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JP3752290B2 - High frequency package - Google Patents
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JP3752290B2 - High frequency package - Google Patents

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Publication number
JP3752290B2
JP3752290B2 JP34104695A JP34104695A JP3752290B2 JP 3752290 B2 JP3752290 B2 JP 3752290B2 JP 34104695 A JP34104695 A JP 34104695A JP 34104695 A JP34104695 A JP 34104695A JP 3752290 B2 JP3752290 B2 JP 3752290B2
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Japan
Prior art keywords
wiring pattern
frequency
pad
terminal
control
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JP34104695A
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Japanese (ja)
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JPH09181454A (en
Inventor
良行 生熊
知英 副島
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Toshiba Corp
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Toshiba Corp
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Priority to JP34104695A priority Critical patent/JP3752290B2/en
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Description

【0001】
【発明の属する技術分野】
本発明は、マイクロ波半導体などの高周波部品を装架する高周波パッケ−ジに関する。
【0002】
【従来の技術】
従来の高周波パッケ−ジについて図5を参照して説明する。51は、複数の基板51a〜51dを積層した構造のセラミック製多層基板で、多層基板51はその一部を切り欠いて示されている。多層基板51の表面には、その内側を気密封止するシールリング(図示せず)が設けられ、シールリングの内側に高周波部品などが配置される。また、セラミック多層基板51の例えば層間の1つの面に地導体52が形成される。
【0003】
符号53a、53bは、高周波部品に対しバイアスや制御信号を供給するパッドで、シールリングの内側に設けられている。また、54a、54bは端子で、シールリングの外側に設けられている。そして、パッド53a、53bと端子54a、54b間は配線パタ−ン55a、55bで接続されている。
【0004】
この図の場合、各配線パタ−ン55a、55bは交差する構造になっている。その交差部分は、一方の配線パタ−ン55aを、他方の配線パタ−ン55bが形成された面とは異なる層間の面に形成し、パッド53aと配線パタ−ン55aとの間、そして、端子54aと配線パタ−ン55aとの間はそれぞれ層間を貫通する導電体、例えばビアホ−ル56で接続し、配線パタ−ン55a、55b同士が接触しないようにしている。
【0005】
ところで、バイアスや制御信号を供給する配線パタ−ンは、多層基板の裏面や層間に形成された地導体との間で高周波伝送線路を構成する。また、これら配線パタ−ンは、通常、バイアス電源や制御回路などの外部回路に接続される。このような場合、外部回路は、高周波パッケ−ジで使用される周波数に対して、全反射特性を示すことが多い。したがって、バイアスまたは制御信号を供給する配線パタ−ンと外部回路との間で共振回路が構成される。
【0006】
このとき、高周波パッケ−ジが例えば増幅器を構成し、そして、高周波パッケ−ジの内部などで高周波信号を伝送する配線パタ−ンと、バイアスまたは制御信号を供給する配線パタ−ンがカップリングすると、バイアスまたは制御信号用の配線パタ−ンと外部回路との間で構成される共振回路の共振周波数で、利得が低下するなど高周波伝達特性に影響が現れる。
【0007】
従来の高周波パッケ−ジは、このような影響を避けるために、高周波信号を供給する配線パタ−ンと、バイアスまたは制御信号を供給する配線パタ−ンとの間隔を大きく取ってカップリングが起きないようにし、また、バイアスまたは制御信号を供給する配線パタ−ンなどが構成する共振回路の共振周波数が、高周波パッケ−ジで使用される周波数から外れるように外部回路の特性を調整している。
【0008】
【発明が解決しようとする課題】
