JP3499433B2 - Material testing machine - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is a material capable of accurately collecting the load and displacement of a load-applied test piece at a fixed cycle and processing the data, thereby improving the test accuracy. Regarding testing machines.

[0002]

2. Related Background Art Generally, a material testing machine has a testing machine body 1 for applying a load such as a load or a displacement to a specimen and an operation of the testing machine body 1 as shown in the schematic configuration of FIG. Dynamometer 2 for controlling the load and displacement of the specimen under load, and to obtain the material properties of the specimen according to the data consisting of the load and the displacement detected by the dynamometer 2. And the data processing device 3.

Specifically, the tester main body 1 has a pair of chucks (not shown) on which test pieces such as metal material pieces are mounted.
A fluid pressure of a hydraulic cylinder or the like is used to apply a compressive load or a tensile load, or a load consisting of a compressive displacement or a tensile displacement, to the sample. In addition, a load such as bending may be applied in addition to compression and tension. Therefore, the dynamometer 2 controls the load on the tester main body 1 by the control unit 2a, and via the load meter (load cell) 1a and the displacement meter (extension meter) 1b incorporated in the tester main body 1. The measurement unit 2b is configured to measure the load and the displacement applied to the specimen.

On the other hand, the data processing device 3 is composed of, for example, a personal computer, and is configured to take in data including the load and displacement detected by the dynamometer 2 at a predetermined cycle and process the data. To be done. In the data processing device 3, the load / elongation characteristics, stress / strain characteristics, and further strength of the test piece are obtained.
In some cases, the data processing device 3 may give a control command to the dynamometer 2 to start the material test by the tester body 1.

[0005]

By the way, the dynamometer 2 mainly composed of a microprocessor operates a counter circuit under the control of the microprocessor so that the dynamometer has a fixed cycle in terms of hardware, for example, every 50 mSec. In addition, the load and the displacement are sampled and detected respectively.

On the other hand, the personal computer which constitutes the data processing device 3 is usually constructed so that it can handle various software programs under the control of the management program. Then, as one of the software programs, a control program for operating the dynamometer 2 and thus the tester main body 1 to test the specimen, and measurement data obtained by the dynamometer 2 are taken in and processed. The data processing device 3 is realized by incorporating a test program or the like for obtaining the material characteristics of the specimen. Therefore, it is undeniable that coordination among various programs in the management program in the data processing device 3 is difficult and the processing load thereof becomes large. Therefore, there is a problem in that even if the data processing device 3 tries to capture the measured data including the load and the displacement described above at a constant cycle, it is difficult to guarantee the periodicity.

That is, even if the data processing device 3 tries to fetch data from the dynamometer 2 every 50 mSec, for example, there is a deviation in the timing of the data request to be output to the dynamometer 2 due to the management program described above. It is undeniable that an error of up to 2-3 mSec occurs. Therefore, as shown in the concept in FIG. 5, even when data is sampled and detected at a constant cycle on the dynamometer 2 side, there is a deviation in the timing of the data request from the data processing device 3 side. Data series [D1, D2, D3,
D3, ...], the same data D3 is duplicated and taken into the data processing device 3, or the data series [Dn,
[Dn + 1, Dn + 3, Dn + 4, ...] As a result, there occurs a problem that the data Dn + 2 is missing.

The present invention has been made in consideration of such circumstances, and an object thereof is to provide a dynamometer with a constant cycle even if the periodicity of a data request from the data processing device side is not guaranteed. It is an object of the present invention to provide a material testing machine having a simple and highly practical configuration capable of reliably providing the data processing device with the measurement data including the load and the displacement detected in step 3 to ensure the periodicity thereof.

