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JP3615864B2 - Measuring method of optical axis angle of wedge birefringent plate - Google Patents
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JP3615864B2 - Measuring method of optical axis angle of wedge birefringent plate - Google Patents

Measuring method of optical axis angle of wedge birefringent plate Download PDF

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JP3615864B2
JP3615864B2 JP10713096A JP10713096A JP3615864B2 JP 3615864 B2 JP3615864 B2 JP 3615864B2 JP 10713096 A JP10713096 A JP 10713096A JP 10713096 A JP10713096 A JP 10713096A JP 3615864 B2 JP3615864 B2 JP 3615864B2
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Prior art keywords
optical axis
wedge
angle
birefringent plate
light
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JPH09292212A (en
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利光 稲垣
明夫 高橋
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FDK Corp
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FDK Corp
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Description

【0001】
【発明の属する技術分野】
本発明は、偏波無依存型光アイソレータなどの光学デバイスに用いられる楔状複屈折板の光学軸方向を測定する方法に関する。
【0002】
【従来の技術】
図5は偏波無依存型光アイソレータの概略構成とその動作原理とを説明するための斜視図である。同図(a),(b)のそれぞれに示すように、偏波無依存型光アイソレータ2はファラデー回転子4を挟んで一対の同形状の楔状複屈折板6を対称に配置し、さらにその前後に一対のレンズ8を配置して光ファイバー10に結合させている。
【0003】
ここで、上記ファラデー回転子4による偏光面回転角は45度とされ、その前後の一対の楔状複屈折板6は前方の第1複屈折板6aの光学軸方向に対して後方の第2複屈折板6bの光学軸方向が上記ファラデー回転子4による偏光面回転角に対応されて45度ずらされ、かつ第1,第2複屈折板6a,6bは楔状の傾斜面同士を外側にして平行に対称配置されている。なお、楔状複屈折板6は光の透過方向に垂直な端面62と、この端面62に対して所定角度傾斜して対面する傾斜面64とを有し、光学軸は上記端面62の面内に存する。
【0004】
そして、このように構成される偏波無依存型光アイソレータ2では、同図(a)に示すように、前方の光ファイバー10aからの順方向の光は第1レンズ8aで平行光線にされて第1複屈折板6aに入射され、この第1複屈折板6aを透過した光は常光と異常光とに分離される。そして、この分離された常光と異常光とはさらにファラデー回転子4によって各々偏光面が45度回転されて、後方の第2複屈折板6bに入射される。
【0005】
このとき、第2複屈折板6bは第1複屈折板との関係において、その光学軸方向がファラデー回転子4による偏光面の回転角度に合わされて45度ずらされており、かつ傾斜面同士を平行にして対称配置されているから、この第2複屈折板6bを透過する際の常光と異常光との関係は、第1複屈折板6aを透過したときと変わらず、このため第2複屈折板6bを透過した常光と異常光は平行光線に戻されて後方の第2レンズ8bに入射する。よって当該常光と異常光は後方の光ファイバー10bに集光されて順方向に伝播されていく。
【0006】
一方、同図(b)に示すように、後方の光ファイバー10bからの逆方向の反射戻り光は、第2レンズ8bで平行光線にされてから第2複屈折板6bで常光と異常光とに分離され、さらにファラデー回転子4で偏光面が45度回転されたのち、第1複屈折板6aに入射される。
【0007】
ところが、この逆方向の場合には、第1複屈折板6aの光学軸は第2複屈折板6bの光学軸に対してファラデー回転子4による回転方向と逆回転方向に45度ずれていることになるので、第2複屈折板6bを透過したときに分離された常光と異常光は、当該第1複屈折板6aを透過する際においてはそれらの関係が逆転することになる。
【0008】
従って、この第1複屈折板6aを透過しても反射戻り光の常光と異常光とは平行光線には戻らず、よって当該常光と異常光は第1レンズ8aによって前方の光ファイバー10aに集光されることがなく、これ故、反射戻り光の逆方向への伝播が阻止される。
【0009】
ところで、この偏波無依存型光アイソレータ2は上述の動作原理から明らかなように、一対の楔状複屈折板6a,6bはその傾斜面角度を同一にするとともに平行に配置し、かつ光学軸の角度方向を相互に45度ずらすことが必要であり、しかもこれらの精度はきわめて精密に設定しなければならない。
