JP3360352B2 - Scanner for confocal scanning laser microscope - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a scanner for a confocal scanning laser microscope used for measuring a line width of a pattern drawn on a mask or a reticle, and relates to scanning with the mask or the reticle set on a mask holder. It is made possible.

[0002]

2. Description of the Related Art A confocal scanning laser microscope is used as a dimension inspection apparatus for a mask, a reticle, or a wafer to measure a line width of a pattern drawn on a mask, a reticle, or a wafer, and to measure overlay accuracy. Is done. FIG. 2 shows a principle diagram of the confocal scanning laser microscope. Laser light 1 emitted from laser oscillator 10
2 is reflected by a mirror 14, narrowed by a lens 16 and passed through a pinhole 18. The laser beam 12 that has passed through the pinhole 18 passes through a beam splitter 20 and is converged by an objective lens 22 to irradiate a sample 24 (mask or reticle or wafer). The laser light reflected by the surface of the sample 24 is reflected by the beam splitter 20, passes through the pinhole 26, and is received and amplified by the photomultiplier tube 28.

When a dimensional inspection is performed, the position of the focal point F of the laser beam is fixed below the pattern 30 (or above the pattern 30) as shown in FIG. Then, while the sample 24 is scanned in the X-axis direction at a high frequency by the scan controller 32, the sample 24 is slowly moved in the Y-axis direction on the X and Y stages. At this time, when the beam spot passes below the pattern 30 as in (a), all the reflected light passes through the pinhole 26, and the output of the photomultiplier tube 28 increases. On the other hand, when the beam spot is passing over the pattern 30 as shown in (b), the reflected light is not focused at the position of the pinhole 26 and is largely blocked. The output will be smaller. Therefore, an image 36 of the pattern 30 is displayed on the television monitor 34 by sequentially drawing on the television monitor 34 at a luminance corresponding to the output of the photomultiplier tube 28 in synchronization with the scan by the scan controller 32. When the operator moves the cursor to an arbitrary position on the image 36, the pattern width at that position is automatically measured.

A specific example of a confocal scanning laser microscope for wafers using the above principle (SiScan manufactured by SiScan)
anIIA) will be described. FIG. 3 is a block diagram of the apparatus.
The confocal scanning laser microscope 40 for a wafer includes an optical module 42 and a work station 44, and is connected to each other by a signal cable 45. The optical module 42 includes a base 4 supported by an air suspension.
An X, Y stage 48 is mounted on the scanner 6, and a scanner 50 is mounted thereon. The sample is attached to the scanner 50 by being chucked by vacuum suction. A focusing device 52 is arranged above the scanner 50,
The laser beam emitted from the laser oscillator 10 is converged by the objective lens 22 and irradiates the sample on the scanner 50.
The optical system of FIG. 2 is housed in the optical system box 29. In addition, a television camera 56 with a zoom lens is disposed downward adjacent to the laser oscillator 10 and is used to take an image of a sample (wafer) near a laser irradiation position. An electric circuit chassis 5 is provided under the base 46.
8, an indicator 60 such as a vacuum for chuck, a power supply 62 for laser, a control device 8 of a robot for setting a sample on the scanner 50 and removing the sample whose inspection has been completed from the scanner 50 are provided.

On the other hand, the work station 44 includes an operator's operation panel 64, a television monitor 66, and a printer 6.
8. A control device 70 including a CPU and the like are provided so that all the optical modules 42 can be operated from the workstation 44. On the television monitor 66, an observation image by a laser microscope, an image by a television camera 56, and the like are displayed.

FIG. 4 shows a system configuration of the confocal scanning laser microscope 40 for a wafer shown in FIG. The sample (wafer) 24 is conveyed onto the scanner 50 by the wafer handling robot 72 and chucked. The laser beam 12 from the laser oscillator 10 is emitted from the objective lens 22 via the optical system shown in FIG. The reflected light is received by a photodetector 28 (such as a photomultiplier tube).

Computer 7 of workstation 44
Reference numeral 6 controls each unit via the bus 77. That is, the wafer handler control unit 82 drives the robot 72 to carry out and carry in the sample 24. Further, the X, Y stage motor control unit 78 drives the X, Y stage 48 to position a desired inspection location on the sample 24 within the scanning range of the laser light 12. In addition, the Z-axis focus control unit 80 moves the objective lens 22 in the up-down direction to focus on a pattern below or above the pattern on the sample 24. When focus is achieved, the height of the objective lens 22 is fixed there.

