the operation of this displacement measuring device will be described with reference to FIGS.
It will be described based on. FIG. 3 is a diagram of the light receiving unit viewed from above in a direction orthogonal to the optical axis of the imaging lens 26, and FIG. 4 is a diagram of the light receiving unit viewed from the side in a direction in which the optical axis of the imaging lens 26 is horizontal. .
【0023】基準面2上の測定対象物1に向かって出射
されるビームの照射点Sは、基準面2および測定対象物
1の表面1a上を一定方向に走査される。The irradiation point S of the beam emitted toward the measuring object 1 on the reference surface 2 is scanned in a fixed direction on the reference surface 2 and the surface 1a of the measuring object 1.
【0024】ここで、ビームの照射点Sが、例えば図3
の(a)に示すように、レンズアレイ25の集光レンズ
部25aに対向する範囲でその光軸より外側にある場
合、照射点Sから反射、散乱した光は、主に集光レンズ
部25aによってほぼ平行なビームに集束され、結像レ
ンズ26に対してその光軸に角度のある状態で入射す
る。Here, the irradiation point S of the beam is, for example, as shown in FIG.
As shown in (a), when the light is reflected outside and scattered from the irradiation point S when the light beam is outside the optical axis in a range facing the light collecting lens portion 25a of the lens array 25, the light is mainly emitted from the light collecting lens portion 25a. Are focused into substantially parallel beams, and enter the imaging lens 26 at an angle to the optical axis thereof.
【0025】結像レンズ26は、集光レンズ部25aか
らのビームを集束しつつ、その光軸の向きを変えて、受
光素子27の受光面27aの一端側の位置に集束させ
る。The imaging lens 26 converges the beam from the condenser lens portion 25a, changes the direction of its optical axis, and converges the beam at a position on one end side of the light receiving surface 27a of the light receiving element 27.
【0026】レンズアレイ25の各集光レンズ部および
結像レンズ26は光をその光軸の周りに均等に絞り込む
球面集束型のレンズであるから、図4の(a)に示すよ
うに、側方からみて照射点Sから散乱する光も集光レン
ズ部25aによってほぼ平行に集束され、結像レンズ2
6によって受光素子27の受光面27a上に集束され
る。Each of the condensing lens portions and the imaging lens 26 of the lens array 25 is a spherical converging type lens that converges light around its optical axis evenly, so that as shown in FIG. The light scattered from the irradiation point S when viewed from the side is also focused substantially parallel by the condenser lens portion 25a, and
6 converges on the light receiving surface 27a of the light receiving element 27.
【0027】このため、受光素子27の受光面27aに
は、照射点Sの高さに正確に対応した位置に点状の像K
aが作られ、その位置に対応した電気信号が出力され
る。For this reason, on the light-receiving surface 27a of the light-receiving element 27, a point-like image K is placed at a position exactly corresponding to the height of the irradiation point S.
is generated, and an electric signal corresponding to the position is output.
【0028】この信号は図示しない信号処理部に入力さ
れ、基準面2から照射点Sまでの高さが検出される。This signal is input to a signal processing unit (not shown), and the height from the reference plane 2 to the irradiation point S is detected.
【0029】なお、照射点Sから他の集光レンズ部25
b〜25eに入射する弱い光も集束されて結像レンズ2
6に入射するが、これらの光は受光素子27の受光面2
7a上には結像されない。It should be noted that the other condensing lens unit 25 is located
Weak light incident on b to 25e is also focused and formed into an imaging lens 2
6 are incident on the light receiving surface 2 of the light receiving element 27.
No image is formed on 7a.
【0030】また、ビームの走査によって照射点Sが、
図3の(b)に示すように、レンズアレイ25の集光レ
ンズ部25aの光軸と交わる位置にきた場合には、照射
点Sから反射、散乱した光は、主に集光レンズ部25a
によってその光軸と平行なビームに集束され、結像レン
ズ26に対してその光軸に平行な状態で入射する。The irradiation point S is set by
As shown in FIG. 3B, when the light reaches the position intersecting with the optical axis of the condenser lens section 25a of the lens array 25, the light reflected and scattered from the irradiation point S is mainly emitted from the condenser lens section 25a.
Is focused into a beam parallel to the optical axis, and enters the imaging lens 26 in a state parallel to the optical axis.