【0010】
このため、上記一対の楔状複屈折板6a,6bは、ルチル(TiO)等の光学材料のブロック素材からの切り出しから研磨による傾斜面64の形成までを一貫して同一の工程で同時加工し、その後に2つの複屈折板6a,6bに切断分離して作製しており、一対に組み合わせる2つの楔状複屈折板6a,6bは必ずペアで同時に作製することにより加工精度の誤差レベルまで形状が等しくなるようにしている。
【0011】
また、このようにペアで作製した一対の楔状複屈折板6a,6bは、図6に拡大表示するように、ファラデー回転子4の前後にそれぞれの傾斜面64を外側にしてかつ平行度を精密にして対称に配置するが、その際には平行度だけでなく光学軸<001>の方向も正確に45度ずらさなければならない。
【0012】
ここで、上述のように一対の楔状複屈折板6a,6bは同一のブロック素材からペアで切り出されて加工形成されるので、光学軸<001>が存する端面62の周囲に直角に形成したある共通の周側面を基準面66とすれば、この基準面66に対する光学軸<001>の方向つまり角度θは等しく、この一対の楔形複屈折板6a,6bをその各傾斜面64を平行にして対称配置すれば両光学軸<001>のなす角度、即ち光学軸<001>相互のずれ角度は2θになる。よって、ずれ角度を45度にするには上記基準面66からの光学軸角度θを22.5度にすれば良い。
【0013】
従って、以上のことから、従来より上記一対の楔状複屈折板6a,6bは図7に示すようにして作製している。即ち、先ず光学材料のブロック素材12の光学軸<001>をX線回析により測定し、この光学軸<001>を面内に内包する平行な2面と、この2面に直交するとともに光学軸<001>に対して22.5度の角度をなす平行な2面とで囲まれる角柱状体14を切り出す。次に、光学軸<001>を内包する平行な2面のうちの一方を研磨して所定角度傾斜させ、傾斜面64を形成する。爾後、上記4面に直交する面で切断して、2つの同形状の楔状複屈折板6a,6bを得ている。
【0014】
【発明が解決しようとする課題】
ところで、上記偏波無依存型光アイソレータ2の性能を規定値以上に満足させるためには、楔状複屈折板6a,6bの光学軸の方向は基準面に対して22.5度±10分程度の加工精度内に納める必要がある。しかしながら、楔状複屈折板6にまで加工し終わった後では、あまりにも小さすぎてその光学軸<001>の測定はX線回析によっても正確に行うことができず、また従来では正確に当該光学軸<001>の測定を行う術も他に無く、よって楔状複屈折板6はその寸法精度管理が行えず、部品としての合否判定をすることが実質的にできなかった。
【0015】
従って、楔状複屈折板6は加工途中のブロック素材12段階でのX線回析による光学軸測定に依存して、以後の加工精度を可及的に高めることによって便宜的にその部品の寸法精度を保証せざるを得ず、偏波無依存型光アイソレータ2として組立の完了した完成品の性能試験で合否判定するしかなかった。
【0016】
このため、部品として光学軸角度が不良であっても、無駄に組立をおこなっており、その結果、歩留まりを低下させて、コストの低減を阻害する要因にもなっていた。
【0017】
本発明は、このような事情に鑑みてなされたものであって、その目的は、楔形複屈折板における基準面と光学軸とのなす角度を正確に測定することができ、もって部品としての合否判定を容易に行い得る楔状複屈折板の光学軸角度測定方法を提供することにある。
【0018】
【課題を解決するための手段】
上記目的を達成するため、本発明に係る楔状複屈折板の光学軸角度測定方法では、光の透過方向に平行な基準面(66)と、該透過方向に直交して光学軸<001>が面内に存する端面(62)と、該端面(62)に対して所定角度傾斜して対面する傾斜面(64)とを有する楔状複屈折板(6)における該基準面(66)と該光学軸<001>とのなす角度θを測定するに際して、測定台(22)上に該複屈折板(6)をその基準面(66)を合わせて載置し、該載置した複屈折板(6)に回転式偏光板(28)により偏光した光を透過させて、該透過後の常光又は異常光のみの透過光量を測定し、該透過光量が最小値となる該偏光板(28)の回転位置を探して該光学軸<001>方向を求めた後、載置する楔形複屈折板6の基準面(66)はそのままにして当該楔状複屈折板(6)を180度回転させて該光学軸<001>方向を求めることで、該端面(62)側からと該傾斜面(64)側からとの双方で該光学軸<001>方向を求め、該両回転位置の角度差αから該基準面(66)と該光学軸<001>とのなす角度θを測定することを特徴とする。
【0019】
ここで、上記常光又は異常光のみの透過光量が最小値となる回転式偏光板(28)の回転位置は光学軸<001>方向を正確に計測して示すものであり、端面(62)側から見た場合の光学軸<001>方向と傾斜面(64)側から見た場合の光学軸<001>方向とは当然のことであるが基準面(66)に対して逆方向に同一角度θだけ回転した位置となる。従って、この2方向から見た場合の各光学軸<001>方向の回転位置をそれぞれ求めて、それらの角度差αを得れば、この角度差αは基準面(66)と光学軸<001>とがなす角度θの2倍をπから差し引いたものであるから、当該角度θは(π−α)/2となり、容易に算出できる。また、2方向から測定して得られるそれぞれの光学軸方向つまり回転位置は、実質的に光学軸<001>を直接計測するものであるから、それらの角度差αはきわめて高精度に計測でき、よって角度θも高精度に測定できる。このため、信頼度の高い部品精度管理が可能となり、部品の合否判定を適切に行えるようになる。
【0020】
【発明の実施の形態】
以下に本発明に係る楔状複屈折板の光学軸角度測定方法について、添付図面に基づき詳細に説明する。
