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JP3392966B2 - Optical component characteristic measuring device - Google Patents
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JP3392966B2 - Optical component characteristic measuring device - Google Patents

Optical component characteristic measuring device

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Publication number
JP3392966B2
JP3392966B2 JP31591094A JP31591094A JP3392966B2 JP 3392966 B2 JP3392966 B2 JP 3392966B2 JP 31591094 A JP31591094 A JP 31591094A JP 31591094 A JP31591094 A JP 31591094A JP 3392966 B2 JP3392966 B2 JP 3392966B2
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JP
Japan
Prior art keywords
optical component
optical
measured
reverse
waveguide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP31591094A
Other languages
Japanese (ja)
Other versions
JPH08145847A (en
Inventor
良博 今野
嘉子 岩田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Namiki Precision Jewel Co Ltd
Adamant Namiki Precision Jewel Co Ltd
Original Assignee
Namiki Precision Jewel Co Ltd
Adamant Namiki Precision Jewel Co Ltd
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Filing date
Publication date
Application filed by Namiki Precision Jewel Co Ltd, Adamant Namiki Precision Jewel Co Ltd filed Critical Namiki Precision Jewel Co Ltd
Priority to JP31591094A priority Critical patent/JP3392966B2/en
Publication of JPH08145847A publication Critical patent/JPH08145847A/en
Application granted granted Critical
Publication of JP3392966B2 publication Critical patent/JP3392966B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】 【0001】 【発明の属する技術分野】本発明は、光ファイバを介し
て外部の光学処理システムに接続される光学部品の特性
測定装置に関するものである。 【0002】 【従来の技術】光通信等において用いられる各種の光学
部品,殊に、光アイソレータや光サーキュレータ等の光
ファイバ中に配置される部品は部品自体の特性は勿論、
ファイバ中における順方向及び逆方向の挿入損失,偏波
依存性,反射減衰量等に対し、どの程度の特性を発揮す
るかを検査する必要がある。即ち、光ファイバ中を伝播
してくる光の偏波状態が無秩序であっても一定の光学特
性が維持できるか否か、光学部品の界面から反射されて
回帰してしまう光量等に対してどの程度の能力を有する
かを特定する必要がある。 【0003】従来、上述した光学部品の特性を測定する
には個別の検査回路を用い、少なくとも順方向並びに逆
方向の挿入損失,順方向並びに逆方向の反射減衰量,偏
波依存性毎に個々に検査することが行なわれている。ま
た、光学部品を検査回路に組み付ける前に各検査項目に
ついて検査回路自体の測定を行い、しかる後に光学部品
を検査項目毎に個別にファイバ融着で接合することによ
り検査回路に組み付けて測定することが行なわれてい
る。 【0004】通常、ファイバ融着には10分程度の時間
を要し、上述した検査項目毎の各ファイバ融着を含める
と長い段取り時間が必要となる。また、ファイバ融着を
繰返し行うのに伴って不確定要素が混入することから測
定データが不確実なものになってしまう。 【0005】 【発明が解決しようとする課題】本発明は、光学部品の
検査項目のうち少なくとも順方向挿入損失,逆方向挿入
損失,順方向反射減衰量,逆方向反射減衰量,偏波依存
性を極めて能率よく正確に測定可能な光学部品の特性測
定装置を提供することを目的とする。 【0006】 【課題を解決するための手段】本発明に係る光学部品の
特性測定装置においては、被測定光学部品をファイバの
融着接合で組み付けて光学部品の特性を測定する検査回
路でなり、発光源の入射端には導波路を順方向と逆方向
とに切り換える光スイッチを備え、順方向の導波路には
偏波制御器を配置すると共に、該偏波制御器に引き続く
導波路を光カプラーで三方向に分岐接続し、その1つは
被測定光学部品の片端子を接合するファイバ端とし、他
の2つのには順方向反射減衰量及び逆方向挿入損失を測
定する光パワーメータと、発光源参照光強度を測定する
光パワーメータを接続し、 逆方向の導波路には方向性
光循環器を配置し、この方向性光循環器の1端子より引
き続く導波路は被測定光学部品の他端子を接合するファ
イバ端とし、他の端子には挿入損失,逆方向反射減衰量
並びに偏波依存性を測定する光パワーメータを備え、更
に、順方向,逆方向の各導波路には被測定光学部品接合
用のファイバ端をベンディングするチャックを備え、光
学部品の検査項目のうち少なくとも順方向挿入損失,逆
方向挿入損失,順方向反射減衰量,逆方向反射減衰量,
偏波依存性を被測定光学部品の組付け前,組付け状態で
順方向,逆方向個別に夫々測定し、被測定光学部品組付
け前の測定データを基準光強度として両者の測定データ
を対比し、その両者の差異に基づいて被測定光学部品を
ファイバ融着で1回接合することから光学部品自体の特
性を測定する検査回路として構成されている。 【0007】 【作用】本発明に係る光学部品の特性測定装置では、光
学部品を検査回路のファイバ端に対して1回のファイバ
融着を行なうだけで光学部品の特性を測定可能な回路構
成を具体化できる。これにより、光学部品の検査項目の
