JP3498521B2 - Method for producing electrolytic capacitor and method for treating capacitor element - Google Patents
Method for producing electrolytic capacitor and method for treating capacitor elementInfo
- Publication number
- JP3498521B2 JP3498521B2 JP05456897A JP5456897A JP3498521B2 JP 3498521 B2 JP3498521 B2 JP 3498521B2 JP 05456897 A JP05456897 A JP 05456897A JP 5456897 A JP5456897 A JP 5456897A JP 3498521 B2 JP3498521 B2 JP 3498521B2
- Authority
- JP
- Japan
- Prior art keywords
- foil
- cathode
- anode
- side lead
- capacitor element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Description
【０００１】[0001]
【発明の属する技術分野】本発明は各種電子機器に利用
される電解コンデンサの製造方法およびコンデンサ素子
の処理方法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing an electrolytic capacitor used in various electronic devices and a method of treating a capacitor element.
【０００２】[0002]
【従来の技術】近年、電子機器の小型化が進むにつれ、
電解コンデンサも小型化が顕著になっている。また電子
機器のデジタル化や蛍光灯等のインバータ化に伴い、電
解コンデンサも高周波のリップル吸収特性が良く、かつ
内部抵抗を低インピーダンス化したものが望まれてい
る。2. Description of the Related Art In recent years, as electronic devices have become smaller,
The downsizing of electrolytic capacitors has become remarkable. Further, with the digitization of electronic devices and the use of inverters such as fluorescent lamps, it has been desired that electrolytic capacitors have good high-frequency ripple absorption characteristics and low internal resistance.
【０００３】電解コンデンサの場合は、内部抵抗の大部
分を電解液の導通抵抗が占めており、セパレータを介し
て対向する陽極箔と陰極箔の電極面積が１／２になると
この部分の内部抵抗は２倍になり、一方、陽極箔と陰極
箔の電極間距離が１／２になるとこの部分の内部抵抗は
１／２倍になるものである。またこの内部抵抗はセパレ
ータの密度が低いほど減少するものである。In the case of an electrolytic capacitor, the conduction resistance of the electrolytic solution occupies most of the internal resistance, and when the electrode area of the anode foil and the cathode foil facing each other via the separator becomes 1/2, the internal resistance of this portion is reduced. Is doubled, on the other hand, when the distance between the electrodes of the anode foil and the cathode foil is halved, the internal resistance of this portion is halved. Further, this internal resistance decreases as the separator density decreases.
【０００４】図４は従来の電解コンデンサにおけるコン
デンサ素子の構成を示したもので、陽極側リード１を接
続した陽極箔２と、陰極側リード（図示せず）を接続し
た陰極箔３と、この陰極箔３と前記陽極箔２との間に介
在されかつ和紙で形成したセパレータ４，５を巻回する
ことにより巻回形のコンデンサ素子６を構成している。FIG. 4 shows the structure of a capacitor element in a conventional electrolytic capacitor. An anode foil 2 to which an anode lead 1 is connected, a cathode foil 3 to which a cathode lead (not shown) is connected, and The wound capacitor element 6 is formed by winding the separators 4 and 5 formed of Japanese paper and interposed between the cathode foil 3 and the anode foil 2.
【０００５】図５は図４で示したコンデンサ素子６の断
面図を示したもので、陽極箔２および陰極箔３からは突
起７，８が突出しているが、一般的にはセパレータ４，
５を介在させることにより、これらの突起７，８が対向
する陰極箔３あるいは陽極箔２に接触しないように設定
されているものである。FIG. 5 is a cross-sectional view of the capacitor element 6 shown in FIG. 4, in which the projections 7 and 8 are projected from the anode foil 2 and the cathode foil 3, but generally the separator 4,
By interposing 5, the protrusions 7 and 8 are set so as not to contact the cathode foil 3 or the anode foil 2 facing each other.
【０００６】電解コンデンサの小型化に対しては、陽極
箔２と陰極箔３の単位面積当たりの箔容量を向上させ、
かつ陽極箔２と陰極箔３の対向面積を小さくすることに
より、コンデンサ素子６の巻回数を少なくしている。そ
してこのコンデンサ素子６に電解液を含浸させてケース
（図示せず）内に収納し、その後、ケースの開口部を封
口した完成品の状態においては、内部インピーダンスが
増加するものである。To reduce the size of the electrolytic capacitor, the foil capacity per unit area of the anode foil 2 and the cathode foil 3 is improved,
Moreover, the number of windings of the capacitor element 6 is reduced by reducing the facing area between the anode foil 2 and the cathode foil 3. Then, the capacitor element 6 is impregnated with an electrolytic solution and housed in a case (not shown), and then, in a state of a finished product in which the opening of the case is sealed, the internal impedance is increased.
【０００７】この内部インピーダンスの増加を防止した
り、あるいは電解コンデンサの低インピーダンス化を図
るためには、セパレータ４，５の厚みを薄くするか、低
密度にする必要があるものである。In order to prevent the increase of the internal impedance or to reduce the impedance of the electrolytic capacitor, it is necessary to reduce the thickness of the separators 4 and 5 or reduce the density thereof.
【０００８】[0008]
【発明が解決しようとする課題】しかしながら、上記し
たようにセパレータ４，５の厚みを薄くしたり、低密度
にした場合、図５に示した突起７，８と陰極箔３あるい
は陽極箔２の電極間距離が十分に確保できないコンデン
サ素子６が得られることになり、そしてこのコンデンサ
素子６に電解液を含浸させてケース内に収納し、その
後、ケースの開口部を封口した完成品の状態において陽
極側リード１と陰極側リード（図示せず）にストレスを
加えると、ショートしやすくなるという問題点を有して
いた。However, when the thickness of the separators 4 and 5 is reduced or the density thereof is reduced as described above, the protrusions 7 and 8 and the cathode foil 3 or the anode foil 2 shown in FIG. A capacitor element 6 in which a sufficient distance between electrodes cannot be secured is obtained, and the capacitor element 6 is impregnated with an electrolytic solution and housed in a case, and then, in a state of a finished product in which an opening portion of the case is sealed. When stress is applied to the anode side lead 1 and the cathode side lead (not shown), there is a problem in that a short circuit easily occurs.