【0021】
図1は本発明に係る測定方法を実施するにあたって用いる測定系の概略構成を示す図である。同図に示すように、測定系20は被測定物である楔状複屈折板6を載せる測定台22と、この測定台22上に載置した楔状複屈折板6に向けて平行光線を照射して透過させる照射器24及びその光源26、測定台22と照射器24との間に配置されて照射される平行光線を任意な角度の偏波面に偏光可能な回転式偏光板28、並びにこの回転式偏光板28の回転角度を測定する角度測定手段30、そして楔状複屈折板6を透過した後の透過光量を計測するディテクター32及びその電源34とからなる。
【0022】
また、楔状複屈折板6は上述の従来技術で説明したように、光の透過方向に直角で光学軸<001>を内包する端面62と、この端面62に対して所定角度傾斜して対面する傾斜面64及び上記端面62に直交して光の透過方向に平行な基準面66とを有し、具体的には直方体の一面を傾斜面に形成した楔状をなす。
【0023】
ところで、この楔状複屈折板6の基準面66に対する光学軸<001>方向、つまり基準面66と光学軸<001>とのなす角度θを測定するには、図1及び図2に示すように、先ず、楔状複屈折板6を測定台22上に基準面66を合わせて載置し、かつこの楔状複屈折板6の端面62あるいは傾斜面64を照射器24に向けて(図2(a)参照)、照射器24から平行光線を照射して透過させる。そして、楔状複屈折板6で分離された常光又は異常光のいずれか一方の光軸上にディテクター32の位置を合わせ、透過後の透過光量を測定する。なお、本図示例では常光の光軸上にディテクター32を配置して、常光のみの透過光量を測定するようにしており、また、光学軸<001>を内包する端面62側から見た場合の光学軸<001>方向を先に求めるべく、当該端面62側を照射器24側に向けている。
【0024】
次に、回転式偏光板28を回転させて上記透過光量の測定値が最小値となる回転位置を探して光学軸<001>方向を求め、当該光学軸<001>方向が求められたなら、このときの回転式偏光板28の回転位置を角度測定開始点とし、角度測定手段30のスケールをリセットする。
【0025】
次いで、載置する楔形複屈折板6の基準面66はそのままにして当該楔状複屈折板6を180度回転させて傾斜面64側を照射器24に向け(図2(b)参照)、当該傾斜面64側から見た場合の光学軸<001>方向を上述したのと同様にして求める。そして、このときの回転式偏光板28の回転角度を角度測定器30で読みとれば、端面62側から見た場合の光学軸<001>の角度方向でスケールが予めリセットしてあるから、その読みとり値がそのまま2方向からの見た場合の各光学軸<001>方向の角度差αになる。そして、こうして求められる角度差αは、いわば2つの光学軸<001>間の角度を直接的に計測するのに実質的に等しいから、その測定精度はきわめて高いものとなる。
【0026】
また、上記角度差αは基準面66と光学軸<001>とがなす角度θの2倍をπから差し引いたものであるから、当該角度θは(π−α)/2であり、容易に算出して測定でき、しかも高精度な測定値が得られる。
【0027】
なお、角度差αを求めるにあたっては、角度測定手段30のスケール初期値を任意にしておいて、それぞれの方向からの光学軸<001>方向を探し当てたときの回転位置のスケール表示値をそのまま読みとって、それらの読みとり値の差から角度差αを求めても良い。このようにして算出しても、任意に設定した初期値は減算するときに消失するので何等影響はない。つまり、各光学軸<001>の方向を回転式偏光板28を回転させて探し当てるにあたって、角度測定手段30のスケールは初期設定する必要がない。また、楔状複屈折板6の基準面66としては傾斜面の周囲4面のいずれをも選択し得る。
【0028】
また、偏波無依存型光アイソレータに組み込む一対の楔状複屈折板6a,6bの光学軸方向を測定する場合には、一方の楔状複屈折板6aは図2に示すように、楔状の台形断面において幅広となる長辺側の周側面を基準面66として測定し、他方の楔状複屈折板6bは図3に示すように楔状の台形断面において幅狭となる短辺側の周側面を基準面66として測定するようにしても良い。このように、基準面を分けて測定した場合において、一対の両楔状複屈折板6a,6bの光学軸<001>方向がともに許容寸法精度内(具体例としては22.5度±10分)に入って、部品として合格判定が下されていれば、偏波無依存型光アイソレータを組み立てるときに、当該一対の楔状複屈折板6a,6bは組立治具台36の基準面36a上に載置するだけで光学軸方向を相互に45度ずらすことができ、光学軸調整が不要になる。
【0029】
【発明の効果】
以上、発明の実施の形態で詳細に説明したように、本発明に係る楔形複屈折板の光学軸角度測定方法によれば、常光又は異常光のみの透過光量が最小値となる回転式偏光板の回転位置から光学軸方向を正確に探し出して、端面側から見た場合の光学軸方向と傾斜面側から見た場合の光学軸方向との角度差αを計測でき、この2方向から見た場合の光学軸方向の角度差αは、基準面と光学軸とがなす角度θの2倍をπから差し引いたもので、当該角度θは(π−α)/2であるから、求めた角度差αから角度θを容易に算出して測定できる。
【0030】
また、2方向から測定して得られるそれぞれの光学軸方向の回転位置は、実質的に光学軸を直接計測するものであるから、それらの角度差αはきわめて高精度に計測でき、よって角度θも高精度に測定できる。
【0031】
このため、信頼度の高い部品精度管理が可能となり、部品の合否判定を適切に行えるようになる。
【図面の簡単な説明】
【図1】本発明に係る測定方法を実施するにあたって用いる測定系の概略構成を示す図である。
【図2】測定台上に基準面を合わせて載置した楔状複屈折板を示すもので、同図(a)は端面側から測定する場合を示し、(i)はその側面図、(ii)はその正面図、同図(b)は傾斜面側から測定する場合を示し、(i)はその側面図、(ii)はその正面図である。