うち少なくとも順方向挿入損失,逆方向挿入損失,順方
向反射減衰量,逆方向反射減衰量,偏波依存性を測定で
きるため、光学部品の特性を能率よくしかも不確定要素
の混入を生ずることなく測定可能で、また、各検査項目
の測定データを順方向,逆方向毎に分けしかも光学部品
の組付け前,後で求めて対比することにより光学部品の
特性を正確に測定できる。 【0008】 【発明の実施の形態】以下、添付図面を参照して説明す
ると、図1は、本発明に係る光学部品の特性測定装置を
示す。同図中、各装置を接続する実線は光学回路系を示
し、点線は電気回路系を示す。その検査回路は発光源1
を備え、この発光源1より入射する光線を順方向,逆方
向の各ファイバ端に融着接合する光アイソレータや光サ
ーキュレータ等の被測定光学部品に導通することにより
該光学部品の特性を測定する光学検査回路として構成さ
れている。また、検査項目としては光学部品の特性のう
ち少なくとも順方向挿入損失,逆方向挿入損失,順方向
反射減衰量,逆方向反射減衰量,偏波依存性が対象にさ
れている。 【0009】その検査回路は、光スイッチ2を発光源1
の入射端に配置することにより導波路が順方向と逆方向
とに切換え自在に構成されている。この導波路の順方向
にはファイバをコイル状に巻回すると共に、所定のステ
ップづつ回転することにより光の偏波を制御する偏波制
御器3が備えられている。また、偏波制御器3に引き続
く導波路は光カプラ4で三方向に分岐接続されている。 【0010】その三方向のうち、1つは被測定光学部品
の片端子を接続するファイバ端f1として導出されてい
る。他の2つには、順方向反射減衰量及び逆方向挿入損
失を測定する光パワーメータ5と、発光源参照光強度を
測定する光パワーメータ6とが備えられている。なお、
発光源1と光スイッチ2との間、偏波制御器3と光カプ
ラ4との間、光カプラ4と各光パワーメータ5,6との
間には光の戻り反射を防ぐアイソレータ7,8,9,1
0が組み付けられている。 【0011】逆方向の導波路には、三端子型サーキュレ
ータ等の方向性光循環器11が配置されている。この方
向性光循環器11からは、被測定光学部品の他端子を接
合するファイバ端fが1端子より引き続く導波路とし
て導出されている。他の端子には、挿入損失,逆方向反
射減衰量並びに偏波依存性を測定する光パワーメータ1
2が備えられている。 【0012】上述した各装置に加えて、順方向,逆方向
の各導波路には被測定光学部品接合用のファイバ端
,fをベンディングするチャック13,14が備
えられている。各ファイバ端f,fの間には、被測
定光学部品を挿通支持する治具15が備えられている。
また、治具15には被測定光学部品並びに導波路の温度
条件を可変自在なペルチェ等の半導体発熱素子16が備
えられている。 【0013】このように回路構成する光学部品の特性測
定装置では、光学部品の特性をコンピュータ17による
メニュー操作乃至は連続全自動で測定できる。その測定
データは読み込み可能な型式にし、フロッピーディスク
に記録するようにもできる。また、波長1470〜15
90mm程度の可変レーザを適用し、被測定光学部品の
特性を温度−20℃〜80℃程度の可変温度条件のもと
に測定するとよい。この可変条件に応じて、各検査項目
を測定すれば、一般に汎用される広範な波長並びに異な
る使用環境における光学部品の特性について数多くの測
定データが得られる。 【0014】この光学部品の特性測定装置では、被測定
光学部品を組み付ける前に検査回路自体について各検査
項目を順方向,逆方向個別に各々測定した後、被測定光
学部品を検査回路中に組み付けて各検査項目の測定を順
方向,逆方向個別に行うようにする。その検査回路自体
より求めた測定データを基準光強度として両者の測定デ
ータを対比し、この両者の差異を求めれば、被測定光学
部品を一回のファイバ融着で回路中に組み付けることに
より光学部品自体の特性を測定できる。 【0015】まず、被測定光学部品を組み付けないで検
査回路自体について各検査項目の測定を行う。システム
全体を立ち上げ、図2で示すように光スイッチ2を順方
向側にする。その順方向には指定波長の光を発光源1よ
り入射し、順方向のリターンロス用基準パワーを光パワ
ーメータ5で測定し、RLI1wする。次に、図3で示
すように順方向のファイバ端fをチャック13でベン
ディングし、ファイバ端fの端面からの反射戻り光量
をゼロにさせて光パワーメータ5に入力することにより
順方向の寄生戻り光量を測定し、RLI2wとする。 【0016】その後、図4で示すように光スイッチ2を
逆方向に切り換えて指定波長の光を発光源1より入射
し、逆方向のリターンロス用基準パワーを光パワーメー
タ12で測定し、RLO1wとする。また、図5で示す
ようにファイバ端fをチャック14でベンディング
し、ファイバ端fの端面からの反射戻り光量をゼロに
することにより逆方向の寄生戻り光量を光パワーメータ
12で測定し、RLO2wとする。 【0017】今までは各ファイバ端f,fを切り離
し状態に保ったが、次には検査回路自体の寄生損失,偏
波依存性を測定するべく各ファイバ端f,fを接続
する。この測定にあたっては、図6で示すように光スイ
ッチ2を順方向に切り換え、或いは図7で示すように前
工程に引き続いて光スイッチ2を逆方向に維持すること
から順方向,逆方向いずれの測定を先に行ってもよい。 【0018】順方向では、図6で示すように偏波制御器
3並びに半導体発熱素子16を作動し、可変温度条件の
もとに発光源1より指定波長の光を入射することにより
寄生偏波依存量の上限,下限値を光パワーメータ12で
測定し且つ寄生損失も測定する。また、図7で示すよう
に逆方向の寄生損失を光パワーメータ5で測定し、IS
Rwtとする。 【0019】その検査回路自体の偏波依存性(PDLR
wt)は、光パワーメータ6による発光源参照光強度
(OPM2wti)並びに光パワーメータ12による測
定値(OPM3wti)から、次の式1で求めることが
できる。なお、iはポアンカレ球の中の位置番号を示
し、具体的には偏波制御器3内のλ/2位相差素子とλ
/4位相差素子の各回転角度に対応した番号を示す。ま
た、MAX,MINはOPM3wtiの最大パワー値及
び最小パワー値を夫々示す。 【0020】 【式1】PDLRwt=−10*log(OPM3wt
MAX/(OPM2wti+OPM3wti))−(−
10*log(OPM3wtMIN/(OPM2wti
+OPM3wti))) 【0021】また、順方向の寄生損失(ILRwt(d
B))は、光パワーメータ12による測定値(OPM3
wti)から次の式2で求められる。 【0022】 【式2】ILRwt=−10*log(OPM3wtM
AX/(OPM2wti+OPM3wti)) 【0023】今までは検査回路自体について各検査項目
の測定を行ったが、これからは、図8,9で示すように
被測定光学部品Dを各ファイバ端f,fにファイバ
融着で接合することにより各検査項目の測定を行う。こ
の際にも指定波長の光を発光源1より入射し、半導体発
熱素子16を作動することにより可変温度条件のもとに
順方向,逆方向別に測定を行う。 【0024】まず、図8で示すように光スイッチ2を順