[0008] The scan control and synchronization circuit 84 performs readout of scan waveforms and synchronization control as scan control. The line scan waveform memory 86 stores a scan waveform such as a sine wave, and reads out the stored scan waveform at a high speed (for example, 2 kHz) according to a command from the scan control and synchronization circuit 84. The read scan waveform is converted into an analog waveform by a D / A converter 88, and the actuator (voice coil motor, piezoelectric element, etc.) of the scanner 50 is driven in the X-axis direction via an amplifier 90, Scan the light irradiation position. The scanning speed is maintained at a specified speed by speed feedback.

The output of the photodetector 28 is converted into a digital signal by an A / D converter 94 via an amplifier 92.
The pixel timing and synchronization circuit 96 is for obtaining the correspondence between the detection information of the photodetector 28 continuously obtained in each scan and the position on the X axis, and the data sequentially output from the A / D converter 94. In response to this, an address on one scan line is given and taken into the line scan pixel memory 98. The line scan distortion memory 100 corrects the spatial distortion of the scan waveform so that an accurate pattern is taken into the memory 98.

Scanning is performed while slowly moving the Y-axis of the X, Y stage 48 at a constant speed.
The data is sequentially taken into the memory 102, whereby X,
A pattern image in a desired range on the Y plane is displayed on the display area of the image monitor 104 on the television monitor. In the display area of the graphic monitor 106 on the television monitor, a photodetector detection waveform in the X-axis direction at the Y-axis position indicated by the cursor on the image monitor 104 is displayed. The pattern width is a value obtained by counting the number of pixels of the pattern stored in the video display memory 102 in the range indicated by the cursor on the image monitor 104 and averaging the count value at each position in the Y-axis direction within the cursor. Is automatically calculated, and the result is displayed on a television screen as a numerical value.

[0011]

In the case of a wafer, since the dimensions are fixed (8, 6, 5 inches, etc.), the wafer can be set as it is on the scanner 50 for inspection. However, masks and reticles vary in external dimensions (vertical and horizontal dimensions, thickness, etc.), weight and the presence or absence of accessory parts (pellicles, etc.). If the external dimensions are different, they cannot be set on the scanner 50 as they are. Further, if the weight is different, the behavior when the scanner is set on the scanner 50 is different, which may hinder the inspection in some cases. It is also necessary to correspond to the presence or absence of a pellicle.

In order to solve such a problem, the present applicant has proposed to set a mask or a reticle on a scanner with the mask or reticle mounted on a jig called a mask holder. By unifying the external dimensions of the mask holder and preparing various shapes and weights of the mounting surface of the mask and reticle according to the external dimensions and weight of the mask and reticle, preparing the mask and reticle Regardless of the external dimensions and weight, the external dimensions and weight of the mask holder as a whole are unified, and can be commonly handled by the scanner.

When a mask holder is used, a moment is generated if the position of the center of gravity of the scanner on which the mask or reticle is mounted is greatly deviated from the scanning drive shaft, so that the scanning drive causes vibration in directions other than the scanning direction. There is a problem that good inspection cannot be performed.

SUMMARY OF THE INVENTION The present invention has been made in view of the above points, and has as its object to provide a scanner which prevents vibrations other than in the scanning direction.

[0015]

According to the present invention, a mask holder for holding a mask or a reticle is provided.
Is the mask hole regardless of the external dimensions and weight of the reticle.
Dimensions, weight and center of gravity
The mask and reticle holding the mask
The scanning is performed by chucking the holder on the scanner in a state where the center of gravity of the holder is substantially coincident with the scanning drive shaft.

[0016]

According to the present invention, a mask holder for holding a mask or a reticle is provided outside the mask or the reticle.
All sizes, including mask holders, regardless of size and weight
Dimensions, weight, and center of gravity of the body
The mask holder holding the mask or reticle.
Since to carry out the scanning in a state where the was substantially matched with the center of gravity position for scanning on the drive shaft and chucked onto the scanner, the outer mask or reticle
Regardless of shape and size, the entire mask holder
As a result, the external dimensions and weight can be unified, whereby the moment can be reduced, and vibrations in the scanning direction can be prevented, and good inspection can be performed.

