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JP3811345B2 - Optical integrated circuit board - Google Patents
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JP3811345B2 - Optical integrated circuit board - Google Patents

Optical integrated circuit board Download PDF

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Publication number
JP3811345B2
JP3811345B2 JP2000331540A JP2000331540A JP3811345B2 JP 3811345 B2 JP3811345 B2 JP 3811345B2 JP 2000331540 A JP2000331540 A JP 2000331540A JP 2000331540 A JP2000331540 A JP 2000331540A JP 3811345 B2 JP3811345 B2 JP 3811345B2
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Prior art keywords
thin film
substrate
film type
optical element
optical waveguide
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JP2000331540A
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JP2002139639A (en
Inventor
勝弘 金子
成夫 棚橋
徳一 山地
真一 阿部
由里子 上野
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Kyocera Corp
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Kyocera Corp
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Priority to US10/020,357 priority patent/US6694069B2/en
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  • Optical Integrated Circuits (AREA)
  • Semiconductor Lasers (AREA)
  • Light Receiving Elements (AREA)

Description

【0001】
【発明の属する技術分野】
本発明は、光導波路と薄膜型光素子とを同一基板に集積する光集積回路基板に関し、例えばWDM(Wavelength Division Multiplex:波長分割多重伝送方式)用光モジュール基板のように同一基板上に複数の薄膜型光素子およびその他のデバイスを搭載するような場合に好適に利用され、光導波路と薄膜型光素子とを同一基板に集積して基板サイズの小型化と生産性の向上ならびに光送受信効率の増加を実現できる光集積回路基板に関する。
【0002】
【従来の技術】
近年、光伝送モジュールの性能ならびに生産性の向上を図るための光素子の研究開発や、高密度・高精度・高光接続効率な光素子実装技術の研究開発が進められている。
【0003】
例えば、“Thin-Film Multimaterial Optoelectronic Integrated Circuits”, IEEE Transactions on Components, Packaging and Manufacturing Technology, part B, Vol. 19, No.1, February 1996.においては、半導体基板上にエピタキシャル成長させて受光素子を形成した後にエピタキシャル層のみを分離して薄膜型受光素子を作製し、別の実装基板に実装する技術について述べられている。この技術によれば、異種材料で作製された薄膜型光素子を高密度・高精度に実装基板上に実装することが可能となる。
【0004】
また、光素子実装技術の例として、特開平7−128531号公報に提案された光集積回路基板の例を図2に断面図で示す。図2において、21は基板、24は光導波路の下部クラッド層、25は光導波路のコア層、26は光導波路の上部クラッド層、27は基板21の上面で下部クラッド層24の下に設置された薄膜型光素子である面型受光素子である。このような構成によれば、コア部25を中心に伝搬する光は、下部クラッド層24部分にも広がっているため、面型受光素子27と結合することができるというものである。
【0005】
【発明が解決しようとする課題】
これに対し、基板上に形成した光導波路と、その光導波路中に埋設された薄膜型光素子とで光結合をしようとする場合には、以下のような問題が生じることとなる。
【0006】
薄膜型光素子は、エピタキシャル層のみで構成されるため数μm以下の薄さである。また、一般的なシングルモード光導波路は、クラッド部とコア部との比屈折率差は0.2〜1.5%、コア部の厚さが4〜8μm程度であるが、基板と伝搬光との相互作用を十分小さくするためには下部クラッド部の厚さをコア部の1.5倍程度以上にする必要があり、下部クラッド部として少なくとも6〜12μmの厚さを有することが望まれる。一方、光導波路とその下方に配置される薄膜型光素子との光結合効率を高くするためには、光導波路の下部クラッド部をできるだけ薄くしてコア部と薄膜型光素子との距離を近づける必要がある。
【0007】
従来は、薄膜型光素子が基板表面上に形成あるいは設置された後に光導波路が被覆形成されていた。従って、薄膜型光素子を基板上に設置した後、その上部に光導波路を形成して光結合を得ようとするには、図2に示されるように、光導波路層に湾曲部あるいは屈曲部を形成して、薄膜型光素子の上方の領域では下部クラッド部を薄くし、薄膜型光素子がない領域では下部クラッド部を厚くする必要がある。こうした場合、湾曲部の曲率を大きくすると薄膜型光素子の近傍で基板と伝搬光との相互作用が生じる領域が広くなり光伝搬損失が大きくなるという問題がある。また、湾曲部の曲率を小さくすると薄膜型光素子近傍の基板との相互作用領域を狭くすることができるが、湾曲部で伝搬光が放射して光伝搬損失が大きくなったり、クロストークの原因となる迷光が発生するという問題がある。
【0008】
