JP3353585B2 - Plasma processing method and apparatus - Google Patents
Plasma processing method and apparatusInfo
- Publication number
- JP3353585B2 JP3353585B2 JP00098396A JP98396A JP3353585B2 JP 3353585 B2 JP3353585 B2 JP 3353585B2 JP 00098396 A JP00098396 A JP 00098396A JP 98396 A JP98396 A JP 98396A JP 3353585 B2 JP3353585 B2 JP 3353585B2
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- JP
- Japan
- Prior art keywords
- processing
- plasma
- container
- voltage power
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Treatments Of Macromolecular Shaped Articles (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は、樹脂、ゴム等の有
機材料、金属材料、セラミック材料等からなる物品表面
のプラズマを用いた改質処理、洗浄処理等のプラズマ処
理方法及びその方法を実施するためのプラズマ処理装置
に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a plasma treatment method such as a modification treatment and a cleaning treatment using plasma on the surface of an article made of an organic material such as a resin or rubber, a metal material, a ceramic material or the like, and to implement the method. To a plasma processing apparatus for performing
【0002】[0002]
【従来の技術】従来、物品の耐摩耗性、潤滑性、耐熱性
その他の特性を改善するために、物品表面に所定の物質
を注入して改質したり、物品表面粗度を向上させたり、
物品表面部分の性状を変化させたりする表面改質処理
や、物品表面に付着した汚れを除去する表面洗浄処理等
が行われている。このような表面処理としては、減圧下
で行うプラズマ処理、イオンビーム照射等がある。2. Description of the Related Art Conventionally, in order to improve the abrasion resistance, lubricity, heat resistance and other characteristics of an article, a predetermined substance is injected into the article surface to modify the article, or to improve the article surface roughness. ,
BACKGROUND ART Surface modification treatment for changing the properties of the article surface portion, surface cleaning treatment for removing dirt attached to the article surface, and the like are performed. Examples of such surface treatment include plasma treatment performed under reduced pressure, ion beam irradiation, and the like.
【0003】[0003]
【発明が解決しようとする課題】しかしながら、このよ
うに減圧下で物品表面処理を行う場合、処理容器内を所
定真空状態にするために排気能力の大きい排気装置が必
要であり、排気装置及びそのランニングコストが高くつ
く。特に、大型の物品への処理を行うためには大容量の
処理容器内を真空引きしなければならず、さらにコスト
高につく。However, when the article surface treatment is performed under reduced pressure as described above, an exhaust device having a large exhaust capability is required to bring the inside of the processing container into a predetermined vacuum state. Running costs are high. In particular, in order to process large-sized articles, it is necessary to evacuate the inside of a large-capacity processing container, which further increases the cost.
【0004】そこで本発明は、高価な排気装置を必要と
せず、またこのことから大型の被処理物品にもそれだけ
低コストで表面処理を行うことができるプラズマ処理方
法及び装置を提供することを課題とする。Accordingly, an object of the present invention is to provide a plasma processing method and apparatus which do not require an expensive exhaust device and which can perform a surface treatment on a large article to be processed at a low cost. And
【0005】[0005]
【課題を解決するための手段】前記課題を解決するため
に本発明者は研究を重ね、以下の知見を得た。すなわ
ち、大気圧又は略大気圧以上の処理用ガスに電力を印加
して該ガスをプラズマ化させる場合、高電圧電力を印加
すればプラズマを発生させることができ、減圧下でプラ
ズマを発生させるより効率よく、高密度のプラズマを得
ることができる。さらに、高電圧電力をパルス状に印加
すれば容易にかかるプラズマを発生させることができ
る。これらにより処理コスト高騰の要因となる排気装置
を省略することができる。Means for Solving the Problems In order to solve the above-mentioned problems, the present inventors have conducted various studies and have obtained the following findings. That is, when power is applied to a processing gas at or above atmospheric pressure to convert the gas into plasma, plasma can be generated by applying high-voltage power, rather than generating plasma under reduced pressure. High-density plasma can be obtained efficiently. Furthermore, if high-voltage power is applied in a pulse shape, the generated plasma can be easily generated. Thus, an exhaust device that causes a rise in processing cost can be omitted.
【0006】前記知見に基づき本発明は、処理容器内に
被処理物品を設置し、該容器内に圧力1kg/cm2 〜
10kg/cm2 の処理用ガスを導入するとともに、該
容器内圧力を1kg/cm2 〜10kg/cm2 の所定
圧に調整しつつ、該ガスに高電圧電力を印加してこれを
プラズマ化し、該プラズマのもとで前記被処理物品に所
定の処理を施すプラズマ処理方法を提供する。[0006] Based on the above findings, the present invention places an article to be processed in a processing vessel and places a pressure of 1 kg / cm 2-
While introducing a process gas of 10 kg / cm 2, while adjusting the vessel inside pressure at a predetermined pressure of 1kg / cm 2 ~10kg / cm 2 , which was plasma by applying a high voltage power to the gas, wherein under said plasma providing facilities to flop plasma processing method a predetermined process on an article to be treated.
