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JP3496903B2 - Method for manufacturing light receiving member - Google Patents
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JP3496903B2 - Method for manufacturing light receiving member - Google Patents

Method for manufacturing light receiving member

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Publication number
JP3496903B2
JP3496903B2 JP05105796A JP5105796A JP3496903B2 JP 3496903 B2 JP3496903 B2 JP 3496903B2 JP 05105796 A JP05105796 A JP 05105796A JP 5105796 A JP5105796 A JP 5105796A JP 3496903 B2 JP3496903 B2 JP 3496903B2
Authority
JP
Japan
Prior art keywords
support
container
vacuum
gas
cylindrical support
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP05105796A
Other languages
Japanese (ja)
Other versions
JPH09223674A (en
Inventor
好雄 瀬木
宏之 片桐
寿康 白砂
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP05105796A priority Critical patent/JP3496903B2/en
Publication of JPH09223674A publication Critical patent/JPH09223674A/en
Application granted granted Critical
Publication of JP3496903B2 publication Critical patent/JP3496903B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Photoreceptors In Electrophotography (AREA)
  • Chemical Vapour Deposition (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、プラズマCVD法
により、支持体上に機能性堆積膜、特に電子写真用感光
体、光起電力デバイス、画像入力用ラインセンサー、撮
像デバイス、TFT等の半導体素子として好適に利用で
きる、結晶質、または非単結晶質半導体を連続的に形成
する改良された堆積膜形成方法に関するものである。特
に、電子写真感光体のような大面積の光受容部材を連続
的に製造する方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a functional deposited film on a support, particularly an electrophotographic photosensitive member, a photovoltaic device, an image input line sensor, an imaging device, a semiconductor such as a TFT, etc., by a plasma CVD method. can be suitably used as a device, crystalline, or those related to the non-single-crystalline semiconductor improved deposited film forming how to continuously form. In particular, about the way of continuously producing a light-receiving member having a large area, such as the electrophotographic photosensitive member.

【0002】[0002]

【従来の技術】従来、半導体デバイス、電子写真用感光
体、画像入力用ラインセンサー、撮像デバイス、光起電
力デバイス、その他各種エレクトロニクス素子、光学素
子等に用いる素子部材として、アモルファスシリコン、
例えば水素または/及びハロゲン(例えばフッ素、塩素
等)で補償されたアモルファスシリコン[以下、A−S
i(H,X)と略記する]のような非単結晶質の堆積膜
またはダイヤモンド薄膜のような結晶質の堆積膜が提案
され、その中のいくつかは実用に付されている。そし
て、こうした堆積膜は、プラズマCVD法、すなわち、
原料ガスを直流または高周波、あるいはマイクロ波によ
るグロー放電によって分解し、ガラス、石英、耐熱性合
成樹脂フイルム、ステンレス、アルミニウムなどの支持
体上に堆積膜を形成する方法により形成され、そのため
の装置も各種提案されている。
2. Description of the Related Art Conventionally, amorphous silicon has been used as an element member for semiconductor devices, electrophotographic photoconductors, image input line sensors, image pickup devices, photovoltaic devices, other various electronic elements, optical elements, etc.
For example, amorphous silicon compensated with hydrogen or / and halogen (eg, fluorine, chlorine, etc.) [hereinafter referred to as AS
abbreviated as i (H, X)] or a crystalline deposited film such as a diamond thin film, some of which have been put to practical use. Then, such a deposited film is formed by the plasma CVD method, that is,
The raw material gas is decomposed by glow discharge by direct current, high frequency, or microwave to form a deposited film on a support such as glass, quartz, heat-resistant synthetic resin film, stainless steel, or aluminum. Various proposals have been made.

【0003】例えば、図1は高周波プラズマCVD法
(以後「PCVD」と略記する)による電子写真用感光
体の連続生産装置の一例を示す模式的な構成図である。
図1に示す生産装置の構成は以下の通りである。この装
置は大別すると、支持体投入容器(2100)、支持体
加熱装置(2200)、反応装置(2300)、支持体
冷却及び排出装置(2400)、これらの容器間で移動
可能な搬送専用の装置(2900)から構成されてい
る。各装置の真空容器(2101、2201、2301
a〜c、2401、2901)には容器内を真空にする
為の排気手段(2501〜2507)、排気バルブ(2
601〜2607)、各真空容器は接続可能な開閉ゲー
ト(2801〜2807)が設置されている。また、支
持体投入容器(2101)は、容器内を大気に戻す為の
リークバルブ(2701)が設けられている。支持体加
熱容器(2201)には、加熱時に使用するガスを流入
させる為の補助バルブ(2702)があり、支持体冷却
及び排出容器(2401)は、容器内を大気に戻す為の
リークバルブ(2705)が設けられている。反応容器
(2301a〜c)は、反応ガス流出バルブ(2703
a〜c、2704)高周波マッチングボックス(図示せ
ず)が接続されている。搬送専用の真空容器には、容器
内を真空にする為の排気バルブ(2607)、ゲート間
を真空にする為の排気バルブ(2608)、ゲート間を
大気に戻す為のリークバルブ(2706)、支持体チャ
ッキング(2905)、移動用レール(2952)が設
けられている。支持体投入容器(2201)、加熱容器
(2201)、反応容器(2301a〜c)、冷却及び
取り出し容器(2401)の数は、それぞれの処理時間
により無駄の無いようにその数の組み合わせが選択され
る。また、搬送専用の真空容器(2901)は、同時に
複数の支持体を移送出来るように複数個でも可能で、搬
送装置(2900)は直線移動方式、円周方向の移動で
も可能である。
For example, FIG. 1 is a schematic configuration diagram showing an example of a continuous production apparatus for electrophotographic photoreceptors by a high frequency plasma CVD method (hereinafter abbreviated as "PCVD").
The structure of the production apparatus shown in FIG. 1 is as follows. This device is roughly classified into a support charging container (2100), a support heating device (2200), a reaction device (2300), a support cooling and discharging device (2400), and a transfer-only container movable between these containers. The device (2900). Vacuum container (2101, 2201, 2301) of each device
a to c, 2401, 2901), exhaust means (2501 to 2507) for making the inside of the container a vacuum, exhaust valve (2
601-2607), each vacuum container is provided with an openable / closable gate (2801-2807) which can be connected. Further, the support feeding container (2101) is provided with a leak valve (2701) for returning the inside of the container to the atmosphere. The support heating container (2201) has an auxiliary valve (2702) for introducing a gas used for heating, and the support cooling and discharge container (2401) has a leak valve (for returning the inside of the container to the atmosphere). 2705) is provided. The reaction vessel (2301a-c) is provided with a reaction gas outflow valve (2703).
a to c, 2704) A high frequency matching box (not shown) is connected. The transfer-dedicated vacuum container includes an exhaust valve (2607) for creating a vacuum inside the container, an exhaust valve (2608) for creating a vacuum between the gates, and a leak valve (2706) for returning the space between the gates to the atmosphere. A support chucking (2905) and a moving rail (2952) are provided. The number of the support charging container (2201), the heating container (2201), the reaction containers (2301a to c), and the cooling and taking out container (2401) are selected so that there is no waste depending on the processing time. It Further, a plurality of vacuum containers (2901) dedicated to transfer can be provided so that a plurality of supports can be transferred at the same time, and the transfer device (2900) can be moved linearly or in a circumferential direction.

【0004】こうした、連続生産装置は、例えば以下の
ように行われる。支持体投入容器(2101)に支持体
を投入し容器内を徐々に大気圧から所定の真空度になる
まで排気する。所定の真空度に到達したら、搬送専用の
真空容器(2901)を用い、真空の支持体加熱容器
(2201)に移送し、加熱用ガスを補助バルブ(27
02)から所定の圧力になる様に流し、容器内に設置さ
れているヒーター(図示せず)を用い、所定の温度に加
熱する。加熱された支持体は搬送専用の真空容器(29
01)を用い、真空の反応容器(2301a〜c)内へ
移送される。反応容器内で所定の手段により堆積膜を形
成し、その後、真空の冷却及び排出容器(2401)に
移送され、所定の温度になるまで冷却されたのち、リー
クバルブ(2705)からリーク用ガスを大気圧になる
まで流し、その後排出する。各真空容器(2101、2
201、2301a〜c、2401)と搬送専用の真空
容器(2901)間での支持体の受け渡しは、まず、搬
送装置(2900)が取り出す真空容器上に移動し、ゲ
ート(2807)を取り出す真空容器のゲート(280
1〜2806のいずれか)に接続させる。その後排気手
段(2507)、排気バルブ(2608)にてゲート間
を真空にする。尚、真空容器(2901)内が所定の真
空度で無い場合は、排気バルブ(2607)にて真空引
きを行なう。ゲート間が所定の真空度になったら、双方
のゲートを開し、支持体の受け渡しを行なう。受け渡し
終了後、双方のゲートは閉され、ゲート間リークバルブ
(2706)からリーク用ガスを流し、ゲート間を大気
圧にする。その後、搬送専用の真空容器(2901)の
ゲート(2807)は切り離され、搬送装置(290
0)は次工程へ移動する。尚、支持体の受け渡しはチャ
ッキング(2951)を用いて行われる。これらの工程
は全て自動制御によって行われる。
Such a continuous production apparatus is performed, for example, as follows. The support is put into the support feeding container (2101), and the inside of the container is gradually evacuated from atmospheric pressure to a predetermined vacuum degree. When a predetermined degree of vacuum is reached, a vacuum container (2901) dedicated to transportation is used to transfer to a vacuum support heating container (2201), and heating gas is supplied to the auxiliary valve (27).
It is made to flow from 02) so that it may become a predetermined pressure, and it heats to a predetermined temperature using the heater (not shown) installed in the container. The heated support is a vacuum container (29
01), and transferred into a vacuum reaction container (2301a-c). A deposited film is formed in the reaction container by a predetermined means, and then the film is transferred to a vacuum cooling and discharge container (2401) and cooled to a predetermined temperature, and then a leak gas is discharged from a leak valve (2705). Flow until atmospheric pressure, then discharge. Each vacuum container (2101, 2
201, 2301a to c, 2401) and the vacuum container (2901) dedicated to the transfer of the support, first, the transfer device (2900) moves to the vacuum container taken out and the gate (2807) takes out the vacuum container. Gate of (280
1 to 2806). After that, the space between the gates is evacuated by the exhaust means (2507) and the exhaust valve (2608). When the inside of the vacuum container (2901) does not have a predetermined degree of vacuum, the exhaust valve (2607) evacuates. When the degree of vacuum between the gates reaches a predetermined level, both gates are opened to transfer the support. After the delivery is completed, both gates are closed, and a leak gas (2706) between the gates is used to flow a leaking gas to bring the pressure between the gates to atmospheric pressure. After that, the gate (2807) of the vacuum container (2901) dedicated to the transfer is cut off, and the transfer device (290
0) moves to the next process. The transfer of the support is performed by using chucking (2951). All of these steps are performed by automatic control.