また、特開平7−128531号公報には、実施例3において、下地の半導体層で高さを確保して、薄膜型光素子に相当する活性層または光吸収層を基板から十分離れた距離に位置させておき、これに光導波路を被覆形成する構造が示されている。しかしながら、この場合においては、光素子の近傍で光導波路のコア部が大きく屈曲するため、屈曲部での放射損失や光素子部での散乱損失が生じるという問題点がある。また、光導波路を被覆形成する際に、光素子による段差のために光導波路のコア部の加工精度が悪くなったり、光素子近傍の被覆部や屈曲部の形状を所望の形状に制御することが困難であるため設計通りの性能を得ることができないといった問題点もある。
【0009】
本発明は上記問題点に鑑みてなされたものであり、その目的は、基板上に配置された薄膜型光素子とそれに被覆形成された光導波路との間で良好な光結合が得られるとともに低損失な光伝送が可能な光集積回路基板を提供することにある。
【0010】
【課題を解決するための手段】
本発明の光集積回路基板は、基板と、前記基板上に設けられた配線導体と、前記基板上に形成され、少なくとも下部クラッド部およびコア部を有する光導波路と、前記下部クラッド部中に形成された光素子設置用の金属設置部と、前記下部クラッド部中に設けられ、前記配線導体と前記金属設置部とを電気的に接続する貫通導体と、受光面または発光部を有し、前記下部クラッド部中かつ前記金属設置部上に設置されるとともに前記光導波路に埋設された薄膜型光素子であって、前記受光面を前記コア部に近接させるかまたは前記発光部を前記コア部中に位置するように配設された薄膜型光素子と、を有するものである。
【0011】
本発明の光集積回路基板によれば、基板上に少なくとも下部クラッド部およびコア部を有する光導波路が形成されており、この光導波路中に、基板上に設けた配線導体と電気的に接続された光素子設置用の金属設置部が下部クラッド部中に形成され、この金属設置部の上に薄膜型光素子が下部クラッド部中で受光面をコア部に近接させるかまたは発光部をコア部中に位置させるように設置されて、これらが光導波路中に埋設されているので、薄膜型光素子と光導波路のコア部との距離を近くしつつ、あるいは薄膜型光素子をコア部内に位置させて光素子とコア部との間で効率良く光信号の授受を行なうことができるとともに、薄膜型光素子がない領域では光導波路のコア部と基板との距離を十分に長く確保することができるため、光導波路中に埋設された薄膜型光素子と光導波路との間で良好な光結合を得ることができるとともに、光導波路の伝搬光と基板との相互作用がなく低損失な光伝送を行なうことができる。
【0012】
また、薄膜型光素子が、下部クラッド部中に形成され基板上に設けた配線導体と電気的に接続された金属設置部に、下部クラッド部中で受光面をコア部に近接させるかまたは発光部をコア部中に位置させるように設置されて光導波路中に埋設されていることから、薄膜型光素子からの信号の出力や入力、電力の供給や発熱の伝導・放散をこの金属設置部により薄膜型光素子に対して直接に効率良く行なうことができるため、高周波信号の入出力や高出力の光信号の入出力等を安定して行なうことができ、高周波特性に優れ、動作の安定性にも優れた高性能・高信頼性の光信号処理を行なうことができる。
【0013】
さらに、光導波路に埋設させる金属設置部および薄膜型光素子は、いずれも光導波路の作製プロセスと同様の薄膜形成プロセスにより形成することができるので、高い加工精度で形成でき、高密度配置が可能であり、生産性にも優れるという利点も有するものである。
【0014】
【発明の実施の形態】
以下、本発明の光集積回路基板について図面を参照しつつ説明する。
【0015】
図1は、本発明の光集積回路基板の実施の形態の一例を示す断面図である。図1において、1は基板、2は基板1上に形成された光導波路の下部クラッド部、3は光導波路のコア部、4は光導波路の上部クラッド部である。5は薄膜型光素子、6は薄膜型光素子設置用の金属設置部、7は貫通導体、8は基板1に形成されている配線導体であり、配線導体8から貫通導体7および金属設置部6を介して薄膜型光素子5への電気信号の入出力が行なわれる。
【0016】
そして、本発明の光集積回路基板においては、金属設置部6は光導波路中、この例では下部クラッド部2中に形成され、薄膜型光素子5はこの金属設置部6に設置されて光導波路中、この例では同じく下部クラッド部2中に配置されて、いずれも光導波路中に埋設されていることを特徴とする。なお、薄膜型光素子5としては受光素子と発光素子とがあるが、受光素子の場合は、コア部3中を伝搬する光信号を散乱させたり減衰させたりしないように、この例のように下部クラッド部2中にコア部3に近接させて埋設することが好ましく、発光素子の場合は、コア部3に光信号を効率良く出力できるように、コア部3中に位置するように埋設することが好ましい。
【0017】
本発明の光集積回路基板において、基板1は、電気回路および光導波路を始めとする光電気回路が形成され、また光導波路中に埋設される薄膜型光素子5に対する支持基板として機能するものであり、光集積回路基板や光電子混在基板等の光信号を扱う基板として使用される種々の基板、例えばシリコン基板やアルミナ基板・ガラスセラミック基板・多層セラミック基板・プラスチック電気配線基板等が使用できる。
【0018】
基板1に形成され、内部に薄膜型光素子5が埋設される光導波路は、少なくとも下部クラッド部2とコア部3とを有しており、好ましくはこれらの上部に上部クラッド部4を有する3次元導波路形状の光導波路である。
【0019】
この光導波路の材料としては、基板1上に形成された配線導体8や貫通導体7・金属設置部6・金属設置部6上に設置された薄膜型光素子5上に光導波路を積層形成した際にダメージを与えないように、低温で形成可能であり、さらにこれら配線導体8・貫通導体7・金属設置部6・薄膜型光素子5による表面の凹凸を緩和することができる平坦化性に優れ、さらに低損失で光を伝搬させることができる透明性に優れた材料を用いる。また、特に下部クラッド部2は光集積回路基板における電気配線の誘電体層としても機能するものなので、特に高周波電気信号を取り扱う場合においては低誘電損失で低誘電率の材料が好ましい。例えばシロキサン系ポリマ・フッ素化ポリイミド・フッ素樹脂・ポリメチルメタクリレート(PMMA)・ポリカーボネート(PC)等の溶液状態で基板1上に塗布可能な光学材料が好適に用いられる。
【0020】
本発明の光集積回路基板の作製方法としては、図1に示した例であれば、まず基板1上に、光導波路の下部クラッド部2の下方の一部となると同時にその上に薄膜型光素子5設置用の金属設置部6を形成する層(図1の下部クラッド部2を点線で区切って示した下側の層)を形成する。次にこの層に、基板1上の配線導体8に接続される貫通導体7と薄膜型光素子5設置用の金属設置部6を形成する。次に、薄膜型光素子5を金属設置部6に載置し、あるいは直接形成することにより設置する。次に、金属設置部6および薄膜型光素子5を覆い下部クラッド部2の上方の一部となる層(図1の下部クラッド部2を点線で区切って示した上側の層)を形成する。次にこの下部クラッド部2上にコア部3となる層を形成した後、フォトリソグラフィやRIE(リアクティブイオンエッチング)等の周知の薄膜微細加工技術を用いて所定の形状でコア部3を形成する。そして、コア部3を形成した後に、上部クラッド部4を被覆形成して3次元形状の光導波路を形成する。これにより、光導波路中、ここでは下部クラッド部2中に金属設置部6および薄膜型光素子5が埋設された光導波路が形成される。
