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JP3698746B2 - Solar cell and manufacturing method thereof - Google Patents
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JP3698746B2 - Solar cell and manufacturing method thereof - Google Patents

Solar cell and manufacturing method thereof Download PDF

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JP3698746B2
JP3698746B2 JP29706494A JP29706494A JP3698746B2 JP 3698746 B2 JP3698746 B2 JP 3698746B2 JP 29706494 A JP29706494 A JP 29706494A JP 29706494 A JP29706494 A JP 29706494A JP 3698746 B2 JP3698746 B2 JP 3698746B2
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electrode
groove
light
solar cell
vapor deposition
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JPH08162652A (en
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一郎 山嵜
実 兼岩
諭 岡本
誠 西田
雄爾 小松
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Sharp Corp
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Sharp Corp
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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Description

【0001】
【産業上の利用分野】
本発明は、光電変換効率の高い太陽電池に関するものである。
【0002】
【従来の技術】
一般に、太陽電池の受光面側に形成される電極の断面形状は、図1に示すように、矩形をしており、電極上に入射した光11は受光面外に反射されてしまい、光電変換に寄与しない。この電極上に入射した光を有効に利用する方法として、電極の断面形状を、受光面に対して45°以上の傾斜をもつ山形とすることが有効であるが、その形成方法として、例えば、特開昭56−10977に開示された、所望の電極幅よりも狭いスリットを備えた蒸着マスクを電極形成面とある間隔をもって保持した状態で蒸着することにより、平らな面に形成する方法が取られている。このようにして形成した山形電極の場合、図2に断面と入射光の経路を示すが、電極上に入射した光11が受光面に向けて反射し、光電変換に利用できるようになる。
【0003】
【発明が解決しようとする課題】
しかしながら、上記のような電極の場合、図2に示すように電極から反射されて受光面に向かった光の受光面における反射分11´は二度と受光面に向かうことはなく、入射光の利用としては不十分である。また、実際の太陽電池の利用を考えた場合、大部分は屋外での発電用であり、その際には、地面の上や、建物の屋根の上あるいは壁面等にある角度をもたせて固定して設置することが一般的に行われている。このような場合、一日のうちで太陽光が受光面に対して斜めに入射する時間が長くなるが、従来の山形電極では図3に示すように、電極の傾斜角をa°として、入射角(180−2a)°以下で入射した光は電極に入射した分はすべて受光面外に反射されてしまい、山形電極の効果は全くなくなってしまう。従って、従来山形電極が有効に働くのは、光の入射角度が、(180−2a)°より大きい場合のみに限られてしまう。また、形成方法としては、特開昭56−10977に示される方法があるが、これは数mm程度の幅の電極を形成する場合は、蒸着マスクと基板を数mmの間隔をあけて保持すればよいので簡単である。ところが、近年の高効率を狙った太陽電池においては、数十μm程度の幅の微細な電極を形成する必要があり、そのためには、蒸着マスクを基板上に数十μmの間隔をあけて保持しなければならないが、特開昭56−10977には、この蒸着マスクの支持方法は開示されていない。
【0004】
【課題を解決するための手段】
本発明に係る請求項1の太陽電池は、上記請求項1において、受光面側に開口し基板内部に側壁がある溝と、前記溝内に前記溝の上部から底部にかけてその断面形状の幅が広がる領域を含む電極と、を含み、前記溝の側壁の少なくとも一部が前記電極と接触しておらず、前記溝の深さが、前記電極の高さよりも深いまたは前記電極の高さと同一であることを特徴とする太陽電池である。また、本発明に係る請求項2の太陽電池は、上記請求項2において、受光面側に開口し基板内部に側壁がある溝と、前記溝内にその断面形状が前記受光面に対して傾斜を持つ山形電極とを有し、前記溝の側壁の少なくとも一部が前記山形電極と接触しておらず、前記溝の深さが、前記山形電極の高さよりも深いまたは前記山形電極の高さと同一であることを特徴とする太陽電池である。
【0005】
本発明にかかる請求項の太陽電池は、上記請求項において、請求項に記載の太陽電池において、前記溝は、その幅をw、山形電極の傾斜角をa°として、溝の深さが、山形電極の高さよりも、0.5w×tan(90−a)°以上深く形成されることを特徴とするものである。
【0006】