【0005】反応容器について図2の反応装置の模式的
な構成図を用いて更に詳細に説明すると、堆積装置(5
100)、原料ガスの供給装置(5200)、開閉ゲー
ト(5120)、反応容器(5111)内を減圧にする
ための排気装置(図示せず)から構成されている。堆積
装置(5100)中の反応容器(5111)内には円筒
状支持体(5112)、支持体加熱用ヒーター(511
3)、原料ガス導入管(5114)が設置され、更に高
周波マッチングボックス(5115)が接続されてい
る。原料ガス供給装置(5200)は、SiH4、Ge
H4、H2、CH4、B2H6、PH3、等の原料ガスのボン
ベ(5221〜5226)とバルブ(5231〜523
6、5241〜5246、5251〜5256)および
マスフローコントローラー(5211〜5216)から
構成され、各原料ガスのボンベはバルブ(5260)を
介して反応容器(5111)内のガス導入管(511
4)に接続されている。
The reaction vessel will be described in more detail with reference to the schematic configuration diagram of the reaction apparatus shown in FIG.
100), a source gas supply device (5200), an opening / closing gate (5120), and an exhaust device (not shown) for reducing the pressure inside the reaction vessel (5111). Inside the reaction vessel (5111) in the deposition apparatus (5100), a cylindrical support (5112) and a heater for heating the support (511)
3), the raw material gas introduction pipe (5114) is installed, and the high frequency matching box (5115) is connected. The source gas supply device (5200) is made of SiH4, Ge.
H4, H2, CH4, B2H6, PH3, etc. source gas cylinders (5221 to 5226) and valves (5231 to 523)
6, 5241 to 5246, 5251 to 5256) and a mass flow controller (5211 to 5216), and a cylinder of each source gas is a gas introduction pipe (511) in a reaction vessel (5111) via a valve (5260).
4) is connected.

【0006】こうした堆積膜形成装置を用いた堆積膜の
形成は、例えば以下のように行なわれる。まず、排気手
段(図示せず)により真空に排気された反応容器(51
11)内に所定の温度に加熱された円筒状支持体(51
12)を搬送専用の真空容器(図示せず)により開閉ゲ
ート(5120)を介して投入し、支持体加熱用ヒータ
ー(5113)により円筒状支持体(5112)の温度
を所定の温度に制御する。堆積膜形成用の原料ガスを反
応容器(5111)に流入させるには、ガスボンベのバ
ルブ(5231〜5236)、反応容器のリークバルブ
(5123)が閉じられていることを確認し、又、流入
バルブ(5241〜5246)、流出バルブ(5251
〜5256)、補助バルブ(5260)が開かれている
ことを確認して、まずメインバルブ(5118)を開い
て反応容器(5111)およびガス配管内(5116)
を排気する。次に真空計(5124)の読みが5×10
-6Torrになった時点で補助バルブ(5260)、流
出バルブ(5251〜5256)を閉じる。その後、ガ
スボンベ(5221〜5226)より各ガスをバルブ
(5231〜5236)を開いて導入し、圧力調整器
(5261〜5266)により各ガス圧を2kg/cm
2 に調整する。次に、流入バルブ(5241〜524
6)を徐々に開けて、各ガスをマスフローコントローラ
ー(5211〜5216)内に導入する。
Formation of a deposited film using such a deposited film forming apparatus is performed, for example, as follows. First, a reaction container (51) evacuated to a vacuum by an evacuation unit (not shown).
11) a cylindrical support (51) heated to a predetermined temperature.
12) is charged through a gate (5120) for opening and closing by a vacuum container (not shown) exclusively for transportation, and the heater (5113) for heating the support controls the temperature of the cylindrical support (5112) to a predetermined temperature. . To flow the raw material gas for forming the deposited film into the reaction vessel (5111), make sure that the gas cylinder valves (5231 to 5236) and the leak valve (5123) of the reaction vessel are closed. (5241 to 5246), outflow valve (5251)
~ 5256), and confirm that the auxiliary valve (5260) is open, first open the main valve (5118) to the reaction vessel (5111) and the gas pipe (5116).
Exhaust. Next, the reading of the vacuum gauge (5124) is 5 × 10.
At the time of -6 Torr, the auxiliary valve (5260) and the outflow valve (5251 to 5256) are closed. Then, each gas is introduced from the gas cylinder (5221 to 5226) by opening the valve (5231 to 5236), and each gas pressure is adjusted to 2 kg / cm by the pressure regulator (5261 to 5266).
Adjust to 2 . Next, inflow valves (5241-524)
6) is gradually opened to introduce each gas into the mass flow controller (5211 to 5216).

【0007】以上のようにして成膜の準備が完了した
後、以下の手順で各層の形成を行う。円筒状支持体(5
112)が所定の温度になったところで流出バルブ(5
251〜5256)のうち必要なものおよび補助バルブ
(5260)を徐々に開き、ガスボンベ(5221〜5
226)から所定のガスをガス導入管(5114)を介
して反応容器(5111)内に導入する。次にマスフロ
ーコントローラー(5211〜5216)によって各原
料ガスが所定の流量になるように調整する。その際、反
応容器(5111)内の圧力が1Torr以下の所定の
圧力になるように真空計(5124)を見ながらメイン
バルブ(5118)の開口を調整する。内圧が安定した
ところで、周波数13.56MHzの高周波電源(不図
示)を所望の電力に設定して、高周波マッチングボック
ス(5115)を通じて反応容器(5111)内に高周
波電力を導入し、グロー放電を生起させる。この放電エ
ネルギーによって反応容器内に導入された原料ガスが分
解され、円筒状支持体(5112)上に所定のシリコン
を主成分とする堆積膜が形成されるところとなる。所望
の膜厚の形成が行われた後、高周波電力の供給を止め、
流出バルブを閉じて反応容器へのガスの流入を止め、堆
積膜の形成を終える。同様の操作を複数回繰り返すこと
によって、所望の多層構造の光受容層を形成することが
できる。それぞれの層を形成する際には必要なガス以外
の流出バルブはすべて閉じられていることは言うまでも
なく、また、それぞれのガスが反応容器(5111)
内、流出バルブ(5251〜5256)から反応容器
(5111)に至る配管内に残留することを避けるため
に、流出バルブ(5251〜5256)を閉じ、補助バ
ルブ(5260)を開き、さらにメインバルブ(511
8)を全開にして系内を一旦高真空に排気する操作を必
要に応じて行う。この間は、全て自動制御により行われ
るものである。
After the preparation for film formation is completed as described above, each layer is formed by the following procedure. Cylindrical support (5
When the temperature of (112) reaches a predetermined temperature, the outflow valve (5
251-5256) and the auxiliary valve (5260) are gradually opened to open the gas cylinder (5221-5).
A predetermined gas is introduced from 226) into the reaction vessel (5111) through the gas introduction pipe (5114). Next, the mass flow controllers (5211 to 5216) are adjusted so that each raw material gas has a predetermined flow rate. At that time, the opening of the main valve (5118) is adjusted while observing the vacuum gauge (5124) so that the pressure in the reaction vessel (5111) becomes a predetermined pressure of 1 Torr or less. When the internal pressure became stable, a high frequency power source (not shown) with a frequency of 13.56 MHz was set to the desired power, and high frequency power was introduced into the reaction vessel (5111) through the high frequency matching box (5115) to cause glow discharge. Let The source energy introduced into the reaction vessel is decomposed by this discharge energy, and a predetermined deposited film containing silicon as a main component is formed on the cylindrical support (5112). After forming the desired film thickness, stop the high frequency power supply,
The outflow valve is closed to stop the gas from flowing into the reaction vessel, and the formation of the deposited film is completed. By repeating the same operation a plurality of times, a desired multi-layered light-receiving layer can be formed. Needless to say, all the outflow valves other than the necessary gas were closed when forming each layer, and each gas was added to the reaction vessel (5111).
In order to avoid remaining in the pipe from the outflow valve (5251 to 5256) to the reaction vessel (5111), the outflow valve (5251 to 5256) is closed, the auxiliary valve (5260) is opened, and the main valve ( 511
If necessary, operation 8) is fully opened and the system is once evacuated to high vacuum. During this period, all is performed by automatic control.

【0008】このようにして、電子写真用感光体のよう
な大面積を有する堆積膜を形成する場合、膜厚、膜質の
均一化が必要であり、そのための装置構成も各種提案さ
れている。例えば、特開昭60−26667号公報によ
れば、円筒状支持体の接地方法の技術で、自転軸を有
し、円筒状支持体を回転させながら堆積膜を形成する装
置において、円筒状支持体と電気的伝導状態にある自転
軸とを互いに密着させ、その摺動部分に水銀を介在させ
接地することにより、放電の安定性が得られ、膜厚およ
び電子写真用感光体として使用する場合の特性ムラを改
善する技術が開示されている。特開平4−80370号
公報によれば、自転軸を有し、円筒状支持体を回転させ
ながら堆積膜を形成する装置において、円筒状支持体と
自転軸の接地を、円形の線接触を成すとともに、円筒状
支持体の自重により鉛直にならしめる自由度を持つよう
にした回転機構を有していることにより、回転ムラをお
さえ、膜厚、膜質の均一性を改善する技術が開示されて
いる。また、自動装置については、特開昭60−184
678号公報に技術が開示されている。
In this way, when forming a deposited film having a large area such as an electrophotographic photosensitive member, it is necessary to make the film thickness and film quality uniform, and various apparatus configurations have been proposed for that purpose. For example, according to Japanese Laid-Open Patent Publication No. 60-26667, a cylindrical support is formed in a device having a rotation axis and forming a deposited film while rotating the cylindrical support by a technique of grounding the cylindrical support. When the body and the rotating shaft in an electrically conductive state are brought into close contact with each other, and mercury is interposed in the sliding portion to ground the discharge stability, the film thickness and when used as an electrophotographic photoreceptor A technique for improving the characteristic unevenness of is disclosed. According to Japanese Patent Laid-Open No. 80370/1992, in a device having a rotation shaft and forming a deposited film while rotating a cylindrical support, the cylindrical support and the rotation shaft are grounded to make circular line contact. At the same time, by having a rotation mechanism that has a degree of freedom that allows the cylindrical support to be vertically aligned by its own weight, a technique for suppressing uneven rotation, improving film thickness, and uniformity of film quality is disclosed. There is. Further, regarding an automatic device, see Japanese Patent Laid-Open No. 60-184.
The technology is disclosed in Japanese Patent No. 678.

【0009】[0009]

【発明が解決しようとする課題】しかしながら、従来の
装置で作成された電子写真用感光体は、膜厚、膜質が均
一化され歩留の面で改善されてきたが、連続生産での特
性の安定化を図る上でさらに改良される余地が存在する
のが実情である。このような状況下において、前述した
従来技術により上記課題についてある程度の膜厚、膜質
の均一化が可能になってはきたが、更なる生産の安定性
向上に関しては未だ十分とはいえない。特にアモルファ
スシリコン系感光体の更なる高画質化への課題として、
更に、均一な膜を得るとともに、連続生産における経時
的な膜厚変化による特性変化を起こさず、安定的に生産
を行うことが挙げられる。そのためには、反応空間内の
放電の安定性を確立することが必要である。特に、成膜
中に反応空間内に発生したポリシランや膜片は、円筒状
支持体移送中に基体接地部に堆積していき、その影響に
より円筒状支持体の接地状態が連続生産において経時変
化していき、その結果、放電の不安定が生じ、膜厚及び
膜質の変化を発生してしまう。そのため、円筒状支持体
接地部の形状をポリシランや膜片の影響を受けない形状
とし、連続生産での放電の安定化を行ない、膜厚及び膜
質の安定化を図らなければならない。
However, although the electrophotographic photosensitive member produced by the conventional apparatus has been improved in yield in terms of uniform film thickness and film quality, it has a characteristic of continuous production. The reality is that there is room for further improvement in terms of stabilization. Under such circumstances, the above-mentioned conventional techniques have made it possible to make the film thickness and film quality uniform to some extent with respect to the above problems, but it is still insufficient to further improve the stability of production. In particular, as an issue to further improve the image quality of the amorphous silicon type photoreceptor,
Further, it is possible to obtain a uniform film, and to perform stable production without causing characteristic changes due to changes in film thickness over time in continuous production. To that end, it is necessary to establish the stability of the discharge in the reaction space. In particular, polysilane and film fragments generated in the reaction space during film formation accumulate on the grounding part of the substrate during transfer of the cylindrical support, and the effect of this is that the grounding state of the cylindrical support changes over time during continuous production. As a result, the discharge becomes unstable, and the film thickness and film quality change. Therefore, it is necessary to make the shape of the grounded portion of the cylindrical support member free from the influence of polysilane and film pieces, to stabilize the discharge in continuous production, and to stabilize the film thickness and film quality.