近年、マイクロ波半導体など高周波部品の集積度が向上している。このため、高周波信号を供給する配線パタ−ンや、バイアスまたは制御信号を供給する配線パタ−ンが1つの高周波パッケ−ジ内に数多く形成されるようになっている。したがって、配線パタ−ン間の間隔を大きく取ることが難しくなり、配線パタ−ン間のカップリングが避けられなくなっている。また、配線パタ−ンが増加することによって外部回路の数も多くなっている。このため、配線パタ−ンや外部回路が構成する共振回路の共振周波数が高周波パッケ−ジで使用される周波数から外れるように、外部回路の特性を1つ1つ調整することは、調整作業が繁雑で実用的でない。
【0009】
本発明は、上記した欠点を解決するもので、高周波伝達特性に影響の少ない高周波パッケ−ジを提供することを目的とする。
【0010】
【課題を解決するための手段】
この発明は、複数の基板を積層して構成され、高周波部品が配置される多層基板と、前記高周波部品に入力され、あるいは前記高周波部品から出力される高周波信号を伝送する伝送用配線パターンと、前記高周波部品を気密封止し、その内側にパッドが位置し、その外側に端子が位置するシールリングと、前記パッドと前記端子を接続し、かつ前記パッドおよび前記端子を設けた面とは異なる層間の面に形成され、前記高周波部品にバイアスまたは制御信号を供給する制御用配線パターンとを具備した高周波パッケ−ジにおいて、前記制御用配線パターンの幅を一部で広くしたことを特徴とする。
【0011】
また、この発明は、複数の基板を積層して構成され、高周波部品が配置される多層基板と、前記高周波部品に入力され、あるいは前記高周波部品から出力される高周波信号を伝送する伝送用配線パターンと、前記高周波部品を気密封止し、その内側にパッドが位置し、その外側に端子が位置するシールリングと、前記パッドと前記端子を接続し、かつ前記パッドおよび前記端子を設けた面とは異なる層間の面に形成され、前記高周波部品にバイアスまたは制御信号を供給する制御用配線パターンと、前記伝送用配線パターンと共に伝送線路を構成する地導体とを具備した高周波パッケ−ジにおいて、前記パッドと前記制御用配線パターンとの間および前記端子と前記制御用配線パターンとの間をビアホールで接続し、多層基板を形成する基板面に前記ビアホールに接続されて制御用配線パターンの一部として機能する導体パターンを設けたことを特徴とする。
【0012】
また、ビアホールと導体パターンが交互に接続する構成となっている。
【0013】
また、制御用配線パタ−ンの少なくとも1つは、地導体を挟んで伝送用配線パタ−ンと反対側に位置している。
【0014】
上記した構成によれば、制御用配線パタ−ンが、伝送用配線パタ−ンを伝送する高周波信号の周波数を遮断周波数域とするロ−パスフィルタを構成する。したがって、制御用配線パタ−ンと伝送用配線パタ−ン間でカップリングがあっても、制御用配線パタ−ンや外部回路は、伝送用配線パタ−ンを伝送する高周波信号の周波数に対し共振特性を持たず、高周波伝達特性に影響が現れない。
【0015】
また、ロ−パスフィルタを、制御用配線パタ−ンと地導体との間で形成されるキャパシタンス成分と、多層基板の層部分を貫通する導電体で形成されるインダクタンス成分とで構成している。この場合、インダクタンス成分を構成する導電体は、多層基板の面に垂直に形成されており、大きなスペースを必要としない。また、導電体は形状が細いため大きなインダクタンス成分が容易に得られる。したがって、小形で良好な特性のロ−パスフィルタを構成できる。
【0016】
また、制御用配線パタ−ンの少なくとも1つが、地導体を挟んで伝送用配線パタ−ンと反対側に位置している。この場合、制御用配線パタ−ンと伝送用配線パタ−ンが地導体でシールドされ、制御用配線パタ−ンと伝送用配線パタ−ンのカップリングが小さくなる。この構造は、ロ−パスフィルタを構成するために制御用配線パタ−ンの一部の幅を大きくし、制御用配線パタ−ンと伝送用配線パタ−ンがカップリングしやすくなっている場合に有効である。
【0017】
【発明の実施の形態】
本発明の1つの実施形態について図1を参照して説明する。11はセラミック製多層基板で、多層基板11は、複数の基板11a〜11dを積層して構成されている。セラミック多層基板11の中央には凹部が設けられ、半導体素子など高周波部品の装架部12を構成している。また、装架部12を磁気シールドするために、装架部12の周囲にシールリング13が設けられている。
【0018】
シールリング13の内側には、高周波部品に対してバイアスやオン・オフなどの制御信号を供給するパッド14が装架部12の周辺に形成されている。また、シールリング13の外側には端子15が形成されている。なお、シールリング13内側のパッド14とシールリング13外側の端子15は、多層基板11の表面や多層基板11の層間に形成された制御用配線パタ−ン(図示せず)で接続される。
【0019】
また、多層基板11表面の装架部12周辺には、高周波部品に対し高周波信号を入力し、あるいは高周波部品から出力される高周波信号を伝送する伝送用配線パタ−ン16が形成され、また、多層基板11の周辺には伝送用配線パタ−ン16に接続される高周波端子17が形成されている。また、多層基板11の基板間などに地導体が形成されている。
【0020】
ここで、上記した構成の高周波パッケ−ジにおいて、バイアスや制御信号を供給する制御用配線パタ−ン部分を拡大した構造について図2を参照して説明する。図2は、多層基板11の一部を切り欠いて示した図で、シールリング13は省略されている。また、図1に対応する部分には同一の符号を付し、重複する説明は一部省略する。
【0021】