本発明に係る請求項の太陽電池の製造方法は、上記請求項において、受光面側に、その断面形状が前記受光面に対して傾斜を持つ山形となる電極を有した太陽電池の製造方法において、前記山形電極を形成する際に、所望の電極幅よりも狭いスリットを備えた蒸着マスクを電極形成面とある間隔をもって保持した状態で蒸着する方法であって、所望の電極の形状を得るために必要な電極形成面と蒸着マスクとの距離を保持する際に、基板表面にレジスト膜を、電極形成面からレジスト膜表面までの高さが、所望の電極の形状を得るために必要な電極形成面と蒸着マスクとの距離と同じになるように形成し、少なくとも電極形成部を含む部分が開口するようにパターニングし、レジスト表面に蒸着マスクを密着させてなることを特徴とするものである。
【0007】
本発明に係る請求項の太陽電池の製造方法は、上記請求項において、受光面側に、その断面形状が前記受光面に対して傾斜を持つ山形となる電極を有した太陽電池の製造方法であって、前記山形電極を形成する際に、所望の電極幅よりも狭いスリットを備えた蒸着マスクを電極形成面とある間隔をもって保持した状態で蒸着する方法であって、所望の電極の形状を得るために必要な電極形成面と蒸着マスクとの距離を保持する際に、基板表面の電極形成部に溝を、その深さが所望の電極の形状を得るために必要な電極形成面と蒸着マスクとの距離と同じになるように形成し、基板表面に蒸着マスクを密着させてなることを特徴とするものである。
【0008】
【作用】
請求項1および請求項2においては、溝内に電極を形成することにより、溝壁面で光が反射して入射光の利用率を高めることが可能となる。
【0009】
請求項においては、山形電極を、電極高さより深い溝内に形成することにより、斜めからの光が入射した際に生じる山形電極による損失をなくすことが可能となる。
【0010】
請求項においては、レジスト皮膜を蒸着マスクの支持体として用いることにより、膜厚制御性のよいレジスト皮膜の特性を活かして、薄い膜厚の蒸着マスク支持体を形成することができる。
【0011】
請求項においては、溝を利用して自動的に蒸着マスクと山形電極形成部との間に所望の間隔をもたせることが可能になる。
【0012】
即ち、図4に請求項1および請求項2に係る発明による電極部を備えた素子の断面と、そこに真上からの入射した光の反射経路を示す。従来例では図2に示すように、電極の斜面で反射して受光面に入射した光の反射分11´は二度と受光面に戻って来ることはない。しかしながら、本発明においては、図4に示すように、電極と溝の壁10´との間で反射を繰り返すため、電極で反射される光が素子に吸収される量が増加し、さらに光電変換に対する寄与率が高まる。
【0013】
図5に請求項に係る発明による電極部を備えた素子の断面図と、そこに入射角(180−2a)°で斜めから入射した光の経路を示す。入射した光は溝の壁部分10′に入射し、光電変換に寄与する。これ以下の角度で入射した光についても同様である。
【0014】
また、電極形成については、請求項に係る発明により、図6(d)に示すように、基板上に適当な厚さのレジスト皮膜を形成して、少なくとも電極形成部を含む部分を開口し、レジスト膜表面に蒸着マスクを密着させて置くことによって、所望の間隔を電極形成部と蒸着マスクの間に持たせることができ、レジスト膜の厚さはμmオーダーで制御可能であるので、レジスト膜厚を適当に選択することによって、微細な山形電極を形成することができる。
【0015】
更に、請求項に係る発明により、図7(d)に示すように、電極形成部にあらかじめ適当な深さの溝を形成しておいて、基板にマスクを密着させて置くことで、レジスト皮膜の形成、パターニング等の工程なしで、自動的にマスクと電極形成部に所望の間隔を持たせることができるようになり、工程を簡略化することができる。
【0016】
【実施例】
(実施例1)
請求項1、請求項2及び請求項に基づいた実施例について図面を用いて説明する。
【0017】
まず、図6(a)を参考にして、P型Si基板1に、厚さ20μmのブレードを備えたダイサーを用いて、幅20μm、深さ20μmの溝2を1mmピッチで形成する。次に、図6(b)を参考にして、りん拡散を行い、基板表面にN+層3を形成する。次に、図6(c)を参考にして、バックエッチを施した後、裏面にAlペーストを印刷焼成してP+層4および裏面電極5を形成する。次に、図6(d)を参考にして、表面にフォトレジスト6を40μmの厚さに塗布し、電極形成部を含むように30μmの幅に開口する。そのうえに密着させて幅10μmに開口した蒸着マスク8を載せる。次に、Tiを500Å蒸着してから、反射率の高いAgを蒸着すると、図6に示すように山形電極7が形成される。山形電極は高さ20μm、傾斜角70°であった。次に、蒸着マスクを外し、アセトン中にてフォトレジストを除去して完成した素子を図6(f)に示す。図4に本実施例による電極部の入射光の反射経路を示す。従来例では、図2に示すように電極の斜面で反射して受光面に入射した光の反射分11′は二度と受光面に戻って来ることはないが、本発明においては、電極と溝の壁10′との間で反射を繰り返し、さらに光電変換に対する寄与率が高まる。
【0018】
(実施例2)
請求項及び請求項に基づいた実施例について図面を用いて説明する。
【0019】
