JP3511228B2 - Ethylcyclopentadienyl (1,5-cyclooctadiene) iridium, method for producing the same, and method for producing iridium-containing thin film using the same - Google Patents
Ethylcyclopentadienyl (1,5-cyclooctadiene) iridium, method for producing the same, and method for producing iridium-containing thin film using the sameInfo
- Publication number
- JP3511228B2 JP3511228B2 JP12940798A JP12940798A JP3511228B2 JP 3511228 B2 JP3511228 B2 JP 3511228B2 JP 12940798 A JP12940798 A JP 12940798A JP 12940798 A JP12940798 A JP 12940798A JP 3511228 B2 JP3511228 B2 JP 3511228B2
- Authority
- JP
- Japan
- Prior art keywords
- iridium
- cyclooctadiene
- thin film
- ethylcyclopentadienyl
- producing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000010409 thin film Substances 0.000 title claims description 29
- SFGLQAJOHPDTPZ-UHFFFAOYSA-N [Ir].C(C)C1(C=CC=C1)C1=CCCC=CCC1 Chemical compound [Ir].C(C)C1(C=CC=C1)C1=CCCC=CCC1 SFGLQAJOHPDTPZ-UHFFFAOYSA-N 0.000 title claims description 24
- 238000004519 manufacturing process Methods 0.000 title claims description 15
- 229910052741 iridium Inorganic materials 0.000 title claims description 7
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 title claims description 7
- 238000000034 method Methods 0.000 claims description 19
- 238000005229 chemical vapour deposition Methods 0.000 claims description 18
- 239000000758 substrate Substances 0.000 claims description 15
- 239000002904 solvent Substances 0.000 claims description 4
- OOFOOWBKEGKSBQ-UHFFFAOYSA-N sodium;5-ethylcyclopenta-1,3-diene Chemical compound [Na+].CC[C-]1C=CC=C1 OOFOOWBKEGKSBQ-UHFFFAOYSA-N 0.000 claims description 3
- 150000001875 compounds Chemical class 0.000 description 16
- 239000007788 liquid Substances 0.000 description 15
- 239000010408 film Substances 0.000 description 13
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 12
- 239000002994 raw material Substances 0.000 description 11
- 239000012298 atmosphere Substances 0.000 description 10
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 8
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 8
- 239000001301 oxygen Substances 0.000 description 8
- 229910052760 oxygen Inorganic materials 0.000 description 8
- 239000001257 hydrogen Substances 0.000 description 7
- 229910052739 hydrogen Inorganic materials 0.000 description 7
- 238000000197 pyrolysis Methods 0.000 description 7
- 238000004458 analytical method Methods 0.000 description 6
- 230000008018 melting Effects 0.000 description 6
- 238000002844 melting Methods 0.000 description 6
- 239000012535 impurity Substances 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 230000005587 bubbling Effects 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 4
- 239000012159 carrier gas Substances 0.000 description 4
- BGTOWKSIORTVQH-UHFFFAOYSA-N cyclopentanone Chemical compound O=C1CCCC1 BGTOWKSIORTVQH-UHFFFAOYSA-N 0.000 description 4
- 238000001704 evaporation Methods 0.000 description 4
- -1 pentadienyl Chemical group 0.000 description 4
- 238000003756 stirring Methods 0.000 description 4
- 238000005979 thermal decomposition reaction Methods 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- LMWPLSQCTNLPGA-UHFFFAOYSA-N [Ir].CC1(C=CC=C1)C1=CCCC=CCC1 Chemical compound [Ir].CC1(C=CC=C1)C1=CCCC=CCC1 LMWPLSQCTNLPGA-UHFFFAOYSA-N 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- HLYTZTFNIRBLNA-LNTINUHCSA-K iridium(3+);(z)-4-oxopent-2-en-2-olate Chemical compound [Ir+3].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O HLYTZTFNIRBLNA-LNTINUHCSA-K 0.000 description 3
- 239000011734 sodium Substances 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 238000000859 sublimation Methods 0.000 description 3
- 230000008022 sublimation Effects 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 238000005160 1H NMR spectroscopy Methods 0.000 description 2
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 125000000058 cyclopentadienyl group Chemical group C1(=CC=CC1)* 0.000 description 2
- 229910001882 dioxygen Inorganic materials 0.000 description 2
- 238000004993 emission spectroscopy Methods 0.000 description 2
- ZSWFCLXCOIISFI-UHFFFAOYSA-N endo-cyclopentadiene Natural products C1C=CC=C1 ZSWFCLXCOIISFI-UHFFFAOYSA-N 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 150000002902 organometallic compounds Chemical class 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- UMNPERIIMBANHL-UHFFFAOYSA-N sodium;2-methylcyclopenta-1,3-diene Chemical compound [Na+].CC1=[C-]CC=C1 UMNPERIIMBANHL-UHFFFAOYSA-N 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 230000002194 synthesizing effect Effects 0.000 description 2