【図3】同上、測定台上に異なる基準面を合わせて載置した楔状複屈折板を示すもので、同図(a)は端面側から測定する場合を示し、(i)はその側面図、(ii)はその正面図、同図(b)は傾斜面側から測定する場合を示し、(i)はその側面図、(ii)はその正面図である。
【図4】組立治具台上で偏波無依存型光アイソレータを組み付ける状態を示す図である。
【図5】偏波無依存型光アイソレータの概略構成とその動作原理とを説明するための斜視図である。
【図6】偏波無依存型光アイソレータの要部を拡大して示す斜視図である。
【図7】偏波無依存型光アイソレータに用いる楔状複屈折板の形成手順を説明する図である。
【符号の説明】
6 楔状複屈折板
22 測定台
28 回転式偏光板
62 端面
64 傾斜面
66 基準面
<001> 光学軸
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a method for measuring the optical axis direction of a wedge-shaped birefringent plate used in an optical device such as a polarization-independent optical isolator.
[0002]
[Prior art]
FIG. 5 is a perspective view for explaining a schematic configuration and an operation principle of a polarization-independent optical isolator. As shown in FIGS. 1A and 1B, the polarization-independent optical isolator 2 has a pair of wedge-shaped birefringent plates 6 of the same shape arranged symmetrically with a Faraday rotator 4 interposed therebetween, and further A pair of lenses 8 are arranged on the front and rear sides and coupled to the optical fiber 10.
[0003]
Here, the rotation angle of the polarization plane by the Faraday rotator 4 is set to 45 degrees, and the pair of wedge-shaped birefringent plates 6 before and after the pair of wedge-shaped birefringent plates 6 are arranged in the rear direction with respect to the optical axis direction of the first birefringent plate 6a. The optical axis direction of the refracting plate 6b is shifted by 45 degrees corresponding to the polarization plane rotation angle by the Faraday rotator 4, and the first and second birefringent plates 6a and 6b are parallel with the wedge-shaped inclined surfaces facing each other. Are arranged symmetrically. The wedge-shaped birefringent plate 6 has an end face 62 perpendicular to the light transmission direction and an inclined face 64 that faces the end face 62 at a predetermined angle, and the optical axis is in the plane of the end face 62. Exist.
[0004]
In the polarization-independent optical isolator 2 configured in this way, as shown in FIG. 5A, the forward light from the front optical fiber 10a is converted into parallel rays by the first lens 8a. The light incident on the first birefringent plate 6a and transmitted through the first birefringent plate 6a is separated into ordinary light and extraordinary light. The separated ordinary light and extraordinary light are further rotated by 45 degrees by the Faraday rotator 4 and are incident on the rear second birefringent plate 6b.
