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JP3672949B2 - Vapor deposition equipment - Google Patents
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JP3672949B2 - Vapor deposition equipment - Google Patents

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Publication number
JP3672949B2
JP3672949B2 JP24168394A JP24168394A JP3672949B2 JP 3672949 B2 JP3672949 B2 JP 3672949B2 JP 24168394 A JP24168394 A JP 24168394A JP 24168394 A JP24168394 A JP 24168394A JP 3672949 B2 JP3672949 B2 JP 3672949B2
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Japan
Prior art keywords
vapor deposition
mask
base material
cooling
cooling drum
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JP24168394A
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Japanese (ja)
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JPH08104979A (en
Inventor
敏郎 篠原
健一 安西
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Mitsubishi Shindoh Co Ltd
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Mitsubishi Shindoh Co Ltd
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Description

【0001】
【産業上の利用分野】
本発明は、帯状の基材を走行させつつ、その表面に金属やセラミックス等の蒸着膜を形成するための蒸着装置に関するものである。
【0002】
【従来の技術】
例えば、金属化フィルムコンデンサ用フィルムや包装用蒸着フィルム、磁気記録用蒸着テープ等の製造においては、プラスチックフィルムの表面に各種金属を蒸着する工程が設けられている。
この種の蒸着フィルムを製造する際には、従来より、冷却手段を内蔵し軸線を中心として回転される冷却ドラムと、冷却ドラムの外周面の一部にフィルム(以下、基材という)を巻回させた状態でこの基材を走行させるアンコイラおよびリコイラと、基材巻回部と対向して配置され蒸着材料を保持する蒸着材料保持部と、蒸着材料保持部内に保持された蒸着材料を蒸散させるための加熱機構と、以上の各構成要素を収容する真空容器とを備えた蒸着装置が使用されている。
【0003】
【発明が解決しようとする課題】
ところで、前記基材巻回部に位置する基材には、高温の材料蒸気が直接被着されるため、蒸気からの伝達熱のみならず、材料保持部からの輻射熱、さらには材料蒸気が基材に凝着する際に放出する潜熱により、基材表面は高温に加熱される。この時の熱により、基材が許容温度以上に熱せられてしまうと、基材に弛みや皺などの変形が生じ、不良品が発生する原因となる。これは特に、極薄の高分子フィルムなどの熱影響に敏感な材質を使用する際に顕著な問題である。
【0004】
そこで従来では、冷却ドラムの冷却効率を高めたり、基材巻回部において基材が冷却ドラムに隙間無く密着するように、冷却ドラムや基材の表面平滑性を調整したり、基材に加える張力分布を高精度に調節する機構を設けるなど、基材からの放熱性を高めることを主眼において各種の対策が採られてきた。
しかし、以上のような対策では、装置の構造が複雑になって設備コストが増すうえ、基材巻回部において基材が冷却ドラムから僅かにでも剥離すると、その剥離部分で基材の冷却効率が著しく低下して温度が急上昇し、さらに基材の剥離が進行するという悪循環に陥りやすく、一旦剥離すると比較的大面積に亙って皺や弛みが生じる問題があった。また、基材が冷却ドラムで冷却された後、基材表面が輻射熱や潜熱で高温に急激に加熱されると、基材の表裏の温度差から皺が発生する等の問題もあった。
【0005】
本発明は上記事情に鑑みてなされたもので、蒸着過程での基材のピーク温度を効果的に低下させることにより、基材の皺や弛みを防止でき、設備コストも安い蒸着装置を提供することを課題としている。
【0006】
【課題を解決するための手段】