[0009]

In order to achieve the above-mentioned object, the present invention provides a tester main body for applying a load to a test piece, and a tester main body for controlling the operation of the tester main body and applying a load. A dynamometer for detecting load and displacement, and a material testing machine comprising a data processing device for determining material properties of the specimen according to measurement data consisting of the load and displacement detected by the dynamometer, In the dynamometer equipped with sampling means for detecting the load and the displacement of the sample at a predetermined cycle, the data including the load and the displacement sampled and detected as described above is set at the sampling cycle.
A data buffer for sequentially storing a plurality of samples in accordance with a write pointer stepped in synchronization is provided, and when a data request from the data processing device is received,
Compare the write pointer with the read pointer
If the write pointer is ahead,
It is stored in the above data buffer according to the read pointer.
The read data and output it to the data processing device.
After that, data output means for stepping the read pointer
And the write pointer and the read pointer are
Outputs invalid data to the data processor when they are equal
And a data output prohibiting means for controlling the data output .

That is, in the present invention, the dynamometer is provided with a data buffer for sequentially storing data over a plurality of samples,
Data using write and read pointers
Control the writing and reading of data, and when receiving a data request from the data processing device, write pointer and read
Then, while checking the relationship with the pointer, the data written in the above data buffer is sequentially read out and output to the data processing device, and invalid if the read pointer precedes
By outputting the data, the order of the data series given to the data processing device is guaranteed, and thus the periodicity of the data series is guaranteed. For example, each time a data request is received from the data processing device, the measured data is read from the data buffer one sample at a time and transmitted sequentially.

[0011] Preferably the storage of data to the data buffer (write) the read, data bus
By managing the address using a pointer that cyclically designates a plurality of addresses of the buffer, regardless of the timing of the data sampling operation in the dynamometer and the data request from the data processing device, the data of the data buffer is stored. It is characterized in that writing and reading are managed easily and accurately.

[0012]

BEST MODE FOR CARRYING OUT THE INVENTION A material testing machine according to an embodiment of the present invention will be described below with reference to the drawings. This material testing machine is basically the same as described above with reference to FIG. Is composed of a tester main body 1, a dynamometer 2 for controlling its operation, and a data processing device 3, and is particularly characterized by the configuration of the dynamometer 2.

FIG. 1 functionally shows a schematic structure of a dynamometer 2 having a characteristic structure according to an embodiment of the present invention.
The dynamometer 2 is mainly composed of a microprocessor 21 in terms of hardware, and has a counter circuit 22 and a data buffer 2.
3, a transmission buffer 24 is provided. Then, the microprocessor 21 has a main program 21a constructed for controlling the tester main body 1 and a plurality of subprograms 21b, 21b ... Which execute data measurement processing and the like, and manages the interrupt vector table 21c. The programs 21a, 21b, 21b ... Are executed below. The functions of the control unit 2a and the function of the measuring unit 2b described above are realized by software by such programs 21b, 21b ....

The counter circuit 22 includes a plurality of counters 22a, 22a for defining various operation timings.
It has a ... These counters 22a, 22a ...
One of the main programs 2 is to detect the load and the displacement of the specimen under load in the tester main body 1 at a predetermined sampling cycle.
With the initial signal given from 1a as a reference, for example, timing is measured every 10 mSec.

The microprocessor 21 controls the operation of the tester body 1 in accordance with the timing measured by the counter circuit 22, and the test piece (not shown) mounted on the tester body 1 is predetermined. The load and the displacement applied to the sample are sequentially detected at predetermined sampling intervals while applying the load. The detection of the data composed of the load and the displacement is basically performed by the counter 22a.
The period is 10 mSec, which is timed by the reference. However, if the sampling period instructed by the data processing device 3 is 50 mSec, the sampling timing is increased by, for example, multiplying the counter period by 5. Managed. That is, the microprocessor 21 sequentially manages the designated cycle in accordance with a command from the data processing device 3 while managing the designated cycle with high accuracy by hardware using the counter circuit 22, and sequentially sampling the data at the cycle. Has become.

The data buffer 23 sequentially stores the data (sample data D) consisting of the load and displacement sampled and detected at predetermined intervals by the execution of the program in the microprocessor 21.
For example, a data area for storing a plurality of data of 500 samples is provided. In this way, the data sequentially detected in the predetermined cycle is sequentially written in the data buffer 23 according to the write pointer WP that manages the write address of the data buffer 23. The write pointer WP is incremented (+1) every time one sample of data is stored in the data buffer 23.