【０００９】図６は従来の電解コンデンサにおける生産
工程のフローチャートを示したもので、従来におけるコ
ンデンサ素子のショート検査は、巻き取り工程のすぐ後
に行い、そしてこのショート検査の内容は陽極側リード
と陰極側リード間の導通抵抗を測定するようにしている
ため、陽極箔と陰極箔の電極間距離が十分確保されてい
ない場合でも、電極間が接触していない限り、ショート
として検出することはできなかった。また従来において
は、ショート検査の後に陽極側リードと陰極側リードに
封口部材を挿入するようにしているため、この封口部材
の挿入工程において陽極側リードと陰極側リードに応力
が加わってショートに至るものが発生していた。FIG. 6 shows a flow chart of the production process in the conventional electrolytic capacitor. The short-circuit inspection of the conventional capacitor element is performed immediately after the winding step, and the contents of this short-circuit inspection are the anode side lead and the cathode. Since the conduction resistance between the side leads is measured, even if the distance between the electrodes of the anode foil and the cathode foil is not sufficiently secured, it cannot be detected as a short circuit unless the electrodes are in contact with each other. It was Further, in the past, since the sealing member is inserted into the anode side lead and the cathode side lead after the short circuit inspection, stress is applied to the anode side lead and the cathode side lead in the process of inserting the sealing side member, which causes a short circuit. Things were happening.
【００１０】本発明は上記従来の問題点を解決するもの
で、陽極箔と陰極箔の電極間距離が十分確保されていな
い場合においても、電極間距離を確実に広げることがで
き、かつケースの開口部を封口した完成品のリードスト
レスに対しても強いものが得られる電解コンデンサの製
造方法を提供することを目的とするものである。The present invention solves the above-mentioned conventional problems. Even when the distance between the electrodes of the anode foil and the cathode foil is not sufficiently secured, the distance between the electrodes can be surely widened, and the case It is an object of the present invention to provide a method for manufacturing an electrolytic capacitor, which is strong against the lead stress of a finished product with the opening sealed.
【００１１】[0011]
【課題を解決するための手段】上記課題を解決するため
に本発明の電解コンデンサの製造方法は、陽極側リード
を接続した陽極箔と、陰極側リードを接続した陰極箔
と、この陰極箔と前記陽極箔との間に介在されたセパレ
ータとにより構成されたコンデンサ素子を備え、このコ
ンデンサ素子の陽極側リードと陰極側リード間に、まず
５〜２００Ｖの低電圧のパルス電流を印加して陽極箔と
陰極箔の突起によるショート箇所を切断し、次に３００
〜５００Ｖの高電圧のパルス電流を印加して前記ショー
ト箇所の切断部における陽極箔と陰極箔の突起による近
接箇所を広げ、その後、規定の陽極箔と陰極箔の電極間
距離まで放電する放電電圧を印加して陽極箔と陰極箔の
電極間距離による良品、不良品の判定検査を行った後、
このコンデンサ素子に電解液を含浸させてケース内に収
納し、その後、ケースの開口部を封口するようにしたも
ので、この製造方法によれば、陽極箔と陰極箔の電極間
距離が十分確保されていない場合においても、電極間距
離を確実に広げることができ、かつケースの開口部を封
口した完成品のリードストレスに対しても強いものが得
られるものである。Method of manufacturing an electrolytic capacitor of the present invention to solve the above problems SUMMARY OF THE INVENTION comprises an anode foil connected with an anode-side lead and a cathode foil connected with a cathode-side lead, and the cathode foil A capacitor element constituted by a separator interposed between the anode foil and the anode foil is provided.
By applying a low-voltage pulse current of 5 to 200 V, the short-circuited portion due to the protrusion of the anode foil and the cathode foil is cut, and then 300
Discharge voltage for applying a high-voltage pulse current of ~ 500 V to widen the proximity of the anode foil and cathode foil projections in the cut portion of the short-circuited location, and then discharging to the specified interelectrode distance between the anode foil and cathode foil. After applying the voltage and conducting a judgment inspection of good products and defective products by the distance between the electrodes of the anode foil and the cathode foil,
This capacitor element is impregnated with an electrolytic solution and stored in a case, and then the opening of the case is sealed. According to this manufacturing method, a sufficient distance between the electrodes of the anode foil and the cathode foil is secured. Even in the case where it is not provided, the distance between the electrodes can be surely widened, and a strong product against the lead stress of the finished product in which the opening of the case is sealed can be obtained.
