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JP3697564B2 - Particle size distribution measuring device - Google Patents
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JP3697564B2 - Particle size distribution measuring device - Google Patents

Particle size distribution measuring device Download PDF

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JP3697564B2
JP3697564B2 JP19291996A JP19291996A JP3697564B2 JP 3697564 B2 JP3697564 B2 JP 3697564B2 JP 19291996 A JP19291996 A JP 19291996A JP 19291996 A JP19291996 A JP 19291996A JP 3697564 B2 JP3697564 B2 JP 3697564B2
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Prior art keywords
cell
particle size
size distribution
sample
distribution measuring
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JPH1019757A (en
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一裕 鷲尾
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Shimadzu Corp
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Shimadzu Corp
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Description

【0001】
【発明の属する技術分野】
この発明は、各種粉粒体の粒度分布測定装置、特に光学系の配置としては縦型であって、バッチ式セルを移動可能として測定誤差が小さくなるように構成した粒度分布測定装置に関する。
【0002】
【従来の技術】
粒度分布測定法のうち湿式測定法では、測定容器に入れた試料懸濁液をよく攪拌してレ−ザ−光を照射して粒子によって回折・散乱する光を検出し、その粒度分布を測定する。このようなレ−ザ回折/散乱法による粒度分布測定装置には、光学系の配置として大別すると横型と縦型がある。また、粒度分布測定装置には、粉粒体試料を混合し、よく攪拌した懸濁液をポンプによって還流させつつ測定する還流式と、所定容量の容器を測定位置にセットして測定するバッチセル式とがある。
【0003】
バッチセル方式による粒度分布測定装置の場合、横型は、図5に示すように、縦方向に水深を深くした試料容器20に懸濁液を入れ、攪拌装置21によりよく攪拌した後、横方向からレ−ザ光を照射してその回折/散乱光を測定する。
また、同じく縦型のバッチセル方式の粒度分布測定装置では、図6に示すように、横方向に長く且つ水深の浅い試料容器23に懸濁液を入れ、縦方向からレ−ザ光を照射してその回折/散乱光を測定する。従って、横型では粒子の沈降速度の影響が大きいため懸濁液の攪拌が不可欠であるのに対して、縦型では粒子の沈降速度の影響を殆ど受けないため必ずしも攪拌する必要はない。
【0004】
【発明が解決しようとする課題】
上記するバッチセル式粒度分布測定装置のうち縦型は、通常、攪拌装置により攪拌しないため粒子の偏り、即ち、粒子径分布が均等でなく粒子径の大きいものが一部に多く存在した場合、この粒子径分布の比較的大きい位置にレ−ザビ−ムを照射するとサンプリング誤差が大きくなる。例えば、図7においてレ−ザビ−ムを照射する位置が、たまたま粒子30a,30b,30c,・・・等の径の大きいものが集まっていると測定誤差が大きくなることになる。バッチセル式には連続測定を自動的に行うものもあるが、このような場合、サンプリング誤差の大きいものが多数出る可能性もある。特に、攪拌機能を持たない縦型のバッチセル式粒度分布測定装置では粒子径が大きい試料の場合サンプリング誤差を無視できない。
【0005】
この発明は上記する課題に着目してなされたものであり、少量の懸濁液を使用したバッチセル式粒度分布測定装置であって分布する試料の粒子径にある程度の偏りがあってもサンプリング誤差を軽減し、また多数のバッチ式セルであっても精度のよい連続測定が可能な粒度分布測定装置を提供することを目的とする。
【0006】
【課題を解決するための手段】
即ち、この発明は上記する課題を解決するために、請求項1に記載の発明、試料にレーザ光を照射するためのレーザ光源と、試料を入れた試料用セルを載置するためのセル取付台と、試料からの散乱光を検出する検出器を備えた粒度分布測定装置において、
前記セル取付台を駆動機構により移動可能とすると共に、前記試料用セルにレーザ光を照射しつつ散乱光を前記検出器によって測定する際に前記駆動機構によって試料用セル内の測定箇所を移動させ、この間の回折/散乱光データを積算して平均化することを特徴とするものである。