図の符号21は、パッド14と端子15を接続する制御用配線パタ−ンで、制御用配線パタ−ン21は、パッド14や端子15が形成された面とは異なる層間の面に形成されている。そして、制御用配線パタ−ン21はその幅が2か所21a、21bで広くなっている。また、パッド14と配線パタ−ン21間、あるいは端子15と配線パタ−ン21間は、多層基板11の層を貫通する透孔に導電体を設けたビアホ−ル22で接続されている。なお23は、基板11a、11b間に形成された地導体である。
【0022】
上記した構成の場合、制御用配線パタ−ン21の幅を一部で広くし、ロ−パスフィルタを構成している。なお、ロ−パスフィルタは、高周波パッケ−ジで使用される周波数、即ち、伝送用配線パタ−ンを伝送する信号の周波数が遮断周波数域となるように設定される。
【0023】
このとき、伝送用配線パタ−ン(図示せず)と制御用配線パタ−ン21がカップリングしても、制御用配線パタ−ン21部分に構成されるロ−パスフィルタによって高周波信号が遮断される。このため、高周波パッケ−ジで使用される周波数に対して共振特性を持たず、高周波伝達特性に影響は現れない。
【0024】
次に、この発明の他の実施態様について図3を参照して説明する。図3は、バイアスまたは制御信号を供給する制御用配線パタ−ン部分を抜き出し、多層基板の一部を切り欠いて示している。また、図1や図2に対応する部分には同一の符号を付し、重複する説明は一部省略する。
【0025】
図3では、11が多層基板で、多層基板11を構成する基板11aと基板11b間の面に地導体23が形成され、基板11bと基板11c間の面に制御用配線パタ−ン21が形成されている。そして、多層基板11を構成する各基板間の面に、制御用配線パタ−ンの一部を構成する円形導体パターン31a〜31c、および32a〜32cが形成されている。また、円形導体パターン31a〜31c、および32a〜32c間はそれぞれビアホ−ル22で接続されている。そして、多層基板11の表面に形成された円形導体パターン31cがパッド14に接続され、円形導体パターン32cが端子15に接続されている。また、円形導体パターン31aと円形導体パターン32a間を接続する制御用配線パタ−ン21は、パッド14や端子15が形成された面とは異なる基板11bと基板11c間の面に形成されている。
【0026】
上記した構造の場合、制御用配線パタ−ンの一部として機能する円形導体パターン31a〜31c、32a〜32cや制御用配線パタ−ン21はビアホ−ル22で接続されている。そして、これら各パターンは、通常、ある面積を持っており、これら各パターンは地導体23との間にキャパシタンス成分が形成される。また、ビアホ−ル22は多層基板11の各層を貫通する細い透孔部分に導電体が埋め込まれた形になっており、インダクタンス成分を形成する。
【0027】
したがって、円形導体パターン31a〜31c、32a〜32cや、パッド14と端子15間を接続する制御用配線パタ−ン、そしてビアホ−ル22は、キャパシタンス成分とインダクタンス成分が交互に従属接続された形になりロ−パスフィルタが構成される。なお、ビアホ−ル22の導電体は各層に垂直方向に形成されるため大きなスペ−スを必要とせず、また、細い形状であるため大きなインダクタンスを得ることができる。したがって、小形で良好な特性のロ−パスフィルタを構成できる。
【0028】
次に、この発明のもう1つの他の実施態様について図4を参照して説明する。図4の場合も、バイアスまたは制御信号を供給する制御用配線パタ−ン部分を抜き出し、多層基板の一部を切り欠いて示している。また、図1や図2、図3に対応する部分には同一の符号を付し、重複する説明は一部省略する。
【0029】
11は多層基板で、多層基板11の表面にはパッド14や端子15、そして、高周波信号を伝送する伝送用配線パタ−ン41が形成されている。また、多層基板11を構成する基板11cと基板11d間の面に地導体42が形成されている。また、パッド14と端子15を接続する制御用配線パタ−ン21はパッド14や端子15が形成された面とは異なる基板11bと基板11c間の面に形成され、伝送用配線パタ−ン41とは地導体42を挟んで反対側に位置している。
【0030】
なお、パッド14や端子15と制御用配線パタ−ン21との間はビアホ−ル22で接続されている。このとき、多層基板11の各層間の面にはビアホ−ル22に接続される円形導体パターン43、44が制御用配線パタ−ンの一部として形成される。また、地導体42が形成された面では、円形導体パターン43、44と地導体42が接触しないように両者間に隙間が形成される。
【0031】
上記した構成の場合も、円形導体パターン43、44など制御用導体パターンと地導体42との間にキャパシタンス成分が形成され、また、ビアホ−ル22によってインダクタンス成分が形成され、パッド14と端子15間に、キャパシタンス成分とインダクタンス成分とが交互に従属接続されたロ−パスフィルタが構成される。この場合も、小形で良好な特性のロ−パスフィルタを構成できる。また、地導体のシ−ルド効果によって、伝送用配線パタ−ンと制御用配線パタ−ンとのカップリングが小さくなり、高周波伝達特性への影響がより効果的に抑えられる。
【0032】
また、制御用配線パタ−ンがロ−パスフィルタを構成するために幅の広い部分を持つ場合、伝送用配線パタ−ンとの間でカップリングしやすい。したがって、制御用配線パタ−ンの一部の幅を広くした場合には、制御用配線パタ−ンを地導体を挟んで反対側に配置する構成は有効である。
【0033】
【発明の効果】
本発明によれば、高周波伝達特性に影響の小さい高周波パッケ−ジを実現できる。
【図面の簡単な説明】
【図1】本発明の実施態様を示す概略構造図である。
【図2】本発明の実施態様を説明する図で、一部を切り欠いて示した図である。
【図3】本発明の他の実施態様を説明する図で、一部を切り欠いて示した図である。