【0010】そこで、本発明は、従来のものにおける上
記課題を解決するため、反応容器内の放電の安定性を図
り、膜厚および膜質が均一な堆積膜を定常的に形成する
ことができ、形成される膜の諸物性、成膜速度、再現性
を向上させ、膜の生産性の向上と量産化を行う場合にお
ける歩留まりを飛躍的に向上させることの可能なプラズ
マCVD法による光受容部材の連続生産方法を供給する
ことにある。
Therefore, in order to solve the above-mentioned problems in the conventional one, the present invention can stabilize the discharge in the reaction vessel and can constantly form a deposited film having a uniform film thickness and film quality. It is possible to improve the properties of the formed film, the film forming speed, and the reproducibility, and to improve the productivity of the film and the yield in the case of mass production. It is to supply a continuous production how.

【0011】[0011]

【課題を解決するための手段】本発明は、上記課題を解
決するため、光受容部材の製造方法をつぎのように構成
したものであるすなわち、本発明の光受容部材の製造
方法は、支持体投入容器、支持体加熱容器、反応容器、
支持体冷却及び排出容器をそれぞれ真空容器で形成し、
搬送用真空容器を前記支持体投入容器等の各真空容器間
を移動させ、前記搬送用真空容器と前記支持体投入容器
等の各真空容器とを開閉ゲートを介して接続させて、支
持体を前記搬送用真空容器と前記支持体投入容器等の各
真空容器間で出し入れ移動可能とし、該支持体を有する
光受容部材の作製及びドライエッチングのサイクルを繰
り返して光受容部材を連続的に製造する方法において、
前記反応容器内に設置された円筒状支持体を、放電の安
定化を図るための接地接続手段を介して、前記反応容器
内の円筒状支持体設置台、又は/及び自転軸と接地接続
させる工程を有し、該接地接続手段は、無電解ニッケル
−りんメッキの表面処理が0.5μm〜50μmの厚さ
とされた金属板バネであることを特徴とする。また本発
明の光受容部材の製造方法は、前記金属バネが、析出
硬化系ステンレス鋼であることを特徴とする。また本発
明の光受容部材の製造方法は、前記析出硬化系ステンレ
ス鋼の金属板バネのバネ定数が、0.5kg/mm〜5
kg/mmであることを特徴とする。
The present invention SUMMARY OF] In order to solve the above problems, production how light receiving members are those having the following structure. That is, the method for producing the light receiving member of the present invention includes a support charging container, a support heating container, a reaction container,
The support cooling and discharge containers are each formed by a vacuum container,
The transfer vacuum container is moved between the respective vacuum containers such as the support charging container, and the transfer vacuum container and the respective vacuum containers such as the support charging container are connected through an opening / closing gate, and the support is fixed. It has a support so that it can be moved in and out between the transfer vacuum container and each vacuum container such as the support input container.
Repeat the cycle of photo-receiving member fabrication and dry etching.
In the method of continuously producing a light receiving member by returning ,
The cylindrical support installed in the reaction container is grounded to the cylindrical support installation base in the reaction container or / and the rotating shaft through a grounding connection means for stabilizing discharge. have br /> is not Ru step, the ground connecting means, electroless nickel
-Phosphorus plating surface treatment has a thickness of 0.5 μm to 50 μm
It is characterized by being a metal leaf spring . Method for producing a light-receiving member or the present invention, the metal plate spring, characterized in that it is a precipitation hardening stainless steel. In the method for manufacturing a light receiving member of the present invention, the metal constant of the precipitation hardening stainless steel has a spring constant of 0.5 kg / mm to 5 kg.
It is characterized by being kg / mm.

【0012】[0012]

【発明の実施の形態】本発明は、上記構成により、上記
した本発明の目的を達成することができるものである
が、それは、本発明者らの、従来の堆積膜形成方法にお
ける前述の問題を克服して、前述の本発明の問題を達成
すべく鋭意研究を重ねることにより得られた、放電の安
定性は、円筒状支持体と電気伝導状態にある設置台、自
転軸との接地状態と大きく関係があるという知見に基づ
くものである。この点について、説明すると、特に、従
来の装置においては、円筒状支持体下面から電気伝導状
態になるような面受け形状の設置台で、支持体を面受け
して接地接続させるだけで連続生産する場合、円筒状支
持体は機械搬送によって真空内移動となることから、成
膜中に発生したポリシランや膜片が円筒状支持体が取り
出された後の円筒状支持体接地部に堆積していく。その
影響により、次から投入される円筒状支持体の接地状態
が徐々に不安定になり放電の不安定さを起こし、その結
果、経時的に膜厚、及び膜質の変化が発生し、特性の変
化を引き起こしてしまう。このようなことから、本発明
は、円筒状支持体の接地接続を効果的に行なう手段とし
て、円筒状支持体設置台に密着して且つ、円筒状支持体
内面に導電性金属を板バネ状にしたものが密着する様、
接地接続することにより、放電の安定化を図ることを可
能とし、その結果、連続生産装置でも、経時的な接地状
態の変化を抑え、堆積される堆積膜の膜質及び膜厚を常
に均一にすることを可能とするものである。また、前記
接地接続の手段である金属板バネは、円筒状支持体の受
け渡しに影響を出さないようにバネ定数及び曲げ角度を
特定の範囲に設定し、更に、ドライエッチングでのフッ
素等による腐食を防止し耐久性を上げるため、金属板バ
ネに表面処理を施すことによって、連続生産装置の効果
をより一層向上させることが可能となる。即ち、特定の
範囲のバネ定数、曲げ角度であり、且つ腐食防止の表面
処理を施した金属板バネを設け、円筒状支持体と設置
台、自転軸との接地をより効果的にしたことで、堆積さ
れる光受容部材の膜質及び膜厚の経時的変化をなくすこ
とができ、連続生産での生産性を飛躍的に向上させるこ
とを可能にすることが分かった。
BEST MODE FOR CARRYING OUT THE INVENTION The present invention can achieve the above-mentioned object of the present invention by the above-mentioned constitution, which is due to the above-mentioned problems of the present inventors in the conventional method for forming a deposited film. The stability of the discharge, which was obtained by repeated studies to overcome the above-mentioned problems of the present invention, was confirmed by the cylindrical support, the installation base in an electrically conductive state, and the grounding state with the rotating shaft. It is based on the finding that it has a great relationship with. This point will be explained. Particularly, in the conventional device, continuous production is performed by simply bearing the support and ground-connecting the support with an installation base having a surface-bearing shape such that the lower surface of the support is electrically conductive. In this case, since the cylindrical support is moved in a vacuum by mechanical transfer, polysilane and film fragments generated during film formation are deposited on the cylindrical support grounding part after the cylindrical support is taken out. Go. Due to the influence, the grounding state of the cylindrical support to be charged next becomes gradually unstable, causing instability of the discharge, and as a result, the film thickness and the film quality change over time, and the characteristic It causes change. In view of the above, the present invention provides a means for effectively connecting the grounding of the cylindrical support body, in which the conductive metal is closely attached to the cylindrical support installation base and the inner surface of the cylindrical support body is made of a conductive metal. So that the ones you put in close contact,
By connecting to the ground, it is possible to stabilize the discharge, and as a result, even in a continuous production device, changes in the ground state over time are suppressed, and the quality and thickness of the deposited film are always made uniform. It makes it possible. Further, the metal leaf spring, which is the means for grounding connection, has a spring constant and a bending angle set in a specific range so as not to affect the transfer of the cylindrical support, and further, is corroded by fluorine or the like in dry etching. In order to prevent this and increase the durability, it is possible to further improve the effect of the continuous production apparatus by subjecting the metal leaf spring to a surface treatment. That is, by providing a metal leaf spring with a spring constant and a bending angle within a specific range and having a surface treatment for corrosion prevention, it is possible to more effectively ground the cylindrical support, the installation base, and the rotation axis. It has been found that the film quality and film thickness of the deposited light-receiving member can be eliminated and the productivity in continuous production can be dramatically improved.

【0013】本発明は、これらの知見に基づいて完成に
至ったものであるが、以下図面を用いて本発明の内容に
ついて詳述する。図4は、本発明のプラズマCVD法に
よる光受容部材の製造装置における円筒状支持体と設置
台の配置を模式的に示す断面図である。図中5112は
円筒状支持体、5113は支持体加熱用ヒーター、58
02は電極を兼ねる円筒状反応容器と対向電極となり、
円筒状支持体とは電気伝導状態となる設置台、5801
は設置台に装着された金属板バネをそれぞれ示す。ま
た、図5は、本発明の自転軸を有するプラズマCVD法
による光受容部材の製造装置における円筒状支持体と自
転軸の配置を模式的に示す断面図であり、図中6112
は円筒状支持体、6113は支持体加熱用ヒーター、6
802は電極を兼ねる円筒状反応容器と対向電極とな
り、円筒状支持体とは電気伝導状態となる自転軸、68
01は自転軸に装着された金属板バネをそれぞれ示す。
The present invention has been completed based on these findings, and the details of the present invention will be described below with reference to the drawings. FIG. 4 is a sectional view schematically showing the arrangement of the cylindrical support and the installation base in the apparatus for manufacturing a light receiving member by the plasma CVD method of the present invention. In the figure, 5112 is a cylindrical support, 5113 is a heater for heating the support, 58
02 is a cylindrical reaction container that also serves as an electrode and a counter electrode,
Cylindrical support means an installation table in an electrically conductive state, 5801
Indicates metal leaf springs mounted on the installation table. Further, FIG. 5 is a cross-sectional view schematically showing the arrangement of the cylindrical support and the rotation shaft in the apparatus for manufacturing a light receiving member by the plasma CVD method having the rotation shaft of the present invention, which is 6112.
Is a cylindrical support body, 6113 is a heater for heating the support body, 6
Reference numeral 802 denotes a cylindrical reaction vessel which also serves as an electrode and a counter electrode, and a rotation shaft which is in an electrically conductive state with the cylindrical support, 68.
Reference numeral 01 denotes a metal leaf spring mounted on the rotation shaft.