【0021】
薄膜型光素子5設置用の金属設置部6ならびに貫通導体7・配線導体8は、いずれもAu・Ti・Pd・Pt・Al・Cu・W・Cr等の周知の薄膜配線導体材料を用いて、周知の薄膜多層配線の手法を利用して形成すればよい。金属設置部6の大きさおよび形状は、薄膜型光素子5に形成された電極の大きさ・形状に相応したものを形成する。金属設置部6の光導波路中の位置は、薄膜型光素子5が受光素子の場合は、伝搬光の電磁界分布が受光面に及ぶ位置となるようにコア部3と受光面とが配置されるような位置に設定する。一般的なシングルモード光導波路の場合には、コア部3と受光面との距離を少なくともコア部3の厚みの1.5倍以内にする必要がある。実際には、薄膜型光素子5の屈折率・透過率・厚さ、光導波路の構造・屈折率・厚さ、受光素子の感度等を考慮したシミュレーションや実験を行ない、目標とする受光効率が得られるように決定すればよい。また、薄膜型光素子5が発光素子の場合は、コア部3に光信号を効率良く出力できるように、発光部がコア部3中に位置するような位置に設定する。
【0022】
また、薄膜型光素子設置用の金属設置部6の最表面には、薄膜型光素子5を設置する際に、薄膜型光素子5を載置して金属設置部6と接合する場合や電気的な接続を行なう場合等のために必要であれば、AuSn・AuGe等の半田層を形成しておくとよい。
【0023】
また、図1では下部クラッド部2中に形成された金属設置部6を基板1上に設けた配線導体8と貫通導体7で接続した例を示したが、光集積回路基板に形成された回路配線に金属設置部6を電気的に接続する構造は、単層配線やさらに多層化された構造や光導波路上部に形成された配線と接続された構造等でもよく、仕様に応じた所望の電気配線構造を用いればよい。
【0024】
このような金属設置部6を形成して薄膜型光素子5を設置することにより、薄膜型光素子5を設置したことによる段差を前述の特開平7−128531号公報の実施例3に示された例よりも小さくすることができ、2〜3μm程度以下とすることができる。このように薄膜型光素子5上に光導波路層を積層形成する際に問題がない程度に平坦にすることができるので、光素子5近傍での散乱損失や放射損失を十分小さくすることができ、さらに光導波路のコア部3の加工精度は良好なものとなり容易に設計通りの性能を実現することができる。
【0025】
金属設置部6上に設置される薄膜型光素子5は、例えばSi・Ge・InP・GaAs・InAs・InGaAsP等の半導体材料を用いて製造された薄膜型受光素子あるいは薄膜型発光素子であり、pnフォトダイオード・pinフォトダイオード・フォトトランジスタ・MSM(Metal-Semiconductor-Metal)フォトダイオード・アバランシェフォトダイオードといった受光素子や、LED・垂直共振器型面発光レーザ・端面発光型レーザといった発光素子が用いられる。また、ここで言う薄膜型光素子とは、その厚さが埋設される下部クラッド部2またはコア部3の厚さよりも薄いものである。
【0026】
薄膜型光素子5は、光導波路との光結合を得るために、薄膜型光素子5が例えば面受光型受光素子である場合においては、コア部3を中心に伝搬する光のフィールドが薄膜型光素子5の受光部にかかるように配置する。また、薄膜型光素子5が端面発光型発光素子である場合においては、発光部がコア部3内に位置するように配置すればよい。また、薄膜型光素子5が導波路型受光素子である場合においては、コア部3を中心に伝搬する光のフィールドが薄膜型光素子5の端面にかかるように配置すればよい。また、薄膜型光素子5が導波路構造を有している場合には、コア部3と薄膜型光素子5内の光導波路部とを平行に配置してモード結合を行なわせることよって光結合を行なってもよい。
【0027】
光導波路中に埋設される薄膜型光素子5と光導波路のコア部3との位置関係、およびコア部3の高さ・幅・屈折率、下部クラッド部2の厚さ・屈折率、上部クラッド部4の厚さ・屈折率は、薄膜型光素子5の受光感度や伝搬光強度や伝搬光のモードフィールド等を考慮して、所望の光結合効率が得られるように周知の光導波路理論やシミュレーションや実験から決定すればよい。
【0028】
なお、薄膜型光素子5を金属設置部6に設置する方法としては、例えば"Thin-Film Multimaterial Optoelectronic Integrated Circuits", IEEE Transactions on Components, Packaging and Manufacturing Technology, part B, Vol. 19, No.1, February 1996.に述べられているような周知の薄膜型素子実装方法を用いればよい。
【0029】
【実施例】
次に、本発明の光集積回路基板について具体例を説明する。
【0030】
まず、シリコン基板上に、フォトリソグラフィ・電子ビーム蒸着法・リフトオフの手法を用いて、Ti/Pt/Au(厚さ:0.1μm/0.2μm/0.8μm)からなる配線導体による電気配線および外部との接続用パッドを形成した。
【0031】
次に、この基板上に、シロキサンポリマの有機溶媒溶液をスピンコート法によって塗布し、85℃/30分および270℃/30分の熱処理を行ない、厚さ8μmの下部クラッド部の一部(屈折率1.4405,λ=1.3μm)を形成した。続いて、Al薄膜の開口パターンをマスクとしてRIE加工を行ないスルーホールを形成した。Al薄膜マスクを除去した後、Ti/Pt/Au薄膜(厚さ:0.1μm/0.2μm/0.5μm)を電子ビーム蒸着法により成膜し、フォトリソグラフィ・ドライエッチングを行ない、スルーホール中の導体により外部との接続用パッドと電気的に接続された、金属設置部としての薄膜受光素子設置用パッドを形成した。
【0032】
次に、厚さ1μmのGaAs系材料と厚さ0.2μmのAu電極から構成されたMSM型の薄膜受光素子を薄膜受光素子設置用パッドに実装し設置した。
【0033】
次に、この基板上に、上記の下部クラッド部の一部と同材料のシロキサンポリマの有機溶媒溶液をスピンコート法によって塗布し、85℃/30分および270℃/30分の熱処理を行ない、厚さ10μmの層(屈折率1.4405,λ=1.3μm)を形成した。その後、全面をCF4ガスとO2ガスを用いたRIEによってエッチングして、薄膜受光素子を被覆している部分のクラッド層の厚さが1μmとなるようにした。この際、薄膜受光素子の部分とその他の部分との下部クラッド部表面に生じた段差は0.3μm以下であり問題ない程度であった。このようにして形成した下部クラッド部の厚さは、薄膜受光素子のないところで約11μmとなった。
【0034】
次に、シロキサンポリマとテトラ−n−ブトキシチタンとの混合液をスピンコート法によってクラッド層上に塗布し、85℃/30分および150℃/30分の熱処理を行ない、厚さ7μmのコア層(屈折率1.4450,λ=1.3μm)を形成した。
