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JP3540902B2 - Thin leaf flatness measuring device - Google Patents
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JP3540902B2 - Thin leaf flatness measuring device - Google Patents

Thin leaf flatness measuring device Download PDF

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JP3540902B2
JP3540902B2 JP21947996A JP21947996A JP3540902B2 JP 3540902 B2 JP3540902 B2 JP 3540902B2 JP 21947996 A JP21947996 A JP 21947996A JP 21947996 A JP21947996 A JP 21947996A JP 3540902 B2 JP3540902 B2 JP 3540902B2
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Prior art keywords
data
thin leaf
axis direction
measurement target
slack
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JP21947996A
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JPH1047933A (en
Inventor
浩司 名倉
健浩 大森
孝 鈴木
忠幸 遠藤
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三菱化学ポリエステルフィルム株式会社
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Description

【0001】
【発明の属する技術分野】
本発明は、薄葉体の平面性測定装置に関し、詳しくは、薄葉体の平面性を自動的に且つ高速で測定できる装置に関する。なお、本発明において、平面性とは薄葉体自体のたるみの状態を指す。
【0002】
【従来の技術】
プラスチック薄葉体等を走行させる際、薄葉体の平面性が不良な場合は、薄葉体がバタつき、工程が安定しないというトラブルの原因となるため、薄葉体製造工程では、品質管理の一環として、薄葉体の平面性を測定する必要がある。
【0003】
従来の測定方法としては、例えば、二つのロール間において、一定の張力条件下、薄葉体を走行させ、薄葉体面に対して斜め上方から光を照射し、その反射光を像としてスクリーンに映し出し、その像の個数およびその面積を測定者が目視で読み取り、面積率を決定することにより、たるみ部分を連続的に評価する方法が知られている。
【0004】
【発明が解決しようとする課題】
しかしながら、上記の方法は、測定者による個人誤差が出易いこと、測定中は目が離せないこと、測定速度が上げられないこと等、高速巻取り時の平面性の測定には不十分である。本発明は、斯かる問題点に鑑みなされたものであり、その目的は、薄葉体の平面性を自動的に且つ高速で測定できる装置を提供することにある。
【0005】
【課題を解決するための手段】
すなわち、本発明の要旨は、走行中の薄葉体(1)の平面性を測定する装置であって、薄葉体(1)がプラスチックフイルムであり、薄葉体の走行面上であって且つ当該薄葉体の走行方向と交叉する向きに設定された線状測定対象域(13)に斜め上方から光照射可能な光源(2)、当該光源から照射され且つ上記線状測定対象域(13)における反射光(22)を受光し、当該線状測定対象域(13)の長さ方向(X軸方向)の平面性に基づく反射光強度分布を輝度値データ(Z)分布に変換し、薄葉体の走行方向(Y軸方向)の距離に応じて、各輝度値データ(Z)とそれに対応するX軸方向位置データ(X)及びY軸方向距離データ(Y)とを一組のデータとして制御部(4)へ伝送可能なセンサー(3)、当該センサー(3)から伝送された各データを組データとして記憶し、記憶データ中の輝度値データ(Z)のX軸方向分布の輝度値曲線(51)を仮想し、その振幅が一定値を超える点(たるみ点(55))、または、ベースライン(53)からの変位(54)が一定値を超える点(たるみ点(55))のみをX軸−Y軸座標上にプロットとしたとき、各たるみ点(55)が相互に一定距離以内に近接している点を包囲する範囲を一つの連続したブロック状パターン(57)として認識し、たるみ領域面積として各ブロック状パターン(57)の面積を算出して結果を出力する制御部(4)から主として構成される、薄葉体の平面性測定装置に存する。
【0006】
【発明の実施の形態】
以下、本発明の装置を添付図面の例を使用してに従って説明する。なお、図1は、本発明の測定装置の概念説明図、図2は、薄葉体面上のたるみ領域(12)及びそれに含まれる個々のたるみシワ(11)の説明図、図3は、図2の薄葉体のたるみ領域(12)とたるみ点(55)との関係の説明図、図4は、たるみ点(55)に相当するプロットのみを薄葉体長さ方向に連続的にプロットして得られるブロック状パターン(57)の様子を示す説明図である。
【0007】
本発明の平面性測定装置(単に測定装置と略記する)は、走行中の薄葉体(1)の平面性を測定する装置であって、光源(2)、センサー(3)および制御部(4)から主として構成される。