- AZFHXIBNMPIGOD-LNTINUHCSA-N (z)-4-hydroxypent-3-en-2-one;iridium Chemical compound [Ir].C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O AZFHXIBNMPIGOD-LNTINUHCSA-N 0.000 description 1
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
- 239000005977 Ethylene Substances 0.000 description 1
- 239000007983 Tris buffer Substances 0.000 description 1
- TVRHDFJMHSSQCP-UHFFFAOYSA-M [Ir]Cl.C1CC=CCCC=C1 Chemical compound [Ir]Cl.C1CC=CCCC=C1 TVRHDFJMHSSQCP-UHFFFAOYSA-M 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 239000012300 argon atmosphere Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000001351 cycling effect Effects 0.000 description 1
- 125000002188 cycloheptatrienyl group Chemical group C1(=CC=CC=CC1)* 0.000 description 1
- CBODOYGAWVREOV-UHFFFAOYSA-N cyclohexa-1,3-diene iridium Chemical compound [Ir].C1CC=CC=C1 CBODOYGAWVREOV-UHFFFAOYSA-N 0.000 description 1
- 125000003678 cyclohexadienyl group Chemical group C1(=CC=CCC1)* 0.000 description 1
- JJQVHODEIZDXSW-UHFFFAOYSA-N cycloocta-1,5-diene iridium Chemical compound [Ir].C1CC=CCCC=C1 JJQVHODEIZDXSW-UHFFFAOYSA-N 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- PTCDSXUUSKNNBE-UHFFFAOYSA-N ethene;iridium;1,2,3,4,5-pentamethylcyclopentane Chemical compound [Ir].C=C.C=C.C[C]1[C](C)[C](C)[C](C)[C]1C PTCDSXUUSKNNBE-UHFFFAOYSA-N 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000003446 ligand Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000005546 reactive sputtering Methods 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 238000010992 reflux Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 239000013076 target substance Substances 0.000 description 1
- 238000005292 vacuum distillation Methods 0.000 description 1
- 239000011345 viscous material Substances 0.000 description 1
- 230000004580 weight loss Effects 0.000 description 1
Landscapes
- Chemical Vapour Deposition (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は、エチルシクロペン
タジエニル(1,5−シクロオクタジエン)イリジウム
(C2H5C5H4)Ir(C8H12)とその製造方
法及びそれを用いて化学気相成長法(以下CVD法と表
す)によりイリジウム含有薄膜を製造する方法に関す
る。TECHNICAL FIELD The present invention relates to ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5 C 5 H 4 ) Ir (C 8 H 12 ), a method for producing the same, and a method for producing the same. The present invention relates to a method for producing an iridium-containing thin film by a chemical vapor deposition method (hereinafter referred to as a CVD method).
【0002】[0002]
【従来の技術】近年、ULSIの高集積化に伴い、キャ
パシターとして高誘電率の(Ba,Sr)TiO3薄
膜、強誘電体のPb(Zr,Ti)O3薄膜などが開発
されつつある。この電極として、Irおよび/またはI
rO2薄膜が検討されている。該Ir薄膜の製法として
は、Ir金属のスパッタリングが多く用いられ、IrO
2 薄膜の製法としてはIr金属の反応性スパッタリング
が多く用いられているが、より微細化した場合のステッ
プカバレジや量産性への対応として、CVD法が期待さ
れている。CVD法に用いる揮発性のIr化合物として
は、トリス(ジピバロイルメタナート)イリジウムIr
(dpm)3やトリス(アセチルアセトナート)イリジ
ウムIr(acac)3やシクロペンタジエニル(1,
5−シクロオクタジエン)イリジウム(C5H5)Ir
(C8H12)やメチルシクロペンタジエニル(1,5
−シクロオクタジエン)イリジウム(CH3C5H4)
Ir(C8H12)などが検討されている。2. Description of the Related Art In recent years, with high integration of ULSI, a high dielectric constant (Ba, Sr) TiO 3 thin film and a ferroelectric Pb (Zr, Ti) O 3 thin film have been developed as capacitors. As this electrode, Ir and / or I
rO 2 thin films have been investigated. The preparation of the Ir film, sputtering of Ir metal is used often, IrO
Although reactive sputtering of Ir metal is often used as a method for manufacturing the 2 thin film, the CVD method is expected as a measure for step coverage and mass productivity in the case of further miniaturization. As the volatile Ir compound used in the CVD method, tris (dipivaloylmethanato) iridium Ir is used.
(Dpm) 3 and tris (acetylacetonato) iridium Ir (acac) 3 and cyclopentanone dienyl (1,
5-Cyclooctadiene) iridium (C 5 H 5 ) Ir
(C 8 H 12 ) and methylcyclopentadienyl (1,5
- cyclooctadiene) iridium (CH 3 C 5 H 4)
Ir (C 8 H 12 ) and the like are being studied.
【0003】平成7年春季第42回応用物理学関係連合
講演会講演予稿集p491,30−p−D−14(中林
ら)では、CVD法で原料としてIr(dpm)3を用
い、500〜600℃のSi基板上にIrを成膜し、そ
の後空気中、600℃で熱処理して、IrO2としたこ
とが開示されている。しかしIr(dpm)3は融点2
35℃の室温では固体結晶であり、0.1Torrの蒸
気圧は150℃付近であり、昇華による供給となる。In the proceedings of the 42nd Joint Lecture Meeting on Applied Physics in Spring 1995, p491,30-p-D-14 (Nakabayashi et al.), Ir (dpm) 3 was used as a raw material in the CVD method, and 500. It is disclosed that an Ir film is formed on a Si substrate at ˜600 ° C. and then heat-treated at 600 ° C. in air to obtain IrO 2 . However, Ir (dpm) 3 has a melting point of 2
It is a solid crystal at room temperature of 35 ° C., the vapor pressure of 0.1 Torr is around 150 ° C., and it is supplied by sublimation.