方向にセットし、順方向の偏波依存性(PDLwt)を
測定する。その偏波依存性は上述した検査回路自体の偏
波依存性(PDLRwt)と対比することから、次の式
3で光学部品自体のものとして求められる。 【0025】 【式3】PDLwt(dB)=−10*log(OPM
3wtMAX/(OPM2wti+OPM3wti))
−(−10*log(OPM3wtMIN/(OPM2
wti+OPM3wti)))−PDLRwt 【0026】また、順方向の偏波依存性(PDLwt)
の測定データに基づいて順方向の損失(ILwt)を検
出回路自体の寄生損失(ILRwt)と対比し、次の式
4から求めることができる。 【0027】 【式4】ILwt(dB)=−10*log(OPM3
wtMAX/(OPM2wti+OPM3wti))−
ILRwt 【0028】次に、順方向のリターンロス(RLIw
(dB))を光パワーメータ5による順方向のリターン
ロス用基準パワー(RLI1w),検出回路自体の光パ
ワーメータ5による順方向の寄生戻り光量(RLI2
w)とで対比し、次の式5で求める。 【0029】 【式5】RLIw(dB)=−10*log(KR(O
PM1w−RLI2w)/(RLI1w−RLI2
w)) 【0030】但し、KRは光ファイバの切断部における
コア部(石英)と空気媒体界面からの光の反射係数であ
り、0.03336とする。この反射係数(KR)は、
石英の屈折率1.4469(n1),空気の屈折率1
(n2)に基づいて次の式6で求められる。なお、OP
M1wは光パワーメータ5による測定値である。 【0031】 【式6】KR=((n−n)/(n+n)) 【0032】今度は光スイッチ2を逆方向に切り換え、
逆方向の損失(ISwt)を検出回路自体の逆方向の寄
生損失(ISRwt),上述した順方向の損失(ILw
t)から、次の式7で求められる。なお、OPM1wt
は光パワーメータ5の測定値である。 【0033】 【式7】ISwt(dB)=−10*log(OPM1
wt/ISRwt)−ILwt 【0034】また、逆方向のリターンロス(RLOw
(dB))を測定する。このリターンロスは、検出回路
自体の逆方向の寄生戻り光量(RLO2w)と対比し、
次の式8で求められる。但し,KRは0.03336と
する。なお、OPM3wは光パワーメータ12による測
定値である。 【0035】 【式8】RLOw(dB)=−10*log(KR(O
PM3w−RLO2w)/(RLO1w−RLO2
w)) 【0036】このようにして光学部品の特性を測定すれ
ば、光学部品を検査回路中にファイバ融着で1回接合す
るだけでよいから不確定要素が混入するのを防げる。ま
た、光スイッチを切り換えるだけの操作で、光学部品の
検査項目のうち順方向の挿入損失,逆方向の挿入損失,
順方向の反射減衰量,逆方向の反射減衰量,偏波依存性
を能率よく測定できる。 【0037】 【発明の効果】以上の如く、本発明に係る光学部品の特
性測定装置に依れば、光学部品を検査回路中にファイバ
融着で1回接合するだけで各検査項目の測定を行えるか
ら作業能率を向上でき、また、不確定要素が測定データ
に混入するのも防げるため、こ光学部品自体の特性を正
確に測定できる。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for measuring characteristics of optical components connected to an external optical processing system via an optical fiber. 2. Description of the Related Art Various optical components used in optical communication and the like, especially components arranged in optical fibers such as optical isolators and optical circulators, have the characteristics of the components themselves, of course.
It is necessary to inspect how much the forward and reverse insertion loss, polarization dependence, return loss and the like in the fiber are exhibited. That is, whether or not a certain optical characteristic can be maintained even if the polarization state of light propagating in an optical fiber is disordered, and whether or not the amount of light reflected from the interface of the optical component returns. Needs to be identified. Conventionally, individual test circuits have been used to measure the characteristics of the above-described optical components, and at least for each of forward and reverse insertion loss, forward and reverse return loss, and polarization dependence. Inspection is being carried out. In addition, before mounting optical components on the inspection circuit, measure the inspection circuit itself for each inspection item, and then attach the optical components individually to each inspection item by fiber fusion and attach them to the inspection circuit for measurement. Is being done. [0004] Normally, fiber fusion requires about 10 minutes, and a long setup time is required if fiber fusion for each inspection item described above is included. In addition, measurement data becomes uncertain due to the incorporation of uncertainties as the fiber fusion is