【0014】従来装置においては、円筒状支持体設置台
及び自転軸が、面受けにより支持体と接触しているだけ
の接地接続となっていたが、連続生産装置の場合は、円
筒状支持体は機械搬送によって真空内移動となることか
ら、成膜中に発生したポリシランや膜片が円筒状支持体
が取り出された後の円筒状支持体接地部に堆積してい
く。その影響により、次から投入される円筒状支持体の
接地状態が徐々に不安定になり放電の不安定さを起こ
し、その結果、経時的に膜厚、及び膜質の変化が発生し
てしまうという問題があった。こうした問題を解決する
為、支持体設置台と支持体の接地面積を広げたり、定期
的な設置台のメンテナンス等を行ない、連続生産での対
応を図り、ある程度改善されたものの、生産性等の問題
でまだ不十分である。本発明の支持体投入容器、支持体
加熱容器、反応容器、支持体冷却及び排出容器と、これ
らの容器間で移動可能な搬送専用の真空容器とからな
り、各真空容器は接続可能な開閉ゲートを設け、前記搬
送容器と支持体の出し入れ移動可能とした連続生産方法
においては、前記反応容器内に設置された円筒状支持体
を、該反応容器内の円筒状支持体設置台、又は/及び自
転軸と接地接続する手段を設けた事により、接地接続状
態の安定化、即ち放電の安定化をすることができ、常に
堆積される堆積膜の膜質及び膜厚の均一化が図られるこ
とになる。また接地接続の手段として、バネ定数が好ま
しくは0.5kg/mm〜5kg/mm 、より好まし
くは1kg/mm〜2kg/mmの析出硬化系ステンレ
ス鋼の金属板バネを用いることで、連続生産での支持体
の受け渡しの支障になることなく接地接続の安定化を図
ることが出来る。更に、その金属板バネが好ましくは
0.5〜50μm、より好ましくは2〜15μmの厚み
の無電解ニッケル−りんメッキの表面処理を施すことが
本発明には適している。尚、金属バネの個数は、図6で
はバネの数が9本の形状になっているが、3〜12本が
支持体の受け渡しに支障をきたさず、且つ効果的に接地
接続出来るとして本発明には適している。また、金属板
バネの曲げ角度(図5−a)は、支持体の受け渡しに支
障をきたさず、且つ密着するよう、10゜〜30゜の範
囲とするのが本発明には適している。
In the conventional apparatus, the cylindrical support installation base and the rotation shaft are grounded so that they are only in contact with the support by the bearing, but in the case of the continuous production apparatus, the cylindrical support is provided. Is moved in a vacuum by mechanical transportation, and therefore polysilane and film fragments generated during film formation are deposited on the grounded portion of the cylindrical support after the cylindrical support is taken out. Due to the influence, the grounding state of the cylindrical support to be introduced next gradually becomes unstable and causes instability of discharge, and as a result, the film thickness and film quality change with time. There was a problem. In order to solve these problems, we expanded the grounding area between the support installation base and the support, and performed regular maintenance of the installation base, etc. The problem is still insufficient. The present invention comprises a support charging container, a support heating container, a reaction container, a support cooling and discharging container, and a transfer-dedicated vacuum container that can be moved between these containers. In the continuous production method in which the transfer container and the support can be moved in and out, the cylindrical support installed in the reaction container is replaced with a cylindrical support installation table in the reaction container. Or / and by providing a means for ground connection with the rotation axis, the ground connection state can be stabilized, that is, the discharge can be stabilized, and the quality and thickness of the deposited film that is always deposited can be made uniform. Will be planned. Further, as a means for ground connection, a precipitation-hardened stainless steel metal leaf spring having a spring constant of preferably 0.5 kg / mm to 5 kg / mm, and more preferably 1 kg / mm to 2 kg / mm is used for continuous production. It is possible to stabilize the ground connection without hindering the delivery of the support. Further, it is suitable for the present invention that the metal leaf spring is subjected to a surface treatment of electroless nickel-phosphorus plating having a thickness of preferably 0.5 to 50 μm, more preferably 2 to 15 μm. Although the number of metal springs is nine in FIG. 6, the number of metal springs is 3 to 12 so that it does not hinder the transfer of the support and can be effectively grounded. Suitable for Further, it is suitable for the present invention that the bending angle of the metal leaf spring (FIG. 5A) is in the range of 10 ° to 30 ° so that the support is not hindered from being delivered and the support is closely attached.

【0015】本発明において使用される支持体として
は、導電性でも電気絶縁性であってもよい。導電性支持
体としては、Al 、Cr、Mo、Au、In、Nb、
Te、V、Ti、Pt、Pd、Fe等の金属、およびこ
れらの合金、例えばステンレス等が挙げられる。また、
ポリエステル、ポリエチレン、ポリカーボネート、セル
ロースアセテート、ポリプロピレン、ポリ塩化ビニル、
ポリスチレン、ポリアミド等の合成樹脂のフィルムまた
はシート、ガラス、セラミック等の電気絶縁性支持体の
少なくとも光受容層を形成する側の表面を導電処理した
支持体も用いることができる。本発明に於いて使用され
る支持体の形状は平滑表面あるいは凹凸表面の円筒状ま
たは板状無端ベルト状であることができ、その厚さは、
所望通りの電子写真用感光体を形成し得るように適宜決
定するが、電子写真用感光体としての可撓性が要求され
る場合には、支持体としての機能が十分発揮できる範囲
内で可能な限り薄くすることができる。しかしながら、
支持体は製造上および取り扱い上、機械的強度等の点か
ら通常は10μm以上とされる。特にレーザー光などの
可干渉性光を用いて像記録を行う場合には、可視画像に
おいて現われる、いわゆる干渉縞模様による画像不良を
より効果的に解消するために、支持体の表面に凹凸を設
けてもよい。支持体の表面に設けられる凹凸は、特開昭
60−168156号公報、同60−178457号公
報、同60−225854号公報等に記載された公知の
方法により作成される。
The support used in the present invention may be electrically conductive or electrically insulating. As the conductive support, Al 2, Cr, Mo, Au, In, Nb,
Examples thereof include metals such as Te, V, Ti, Pt, Pd, and Fe, and alloys thereof such as stainless steel. Also,
Polyester, polyethylene, polycarbonate, cellulose acetate, polypropylene, polyvinyl chloride,
It is also possible to use a support in which at least the surface of the electrically insulating support of the synthetic resin film or sheet of polystyrene, polyamide or the like, glass, ceramic or the like on which the light receiving layer is formed is subjected to a conductive treatment. The shape of the support used in the present invention may be a cylindrical or plate-shaped endless belt having a smooth surface or an uneven surface, and its thickness is
It is appropriately determined so that a desired electrophotographic photoreceptor can be formed, but when flexibility as an electrophotographic photoreceptor is required, it is possible within a range in which the function as a support can be sufficiently exhibited. It can be made as thin as possible. However,
The support is usually 10 μm or more in terms of manufacturing and handling, mechanical strength and the like. In particular, when performing image recording using coherent light such as laser light, unevenness is provided on the surface of the support in order to more effectively eliminate image defects due to so-called interference fringe patterns that appear in visible images. May be. The unevenness provided on the surface of the support is formed by a known method described in JP-A-60-168156, JP-A-60-178457, JP-A-60-225854 and the like.

【0016】また、レーザー光などの可干渉光を用いた
場合の干渉縞模様による画像不良をより効果的に解消す
る別の方法として、支持体の表面に複数の球状痕跡窪み
による凹凸形状を設けてもよい。即ち、支持体の表面が
電子写真用感光体に要求される解像力よりも微少な凹凸
を有し、しかも該凹凸は、複数の球状痕跡窪みによるも
のである。支持体の表面に設けられる複数の球状痕跡窪
みによる凹凸は、特開昭61−231561号公報に記
載された公知の方法により作成される。本発明の方法
用いて、グロー放電法によって堆積膜を形成するには、
基本的にはシリコン原子(Si)を供給し得るSi供給
用の原料ガスと、水素原子(H)を供給し得るH供給用
の原料ガスまたは/及びハロゲン原子(X)を供給し得
るX供給用の原料ガスを、反応容器内に所望のガス状態
で導入して、該反応容器内にグロー放電を生起させ、あ
らかじめ所定の位置に設置されている所定の支持体上に
a−Si:H,Xからなる層を形成すればよい。
Further, as another method for more effectively eliminating the image defect due to the interference fringe pattern when the coherent light such as laser light is used, the surface of the support is provided with a concavo-convex shape formed by a plurality of spherical trace depressions. May be. That is, the surface of the support has irregularities that are smaller than the resolving power required for the electrophotographic photoreceptor, and the irregularities are due to a plurality of spherical trace depressions. The unevenness due to the plurality of spherical trace depressions provided on the surface of the support is prepared by the known method described in JP-A-61-231561. To form a deposited film by the glow discharge method using the method of the present invention,
Basically, a source gas for supplying Si, which can supply silicon atoms (Si), and a source gas for supplying H, which can supply hydrogen atoms (H), and / or an X supply, which can supply halogen atoms (X). A raw material gas for use in the reaction vessel in a desired gas state to cause glow discharge in the reaction vessel, and a-Si: H on a predetermined support previously set at a predetermined position. , X may be formed.

【0017】本発明において使用されるSi供給用ガス
となり得る物質としては、SiH4、Si2H6、Si3H
8、Si4H10等のガス状態の、またはガス化し得る水素
化珪素(シラン類)が有効に使用されるものとして挙げ
られ、更に層作成時の取り扱い易さ、Si供給効率の良
さ等の点でSiH4、Si2H6が好ましいものとして挙
げられる。そして、形成される堆積膜中に水素原子を構
造的に導入し、水素原子の導入割合の制御をいっそう容
易になるようにはかり、本発明の目的を達成する膜特性
を得るために、これらのガスに更にH2および/または
Heあるいは水素原子を含む珪素化合物のガスも所望量
混合して層形成することが必要である。また、各ガスは
単独種のみでなく所定の混合比で複数種混合しても差し
支えないものである。また本発明において使用されるハ
ロゲン原子供給用の原料ガスとして有効なのは、たとえ
ばハロゲンガス、ハロゲン化物、ハロゲンを含むハロゲ
ン間化合物、ハロゲンで置換されたシラン誘導体等のガ
ス状のまたはガス化し得るハロゲン化合物が好ましく挙
げられる。また、さらにはシリコン原子とハロゲン原子
とを構成要素とするガス状のまたはガス化し得る、ハロ
ゲン原子を含む水素化珪素化合物も有効なものとして挙
げることができる。
The substances that can be used as the Si supply gas in the present invention include SiH4, Si2H6 and Si3H.
8, silicon hydrides (silanes) in a gas state such as Si4H10 or capable of being gasified are mentioned as being effectively used, and SiH4 is more advantageous in terms of ease of handling during layer formation and good Si supply efficiency. , Si2H6 are preferred. Then, structurally introducing hydrogen atoms into the deposited film to be formed, and in order to further facilitate the control of the introduction ratio of hydrogen atoms, in order to obtain the film characteristics to achieve the object of the present invention, these It is necessary to form a layer by further mixing the gas with a desired amount of H2 and / or He or a silicon compound gas containing hydrogen atoms. Further, each gas may be mixed not only with one kind but also with plural kinds at a predetermined mixing ratio. Further, as a raw material gas for supplying a halogen atom used in the present invention, a gaseous or gasifiable halogen compound such as a halogen gas, a halide, an interhalogen compound containing a halogen, a silane derivative substituted with a halogen is effective. Are preferred. Further, a gaseous or gasifiable silicon hydride compound containing a halogen atom, which contains silicon atoms and a halogen atom as constituent elements, can also be cited as an effective one.

