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JP3468484B2 - Method for producing chalcopyrite semiconductor thin film solar cell - Google Patents
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JP3468484B2 - Method for producing chalcopyrite semiconductor thin film solar cell - Google Patents

Method for producing chalcopyrite semiconductor thin film solar cell

Info

Publication number
JP3468484B2
JP3468484B2 JP11166895A JP11166895A JP3468484B2 JP 3468484 B2 JP3468484 B2 JP 3468484B2 JP 11166895 A JP11166895 A JP 11166895A JP 11166895 A JP11166895 A JP 11166895A JP 3468484 B2 JP3468484 B2 JP 3468484B2
Authority
JP
Japan
Prior art keywords
thin film
solar cell
semiconductor thin
gas
chalcopyrite semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP11166895A
Other languages
Japanese (ja)
Other versions
JPH08306945A (en
Inventor
幹彦 西谷
隆博 和田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Panasonic Holdings Corp
Original Assignee
Panasonic Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp, Matsushita Electric Industrial Co Ltd filed Critical Panasonic Corp
Priority to JP11166895A priority Critical patent/JP3468484B2/en
Publication of JPH08306945A publication Critical patent/JPH08306945A/en
Application granted granted Critical
Publication of JP3468484B2 publication Critical patent/JP3468484B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/541CuInSe2 material PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Drying Of Semiconductors (AREA)
  • Photovoltaic Devices (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、カルコパイライト半導
体薄膜太陽電池の製造方法及びそれに用いる半導体薄膜
処理装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a chalcopyrite semiconductor thin film solar cell and a semiconductor thin film processing apparatus used therein.

【0002】[0002]

【従来の技術】CuInSe2やCuInS2薄膜を用い
た太陽電池(以下CIS系太陽電池と呼ぶ)の製造にお
いて、図5に示すように、電極2を形成した基板1上に
作製した過剰のCuInSe2やCuInS2薄膜3を、
処理容器54内のKCN(シアン化カリ)溶液55で処
理した後、接合を形成することにより10%以上の変換
効率を得ることがR.Sheerらによって報告されて
いる(Proc. of 12th ECPVSEC, Amsterdam, (1994)P175
1〜)。これは、Cu過剰のCuInSe2やCuInS
2薄膜ではCuSeやCuSの異相を含んでいるが、K
CN溶液処理でその異相を取り除くことができ、比較的
結晶性がよく高いホール濃度をもつ薄膜が得られるから
である。CdSとのヘテロ接合を用いたいずれのセルも
CuInSe2やCuInS2のバンドギャップから期待
される開放端電圧(Voc:open circuit voltage)に比べ
まだ改善の余地があることを著者らは指摘している。そ
のためには、1)接合部のバンドオフセットをCdZn
Sなどを用いてより小さくすること、2)接合を吸収層
側にシフトさせる工夫が必要であると述べている。
2. Description of the Related Art In manufacturing a solar cell using CuInSe 2 or CuInS 2 thin film (hereinafter referred to as a CIS solar cell), as shown in FIG. 5, excess CuInSe formed on a substrate 1 on which an electrode 2 is formed is used. 2 or CuInS 2 thin film 3,
After processing with the KCN (potassium cyanide) solution 55 in the processing container 54, it is possible to obtain a conversion efficiency of 10% or more by forming a bond. Reported by Sheer et al. (Proc. Of 12th ECPVSEC, Amsterdam, (1994) P175
1 ~). This is CuInSe 2 and CuInS with excess Cu.
2 The thin film contains CuSe and CuS heterogeneous phase, but K
This is because the heterogeneous phase can be removed by the CN solution treatment, and a thin film having relatively high crystallinity and a high hole concentration can be obtained. The authors point out that any cell using a heterojunction with CdS still has room for improvement compared to the open circuit voltage (Voc: open circuit voltage) expected from the band gap of CuInSe 2 or CuInS 2 . There is. To do so, 1) adjust the band offset of the junction to CdZn.
It is stated that it should be made smaller by using S or the like, and 2) it is necessary to devise to shift the junction to the absorption layer side.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、従来の
製造方法は、大量にKCN溶液を含んだ液体を用いるの
で、その有害な液体の廃液処理設備を必要とし、製造コ
ストを高くする要因となる。KCN溶液処理の本来の目
的は、Cu過剰のCuInSe2やCuInS2薄膜に存
在しているCuSeやCuSの異相を選択的に取り除く
ことである。従って、この処理と同等な効果をもち、か
つドライプロセスを確立できる太陽電池の製造プロセス
が望まれる。
However, since the conventional manufacturing method uses a liquid containing a large amount of KCN solution, it requires a waste liquid treatment facility for the harmful liquid, which is a factor of increasing the manufacturing cost. The original purpose of the KCN solution treatment is to selectively remove the different phases of CuSe and CuS existing in the Cu-excessive CuInSe 2 and CuInS 2 thin films. Therefore, a solar cell manufacturing process that has the same effect as this treatment and that can establish a dry process is desired.