【0008】
本発明において、測定対象とする薄葉体(1)は、反射光の内、反射光の存在が視認可能な表面特性を有し且つ可撓性を有する長尺物をいい、所謂、フイルム状またはシート状材料であり、その例としては、プラスチックフイルム、プラスチックシート、光沢紙、金属フォイルが挙げられる。
【0009】
線状測定対象域(13)は、後述の照射光(21)が薄葉体(1)表面に照射され、その照射面の平坦部における反射光がセンサー(3)に受光された場合、その受光された反射光(22)が反射された薄葉体(1)の表面部分を主に含む細長い仮想面域を指す。当該面域すなわち線状測定対象域(13)の方向は、通常、薄葉体(1)の走行方向と直交する向き、すなわち、薄葉体の幅方向とされるが、斜交する向きでもよい。また、その幅は、通常、数mm程度以下であり、その長さは、通常、薄葉体の全幅を対象とするが、目的により薄葉体の幅の一部に限定してもよい。
【0010】
光源(2)は、線状測定対象域(13)に向かって斜め上方から光照射可能に配置され、通常、光源(2)の中心が薄葉体幅の中心部になるよう調節されるが、必要に応じ、薄葉体走行面の上方から外れた位置などであってもよい。また、その向きは、線状測定対象域(13)に向かって斜め上方から光を照射することが出来る様に調整される。
【0011】
この光源(2)の照射光(21)の波長分布は、後述のセンサー(3)の受光素子の感度特性に適合しているのが好ましい。また、光源(2)から照射される照射面の幅は、前記線状測定対象域(13)の幅を覆うことが出来る程度以上とされるが、測定精度を上げるためには、前記の線状測定対象域(13)の幅により近い幅にするのが好ましい。
【0012】
光源(2)の長さは、センサー(3)の形状を考慮して適宜選択され、線状測定対象域(13)で照射光(21)が反射した光(22)の全長が、センサーに配列された受光素子に受光され得るように選択される。例えば、センサー(3)の各受光素子の配列が短く、実質的に一点に集中配置されている場合は、線状測定対象域(13)全長の略2倍程度の棒状または線状の長い光源(2)が好適に採用され、センサー(3)の各受光素子配列が線状測定対象域(13)の長さと等しい長さに配置されている場合は、光源(2)は線状測定対象域(13)の長さと等しいものが採用され、センサー(3)の各受光素子配列が線状測定対象域(13)の長さの2倍以上に配置されている場合は、点状の光源(2)が採用される。
【0013】
センサー(3)は、光源(2)から照射され且つ線状測定対象域(13)における反射光(22)を受光し、当該線状測定対象域(13)の長さ方向(X軸方向)の平面性に基づく反射光強度分布を輝度値データ(Z)分布に変換し、薄葉体の走行方向(Y軸方向)の距離に応じて、各輝度値データ(Z)とそれに対応するX軸方向位置データ(X)及びY軸方向距離データ(Y)とを一組のデータとしてケーブル(31)を経て制御部(4)へ伝送する。
【0014】
上記センサー(3)は、線状に配列された多数の受光素子を内蔵し、信号伝送ケーブル(31)を具備する。センサーの形状は、通常、受光素子が短い長さに配列され、受光口の面積が小さく、全体の大きさがコンパクトなものが使用されるが、受光素子の配列長さが長く、例えば、線状測定対象域(13)と同じか又は2倍程度の長いものでもよい。センサー(3)の配置は、薄葉体(1)の線状測定対象域(13)の平坦部分における反射光を受光素子が受光し得る位置および向きに調整される。
【0015】
制御部(4)は、主として、データ記憶部、演算部および出力部から構成される。データ記憶部は、センサー(3)から伝送された組データを記憶し、演算部の必要に応じて記憶されたデータが読取り可能に設けられる。データ記憶部の記憶手段としては、後述の演算部において随時読取り出来るものが採用され、例えば、コンピューター装置の中のメモリー、ハードディスク、フロッピーディスクが挙げられるがこれらに限定されない。その中で、コンピューター装置の中のメモリー素子等が好適に使用できるが、データ記録用具としてハードディスク、フロッピーディスク等の永続的に記憶・保存可能な装置を併せて備えるのが更に好ましい。
【0016】
演算部は、記憶データ中の輝度値データ(Z)のX軸方向分布の輝度値曲線(51)を仮想し、図3に示す様に、その振幅が一定値を超える点(たるみ点)、または、ベースライン(53)からの変位(54)が一定値を超える点(たるみ点)のみを、図4に示す様に、X軸−Y軸座標上にプロットしたとき、各点が相互に一定距離以内に近接している点を包囲する範囲を一つの連続したブロック状パターン(57)として認識し、各ブロック状パターン(57)の面積を算出する。
【0017】
上記の輝度値曲線(51)中のベースライン(53)は、基本的には、薄葉体(1)の平坦部に相当し、振幅部分はたるみシワ部分に相当する。このような振幅部分が生じる理由は、明確ではないが、図2に示す様に、線状測定対象域(13)にたるみシワ(11)がある場合は、その部分の反射平面が平坦部分の反射平面から変化し、反射方向がシフトするため、平坦部であれば反射光を受光すべき位置の受光素子に受光されず、また、他のたるみシワ部分の反射光を受光する場合もあり、それらの結果、各受光素子に受光される光は、薄葉体のたるみシワの状態によりX軸方向に強弱を生じ、強度分布を有することになるとも考えられる。
【0018】
前記の振幅(52)の値が一定値を超える点、または、ベースライン(53)からの変位(54)が一定値を超える点は、たるみ点(55)と呼び、薄葉体(1)のたるみシワ部分の代替特性となる。また、上記のたるみ点の判別の基準となる一定値は、測定の目的に応じて適宜設定されるが、例えば、振幅(52)の判別の場合は、ベースライン(53)の輝度値の10%、ベースライン(53)からの変位の場合は、5%とする例が挙げられる。