【0007】
また、請求項2に記載の発明は、前記セル取付台にゼロ点設定用の媒液を入れるゼロ点設定用セルと単数若しくは複数の試料用セルとを並べて設置すると共に、前記駆動機構により前記ゼロ点設定用セルと前記試料用セルとを前記レーザ光の照射位置にそれぞれ移動可能としたことを特徴とするものである。
【0008】
【発明の実施の形態】
先ず、レ−ザ回折/散乱法の原理について説明する。
図4は、レ−ザ回折/散乱法を用いた粒度分布測定装置の基本的な構成を示す図である。この図に示すように、レ−ザ光源1より測定対象となる粒子群30にレ−ザ光を照射すると、空間的に回折/散乱光の光強度分布パタ−ンが生ずる。このうち前方散乱光の光強度分布パタ−ンは、回折レンズ4によって集光され、焦点距離の位置にある検出面にリング状の回折/散乱像を結ぶ。これをリング状フォトダイオ−ドアレイ5で検出する。また、側方散乱光や後方散乱光は、側方散乱センサ31や後方散乱センサ32で検出する。
【0009】
この光強度分布パタ−ンは、粒子の大きさによって変化する。実際のサンプルには、大きさの異なる粒子が混在しているため、粒子群から生ずる光強度分布パタ−ンはそれぞれの粒子からの回折/散乱光の重ね合わせとなる。
これをマトリクス(行列)で表現すると、
【数1】

Figure 0003697564
となる。ただし、
【数2】
Figure 0003697564
【数3】
Figure 0003697564
sは光強度分布ベクトルである。その要素si (i=1,2,・・・m)は、リングディテクタの各素子及び側方散乱光センサによって検出される入射光量である。
qは粒度分布(頻度分布%)ベクトルである。粒度分布範囲を有限とし、この範囲内をn分割して、最大値をd1 、最小値をdn+1 とする。それぞれの分割区間〔dj ,dj+1 〕を一つの粒子径xj (j=1,2,・・n)で代表させる。qの要素qj (j=1,2,・・n)は、粒子径xj に対応する粒子量である。 通常は、
【数4】
Figure 0003697564
となるように正規化(ノルマライズ)を行っている。
Aは、粒度分布(ベクトル)qを、光強度分布(ベクトル)sに、返還する係数行列である。Aの要素ai,j (i=1,2,・・・m,j=1,2,・・・n)の物理的意味は、粒子径xj の単位粒子量の粒子群によって回折/散乱した光のi番目の素子に対する入射光量である。 ai,j の数値は、理論的に計算することができる。これには、粒子径が光源となるレ−ザ光の波長に比べて十分に大きい場合には、Fraunhofer回折理論を用いる。しかし、粒子径がレ−ザ光の波長と同程度か、それより小さいサブミクロン野領域ではMie 散乱理論を用いる必要がある。Fraunhofer回折理論は、前方微小角散乱において、粒子径が波長に比べて充分大きな場合に有効なMie 散乱理論の優れた近似であると考えることができる。
【0010】
Mie 散乱理論を用いて、係数行列Aの要素を計算するためには、粒子及びそれを分散させる媒液の屈折率を設定する必要がある。
さて、数1の式に基づいて粒度分布(ベクトル)qの最小自乗解を求める式を導出すると、
【数5】
Figure 0003697564
が得られる。ただし、AT はAの転置行列であり、( )- は逆行列を表す。 数4の右辺において、光強度分布(ベクトル)sの各要素は、リングディテクタおよび側方散乱光センサで検出される数値である。また、係数行列Aは、Fraunhofer回折理論或いはMie 散乱理論を用いて予め計算しておくことができる。 従って、それらの既知のデ−タを用いて数5の計算を実行すれば、粒度分布(ベクトル)qが求まることは明らかである。
【0011】
以上が、レ−ザ回折/散乱法の基本的な測定原理であるが、ここで示したのは、粒度分布の計算方法の一例であり、この他にも様々なバリエ−ションが存在する。また、センサ、ディテクタの種類、配置にかかわらずサブミクロン粒子の粒度分布を測定するためには、測定対象となる粒子及びそれを分散させる媒液の屈折率を設定する必要がある。
【0012】
以上のレ−ザ回折/散乱法の原理に基づくこの発明の具体的実施の形態について図面を参照しながら説明する。
図1はこの発明の粒度分布測定装置の要部の斜視図である。この粒度分布測定装置では、下方向から上方向にかけて、レ−ザ光源1,コリメ−タレンズ2,セル取付台3,回折レンズ(集光レンズ)4,検出器となる前方回折/散乱光センサのリング状フォトダイオ−ドアレイ5(下側は検出面),等がこの順に配置されている。
【0013】
前記セル取付台3には、ゼロ点設定用の媒液を入れたセル6と、試料懸濁液を入れたセル7とを並べて設置することができるようにしてある。該セル取付台3に配置するゼロ点設定用の媒液を入れたセル6及び試料懸濁液を入れたセル7の下側は透明カバ−或いはレ−ザ光透過穴が設けられている。更に、該セル取付台3は端部には側面にラック8を形成したバ−9が接続してある。そして該ラック8にはモ−タ10で駆動するピニオン11が噛合させてある。また、該ラック8を設けたバ−9の下側にはシャッタ12,13,14が取り付けてあり、これらのシャッタがフォトセンサ15の位置に来て光を遮蔽するとこのセル取付台3を停止させるようになっている。
【0014】
上記構成とした粒度分布測定装置は、レ−ザ光源1から照射されたレ−ザ光をコリメ−レンズ2で平行光線としてセル取付台3に設置されたゼロ点設定用の媒液を入れたセル6及び試料懸濁液を入れたセル7を透過させ、回折レンズ(集光レンズ)4を透過させてリング状フォトダイオ−ドアレイ5にリング状の回折/散乱像を結ぶ。この回折/散乱像を検出器(図示省略)で検出し、上記したレ−ザ回折/散乱法の原理により粒度分布を測定する。