On the other hand, the reading of the data from the data buffer 23 is controlled according to the read pointer RP that manages the read address of the data buffer 23, and according to the storage order of the data of a plurality of samples stored in the data buffer 23. Each sample is read out. That is, the reading of data from the data buffer 23 is executed under the control of the main program 21a when the data processing device 3 issues a data request to the dynamometer 2 (microprocessor 21). . Then, the data stored in the address specified by the read pointer RP of the data buffer 23 is selectively read and stored in the transmission buffer 24. In this way, the transmission buffer 2
The data stored in No. 4 is transmitted at the data transfer timing following the data request and is taken into the data processing device 3 (data transmission). The read pointer RP reads out one sample of data from the data buffer 23 and increments (+1) each time the data is transmitted to the data processing device 3.

The writing and reading of data to and from the data buffer 23 will now be described in a little more detail.
Each of these controls is executed according to the processing procedure shown in FIGS. 2 and 3, for example. As shown in FIG. 2, in the process of writing data to the data buffer 23, first, the control value N that defines the sampling period designated by the data processing device 3 is set, and the parameter n that manages the sampling period is set to zero [ 0] is initialized. At the same time, the write pointer WP is initialized to zero [0] [step S1]. The control value N is such that the sampling of the data in the dynamometer 2 is basically executed with a cycle of 10 mSec measured by the counter 22a, on the other hand, the sampling cycle designated by the data processor 3 Is 50 mSec, it is set as [N = 5] so that the data becomes valid every five samplings.

When the initial settings are made as described above, an interrupt having 10 mSec as one cycle is next generated using the counter 22a [step S2], and the tester main body 1 is generated at the interrupt generation timing. At step S3, data consisting of the load and displacement applied to the sample is sampled. Then, the parameter n is incremented (+1) [step S4], and whether or not the parameter n has reached the control value N is checked to check the suitability with respect to the specified sampling period, and the data thereof is checked. The validity of [Step S
5]. If the parameter n has not reached the control value N, the data obtained at that time is invalidated (unnecessary data), and the processing procedure from step S2 is repeated.

If data with a sampling period of 50 mSec is obtained under the control of the parameter n, then the parameter n is reset to zero [0] [step S6] and the data buffer The data is stored in the address designated by the write pointer WP 23 [step S7]. Thereafter, the write pointer WP is incremented (+1) [step S8], and it is determined whether or not the write pointer WP has exceeded the final address of the previously prepared data area of the data buffer 23 [step S9]. . Then, when the write pointer WP has not reached the final address, the processing procedure from step S2 described above is repeatedly executed.

When the write pointer WP reaches the final address, the write pointer WP is reset to zero [0] [step S10], and the above-mentioned step S is performed.
The processing procedure from 2 is repeatedly executed. By controlling the write pointer WP in this way, as described above, 50 mSe
The data sampled for each c is the data buffer 2
The data will be written in order from the address [0] of 3.

Incidentally, the data buffer 23 has 50
When the data area (address) is set so as to sequentially store the data of 0 sample, since the final address for storing the data of the 500th sample is [499], the write pointer WP is [500]. Is reached, the write pointer WP is reset to zero [0]. Therefore, data to be newly sampled after 500 samplings are written again in order from the address [0] of the data buffer 23.

On the other hand, as described above, the write pointer WP
50m sequentially written to the data buffer 23 according to
The sample data of the Sec cycle is managed by the read pointer RP as shown in FIG.
The data are sequentially read according to the order of writing to the data. That is,
In this read processing, first, the read pointer RP is set to zero.
It starts by initializing to [0] [Step S1
1]. Then, it is determined whether or not a data request command is issued from the data processing device 3 [step S1.
2], when a data request is given, the following data reading from the data buffer 23 is executed.