repeatedly performed. SUMMARY OF THE INVENTION According to the present invention, at least forward insertion loss, backward insertion loss, forward return loss, reverse return loss, and polarization dependence among the inspection items for optical components. It is an object of the present invention to provide a device for measuring the characteristics of an optical component capable of measuring the optical component accurately and extremely efficiently. An optical component characteristic measuring apparatus according to the present invention comprises an inspection circuit for measuring an optical component characteristic by assembling an optical component to be measured by fusion splicing of a fiber. An optical switch for switching the waveguide between the forward direction and the reverse direction is provided at the incident end of the light emitting source.A polarization controller is disposed in the forward waveguide, and the waveguide following the polarization controller is connected to the optical switch. Branched in three directions with couplers, one of which is the fiber end joining one terminal of the optical component under test, and the other two are an optical power meter for measuring the forward return loss and reverse insertion loss. An optical power meter for measuring the light source reference light intensity is connected. A directional optical circulator is disposed in the waveguide in the opposite direction, and a waveguide extending from one terminal of the directional optical circulator is an optical component to be measured. Fiber to splice other terminals The other terminals are equipped with optical power meters for measuring insertion loss, reverse return loss, and polarization dependence. Further, each of the forward and reverse waveguides has a fiber for joining an optical component to be measured. Equipped with a chuck that bends the end, and among the inspection items for optical components, at least forward insertion loss, reverse insertion loss, forward return loss, reverse return loss,
The polarization dependence is measured separately in the forward and reverse directions before and after the assembly of the optical component to be measured, and the measured data before the assembly of the optical component to be measured is used as the reference light intensity, and the two measured data are compared. Then, based on the difference between the two, the optical component to be measured is bonded once by fiber fusion, so that it is configured as an inspection circuit for measuring the characteristics of the optical component itself. The optical component characteristic measuring device according to the present invention has a circuit configuration capable of measuring the characteristics of the optical component by performing only one fiber fusion to the fiber end of the inspection circuit. Can be embodied. This makes it possible to measure at least the forward insertion loss, the backward insertion loss, the forward return loss, the backward return loss, and the polarization dependence among the inspection items of the optical component, so that the characteristics