まず、図7(a)を参考にして、P型Si基板1に、ダイサーを用いて、幅20μm、深さ60μmの溝2を500μmピッチで形成する。次に、図7(b)を参考にして、りん拡散を行い、基板表面にN+層3を形成する。次に、図7(c)を参考にして、バックエッチを施した後、裏面にAlペーストを印刷焼成してP+層4および裏面電極5を形成する。次に、図7(d)を参考にして、基板表面に密着させて幅10μmに開口した蒸着マスク8を載せる。次に、Tiを500Å蒸着してから、反射率の高いAgを蒸着すると、図7(e)に示すように山形電極が形成される。次に蒸着マスクを外して完成した素子を図7(f)に示す。今回の条件では、高さ20μm、傾斜角70°の山形電極7が幅20μm、深さ60μmの溝に形成されており、溝の深さ60μmは、電極の高さ20μmよりも0.5×20×tan(90−70)゜≒3.6μm以上深くなっており、請求項を満たしている。図8及び図9に実施例1による電極と本実施例による電極とにそれぞれ、入射角n゜(n<40=180−70×2)で入射した光の経路を示す。この角度で入射した光の場合、実施例1による電極では、一部の光が電極の斜面に当たり受光面外に反射されてしまい、n<20のときには、50%もの損失となる。また、従来山形電極では、この角度で入射した光が、すべて電極斜面で受光面外に反射されてしまうことは「従来の技術」で述べた通りである。しかしながら、本実施例による電極では、入射した光はすべて溝の壁10′に入射して光電変換に寄与する。従って、本実施例による電極を備えた太陽電池は、屋外に設置した場合、全日照時間において、電極による反射損失を生じることがない。図10に傾斜角a°の従来山形電極に入射角(180−2a)°以下の角度で光が入射したときに電極によって生じる陰を示す。入射角が小さくなるほど、従来例では受光面のうちで電極の陰になる部分12が大きくなって受光面に入射する光のうち光電変換に寄与する光の割合が減少する。図11に、従来山形電極を備えた太陽電池に有効に入射した光の量を1としたときの、本実施例による太陽電池に有効に入射する光の量を、入射角40°以下の場合について示す。電極は、いずれも高さ20μm、傾斜角70°、ピッチ500μmで形成されている。本実施例では受光面に入射する光はすべて光電変換に寄与するので、入射角が小さくなるほど、本実施例の優位性が大きくなる。
【0020】
また、電極形成時においては、請求項の方法では金属蒸着時に蒸着マスクを基板とある間隔を持たせて保持するために、(実施例1)で述べたように、レジスト膜の形成、パターニング、除去という工程が必要であったが、本発明では溝形成時の深さを適当に選択することにより、基板にマスクを密着させて置くことで、自動的にマスクと電極形成部に必要な間隔を持たせることができ、工程を簡略化できる。
【0021】
以上の実施例においては、溝の形成にダイサーを用いたが、この他にも、レジスト等でエッチングマスクを形成した後に、ウエットエッチあるいはドライエッチを行って形成することもできる。なお、本発明は、基板の溝加工が可能であって、受光面に電極を有する太陽電池であれば適用することができ、実施例に挙げた太陽電池に限定されるものではない。
【0022】
【発明の効果】
請求項1および請求項2の太陽電池によれば、山形電極の入射光の利用率が高まり、高効率化を図ることが可能となる。
【0023】
請求項の太陽電池によれば、電極による反射損失が生じることのない理想的な太陽電池を提供することが可能となる。
【0024】
請求項の太陽電池の製造方法によれば、山形電極の微細化が可能となるものである。
【0025】
請求項の太陽電池の製造方法によれば、その工程の簡略化が可能となるものである。
【0026】
即ち、太陽電池に山形電極を形成する際に、電極形成部にあらかじめ溝を形成しておくことによって、山形電極の入射光光電変換寄与率向上効果をさらに高めることができ、変換効率を向上させることができる。また、溝の深さを適当に選ぶことによって、光が斜めに入射したときも、電極による反射損失が発生することがないようにできる。また、形成方法に関して、基板上に適当な厚さのレジスト皮膜を形成して、少なくとも電極形成部を含む部分を開口し、レジスト膜表面に蒸着マスクを密着させて置くことによって、所望の間隔を電極形成部と蒸着マスクの間に持たせることができ、レジスト膜の厚さはμmオーダーで制御可能であるので、レジスト膜厚を適当に選択することによって、微細な山形電極を形成することができる。また、電極形成部にあらかじめ適当な深さの溝を形成しておいて、基板にマスクを密着させて置くことで、レジスト皮膜の形成、パターニング等の工程なしで、自動的にマスクと電極形成部に所望の間隔を持たせることができるようになり、工程を簡略化することができる。
【図面の簡単な説明】
【図1】 従来の矩形電極における入射光の経路を示す図である。
【図2】 従来の山形電極における入射光の経路を示す図である。
【図3】 傾斜角a°の従来山形電極に入射角(180−2a)°およびそれ以下の角度で入射した光の経路を示す図である。
【図4】 請求項1および請求項2に係る発明による山形電極における入射光の経路を示す図である。
【図5】 請求項に係る発明による傾斜角a°の山形電極に入射角(180−2a)°で入射した光の経路を示す図である。
【図6】 (a)〜(f) 実施例1に係る素子作成工程図である。
【図7】 (a)〜(f) 実施例2に係る素子作成工程図である。
【図8】 実施例1による山形電極に入射角n°(n<40)で入射した光の経路を示す図である。
【図9】 実施例2による山形電極に入射角n°(n<40)で入射した光の経路を示す図である。
【図10】 傾斜角a°の従来山形電極に入射角(180−2a)°以下の角度で光が入射したときに電極によって生じる陰を示す図である。
【図11】 入射角40°以下で光が入射した時に、従来山形電極を備えた太陽電池に有効に入射する光の量を1としたときの、実施例2による太陽電池に有効に入射する光の量を表す図である。
【符号の説明】
1 P型Si基板
2 溝
3 N+
4 P+
5 裏面電極
6 レジスト
7 山形電極
8 蒸着マスク
9 矩形電極
10 基板
10′ 壁
11 入射光
11′ 反射光
12 陰
[0001]
[Industrial application fields]
The present invention relates to a solar cell with high photoelectric conversion efficiency.
[0002]
[Prior art]