【0007】また、前記知見に基づき本発明は、処理容
器と、該容器内に備えられた被処理物品支持手段と、該
容器内へ圧力1kg/cm2 〜10kg/cm2 の処理
用ガスを供給する手段と、該容器内の圧力を1kg/c
m2 〜10kg/cm2 の所定圧に調整するための手段
と、該処理用ガス供給手段により該容器内に導入される
処理用ガスに高電圧電力を印加して該ガスをプラズマ化
させるための高電圧電力印加手段とを有するプラズマ処
理装置を提供する。[0007] The present invention is based on the finding, and processing container, and the object to be processed article support means provided within the vessel, the pressure 1kg / cm 2 ~10kg / cm 2 of the processing gas into said vessel Supply means, and the pressure in the container is 1 kg / c.
a means for adjusting the pressure to a predetermined pressure of m 2 to 10 kg / cm 2 , and a means for applying high voltage power to the processing gas introduced into the container by the processing gas supply means to convert the gas into plasma. providing a high-voltage power applying means Help plasma processing apparatus having a.
【0008】本発明方法及び装置によると、高電圧電力
を印加することで大気圧又は略大気圧(約1kg/cm
2 )以上の処理用ガスをプラズマ化できる。従って、従
来の減圧プラズマ処理のような減圧下での表面処理に必
要であった処理を行う容器内を真空状態にするための排
気装置が不要になるとともに、かかる排気装置運転に伴
うランニングコストが不要になり、それだけ低コストで
処理を行うことができ、特に、大型の処理容器を必要と
する大型の被処理物品への処理も低コストで行うことが
できる。[0008] According to the method and apparatus of the present invention, by applying a high voltage power, the atmospheric pressure or nearly atmospheric pressure (about 1 kg / cm
2 ) The above processing gases can be turned into plasma. Accordingly, an exhaust device for evacuating the inside of a container for performing a process required for surface treatment under reduced pressure such as a conventional reduced-pressure plasma process becomes unnecessary, and running costs associated with the operation of the exhaust device are reduced. It becomes unnecessary, and the processing can be performed at a low cost. In particular, the processing of a large article to be processed that requires a large processing container can be performed at a low cost.
【0009】本発明方法及び装置におけるプラズマ処理
には、被処理物品表面に所定の物質を注入して改質した
り、該物品表面粗度を向上させたり、該物品表面部分の
性状を変化させたりする等の、プラズマによる表面改質
処理、該物品表面に付着した汚れを除去するプラズマに
よる表面洗浄処理等が含まれる。本発明方法における前
記処理用ガスへの高電圧電力の印加は、前記処理容器内
に配置した放電用主電極対と該主電極対間の放電開始を
介助する、放電用電極対を含む予備電離ピンとを高電圧
電源に対し並列に接続して該主電極対及び予備電離ピン
のそれぞれに該電源から高電圧を印加することで行う。
本発明装置における前記高電圧電力印加手段は、高電圧
電源と、該高電圧電源に並列に接続され、前記処理容器
内に配置された放電用主電極対及び予備電離ピンとを含
んでおり、該予備電離ピンは該主電極対間の放電開始を
介助する放電用電極対を含んでおり、該電源から主電極
対及び予備電離ピンのそれぞれに高電圧が印加される。In the plasma treatment in the method and apparatus of the present invention, the surface of the article to be treated is modified by injecting a predetermined substance, the surface roughness of the article is improved, or the property of the surface portion of the article is changed. And surface cleaning treatment by plasma for removing dirt attached to the surface of the article. Before in the method of the present invention
The application of the high voltage power to the processing gas is performed in the processing container.
The discharge main electrode pair and the discharge start between the main electrode pair
A high voltage is applied to the auxiliary ionizing pins including the discharge electrode pairs to assist
A main electrode pair and a pre-ionization pin connected in parallel to a power source;
Is performed by applying a high voltage from the power supply to each of them .
The high voltage power applying means in the present invention apparatus, high voltage
A power supply, and the processing container connected in parallel to the high-voltage power supply;
Main electrode pairs for discharge and pre-ionization pins
The preliminary ionization pin initiates discharge between the main electrode pair.
A pair of discharge electrodes for assistance, and a main electrode
A high voltage is applied to each of the pair and the preionization pin .
【0010】また、前記容器内の圧力を1kg/cm2
〜10kg/cm2 の所定圧に調整するための手段は、
例えば容器内圧力を検出するための圧力計、容器内圧力
を所定圧力に維持する目的で必要に応じ容器内ガスを放
出するための圧力調整弁等を含むものが考えられる。本
発明方法及び装置において、前記高電圧電力は1kV〜
50kV程度、好ましくは10kV〜30kV程度の直
流電力とすることが考えられる。これは、1kVより小
さいと、前記圧力範囲内の処理用ガスのプラズマ密度が
小さくなるため処理速度が低くなり、それだけ処理時間
が長くなってしまうからであり、50kVより大きいと
電源コストが高くつくからである。Further, the pressure in the container is set to 1 kg / cm 2
Means for adjusting to a predetermined pressure of 〜1010 kg / cm 2 are:
For example, a pressure gauge for detecting the pressure in the container, a pressure regulating valve for releasing gas in the container as needed for the purpose of maintaining the pressure in the container at a predetermined pressure, and the like are considered. In the method and apparatus of the present invention, the high voltage power is 1 kV to
It is conceivable to use DC power of about 50 kV, preferably about 10 kV to 30 kV. This is because if the voltage is lower than 1 kV, the plasma density of the processing gas within the pressure range becomes low, so that the processing speed becomes low and the processing time becomes long. If it is higher than 50 kV, the power supply cost becomes high. Because.
