JP3395448B2 - Material testing machine - Google Patents

Description

Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a material testing machine for analyzing the results of various tests on a material at a predetermined sampling period and then analyzing the data. 2. Description of the Related Art A material testing machine (hereinafter referred to as a measuring device) performs a load-displacement characteristic test and the like, and transmits a test result to a data processing device to analyze data. It is known (for example, see Japanese Patent Publication No. 5-20690). In the material testing machine system described in the above publication, test result data indicated by a solid line in FIG. 10 is sampled at a predetermined sampling cycle (black circles in the drawing) and sequentially stored in a RAM inside the measuring device. Sampling data is extracted one by one (open circles in the drawing) and transmitted to the data processing device, and after the test is completed, all data stored in the RAM is transmitted to the data processing device. By doing so, rough data analysis can be performed in real time by the data processing device while the test is being performed by the measurement device, and detailed data analysis can be performed on necessary portions after the test is completed. [0004] For example, when a tensile test is performed, the elongation of a sample under the same load is different depending on the material of the sample. Therefore, the elongation is sampled in consideration of the material of the sample. It is desirable to do. That is, when testing a sample having high rigidity such as ceramics, sampling at shorter time intervals improves the accuracy.
However, in the past, since the sampling speed was always kept constant, there was a possibility that the accuracy would vary depending on the material of the sample and the like. [0005] Even when testing the same sample, sampling is performed at short time intervals during an important period, such as immediately after starting to apply a load or immediately before the sample breaks, and roughly during a period that is not so important. This can reduce the memory capacity. However, since the sampling period could not be changed during the test in the past,
In some cases, there is a possibility that the storage capacity of the RAM becomes full before the end of the test. Even if the sampling period can be changed, both the data length and the storage capacity of the RAM are fixed (for example, if the data length is 20 bytes and the RAM is
In the case where the storage capacity of the RAM is 512 kilobytes), it is difficult to predict when the RAM will be full because the time until the RAM is full varies depending on the sampling cycle. Further, conventionally, the sampling data stored in the RAM of the measuring device has been transmitted to the data processing device after the test has been completed. Since the data transmitted from the measuring device after the test was managed separately, some data would be duplicated,
As the memory capacity increases, data management may be complicated. An object of the present invention is to provide a material testing machine which can efficiently sample material test results and store sampling data. The present invention will be described with reference to FIG. 1 showing an embodiment. The present invention comprises a measuring device 10 and a data processing device 20, and a predetermined At the same time as sampling various data
In a material testing machine for transmitting the collected data to the data processing device 20 at predetermined time intervals, a first storage means 18 provided on the measuring device 10 and storing various data collected at a first sampling cycle; Data processing device 20
The second memory is provided on the side and stores various data collected in a second sampling cycle longer than the first sampling cycle.
Storage means 23, and the first and second storage means 2
The above object is achieved by providing a data processing device for synthesizing the sampling data stored in 3 so as not to include duplicate data. According to the first aspect of the present invention, the first storage means (for example, a RAM card) is provided on the measuring device 10 side.
A second storage unit 23 (for example,
RAM). The first storage means 18 stores various data collected in the first sampling cycle, and the second storage means 23 stores various data collected in a cycle longer than the first sampling cycle. The data processing device 20
After completion of the test, the sampling data stored in the first storage means 18 is read out and combined with the sampling data stored in the second storage means 23 so that no duplicate data is included. [0010] In the means and means for solving the above problems which explain the constitution of the present invention, the drawings of the embodiments are used to make the present invention easy to understand. However, the present invention is not limited to this. An embodiment of the present invention will be described below with reference to FIGS. FIG. 1 is a block diagram illustrating a schematic configuration of the material testing machine of the present embodiment. The material testing machine shown in FIG. 1 is used for testing tensile / compression characteristics and the like.
0 and the data processing device 20. Measuring device 1
0 and the data processing device 20 are both CPUs 11 and 21
And read-only fixed memories (ROM) 12, 22
And rewritable variable memories (RAM) 13 and 23. The measuring device 10 and the data processing device 20 include transmission interface circuits 14 and 24, and exchange data with each other via the transmission line L. The measuring device 10 includes a load cell 15 for measuring the load applied to the sample, an extensometer 16 for measuring the deformation of the sample due to the load, and an A / A for converting the analog output of each of the measuring devices 15 and 16 into a digital signal. D converter 17 and RA
Card reader 19 for controlling reading / writing of M card 18
And The RAM card 18 stores data obtained by sampling the test results at a predetermined sampling cycle. On the other hand, the data processing device 20 is a keyboard 2
5, a CRT 26, and an XY plotter 27.