【0018】本発明に於て好適に使用し得るハロゲン化
合物としては、具体的には弗素ガス(F2)、BrF、
ClF、ClF3、BrF3、BrF5、IF3、IF7等
のハロゲン間化合物を挙げることができる。ハロゲン原
子を含む珪素化合物、いわゆるハロゲン原子で置換され
たシラン誘導体としては、具体的には、たとえばSiF
4、Si2F6等の弗化珪素が好ましいものとして挙げる
ことができる。堆積膜中に含有される水素原子または/
及びハロゲン原子の量を制御するには、例えば支持体の
温度、水素原子または/及びハロゲン原子を含有させる
ために使用される原料物質の反応容器内へ導入する量、
放電電力等を制御すればよい。本発明においては、堆積
膜には必要に応じて伝導性を制御する原子を含有させる
ことが好ましい。伝導性を制御する原子は、堆積膜中に
万偏なく均一に分布した状態で含有されても良いし、あ
るいは層厚方向には不均一な分布状態で含有している部
分があってもよい。
Halogen compounds which can be preferably used in the present invention include fluorine gas (F2), BrF,
Interhalogen compounds such as ClF, ClF3, BrF3, BrF5, IF3 and IF7 can be mentioned. Specific examples of the silicon compound containing a halogen atom, that is, a silane derivative substituted with a halogen atom include, for example, SiF.
4, silicon fluorides such as Si2 F6 can be mentioned as preferable ones. Hydrogen atoms contained in the deposited film or /
And the amount of halogen atoms can be controlled, for example, by the temperature of the support, the amount of the raw material used to contain hydrogen atoms and / or halogen atoms introduced into the reaction vessel,
It suffices to control discharge power and the like. In the present invention, it is preferable that the deposited film contain atoms for controlling conductivity, if necessary. Atoms for controlling conductivity may be contained in the deposited film in a uniformly distributed state, or may be contained in a non-uniformly distributed state in the layer thickness direction. .

【0019】前記伝導性を制御する原子としては、半導
体分野における、いわゆる不純物を挙げることができ、
p型伝導特性を与える周期律表IIIb族に属する原子(以
後「第族IIIb原子」と略記する)またはn型伝導特性を
与える周期律表第Vb族に属する原子(以後「第Vb族
原子」と略記する)を用いることができる。第族IIIb原
子としては、具体的には、硼素(B)、アルミニウム
(Al)、ガリウム(Ga)、インジウム(In)、タ
リウム(Tl)等があり、特にB、Al、Gaが好適で
ある。第Vb族原子としては、具体的には燐(P)、砒
素(As)、アンチモン(Sb)、ビスマス(Bi)等
があり、特にP、Asが好適である。堆積膜に含有され
る伝導性を制御する原子の含有量としては、好ましくは
1×10-2〜1×104原子ppm、より好ましくは5
×10-2〜5×103原子ppm、最適には1×10-1
〜1×103 原子ppmとされるのが望ましい。伝導
性を制御する原子、たとえば、第IIIb族原子あるいは第
Vb族原子を構造的に導入するには、層形成の際に、第
IIIb族原子導入用の原料物質あるいは第Vb族原子導入
用の原料物質をガス状態で反応容器中に、堆積膜を形成
するための他のガスとともに導入してやればよい。第II
Ib族原子導入用の原料物質あるいは第Vb族原子導入用
の原料物質となり得るものとしては、常温常圧でガス状
のまたは、少なくとも層形成条件下で容易にガス化し得
るものが採用されるのが望ましい。そのような第IIIb族
原子導入用の原料物質として具体的には、硼素原子導入
用としては、B2H6、B4H10、B5H9、B5H11、B6
H10、B6H12、B6H14等の水素化硼素、BF3、BC
l3、BBr3等のハロゲン化硼素等が挙げられる。この
他、AlCl3、GaCl3、Ga(CH3)3、InCl
3、TlCl3等も挙げることができる。
Examples of the atoms for controlling the conductivity include so-called impurities in the semiconductor field,
Atoms belonging to Group IIIb of the periodic table giving p-type conductivity (hereinafter abbreviated as “Group IIIb atoms”) or atoms belonging to Group Vb of the periodic table giving n-type conductivity (hereinafter “Vb group atom”) Abbreviated) can be used. Specific examples of the group IIIb atom include boron (B), aluminum (Al), gallium (Ga), indium (In), and thallium (Tl), and B, Al, and Ga are particularly preferable. . Specific examples of the Group Vb atom include phosphorus (P), arsenic (As), antimony (Sb), bismuth (Bi), and the like, with P and As being particularly preferable. The content of atoms controlling the conductivity contained in the deposited film is preferably 1 × 10 −2 to 1 × 10 4 atomic ppm, more preferably 5
× 10 -2 to 5 × 10 3 atomic ppm, optimally 1 × 10 -1
It is desirable that the concentration be ˜1 × 10 3 atomic ppm. To structurally introduce a conductivity controlling atom, for example, a Group IIIb atom or a Group Vb atom, a
The raw material for introducing the group IIIb atom or the raw material for introducing the group Vb atom may be introduced in a gas state into the reaction vessel together with another gas for forming the deposited film. No. II
As the raw material for introducing the group Ib atom or the raw material for introducing the group Vb atom, a gaseous material at room temperature and normal pressure or at least a gas which can be easily gasified under the layer forming condition is adopted. Is desirable. Specific examples of the raw material for introducing the group IIIb atom include B2H6, B4H10, B5H9, B5H11, and B6 for introducing the boron atom.
Boron hydride such as H10, B6H12, B6H14, BF3, BC
Examples thereof include boron halides such as 13 and BBr3. In addition, AlCl3, GaCl3, Ga (CH3) 3, InCl
3, TlCl3 and the like can also be mentioned.

【0020】第Vb族原子導入用の原料物質として有効
に使用されるのは、燐原子導入用としてはPH3、P2H
4等の水素化燐、PH4I、PF3、PF5、PCl3、P
Cl5、PBr3、PBr5、PI3等のハロゲン化燐が挙
げられる。この他、AsH3、AsF3、AsCl3、A
sBr3、AsF5、SbH3、SbF3、SbF5、Sb
Cl3、SbCl5、BiH3、BiCl3、BiBr3等
も第Vb族原子導入用の出発物質の有効なものとして挙
げることができる。また、これらの伝導性を制御する原
子導入用の原料物質を必要に応じてH2および/または
Heにより希釈して使用してもよい。
Effectively used as a raw material for introducing a group Vb atom is PH3 or P2H for introducing a phosphorus atom.
Phosphorus hydride such as 4, PH4I, PF3, PF5, PCl3, P
Examples thereof include phosphorus halides such as Cl5, PBr3, PBr5 and PI3. In addition, AsH3, AsF3, AsCl3, A
sBr3, AsF5, SbH3, SbF3, SbF5, Sb
Cl3, SbCl5, BiH3, BiCl3, BiBr3 and the like can also be mentioned as effective starting materials for introducing a Group Vb atom. Further, these raw material substances for atom introduction for controlling the conductivity may be diluted with H2 and / or He as necessary and used.

【0021】本発明の目的を達成し、所望の膜特性を有
する堆積膜を形成するには、Si供給用のガスと希釈ガ
スとの混合比、反応容器内のガス圧、放電電力ならびに
支持体温度を適宜決定することが必要である。希釈ガス
として使用するH2および/またはHeの流量は、層形
成にしたがって適宜最適範囲が選択されるが、Si供給
用ガスに対しH2および/またはHeを、通常の場合1
〜20倍、好ましくは2〜15倍、最適には4〜10倍
の範囲に制御することが望ましい。反応容器内のガス圧
も同様に層設計にしたがって適宜最適範囲が選択される
が、通常の場合1×10-4〜10Torr、好ましくは
5×10-4〜5Torr、最適には1×10-3〜1To
rrとするのが好ましい。放電電力もまた同様に層設計
にしたがって適宜最適範囲が選択されるが、Si供給用
のガスの流量に対する放電電力を、通常の場合0.5〜
7倍、好ましくは0.7〜6倍、最適には1〜5倍の範
囲に設定することが望ましい。さらに支持体の温度は、
層設計にしたがって適宜最適範囲が選択されるが、通常
の場合200〜350℃とするのが望ましい。本発明に
おいては、堆積膜を形成するための支持体温度、ガス圧
の望ましい数値範囲として前記した範囲が挙げられる
が、これらの条件は通常は独立的に別々に決められるも
のではなく、所望の特性を有する電子写真用感光体を形
成すべく相互的且つ有機的関連性に基づいて最適値を決
めるのが望ましい。
In order to achieve the object of the present invention and form a deposited film having desired film characteristics, the mixing ratio of the gas for supplying Si and the diluting gas, the gas pressure in the reaction vessel, the discharge power and the support. It is necessary to determine the temperature appropriately. The flow rate of H2 and / or He used as a diluting gas is appropriately selected in accordance with the layer formation. However, H2 and / or He is used for the Si supply gas in the usual case of 1
-20 times, preferably 2 to 15 times, and optimally 4 to 10 times. Similarly, the gas pressure in the reaction vessel is appropriately selected according to the layer design, but in the usual case, it is 1 × 10 −4 to 10 Torr, preferably 5 × 10 −4 to 5 Torr, most preferably 1 × 10 −. 3 ~1To
It is preferably rr. Similarly, the discharge power is also appropriately selected according to the layer design, but the discharge power relative to the flow rate of the gas for supplying Si is usually 0.5 to
It is desirable to set in the range of 7 times, preferably 0.7 to 6 times, and optimally 1 to 5 times. Furthermore, the temperature of the support is
The optimum range is appropriately selected according to the layer design, but in the usual case, it is preferably 200 to 350 ° C. In the present invention, the above-mentioned ranges are mentioned as desirable numerical ranges of the support temperature and gas pressure for forming the deposited film, but these conditions are not usually independently determined separately, It is desirable to determine the optimum value based on the mutual and organic relationships so as to form the electrophotographic photoreceptor having the characteristics.

【0022】[0022]

【実施例】以下、本発明について、参考例、実施例、比
較例により更に詳しく説明するが、本発明はこれらによ
り限定されるものではない。 [参考例1] 長さ358mm、外径φ108mmの鏡面加工を施した
Al製シリンダー(円筒状支持体)を載置したAl製ホ
ルダー(長さ1000mm)を用い、図1、図2に示し
た連続生産装置、図4に示す構成の反応容器にて、搬送
専用の真空容器を用いて、支持体の受け渡しのみを30
0回繰り返し行い、金属バネの変化を見た。本参考例
は、アルミ製の円筒状支持体設置台に材質がSUS63
1(析出硬化系ステンレス鋼)である金属板バネを取り
付け作製した。尚、金属板バネのバネ定数は1.537
kg/mm、曲げ角度は25°、バネの数5本で行なっ
た。その結果を表1に示す。尚、評価方法は以下の通り
である。バネ荷重試験機を用い、X(kg)の荷重をか
けた時のバネの高さをH1(mm)、Y(kg)の荷重
をかけた時のバネの高さをH2(mm)とし測定し、バ
ネ定数(kg/mm)=Y−X/H2−H1で算出して求
めた。5本のバネについて測定を行い、算出されたバネ
定数の平均値が、実施前のバネ定数平均値に対して−5
%以内のものを◎、−10%以内のものを○、−10%
を越えるものを△とした3段階評価にて行った。
EXAMPLES The following information on the onset bright, Reference Examples, Examples, is described in more detail with reference to comparative examples, the present invention is not intended to be limited to these. [ Reference Example 1] An Al holder (length 1000 mm) on which a mirror-finished Al cylinder (cylindrical support) having a length of 358 mm and an outer diameter of 108 mm is mounted is shown in FIGS. 1 and 2. In the continuous production apparatus, the reaction container having the configuration shown in FIG.
It was repeated 0 times and the change of the metal spring was observed. In this reference example , the material of the cylindrical support base made of aluminum is SUS63.
A metal leaf spring of No. 1 (precipitation hardening stainless steel) was attached and manufactured. The spring constant of the metal leaf spring is 1.537.
kg / mm, the bending angle was 25 °, and the number of springs was 5. The results are shown in Table 1. The evaluation method is as follows. Using a spring load tester, measure the height of the spring when a load of X (kg) is H1 (mm) and the height of the spring when a load of Y (kg) is H2 (mm). Then, the spring constant (kg / mm) = Y−X / H 2 −H 1 was calculated. Measurement was performed on 5 springs, and the calculated average value of the spring constants was −5 with respect to the average value of the spring constants before the execution.
% Within ◎, -10% within ○, -10%
The evaluation was carried out in a three-stage evaluation with a value exceeding Δ as Δ.

