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JP3599259B2 - X-ray analyzer - Google Patents
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JP3599259B2 - X-ray analyzer - Google Patents

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Publication number
JP3599259B2
JP3599259B2 JP3597297A JP3597297A JP3599259B2 JP 3599259 B2 JP3599259 B2 JP 3599259B2 JP 3597297 A JP3597297 A JP 3597297A JP 3597297 A JP3597297 A JP 3597297A JP 3599259 B2 JP3599259 B2 JP 3599259B2
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Japan
Prior art keywords
ray
vacuum
sample
chamber
entrance window
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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JP3597297A
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Japanese (ja)
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JPH10232285A (en
Inventor
壱永 大野
幸郎 橋詰
正彦 桑田
俊善 渡辺
弘 大久保
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
DKK TOA Corp
Original Assignee
Jeol Ltd
DKK TOA Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to JP3597297A priority Critical patent/JP3599259B2/en
Priority to US09/026,496 priority patent/US6052429A/en
Publication of JPH10232285A publication Critical patent/JPH10232285A/en
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  • Analysing Materials By The Use Of Radiation (AREA)

Description

【0001】
【発明の属する技術分野】
本発明は、X線検出器を冷却装置と共に真空容器内に封入して冷却し、X線入射窓を通して試料から放射される特性X線を検出して分析を行うX線分析装置に関する。
【0002】
【従来の技術】
図2は従来のX線分析装置の構成例を示す図である。
電子顕微鏡では、試料の微小領域を元素分析する装置としてエネルギー分散型X線分析装置が使用されている。このエネルギー分散型X線分析装置では、図2に示すように励起線発生器1から発生された一次線5を試料4に照射し、それによって発生したX線6をX線検出器8で検出し電気信号に変換して定性定量分析を行う。励起線発生器1は、イオン源や電子線発生器、X線発生器、放射線源等からなる。X線検出器8は、シリコン半導体素子等からなり、その前方にベリリウム(Be)薄膜や有機薄膜付のX線入射窓7を有する真空容器3に冷却装置10と共に封入され、液体窒素の入った容器や冷凍機等の冷却装置10により熱伝導棒9を介して冷却される。
【0003】
このように、X線分析装置において、高性能の分析を期待する場合には、信号対雑音比を向上させるためにX線検出器8を冷却することが行われる。そして、冷却して使用するX線検出器8の場合、冷却効率を上げるためX線検出器8を真空容器3中で使用することも一般的な手法であり、真空容器3中のX線検出器8にX線を導入するために、ベリリウムや有機膜等の非常に薄いX線入射窓7を使用している。
【0004】
【発明が解決しようとする課題】
上記のようにX線検出器8を真空容器3中で冷却して使用するX線分析装置において、試料4が液体や含水率の高い生物試料や揮発性の高い物質の場合、試料室2を高真空として分析することはできない。そのため、このような場合には、試料室2を低真空又はガス雰囲気として試料4の測定を行うが、ガス雰囲気で分析を行う場合、試料4とX線入射窓7との距離が長いと、ガスによるX線の吸収によって感度が低下するため、ヘリウムや水素などの軽いガスが使用される。
【0005】
しかし、軽いガスは、分子が小さいため、X線検出器8を封入した真空容器3中にX線入射窓7を透過して侵入するという問題が生じている。このことは、ヘリウムや水素ガスで膨らませた風船が数日で萎んでしまうことと同じ現象である。真空容器3中にガスが侵入すると、真空容器3中の真空度が低下する。このことにより、X線検出器8には高圧が印加されているため、放電が発生し、また、冷却効率が悪化し、X線検出器8の性能が劣化する。さらには、冷却効率が悪化することにより、冷却装置10の液体窒素の消費量が増大する。