【0031】このため、照射点Sの像Kaは、受光素子
27の受光面27aの幅方向のほぼ中心位置につくられ
る。For this reason, the image Ka of the irradiation point S is formed substantially at the center of the light receiving surface 27a of the light receiving element 27 in the width direction.
【0032】さらにビームが走査されて照射点Sが、図
3の(c)に示すように、レンズアレイ25の集光レン
ズ部25aに対向する範囲内でその光軸より隣の集光レ
ンズ部25b寄りにある場合、照射点Sから反射、散乱
した光は、主に集光レンズ部25aによって集束され、
結像レンズ26に対してその光軸に図3の(a)の場合
と逆な角度をもって入射する。As shown in FIG. 3C, the beam is further scanned so that the irradiation point S is within a range opposing the converging lens portion 25a of the lens array 25, and the converging lens portion adjacent to the optical axis thereof. When it is near 25b, the light reflected and scattered from the irradiation point S is mainly focused by the condenser lens portion 25a,
The light enters the image forming lens 26 at an angle opposite to that in the case of FIG.
【0033】このため、結像レンズ26は、受光素子2
7の受光面27aの幅方向の他端側の位置で点状の像K
aをつくる。For this reason, the imaging lens 26 includes the light receiving element 2
7 at a position on the other end side of the light receiving surface 27a in the width direction of the light receiving surface 27a.
Make a.
【0034】このように、照射点Sの位置が集光レンズ
部25aに対向する範囲内で一端から他端に移動する
と、受光素子27の受光面27a上の像Kaの位置は、
受光面27aの幅方向の一端側から他端側に移動するこ
とになる。As described above, when the position of the irradiation point S moves from one end to the other end within the range facing the condenser lens portion 25a, the position of the image Ka on the light receiving surface 27a of the light receiving element 27 becomes
The light receiving surface 27a moves from one end in the width direction to the other end.
【0035】また、ビームの走査にともなって、例えば
図4の(b)に示すように照射点がS′のように高さ方
向(基準面2の法線方向)にδだけ移動すると、受光素
子27の受光面27a上の像の位置がK′のようにず
れ、その位置に対応する信号が出力され、この信号から
照射点S′の基準面2からの高さが検出され、照射点S
の高さとの差δも判る。When the irradiation point moves by δ in the height direction (normal direction of the reference plane 2) as shown in FIG. 4B, for example, as shown in FIG. The position of the image on the light receiving surface 27a of the element 27 is shifted like K ', a signal corresponding to the position is output, and the height of the irradiation point S' from the reference plane 2 is detected from this signal, S
The difference δ from the height is also known.
【0036】そして、図3の(d)に示すように、照射
点Sが集光レンズ部25aと集光レンズ部25bの境界
部に対向する位置にくると、その照射点Sからの光は、
2つの集光レンズ部25a、25bによってそれぞれほ
ぼ平行なビームに集束されて結像レンズ26に入射する
ため、受光素子27の受光面27aの幅方向の両端に像
Ka、Kbがつくられるが、この2つの結像点Ka、K
bの受光面27aの縦方向に沿った位置はともに等しい
ので、受光素子27からは像が一つの場合と同様にその
縦方向の位置に対応した信号が出力される。Then, as shown in FIG. 3D, when the irradiation point S comes to a position facing the boundary between the condensing lens portion 25a and the converging lens portion 25b, the light from the irradiation point S becomes ,
Since the two condensing lens portions 25a and 25b converge into substantially parallel beams and enter the imaging lens 26, images Ka and Kb are formed at both ends of the light receiving surface 27a of the light receiving element 27 in the width direction. These two imaging points Ka, K
Since the positions along the vertical direction of the light receiving surface 27a are the same, a signal corresponding to the position in the vertical direction is output from the light receiving element 27 as in the case of one image.
【0037】ビームがさらに走査されて、図3の(e)
に示すように、照射点Sが集光レンズ部25bに対向す
る範囲内まで移動すると、照射点Sから反射、散乱した
光は、主に集光レンズ部25bによって集束され、結像
レンズ26に対してその光軸に角度のある状態で入射
し、結像レンズ26は、受光素子27の受光面27aの
幅方向の一端側の位置で点状の像Kbをつくる。The beam is further scanned, and FIG.
As shown in (2), when the irradiation point S moves within a range opposed to the condenser lens portion 25b, the light reflected and scattered from the irradiation point S is mainly focused by the condenser lens portion 25b, and is focused on the imaging lens 26. On the other hand, the light is incident on the optical axis at an angle, and the imaging lens 26 forms a point image Kb at one end of the light receiving surface 27a of the light receiving element 27 in the width direction.