【0015】
次に、この粒度分布測定装置による具体的測定方法について説明する。
上記するように、前記セル取付台3は同じ形のバッチセルとしたゼロ点設定用の媒液を入れたセル6及び試料懸濁液を入れたセル7を2個セットできるようにしてラック8とピニオン11により光軸と垂直な面で往復運動できるように構成されている。このバッチ式セルの停止位置は、ゼロ点設定用のセル6が光軸にセットされる点(図1の(1)のシャッタ12がフォトセンサ15を遮蔽する位置)、実測用の懸濁液を入れたセル7がスキャンされる開始点(図1の(2)のシャッタ13がフォトセンサ15を遮蔽する位置)、同スキャン終了点(図1の(3)のシャッタ14がフォトセンサ15を遮蔽する位置)、である。
【0016】
実測時には、ゼロ点設定用セル6に媒液のみ満たし、実測用セル7には測定試料懸濁液を満たす。
この状態で、先ず、停止位置の図1の(1)でゼロ点測定を行う。続いて、実測に移ると、ラック8とピニオン11が測定試料懸濁液を入れたセル7を図1の(2)の位置まで移動させ、回折/散乱光のデ−タ収集を開始する。次に、ラック8とピニオン11が図1の(2)から(3)までセル7を移動させる。図2及び図3はこのときのセル7の測定箇所の移動状態を示す図である。このように、セル7を移動させつつ数カ所の粒度分布を測定する。そしてこの間の回折/散乱光デ−タは積算され平均化される。
【0017】
この発明の粒度分布測定装置の構成は以上のようであるが、上記実施例において、セル取付台3の移動機構はラック8とピニオン11の代わりに他の移動機構、例えばエアシリンダ或いはベルトやチェ−ン駆動機構等によってもよい。また、停止位置の制御はシャッタとフォトインタラプタによる制御としたが、パルスモ−タによる制御でもよい。なお、セル取付台3は直線運動する場合で説明したが、回転運動による場合でも同様に実施することができる。
更に、前記セル取付台3には、実施の形態ではゼロ点設定用の媒液を入れたセル6と試料懸濁液を入れたセル7とを並べて設置する実施例で説明したが、該セル取付台3には多数の測定用セルを設置するように改造することも可能であり、従ってこの場合マルチサンプラ測定も実施することができる。
【0018】
【発明の効果】
以上詳述したように、この発明の粒度分布測定装置によれば、縦型で生じやすいサンプリング誤差を軽減することができるため測定精度を向上させることができる。また、同時に媒液によるゼロ点も測定するためその設定が簡単となる。更に、バッチセルタイプのマルチサンプラ(多数サンプル連続自動測定)へ拡張することも容易である。
【図面の簡単な説明】
【図1】 この発明の粒度分布測定装置の要部の斜視図である。
【図2】 この発明の粒度分布測定装置のセル取付台に載せたゼロ点設定用の媒液を入れたバッチセルと試料懸濁液を入れたバッチセルの一部正面図である。
【図3】 この発明の粒度分布測定装置のセル取付台を移動させつつ粒度分布を測定するときの試料懸濁液を入れたバッチセルの底面図である。
【図4】 レ−ザ回折/散乱法による粒度分布測定装置の基本的な構成を示す斜視図である。
【図5】 従来の粒度分布測定装置で使用される横型のバッチセルで粒度分布を測定する状態を示す図である。
【図6】 従来の粒度分布測定装置で使用される縦型のバッチセルで粒度分布を測定する状態を示す図である。
【図7】 従来の粒度分布測定装置で使用される縦型のバッチセルで粒度分布を測定する状態を示すバッチセルの底面図である。
【符号の説明】
1 レ−ザ光源
2 コリメ−タレンズ
3 セル取付台
4 回折レンズ
5 フォトダイオ−ドアレイ
6 ゼロ点設定用セル
7 試料用セル
8 ラック
9 バ−
10 モ−タ
11 ピニオン
12,13,14 シャッタ
15 フォトセンサ[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a particle size distribution measuring device for various types of granular materials, and more particularly to a particle size distribution measuring device configured to be vertically movable as an optical system and to move a batch-type cell so as to reduce a measurement error.
[0002]
[Prior art]
Of the particle size distribution measurement methods, the wet measurement method detects the light diffracted and scattered by the particles by thoroughly stirring the sample suspension in the measurement vessel and irradiating it with laser light, and measures the particle size distribution. To do. Such a particle size distribution measuring apparatus using a laser diffraction / scattering method is roughly classified into a horizontal type and a vertical type as arrangement of optical systems. In addition, the particle size distribution measuring device has a reflux type that mixes powder samples and measures a well-stirred suspension while refluxing it with a pump, and a batch cell type that sets and measures a container with a predetermined capacity at the measurement position. There is.
[0003]
In the case of a particle size distribution measuring apparatus using a batch cell method, as shown in FIG. 5, the horizontal type is prepared by putting the suspension in a sample container 20 having a deep water depth in the vertical direction and stirring well with the stirrer 21 and then starting from the horizontal direction. -Irradiate the light and measure the diffracted / scattered light.
Similarly, in the vertical batch cell type particle size distribution measuring apparatus, as shown in FIG. 6, the suspension is put in a sample container 23 which is long in the horizontal direction and shallow in water depth, and laser light is irradiated from the vertical direction. The diffraction / scattered light is measured. Accordingly, stirring of the suspension is indispensable in the horizontal type because the influence of the sedimentation rate of the particles is large, whereas in the vertical type, it is not always necessary to stir because it is hardly affected by the sedimentation rate of the particles.
[0004]
[Problems to be solved by the invention]
Of the batch cell type particle size distribution measuring apparatus described above, the vertical type is usually not stirred by a stirrer, so that there is a large amount of unevenness of particles, i.e., when the particle size distribution is not uniform and the particle size is large. When the laser beam is irradiated to a position where the particle size distribution is relatively large, the sampling error increases. For example, in FIG. 7, if the laser beam is incidentally gathered with large diameter particles such as particles 30a, 30b, 30c,..., The measurement error increases. Some batch cell types automatically perform continuous measurement, but in such a case, many samples with large sampling errors may occur. In particular, in a vertical batch cell type particle size distribution measuring apparatus having no stirring function, a sampling error cannot be ignored for a sample having a large particle size.