【0006】
【課題を解決するための手段】
本発明は、上記課題を解決するものであって、X線検出器を冷却して使用する真空容器にガスが侵入するのを防ぎ、真空度の低下による冷却効率の悪化を防ぐものである。
【0007】
そのために本発明は、X線検出器を冷却装置と共に真空容器内に封入して冷却し、X線入射窓を通して試料から放射される特性X線を検出して分析を行うX線分析装置において、前記X線検出器を封入した前記真空容器のX線入射窓のX線入射側とガス雰囲気とした前記試料のある試料室との間に第2のX線入射窓を有する真空の隔離室を設け、該隔離室により前記真空容器のX線入射窓における両側の差圧を小さくし、前記ガス雰囲気とした試料室と前記真空容器のX線入射窓との間を隔離したことを特徴とし、前記真空の隔離室は、真空排気するポンプを有する真空室や、真空密封室とすることを特徴とするものである。
【0008】
【発明の実施の形態】
以下、本発明の実施の形態を図面を参照しつつ説明する。
図1は本発明に係るX線分析装置の実施の形態を示す図であり、1は励起線発生器、2は試料室、3は真空容器、4は試料、5は一次線、6はX線、7、13はX線入射窓、8はX線検出器、9は熱伝導棒、10は冷却装置、11は隔離室、12はロータリーポンプを示す。
【0009】
図1において、励起線発生器1は、イオン源や電子線発生器、X線発生器、放射線源等からなり、一次線5を発生する。一次線5は、例えばX線またはγ線源である。試料室2は、大気またはヘリウム、水素などのガス雰囲気の中で励起線発生器1からの一次線5を照射する試料4を保持するものである。X線検出器8は、一次線5の照射によって試料4から発生しX線入射窓13、7を通して入射するX線6を検出するものであり、それを電気信号に変換して定性定量分析を行う。また、X線検出器8は、例えば冷媒として液体窒素を用いた冷却装置10により熱伝導棒9を介して冷却され、真空容器3は、X線入射窓7を有し、これらX線検出器8、熱伝導棒9、冷却装置10を真空封入するものである。
【0010】
隔離室11は、試料室2と真空容器3とを隔離するものであり、X線入射窓13を有し、ロータリーポンプ12は、隔離室11を排気して真空に保持するためのものである。つまり、隔離室11は、真空室とすることによりX線入射窓7の両側の差圧を小さくしている。したがって、試料4から発生したX線6は、隔離室11のX線入射窓13、真空容器3のX線入射窓7の2枚を通してX線検出器8で検出される。しかし、隔離室11は、ロータリーポンプ12により真空に引くので、真空容器3のX線入射窓7における両側の差圧を小さくすことができ、真空容器3のX線入射窓7を通してガスが侵入するのを防ぐことができる。つまり、試料室2と真空容器3との間は、2枚のX線入射窓13と7の間で真空の隔離室11によって隔離される。
【0011】
上記のように構成することにより、試料室2を大気またはヘリウム、水素などのガス雰囲気として試料4の測定を行う場合、X線検出器8の前方に配置されたX線入射窓7は、直接試料室2側のガスと接しないので、ガスが侵入するのを防ぎ、真空度の低下による冷却効率の悪化を防ぐことができる。
【0012】
なお、本発明は、上記実施の形態に限定されるものではなく、種々の変形が可能である。例えば上記実施の形態では、隔離室をロータリーポンプで排気して真空に引く構成を示したが、このようなロータリーポンプを用いずに真空密封型の隔離室としてもよい。また、試料室から真空容器を完全に隔離するようにした隔離室11の例を示したが、ガスが侵入するX線入射窓7のX線入射側だけで隔離室を構成するものであってもよい。
【0013】
【発明の効果】
以上の説明から明らかなように、本発明によれば、X線検出器の前方に配置されたX線入射窓の薄膜が直接ヘリウムや水素ガスと接しないので、X線入射窓を透過または粒界を通してのガスの漏れがあっても、その量は、隔膜両側の圧力差により、少なくとも3桁減らすことができる。その結果、真空度の低下による冷却効率の悪化を防ぐことができる。したがって、X線検出器の寿命を大幅に延ばすことができ、さらに、液体窒素等の冷媒の消費量を低減することができる。
【図面の簡単な説明】
【図1】本発明に係るX線分析装置の実施の形態を示す図である。
【図2】従来のX線分析装置の構成例を示す図である。
【符号の説明】
1…励起線発生器、2…試料室、3…真空容器、4…試料、5…一次線、6…X線、7、13…X線入射窓、8…X線検出器、9…熱伝導棒、10…冷却装置、11…隔離室、12…ロータリーポンプ
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to an X-ray analyzer for sealing an X-ray detector together with a cooling device in a vacuum vessel, cooling the same, and detecting and analyzing characteristic X-rays emitted from a sample through an X-ray entrance window.