【0004】平成7年秋季第56回応用物理学会学術講
演会講演予稿集p400,27p−ZG−3(老月ら)
では、CVD法で原料としてIr(acac)3を用
い、400℃のMgO基板上にIrO2を成膜したこと
が開示されている。しかしIr(acac)3は融点2
69℃の室温では固体結晶であり、0.1Torrの蒸
気圧は180℃付近であり、昇華による供給となる。Proceedings of the 56th Autumn Meeting of the Applied Physics Society of Japan p400, 27p-ZG-3 (Otsuki et al.)
Discloses that Ir (acac) 3 is used as a raw material by a CVD method and IrO 2 is deposited on a MgO substrate at 400 ° C. However, Ir (acac) 3 has a melting point of 2
It is a solid crystal at room temperature of 69 ° C., the vapor pressure of 0.1 Torr is around 180 ° C., and it is supplied by sublimation.
【0005】J.B.Hoke,E.W.Stern
and H.H.Murray,J.Mater.Ch
em.Vol.1,551(1991)には、95℃に
保った(C5H5)Ir(C8H12)や(CH3C5
H4)Ir(C8H12)からの蒸気を水素ガスに同伴
させ、120℃の溶融シリカ基板に炭素1原子%以下の
イリジウム金属の膜をCVD法で形成したことが開示さ
れている。更には、80℃に保った(C5H5)Ir
(C8H12)や(CH3C5H4)Ir(C
8H12)からの蒸気を酸素分圧1.3Torr下で酸
化し、270℃の基板に炭素と酸素が1原子%以下のイ
リジウムの膜をCVD法で形成したことが開示されてい
る。J. B. Hoke, E .; W. Stern
and H.D. H. Murray, J .; Mater. Ch
em. Vol. The 1,551 (1991), was maintained at 95 ℃ (C 5 H 5) Ir (C 8 H 12) or (CH 3 C 5
It is disclosed that a vapor of H 4 ) Ir (C 8 H 12 ) is caused to be accompanied by hydrogen gas and a film of iridium metal containing 1 atomic% or less of carbon is formed on a fused silica substrate at 120 ° C. by a CVD method. Further, (C 5 H 5 ) Ir kept at 80 ° C.
(C 8 H 12 ) and (CH 3 C 5 H 4 ) Ir (C
It is disclosed that a vapor of 8 H 12 ) is oxidized under an oxygen partial pressure of 1.3 Torr and a film of iridium containing 1 atomic% or less of carbon and oxygen is formed on a substrate at 270 ° C. by a CVD method.
【0006】USP5130172では、100℃以下
の加熱で得られたLnMRmで表される有機金属化合物
の蒸気を、190℃以下の加熱基板にさらし、次いで、
100℃以下で水素ガスにさらし、該有機金属と水素を
反応させ、金属膜をコーティングするプロセスが開示さ
れている。ここで、LnMRmにおいて、Lは、水素、
エチレン、アリル、メチルアリル、ブタジエニル、ペン
タジエニル、シクロペンタジエニル、メチルシクロペン
タジエニル、シクロヘキサジエニル、ヘキサジエニル、
シクロヘプタトリエニル、またはこれらの誘導体で、炭
素数5より小さいアルキル側鎖を少なくとも一つ持つも
のを表し、Mは、容易に二つの酸化状態をサイクルで
き、かつ炭化水素配位子を触媒水添できる金属を表し、
Rは、メチル、エチル、プロピル、ブチルを表し、n
は、0から金属の価数までの整数で、mは、0から金属
の価数までの整数で、かつ(n+m)が金属の価数とな
る。化合物名を特定したクレームに記載されたIr化合
物は、トリアリルイリジウム(C3H5)3Ir、シク
ロペンタジエニル(ヘキサジエン)イリジウム(C5H
5)Ir(C6H10)、シクロペンタジエニル(シク
ロヘキサジエン)イリジウム(C5H5)Ir(C6H
8)、ペンタメチルシクロペンタジエニルイリジウムビ
ス(エチレン)(C5(CH3)5)Ir(C2H4)
2である。In US Pat. No. 5,130,172, vapor of an organometallic compound represented by L n MR m obtained by heating at 100 ° C. or lower is exposed to a heated substrate at 190 ° C. or lower, and then,
A process of coating a metal film by exposing the organic metal to hydrogen at 100 ° C. or lower and reacting the hydrogen with the hydrogen is disclosed. Here, in L n MR m , L is hydrogen,
Ethylene, allyl, methylallyl, butadienyl, pentadienyl, cyclopentadienyl, methylcyclopentadienyl, cyclohexadienyl, hexadienyl,
Cycloheptatrienyl, or a derivative thereof having at least one alkyl side chain having less than 5 carbon atoms, M is capable of easily cycling between two oxidation states, and has a hydrocarbon ligand as a catalyst water. Represents a metal that can be added,
R represents methyl, ethyl, propyl, butyl, n
Is an integer from 0 to the valence of the metal, m is an integer from 0 to the valence of the metal, and (n + m) is the valence of the metal. The Ir compounds described in the claims specifying the compound names are triaryliridium (C 3 H 5 ) 3 Ir, cyclopentadienyl (hexadiene) iridium (C 5 H
5) Ir (C 6 H 10 ), cyclopentanone dienyl (cyclohexadiene) iridium (C 5 H 5) Ir ( C 6 H
8 ), pentamethylcyclopentadienyl iridium bis (ethylene) (C 5 (CH 3 ) 5 ) Ir (C 2 H 4 ).
