JP3440759B2 - Method and apparatus for diagnosing deterioration of electrical equipment - Google Patents
Method and apparatus for diagnosing deterioration of electrical equipmentInfo
- Publication number
- JP3440759B2 JP3440759B2 JP16371297A JP16371297A JP3440759B2 JP 3440759 B2 JP3440759 B2 JP 3440759B2 JP 16371297 A JP16371297 A JP 16371297A JP 16371297 A JP16371297 A JP 16371297A JP 3440759 B2 JP3440759 B2 JP 3440759B2
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- JP
- Japan
- Prior art keywords
- light
- optical fiber
- irradiation
- deterioration
- reflection absorbance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Testing Electric Properties And Detecting Electric Faults (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Housings And Mounting Of Transformers (AREA)
Description
【発明の詳細な説明】Detailed Description of the Invention
【0001】[0001]
【発明の属する技術分野】本発明は、稼働中の機器の運
転を特に停止することなく、油入電気機器に使用されて
いる鉱油系絶縁油,パーフルオロカーボン液等の絶縁媒
体やセルロース系絶縁材料,樹脂モールド絶縁方式電気
機器の樹脂材料,SF6 等のガス絶縁方式電気機器中の
絶縁材料の劣化度を非破壊で診断できる劣化診断方法及
び装置に関している。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an insulating medium such as mineral oil-based insulating oil or perfluorocarbon liquid used in oil-filled electrical equipment, or a cellulose-based insulating material, without particularly stopping the operation of the equipment in operation. The present invention relates to a deterioration diagnosis method and apparatus capable of nondestructively diagnosing the deterioration degree of a resin material of a resin mold insulation type electric device and an insulation material in a gas insulation type electric device such as SF 6 .
【0002】[0002]
【従来の技術】油入電気機器の絶縁油や絶縁紙の劣化度
や寿命を推定する診断方法としては、特開平7−272939
号公報に開示されているように、絶縁紙の分解生成物で
あるフルフラールや、一酸化炭素,二酸化炭素等を絶縁
油より抽出し、ガス分析を行って、別途求めてあるガス
発生量と絶縁紙の重合度残率との相関図から劣化度を推
定する方法等が提案されている。2. Description of the Related Art As a diagnostic method for estimating the deterioration degree and life of insulating oil and insulating paper of oil-filled electrical equipment, Japanese Patent Laid-Open No. 7-272939
As disclosed in Japanese Unexamined Patent Publication, furfural, which is a decomposition product of insulating paper, carbon monoxide, carbon dioxide, etc. are extracted from insulating oil, gas analysis is performed, and the gas generation amount and insulation A method of estimating the degree of deterioration from a correlation diagram with the residual degree of polymerization of paper has been proposed.
【0003】[0003]
【発明が解決しようとする課題】前記従来技術では、劣
化に伴う発生ガス量が微量であるため、それを油中から
抽出する特殊な手段が必要であったり、また、ガス分析
用の評価装置が大型であるなど簡便な診断方法ではなか
った。In the above-mentioned prior art, since the amount of gas generated due to deterioration is very small, a special means for extracting it from the oil is required, or an evaluation device for gas analysis. It was not a simple diagnosis method because it was large.
【0004】さらに、機器の寿命を支配しているのは絶
縁紙の劣化度であるが、これを直接診断しているのでは
なく、絶縁油中に溶解した絶縁紙の分解生成物を間接的
に診断する方法であるため、例えば、中型変圧器や小型
変圧器等で絶縁油を交換した場合など、もはや分解生成
物全量の正確な測定値を得られなくなる等の問題点を有
していた。Furthermore, it is the degree of deterioration of the insulating paper that governs the life of the equipment, but this is not directly diagnosed, but indirectly the decomposition products of the insulating paper dissolved in the insulating oil. Since it is a method of diagnosing, it has a problem that it is no longer possible to obtain an accurate measurement value of the total amount of decomposition products, for example, when the insulating oil is replaced with a medium-sized transformer or a small transformer. .
【0005】本発明の目的は上記の課題を解決し、稼働
中の機器の運転を特に停止することなく、電気機器に使
用されている鉱油系絶縁油やパーフルオロカーボン液等
の絶縁媒体やセルロース系絶縁材料,樹脂モールド絶縁
方式電気機器の樹脂材料,SF6 等のガス絶縁方式電気
機器中の絶縁材料の劣化度を非破壊で診断できる劣化診
断方法及び装置を提供することにある。The object of the present invention is to solve the above-mentioned problems, and to prevent the operation of the equipment in operation from being stopped in particular, an insulating medium such as mineral oil-based insulating oil or perfluorocarbon liquid used in electric equipment, or a cellulose-based insulating medium. An object of the present invention is to provide a deterioration diagnosing method and apparatus capable of nondestructively diagnosing the degree of deterioration of an insulating material, a resin material of a resin mold insulating type electric device, and an insulating material in a gas insulating type electric device such as SF 6 .
【0006】[0006]
【課題を解決するための手段】本発明者らは、電気機器
に使用されている絶縁油や絶縁紙等の各種絶縁材料,モ
ールド樹脂材料の劣化度と光学物性との関係を検討した
結果、熱劣化に伴う絶縁油の透過光強度変化や絶縁紙,
モールド樹脂材料の反射光強度変化から劣化度を判定で
きる診断方法並びに診断装置を見出し、本発明に到達し
た。即ち、本発明の要旨は次のとおりである。Means for Solving the Problems As a result of studying the relationship between the degree of deterioration and the optical properties of various insulating materials such as insulating oil and insulating paper used in electric equipment and mold resin materials, Change in transmitted light intensity of insulating oil due to heat deterioration and insulating paper,
The present invention has been accomplished by finding a diagnostic method and a diagnostic device capable of determining the degree of deterioration from the change in reflected light intensity of a mold resin material. That is, the gist of the present invention is as follows.
【0007】(1)波長が相異なる少なくとも2種の単
色光光源からの照射光を照射用光ファイバーで電気機器
内部に導き、該照射用光ファイバーからの出射光は透過
距離aなる絶縁媒体中を透過後、電気機器外部に導かれ
る受光用光ファイバーに入射,伝送し、光量測定部に導
かれ、該単色光光源の光源強度を該光量測定部での強度
が全て一定値となるように光量調整した後、該単色光光
源からの照射光を照射用光ファイバーで電気機器内部に
導き、透過距離a/2の位置にある絶縁材料表面に照射
し、該絶縁材料表面からの反射光を電気機器外部に導く
受光用光ファイバーを用いて光量測定部に導き、劣化度
演算部において該光量測定部からの出力値より各波長に
おける反射吸光度(Aλ)を(1)式で算出後、任意の
2波長間の反射吸光度差(ΔAλ)あるいは反射吸光度
比(Aλ′)を(2)式あるいは(3)式で演算し、さ
らに予め記憶させた被測定材料の劣化度と反射吸光度差
あるいは反射吸光度比との関係(マスターカーブ)を比
較演算することによって劣化度を判定することを特徴と
する電気機器の劣化診断方法並びに診断装置にある。(1) Irradiation light from at least two types of monochromatic light sources having different wavelengths is guided into an electric device by an irradiation optical fiber, and light emitted from the irradiation optical fiber is transmitted through an insulating medium having a transmission distance a. After that, the light is incident on and transmitted to a light receiving optical fiber guided to the outside of the electric device, is guided to a light quantity measuring section, and the light source intensity of the monochromatic light source is adjusted so that all the intensity in the light quantity measuring section becomes a constant value. After that, the irradiation light from the monochromatic light source is guided to the inside of the electric device by the irradiation optical fiber, the surface of the insulating material at the position of the transmission distance a / 2 is irradiated, and the reflected light from the surface of the insulating material is outside the electric device. It is guided to the light quantity measuring section using the light receiving optical fiber, and the reflection absorbance (A λ ) at each wavelength is calculated by the formula (1) from the output value from the light quantity measuring section in the deterioration degree calculating section, and then, between two arbitrary wavelengths. Reflection of The light intensity difference (ΔA λ ) or the reflection absorbance ratio (A λ ′) is calculated by the equation (2) or the equation (3), and the deterioration degree of the measured material and the reflection absorbance difference or the reflection absorbance ratio are stored in advance. A deterioration diagnosis method and a diagnosis device for an electric device are characterized in that the deterioration degree is determined by comparing and calculating a relationship (master curve).
【0008】[0008]
【数5】
Aλ=−log(Rλ/100) …(1)
ΔAλ=Aλ1−Aλ2(ただし、λ1<λ2) …(2)
Aλ′=Aλ1/Aλ2(ただし、λ1<λ2) …(3)
(波長λ(nm)における被測定物の反射率をR
λ(%)とする)
なお、光源として使用する単色光は、波長650〜13
10nmにピーク波長を有する半導体レーザ(LD)あ
るいは発光ダイオード(LED)が入手容易で寿命も長
く性能も安定しており好適である。特に、655,66
0,670,780,800,820,830,85
0,1300,1310nm等のLD,LED光源が好
適である。上記領域以外の波長の光源では、被測定材料
の劣化度が比較的小さいうちに検出器(光量測定部)が
オーバーレンジとなり、測光不能となる場合がある。被
測定材料がもともと色の薄い材料である場合には、65
5,660,670,780,800nm等の800n
m以下の波長の光を用いることがより好ましい。一方、
被測定材料がもともと着色している材料等については、
780,800,820,830,850,1300,
1310nm等の近赤外領域の波長を用いることがより
好ましい。## EQU5 ## A λ = −log (R λ / 100) (1) ΔA λ = A λ1 -A λ2 (where λ1 <λ2) (2) A λ ′ = A λ1 / A λ2 (where λ1 <λ2) (3) (The reflectance of the measured object at the wavelength λ (nm) is R
λ (%)) The monochromatic light used as the light source has a wavelength of 650 to 13
A semiconductor laser (LD) or a light emitting diode (LED) having a peak wavelength of 10 nm is suitable because it is easily available, has a long life, and has stable performance. Especially 655, 66
0,670,780,800,820,830,85
LD, LED light sources of 0, 1300, 1310 nm and the like are suitable. In a light source having a wavelength other than the above range, the detector (light quantity measuring unit) may be in the overrange and the photometry may not be possible while the deterioration degree of the material to be measured is relatively small. If the material to be measured is originally a light-colored material, 65
800n such as 5,660, 670, 780, 800nm
It is more preferable to use light having a wavelength of m or less. on the other hand,
For materials that are originally colored,
780, 800, 820, 830, 850, 1300,
It is more preferable to use a wavelength in the near infrared region such as 1310 nm.