【0023】(比較例1) 円筒状支持体設置台に取り付けられた金属バネの材質
が、(1)SUS304(オーステナイト系ステンレス
鋼)、(2)SUS420J2(マルテンサイト系ステ
ンレス鋼)であること以外は、参考例1と同様条件にて
行い、参考例1と同様な手段にて評価を行った。これら
の評価結果を参考例1と共に表1に示す。表1結果よ
り、比較例1においては、何れも受け渡し回数が多くな
るにつれて、バネ定数が変化してきているのに対し、
考例1では、バネ定数の変化は見られない。本発明の製
造方法により使用したSUS631(析出硬化系ステン
レス鋼)は、他の材料に比べ、連続生産においても経時
的なバネ定数の変化が無く、安定して接地接続を成して
いるという良好な結果が得られた。
(Comparative Example 1) Except that the material of the metal spring attached to the cylindrical support installation base is (1) SUS304 (austenitic stainless steel), (2) SUS420J2 (martensitic stainless steel). It is carried out under the same conditions as in reference example 1, was evaluated by the same means as in reference example 1. The results of these evaluations are shown in Table 1 together with Reference Example 1. From Table 1 results, in Comparative Example 1, as both becomes large delivery times, whereas the spring constant has been changing, ginseng
In Consideration 1, no change in spring constant is observed. The SUS631 (precipitation hardened stainless steel) used by the manufacturing method of the present invention has a stable spring connection with no change in the spring constant over time in continuous production as compared with other materials. The results were obtained.

【0024】[0024]

【表1】 参考例2] 長さ358mm、外径φ108mmの鏡面加工を施した
Al製シリンダー(円筒状支持体)を載置したAl製ホ
ルダー(長さ1000mm)を用い、図1、図2に示し
た連続生産装置、図4に示す構成の反応容器にて、搬送
専用の真空容器を用いて、支持体の受け渡しのみを10
0回繰り返し行い、金属バネ定数の変化、支持体内面の
傷状態を見た。本参考例では、アルミ製の円筒状支持体
設置台に材質がSUS631(析出硬化系ステンレス
鋼)曲げ角度は25゜、バネの数5本の金属板バネを用
い、バネ定数を0.2kg/mmから7kg/mmの間
で変化させた。
[Table 1] [ Reference Example 2] An Al holder (1000 mm in length) on which a mirror-finished Al cylinder (cylindrical support) having a length of 358 mm and an outer diameter of 108 mm is mounted is shown in FIGS. 1 and 2. In a continuous production apparatus, the reaction container having the configuration shown in FIG.
The measurement was repeated 0 times to check the change of the metal spring constant and the scratched state on the inner surface of the support. In this reference example , a cylindrical support base made of aluminum is made of SUS631 (precipitation hardening type stainless steel) with a bending angle of 25 ° and a metal plate spring having a number of springs of 5 and a spring constant of 0.2 kg /. The value varied from mm to 7 kg / mm.

【0025】(比較例2) 表2に示す比較例2は、円筒状支持体設置台に金属バネ
が取りつけられていないものであり、それ以外は参考例
2と同様の条件にて行った。これらの結果を参考例2と
共に表2に示す。尚、評価方法は、以下のとうりであ
る。 『金属バネ定数の変化』参考例1と同様な手段にて評価
を行った。 『支持体内面の傷』支持体内面についた擦れ傷の深さ
を、表面形状測定器を用い測定し、0.05mm以内の
傷を◎、0.1mm以内の傷を○、0.1mmを越える
傷を△として、3段階の評価を行った。総合評価とし
て、バネ定数の変化が無く、且つ支持体に傷がつかない
ものを◎、バネ定数がやや変化している、或は支持体に
やや傷がついているものを○、バネ定数が大きく変化し
ている、支持体に傷がかなりついているものを△、とし
て判定した。表2の結果より、金属バネ定数が0.5k
g/mm未満では、支持体内面は傷がつかないが受け渡
し回数が多くなるにつれて、バネ定数が変化する。ま
た、バネ定数が5kg/mmより大きくなると、支持体
内面に傷がついてしまう。従って、金属板バネのバネ定
数は、好ましくは0.5kg/mm〜5.0kg/mm
、より好ましくは、1.0kg/mm〜2.0kg/
mmの範囲で良好であることがわかった。
Comparative Example 2 In Comparative Example 2 shown in Table 2, the metal spring was not attached to the cylindrical support base, and the other conditions were the same as those of Reference Example 2. The results are shown in Table 2 together with Reference Example 2. The evaluation method is as follows. "Change in metal spring constant" Evaluation was performed by the same means as in Reference Example 1. "Scratches on the inner surface of the support" The depth of the scratches on the inner surface of the support was measured using a surface shape measuring instrument. A scratch within 0.05 mm was marked with ◎, a scratch within 0.1 mm was marked with ○, and 0.1 mm was marked. The scratches to be crossed were evaluated as Δ and evaluated in three levels. As a comprehensive evaluation, ◎ if the spring constant does not change and the support is not damaged, ◎, if the spring constant is slightly changed or the support is slightly damaged, ○, the spring constant is large The change, which was considerably scratched on the support, was judged as Δ. From the results of Table 2, the metal spring constant is 0.5k.
If it is less than g / mm, the inner surface of the support is not damaged, but the spring constant changes as the number of times of delivery increases. If the spring constant exceeds 5 kg / mm, the inner surface of the support will be damaged. Therefore, the spring constant of the metal leaf spring is preferably 0.5 kg / mm to 5.0 kg / mm.
, And more preferably 1.0 kg / mm to 2.0 kg /
It was found to be good in the mm range.

【0026】[0026]

【表2】 参考例3] 長さ358mm、外径φ108mmの鏡面加工を施した
Al製シリンダー(円筒状支持体)を載置したAl製ホ
ルダー(長さ1000mm)を用い、図1、図2に示し
た連続生産装置、図4に示す構成の反応容器を用いて、
構成該支持体上に電荷注入阻止層、光導電層および表面
層からなる電子写真感光体を表3−1に示す作製条件に
より形成し、その後、表3−2に示す条件にてダミー基
体投入後、ドライエッチングを行った。尚、ダミー基体
は図の生産装置の反応容器と冷却及び排出容器の間
(図示せず)に置き台が設けてあり、そこより搬送専用
の真空容器により、各反応容器に自動的に受け渡しを行
うものである。これを1サイクルとして、合計30サイ
クル電子写真感光体を作製した。本参考例では、アルミ
製の円筒状支持体設置台に材質がSUS631(析出硬
化系ステンレス鋼)である金属板バネを取り付け作製し
た。尚、金属板バネのバネ定数は1.537kg/m
m、曲げ角度は25゜、バネの数5本で行った。
[Table 2] [ Reference Example 3] An Al holder (length 1000 mm) on which a mirror-finished Al cylinder (cylindrical support) having a length of 358 mm and an outer diameter of 108 mm is mounted is shown in FIGS. 1 and 2. Continuous production apparatus, using the reaction vessel of the configuration shown in FIG.
Structure An electrophotographic photosensitive member comprising a charge injection blocking layer, a photoconductive layer and a surface layer is formed on the support under the manufacturing conditions shown in Table 3-1, and then a dummy substrate is charged under the conditions shown in Table 3-2. After that, dry etching was performed. A dummy base is provided between the reaction container and the cooling and discharging container (not shown) of the production apparatus of FIG. 1 , and is automatically transferred to each reaction container from there by a vacuum container dedicated to transportation. Is to do. With this as one cycle, a total of 30 cycles of electrophotographic photosensitive member were produced. In this reference example , a metal leaf spring made of SUS631 (precipitation hardening stainless steel) was attached to a cylindrical support base made of aluminum to fabricate it. The spring constant of the metal leaf spring is 1.537 kg / m.
The bending angle was 25 °, and the number of springs was 5.

【0027】[0027]

【表3−1】 [Table 3-1]

【0028】[0028]

【表3−2】 作製した電子写真用感光体の膜厚の経時変化、支持体設
置台の汚れ(ポリシラン等の堆積状態)について評価し
た。その結果を表4に示す。尚、評価方法は以下の通り
である。 『膜厚の経時変化』渦電流式膜厚計(ケット科学研究所
製:パーマスコープE111型)を用い、作製した電子
写真感光体の長手方向5箇所、円周方向8箇所の計40
箇所を測定し、その膜厚平均値が、1サイクル目の膜厚
平均値に対して−3%以内のものを◎、−5%以内のも
のを○、−5%を越えるものを△とした3段階評価にて
行った。 『支持体設置台の汚れ』ドライエッチング終了、ダミー
排出後反応容器ゲート上にガラス板をのせ、ゲートとガ
ラス板の間を真空にした後、ゲートを開し、支持体設置
台の汚れを目視にて確認した。評価基準は、全く汚れが
ないもの(受け面にポリシラン等の堆積が無いもの)を
◎、ややあるもの(受け面にうっすらとポリシラン等が
堆積しているが設置台のアルミ面が見えている)を○、
かなりあるもの(受け面にポリシラン等が堆積して設置
台のアルミ面が殆ど見えない)を△、(受け面にポリシ
ラン等が堆積して設置台のアルミ面が全く見えない)を
×、として、4段階の目視による感覚的判断を行った。
[Table 3-2] The film thickness of the produced electrophotographic photosensitive member was evaluated with respect to time, and the support installation table was stained (the deposition state of polysilane or the like). The results are shown in Table 4. The evaluation method is as follows. "Change in film thickness with time" Using an eddy current film thickness meter (Ket Science Institute: Permascope E111 type), a total of 40 in the longitudinal direction of the electrophotographic photosensitive member and in the circumferential direction of 8 positions.
The locations were measured, and the average film thickness was -3% or less of the average film thickness of the first cycle, ◯ was -5% or less, and Δ was -5% or more. The evaluation was performed according to the following three-stage evaluation. "Dirt on the support base" After dry etching, after discharging the dummy, place a glass plate on the gate of the reaction vessel, apply a vacuum between the gate and the glass plate, open the gate, and visually check the dirt on the support base. confirmed. The evaluation standard is ◎ that there is absolutely no stain (no deposit of polysilane, etc. on the receiving surface), and slightly (somewhat polysilane is deposited on the receiving surface, but the aluminum surface of the installation table is visible) ) ○,
Significant things (polysilane etc. are deposited on the receiving surface and the aluminum surface of the installation base is hardly visible) are marked with △, and (aluminum surface of the mounting base is completely invisible because the polysilane, etc. are deposited on the receiving surface) Sensory judgment was made by visual observation in four stages.