It is 2 .
【0007】上記の化合物のうちで、融点が文献 Di
ctionary of Organometalli
c Compounds,Vol.2(2nd Ed.
1996,Chapman & Hall)などに記載
されているものを挙げると表1となる。表1からわかる
ように、すべての化合物は室温25℃で固体である。Among the above compounds, the melting point is in the literature Di
motionary of Organometalli
c Compounds, Vol. 2 (2nd Ed.
Table 1 is a list of those described in 1996, Chapman & Hall) and the like. As can be seen from Table 1, all compounds are solid at room temperature 25 ° C.
【0008】[0008]
【表1】 [Table 1]
【0009】CVD法において、原料化合物を昇華で供
給する方式は、液体で供給する方式やキャリヤーガスの
バブリングによる液体の蒸発で供給する方式に比べ、定
量性、制御性、量産性が劣っている。また加熱して液体
にできれば、蒸発で供給できるためかなり制御性が向上
する。しかし、それでも室温で液体の化合物を使う場合
にくらべ、使用できる方式や装置に制約が付く。そのた
め室温で液体であり、加熱して充分な蒸気圧を有する原
料化合物が求められている。しかしCVD法でIrの薄
膜を形成でき、室温25℃で液体でかつ蒸気圧を有する
化合物は公知でない。In the CVD method, the method of supplying the raw material compound by sublimation is inferior in quantitativeness, controllability, and mass productivity to the method of supplying by liquid or the method of supplying by evaporation of liquid by bubbling a carrier gas. . In addition, if it can be heated to form a liquid, it can be supplied by evaporation, so the controllability is considerably improved. However, there are still restrictions on the methods and devices that can be used as compared with the case of using a compound that is liquid at room temperature. Therefore, a raw material compound that is liquid at room temperature and has a sufficient vapor pressure when heated is required. However, a compound capable of forming an Ir thin film by the CVD method, liquid at room temperature of 25 ° C., and having a vapor pressure is not known.
【0010】[0010]
【発明が解決しようとする課題】本発明が解決しようと
する課題は、CVD法でIr、IrO2薄膜を形成する
際、室温25℃で液体で、かつ充分な蒸気圧を有する化
合物を開示し、それを用いてCVDを行いIr、IrO
2薄膜をつくる方法を提供することである。さらにその
化合物の製造方法を提供することである。The problem to be solved by the present invention discloses a compound which is liquid at room temperature of 25 ° C. and has a sufficient vapor pressure when forming an Ir or IrO 2 thin film by a CVD method. , CVD using it, Ir, IrO
2 to provide a method of making a thin film. Another object is to provide a method for producing the compound.
【0011】[0011]
【課題を解決するための手段】本発明者は、長年有機金
属化合物の合成およびそれを用いたCVDを研究してき
た。上記課題を解決するために、未公知のエチルシクロ
ペンタジエニル(1,5−シクロオクタジエン)イリジ
ウム(C2H5C5H4)Ir(C8H12)を合成
し、精製し、融点、蒸気圧を測定したところ、好ましい
物性であり、さらにそれを用いCVDでIr、IrO2
膜を作ったところ、安定して良好な膜が得られることを
見いだし本発明を完成するに至った。すなわち本発明
は、Ir、IrO2膜をCVD法でつくるための室温2
5℃で液体の原料として、エチルシクロペンタジエニル
(1,5−シクロオクタジエン)イリジウム(C2H5
C5H4)Ir(C8H12)を見いだしたことによ
る。The present inventor has studied synthesis of organometallic compounds and CVD using the same for many years. In order to solve the above problems, to synthesize a non-known ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5 C 5 H 4) Ir (C 8 H 12), was purified, The melting point and vapor pressure were measured to find that they have favorable physical properties. Further, using them, CVD was carried out to obtain Ir, IrO 2
When a film was made, it was found that a stable and good film was obtained, and the present invention was completed. That is, according to the present invention, the room temperature 2 for forming the Ir, IrO 2 film by the CVD method is used.
As a liquid raw material at 5 ° C., ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5
This is due to the finding of C 5 H 4 ) Ir (C 8 H 12 ).
【0012】[0012]
【発明の実施の形態】本発明の化合物はエチルシクロペ
ンタジエニル(1,5−シクロオクタジエン)イリジウ
ム(C2H5C5H4)Ir(C8H12)である。本
発明は、量産性に優れた上記化合物の製造方法である。
その原型は、J.B.Hoke,E.W.Stern
and H.H.Murray,J.Mater.Ch
em.Vol.1,551(1991)に開示されたメ
チルシクロペンタジエニル(1,5−シクロオクタジエ
ン)イリジウムの合成法である。それはTHF中で、ビ
ス(1,5−シクロオクタジエンクロロイリジウム)
〔(C8H12)IrCl〕2とナトリウムメチルシク
ロペンタジエニドNa(CH3C5H4)を−78℃か
ら室温で攪拌反応させ、回収し、昇華すると、Irにつ
いて81%の収率で、メチルシクロペンタジエニル
(1,5−シクロオクタジエン)イリジウム(CH3C
5H4)Ir(C8H12)が得られることを開示して
いる。The compounds of the present invention DETAILED DESCRIPTION OF THE INVENTION ethyl cyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5 C 5 H 4) Ir (C 8 H 12). The present invention is a method for producing the above compound, which is excellent in mass productivity.