[0005]
The present invention has been made paying attention to the above-described problems, and is a batch cell type particle size distribution measuring apparatus using a small amount of suspension, and even if there is a certain amount of deviation in the particle size of the distributed sample, a sampling error is caused. It is an object of the present invention to provide a particle size distribution measuring apparatus that can reduce the number and can perform continuous measurement with high accuracy even with a large number of batch cells.
[0006]
[Means for Solving the Problems]
That is, in order to solve the problems this invention to the aforementioned, the invention according to claim 1, the cell for loading a laser light source for irradiating a laser beam to the sample, the sample cell containing the sample In the particle size distribution measuring apparatus equipped with a mounting base and a detector for detecting scattered light from the sample,
The cell mounting base can be moved by a driving mechanism, and when the scattered light is measured by the detector while irradiating the sample cell with a laser beam, the measurement point in the sample cell is moved by the driving mechanism. The diffracted / scattered light data during this period is integrated and averaged .
[0007]
The invention according to claim 2 is characterized in that a zero point setting cell and a single or a plurality of sample cells are placed side by side into which the liquid for zero point setting is placed in the cell mounting base, and the driving mechanism The zero point setting cell and the sample cell can be moved to the irradiation position of the laser beam, respectively.
[0008]
DETAILED DESCRIPTION OF THE INVENTION
First, the principle of the laser diffraction / scattering method will be described.
FIG. 4 is a diagram showing a basic configuration of a particle size distribution measuring apparatus using a laser diffraction / scattering method. As shown in this figure, Les - is irradiated with laser light, the light intensity distribution pattern of spatially diffracted / scattered light - - Les the particles 30 to be measured from the laser light source 1 down occurs. Among these, the light intensity distribution pattern of the forward scattered light is collected by the diffraction lens 4 and forms a ring-shaped diffraction / scattered image on the detection surface at the focal length. This is detected by the ring-shaped photodiode array 5. Further, the side scattered light and the back scattered light are detected by the side scattered sensor 31 and the back scattered sensor 32.
[0009]
This light intensity distribution pattern varies depending on the size of the particles. Since particles of different sizes are mixed in an actual sample, the light intensity distribution pattern generated from the particle group is an overlap of diffracted / scattered light from each particle.
If this is expressed in a matrix,
[Expression 1]
Figure 0003697564
It becomes. However,
[Expression 2]
Figure 0003697564
[Equation 3]
Figure 0003697564
s is a light intensity distribution vector. The element s i (i = 1, 2,... M) is the amount of incident light detected by each element of the ring detector and the side scattered light sensor.
q is a particle size distribution (frequency distribution%) vector. The particle size distribution range is finite, and the range is divided into n, and the maximum value is d 1 and the minimum value is d n + 1 . Each divided section [d j , d j + 1 ] is represented by one particle diameter x j (j = 1, 2,... N). The element q j (j = 1, 2,... n) of q is the amount of particles corresponding to the particle diameter x j . Normally,
[Expression 4]
Figure 0003697564
Normalization is performed so that
A is a coefficient matrix that returns the particle size distribution (vector) q to the light intensity distribution (vector) s. Element a i of A, j (i = 1,2, ··· m, j = 1,2, ··· n) The physical meaning of the diffracted by the particles of unit particles of particle size x j / This is the amount of light incident on the i-th element of scattered light. The numerical value of a i, j can be calculated theoretically. For this, the Fraunhofer diffraction theory is used when the particle diameter is sufficiently larger than the wavelength of the laser beam as the light source. However, it is necessary to use the Mie scattering theory in the sub-micron field region where the particle diameter is the same as or smaller than the wavelength of the laser beam. The Fraunhofer diffraction theory can be considered as an excellent approximation of the Mie scattering theory, which is effective when the particle diameter is sufficiently larger than the wavelength in forward small angle scattering.
[0010]
In order to calculate the elements of the coefficient matrix A using the Mie scattering theory, it is necessary to set the refractive index of the particles and the liquid medium in which the particles are dispersed.