Various commands are issued to 0, and the analysis result is confirmed by the CRT 26. This data processing device 20 is usually composed of a personal computer and its peripheral devices. FIG. 2 shows test condition creation mode processing performed by the CPU 21 of the data processing apparatus 20, FIGS. 3 and 4 show test mode processing performed by the CPU 21 of the data processing apparatus 20, and FIGS. 5 is a flowchart showing control processing, and the operation of the present embodiment will be described below based on these flowcharts. When the operator operates the keyboard 25 of the data processing device 20 to select the test condition creation mode, the CP
U21 starts the processing of FIG. In step S1 of FIG. 2, normal test conditions, such as test contents and sample type, are set based on the keyboard operation of the operator. In step S2, based on the keyboard operation by the operator,
Sampling cycle when collecting test result data,
The capacity of the RAM card 18 connected to the measuring device 10 and the sampling data length per sampling are set. In step S3, various test conditions set in steps S1 and S2 are stored as a test condition file in RA.
It stores it in M23 and returns. On the other hand, when the operator selects the test mode using the keyboard, the CPU 21 starts the processing shown in FIG.
In step S11 of FIG. 3, the test condition file stored in the RAM 23 is read. In step S12,
The sample attachment in the measuring device 10 is controlled. Step S1
In step 3, general information and batch information relating to the test input by the operator through the keyboard 25 are fetched. In step S14, step S2 in FIG.
Are displayed on the CRT 26, and a process of confirming whether or not to change these test conditions is performed.
For example, when the operator inputs new test conditions via the keyboard 25, the RAM 2 is changed to change the test conditions.
3 is rewritten. In step S15, based on the three test conditions described above, a period Tr for sampling at the sampling period Ts and a total number Nd of sampling data stored in the RAM card 18 are calculated. In step S16, the following data are transmitted to the measuring device 10 via the transmission interface circuits 14 and 24. Normal test condition data Three items of data set in step S2 of FIG. 2, ie, sampling period, capacity of RAM card 18, and sampling data length Total number of sampling data stored in RAM card 18 Nd In step S17 of FIG. Then, a signal instructing the start of the test is transmitted to the measuring device 10 via the transmission interface circuits 14 and 24. In response to this signal, the measuring device 10 drives an actuator (not shown) to apply a load to the sample, and starts the test. In step S18, the sampling data transmitted from the measuring device 10 is received. In step S19, the received sampling data is stored in the RAM. In step S20, the load applied to the sample is changed by controlling the actuator of the measuring device 10. In step S21, it is determined whether or not the test has been completed. For example, in the case of a tensile test, if information indicating that the sample has been broken is transmitted from the measuring device 10, it is determined that the test has been completed. If the determination is negative, the process returns to step S18, and if the determination is positive, the process proceeds to step S22. In step S22, a signal instructing the end of the test is transmitted to the measuring device 10. In step S23,
It instructs the measuring device 10 to transmit the sampling data stored in the RAM card 18. Step S
24, the RAM card 1 transmitted from the measuring device 10
8 sampled data is received. In step S25, a data reduction process, which will be described later, is performed using the sampling data stored in the RAM 23 and the sampling data received in step S24. In step S26, various data analysis and data processing, for example, displaying the test results on the CRT 26 or displaying a graph showing the test results on the XY plotter 27, and then returning. On the other hand, when the operator turns on the power of the measuring device 10, the CPU 11 inside the measuring device 10 performs the test control processing shown in FIGS. In step S51 of FIG. 5, it is determined whether the test condition transmitted from the data processing device 20 has been received. If the determination is negative, the process remains at step S51, and if the determination is positive, the process proceeds to step S52. In step S52, it is determined whether or not a signal transmitted from the data processing device 20 and indicating a test start has been received.
If the determination is negative, the process remains at step S52, and if the determination is positive, the process proceeds to step S53. In step S53, a test is started by driving an actuator (not shown) to apply a load to the sample. In step S54, a variable N indicating the number of data stored in the RAM card 18 is initialized to "0". Step S55
Then, it is determined whether or not the variable N is equal to a preset maximum number Nd. Note that the maximum number Nd is determined in step S in FIG.
15 are set. If the determination in step S55 is negative, the process proceeds to step S56, where the time T
It is determined whether or not s has elapsed. If the determination is negative, the process stays at step S56. If the determination is positive, step S56 is reached.