【0011】さらに本発明方法及び装置において、前記
高電圧電力はパルス状の高電圧電力とすることが考えら
れ、このとき大気圧又は略大気圧(約1kg/cm2 )
以上の処理用ガスのプラズマ化を容易に行うことができ
る。例えば電源として直流電源を用いるとき、パルス状
高電圧電力の印加繰り返し周波数は10Hz〜1000
Hz程度とすることが考えられる。これは、10Hzよ
り小さいと被処理物品がプラズマに曝される時間が短く
なるからであり、1000Hzより大きいと電源コスト
が高くつくからである。Further, in the method and the apparatus according to the present invention, the high voltage power may be a pulsed high voltage power. At this time, atmospheric pressure or approximately atmospheric pressure (about 1 kg / cm 2 ) is used.
The above processing gas can be easily converted into plasma. For example, when a DC power supply is used as a power supply, the application repetition frequency of pulsed high-voltage power is 10 Hz to 1000 Hz.
Hz. This is because if the frequency is lower than 10 Hz, the time during which the article to be processed is exposed to the plasma becomes shorter, and if the frequency is higher than 1000 Hz, the power supply cost increases.
【0012】本発明方法及び装置において、処理用ガス
に直流高電圧電力をパルス状に印加するにあたっては、
通常のスイッチを用いて高電圧電源からの電力印加のオ
ンオフを行うとスイッチ端子部に損傷を与えるため、例
えば高電圧電源からの電力を一旦コンデンサに充電した
後放電することを繰り返して前記ガスへの電力印加をパ
ルス状にする回路を採用できる。その充放電の繰り返し
は、例えば該コンデンサと並列に高電圧直流電源に接続
されたサイラトロンにより行うことが考えられる。In the method and apparatus of the present invention, when applying a DC high voltage power to the processing gas in a pulse form,
Turning on / off the application of power from the high-voltage power supply using a normal switch may damage the switch terminal.For example, charging the power from the high-voltage power supply once to the capacitor and then discharging the power repeatedly to the gas. A circuit that makes the power application pulsed can be employed. It is conceivable that the charge and discharge are repeated by, for example, a thyratron connected to a high-voltage DC power supply in parallel with the capacitor.
【0013】本発明方法及び装置における前記被処理物
品の材質としては、金属、セラミックのほか樹脂、ゴム
等の有機材料を挙げることができる。大気圧程度以上の
ガスのプラズマは非常に高温の熱プラズマであるため、
樹脂、ゴム等の比較的耐熱性が劣る材質からなる物品の
処理を行うときには、例えば、プラズマ発生領域と被処
理物品とを隔てる、一部にプラズマ通過孔を有する仕切
り壁を処理容器に設け、該物品が高温の熱プラズマ発生
領域に直接曝されないようにして処理を行うことが考え
られる。The material of the article to be treated in the method and apparatus of the present invention may be an organic material such as resin, rubber, etc. in addition to metal and ceramic. Since the plasma of a gas above atmospheric pressure is a very hot thermal plasma,
When processing an article made of a material having relatively low heat resistance such as resin and rubber, for example, a partition wall having a plasma passage hole is provided in a processing container, separating a plasma generation region and an article to be processed, It is conceivable to perform the treatment such that the article is not directly exposed to the high temperature thermal plasma generation region.
【0014】本発明方法及び装置において、被処理物
品、該物品の処理に用いることができる処理用ガス及び
それにより行われる処理の種類としては、表1に示す組
み合わせを例示できる。In the method and apparatus of the present invention, the combinations shown in Table 1 can be exemplified as the article to be processed, the processing gas that can be used for processing the article, and the type of processing performed thereby.
【0015】[0015]
【表1】 [Table 1]
【0016】前記フッ素含有ガスとしては、フッ素(F
2 )ガス、3フッ化窒素(NF3 )ガス、6フッ化硫黄
(SF6 )ガス、4フッ化炭素(CF4 )ガス、4フッ
化ケイ素(SiF4 )ガス、6フッ化2ケイ素(Si2
F6 )ガス、3フッ化塩素(ClF3 )ガス、フッ化水
素(HF)ガス等を挙げることができる。As the fluorine-containing gas, fluorine (F
2 ) gas, nitrogen trifluoride (NF 3 ) gas, sulfur hexafluoride (SF 6 ) gas, carbon tetrafluoride (CF 4 ) gas, silicon tetrafluoride (SiF 4 ) gas, disilicon hexafluoride ( Si 2
F 6 ) gas, chlorine trifluoride (ClF 3 ) gas, hydrogen fluoride (HF) gas and the like.