上記課題を解決するため、本発明の蒸着装置は、その外周面を冷却するための冷却手段を内蔵し、その軸線を中心として回転される冷却ドラムと、前記冷却ドラムの外周面の一部に帯状の基材を巻回した状態でこの基材を走行させる基材走行機構と、前記冷却ドラムの基材巻回部と対向して配置され、蒸着材料を保持する蒸着材料保持部と、前記蒸着材料保持部内に保持された蒸着材料を前記基材巻回部に向けて蒸散させるための加熱機構と、 前記冷却ドラムと前記蒸着材料保持部との間に配置されたマスク機構と、以上の各構成要素を収容する真空容器とを具備し、前記マスク機構は、前記蒸着材料保持部から前記基材巻回部へ向かう蒸気を部分的に遮蔽することにより、前記基材巻回部上における材料蒸着領域を基材走行方向に並ぶ2以上の領域に分割するマスク部を具備し、前記マスク部はそれぞれ前記冷却ドラムの軸線と平行に延び、前記マスク部は前記冷却ドラムの前記基材巻回部の外周面から等距離を保ちながら基材走行方向へ向けて位置変更可能に支持され、 前記マスク部にはそれぞれ前記マスク部を冷却するための冷却機構が設けられていることを特徴とする。
【0007】
前記マスク板には冷却水路が形成されるとともに、各冷却水路に冷却水を供給するための冷却水供給機構が設けられていてもよい。
【0008】
【作用】
本発明の蒸着装置では、マスク機構のマスク部により、蒸着材料保持部から基材巻回部へ向かう蒸気を部分的に遮蔽して、基材巻回部上における蒸着領域を基材走行方向に向けて2以上の領域に分割するため、各蒸着領域間の非蒸着領域では、基材の加熱が一時停止され、基材から冷却ドラムへの放熱のみが進行して基材温度が低下する。このように、基材温度は蒸着領域で上昇し、非蒸着領域で降下するというサイクルを繰り返すから、蒸着過程における基材の温度変化が平均化され、同じ蒸着膜厚を得る場合にも基材のピーク温度を低下することができ、熱変形による基材の皺や弛みの発生を低減することが可能である。また、各蒸着領域間に冷却領域を設けたことにより、たとえ局部的な剥離箇所が生じたとしても、この剥離箇所が加熱され続けることがないから、剥離が加速度的に助長されて大面積に亙る欠陥を生じるといった不都合が少ない。
【0009】
【実施例】
図1は、本発明に係る蒸着装置の一実施例を示す正断面図である。
図中符号1は金属等からなる円柱状の冷却ドラムであり、図示しない駆動装置により図中矢印方向へ回転駆動される。冷却ドラム1の外周面の一部(この例では下面側)には、一定幅で帯状の基材Fがドラム周方向に向けて半円状に巻回され、アンコイラ2から繰り出されてリコイラ4で巻取られることにより連続走行されるようになっている。基材Fとしては、プラスチックフィルムや金属箔を始めとし、いかなる材質を使用してもよい。
【0010】
冷却ドラム1の基材巻回部と対向して蒸着材料保持部6が配置され、その内部には金属やセラミックス等の蒸着材料8が収容されている。蒸着材料8としてはセラミックスや金属など従来より蒸着材料として使用されている物質であればいかなるものを用いてもよい。蒸着材料保持部6には、図示しない加熱機構が付設されている。加熱機構の種類は限定されないが、例えば真空蒸着方式を採用する場合には各種ヒータ、電子ビーム蒸着法式を採用する場合には電子ビーム発生機構等が設けられ、これらヒータまたは電子ビームにより蒸着材料8を加熱することにより、その蒸気が蒸着材料保持部6から冷却ドラム1に向けて放射されるようになっている。加熱機構の構成は周知の通りでよく、ここでは詳述しない。
【0011】
以上の構成は全て真空容器9内に収容されている。真空容器9には図示しない真空ポンプおよび不活性ガス供給源等が接続され、真空容器9内の雰囲気を所望条件に合わせられるようになっている。真空容器9内には、冷却ドラム1の中心軸の高さにほぼ一致して水平な隔壁10が取り付けられ、これら隔壁10により冷却ドラム1の周囲において真空容器9内空間が上下に区画されている。隔壁10と冷却ドラム1の周囲との間には僅かな間隙が空けられるとともに、冷却ドラム1側の隔壁10の周縁には、冷却ドラム1の基材巻回部を一定間隙を空けて包囲するようにマスク支持体12が取り付けられている。
【0012】
マスク支持体12は、図2に示すように、互いに平行な一対のレール部16と、これらレール部16の端部間を直角につなぐ一対の固定マスク部14とからなる四角い枠状をなしている。各レール部16は半円状に湾曲しており、冷却ドラム1の軸方向両端部の外周面とそれぞれ平行に対向して配置されている。また、固定マスク部14はレール部16と同一平面に沿って僅かに湾曲した細長い板状をなし、基材Fの巻始め側の一定幅部分、および巻終わり側の一定幅部分のそれぞれと一定間隙を空けて平行に対向している。固定マスク部14の全長は、図2に示すように冷却ドラム1の軸線方向長さよりも大きく設定されている。
【0013】
各レール部16には、その中心線に沿ってレール部16のほぼ全長に亙って延びるスリット22が形成されている。また、レール部16の外周面に沿って、基材Fの巻始め側から順に、第1マスク板18、第2マスク板20、第2マスク板20および第1マスク板18がそれぞれ冷却ドラム1の軸線方向に向けて配置され、各マスク板18,20の両端を貫通するボルト24がそれぞれスリット22に通されてナット(図示略)で固定されている。これにより、各マスク板18,20は、両端のボルト24を緩めると、レール部16の外周面に沿って円周方向へ位置変更でき、さらにボルト24を取り外せばレール部16から取り外しもできるようになっている。
【0014】
マスク板18,20の幅および厚さは、必要とする蒸着条件に合わせて適宜設定されるべきである。具体的には、図1に示すように、蒸着材料保持部6からの蒸気が基材Fに到達する蒸着領域Pと、到達しない非蒸着領域Qが交互に形成される状態において、蒸着中の基材Fのピーク温度が、基材Fに皺や弛みが生じる許容限界温度よりも十分低くなるように、実験を行って決定すべきである。マスク板18,20の枚数は4枚に限定されず、必要とされる基材冷却効果に応じて適宜変更してよい。
【0015】