【0009】(2)白色連続光を照射するハロゲンラン
プからの照射光を分光器を介して照射用光ファイバーで
電気機器内部に導き、該照射用光ファイバーからの出射
光は透過距離aなる絶縁媒体中を透過後、電気機器外部
に導かれる受光用光ファイバーに入射,伝送し、光量測
定部に導かれ、該照射光強度の波長依存性を測定した
後、該照射光を照射用光ファイバーで電気機器内部に導
き、透過距離a/2の位置にある絶縁材料表面に照射
し、該絶縁材料表面からの反射光を電気機器外部に導く
受光用光ファイバーを用いて光量測定部に導き、劣化度
演算部において該光量測定部からの出力値より各波長に
おける反射吸光度(Aλ)を(1)式で算出後、任意の
2波長間の反射吸光度差(ΔAλ)あるいは反射吸光度
比(Aλ′)を(2)式あるいは(3)式で演算し、さ
らに該照射光強度の波長依存性の測定値を用いて、予め
記憶させた被測定材料の劣化度と反射吸光度差あるいは
反射吸光度比との関係(マスターカーブ)を比較演算す
ることによって劣化度を判定することを特徴とする電気
機器の劣化診断方法並びに診断装置にある。(2) Light emitted from a halogen lamp that emits white continuous light is guided through a spectroscope to the inside of an electric device through an optical fiber for irradiation, and light emitted from the optical fiber for irradiation is in an insulating medium having a transmission distance a. After being transmitted, the light is incident on and transmitted to a light receiving optical fiber that is guided to the outside of the electrical equipment, and is guided to the light quantity measurement unit. After measuring the wavelength dependence of the irradiation light intensity, the irradiation light is irradiated to the inside of the electrical equipment by the irradiation optical fiber. And irradiate the surface of the insulating material at the position of the transmission distance a / 2, and guide the reflected light from the surface of the insulating material to the light quantity measuring section using the light receiving optical fiber that guides it to the outside of the electric device. After calculating the reflection absorbance (A λ ) at each wavelength from the output value from the light quantity measurement unit by the equation (1), the reflection absorbance difference (ΔA λ ) or the reflection absorbance ratio (A λ ′) between any two wavelengths is calculated. (2 Formula or (3) is calculated, and the measured value of the wavelength dependence of the irradiation light intensity is used to store the relationship between the deterioration degree of the material to be measured and the reflection absorbance difference or the reflection absorbance ratio (master curve ) Is compared and calculated to determine the degree of deterioration.
【0010】[0010]
【数6】
Aλ=−log(Rλ/100) …(1)
ΔAλ=Aλ1−Aλ2(ただし、λ1<λ2) …(2)
Aλ′=Aλ1/Aλ2(ただし、λ1<λ2) …(3)
(波長λ(nm)における被測定物の反射率をR
λ(%)とする)
一般に、絶縁紙やモールド樹脂等の有機材料の熱劣化に
伴う反射吸光度スペクトルの変化は、図3で示されるよ
うな変化で代表される。該図のように劣化に伴って可視
領域の短波長側で反射吸光度は著しい増加を示すので、
検出器(光量測定部)の測定レンジ上の制約から650
nm未満の波長領域では機器の寿命点まで、使用されて
いる材料の反射吸光度を測定し続けることが実質的に困
難となってしまう。この短波長側での反射吸光度の増加
は、主に材料の熱酸化劣化反応による電子遷移吸収損失
の増大に起因するものである。(6) A λ = −log (R λ / 100) (1) ΔA λ = A λ1 −A λ2 (where λ1 <λ2) (2) A λ ′ = A λ1 / A λ2 (where λ1 <λ2) (3) (The reflectance of the measured object at the wavelength λ (nm) is R
λ (%)) Generally, the change in the reflection absorbance spectrum due to the thermal deterioration of the organic material such as the insulating paper or the mold resin is represented by the change as shown in FIG. As shown in the figure, since the reflection absorbance significantly increases on the short wavelength side of the visible region with deterioration,
650 due to restrictions on the measurement range of the detector (light quantity measurement unit)
In the wavelength region of less than nm, it becomes substantially difficult to continuously measure the reflection absorbance of the material used until the end of the life of the device. This increase in reflection absorbance on the short wavelength side is mainly due to an increase in electron transition absorption loss due to the thermal oxidation deterioration reaction of the material.
【0011】また、劣化度の増大に伴って反射吸光度A
λは短波長側ほど増加するようになるので、任意の2波
長間の反射吸光度差ΔAλ(=Aλ1−Aλ2)あるいは
反射吸光度比Aλ′(=Aλ1/Aλ2)も同様に増加す
る。ここで、λ1<λ2である。例えば図3において、
波長λ1(nm)と波長λ2(nm)間の反射吸光度差
ΔAλを、劣化度の大きい材料から順にα1,α2,α
3とすれば、α1>α2>α3の関係が成立する。反射
吸光度比Aλ′に対しても同様のことが言える。Further, as the deterioration degree increases, the reflection absorbance A
Since λ increases toward the shorter wavelength side, the reflection absorbance difference ΔA λ (= A λ1 −A λ2 ) between any two wavelengths or the reflection absorbance ratio A λ ′ (= A λ1 / A λ2 ) is also the same. To increase. Here, λ1 <λ2. For example, in FIG.
The reflection absorbance difference ΔA λ between the wavelength λ1 (nm) and the wavelength λ2 (nm) is α1, α2, α
If 3, then the relationship α1>α2> α3 is established. The same applies to the reflection absorbance ratio A λ ′.
【0012】この熱劣化に伴う反射吸光度差や反射吸光
度比の変化が、材料の各種物性の変化と相関を有してお
り、これらの反射吸光度パラメータを測定することで非
破壊的に材料の物性低下を診断できる。例えば、油入変
圧器の絶縁紙の平均重合度残率と反射吸光度差との関係
を図4に示したが、良好な相関関係を有していることが
わかる。The difference in reflection absorbance or the change in reflection absorbance ratio due to the heat deterioration has a correlation with the change in various physical properties of the material, and the physical properties of the material can be nondestructively measured by measuring these reflection absorbance parameters. Can diagnose decline. For example, the relationship between the average residual polymerization degree of the insulating paper of the oil-immersed transformer and the reflection absorbance difference is shown in FIG. 4, and it can be seen that there is a good correlation.
【0013】また、特開平3−226651 号公報に記載され
ているように、劣化度は換算時間θで表すことが一般的
である。換算時間θで表すことにより、様々な熱履歴を
有する材料であっても、θが等しければ同じ劣化程度で
あることを意味する。換算時間θ(h)は(4)式で定
義される。Further, as described in Japanese Patent Laid-Open No. 3-226651, the degree of deterioration is generally represented by a conversion time θ. By expressing it as the conversion time θ, it means that even if the materials have various thermal histories, if θ is the same, the degree of deterioration is the same. The conversion time θ (h) is defined by the equation (4).
【0014】[0014]
【数7】 [Equation 7]
【0015】ここで、ΔEは熱劣化のみかけの活性化エ
ネルギー(J/mol)、Rは気体定数(J/K/mol)、T
は熱劣化の絶対温度(K)、tは劣化時間(h)であ
る。樹脂やオイル等のΔEは、数種の劣化温度に対する
反射吸光度差あるいは反射吸光度比の変化をアレニウス
プロットすることによって容易に算出できる。Here, ΔE is the apparent activation energy (J / mol) of thermal deterioration, R is the gas constant (J / K / mol), T
Is the absolute temperature (K) of heat deterioration, and t is the deterioration time (h). ΔE of resin, oil, etc. can be easily calculated by Arrhenius plotting the difference in reflection absorbance or the change in reflection absorbance ratio with respect to several kinds of deterioration temperatures.
【0016】さらに、予め求めておいた絶縁油や絶縁紙
を用いた機器の寿命点における換算時間をθ0とすれ
ば、実測から求めた換算時間θとの差Δθ(=θ0−
θ)が余寿命に相当する換算時間となり、劣化度判定の
尺度となる。即ち、余寿命Δθ(h)は(5)式で表され
る。Further, if the conversion time at the life point of the device using the insulating oil or the insulating paper which is obtained in advance is θ 0 , the difference Δθ (= θ 0 −
θ) is the converted time corresponding to the remaining life, and is a measure for determining the degree of deterioration. That is, the remaining life Δθ (h) is expressed by the equation (5).
【0017】[0017]
【数8】 [Equation 8]
【0018】(5)式より、時間t以降の機器の使用温
度条件が定まれば、余寿命の時間Δt(=t0−t)を
求めることができる。From the equation (5), if the operating temperature condition of the device after the time t is determined, the remaining life time Δt (= t 0 -t) can be obtained.
【0019】油入電気機器に使用されている絶縁紙の劣
化度を反射吸光度差(ΔAλ)あるいは反射吸光度比
(Aλ′)で診断しようとする場合、劣化の程度が小さ
いうちは問題ないが、劣化が進行して絶縁油自身が着色
してくると、絶縁油の吸収の影響で正確な反射吸光度値
が得られなくなる。図6に絶縁油の波長660nmと8
50nm間における光透過損失差のマスターカーブの例
を示したが、劣化が進行してくると光透過損失差は指数
関数的に増大する傾向がある。この絶縁油の劣化に伴う
吸収の増大を補正するために、本発明では、絶縁油の距
離aにおける透過光強度を各波長ごとに測定し、波長間
の強度補正を行う。このときの透過光路長の1/2の距
離a/2で絶縁紙の反射光強度を測定すれば、往復の絶
縁油の吸収をキャンセルでき、正確な絶縁紙の反射吸光
度値を得られる。When the deterioration degree of the insulating paper used in the oil-filled electrical equipment is to be diagnosed by the reflection absorbance difference (ΔA λ ) or the reflection absorbance ratio (A λ ′), there is no problem as long as the degree of deterioration is small. However, when the deterioration progresses and the insulating oil itself becomes colored, an accurate reflection absorbance value cannot be obtained due to the absorption of the insulating oil. Fig. 6 shows the insulating oil wavelengths of 660 nm and 8
An example of the master curve of the light transmission loss difference between 50 nm is shown, but the light transmission loss difference tends to exponentially increase as the deterioration progresses. In order to correct the increase in absorption due to the deterioration of the insulating oil, in the present invention, the transmitted light intensity at the distance a of the insulating oil is measured for each wavelength and the intensity correction between the wavelengths is performed. If the reflected light intensity of the insulating paper is measured at a distance a / 2 that is ½ of the transmitted optical path length at this time, the absorption of the insulating oil in the back and forth can be cancelled, and an accurate reflected light absorption value of the insulating paper can be obtained.
【0020】[0020]
【発明の実施の形態】以下、実施例を用いて本発明を詳
細に説明する。BEST MODE FOR CARRYING OUT THE INVENTION The present invention will be described in detail below with reference to examples.