In general, the cross-sectional shape of the electrode formed on the light-receiving surface side of the solar cell is rectangular as shown in FIG. 1, and the light 11 incident on the electrode is reflected outside the light-receiving surface, resulting in photoelectric conversion. Does not contribute. As a method of effectively using the light incident on the electrode, it is effective to make the cross-sectional shape of the electrode a mountain shape having an inclination of 45 ° or more with respect to the light receiving surface. JP-A-56-10777 discloses a method of forming a deposition mask having a slit narrower than a desired electrode width while keeping it at a certain distance from the electrode formation surface to form a flat surface. It has been. In the case of the chevron electrode formed in this way, FIG. 2 shows a cross section and a path of incident light. Light 11 incident on the electrode is reflected toward the light receiving surface and can be used for photoelectric conversion.
[0003]
[Problems to be solved by the invention]
However, in the case of the electrode as described above, as shown in FIG. 2, the reflected portion 11 ′ of the light reflected from the electrode toward the light receiving surface does not go to the light receiving surface again, and the incident light is used. Is insufficient. Also, when considering the use of actual solar cells, most of them are for outdoor power generation. At that time, fix them at an angle on the ground, on the roof of the building, or on the wall surface. It is generally done to install. In such a case, it takes a long time for sunlight to be incident obliquely on the light receiving surface in one day. However, as shown in FIG. Light incident at an angle of (180-2a) ° or less is reflected off the light receiving surface as much as it enters the electrode, and the effect of the chevron electrode is completely lost. Therefore, the conventional angle-shaped electrode works effectively only when the incident angle of light is larger than (180-2a) °. As a forming method, there is a method disclosed in Japanese Patent Application Laid-Open No. 56-10977. In the case of forming an electrode having a width of about several mm, the vapor deposition mask and the substrate are held with an interval of several mm. It ’s easy because it ’s all right. However, in recent solar cells aiming at high efficiency, it is necessary to form a fine electrode with a width of about several tens of μm. For this purpose, the deposition mask is held on the substrate with an interval of several tens of μm. However, Japanese Patent Laid-Open No. 56-10977 does not disclose a method for supporting the vapor deposition mask.