This process is carried out by first reading the read pointer RP.
Is determined by determining whether or not it is equal to the above-mentioned write pointer WP [step S13]. This determination is made at least by the write pointer WP when the sample data is stored in the data buffer 23 but the data is not read.
Is preceded by the read pointer RP. In other words, these pointers WP, R
When P is equal to each other, the data sampling at the designated sampling point and the storage of the data in the data buffer 23 are not executed.

When the pointers WP and RP have the same value, invalid data is transmitted in response to the data request [step S14], and the next data request is waited [step S12]. This invalid data is made, for example, by setting data indicating validity / invalidity assigned to a part of the transmission data in the [invalid code]. As a result, the data processing device 3 knows from the invalid code in the data sent from the dynamometer 2 according to the data request that the measured data is invalid data and eliminates it.

On the other hand, when the pointers WP and RP have different values, the address of the data buffer 23 specified by the read pointer RP at that time is designated. Then, the data stored in the address is selectively read out, stored in the transmission buffer 24, and transmitted to the data processing device 3 [step S1.
5]. Then, the read pointer RP is incremented (+1) [step S16], and it is determined whether the read pointer RP has exceeded the final address of the data buffer 23 [step S17]. When the read pointer RP has not reached the final address, the processing procedure from step S12 described above is repeatedly executed, and data is read from the data buffer 23 each time a data request from the data processing device 3 is received. Run.

When the read pointer RP reaches the final address, the read pointer RP is reset to zero [0] [step S18], and the processing procedure from step S12 is repeatedly executed. When the read pointer RP is reset to zero [0] in this way, the write pointer WP is also reset to zero [0] prior to this, and the address [0] of the data buffer 23 is Since the data writing is performed again, the reading of the data from the data buffer 23 is executed without any trouble in the writing order.

Thus, according to the material testing machine configured as described above, the data buffer 23 for holding the data of a plurality of samples is particularly provided, and the data is written into the data buffer 23 by using the write pointer WP and the read pointer RP. According to the dynamometer 2 for controlling the reading and the reading thereof, the data sampled and detected at a predetermined cycle is once written in order to the data buffer 23, and then the data buffer receives the data request from the data processing device 3. It is possible to sequentially read the data from 23 in accordance with the writing order and to send the data to the data processing device 3. Therefore, even if there is some deviation in the output timing of the data request from the data processing device 3, that is, even if the data request cycle includes a large error, the dynamometer 2 will not affect the cycle. The order of the data series transmitted to the data processing device 3 can always be kept constant.

Particularly, this data series is used in the data processing device 3.
Irrespective of the operation timing, the dynamometer 2 is sampled and detected under a predetermined cycle that is set with high accuracy in terms of hardware, so the periodicity between the data is guaranteed with high accuracy. ing. Therefore, even if there is some deviation in the timing of the data request, the periodicity between the data in the data series sequentially obtained from the dynamometer 2 (data buffer 23) in accordance with the data request is guaranteed. In No. 3, data processing can be advanced with high accuracy in accordance with the data sequence having the high periodicity. As a result, the test accuracy in the material testing machine can be simplified and effectively improved.

Further, as shown in this embodiment, the dynamometer 2 may be provided with the data buffer 23 as described above, and the writing and reading of data to and from the data buffer 23 may be controlled respectively. The configuration is very simple, since it does not require any changes to. Moreover, it is not necessary to secure a fixed cycle by the outside, that is, to secure a fixed cycle of the data request. Therefore, the stabilization of the program operation in the data processing device 3 can be easily ensured, and the reliability of the data can be simply ensured, so that the load on the software can be reduced. Played.

The present invention is not limited to the above-described embodiment. For example, as the above-mentioned data buffer 23, a shift register having a plurality of tap outputs is used to sequentially output a plurality of samples of data to the shift register. The periodicity of the data series may be ensured by inputting the data and selecting the tap output while determining the cycle (timing) of the data request from the data processing device 3. However, in this case, it is necessary to accurately determine the deviation between the data write timing to the shift register and the data request cycle (timing), and therefore the control becomes complicated compared to the above-described embodiment. There is no denying it.