【0004】本発明は、前記従来の課題を解決するた
め、KCN溶液を用いず安全に、かつ低コストでカルコ
パイライト半導体薄膜太陽電池を提供することを目的と
する。
In order to solve the above-mentioned conventional problems, it is an object of the present invention to provide a chalcopyrite semiconductor thin film solar cell safely and at low cost without using a KCN solution.

【0005】[0005]

【課題を解決するための手段】前記目的を達成するた
め、本発明の太陽電池の製造方法は、絶縁性基板上に下
部電極を形成し、I族元素が過剰なI−III−VI
型カルコパイライト半導体薄膜を形成し、ハロゲン元素
を含むガスに前記薄膜を暴露することによって前記薄膜
中の異相を取り除き、前記カルコパイライト半導体薄膜
上に接合形成のための窓層を形成し、透光性の上部電極
を形成する工程を含み、ハロゲン元素を含むガスがガス
プラズマまたはラジカル化したガスである。ここでI族
元素が過剰とは、化学量論的に理想的な組成比であるI
族元素:III族元素:VI族元素=25:25:50
に対し、I族元素のみが理想値を越えている状態、例え
ばI族元素が30原子%を占める場合をいう。
In order to achieve the above object, a method of manufacturing a solar cell according to the present invention comprises a lower electrode formed on an insulating substrate, and a group I element in excess I-III-VI 2
-Type chalcopyrite semiconductor thin film is formed, and the thin film is formed by exposing the thin film to a gas containing a halogen element.
The step of removing the heterogeneous phase therein , forming a window layer for forming a junction on the chalcopyrite semiconductor thin film, and forming a translucent upper electrode, the gas containing a halogen element is a gas.
It is a plasma or radicalized gas. Excessive group I element means a stoichiometrically ideal composition ratio I
Group element: Group III element: Group VI element = 25:25:50
On the other hand, it means a state in which only the group I element exceeds the ideal value, for example, the group I element occupies 30 atom%.

【0006】前記構成においては、ハロゲン元素を含む
ガスがCl2、Br2、HCl、HBr、HI、及びBC
3から選ばれる少なくとも1種であることが好まし
い。また前記構成においては、薄膜をハロゲン元素を含
むガスに暴露するとき、基板を150〜200℃に加熱
することが好ましい。
In the above structure, the gas containing the halogen element is Cl 2 , Br 2 , HCl, HBr, HI, and BC.
It is preferably at least one selected from l 3 . Further, in the above structure, it is preferable to heat the substrate to 150 to 200 ° C. when exposing the thin film to a gas containing a halogen element.

【0007】[0007]

【0008】また前記構成においては、I族元素がCu
であることが好ましい。また前記構成においては、II
I族元素がIn及びGaのうちの少なくとも1つである
ことが好ましい。
In the above structure, the group I element is Cu.
Is preferred. In the above configuration, II
The Group I element is preferably at least one of In and Ga.

【0009】また前記構成においては、VI族元素が
S、Se及びTeのうちの少なくとも一つであることが
好ましい。次に本発明のカルコパイライト半導体薄膜処
理装置は、ガス排気口を有し、内部にガス噴出口と基板
を保持するための基板ホルダーとを備えた処理容器と、
前記容器内にガスを供給するためのガス供給手段と、ガ
スの供給量を制御するためのガス流量制御手段とを備え
たものである。
Further, in the above structure, the group VI element is preferably at least one of S, Se and Te. Next, the chalcopyrite semiconductor thin film processing apparatus of the present invention has a gas exhaust port, and a processing container having a gas outlet and a substrate holder for holding a substrate therein,
A gas supply unit for supplying gas into the container and a gas flow rate control unit for controlling the gas supply amount are provided.

【0010】前記構成においては、基板ホルダーを加熱
するための加熱手段を有することが好ましい。また前記
構成においては、基板ホルダーに相対して設けられたプ
レートと、前記プレートに電気的に接続された高周波電
源とを備えることが好ましい。
In the above structure, it is preferable to have a heating means for heating the substrate holder. Further, in the above configuration, it is preferable that a plate provided opposite to the substrate holder and a high frequency power source electrically connected to the plate are provided.