マスク板18,20の材質としては、蒸着中に高温になることから、セラミックスや金属材料、またはこれらの複合材料等の耐熱材料が好ましい。より好ましくは、マスク板18,20を熱伝導性の高い金属またはこれら金属を主組成物とする複合材料で形成するとともに、その内部に冷却水路を形成し、これら冷却水路へ冷却水供給機構から冷却水を循環させるようにするとよい。図3はそのような冷却水路26が形成されたマスク板18,20を示す。冷却水路26はマスク板18(20)の両端に取り付けられたパイプ28間を連通させるもので、マスク板18(20)の内部で蛇行している。さらに、パイプ28はそれぞれチューブを介して図示しない冷却水供給機構に接続されている。冷却水路26の形状は図示形状に限定されず、必要に応じて適宜変更してよい。なお、マスク支持体12の固定マスク部14およびレール部16内にも前記同様の冷却水路26を形成し、マスク板18,20とともに冷却することがより好ましい。
【0016】
マスク板18,20の内部に冷却水路26を形成した場合には、蒸着中のマスク板18,20の温度上昇が抑制されるため、これらマスク板18,20と対向する位置での基材Fの冷却効率を一層高めることができる。これにより、基材Fの最高温度をさらに低下させることが可能で、皺や弛みを防止する効果を一層高めることができる。
【0017】
上記構成からなる蒸着装置によれば、マスク板18,20により蒸着材料保持部6から基材巻回部へ向かう蒸気を部分的に遮蔽し、図1に示すように、基材巻回部上における蒸着領域を基材走行方向に向けて3つの領域Pに分割するため、各蒸着領域P間の非蒸着領域Qでは、基材Fの加熱が停止され、基材Fから冷却ドラム1への放熱のみが進行して基材温度が低下する。このため、基材Fの温度は図4に示すように蒸着領域Pで上昇し、非蒸着領域Qで降下するというサイクルを繰り返すから、蒸着過程における基材Fの温度変化が平均化され、同じ蒸着膜厚を得る場合にも基材Fのピーク温度を低下することができ、熱変形による基材Fの皺や弛みの発生を防ぐことが可能である。また、マスク支持体12およびマスク板18,20を配置するだけの単純な構造であるから、安いコストで確実な効果を得ることができる。
【0018】
また、各蒸着領域P間に冷却領域Qを設けたことにより、たとえ局部的に冷却ドラム1から基材Fが剥離した箇所が生じたとしても、この剥離箇所が加熱され続けることがなく、剥離が加速度的に助長されて大面積に亙る欠陥を生じるといった不都合が少ない。これに対し従来の装置では、蒸着領域の全面において図5に示すように基材温度が急激に上昇し続けるから、冷却ドラムからの剥離などにより基材の冷却効率が僅かに低下しただけで、その部分の最高温度が簡単に許容範囲を超えてしまい、皺や弛みの問題を生じ易い。
【0019】
さらに、この実施例では、マスク板18,20の位置を個々に調整することにより、蒸着領域Pと非蒸着領域Qの各幅を自在に調整できるから、例えば図4に示す3つのピーク温度がほぼ同値となるように調整することが容易で、皺や弛み発生のおそれを最小化すると共に、十分な蒸着効率を得ることが可能である。
なお、本発明は上記実施例のみに限定されるものではなく、他にも様々な変形例が可能である。例えば、上記実施例ではレール部16の外周面に沿ってマスク板18,20を摺動させる構成であったが、レール部16の内周面に沿ってマスク板18,20を摺動させるようにし、マスク板18,20と基材Fとの離間距離を縮小して、マスク板18,20による基材Fの冷却効果を高めるようにしてもよい。さらに、マスク部は必ずしも位置調整可能でなくともよく、マスク支持体12と一体に固定してもよい。
【0020】
【発明の効果】
以上説明したように、本発明に係る蒸着装置によれば、マスク機構のマスク部により、蒸着材料保持部から基材巻回部へ向かう蒸気を部分的に遮蔽して、基材巻回部上における蒸着領域を基材走行方向に向けて2以上の領域に分割するため、各蒸着領域間の非蒸着領域では、基材への加熱が停止され、基材から冷却ドラムへの放熱のみが進行して基材温度が低下する。このように、基材温度は蒸着領域で上昇し、非蒸着領域で降下するというサイクルを繰り返すから、蒸着過程における基材の温度変化が平均化され、同じ蒸着膜厚を得る場合にも基材のピーク温度を低下することができる。したがって、熱変形による基材の皺や弛みの発生を低減することが可能である。また、各蒸着領域間に冷却領域を設けたことにより、たとえ局部的な剥離箇所が生じたとしても、この剥離箇所が加熱され続けることがないから、剥離が加速度的に助長されて大面積に亙る欠陥を生じるといった不都合が少ない。このように優れた効果を得られるにも拘わらず、構成が単純であるから設備コストは安いという利点を有する。
【0021】
また、冷却ドラム軸線と平行に延びるマスク部を設け、これらを冷却ドラムの基材巻回部の外周面から等距離を保ちながら基材走行方向へ向けて位置変更可能に支持し、さらにマスク部にはそれぞれマスク部を冷却するための冷却機構を設けているから、各蒸着領域の幅をマスク部の移動により調整し、各蒸着領域における基材のピーク温度をほぼ同じ値となるように調整することが容易であり、皺や弛み発生のおそれを最小化すると共に、十分な蒸着効率を得ることが可能である。また、マスク部は冷却ドラムの基材巻回部の外周面から等距離を保ちながら位置変更可能とされているから、位置変更の前後で基材巻回部に対する冷却効果がほぼ一定に保たれ、位置変更によって基材巻回部に対する冷却効果が常に良好に保たれる。
【0022】