【0017】[0017]
【発明の実施の形態】以下、本発明の実施の形態を図面
を参照して説明する。図1は、本発明に係るプラズマ処
理装置の1例の概略構成を示す図である。この装置は耐
圧性の処理容器1を有し、容器1内には熱交換器2、ガ
ス循環用ファン3、高電圧電力を印加するための1対の
半円柱状の主電極41a、41b、2組の予備電離ピン
44a、44b及び被処理物品支持ホルダ5が設けられ
ている。高圧ガスプラズマは寿命が短いため、主電極4
1a、41bと被処理物品支持ホルダ5とは通常接近し
て配置される。Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing a schematic configuration of an example of a plasma processing apparatus according to the present invention. This apparatus has a pressure-resistant processing vessel 1, in which a heat exchanger 2, a gas circulation fan 3, and a pair of semi-cylindrical main electrodes 41a, 41b for applying high-voltage power are provided. Two sets of preliminary ionization pins 44a and 44b and a workpiece support holder 5 are provided. Since the high pressure gas plasma has a short life, the main electrode 4
1a, 41b and the article support holder 5 to be processed are usually arranged close to each other.
【0018】容器1外には高圧直流電源42、コンデン
サC、磁気スイッチSW、コイル(インダクタンス)L
及びサイラトロン43が設置されている。コンデンサ
C、磁気スイッチSW及びコイルLは直列に電源42に
接続されており、これら直列回路に並列してサイラトロ
ン43が電源42に接続されている。また、主電極41
a、41b及び2組の予備電離ピン44a、44bはそ
れぞれコイルLに並列に接続されている。Outside the container 1, a high-voltage DC power supply 42, a capacitor C, a magnetic switch SW, and a coil (inductance) L
And a thyratron 43. The capacitor C, the magnetic switch SW, and the coil L are connected in series to a power supply 42, and a thyratron 43 is connected to the power supply 42 in parallel with the series circuit. In addition, the main electrode 41
a, 41b and two sets of preliminary ionization pins 44a, 44b are connected to the coil L in parallel.
【0019】予備電離ピン44a、44bはそれぞれ先
端が尖った1対の電極及びコンデンサからなるものであ
り、容器1内の主電極41a、41b付近に配置されて
いる。面積が比較的広い電極間に直流電圧を印加する場
合、放電及びそれに伴うプラズマの発生が起こり難い
が、このように比較的広面積の主電極41a、41b付
近に予備電離ピン44a、44bを配置することで、予
備電離ピン44a、44bは主電極41a、41b間の
放電開始を介助する役割をする。The preionization pins 44a and 44b are each composed of a pair of electrodes having a sharp tip and a capacitor, and are arranged in the container 1 near the main electrodes 41a and 41b. When a DC voltage is applied between electrodes having a relatively large area, discharge and accompanying plasma are unlikely to occur. However, preliminary ionization pins 44a and 44b are arranged near main electrodes 41a and 41b having a relatively large area. By doing so, the preliminary ionization pins 44a and 44b play a role in assisting the start of discharge between the main electrodes 41a and 41b.
【0020】磁気スイッチSWはコイル(インダクタン
ス)Lとともに作用して、サイラトロン43への急激な
電流の流れを抑制して、サイラトロン43の損傷を防止
する役割をする。すなわち、磁気スイッチSWは、サイ
ラトロン43が接続されると同時的にはインピーダンス
が大きく、そのあと小さく変化させ得るもので、これに
よりサイラトロン43を保護できる。高電圧直流電源4
2、コンデンサC、磁気スイッチSW、コイルL、サイ
ラトロン43、主電極41a、41b及び2組の予備電
離ピン44a、44bは高電圧電力印加手段を構成す
る。The magnetic switch SW acts together with the coil (inductance) L to suppress a rapid current flow to the thyratron 43 and to prevent the thyratron 43 from being damaged. That is, when the thyratron 43 is connected, the impedance of the magnetic switch SW is large at the same time, and then the magnetic switch SW can be changed to a small value. Thus, the thyratron 43 can be protected. High voltage DC power supply 4
2. The capacitor C, the magnetic switch SW, the coil L, the thyratron 43, the main electrodes 41a and 41b, and the two sets of preliminary ionization pins 44a and 44b constitute high voltage power application means.
【0021】また、容器1には処理用ガス供給部6が接
続されており、ガス供給部6にはレギュレータ611、
612・・・及び弁621、622を介して接続された
1又は2以上の処理用ガスのガス源631、632・・
・が含まれる。さらに、容器1には圧力計81が接続さ
れるとともに圧力調整弁82が接続され、これらは容器
1内圧力を調整するための圧力調整部80を構成してい
る。The processing gas supply unit 6 is connected to the container 1, and the gas supply unit 6 has a regulator 611,
612 and one or more processing gas sources 631, 632,... Connected via valves 621, 622.
・ Is included. Further, a pressure gauge 81 and a pressure adjusting valve 82 are connected to the container 1, and these constitute a pressure adjusting unit 80 for adjusting the pressure inside the container 1.