【0011】また前記構成においては、基板ホルダーに
相対して設けられた紫外線照射装置を備えることが好ま
しい。
Further, in the above structure, it is preferable that an ultraviolet irradiation device is provided so as to face the substrate holder.

【0012】[0012]

【作用】前記本発明の製造方法によれば、絶縁性基板上
に下部電極を形成し、I族元素が過剰なI−III−V
2型カルコパイライト半導体薄膜を形成し、ハロゲン
元素を含むガス、特にCl2、Br2、HCl、HBr、
HI、及びBCl3から選ばれる少なくとも1種を前記
薄膜を暴露し、前記カルコパイライト半導体薄膜上に接
合形成のための窓層を形成し、透光性の上部電極を形成
することにより、有害な溶液を用いずにCuSeやCu
S等の異相を効率的に取り除くことができ、カルコパイ
ライト半導体薄膜太陽電池を効率よく合理的に製造する
ことができる。また薄膜をハロゲン元素を含むガスに暴
露するとき、基板を150〜200℃に加熱するという
本発明の好ましい例によれば、優れた太陽電池特性が得
られる。またハロゲン元素を含むガスがガスプラズマで
ある、またはラジカル化しているという本発明の好まし
い例によれば、ハロゲン元素の反応性が高められる。ま
たI族元素がCu、III族元素がIn及びGaのうち
の少なくとも1つ、またはVI族元素がS、Se及びT
eのうちの少なくとも一つであるという本発明の好まし
い例によれば、結晶性に優れた太陽電池を製造できる。
According to the above-described manufacturing method of the present invention, the lower electrode is formed on the insulating substrate, and the I-III-V group I element is excessive.
An I 2 -type chalcopyrite semiconductor thin film is formed and a gas containing a halogen element, particularly Cl 2 , Br 2 , HCl, HBr,
By exposing the thin film to at least one selected from HI and BCl 3 , forming a window layer for forming a junction on the chalcopyrite semiconductor thin film, and forming a translucent upper electrode, harmful CuSe and Cu without using a solution
Heterogeneous phases such as S can be efficiently removed, and a chalcopyrite semiconductor thin film solar cell can be efficiently and rationally manufactured. Further, according to the preferable example of the present invention in which the substrate is heated to 150 to 200 ° C. when the thin film is exposed to the gas containing the halogen element, excellent solar cell characteristics can be obtained. Further, according to the preferable example of the present invention in which the gas containing the halogen element is gas plasma or is radicalized, the reactivity of the halogen element is enhanced. Further, the group I element is Cu, the group III element is at least one of In and Ga, or the group VI element is S, Se and T.
According to the preferable example of the present invention, which is at least one of e, a solar cell having excellent crystallinity can be manufactured.

【0013】次に前記本発明のカルコパイライト半導体
薄膜処理装置によれば、ガス排気口を有し、内部にガス
噴出口と基板を保持するための基板ホルダーとを備えた
処理容器と、前記処理容器内にガスを供給するためのガ
ス供給手段と、ガスの供給量を制御するためのガス流量
制御手段とを備えたことにより、本発明の製造方法に適
した処理装置を実現できる。また基板ホルダーを加熱す
るための加熱手段を有するという本発明の好ましい例に
よれば、基板を150〜200℃に加熱した状態で処理
することができる。また基板ホルダーに相対して設けら
れたプレートと、前記プレートに電気的に接続された高
周波電源とを備えるという本発明の好ましい例によれ
ば、ハロゲンガスをプラズマ化することができる。また
基板ホルダーに相対して設けられた紫外線照射装置を備
えるという本発明の好ましい例によれば、ハロゲンガス
を紫外線によりラジカル化することができる。
Next, according to the chalcopyrite semiconductor thin film processing apparatus of the present invention, a processing container having a gas exhaust port, having a gas ejection port and a substrate holder for holding a substrate therein, and the above processing are provided. By providing the gas supply unit for supplying the gas into the container and the gas flow rate control unit for controlling the supply amount of the gas, it is possible to realize the processing apparatus suitable for the manufacturing method of the present invention. Further, according to a preferred example of the present invention in which a heating means for heating the substrate holder is provided, the substrate can be processed while being heated to 150 to 200 ° C. Further, according to the preferable example of the present invention in which the plate provided opposite to the substrate holder and the high frequency power source electrically connected to the plate are provided, halogen gas can be turned into plasma. Further, according to a preferred example of the present invention in which an ultraviolet irradiation device is provided opposite to the substrate holder, the halogen gas can be radicalized by ultraviolet rays.