[0017]

An embodiment of the present invention will be described below. First, FIG. 5 shows a state in which a mask is inspected with a laser microscope using a mask holder. The inspection target mask (or reticle) 122 is inspected while being mounted on the mask holder 124. The mask holder 124 is prepared for each external dimension and thickness dimension of the mask 122, and holds the mask 122 at a predetermined position. Mask holder 124
Are unified so that common handling can be performed regardless of the type of mask.

When the mask holder 124 is carried into the pre-alignment device 126 by hand or by a robot or the like and placed thereon, the pre-alignment device 126 is moved to the master holder 124.
Is automatically positioned at a predetermined pre-alignment position. When the positioning is completed, the mask handler 128 scoops up the mask holder 124 from the pre-alignment device 126 in a certain process, mounts the mask holder 124 on the scanner 50, and performs inspection. When the inspection is completed, the mask handler 128 scoops up the mask holder 124 from the scanner 50 in the reverse process, and
Return to 6. Thus, the inspection of one mask 122 is completed.

FIG. 6 shows a specific example (optical module portion) of the laser microscope 120 shown in FIG. Parts common to those in FIG. 3 are denoted by the same reference numerals. The laser microscope 120 is entirely covered with a housing 139. Pre-alignment device 12
6 is provided at a position facing the front of the housing 139;
The lid 146 is opened to carry in and carry out the mask holder 124. Behind the pre-alignment device 126, a mask handler 128 is arranged. Further, the reference position of the scanner 50 is disposed at a position that is rotated leftward by 90 ° in the horizontal direction from the position of the pre-alignment device 126 about the rotation axis 146 of the mask handler 128.

The pre-alignment device 126 has a plate portion 130 on which the mask holder 124 is placed. The mask holder 124 is carried in from the outside manually or by a robot, and is roughly placed on the plate portion 130. A suction groove 131 for vacuum-sucking the mask holder 124 is formed on the surface of the plate portion 130. Utilizing the suction force of the suction groove 131, the mask 122 itself is firmly vacuum-sucked to the mask holder 124.

The plate-like portion 130 can be tilted forward (in the direction of loading the mask holder) with the tilt shaft 132 as an axis. The plate-like portion 130 is normally in a horizontal state, but it tilts when performing pre-alignment, and slides the mask holder 124 so that the two edges 133 and 134 are steep.
Lock with. Thus, the center position of the mask holder 124 matches the pre-alignment center position 135 of the pre-alignment device 126, and a pre-aligned state is obtained.

The mask handler 128 moves up and down,
It has three drive shafts for horizontal rotation and horizontal expansion and contraction. The mask hand 136 at the tip is inserted into the notch 140 of the plate portion 130 of the pre-alignment device 126, and the mask holder 124 is sucked up by vacuum suction. And
With the mask holder 124 vacuum-adsorbed, the scanner 5
Transfer to the top of the scanner 50 and cut out 51 of the scanner 50 (see FIG. 1)
Insert the mask hand 136 into the
24 is delivered to the scanner 50. The scanner 50 performs inspection by chucking the delivered mask holder 124 by vacuum suction.

A mask height detector such as a photoelectric type or a television camera type is disposed at a position facing the pre-alignment device 126, and detects the height of the mask placed on the plate-like portion 130. By detecting the height, an error in the combination of the mask holder and the mask is automatically detected, and the collision between the objective lens 22 and the mask 122 during the inspection is prevented.

A series of inspection steps using the laser microscope shown in FIG. 6 will be described with reference to FIG. When performing the inspection, the mask 12
The mask holder 124 on which the mask 2 is mounted is roughly placed on the plate portion 130 of the pre-alignment device 126 by hand or by a robot. When the inspection start button is pressed (P
1), the plate portion 130 of the pre-alignment device 126 performs vacuum suction to detect pressure, and detects whether or not the mask holder 124 is mounted on the plate portion 130 (P2).
P3). That is, when the pressure does not drop below the predetermined value, it is determined that the mask holder 124 is not set, and the vacuum suction is stopped (P4), and the inspection start command is released (P5).

If the pressure falls below a predetermined value, it is determined that the mask holder 124 is set, and the suction is stopped (P6). Then, the plate-shaped portion 130 of the pre-alignment device 126 is tilted by a predetermined amount to perform pre-alignment (P7). After the tilting is completed, suction is started again (P8),
The plate portion 130 is returned to a horizontal position (P9).

