JP3813007B2 - Composite, heat sink using the same, and method of manufacturing composite - Google Patents
Composite, heat sink using the same, and method of manufacturing composite Download PDFInfo
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- JP3813007B2 JP3813007B2 JP30563797A JP30563797A JP3813007B2 JP 3813007 B2 JP3813007 B2 JP 3813007B2 JP 30563797 A JP30563797 A JP 30563797A JP 30563797 A JP30563797 A JP 30563797A JP 3813007 B2 JP3813007 B2 JP 3813007B2
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- 239000002131 composite material Substances 0.000 title claims description 53
- 238000004519 manufacturing process Methods 0.000 title claims description 4
- 239000000919 ceramic Substances 0.000 claims description 58
- 229910052751 metal Inorganic materials 0.000 claims description 27
- 239000002184 metal Substances 0.000 claims description 27
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 20
- 229910052782 aluminium Inorganic materials 0.000 claims description 18
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 17
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims description 15
- 238000002425 crystallisation Methods 0.000 claims description 14
- 230000008025 crystallization Effects 0.000 claims description 14
- 239000011777 magnesium Substances 0.000 claims description 14
- 229910052749 magnesium Inorganic materials 0.000 claims description 12
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 11
- 239000002245 particle Substances 0.000 claims description 8
- 230000005540 biological transmission Effects 0.000 claims description 6
- 238000010438 heat treatment Methods 0.000 claims description 4
- 239000002923 metal particle Substances 0.000 claims description 3
- 238000001000 micrograph Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 description 17
- 229910052581 Si3N4 Inorganic materials 0.000 description 5
- 229910045601 alloy Inorganic materials 0.000 description 5
- 239000000956 alloy Substances 0.000 description 5
- CSDREXVUYHZDNP-UHFFFAOYSA-N alumanylidynesilicon Chemical compound [Al].[Si] CSDREXVUYHZDNP-UHFFFAOYSA-N 0.000 description 5
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 5
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 4
- 238000005266 casting Methods 0.000 description 4
- 238000004512 die casting Methods 0.000 description 4
- 238000005470 impregnation Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 230000017525 heat dissipation Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229910000838 Al alloy Inorganic materials 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000006378 damage Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 2