【0021】(実施例1)図1は油入電気機器(変圧
器)の劣化診断装置の適用形態を示す模式図である。ま
た、図7に劣化度判定のための演算のフローチャート図
を示す。図1において、劣化度演算部10はハードディ
スクユニットが内蔵されたノートブック型パーソナルコ
ンピュータを用いている。まず、各光源波長に対する絶
縁油の透過光量を各々測定し、透過光強度が一定値とな
るように補正する。本実施例では2波長を用いた装置構
成での説明をする。2種類のLED光源を内蔵する光源
部8から発生したピーク波長λ1=660nmの単色光
は、照射用光ファイバー6に導かれ、図2に示されたプ
ローブ5内に到達し、ハーフミラー11を透過した後、
距離aの絶縁油中を透過する。この透過光は受光部13
を経た後、受光用光ファイバー7を通り光量測定部9に
伝送される。光量測定部9はフォトダイオードを内蔵し
た光パワーメータを用いている。同様に、光源部8から
発生したピーク波長λ2=850nmの単色光を用いて
同じ操作を行い、λ1とλ2の透過光強度が等しくなる
ように光源部の光強度調整ダイアルを調節する。本測定
ではこのベース値を600nWに調節した。この操作を
行うことにより、絶縁紙の劣化診断に対する絶縁油の劣
化に伴う光吸収の影響を補正することができる。次に、
本質的に寿命を支配している絶縁紙の反射光量を測定す
る。光源部8からのピーク波長λ1=660nmの単色
光は、同様の操作により照射用光ファイバー6に導か
れ、プローブ5を通りコイル2上の絶縁紙の表面に照射
される。プローブ5の反射光測定部側は、図2に示した
ように外部の迷光を遮断する遮へいリング構造を有して
いる。さらに図2に示したように透過光強度を測定した
光路長の1/2の距離を保てるように設計されている。
コイル2の絶縁紙表面からの反射光を受光用光ファイバ
ー7を経由して、その伝送光は光量測定部9に送られ、
反射光量I1′が測定され劣化度演算部10に結果I1′
が出力される。劣化度演算部10では、660nmにお
ける反射率R660(=100×I1′/I0,I0=60
0)が算出、メモリー上に記憶される。同様にして、ピ
ーク波長λ2=850nmの単色光を用いて同じ操作が
行われ、劣化度演算部10において850nmにおける
反射率R850(=100×I2′/I0,I0=600)が
算出、メモリー上に記憶される。このようにして、66
0,850nmにおける反射率が得られるので、劣化度
演算部10において2波長間の反射吸光度差ΔAλ(=
Aλ1−Aλ2)あるいは反射吸光度比Aλ′(=Aλ1
/Aλ2)が求められる。ハードディスクユニットに
は、図5,図9に示したような劣化度に対応した反射吸
光度差あるいは反射吸光度比がマスターカーブとして予
め記憶されており、劣化度演算部10に出力する。この
記憶された関数値と実測の反射吸光度差あるいは反射吸
光度比の値から劣化度演算部10で比較演算して劣化度
を判定し、外部(図示省略)のプリンタ等に測定結果と
して出力する。(Embodiment 1) FIG. 1 is a schematic diagram showing an application form of a deterioration diagnosis device for an oil-filled electric device (transformer). Further, FIG. 7 shows a flowchart of the calculation for determining the degree of deterioration. In FIG. 1, the deterioration degree calculation unit 10 uses a notebook personal computer with a built-in hard disk unit. First, the amount of transmitted light of the insulating oil for each wavelength of the light source is measured, and the intensity of the transmitted light is corrected to a constant value. In this embodiment, an apparatus configuration using two wavelengths will be described. The monochromatic light having the peak wavelength λ1 = 660 nm generated from the light source section 8 containing the two types of LED light sources is guided to the irradiation optical fiber 6, reaches the probe 5 shown in FIG. 2, and passes through the half mirror 11. After doing
It penetrates through the insulating oil at the distance a. This transmitted light is received by the light receiving unit 13.
After passing through, the light is transmitted to the light quantity measuring section 9 through the light receiving optical fiber 7. The light quantity measuring unit 9 uses an optical power meter with a built-in photodiode. Similarly, the same operation is performed using the monochromatic light having the peak wavelength λ2 = 850 nm generated from the light source unit 8, and the light intensity adjustment dial of the light source unit is adjusted so that the transmitted light intensities of λ1 and λ2 are equal. In this measurement, this base value was adjusted to 600 nW. By performing this operation, it is possible to correct the influence of light absorption due to the deterioration of the insulating oil on the deterioration diagnosis of the insulating paper. next,
The amount of reflected light from the insulating paper, which essentially controls the life, is measured. The monochromatic light having the peak wavelength λ1 = 660 nm from the light source unit 8 is guided to the irradiation optical fiber 6 by the same operation, passes through the probe 5, and is irradiated onto the surface of the insulating paper on the coil 2. The reflected light measuring portion side of the probe 5 has a shield ring structure for blocking external stray light as shown in FIG. Further, as shown in FIG. 2, it is designed so that the distance of 1/2 of the optical path length for measuring the transmitted light intensity can be maintained.
The reflected light from the surface of the insulating paper of the coil 2 is sent to the light quantity measurement unit 9 via the light receiving optical fiber 7.
The reflected light amount I 1 ′ is measured and the deterioration degree calculation unit 10 outputs the result I 1 ′.
Is output. In the deterioration degree calculation unit 10, the reflectance R 660 (= 100 × I 1 ′ / I 0 , I 0 = 60 at 660 nm is used.
0) is calculated and stored in the memory. Similarly, the same operation is performed using the monochromatic light having the peak wavelength λ2 = 850 nm, and the deterioration degree calculation unit 10 calculates the reflectance R 850 (= 100 × I 2 ′ / I 0 , I 0 = 600) at 850 nm. Calculated and stored in memory. In this way, 66
Since the reflectance at 0,850 nm is obtained, the deterioration degree calculator 10 calculates the difference in reflection absorbance between two wavelengths ΔA λ (=
A λ1 -A λ2 ) or reflection absorbance ratio A λ '(= A λ1
/ A λ2 ) is required. In the hard disk unit, a reflection absorbance difference or a reflection absorbance ratio corresponding to the degree of deterioration as shown in FIGS. From the stored function value and the actually measured reflection absorbance difference or the reflection absorbance ratio value, the deterioration degree calculating unit 10 performs a comparison calculation to determine the deterioration degree, and outputs the measurement result to an external printer (not shown) or the like.
【0022】なお、本実施例では2波長を用いた材料の
劣化度測定装置を説明したが、3波長でも測定装置を同
様に操作し、3波長用のマスターカーブを用いて劣化度
を判定できる。さらに、光を時分割で照射せずに合波し
て同時に照射しても一向に差し支えない。この場合は検
出器(光量測定部)側でフィルターをかけるなどすると
効果的である。本装置はオンラインでの常時監視の目的
でも、携帯して点検運用する目的でもどちらの場合にも
適用できる。In this embodiment, the deterioration degree measuring apparatus for materials using two wavelengths has been described, but the deterioration degree can be judged by operating the measuring apparatus similarly for three wavelengths and using a master curve for three wavelengths. . Further, the light may be combined and simultaneously irradiated without time-division irradiation. In this case, it is effective to apply a filter on the detector (light quantity measurement section) side. This device can be applied both for the purpose of continuous monitoring online and for the purpose of carrying out inspection operation while carrying.
【0023】(実施例2)実施例1と同様にして、図8
に示した絶縁媒体としてパーフルオロカーボン液14を
用いた変圧器に対して劣化診断を適用した例を示す。ま
ず、各光源波長に対するパーフルオロカーボン液の透過
光量を各々測定し、透過光強度が一定値となるように補
正する。2種類のLD光源を内蔵する光源部8から発生
したピーク波長λ1=780nmの単色光は、照射用光
ファイバー6に導かれ、図2に示されたプローブ5内に
到達し、ハーフミラー11を透過した後、距離aのパー
フルオロカーボン液中を透過する。この透過光は受光部
13を経た後、受光用光ファイバー7を通り光量測定部
9に伝送される。同様に、光源部8から発生したピーク
波長λ2=1310nmの単色光を用いて同じ操作を行
い、λ1とλ2の透過光強度が等しくなるように光源部
の光強度調整ダイアルを調節する。本測定ではこのベー
ス値を1.0μW に調節した。次に、絶縁紙の反射光量
を測定する。光源部8からのピーク波長λ1=780n
mの単色光は、同様の操作により照射用光ファイバー6
に導かれ、プローブ5を通りコイル2上の絶縁紙の表面
に照射される。コイル2の絶縁紙表面からの反射光を受
光用光ファイバー7を経由して、その伝送光は光量測定
部9に送られ、反射光量I1′ が測定され劣化度演算部
10に結果I1′ が出力される。劣化度演算部10で
は、780nmにおける反射率R780(=100×I1′
/I0,I0=1.0)が算出、メモリー上に記憶され
る。同様にして、ピーク波長λ2=1310nmの単色
光を用いて同じ操作が行われ、劣化度演算部10におい
て1310nmにおける反射率R1310(=100×
I2′/I0,I0=1.0)が算出、メモリー上に記憶さ
れる。このようにして、780,1310nmにおける
反射率が得られるので、劣化度演算部10において2波
長間の反射吸光度差ΔAλ(=Aλ1−Aλ2)あるいは
反射吸光度比Aλ′(=Aλ1/Aλ2)が求められる。
ハードディスクユニットには、図5,図9に示したよう
な劣化度に対応した反射吸光度差あるいは反射吸光度比
がマスターカーブとして予め記憶されており、劣化度演
算部10に出力する。この記憶された関数値と実測の反
射吸光度差あるいは反射吸光度比の値から劣化度演算部
10で比較演算して劣化度を判定する。(Embodiment 2) As in Embodiment 1, FIG.
An example in which the deterioration diagnosis is applied to the transformer using the perfluorocarbon liquid 14 as the insulating medium shown in FIG. First, the amount of transmitted light of the perfluorocarbon liquid with respect to each light source wavelength is measured, and the transmitted light intensity is corrected so as to be a constant value. The monochromatic light having the peak wavelength λ1 = 780 nm generated from the light source unit 8 incorporating the two types of LD light sources is guided to the irradiation optical fiber 6, reaches the probe 5 shown in FIG. 2, and passes through the half mirror 11. After that, it permeates through the perfluorocarbon liquid at a distance a. The transmitted light passes through the light receiving section 13 and then is transmitted to the light quantity measuring section 9 through the light receiving optical fiber 7. Similarly, the same operation is performed using the monochromatic light having the peak wavelength λ2 = 1310 nm generated from the light source unit 8, and the light intensity adjustment dial of the light source unit is adjusted so that the transmitted light intensities of λ1 and λ2 are equal. In this measurement, this base value was adjusted to 1.0 μW. Next, the reflected light amount of the insulating paper is measured. Peak wavelength λ1 = 780n from the light source unit 8
The monochromatic light of m is irradiated with the optical fiber 6 by the same operation.