【0014】[0014]

【実施例】【Example】

(実施例1)図1に本実施例の装置を示す。本装置のサ
イズは、基板の大きさに応じて変化するが、10×10
cmほどの基板を処理する場合には通常、直径200mm
×高さ200mmほどの容器に各制御系が付随した大きさ
となる。本プロセスは、図4(a)に示したようにガラ
ス基板1上に下部電極2としてMoをスパッタリングに
よって形成し、Cu過剰のCuInS2薄膜3(Cu:
30原子%、In:23原子%、S:47原子%)を多
元蒸着法で形成したあとに用いるプロセスである。図4
の各層の厚さは、ガラス基板1:約1mm、下部電極
2:約1μm、CuInS2薄膜3:約2.5μmであ
る。各層の厚さの好ましい範囲は、基板1:0.5〜2
mm程度、下部電極2:1μm程度、半導体薄膜3:2
〜3μm程度である。すでに述べたようにCu過剰のC
uInS2薄膜には、CuSなどの異相が存在するため
に電気的には低抵抗な膜(10〜100Ω-1cm-1)で
ある。そのようなCu過剰なCuInS2薄膜が形成さ
れた基板を図1に示した基板ホルダー7に設置し、ガス
供給源11よりガス流量制御装置10及びガス噴出口9
を経てBCl3ガスを容器内6に導入することによって
ガスに暴露した。この際、容器内は100〜700To
rrのやや減圧状態に保持され、ガスの流量は約50s
ccmである。この状態で30分間CuInS2薄膜を
処理すると電気的にはやや高抵抗な膜(0.01〜0.
001Ω-1cm-1)が得られる。この現象は、CuIn
2薄膜と混在しているCuSがこの処理によって取り
除かれたことを示している。処理時間は30〜60分で
あった。さらに、基板加熱ヒーター8によって基板ホル
ダー7を150〜200℃に保って同様な処理を行う
と、処理時間は5分程度に短縮された。ただし、200
℃より高い温度で処理を行うとCuInS2薄膜自身の
組成が変化してしまい好ましくない。以上に述べたプロ
セスのあと従来と同様に図4(b)に示したようにCd
Sの窓層4を蒸着法で約0.1μm程度の厚さで形成
し、透明導電膜5としてITOをスパッタリングで厚さ
0.5μm程度の厚さで形成して太陽電池を完成した。
窓層4及び透明導電膜5の好ましい厚さの範囲はそれぞ
れ0.05〜0.1μm、0.2〜1μm程度である。
本実施例のCuInS2薄膜太陽電池は、変換効率とし
て10%を示し、従来プロセスのKCN処理と遜色はな
かった。
(Embodiment 1) FIG. 1 shows an apparatus of this embodiment. The size of this device varies depending on the size of the substrate, but it is 10 x 10
When processing a substrate of about cm, the diameter is usually 200 mm
× The size is about 200 mm high with each control system attached to the container. In this process, as shown in FIG. 4A, Mo is formed as the lower electrode 2 on the glass substrate 1 by sputtering, and Cu-excessive CuInS 2 thin film 3 (Cu:
30 at%, In: 23 at%, S: 47 at%) is used after being formed by the multi-source vapor deposition method. Figure 4
The thickness of each layer is: glass substrate 1: about 1 mm, lower electrode 2: about 1 μm, CuInS 2 thin film 3: about 2.5 μm. The preferable range of the thickness of each layer is as follows: Substrate 1: 0.5-2
mm, lower electrode 2: 1 μm, semiconductor thin film 3: 2
It is about 3 μm. As mentioned above, Cu-rich C
The uInS 2 thin film is a film (10 to 100 Ω −1 cm −1 ) having a low electrical resistance due to the presence of a different phase such as CuS. A substrate on which such a Cu-excessive CuInS 2 thin film is formed is installed in the substrate holder 7 shown in FIG. 1, and the gas flow source 11 and the gas flow controller 10 and the gas ejection port 9
Was exposed to the gas by introducing BCl 3 gas into the vessel 6 via At this time, the inside of the container is 100 to 700 To
It is maintained at a slightly reduced pressure of rr and the gas flow rate is about 50 s.
It is ccm. When the CuInS 2 thin film is treated for 30 minutes in this state, the film has a slightly high electrical resistance (0.01-0.
001 Ω −1 cm −1 ) is obtained. This phenomenon is caused by CuIn
It shows that CuS mixed with the S 2 thin film was removed by this treatment. The processing time was 30 to 60 minutes. Furthermore, when the substrate holder 7 was kept at 150 to 200 ° C. by the substrate heater 8 and the same treatment was performed, the treatment time was shortened to about 5 minutes. However, 200
If the treatment is performed at a temperature higher than ° C, the composition of the CuInS 2 thin film itself changes, which is not preferable. After the process described above, as in the conventional case, as shown in FIG.
The window layer 4 of S was formed by vapor deposition to a thickness of about 0.1 μm, and ITO was formed as the transparent conductive film 5 by sputtering to a thickness of about 0.5 μm to complete the solar cell.
Preferable thickness ranges of the window layer 4 and the transparent conductive film 5 are about 0.05 to 0.1 μm and 0.2 to 1 μm, respectively.
The CuInS 2 thin-film solar cell of this example exhibited a conversion efficiency of 10%, which was comparable to the KCN treatment of the conventional process.