[0005]
At this time, in relation to the first birefringent plate, the second birefringent plate 6b is shifted by 45 degrees in accordance with the rotation angle of the polarization plane by the Faraday rotator 4 and the inclined surfaces are offset from each other. Since they are arranged in parallel and symmetrically, the relationship between ordinary light and extraordinary light when passing through the second birefringent plate 6b is the same as when passing through the first birefringent plate 6a. The ordinary light and the extraordinary light transmitted through the refracting plate 6b are returned to parallel rays and enter the rear second lens 8b. Therefore, the normal light and the abnormal light are condensed on the rear optical fiber 10b and propagated in the forward direction.
[0006]
On the other hand, as shown in FIG. 4B, the reflected light in the reverse direction from the rear optical fiber 10b is converted into parallel rays by the second lens 8b and then converted into ordinary light and extraordinary light by the second birefringent plate 6b. After being separated and further rotated by 45 degrees by the Faraday rotator 4, the light is incident on the first birefringent plate 6a.
[0007]
However, in the case of this reverse direction, the optical axis of the first birefringent plate 6a is deviated from the optical axis of the second birefringent plate 6b by 45 degrees in the direction opposite to the rotation direction by the Faraday rotator 4. Therefore, the relationship between the ordinary light and the extraordinary light separated when transmitted through the second birefringent plate 6b is reversed when transmitted through the first birefringent plate 6a.
[0008]
Therefore, even if it passes through the first birefringent plate 6a, the ordinary light and the extraordinary light of the reflected return light do not return to parallel rays, so that the ordinary light and the extraordinary light are collected on the optical fiber 10a in front by the first lens 8a. Therefore, propagation of the reflected return light in the reverse direction is prevented.
[0009]
By the way, the polarization-independent optical isolator 2 has a pair of wedge-shaped birefringent plates 6a and 6b arranged in parallel and in parallel with each other, as is apparent from the operation principle described above, and the optical axis It is necessary to shift the angular directions by 45 degrees from each other, and these precisions must be set very precisely.
[0010]
For this reason, the pair of wedge-shaped birefringent plates 6a and 6b are simultaneously processed in the same process from cutting out of an optical material such as rutile (TiO 2 ) from the block material to formation of the inclined surface 64 by polishing. After that, the two birefringent plates 6a and 6b are cut and separated, and the two wedge-shaped birefringent plates 6a and 6b combined in a pair are always manufactured in pairs at the same time, so that the shape has an error level of machining accuracy. To be equal.
[0011]
In addition, the pair of wedge-shaped birefringent plates 6a and 6b manufactured in pairs as described above has the inclined surfaces 64 on the front and rear sides of the Faraday rotator 4, and the parallelism is precise as shown in an enlarged view in FIG. In this case, not only the parallelism but also the direction of the optical axis <001> must be accurately shifted by 45 degrees.
[0012]
Here, as described above, the pair of wedge-shaped birefringent plates 6a and 6b are cut and processed in pairs from the same block material, so that they are formed at right angles around the end face 62 where the optical axis <001> exists. If the common peripheral side surface is the reference surface 66, the direction of the optical axis <001>, that is, the angle θ with respect to the reference surface 66 is equal, and the pair of wedge-shaped birefringent plates 6a and 6b are arranged with their inclined surfaces 64 in parallel. If symmetrically arranged, the angle formed by both optical axes <001>, that is, the deviation angle between the optical axes <001> is 2θ. Therefore, in order to set the deviation angle to 45 degrees, the optical axis angle θ from the reference surface 66 may be set to 22.5 degrees.
[0013]
Therefore, from the above, the pair of wedge-shaped birefringent plates 6a and 6b has been manufactured as shown in FIG. That is, first, the optical axis <001> of the block material 12 of the optical material is measured by X-ray diffraction, and two parallel surfaces including the optical axis <001> in the plane are orthogonal to the two surfaces and are optical. A prismatic body 14 is cut out surrounded by two parallel surfaces forming an angle of 22.5 degrees with respect to the axis <001>. Next, one of the two parallel surfaces including the optical axis <001> is polished and inclined by a predetermined angle to form the inclined surface 64. Then, the same wedge-shaped birefringent plates 6a and 6b are obtained by cutting along a plane orthogonal to the four surfaces.
[0014]
[Problems to be solved by the invention]
By the way, in order to satisfy the performance of the polarization-independent optical isolator 2 to a specified value or more, the direction of the optical axis of the wedge-shaped birefringence plates 6a and 6b is about 22.5 ± 10 minutes with respect to the reference plane. Must be within the machining accuracy. However, after processing to the wedge-shaped birefringent plate 6 is too small, the optical axis <001> cannot be measured accurately even by X-ray diffraction. There is no other way to measure the optical axis <001>. Therefore, the dimensional accuracy of the wedge-shaped birefringent plate 6 cannot be managed, and it is substantially impossible to make a pass / fail judgment as a part.