The prototype is J. B. Hoke, E .; W. Stern
and H.D. H. Murray, J .; Mater. Ch
em. Vol. It is a method for synthesizing methylcyclopentadienyl (1,5-cyclooctadiene) iridium disclosed in 1,551 (1991). It in THF, bis (1,5-cyclooctadiene chloro iridium)
[(C 8 H 12 ) IrCl] 2 and sodium methylcyclopentadienide Na (CH 3 C 5 H 4 ) were reacted by stirring at −78 ° C. at room temperature, recovered, and sublimated to obtain an Ir yield of 81%. And methylcyclopentadienyl (1,5-cyclooctadiene) iridium (CH 3 C
It is disclosed that 5 H 4 ) Ir (C 8 H 12 ) is obtained.
【0013】本発明者は、Hokeらの方法において、
ナトリウムメチルシクロペンタジエニドの代わりに、ナ
トリウムエチルシクロペンタジエニドを用いて同様な条
件で反応させれば目的のエチルシクロペンタジエニル
(1,5−シクロオクタジエン)イリジウム(C2H5
C5H4)Ir(C8H12)が得られることを見いだ
した。The present inventor, in the method of Hoke et al.
If sodium ethylcyclopentadienide is used instead of sodium methylcyclopentadienide and the reaction is carried out under similar conditions, the desired ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5
C 5 H 4) found that Ir (C 8 H 12) is obtained.
【0014】反応後、THF溶媒を減圧留去し、生成し
ている粘ちょう物から目的物をヘキサンで抽出し、ヘキ
サンを減圧留去し、ついで真空蒸留すると(105℃/
0.3Torr)淡黄色の液体が得られた。この液体
を、Ir含有量分析、CH分析および1H−NMR分析
からエチルシクロペンタジエニル(1,5−シクロオク
タジエン)イリジウム(C2H5C5H4)Ir(C8
H12)と同定した。融点は14℃で過冷却しやすい液
体であり、室温での粘度は約20cP程度である。空気
中で安定で水と反応しにくい。熱安定性が高く、Ar雰
囲気1気圧下のTG−DTAによれば、260℃で10
0%蒸発した。After the reaction, the THF solvent was distilled off under reduced pressure, the target substance was extracted from the resulting viscous product with hexane, the hexane was distilled off under reduced pressure, and the residue was vacuum distilled (105 ° C /
A light yellow liquid (0.3 Torr) was obtained. This liquid was analyzed by Ir content analysis, CH analysis and 1 H-NMR analysis to obtain ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5 C 5 H 4 ) Ir (C 8
H 12 ). It has a melting point of 14 ° C. and is a liquid that is easily supercooled, and its viscosity at room temperature is about 20 cP. Stable in air and difficult to react with water. It has high thermal stability, and according to TG-DTA under 1 atmosphere of Ar atmosphere, it is 10 at 260 ° C.
Evaporated 0%.
【0015】本発明は、電子材料の原料として使い得る
高純度のエチルシクロペンタジエニル(1,5−シクロ
オクタジエン)イリジウム(C2H5C5H4)Ir
(C8H12)を合成する方法でもある。The present invention is a highly pure ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5 C 5 H 4 ) Ir which can be used as a raw material for electronic materials.
It is also a method of synthesizing (C 8 H 12 ).
【0016】本発明は、エチルシクロペンタジエニル
(1,5−シクロオクタジエン)イリジウム(C2H5
C5H4)Ir(C8H12)を用いて、CVD法でI
r含有薄膜をつくる方法でもある。この化合物を80〜
150℃程度に保ち、この液に減圧下でキャリヤーガス
をバブリングさせ蒸発同伴させ、熱分解反応器中に送
り、水素雰囲気中100〜500℃の基板上で熱分解さ
せるとIr薄膜が形成できる。また、低酸素分圧中25
0〜500℃の基板上で熱分解させるとIr薄膜が形成
できる。バブリングで蒸発供給する代わりに、液体マス
フローコントローラーで供給して蒸発させる方式も可能
である。The present invention is directed to ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5
C 5 H 4 ) Ir (C 8 H 12 ) is used to form I by the CVD method.
It is also a method of forming an r-containing thin film. 80 to this compound
An Ir thin film can be formed by keeping the temperature at about 150 ° C., bubbling a carrier gas in this solution under reduced pressure to evaporate it, sending it into a thermal decomposition reactor, and thermally decomposing it on a substrate at 100 to 500 ° C. in a hydrogen atmosphere. Also, during low oxygen partial pressure 25
An Ir thin film can be formed by thermal decomposition on a substrate at 0 to 500 ° C. Instead of bubbling and evaporating and supplying, a method of supplying and evaporating by a liquid mass flow controller is also possible.