Proceed to 57. In step S57, the test result is sampled, and the sampled data is used in the next step S58.
To store in the RAM card 18. In step S59,
“1” is added to the variable N. As described above, in steps S55 to S59, the test results are sampled every sampling time Ts, and the results are stored in the RAM card 18. In addition,
The sampling time Ts is, for example, 5 ms. In step S60 of FIG. 6, it is determined whether or not a predetermined time Td, for example, 50 ms, has elapsed since the previous transmission of the sampling data to the data processing device 20.
Also, when the determination in step S55 is affirmative, that is, when the number of data stored in the RAM card 18 reaches the preset total number Nd of data, the process of step S60 is also performed. As described above, after the number of data stored in the RAM card 18 becomes Nd, sampling at a long sampling cycle (for example, 50 ms) is performed without performing sampling at a short sampling cycle (for example, 5 ms). I do. If the determination in step S60 is negative, the process returns to step S55, and if the determination is affirmative, step S61.
Proceed to. In step S61, the test result is sampled, and the sampled data is transmitted to the data processing device 20 in the next step S62. As described above, in steps S60 to S62, the test result is sampled at a period longer than the sampling period Ts, and the result is transmitted to the data processing device 20. As described above, the data sampled at the short sampling period Ts is stored in the RAM card 18 of the measuring device 10, while the data sampled at the long sampling period Td is stored in the data processing device 20. Note that the sampling period Td transmitted to the data processing device 20 is preferably an integral multiple of the sampling period Ts stored in the RAM card 18. By setting the integral multiple, the sampling data transmitted to the data processing device 20 can be easily replaced with the sampling data stored in the RAM card 18 after the test is completed. In step S63, it is determined whether the test has been completed. For example, in the case of a tensile / compression test, when the sample breaks, it is determined that the test is completed. If the determination is negative, the process returns to step S55, and if the determination is positive, step S6
Proceed to 4. In step S64, a signal notifying the end of the test is transmitted to the data processing device 20, and the process returns. FIG. 7 is a detailed flowchart of the data reduction processing in step S25 in FIG. Step S1 in FIG.
In step 01, data having the largest displacement is extracted from the sampling data transmitted from the RAM card 18. In step S102, the sampling data stored in the RAM 23 is read. In step S103, of the sampling data read in step S102, data whose displacement is smaller than the data extracted in step S101 is deleted. In step S104, RA
M23 and each sampling data stored in the RAM card 18 are synthesized. As described above, in the processing of FIG.
Of the sampling data stored in the RAM card 18 is searched, and the data collected before this data is replaced with the detailed data stored in the RAM card 18 to improve the sampling accuracy. I'm trying. The data reduction processing of FIG.
7 is an internal process performed using the RAM 23. Before performing the process of FIG. 7, the CPU 21 reads out the sampling data from the RAM card 18 and stores it in the RAM 23, and uses only the RAM 23 (for accessing the RAM card 18). The processing of FIG. 7 is performed (without performing). 8 and 9 shown below are the same. FIG. 8 is a detailed flowchart showing a modification of the data reduction processing. In step S111 of FIG.
The sampling data (data transmitted from the measuring device 10 during the test) stored in the RAM 23 is read.
In step S112, the sampled data read in step S111 is compared with the sampled data transmitted from the RAM card 18, and each sampled data is sorted in ascending or descending order of value. In step S113, it is detected whether or not there is any duplicate data in the sampling data arranged in step S112, and the duplicate data is deleted. In step S114, the processing result of step S113 is stored in the RAM 23, and the process returns. Thereby, all the duplicate data in the RAM 23 is deleted, and the memory capacity can be reduced. FIG. 9 is a detailed flowchart showing another modification of the data reduction processing. In step S121 in FIG. 9, the sampling data (data transmitted from the measuring device 10 during the test) stored in the RAM 23 is read. In step S122, of the sampling data read out in step S121, it is detected whether or not data of the same sampling time exists in the RAM card 18. If the same data exists, the data is stored in the RAM2.
Delete from 3. In step S123, the data stored in the RAM 23 and the data transmitted from the RAM card 18 are combined. In step S124, the processing result of step S123 is stored in RAM 23, and the process returns. 2 to 9 described above, the data processing device 20 sets three test condition items (sampling period, capacity of the RAM card 18, and Sampling data length) is set in advance, and based on these test conditions, the total number N of data to be sampled at a short sampling cycle Ts
Calculate d. The measuring device 10 calculates the total number N of the calculated data.