【0022】この装置を用いて本発明方法を実施するに
あたっては、容器1内に、図示しない搬送手段にて被処
理物品Sを搬入し、被処理物品支持ホルダ5に物品Sを
支持させる。次いで、ガス供給部6より処理用ガスを容
器1内に導入するとともに主電極41a、41b間に1
kV〜50kVの高電圧電力を印加する。主電極41
a、41b間への電圧印加は、高電圧電源42から供給
された電力を一旦コンデンサCに充電し、これを放電さ
せることで行う。放電開始にあたっては、まず予備電離
ピン44a、44bにて放電開始し、その助けのもとに
引き続き主電極41a、41b間で放電が始まる。コン
デンサCへの充放電はサイラトロン43により行い、高
電圧電力のパルス状の印加を10Hz〜1000Hzの
周期で繰り返す。In carrying out the method of the present invention using this apparatus, the article S to be processed is carried into the container 1 by a transport means (not shown), and the article S is supported by the article support holder 5. Next, a processing gas is introduced into the container 1 from the gas supply unit 6, and one gas is applied between the main electrodes 41a and 41b.
A high voltage power of kV to 50 kV is applied. Main electrode 41
The voltage application between the terminals a and 41b is performed by temporarily charging the capacitor C with the power supplied from the high-voltage power supply 42 and discharging the capacitor C. When starting the discharge, the discharge is first started at the preliminary ionization pins 44a and 44b, and with the help of the discharge, the discharge starts between the main electrodes 41a and 41b. The charging and discharging of the capacitor C is performed by the thyratron 43, and pulse application of high-voltage power is repeated at a period of 10 Hz to 1000 Hz.
【0023】この場合、サイラトロン43は過電流に非
常に弱いため、磁気スイッチSWによりサイラトロン4
3に電流が流れ始めると同時に磁気スイッチSWのイン
ピーダンスを大きくしておき、初期にサイラトロン43
に急激な電流が流れるのを抑制し、数100nsec後
に磁気スイッチSWのインピーダンスを小さくして徐々
にサイラトロン43に電流が流れるようにする。In this case, since the thyratron 43 is very weak against overcurrent, the thyratron 4
3 and the impedance of the magnetic switch SW is increased at the same time as the current starts flowing through the thyratron 43.
The impedance of the magnetic switch SW is reduced after several 100 nsec so that the current gradually flows through the thyratron 43.
【0024】これにより前記導入した処理用ガスをプラ
ズマ化し、このプラズマの下で被処理物品Sに所定の処
理を施す。この間、ガス循環用ファン3の回転により容
器内のガスを均一化する。また、容器内雰囲気を主電極
41a、41b間へ送り込む。なお、ファン3の回転方
向は、主電極41a、41b間を通り被処理物品支持ホ
ルダ5に支持された被処理物品Sの方へ処理用ガスを送
り込むような方向としてある。また、圧力調整部80に
おける圧力調整弁82の操作にて容器内気体を容器外
へ、又は予め準備された適当な大気圧下の空間へ放出す
ることで容器1内のガス圧を1kg/cm2 〜10kg
/cm2 の範囲内の所定の圧に保つ。また、この間、高
温プラズマに起因して容器1内が高温になるため、熱交
換器2の運転により容器1内を冷却する。Thus, the introduced processing gas is turned into plasma, and a predetermined process is performed on the article S under the plasma. During this time, the gas in the container is made uniform by the rotation of the gas circulation fan 3. Further, the atmosphere in the container is sent between the main electrodes 41a and 41b. The direction of rotation of the fan 3 is such that the processing gas is sent toward the article S supported by the article support holder 5 through the space between the main electrodes 41a and 41b. Further, the gas pressure in the container 1 is reduced to 1 kg / cm by discharging the gas in the container to the outside of the container or to a space prepared under an appropriate atmospheric pressure by operating the pressure adjusting valve 82 in the pressure adjusting unit 80. 2 ~10kg
/ Cm 2 at a given pressure. During this time, the inside of the container 1 becomes high temperature due to the high-temperature plasma, so that the inside of the container 1 is cooled by the operation of the heat exchanger 2.
【0025】以上説明した方法及び装置によると、大気
圧又は略大気圧以上のガス圧の処理用ガスに高電圧電力
をパルス状に印加することで、該ガスをプラズマ化させ
ることができ、これにより減圧プラズマ処理に比べて高
密度のプラズマを効率よく得ることができる。また、容
器1内を真空状態にする必要がないため、排気装置が不
要であるとともに、その排気装置による排気のためのラ
ンニングコストが不要となる。According to the above-described method and apparatus, a high-voltage power is applied in a pulsed manner to a processing gas having an atmospheric pressure or a gas pressure higher than substantially atmospheric pressure, whereby the gas can be turned into plasma. As a result, high-density plasma can be efficiently obtained as compared with the low-pressure plasma treatment. Further, since it is not necessary to make the inside of the container 1 a vacuum state, an exhaust device is not required, and a running cost for exhausting by the exhaust device is unnecessary.