【0019】
上記の様な操作を薄葉体(1)のY軸方向の各距離について繰り返し、たるみ点(55)をX軸−Y軸座標にプロット表示することを仮想したとき、プロットは、多数のプロットが散布されて一種のパターンを形成し、通常、薄葉体のたるみシワ(11)に対応していくつかの筋状パターン(56)を形成する。この際、これらの筋状パターン(56)は複数個が全体として一つの連続したブロック状パターン(57)を形成している場合がある。
【0020】
前記複数個の筋状パターン(56)が連続した一つのブロック状パターン(57)を形成するかどうかの判断は、前記の筋状パターン(56)を構成する各プロットの位置の相互間の距離を計算し、各プロット間の距離が適宜設定する一定値(最小平坦距離)、例えば、10mm、より小さい場合は、二つのたるみ点(55)は連続したプロットとして認識するものとし、互いに連続したプロットを包囲する範囲を一つの連続ブロック状パターン(57)と判断する。この様にして判断された各々の連続したブロック状パターン(57)の面積を薄葉体(1)の指定する長さについて算出する。この際、必要に応じ、更に連続ブロック状パターン(57)の面積分布、薄葉体面積中のたるみ面積率などを算出可能であるのが好ましい。なお、前記のブロック状パターンは、薄葉体(1)上でいえば、連続した一つのたるみ領域(12)に対応すると考えることが出来る。
【0021】
出力部は、演算部における算出結果を出力する。なお、前記演算部における演算では、輝度値データのマトリックスとして内部メモリー上で行なわれるため、輝度値曲線(51)、ベースライン(53)及びたるみ点(55)のプロットパターン図などを可視的図形として上記出力装置に出力可能である必要はないが、走行中の薄葉体の平面性の監視のため、CRT表示装置、液晶表示装置、プリンターなどの出力装置へ並行して出力できるものが好ましい。また、輝度値データのプロットを出力装置へ出力する場合、表示の色彩は、モノカラーでもよいが、輝度値データの大きさに対応して色彩または明るさを変えて表示可能なマルチカラーがさらに好ましい。
【0022】
【発明の効果】
以上説明した様に、本発明によれば、走行中の薄葉体の平面性が自動的に且つ高速に定量的に測定でき、表示および記録することが出来る。また、その測定結果には測定担当者による個人誤差が生じない。さらに、希望により、随時、輝度値曲線(51)、たるみ点プロット等をCRT表示装置、液晶表示装置等に表示することにより、走行中の薄葉体の平面性の監視に利用することが出来る。
【図面の簡単な説明】
【図1】本発明の測定装置の概念説明図
【図2】薄葉体面上のたるみ領域(12)及びそれに含まれる個々のたるみシワ(11)の説明図
【図3】図2の薄葉体のたるみ領域(12)とたるみ点(55)との関係の説明図
【図4】たるみ点(55)に相当するプロットのみを薄葉体長さ方向に連続的にプロットして得られるブロック状パターン(57)の様子を示す説明図
【符号の説明】
1:薄葉体
11:たるみシワ
12:たるみ領域
13:線状測定対象域
2:光源
21:照射光
22:反射光
3:センサー
31:ケーブル
4:制御部
51:輝度値曲線
52:振幅
53:ベースライン
54:ベースラインからの変位
55:たるみ点
56:筋状パターン
57:ブロック状パターン
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to an apparatus for measuring flatness of a thin leaf, and more particularly, to an apparatus capable of automatically and rapidly measuring the flatness of a thin leaf. In the present invention, flatness refers to the state of slack of the thin leaf itself.
[0002]
[Prior art]
When running a plastic thin body, etc., if the flatness of the thin body is poor, the thin body will flutter and cause a problem that the process will not be stable, so in the thin body manufacturing process, as part of quality control, It is necessary to measure the flatness of the thin body.
[0003]
As a conventional measuring method, for example, between two rolls, under a constant tension condition, the thin leaf is run, light is irradiated from obliquely above the thin leaf surface, and the reflected light is projected on the screen as an image, A method is known in which a measurer visually reads the number and area of the images and determines the area ratio, thereby continuously evaluating the slack portion.