- 239000010432 diamond Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000010292 electrical insulation Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 239000000395 magnesium oxide Substances 0.000 description 2
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 2
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 230000002269 spontaneous effect Effects 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000008119 colloidal silica Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000002050 diffraction method Methods 0.000 description 1
- 238000000921 elemental analysis Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 238000005242 forging Methods 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 230000008595 infiltration Effects 0.000 description 1
- 238000001764 infiltration Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- NLYAJNPCOHFWQQ-UHFFFAOYSA-N kaolin Chemical compound O.O.O=[Al]O[Si](=O)O[Si](=O)O[Al]=O NLYAJNPCOHFWQQ-UHFFFAOYSA-N 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000004663 powder metallurgy Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/50—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with inorganic materials
- C04B41/51—Metallising, e.g. infiltration of sintered ceramic preforms with molten metal
- C04B41/515—Other specific metals
- C04B41/5155—Aluminium
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/009—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone characterised by the material treated
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
- C04B41/81—Coating or impregnation
- C04B41/85—Coating or impregnation with inorganic materials
- C04B41/88—Metals
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/05—Insulated conductive substrates, e.g. insulated metal substrate
- H05K1/053—Insulated conductive substrates, e.g. insulated metal substrate the metal substrate being covered by an inorganic insulating layer
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Ceramic Engineering (AREA)
- Materials Engineering (AREA)
- Structural Engineering (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Manufacture Of Alloys Or Alloy Compounds (AREA)
Description
【0001】
【発明の属する技術分野】
本発明は、多孔質セラミックス構造体に金属を溶浸(含浸ともいう)してなる金属セラミックス複合体(以下、複合体という)、特に、ICパッケージやIGBT、GTO等のパワーモジュール用ヒートシンク材に適する複合体に関する。
【0002】
【従来の技術】
半導体分野において、LSIの集積化や高速化がすすむことに加え、近年GTOやIGBT等のパワーデバイスの用途が拡大するなど、シリコンチップの発熱量は増加の一途をたどっている。それとともにシリコンチップから発熱した熱を逃がす回路基板、更にヒートシンクについても、より一層の高性能化が求められている。
【0003】
具体的には、回路基板に関しては、熱伝導性の良いアルミナ、窒化アルミニウム、窒化珪素等のセラミック基板が用いられているし、これに接合して用いられるヒートシンク自体の熱伝導率が高いことに加えて、両者が組み合わされ、モジュール化された場合においては、前記回路基板とヒートシンクとの熱膨張率が近いことが望まれる。これは、実使用時に半導体素子から発生する熱等に原因して発生した熱応力が回路基板を破壊したり、回路基板の電気絶縁性や熱伝導性を劣化させ、モジュールとしての信頼性を低下させる原因になってしまうからである。
【0004】
上記の事情により、電気、或いは自動車などの車両用途等の高信頼性が重要とされる分野において、熱膨張率がセラミックス回路基板に近いヒートシンクとして金属−セラミックス複合体(以下、複合体という)の適用が進められている(特開昭64−83634号公報、特開平9−209058号公報)。