【0038】以下同様に、照射点Sが所定範囲(ここで
は30mm)を走査される間に、受光素子27の受光面
27a上の像Kは、レンズアレイ25の集光レンズ部の
数に等しい回数だけ幅方向に一端から他端まで移動しな
がら、測定対象物1の表面1aの高さの変位に応じて縦
方向に移動し、受光素子27からは、測定対象物1の表
面1aの高さ変位に正確に対応した信号が出力され、こ
の信号に基づいて、測定対象表面の変位を測定すること
ができる。Similarly, while the irradiation point S is scanned within a predetermined range (here, 30 mm), the image K on the light receiving surface 27a of the light receiving element 27 is equal to the number of the condensing lens portions of the lens array 25. While moving from one end to the other end in the width direction by the number of times, it moves in the vertical direction in accordance with the displacement of the height of the surface 1a of the measurement target 1, and the height of the surface 1a of the measurement target 1 A signal corresponding to the displacement is output, and the displacement of the surface to be measured can be measured based on the signal.
【0039】このように、実施形態の変位測定装置で
は、複数の球面集束型の集光レンズ部が投光部のビーム
走査方向と平行に一列に連続した状態で並んでいるレン
ズアレイによって照射点からの光をほぼ平行なビームに
集束し、このビームを球面集束型の結像レンズで受光素
子の受光面上に点状に集束させるようにしている。As described above, in the displacement measuring apparatus according to the embodiment, the irradiation point is formed by the lens array in which the plurality of spherical focusing type condensing lens units are arranged in a row in parallel with the beam scanning direction of the light projecting unit. Is focused into a substantially parallel beam, and this beam is focused on a light receiving surface of a light receiving element in a point-like manner by a spherical focusing type imaging lens.
【0040】このため、測定対象物の表面が粗な場合で
も、受光素子の受光面上の像が広がってぼけることがな
く、精度の高い変位測定ができる。Therefore, even when the surface of the object to be measured is rough, the image on the light receiving surface of the light receiving element is not spread and blurred, and a highly accurate displacement measurement can be performed.
【0041】また、ビームの走査範囲より径が大きい1
つの球面集束型の集光レンズのみで照射点からの光をほ
ぼ平行に集束して結像レンズ26へ出射する方式に比べ
て、受光面の幅が小さい受光素子を用いることができ
る。つまり、この種の受光素子はその幅が大きい程の応
答速度が遅くなることが知られているので、上記したよ
うに、小さな複数の集光レンズ部で照射点からの光を集
束するように構成することで、受光面の幅が小さい応答
速度の速い受光素子を用いることができ、走査速度を上
げて受光素子からの信号に対する処理速度を上げること
ができ、測定時間を短縮することが可能となる。The diameter 1 is larger than the beam scanning range.
A light receiving element having a smaller light receiving surface width can be used as compared with a method in which light from an irradiation point is converged almost in parallel by only two spherical focusing type condensing lenses and emitted to the imaging lens 26. In other words, it is known that the response speed of this type of light receiving element becomes slower as the width thereof is larger, so that light from the irradiation point is focused by a plurality of small condenser lenses as described above. With this configuration, a light-receiving element with a small width of the light-receiving surface and a high response speed can be used, and the scanning speed can be increased to increase the processing speed for signals from the light-receiving element, thereby shortening the measurement time. Becomes
【0042】なお、上記実施形態では、ビームの走査範
囲30mmに対して5つの集光レンズ部25a〜25e
を有するレンズアレイ25を用いていたが、これは本発
明を限定するものでない。例えば、より外形の小さい集
光レンズ部(例えば幅2mm)をより多く(例えば15
個)用いるようにしてもよく、このように集光レンズ部
の幅を小さくすれば、受光素子の受光面の幅をさらに小
さくすることができ、受光素子から出力される信号に対
する処理速度をさらに上げることができる。In the above embodiment, five condensing lens portions 25a to 25e are provided for a beam scanning range of 30 mm.
Is used, but this does not limit the present invention. For example, a condensing lens portion having a smaller outer shape (for example, 2 mm in width) is more (for example, 15 mm in width).
The width of the light-receiving surface of the light-receiving element can be further reduced by reducing the width of the condensing lens portion in this way, and the processing speed for a signal output from the light-receiving element can be further increased. Can be raised.