【0035】
続いて、厚さ0.5μmのAl膜をスパッタリング法によりコア層上に形成し、コア部のパターンとなるフォトレジストパターンをフォトリソグラフィ手法により形成した。次いで、燐酸・酢酸・硝酸の混合溶液によりAl膜をエッチングし、レジストパターンが転写されたAlパターンを形成した。
【0036】
次いで、レジストを除去した後、CF4ガスとO2ガスを用いたRIE加工によりコア部のエッチング加工を行ない、幅7μm×高さ7μmの断面がほぼ矩形のコア部を形成した。このコア部は薄膜受光素子の受光部の上方に位置するようにした。
【0037】
その後、Alパターンを除去し、上記と同様にしてクラッド層(屈折率1.4405,λ=1.3μm)を形成してコア部を埋め込み、クラッド部がシロキサン系ポリマから成り、コア部がチタン含有シロキサン系ポリマから成るステップインデックス型光導波路を形成した。
【0038】
次に、エキシマレーザによるアブレーション加工を施し、シリコン基板表面上に形成してある外部との接続用パッドの一部を露出させた。また、基板をチップ状に切り分けると同時に、光導波路の外部からの光を入射するための接続用端面をダイシングによって形成した。
【0039】
このようにして作製した本発明の光集積回路基板について、波長1.3μmのレーザ光をシングルモード光導波路を介して光導波路接続用端面に入射して、本光集積回路基板の光伝搬特性と受光特性を評価した。
【0040】
その結果、薄膜受光素子のないところでの光導波路は、下部クラッド部の厚みが11μmあり下地のシリコン基板との相互作用が十分小さく、低損失で良好な光伝搬ができることを確認した。一方、薄膜受光素子の受光効率は約10%と優れた結合効率を有していることが確認できた。
【0041】
なお、以上はあくまで本発明の実施の形態の例示であって、本発明はこれらに限定されるものではなく、本発明の要旨を逸脱しない範囲で種々の変更や改良を加えることは何ら差し支えない。例えば、薄膜受光素子とコア部との間にクラッド部を介さず、直接、薄膜受光素子表面にコア部を形成してもよい。また、薄膜受光素子とコア部との間のクラッド部にグレーティングを形成して波長分波等の機能を付加してもよい。
【0042】
【発明の効果】
以上のように、本発明の光集積回路基板によれば、基板上に少なくとも下部クラッド部およびコア部を有する光導波路が形成され、この光導波路中に、基板上に設けた配線導体と電気的に接続された光素子設置用の金属設置部およびこの金属設置部の上に設置された薄膜型光素子が、金属設置部が下部クラッド部中に形成され、薄膜型光素子が下部クラッド部中で受光面をコア部に近接させるかまたは発光部をコア部中に位置させるように配置されて、埋設されていることから、薄膜型光素子と光導波路のコア部との間で効率良く光信号の授受を行なうことができて良好な光結合を得ることができるとともに、薄膜型光素子がない領域では光導波路のコア部と基板との距離を十分に長く確保することができるために光導波路の伝搬光と基板との相互作用がなく低損失な光伝送を行なうことができる。
【0043】
また、薄膜型光素子が、下部クラッド部中に形成され基板上に設けた配線導体と電気的に接続された金属設置部に、下部クラッド部中で受光面をコア部に近接させるかまたは発光部をコア部中に位置させるように設置されて光導波路中に埋設されていることから、薄膜型光素子の信号の入出力や電力の供給や発熱の伝導・放散をこの金属設置部により薄膜型光素子に対して直接に効率良く行なうことができるため、高周波信号の入出力や高出力の光信号の入出力等を安定して行なうことができ、高周波特性に優れ、動作の安定性にも優れた高性能・高信頼性の光信号処理を行なうことができる。
【0044】
さらに、光導波路に埋設させる金属設置部および薄膜型光素子は、いずれも光導波路の作製プロセスと同様の薄膜形成プロセスにより形成することができるので、高い加工精度で形成でき、高密度配置が可能であり、生産性にも優れるという利点も有する。
【0045】
以上により、本発明によれば、基板上に配置された薄膜型光素子とそれに被覆形成された光導波路との間で良好な光結合が得られるとともに低損失な光伝送が可能な光集積回路基板を提供することができた。
【図面の簡単な説明】
【図1】本発明の光集積回路基板の実施の形態の一例を示す断面図である。
【図2】従来の光集積回路基板の例を示す断面図である。
【符号の説明】
1・・・・・基板
2・・・・・光導波路の下部クラッド部
3・・・・・光導波路のコア部
4・・・・・光導波路の上部クラッド部
5・・・・・薄膜型光素子
6・・・・・金属設置部
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an optical integrated circuit substrate in which an optical waveguide and a thin film type optical element are integrated on the same substrate, for example, a plurality of optical modules on a single substrate such as a WDM (Wavelength Division Multiplexing) optical module substrate. It is suitably used when mounting thin film type optical elements and other devices. The optical waveguide and the thin film type optical element are integrated on the same substrate to reduce the substrate size, improve productivity, and improve optical transmission and reception efficiency. The present invention relates to an optical integrated circuit substrate capable of realizing an increase.
[0002]
[Prior art]
In recent years, research and development of optical elements for improving the performance and productivity of optical transmission modules and research and development of optical element mounting technology with high density, high accuracy, and high optical connection efficiency have been promoted.