[0004]
[Problems to be solved by the invention]
However, the above-mentioned method is insufficient for measuring flatness at the time of high-speed winding, such as that individual errors easily occur by a measurer, that eyes cannot be taken off during measurement, that the measurement speed cannot be increased, and the like. . The present invention has been made in view of such a problem, and an object of the present invention is to provide an apparatus that can automatically and quickly measure the flatness of a thin leaf body.
[0005]
[Means for Solving the Problems]
That is, the gist of the present invention is an apparatus for measuring the flatness of a moving thin leaf (1) , wherein the thin leaf (1) is a plastic film, is on a running surface of the thin leaf, and A light source (2) capable of irradiating the linear measurement target area (13) set in a direction intersecting with the running direction of the body from diagonally above, and being radiated from the light source and reflected by the linear measurement target area (13) The light (22) is received, and the reflected light intensity distribution based on the flatness in the length direction (X-axis direction) of the linear measurement target area (13) is converted into the luminance value data (Z) distribution. In accordance with the distance in the traveling direction (Y-axis direction), the control unit converts each of the brightness value data (Z) and the corresponding X-axis direction position data (X) and Y-axis direction distance data (Y) as a set of data. Sensor (3) that can be transmitted to (4), and transmission from sensor (3) Each of the obtained data is stored as a set of data, and a luminance value curve (51) of the X-axis direction distribution of the luminance value data (Z) in the stored data is imagined, and a point where the amplitude exceeds a certain value (the sag point (55) )) Or when only points (slack points (55)) where the displacement (54) from the baseline (53) exceeds a certain value are plotted on the X-axis-Y-axis coordinates, each slack point (55) Recognizes a range surrounding points that are close to each other within a certain distance as one continuous block-shaped pattern (57), calculates the area of each block-shaped pattern (57) as a slack area, and calculates the result. The present invention resides in a thin-sheet flatness measuring device mainly composed of a control section (4) for outputting.