【0026】また、図2は本発明に係るプラズマ処理装
置の他の例の概略構成を示す図である。この装置は、図
1に示す装置において、処理容器1として大容量のもの
を用い、容器1内が仕切り壁11により二つの部分に分
けられているものである。仕切り壁11は、中央部にプ
ラズマを通過させるための孔11aを有する。また、被
処理物品支持手段5に代えて、後述するように、長尺又
は大型の被処理物品Sを支持するリール又は駆動テーブ
ルが仕切り壁11に対してプラズマ発生領域とは反対側
に設置される。その他の構成は図1の装置と同様であ
り、処理動作も同様である。図1の装置におけると同構
成、作用の部品には図1と同じ参照符号を付してある。FIG. 2 is a diagram showing a schematic configuration of another example of the plasma processing apparatus according to the present invention. This apparatus uses a large-capacity processing vessel 1 in the apparatus shown in FIG. 1, and the inside of the vessel 1 is divided into two parts by a partition wall 11. The partition wall 11 has a hole 11a at the center for allowing plasma to pass therethrough. In place of the article supporting means 5, a reel or a drive table for supporting a long or large article S is provided on the opposite side of the partition wall 11 from the plasma generation area, as described later. You. Other configurations are the same as those of the apparatus in FIG. 1, and the processing operations are also the same. Components having the same configuration and operation as those in the apparatus of FIG. 1 are denoted by the same reference numerals as those in FIG.
【0027】この装置を用いて本発明方法を実施する場
合、容器1内の容積が大きいため、長尺又は大型の被処
理物品にも処理を施すことができる。反面、立体構造物
に対するプラズマ処理は行い難いため、このような物品
への処理には図1の装置を用いればよい。図示の例で
は、長尺被処理物品Sを巻いたリールR1及び巻き取り
リールR2を仕切り壁11に対して主電極41a、41
bとは反対側の所定位置に配置している。長尺物品Sへ
の処理はリールR1から巻き取りリールR2に物品を順
に巻き取りつつ物品Sの上面を処理用ガスのプラズマに
曝すことで行う。リールR1、R2は仕切り壁11によ
りプラズマ発生領域から隔てられている。また、この
他、駆動テーブルに大型の被処理物品を支持させ、駆動
手段にて該駆動テーブルを平行に移動させることで該物
品上面全体に処理を行うこともできる。When the method of the present invention is carried out using this apparatus, since the volume in the container 1 is large, long or large articles can be treated. On the other hand, it is difficult to perform the plasma processing on the three-dimensional structure, and thus the apparatus shown in FIG. In the illustrated example, the reel R1 and the take-up reel R2 on which the long workpiece S is wound are separated from the main electrode 41a, 41 with respect to the partition wall 11.
It is arranged at a predetermined position on the opposite side to b. The processing on the long article S is performed by exposing the upper surface of the article S to the plasma of the processing gas while sequentially winding the article from the reel R1 to the take-up reel R2. The reels R1 and R2 are separated from the plasma generation region by a partition wall 11. In addition, the drive table can support a large article to be processed, and the drive means can move the drive table in parallel to perform processing on the entire upper surface of the article.
【0028】この装置を用いる場合、仕切り壁11によ
りプラズマ発生領域と被処理物品とが隔てられているた
め、耐熱性の低い物品に対しても処理を行うことができ
る。その他の作用効果は、図1に示す装置と同様であ
る。次に、ウレタンゴムからなる被処理物品Sの表面の
水による濡れ性を向上させるために、図1の装置を用い
て該物品Sにプラズマ処理を施した本発明方法実施の具
体例について説明する。When this apparatus is used, since the plasma generation region and the article to be processed are separated by the partition wall 11, it is possible to process even an article having low heat resistance. Other functions and effects are the same as those of the device shown in FIG. Next, a specific example of the method of the present invention in which the article S is subjected to plasma treatment using the apparatus shown in FIG. 1 in order to improve the wettability of the surface of the article S to be treated made of urethane rubber with water will be described. .