[0003]
For example, “Thin-Film Multimaterial Optoelectronic Integrated Circuits”, IEEE Transactions on Components, Packaging and Manufacturing Technology, part B, Vol. 19, No.1, February 1996. After that, a technique is described in which only the epitaxial layer is separated to produce a thin film type light receiving element and mounted on another mounting substrate. According to this technology, it is possible to mount a thin film type optical element made of a different material on a mounting substrate with high density and high accuracy.
[0004]
Further, as an example of the optical element mounting technique, an example of an optical integrated circuit substrate proposed in Japanese Patent Laid-Open No. 7-128531 is shown in a sectional view in FIG. In FIG. 2, 21 is a substrate, 24 is a lower cladding layer of the optical waveguide, 25 is a core layer of the optical waveguide, 26 is an upper cladding layer of the optical waveguide, and 27 is placed on the upper surface of the substrate 21 below the lower cladding layer 24. It is a surface type light receiving element which is a thin film type optical element. According to such a configuration, the light propagating around the core portion 25 spreads also to the lower clad layer 24 portion, so that it can be coupled to the surface light receiving element 27.
[0005]
[Problems to be solved by the invention]
On the other hand, when optical coupling is attempted between an optical waveguide formed on a substrate and a thin film type optical element embedded in the optical waveguide, the following problems occur.
[0006]
Since the thin film type optical element is composed of only an epitaxial layer, it has a thickness of several μm or less. Further, a general single mode optical waveguide has a relative refractive index difference of 0.2 to 1.5% between the clad part and the core part and a thickness of the core part of about 4 to 8 μm. In order to make the thickness sufficiently small, the thickness of the lower cladding portion needs to be about 1.5 times or more that of the core portion, and it is desirable that the lower cladding portion has a thickness of at least 6 to 12 μm. On the other hand, in order to increase the optical coupling efficiency between the optical waveguide and the thin film type optical element disposed below the optical waveguide, the lower clad portion of the optical waveguide is made as thin as possible so that the distance between the core and the thin film type optical element is reduced. There is a need.
[0007]
Conventionally, an optical waveguide is coated after a thin film type optical element is formed or placed on a substrate surface. Accordingly, in order to obtain an optical coupling after forming a thin film type optical element on a substrate and forming an optical waveguide thereon, as shown in FIG. 2, a curved portion or a bent portion is formed in the optical waveguide layer. Thus, it is necessary to make the lower cladding part thinner in the region above the thin film type optical element and to make the lower cladding part thicker in the region where the thin film type optical element is not present. In such a case, when the curvature of the curved portion is increased, there is a problem that the region where the interaction between the substrate and the propagation light occurs in the vicinity of the thin film type optical element is widened and the light propagation loss is increased. In addition, if the curvature of the curved part is reduced, the interaction area with the substrate in the vicinity of the thin film type optical element can be narrowed. However, the propagation light is radiated at the curved part and the light propagation loss increases, causing crosstalk. There is a problem that stray light is generated.
[0008]
Japanese Patent Laid-Open No. 7-128531 discloses that in Example 3, the underlying semiconductor layer is secured to a height so that the active layer or light absorbing layer corresponding to the thin film type optical element is sufficiently separated from the substrate. A structure is shown in which the optical waveguide is formed on the optical waveguide. However, in this case, since the core portion of the optical waveguide is largely bent in the vicinity of the optical element, there is a problem that radiation loss at the bent portion and scattering loss at the optical element portion occur. In addition, when forming an optical waveguide covering, the processing accuracy of the core portion of the optical waveguide is deteriorated due to a step due to the optical element, or the shape of the covering portion or the bent portion near the optical element is controlled to a desired shape. However, it is difficult to obtain the designed performance.
[0009]
The present invention has been made in view of the above problems, and its object is to achieve a good optical coupling between a thin film type optical element disposed on a substrate and an optical waveguide coated thereon, and to achieve low optical coupling. An object of the present invention is to provide an optical integrated circuit substrate capable of lossy optical transmission.
[0010]
[Means for Solving the Problems]
An optical integrated circuit substrate of the present invention is formed in a substrate, a wiring conductor provided on the substrate, an optical waveguide formed on the substrate and having at least a lower cladding portion and a core portion, and the lower cladding portion. A metal installation part for optical element installation, a through conductor provided in the lower clad part and electrically connecting the wiring conductor and the metal installation part, and a light receiving surface or a light emitting part, A thin film type optical element which is installed in the lower clad part and on the metal installation part and embedded in the optical waveguide, wherein the light receiving surface is brought close to the core part or the light emitting part is placed in the core part And a thin film type optical element disposed so as to be positioned at the same position.
[0011]
According to the optical integrated circuit substrate of the present invention, an optical waveguide having at least a lower clad portion and a core portion is formed on the substrate, and the optical waveguide is electrically connected to a wiring conductor provided on the substrate. A metal installation portion for installing the optical element is formed in the lower clad portion, and on the metal installation portion, the thin film type optical element makes the light receiving surface close to the core portion in the lower clad portion, or the light emitting portion is the core portion. Since these are embedded in the optical waveguide, the distance between the thin film type optical element and the core part of the optical waveguide is reduced, or the thin film type optical element is positioned in the core part. As a result, it is possible to efficiently exchange optical signals between the optical element and the core part, and to ensure a sufficiently long distance between the core part of the optical waveguide and the substrate in a region where there is no thin film type optical element. In the optical waveguide It is possible to obtain good optical coupling between the buried thin-film optical element and the optical waveguide, it is possible to perform the low-loss optical transmission is no interaction between the propagating light and the substrate of the optical waveguide.
[0012]
In addition, the thin film type optical element has a light receiving surface in the lower clad part close to the core part or emits light to a metal installation part formed in the lower clad part and electrically connected to the wiring conductor provided on the substrate. This metal installation part is installed so that the part is located in the core part and embedded in the optical waveguide, so that signal output and input from the thin film type optical element, power supply and heat conduction and dissipation Can directly and efficiently perform on a thin film type optical device, so that input / output of high-frequency signals and input / output of high-power optical signals can be performed stably, with excellent high-frequency characteristics and stable operation. High-performance and high-reliability optical signal processing with excellent performance can be performed.