And is irradiated onto the surface of the insulating paper on the coil 2 through the probe 5. The reflected light from the surface of the insulating paper of the coil 2 is sent to the light quantity measuring unit 9 through the light receiving optical fiber 7, the reflected light quantity I 1 ′ is measured, and the deterioration degree calculation unit 10 outputs the result I 1 ′. Is output. In the deterioration degree calculation unit 10, the reflectance R 780 (= 100 × I 1 ′) at 780 nm is obtained.
/ I 0 , I 0 = 1.0) is calculated and stored in the memory. Similarly, the same operation is performed using the monochromatic light with the peak wavelength λ2 = 1310 nm, and the reflectance R 1310 (= 100 ×
I 2 ′ / I 0 , I 0 = 1.0) is calculated and stored in the memory. In this way, since the reflectances at 780 and 1310 nm are obtained, the deterioration calculating section 10 reflects the difference in reflection absorbance between two wavelengths ΔA λ (= A λ1 −A λ2 ) or the reflection absorbance ratio A λ ′ (= A λ1). / A λ2 ) is required.
The reflection absorbance difference or the reflection absorbance ratio corresponding to the deterioration degree as shown in FIGS. 5 and 9 is stored in advance in the hard disk unit as a master curve, and is output to the deterioration degree calculation unit 10. The deterioration degree calculation unit 10 compares the stored function value with the actually measured reflection absorption difference or the reflection absorption ratio value to determine the deterioration degree.
【0024】(実施例3)実施例1,2と同様にして、
図10に示した絶縁媒体としてSF6 ガス15を用いた
変圧器に対して劣化診断を適用した例を示す。まず、各
光源波長に対するSF6 ガスの透過光量を各々測定し、
透過光強度が一定値となるように補正する。2種類のL
D光源を内蔵する光源部8から発生したピーク波長λ1
=780nmの単色光は、照射用光ファイバー6に導か
れ、図2に示されたプローブ5内に到達し、ハーフミラ
ー11を透過した後、距離aのSF6 ガス中を透過す
る。この透過光は受光部13を経た後、受光用光ファイ
バー7を通り光量測定部9に伝送される。同様に、光源
部8から発生したピーク波長λ2=1310nmの単色
光を用いて同じ操作を行い、λ1とλ2の透過光強度が
等しくなるように光源部の光強度調整ダイアルを調節す
る。本測定ではこのベース値を1.5μW に調節した。
次に、絶縁紙の反射光量を測定する。光源部8からのピ
ーク波長λ1=780nmの単色光は、同様の操作により
照射用光ファイバー6に導かれ、プローブ5を通りコイ
ル2上の絶縁紙の表面に照射される。コイル2の絶縁紙
表面からの反射光を受光用光ファイバー7を経由して、
その伝送光は光量測定部9に送られ、反射光量I1′が
測定され劣化度演算部10に結果I1′が出力される。
劣化度演算部10では、780nmにおける反射率R
780(=100×I1′/I0,I0=1.5)が算出、メモ
リー上に記憶される。同様にして、ピーク波長λ2=13
10nmの単色光を用いて同じ操作が行われ、劣化度演算部
10において1310nmにおける反射率R1310(=1
00×I2′/I0,I0=1.5)が算出、メモリー上に
記憶される。このようにして、780,1310nmに
おける反射率が得られるので、劣化度演算部10におい
て2波長間の反射吸光度差ΔAλ(=Aλ1−Aλ2)あ
るいは反射吸光度比Aλ′(=Aλ1/Aλ2)が求めら
れる。ハードディスクユニットには、図5,図9に示し
たような劣化度に対応した反射吸光度差あるいは反射吸
光度比がマスターカーブとして予め記憶されており、劣
化度演算部10に出力する。この記憶された関数値と実
測の反射吸光度差あるいは反射吸光度比の値から劣化度
演算部10で比較演算して劣化度を判定する。(Third Embodiment) Similar to the first and second embodiments,
An example is shown in which deterioration diagnosis is applied to the transformer using SF 6 gas 15 as the insulating medium shown in FIG. 10. First, the amount of transmitted light of SF 6 gas for each light source wavelength is measured,
The transmitted light intensity is corrected to a constant value. 2 types of L
Peak wavelength λ1 generated from the light source unit 8 having a built-in D light source
The monochromatic light of 780 nm is guided to the irradiation optical fiber 6, reaches the inside of the probe 5 shown in FIG. 2, passes through the half mirror 11, and then passes through the SF 6 gas at the distance a. The transmitted light passes through the light receiving section 13 and then is transmitted to the light quantity measuring section 9 through the light receiving optical fiber 7. Similarly, the same operation is performed using the monochromatic light having the peak wavelength λ2 = 1310 nm generated from the light source unit 8, and the light intensity adjustment dial of the light source unit is adjusted so that the transmitted light intensities of λ1 and λ2 are equal. In this measurement, this base value was adjusted to 1.5 μW.
Next, the reflected light amount of the insulating paper is measured. The monochromatic light with the peak wavelength λ1 = 780 nm from the light source unit 8 is guided to the irradiation optical fiber 6 by the same operation, passes through the probe 5, and is irradiated onto the surface of the insulating paper on the coil 2. The reflected light from the surface of the insulating paper of the coil 2 is passed through the light receiving optical fiber 7,
The transmitted light is sent to the light quantity measurement unit 9, the reflected light quantity I 1 ′ is measured, and the result I 1 ′ is output to the deterioration degree calculation unit 10.
In the deterioration degree calculation unit 10, the reflectance R at 780 nm
780 (= 100 × I 1 ′ / I 0 , I 0 = 1.5) is calculated and stored in the memory. Similarly, the peak wavelength λ2 = 13
The same operation is performed using monochromatic light of 10 nm, and the reflectance R 1310 (= 1 at 1310 nm in the deterioration degree calculation unit 10
00 × I 2 ′ / I 0 , I 0 = 1.5) is calculated and stored in the memory. In this way, since the reflectances at 780 and 1310 nm are obtained, the deterioration degree calculator 10 reflects the difference in reflection absorbance between two wavelengths ΔA λ (= A λ1 −A λ2 ) or the reflection absorbance ratio A λ ′ (= A λ1). / A λ2 ) is required. The reflection absorbance difference or the reflection absorbance ratio corresponding to the deterioration degree as shown in FIGS. 5 and 9 is stored in advance in the hard disk unit as a master curve, and is output to the deterioration degree calculation unit 10. The deterioration degree calculation unit 10 compares the stored function value with the actually measured reflection absorption difference or the reflection absorption ratio value to determine the deterioration degree.
【0025】(実施例4)実施例1〜3と同様にして、
図11に示した樹脂モールド方式の乾式変圧器に対して
劣化診断を適用した例を示す。まず、各光源波長に対し
ての透過光量を各々測定し、透過光強度が一定値となる
ように補正する。この場合の媒体は空気である。2種類
のLED光源を内蔵する光源部8から発生したピーク波
長λ1=660nmの単色光は、照射用光ファイバー6
に導かれ、図2に示されたプローブ5内に到達し、ハー
フミラー11を透過した後、距離aの間隙部を透過す
る。この透過光は受光部13を経た後、受光用光ファイ
バー7を通り光量測定部9に伝送される。同様に、光源
部8から発生したピーク波長λ2=850nmの単色光
を用いて同じ操作を行い、λ1とλ2の透過光強度が等
しくなるように光源部の光強度調整ダイアルを調節す
る。本測定ではこのベース値を800nWに調節した。
次に、エポキシモールド樹脂16の反射光量を測定す
る。光源部8からのピーク波長λ1=660nmの単色
光は、同様の操作により照射用光ファイバー6に導か
れ、プローブ5を通りコイル2上のエポキシモールド樹
脂の表面に照射される。コイル2のエポキシモールド樹
脂表面からの反射光を受光用光ファイバー7を経由し
て、その伝送光は光量測定部9に送られ、反射光量
I1′ が測定され劣化度演算部10に結果I1′ が出力
される。劣化度演算部10では、660nmにおける反
射率R660(=100×I1′/I0,I0=800)が算
出、メモリー上に記憶される。同様にして、ピーク波長
λ2=850nmの単色光を用いて同じ操作が行われ、
劣化度演算部10において850nmにおける反射率R
850(=100×I2′/I0,I0=800)が算出、メ
モリー上に記憶される。このようにして、660,85
0nmにおける反射率が得られるので、劣化度演算部1
0において2波長間の反射吸光度差ΔAλ(=Aλ1−
Aλ2)あるいは反射吸光度比Aλ′(=Aλ1/
Aλ2)が求められる。ハードディスクユニットには、
図5,図9に示したような劣化度に対応した反射吸光度
差あるいは反射吸光度比がマスターカーブとして予め記
憶されており、劣化度演算部10に出力する。この記憶
された関数値と実測の反射吸光度差あるいは反射吸光度
比の値から劣化度演算部10で比較演算して劣化度を判
定する。(Embodiment 4) In the same manner as in Embodiments 1 to 3,
An example in which deterioration diagnosis is applied to the resin mold type dry transformer shown in FIG. 11 is shown. First, the amount of transmitted light for each light source wavelength is measured, and the transmitted light intensity is corrected to a constant value. The medium in this case is air. The monochromatic light having the peak wavelength λ1 = 660 nm generated from the light source section 8 incorporating the two types of LED light sources is the irradiation optical fiber 6
2 to reach the inside of the probe 5 shown in FIG. 2, pass through the half mirror 11, and then pass through the gap portion of the distance a. The transmitted light passes through the light receiving section 13 and then is transmitted to the light quantity measuring section 9 through the light receiving optical fiber 7. Similarly, the same operation is performed using the monochromatic light having the peak wavelength λ2 = 850 nm generated from the light source unit 8, and the light intensity adjustment dial of the light source unit is adjusted so that the transmitted light intensities of λ1 and λ2 are equal. In this measurement, this base value was adjusted to 800 nW.