【0043】また、各集光レンズ部の焦点距離f1と結
像レンズ26の焦点距離f2の比f2/f1を小さくす
れば受光素子の幅も小さくできるが、このために結像レ
ンズ26の焦点距離f2を小さくすると収差が悪化し、
集光レンズ部の焦点距離f1を大きくすると受光量が低
下するため、被測定表面の状態や測定に要求される精度
等に応じて、各レンズの外形、焦点距離等を決定すれば
よい。The width of the light receiving element can be reduced by reducing the ratio f2 / f1 of the focal length f1 of each condenser lens portion to the focal length f2 of the imaging lens 26. When the distance f2 is reduced, the aberrations worsen,
When the focal length f1 of the condenser lens unit is increased, the amount of received light decreases. Therefore, the outer shape, focal length, and the like of each lens may be determined according to the state of the surface to be measured, the accuracy required for measurement, and the like.
【0044】また、前記実施形態のレンズアレイ25
は、複数の集光レンズ部が合成樹脂あるいはガラスで一
体成形されていたが、個別につくられた複数の集光レン
ズを接着して一体化してもよく、また、各集光レンズを
接着せずに隙間のない状態で一列に並べたものであって
もよい。Further, the lens array 25 of the above embodiment is used.
Although a plurality of condenser lenses were integrally formed of synthetic resin or glass, a plurality of individually produced condenser lenses may be bonded together to be integrated. They may be arranged in a line without any gap.
【0045】また、前記実施形態では、レンズアレイ2
5の各集光レンズ部および結像レンズ26を、一方の面
が実際に球面状に形成されている球面集束型のレンズを
用いていたが、光をその光軸の周りに均等にしぼり込む
ことができる球面集束型のレンズであればよく、両面が
球面または非球面のレンズを用いてもよい。In the above embodiment, the lens array 2
Although each of the condensing lens units 5 and the imaging lens 26 is a spherical focusing lens whose one surface is actually formed in a spherical shape, light is evenly converged around its optical axis. Any lens can be used as long as it is a spherical focusing type lens that can perform such operations, and a lens having both spherical surfaces or aspheric surfaces may be used.
【0046】[0046]
【発明の効果】以上説明したように、本発明の変位測定
装置は、光をその光軸の周りに均等にしぼり込むことが
できる球面集束型の複数の集光レンズ部がビーム走査方
向と平行に一列に並んでいるレンズアレイによって、照
射点からの光をほぼ平行なビームにし、このビームを球
面集束型の結像レンズで受光素子の受光面に集束させる
ようにしている。As described above, in the displacement measuring apparatus according to the present invention, a plurality of spherical focusing type condensing lens portions capable of uniformly squeezing light around the optical axis thereof are parallel to the beam scanning direction. The light from the irradiation point is converted into a substantially parallel beam by a lens array arranged in a row, and this beam is focused on a light receiving surface of a light receiving element by a spherical focusing type imaging lens.
【0047】このため、測定対象物の表面が粗な場合で
も、受光素子の受光面上の照射点の像が広がってぼける
ことがなく、しかも、受光面の幅の小さい応答速度が速
い受光素子を用いることができ、精度の高い変位測定を
高速に行なえる。Therefore, even when the surface of the object to be measured is rough, the image of the irradiation point on the light-receiving surface of the light-receiving element does not spread and is blurred, and the light-receiving surface has a small width and a high response speed. Can be used, and highly accurate displacement measurement can be performed at high speed.
【図面の簡単な説明】[Brief description of the drawings]
【図1】本発明の実施形態の構成を示す斜視図FIG. 1 is a perspective view showing a configuration of an embodiment of the present invention.
【図2】実施形態の側面図FIG. 2 is a side view of the embodiment.
【図3】実施形態の受光部をその光軸に直交する向きで
上からみた図FIG. 3 is a view of the light receiving unit according to the embodiment viewed from above in a direction orthogonal to the optical axis thereof.
【図4】実施形態の受光部をその光軸が水平となる向き
で側方からみた図FIG. 4 is a side view of the light receiving unit according to the embodiment in a direction in which its optical axis is horizontal.
【図5】光による変位測定の原理図FIG. 5 is a principle diagram of displacement measurement using light.
【図6】従来の走査型の変位測定装置の構成を示す斜視
図FIG. 6 is a perspective view showing a configuration of a conventional scanning displacement measuring device.