また、マスク板の内部に冷却水路を形成し冷却水を流すようにした場合には、蒸着中のマスク板の温度上昇が抑制され、マスク板と対向する位置での基材の冷却効率を一層高めることができる。これにより、基材の最高温度をさらに低下させることが可能で、皺や弛みを防止する効果を一層高めることができる。
【図面の簡単な説明】
【図1】本発明に係る蒸着装置の一実施例を示す正断面図である。
【図2】同実施例のマスク支持体(マスク機構)を下方から見た図である。
【図3】同実施例のマスク板の一例を示す平面図である。
【図4】本発明の効果を示す基材温度のグラフである。
【図5】従来装置の問題点を示すための基材温度のグラフである。
【符号の説明】
1 冷却ドラム
2 アンコイラ(基材走行機構)
4 リコイラ(基材走行機構)
6 蒸着材料保持部
8 蒸着材料
9 真空容器
10 隔壁
12 マスク支持体(マスク機構)
14 固定マスク部
16 レール部
18 第1マスク板(マスク部)
20 第2マスク板(マスク部)
22 スリット
24 ボルト
26 冷却水路
P 蒸着領域
Q 非蒸着領域
[0001]
[Industrial application fields]
The present invention relates to a vapor deposition apparatus for forming a vapor deposition film of metal, ceramics, or the like on the surface of a belt-shaped substrate while traveling.
[0002]
[Prior art]
For example, in the manufacture of a metallized film capacitor film, a packaging vapor deposition film, a magnetic recording vapor deposition tape, and the like, a step of depositing various metals on the surface of a plastic film is provided.
When manufacturing this type of deposited film, conventionally, a cooling drum having a cooling means built therein and rotating around an axis, and a film (hereinafter referred to as a base material) are wound around a part of the outer peripheral surface of the cooling drum. The uncoiler and recoiler that run the substrate in a rotated state, the vapor deposition material holding unit that holds the vapor deposition material disposed facing the substrate winding unit, and the vapor deposition material held in the vapor deposition material holding unit evaporates. The vapor deposition apparatus provided with the heating mechanism for making it and the vacuum vessel which accommodates each said component is used.
[0003]
[Problems to be solved by the invention]
By the way, since the high-temperature material vapor is directly applied to the base material positioned in the base material winding part, not only the heat transferred from the steam but also the radiant heat from the material holding part and further the material vapor are based on it. The surface of the substrate is heated to a high temperature by the latent heat released when it adheres to the material. If the base material is heated to a temperature higher than the allowable temperature by the heat at this time, the base material is deformed such as slack and wrinkles, which causes defective products. This is a particular problem when using a material sensitive to heat influence such as an ultra-thin polymer film.