[0004]
[Means for Solving the Problems]
A solar cell according to a first aspect of the present invention is the solar cell according to the first aspect, wherein a groove having an opening on the light receiving surface side and having a side wall inside the substrate, and a width of a cross-sectional shape in the groove from the top to the bottom of the groove An electrode including a widened region, wherein at least a part of the side wall of the groove is not in contact with the electrode, and the depth of the groove is deeper than or equal to the height of the electrode. It is a solar cell characterized by being. According to a second aspect of the present invention, there is provided a solar cell according to the second aspect, wherein a groove having an opening on the light receiving surface side and having a side wall inside the substrate, and a cross-sectional shape in the groove is inclined with respect to the light receiving surface. And at least part of the side wall of the groove is not in contact with the chevron electrode, and the depth of the groove is greater than the height of the chevron electrode or the height of the chevron electrode. It is the solar cell characterized by being the same.
[0005]
The solar cell of claim 3 according to the present invention, in the above-mentioned claim 3, in the solar cell according to claim 2, wherein the groove has a width w, as a ° inclination angle of the chevron electrode, the depth of the groove Is formed deeper than the height of the chevron electrode by 0.5 w × tan (90-a) ° or more.
[0006]
Method of manufacturing a solar cell according to claim 4 of the present invention, in the fourth aspect, the light-receiving surface side, the production of solar cells having an electrode sectional shape is angular with an inclination with respect to the light receiving surface In the method, when the chevron electrode is formed, the deposition mask having a slit narrower than the desired electrode width is deposited with a certain distance from the electrode formation surface, and the desired electrode shape is formed. When maintaining the distance between the electrode formation surface and the vapor deposition mask necessary to obtain the resist film on the substrate surface, the height from the electrode formation surface to the resist film surface is necessary to obtain the desired electrode shape The electrode is formed so that the distance between the electrode formation surface and the vapor deposition mask is the same, and is patterned so that at least a portion including the electrode formation portion is opened, and the vapor deposition mask is adhered to the resist surface. Than it is.
[0007]
The method for manufacturing a solar cell according to claim 5 of the present invention is the method for manufacturing a solar cell according to claim 5, wherein the light receiving surface side has an electrode whose cross-sectional shape is inclined with respect to the light receiving surface. A method of depositing a deposition mask having a slit narrower than a desired electrode width while maintaining a certain distance from an electrode formation surface when forming the chevron electrode, When maintaining the distance between the electrode forming surface necessary for obtaining the shape and the vapor deposition mask, a groove is formed in the electrode forming portion of the substrate surface, and the electrode forming surface necessary for obtaining the desired electrode shape in depth. And the vapor deposition mask are formed so as to have the same distance as the vapor deposition mask, and the vapor deposition mask is adhered to the surface of the substrate.
[0008]
[Action]
In the first and second aspects, by forming an electrode in the groove, light is reflected by the groove wall surface, and the utilization rate of incident light can be increased.
[0009]
According to the third aspect of the present invention, by forming the chevron electrode in the groove deeper than the electrode height, it is possible to eliminate the loss due to the chevron electrode that occurs when light from an oblique direction is incident.
[0010]
According to the fourth aspect of the present invention, by using the resist film as a support for the vapor deposition mask, it is possible to form a vapor deposition mask support having a thin film thickness by taking advantage of the characteristics of the resist film with good film thickness controllability.
[0011]
According to the fifth aspect of the present invention, it is possible to automatically provide a desired interval between the vapor deposition mask and the chevron electrode forming portion using the groove.
[0012]
That is, FIG. 4 shows a cross section of an element having an electrode portion according to the inventions according to claim 1 and claim 2 , and a reflection path of light incident thereon from directly above. In the conventional example, as shown in FIG. 2, the reflected portion 11 ′ of the light reflected by the slope of the electrode and incident on the light receiving surface never returns to the light receiving surface. However, in the present invention, as shown in FIG. 4, since reflection is repeated between the electrode and the groove wall 10 ', the amount of light reflected by the electrode is absorbed by the element, and further photoelectric conversion is performed. The contribution rate to is increased.
[0013]
FIG. 5 shows a cross-sectional view of an element including an electrode portion according to the invention of claim 3 and a path of light incident obliquely at an incident angle (180-2a) °. The incident light enters the wall portion 10 'of the groove and contributes to photoelectric conversion. The same applies to light incident at an angle smaller than this.
[0014]
As for the electrode formation, according to the invention of claim 4 , as shown in FIG. 6D, a resist film having an appropriate thickness is formed on the substrate, and at least a portion including the electrode forming portion is opened. By placing the deposition mask in close contact with the resist film surface, a desired interval can be provided between the electrode forming portion and the deposition mask, and the thickness of the resist film can be controlled on the order of μm. By selecting an appropriate film thickness, a fine chevron electrode can be formed.
