JP3461906B2 - Fault diagnosis method for policing circuit and action method at the time of fault - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a failure diagnosing method for a polishing circuit and a method for dealing with a failure, and more specifically, a failure diagnosing method for a polishing circuit for controlling a cell flow rate based on a specified value of the cell flow rate and a failure time. Regarding the treatment method of.
B-ISDN (Brordband-Integrated Services Digita
ATM (Asynchronous T), which is the core technology of Network
In the ransfer mode) technology, so-called policing control (or UPC: Usage Parameter) is performed to judge whether the flow rate of ATM cells flowing into the network from a subscriber exceeds the declared value of the subscriber and to control the cell flow rate. Control) is required. That is, in this policing control, each VP is
Incoming cells are monitored for each (VirtualPath) or each VC (Virtual Call), and compared with the flow rate of the subscriber declaration,
For the violating cell, the cell is discarded or a violation tag is added.

B-ISDN is an important infrastructure that forms the backbone of the information society, and requires high reliability. For this reason, it is ensured that a redundant redundancy configuration is adopted inside the communication device, or that a monitoring cell is allowed to flow inside to always perform cell transmission without error, but it is also desired to maintain high reliability in policing control.

[0003]

2. Description of the Related Art FIGS. 6 and 7 are views for explaining various proposed policing control methods. FIG. 6A shows the “time interval method”, in which time intervals t ₁ and t at which each cell arrives.
_It is determined whether or not the flow rate is excessive by measuring ₂ and comparing these with the specified time T. FIG. 6 shows the “T- of (B).
X method ”, the number of cells x ₁ and x ₂ that arrive during a prescribed period T is measured, and these are compared with the prescribed cell number X to determine whether or not the flow rate is excessive. FIG. 6C shows the “DB (Dangerous Bridge) method”, in which the number of cells x _{1 to} x ₆ that arrive during each specified time T, which is phase shifted by one cell passage time Δt, is measured, Whether or not the flow rate is excessive is determined by comparing these with the specified cell number X.

[0004] Further, (A) in FIG. 7 shows the "CAT-M method", the time interval t ₁ ~t ₅ until the number of arriving cells is the number obtained by adding 1 to the number of defined cell X 1 Each time the cell arrives, the phase is shifted and measured, and these are compared with the specified time T to determine whether the flow rate is excessive. Then, FIG. 7B shows the “LB method”, in which the counter is counted up each time one cell arrives and the counter is constantly counted down at a predetermined rate, and the count value of the counter is compared with the specified count value. By doing so, it is determined whether the flow rate is excessive.

FIG. 8 is a block diagram of an example of a polishing circuit according to the DB method. In the figure, 1 is a polishing circuit and 11 is a polishing circuit.
Is a cell information branch unit (SB), 12 is a cell delay unit (S)
M), 13 is a cell control unit (SC), 14 is a bridge memory (BM), and 15 ₁ to 15 _n are polishing circuit units each having a flow rate (traffic) measuring function for one cell type, 1
6, 17 is a cell filter (SF), CTR is an up / down counter, SEL is a selector, PM is a parameter memory, CMP is a comparator, 18 is an OR gate circuit (O), 100 is a CPU, 101 is a common bus of the CPU 100. .

The DB (Dangerous Bridge) method is called
You can limit the number of people who can cross the street "dangerous bridge" at the same time.
Is to control the ATM cell equivalent to
Each T _iThe cell time length of the bridge memory 14 exists at the same time.
Number of cells_iX respectively_iIs limited to
It Polishing circuit unit 15₁Pay attention to the operation of. In advance C
The PU 100 stores the VPI of the target cell in the parameter memory PM.
Parameter VP₁, Declared value of time interval T₁And the number of cells
Declared value X₁Set.

The cell information branching unit 11 receives the header information VPI (Virtual Pass I) from the cell arriving at the cell highway IN.
dentifier) is branched (copied), and then delayed by the cell delay unit 12 for a time required for policing judgment described later. Further, the branched header information VPI is shifted into the bridge memory 14, and at the same time, the cell filter 16 compares the header information VPI with its own VPI parameter VP ₁ and, if they match, increments the up / down counter CTR by +1. Further, the header information V in the bridge memory 14
PI is shifted at a constant speed, and the declared value of the time interval T ₁
Is selected by the selector SEL. The cell filter 17 compares this VPI information with its own VPI parameter VP _1, and if they match, decrements the up-down counter CTR by -1. In this way, the up / down counter CTR counts the number x ₁ of the cells VP _{1 which} are simultaneously present in the bridge memory 14 having the T ₁ cell time length moment by moment.