[0004]
Therefore, conventionally, the cooling efficiency of the cooling drum is increased, or the surface smoothness of the cooling drum and the substrate is adjusted or added to the substrate so that the substrate is in close contact with the cooling drum at the substrate winding part without gaps. Various measures have been taken with a focus on improving heat dissipation from the base material, such as providing a mechanism for adjusting the tension distribution with high accuracy.
However, with the measures described above, the structure of the apparatus becomes complicated and the equipment cost increases, and if the substrate peels even slightly from the cooling drum in the substrate winding part, the cooling efficiency of the substrate at the peeling portion However, the temperature rapidly increases and the peeling of the base material progresses easily, and once peeled, there is a problem that wrinkles and slacks occur over a relatively large area. In addition, when the substrate surface is rapidly heated to a high temperature by radiant heat or latent heat after the substrate is cooled by the cooling drum, there is a problem that wrinkles are generated due to a temperature difference between the front and back surfaces of the substrate.
[0005]
The present invention has been made in view of the above circumstances, and provides a vapor deposition apparatus that can prevent wrinkles and slack of the base material and reduce the equipment cost by effectively reducing the peak temperature of the base material in the vapor deposition process. It is an issue.
[0006]
[Means for Solving the Problems]
In order to solve the above-described problems, the vapor deposition apparatus of the present invention has a cooling means for cooling the outer peripheral surface thereof, a cooling drum that rotates around its axis, and a part of the outer peripheral surface of the cooling drum. A base material traveling mechanism for traveling the base material in a state where the belt-shaped base material is wound, a vapor deposition material holding portion that is disposed to face the base material winding portion of the cooling drum, and holds the vapor deposition material; A heating mechanism for evaporating the vapor deposition material held in the vapor deposition material holding part toward the substrate winding part, a mask mechanism arranged between the cooling drum and the vapor deposition material holding part, A vacuum vessel that houses each component, and the mask mechanism partially shields the vapor from the vapor deposition material holding part toward the base material winding part, and thereby on the base material winding part. 2 or more lines up the material deposition area in the substrate running direction A mask portion that is divided into upper regions, each of the mask portions extending in parallel with the axis of the cooling drum, and the mask portion being kept equidistant from the outer peripheral surface of the substrate winding portion of the cooling drum It is supported so that the position can be changed in the base material traveling direction, and each of the mask portions is provided with a cooling mechanism for cooling the mask portions .
[0007]
A cooling water channel may be formed in the mask plate, and a cooling water supply mechanism for supplying cooling water to each cooling water channel may be provided.
[0008]
[Action]
In the vapor deposition apparatus of the present invention, the vapor directed from the vapor deposition material holding part to the base material winding part is partially shielded by the mask part of the mask mechanism so that the vapor deposition area on the base material winding part is in the base material traveling direction. Therefore, in the non-deposition region between the respective vapor deposition regions, the heating of the base material is temporarily stopped, and only the heat radiation from the base material to the cooling drum proceeds to lower the base material temperature. Thus, since the substrate temperature rises in the vapor deposition region and repeats a cycle in which it falls in the non-deposition region, the temperature change of the substrate in the vapor deposition process is averaged, and even when the same vapor deposition film thickness is obtained. It is possible to reduce the peak temperature of the substrate and reduce the occurrence of wrinkles and slackness of the base material due to thermal deformation. In addition, by providing a cooling region between the respective vapor deposition regions, even if a localized peeling portion occurs, the peeling portion does not continue to be heated, so that peeling is accelerated and accelerated to a large area. There are few inconveniences such as generating flaws.
[0009]
【Example】
FIG. 1 is a front sectional view showing an embodiment of a vapor deposition apparatus according to the present invention.
Reference numeral 1 in the figure denotes a cylindrical cooling drum made of metal or the like, and is driven to rotate in the direction of the arrow in the figure by a driving device (not shown). On a part of the outer peripheral surface of the cooling drum 1 (the lower surface side in this example), a strip-shaped base material F having a constant width is wound in a semicircular shape toward the drum circumferential direction, and is fed out from the uncoiler 2 to be recoiler 4. It is designed to be continuously run by being wound on. As the substrate F, any material such as a plastic film or a metal foil may be used.
[0010]
A vapor deposition material holding portion 6 is disposed opposite to the substrate winding portion of the cooling drum 1, and a vapor deposition material 8 such as metal or ceramics is accommodated therein. Any material may be used as the vapor deposition material 8 as long as it has been conventionally used as a vapor deposition material, such as ceramics or metal. The vapor deposition material holding unit 6 is provided with a heating mechanism (not shown). The type of the heating mechanism is not limited. For example, when a vacuum vapor deposition method is adopted, various heaters are provided, and when an electron beam vapor deposition method is adopted, an electron beam generating mechanism is provided. Is heated so that the vapor is radiated from the vapor deposition material holding part 6 toward the cooling drum 1. The structure of the heating mechanism may be well known and will not be described in detail here.