【００１２】[0012]
【発明の実施の形態】本発明の請求項１に記載の発明
は、陽極側リードを接続した陽極箔と、陰極側リードを
接続した陰極箔と、この陰極箔と前記陽極箔との間に介
在されたセパレータとにより構成されたコンデンサ素子
を備え、このコンデンサ素子の陽極側リードと陰極側リ
ード間に、まず５〜２００Ｖの低電圧のパルス電流を印
加して陽極箔と陰極箔の突起によるショート箇所を切断
し、次に３００〜５００Ｖの高電圧のパルス電流を印加
して前記ショート箇所の切断部における陽極箔と陰極箔
の突起による近接箇所を広げ、その後、規定の陽極箔と
陰極箔の電極間距離まで放電する放電電圧を印加して陽
極箔と陰極箔の電極間距離による良品、不良品の判定検
査を行った後、このコンデンサ素子に電解液を含浸させ
てケース内に収納し、その後、ケースの開口部を封口す
るようにしたもので、この製造方法によれば、まず５〜
２００Ｖの低電圧のパルス電流により陽極箔と陰極箔の
突起によるショート箇所を切断するようにしているた
め、次工程で３００〜５００Ｖの高電圧のパルス電流を
印加した場合にアーク放電がしやすくなり、これによ
り、陽極箔と陰極箔の電極間距離が十分確保されていな
い場合においても、電極間距離を確実に広げることがで
き、また、その後、規定の陽極箔と陰極箔の電極間距離
まで放電する放電電圧を印加して陽極箔と陰極箔の電極
間距離による良品、不良品の判定検査を行うようにして
いるため、この検査により、その後の工程には電極間距
離の広いものを選別して流すことができ、これにより、
ケースの開口部を封口した完成品の状態において陽極側
リードと陰極側リードにストレスが加わった場合におい
ても、ショートしにくい強いものが得られるものであ
る。BEST MODE FOR CARRYING OUT THE INVENTION The invention according to claim 1 of the present invention is directed to an anode foil to which an anode side lead is connected, a cathode foil to which a cathode side lead is connected, and between the cathode foil and the anode foil. A capacitor element constituted by an intervening separator is provided, and a low-voltage pulse current of 5 to 200 V is first applied between the anode side lead and the cathode side lead of this capacitor element to cause the protrusion of the anode foil and the cathode foil. The short-circuited portion is cut, and then a high-voltage pulse current of 300 to 500 V is applied to widen the proximity of the cut-out portion of the shorted portion due to the protrusions of the anode foil and the cathode foil, and then the specified anode foil and cathode foil. After applying a discharge voltage that discharges to the distance between the electrodes of the anode foil and the cathode foil to perform a judgment test of good products and defective products according to the distance between the electrodes, the capacitor element is impregnated with an electrolytic solution and stored in a case. Thereafter, the opening of the case which was to be sealed, according to this manufacturing method, first 5
Since the short-circuited portion due to the protrusion of the anode foil and the cathode foil is cut by the low voltage pulse current of 200 V , arc discharge is easily caused when a high voltage pulse current of 300 to 500 V is applied in the next step. , By this, even when the distance between the electrodes of the anode foil and the cathode foil is not sufficiently secured, the distance between the electrodes can be surely increased, and after that, up to the specified distance between the electrodes of the anode foil and the cathode foil. A discharge voltage is applied to discharge, and the product is tested to determine whether it is a good product or a defective product based on the distance between the electrodes of the anode and cathode foils. And then it can be flushed,
Even when stress is applied to the anode-side lead and the cathode-side lead in the state of a completed product with the opening of the case sealed, a strong product that is unlikely to cause a short circuit can be obtained.
【００１３】請求項２に記載の発明は、陽極側リードを
接続した陽極箔と、陰極側リードを接続した陰極箔と、
この陰極箔と前記陽極箔との間に介在されたセパレータ
とにより構成されたコンデンサ素子を備え、このコンデ
ンサ素子の陽極側リードと陰極側リードにまず封口部材
を挿入し、その後、前記陽極側リードと陰極側リード間
に５〜２００Ｖの低電圧のパルス電流を印加して陽極箔
と陰極箔の突起によるショート箇所を切断し、次に３０
０〜５００Ｖの高電圧のパルス電流を印加して前記ショ
ート箇所の切断部における陽極箔と陰極箔の突起による
近接箇所を広げ、その後、規定の陽極箔と陰極箔の電極
間距離まで放電する放電電圧を印加して陽極箔と陰極箔
の電極間距離による良品、不良品の判定検査を行った
後、このコンデンサ素子に電解液を含浸させてケース内
に収納し、その後、ケースの開口部を封口するようにし
たもので、この製造方法によれば、コンデンサ素子の陽
極側リードと陰極側リードにまず封口部材を挿入してコ
ンデンサ素子の陽極側リードと陰極側リードを固定し、
その後、５〜２００Ｖの低電圧のパルス電流や３００〜
５００Ｖの高電圧のパルス電流等による処理を行うよう
にしているため、組み立て工程などのストレスに対して
も、陽極箔と陰極箔の電極間距離の変化は起こりにく
く、その結果、ケースの開口部を封口した完成品のリー
ドストレスに対する強度のバラツキも少なくなるもので
ある。According to a second aspect of the present invention, there is provided an anode foil to which an anode lead is connected, a cathode foil to which a cathode lead is connected,
A capacitor element constituted by a separator interposed between the cathode foil and the anode foil is provided, and a sealing member is first inserted into the anode side lead and the cathode side lead of the capacitor element, and then the anode side lead. A low-voltage pulse current of 5 to 200 V is applied between the lead and the cathode side lead to cut the short-circuited portion due to the protrusion of the anode foil and the cathode foil, and then 30
A high-voltage pulse current of 0 to 500 V is applied to widen the proximity of the cut portion of the short-circuited portion due to the protrusions of the anode foil and the cathode foil, and then discharge up to the prescribed distance between the electrodes of the anode foil and the cathode foil. After applying a voltage and performing a judgment test for good and defective products by the distance between the anode foil and cathode foil electrodes, the capacitor element is impregnated with an electrolytic solution and stored in a case. According to this manufacturing method, the sealing member is first inserted into the anode side lead and the cathode side lead of the capacitor element to fix the anode side lead and the cathode side lead of the capacitor element,
After that, a low-voltage pulse current of 5 to 200 V or 300 to
Since the treatment is performed by a pulsed current with a high voltage of 500 V, the distance between the electrodes of the anode foil and the cathode foil is unlikely to change even when stressed in the assembly process, etc., and as a result, the opening of the case is opened. The variation in strength against the lead stress of the finished product with the sealed container is reduced.