The comparator CMP compares the number of cells x ₁ with the declared value X _1, and outputs a control signal D ₁ if x ₁ > X ₁ . As a result, the cell control unit 13 marks or discards the cell VP ₁ of the cell delay unit 12. When the comparator CMP is not x ₁ > X ₁ , the control signal D ₁
Is not output. In this case, the cell control unit 13 allows the cell VP ₁ of the cell delay unit 12 to pass through as it is. Unique policing parameters are set for the other policing circuit units 15 ₂ to 15 _n , and policing control similar to the above is performed.

Therefore, if the policing circuit 1 is operating normally, no cells exceeding the declared flow rate will be output no matter what phase the observation is performed.

[0010]

However, if such a policing circuit fails, even if there is an inflow of a violating cell due to the subscriber's intention or due to the failure of the terminal, its detection and discard control are not performed. , The violating cells flow into the network. If this is left as it is, it causes a harmful effect such as discarding other normal VP / VC cells. Therefore, it is important to diagnose the failure of the polishing circuit and take appropriate measures at the time of failure.

Heretofore, an effective failure diagnosis method and a failure countermeasure method for a polishing circuit have not been proposed. In a conventional communication device, reliability is ensured by a redundant configuration, etc. However, since the policing circuit is a circuit for subscribers in which miniaturization of the circuit size is important, the circuit size becomes large. It is difficult to have a redundant configuration.

SUMMARY OF THE INVENTION An object of the present invention is to provide a failure diagnosis system for a polishing circuit which can be realized in a small size with a simple structure and a treatment system for a failure.

[0013]

The above problems can be solved by the structure shown in FIG. That is, fault diagnosis method of policing circuit of the present invention (1), in the fault diagnosis method of policing circuit which outputs a cell subjected to flow rate control based on the specified value of the cell flow, policing circuit 1 outputs Se
For Le, the measurement unit 2 for measuring the cell rate of the at least one cell type by the policing circuit 1 the same flow rate measuring method and a defined value of the cell rate of the cell species corresponding to the measured value A of the measuring part 2 B When A> B by comparing with, a failure diagnosis unit 3 that determines that the polishing circuit 1 is abnormal is provided.

The above problem can be solved by the structure of FIG. That is, fault diagnosis method of policing circuit of the present invention (2), in the fault diagnosis method of policing circuit which outputs a cell subjected to flow rate control based on the specified value of the cell flow, the output cells of the policing circuit 1, 1 Alternatively, the output measuring unit 4 for measuring the total cell flow rate in a predetermined section for two or more cell types, and the predetermined value of the cell flow rate of each cell type corresponding to the measurement value C of the output measuring unit 4 are converted into the predetermined section. When C> D by comparing the total value D of the values thus determined, the failure diagnosis unit 5 that determines that the polishing circuit 1 is abnormal is provided.

Further, referring to FIG. 1B, the present invention (3)
The failure diagnosing method for the policing circuit further includes an input measuring unit 6 in the preceding stage of the policing circuit 1 for measuring each cell flow rate Q _i in the predetermined section for the one or more cell types. for each measured value Q _i of the input measuring unit 6, the of the cell species if the measured value Q _i is larger than the value converted into the predetermined section specified value of the cell rate of the corresponding cell species The converted value is used, and in other cases, the measured value Q _i is used to obtain the total value D.

The above problem can be solved by the configuration of FIG. That is, the present invention (5) is a method for treating a failure of the polishing circuit, which is a method for treating a failure of the polishing circuit that outputs cells whose flow rate is controlled based on the specified value of the cell flow rate. And a cell discarding unit 8 provided at a subsequent stage of the polishing circuit 1. The cell discarding unit 8 detects the failure of the polishing circuit 1 by the failure detecting unit 7. The cell flow rate passing through the cell is restricted to an arbitrary flow rate E which is equal to or less than the sum of the values converted into the predetermined section of the predetermined value of the cell flow rate of all cell types input to the cell highway.

[0017]

In the present invention (1) of FIG. 1 (A), for example, when the policing circuit 1 by the DB method is operating normally, no matter what phase is observed, it will be detected during each declaration period T _i . never cell VP _i having x _i that exceeds the reported number X _i respectively corresponding to the outputs.