Next, the amount of reflected light of the epoxy mold resin 16 is measured. The monochromatic light having the peak wavelength λ1 = 660 nm from the light source unit 8 is guided to the irradiation optical fiber 6 by the same operation, passes through the probe 5, and is irradiated onto the surface of the epoxy mold resin on the coil 2. The reflected light from the epoxy mold resin surface of the coil 2 is sent to the light quantity measuring unit 9 through the light receiving optical fiber 7, the reflected light quantity I 1 ′ is measured, and the result I 1 is sent to the deterioration degree calculating unit 10. ′ Is output. In the deterioration degree calculation unit 10, the reflectance R 660 (= 100 × I 1 ′ / I 0 , I 0 = 800) at 660 nm is calculated and stored in the memory. Similarly, the same operation is performed using monochromatic light having a peak wavelength λ2 = 850 nm,
In the deterioration degree calculation unit 10, the reflectance R at 850 nm
850 (= 100 × I 2 ′ / I 0 , I 0 = 800) is calculated and stored in the memory. In this way, 660,85
Since the reflectance at 0 nm can be obtained, the deterioration degree calculation unit 1
At 0, the difference in reflection absorbance between the two wavelengths ΔA λ (= A λ1 −
A λ2 ) or reflection absorbance ratio A λ '(= A λ1 /
A λ2 ) is required. In the hard disk unit,
The reflection absorbance difference or the reflection absorbance ratio corresponding to the deterioration degree as shown in FIGS. 5 and 9 is stored in advance as a master curve and is output to the deterioration degree calculation unit 10. The deterioration degree calculation unit 10 compares the stored function value with the actually measured reflection absorption difference or the reflection absorption ratio value to determine the deterioration degree.
【0026】(実施例5)実施例1と同様にして、光源
部8に白色連続光を照射するハロゲンランプを用いた場
合の油入変圧器に対する劣化診断装置の適用例を示す。
まず、絶縁油の波長依存性を測定する。光源部8からの
連続光は、分光器を介して照射用光ファイバー6に導か
れ、図2に示されたプローブ5内に到達し、ハーフミラ
ー11を透過した後、距離aの絶縁油中を透過する。こ
の透過光は受光部13を経た後、受光用光ファイバー7
を通り光量測定部9に伝送され、各波長λにおける基準
光量Iλが得られる。波長依存性の測定範囲は特に制限
されるものではないが、400〜1500nmの領域で十
分である。次に、絶縁紙の反射光量の波長依存性を測定
する。光源部8からの連続光は、同様の操作により照射
用光ファイバー6に導かれ、プローブ5を通りコイル2
上の絶縁紙の表面に照射される。コイル2の絶縁紙表面
からの反射光を受光用光ファイバー7を経由して、その
伝送光は光量測定部9に送られ、反射光量Iλ′が測定
され劣化度演算部10に結果Iλ′が出力される。劣化
度演算部10では、各波長における反射率Rλ(=10
0×Iλ′/Iλ)が算出され、メモリー上に記憶され
るので、劣化度演算部10において任意の2波長間の反
射吸光度差ΔAλ(=Aλ1−Aλ2)あるいは反射吸光
度比Aλ′(=Aλ1/Aλ2)が求められる。ハードデ
ィスクユニットには、図5,図9に示したような劣化度
に対応した反射吸光度差あるいは反射吸光度比がマスタ
ーカーブとして予め記憶されており、劣化度演算部10
に出力する。この記憶された関数値と実測の反射吸光度
差あるいは反射吸光度比の値から劣化度演算部10で比
較演算して劣化度を判定し、外部(図示省略)のプリン
タ等に測定結果として出力する。(Fifth Embodiment) Similar to the first embodiment, an application example of the deterioration diagnosing device to the oil-filled transformer in the case where the light source unit 8 uses a halogen lamp for irradiating white continuous light will be described.
First, the wavelength dependence of insulating oil is measured. Continuous light from the light source unit 8 is guided to the irradiation optical fiber 6 through the spectroscope, reaches the probe 5 shown in FIG. 2, passes through the half mirror 11, and then passes through the insulating oil at the distance a. To Penetrate. This transmitted light passes through the light receiving unit 13 and then is received by the light receiving optical fiber 7.
And is transmitted to the light amount measuring unit 9 to obtain the reference light amount I λ at each wavelength λ. The measurement range of the wavelength dependence is not particularly limited, but a range of 400 to 1500 nm is sufficient. Next, the wavelength dependence of the reflected light amount of the insulating paper is measured. Continuous light from the light source unit 8 is guided to the irradiation optical fiber 6 by the same operation, passes through the probe 5 and the coil 2
The surface of the upper insulating paper is irradiated. The reflected light from the surface of the insulating paper of the coil 2 is sent to the light quantity measuring unit 9 via the light receiving optical fiber 7, the reflected light quantity I λ ′ is measured, and the deterioration degree calculation unit 10 outputs the result I λ ′. Is output. In the deterioration degree calculation unit 10, the reflectance R λ (= 10 at each wavelength)
Since 0 × I λ ′ / I λ ) is calculated and stored in the memory, the deterioration calculating section 10 reflects the difference ΔA λ (= A λ1 −A λ2 ) in reflection absorbance between two arbitrary wavelengths or the reflection absorbance ratio. A λ '(= A λ1 / A λ2 ) is obtained. In the hard disk unit, the reflection absorbance difference or the reflection absorbance ratio corresponding to the deterioration degree as shown in FIGS. 5 and 9 is stored in advance as a master curve, and the deterioration degree calculation unit 10
Output to. From the stored function value and the actually measured reflection absorbance difference or the reflection absorbance ratio value, the deterioration degree calculating unit 10 performs a comparison calculation to determine the deterioration degree, and outputs the measurement result to an external printer (not shown) or the like.
【0027】(実施例6)実施例5と同様にして、光源
部8に白色連続光を照射するハロゲンランプを用いた場
合のパーフルオロカーボン液入変圧器に対する劣化診断
装置の適用例を示す。まず、パーフルオロカーボン液の
波長依存性を測定する。光源部8からの連続光は、分光
器を介して照射用光ファイバー6に導かれ、図2に示さ
れたプローブ5内に到達し、ハーフミラー11を透過し
た後、距離aのパーフルオロカーボン液中を透過する。
この透過光は受光部13を経た後、受光用光ファイバー
7を通り光量測定部9に伝送され、各波長λにおける基
準光量Iλが得られる。波長依存性の測定範囲は特に制
限されるものではないが、400〜1500nmの領域
で十分である。次に、絶縁紙の反射光量の波長依存性を
測定する。光源部8からの連続光は、同様の操作により
照射用光ファイバー6に導かれ、プローブ5を通りコイ
ル2上の絶縁紙の表面に照射される。コイル2の絶縁紙
表面からの反射光を受光用光ファイバー7を経由して、
その伝送光は光量測定部9に送られ、反射光量Iλ′が
測定され劣化度演算部10に結果Iλ′が出力される。
劣化度演算部10では、各波長における反射率Rλ(=
100×Iλ′/Iλ)が算出され、メモリー上に記憶
されるので、劣化度演算部10において任意の2波長間
の反射吸光度差ΔAλ(=Aλ1−Aλ2)あるいは反射
吸光度比Aλ′(=Aλ1/Aλ2)が求められる。ハー
ドディスクユニットには、図5,図9に示したような劣
化度に対応した反射吸光度差あるいは反射吸光度比がマ
スターカーブとして予め記憶されており、劣化度演算部
10に出力する。この記憶された関数値と実測の反射吸
光度差あるいは反射吸光度比の値から劣化度演算部10
で比較演算して劣化度を判定する。(Sixth Embodiment) Similar to the fifth embodiment, an application example of the deterioration diagnosing device to the perfluorocarbon liquid-immersed transformer in the case where the halogen lamp for irradiating the white continuous light is used for the light source section 8 will be described. First, the wavelength dependence of the perfluorocarbon liquid is measured. Continuous light from the light source unit 8 is guided to the irradiation optical fiber 6 through the spectroscope, reaches the inside of the probe 5 shown in FIG. 2, passes through the half mirror 11, and is then in the perfluorocarbon liquid at a distance a. Through.
The transmitted light passes through the light receiving section 13 and then is transmitted to the light quantity measuring section 9 through the light receiving optical fiber 7 to obtain the reference light quantity I λ at each wavelength λ. The measurement range of the wavelength dependence is not particularly limited, but a range of 400 to 1500 nm is sufficient. Next, the wavelength dependence of the reflected light amount of the insulating paper is measured. Continuous light from the light source unit 8 is guided to the irradiation optical fiber 6 by the same operation, passes through the probe 5, and is irradiated onto the surface of the insulating paper on the coil 2. The reflected light from the surface of the insulating paper of the coil 2 is passed through the light receiving optical fiber 7,
The transmitted light is sent to the light quantity measurement unit 9, the reflected light quantity I λ ′ is measured, and the result I λ ′ is output to the deterioration degree calculation unit 10.
In the deterioration degree calculator 10, the reflectance R λ (=
Since 100 × I λ ′ / I λ ) is calculated and stored in the memory, the deterioration degree calculator 10 reflects the difference in reflection absorbance between two arbitrary wavelengths ΔA λ (= A λ1 −A λ2 ) or the reflection absorbance ratio. A λ '(= A λ1 / A λ2 ) is obtained. The reflection absorbance difference or the reflection absorbance ratio corresponding to the deterioration degree as shown in FIGS. 5 and 9 is stored in advance in the hard disk unit as a master curve, and is output to the deterioration degree calculation unit 10. From the stored function value and the measured reflection absorbance difference or the reflection absorbance ratio value, the deterioration degree calculation unit 10
And the degree of deterioration is determined by comparison calculation.
【0028】(実施例7)実施例5,6と同様にして、
光源部8に白色連続光を照射するハロゲンランプを用い
た場合のSF6 ガス変圧器に対する劣化診断装置の適用
例を示す。まず、SF6 ガスの波長依存性を測定する。
光源部8からの連続光は、分光器を介して照射用光ファ
イバー6に導かれ、図2に示されたプローブ5内に到達
し、ハーフミラー11を透過した後、距離aのSF6 ガ
ス中を透過する。この透過光は受光部13を経た後、受
光用光ファイバー7を通り光量測定部9に伝送され、各
波長λにおける基準光量Iλが得られる。波長依存性の
測定範囲は特に制限されるものではないが、400〜1
500nmの領域で十分である。次に、絶縁紙の反射光
量の波長依存性を測定する。光源部8からの連続光は、
同様の操作により照射用光ファイバー6に導かれ、プロ
ーブ5を通りコイル2上の絶縁紙の表面に照射される。
コイル2の絶縁紙表面からの反射光を受光用光ファイバ
ー7を経由して、その伝送光は光量測定部9に送られ、
反射光量Iλ′が測定され劣化度演算部10に結果
Iλ′が出力される。劣化度演算部10では、各波長に
おける反射率Rλ(=100×Iλ′/Iλ)が算出さ
れ、メモリー上に記憶されるので、劣化度演算部10に
おいて任意の2波長間の反射吸光度差ΔAλ(=Aλ1−
Aλ2)あるいは反射吸光度比Aλ′(=Aλ1/Aλ2)
が求められる。ハードディスクユニットには、図5,図
9に示したような劣化度に対応した反射吸光度差あるい
は反射吸光度比がマスターカーブとして予め記憶されて
おり、劣化度演算部10に出力する。この記憶された関
数値と実測の反射吸光度差あるいは反射吸光度比の値か
ら劣化度演算部10で比較演算して劣化度を判定する。(Embodiment 7) In the same manner as in Embodiments 5 and 6,
An example of application of the deterioration diagnosis device to the SF 6 gas transformer when a halogen lamp that emits white continuous light is used for the light source unit 8 will be shown. First, the wavelength dependence of SF 6 gas is measured.