[0011]
All the above configurations are accommodated in the vacuum vessel 9. A vacuum pump and an inert gas supply source (not shown) are connected to the vacuum container 9 so that the atmosphere in the vacuum container 9 can be adjusted to desired conditions. In the vacuum vessel 9, a horizontal partition wall 10 is attached so as to substantially coincide with the height of the central axis of the cooling drum 1, and the space inside the vacuum vessel 9 is partitioned vertically by the partition wall 10 around the cooling drum 1. Yes. A slight gap is formed between the partition wall 10 and the periphery of the cooling drum 1, and the base material winding portion of the cooling drum 1 is surrounded by a certain gap around the periphery of the partition wall 10 on the cooling drum 1 side. Thus, the mask support 12 is attached.
[0012]
As shown in FIG. 2, the mask support 12 has a rectangular frame shape including a pair of parallel rail portions 16 and a pair of fixed mask portions 14 that connect the end portions of the rail portions 16 at a right angle. Yes. Each rail portion 16 is curved in a semicircular shape, and is disposed so as to face each other in parallel with the outer peripheral surfaces of both end portions in the axial direction of the cooling drum 1. Further, the fixed mask portion 14 has an elongated plate shape slightly curved along the same plane as the rail portion 16, and is constant with each of the constant width portion on the winding start side and the constant width portion on the winding end side of the substrate F. Opposite parallel with a gap. The total length of the fixed mask portion 14 is set to be larger than the axial length of the cooling drum 1 as shown in FIG.
[0013]
Each rail portion 16 is formed with a slit 22 extending along the center line thereof over almost the entire length of the rail portion 16. In addition, the first mask plate 18, the second mask plate 20, the second mask plate 20, and the first mask plate 18 are arranged in order from the winding start side of the base material F along the outer peripheral surface of the rail portion 16, respectively. The bolts 24 that are arranged in the axial direction of the mask plates 18 and pass through both ends of the mask plates 18 and 20 are respectively passed through the slits 22 and fixed by nuts (not shown). Thus, each mask plate 18, 20 can be repositioned in the circumferential direction along the outer peripheral surface of the rail portion 16 when the bolts 24 at both ends are loosened, and can be removed from the rail portion 16 by removing the bolt 24. It has become.
[0014]
The width and thickness of the mask plates 18 and 20 should be appropriately set according to the required deposition conditions. Specifically, as shown in FIG. 1, in a state where vapor deposition regions P where the vapor from the vapor deposition material holding unit 6 reaches the base material F and non-deposition regions Q that do not reach are alternately formed, The peak temperature of the substrate F should be determined by performing experiments so that the peak temperature of the substrate F is sufficiently lower than the allowable limit temperature at which the substrate F is wrinkled or slackened. The number of mask plates 18 and 20 is not limited to four, and may be appropriately changed according to the required substrate cooling effect.
[0015]
The material of the mask plates 18 and 20 is preferably a heat-resistant material such as ceramics, metal material, or a composite material thereof because it becomes high temperature during vapor deposition. More preferably, the mask plates 18 and 20 are formed of a metal having a high thermal conductivity or a composite material containing these metals as a main composition, a cooling water channel is formed therein, and a cooling water supply mechanism is provided to these cooling water channels. It is advisable to circulate cooling water. FIG. 3 shows the mask plates 18 and 20 on which such cooling water channels 26 are formed. The cooling water passage 26 communicates between the pipes 28 attached to both ends of the mask plate 18 (20), and meanders inside the mask plate 18 (20). Further, each of the pipes 28 is connected to a cooling water supply mechanism (not shown) via a tube. The shape of the cooling water channel 26 is not limited to the illustrated shape, and may be changed as appropriate. It is more preferable that the same cooling water channel 26 is formed in the fixed mask portion 14 and the rail portion 16 of the mask support 12 and is cooled together with the mask plates 18 and 20.
[0016]
When the cooling water channel 26 is formed inside the mask plates 18 and 20, the temperature rise of the mask plates 18 and 20 during vapor deposition is suppressed. Therefore, the base material F at a position facing the mask plates 18 and 20 is suppressed. The cooling efficiency can be further increased. Thereby, the maximum temperature of the base material F can be further lowered, and the effect of preventing wrinkles and slack can be further enhanced.