[0015]
Further, according to the invention of claim 5 , as shown in FIG. 7 (d), a groove having an appropriate depth is formed in advance in the electrode forming portion, and a mask is placed in close contact with the substrate, thereby providing a resist. A desired interval can be automatically provided between the mask and the electrode forming portion without steps such as film formation and patterning, and the steps can be simplified.
[0016]
【Example】
(Example 1)
Claim 1, will be described with reference to the drawings embodiment according to claim 2及 beauty claim 4.
[0017]
First, referring to FIG. 6A, grooves 2 having a width of 20 μm and a depth of 20 μm are formed on a P-type Si substrate 1 with a pitch of 1 mm using a dicer provided with a blade having a thickness of 20 μm. Next, referring to FIG. 6B, phosphorus diffusion is performed to form an N + layer 3 on the substrate surface. Next, referring to FIG. 6C, after performing back etching, an Al paste is printed and fired on the back surface to form the P + layer 4 and the back electrode 5. Next, referring to FIG. 6D, a photoresist 6 is applied to the surface to a thickness of 40 μm, and an opening having a width of 30 μm is formed so as to include the electrode forming portion. A vapor deposition mask 8 having a width of 10 μm and an intimate contact is placed thereon. Next, after depositing 500 μm of Ti and then depositing Ag having a high reflectance, a chevron electrode 7 is formed as shown in FIG. 6. The chevron electrode had a height of 20 μm and an inclination angle of 70 °. Next, a device completed by removing the vapor deposition mask and removing the photoresist in acetone is shown in FIG. FIG. 4 shows a reflection path of incident light of the electrode unit according to this embodiment. In the conventional example, as shown in FIG. 2, the reflected portion 11 'of the light reflected by the inclined surface of the electrode and incident on the light receiving surface never returns to the light receiving surface. Reflection with the wall 10 'is repeated, and the contribution rate to photoelectric conversion is further increased.
[0018]
(Example 2)
Embodiments based on claims 3 and 5 will be described with reference to the drawings.
[0019]
First, referring to FIG. 7A, grooves 2 having a width of 20 μm and a depth of 60 μm are formed on a P-type Si substrate 1 with a pitch of 500 μm using a dicer. Next, referring to FIG. 7B, phosphorus diffusion is performed to form an N + layer 3 on the substrate surface. Next, referring to FIG. 7C, after back etching is performed, an Al paste is printed and fired on the back surface to form the P + layer 4 and the back electrode 5. Next, referring to FIG. 7 (d), a deposition mask 8 that is brought into close contact with the substrate surface and opened to a width of 10 μm is placed. Next, after depositing 500 μm of Ti and then depositing Ag having a high reflectance, a chevron electrode is formed as shown in FIG. Next, the element completed by removing the vapor deposition mask is shown in FIG. Under the present conditions, a chevron electrode 7 having a height of 20 μm and an inclination angle of 70 ° is formed in a groove having a width of 20 μm and a depth of 60 μm, and the groove depth of 60 μm is 0.5 × 20 × tan (90−70) ° ≈3.6 μm or more, which satisfies claim 3 . FIGS. 8 and 9 show paths of light incident on the electrode according to the first embodiment and the electrode according to the present embodiment at an incident angle n ° (n <40 = 180−70 × 2), respectively. In the case of light incident at this angle, in the electrode according to Example 1, a part of the light hits the slope of the electrode and is reflected outside the light receiving surface, and when n <20, the loss is as much as 50%. In addition, as described in the “conventional technology”, in the conventional chevron electrode, all the light incident at this angle is reflected off the light receiving surface by the inclined surface of the electrode. However, in the electrode according to the present embodiment, all incident light enters the groove wall 10 'and contributes to photoelectric conversion. Therefore, when the solar cell provided with the electrode according to the present embodiment is installed outdoors, the reflection loss due to the electrode does not occur during the entire daylight hours. FIG. 10 shows the shadow generated by the electrode when light is incident on the conventional angled electrode having an inclination angle of a ° at an incident angle of (180-2a) ° or less. As the incident angle decreases, in the conventional example, the portion 12 of the light receiving surface that is behind the electrode increases, and the proportion of light that contributes to photoelectric conversion in the light incident on the light receiving surface decreases. FIG. 11 shows a case where the amount of light effectively incident on the solar cell according to the present embodiment is 1 when the amount of light effectively incident on the solar cell having the conventional chevron electrode is 1. Show about. All the electrodes are formed with a height of 20 μm, an inclination angle of 70 °, and a pitch of 500 μm. In this embodiment, all light incident on the light receiving surface contributes to photoelectric conversion. Therefore, the smaller the incident angle, the greater the advantage of this embodiment.