【0017】本発明でIr薄膜を形成する第一の方法
は、水素雰囲気下、100〜500℃の基板上で熱分解
する方法である。水素雰囲気下で得られるIr薄膜は、
きれいな鏡面で、炭素取り込みの少ない金属膜である。
IrO2薄膜を得るには、550℃以上で酸素ガス共存
下に熱分解するか、Ir薄膜を形成後、酸素を含んだ雰
囲気中で550℃以上で熱処理することによって得られ
る。The first method of forming an Ir thin film in the present invention is a method of thermally decomposing on a substrate at 100 to 500 ° C. in a hydrogen atmosphere. The Ir thin film obtained in a hydrogen atmosphere is
A metal film with a clean mirror surface and low carbon uptake.
The IrO 2 thin film can be obtained by thermal decomposition at 550 ° C. or higher in the presence of oxygen gas, or by forming an Ir thin film and then heat-treating at 550 ° C. or higher in an atmosphere containing oxygen.
【0018】本発明でIr薄膜を形成する第二の方法
は、低圧酸素雰囲気下、250〜500℃の基板上で熱
分解する方法である。低圧酸素雰囲気下で得られるIr
薄膜は、きれいな鏡面で、炭素や酸素の取り込みの少な
い金属膜である。この方法は、還元雰囲気を嫌う化合物
の上に膜付けする時に好都合である。The second method of forming an Ir thin film in the present invention is a method of thermally decomposing on a substrate at 250 to 500 ° C. in a low pressure oxygen atmosphere. Ir obtained under low pressure oxygen atmosphere
The thin film is a metal film with a clean mirror surface and little uptake of carbon and oxygen. This method is convenient when depositing a film on a compound that dislikes a reducing atmosphere.
【0019】[0019]
【実施例1】エチルシクロペンタジエニル(1,5−シ
クロオクタジエン)イリジウム(C2H5C5H4)I
r(C8H12)の製造
リフラックスコンデンサー、温度計、滴下ロート、攪拌
羽根を備えた500ml四口フラスコを真空置換しアル
ゴン雰囲気とし、THF350mlを仕込み、次いで、
ビス(1,5−シクロオクタジエンクロロイリジウム)
〔(C8H12)IrCl〕216.8g(25.0m
mol)を仕込み溶解させた。この反応フラスコを−7
8℃に冷却し、攪拌しながら、滴下ロートからナトリウ
ムエチルシクロペンタジエニドNa(C2H5C
5H4)7.2g(62.0mmol)のTHF溶液3
1mlを添加した。−78℃で30分攪拌後、徐々に室
温まで昇温し、室温で30分攪拌した。次いで、減圧下
で溶媒類を留去し、残った粘ちょう物にヘキサン300
mlを加え溶解した。少量の沈殿物を濾過により除き、
ヘキサンを留去し、約0.3Torrで真空蒸留する
と、100〜110℃の留分として淡黄色の液体が1
5.2g得られた。この液体は、以下の同定により、エ
チルシクロペンタジエニル(1,5−シクロオクタジエ
ン)イリジウム(C2H5C5H4)Ir(C
8H12)であり、38.6mmolに相当し、収率7
7%であった。Example 1 Ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5 C 5 H 4 ) I
Production of r (C 8 H 12 ) A 500 ml four-necked flask equipped with a reflux condenser, a thermometer, a dropping funnel, and a stirring blade was vacuum-replaced to an argon atmosphere and charged with 350 ml of THF, then,
Bis (1,5-cyclooctadienechloroiridium)
[(C 8 H 12 ) IrCl] 2 16.8 g (25.0 m
(mol) was charged and dissolved. -7 this reaction flask
After cooling to 8 ° C. and stirring, sodium ethylcyclopentadienide Na (C 2 H 5 C
5 H 4 ) 7.2 g (62.0 mmol) in THF solution 3
1 ml was added. After stirring at −78 ° C. for 30 minutes, the temperature was gradually raised to room temperature, and the mixture was stirred at room temperature for 30 minutes. Then, the solvents are distilled off under reduced pressure, and the remaining viscous substance is diluted with hexane (300).
ml was added and dissolved. Remove a small amount of precipitate by filtration,
Hexane was distilled off, and vacuum distillation was performed at about 0.3 Torr.
Obtained was 5.2 g. This liquid was identified by the following identification as ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5 C 5 H 4 ) Ir (C
8 H 12 ), corresponding to 38.6 mmol , yield 7
It was 7%.