Next, the mask hand 136 of the mask handler 128 is inserted into the notch 140 of the plate portion 130 in a non-contact manner, and the mask hand 136 is slightly raised, so that the surface of the mask hand 136 is brought into contact with the surface of the plate portion 130. Positioning is performed at the same height (P10), and after suction of the mask hand 136 is started (P11), suction of the plate portion 130 is stopped (P12). Then, the mask hand 136 is raised, and the mask holder 124 is pulled up from the plate portion 130 (P13).

When the mask hand 136 is lifted,
Rotate left in the horizontal direction to extend the arms 142 and 144, and move the mask hand 136 to the notch 51 of the scanner 50.
(FIG. 1) is inserted in a non-contact manner (P14). At this time, the X and Y stages 48 are positioned at reference positions such as the origin. Then, lower the mask hand 136,
The surface of the mask hand 136 is positioned at the same height as the chuck surface of the scanner 50 (P15). After the positioning, the suction of the scanner 50 is started (P1
6), the suction of the mask hand 136 is stopped (P1).
7). The mask holder 124 is now in the scanner 50.
It is in a state where it is chucked.

Thereafter, the mask hand 136 is slightly lowered to contract the arms 142 and 144, and the mask hand 13
6 is drawn out of the notch 51 of the scanner 50 in a non-contact manner (P18). Thus, the inspection is started (P19). In the inspection, similarly to the conventional apparatus, the X, Y stage 48 is moved to position a desired inspection position on the mask 122 immediately below the objective lens 22, and the scanner 50 scans the mask holder 12.
4 by scanning the Y-axis stage at high speed in the X-axis direction.

When the inspection is completed (P20), the mask holder 124 is returned to the plate-like portion 130 of the pre-alignment device 126 in the reverse process of the loading (P21). Plate 13
The mask holder 124 returned to 0 is removed manually or by a robot.

According to the above series of inspection steps, the human or robot can use the pre-alignment apparatus 1 with the mask holder 128 facing the front of the optical module housing 139.
26, there is no need to insert an arm into the interior of the housing 139, and since the scanner 139 is located in the center of the housing 139, dust enters the inspection location. Can be prevented.

FIG. 8 shows the vacuum suction period of each device in the above series of inspection steps. According to this, after the mask holder 124 is pre-aligned, the vacuum suction periods are always overlapped and sequentially delivered and chucked by the scanner 50, so that the mask holder 124 is correctly chucked at the correct position on the scanner 50. Can be.

The above-described inspection process is executed by a command given from the control device 70 of the workstation 44 (FIG. 3) via the control device 150 of the optical module 120.

Next, one embodiment of the mask holder 124 is shown in FIGS. The mask holder 124 is made by processing an aluminum material. The mask holder 124 has an outer peripheral thin portion 160 formed in a substantially quadrangular shape. Ribs 162 are formed on the lower surface of the outer peripheral thin portion 160 for reinforcement. Further, a through hole 210 is formed in the outer peripheral thin portion 160 for weight adjustment. An aluminum adjustment weight 166 for adjusting the weight depending on the presence or absence of a stainless steel mask stopper 164 and a pellicle is screwed to the upper surface of the outer peripheral thin portion 160.

A suction surface 168 is formed on a step inside the outer peripheral thin portion 160 on the upper surface of the mask holder 124, and the peripheral edge of the mask or reticle is suctioned on this surface. Suction grooves 170, 171 and 172 are formed in the suction surface 168. A concave portion 174 is formed inside the suction surface 168,
The central portion of the mask is prevented from contacting the mask holder 124. The concave portion 174 is formed deep enough so that the pellicle does not come into contact with the mask holder 124 even in a mask with a pellicle.

The central portion 17 on the lower surface of the mask holder 124
Reference numeral 6 denotes a chuck surface of the scanner 50. Therefore, this surface 176 is formed with extremely high flatness. Near the four corners of the chuck surface 176, lower suction holes 188 of suction paths 184, 186 communicating with the suction holes 180, 182 of the suction grooves 170, 171 on the surface are formed. The suction hole 188 is provided in the pre-alignment device 126.
And used for suction by the scanner 50. Also,
In the center of the chuck surface 176, a lower suction hole 19 of a suction path 192 communicating with the suction hole 190 of the suction groove 172 on the surface is provided.
4 are formed. The suction holes 194 are used for suction by the mask handler 128. By sucking through the suction holes 188 or 194, the mask 122 is attracted to the mask holder 124, and the mask holder 12
4 itself is also attracted to the pre-alignment device 126, the mask handler 128, the scanner 50, and the like.