[0002]
[Prior art]
FIG. 2 is a diagram showing a configuration example of a conventional X-ray analyzer.
In an electron microscope, an energy dispersive X-ray analyzer is used as an apparatus for performing elemental analysis on a small region of a sample. In this energy dispersive X-ray analyzer, a primary ray 5 generated from an excitation ray generator 1 is irradiated on a sample 4 as shown in FIG. 2, and an X-ray 6 generated thereby is detected by an X-ray detector 8. Qualitative and quantitative analysis by converting to electrical signals. The excitation ray generator 1 includes an ion source, an electron beam generator, an X-ray generator, a radiation source, and the like. The X-ray detector 8 is made of a silicon semiconductor element or the like, and is sealed together with the cooling device 10 in a vacuum vessel 3 having an X-ray entrance window 7 with a beryllium (Be) thin film or an organic thin film in front thereof, and contains liquid nitrogen. It is cooled via a heat conducting rod 9 by a cooling device 10 such as a container or a refrigerator.
[0003]
As described above, when high-performance analysis is expected in the X-ray analyzer, the X-ray detector 8 is cooled to improve the signal-to-noise ratio. In the case of the X-ray detector 8 used after cooling, it is a general method to use the X-ray detector 8 in the vacuum vessel 3 in order to increase the cooling efficiency. In order to introduce X-rays into the vessel 8, a very thin X-ray entrance window 7 such as beryllium or an organic film is used.
[0004]
[Problems to be solved by the invention]
In the X-ray analyzer that uses the X-ray detector 8 cooled in the vacuum vessel 3 as described above, if the sample 4 is a liquid, a biological sample with a high water content, or a highly volatile substance, the sample chamber 2 is It cannot be analyzed as a high vacuum. Therefore, in such a case, the measurement of the sample 4 is performed by setting the sample chamber 2 to a low vacuum or a gas atmosphere. However, when the analysis is performed in a gas atmosphere, if the distance between the sample 4 and the X-ray incident window 7 is long, Since sensitivity is reduced by absorption of X-rays by the gas, a light gas such as helium or hydrogen is used.
[0005]
However, since a light gas has small molecules, there is a problem that the light gas penetrates through the X-ray entrance window 7 and enters the vacuum vessel 3 in which the X-ray detector 8 is sealed. This is the same phenomenon that a balloon inflated with helium or hydrogen gas will wither in a few days. When gas enters the vacuum vessel 3, the degree of vacuum in the vacuum vessel 3 decreases. As a result, since a high voltage is applied to the X-ray detector 8, discharge occurs, cooling efficiency deteriorates, and performance of the X-ray detector 8 deteriorates. Further, the cooling efficiency is deteriorated, so that the consumption of the liquid nitrogen of the cooling device 10 is increased.
[0006]
[Means for Solving the Problems]
The present invention has been made to solve the above-described problems, and it is an object of the present invention to prevent a gas from entering a vacuum vessel used for cooling an X-ray detector, and to prevent deterioration in cooling efficiency due to a decrease in the degree of vacuum.