[0006]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, the device of the present invention will be described with reference to the accompanying drawings. FIG. 1 is a conceptual explanatory view of the measuring apparatus of the present invention, FIG. 2 is an explanatory view of a sag area (12) on a thin leaf body surface and individual sag wrinkles (11) included therein, and FIG. FIG. 4 is an explanatory diagram of the relationship between the slack area (12) and the slack point (55) of the thin leaf body, and FIG. 4 is obtained by continuously plotting only the plot corresponding to the slack point (55) in the thin leaf length direction. It is explanatory drawing which shows a mode of a block-shaped pattern (57).
[0007]
A flatness measuring device (hereinafter simply referred to as a measuring device) of the present invention is a device for measuring the flatness of a running thin leaf (1), and includes a light source (2), a sensor (3), and a control unit (4). ).
[0008]
In the present invention, the thin leaf (1) to be measured refers to a long object having surface characteristics and flexibility in which the presence of reflected light is visible among the reflected light, so-called film-like or It is a sheet-like material, examples of which include plastic film, plastic sheet, glossy paper, and metal foil.
[0009]
When the irradiation light (21) described later is irradiated on the surface of the thin leaf (1) and the reflected light on the flat portion of the irradiation surface is received by the sensor (3), the linear measurement target area (13) receives the light. Refers to an elongated virtual surface area mainly including the surface portion of the thin body (1) where the reflected light (22) is reflected. The direction of the surface area, that is, the linear measurement target area (13) is usually set to a direction orthogonal to the traveling direction of the thin leaf (1), that is, a width direction of the thin leaf, but may be an oblique direction. Further, the width is usually about several mm or less, and the length is usually the entire width of the thin leaf, but may be limited to a part of the width of the thin leaf depending on the purpose.
[0010]
The light source (2) is arranged so as to be able to irradiate light from obliquely upward toward the linear measurement target area (13), and is usually adjusted so that the center of the light source (2) is the center of the thin leaf width. If necessary, the position may be a position deviated from above the thin leaf running surface. The direction is adjusted so that light can be emitted from obliquely upward toward the linear measurement target area (13).
[0011]
It is preferable that the wavelength distribution of the irradiation light (21) of the light source (2) is adapted to the sensitivity characteristics of the light receiving element of the sensor (3) described later. The width of the irradiation surface irradiated from the light source (2) is set to be at least as large as it can cover the width of the linear measurement target area (13). It is preferable to make the width closer to the width of the shape measurement target area (13).
[0012]
The length of the light source (2) is appropriately selected in consideration of the shape of the sensor (3), and the total length of the light (22) reflected by the irradiation light (21) in the linear measurement target area (13) is transmitted to the sensor. It is selected so that it can be received by the arranged light receiving elements. For example, in the case where the arrangement of the light receiving elements of the sensor (3) is short and substantially concentrated at one point, a long rod-shaped or linear light source approximately twice as long as the linear measurement target area (13) is used. When (2) is suitably adopted and each light receiving element array of the sensor (3) is arranged at a length equal to the length of the linear measurement target area (13), the light source (2) is used as the linear measurement target. When the length equal to the length of the area (13) is adopted and each light receiving element array of the sensor (3) is arranged at least twice the length of the linear measurement target area (13), a point light source is used. (2) is adopted.
[0013]
The sensor (3) receives the reflected light (22) emitted from the light source (2) and reflected by the linear measurement target area (13), and the length direction (X-axis direction) of the linear measurement target area (13). Is converted into a luminance value data (Z) distribution based on the flatness of the image data, and the luminance value data (Z) and the corresponding X-axis corresponding to the distance in the running direction (Y-axis direction) of the thin leaf body are converted. The direction position data (X) and the Y-axis direction distance data (Y) are transmitted as a set of data to the control unit (4) via the cable (31).
[0014]
The sensor (3) incorporates a large number of light receiving elements arranged in a line and includes a signal transmission cable (31). The shape of the sensor is generally such that the light receiving elements are arranged in a short length, the area of the light receiving opening is small, and the whole size is compact, but the array length of the light receiving elements is long, for example, a line It may be the same as or twice as long as the shape measurement target area (13). The arrangement of the sensor (3) is adjusted to a position and a direction in which the light receiving element can receive the reflected light in the flat portion of the linear measurement target area (13) of the thin leaf (1).
