JP3565414B2 - Waveform observation device - Google Patents

Description

[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a waveform observing apparatus for displaying a waveform of an input signal, and more particularly to a waveform observing apparatus capable of performing an averaging process using arbitrary measured waveform data by improving averaging means.
[0002]
[Prior art]
A conventional waveform observation device, for example, a digital oscilloscope includes an averaging means for removing a random noise component mixed in an input signal.
[0003]
The averaging means performs a predetermined number of measurements of n times, and obtains average waveform data by calculating an average value of data at each sample point of the n pieces of measured waveform data thus obtained, and mixes the averaged waveform data with the input signal. To remove random noise components.
[0004]
FIG. 3 is a diagram in which the average waveform data 34 is generated by performing an averaging process on the measurement waveform data 31 to 33 obtained by three measurements by the above-described averaging means. When the averaging process is performed, the value does not change even if the repetitive signal included in the measured waveform data is averaged, but when the random noise component is averaged, the value approaches zero due to its nature. Therefore, in a conventional waveform observation apparatus, average waveform data is generated by removing the random noise component included in the input signal by averaging the measured waveform data of the input signal, and the average waveform data is used to calculate the input signal. The analysis was being performed.
[0005]
[Problems to be solved by the invention]
However, in the conventional waveform observation device, the average processing is performed by generating the average waveform data using the n pieces of measured waveform data obtained by the predetermined continuous n times of measurement. If abnormal measurement waveform data that is significantly different from other measurement waveform data is stored in the storage means due to, for example, a measurement error, an error may occur in the generated average waveform data including this. there were.
[0006]
In addition, in the conventional waveform observation device, the measured waveform data used in the averaging process is deleted when the average waveform data is obtained, so that the measured waveform data used in the averaging process cannot be analyzed. was there.
[0007]
The present invention solves the above-described problem, and stores measurement data used for averaging processing in a storage unit, and selects arbitrary measurement data from the measurement data stored in the storage unit. It is an object of the present invention to provide a waveform observation device capable of performing an averaging process using the measured waveform data.
[0008]
[Means for Solving the Problems]
In order to achieve such an object, in the invention described in claim 1,
In a waveform observation device that displays measured waveform data obtained by measuring an input signal on a display unit ,
A measurement unit that measures the input signal and generates measurement waveform data;
A storage unit for storing a plurality of measurement waveform data from the measurement unit,
Selecting means for selecting two or more measurement waveform data to be used for averaging from the measurement waveform data displayed on the display unit;
Average means for inputting the measured waveform data selected by the selecting means from the storage unit , performing an averaging process on the input measured waveform data to generate average waveform data,
And data control means for displaying the average waveform data from the averaging unit on the display unit,
It is characterized by having.
[0009]
According to such a configuration, it is possible to store a plurality of measurement waveform data in the storage unit, and to select arbitrary measurement waveform data from the plurality of measurement waveform data stored here and perform an averaging process. Becomes possible.
[0010]
Further, as in claim 2, by displaying the measured waveform data and the average waveform data on the same screen of the display unit, the waveform of the input signal before the averaging process and the input signal after the averaging process are performed. Signal waveforms can be compared on the same screen.
[0011]
Furthermore, by selecting the measurement waveform data to be displayed on the display unit from a plurality of measurement waveform data stored in the storage unit, only the measurement waveform data to be analyzed is displayed on the display unit. It becomes possible.
[0012]
Further, by displaying the measured waveform data and the averaged waveform data used in the averaging process on the same screen of the display means, it is easy to grasp what type of the measured waveform data was used to perform the averaging process. it can.
[0013]
By storing the averaged waveform data thus obtained in the storage unit, it is possible to save the waveform after the averaging process.
[0014]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, the present invention will be described in detail with reference to the drawings. FIG. 1 is a configuration diagram showing one embodiment of a waveform observation device according to the present invention.
[0015]
In FIG. 1, a measuring unit 1 measures an input signal and generates digital data, that is, measured waveform data. The history memory 2 is a storage unit that stores a plurality of measurement waveform data input from the measurement value 1.
[0016]
The data control unit 3 reads the measured waveform data from the history memory 2 and displays the waveform on the display unit 4, for example, a CRT or an LCD. The data control means 3 has an averaging means 31.
[0017]
The averaging means 31 selects two or more waveform measurement data from the plurality of measurement waveform data stored in the history memory, and obtains an average value of the data at each sample point for the two or more waveform measurement data. Then, the average waveform data is generated and displayed on the display unit 4.
[0018]
The selection means 5 selects the measurement waveform data of the history memory 2 to be input to the averaging means 31 with a key or the like, and also selects the measurement waveform data and the average waveform data to be displayed on the display 4.
[0019]
The operation of the thus configured device will be described below.
[0020]
The measurement unit 1 measures an input signal and stores measurement waveform data for the number of times of trigger in the history memory 2. The data control means 3 reads the measured waveform data stored from the history memory 2 and overwrites the read measured waveform data on the display means 4. Thereby, the measured waveform data of the input signal can be displayed on the display unit 4. This is the normal measurement operation in the data observation device of the present invention.