of the optical component can be efficiently performed. The measurement can be performed without introducing uncertain elements, and the measured data of each inspection item can be divided into forward and reverse directions. Can be measured accurately. Referring to the accompanying drawings, FIG. 1 shows an apparatus for measuring characteristics of an optical component according to the present invention. In the figure, a solid line connecting each device indicates an optical circuit system, and a dotted line indicates an electric circuit system. The inspection circuit is a light source 1
And the characteristics of the optical component are measured by conducting light incident from the light emitting source 1 to an optical component to be measured such as an optical isolator or an optical circulator that is fusion-bonded to the fiber ends in the forward and reverse directions. It is configured as an optical inspection circuit. The inspection items include at least forward insertion loss, backward insertion loss, forward return loss, reverse return loss, and polarization dependence among the characteristics of the optical components. The inspection circuit includes an optical switch 2 and a light emitting source 1.
The waveguide is configured to be switchable between a forward direction and a reverse direction by arranging the waveguide at the incident end. In the forward direction of the waveguide, a polarization controller 3 for controlling the polarization of light by winding the fiber in a coil shape and rotating the fiber by predetermined steps is provided. The waveguide following the polarization controller 3 is branched and connected in three directions by an optical coupler 4. One of the three directions is led out as a fiber end f 1 for connecting one terminal of the optical component to be measured. The other two are provided with an optical power meter 5 for measuring forward return loss and reverse insertion loss, and an optical power meter 6 for measuring light source reference light intensity. In addition,
Isolators 7 and 8 for preventing return reflection of light are provided between the light emitting source 1 and the optical switch 2, between the polarization controller 3 and the optical coupler 4, and between the optical coupler 4 and each of the optical power meters 5 and 6. , 9,1
0 is assembled. A directional light circulator 11, such as a three-terminal circulator, is disposed in the waveguide in the opposite direction. From this direction optical circulator 11, the fiber end f 2 for bonding the other terminal of the measured optical component is derived as a subsequent waveguide than 1 terminal. Other terminals include an optical power meter 1 for measuring insertion loss, reverse return loss, and polarization dependence.
2 are provided. In addition to the above-described devices, chucks 13 and 14 for bending the fiber ends f 1 and f 2 for joining optical components to be measured are provided in each of the forward and backward waveguides. A jig 15 for inserting and supporting the optical component to be measured is provided between each of the fiber ends f 1 and f 2 .