【００１４】請求項３に記載の発明は、陽極側リードを
接続した陽極箔と、陰極側リードを接続した陰極箔と、
この陰極箔と前記陽極箔との間に介在されたセパレータ
とにより構成されたコンデンサ素子の陽極側リードと陰
極側リード間に、まず５〜２００Ｖの低電圧のパルス電
流を印加して陽極箔と陰極箔の突起によるショート箇所
を切断し、次に３００〜５００Ｖの高電圧のパルス電流
を印加して前記ショート箇所の切断部における陽極箔と
陰極箔の突起による近接箇所を広げるようにしたもの
で、このコンデンサ素子の処理方法によれば、まず５〜
２００Ｖの低電圧のパルス電流により陽極箔と陰極箔の
突起によるショート箇所を切断するようにしているた
め、次工程で３００〜５００Ｖの高電圧のパルス電流を
印加した場合にアーク放電がしやすくなり、これによ
り、陽極箔と陰極箔の電極間距離が十分確保されていな
い場合においても、電極間距離を確実に広げることがで
きるものである。According to a third aspect of the present invention, there is provided an anode foil to which an anode side lead is connected, a cathode foil to which a cathode side lead is connected,
First, a low-voltage pulse current of 5 to 200 V is applied between the anode-side lead and the cathode-side lead of the capacitor element constituted by the cathode foil and the separator interposed between the anode foil and the anode foil. A short-circuited portion due to the protrusion of the cathode foil is cut, and then a high-voltage pulse current of 300 to 500 V is applied to widen the proximity portion due to the protrusion of the anode foil and the cathode foil in the cut portion of the short-circuited portion. According to the processing method of the capacitor element, first 5
Since the short-circuited portion due to the protrusion of the anode foil and the cathode foil is cut by the low voltage pulse current of 200 V , arc discharge is easily caused when a high voltage pulse current of 300 to 500 V is applied in the next step. Therefore, even when the distance between the electrodes of the anode foil and the cathode foil is not sufficiently secured, the distance between the electrodes can be surely increased.
【００１５】以下、本発明の実施の形態について添付図
面にもとづいて説明する。図１（ａ）（ｂ）（ｃ）は本
発明の一実施の形態における電解コンデンサの耐電圧向
上と検査の工程を示したもので、この図１（ａ）（ｂ）
（ｃ）において、１１はコンデンサ素子で、このコンデ
ンサ素子１１は陽極側リード１２ａを接続した陽極箔
（図示せず）と、陰極側リード１２ｂを接続した陰極箔
（図示せず）をその間にセパレータ（図示せず）を介在
させて巻回することにより構成されている。Embodiments of the present invention will be described below with reference to the accompanying drawings. FIGS. 1 (a), (b) and (c) show steps of improving the withstand voltage and inspecting an electrolytic capacitor according to an embodiment of the present invention.
In (c), 11 is a capacitor element, and this capacitor element 11 has an anode foil (not shown) to which an anode side lead 12a is connected and a cathode foil (not shown) to which a cathode side lead 12b is connected. It is configured by winding with (not shown) interposed.
【００１６】そして図１（ａ）に示すように、まず５〜
２００Ｖの低電圧Ｖ1を充電用抵抗１３を介してコンデ
ンサ１４に充電し、そしてコンデンサ素子１１の陽極側
リード１２ａと陰極側リード１２ｂを一対の接触端子１
５ａ，１５ｂに接触させることにより、低電圧のパルス
電流を印加してコンデンサ素子１１を構成する陽極箔と
陰極箔の突起によるショート箇所を切断する。Then, as shown in FIG.
The capacitor 14 is charged with a low voltage V 1 of 200 V via the charging resistor 13, and the anode side lead 12a and the cathode side lead 12b of the capacitor element 11 are connected to the pair of contact terminals 1.
By contacting with 5a and 15b, a low-voltage pulse current is applied to cut off the short-circuited portion due to the protrusions of the anode foil and the cathode foil forming the capacitor element 11.
【００１７】次に図１（ｂ）に示すように、３００〜５
００Ｖの高電圧Ｖ2を抵抗１６を介してコンデンサ１７
に充電し、そしてコンデンサ素子１１の陽極側リード１
２ａと陰極側リード１２ｂを一対の接触端子１８ａ，１
８ｂに接触させることにより、高電圧のパルス電流を印
加して前記ショート箇所の切断部における陽極箔と陰極
箔の突起による近接箇所を広げる。なお、高電圧のパル
ス電流の印加時間は長いほうが陽極箔と陰極箔の電極間
距離を確実に広げることができるものである。Next, as shown in FIG.
The high voltage V 2 of 00V is passed through the resistor 16 to the capacitor 17
1 and charged to the anode side of the capacitor element 11
2a and cathode side lead 12b as a pair of contact terminals 18a, 1
By contacting with 8b, a high-voltage pulse current is applied to widen the vicinity of the cut portion of the short portion due to the protrusion of the anode foil and the cathode foil. It should be noted that the longer the application time of the high-voltage pulse current, the more reliably the distance between the electrodes of the anode foil and the cathode foil can be increased.
【００１８】次に検査工程として、図１（ｃ）に示すよ
うに、コンデンサ素子１１の陽極側リード１２ａと陰極
側リード１２ｂを一対の接触端子１９ａ，１９ｂに接触
させた状態で、前述した３００〜５００Ｖの高電圧Ｖ2
と同等か、もしくは高電圧Ｖ2より低い電圧に設定さ
れ、かつ規定の陽極箔と陰極箔の電極間距離まで放電す
る放電電圧Ｖ3を電流制限用抵抗２０を介して印加し、
そして電流計２１により、放電すれば不良品、放電しな
ければ良品と判定することにより、陽極箔と陰極箔の電
極間距離による良品、不良品の判定検査を行うようにし
たものである。Next, as an inspection step, as shown in FIG. 1C, the above-mentioned 300 is performed with the anode side lead 12a and the cathode side lead 12b of the capacitor element 11 being in contact with the pair of contact terminals 19a, 19b. ~ 500V high voltage V 2
Is set to a voltage equal to or lower than the high voltage V 2 , and a discharge voltage V 3 that discharges up to a specified distance between the electrodes of the anode foil and the cathode foil is applied via the current limiting resistor 20,
Then, the ammeter 21 determines that the product is defective if it discharges and is good if it does not discharge, so that a determination test of a good product or a defective product is performed based on the distance between the electrodes of the anode foil and the cathode foil.