Continuous light from the light source unit 8 is guided through the spectroscope to the irradiation optical fiber 6, reaches the inside of the probe 5 shown in FIG. 2, passes through the half mirror 11, and then in the SF 6 gas at a distance a. Through. The transmitted light passes through the light receiving section 13 and then is transmitted to the light quantity measuring section 9 through the light receiving optical fiber 7 to obtain the reference light quantity I λ at each wavelength λ. The measurement range of the wavelength dependence is not particularly limited, but 400 to 1
A region of 500 nm is sufficient. Next, the wavelength dependence of the reflected light amount of the insulating paper is measured. Continuous light from the light source unit 8 is
By the same operation, it is guided to the irradiation optical fiber 6, passes through the probe 5, and is irradiated onto the surface of the insulating paper on the coil 2.
The reflected light from the surface of the insulating paper of the coil 2 is sent to the light quantity measurement unit 9 via the light receiving optical fiber 7.
The amount of reflected light I λ ′ is measured and the result I λ ′ is output to the deterioration degree calculator 10. In the deterioration degree calculation unit 10, the reflectance R λ (= 100 × I λ ′ / I λ ) at each wavelength is calculated and stored in the memory, so that the deterioration degree calculation unit 10 reflects between two arbitrary wavelengths. Absorbance difference ΔA λ (= A λ1 −
A λ2 ) or reflection absorbance ratio A λ '(= A λ1 / A λ2 )
Is required. The reflection absorbance difference or the reflection absorbance ratio corresponding to the deterioration degree as shown in FIGS. 5 and 9 is stored in advance in the hard disk unit as a master curve, and is output to the deterioration degree calculation unit 10. The deterioration degree calculation unit 10 compares the stored function value with the actually measured reflection absorption difference or the reflection absorption ratio value to determine the deterioration degree.
【0029】(実施例8)実施例5〜7と同様にして、
光源部8に白色連続光を照射するハロゲンランプを用い
た場合の樹脂モールド方式の乾式変圧器に対する劣化診
断装置の適用例を示す。まず、光源の波長依存性を測定
する。光源部8からの連続光は、分光器を介して照射用
光ファイバー6に導かれ、図2に示されたプローブ5内
に到達し、ハーフミラー11を透過した後、距離aの間
隙部を透過する。この透過光は受光部13を経た後、受
光用光ファイバー7を通り光量測定部9に伝送され、各
波長λにおける基準光量Iλが得られる。波長依存性の
測定範囲は特に制限されるものではないが、400〜1
500nmの領域で十分である。次に、エポキシモール
ド樹脂16の反射光量の波長依存性を測定する。光源部
8からの連続光は、同様の操作により照射用光ファイバ
ー6に導かれ、プローブ5を通りコイル2上のエポキシ
モールド樹脂の表面に照射される。コイル2のエポキシ
モールド樹脂表面からの反射光を受光用光ファイバー7
を経由して、その伝送光は光量測定部9に送られ、反射
光量Iλ′が測定され劣化度演算部10に結果Iλ′が
出力される。劣化度演算部10では、各波長における反
射率Rλ(=100×Iλ′/Iλ)が算出され、メモ
リー上に記憶されるので、劣化度演算部10において任
意の2波長間の反射吸光度差ΔAλ(=Aλ1−Aλ2)
あるいは反射吸光度比Aλ′(=Aλ1/Aλ2)が求め
られる。ハードディスクユニットには、図5,図9に示
したような劣化度に対応した反射吸光度差あるいは反射
吸光度比がマスターカーブとして予め記憶されており、
劣化度演算部10に出力する。この記憶された関数値と
実測の反射吸光度差あるいは反射吸光度比の値から劣化
度演算部10で比較演算して劣化度を判定する。(Embodiment 8) In the same manner as in Embodiments 5-7,
An example of application of the deterioration diagnosing device to a resin-mold dry transformer in which a halogen lamp that emits white continuous light is used as the light source unit 8 will be described. First, the wavelength dependence of the light source is measured. Continuous light from the light source unit 8 is guided to the irradiation optical fiber 6 via the spectroscope, reaches the inside of the probe 5 shown in FIG. 2, passes through the half mirror 11, and then passes through the gap portion at the distance a. To do. The transmitted light passes through the light receiving section 13 and then is transmitted to the light quantity measuring section 9 through the light receiving optical fiber 7 to obtain the reference light quantity I λ at each wavelength λ. The measurement range of the wavelength dependence is not particularly limited, but 400 to 1
A region of 500 nm is sufficient. Next, the wavelength dependence of the amount of reflected light of the epoxy mold resin 16 is measured. The continuous light from the light source unit 8 is guided to the irradiation optical fiber 6 by the same operation, passes through the probe 5, and is irradiated onto the surface of the epoxy mold resin on the coil 2. Optical fiber 7 for receiving the light reflected from the epoxy mold resin surface of coil 2
The transmitted light is sent to the light amount measuring unit 9 via the, and the reflected light amount I λ ′ is measured, and the result I λ ′ is output to the deterioration degree calculating unit 10. In the deterioration degree calculation unit 10, the reflectance R λ (= 100 × I λ ′ / I λ ) at each wavelength is calculated and stored in the memory, so that the deterioration degree calculation unit 10 reflects between two arbitrary wavelengths. Absorbance difference ΔA λ (= A λ1 −A λ2 )
Alternatively, the reflection absorbance ratio A λ ′ (= A λ1 / A λ2 ) can be obtained. In the hard disk unit, a reflection absorbance difference or a reflection absorbance ratio corresponding to the degree of deterioration as shown in FIGS. 5 and 9 is stored in advance as a master curve.
It is output to the deterioration degree calculation unit 10. The deterioration degree calculation unit 10 compares the stored function value with the actually measured reflection absorption difference or the reflection absorption ratio value to determine the deterioration degree.
【0030】(実施例9)実施例1の装置構成で、絶縁
油の2波長間の光透過損失差をパラメータとして劣化診
断を行う例について示す。まず、各光源波長に対しての
空気中での透過光量を各々測定する。光源としては2種
類のLED光源(λ1=660nm,λ2=850n
m)を用いた。距離a(cm)の間隙部を透過したときの
各波長における基準光量をそれぞれ測定し、これをI
λ1,Iλ2とする。次に、同様にして絶縁油中での透過
光量をそれぞれ測定する。660nmにおける絶縁油の
透過光量Iλ1′を測定し、劣化度演算部10に結果I
λ1′が出力される。劣化度演算部10では、660n
mにおける光透過損失αλ1(=−10/a×log
(Iλ1′/Iλ1),単位dB/cm)が算出、メモリー上
に記憶される。同様にして、850nmの単色光を用い
て同じ操作が行われ、劣化度演算部10において850
nmにおける光透過損失αλ2(=−10/a×log(I
λ2′/Iλ2),単位dB/cm)が算出、メモリー上に
記憶される。このようにして、660nm,850nm
における光透過損失が得られるので、劣化度演算部10
において2波長間の光透過損失差Δαλ(=αλ1−α
λ2)が求められる。ハードディスクユニットには、図
6に示したような劣化度に対応した光透過損失差がマス
ターカーブとして予め記憶されており、劣化度演算部1
0に出力する。この記憶された関数値と実測の絶縁油の
光透過損失差の値から劣化度演算部10で比較演算して
劣化度を判定できる。(Embodiment 9) An example of performing the deterioration diagnosis with the device configuration of Embodiment 1 using the difference in the light transmission loss between two wavelengths of insulating oil as a parameter will be described. First, the amount of transmitted light in air for each light source wavelength is measured. Two types of LED light sources (λ1 = 660 nm, λ2 = 850n)
m) was used. The reference amount of light at each wavelength when transmitted through the gap of distance a (cm) is measured, and this is I
Let λ 1 and I λ 2 . Next, similarly, the amount of transmitted light in the insulating oil is measured. The amount of transmitted light I λ1 ′ of the insulating oil at 660 nm was measured, and the result I was calculated by the deterioration degree calculation unit 10.
λ1 'is output. In the deterioration degree calculation unit 10, 660n
Light transmission loss at m α λ1 (= -10 / a × log
(I λ1 ′ / I λ1 ), unit dB / cm) is calculated and stored in the memory. Similarly, the same operation is performed by using monochromatic light of 850 nm, and the deterioration degree calculation unit 10 performs 850
light transmission loss α nm λ2 (= -10 / a × log (I
λ2 '/ I λ2 ), unit dB / cm) is calculated and stored in the memory. In this way, 660nm, 850nm
Since the light transmission loss in
Difference in optical transmission loss between two wavelengths at Δα λ (= α λ1 −α
λ 2 ) is required. In the hard disk unit, the light transmission loss difference corresponding to the deterioration degree as shown in FIG. 6 is stored in advance as a master curve.
Output to 0. The deterioration degree can be determined by performing a comparison calculation in the deterioration degree calculation unit 10 from the stored function value and the value of the measured optical transmission loss difference of the insulating oil.
【0031】(実施例10)実施例5の装置構成で、絶
縁油の2波長間の光透過損失差をパラメータとして劣化
診断を行う例について示す。まず、白色連続光に対して
の空気中での透過光量を各々測定する。光源としてはハ
ロゲンランプを用いた。距離a(cm)の間隙部を透過し
たときの各波長における基準光量をそれぞれ測定し、こ
れをIλとする。波長λの範囲は特に制限されるもので
はないが、400〜1500nmの領域で十分である。
次に、絶縁油中での各波長における透過光量をそれぞれ
測定する。波長λにおける絶縁油の透過光量Iλ′を測
定し、劣化度演算部10に結果Iλ′が出力される。劣
化度演算部10では、波長λにおける光透過損失α
λ(=−10/a×log(Iλ′/Iλ),単位dB/c
m)が算出、メモリー上に記憶される。このようにし
て、各波長における光透過損失が得られるので、劣化度
演算部10において任意の2波長間の光透過損失差Δα
λ(=αλ1−αλ2)が求められる。ハードディスクユ
ニットには、図6に示したような劣化度に対応した光透
過損失差がマスターカーブとして予め記憶されており、
劣化度演算部10に出力する。この記憶された関数値と
実測の絶縁油の光透過損失差の値から劣化度演算部10
で比較演算して劣化度を判定できる。(Embodiment 10) An example of performing a deterioration diagnosis with the device configuration of Embodiment 5 using the difference in light transmission loss between two wavelengths of insulating oil as a parameter will be described. First, the amount of transmitted light in air for white continuous light is measured. A halogen lamp was used as the light source. The amount of reference light at each wavelength when transmitted through the gap portion at the distance a (cm) is measured, and is referred to as I λ . The range of the wavelength λ is not particularly limited, but a range of 400 to 1500 nm is sufficient.