【0029】各実施例に共通の装置条件は次の通りであ
る。 主電極サイズ及び形状 半径50mm×長さ500mmの半円柱形状 主電極41a、41b間の間隔 28mm ガス循環用ファン3回転速度 500rpm 実施例1(表面改質処理及び表面洗浄処理) 被処理物品S材質 ウレタンゴム サイズ 100mm×100mm 印加電圧 25kV 繰り返し周波数 200Hz 容器内圧力 3kg/cm2 処理用ガス 酸素(O2 ) 処理時間 5min 実施例2(表面改質処理及び表面洗浄処理) 被処理物品S材質 ウレタンゴム サイズ 100mm×100mm 印加電圧 25kV 繰り返し周波数 200Hz 容器内圧力 3kg/cm2 処理用ガス 水素(H2 ) 処理時間 5min 実施例3(表面改質処理) 被処理物品S材質 ウレタンゴム サイズ 100mm×100mm 印加電圧 25kV 繰り返し周波数 200Hz 容器内圧力 3kg/cm2 処理用ガス 6フッ化硫黄(SF6 ) 処理時間 5min 次に、前記実施例1、2、3のプラズマ処理により得ら
れた物品、及び同一の被処理物品Sに6フッ化硫黄ガス
を用いて従来の減圧プラズマ処理を同一時間施して得ら
れた物品(比較例)のそれぞれについて、その表面の水
による濡れ性を評価した。水による濡れ性は水の接触角
を測定することで評価した。接触角は、空気中にある固
体面上に液体があるときの、固体、液体、気体の3相の
接触点で液体に引いた切線と固体面のなす角のうち、液
体を含むほうの角であり、図3において角θで表した角
である。The apparatus conditions common to each embodiment are as follows. Main electrode size and shape Semi-cylindrical shape with radius 50 mm x length 500 mm Distance between main electrodes 41 a and 41 b 28 mm Gas circulation fan 3 rotation speed 500 rpm Example 1 (Surface modification treatment and surface cleaning treatment) Urethane rubber Size 100 mm × 100 mm Applied voltage 25 kV Repetition frequency 200 Hz Container pressure 3 kg / cm 2 Processing gas Oxygen (O 2 ) Processing time 5 min Example 2 (Surface modification and surface cleaning) Article to be processed S material Urethane rubber Size 100 mm × 100 mm Applied voltage 25 kV Repetition frequency 200 Hz Container pressure 3 kg / cm 2 Processing gas Hydrogen (H 2 ) Processing time 5 min Example 3 (Surface modification) Material S to be processed Urethane rubber Size 100 mm × 100 mm Applied voltage 25kV repetition frequency 2 0Hz container pressure 3 kg / cm 2 treatment gas sulfur hexafluoride (SF 6) processing time 5min then the article obtained by the plasma treatment of the Examples 1, 2, 3, and identical to an article to be treated S The wettability of the surface of each of the articles (comparative examples) obtained by performing the conventional reduced-pressure plasma treatment using sulfur hexafluoride gas for the same time was evaluated. Water wettability was evaluated by measuring the contact angle of water. The contact angle is the angle between the solid line and the cut line drawn at the liquid at the three-phase contact point of solid, liquid, and gas when the liquid is on the solid surface in air. Which is the angle represented by the angle θ in FIG.
【0030】結果を次表に示す。 このように、実施例1、2、3の処理により得られた物
品は、比較例の処理により得られた物品より表面の濡れ
性が良く、大気圧程度以上のガスのプラズマを用いるこ
とで減圧プラズマを用いるより効率良く物品表面のプラ
ズマ処理を行えたことが分かる。The results are shown in the following table. As described above, the articles obtained by the treatments of Examples 1, 2, and 3 have better surface wettability than the articles obtained by the treatments of the comparative examples, and are decompressed by using a plasma of a gas at about atmospheric pressure or higher. It can be seen that the plasma treatment of the article surface was performed more efficiently than using plasma.
【0031】[0031]
【発明の効果】以上のように本発明によると、高価な排
気装置を必要とせず、またこのことから大型の被処理物
品にもそれだけ低コストで表面処理を行うことができる
プラズマ処理方法及び装置を提供することができる。As described above, according to the present invention, an expensive exhaust device is not required, and a large-sized article can be subjected to a surface treatment at a low cost without using an expensive exhaust device. Can be provided.
【図1】本発明に係るプラズマ処理装置の1例の概略構
成を示す図である。FIG. 1 is a diagram showing a schematic configuration of an example of a plasma processing apparatus according to the present invention.
【図2】本発明に係るプラズマ処理装置の他の例の概略
構成を示す図である。FIG. 2 is a diagram showing a schematic configuration of another example of the plasma processing apparatus according to the present invention.
【図3】水による濡れ性の程度を表す接触角θを説明す
る図である。FIG. 3 is a diagram illustrating a contact angle θ indicating a degree of wettability by water.
1 高圧容器 2 熱交換器 3 ガス循環用ファン 41a、41b 主電極 42 高電圧電力 43 サイラトロン 44a、44b 予備電離ピン C コンデンサ SW 磁気スイッチ L コイル 5 被処理物品支持ホルダ 6 処理用ガス供給部 80 圧力調整部 81 圧力計 82 圧力調整弁 R1、R2 リール DESCRIPTION OF SYMBOLS 1 High-pressure container 2 Heat exchanger 3 Gas circulation fan 41a, 41b Main electrode 42 High voltage power 43 Thyratron 44a, 44b Preionization pin C Capacitor SW Magnetic switch L Coil 5 Treated article support holder 6 Processing gas supply unit 80 Pressure Adjusting unit 81 Pressure gauge 82 Pressure adjusting valve R1, R2 Reel
フロントページの続き (56)参考文献 特開 平3−61376(JP,A) 特開 平7−118857(JP,A) 特開 平2−50967(JP,A) 特開 平5−235520(JP,A) 特開 昭60−116784(JP,A) 特開 平6−120144(JP,A) (58)調査した分野(Int.Cl.7,DB名) C23C 16/00 - 16/56 C08J 7/00 H05H 1/46 Continuation of the front page (56) References JP-A-3-61376 (JP, A) JP-A-7-118857 (JP, A) JP-A-2-50967 (JP, A) JP-A 5-235520 (JP) JP-A-60-116784 (JP, A) JP-A-6-120144 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) C23C 16/00-16/56 C08J 7/00 H05H 1/46
Claims (8)
器内に圧力1kg/cm2 〜10kg/cm2 の処理用
ガスを導入するとともに、該容器内圧力を1kg/cm
2 〜10kg/cm2 の所定圧に調整しつつ、該ガスに
高電圧電力を印加してこれをプラズマ化し、該プラズマ
のもとで前記被処理物品に所定の処理を施すようにし、
前記高電圧電力の印加は、前記処理容器内に配置した放
電用主電極対と該主電極対間の放電開始を介助する、放
電用電極対を含む予備電離ピンとを高電圧電源に対し並
列に接続して該主電極対及び予備電離ピンのそれぞれに
該電源から高電圧を印加することで行うことを特徴とす
るプラズマ処理方法。1. A The article to be treated was placed in a treatment vessel, together with introducing a processing gas at a pressure of 1kg / cm 2 ~10kg / cm 2 within the vessel, the vessel internal pressure 1 kg / cm
While adjusting the pressure to a predetermined pressure of 2 to 10 kg / cm 2 , high-voltage power is applied to the gas to convert it into plasma, and the predetermined process is performed on the article under the plasma .