Therefore, the measuring unit 2 measures the cell flow rate of at least one cell type output from the polishing circuit 1 by the same flow rate measuring method as that of the polishing circuit 1. That is, of the various cells VP _i output from the policing circuit 1, for example, the cell type VP output during the reporting cycle T _1.
The number of cells in ₁ x ₁ is measured. Then, the failure diagnosis unit 3 compares the measured value A (= x ₁ ) of the measuring unit 2 with the specified value B (= X ₁ ) of the cell flow rate of the corresponding cell type VP ₁ , and when A> B, The polishing circuit 1 is determined to be abnormal.

According to the present invention (1), the measuring unit 2 is provided with the flow rate measuring means in the same manner as the polishing circuit 1,
Since it is sufficient to provide at least one cell type, the circuit scale is remarkably small. When the same flow rate measuring method as the polishing circuit 1 is adopted, strict and advanced diagnosis can be performed. Also,
It is also possible to make the measuring unit 2 simpler than the polishing circuit 1 and suppress the circuit scale. As the flow rate measuring method of the polishing circuit 1, a time interval method, a TX method, a CAT-M method, an LB method, and the like can be considered in addition to the above-mentioned DB method. The same or different arbitrary flow rate measurement method can be adopted.

In the present invention (2) of FIG. 1B, when the policing circuit 1 is operating normally, the policing circuit 1 outputs a predetermined interval for one or more cell types. The total cell flow rate does not exceed the total value D of the specified values of the cell flow rates of the corresponding cell types converted into the predetermined section. Therefore, the output measuring unit 4 measures the total cell flow rate in a predetermined section for one or more cell types of the output of the polishing circuit 1. Then, the failure diagnosing unit 5 compares the measured value C of the output measuring unit 4 with the total value D of the specified values of the cell flow rates of the corresponding cell types converted into the predetermined section to obtain C> D.
In this case, the polishing circuit 1 is determined to be abnormal.

According to the second aspect of the present invention, the output measuring unit 4 measures the total cell flow rate in the predetermined section, so that the output measuring unit 4 can be realized with a small circuit scale.
Moreover, since the failure diagnosis unit 5 makes a diagnosis based on the sum of the specified values converted into the conditions equivalent to the measurement conditions of the output measurement unit 4, a strict and advanced diagnosis can be performed. By the way, in the present invention (2), for example, the number of cells D ₁ = 20 converted into a predetermined section of the specified value of the cell flow rate of the cell VP ₁ and the cell V
Number of cells converted into the same section of the specified value of P ₂ cell flow rate D ₂
= 20, the total value D of these is D = 40. Then, it is assumed that the number of cells x ₁ = 10 in a predetermined section of the cell VP ₁ and the number of cells x ₂ = 30 (violation) in the same section of the cell VP ₂ are input to the polishing circuit 1 at a certain point. If the policing circuit 1 is normal, the number of passages of the cell VP ₁ x ₁ = 10 and the number of passages of the cell VP ₂ x ₂ = 20. However, for example, the control line of the cell VP ₂ of the policing circuit 1 fails, Therefore, the number of passing cells VP ₂ x ₂ = 3
Even if it becomes 0, the total count value C of these output cells
Since = 10 + 30 = 40, C> D (= 40) does not hold and no failure is detected.

Therefore, according to the present invention (3), polycin
1 or more cell types (in this example
Is VP₁, VP₂) In each of the predetermined sections
Cell flow rate Q_i(Ie Q₁= 10, Q₂= 30) is measured
The input diagnosis unit 6 for further operation is provided, and the failure diagnosis unit 5 is also provided.
Is each measured value Q of the input measuring unit 6._iAbout the measured value Q
_i(Ie Q₂= 30) corresponds to the cell type (VP₂)of
Value converted to the specified section of the specified value of cell flow rate (immediately
C, D₂= 20) before the cell type
The converted value (ie D₂= 20), other than
(Ie Q₁= 10 <D₁= 20), the relevant measurement
Value Q_i(Ie D₁= Q₁= 10)
D (= 20 + 10 = 30) is calculated. So in this case
Is the total count value of output C = 40, C> D (= 3
0) is satisfied, no failure of the policing circuit 1 is detected.
Will be done.

Further, preferably, the present inventions (1) to (1) to
In (3), the cell type to be measured is changed sequentially or in any order in units of one or more groups of cell types. Therefore, if the target cell type makes one round, the entire configuration of the polishing circuit 1 can be diagnosed. In the present invention (5) of FIG. 1C, the failure detection unit 7 detects a failure of the polishing circuit 1. The method of detecting a failure is not limited to that of the present invention described above, and any other method may be used. The cell discarding unit 8 is provided at the subsequent stage of the polishing circuit 1. Then, the cell discarding unit 8 detects that the policing circuit 1 has failed by the failure detecting unit 7, and thus the cell discarding unit 8
The cell flow rate passing through is limited to an arbitrary flow rate E which is equal to or less than the sum of the values converted into the predetermined section of the specified values of the cell flow rate of all cell types input to the cell highway. That is, the cell is not flowed at all, or even if the cell is flowed, the total value of the values converted into the predetermined section of the specified value of the cell flow rate of all cell types input to the cell highway is not exceeded. Therefore, even if the policing circuit 1 fails, the excess cells do not flow into the network, and the network is not adversely affected.