【００１９】なお、上記本発明の一実施の形態において
は、量産の流れ作業を想定して、図１（ａ）（ｂ）に示
す処理と図１（ｃ）に示す検査のスイッチングを、コン
デンサ素子１１の陽極側リード１２ａと陰極側リード１
２ｂを各接触端子に順次接触させることにより行ってい
るが、トランジスタやリレー等のスイッチング素子によ
って図１（ａ）（ｂ）に示す処理と図１（ｃ）に示す検
査の切り替えを行ったり、複数パルスのスイッチングを
行うようにしてもよいものである。In the above-described embodiment of the present invention, the process shown in FIGS. 1A and 1B and the switching of the inspection shown in FIG. Anode side lead 12a and cathode side lead 1 of element 11
2b is sequentially brought into contact with each contact terminal, but switching between the processing shown in FIGS. 1A and 1B and the inspection shown in FIG. 1C is performed by a switching element such as a transistor or a relay. A plurality of pulses may be switched.
【００２０】また、図１（ａ）（ｂ）に示すコンデンサ
１４，１７の容量や各種抵抗の定数は、陽極箔や陰極
箔、セパレータに著しいダメージを与えない設定にしな
ければならないものである。The capacitors 14 and 17 shown in FIGS. 1 (a) and 1 (b) and the constants of various resistances must be set so as not to give significant damage to the anode foil, the cathode foil and the separator.
【００２１】図２（ａ）（ｂ）（ｃ）は図１（ａ）
（ｂ）に示す処理によって、陽極箔と陰極箔の突起によ
るショート箇所が切断されたり、このショート箇所の切
断部における陽極箔と陰極箔の突起による近接箇所が広
げられる状態を示したものである。すなわち、図２
（ａ）は陽極箔２２より突起２３が出ており、この突起
２３が陰極箔２４に接触してショートを起こしている状
態を示したもので、陽極箔２２と陰極箔２４との間に
は、両者２２，２４が接触しないようにセパレータ（図
示せず）を介在させているものである。2A, 2B and 2C are shown in FIG. 1A.
By the process shown in (b), a short-circuited portion due to the protrusion of the anode foil and the cathode foil is cut, or a proximate portion due to the protrusion of the anode foil and the cathode foil at the cut portion of this short-circuited portion is expanded. . That is, FIG.
(A) shows a state in which the protrusions 23 are projected from the anode foil 22 and the protrusions 23 are in contact with the cathode foil 24 to cause a short circuit. Between the anode foil 22 and the cathode foil 24, A separator (not shown) is interposed so that the two 22 and 24 do not come into contact with each other.
【００２２】そしてこの図２（ａ）に示す状態で、図１
（ａ）に示す処理を実施することにより、突起２３の先
端が放電エネルギーにより切断され、すなわちショート
箇所が切断されて図２（ｂ）に示す状態となるものであ
る。そしてこの図２（ｂ）に示す状態で、図１（ｂ）に
示す処理を実施することにより、突起２３の先端がアー
ク放電２５により広げられ、すなわちショート箇所の切
断部における陽極箔２２と陰極箔２４の突起２３による
近接箇所が広げられて図２（ｃ）に示す状態となるもの
である。Then, in the state shown in FIG.
By performing the process shown in (a), the tips of the protrusions 23 are cut by the discharge energy, that is, the short-circuited parts are cut, and the state shown in FIG. 2 (b) is obtained. By performing the process shown in FIG. 1B in the state shown in FIG. 2B, the tips of the protrusions 23 are spread by the arc discharge 25, that is, the anode foil 22 and the cathode at the cut portion of the short portion. The proximate portion of the foil 24 due to the protrusion 23 is widened to be in the state shown in FIG. 2 (c).
【００２３】なお、上記図２（ａ）に示す状態で図１
（ｂ）に示す処理を行うと突起２３の先端が溶けて、こ
れの表面張力により陰極箔２４に接触したままとなり、
処理後もショートしたままとなる場合が多いものであ
る。In addition, in the state shown in FIG.
When the treatment shown in (b) is performed, the tips of the protrusions 23 are melted and the surface tension of the protrusions 23 keeps contacting the cathode foil 24.
In many cases, it remains short-circuited even after processing.
【００２４】上記した本発明の一実施の形態において
は、図１（ａ）に示す低電圧のパルス電流により、図２
（ａ）に示す陽極箔２２と陰極箔２４の突起２３による
ショート箇所を切断するようにしているため、次工程で
図１（ｂ）に示す高電圧のパルス電流を印加した場合、
図２（ｂ）に示すアーク放電がしやすくなり、これによ
り、陽極箔２２と陰極箔２４の電極間距離が十分確保さ
れていない場合においても、電極間距離を確実に広げる
ことができるものである。In the above embodiment of the present invention, the low voltage pulse current shown in FIG.
Since the short portions due to the protrusions 23 of the anode foil 22 and the cathode foil 24 shown in (a) are cut, when the high-voltage pulse current shown in FIG. 1 (b) is applied in the next step,
The arc discharge shown in FIG. 2B is easy to occur, and thus the interelectrode distance can be surely increased even when the interelectrode distance between the anode foil 22 and the cathode foil 24 is not sufficiently secured. is there.