[0015]
The control unit (4) mainly includes a data storage unit, a calculation unit, and an output unit. The data storage unit stores the set data transmitted from the sensor (3), and is provided so that the stored data can be read as needed by the operation unit. As a storage unit of the data storage unit, a storage unit that can be read at any time by an arithmetic unit described later is adopted, and examples thereof include a memory, a hard disk, and a floppy disk in a computer device, but are not limited thereto. Among them, a memory device or the like in a computer device can be suitably used, but it is more preferable that a device capable of permanently storing and storing such as a hard disk or a floppy disk is further provided as a data recording tool.
[0016]
The calculation unit simulates a luminance value curve (51) of the X-axis direction distribution of the luminance value data (Z) in the stored data, and as shown in FIG. 3, a point (sag point) whose amplitude exceeds a certain value, Alternatively, when only points (slack points) where the displacement (54) from the baseline (53) exceeds a certain value are plotted on the X-axis-Y-axis coordinates as shown in FIG. A range surrounding a point close to within a certain distance is recognized as one continuous block-shaped pattern (57), and the area of each block-shaped pattern (57) is calculated.
[0017]
The base line (53) in the brightness value curve (51) basically corresponds to a flat portion of the thin leaf body (1), and the amplitude portion corresponds to a slack wrinkle portion. The reason why such an amplitude portion occurs is not clear, but as shown in FIG. 2, when there is a slack wrinkle (11) in the linear measurement target area (13), the reflection plane of that portion has a flat portion. Since it changes from the reflection plane and the reflection direction shifts, if it is a flat portion, it is not received by the light receiving element at the position where it should receive the reflected light, and it may also receive the reflected light of another slack wrinkle part, As a result, it is considered that the light received by each light receiving element has an intensity distribution in the X-axis direction due to the state of the slack wrinkle of the thin leaf body, and has an intensity distribution.
[0018]
The point at which the value of the amplitude (52) exceeds a certain value or the point at which the displacement (54) from the baseline (53) exceeds a certain value is called a sag point (55), and It is an alternative to the sagging wrinkle. In addition, the constant value serving as the reference for the determination of the sag point is appropriately set according to the purpose of the measurement. For example, in the case of the determination of the amplitude (52), the brightness value of the baseline (53) is set to 10 %, And 5% in the case of displacement from the baseline (53).
[0019]
The above operation is repeated for each distance in the Y-axis direction of the thin leaf body (1), and when it is assumed that the sag point (55) is plotted and displayed on the X-axis-Y-axis coordinates, a large number of plots are formed. It is scattered to form a kind of pattern, and usually forms several streak patterns (56) corresponding to the slack wrinkles (11) of the thin body. At this time, a plurality of these streak patterns (56) may form a single continuous block pattern (57) as a whole.
[0020]
Whether or not the plurality of streak patterns (56) form one continuous block-like pattern (57) is determined by the distance between the positions of the plots constituting the streak pattern (56). When the distance between the plots is smaller than a fixed value (minimum flat distance), for example, 10 mm, which is appropriately set, the two slack points (55) are recognized as continuous plots, and The range surrounding the plot is determined as one continuous block pattern (57). The area of each continuous block pattern (57) determined in this way is calculated for the designated length of the thin leaf (1). At this time, it is preferable that the area distribution of the continuous block pattern (57), the slack area ratio in the thin leaf body area, and the like can be calculated as required. The above-mentioned block-shaped pattern can be considered to correspond to one continuous slack region (12) on the thin leaf (1).
[0021]
The output unit outputs a calculation result in the calculation unit. Since the calculation in the calculation unit is performed on the internal memory as a matrix of the brightness value data, a plot pattern diagram of the brightness value curve (51), the baseline (53), and the slack point (55) is represented by a visual figure. It is not necessary to be able to output to the above-mentioned output device, but it is preferable to be able to output to the output device such as a CRT display device, a liquid crystal display device, and a printer in parallel for monitoring the flatness of the thin leaf body during traveling. Further, when the plot of the brightness value data is output to the output device, the display color may be a monocolor, but a multi-color that can be displayed by changing the color or brightness according to the size of the brightness value data is further added. preferable.