Also, the jig 15 is provided with a semiconductor heating element 16 such as a Peltier or the like that can change the temperature conditions of the optical component to be measured and the waveguide. In the apparatus for measuring the characteristics of optical components having such a circuit configuration, the characteristics of the optical components can be measured by menu operation by the computer 17 or continuously and fully automatically. The measurement data can be in a readable format and recorded on a floppy disk. In addition, wavelengths 1470 to 15
The characteristics of the optical component to be measured may be measured under a variable temperature condition of about −20 ° C. to 80 ° C. by using a variable laser of about 90 mm. By measuring each inspection item in accordance with the variable conditions, a large number of measurement data can be obtained on the characteristics of the optical component in a wide range of wavelengths generally used and in different use environments. In this optical component characteristic measuring apparatus, before assembling the optical component to be measured, each inspection item is individually measured in the forward and reverse directions for the inspection circuit itself, and then the optical component to be measured is assembled in the inspection circuit. Measurement of each test item separately in the forward and reverse directions. The measured data obtained from the test circuit itself is used as the reference light intensity, and the measured data is compared. If the difference between the two is determined, the optical component to be measured is assembled into the circuit by a single fiber fusion. It can measure its own characteristics. First, each test item is measured for the test circuit itself without assembling the optical component to be measured. The entire system is started up, and the optical switch 2 is set to the forward direction as shown in FIG. In the forward direction, light of the designated wavelength is incident from the light emitting source 1, the reference power for return loss in the forward direction is measured by the optical power meter 5, and RLI1w is performed. Next, as shown in FIG. 3, the fiber end f 1 in the forward direction is bent by the chuck 13, the amount of reflected return light from the end face of the fiber end f 1 is reduced to zero, and input to the optical power meter 5. Is measured as RLI2w. Thereafter, as shown in FIG. 4, the optical switch 2 is switched in the reverse direction, light of the designated wavelength is incident from the light emitting source 1, the return power reference power in the reverse direction is measured by the optical power meter 12, and the RLO 1w is measured. And Also, as shown in FIG. 5, the fiber end f 2 is bent by the chuck 14, and the amount of reflected return light from the end face of the fiber end f 2 is set to zero, so that the amount of parasitic return light in the reverse direction is measured by the optical power meter 12. , RLO2w. Until now, the respective fiber ends f 1 and f 2 were kept in a disconnected state. Next, the respective fiber ends f 1 and f 2 are connected to measure the parasitic loss and the polarization dependence of the inspection circuit itself. I do. In this measurement, the optical switch 2 is switched in the forward direction as shown in FIG. 6, or the optical switch 2 is maintained in the reverse direction following the previous process as shown in FIG. The measurement may be performed first. In the forward direction, the polarization controller 3 and the semiconductor heating element 16 are operated as shown in FIG. The upper and lower limits of the dependence amount are measured by the optical power meter 12, and the parasitic loss is also measured. Further, as shown in FIG. 7, the parasitic loss in the reverse direction was measured by the optical power meter 5, and
Rwt. The polarization dependence of the inspection circuit itself (PDLR)
(wt) can be obtained from the light source reference light intensity (OPM2wti) obtained by the optical power meter 6 and the measurement value (OPM3wti) obtained by the optical power meter 12 using the following equation (1). Here, i indicates a position number in the Poincare sphere, and specifically, the λ / 2 phase difference element in the polarization controller 3 and the λ / 2
The numbers corresponding to the respective rotation angles of the / 4 phase difference element are shown. MAX and MIN indicate the maximum power value and the minimum power value of the OPM3wti, respectively. [Formula 1] PDLRwt = −10 * log (OPM3wt
MAX / (OPM2wti + OPM3wti))-(-
10 * log (OPM3wtMIN / (OPM2wti
+ OPM3wti))) Also, the forward parasitic loss (ILRwt (d
B)) is a value measured by the optical power meter 12 (OPM3).
wti) is obtained by the following equation (2). ## EQU2 ## ILRwt = −10 * log (OPM3wtM
AX / (OPM2wti + OPM3wti)) Until now, each test item was measured for the test circuit itself. From now on, as shown in FIGS. 8 and 9, the optical component D to be measured is connected to each fiber end f 1 , f Each of the inspection items is measured by bonding to the fiber 2 by fiber fusion. At this time, light of the designated wavelength is incident from the light emitting source 1 and the semiconductor heating element 16 is operated to perform measurement in the forward direction and the reverse direction under variable temperature conditions. First, as shown in FIG. 8, the optical switch 2 is set in the forward direction, and the polarization dependency (PDLwt) in the forward direction is measured. Since the polarization dependence is compared with the above-described polarization dependence (PDLRwt) of the inspection circuit itself, the polarization dependence is obtained as that of the optical component itself by the following Expression 3. Formula 3 PDLwt (dB) = − 10 * log (OPM
3wtMAX / (OPM2wti + OPM3wti))
− (− 10 * log (OPM3wtMIN / (OPM2
wti + OPM3wti)))-PDLRwt Also, the forward polarization dependence (PDLwt)
The loss in the forward direction (ILwt) is compared with the parasitic loss (ILRwt) of the detection circuit itself based on the above measurement data, and can be obtained from the following Expression 4. [Formula 4] ILwt (dB) = − 10 * log (OPM3
wtMAX / (OPM2wti + OPM3wti))-
ILRwt Next, the forward return loss (RLIw
(DB)) is the reference power for return loss in the forward direction (RLI1w) by the optical power meter 5, and the forward parasitic return light amount (RLI2) by the optical power meter 5 of the detection circuit itself.