Next, the amount of transmitted light at each wavelength in the insulating oil is measured. The amount of transmitted light I λ ′ of insulating oil at the wavelength λ is measured, and the result I λ ′ is output to the deterioration degree calculator 10. The deterioration degree calculator 10 calculates the light transmission loss α at the wavelength λ.
λ (= −10 / a × log (I λ ′ / I λ ), unit dB / c
m) is calculated and stored in memory. In this way, since the light transmission loss at each wavelength is obtained, the deterioration degree calculation unit 10 calculates the light transmission loss difference Δα between two arbitrary wavelengths.
λ (= α λ1 −α λ2 ) is obtained. In the hard disk unit, the light transmission loss difference corresponding to the degree of deterioration as shown in FIG. 6 is stored in advance as a master curve.
It is output to the deterioration degree calculation unit 10. From the stored function value and the value of the measured optical transmission loss difference of the insulating oil, the deterioration degree calculation unit 10
The deterioration degree can be determined by performing a comparison calculation with.
【0032】[0032]
【発明の効果】本発明によれば、稼働中の機器の運転を
特に停止することなく、油入電気機器に使用されている
鉱油系絶縁油,パーフルオロカーボン液等の絶縁媒体や
セルロース系絶縁材料,樹脂モールド絶縁方式電気機器
の樹脂材料,SF6 等のガス絶縁方式電気機器中の絶縁
材料の劣化度を非破壊で診断できる劣化診断方法及び装
置を得ることが可能となる。According to the present invention, an insulating medium such as a mineral oil-based insulating oil, a perfluorocarbon liquid or the like used in an oil-filled electric device or a cellulose-based insulating material can be used without particularly stopping the operation of the device in operation. It is possible to obtain a deterioration diagnosing method and apparatus capable of nondestructively diagnosing the degree of deterioration of the resin material of the resin mold insulation type electric equipment and the insulation material of the gas insulation type electric equipment such as SF 6 .
【図1】油入電気機器(変圧器)の劣化診断装置の適用
形態を示す模式図。FIG. 1 is a schematic diagram showing an application form of a deterioration diagnosis device for an oil-filled electrical device (transformer).
【図2】プローブの模式断面図。FIG. 2 is a schematic cross-sectional view of a probe.
【図3】材料の反射吸光度スペクトル変化の概念図。FIG. 3 is a conceptual diagram of a change in reflection absorbance spectrum of a material.
【図4】絶縁紙の平均重合度残率と反射吸光度差との関
係図の例。FIG. 4 is an example of a relationship diagram between an average residual polymerization degree of insulating paper and a reflection absorbance difference.
【図5】劣化度判定の基準となる絶縁紙の反射吸光度差
マスターカーブの例。FIG. 5 is an example of a reflection / absorption difference master curve of insulating paper, which serves as a reference for deterioration degree determination.
【図6】絶縁油の光透過損失差のマスターカーブの例。FIG. 6 is an example of a master curve of light transmission loss difference of insulating oil.
【図7】劣化度判定のための演算のフローチャート図。FIG. 7 is a flowchart of calculation for deterioration degree determination.
【図8】パーフルオロカーボン液入変圧器への適用形態
を示す模式図。FIG. 8 is a schematic diagram showing a form of application to a perfluorocarbon liquid-immersed transformer.
【図9】劣化度判定の基準となる絶縁紙の反射吸光度比
マスターカーブの例。FIG. 9 shows an example of a reflection / absorption ratio master curve of insulating paper which serves as a criterion for determining the degree of deterioration.
【図10】SF6 ガス変圧器への適用形態を示す模式
図。FIG. 10 is a schematic diagram showing an application form to an SF 6 gas transformer.
【図11】樹脂モールド方式の乾式変圧器への適用形態
を示す模式図。FIG. 11 is a schematic diagram showing a form of application to a resin mold type dry transformer.
1…油入電気機器(変圧器)、2…コイル、3…鉄心、
4…絶縁油、5…プローブ、6…照射用光ファイバー、
7…受光用光ファイバー、8…光源部、9…光量測定
部、10…劣化度演算部、11…ハーフミラー、12…
迷光遮へいリング、13…受光部、14…パーフルオロ
カーボン液、15…SF6 ガス、16…エポキシモール
ド樹脂。1 ... Oil-filled electrical equipment (transformer), 2 ... Coil, 3 ... Iron core,
4 ... Insulating oil, 5 ... Probe, 6 ... Irradiation optical fiber,
7 ... Optical fiber for receiving light, 8 ... Light source part, 9 ... Light quantity measuring part, 10 ... Degradation degree calculating part, 11 ... Half mirror, 12 ...
Stray light shielding ring, 13 ... Light receiving part, 14 ... Perfluorocarbon liquid, 15 ... SF 6 gas, 16 ... Epoxy mold resin.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 佐藤 重勝 茨城県日立市国分町一丁目1番1号 株 式会社 日立製作所 国分工場内 (56)参考文献 特開 平9−7840(JP,A) 特開 平3−226653(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01F 27/00 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Shigekatsu Sato 1-1-1 Kokubun-cho, Hitachi-shi, Ibaraki, Ltd. Kokubun factory, Hitachi, Ltd. (56) Reference JP-A-9-7840 (JP, A) JP-A-3-226653 (JP, A) (58) Fields investigated (Int.Cl. 7 , DB name) H01F 27/00
Claims (6)
源からの照射光を照射用光ファイバーで電気機器内部に
導き、該照射用光ファイバーからの出射光は透過距離a
なる絶縁媒体中を透過後、電気機器外部に導かれる受光
用光ファイバーに入射,伝送し、光量測定部に導かれ、
該単色光光源の光源強度を該光量測定部での強度が全て
一定値となるように光量調整した後、該単色光光源から
の照射光を照射用光ファイバーで電気機器内部に導き、
透過距離a/2の位置にある絶縁材料表面に照射し、該
絶縁材料表面からの反射光を電気機器外部に導く受光用
光ファイバーを用いて光量測定部に導き、劣化度演算部
において該光量測定部からの出力値より各波長における
反射吸光度(Aλ)を(1)式で算出後、任意の2波長
間の反射吸光度差(ΔAλ )あるいは反射吸光度比
(Aλ′)を(2)式あるいは(3)式で演算し、さらに
予め記憶させた被測定材料の劣化度と反射吸光度差ある
いは反射吸光度比との関係(マスターカーブ)を比較演
算することによって劣化度を判定することを特徴とする
電気機器の劣化診断方法。 【数1】 Aλ=−log(Rλ/100) …(1) ΔAλ=Aλ1−Aλ2(ただし、λ1<λ2) …(2) Aλ′=Aλ1/Aλ2(ただし、λ1<λ2) …(3) (波長λ(nm)における被測定物の反射率をR
λ(%)とする)1. Irradiation light from at least two types of monochromatic light sources having different wavelengths is guided inside an electric device by an irradiation optical fiber, and light emitted from the irradiation optical fiber has a transmission distance a.
After passing through the insulating medium, it enters and transmits to the light receiving optical fiber that is guided to the outside of the electrical equipment, and is guided to the light quantity measurement unit.
After adjusting the light intensity of the light source intensity of the monochromatic light source so that all the intensities in the light amount measuring section are constant values, the irradiation light from the monochromatic light source is guided to the inside of an electric device by an irradiation optical fiber,
Irradiate the surface of the insulating material at the position of the transmission distance a / 2, and guide the reflected light from the surface of the insulating material to the light quantity measuring section using a light receiving optical fiber that guides the light to the outside of the electric device, and measure the light quantity in the deterioration degree calculating section. After calculating the reflection absorbance (A λ ) at each wavelength from the output value from the section by the formula (1), the reflection absorbance difference (ΔA λ ) or the reflection absorbance ratio (A λ ′) between any two wavelengths is calculated as (2). Formula or (3) is calculated, and the degree of deterioration is determined by comparing and calculating the relationship (master curve) between the degree of deterioration of the material to be measured and the reflection absorbance difference or the reflection absorbance ratio, which is stored in advance. A method for diagnosing deterioration of electrical equipment. ## EQU1 ## A λ = −log (R λ / 100) (1) ΔA λ = A λ1 −A λ2 (where λ1 <λ2) (2) A λ ′ = A λ1 / A λ2 (where λ1 <λ2) (3) (The reflectance of the measured object at the wavelength λ (nm) is R
λ (%))
上1310nm以下のピーク波長を有する半導体レーザ
あるいは発光ダイオードを用いることを特徴とする請求
項1記載の電気機器の劣化診断方法。2. The deterioration diagnosing method for an electric device according to claim 1, wherein a semiconductor laser or a light emitting diode having a peak wavelength of 650 nm or more and 1310 nm or less is used as the monochromatic light source.