[0022]
【The invention's effect】
As described above, according to the present invention, the flatness of a running thin leaf can be measured automatically, quickly and quantitatively, and can be displayed and recorded. In addition, there is no individual error in the measurement result by the person in charge of measurement. Further, if desired, the brightness value curve (51), the slack point plot, and the like are displayed on a CRT display device, a liquid crystal display device, or the like, so that the flatness of the running thin leaf can be monitored.
[Brief description of the drawings]
FIG. 1 is a conceptual explanatory view of a measuring apparatus of the present invention. FIG. 2 is an explanatory view of a sag area (12) on a thin leaf body surface and individual sag wrinkles (11) included therein. FIG. FIG. 4 is an explanatory diagram of a relationship between a sag area (12) and a sag point (55). FIG. 4 is a block-like pattern (57) obtained by continuously plotting only a plot corresponding to a sag point (55) in a thin leaf length direction. ) (Explanation of symbols)
1: thin leaf 11: sagging wrinkles 12: sagging area 13: linear measurement target area 2: light source 21: irradiation light 22: reflected light 3: sensor 31: cable 4: control unit 51: brightness value curve 52: amplitude 53: Base line 54: Displacement from baseline 55: Slack point 56: Stripe pattern 57: Block pattern

Claims (1)

走行中の薄葉体(1)の平面性を測定する装置であって、薄葉体(1)がプラスチックフイルムであり、薄葉体の走行面上であって且つ当該薄葉体の走行方向と交叉する向きに設定された線状測定対象域(13)に斜め上方から光照射可能な光源(2)、当該光源から照射され且つ上記線状測定対象域(13)における反射光(22)を受光し、当該線状測定対象域(13)の長さ方向(X軸方向)の平面性に基づく反射光強度分布を輝度値データ(Z)分布に変換し、薄葉体の走行方向(Y軸方向)の距離に応じて、各輝度値データ(Z)とそれに対応するX軸方向位置データ(X)及びY軸方向距離データ(Y)とを一組のデータとして制御部(4)へ伝送可能なセンサー(3)、当該センサー(3)から伝送された各データを組データとして記憶し、記憶データ中の輝度値データ(Z)のX軸方向分布の輝度値曲線(51)を仮想し、その振幅が一定値を超える点(たるみ点(55))、または、ベースライン(53)からの変位(54)が一定値を超える点(たるみ点(55))のみをX軸−Y軸座標上にプロットとしたとき、各たるみ点(55)が相互に一定距離以内に近接している点を包囲する範囲を一つの連続したブロック状パターン(57)として認識し、たるみ領域面積として各ブロック状パターン(57)の面積を算出して結果を出力する制御部(4)から主として構成される、薄葉体の平面性測定装置。An apparatus for measuring the flatness of a moving thin leaf (1) , wherein the thin leaf (1) is a plastic film, is on a running surface of the thin leaf, and intersects with a running direction of the thin leaf. A light source (2) capable of irradiating the linear measurement target area (13) set in the obliquely upward direction with light, receiving reflected light (22) from the light source and reflected in the linear measurement target area (13); The reflected light intensity distribution based on the flatness in the length direction (X-axis direction) of the linear measurement target area (13) is converted into the luminance value data (Z) distribution, and the thin-sheet body traveling direction (Y-axis direction) is converted. A sensor capable of transmitting the brightness value data (Z) and the corresponding X-axis direction position data (X) and Y-axis direction distance data (Y) as a set of data to the control unit (4) according to the distance. (3) Each data transmitted from the sensor (3) is grouped data. A luminance value curve (51) of the X-axis direction distribution of the luminance value data (Z) in the stored data is imagined, and a point where the amplitude exceeds a certain value (sag point (55)) or a base When only points (slack points (55)) where the displacement (54) from the line (53) exceeds a certain value are plotted on the X-axis-Y-axis coordinates, the respective slack points (55) are within a certain distance from each other. The control unit (4) which recognizes a range surrounding a point close to the pattern as one continuous block-shaped pattern (57), calculates the area of each block-shaped pattern (57) as a slack area, and outputs the result. ), Which is mainly composed of:
JP21947996A 1996-07-31 1996-07-31 Thin leaf flatness measuring device Expired - Fee Related JP3540902B2 (en)

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