【００２５】また、図１（ｃ）に示すように、規定の陽
極箔２２と陰極箔２４の電極間距離まで放電する放電電
圧Ｖ3を電流制限用抵抗２０を介して印加し、電流計２
１により陽極箔２２と陰極箔２４の電極間距離による良
品、不良品の判定検査を行うようにしているため、この
検査により、その後の工程には電極間距離の広いものを
選別して流すことができ、これにより、コンデンサ素子
１１を内蔵するケースの開口部を封口した完成品の状態
において陽極側リード１２ａと陰極側リード１２ｂにス
トレスが加わった場合においても、ショートしにくい強
いものが得られるものである。Further, as shown in FIG. 1 (c), a discharge voltage V 3 that discharges up to the electrode distance between the specified anode foil 22 and cathode foil 24 is applied through the current limiting resistor 20, and the ammeter 2
Since the inspection of the non-defective product and the defective product based on the distance between the electrodes of the anode foil 22 and the cathode foil 24 is carried out according to 1, the inspection is performed by selecting those having a wide distance between the electrodes in the subsequent steps. As a result, even when stress is applied to the anode side lead 12a and the cathode side lead 12b in the state of a completed product in which the opening of the case containing the capacitor element 11 is sealed, a strong one which is not easily short-circuited can be obtained. It is a thing.
【００２６】図３（ａ）（ｂ）は本発明の一実施の形態
における電解コンデンサの生産工程のフローチャートを
示したもので、この図３（ａ）（ｂ）に示すように、本
発明の一実施の形態においては、ショート検査を行う前
に、まずコンデンサ素子１１の陽極側リード１２ａと陰
極側リード１２ｂに封口部材２６を挿入してコンデンサ
素子１１の陽極側リード１２ａと陰極側リード１２ｂを
固定し、その後、陽極側リード１２ａと陰極側リード１
２ｂ間に低電圧のパルス電流を印加して陽極箔２２と陰
極箔２４の突起２３によるショート箇所を切断し、次に
高電圧のパルス電流を印加して前記ショート箇所の切断
部における陽極箔２２と陰極箔２４の突起２３による近
接箇所を広げ、その後、規定の陽極箔２２と陰極箔２４
の電極間距離まで放電する放電電圧を印加して陽極箔２
２と陰極箔２４の電極間距離による良品、不良品の判定
検査を行って、不良品を排除し、そして良品のみをその
後の組み立て工程に移行させるようにしたものである。FIGS. 3 (a) and 3 (b) show a flow chart of the production process of the electrolytic capacitor according to one embodiment of the present invention. As shown in FIGS. 3 (a) and 3 (b), In one embodiment, before performing the short circuit inspection, first, the sealing member 26 is inserted into the anode side lead 12a and the cathode side lead 12b of the capacitor element 11 to connect the anode side lead 12a and the cathode side lead 12b of the capacitor element 11. After fixing, then the anode side lead 12a and the cathode side lead 1
2b to apply a low-voltage pulse current to cut the short-circuited portion of the anode foil 22 and the cathode foil 24 by the projection 23, and then apply a high-voltage pulse current to the anode foil 22 at the cut-off portion of the short-circuited portion. And the vicinity of the cathode foil 24 by the protrusions 23 are widened, and then the specified anode foil 22 and cathode foil 24
Anode foil 2 by applying a discharge voltage that discharges to the distance between the electrodes
It is configured such that a non-defective product or a defective product is inspected by the distance between the electrodes of the electrode 2 and the cathode foil 24, the defective product is eliminated, and only the non-defective product is transferred to the subsequent assembling process.
【００２７】そして、組み立て工程においては、コンデ
ンサ素子１１に電解液を含浸させてアルミニウムよりな
る有底円筒状のケース２７内に収納し、その後、ケース
２７の開口部を絞り２８によって封口するようにしてい
るものである。In the assembly process, the capacitor element 11 is impregnated with the electrolytic solution and housed in the cylindrical case 27 having a bottom and made of aluminum, and then the opening of the case 27 is closed by the diaphragm 28. It is what
【００２８】上記した図３（ａ）（ｂ）に示す電解コン
デンサにおいては、ショート検査を行う前に、まずコン
デンサ素子１１の陽極側リード１２ａと陰極側リード１
２ｂに封口部材２６を挿入してコンデンサ素子１１の陽
極側リード１２ａと陰極側リード１２ｂを固定し、その
後、低電圧のパルス電流や高電圧のパルス電流等による
処理を行うようにしているため、組み立て工程などのス
トレスに対しても、陽極箔２２と陰極箔２４の電極間距
離の変化は起こりにくく、その結果、ケース２７の開口
部を封口した完成品のリードストレスに対する強度のバ
ラツキも少なくなるものである。In the electrolytic capacitors shown in FIGS. 3 (a) and 3 (b), the anode side lead 12a and the cathode side lead 1 of the capacitor element 11 are first subjected to the short-circuit inspection.
Since the sealing member 26 is inserted into 2b to fix the anode-side lead 12a and the cathode-side lead 12b of the capacitor element 11, and thereafter, processing by low-voltage pulse current or high-voltage pulse current is performed. The distance between the electrodes of the anode foil 22 and the cathode foil 24 is unlikely to change due to stress in the assembly process, etc. As a result, variations in strength against the lead stress of the finished product with the opening of the case 27 sealed are reduced. It is a thing.