[0015]
Therefore, the wedge-shaped birefringent plate 6 depends on the optical axis measurement by X-ray diffraction at the stage of the block material 12 in the middle of processing, and improves the subsequent processing accuracy as much as possible. As a result, it has been necessary to make a pass / fail judgment in a performance test of a finished product that has been assembled as the polarization-independent optical isolator 2.
[0016]
For this reason, even if the optical axis angle is defective as a component, the assembly is wasted, resulting in a decrease in yield and a factor in inhibiting cost reduction.
[0017]
The present invention has been made in view of such circumstances, and an object of the present invention is to accurately measure the angle formed by the reference surface and the optical axis of the wedge-shaped birefringent plate, and thus pass or fail as a component. An object of the present invention is to provide a method for measuring the optical axis angle of a wedge-shaped birefringent plate that can be easily determined.
[0018]
[Means for Solving the Problems]
In order to achieve the above object, in the method of measuring the optical axis angle of the wedge-shaped birefringent plate according to the present invention, the reference plane (66) parallel to the light transmission direction and the optical axis <001> perpendicular to the transmission direction are provided. The reference surface (66) in the wedge-shaped birefringent plate (6) having the end surface (62) existing in the surface and the inclined surface (64) facing the end surface (62) at a predetermined angle and the optical surface When measuring the angle θ formed with the axis <001>, the birefringent plate (6) is placed on the measurement table (22 ) with its reference surface (66) aligned, and the placed birefringent plate ( The light polarized by the rotary polarizing plate (28) is transmitted to 6) , the transmitted light amount of only ordinary light or abnormal light after the transmission is measured, and the transmitted light amount of the polarizing plate (28) is minimized. after looking for the rotational position seeking optical axis <001> direction, the reference surface of the tapered birefringent plate 6 for mounting (6 ) Is both with the wedge-shaped birefringent plate leave the (6) is rotated 180 degrees by obtaining the optical axis <001> direction, from the end face (62) side and the inclined surface (64) side Then, the optical axis <001> direction is obtained, and the angle θ between the reference plane (66) and the optical axis <001> is measured from the angle difference α between the rotational positions.
[0019]
Here, the rotational position of the rotary polarizing plate (28) at which the transmitted light amount of only ordinary light or abnormal light is the minimum value is obtained by accurately measuring the optical axis <001> direction, and is on the end face (62) side. The optical axis <001> direction when viewed from the side and the optical axis <001> direction when viewed from the inclined surface (64) side are naturally the same angle in the opposite direction with respect to the reference surface (66) . The position is rotated by θ. Accordingly, if the rotational positions in the respective optical axis <001> directions when viewed from these two directions are obtained and the angular difference α between them is obtained, the angular difference α is determined from the reference plane (66) and the optical axis <001. Since it is obtained by subtracting twice the angle θ formed by> from π, the angle θ is (π−α) / 2 and can be easily calculated. In addition, each optical axis direction obtained by measuring from two directions, that is, the rotational position, is a direct measurement of the optical axis <001>. Therefore, the angular difference α can be measured with extremely high accuracy. Therefore, the angle θ can be measured with high accuracy. For this reason, highly accurate component accuracy management becomes possible, and it becomes possible to appropriately perform pass / fail determination of components.
[0020]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, a method for measuring an optical axis angle of a wedge-shaped birefringent plate according to the present invention will be described in detail with reference to the accompanying drawings.
[0021]
FIG. 1 is a diagram showing a schematic configuration of a measurement system used in carrying out the measurement method according to the present invention. As shown in the figure, the measurement system 20 irradiates parallel beams toward a measuring table 22 on which a wedge-shaped birefringent plate 6 as a measurement object is placed and a wedge-shaped birefringent plate 6 mounted on the measuring table 22. Irradiator 24 for transmitting the light and its light source 26, a rotating polarizing plate 28 arranged between the measuring table 22 and the irradiator 24 and capable of polarizing a parallel light beam to a polarization plane of an arbitrary angle, and this rotation It comprises an angle measuring means 30 for measuring the rotation angle of the polarizing plate 28, a detector 32 for measuring the amount of light transmitted through the wedge-shaped birefringent plate 6, and its power supply 34.
[0022]
Further, as described in the above-mentioned prior art, the wedge-shaped birefringent plate 6 faces the end face 62 that is perpendicular to the light transmission direction and includes the optical axis <001>, and is inclined at a predetermined angle with respect to the end face 62. It has a sloped surface 64 and a reference surface 66 that is orthogonal to the end surface 62 and parallel to the light transmission direction, and specifically has a wedge shape in which one surface of a rectangular parallelepiped is formed on the sloped surface.