【0005】
前記複合体は、一般に、セラミックス粉、セラミックス繊維などを成形、必要な場合においては焼成して多孔質セラミックス構造体を作製し、次に溶融金属を含浸し、これを冷却することにより作製される。溶融金属を含浸する方法としては、粉末冶金法に基づく方法、例えばダイキャスト法(特開平5−508350号公報)や溶湯鍛造法(まてりあ、第36巻、第1号、1997、40−46ページ)などの高圧鋳造による方法、自発浸透による方法(特開平2−197368号公報)等の各種の方法が知られている。
【0006】
【本発明が解決しようとする課題】
金属−セラミックス複合体として、代表的なアルミニウム−炭化珪素複合体の例をとると、熱伝導率は120〜170W/(m・K)程度であり、従来よりヒートシンクとして使用されている銅板の熱伝導率(約400W/(m・K))の半分以下である。このため、前記複合体をヒートシンクとして用いようとしても、従来公知の銅のヒートシンクよりも、熱伝導率が劣り、放熱性が低いために、半導体素子等の電子部品から発生した熱を逃がしきれず、電子部品特に半導体素子自身の温度が上昇するため誤動作や熱暴走を招きやすいという問題がある。上記事情から、熱膨張率がセラミック回路基板の熱膨張率に近く、しかも、熱伝導率をより向上させたヒートシンク用材料の開発が望まれていた。
【0007】
本発明は、上記の事情に鑑みてなされたものであって、その目的は、セラミックスス回路基板と同程度に小さな熱膨張率を有し、しかも高熱伝導率な金属−セラミックス複合体を提供し、セラミックス回路基板用のヒートシンクとして用いた時に、セラミックス回路基板の電気絶縁性や熱伝導性を劣化させ、モジュールとしての信頼性を低下させることがないヒートシンクを提供することにある。
【0008】
【課題を解決するための手段】
本発明は、多孔質セラミックス構造体にマグネシウムを含有するアルミニウム系金属を含浸してなる複合体であって、該複合体中のセラミックス粒子と金属粒子との境界に存在する中間相について、透過型電子顕微鏡像から求めた中間相の結晶化領域の面積割合が20%以上であることを特徴とする複合体であり、好ましくは、多孔質セラミックス構造体が空隙率20〜50%の炭化珪素を主成分とするセラミックス構造体であることを特徴とする前記の複合体である。
【0009】
又、本発明は、前記の複合体を用いてなることを特徴とする回路基板用ヒートシンクである。
【0010】
加えて、本発明は、多孔質セラミックス構造体にマグネシウムを含有するアルミニウム系金属を含浸させた後、700℃以上1000℃以下で熱処理することを特徴とする複合体の製造方法である。
【0011】
【発明の実施の形態】
一般的に、金属−セラミックス複合体の熱膨張率、熱伝導率は、それを構成する金属とセラミックスとの種類、それらの配合比により大きく依存し、金属とセラミックスと種類を定めれば、得られる複合体の熱伝導率はほぼ決定されてしまう。
【0012】
しかし、本発明者らが鋭意検討を重ねた結果、複合体の熱伝導率に関して、複合体を構成する金属とセラミックスの境界に中間相が存在すること、そして該中間相の結晶化状態が複合体の熱伝導率を大きく支配し、該中間相の結晶化を進めることで従来よりも高熱伝導率の金属−セラミックス複合体を得ることができるという知見を得て、本発明に至ったものである。
【0013】
即ち、セラミックスとして炭化珪素(SiC)、金属としてアルミニウム系合金(AC4C)を用い、800℃の温度でダイキャスト法により高圧含浸させて得た金属−セラミックス複合体について、走査型電子顕微鏡(SEM)で観察した組織は、金属からなるマトリクス中にセラミックス粒子が島状に点在している微構造を有する。
【0014】
そして、図2は、前記金属とセラミックス粒子との境界を透過型電子顕微鏡(TEM:日本電子(株)JEM2010;加速電圧200KV)で撮影したときに得られる透過型電子顕微鏡写真像の模式図で、金属(アルミニウム)とセラミックス(SiC)の境界に中間相が存在していることを示している。この中間相に関して、電子ビームを絞って該中間相より発生する特性X線により局所部分の元素分析を行ったところ、Al、Si、微量のMgといった元素に加えて酸素が検出され、中間相は前記金属の酸化物により構成されていることが判明した。さらに、同時に行った電子線回折法により、その中間層内部には微細な結晶粒子がわずかに点在しており、その結晶粒子以外の部分は非晶質であることも判明した。
【0015】
上記解析で得た知見に基づき、更に、本発明者らは、金属とセラミックスとの境界に存在する中間相の結晶化を進めることで、金属−セラミックス複合体の熱伝導率を向上し得ると考え、実験的に検討を進めた結果、マグネシウム含有のアルミニウム系金属を用いるとき、Mg成分を中間相中に積極的に存在させることで、前記中間相の結晶化を高めることができることを見出し、本発明に至ったものである。
【0016】
即ち、本発明は、多孔質セラミックス構造体にマグネシウムを含有するアルミニウム系金属を含浸してなる複合体であって、該複合体中のセラミックス粒子と金属粒子との境界に存在する中間相について、透過型電子顕微鏡像から求めた中間相の結晶化領域の面積割合が20%以上であることを特徴とする複合体である。
【0017】
本発明において、マグネシウムを含有するアルミニウム系金属としては、AC1B、AC4A、AC4C、AC4CH、AC4D、AC5A等があげられるが、含浸時にアルミニウム或いはアルミニウム合金とマグネシウム或いはその合金とを適宜混合することもできる。このときのマグネシウム量は、0.15重量%〜上6重量%であれば十分に本発明の目的が達成できる。一方、鋳造のしやすさの点から、Si含有量が4〜10%のアルミニウム合金、即ち、AC2A、AC2B、AC4A、AC4B、AC4C、AC4D、AC8B、AC8Cなどの合金との併用が望ましいことから、MgとSiをともに含有するAC4A、AC4C、AC4CH、AC4Dが好ましく、選択される。
【0018】