[0024]

Embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The same reference numerals denote the same or corresponding parts throughout the drawings. FIG. 2 is a diagram showing the configuration of the failure diagnosis system of the first embodiment, in which 1 is, for example, D
A policing circuit according to the B method, 9 is a cell information branching unit (S
B), 2 is a measuring unit using the same DB method as the polishing circuit 1, 21 is a bridge memory (BM), 22 and 23 are cell filters (SF), and 24 is an up / down counter (CT).
R), 25 is a selector (SEL), 26 is a parameter memory (PM), 3 is a failure diagnosis unit, 31 is a parameter memory (PM), 32 is a comparator (CMP), 100 is a CPU, 101 is a common bus of the CPU 100. is there.

The polishing circuit 1 of FIG. 2 is the same as the polishing circuit 1 of FIG. 8, for example. The detailed operations of the measuring section 2 and the failure diagnosing section 3 are substantially the same as those described for the single policing circuit section (that is, the traffic measuring section) 15 in FIG. The difference is that the discrimination output (x ₁ > X ₁ ) of the comparator 32 becomes an abnormality detection signal of the polishing circuit 1 and is used as an interrupt input to the CPU 100.

With this configuration, the CPU 100 _first sets the VPI parameter VP ₁ of the target cell and the declared value T ₁ of the time interval in the parameter memory 26 of the measuring unit 2, and sets the number of cells in the parameter memory 31 of the failure diagnosis unit 3. Set the declared value X ₁ . As a result, the measuring unit 2 causes the cell VP
Counting every moment the flow rate x ₁ in the _first time interval T _1.

On the other hand, in the polishing circuit 1, the cell VP
We are doing _a policing control is policing circuit portion 15 ₁ of FIG. 8, for example. If the policing circuit unit 15 ₁ is normal, no matter what phase it is observed, the policing circuit 1 outputs a number x ₁ of cells VP ₁ that exceed the declared value X ₁ during the reporting cycle T _1. There is no. Therefore, in the failure diagnosis unit 3, the comparator 32 compares the count value x ₁ of the measurement unit 2 with the declared value X ₁ of the parameter memory 31. If x ₁ > X ₁ , it is determined that the polishing circuit 1 is abnormal. Input an interrupt to the CPU 100. The CPU 100 that has received this interrupt input is, for example, the policing circuit unit 1.
The process of 5 ₁ is replaced by another vacant polishing circuit unit 15 _i to cope with the failure. If x ₁ > X ₁ is not satisfied, the monitoring is continued.

When the predetermined time has elapsed in this way, this time C
The PU 100 stores the next pair in the parameter memory 26 of the measuring unit 2.
VPI parameter VP of elephant cell₂And the declared value of the time interval
T₂Parameter memory of the fault diagnosis unit 3
The declared value X of the number of cells in 31 ₂Set. By this
In the same manner as described above, for example, the polishing circuit unit 1
5₂Diagnose. In the same way, the target cell
Change in order, or change in any order, and eventually
When the target cell makes one cycle, all the ports in the policing circuit 1 are
Ricing circuit section 15₁~ 15_nThat the diagnosis of
Become.

The policing circuit 1 may add a violation tag instead of discarding the violating cell. In this case, the cell filters 22 and 23 of the measuring unit 2 detect the violation tag of the VPI information, and when the violation tag is detected, the up / down counter 24 is not set to ± 1. Further, such a configuration including the measuring unit 2 and the failure diagnosing unit 3 can be provided in parallel as long as the circuit scale of the system allows. In this way, the flow rates of two or more different cell types can be measured in parallel at the same time, and thus failure diagnosis of any two or more polishing circuit units 15 can be performed in parallel at the same time.