【図4】本発明の他の実施態様を説明する図で、一部を切り欠いて示した図である。
【図5】従来例を説明する図で、一部を切り欠いて示した図である。
【符号の説明】
11…セラミック多層基板
11a〜11d…基板
12…装架部
13…シ−ルリング
14…バイアスまたは制御信号パッド
15…バイアスまたは制御信号端子
16…伝送用配線パタ−ン
17…高周波端子
21…制御用配線パタ−ン
22…ビアホ−ル
23…地導体
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a high-frequency package for mounting a high-frequency component such as a microwave semiconductor.
[0002]
[Prior art]
A conventional high-frequency package will be described with reference to FIG. Reference numeral 51 denotes a ceramic multilayer substrate having a structure in which a plurality of substrates 51a to 51d are stacked, and the multilayer substrate 51 is shown with a part thereof cut away. A seal ring (not shown) that hermetically seals the inside of the multilayer substrate 51 is provided, and high-frequency components and the like are disposed inside the seal ring. Further, the ground conductor 52 is formed on one surface of the ceramic multilayer substrate 51, for example, between layers.
[0003]
Reference numerals 53a and 53b are pads for supplying a bias and a control signal to the high-frequency component, and are provided inside the seal ring. 54a and 54b are terminals provided outside the seal ring. The pads 53a and 53b and the terminals 54a and 54b are connected by wiring patterns 55a and 55b.
[0004]
In the case of this figure, each wiring pattern 55a, 55b has a crossing structure. At the intersection, one wiring pattern 55a is formed on a surface between layers different from the surface on which the other wiring pattern 55b is formed, between the pad 53a and the wiring pattern 55a, and The terminal 54a and the wiring pattern 55a are connected to each other by a conductor penetrating between the layers, for example, via holes 56 so that the wiring patterns 55a and 55b do not come into contact with each other.
[0005]
By the way, the wiring pattern for supplying the bias and the control signal constitutes a high-frequency transmission line between the back surface of the multilayer substrate and the ground conductor formed between the layers. These wiring patterns are usually connected to an external circuit such as a bias power source or a control circuit. In such a case, the external circuit often exhibits total reflection characteristics with respect to the frequency used in the high-frequency package. Therefore, a resonance circuit is configured between the wiring pattern for supplying the bias or control signal and the external circuit.