本発明に用いる多孔質セラミックス構造体については、前記アルミニウム系金属を含浸する際に反応したり、破損する等の問題が生じない限り、どのようなものでも構わない。しかし、得られる構造体の熱膨張率がアルミナ、窒化アルミニウム、窒化珪素、炭化珪素等のセラミックス回路基板と同程度に小さくする必要から、前記セラミックス回路基板と似た特性を有する材質のアルミナ、窒化アルミニウム、窒化珪素、炭化珪素、酸化珪素等が好ましい。このうち、熱伝導率が高く、かつ熱膨張率が小さい炭化珪素が好適である。また、セラミックス構造体として、酸化マグネシウム、或いは焼結助剤に酸化マグネシウムを用いた窒化珪素のようにマグネシウムを多量に含有するセラミックスの構造体を選択し、金属として必ずしもマグネシウムを含有しないアルミニウム或いはその合金を選択する場合にも、本発明の効果が得られるケースがある。しかし、これらの方法では、安定して熱膨張率が小さく、しかも高熱伝導率の複合体が得られないことがある。
【0019】
アルミニウム−炭化珪素複合体は、セラミック回路基板との熱膨張の適合性と、放熱性の点において優れた組み合わせである。しかし、アルミニウム−炭化珪素複合体中の炭化珪素含有量が50体積%未満では熱膨張率係数が高くなり、セラミックス回路基板と該複合体との熱膨張率差に起因する残留応力発生に起因するセラミックス回路基板の破壊などの問題が生じやすくなる。また、セラミックスは高温では熱伝導率が低下するため、複合体中の炭化珪素含有量が80体積%を越える場合には高温時の熱伝導率低下が顕著になってくる。そのため、アルミニウム−炭化珪素複合体中の炭化珪素含有量は50〜80体積%の範囲にあることが好ましい。
【0020】
次に、本発明の複合体を製造する方法としては、まず、従来公知の方法、即ち、高圧鋳造法や化学反応を利用した自発浸透法等を適用して、多孔質セラミックス構造体にマグネシウムを含有するアルミニウム系金属を含浸させる。この場合、使用する金属やセラミックス多孔質体を選ばないという観点からダイキャスト法のような高圧鋳造法が望ましい。
【0021】
本発明では、前記含浸操作の後、700℃以上1000℃以下で熱処理することにより、金属とセラミックとの境界に存在する中間相の結晶化を図ることを特徴とする。この操作により、中間相が面積比で20%以上が結晶化され、複合体の高熱伝導率化が達成される。熱処理温度について、700℃未満では結晶化に時間を要し、生産性の面で好ましくなく、1000℃を越えるとアルミニウムの蒸発が大きくなり、加圧雰囲気を必要とするため、過大な設備を必要とし、その結果コストが高くなる。700℃〜1000℃が好ましい範囲である。
【0022】
本発明の複合体は、アルミナ、窒化アルミニウム、窒化珪素等のセラミック回路基板と同程度に小さな熱膨張率を有し、しかも高熱伝導率であるので、前記セラミック回路基板用にヒートシンクとして取り付けたときに、実使用下で受ける熱衝撃によっても回路基板の破損等を生じることがなく、信頼性の高いモジュールを構成することができる。
【0023】
以下、実施例、比較例をもって、本発明を更に詳細に説明する。
【0024】
【実施例】
〔実施例1〜5、比較例〕
SiC粉末(屋久島電工;GC1000F)にコロイダルシリカ(日産化学;スノーテックス)を4wt%加え、混合後、プレス成形して、150℃で乾燥、固化させる。次に、大気中で800℃で1時間加熱して、気孔率35%のSiC多孔質構造体を得た。
【0025】
前記SiC多孔質構造体に、ダイキャスト法により800℃でAC4C合金を含浸させ、アルミニウム−炭化珪素複合体を作製した。この複合体の熱伝導率をレーザーフラッシュ法(理学電機社;FA8510B)にて測定後、ダイヤモンド砥石を用いて研削、研磨して、透過型電子顕微鏡を用いて中間相の結晶化領域の面積比率を測定したところ12%であり、また熱伝導率が132W/(m・K)であった。
【0026】
前記アルミニウム−SiC複合体を、窒素雰囲気中で750℃で0〜60分の間保持し、熱処理を行い、中間層の結晶化領域の比率と熱伝導率の関係を調べた。この結果を表1に示した。熱処理時間が長くなり、中間層の結晶化領域の面積比率が増えるに従い、熱伝導率が向上することが確認された。また、実施例5では、中間層の殆どが結晶化した微粒子で構成されていることが確認された(図1参照)。
【0027】
【表1】
【0028】
なお、中間相の結晶化領域の面積比率の測定は、複合体をダイヤモンド砥石を用いて研削、研磨して得た試片について、少なくとも5ヶ所をランダムに選択し、おのおのの位置について、透過型顕微鏡を用いて暗視野法で5万〜10万の倍率で写真撮影し、前記写真の中間相の全面積(中間相内にある結晶性粒子の面積を含む)と、中間相内にある結晶化領域(明るく見える部分)の占める面積を面積計にてそれぞれ測定し、その割合を算出し、その平均値をもって中間相中の結晶化比率とした。
【0029】
【発明の効果】
本発明の複合材は、セラミックスと金属(アルミニウム)との境界に存在する中間相の結晶化度が高いので、セラミックス回路基板と同程度に小さい熱膨張率を有しながら、しかも高熱伝導率であるので、セラミックス回路基板のヒートシンクに用いて、高信頼性のモジュールを提供でき、有用である。
また、本発明の複合材は、いろいろなセラミックスと接合して用いることができ、各種の放熱部品に適用できるし、本発明の複合材は軽量なので、電気、車両、ひいては飛行機等の軽量構造体として用いることもできる。
【図面の簡単な説明】
【図1】 本発明の実施例5に係る金属−セラミックス複合体のアルミニウムと炭化珪素との境界に存在する中間相の結晶化の状況を示す模式図。
【図2】 従来公知の金属(アルミニウム)−セラミックス(炭化珪素複合体)の透過型顕微鏡観察下での微細構造を示す模式図。[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a metal ceramic composite (hereinafter referred to as a composite) obtained by infiltrating (also referred to as impregnation) a metal into a porous ceramic structure, particularly to a heat sink material for a power module such as an IC package, IGBT, or GTO. Relates to a suitable complex.