Furthermore, in addition to the DB method described above, the configuration including the polishing circuit 1 and the measuring section 2 and the failure diagnosing section 3 has the time interval method as described in FIGS.
Method, CAT-M method, LB method or the like. FIG. 3 is a diagram showing the configuration of the failure diagnosis system of the second embodiment. In FIG. 3, 1 is a policing circuit using the DB method, 9 is a cell information branching unit (SB), 4 is an output measuring unit, and 41 is cell timing extraction. Part (TG), 42 is a register (RG), 4
3 is a down counter (DCTR), 44-46 are VPI
Cell filter (SF) with parameter holding function, A is an AND gate circuit, O is an OR gate circuit, 47 is a switch circuit (SW), 48 is a counter (CTR), 49 is a register (REG), 100 is a CPU, 101 Is CPU1
00 is a common bus, and 5 is a failure diagnosis unit realized by a program in the CPU 100.

The CPU 100 uses the register 4 of the output measuring unit 4.
A count value N corresponding to a predetermined time T (for example, 1 second) is set to 2. The cell timing extraction unit 41 extracts a predetermined timing signal (eg frame pulse signal) FP from the header information VPI of the branched cell. This timing signal FP is also generated at the input of an empty cell (which may include a specific monitoring cell other than the subscriber). When the CPU 100 further activates the count enable terminal E of the down counter 43, the down counter 43 is activated by the next timing signal FP.
Is loaded with the count value N, and the next timing signal FP
The countdown starts from.

Then, in this example, when 1 second has passed, the count value Q of the down counter 43 becomes 0, whereby the latch pulse signal T is output. The latch pulse signal T latches a count value Q obtained by counting various targets of the counter 48, which will be described later, in the register 49 and, at the same time, resets the counter 48. At the same time, the latch pulse signal T is input to the CPU 100 as an interrupt signal and the CP
The U100 takes in the count value C of the register 49 via the common bus 101. Then, the failure diagnosis section 5 carries out a failure diagnosis described later.

When the next timing signal FP is generated, the count value N is reloaded in the down counter 43, and the down counter 43 counts down from the next timing signal FP. Thus, while the CPU 100 is energizing the count enable terminal E, the number of cells and the failure diagnosis, which will be described later, are performed every one second. With this configuration, the CPU 100 can perform various measurements described below by controlling the switch circuit 47 and the VPI parameters given to the cell filters 45 and 46.

For example, when the CPU 100 connects between the terminals ac of the switch circuit 47, the total number C of cells measured for one second for all cell types of the subscriber can be obtained. Specifically, the timing signal FP is input to the AND gate circuit A. On the other hand, the cell filter 44 has an internal V
PI VPI information VP ₀ of empty cell by the parameter VP ₀
Is detected and the output is LOW when an empty cell is detected.
To level. Therefore, the AND gate circuit A generates a count pulse CP _a every input of all the cells kinds of cells of the subscriber, counts up the counter 48. as a result,
The register 49 latches the total number C of cells measured in one second for all cell types.

On the other hand, in the failure diagnosis unit 5, a prescribed value of the cell flow rate of all cell types of the subscriber (for example, a peak rate declaration value) is preset.
Based on the above, the total number of cells D, which is a value obtained by converting these into one second, is obtained. For example, the cell highway speed is 149.76 Mbps, and all subscriber cell types are VP ₁
And ~VP _5, respectively is assumed to be following peak rate T, set at X (declaration) by DB method.

VP₁: T₁= 10, X₁= 1 (D₁=
35, 321) VP₂: T₂= 20, X₂= 1 (D₂= 17,66
0) VP₃: T₃= 10, X₃= 3 (D₃= 105,96
2) VP_Four: T_Four= 5, X_Four= 1 (D_Four= 70,64
2) VP_Five: T_Five= 4, X_Five= 1 (D_Five= 88,30
2) First, the peak rate declaration converted to T = 20 cell hours
The sum of the values (X / T) is X / T = (2 + 1 + 6 + 4 +
5) / 20 = 18/20. This is the cell highway
Converted to speed, 149.76 Mbps x (18/2
0) = 134.784 Mbps. 1 cell = 5
If 3 bytes are used, this corresponds to 53 × 8 = 424 bits.
Hit Therefore, the policing circuit 1 can be passed in one second.
The maximum total number of cells D is D = 134.784 Mbp
s ÷ 424 bits = 317,887 cells. In addition,
Cell type VP₁~ VP_FiveThe maximum speed that can be passed in each second
Number D ₁~ D_FiveIs also described.

Then, the failure diagnosing unit 5 and the measured value C of the output measuring unit 4 and the number of cells D (= 317,8) obtained above.
87), the policing circuit 1 is judged to be abnormal if C> D, and otherwise it is not judged to be abnormal. Alternatively, the CPU 100 connects the terminals b and c of the switch circuit 47 and sets the VPI parameter VP ₁ in the cell filter 45. However, in this case, the VPI parameter that does not exist in the highway is set in the cell filter 46.