【００２９】[0029]
【発明の効果】以上のように本発明の電解コンデンサ
は、陽極側リードを接続した陽極箔と、陰極側リードを
接続した陰極箔と、この陰極箔と前記陽極箔との間に介
在されたセパレータとにより構成されたコンデンサ素子
を備え、このコンデンサ素子の陽極側リードと陰極側リ
ード間に、まず５〜２００Ｖの低電圧のパルス電流を印
加して陽極箔と陰極箔の突起によるショート箇所を切断
し、次に３００〜５００Ｖの高電圧のパルス電流を印加
して前記ショート箇所の切断部における陽極箔と陰極箔
の突起による近接箇所を広げ、その後、規定の陽極箔と
陰極箔の電極間距離まで放電する放電電圧を印加して陽
極箔と陰極箔の電極間距離による良品、不良品の判定検
査を行った後、このコンデンサ素子に電解液を含浸させ
てケース内に収納し、その後、ケースの開口部を封口す
るようにしたもので、この製造方法によれば、まず５〜
２００Ｖの低電圧のパルス電流により陽極箔と陰極箔の
突起によるショート箇所を切断するようにしているた
め、次工程で３００〜５００Ｖの高電圧のパルス電流を
印加した場合にアーク放電がしやすくなり、これによ
り、陽極箔と陰極箔の電極間距離が十分確保されていな
い場合においても、電極間距離を確実に広げることがで
き、また、その後、規定の陽極箔と陰極箔の電極間距離
まで放電する放電電圧を印加して陽極箔と陰極箔の電極
間距離による良品、不良品の判定検査を行うようにして
いるため、この検査により、その後の工程には電極間距
離の広いものを選別して流すことができ、これにより、
ケースの開口部を封口した完成品の状態において陽極側
リードと陰極側リードにストレスが加わった場合におい
ても、ショートしにくい強いものが得られるものであ
る。As described above, the electrolytic capacitor of the present invention includes the anode foil to which the anode lead is connected, the cathode foil to which the cathode lead is connected, and the cathode foil and the anode foil. A capacitor element composed of a separator is provided, and a low-voltage pulse current of 5 to 200 V is first applied between the anode side lead and the cathode side lead of this capacitor element to form a short-circuited portion due to the protrusion of the anode foil and the cathode foil. Cutting, and then applying a high-voltage pulse current of 300 to 500 V to widen the vicinity of the cut portion of the short-circuited portion due to the protrusions of the anode foil and the cathode foil, and thereafter, between the electrodes of the specified anode foil and the cathode foil. After applying a discharge voltage that discharges to a distance and performing a judgment test for good and defective products based on the distance between the electrodes of the anode foil and cathode foil, impregnate this capacitor element with electrolytic solution and store it in the case. Thereafter, the opening of the case which was to be sealed, according to this manufacturing method, first 5
Since the short-circuited portion due to the protrusion of the anode foil and the cathode foil is cut by the low voltage pulse current of 200 V , arc discharge is easily caused when a high voltage pulse current of 300 to 500 V is applied in the next step. , By this, even when the distance between the electrodes of the anode foil and the cathode foil is not sufficiently secured, the distance between the electrodes can be surely increased, and after that, up to the specified distance between the electrodes of the anode foil and the cathode foil. A discharge voltage is applied to discharge, and the product is tested to determine whether it is a good product or a defective product based on the distance between the electrodes of the anode and cathode foils. And then it can be flushed,
Even when stress is applied to the anode-side lead and the cathode-side lead in the state of a completed product with the opening of the case sealed, a strong product that is unlikely to cause a short circuit can be obtained.
【図１】（ａ）〜（ｃ）本発明の一実施の形態における
電解コンデンサの耐電圧向上と検査の工程を示す電気回
路図1 (a) to 1 (c) are electric circuit diagrams showing steps of improving withstand voltage and inspecting an electrolytic capacitor according to an embodiment of the present invention.
【図２】（ａ）〜（ｃ）図１（ａ）（ｂ）に示す処理に
よってショート箇所が切断されたり、近接箇所が広げら
れる状態を示す断面図2A to 2C are cross-sectional views showing a state in which a short-circuited portion is cut or an adjacent portion is widened by the processing shown in FIGS. 1A and 1B.
【図３】（ａ）（ｂ）同電解コンデンサの生産工程を示
すフローチャート3A and 3B are flowcharts showing a production process of the electrolytic capacitor.
【図４】従来の電解コンデンサにおけるコンデンサ素子
の構成を示す展開斜視図FIG. 4 is a developed perspective view showing a configuration of a capacitor element in a conventional electrolytic capacitor.
【図５】同コンデンサ素子の断面図FIG. 5 is a sectional view of the same capacitor element.
【図６】従来の電解コンデンサの生産工程を示すフロー
チャートFIG. 6 is a flowchart showing a production process of a conventional electrolytic capacitor.