の照射光を分光器を介して照射用光ファイバーで電気機
器内部に導き、該照射用光ファイバーからの出射光は透
過距離aなる絶縁媒体中を透過後、電気機器外部に導か
れる受光用光ファイバーに入射,伝送し、光量測定部に
導かれ、該照射光強度の波長依存性を測定した後、該照
射光を照射用光ファイバーで電気機器内部に導き、透過
距離a/2の位置にある絶縁材料表面に照射し、該絶縁
材料表面からの反射光を電気機器外部に導く受光用光フ
ァイバーを用いて光量測定部に導き、劣化度演算部にお
いて該光量測定部からの出力値より各波長における反射
吸光度(Aλ)を(1)式で算出後、任意の2波長間の
反射吸光度差(ΔAλ)あるいは反射吸光度比
(Aλ′)を(2)式あるいは(3)式で演算し、さらに
該照射光強度の波長依存性の測定値を用いて、予め記憶
させた被測定材料の劣化度と反射吸光度差あるいは反射
吸光度比との関係(マスターカーブ)を比較演算するこ
とによって劣化度を判定することを特徴とする電気機器
の劣化診断方法。 【数2】 Aλ=−log(Rλ/100) …(1) ΔAλ=Aλ1−Aλ2(ただし、λ1<λ2) …(2) Aλ′=Aλ1/Aλ2(ただし、λ1<λ2) …(3) (波長λ(nm)における被測定物の反射率をR
λ(%)とする)3. Light emitted from a halogen lamp that emits white continuous light is guided through a spectroscope to the inside of electrical equipment by an optical fiber for irradiation, and light emitted from the optical fiber for irradiation passes through an insulating medium having a transmission distance a. After passing through the optical fiber for light reception, which is guided to the outside of the electrical equipment, is transmitted, is guided to the light quantity measurement unit, and after measuring the wavelength dependence of the intensity of the irradiation light, the irradiation light is transmitted to the inside of the electrical equipment by the optical fiber for irradiation. The light is guided to the surface of the insulating material at the position of the transmission distance a / 2, and the reflected light from the surface of the insulating material is guided to the light quantity measuring section using a light receiving optical fiber for guiding the light to the outside of the electric device. After calculating the reflection absorbance (A λ ) at each wavelength from the output value from the light quantity measurement unit by the equation (1), the reflection absorbance difference (ΔA λ ) or the reflection absorbance ratio (A λ ′) between any two wavelengths can be calculated by 2) Expression The relationship (master curve) between the deterioration degree of the material to be measured and the reflection absorbance difference or the reflection absorbance ratio, which is stored in advance, is calculated using the equation (3) and the measured value of the wavelength dependence of the irradiation light intensity. A deterioration diagnosis method for an electric device, characterized in that a deterioration degree is determined by performing a comparison calculation. (2) A λ = −log (R λ / 100) (1) ΔA λ = A λ1 −A λ2 (where λ1 <λ2) (2) A λ ′ = A λ1 / A λ2 (where λ1 <λ2) (3) (The reflectance of the measured object at the wavelength λ (nm) is R
λ (%))
源からなる光源部と、該光源部からの照射光を電気機器
内部に導く照射用光ファイバーと、該照射用光ファイバ
ーで導かれた照射光が透過距離aなる絶縁媒体中を透過
後、該透過光を電気機器外部に導く受光用光ファイバー
と、該受光用光ファイバーによって導かれた透過光の強
度を測定する光量測定部と、該単色光光源の光源強度を
該透過光強度が全て一定値となるように光量調整した
後、該光源部からの照射光を照射用光ファイバーで電気
機器内部に導き、透過距離a/2の位置にある絶縁材料
表面に照射し、該絶縁材料表面からの反射光を受光用光
ファイバーを用いて光量測定部に導き、該光量測定部か
らの出力値より各波長における反射吸光度(Aλ)を
(1)式で算出後、任意の2波長間の反射吸光度差(Δ
Aλ)あるいは反射吸光度比(Aλ′)を(2)式あるい
は(3)式で演算し、さらに予め記憶させた被測定材料
の劣化度と反射吸光度差あるいは反射吸光度比との関係
(マスターカーブ)を比較演算することによって劣化度
を判定する劣化度演算部とを備えたことを特徴とする電
気機器の劣化診断装置。 【数3】 Aλ=−log(Rλ/100) …(1) ΔAλ=Aλ1−Aλ2(ただし、λ1<λ2) …(2) Aλ′=Aλ1/Aλ2(ただし、λ1<λ2) …(3) (波長λ(nm)における被測定物の反射率をR
λ(%)とする)4. A light source section comprising at least two kinds of monochromatic light sources having different wavelengths, an irradiation optical fiber for guiding the irradiation light from the light source section into an electric device, and an irradiation light guided by the irradiation optical fiber. After passing through an insulating medium having a transmission distance a, a light receiving optical fiber for guiding the transmitted light to the outside of the electric device, a light amount measuring unit for measuring the intensity of the transmitted light guided by the light receiving optical fiber, and the monochromatic light source. After adjusting the light intensity of the light source so that all the transmitted light intensities are constant, the irradiation light from the light source is guided to the inside of the electric device by the irradiation optical fiber, and the insulating material is located at the transmission distance a / 2. The surface is irradiated, and the reflected light from the surface of the insulating material is guided to the light quantity measuring section using the light receiving optical fiber, and the reflection absorbance (A λ ) at each wavelength is calculated by the formula (1) from the output value from the light quantity measuring section. After calculation, Reflection absorbance difference between two desired wavelengths (Δ
A λ ) or the reflection absorbance ratio (A λ ′) is calculated by the equation (2) or the equation (3), and the relationship between the deterioration degree of the material to be measured and the reflection absorbance difference or the reflection absorbance ratio stored in advance (master) A deterioration diagnosis apparatus for an electric device, comprising: a deterioration degree calculation unit that determines a deterioration degree by comparing and calculating a curve). ## EQU3 ## A λ = −log (R λ / 100) (1) ΔA λ = A λ1 -A λ2 (where λ1 <λ2) (2) A λ ′ = A λ1 / A λ2 (where λ1 <λ2) (3) (The reflectance of the measured object at the wavelength λ (nm) is R
λ (%))
上1310nm以下のピーク波長を有する半導体レーザ
あるいは発光ダイオードを用いることを特徴とする請求
項8記載の電気機器の劣化診断装置。5. The deterioration diagnostic apparatus for electric equipment according to claim 8, wherein a semiconductor laser or a light emitting diode having a peak wavelength of 650 nm or more and 1310 nm or less is used as the monochromatic light source.
なる光源部と、該光源部からの照射光を分光器を介して
電気機器内部に導く照射用光ファイバーと、該照射用光
ファイバーで導かれた照射光が透過距離aなる絶縁媒体
中を透過後、該透過光を電気機器外部に導く受光用光フ
ァイバーと、該受光用光ファイバーによって導かれた透
過光の強度を測定する光量測定部と、該照射光強度の波
長依存性を測定した後、該照射光を照射用光ファイバー
で電気機器内部に導き、透過距離a/2の位置にある絶
縁材料表面に照射し、該絶縁材料表面からの反射光を受
光用光ファイバーを用いて光量測定部に導き、該光量測
定部からの出力値より各波長における反射吸光度
(Aλ)を(1)式で算出後、任意の2波長間の反射吸
光度差(ΔAλ)あるいは反射吸光度比(Aλ′)を
(2)式あるいは(3)式で演算し、さらに該照射光強
度の波長依存性の測定値を用いて、予め記憶させた被測
定材料の劣化度と反射吸光度差あるいは反射吸光度比と
の関係(マスターカーブ)を比較演算することによって
劣化度を判定する劣化度演算部とを備えたことを特徴と
する電気機器の劣化診断装置。 【数4】 Aλ=−log(Rλ/100) …(1) ΔAλ=Aλ1−Aλ2(ただし、λ1<λ2) …(2) Aλ′=Aλ1/Aλ2(ただし、λ1<λ2) …(3) (波長λ(nm)における被測定物の反射率をR
λ(%)とする)6. A light source section comprising a halogen lamp for irradiating white continuous light, an irradiation optical fiber for guiding the irradiation light from the light source section into an electric device through a spectroscope, and an irradiation optical fiber. A light receiving optical fiber that guides the transmitted light to the outside of the electric device after the irradiation light has passed through an insulating medium having a transmission distance a, a light amount measuring unit that measures the intensity of the transmitted light guided by the light receiving optical fiber, and the irradiation After measuring the wavelength dependence of the light intensity, the irradiation light is guided to the inside of the electric device by the irradiation optical fiber, and the surface of the insulating material at the position of the transmission distance a / 2 is irradiated with the reflected light from the surface of the insulating material. It is guided to the light quantity measuring section using the light receiving optical fiber, and the reflection absorbance at each wavelength is determined from the output value from the light quantity measuring section.
After calculating (A λ ) by the equation (1), the reflection absorbance difference (ΔA λ ) between two arbitrary wavelengths or the reflection absorbance ratio (A λ ′) is calculated by the equation (2) or the equation (3). Using the measured value of the wavelength dependence of the irradiation light intensity, the degree of deterioration is determined by comparing and calculating the relationship (master curve) between the degree of deterioration of the material to be measured and the reflection absorbance difference or the reflection absorbance ratio, which is stored in advance. And a deterioration degree calculating section for performing deterioration diagnosis apparatus for electric equipment. (4) A λ = −log (R λ / 100) (1) ΔA λ = A λ1 −A λ2 (where λ1 <λ2) (2) A λ ′ = A λ1 / A λ2 (where λ1 <λ2) (3) (The reflectance of the measured object at the wavelength λ (nm) is R
λ (%))
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16371297A JP3440759B2 (en) | 1996-06-28 | 1997-06-20 | Method and apparatus for diagnosing deterioration of electrical equipment |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8-168961 | 1996-06-28 | ||
| JP16896196 | 1996-06-28 | ||
| JP16371297A JP3440759B2 (en) | 1996-06-28 | 1997-06-20 | Method and apparatus for diagnosing deterioration of electrical equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1074628A JPH1074628A (en) | 1998-03-17 |
| JP3440759B2 true JP3440759B2 (en) | 2003-08-25 |
Family
ID=26489081
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16371297A Expired - Lifetime JP3440759B2 (en) | 1996-06-28 | 1997-06-20 | Method and apparatus for diagnosing deterioration of electrical equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3440759B2 (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000146834A (en) * | 1998-11-05 | 2000-05-26 | Hitachi Ltd | Moisture measurement method, moisture measurement device, and method for manufacturing electrical equipment |
| JP2003222587A (en) * | 2001-11-20 | 2003-08-08 | Hitachi Ltd | Non-destructive degradation diagnosis method and its diagnostic device |
| JP4710701B2 (en) * | 2006-04-18 | 2011-06-29 | 富士電機システムズ株式会社 | Deterioration diagnosis method and apparatus for polymer material |
| JP5169190B2 (en) * | 2007-12-13 | 2013-03-27 | 東亜ディーケーケー株式会社 | Light oil identification method and light oil monitor |
| KR101465787B1 (en) * | 2013-07-08 | 2014-12-01 | 한국광기술원 | optical line sensor for detecting arc position and method therefor |
| JP2019067989A (en) | 2017-10-04 | 2019-04-25 | 株式会社日立製作所 | Diagnostic device for on-load tap switching device, diagnostic method for on-load tap switching device, diagnostic device for transformer |
| JP2020072118A (en) * | 2018-10-29 | 2020-05-07 | 株式会社日立産機システム | Transformer |
| KR102601867B1 (en) * | 2021-04-01 | 2023-11-13 | 엘에스일렉트릭(주) | Life evaluation apparatus of transformer |
-
1997
- 1997-06-20 JP JP16371297A patent/JP3440759B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH1074628A (en) | 1998-03-17 |
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