[0006]
At this time, the high frequency package constitutes an amplifier, for example, and the wiring pattern for transmitting a high frequency signal inside the high frequency package and the wiring pattern for supplying a bias or control signal are coupled. The resonance frequency of the resonance circuit formed between the bias pattern or the control signal wiring pattern and the external circuit affects the high-frequency transfer characteristics such as a decrease in gain.
[0007]
In the conventional high-frequency package, in order to avoid such an influence, the coupling occurs due to a large interval between the wiring pattern that supplies the high-frequency signal and the wiring pattern that supplies the bias or control signal. In addition, the characteristic of the external circuit is adjusted so that the resonance frequency of the resonance circuit constituted by the wiring pattern or the like for supplying the bias or the control signal deviates from the frequency used in the high frequency package. .
[0008]
[Problems to be solved by the invention]
In recent years, the degree of integration of high-frequency components such as microwave semiconductors has improved. For this reason, a number of wiring patterns for supplying high-frequency signals and wiring patterns for supplying bias or control signals are formed in one high-frequency package. Therefore, it is difficult to increase the interval between the wiring patterns, and coupling between the wiring patterns is unavoidable. In addition, the number of external circuits increases as the wiring pattern increases. For this reason, adjusting the characteristics of the external circuit one by one so that the resonant frequency of the resonant circuit formed by the wiring pattern or the external circuit deviates from the frequency used in the high frequency package is an adjustment work. Complex and impractical.
[0009]
The present invention solves the above-described drawbacks, and an object thereof is to provide a high-frequency package with little influence on high-frequency transmission characteristics.
[0010]
[Means for Solving the Problems]
The present invention is configured by laminating a plurality of substrates, a multilayer substrate on which a high-frequency component is disposed , a transmission wiring pattern that transmits a high-frequency signal that is input to or output from the high-frequency component, The high-frequency component is hermetically sealed, and a seal ring in which a pad is located inside and a terminal is located outside thereof is different from a surface where the pad and the terminal are connected and the pad and the terminal are provided. A high-frequency package formed on a surface between layers and provided with a control wiring pattern for supplying a bias or a control signal to the high-frequency component, wherein the width of the control wiring pattern is partially increased. .
[0011]
The present invention also includes a multilayer substrate in which a plurality of substrates are stacked and a high-frequency component is disposed, and a transmission wiring pattern that transmits a high-frequency signal that is input to or output from the high-frequency component. And a sealing ring in which the high-frequency component is hermetically sealed, a pad is positioned inside and a terminal is positioned outside the surface, a surface connecting the pad and the terminal, and a surface provided with the pad and the terminal; is formed on the surface of the different layers, wherein the control wiring pattern for supplying the bias or control signals to the high-frequency components, high-frequency and and a ground conductor that constitutes the transmission line together with the transmission wiring pattern package - in di, the A substrate on which a multilayer substrate is formed by connecting via via holes between a pad and the control wiring pattern and between the terminal and the control wiring pattern Characterized in that the provided conductor pattern functions as a part of the connected control wiring pattern on the via hole.
[0012]
In addition, via holes and conductor patterns are alternately connected .
[0013]
At least one of the control wiring patterns is located on the opposite side of the transmission wiring pattern with the ground conductor interposed therebetween.
[0014]
According to the configuration described above, the control wiring pattern constitutes a low-pass filter that uses the frequency of the high-frequency signal transmitted through the transmission wiring pattern as a cutoff frequency region. Therefore, even if there is a coupling between the control wiring pattern and the transmission wiring pattern, the control wiring pattern and the external circuit are not connected to the frequency of the high-frequency signal transmitted through the transmission wiring pattern. Does not have resonance characteristics and does not affect high-frequency transfer characteristics.
[0015]
Further, the low-pass filter is composed of a capacitance component formed between the control wiring pattern and the ground conductor and an inductance component formed of a conductor penetrating the layer portion of the multilayer substrate. . In this case, the conductor constituting the inductance component is formed perpendicular to the surface of the multilayer substrate and does not require a large space. In addition, since the conductor is thin, a large inductance component can be easily obtained. Therefore, a small low-pass filter having good characteristics can be configured.
[0016]
At least one of the control wiring patterns is located on the opposite side of the transmission wiring pattern with the ground conductor interposed therebetween. In this case, the control wiring pattern and the transmission wiring pattern are shielded by the ground conductor, and the coupling between the control wiring pattern and the transmission wiring pattern is reduced. This structure increases the width of a part of the control wiring pattern to form a low-pass filter, so that the control wiring pattern and the transmission wiring pattern can be easily coupled. It is effective for.