FIG. 11 shows a state in which the mask with pellicle 122 is mounted on the mask holder 124 shown in FIGS.
The vicinity of the lower surface peripheral portion of the mask 122 is placed and supported on the suction surface 168. In addition, the side face is the mask stopper 164
Are supported by a point contact with the convex portion 200 and are not moved. Because of the point contact, generation and contamination of particles are prevented. The pellicle 204 is provided on the upper and lower surfaces, but since the concave portion 174 is deep, the pellicle 204 can hold the mask holder 124 without contacting the mask holder 124. Since the weight of the mask 122 is increased by the amount of the pellicle 204, the adjustment weight 1
66 (FIG. 9) is maintained at a predetermined weight. Adjustment weight 166 for mask without pellicle
Attach and adjust to the specified weight.

Since the thickness varies depending on the mask,
The height of the suction surface 168 is individually designed according to the thickness of the mask 122 to be used so that the height from the chuck surface 176 to the surface of the mask 122 is always constant. If the weight and the center of gravity of the mask holder 124 and the mask 122 are different, the behavior when driven by the scanner 50 changes, which may hinder the inspection. Therefore, the weight and the center of gravity of the mask holder 124 and the mask 122 may be changed. The weight and the position of the center of gravity of the mask holder 124 are individually designed according to the weight of the mask 122 to be used so as to be always constant. However, the external dimensions (vertical and horizontal dimensions) of the mask holder 124 are unified so that they can be handled in common.

Incidentally, since the manufacturing accuracy of the mask holder 124 affects the inspection accuracy when inspecting with a scanner, extremely high accuracy is required. In particular, the weight, the moment with respect to the scanner drive shaft (that is, the position of the center of gravity), the flatness of the chuck surface 176 in contact with the scanner, the thickness accuracy, and the outer dimension accuracy are severe. These requirements are specifically summarized below, for example.

(A) The normal size requires a JIS standard tolerance of 12 in the cutting dimension of JIS, and in some cases, the critical size requires a tolerance of 1/4 or less. (B) A flatness of about 10 μm is required. (C) Require a tolerance of 2% or less by weight. (D) Moment error must be 2% or less of the whole.

In order to satisfy these requirements, the fabrication of the mask holder 124 requires a complicated shaving process. One embodiment of the manufacturing process for that will be described with reference to FIG.

An aluminum material having a sufficient margin and thickness with respect to the final external dimensions is cut out so as not to be affected by the internal stress of the material cutting portion. The outer peripheral contour, the upper and lower through-holes 210 and the like are finished by wire cutting to reduce residual stress in the cut portion. While measuring the dimensions of the front and back surfaces, the shaving process is divided into roughing, middleing, fine, and finishing, and the cutting process is performed alternately on the front and back sides.
8, recess 174, chuck surface 176, rib 162, etc.). Further, each suction path 184, 1
86 and 192 are machined from the bottom and side surfaces with a drill.
Unnecessary openings on the bottom and side surfaces formed at this time are later closed with blind plugs.

As a part that does not require dimensional accuracy and has little effect on the moment due to the driving of the scanner,
For example, the rear surface of the outer peripheral thin portion 160 is slightly cut to adjust the weight. Anodized to complete.

Next, one embodiment of the scanner 50 of the present invention is shown in FIG. The scanner 50 is mounted on the base plate 26.
0 is mounted on the X, Y stage 48 (FIG. 6).
One ends of the leaf springs 262 and 264 are horizontally fixed on the base plate 260, and a chuck member 266 is supported on the distal ends of the leaf springs 262 and 264 so as to be able to vibrate in the X-axis direction and float from the base plate 260. .

The upper surface of the chuck member 266 is the chuck surface 2
70 and are formed with high flatness. A suction groove 272 is formed in the chuck surface 270, and suction is performed from a suction hole 274. When the mask holder 124 is placed, the chuck surface 270 comes into close contact with the chuck surface 176 on the lower surface of the mask holder 124, and the suction groove 272 communicates with the suction hole 188 on the lower surface of the mask holder 124. Thus, when suction is performed from the suction hole 274, the mask 122 is suctioned to the mask holder 124, and the mask holder 124 is suctioned to the chuck member 266. Accordingly, even when the scanning operation is performed, the mask holder 124 does not shift with respect to the chuck member 266, and the mask 122 does not shift.