【図7】従来装置の動作を説明するための図FIG. 7 is a diagram for explaining the operation of the conventional device.
【図8】従来装置の結像パターンを示す図FIG. 8 is a diagram showing an imaging pattern of a conventional device.
21 光源 22 偏向装置 23 レンズ 25 レンズアレイ 25a〜25e 集光レンズ部 26 結像レンズ 27 受光素子 27a 受光面 DESCRIPTION OF SYMBOLS 21 Light source 22 Deflection device 23 Lens 25 Lens array 25a-25e Condensing lens part 26 Imaging lens 27 Light receiving element 27a Light receiving surface
フロントページの続き (58)調査した分野(Int.Cl.7,DB名) G01B 11/00 - 11/30 G01C 3/06 Continuation of the front page (58) Field surveyed (Int. Cl. 7 , DB name) G01B 11/00-11/30 G01C 3/06
Claims (1)
するビームを測定対象面に出射して、該測定対象面上の
ビームの照射点を走査する投光部と、 測定対象面上の照射点からの光を受けて該照射点の像を
受光素子の受光面上に結像させ、前記受光素子の受光面
上の光の結像位置に対応する信号を出力させる受光部と
を有し、 前記受光素子から出力される信号に基づいて前記照射点
の走査方向に沿った前記測定対象面の変位を測定する変
位測定装置において、 前記受光部は、 外形寸法が前記ビームの走査幅より小さく焦点距離がそ
れぞれ等しい複数の球面集束型の集光レンズ部が、それ
ぞれの光軸を平行に且つ該光軸と直交する線上に連続し
た状態で一列に並んで形成され、前記各集光レンズ部の
光軸が測定対象面上を走査される照射点に交わる向き
で、該照射点までの距離が前記焦点距離とほぼ等しくな
る位置に配置され、前記照射点からの光を前記各集光レ
ンズ部によって集束するレンズアレイと、 前記レンズアレイの各集光レンズ部によって集束された
ビームを前記受光素子の受光面上に集束させて、該受光
面上に測定対象面上の照射点の像を結像させる球面集束
型の結像レンズとを備えていることを特徴とする変位測
定装置。1. A light projecting unit which emits a beam whose optical axis moves in a predetermined range in parallel on the same plane to a surface to be measured, and scans an irradiation point of the beam on the surface to be measured, and a surface to be measured. A light receiving unit that receives light from the upper irradiation point, forms an image of the irradiation point on the light receiving surface of the light receiving element, and outputs a signal corresponding to an image forming position of light on the light receiving surface of the light receiving element; A displacement measuring device that measures displacement of the measurement target surface along a scanning direction of the irradiation point based on a signal output from the light receiving element, wherein the light receiving unit has an outer dimension of scanning the beam. A plurality of converging spherical converging lens units having a smaller focal length and a smaller focal length are formed in a row with their optical axes parallel and continuous on a line perpendicular to the optical axis. The optical axis of the optical lens part is set to the irradiation point where it is scanned on the surface to be measured. A lens array that is disposed at a position where the distance to the irradiation point is substantially equal to the focal length in the intersecting direction, and that focuses light from the irradiation point by each of the condensing lens units; A spherical focusing type imaging lens that focuses the beam focused by the lens unit on a light receiving surface of the light receiving element and forms an image of an irradiation point on a measurement target surface on the light receiving surface. Displacement measuring device characterized by the above-mentioned.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25775897A JP3326682B2 (en) | 1997-09-04 | 1997-09-04 | Displacement measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25775897A JP3326682B2 (en) | 1997-09-04 | 1997-09-04 | Displacement measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1183426A JPH1183426A (en) | 1999-03-26 |
| JP3326682B2 true JP3326682B2 (en) | 2002-09-24 |
Family
ID=17310696
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP25775897A Expired - Fee Related JP3326682B2 (en) | 1997-09-04 | 1997-09-04 | Displacement measuring device |
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| Country | Link |
|---|---|
| JP (1) | JP3326682B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10307210B2 (en) | 2013-04-30 | 2019-06-04 | Koh Young Technology Inc. | Optical tracking system and tracking method using the same |
-
1997
- 1997-09-04 JP JP25775897A patent/JP3326682B2/en not_active Expired - Fee Related
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| Publication number | Publication date |
|---|---|
| JPH1183426A (en) | 1999-03-26 |
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