【0020】 同定 (1)Ir分析値 50.8wt%(理論値 48.84wt%) (2)CH分析 C45.36wt% H5.42wt% (理論値 C45.78wt% H5.38wt%) (3)1H−NMR 装置 BRUKER AC300P(300MHz) 溶媒 CD2 Cl 2 方法 1D スペクトルと帰属 δH(ppm) プロトン数 帰属 1.15 3H CH3;Et 1.76 4H CH2;Cyclooctadiene 2.01 4H CH2;Cyclooctadiene 2.25 2H CH2;Et 3.58 4H CH;Cyclooctadiene 4.99〜5.32 4H CH;CyclopentadienylIdentification (1) Ir analysis value 50.8 wt% (theoretical value 48.84 wt%) (2) CH analysis C45.36 wt% H5.42 wt% (theoretical value C45.78 wt% H5.38 wt%) (3) 1 H-NMR apparatus BRUKER AC300P (300 MHz) solvent CD 2 Cl 2 method 1D spectrum and attribution δ H (ppm) proton number attribution 1.15 3H CH 3 ; Et 1.76 4H CH 2 ; Cycloadenee 2.04 4H CH 2 Cycloaddiene 2.25 2H CH 2 ; Et 3.58 4H CH; Cycloaddiene 4.99 to 5.32 4H CH; Cyclopentadienyl
【0021】物性と純度
(4)融点 14℃ 過冷却しやすい
(5)蒸気圧 100〜110℃/0.3Torr
(6)密度 約1.5g/cm3
(7)粘度 約20cP(室温)
(8)反応性 空気、水とは反応せず安定
(9)熱安定性 150℃で安定
(10)TG−DTA
測定条件;Arl気圧下、試料重量 12.67mg、
昇温速度 10.0deg/min
結果;約120℃から減量が開始し、240℃で50
%、260℃で100%減量した。
(11)純度
不純物分析値(単位ppm)
Fe 1,Al <1,Si 3,Na <1,Ca
1,
上記のとおり高純度であった。Physical properties and purity (4) Melting point 14 ° C. Easy to supercool (5) Vapor pressure 100-110 ° C./0.3 Torr (6) Density about 1.5 g / cm 3 (7) Viscosity about 20 cP (room temperature) ( 8) Reactivity Stable without reacting with air and water (9) Thermal stability Stable at 150 ° C (10) TG-DTA measurement conditions; Arl pressure, sample weight 12.67 mg,
Temperature rising rate 10.0 deg / min Result; weight loss starts at about 120 ° C, 50 at 240 ° C
%, 100% reduction at 260 ° C. (11) Purity impurity analysis value (unit: ppm) Fe 1, Al <1, Si 3, Na <1, Ca
1, It was highly pure as described above.
【0022】[0022]
【実施例2】エチルシクロペンタジエニル(1,5−シ
クロオクタジエン)イリジウム(C2H5C5H4)I
r(C8H12)を用いたCVD法による純Ir薄膜の
製造原料容器および熱分解反応器の全系をロータリー真
空ポンプと圧力調節弁で10Torrの減圧に保った。
エチルシクロペンタジエニル(1,5−シクロオクタジ
エン)イリジウム(C2H5C5H4)Ir(C8H
12)13gを充填した原料容器を100℃の恒温槽に
入れ、キャリヤーガスArを10sccmでバブリング
し、このガスにエチルシクロペンタジエニル(1,5−
シクロオクタジエン)イリジウムを蒸発同伴させ、熱分
解反応器に導入した。同時に水素ガス100sccmも
熱分解反応器に導入した。熱分解反応器中では、400
℃に加熱された石英基板がセットされており、エチルシ
クロペンタジエニル(1,5−シクロオクタジエン)イ
リジウムがこの基板上において分解し、純Ir薄膜が2
5分間で50nmの厚みに形成された。XRDにより金
属Irであることを同定した。膜を溶解し、金属不純物
をICP発光分析で分析したが、Ir以外の金属不純物
は検出されなかった。EXAMPLE 2 Ethyl cyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5 C 5 H 4) I
Production of pure Ir thin film by CVD method using r (C 8 H 12 ). The entire system of the raw material container and the pyrolysis reactor was kept at a reduced pressure of 10 Torr by a rotary vacuum pump and a pressure control valve.
Ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5 C 5 H 4) Ir (C 8 H
12 ) A raw material container filled with 13 g was placed in a constant temperature bath at 100 ° C., a carrier gas Ar was bubbled at 10 sccm, and ethyl cyclopentadienyl (1,5-
Cyclooctadiene) iridium was evaporated and introduced into the pyrolysis reactor. At the same time, 100 sccm of hydrogen gas was also introduced into the thermal decomposition reactor. 400 in the pyrolysis reactor
A quartz substrate heated to ℃ was set, ethylcyclopentadienyl (1,5-cyclooctadiene) iridium was decomposed on this substrate, and a pure Ir thin film was formed.
It was formed to a thickness of 50 nm in 5 minutes. It was identified as metal Ir by XRD. The film was dissolved and analyzed for metallic impurities by ICP emission spectrometry, but metallic impurities other than Ir were not detected.
【0023】[0023]
【実施例3】エチルシクロペンタジエニル(1,5−シ
クロオクタジエン)イリジウム(C2H5C5H4)I
r(C8H12)を用いたCVD法による純Ir薄膜の
製造
原料容器および熱分解反応器の全系をロータリー真空ポ
ンプと圧力調節弁で10Torrの減圧に保った。エチ
ルシクロペンタジエニル(1,5−シクロオクタジエ
ン)イリジウム(C2H5C5H4)Ir(C
8H12)13gを充填した原料容器を100℃の恒温
槽に入れ、キャリヤーガスArを10sccmでバブリ
ングし、このガスにエチルシクロペンタジエニル(1,
5−シクロオクタジエン)イリジウムを蒸発同伴させ、
熱分解反応器に導入した。同時に酸素ガス20sccm
も熱分解反応器に導入した。熱分解反応器中では300
℃に加熱された石英基板がセットされており、エチルシ
クロペンタジエニル(1,5−シクロオクタジエン)イ
リジウムがこの基板上において分解し、純Ir薄膜が3
0分間で60nmの厚みに形成された。XRDより、金
属Irであることを同定した。その膜を溶解し、金属不
純物をICP発光分析で分析したが、Ir以外の金属不
純物は検出されなかった。EXAMPLE 3 ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5 C 5 H 4) I
Production of pure Ir thin film by CVD method using r (C 8 H 12 ). The entire system of the raw material container and the pyrolysis reactor was kept at a reduced pressure of 10 Torr by a rotary vacuum pump and a pressure control valve. Ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5 C 5 H 4) Ir (C
8 H 12 ) 13 g of the raw material container was placed in a constant temperature bath at 100 ° C., a carrier gas Ar was bubbled at 10 sccm, and ethyl cyclopentadienyl (1,
5-cyclooctadiene) iridium is vaporized and entrained,
It was introduced into the pyrolysis reactor. 20 sccm oxygen gas at the same time
Was also introduced into the pyrolysis reactor. 300 in pyrolysis reactor
A quartz substrate heated to ℃ was set, ethylcyclopentadienyl (1,5-cyclooctadiene) iridium was decomposed on this substrate, and a pure Ir thin film was converted into 3
It was formed to a thickness of 60 nm in 0 minutes. It was identified as metallic Ir by XRD. The film was dissolved and analyzed for metallic impurities by ICP emission spectrometry, but metallic impurities other than Ir were not detected.