[0020]
Further, in forming the electrodes, in the method of claim 4 , in order to hold the vapor deposition mask with a certain distance from the substrate during metal vapor deposition, as described in the first embodiment, the resist film is formed and patterned. However, in the present invention, by appropriately selecting the depth at the time of forming the groove, the mask is placed in close contact with the substrate, so that it is automatically necessary for the mask and the electrode forming portion. An interval can be provided, and the process can be simplified.
[0021]
In the above embodiment, a dicer is used to form the groove, but in addition to this, it is also possible to form the etching mask with a resist or the like and then perform wet etching or dry etching. The present invention can be applied to any solar cell that can process the groove of the substrate and has an electrode on the light receiving surface, and is not limited to the solar cell described in the examples.
[0022]
【The invention's effect】
According to the solar cell of Claim 1 and Claim 2 , the utilization factor of the incident light of a mountain-shaped electrode increases, and it becomes possible to achieve high efficiency.
[0023]
According to the solar cell of claim 3 , it is possible to provide an ideal solar cell in which reflection loss due to the electrode does not occur.
[0024]
According to the method for manufacturing a solar cell of claim 4 , the chevron electrode can be miniaturized.
[0025]
According to the method for manufacturing a solar cell of claim 5 , the process can be simplified.
[0026]
That is, when forming a chevron electrode in a solar cell, by forming grooves in the electrode forming portion in advance, the effect of increasing the incident light photoelectric conversion contribution ratio of the chevron electrode can be further increased, and the conversion efficiency is improved. be able to. Further, by appropriately selecting the depth of the groove, it is possible to prevent the occurrence of reflection loss due to the electrodes even when light is incident obliquely. In addition, regarding the formation method, a resist film having an appropriate thickness is formed on a substrate, at least a portion including an electrode forming portion is opened, and a deposition mask is placed in close contact with the resist film surface to obtain a desired interval. Since the thickness of the resist film can be controlled on the order of μm, it can be formed between the electrode forming portion and the vapor deposition mask, so that a fine chevron electrode can be formed by appropriately selecting the resist film thickness. it can. In addition, by forming a groove of appropriate depth in the electrode formation part in advance and placing the mask in close contact with the substrate, the mask and electrode are automatically formed without the steps of resist film formation and patterning. A desired interval can be given to the part, and the process can be simplified.
[Brief description of the drawings]
FIG. 1 is a diagram showing a path of incident light in a conventional rectangular electrode.
FIG. 2 is a diagram showing a path of incident light in a conventional chevron electrode.
FIG. 3 is a diagram showing a path of light incident on a conventional angled electrode having an inclination angle of a ° at an incident angle of (180-2a) ° or less.
FIG. 4 is a diagram showing a path of incident light in a chevron electrode according to the first and second aspects of the invention.
FIG. 5 is a diagram showing a path of light incident at an incident angle (180-2a) ° on a mountain electrode having an inclination angle of a ° according to the invention of claim 3 ;
6A to 6F are device creation process diagrams according to Example 1. FIG.
7A to 7F are device creation process diagrams according to Example 2. FIG.
FIG. 8 is a diagram illustrating a path of light incident on the chevron electrode according to the first embodiment at an incident angle of n ° (n <40).
FIG. 9 is a diagram showing a path of light incident on a chevron electrode according to Example 2 at an incident angle of n ° (n <40).
FIG. 10 is a diagram showing a shadow produced by an electrode when light is incident on a conventional angled electrode having an inclination angle of a ° at an incident angle of (180-2a) ° or less.
FIG. 11 shows an effective incidence on a solar cell according to Example 2 when the amount of light that is effectively incident on a solar cell equipped with a conventional chevron electrode is 1 when light is incident at an incident angle of 40 ° or less. It is a figure showing the quantity of light.