【0015】本実施例によれば、Cu過剰なCuInS
2、CuInTe2やCu(In,Ga)(S,Se,
Te)の混晶系薄膜の太陽電池の製造においても有効で
あった。また、用いるハロゲンガスとしてBCl3以外
にCl2、Br2、HCl、HBr、HIが同様な作用が
あり、有効であった。
According to this embodiment, CuInS containing excess Cu is used.
e 2 , CuInTe 2 and Cu (In, Ga) (S, Se,
It was also effective in the production of a mixed crystal thin film solar cell of Te). Also, as the halogen gas used, Cl 2 , Br 2 , HCl, HBr, and HI were effective because they had the same action in addition to BCl 3 .

【0016】(実施例2)図2に本実施例の装置を示
す。本プロセスは、図4(a)に示したようにガラス基
板1上に下部電極2としてMoをスパッタリングによっ
て形成し、Cu過剰のCuInS2薄膜(Cu:30原
子%、In:23原子%、S:47原子%)を多元蒸着
法で形成したあとに用いるプロセスである。すでに述べ
たようにCu過剰のCuInS2薄膜には、CuSなど
の異相が存在するために電気的には低抵抗な膜(10〜
100Ω-1cm-1)である。そのようなCu過剰なCu
InS 2薄膜が形成された基板を図2に示した基板ホル
ダー7に設置し、ガス供給源11よりガス流量制御装置
10及びガス噴出口9を経てBCl3ガスを容器内6に
導入することによってガスに暴露した。この際、容器内
の真空度は1Torr程度である。高周波電源13はプ
レート15に電気的に接続されている。ガスは、13.
56MHzの高周波によって10W程度のプラズマ放電
状態にある。ガスの流量は約50sccmである。この
状態で5分間CuInS2薄膜を処理すると電気的には
やや高抵抗な膜(0.01〜0.001Ω-1cm-1)が
得られる。この現象は、CuInS2薄膜と混在してい
るCuSがこの処理によって取り除かれたことを示して
いる。以上に述べたプロセスのあと従来と同様に図4
(b)に示したようにCdSの窓層4を蒸着法で形成
し、透明導電膜5としてITOをスパッタリングで形成
して太陽電池を完成した。本実施例のCuInS2薄膜
太陽電池は、変換効率として10%を示し、従来プロセ
スのKCN処理と遜色はなかった。
(Embodiment 2) FIG. 2 shows an apparatus of this embodiment.
You This process is based on the glass-based method as shown in Fig. 4 (a).
Mo is sputtered on the plate 1 as the lower electrode 2.
Formed with Cu excess CuInS2Thin film (Cu: 30 original)
%, In: 23 atomic%, S: 47 atomic%)
This is the process used after forming by the method. Already mentioned
As shown in Cu2CuS, etc. for the thin film
Electrically low resistance film (10-
100Ω-1cm-1). Such Cu excess Cu
InS 2The substrate on which the thin film is formed is shown in FIG.
Installed on the dar 7, gas flow controller from the gas supply source 11
BCl through 10 and gas outlet 93Gas in container 6
Exposed to gas by introduction. At this time, in the container
The vacuum degree is about 1 Torr. The high frequency power supply 13 is
It is electrically connected to rate 15. The gas is 13.
Plasma discharge of about 10W by high frequency of 56MHz
Is in a state. The gas flow rate is about 50 sccm. this
CuInS for 5 minutes2Electrically when processing thin films
Highly resistant film (0.01-0.001Ω-1cm-1)But
can get. This phenomenon is caused by CuInS2Mixed with thin film
Showing that CuS was removed by this process
There is. After the process described above, as shown in FIG.
As shown in (b), the CdS window layer 4 is formed by vapor deposition.
Then, ITO is formed by sputtering as the transparent conductive film 5.
Then the solar cell was completed. CuInS of this embodiment2Thin film
The solar cell shows a conversion efficiency of 10%,
It was as good as KCN treatment of Su.