As a result, the register 49 has a cell type VP.
_The number of cells C ₁ measured per second for ₁ is latched. The failure diagnosis unit 5 converts the measured value C ₁ and the specified value for the cell type VP ₁ into the number of cells D ₁ (= 35,
321), it is determined that the polishing circuit 1 is abnormal if C ₁ > D ₁ and is not abnormal otherwise.

Next, the CPU 100 applies V to the cell filter 45.
When the PI parameter VP ₂ is set, the register 49 stores in the register 49 the number of cells C ₂ measured per _second for the cell type VP _2.
Is latched. The failure diagnosis unit 5 converts the measured value C ₂ and the specified value for the cell type VP ₂ into the number of cells D per second.
₂ (= 17,660) by comparing C ₂ > D
_In the case of ₂ , the policing circuit 1 is determined to be abnormal, and in other cases, it is not determined to be abnormal. In the same manner, if the target cells are sequentially changed as described above or changed in an arbitrary order, and when the cell type makes one round, diagnosis of the entire configuration of the polishing circuit 1 is performed.

Alternatively, the CPU 100 controls the switch circuit 47.
While connecting between terminals b and c, V is applied to the cell filter 45.
PI parameter VP₁And cell filter 4
VPI parameter VP in 6₂Set to register
49 is cell type VP₁, VP ₂About 1 second
Total number of cells C₁₂Is obtained. In the output measurement unit 4
Cell type VP₁, VP₂Cells are never entered at the same time
Therefore, the counter 48 is connected to the cell via the OR gate circuit O.
Seed VP₁, VP₂Total number of cells C₁₂Count correctly
To do. The failure diagnosis unit 5 uses this measured value C₁₂And cell type VP₁，
VP₂For each of the specified values for
Number D₁₂By comparing with (= 52,981), C
₁₂> D₁₂In this case, the policing circuit 1 is determined to be abnormal and
Otherwise, it is not judged as abnormal. Therefore, the cell fill
Total cells of any number of cell types just by increasing the number of cells in parallel
The number C can be counted.

FIG. 4 is a diagram showing the configuration of the failure diagnosis system of the third embodiment. In FIG. 4, 1 is a polishing circuit by the DB method, 9 ₁ and 9 ₂ are cell information branching units (SB), and 4 is FIG. Output measuring unit, 6 is an input measuring unit, 61 is a cell timing extracting unit (TG), 62 is a register (RG), 63 is a down counter (DCTR), and 64 ₁ to 64 _n are cell filters with a VPI parameter holding function. (SF), 65 ₁
To 65 _n counter (CTR), 66 ₁ ~66 _n register (REG), 67 is a selector (SEL), 100 is CPU, 101 is a common bus for CPU 100, 5 is the fault diagnosis unit.

The CPU 100 is the register 6 of the input measuring unit 6.
2 to set the count value N corresponding to a predetermined time T (e.g., one second), and cell filter 64 _1-64 respectively set VPI parameter VP ₁ ~VP _n of all cells type to _n. Next, the CPU 100 energizes the count enable terminal E of the down counter 63. Preferably, the count enable terminal E of the down counter 63 is energized in a phase slightly before the down counter 43 of the output measuring unit 4,
As a result, the input measuring unit 6 and the output measuring unit 4 count the cell groups in the same section.

The down counter 63 counts 1 sec in the same manner as the down counter 43 of the output measuring unit 4, the counter 65 ₁ to 65 _n in this interval cell species VP ₁ ~VP _n
Each cell is counted separately. The latch pulse signal T of the down counter 63 latches the count values Q _{1 to} Q _n of the counters 65 _{1 to} 65 _{n in} the corresponding registers 66 ₁ to 66 _n, and at the same time resets the counters 65 _{1 to} 65 _n . At the same time, the latch pulse signal T is sent to the CPU 100.
The CPU 100 which has received an interrupt input to the registers 66 _{1 to} 6 through the selector 67 and the common bus 101
The measured values Q _{1 to} Q _n of 6 _n are sequentially taken into the inside.

In the failure diagnosis section 5, each measurement of the input measurement section 6 is performed.
Value Q₁~ Q_nCorresponding cell type VP ₁~ VP_nEach provision of
Number of cells converted into the above value for 1 second₁~ D_n(However,
In this example D₁~ D_Five) And the measured value Q_iIs converted
Number of cells D_iCell that is larger than
Number D_iFor other items, the measured value Q
_iTo find the total number of cells D used for failure determination
Meru. The failure diagnosis unit 5 then measures the measured value C of the output measurement unit 4.
By comparing the calculated total number of cells D with
If C> D, the policing circuit 1 is determined to be abnormal and
Otherwise, it is not judged as abnormal.