[0013]
Furthermore, the metal installation part and the thin film type optical element embedded in the optical waveguide can be formed by the same thin film formation process as the optical waveguide fabrication process, so that they can be formed with high processing accuracy and can be arranged at high density. And has the advantage of excellent productivity.
[0014]
DETAILED DESCRIPTION OF THE INVENTION
The optical integrated circuit substrate of the present invention will be described below with reference to the drawings.
[0015]
FIG. 1 is a sectional view showing an example of an embodiment of an optical integrated circuit substrate of the present invention. In FIG. 1, 1 is a substrate, 2 is a lower cladding portion of an optical waveguide formed on the substrate 1, 3 is a core portion of the optical waveguide, and 4 is an upper cladding portion of the optical waveguide. Reference numeral 5 denotes a thin film type optical element, 6 denotes a metal installation part for installing the thin film type optical element, 7 denotes a through conductor, 8 denotes a wiring conductor formed on the substrate 1, and the wiring conductor 8 to the through conductor 7 and the metal installation part An electrical signal is input to and output from the thin film type optical element 5 through 6.
[0016]
In the optical integrated circuit board according to the present invention, the metal installation portion 6 is formed in the optical waveguide, in this example, the lower cladding portion 2, and the thin film type optical element 5 is installed in the metal installation portion 6 to be the optical waveguide. Among these, in this example, they are also disposed in the lower clad part 2 and are both embedded in the optical waveguide. The thin film type optical element 5 includes a light receiving element and a light emitting element. In the case of the light receiving element, the light signal propagating through the core portion 3 is not scattered or attenuated as in this example. It is preferable to embed in the lower clad part 2 close to the core part 3. In the case of a light emitting element, the light emitting element is buried so as to be located in the core part 3 so that an optical signal can be efficiently output to the core part 3. It is preferable.
[0017]
In the optical integrated circuit substrate of the present invention, the substrate 1 is formed with an optoelectric circuit including an electric circuit and an optical waveguide, and functions as a support substrate for the thin film type optical element 5 embedded in the optical waveguide. In addition, various substrates used as optical signal processing substrates such as an optical integrated circuit substrate and an optoelectronic mixed substrate, for example, a silicon substrate, an alumina substrate, a glass ceramic substrate, a multilayer ceramic substrate, a plastic electric wiring substrate, and the like can be used.
[0018]
The optical waveguide formed on the substrate 1 and embedded with the thin film type optical element 5 has at least a lower clad part 2 and a core part 3, and preferably has an upper clad part 4 on the upper part thereof. It is a two-dimensional waveguide-shaped optical waveguide.
[0019]
As the material of the optical waveguide, an optical waveguide was laminated on the wiring conductor 8 formed on the substrate 1, the through conductor 7, the metal installation portion 6, and the thin film type optical element 5 installed on the metal installation portion 6. It can be formed at a low temperature so as not to cause damage, and the surface irregularity due to the wiring conductor 8, the through conductor 7, the metal installation portion 6, and the thin film type optical element 5 can be reduced. A material having excellent transparency and capable of propagating light with low loss is used. In particular, since the lower clad portion 2 functions also as a dielectric layer of electric wiring in the optical integrated circuit substrate, a material having a low dielectric loss and a low dielectric constant is preferable particularly when a high frequency electric signal is handled. For example, an optical material that can be applied on the substrate 1 in a solution state such as siloxane polymer, fluorinated polyimide, fluororesin, polymethyl methacrylate (PMMA), and polycarbonate (PC) is preferably used.
[0020]
As a method for manufacturing an optical integrated circuit substrate of the present invention, in the example shown in FIG. 1, first, a thin film type light is formed on a substrate 1 at the same time as a portion below a lower cladding portion 2 of an optical waveguide. A layer (a lower layer in which the lower clad portion 2 in FIG. 1 is separated by a dotted line) is formed to form the metal installation portion 6 for installing the element 5. Next, in this layer, the through conductor 7 connected to the wiring conductor 8 on the substrate 1 and the metal installation portion 6 for installing the thin film type optical element 5 are formed. Next, the thin film type optical element 5 is placed on the metal placement portion 6 or directly formed. Next, a layer that covers the metal installation portion 6 and the thin film type optical element 5 and is a part above the lower clad portion 2 (upper layer shown by dividing the lower clad portion 2 in FIG. 1 by a dotted line) is formed. Next, after forming a layer to be the core portion 3 on the lower clad portion 2, the core portion 3 is formed in a predetermined shape using a well-known thin film microfabrication technique such as photolithography or RIE (reactive ion etching). To do. And after forming the core part 3, the upper clad part 4 is coat | covered and a three-dimensional-shaped optical waveguide is formed. As a result, an optical waveguide in which the metal installation portion 6 and the thin film type optical element 5 are embedded in the lower cladding portion 2 is formed in the optical waveguide.
[0021]
The metal installation part 6 and the through conductor 7 and the wiring conductor 8 for installing the thin film type optical element 5 are all made of a well-known thin film wiring conductor material such as Au, Ti, Pd, Pt, Al, Cu, W, and Cr. What is necessary is just to form using the method of a well-known thin film multilayer wiring. The size and shape of the metal installation portion 6 are the same as the size and shape of the electrode formed on the thin film type optical element 5. When the thin-film optical element 5 is a light receiving element, the core portion 3 and the light receiving surface are arranged so that the electromagnetic field distribution of propagating light reaches the light receiving surface. Set the position so that In the case of a general single mode optical waveguide, the distance between the core portion 3 and the light receiving surface needs to be at least 1.5 times the thickness of the core portion 3. Actually, simulations and experiments are conducted in consideration of the refractive index / transmittance / thickness of the thin film type optical element 5, the structure / refractive index / thickness of the optical waveguide, the sensitivity of the light receiving element, etc. What is necessary is just to determine so that it may be obtained. Further, when the thin film type optical element 5 is a light emitting element, the light emitting part is set at a position where the light emitting part is located in the core part 3 so that an optical signal can be efficiently output to the core part 3.