[Explanation of symbols]
1 P-type Si substrate 2 Groove 3 N + layer 4 P + layer 5 Back electrode 6 Resist 7 Mountain-shaped electrode 8 Deposition mask 9 Rectangular electrode 10 Substrate 10 'Wall 11 Incident light 11' Reflected light 12 Negative

Claims (5)

受光面側に開口し基板内部に側壁がある溝と、前記溝内に前記溝の上部から底部にかけてその断面形状の幅が広がる領域を含む電極と、を含み、前記溝の側壁の少なくとも一部が前記電極と接触しておらず、前記溝の深さが、前記電極の高さよりも深いまたは前記電極の高さと同一であることを特徴とする、太陽電池。A groove having an opening on the light receiving surface side and having a side wall inside the substrate, and an electrode including a region in which the width of the cross-sectional shape widens from the top to the bottom of the groove, and at least a part of the side wall of the groove Is not in contact with the electrode, and the depth of the groove is deeper than the height of the electrode or the same as the height of the electrode . 受光面側に開口し基板内部に側壁がある溝と、前記溝内にその断面形状が前記受光面に対して傾斜を持つ山形電極とを有し、前記溝の側壁の少なくとも一部が前記山形電極と接触しておらず、前記溝の深さが、前記山形電極の高さよりも深いまたは前記山形電極の高さと同一であることを特徴とする、太陽電池。 A groove having an opening on the light-receiving surface side and having a side wall inside the substrate; and a chevron electrode whose cross-sectional shape is inclined with respect to the light-receiving surface in the groove; and at least a part of the side wall of the groove is the chevron A solar cell , wherein the solar cell is not in contact with an electrode, and the depth of the groove is greater than or equal to the height of the chevron electrode . 請求項2に記載の太陽電池において、前記溝は、その幅をw、山形電極の傾斜角をa°として、溝の深さが、山形電極の高さよりも、0.5w×tan(90−a)°以上深く形成されることを特徴とする太陽電池。 3. The solar cell according to claim 2, wherein the groove has a width of w, an inclination angle of the mountain electrode is a °, and a depth of the groove is 0.5 w × tan (90− a) A solar cell characterized in that it is formed deeply by more than 0 ° . 受光面側に、その断面形状が前記受光面に対して傾斜を持つ山形となる電極を有した太陽電池の製造方法において、前記山形電極を形成する際に、所望の電極幅よりも狭いスリットを備えた蒸着マスクを電極形成面とある間隔をもって保持した状態で蒸着する方法であって、所望の電極の形状を得るために必要な電極形成面と蒸着マスクとの距離を保持する際に、基板表面にレジスト膜を、電極形成面からレジスト膜表面までの高さが、所望の電極の形状を得るために必要な電極形成面と蒸着マスクとの距離と同じになるように形成し、少なくとも電極形成部を含む部分が開口するようにパターニングし、レジスト表面に蒸着マスクを密着させてなることを特徴とする太陽電池の製造方法。In a method for manufacturing a solar cell having a chevron-shaped electrode whose cross-sectional shape is inclined with respect to the light-receiving surface on the light-receiving surface side, a slit narrower than a desired electrode width is formed when the chevron electrode is formed. It is a method of vapor deposition in a state where the provided vapor deposition mask is held at a certain distance from the electrode formation surface, and when maintaining the distance between the electrode formation surface and the vapor deposition mask necessary for obtaining a desired electrode shape, A resist film is formed on the surface so that the height from the electrode formation surface to the resist film surface is the same as the distance between the electrode formation surface and the vapor deposition mask necessary to obtain a desired electrode shape, and at least the electrode A method for manufacturing a solar cell, wherein patterning is performed so that a portion including a forming portion is opened, and a deposition mask is adhered to the resist surface. 受光面側に、その断面形状が前記受光面に対して傾斜を持つ山形となる電極を有した太陽電池の製造方法であって、前記山形電極を形成する際に、所望の電極幅よりも狭いスリットを備えた蒸着マスクを電極形成面とある間隔をもって保持した状態で蒸着する方法であって、所望の電極の形状を得るために必要な電極形成面と蒸着マスクとの距離を保持する際に、基板表面の電極形成部に溝を、その深さが所望の電極の形状を得るために必要な電極形成面と蒸着マスクとの距離と同じになるように形成し、基板表面に蒸着マスクを密着させてなることを特徴とする太陽電池の製造方法。A method of manufacturing a solar cell having a cross-sectional electrode on the light-receiving surface side, which has a mountain shape inclined with respect to the light-receiving surface, and is narrower than a desired electrode width when forming the mountain-shaped electrode This is a method of vapor deposition in a state where a vapor deposition mask provided with a slit is held at a certain distance from the electrode formation surface, and when the distance between the electrode formation surface and the vapor deposition mask necessary for obtaining a desired electrode shape is maintained. A groove is formed in the electrode formation portion on the substrate surface so that the depth thereof is the same as the distance between the electrode formation surface and the vapor deposition mask necessary for obtaining a desired electrode shape, and the vapor deposition mask is formed on the substrate surface. A method for producing a solar cell, characterized by being adhered.
JP29706494A 1994-11-30 1994-11-30 Solar cell and manufacturing method thereof Expired - Fee Related JP3698746B2 (en)

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JP4765281B2 (en) * 2004-08-23 2011-09-07 ソニー株式会社 Photoelectric conversion element and manufacturing method thereof
CN112466968B (en) * 2020-11-18 2025-02-11 隆基绿能科技股份有限公司 Photovoltaic cell and photovoltaic module

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