[0021]
Next, when the averaging means is selected by the selecting means 5, the measured waveform data used for the averaging process from the measured waveform data displayed on the display unit 4 by the above operation is displayed on the screen of the display unit 4, for example. Select using the number of the measured waveform data.
[0022]
The measurement waveform data selected here is input from the history memory 2 to the averaging means 31, where the average value of the data at each sample point of each measurement waveform data is calculated, and the average waveform data is obtained. This average waveform data is the waveform of the input signal from which random noise components mixed into the input signal have been removed.
[0023]
The data control means 3 simultaneously displays the obtained average waveform data on the display unit 4 together with the measured waveform data. This is the operation of the averaging means in the data observation device of the present invention.
[0024]
FIG. 2 is a display example of the measured waveform data and the average waveform data displayed on the display unit 4. In the figure, an upper area 41 is an area for displaying the measured waveform data stored in the history memory 2, and a lower area 42 is an area for displaying the average waveform data. Further, as the measurement waveform data displayed in the area 41, the measurement waveform data used for the averaging process can be selectively displayed, and the selection means 5 can display arbitrary measurement waveform data.
[0025]
In the above description, the method of selecting the measurement waveform data used for the averaging process by the selection means 5 has been described. However, when a predetermined number of measurement waveform data are stored in the history memory 2, the data is stored in the history memory 2. The average processing may be automated by inputting the measured waveform data to the averaging means 31. This is effective when only the waveform after the averaging process is required, for example, when measuring an input signal mixed with a lot of random noise.
[0026]
It should be noted that the foregoing description has been directed to specific preferred embodiments for the purpose of explanation and illustration of the present invention. Therefore, the present invention is not limited to the above-described embodiment, but includes many more changes and modifications without departing from the spirit thereof.
[0027]
For example, the history memory 2 is divided into two areas, one for storing measured waveform data and the other for storing average waveform data, and the averaged waveform data after the averaging process can be stored in the area for storing average waveform data in the history memory 2. A configured waveform observation device is also within the scope of the present invention.
[0028]
【The invention's effect】
As is apparent from the above description, the present invention has the following effects.
According to the first aspect of the present invention, it is possible to perform an averaging process by selecting arbitrary measurement waveform data from a plurality of measurement waveform data stored in the storage unit. Therefore, it is possible to exclude the abnormal measurement waveform data from the plurality of measurement waveform data stored in the storage means, select the optimum plurality of measurement waveform data, and perform the averaging process.
[0029]
According to the second aspect of the present invention, the measured waveform data and the average waveform data are displayed on the same screen of the display unit, so that the input signal waveform before the averaging process and the input signal waveform after the averaging process are performed. Can be compared on the same screen.
[0030]
According to the third aspect of the present invention, only the measurement waveform data to be analyzed is displayed on the display unit by selecting the measurement waveform data to be displayed on the display unit from the plurality of measurement waveform data stored in the storage unit. It is possible to do.
[0031]
According to the fourth aspect of the invention, by displaying the measured waveform data and the average waveform data used in the averaging process on the same screen of the display means, it is possible to easily grasp which measurement waveform data was used to perform the averaging process. .
[0032]
According to the invention described in claim 5, it is possible to save the waveform after the averaging process.
[Brief description of the drawings]
FIG. 1 is a configuration diagram showing one embodiment of a waveform observation device according to the present invention.
FIG. 2 is a screen display example of the waveform observation device according to the present invention.
FIG. 3 is a diagram illustrating an averaging process.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Measurement part 2 History memory 3 Data control means 4 Display part 5 Selection means 31 Average means

Claims (5)

In a waveform observation device that displays measured waveform data obtained by measuring an input signal on a display unit ,
A measurement unit that measures the input signal and generates measurement waveform data;
A storage unit for storing a plurality of measurement waveform data from the measurement unit,
Selecting means for selecting two or more measurement waveform data to be used for averaging from the measurement waveform data displayed on the display unit ;
Average means for inputting the measured waveform data selected by the selecting means from the storage unit , performing an averaging process on the input measured waveform data to generate average waveform data,
And data control means for displaying the average waveform data from the averaging unit on the display unit,
A waveform observing device comprising: The waveform observation device according to claim 1, wherein the data control means is configured to display the measured waveform data and the average waveform data on the same screen of the display unit. 2. The waveform observation apparatus according to claim 1, wherein the data control unit is configured to display any of the measured waveform data selected by the selection unit on the display unit. 3. 2. The waveform observation apparatus according to claim 1, wherein the data control unit is configured to display the measurement waveform data input to the average unit on the display unit. The waveform observation device according to claim 1, wherein the storage unit is configured to store the average waveform data.

Images