[0017]
DETAILED DESCRIPTION OF THE INVENTION
One embodiment of the present invention will be described with reference to FIG. Reference numeral 11 denotes a ceramic multilayer substrate, and the multilayer substrate 11 is formed by laminating a plurality of substrates 11a to 11d. A concave portion is provided in the center of the ceramic multilayer substrate 11 and constitutes a mounting portion 12 for high-frequency components such as semiconductor elements. In addition, a seal ring 13 is provided around the mount portion 12 in order to magnetically shield the mount portion 12.
[0018]
Inside the seal ring 13, a pad 14 for supplying a control signal such as bias and on / off to the high-frequency component is formed around the mounting portion 12. A terminal 15 is formed outside the seal ring 13. The pad 14 inside the seal ring 13 and the terminal 15 outside the seal ring 13 are connected by a control wiring pattern (not shown) formed between the surface of the multilayer substrate 11 and the layers of the multilayer substrate 11.
[0019]
In addition, a transmission wiring pattern 16 for inputting a high-frequency signal to the high-frequency component or transmitting a high-frequency signal output from the high-frequency component is formed around the mounting portion 12 on the surface of the multilayer substrate 11. A high-frequency terminal 17 connected to the transmission wiring pattern 16 is formed around the multilayer substrate 11. A ground conductor is formed between the substrates of the multilayer substrate 11.
[0020]
Here, in the high-frequency package having the above-described configuration, a structure in which a control wiring pattern portion for supplying a bias and a control signal is enlarged will be described with reference to FIG. FIG. 2 is a view in which a part of the multilayer substrate 11 is cut away, and the seal ring 13 is omitted. Moreover, the same code | symbol is attached | subjected to the part corresponding to FIG. 1, and the overlapping description is partially abbreviate | omitted.
[0021]
Reference numeral 21 in the figure denotes a control wiring pattern for connecting the pad 14 and the terminal 15. The control wiring pattern 21 is formed on a surface between layers different from the surface on which the pad 14 and the terminal 15 are formed. ing. The control wiring pattern 21 is wide at two locations 21a and 21b. Further, the pad 14 and the wiring pattern 21 or the terminal 15 and the wiring pattern 21 are connected by a via hole 22 provided with a conductor in a through hole penetrating the layer of the multilayer substrate 11. Reference numeral 23 denotes a ground conductor formed between the substrates 11a and 11b.
[0022]
In the case of the above configuration, the width of the control wiring pattern 21 is partially increased to constitute a low-pass filter. The low-pass filter is set so that the frequency used in the high-frequency package, that is, the frequency of the signal transmitted through the transmission wiring pattern falls within the cutoff frequency region.
[0023]
At this time, even if the transmission wiring pattern (not shown) and the control wiring pattern 21 are coupled, the high-frequency signal is blocked by the low-pass filter formed in the control wiring pattern 21 portion. Is done. For this reason, there is no resonance characteristic with respect to the frequency used in the high frequency package, and the high frequency transfer characteristic is not affected.
[0024]
Next, another embodiment of the present invention will be described with reference to FIG. FIG. 3 shows a control wiring pattern portion for supplying a bias or a control signal, and a part of the multilayer substrate is cut away. Moreover, the same code | symbol is attached | subjected to the part corresponding to FIG.1 and FIG.2, and the overlapping description is abbreviate | omitted in part.
[0025]
In FIG. 3, 11 is a multilayer substrate, a ground conductor 23 is formed on the surface between the substrate 11a and the substrate 11b constituting the multilayer substrate 11, and a control wiring pattern 21 is formed on the surface between the substrate 11b and the substrate 11c. Has been. Then, circular conductor patterns 31a to 31c and 32a to 32c constituting a part of the control wiring pattern are formed on the surfaces between the substrates constituting the multilayer substrate 11. The circular conductor patterns 31a to 31c and 32a to 32c are connected to each other by via holes 22. The circular conductor pattern 31 c formed on the surface of the multilayer substrate 11 is connected to the pad 14, and the circular conductor pattern 32 c is connected to the terminal 15. Further, the control wiring pattern 21 for connecting the circular conductor pattern 31a and the circular conductor pattern 32a is formed on a surface between the substrate 11b and the substrate 11c different from the surface on which the pads 14 and the terminals 15 are formed. .