A voice coil motor 268 is mounted on the left side of the chuck member 266. By supplying a drive signal to the voice coil motor 268, the chuck member 266 vibrates in the X-axis direction to perform scanning. At this time, the total weight of the chuck member 266 and the mask holder 124 and the mask 122 together is always constant, and the chuck member 266 is designed such that the position of the center of gravity of the whole coincides with the scanner drive shaft 270. The moment of the moment is small, and the vibration of the chuck member 266 is in the mode only in the X-axis direction, and the observation can be performed under favorable conditions in which the vertical vibration is eliminated (the focus will not be adjusted if the vertical vibration is present). A coil type speed sensor is attached to the right side of the chuck member 266, and is used for feedback control of the scanning speed.

A counter balance scanner 280 is mounted on the lower surface of the base plate 260. The counter balance scanner 280 reduces the vibration of the entire system by causing the scanner 50 to vibrate in a direction opposite to the driving direction.

The counter balance scanner 280 is
Left and right leaf springs 284, 28
6, the voice coil motor 28 on the left side
At 8, the scanner 270 is driven in the opposite direction. At this time, the speed is detected by the right speed sensor 290 and used for speed feedback. The weight of the counterbalance 282 is set equal to the total weight of the chuck member 266, the mask holder 124, and the mask 122.

FIG. 13 shows an embodiment of the driving device of the scanner 50. Information such as a sine waveform read from the waveform memory 86 is converted into an analog signal by the D / A converter 88, and the scanner 50 is driven via the amplifier 90.
At this time, the scan speed is kept at the specified speed by the speed feedback. The drive signal is supplied to the amplifier 90 '.
The counter balance scanner 280 is oscillated in the opposite direction via the. The speed at this time is also maintained at a specified speed by speed feedback. In this manner, scanning is performed while suppressing the vibration of the entire system to a close extent.

[0049]

As described above, according to the present invention, a mask holder for holding a mask or a reticle is provided.
The external dimensions and weight of the mask or reticle
Dimensions and weight as a whole including mask holder
And the mask or reticle with a constant center of gravity
With the center of gravity of the mask holder holding the scanner substantially aligned with the scanning drive shaft.
The scanning is performed by chucking the mask or reticle.
The same external dimensions and weight for the entire mask holder
Can thereby be reduced moment, it is possible to perform a good test to prevent vibration of the scanning direction.

[Brief description of the drawings]

FIG. 1 is a diagram showing one embodiment of the present invention.

FIG. 2 is a principle diagram of a confocal scanning laser microscope.

FIG. 3 is an apparatus configuration diagram of a confocal scanning laser microscope.

FIG. 4 is a block diagram showing a system configuration of the confocal scanning laser microscope 40 of FIG.

FIG. 5 is a block diagram showing an outline of an inspection using a mask holder.

6 is a diagram showing a specific configuration of the laser microscope of FIG.

FIG. 7 is a flowchart showing a series of inspection steps by the apparatus shown in FIG. 6;

8 is a time chart showing a vacuum suction period of each device in the inspection step of FIG. 7;

FIG. 9 is a view showing one embodiment of a mask holder.

10 is an arrow view and a sectional view of the mask holder of FIG. 9;

FIG. 11 is a view showing a state where a mask is mounted on the mask holder of FIG. 9;

FIG. 12 is a view showing a manufacturing process of the mask holder of FIG. 9;

FIG. 13 is a block diagram of a driving device of the scanner of FIG. 1;

[Explanation of symbols]

Reference Signs List 50 scanner 120 confocal laser microscope for mask or reticle 122 mask or reticle 124 mask holder 170 scanning drive shaft

──────────────────────────────────────────────────続 き Continued on the front page (58) Fields surveyed (Int. Cl. ⁷ , DB name) G01B 11/00-11/30 102 G01B 21/00-21/32 G02B 21/00-21/36 G12B 5 / 00

Claims (1)

(57) [Claims] A mask holder for holding a mask or a reticle is provided with an external dimension and weight of the mask or a reticle.
Dimensions as a whole including mask holders regardless of quantity
The method, weight and center of gravity are made constant and this mask or
The ski mask holder which holds the reticle in a state of substantially matched the position of the center of gravity on the scanning drive shaft
A scanner for a confocal scanning laser microscope, wherein scanning is performed by chucking on a scanner.