【0029】(比較例3) 円筒状支持体設置台に金属バネが取り付けられていない
以外は、参考例3と同様条件にて電子写真感光体を作製
した。作製した電子写真感光体を参考例3と同様な手段
にて評価を行った。これらの評価結果を参考例3と共に
表4に示す。表4の結果より、比較例3においては、設
置台の汚れが進行するに従い、膜厚が変化してきている
のに対し、参考例3では、設置台の汚れの進行は比較例
と同等であるが、膜厚の変化は見られない。本発明の
製造方法により作製された電子写真感光体は、従来の製
造方法により作製した電子写真感光体に比べ、連続生産
においても経時的な膜厚の変化が無い良好な結果が得ら
れた。
(Comparative Example 3) An electrophotographic photosensitive member was produced under the same conditions as in Reference Example 3 except that a metal spring was not attached to the cylindrical support base. The produced electrophotographic photosensitive member was evaluated by the same means as in Reference Example 3. The results of these evaluations are shown in Table 4 together with Reference Example 3. From the results of Table 4, in Comparative Example 3, the film thickness changes as the dirt of the installation table progresses, whereas in Reference Example 3 , the dirt of the installation table progresses in the Comparative Example.
It is equivalent to 3 , but no change in film thickness is observed. The electrophotographic photosensitive member manufactured by the manufacturing method of the present invention showed good results with no change in film thickness over time in continuous production, as compared with the electrophotographic photosensitive member manufactured by the conventional manufacturing method.

【0030】[0030]

【表4】 [実施例] 長さ358mm、外径φ108mmの鏡面加工を施した
Al製シリンダー(円筒状支持体)を載置したAl製シ
リンダー(長さ1000mm)を用い、図1、図2に示
した連続生産装置、図4に示す構成の反応容器を用い
て、構成該支持体上に電荷注入阻止層、光導電層および
表面層からなる電子写真感光体を表3−1に示す作製条
件により形成し、その後、表3−2に示す条件にてダミ
ー基体投入後、ドライエッチングを行った。尚、ダミー
基体は図の生産装置の反応容器と冷却及び排出容器の
間(図示せず)に置き台が設けてあり、そこより搬送専
用の真空容器により、各反応容器に自動的に受け渡しを
行なうものである。これを1サイクルとして、合計10
0サイクル電子写真感光体を作製した。本実施例では、
アルミ製の円筒状支持体設置台に材質がSUS631
(析出硬化系ステンレス鋼)である金属板バネを取り付
け作製した。尚、金属板バネのバネ定数は1.537k
g/mm、曲げ角度は25゜、バネの数5本を用い、無
電解ニッケル−りんメッキの表面処理を0.2μmから
70μmの間で変化させた。作製した電子写真用感光体
の膜厚の経時変化、金属板バネの腐食状態について評価
した。その結果を表5に示す。尚、評価方法は以下の通
りである。 『膜厚の経時変化』参考例3と同様の評価を行った。 『金属板バネの腐食』ドライエッチング終了、ダミー排
出後反応容器を大気に戻し、金属板バネの腐食を目視に
て確認した。評価基準は、全く腐食が無いものを◎、や
や腐食しているもの(やや変色している)を○、かなり
腐食しているものを△、とした3段階の目視による感覚
的判断を行った。
[Table 4] [Example 1 ] An Al cylinder (length 1000 mm) on which a mirror-finished Al cylinder (cylindrical support) having a length of 358 mm and an outer diameter of 108 mm was placed was used and shown in FIGS. 1 and 2. Using a continuous production apparatus and a reaction vessel having the structure shown in FIG. 4, an electrophotographic photosensitive member including a charge injection blocking layer, a photoconductive layer and a surface layer is formed on the support by the manufacturing conditions shown in Table 3-1. Then, after the dummy substrate was introduced under the conditions shown in Table 3-2, dry etching was performed. A dummy base is provided between the reaction container and the cooling and discharging container (not shown) of the production apparatus of FIG. 1 , and is automatically transferred to each reaction container from there by a vacuum container dedicated to transportation. Is to do. This is one cycle and a total of 10
A zero-cycle electrophotographic photosensitive member was produced. In this embodiment,
Material is SUS631 for aluminum cylindrical support stand
A metal leaf spring (precipitation hardened stainless steel) was attached and manufactured. The spring constant of the metal leaf spring is 1.537k.
The surface treatment of the electroless nickel-phosphorus plating was changed between 0.2 μm and 70 μm using g / mm, the bending angle was 25 °, and the number of springs was 5. The temporal change of the film thickness of the produced electrophotographic photosensitive member and the corrosion state of the metal leaf spring were evaluated. The results are shown in Table 5. The evaluation method is as follows. “Change in film thickness over time” The same evaluation as in Reference Example 3 was performed. "Corrosion of metal leaf spring" After completion of dry etching, the dummy was discharged and the reaction vessel was returned to the atmosphere, and the corrosion of the metal leaf spring was visually confirmed. As the evaluation criteria, a sensory judgment was made by three-step visual inspection, in which no corrosion was ◎, slightly corroded (slightly discolored) was ○, and considerably corroded was △. .

【0031】(比較例4)参考例 3と同様の条件にて電子写真感光体を作製した。
作製した電子写真感光体を実施例と同様な手段にて評
価を行った。これらの評価結果を実施例と共に表5に
示す。表5の結果より、金属板バネに無電解ニッケル−
りんメッキの表面処理を行うことで腐食に対して良好な
結果が得られた。また、無電解ニッケル−りんメッキの
表面処理の厚さは、好ましくは0.5μm〜50μm、
より好ましくは、2μm〜15μmの範囲であることが
わかった。
Comparative Example 4 An electrophotographic photosensitive member was prepared under the same conditions as in Reference Example 3.
The produced electrophotographic photosensitive member was evaluated by the same means as in Example 1 . The results of these evaluations are shown in Table 5 together with Example 1 . From the results of Table 5, electroless nickel was added to the metal leaf spring.
Good results were obtained against corrosion by the surface treatment of phosphorus plating. The thickness of the surface treatment of electroless nickel-phosphorus plating is preferably 0.5 μm to 50 μm,
It was found that the range is more preferably 2 μm to 15 μm.

【0032】[0032]

【表5】 [実施例] 長さ358mm、外径φ108mmの鏡面加工を施した
Al製シリンダー(円筒状支持体)を載置したAl製ホ
ルダー(長さ1000mm)を用い、図1、図2に示し
た連続生産装置、図4に示す構成の反応容器を用いて、
構成該支持体上に電荷注入阻止層、光導電層および表面
層からなる電子写真感光体を表3−1に示す作製条件に
より形成し、その後、表3−2に示す条件にてダミー基
体投入後、ドライエッチングを行った。尚、ダミー基体
は図の生産装置の反応容器と冷却及び排出容器の間
(図示せず)に置き台が設けてあり、そこより搬送専用
の真空容器により、各反応容器に自動的に受け渡しを行
うものである。これを1サイクルとして、合計500サ
イクル電子写真感光体を作製した。本実施例では、アル
ミ製の円筒状支持体設置台に材質がSUS631(析出
硬化系ステンレス鋼)である金属板バネを取り付け作製
した。尚、金属板バネのバネ定数は1.537kg/m
m、曲げ角度は25゜、バネの数5本を用い、無電解ニ
ッケル−りんメッキの表面処理を5μmとした。作製し
た電子写真用感光体の膜厚の経時変化、金属板バネの腐
食状態、円筒状支持体設置台の汚れについて評価した。
その結果を表6に示す。尚、評価方法は以下のとうりで
ある。 『膜厚の経時変化』参考例3と同様の評価にて行った。 『設置台の汚れ』参考例3と同様の評価にて行った。 『金属板バネの腐食状態』実施例と同様の評価にて行
った。本発明の製造方法により作製された電子写真感光
体は、連続生産においても経時的な膜厚の変化が無い良
好な結果が得られた。
[Table 5] [Example 2 ] An Al holder (length 1000 mm) on which a mirror-finished Al cylinder (cylindrical support) having a length of 358 mm and an outer diameter of 108 mm was placed was used and shown in FIGS. 1 and 2. Continuous production apparatus, using the reaction vessel of the configuration shown in FIG.
Structure An electrophotographic photosensitive member comprising a charge injection blocking layer, a photoconductive layer and a surface layer is formed on the support under the manufacturing conditions shown in Table 3-1, and then a dummy substrate is charged under the conditions shown in Table 3-2. After that, dry etching was performed. A dummy base is provided between the reaction container and the cooling and discharging container (not shown) of the production apparatus of FIG. 1 , and is automatically transferred to each reaction container from there by a vacuum container dedicated to transportation. Is to do. With this as one cycle, a total of 500 cycles of electrophotographic photosensitive member were produced. In this example, a metal leaf spring made of SUS631 (precipitation hardening stainless steel) was attached to a cylindrical support base made of aluminum to fabricate it. The spring constant of the metal leaf spring is 1.537 kg / m.
m, the bending angle was 25 °, the number of springs was 5, and the surface treatment of electroless nickel-phosphorus plating was 5 μm. The film thickness of the produced electrophotographic photosensitive member was evaluated with respect to time, the corrosion state of the metal leaf spring, and the stain on the cylindrical support installation table.
The results are shown in Table 6. The evaluation method is as follows. "Change in film thickness over time" The same evaluation as in Reference Example 3 was performed. "Dirt of installation table" The evaluation was performed in the same manner as in Reference Example 3. "Corrosion state of metal leaf spring" The same evaluation as in Example 2 was performed. The electrophotographic photosensitive member manufactured by the manufacturing method of the present invention showed good results with no change in film thickness over time even in continuous production.

【0033】[0033]

【表6】 [実施例] 実施例に示した装置を用い、表7に示す作製条件で電
荷注入阻止層、電荷輸送層、電荷発生層、表面層からな
る電子写真用感光体を500サイクル作製し、実施例
と同様の評価を行ったところ、実施例と同様に良好な
結果が得られた。
[Table 6] [Example 3 ] Using the apparatus described in Example 2 , 500 cycles of an electrophotographic photosensitive member including a charge injection blocking layer, a charge transport layer, a charge generation layer, and a surface layer were manufactured under the manufacturing conditions shown in Table 7. Example 2
When the same evaluation as in Example 2 was performed, good results were obtained as in Example 2 .

【0034】[0034]

【表7】 [実施例] 実施例に示した装置を用い、表8に示す作製条件で電
荷注入阻止層、電荷輸送層、電荷発生層、中間層、表面
層からなる電子写真用感光体を500サイクル作製し、
実施例と同様の評価を行ったところ、実施例と同様
に良好な結果が得られた。
[Table 7] [Example 4 ] Using the apparatus described in Example 2 , 500 cycles of an electrophotographic photosensitive member including a charge injection blocking layer, a charge transport layer, a charge generation layer, an intermediate layer and a surface layer was prepared under the production conditions shown in Table 8. Made,
When the same evaluation as in Example 2 was performed, good results were obtained as in Example 2 .