[0026]
In the case of the structure described above, the circular conductor patterns 31 a to 31 c and 32 a to 32 c that function as part of the control wiring pattern and the control wiring pattern 21 are connected by the via hole 22. Each of these patterns usually has a certain area, and a capacitance component is formed between these patterns and the ground conductor 23. In addition, the via hole 22 has a shape in which a conductor is embedded in a thin through-hole portion that penetrates each layer of the multilayer substrate 11, and forms an inductance component.
[0027]
Therefore, the circular conductor patterns 31a to 31c, 32a to 32c, the control wiring pattern for connecting the pad 14 and the terminal 15, and the via hole 22 have a configuration in which the capacitance component and the inductance component are alternately connected in cascade. A low-pass filter is formed. Note that the conductor of the via hole 22 is formed in each layer in a vertical direction, so that a large space is not required, and since it has a thin shape, a large inductance can be obtained. Therefore, a small low-pass filter having good characteristics can be configured.
[0028]
Next, another embodiment of the present invention will be described with reference to FIG. Also in the case of FIG. 4, a control wiring pattern portion for supplying a bias or a control signal is extracted and a part of the multilayer substrate is cut out. Also, parts corresponding to those in FIG. 1, FIG. 2, and FIG.
[0029]
Reference numeral 11 denotes a multi-layer substrate. On the surface of the multi-layer substrate 11, pads 14 and terminals 15 and a transmission wiring pattern 41 for transmitting a high-frequency signal are formed. A ground conductor 42 is formed on the surface between the substrate 11c and the substrate 11d constituting the multilayer substrate 11. A control wiring pattern 21 for connecting the pad 14 and the terminal 15 is formed on a surface between the substrate 11b and the substrate 11c different from the surface on which the pad 14 and the terminal 15 are formed, and a transmission wiring pattern 41 is formed. Is located on the opposite side of the ground conductor 42.
[0030]
The pads 14 and the terminals 15 and the control wiring pattern 21 are connected by via holes 22. At this time, circular conductor patterns 43 and 44 connected to the via hole 22 are formed as a part of the control wiring pattern on the surface between the layers of the multilayer substrate 11. In addition, on the surface on which the ground conductor 42 is formed, a gap is formed between the circular conductor patterns 43 and 44 and the ground conductor 42 so as not to contact each other.
[0031]
Also in the case of the above configuration, a capacitance component is formed between the control conductor pattern such as the circular conductor patterns 43 and 44 and the ground conductor 42, and an inductance component is formed by the via hole 22, and the pad 14 and the terminal 15 are formed. A low-pass filter in which a capacitance component and an inductance component are alternately connected in cascade is formed therebetween. Also in this case, a small low-pass filter having good characteristics can be configured. In addition, due to the shield effect of the ground conductor, the coupling between the transmission wiring pattern and the control wiring pattern is reduced, and the influence on the high-frequency transmission characteristics is more effectively suppressed.
[0032]
Further, when the control wiring pattern has a wide portion to form a low-pass filter, coupling with the transmission wiring pattern is easy. Therefore, when the width of a part of the control wiring pattern is widened, it is effective to arrange the control wiring pattern on the opposite side with the ground conductor in between.
[0033]
【The invention's effect】
According to the present invention, it is possible to realize a high-frequency package having a small influence on high-frequency transmission characteristics.
[Brief description of the drawings]
FIG. 1 is a schematic structural diagram showing an embodiment of the present invention.
FIG. 2 is a diagram illustrating an embodiment of the present invention, and is a diagram partially cut away.
FIG. 3 is a view for explaining another embodiment of the present invention and is a view partially cut away.
FIG. 4 is a diagram for explaining another embodiment of the present invention and is a diagram partially cut away.