【0024】[0024]
【実施例4】エチルシクロペンタジエニル(1,5−シ
クロオクタジエン)イリジウム(C2H5C5H4)I
r(C8H12)を用いたCVD法による純IrO2薄
膜の製造
実施例3において、形成した純Ir薄膜を600℃で酸
素雰囲気にすると、IrO2薄膜となった。同定はXR
Dで行った。Example 4 Ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5 C 5 H 4 ) I
Production of Pure IrO 2 Thin Film by CVD Method Using r (C 8 H 12 ). In Example 3, when the pure Ir thin film formed was placed in an oxygen atmosphere at 600 ° C., it became an IrO 2 thin film. Identification is XR
I went in D.
【0025】[0025]
【発明の効果】本発明のエチルシクロペンタジエニル
(1,5−シクロオクタジエン)イリジウム(C2H5
C5H4)Ir(C8H12)は室温で液体であり、1
00℃付近で充分な蒸気圧を有しているので、CVD原
料として、ガスバブリングないし液体マスフローコント
ローラーにより定量的に供給でき、熱分解で基板上にI
r含有薄膜を形成することができる。本発明により、量
産性に優れたCVD法で純IrやIrO2の薄膜を形成
できる。EFFECT OF THE INVENTION The ethylcyclopentadienyl (1,5-cyclooctadiene) iridium (C 2 H 5
C 5 H 4 ) Ir (C 8 H 12 ) is a liquid at room temperature,
Since it has a sufficient vapor pressure near 00 ° C, it can be quantitatively supplied as a CVD raw material by gas bubbling or a liquid mass flow controller, and can be thermally decomposed onto the substrate.
An r-containing thin film can be formed. According to the present invention, a thin film of pure Ir or IrO 2 can be formed by a CVD method having excellent mass productivity.
Claims (3)
シクロオクタジエン)イリジウム。1. Ethylcyclopentadienyl (1,5-
Cyclooctadiene) iridium.
ロイリジウム)とナトリウムエチルシクロペンタジエニ
ドを溶媒中で反応させるエチルシクロペンタジエニル
(1,5−シクロオクタジエン)イリジウムの製造方
法。2. A method for producing ethylcyclopentadienyl (1,5-cyclooctadiene) iridium by reacting bis (1,5-cyclooctadienechloroiridium) with sodium ethylcyclopentadienide in a solvent.
りつくる方法で、加熱した基板をエチルシクロペンタジ
エニル(1,5−シクロオクタジエン)イリジウムと接
触させることを特徴とするイリジウム含有薄膜の製造方
法。3. A method for producing an iridium-containing thin film by chemical vapor deposition, wherein a heated substrate is brought into contact with ethylcyclopentadienyl (1,5-cyclooctadiene) iridium to produce an iridium-containing thin film. Method.
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| US6753437B1 (en) | 2003-01-22 | 2004-06-22 | Tanaka Kikinzoku Kogyo K.K. | CVD material compound and method for manufacturing the same, and CVD method of iridium or iridium compound thin film |
| DE602004019836D1 (en) | 2003-04-24 | 2009-04-23 | Tosoh Corp | Organometallic iridium compounds, process for their preparation and process for the preparation of thin films |
| JP4696454B2 (en) * | 2003-04-24 | 2011-06-08 | 東ソー株式会社 | Novel organic iridium compound, method for producing the same, and method for producing the film |
| CN100390186C (en) * | 2003-08-19 | 2008-05-28 | 东曹株式会社 | Organometallic iridium compound, method for preparing it, and method for preparing thin film |
| JP4553642B2 (en) * | 2003-08-19 | 2010-09-29 | 東ソー株式会社 | Organic iridium compound, process for producing the same, and process for producing film |
| NL2036587B1 (en) * | 2023-12-19 | 2025-07-01 | Powall Holding B V | Particulate Composite Iridium Oxide Materials and Preparation Method and Application Thereof |
-
1998
- 1998-04-03 JP JP12940798A patent/JP3511228B2/en not_active Expired - Fee Related
Non-Patent Citations (1)
| Title |
|---|
| J. MATER. CHEM.,1991年,Vol.1,No.4,551−554 |
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| JPH11292888A (en) | 1999-10-26 |
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