【0017】本実施例によれば、Cu過剰なCuInS
2、CuInTe2やCu(In,Ga)(S,Se,
Te)の混晶系薄膜の太陽電池においても有効であっ
た。また、用いるハロゲンガスとしてBCl3以外にC
2、Br2、HCl、HBr、HIが同様な作用があ
り、有効であった。
According to this embodiment, CuInS containing excess Cu is used.
e 2 , CuInTe 2 and Cu (In, Ga) (S, Se,
It was also effective for a mixed crystal thin film solar cell of Te). In addition to BCl 3 , the halogen gas used is C
l 2 , Br 2 , HCl, HBr, and HI had similar effects and were effective.

【0018】(実施例3)図3に本実施例の装置を示
す。本プロセスは、図4(a)に示したようにガラス基
板1上に下部電極2としてMoをスパッタリングによっ
て形成し、Cu過剰のCuInS2薄膜(Cu:30原
子%、In:23原子%、S:47原子%)を多元蒸着
法で形成したあとに用いるプロセスである。すでに述べ
たようにCu過剰のCuInS2薄膜には、CuSなど
の異相が存在するために電気的には低抵抗な膜(10〜
100Ω-1cm-1)である。そのようなCu過剰なCu
InS 2薄膜が形成された基板を図3に示した基板ホル
ダー7に設置し、BCl3ガスをガス供給源11よりガ
ス流量制御装置10及びガス噴出口9を経て容器内6に
導入することによって暴露した。この際、容器内の真空
度は100〜700Torrのやや減圧状態に保持さ
れ、ハロゲンガスは、100W程度の紫外線ランプ(重
水素ランプ)14によってラジカル状態にある。ガスの
流量は約50sccmである。この状態で5分間CuI
nS2薄膜を処理すると電気的にはやや高抵抗な膜
(0.01〜0.001Ω-1cm-1)が得られる。この
現象は、CuInS 2薄膜と混在しているCuSがこの
処理によって取り除かれたことを示している。以上に述
べたプロセスのあと従来と同様に図4(b)に示したよ
うにCdSの窓層4を蒸着法で形成し、透明導電膜5と
してITOをスパッタリングで形成して太陽電池を完成
した。本実施例のCuInS2薄膜太陽電池は、変換効
率として10%を示し、従来プロセスのKCN処理と遜
色はなかった。
(Embodiment 3) FIG. 3 shows an apparatus of this embodiment.
You This process is based on the glass-based method as shown in Fig. 4 (a).
Mo is sputtered on the plate 1 as the lower electrode 2.
Formed with Cu excess CuInS2Thin film (Cu: 30 original)
%, In: 23 atomic%, S: 47 atomic%)
This is the process used after forming by the method. Already mentioned
As shown in Cu2CuS, etc. for the thin film
Electrically low resistance film (10-
100Ω-1cm-1). Such Cu excess Cu
InS 2The substrate on which the thin film is formed is shown in FIG.
Installed on Dar 7, BCl3Gas is supplied from the gas supply source 11.
Through the flow rate control device 10 and the gas ejection port 9 into the container 6
Exposed by introducing. At this time, the vacuum in the container
The pressure is maintained at a slightly reduced pressure of 100 to 700 Torr.
Halogen gas is emitted from an ultraviolet lamp (heavy
It is in a radical state by the hydrogen lamp) 14. Of gas
The flow rate is about 50 sccm. CuI for 5 minutes in this state
nS2A film with slightly higher electrical resistance when processed with a thin film
(0.01-0.001Ω-1cm-1) Is obtained. this
The phenomenon is CuInS 2CuS mixed with thin film is
It has been removed by the process. Described above
After the solid process, it is shown in Fig. 4 (b) as before.
Window layer 4 of CdS is formed by a vapor deposition method to form a transparent conductive film 5.
Then, ITO is formed by sputtering to complete the solar cell.
did. CuInS of this embodiment2Thin-film solar cells have a conversion effect
The rate is 10%, which is comparable to conventional KCN treatment.
There was no color.