[0007]
For this purpose, the present invention provides an X-ray analyzer for sealing and cooling an X-ray detector together with a cooling device in a vacuum vessel and detecting and analyzing characteristic X-rays emitted from a sample through an X-ray entrance window. A vacuum isolation chamber having a second X-ray entrance window is provided between the X-ray entrance side of the X-ray entrance window of the vacuum vessel enclosing the X-ray detector and a sample chamber having the sample in a gas atmosphere. Wherein the differential chamber reduces the differential pressure on both sides of the X-ray entrance window of the vacuum vessel, thereby isolating the gas atmosphere from the sample chamber and the X-ray entrance window of the vacuum vessel, The vacuum isolation chamber is a vacuum chamber having a pump for evacuating or a vacuum sealed chamber.
[0008]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 is a view showing an embodiment of an X-ray analyzer according to the present invention, wherein 1 is an excitation line generator, 2 is a sample chamber, 3 is a vacuum vessel, 4 is a sample, 5 is a primary line, and 6 is X-ray. Reference numerals 7 and 13 denote X-ray entrance windows, 8 denotes an X-ray detector, 9 denotes a heat conducting rod, 10 denotes a cooling device, 11 denotes an isolation room, and 12 denotes a rotary pump.
[0009]
In FIG. 1, an excitation beam generator 1 includes an ion source, an electron beam generator, an X-ray generator, a radiation source, and the like, and generates a primary beam 5. The primary radiation 5 is, for example, an X-ray or γ-ray source. The sample chamber 2 holds a sample 4 to be irradiated with a primary beam 5 from the excitation beam generator 1 in the atmosphere or a gas atmosphere such as helium or hydrogen. The X-ray detector 8 detects the X-rays 6 generated from the sample 4 by the irradiation of the primary rays 5 and incident through the X-ray incidence windows 13 and 7. The X-rays are converted into electric signals to perform qualitative quantitative analysis. Do. The X-ray detector 8 is cooled via a heat conducting rod 9 by a cooling device 10 using liquid nitrogen as a refrigerant, for example, and the vacuum vessel 3 has an X-ray entrance window 7. 8, the heat conducting rod 9, and the cooling device 10 are vacuum-sealed.
[0010]
The isolation chamber 11 is for isolating the sample chamber 2 from the vacuum vessel 3, has an X-ray incident window 13, and the rotary pump 12 is for exhausting the isolation chamber 11 and keeping it in a vacuum. . That is, the isolation chamber 11 is a vacuum chamber to reduce the differential pressure on both sides of the X-ray entrance window 7. Therefore, the X-ray 6 generated from the sample 4 is detected by the X-ray detector 8 through the X-ray entrance window 13 of the isolation chamber 11 and the X-ray entrance window 7 of the vacuum vessel 3. However, since the isolation chamber 11 is evacuated by the rotary pump 12, the differential pressure on both sides of the X-ray entrance window 7 of the vacuum vessel 3 can be reduced, and gas enters through the X-ray entrance window 7 of the vacuum vessel 3. Can be prevented. That is, the space between the sample chamber 2 and the vacuum vessel 3 is isolated by the vacuum isolation chamber 11 between the two X-ray incidence windows 13 and 7.
[0011]
With the above configuration, when the measurement of the sample 4 is performed by setting the sample chamber 2 to the atmosphere or a gas atmosphere of helium, hydrogen, or the like, the X-ray incident window 7 disposed in front of the X-ray detector 8 directly Since the gas does not come into contact with the gas on the sample chamber 2 side, it is possible to prevent the gas from entering and to prevent the cooling efficiency from being deteriorated due to a decrease in the degree of vacuum.
[0012]
Note that the present invention is not limited to the above embodiment, and various modifications are possible. For example, in the above-described embodiment, a configuration in which the isolation chamber is evacuated by a rotary pump and vacuum is drawn is shown, but a vacuum-sealed isolation chamber may be used without using such a rotary pump. Further, the example of the isolation chamber 11 in which the vacuum chamber is completely isolated from the sample chamber has been described. Is also good.