[0022]
Further, when the thin film type optical element 5 is installed on the outermost surface of the metal installation part 6 for installing the thin film type optical element, the thin film type optical element 5 is placed and joined to the metal installation part 6 If it is necessary for the case of performing a general connection, a solder layer such as AuSn / AuGe may be formed.
[0023]
FIG. 1 shows an example in which the metal installation portion 6 formed in the lower clad portion 2 is connected by the wiring conductor 8 and the through conductor 7 provided on the substrate 1, but the circuit formed on the optical integrated circuit substrate. The structure for electrically connecting the metal installation part 6 to the wiring may be a single-layer wiring, a multi-layered structure, a structure connected to the wiring formed on the optical waveguide, or the like. A wiring structure may be used.
[0024]
By forming such a metal installation portion 6 and installing the thin film type optical element 5, the step due to the installation of the thin film type optical element 5 is shown in Example 3 of the above-mentioned JP-A-7-128531. It can be made smaller than the above example, and can be about 2 to 3 μm or less. As described above, since the optical waveguide layer can be flattened to such an extent that no problem occurs when the optical waveguide layer is formed on the thin film type optical element 5, scattering loss and radiation loss in the vicinity of the optical element 5 can be sufficiently reduced. Furthermore, the processing accuracy of the core portion 3 of the optical waveguide is good, and the performance as designed can be easily realized.
[0025]
The thin film type optical element 5 installed on the metal installation unit 6 is a thin film type light receiving element or a thin film type light emitting element manufactured using a semiconductor material such as Si, Ge, InP, GaAs, InAs, InGaAsP, for example. Light-receiving elements such as pn photodiodes, pin photodiodes, phototransistors, MSM (Metal-Semiconductor-Metal) photodiodes, avalanche photodiodes, and light-emitting elements such as LEDs, vertical cavity surface emitting lasers, and edge emitting lasers are used. . In addition, the thin film type optical element referred to here is one whose thickness is thinner than the thickness of the lower clad part 2 or the core part 3 embedded therein.
[0026]
In order to obtain optical coupling with the optical waveguide, the thin film type optical element 5 has a light field propagating around the core portion 3 when the thin film type optical element 5 is, for example, a surface light receiving type light receiving element. It arrange | positions so that the light-receiving part of the optical element 5 may be covered. Further, in the case where the thin film type optical element 5 is an end surface light emitting type light emitting element, the light emitting part may be disposed in the core part 3. In the case where the thin film type optical element 5 is a waveguide type light receiving element, it may be arranged so that the field of light propagating around the core 3 covers the end face of the thin film type optical element 5. When the thin film type optical element 5 has a waveguide structure, optical coupling is achieved by arranging the core portion 3 and the optical waveguide portion in the thin film type optical element 5 in parallel to perform mode coupling. May be performed.
[0027]
The positional relationship between the thin-film optical element 5 embedded in the optical waveguide and the core portion 3 of the optical waveguide, the height / width / refractive index of the core portion 3, the thickness / refractive index of the lower cladding portion 2, and the upper cladding The thickness / refractive index of the portion 4 is determined by a well-known optical waveguide theory or the like so that a desired optical coupling efficiency can be obtained in consideration of the light receiving sensitivity, the propagation light intensity, the propagation light mode field, etc. It may be determined from simulations or experiments.
[0028]
As a method of installing the thin film type optical element 5 in the metal installation part 6, for example, “Thin-Film Multimaterial Optoelectronic Integrated Circuits”, IEEE Transactions on Components, Packaging and Manufacturing Technology, part B, Vol. 19, No. 1 , February 1996. A well-known thin film type device mounting method may be used.
[0029]
【Example】
Next, specific examples of the optical integrated circuit substrate of the present invention will be described.
[0030]
First, electrical wiring by a wiring conductor made of Ti / Pt / Au (thickness: 0.1 μm / 0.2 μm / 0.8 μm) on the silicon substrate by using photolithography, electron beam evaporation method, and lift-off method, and the outside The connection pad was formed.
[0031]
Next, an organic solvent solution of siloxane polymer is applied onto the substrate by spin coating, and heat treatment is performed at 85 ° C./30 minutes and 270 ° C./30 minutes, and a part of the lower cladding part having a thickness of 8 μm (refractive (Rate 1.4405, λ = 1.3 μm). Subsequently, RIE processing was performed using the opening pattern of the Al thin film as a mask to form a through hole. After removing the Al thin film mask, a Ti / Pt / Au thin film (thickness: 0.1 μm / 0.2 μm / 0.5 μm) is deposited by electron beam evaporation, photolithography and dry etching are performed, and the conductor in the through hole Thus, a thin-film light receiving element installation pad as a metal installation portion, which is electrically connected to an external connection pad, was formed.
[0032]
Next, an MSM type thin film light receiving element composed of a GaAs-based material having a thickness of 1 μm and an Au electrode having a thickness of 0.2 μm was mounted and installed on a thin film light receiving element installation pad.
[0033]
Next, on this substrate, an organic solvent solution of a siloxane polymer of the same material as that of a part of the lower clad part is applied by spin coating, and heat treatment is performed at 85 ° C./30 minutes and 270 ° C./30 minutes, A 10 μm thick layer (refractive index 1.4405, λ = 1.3 μm) was formed. Thereafter, the entire surface was etched by RIE using CF 4 gas and O 2 gas, so that the thickness of the clad layer covering the thin film light receiving element became 1 μm. At this time, the step formed on the surface of the lower clad portion between the thin film light receiving element portion and the other portions was 0.3 μm or less, and there was no problem. The thickness of the lower clad formed in this way was about 11 μm without the thin film light receiving element.
[0034]
Next, a mixed solution of siloxane polymer and tetra-n-butoxytitanium is applied onto the clad layer by spin coating, heat treatment is performed at 85 ° C./30 minutes and 150 ° C./30 minutes, and a core layer having a thickness of 7 μm (Refractive index 1.4450, λ = 1.3 μm) was formed.