w) and is calculated by the following equation 5. [Formula 5] RLIw (dB) = − 10 * log (KR (O
PM1w-RLI2w) / (RLI1w-RLI2
w)) where KR is the reflection coefficient of light from the interface between the core (quartz) and the air medium at the cut portion of the optical fiber, and is assumed to be 0.03336. This reflection coefficient (KR) is
Refractive index of quartz 1.4469 (n1), refractive index of air 1
It is obtained by the following Expression 6 based on (n2). Note that OP
M1w is a value measured by the optical power meter 5. KR = ((n 1 −n 2 ) / (n 1 + n 2 )) 2 This time, the optical switch 2 is switched in the reverse direction.
The reverse loss (ISwt) is determined by the reverse parasitic loss (ISRwt) of the detection circuit itself and the above-described forward loss (ILw).
From t), it is obtained by the following equation 7. In addition, OPM1wt
Is a measured value of the optical power meter 5. ## EQU7 ## ISwt (dB) = − 10 * log (OPM1
wt / ISRwt) -ILwt Also, the return loss in the reverse direction (RLOw)
(DB)) is measured. This return loss is compared with the amount of parasitic return light (RLO2w) in the reverse direction of the detection circuit itself,
It is obtained by the following equation (8). However, KR is set to 0.03336. The OPM 3w is a value measured by the optical power meter 12. [Formula 8] RLow (dB) = − 10 * log (KR (O
PM3w-RLO2w) / (RLO1w-RLO2
w)) By measuring the characteristics of the optical component in this way, it is only necessary to bond the optical component once to the inspection circuit by fiber fusion, so that uncertain elements can be prevented from being mixed. In addition, by simply switching the optical switch, the insertion loss in the forward direction, the insertion loss in the reverse direction,
Efficient measurement of forward return loss, reverse return loss, and polarization dependence. As described above, according to the optical component characteristic measuring apparatus according to the present invention, the measurement of each inspection item can be performed only by bonding the optical component once in the inspection circuit by fiber fusion. Since the operation can be performed, work efficiency can be improved, and uncertain elements can be prevented from being mixed in the measurement data, so that the characteristics of the optical component itself can be accurately measured.

【図面の簡単な説明】 【図1】本発明に係る光学部品の特性測定装置を示す回
路構成図である。 【図2】同装置において、検査回路自体の順方向のリタ
ーンロス用基準パワーを測定する動作回路図である。 【図3】同装置において、検査回路自体の順方向の寄生
戻り光量を測定する動作回路図である。 【図4】同装置において、検査回路自体の逆方向のリタ
ーンロス用基準パワーを測定する動作回路図である。 【図5】同装置において、検査回路自体の逆方向の寄生
戻り光量を測定する動作回路図である。 【図6】同装置において、検査回路自体の順方向の偏波
依存性並びに同寄生損失を測定する動作回路図である。 【図7】同装置において、検査回路自体の逆方向の寄生
損失を測定する動作回路図である。 【図8】同装置において、光学部品の組付け状態で順方
向の偏波依存性並びに同リターンロスを測定する動作回
路図である。 【図9】同装置において、光学部品の組付け状態で逆方
向の寄生損失を測定する動作説明図である。 【符号の説明】 1 発光源 2 光スイッチ 3 偏波制御器 4 光カプラ 5,6 光パワーメータ 11 方向性光循環器 12 光パワーメータ 13,14 チャック f,f ファイバ端 D 光学部品
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a circuit diagram showing an apparatus for measuring characteristics of an optical component according to the present invention. FIG. 2 is an operation circuit diagram for measuring the forward return loss reference power of the inspection circuit itself in the same device. FIG. 3 is an operation circuit diagram for measuring the amount of forward parasitic return light of the inspection circuit itself in the same device. FIG. 4 is an operation circuit diagram for measuring the return power reference power in the reverse direction of the test circuit in the device. FIG. 5 is an operation circuit diagram for measuring the amount of parasitic return light of the inspection circuit itself in the reverse direction in the same device. FIG. 6 is an operation circuit diagram for measuring the forward polarization dependence of the inspection circuit itself and the parasitic loss in the same device. FIG. 7 is an operation circuit diagram for measuring a reverse parasitic loss of the inspection circuit itself in the same device. FIG. 8 is an operation circuit diagram for measuring the polarization dependence and the return loss in the forward direction when the optical components are assembled in the same device. FIG. 9 is an explanatory diagram of the operation of measuring the parasitic loss in the reverse direction in the state where the optical components are assembled in the same device. [EXPLANATION OF SYMBOLS] 1 light source 2 optical switch 3 polarization controller 4 the optical coupler 5 and 6 an optical power meter 11 directional optical circulator 12 optical power meter 13 chuck f 1, f 2 fiber ends D optics