Now, when deriving an equation for obtaining the least squares solution of the particle size distribution (vector) q based on the equation of Equation 1,
[Equation 5]
Figure 0003697564
Is obtained. Here, AT is a transposed matrix of A, and () represents an inverse matrix. On the right side of Equation 4, each element of the light intensity distribution (vector) s is a numerical value detected by the ring detector and the side scattered light sensor. The coefficient matrix A can be calculated in advance using Fraunhofer diffraction theory or Mie scattering theory. Therefore, it is obvious that the particle size distribution (vector) q can be obtained by performing the calculation of Formula 5 using these known data.
[0011]
The above is the basic measurement principle of the laser diffraction / scattering method. What has been shown here is an example of a method for calculating the particle size distribution, and there are various other variations. The sensor, the type of detector, in order to measure the particle size distribution of submicron particles regardless arrangement, it is necessary to set the refractive index of the particles and medium liquid dispersing it be measured.
[0012]
A specific embodiment of the present invention based on the principle of the above laser diffraction / scattering method will be described with reference to the drawings.
FIG. 1 is a perspective view of the main part of the particle size distribution measuring apparatus of the present invention. In this particle size distribution measuring apparatus, a laser light source 1, a collimator lens 2, a cell mounting base 3, a diffractive lens (condensing lens) 4, a forward diffracted / scattered light sensor serving as a detector from the lower direction to the upper direction. A ring-shaped photodiode array 5 (lower side is a detection surface), etc. are arranged in this order.
[0013]
On the cell mount 3, a cell 6 containing a medium for setting a zero point and a cell 7 containing a sample suspension can be installed side by side. A transparent cover or a laser light transmitting hole is provided on the lower side of the cell 6 containing the medium for zero point setting and the cell 7 containing the sample suspension arranged on the cell mounting base 3. Further, a bar 9 having a rack 8 formed on a side surface is connected to the end of the cell mounting base 3. The rack 8 is engaged with a pinion 11 driven by a motor 10. Further, shutters 12, 13, and 14 are attached to the lower side of the bar 9 provided with the rack 8. When these shutters come to the position of the photosensor 15 and shield the light, the cell mounting base 3 is stopped. It is supposed to let you.
[0014]
Particle size distribution measuring apparatus with the above configuration is - a laser light collimator - - Le emitted from laser light source 1 placed transfer fluid for zero-setting installed in the cell mount 3 as parallel rays in data lens 2 The cell 6 and the cell 7 containing the sample suspension are transmitted, and the diffraction lens (condensing lens) 4 is transmitted to form a ring-shaped diffraction / scattering image on the ring-shaped photodiode array 5. This diffraction / scattering image is detected by a detector (not shown), and the particle size distribution is measured by the principle of the laser diffraction / scattering method described above.
[0015]
Next, a specific measuring method using this particle size distribution measuring apparatus will be described.
As described above, the cell mounting base 3 has the same shape as a batch cell, the cell 6 containing the zero point setting liquid and the cell 7 containing the sample suspension so that two racks 8 can be set. The pinion 11 is configured to reciprocate on a plane perpendicular to the optical axis. The stop position of this batch type cell is the point where the cell 6 for setting the zero point is set on the optical axis (the position where the shutter 12 in FIG. 1 (1) shields the photosensor 15), the suspension for measurement. 1 is scanned (the position where the shutter 13 in FIG. 1 (2) shields the photosensor 15), and the scanning end point (the shutter 14 in (3) of FIG. Shielding position).
[0016]
At the time of actual measurement, the zero point setting cell 6 is filled with only the liquid medium, and the actual measurement cell 7 is filled with the measurement sample suspension.
In this state, first, zero point measurement is performed at (1) in FIG. Subsequently, in actual measurement, the rack 8 and the pinion 11 move the cell 7 containing the measurement sample suspension to the position (2) in FIG. 1, and start collecting data of diffracted / scattered light. Next, the rack 8 and the pinion 11 move the cell 7 from ( 2) to (3) in FIG. 2 and 3 are diagrams showing the movement state of the measurement location of the cell 7 at this time. In this way, particle size distributions at several locations are measured while moving the cell 7. The diffracted / scattered light data during this period is integrated and averaged.