While the output measuring unit 4 changes the target cell,
If the cell type 1 is measured sequentially,
Cell filter 64, counter 65, register 6 of measuring unit 6
The system consisting of 6 only needs one system, and the selector 67 is
It can be omitted. Also, each cell type of the input of the policing circuit 1
VP₁~ VP_nTraffic changes too much in a short time
If it does not exist, the input measuring unit 6 has one system
Filter 64, counter 65, and register 66 are used in a time-sharing manner
All cell types VP ₁~ VP_nCount value Q₁~
Q_nMay be sequentially counted.

FIG. 5 is a diagram showing the configuration of the failure treatment system of the embodiment. In FIG. 5, 1 is a polishing circuit by the DB method, 7 is a failure detection unit, 9 is a cell information branching unit (SB), 8
Is a cell discard unit, 81 is a cell information branch unit (SB), 82 is a cell delay unit (SM), 83 is a cell control unit (SC), 84
Is a bridge memory (BM), 85 and 90 are cell timing extractors (TG), and 86 and 91 are cell filters (S).
F), 87 and 89 are AND gate circuits (A), 88 is an up / down counter (CTR), and 92 is a selector (SE).
L), 93 is a parameter memory (PM), 94 is a comparator (CMP), 100 is a CPU, 101 is a CPU1.
00 is a common bus.

The fault detecting section 7 may be a fault detecting section realized by any of the other methods other than the fault detecting section realized by the first to third embodiments. The cell discarding unit 8 is similar to the policing circuit according to the DB method as shown in the figure, and has a set length T cell time length of the bridge memory 8
The number of cells x that can be simultaneously present on 4 is limited to a predetermined set value X or less.

When the failure detecting section 7 detects a failure of the polishing circuit 1, it informs the CPU 100 to that effect. CPU1
00 is a set value T of the time interval (for example, 0.01 seconds) and a set value X of the number of cells for the parameter memory PM of the cell discard unit 8 (for example, each specified value of all cell types is converted to 0.01 seconds). Set the total cell number X). The cell timing extraction unit 85 receives the timing signal F from the input VPI information.
P is extracted and input to the AND gate circuit 87. The cell filter 86 detects the VPI information VP ₀ of the input empty cell, and when detecting the empty cell, sets its output to the LOW level. Therefore, the AND gate circuit 87 increments the up / down counter 88 by +1 each time the cell of all cell types of the subscriber is input.
To do.

On the other hand, each header information VPI shifted into the bridge memory 84 is shifted at a constant speed and is selected by the selector 92 when the set value T of the time interval has elapsed. The cell timing extraction unit 90 has a selector 92.
The timing signal FP is extracted from the VPI information of the output of
Input to the AND gate circuit 89. The cell filter 91 detects the VPI information VP ₀ of the empty cell output from the selector 92, and when detecting the empty cell, sets its output to the LOW level. Therefore, the AND gate circuit 89 similarly raises the up / down counter 8 every time the subscriber inputs cells of all cell types.
Decrement 8 by 1. In this way, the up / down counter 88 counts the number x of all cells simultaneously existing in the T cell time length bridge memory 84 at every moment.

The comparator 94 compares the number of cells x with the set value X, and outputs a control signal D when x> X. As a result, the cell control unit 83 marks or discards the cell of the cell delay unit 82. The comparator 94 has x>
If it is not X, the control signal D is not output. In this case, the cell control unit 83 allows the cell of the cell delay unit 82 to pass through as it is.

According to the above configuration, the set value X of the number of cells can be arbitrarily set, and if X = 0, all the output cells of the policing circuit 1 are discarded by the cell discard unit 8. Therefore, even if the policing circuit 1 is out of order, cells having a flow rate x exceeding the set number X are not output during the set period T, so that the occurrence of cell congestion in the network can be effectively suppressed. You can

In addition to the above, the cell discard unit 8 may be constructed by, for example, the time interval method, the TX method, the CAT-M method, or the LB method. Alternatively, a simple structure in which all input cells are simply counted over a predetermined cell time length T, and when the count value x exceeds a set value X of the number of cells, all subsequent cells are discarded. But good. In the above example, the peak rate was used as the specified value of the cell flow rate. There are concepts such as instantaneous peak rate and average peak rate in the actual declared peak rate, and the concept of peak rate is broad. The specified value of the present invention is not limited to such a peak rate.