Further, in the above-described embodiment, the data sampled with 10 mSec as the reference cycle is selected according to the sampling cycle required by the data processing device 3, and this is sequentially stored in the data buffer 23 as the data of the predetermined sampling cycle. However, it is also possible to generate an interrupt by hardware at a cycle designated by the data processing device 3 and execute sampling detection of load and displacement only at the cycle. Further, in response to one data request, the data of a plurality of untransmitted samples stored in the data buffer 23 up to that point may be sequentially and collectively transmitted. In this case, it is preferable that auxiliary data indicating how many samples of data to be transmitted is also transmitted. In addition, the present invention can be variously modified and implemented without departing from the scope of the invention.

[0033]

As described above, according to the present invention, the dynamometer provided with the sampling means for detecting the load and the displacement of the specimen at a predetermined cycle has the data including the load and the displacement as described above. A data buffer for sequentially storing a plurality of samples, each time a data request from the data processing device is received, the data stored in the data buffer is sequentially read according to the storage order and output to the data processing device. Even if the cycle of the data request given from the data processing device is not guaranteed, the order of the data series given to the data processing device can be easily and surely guaranteed. As a result, it becomes possible to effectively guarantee the periodicity of the data series subjected to the data processing in the data processing device and sufficiently secure the test accuracy.

Further, as described in claim 2, since address writing and reading of data to and from the data buffer are performed by using pointers, data sampling operation in the dynamometer and data request from the data processing device are performed. Regardless of the timing deviation, the writing and reading of data to and from the data buffer can be managed easily and accurately, which is a great practical effect.

[Brief description of drawings]

FIG. 1 is a diagram functionally showing a schematic configuration of a dynamometer having a characteristic configuration of a material testing machine according to an embodiment of the present invention.

FIG. 2 is a diagram showing a procedure of write control of sample data to the data buffer shown in FIG.

FIG. 3 is a diagram showing a procedure for controlling reading of sample data from the data buffer shown in FIG. 1.

FIG. 4 is an overall schematic configuration diagram of a material testing machine.

FIG. 5 is a diagram schematically showing a defect regarding periodicity of sample data in a conventional material testing machine.

[Explanation of symbols]

1 Testing machine body 1a load cell 1b Displacement meter 2 dynamometer 2a Control unit 2b Measuring section 3 Data processing device 21 microprocessors 22 Counter circuit 23 data buffer 24 send buffer

─────────────────────────────────────────────────── ─── Continuation of the front page (56) Reference JP-A 64-88330 (JP, A) JP-A 64-88329 (JP, A) JP-A 8-313421 (JP, A) JP-A 8- 184541 (JP, A) JP-A-5-281114 (JP, A) Actual development Sho 63-109636 (JP, U) (58) Fields investigated (Int.Cl. ⁷ , DB name) G01N 3/00-3 / 62 JISST file (JOIS)

Claims (2)

(57) [Claims] 1. A tester main body for applying a load to a test piece, a dynamometer for controlling the operation of the tester main body and detecting the load and displacement of the test piece under load, and this dynamometer Comprising a data processing device for determining the material characteristics of the specimen according to the detected load and displacement, the dynamometer, sampling means for detecting the load and displacement of the specimen in a predetermined cycle, in the sampling cycle Writing points that are stepped in synchronization
A data buffer for sequentially storing data consisting of the load and displacement detected by the sampling means over a plurality of samples in accordance with the data, and a data request from the data processing device ,
Compare the write pointer with the read pointer
If the write pointer is ahead,
It is stored in the above data buffer according to the read pointer.
The read data and output it to the data processing device.
After that, data output means for stepping the read pointer
And the write pointer and the read pointer are equal
When it is not valid, invalid data is output to the data processing device.
A material testing machine characterized by comprising data output prohibiting means . 2. The write pointer and read pointer
The interface has a plurality of addresses of the data buffer.
The write pointer is used to cyclically specify a data
Each time data is written to the
The interface reads the data from the data buffer.
The material testing machine according to claim 1, wherein the material testing machine is stepped each time .