[0017]
The configuration of the particle size distribution measuring apparatus of the present invention is as described above. In the above embodiment, the moving mechanism of the cell mount 3 is replaced with another moving mechanism such as an air cylinder, a belt or a chain instead of the rack 8 and the pinion 11. It may also be a negative drive mechanism or the like. The stop position is controlled by the shutter and the photo interrupter, but may be controlled by a pulse motor. In addition, although the cell mounting base 3 demonstrated in the case of a linear motion, it can implement similarly also in the case of a rotational motion.
Further, in the embodiment, the cell mounting base 3 has been described in the embodiment in which the cell 6 containing the medium for setting the zero point and the cell 7 containing the sample suspension are installed side by side. It is possible to modify the mounting base 3 so that a large number of measurement cells are installed. Therefore, in this case, multi-sampler measurement can also be performed.
[0018]
【The invention's effect】
As described above in detail, according to the particle size distribution measuring apparatus of the present invention, it is possible to reduce the sampling error that is likely to occur in the vertical type, so that the measurement accuracy can be improved. At the same time, since the zero point due to the liquid medium is also measured, the setting becomes simple. Furthermore, it is easy to expand to a batch cell type multisampler (multiple sample continuous automatic measurement).
[Brief description of the drawings]
FIG. 1 is a perspective view of a main part of a particle size distribution measuring apparatus according to the present invention.
FIG. 2 is a partial front view of a batch cell containing a zero point setting medium liquid and a batch cell containing a sample suspension placed on a cell mount of the particle size distribution measuring apparatus of the present invention.
FIG. 3 is a bottom view of a batch cell containing a sample suspension when a particle size distribution is measured while moving a cell mount of the particle size distribution measuring device of the present invention.
FIG. 4 is a perspective view showing a basic configuration of a particle size distribution measuring apparatus using a laser diffraction / scattering method.
FIG. 5 is a diagram showing a state in which a particle size distribution is measured by a horizontal batch cell used in a conventional particle size distribution measuring apparatus.
FIG. 6 is a diagram showing a state in which a particle size distribution is measured by a vertical batch cell used in a conventional particle size distribution measuring apparatus.
FIG. 7 is a bottom view of a batch cell showing a state in which a particle size distribution is measured by a vertical batch cell used in a conventional particle size distribution measuring apparatus.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Laser light source 2 Collimator lens 3 Cell mounting base 4 Diffraction lens 5 Photodiode array 6 Zero point setting cell 7 Sample cell 8 Rack 9 Bar
10 motor 11 pinion 12, 13, 14 shutter 15 photo sensor

Claims (2)

試料にレーザ光を照射するためのレーザ光源と、試料を入れた試料用セルを載置するためのセル取付台と、試料からの散乱光を検出する検出器を備えた粒度分布測定装置において、
前記セル取付台を駆動機構により移動可能とすると共に、前記試料用セルにレーザ光を照射しつつ散乱光を前記検出器によって測定する際に前記駆動機構によって試料用セル内の測定箇所を移動させ、この間の回折/散乱光データを積算して平均化することを特徴とする粒度分布測定装置。
In a particle size distribution measuring apparatus comprising a laser light source for irradiating a sample with laser light, a cell mounting base for mounting a sample cell containing the sample, and a detector for detecting scattered light from the sample,
The cell mounting base can be moved by a driving mechanism, and when the scattered light is measured by the detector while irradiating the sample cell with a laser beam, the measurement point in the sample cell is moved by the driving mechanism. The particle size distribution measuring apparatus characterized by integrating and averaging the diffraction / scattered light data between them.
前記セル取付台にゼロ点設定用の媒液を入れるゼロ点設定用セルと単数若しくは複数の試料用セルとを並べて設置すると共に、前記駆動機構により前記ゼロ点設定用セルと前記試料用セルとを前記レーザ光の照射位置にそれぞれ移動可能としたことを特徴とする請求項1に記載の粒度分布測定装置。A zero-point setting cell and a single or a plurality of sample cells for placing a medium for zero-point setting on the cell mount are installed side by side, and the driving mechanism sets the zero-point setting cell and the sample cell The particle size distribution measuring device according to claim 1, wherein the particle size distribution measuring device can be moved to an irradiation position of the laser beam.
JP19291996A 1996-07-03 1996-07-03 Particle size distribution measuring device Expired - Fee Related JP3697564B2 (en)

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