[0023]
By the way, in order to measure the optical axis <001> direction of the wedge-shaped birefringent plate 6 with respect to the reference surface 66, that is, the angle θ between the reference surface 66 and the optical axis <001>, as shown in FIGS. First, the wedge-shaped birefringent plate 6 is placed on the measuring table 22 with the reference surface 66 aligned, and the end surface 62 or the inclined surface 64 of the wedge-shaped birefringent plate 6 faces the irradiator 24 (FIG. 2 (a). )), And irradiates and transmits parallel rays from the irradiator 24. Then, the position of the detector 32 is aligned on one of the optical axes of ordinary light and extraordinary light separated by the wedge-shaped birefringent plate 6, and the amount of transmitted light after transmission is measured. In the illustrated example, the detector 32 is disposed on the optical axis of ordinary light so that the transmitted light amount of only ordinary light is measured, and when viewed from the end face 62 side including the optical axis <001>. In order to obtain the optical axis <001> direction first, the end face 62 side is directed to the irradiator 24 side.
[0024]
Next, the rotation type polarizing plate 28 is rotated to find the rotation position where the measured value of the transmitted light amount is the minimum value, the optical axis <001> direction is obtained, and if the optical axis <001> direction is obtained, The rotation position of the rotary polarizing plate 28 at this time is set as the angle measurement start point, and the scale of the angle measurement means 30 is reset.
[0025]
Next, the wedge-shaped birefringent plate 6 to be placed is left as it is, and the wedge-shaped birefringent plate 6 is rotated 180 degrees so that the inclined surface 64 faces the irradiator 24 (see FIG. 2B). The optical axis <001> direction when viewed from the inclined surface 64 side is obtained in the same manner as described above. If the rotation angle of the rotary polarizing plate 28 at this time is read by the angle measuring device 30, the scale is reset in advance in the angle direction of the optical axis <001> when viewed from the end face 62 side. The value is the angle difference α in each optical axis <001> direction when viewed from two directions as it is. Since the angle difference α thus obtained is substantially equal to directly measuring the angle between the two optical axes <001>, the measurement accuracy is extremely high.
[0026]
Further, since the angle difference α is obtained by subtracting twice the angle θ formed by the reference surface 66 and the optical axis <001> from π, the angle θ is (π−α) / 2. It can be calculated and measured, and a highly accurate measurement value can be obtained.
[0027]
In determining the angle difference α, the initial scale value of the angle measuring means 30 is set arbitrarily, and the scale display value of the rotational position when the optical axis <001> direction from each direction is found is read as it is. Then, the angle difference α may be obtained from the difference between the read values. Even if the calculation is performed in this way, the initial value set arbitrarily is lost when subtracting, and thus has no effect. That is, when the direction of each optical axis <001> is found by rotating the rotary polarizing plate 28, the scale of the angle measuring means 30 does not need to be initially set. Further, any of the four peripheral surfaces of the inclined surface can be selected as the reference surface 66 of the wedge-shaped birefringent plate 6.
[0028]
When measuring the optical axis direction of a pair of wedge-shaped birefringent plates 6a and 6b incorporated in the polarization-independent optical isolator, one wedge-shaped birefringent plate 6a has a wedge-shaped trapezoidal cross section as shown in FIG. In FIG. 3, the circumferential side surface on the long side which is wide is measured as the reference surface 66, and the other wedge-shaped birefringent plate 6b is formed on the circumferential side surface on the short side which is narrow in the wedge-shaped trapezoidal cross section as shown in FIG. The measurement may be performed as 66. In this way, when the reference plane is measured separately, the optical axis <001> directions of the pair of wedge-shaped birefringent plates 6a and 6b are both within the allowable dimensional accuracy (22.5 degrees ± 10 minutes as a specific example). If the pass judgment is made, the pair of wedge-shaped birefringent plates 6a and 6b are placed on the reference surface 36a of the assembly jig base 36 when the polarization-independent optical isolator is assembled. The optical axis directions can be shifted from each other by 45 degrees simply by placing them, eliminating the need for optical axis adjustment.
[0029]
【The invention's effect】
As described above in detail in the embodiments of the present invention, according to the wedge-shaped birefringent plate optical axis angle measuring method according to the present invention, the rotating polarizing plate in which the transmitted light amount of only ordinary light or extraordinary light becomes the minimum value. The optical axis direction can be accurately found from the rotation position of the lens, and the angle difference α between the optical axis direction when viewed from the end surface side and the optical axis direction when viewed from the inclined surface side can be measured. In this case, the angle difference α in the optical axis direction is obtained by subtracting twice the angle θ formed by the reference surface and the optical axis from π, and the angle θ is (π−α) / 2. The angle θ can be easily calculated from the difference α and measured.