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) G01M 11/00 - 11/08 ──────────────────────────────────────────────────続 き Continued on front page (58) Field surveyed (Int. Cl. 7 , DB name) G01M 11/00-11/08

Claims (1)

(57)【特許請求の範囲】 【請求項1】 被測定光学部品をファイバの融着接合で
組み付けて光学部品の特性を測定する検査回路でなり、
発光源の入射端には導波路を順方向と逆方向とに切り換
える光スイッチを備え、 順方向の導波路には偏波制御器を配置すると共に、該偏
波制御器に引き続く導波路を光カプラーで三方向に分岐
接続し、その1つは被測定光学部品の片端子を接合する
ファイバ端とし、他の2つのには順方向反射減衰量及び
逆方向挿入損失を測定する光パワーメータと、発光源参
照光強度を測定する光パワーメータを接続し、 逆方向の導波路には方向性光循環器を配置し、この方向
性光循環器の1端子より引き続く導波路は被測定光学部
品の他端子を接合するファイバ端とし、他の端子には挿
入損失,逆方向反射減衰量並びに偏波依存性を測定する
光パワーメータを備え、更に、順方向,逆方向の各導波
路には被測定光学部品接合用のファイバ端をベンディン
グするチャックを備え、 光学部品の検査項目のうち少なくとも順方向挿入損失,
逆方向挿入損失,順方向反射減衰量,逆方向反射減衰
量,偏波依存性を被測定光学部品の組付け前,組付け状
態で順方向,逆方向個別に夫々測定し、被測定光学部品
組付け前の測定データを基準光強度として両者の測定デ
ータを対比し、その両者の差異に基づいて被測定光学部
品をファイバ融着で1回接合することから光学部品自体
の特性を測定する検査回路を構成したことを特徴とする
光学部品の特性測定装置。
(57) [Claims 1] An inspection circuit for measuring characteristics of an optical component by assembling an optical component to be measured by fusion splicing of a fiber,
An optical switch for switching the waveguide between the forward direction and the reverse direction is provided at the incident end of the light emitting source, and a polarization controller is disposed in the forward waveguide, and the waveguide following the polarization controller is optically controlled. Branched in three directions with couplers, one of which is the fiber end joining one terminal of the optical component under test, and the other two are an optical power meter for measuring the forward return loss and reverse insertion loss. An optical power meter for measuring the light source reference light intensity is connected. A directional optical circulator is disposed in the waveguide in the opposite direction, and a waveguide extending from one terminal of the directional optical circulator is an optical component to be measured. The other end is a fiber end to be spliced. The other terminal is equipped with an optical power meter that measures insertion loss, reverse return loss, and polarization dependence. Further, each forward and reverse waveguide has Bend the fiber end for joining the optical component to be measured Comprising a chuck for at least a forward insertion loss of the test item of the optical component,
The reverse insertion loss, forward return loss, reverse return loss, and polarization dependence are measured separately in the forward and reverse directions before and after the optical component under test is assembled, and the optical component under test is measured. Inspection that measures the characteristics of the optical component itself by comparing the measured data before and after assembling with the measured data as the reference light intensity and joining the optical component to be measured once by fiber fusion based on the difference between the two. A device for measuring characteristics of an optical component, comprising a circuit.
JP31591094A 1994-11-25 1994-11-25 Optical component characteristic measuring device Expired - Fee Related JP3392966B2 (en)

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Application Number Priority Date Filing Date Title
JP31591094A JP3392966B2 (en) 1994-11-25 1994-11-25 Optical component characteristic measuring device

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Application Number Priority Date Filing Date Title
JP31591094A JP3392966B2 (en) 1994-11-25 1994-11-25 Optical component characteristic measuring device

Publications (2)

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JPH08145847A JPH08145847A (en) 1996-06-07
JP3392966B2 true JP3392966B2 (en) 2003-03-31

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CN114279688B (en) * 2021-12-22 2025-08-01 长飞(武汉)光系统股份有限公司 Test system of free space type optical isolator
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