【0035】[0035]

【表8】 [実施例] 長さ358mm、外径φ108mmの鏡面加工を施した
Al製シリンダー(円筒状支持体)を載置したAl製ホ
ルダー(長さ650mm)を用い、図1、図3に示す自
転軸を有する連続生産装置、図5に示す構成の反応容器
を用いて、該支持体上に電荷注入阻止層、光導電層およ
び表面層からなる光受容層を表8に示す作製条件により
作製し、実施例と同様の評価を行ったところ、実施例
と同様に良好な結果が得られた。
[Table 8] Example 5 Using an Al holder (length 650 mm) on which a mirror-finished Al cylinder (cylindrical support) having a length of 358 mm and an outer diameter φ108 mm is mounted, the autorotation shown in FIGS. 1 and 3 is performed. Using a continuous production apparatus having a shaft and a reaction vessel having the configuration shown in FIG. 5, a photoreceptive layer including a charge injection blocking layer, a photoconductive layer and a surface layer was produced on the support under the production conditions shown in Table 8. When the same evaluation as in Example 2 was performed,
Good results were obtained as in 2 .

【0036】[0036]

【発明の効果】本発明は、以上のように、反応容器内に
設置された円筒状支持体を、放電の安定化を図るための
接地接続手段を介して、反応容器内の円筒状支持体設置
台、又は/及び自転軸と接地接続させることにより、プ
ラズマCVD法による光受容部材の連続生産方法におけ
る反応容器内の放電の安定化を図ることが可能となり、
特に、ドライエッチングでのフッ素等による腐食を防止
し耐久性を上げることで連続生産装置の効果をより一層
向上させることが可能となり、膜厚および膜質が均一な
堆積膜を定常的に形成することができ、形成される膜の
諸物性、成膜速度、再現性を向上させ、膜の生産性
上と量産化を行う場合における歩留まりを飛躍的に向上
させることができる。
As described above, according to the present invention, the cylindrical support provided in the reaction vessel is connected to the cylindrical support in the reaction vessel through the ground connection means for stabilizing the discharge. installation base, and / or by the ground connected to the rotation axis, it is possible to stabilize the discharge of the light-receiving continuous production side in <br/> Ru reaction vessel put on methods of members by the plasma CVD method,
In particular, prevents corrosion due to fluorine during dry etching
To improve the effect of continuous production equipment
Therefore, it is possible to constantly form a deposited film having a uniform film thickness and film quality, improve the physical properties of the formed film, the film formation speed, and the reproducibility, and improve the productivity of the film. It is possible to dramatically improve the yield in the case of production and mass production.

【図面の簡単な説明】[Brief description of drawings]

【図1】支持体投入容器、支持体加熱容器、反応容器、
支持体冷却及び排出容器と、これらの容器間で移動可能
な搬送専用の真空容器を有する連続生産装置の模式的説
明図である。
FIG. 1 is a support charging container, a support heating container, a reaction container,
It is a schematic explanatory view of a continuous production apparatus having a support cooling and discharge container and a vacuum container dedicated to transportation that is movable between these containers.

【図2】本発明の参考例、実施例に用いたプラズマCV
D法による堆積膜形成装置における、電極を兼ねる円筒
状反応容器、円筒状支持体を含む対向電極、ガス導入分
岐管等を示す模式的説明図である。
FIG. 2 is a plasma CV used in Reference Examples and Examples of the present invention.
FIG. 5 is a schematic explanatory view showing a cylindrical reaction container that also serves as an electrode, a counter electrode including a cylindrical support, a gas introduction branch pipe, and the like in a deposited film forming apparatus by the D method.

【図3】本発明の参考例、実施例に用いたプラズマCV
D法による堆積膜形成装置における、電極を兼ねる円筒
状反応容器、円筒状支持体を含む対向電極、ガス導入分
岐管等を示す模式的説明図である。
FIG. 3 is a plasma CV used in Reference Examples and Examples of the present invention.
FIG. 5 is a schematic explanatory view showing a cylindrical reaction container that also serves as an electrode, a counter electrode including a cylindrical support, a gas introduction branch pipe, and the like in a deposited film forming apparatus by the D method.

【図4】本発明のプラズマCVD法による光受容部材の
製造方法における円筒状支持体と設置台、金属板バネの
配置を模式的に示す断面図である。
FIG. 4 shows a light receiving member manufactured by the plasma CVD method of the present invention.
It is sectional drawing which shows typically the arrangement of a cylindrical support body, an installation stand, and a metal leaf spring in a manufacturing method .

【図5】本発明のプラズマCVD法による光受容部材の
製造方法における円筒状支持体と自転軸、金属板バネの
配置を模式的に示す断面図である。
FIG. 5 shows a light receiving member produced by the plasma CVD method of the present invention.
It is sectional drawing which shows typically the cylindrical support body, the rotating shaft, and arrangement | positioning of a metal leaf spring in a manufacturing method .

【図6】本発明の金属板バネを模式的に示す断面図であ
る。
FIG. 6 is a sectional view schematically showing a metal leaf spring of the present invention.

【符号の説明】[Explanation of symbols]

2100/2101:支持体投入装置/支持体投入容器 2200/2201:支持体加熱装置/支持体加熱容器 2300/2301a〜c:反応装置/反応容器 2400/2401:冷却及び排出装置/冷却及び排出
容器 2501〜2507:排気手段(真空ポンプ) 2601〜2608:排気バルブ 2701、2705、2706:リークバルブ 2702:加熱用ガス補助バルブ 2703a〜c、2704:ガス流出バルブ 2801〜2807:開閉ゲート 2900/2901:搬送装置/搬送専用真空容器 2951:搬送用チャッキング 2952:搬送移動用レール 5100、6100:堆積装置 5111、6111:反応容器 5112、6112:円筒状支持体 5113、6113:加熱用ヒーター 5114:原料ガス導入管 5115、6115:マッチングボックス 5116:原料ガス配管 5117:反応容器リークバルブ 5118:メイン排気バルブ 5119:真空計 5200:原料ガス供給装置 5211〜5216:マスフローコントローラー 5221〜5226:原料ガスボンベ 5231〜5236:原料ガスボンベバルブ 5241〜5246:ガス流入バルブ 5251〜5256:ガス流出バルブ 5261〜5266:圧力調整器 5801/6801:金属板バネ 5802/6802:円筒状支持体設置台 6115:電極 6120:支持体回転用モーター 6121:排気管 6130:放電空間
2100/2101: Support charging device / support charging container 2200/2201: Support heating device / support heating container 2300 / 2301a-c: Reactor / reaction container 2400/2401: Cooling and discharging device / Cooling and discharging container 2501-2507: Exhaust means (vacuum pump) 2601-2608: Exhaust valves 2701, 2705, 2706: Leak valve 2702: Heating gas auxiliary valves 2703a-c, 2704: Gas outflow valves 2801-2807: Open / close gate 2900/2901: Transport device / dedicated transport vacuum container 2951: Transport chucking 2952: Transport transfer rails 5100, 6100: Deposition devices 5111, 6111: Reaction vessels 5112, 6112: Cylindrical supports 5113, 6113: Heating heater 5114: Raw material gas Introductory pipe 5115 , 6115: Matching box 5116: Raw material gas pipe 5117: Reaction vessel leak valve 5118: Main exhaust valve 5119: Vacuum gauge 5200: Raw material gas supply devices 5211-5216: Mass flow controllers 5221-5226: Raw material gas cylinders 5231-5236: Raw material gas cylinder valves 5241-5246: Gas inflow valves 5251-5256: Gas outflow valves 5261-5266: Pressure regulators 5801/6801: Metal leaf springs 5802/6802: Cylindrical support installation base 6115: Electrodes 6120: Support rotation motor 6121: Exhaust pipe 6130: discharge space

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平4−329883(JP,A) 特開 昭62−54913(JP,A) 実開 平7−10934(JP,U) (58)調査した分野(Int.Cl.7,DB名) H01L 21/205 C23C 16/50 ─────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP-A-4-329883 (JP, A) JP-A-62-54913 (JP, A) Fukuihei 7-10934 (JP, U) (58) Survey Field (Int.Cl. 7 , DB name) H01L 21/205 C23C 16/50

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】支持体投入容器、支持体加熱容器、反応容
器、支持体冷却及び排出容器をそれぞれ真空容器で形成
し、搬送用真空容器を前記支持体投入容器等の各真空容
器間を移動させ、前記搬送用真空容器と前記支持体投入
容器等の各真空容器とを開閉ゲートを介して接続させ
て、支持体を前記搬送用真空容器と前記支持体投入容器
等の各真空容器間で出し入れ移動可能とし、該支持体を
有する光受容部材の作製及びドライエッチングのサイク
ルを繰り返して光受容部材を連続的に製造する方法にお
いて、前記反応容器内に設置された円筒状支持体を、放
電の安定化を図るための接地接続手段を介して、前記反
応容器内の円筒状支持体設置台、又は/及び自転軸と接
地接続させる工程を有し、該接地接続手段は、無電解ニ
ッケル−りんメッキの表面処理が0.5μm〜50μm
の厚さとされた金属板バネであることを特徴とする光受
容部材の製造方法。
1. A support charging container, a support heating container, a reaction container, a support cooling and discharging container are each formed of a vacuum container, and a transporting vacuum container is moved between the respective vacuum containers such as the support charging container. Then, the transfer vacuum container and each vacuum container such as the support charging container are connected through an opening / closing gate, and a support is provided between the transfer vacuum container and each vacuum container such as the support charging container. The support can be moved in and out.
Of photo-receptive member with and cycle of dry etching
In the method for continuously producing a light-receiving member by repeating the above procedure, the cylindrical support provided in the reaction vessel is connected to the inside of the reaction vessel via a ground connecting means for stabilizing discharge. cylindrical support mount base, and / or the rotation axis and a step of Ru is a ground connection, the ground connecting means, electroless two
The surface treatment of nickel-phosphorus plating is 0.5μm-50μm
A method of manufacturing a light receiving member, which is a metal leaf spring having a thickness of 1 .
【請求項2】前記金属バネが、析出硬化系ステンレス
鋼であることを特徴とする請求項に記載の光受容部材
の製造方法。
2. The method for manufacturing a light receiving member according to claim 1 , wherein the metal leaf spring is precipitation hardening stainless steel.
【請求項3】前記析出硬化系ステンレス鋼の金属板バネ
のバネ定数が、0.5kg/mm〜5kg/mmである
ことを特徴とする請求項に記載の光受容部材の製造方
法。
3. The method for producing a light receiving member according to claim 2 , wherein the spring constant of the metal leaf spring of precipitation hardening stainless steel is 0.5 kg / mm to 5 kg / mm.
JP05105796A 1996-02-14 1996-02-14 Method for manufacturing light receiving member Expired - Fee Related JP3496903B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP05105796A JP3496903B2 (en) 1996-02-14 1996-02-14 Method for manufacturing light receiving member

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP05105796A JP3496903B2 (en) 1996-02-14 1996-02-14 Method for manufacturing light receiving member

Publications (2)

Publication Number Publication Date
JPH09223674A JPH09223674A (en) 1997-08-26
JP3496903B2 true JP3496903B2 (en) 2004-02-16

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Country Status (1)

Country Link
JP (1) JP3496903B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5599042B2 (en) * 2010-06-10 2014-10-01 キヤノン株式会社 Method and apparatus for producing electrophotographic photosensitive member

Also Published As

Publication number Publication date
JPH09223674A (en) 1997-08-26

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