FIG. 5 is a diagram for explaining a conventional example, with a part cut away;
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 11 ... Ceramic multilayer substrate 11a-11d ... Board | substrate 12 ... Mounting part 13 ... Seal ring 14 ... Bias or control signal pad 15 ... Bias or control signal terminal 16 ... Transmission wiring pattern 17 ... High frequency terminal 21 ... For control Wiring pattern 22 ... via hole 23 ... ground conductor

Claims (4)

複数の基板を積層して構成され、高周波部品が配置される多層基板と、前記高周波部品に入力され、あるいは前記高周波部品から出力される高周波信号を伝送する伝送用配線パターンと、前記高周波部品を気密封止し、その内側にパッドが位置し、その外側に端子が位置するシールリングと、前記パッドと前記端子を接続し、かつ前記パッドおよび前記端子を設けた面とは異なる層間の面に形成され、前記高周波部品にバイアスまたは制御信号を供給する制御用配線パターンとを具備した高周波パッケ−ジにおいて、前記制御用配線パターンの幅を一部で広くしたことを特徴とする高周波パッケ−ジ。 A multilayer substrate that is configured by laminating a plurality of substrates and on which a high-frequency component is disposed , a transmission wiring pattern that transmits a high-frequency signal that is input to or output from the high- frequency component, and the high-frequency component Sealed in an airtight manner, with a pad located inside and a terminal located outside, a seal ring that connects the pad and the terminal, and a surface between layers different from the surface on which the pad and the terminal are provided is formed, the high-frequency component frequency equipped with a control wiring pattern for supplying the bias or control signals to the package - in di-, high frequency, characterized in that the wide part of the width of the control wiring pattern package - di . 複数の基板を積層して構成され、高周波部品が配置される多層基板と、前記高周波部品に入力され、あるいは前記高周波部品から出力される高周波信号を伝送する伝送用配線パターンと、前記高周波部品を気密封止し、その内側にパッドが位置し、その外側に端子が位置するシールリングと、前記パッドと前記端子を接続し、かつ前記パッドおよび前記端子を設けた面とは異なる層間の面に形成され、前記高周波部品にバイアスまたは制御信号を供給する制御用配線パターンと、前記伝送用配線パターンと共に伝送線路を構成する地導体とを具備した高周波パッケ−ジにおいて、前記パッドと前記制御用配線パターンとの間および前記端子と前記制御用配線パターンとの間をビアホールで接続し、多層基板を形成する基板面に前記ビアホールに接続されて制御用配線パターンの一部として機能する導体パターンを設けたことを特徴とする高周波パッケ−ジ。A multilayer substrate that is configured by laminating a plurality of substrates and on which a high-frequency component is disposed, a transmission wiring pattern that transmits a high-frequency signal that is input to or output from the high- frequency component, and the high-frequency component Sealed in an airtight manner, with a pad located inside and a terminal located outside, a seal ring that connects the pad and the terminal, and a surface between layers different from the surface on which the pad and the terminal are provided A high-frequency package comprising a control wiring pattern that is formed and supplies a bias or a control signal to the high-frequency component, and a ground conductor that forms a transmission line together with the transmission wiring pattern, wherein the pad and the control wiring Via holes connect between the terminals and between the terminals and the control wiring pattern, and the via holes are formed on the substrate surface on which a multilayer substrate is formed. RF package characterized in that a conductive pattern that functions as part of the control wiring pattern connected to - di. ビアホールと導体パターンが交互に接続することを特徴とする請求項2記載の高周波パッケ−ジ。3. The high frequency package according to claim 2, wherein the via hole and the conductor pattern are alternately connected . 制御用配線パターンの少なくとも1つは、地導体を挟んで伝送用配線パターンと反対側に位置することを特徴とする請求項2または請求項3記載の高周波パッケ−ジ。  4. The high-frequency package according to claim 2, wherein at least one of the control wiring patterns is located on the opposite side of the transmission wiring pattern with the ground conductor interposed therebetween.
JP34104695A 1995-12-27 1995-12-27 High frequency package Expired - Fee Related JP3752290B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP34104695A JP3752290B2 (en) 1995-12-27 1995-12-27 High frequency package

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP34104695A JP3752290B2 (en) 1995-12-27 1995-12-27 High frequency package

Publications (2)

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JPH09181454A JPH09181454A (en) 1997-07-11
JP3752290B2 true JP3752290B2 (en) 2006-03-08

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JP34104695A Expired - Fee Related JP3752290B2 (en) 1995-12-27 1995-12-27 High frequency package

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Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0547807A3 (en) * 1991-12-16 1993-09-22 General Electric Company Packaged electronic system
JPH06291520A (en) * 1992-04-03 1994-10-18 Matsushita Electric Ind Co Ltd High frequency multilayer integrated circuit
JPH07130900A (en) * 1993-11-01 1995-05-19 Toshiba Corp Semiconductor device

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