Further, although the above-mentioned embodiment shows the configuration example by the DB method, in addition to this, the time interval method, the TX method, the CAT-M method, the LB method as described in FIGS. You may comprise by. In addition, the above embodiment is based on VP (Virtual Pat).
Although the policing processing of h) is described, VC (Virtual C
The present invention can be applied to all) policing processing.

[0054]

As described above, the fault diagnosing method for the polishing circuit and the method for dealing with the failure according to the present invention have the above-mentioned constitutions. Therefore, it is possible to effectively detect the faults of the polishing circuit with a small and simple constitution and also to violate them. Inflow of cells into the network can be effectively prevented.

[Brief description of drawings]

FIG. 1 is a diagram illustrating the principle of the present invention.

FIG. 2 is a diagram showing a configuration of a failure diagnosis system of the first embodiment.

FIG. 3 is a diagram showing a configuration of a failure diagnosis system according to a second embodiment.

FIG. 4 is a diagram showing a configuration of a failure diagnosis system of a third embodiment.

FIG. 5 is a diagram showing a configuration of a failure treatment system of the embodiment.

FIG. 6 is a diagram for explaining various proposed policing control methods.

FIG. 7 is a diagram for explaining another proposed policing control method.

FIG. 8 is a block diagram of an example of a polishing circuit based on the DB method.

[Explanation of symbols]

1 Policing circuit 2 measuring section 3,5 Failure diagnosis unit 4 Output measurement section 6 Input measurement section 7 Failure detector 8 cell discard section

Front page continuation (72) Inventor Setsuo Aburu 1015 Kamiodanaka, Nakahara-ku, Kawasaki-shi, Kanagawa Within Fujitsu Limited (72) Inventor Naoaki Yamanaka 1-6, Uchiyuki-cho, Chiyoda-ku, Tokyo Inside Nippon Telegraph and Telephone Corporation ( 72) Inventor Yoichi Sato 1-6, Uchisaiwaicho, Chiyoda-ku, Tokyo Within Nippon Telegraph and Telephone Corporation (56) References Patent 3135700 (JP, B2) Patent 2994832 (JP, B2) (58) Fields investigated (Int .Cl. ⁷ , DB name) H04L 12/56 200

Claims (5)

(57) [Claims] 1. Flow rate control based on a specified value of cell flow rate
In a failure diagnosing method for a polishing circuit that outputs the applied cells , a measuring unit that measures the cell flow rate of at least one cell type of the output cells of the polishing circuit by the same flow rate measuring method as the polishing circuit, and A failure diagnosis unit for a polishing circuit, comprising: a failure diagnosis unit that determines that the polishing circuit is abnormal when A> B by comparing the measured value A with a specified value B of the cell flow rate of the corresponding cell type. method. 2. Flow rate control based on a specified value of cell flow rate
In a failure diagnosing method for a policing circuit that outputs the applied cells , an output measuring unit that measures the total cell flow rate in a predetermined section for one or more cell types of the output cells of the policing circuit, and a measurement of the output measuring unit By comparing the value C with the total value D of the corresponding values of the cell flow rate of each cell type converted into the predetermined section, if C> D, the failure diagnosis unit determines that the polishing circuit is abnormal. A fault diagnosis system for a polishing circuit, comprising: 3. An input measuring unit for measuring each cell flow rate Q _i in the predetermined section for the one or more cell types is further provided in a preceding stage of the polishing circuit, and the failure diagnosis unit measures each of the input measuring units. Regarding the value Q _i , if the measured value Q _i is larger than the value converted into the predetermined section of the specified value of the cell flow rate of the corresponding cell type, the converted value of the cell type is used, and otherwise fault diagnosis method policing circuit according to claim 2, characterized in that determining the sum total value D by using the measured values Q _i in the case of. Wherein any one of claims 1 to 3, characterized in that to change sequentially or in any order a group of cell species to be 1 or 2 or more cells types of the measuring units 1
A method of diagnosing a failure of a polishing circuit according to 1. 5. Flow rate control based on a specified value of cell flow rate
The policing circuit failure output method that outputs the applied cells includes a failure detection unit that detects a failure of the policing circuit and a cell discard unit that is provided at a subsequent stage of the polishing circuit. Any flow rate that is equal to or less than the sum of the values of the cell flow rate that passes through the cell discard section that is detected by the policing circuit failure and is converted into a specified section of the cell flow rate of all cell types that are input to the cell highway. E
A method for dealing with a failure of a policing circuit, which is characterized in that