【0019】本実施例によれば、Cu過剰なCuInS
2、CuInTe2やCu(In,Ga)(S,Se,
Te)の混晶系薄膜の太陽電池においても有効であっ
た。また、用いるハロゲン元素を含むガスとしてBCl
3以外にCl2、Br2、HCl、HBr、HIが同様な
作用があり、有効であった。
According to this embodiment, Cu-rich CuInS
e 2 , CuInTe 2 and Cu (In, Ga) (S, Se,
It was also effective for a mixed crystal thin film solar cell of Te). Further, as a gas containing a halogen element to be used, BCl
In addition to 3 , Cl 2 , Br 2 , HCl, HBr, and HI had similar effects and were effective.

【0020】[0020]

【発明の効果】以上説明した通り、本発明の製造方法に
よれば、絶縁性基板上に下部電極を形成し、I族元素が
過剰なI−III−VI2型カルコパイライト半導体薄
膜を形成し、ハロゲン元素を含むガス、特にCl2、B
2、HCl、HBr、HI、及びBCl3から選ばれる
少なくとも1種を前記薄膜を暴露し、前記カルコパイラ
イト半導体薄膜上に接合形成のための窓層を形成し、透
光性の上部電極を形成することにより、有害な溶液を用
いずにCuSeやCuS等の異相を効率的に取り除くこ
とができ、カルコパイライト半導体薄膜太陽電池を効率
よく合理的に製造することができる。
As described above, according to the manufacturing method of the present invention, the lower electrode is formed on the insulating substrate to form the I-III-VI 2 type chalcopyrite semiconductor thin film having an excessive amount of the group I element. , A gas containing a halogen element, especially Cl 2 , B
At least one selected from r 2 , HCl, HBr, HI, and BCl 3 is exposed to the thin film, a window layer for forming a junction is formed on the chalcopyrite semiconductor thin film, and a transparent upper electrode is formed. By forming, a hetero phase such as CuSe or CuS can be efficiently removed without using a harmful solution, and a chalcopyrite semiconductor thin film solar cell can be efficiently and rationally manufactured.

【0021】次に前記本発明のカルコパイライト半導体
薄膜処理装置によれば、ガス排気口を有し、内部にガス
噴出口と基板を保持するための基板ホルダーとを備えた
処理容器と、前記処理容器内にガスを供給するためのガ
ス供給手段と、ガスの供給量を制御するためのガス流量
制御手段とを備えたことにより、本発明の製造方法に適
した処理装置を提供できる。
Next, according to the chalcopyrite semiconductor thin film processing apparatus of the present invention, a processing container having a gas exhaust port, having a gas ejection port and a substrate holder for holding a substrate therein, and the above processing are provided. By providing the gas supply means for supplying the gas into the container and the gas flow rate control means for controlling the supply amount of the gas, it is possible to provide the processing apparatus suitable for the manufacturing method of the present invention.

【0022】従って、本発明によってI族元素が過剰な
I−III−VI2型カルコパイライト半導体薄膜の表
面や結晶粒界に存在するI族元素のカルコゲナイド化物
をハロゲン元素を含んだガス中に暴露することによって
除去することが可能となりプロセスのドライプロセス化
が実現できる。
Therefore, according to the present invention, the chalcogenide compound of the group I element existing on the surface of the I-III-VI 2 type chalcopyrite semiconductor thin film and the crystal grain boundary in which the group I element is excessive is exposed to a gas containing a halogen element. By doing so, it becomes possible to remove it, and a dry process can be realized.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の実施例1のカルコパイライト薄膜の
処理装置の構成を示す概略図
FIG. 1 is a schematic diagram showing the configuration of a chalcopyrite thin film processing apparatus according to a first embodiment of the present invention.

【図2】 本発明の実施例2のカルコパイライト薄膜の
処理装置の構成を示す概略図
FIG. 2 is a schematic diagram showing the configuration of a chalcopyrite thin film processing apparatus according to a second embodiment of the present invention.

【図3】 本発明の実施例3のカルコパイライト薄膜の
処理装置の構成を示す概略図
FIG. 3 is a schematic diagram showing a configuration of a chalcopyrite thin film processing apparatus according to a third embodiment of the present invention.