The test result is sampled at a short sampling period Ts until the time reaches d, and the result is stored in the RAM card 18. On the other hand, during the test, the result of sampling at a sampling cycle longer than the sampling cycle Ts is transmitted to the data processing device 20. When the number of data stored in the RAM card 18 reaches the total number Nd of data before the end of the test, after that, the data is not stored in the RAM card 18 but is sampled at a period Td longer than the sampling period Ts. To transmit the sampling data. The test is terminated when the sample breaks. When the test is completed, the measuring device 10
The sampling data stored in the card 18 is transmitted to the data processing device 20, and the data processing device 20
The sampling data from the card 18 and the sampling data stored in the RAM 23 are combined so as not to include duplicate data, and the combined result is stored in the RAM 23.
Then, the data processing device 20 performs data analysis using the synthesized data stored in the RAM 23. As described above, according to the present embodiment, the number of data that can be stored in the RAM card 18 is calculated in advance before the start of the test, so that the possibility that the RAM card 18 becomes full before the end of the test is reduced. That is, the sampling period can be changed based on the calculated number of data, and RA
It is possible to prevent the M card from becoming full. Alternatively, the operator may be alerted by displaying the calculated number of data on the CRT 26 or the like. Further, according to the present embodiment, when data is stored in the RAM card 18 by the number calculated in advance, sampling at the short sampling period Ts is stopped, and RA is stopped at the long sampling period Td.
Since the sampling data is stored in M23, the test can be continued for a relatively long time. On the other hand, when the test is completed, the data stored in the RAM card 18 and the data stored in the RAM 23 are combined to eliminate duplicate data, so that the memory capacity can be reduced. In the above embodiment, when the sampling data is stored in the RAM card 18 by the number of data calculated in advance by the data processing device 20, the data storage in the RAM card 18 is stopped. If the number of data is calculated so that the capacity remains, and the sampling data is stored in the RAM card 18 by the calculated number of data, the sampling period may be lengthened and the sampled data may be stored in the free space of the RAM card 18. In this way, all test data can be stored in the RAM card 18 and there is no need to combine the data with the data in the RAM 23 after the test is completed. In the above embodiment, the measuring device 19
Although the example in which the sampling data is stored in the AM card 18 has been described, the sampling data may be stored in the RAM 13. Also, R
When storing the sampling data in the AM card 18, if a memory management technique such as bank switching is used, a larger capacity RAM card can be used. In the embodiment thus constructed, R
The AM card 18 stores C in the storage unit and the first storage unit.
The PU 21 corresponds to the data total number calculation means, and the RAM 23 corresponds to the second storage means. As described above in detail, according to the present invention, various data collected at a short sampling cycle are stored in the first storage means, and various data are collected at a long sampling cycle in the second storage means. Since the collected various data are stored and the storage contents of these storage means are combined so as not to include duplicate data, the test result data can be stored with a small memory capacity.

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a block diagram showing a schematic configuration of a material testing machine according to the present embodiment. FIG. 2 is a flowchart illustrating test condition creation mode processing performed by a CPU of the data processing apparatus. FIG. 3 is a flowchart showing a test mode process performed by a CPU of the data processing device. FIG. 4 is a flowchart following FIG. 3; FIG. 5 is a flowchart showing a test control process performed by a CPU of the measuring device. FIG. 6 is a flowchart following FIG. 5; FIG. 7 is a detailed flowchart of a data reduction process in step S25 in FIG. 4; FIG. 8 is a detailed flowchart showing a modification of the data reduction processing. FIG. 9 is a detailed flowchart showing a modification of the data reduction processing. FIG. 10 is a diagram illustrating a sampling method in a conventional material machine testing machine system. [Description of Signs] 10 Measurement devices 11 and 21 CPU 18 RAM card 20 Data processing device 23 RAM

Claims (1)

(57) [Claim 1] A measuring device and a data processing device are provided, and the measuring device collects various data at a predetermined sampling cycle and simultaneously collects the collected data for a predetermined time. In a material testing machine that transmits data to the data processing device at intervals,
A first storage unit provided on the measurement device side for storing various data collected at a first sampling period; and a second storage period provided on the data processing device side, the second sampling period being longer than the first sampling period. A second storage unit that stores the collected various data, wherein the data processing device combines the sampling data stored in the first and second storage units so as not to include duplicate data. Characteristic material testing machine.