The application of the high voltage power is performed by a discharge disposed in the processing container.
A discharge main electrode pair for assisting the start of discharge between the main electrode pair and the main electrode pair.
The pre-ionization pin including the charging electrode pair is
Connected to the main electrode pair and the preliminary ionization pin.
A plasma processing method, wherein the method is performed by applying a high voltage from the power supply .
求項1記載のプラズマ処理方法。2. The plasma processing method according to claim 1, wherein the high-voltage power is applied in a pulse shape.
容器内雰囲気を攪拌均一化しつつ前記処理用ガスをプラ
ズマ化する請求項1又は2記載のプラズマ処理方法。3. The plasma processing method according to claim 1, wherein the processing gas is converted into plasma while the atmosphere in the processing chamber is stirred and uniformed by a fan installed in the processing chamber.
した熱交換手段にて制御しつつ処理を行う請求項1、2
又は3記載のプラズマ処理方法。4. The process is performed while controlling the temperature in the processing vessel by a heat exchange means provided for the vessel.
Or the plasma processing method according to 3.
理物品支持手段と、該容器内へ圧力1kg/cm2 〜1
0kg/cm2 の処理用ガスを供給する手段と、該容器
内の圧力を1kg/cm2 〜10kg/cm2 の所定圧
に調整するための手段と、該処理用ガス供給手段により
該容器内に導入される処理用ガスに高電圧電力を印加し
て該ガスをプラズマ化させるための高電圧電力印加手段
とを有し、前記高電圧電力印加手段は高電圧電源と、該
高電圧電源に並列に接続され、前記処理容器内に配置さ
れた放電用主電極対及び予備電離ピンとを含んでおり、
該予備電離ピンは該主電極対間の放電開始を介助する放
電用電極対を含んでおり、該電源から該主電極対及び予
備電離ピンのそれぞれに高電圧が印加されることを特徴
とするプラズマ処理装置。5. A processing container, an article supporting means provided in the container, and a pressure of 1 kg / cm 2 to 1 kg in the container.
Means for supplying processing gas of 0 kg / cm 2, and means for adjusting the pressure within said vessel to a predetermined pressure of 1kg / cm 2 ~10kg / cm 2 , the container by the processing gas supply means the high voltage power is applied to have a high voltage power applying means for plasma the gas to the processing gas introduced into the high-voltage power applying means comprises a high voltage power supply, the
Connected in parallel to a high voltage power supply and placed in the processing vessel
A discharge main electrode pair and a preliminary ionization pin,
The pre-ionization pins are used to assist discharge initiation between the main electrode pairs.
A power electrode pair, and the main electrode pair and a spare
A plasma processing apparatus wherein a high voltage is applied to each of the ionization pins .
電力をパルス状に印加するものである請求項5記載のプ
ラズマ処理装置。6. The plasma processing apparatus according to claim 5, wherein said high voltage power application means applies said high voltage power in a pulsed manner.
均一化するためのファンを設けた請求項5又は6記載の
プラズマ処理装置。7. The plasma processing apparatus according to claim 5, wherein a fan is provided in the processing container to stir and uniformize the atmosphere in the processing container.
段を該容器に対し設けた請求項5、6又は7記載のプラ
ズマ処理装置。8. The plasma processing apparatus according to claim 5, wherein heat exchange means for controlling the temperature inside the processing container is provided for the container.
Priority Applications (1)
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|---|---|---|---|
| JP00098396A JP3353585B2 (en) | 1996-01-08 | 1996-01-08 | Plasma processing method and apparatus |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP00098396A JP3353585B2 (en) | 1996-01-08 | 1996-01-08 | Plasma processing method and apparatus |
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| Publication Number | Publication Date |
|---|---|
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| JP3353585B2 true JP3353585B2 (en) | 2002-12-03 |
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ID=11488845
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