[0035]
Subsequently, an Al film having a thickness of 0.5 μm was formed on the core layer by a sputtering method, and a photoresist pattern to be a pattern of the core portion was formed by a photolithography technique. Next, the Al film was etched with a mixed solution of phosphoric acid, acetic acid and nitric acid to form an Al pattern to which the resist pattern was transferred.
[0036]
Next, after removing the resist, the core portion was etched by RIE using CF 4 gas and O 2 gas to form a core portion having a width of 7 μm and a height of 7 μm and a substantially rectangular cross section. The core portion is positioned above the light receiving portion of the thin film light receiving element.
[0037]
Thereafter, the Al pattern is removed, and a cladding layer (refractive index: 1.4405, λ = 1.3 μm) is formed in the same manner as described above to embed the core portion, the cladding portion is made of a siloxane polymer, and the core portion is a titanium-containing siloxane system. A step index optical waveguide made of polymer was formed.
[0038]
Next, ablation processing by excimer laser was performed to expose a part of the external connection pad formed on the silicon substrate surface. Further, at the same time that the substrate was cut into chips, a connection end face for entering light from the outside of the optical waveguide was formed by dicing.
[0039]
With respect to the optical integrated circuit substrate of the present invention thus fabricated, a laser beam having a wavelength of 1.3 μm is incident on the end face for connecting the optical waveguide through the single mode optical waveguide, and the optical propagation characteristics and light reception of the optical integrated circuit substrate are measured. Characteristics were evaluated.
[0040]
As a result, it was confirmed that the optical waveguide without the thin film light-receiving element had a thickness of the lower cladding portion of 11 μm, and the interaction with the underlying silicon substrate was sufficiently small, and good light propagation could be achieved with low loss. On the other hand, it was confirmed that the light-receiving efficiency of the thin-film light-receiving element was as excellent as about 10%.
[0041]
Note that the above are merely examples of the embodiments of the present invention, and the present invention is not limited to these embodiments, and various modifications and improvements may be added without departing from the scope of the present invention. . For example, the core part may be formed directly on the surface of the thin film light receiving element without interposing the clad part between the thin film light receiving element and the core part. A function such as wavelength demultiplexing may be added by forming a grating in the cladding part between the thin film light receiving element and the core part.
[0042]
【The invention's effect】
As described above, according to the optical integrated circuit substrate of the present invention, the optical waveguide having at least the lower clad portion and the core portion is formed on the substrate, and the wiring conductor provided on the substrate is electrically connected to the optical waveguide. The metal installation part connected to the optical element and the thin film type optical element installed on the metal installation part are formed in the lower cladding part, and the thin film type optical element is in the lower cladding part. Since the light receiving surface is placed close to the core portion or the light emitting portion is positioned in the core portion and embedded, light is efficiently transmitted between the thin film type optical element and the core portion of the optical waveguide. Signals can be exchanged and good optical coupling can be obtained, and in the region where there is no thin film type optical element, the distance between the core portion of the optical waveguide and the substrate can be secured sufficiently long. Wave propagation light and substrate It can interact without performing low-loss optical transmission.
[0043]
In addition, the thin film type optical element has a light receiving surface in the lower clad part close to the core part or emits light to a metal installation part formed in the lower clad part and electrically connected to the wiring conductor provided on the substrate. Is placed in the core and embedded in the optical waveguide, the thin film type optical element can be used to input and output signals, supply power, and conduct and dissipate heat. Type optical elements can be directly and efficiently performed, so that high-frequency signal input / output and high-output optical signal input / output can be performed stably, with excellent high-frequency characteristics and operational stability. Can perform high-performance and high-reliability optical signal processing.
[0044]
Furthermore, the metal installation part and the thin film type optical element embedded in the optical waveguide can be formed by the same thin film formation process as the optical waveguide fabrication process, so that they can be formed with high processing accuracy and can be arranged at high density. And has the advantage of excellent productivity.
[0045]
As described above, according to the present invention, an optical integrated circuit capable of obtaining a good optical coupling between a thin film type optical element arranged on a substrate and an optical waveguide coated thereon and capable of low-loss optical transmission. A substrate could be provided.
[Brief description of the drawings]
FIG. 1 is a cross-sectional view showing an example of an embodiment of an optical integrated circuit substrate of the present invention.
FIG. 2 is a cross-sectional view showing an example of a conventional optical integrated circuit substrate.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 ... Board | substrate 2 ... Lower clad part 3 of optical waveguide ... Core part 4 of optical waveguide ... Upper clad part 5 of optical waveguide ... Thin film type Optical element 6 ... Metal installation part

Claims (1)

基板と、
前記基板上に設けられた配線導体と、
前記基板上に形成され、少なくとも下部クラッド部およびコア部を有する光導波路と、
前記下部クラッド部中に形成された光素子設置用の金属設置部と、
前記下部クラッド部中に設けられ、前記配線導体と前記金属設置部とを電気的に接続する貫通導体と、
受光面または発光部を有し、前記下部クラッド部中かつ前記金属設置部上に設置されるとともに前記光導波路に埋設された薄膜型光素子であって、前記受光面を前記コア部に近接させるかまたは前記発光部を前記コア部中に位置するように配設された薄膜型光素子と、を有する、光集積回路基板。
A substrate,
A wiring conductor provided on the substrate;
An optical waveguide formed on the substrate and having at least a lower cladding part and a core part;
A metal installation portion for optical element installation formed in the lower clad portion;
A through conductor provided in the lower clad part and electrically connecting the wiring conductor and the metal installation part;
A thin film type optical element having a light receiving surface or a light emitting portion , installed in the lower clad portion and on the metal setting portion and embedded in the optical waveguide, wherein the light receiving surface is brought close to the core portion Or a thin film type optical element disposed so that the light emitting part is positioned in the core part.
JP2000331540A 2000-10-30 2000-10-30 Optical integrated circuit board Expired - Fee Related JP3811345B2 (en)

Priority Applications (2)

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JP2000331540A JP3811345B2 (en) 2000-10-30 2000-10-30 Optical integrated circuit board
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
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JP3811345B2 true JP3811345B2 (en) 2006-08-16

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