[0013]
【The invention's effect】
As is clear from the above description, according to the present invention, since the thin film of the X-ray entrance window arranged in front of the X-ray detector does not directly contact helium or hydrogen gas, it passes through the X-ray entrance window, If there is gas leakage through the field, the amount can be reduced by at least three orders of magnitude due to the pressure differential across the diaphragm. As a result, it is possible to prevent the cooling efficiency from being deteriorated due to the decrease in the degree of vacuum. Therefore, the life of the X-ray detector can be significantly extended, and the consumption of a refrigerant such as liquid nitrogen can be reduced.
[Brief description of the drawings]
FIG. 1 is a diagram showing an embodiment of an X-ray analyzer according to the present invention.
FIG. 2 is a diagram showing a configuration example of a conventional X-ray analyzer.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 ... Excitation line generator, 2 ... Sample chamber, 3 ... Vacuum container, 4 ... Sample, 5 ... Primary line, 6 ... X-ray, 7, 13 ... X-ray entrance window, 8 ... X-ray detector, 9 ... Heat Conducting rod, 10: cooling device, 11: isolation chamber, 12: rotary pump

Claims (3)

X線検出器を冷却装置と共に真空容器内に封入して冷却し、X線入射窓を通して試料から放射される特性X線を検出して分析を行うX線分析装置において、前記X線検出器を封入した前記真空容器のX線入射窓のX線入射側とガス雰囲気とした前記試料のある試料室との間に第2のX線入射窓を有する真空の隔離室を設け、該隔離室により前記真空容器のX線入射窓における両側の差圧を小さくし、前記ガス雰囲気とした試料室と前記真空容器のX線入射窓との間を隔離したことを特徴とするX線分析装置。The X-ray detector is sealed in a vacuum vessel together with a cooling device and cooled, and an X-ray analyzer for detecting and analyzing characteristic X-rays emitted from a sample through an X-ray entrance window, wherein the X-ray detector is A vacuum isolation chamber having a second X-ray entrance window is provided between the X-ray entrance side of the sealed X-ray entrance window of the vacuum vessel and a sample chamber containing the sample in a gas atmosphere. An X-ray analyzer, wherein a differential pressure on both sides of an X-ray entrance window of the vacuum vessel is reduced to isolate the sample chamber in the gas atmosphere from the X-ray entrance window of the vacuum vessel. 前記真空の隔離室は、真空排気するポンプを有する真空室とすることを特徴とする請求項1記載のX線分析装置。2. The X-ray analyzer according to claim 1, wherein the vacuum isolation chamber is a vacuum chamber having a pump for evacuating. 前記真空の隔離室は、真空密封室とすることを特徴とする請求項1記載のX線分析装置。The X-ray analyzer according to claim 1, wherein the vacuum isolation chamber is a vacuum sealed chamber.
JP3597297A 1997-02-20 1997-02-20 X-ray analyzer Expired - Fee Related JP3599259B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP3597297A JP3599259B2 (en) 1997-02-20 1997-02-20 X-ray analyzer
US09/026,496 US6052429A (en) 1997-02-20 1998-02-19 X-ray analyzing apparatus

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Application Number Priority Date Filing Date Title
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JP3599259B2 true JP3599259B2 (en) 2004-12-08

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6249569B1 (en) * 1998-12-22 2001-06-19 General Electric Company X-ray tube having increased cooling capabilities
WO2005024407A1 (en) * 2003-08-27 2005-03-17 Rigaku Industrial Corporation Fluorescent x-ray analyzer
JP4679181B2 (en) * 2005-03-02 2011-04-27 日本電子株式会社 Energy dispersive X-ray detector and sample analyzer
JP4910628B2 (en) * 2006-10-25 2012-04-04 株式会社島津製作所 X-ray detector
CN103884725B (en) * 2012-12-21 2016-08-03 中国科学院高能物理研究所 The In Situ Heating device of X-ray absorption spectrum
JP6866801B2 (en) * 2017-08-07 2021-04-28 株式会社島津製作所 X-ray detector monitoring device

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