【図4】 (a)は本発明の一実施例の処理前の半導体
薄膜の断面図、(b)は処理後の半導体薄膜の断面図
4A is a cross-sectional view of a semiconductor thin film before processing according to an embodiment of the present invention, and FIG. 4B is a cross-sectional view of a semiconductor thin film after processing.

【図5】 従来のI−III−VI2型カルコパイライ
ト薄膜の処理法を示した概略断面図
FIG. 5 is a schematic cross-sectional view showing a conventional method for treating a I-III-VI 2 type chalcopyrite thin film.

【符号の説明】[Explanation of symbols]

1 絶縁性基板 2 下部電極 3 I−III−VI2型カルコパイライト半導体薄膜 4 窓層 5 透光性上部電極 6 半導体薄膜処理容器 7 基板ホルダー 8 基板加熱ヒーター 9 ガス噴出口 10 ガス流量制御装置 11 ガス供給装置 12 ガス排出口 13 高周波電源 14 紫外線ランプ 15 プレート 54 容器 55 KCN溶液1 Insulating Substrate 2 Lower Electrode 3 I-III-VI 2 Type Chalcopyrite Semiconductor Thin Film 4 Window Layer 5 Translucent Upper Electrode 6 Semiconductor Thin Film Processing Container 7 Substrate Holder 8 Substrate Heater 9 Gas Jet 10 Gas Flow Control Device 11 Gas supply device 12 Gas outlet 13 High frequency power supply 14 Ultraviolet lamp 15 Plate 54 Container 55 KCN solution

Claims (6)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 絶縁性基板上に下部電極を形成し、I族
元素が過剰なI−III−VI型カルコパイライト半
導体薄膜を形成し、ハロゲン元素を含むガスに前記薄膜
を暴露することによって前記薄膜中の異相を取り除き
前記カルコパイライト半導体薄膜上に接合形成のための
窓層を形成し、透光性の上部電極を形成する工程を含
み、ハロゲン元素を含むガスがガスプラズマまたはラジ
カル化したガスであるカルコパイライト半導体薄膜太陽
電池の製造方法。
1. A lower electrode is formed on an insulative substrate, a I-III-VI 2 type chalcopyrite semiconductor thin film having an excess of a group I element is formed, and the thin film is exposed to a gas containing a halogen element . Removing the foreign phase in the thin film ,
A step of forming a window layer for forming a junction on the chalcopyrite semiconductor thin film and forming a translucent upper electrode is included.
If the gas containing halogen element is gas plasma or
A method for producing a chalcopyrite semiconductor thin film solar cell which is a gas that has been calcified.
【請求項2】 ハロゲン元素を含むガスがCl、Br
、HCl、HBr、HI、及びBClから選ばれる
少なくとも1種である請求項1に記載のカルコパイライ
ト半導体薄膜太陽電池の製造方法。
2. The gas containing a halogen element is Cl 2 or Br.
The method for producing a chalcopyrite semiconductor thin film solar cell according to claim 1, wherein the method is at least one selected from 2 , HCl, HBr, HI, and BCl 3 .
【請求項3】 薄膜をハロゲン元素を含むガスに暴露す
るとき、基板を150〜200℃に加熱する請求項1ま
たは2に記載のカルコパイライト半導体薄膜太陽電池の
製造方法。
3. The method for producing a chalcopyrite semiconductor thin film solar cell according to claim 1, wherein the substrate is heated to 150 to 200 ° C. when the thin film is exposed to a gas containing a halogen element.
【請求項4】 I族元素がCuである請求項1に記載の
カルコパイライト半導体薄膜太陽電池の製造方法。
4. The method for producing a chalcopyrite semiconductor thin film solar cell according to claim 1, wherein the Group I element is Cu.
【請求項5】 III族元素がIn及びGaのうちの少
なくとも1つである請求項1に記載のカルコパイライト
半導体薄膜太陽電池の製造方法。
5. The method for producing a chalcopyrite semiconductor thin film solar cell according to claim 1, wherein the Group III element is at least one of In and Ga.
【請求項6】 VI族元素がS、Se及びTeのうちの
少なくとも一つである請求項1に記載のカルコパイライ
ト半導体薄膜太陽電池の製造方法。
6. The method for producing a chalcopyrite semiconductor thin film solar cell according to claim 1, wherein the Group VI element is at least one of S, Se and Te.
JP11166895A 1995-05-10 1995-05-10 Method for producing chalcopyrite semiconductor thin film solar cell Expired - Fee Related JP3468484B2 (en)

Priority Applications (1)

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JP3468484B2 true JP3468484B2 (en) 2003-11-17

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Country Link
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