[0030]
Further, the rotational positions in the respective optical axis directions obtained by measuring from the two directions substantially measure the optical axis directly, so that the angle difference α can be measured with extremely high accuracy, and therefore the angle θ Can be measured with high accuracy.
[0031]
For this reason, highly accurate component accuracy management becomes possible, and it becomes possible to appropriately perform pass / fail determination of components.
[Brief description of the drawings]
FIG. 1 is a diagram showing a schematic configuration of a measurement system used in carrying out a measurement method according to the present invention.
FIG. 2 shows a wedge-shaped birefringent plate placed on a measurement table with a reference surface aligned, where FIG. 2A shows a case where measurement is performed from the end surface side, FIG. 2I is a side view thereof, and FIG. ) Is a front view thereof, FIG. 5B is a case where measurement is performed from the inclined surface side, (i) is a side view thereof, and (ii) is a front view thereof.
FIG. 3 shows a wedge-shaped birefringent plate placed on a measuring table with different reference planes, wherein FIG. 3 (a) shows a case where measurement is performed from the end face side, and FIG. 3 (i) is a side view thereof. , (Ii) is a front view thereof, FIG. 4B is a case of measurement from the inclined surface side, (i) is a side view thereof, and (ii) is a front view thereof.
FIG. 4 is a diagram showing a state in which a polarization-independent optical isolator is assembled on an assembly jig table.
FIG. 5 is a perspective view for explaining a schematic configuration and an operation principle of a polarization-independent optical isolator.
FIG. 6 is an enlarged perspective view showing a main part of a polarization-independent optical isolator.
FIG. 7 is a diagram illustrating a procedure for forming a wedge-shaped birefringent plate used in a polarization-independent optical isolator.
[Explanation of symbols]
6 Wedge-shaped birefringent plate 22 Measuring table 28 Rotating polarizing plate 62 End surface 64 Inclined surface 66 Reference surface <001> Optical axis

Claims (1)

光の透過方向に平行な基準面(66)と、該透過方向に直交して光学軸<001>が面内に存する端面(62)と、該端面(62)に対して所定角度傾斜して対面する傾斜面(64)とを有する楔状複屈折板(6)における該基準面(66)と該光学軸<001>とのなす角度θを測定するに際して、測定台(22)上に該複屈折板(6)をその基準面(66)を合わせて載置し、該載置した複屈折板(6)に回転式偏光板(28)により偏光した光を透過させて、該透過後の常光又は異常光のみの透過光量を測定し、該透過光量が最小値となる該偏光板(28)の回転位置を探して該光学軸<001>方向を求めた後、載置する楔形複屈折板6の基準面(66)はそのままにして当該楔状複屈折板(6)を180度回転させて該光学軸<001>方向を求めることで、該端面(62)側からと該傾斜面(64)側からとの双方で該光学軸<001>方向を求め、該両回転位置の角度差αから該基準面(66)と該光学軸<001>とのなす角度θを測定することを特徴とする楔状複屈折板の光学軸角度測定方法。A reference plane (66) parallel to the light transmission direction, an end face (62) having an optical axis <001> in-plane perpendicular to the transmission direction, and inclined by a predetermined angle with respect to the end face (62) In measuring the angle θ between the reference surface (66) and the optical axis <001> in the wedge-shaped birefringent plate (6) having the inclined surface (64) facing each other, the compound surface is placed on the measurement table (22). The refracting plate (6) is placed with its reference surface (66) aligned, and the polarized light by the rotary polarizing plate (28) is transmitted through the placed birefringent plate (6) . The transmitted light amount of only ordinary light or extraordinary light is measured, the rotational position of the polarizing plate (28) where the transmitted light amount becomes the minimum value is found, the optical axis <001> direction is obtained, and then the wedge-shaped birefringence to be placed The wedge-shaped birefringent plate (6) is rotated 180 degrees with the reference surface (66) of the plate 6 as it is, and the optical axis <0. 1> by obtaining the direction, both in the optical axis between the end face (62) side from the inclined surface (64) side <001> the determined direction, the reference plane from the angle difference α of the both rotation position The method of measuring an optical axis angle of a wedge-shaped birefringent plate, comprising measuring an angle θ between (66) and the optical axis <001>.
JP10713096A 1996-04-26 1996-04-26 Measuring method of optical axis angle of wedge birefringent plate Expired - Fee Related JP3615864B2 (en)

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CN103968783B (en) * 2013-01-31 2016-08-17 北京智朗芯光科技有限公司 A Method of Measuring Optical Axis Deviation Angle in Double Wave Plate Compensator
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