[0017]
According to the vapor deposition apparatus having the above-described configuration, the vapor directed from the vapor deposition material holding unit 6 to the base material winding part is partially shielded by the mask plates 18 and 20, and as shown in FIG. In the non-deposition region Q between the respective vapor deposition regions P, the heating of the substrate F is stopped and the substrate F is transferred from the substrate F to the cooling drum 1. Only heat dissipation proceeds and the substrate temperature decreases. For this reason, since the temperature of the base material F repeats the cycle of rising in the vapor deposition region P and falling in the non-deposition region Q as shown in FIG. 4, the temperature change of the base material F in the vapor deposition process is averaged and the same Even when the deposited film thickness is obtained, the peak temperature of the base material F can be lowered, and it is possible to prevent the base material F from wrinkling or loosening due to thermal deformation. Moreover, since it is a simple structure which only arrange | positions the mask support body 12 and the mask plates 18 and 20, a reliable effect can be acquired at low cost.
[0018]
Moreover, even if the location where the base material F peeled from the cooling drum 1 locally arises by providing the cooling region Q between each vapor deposition zone P, this peeling location does not continue to be heated, but peeling However, there is little inconvenience that a defect over a large area is caused by acceleration. On the other hand, in the conventional apparatus, since the substrate temperature continues to rise rapidly as shown in FIG. 5 over the entire surface of the vapor deposition region, the cooling efficiency of the substrate is slightly lowered due to peeling from the cooling drum, etc. The maximum temperature of the part easily exceeds the allowable range, and the problem of wrinkles and slack is likely to occur.
[0019]
Furthermore, in this embodiment, the widths of the vapor deposition region P and the non-vapor deposition region Q can be freely adjusted by individually adjusting the positions of the mask plates 18 and 20, so that, for example, three peak temperatures shown in FIG. It is easy to make adjustments so that the values are almost the same, and it is possible to minimize the risk of wrinkles and slacking and to obtain sufficient vapor deposition efficiency.
In addition, this invention is not limited only to the said Example, Other various modifications are possible. For example, in the above embodiment, the mask plates 18 and 20 are slid along the outer peripheral surface of the rail portion 16, but the mask plates 18 and 20 are slid along the inner peripheral surface of the rail portion 16. In addition, the distance between the mask plates 18 and 20 and the base material F may be reduced to enhance the cooling effect of the base material F by the mask plates 18 and 20. Further, the position of the mask portion is not necessarily adjustable, and may be fixed integrally with the mask support 12.
[0020]
【The invention's effect】
As described above, according to the vapor deposition apparatus of the present invention, the mask part of the mask mechanism partially shields the vapor from the vapor deposition material holding part to the base material winding part, and thus on the base material winding part. In order to divide the vapor deposition region in the substrate into two or more regions in the direction of travel of the base material, in the non-deposition region between the respective vapor deposition regions, heating to the base material is stopped, and only heat radiation from the base material to the cooling drum proceeds. As a result, the substrate temperature decreases. Thus, since the substrate temperature rises in the vapor deposition region and repeats a cycle in which it falls in the non-deposition region, the temperature change of the substrate in the vapor deposition process is averaged, and even when the same vapor deposition film thickness is obtained. The peak temperature can be lowered. Therefore, it is possible to reduce the occurrence of wrinkles and slack of the base material due to thermal deformation. In addition, by providing a cooling region between the respective vapor deposition regions, even if a localized peeling portion occurs, the peeling portion does not continue to be heated, so that peeling is accelerated and accelerated to a large area. There are few inconveniences such as generating flaws. In spite of obtaining such an excellent effect, since the structure is simple, there is an advantage that the equipment cost is low.
[0021]
In addition, a mask portion extending in parallel with the cooling drum axis is provided, and these are supported so that the position can be changed in the substrate running direction while maintaining an equal distance from the outer peripheral surface of the substrate winding portion of the cooling drum. Since each has a cooling mechanism for cooling the mask part, the width of each vapor deposition area is adjusted by moving the mask part, and the peak temperature of the substrate in each vapor deposition area is adjusted to be approximately the same value. In addition to minimizing the risk of wrinkles and slacking, it is possible to obtain sufficient vapor deposition efficiency. In addition, since the position of the mask portion can be changed while maintaining an equal distance from the outer peripheral surface of the base material winding portion of the cooling drum, the cooling effect on the base material winding portion is kept substantially constant before and after the position change. By the position change, the cooling effect on the substrate winding part is always kept good.
[0022]
In addition, when a cooling water channel is formed inside the mask plate to flow the cooling water, the temperature rise of the mask plate during vapor deposition is suppressed, and the cooling efficiency of the base material at a position facing the mask plate is further increased. Can be increased. Thereby, the maximum temperature of the base material can be further lowered, and the effect of preventing wrinkles and slack can be further enhanced.