１１ コンデンサ素子 １２ａ 陽極側リード １２ｂ 陰極側リード ２２ 陽極箔 ２３ 突起 ２４ 陰極箔 ２６ 封口部材 ２７ ケース 11 Capacitor element 12a Anode side lead 12b Cathode side lead 22 Anode foil 23 Protrusion 24 cathode foil 26 Sealing member 27 cases
───────────────────────────────────────────────────── フロントページの続き (72)発明者 ▲吉▼谷 幸夫 大阪府門真市大字門真1006番地 松下電 器産業株式会社内 (56)参考文献 特開 平１−216518（ＪＰ，Ａ) 特開 平５−74642（ＪＰ，Ａ) 特開 昭54−136649（ＪＰ，Ａ) 特開 昭56−61119（ＪＰ，Ａ) 特開 平１−196115（ＪＰ，Ａ) (58)調査した分野(Int.Cl.7，ＤＢ名) H01G 4/00 - 4/10 H01G 4/14 - 4/42 H01G 9/02 H01G 9/04 - 9/24 H01G 13/00 - 13/06 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor ▲ Yoshi ▼ Yukio Tani 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. (56) Reference JP-A-1-216518 (JP, A) JP Japanese Patent Laid-Open No. 5-74642 (JP, A) Japanese Patent Laid-Open No. 54-136649 (JP, A) Japanese Patent Laid-Open No. 56-61119 (JP, A) Japanese Patent Laid-Open No. 1-196115 (JP, A) (58) Fields investigated (Int .Cl. 7 , DB name) H01G 4/00-4/10 H01G 4/14-4/42 H01G 9/02 H01G 9/04-9/24 H01G 13/00-13/06
Claims (3)
側リードを接続した陰極箔と、この陰極箔と前記陽極箔
との間に介在されたセパレータとにより構成されたコン
デンサ素子を備え、このコンデンサ素子の陽極側リード
と陰極側リード間に、まず５〜２００Ｖの低電圧のパル
ス電流を印加して陽極箔と陰極箔の突起によるショート
箇所を切断し、次に３００〜５００Ｖの高電圧のパルス
電流を印加して前記ショート箇所の切断部における陽極
箔と陰極箔の突起による近接箇所を広げ、その後、規定
の陽極箔と陰極箔の電極間距離まで放電する放電電圧を
印加して陽極箔と陰極箔の電極間距離による良品、不良
品の判定検査を行った後、このコンデンサ素子に電解液
を含浸させてケース内に収納し、その後、ケースの開口
部を封口するようにした電解コンデンサの製造方法。1. A capacitor element comprising an anode foil connected to an anode side lead, a cathode foil connected to a cathode side lead, and a separator interposed between the cathode foil and the anode foil, A low-voltage pulse current of 5 to 200 V is first applied between the anode side lead and the cathode side lead of this capacitor element to cut the short-circuited portion due to the protrusion of the anode foil and the cathode foil, and then the high voltage of 300 to 500 V is applied. Pulse current is applied to spread the proximity of the anode foil and cathode foil by the projection of the anode foil and cathode foil at the cut portion of the short circuit, and then the discharge voltage is applied to discharge the electrode foil between the specified anode foil and cathode foil. After checking the good and bad products by the distance between the electrodes of the foil and cathode foil, impregnate this capacitor element with electrolyte and store it in the case, then seal the opening of the case. Of manufacturing electrolytic capacitor.
側リードを接続した陰極箔と、この陰極箔と前記陽極箔
との間に介在されたセパレータとにより構成されたコン
デンサ素子を備え、このコンデンサ素子の陽極側リード
と陰極側リードにまず封口部材を挿入し、その後、前記
陽極側リードと陰極側リード間に５〜２００Ｖの低電圧
のパルス電流を印加して陽極箔と陰極箔の突起によるシ
ョート箇所を切断し、次に３００〜５００Ｖの高電圧の
パルス電流を印加して前記ショート箇所の切断部におけ
る陽極箔と陰極箔の突起による近接箇所を広げ、その
後、規定の陽極箔と陰極箔の電極間距離まで放電する放
電電圧を印加して陽極箔と陰極箔の電極間距離による良
品、不良品の判定検査を行った後、このコンデンサ素子
に電解液を含浸させてケース内に収納し、その後、ケー
スの開口部を封口するようにした電解コンデンサの製造
方法。2. A capacitor element comprising an anode foil to which an anode side lead is connected, a cathode foil to which a cathode side lead is connected, and a separator interposed between the cathode foil and the anode foil, A sealing member is first inserted into the anode side lead and the cathode side lead of this capacitor element, and then a low-voltage pulse current of 5 to 200 V is applied between the anode side lead and the cathode side lead to apply the anode foil and the cathode foil. The short portion due to the protrusion is cut, and then a high-voltage pulse current of 300 to 500 V is applied to widen the proximity portion due to the protrusion of the anode foil and the cathode foil in the cut portion of the short portion, and thereafter, with the specified anode foil. After applying a discharge voltage that discharges to the distance between the electrodes of the cathode foil and performing a judgment test for good and defective products based on the distance between the electrodes of the anode foil and the cathode foil, impregnate this capacitor element with an electrolytic solution. A method of manufacturing an electrolytic capacitor, which is housed in a case and then the opening of the case is sealed.
側リードを接続した陰極箔と、この陰極箔と前記陽極箔
との間に介在されたセパレータとにより構成されたコン
デンサ素子の陽極側リードと陰極側リード間に、まず５
〜２００Ｖの低電圧のパルス電流を印加して陽極箔と陰
極箔の突起によるショート箇所を切断し、次に３００〜
５００Ｖの高電圧のパルス電流を印加して前記ショート
箇所の切断部における陽極箔と陰極箔の突起による近接
箇所を広げるようにしたコンデンサ素子の処理方法。3. An anode side of a capacitor element constituted by an anode foil to which an anode side lead is connected, a cathode foil to which a cathode side lead is connected, and a separator interposed between the cathode foil and the anode foil. First, between the lead and the cathode side lead, 5
By applying a pulse current of low voltage ~200V cut short portion of the projections of the anode foil and the cathode foil, then 300
A method of treating a capacitor element, wherein a high-voltage pulse current of 500 V is applied to widen a proximity portion due to a protrusion of an anode foil and a cathode foil in a cut portion of the short circuit portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP05456897A JP3498521B2 (en) | 1997-03-10 | 1997-03-10 | Method for producing electrolytic capacitor and method for treating capacitor element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP05456897A JP3498521B2 (en) | 1997-03-10 | 1997-03-10 | Method for producing electrolytic capacitor and method for treating capacitor element |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH10256104A JPH10256104A (en) | 1998-09-25 |
| JP3498521B2 true JP3498521B2 (en) | 2004-02-16 |
Family
ID=12974306
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP05456897A Expired - Fee Related JP3498521B2 (en) | 1997-03-10 | 1997-03-10 | Method for producing electrolytic capacitor and method for treating capacitor element |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3498521B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7445884B2 (en) * | 2019-12-27 | 2024-03-08 | パナソニックＩｐマネジメント株式会社 | Inspection methods, management methods, production methods, and inspection systems |
| KR102819820B1 (en) * | 2021-09-10 | 2025-06-12 | 엘지디스플레이 주식회사 | Display device |
-
1997
- 1997-03-10 JP JP05456897A patent/JP3498521B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH10256104A (en) | 1998-09-25 |
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