[Brief description of the drawings]
FIG. 1 is a front sectional view showing an embodiment of a vapor deposition apparatus according to the present invention.
FIG. 2 is a view of the mask support (mask mechanism) of the same embodiment as viewed from below.
FIG. 3 is a plan view showing an example of a mask plate of the same embodiment.
FIG. 4 is a graph of substrate temperature showing the effect of the present invention.
FIG. 5 is a graph of a substrate temperature for showing a problem of a conventional apparatus.
[Explanation of symbols]
1 Cooling drum 2 Uncoiler (base material travel mechanism)
4 Recoiler (base material travel mechanism)
6 Vapor deposition material holding portion 8 Vapor deposition material 9 Vacuum container 10 Partition 12 Mask support (mask mechanism)
14 Fixed mask portion 16 Rail portion 18 First mask plate (mask portion)
20 Second mask plate (mask part)
22 Slit 24 Bolt 26 Cooling channel P Deposition area Q Non-deposition area

Claims (2)

その外周面を冷却するための冷却手段を内蔵し、その軸線を中心として回転される冷却ドラムと、
前記冷却ドラムの外周面の一部に帯状の基材を巻回した状態でこの基材を走行させる基材走行機構と、
前記冷却ドラムの基材巻回部と対向して配置され、蒸着材料を保持する蒸着材料保持部と、
前記蒸着材料保持部内に保持された蒸着材料を前記基材巻回部に向けて蒸散させるための加熱機構と、
前記冷却ドラムと前記蒸着材料保持部との間に配置されたマスク機構と、
以上の各構成要素を収容する真空容器とを具備し、
前記マスク機構は、前記蒸着材料保持部から前記基材巻回部へ向かう蒸気を部分的に遮蔽することにより、前記基材巻回部上における材料蒸着領域を基材走行方向に並ぶ2以上の領域に分割するマスク部を具備し、
前記マスク部はそれぞれ前記冷却ドラムの軸線と平行に延び、前記マスク部は前記冷却ドラムの前記基材巻回部の外周面から等距離を保ちながら基材走行方向へ向けて位置変更可能に支持され、
前記マスク部にはそれぞれ前記マスク部を冷却するための冷却機構が設けられていることを特徴とする蒸着装置。
Built-in cooling means for cooling the outer peripheral surface, and a cooling drum rotated around the axis,
A base material traveling mechanism for traveling the base material in a state in which a belt-shaped base material is wound around a part of the outer peripheral surface of the cooling drum;
A vapor deposition material holding unit that is disposed to face the substrate winding part of the cooling drum and holds the vapor deposition material;
A heating mechanism for evaporating the vapor deposition material held in the vapor deposition material holding portion toward the substrate winding portion;
A mask mechanism disposed between the cooling drum and the vapor deposition material holder;
Comprising a vacuum vessel containing each of the above components,
The mask mechanism partially shields the vapor from the vapor deposition material holding part toward the base material winding part, so that the material vapor deposition region on the base material winding part is aligned in the base material traveling direction. Comprising a mask part to be divided into regions;
Each of the mask portions extends parallel to the axis of the cooling drum, and the mask portion is supported so that the position of the mask portion can be changed in the base material traveling direction while maintaining an equal distance from the outer peripheral surface of the base material winding portion of the cooling drum. And
The vapor deposition apparatus, wherein each of the mask portions is provided with a cooling mechanism for cooling the mask portions .
前記マスク板には冷却水路が形成されるとともに、各冷却水路に冷却水を供給するための冷却水供給機構が設けられていることを特徴とする請求項1記載の蒸着装置。The vapor deposition apparatus according to claim 1, wherein a cooling water channel is formed in the mask plate, and a cooling water supply mechanism for supplying cooling water to each cooling water channel is provided.
JP24168394A 1994-10-05 1994-10-05 Vapor deposition equipment Expired - Lifetime JP3672949B2 (en)

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JP3672949B2 true JP3672949B2 (en) 2005-07-20

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US20110065282A1 (en) * 2009-09-11 2011-03-17 General Electric Company Apparatus and methods to form a patterned coating on an oled substrate
KR101118193B1 (en) * 2011-07-20 2012-03-05 김민호 Cooling drum mask
KR101118196B1 (en) * 2011-07-20 2012-02-24 김민호 Drum mask with lower drum mask
JP6795819B2 (en) * 2016-08-31 2020-12-02 京浜ラムテック株式会社 Processing roller and its manufacturing method and processing equipment
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