[0002]
[Prior art]
In the semiconductor field, the amount of heat generated by silicon chips has been increasing steadily, in addition to the progress of integration and speeding up of LSIs, and the expansion of applications of power devices such as GTO and IGBT. At the same time, circuit boards that release heat generated from silicon chips and heat sinks are also required to have higher performance.
[0003]
Specifically, for the circuit board, a ceramic substrate such as alumina, aluminum nitride, silicon nitride or the like having good thermal conductivity is used, and the heat conductivity of the heat sink itself used by being bonded thereto is high. In addition, when both are combined and modularized, it is desirable that the thermal expansion coefficients of the circuit board and the heat sink are close. This is because the thermal stress generated due to the heat generated from the semiconductor element during actual use destroys the circuit board, degrades the electrical insulation and thermal conductivity of the circuit board, and decreases the reliability as a module. It is because it becomes the cause to make it.
[0004]
In fields where high reliability is important, such as electricity or vehicle applications such as automobiles, due to the above circumstances, a metal-ceramic composite (hereinafter referred to as composite) is used as a heat sink having a thermal expansion coefficient close to that of a ceramic circuit board. Application is proceeding (Japanese Patent Laid-Open Nos. 64-83634 and 9-209058).
[0005]
The composite is generally produced by forming ceramic powder, ceramic fiber, etc., and firing it if necessary to produce a porous ceramic structure, then impregnating with molten metal and cooling it. . As a method for impregnating the molten metal, a method based on a powder metallurgy method, for example, a die casting method (Japanese Patent Laid-Open No. 5-508350) or a molten metal forging method (Materia, Vol. 36, No. 1, 1997, 40- Various methods such as a method by high pressure casting such as page 46) and a method by spontaneous infiltration (Japanese Patent Laid-Open No. 2-197368) are known.
[0006]
[Problems to be solved by the present invention]
As an example of a typical aluminum-silicon carbide composite as a metal-ceramic composite, the thermal conductivity is about 120 to 170 W / (m · K), and the heat of a copper plate conventionally used as a heat sink. It is less than half of the conductivity (about 400 W / (m · K)). For this reason, even if it is intended to use the composite as a heat sink, heat generated from electronic components such as semiconductor elements cannot be released due to its lower thermal conductivity and lower heat dissipation than conventionally known copper heat sinks. However, since the temperature of the electronic component, particularly the semiconductor element itself, rises, there is a problem that malfunction and thermal runaway are likely to occur. In view of the above circumstances, it has been desired to develop a heat sink material having a thermal expansion coefficient close to that of a ceramic circuit board and further improving the thermal conductivity.
[0007]
The present invention has been made in view of the above circumstances, and an object thereof is to provide a metal-ceramic composite having a thermal expansion coefficient as small as that of a ceramics circuit board and having a high thermal conductivity. An object of the present invention is to provide a heat sink that, when used as a heat sink for a ceramic circuit board, does not deteriorate the electrical insulation and thermal conductivity of the ceramic circuit board and lowers the reliability as a module.
[0008]
[Means for Solving the Problems]
The present invention relates to a composite formed by impregnating a porous ceramic structure with an aluminum-based metal containing magnesium, and an intermediate phase existing at the boundary between the ceramic particles and the metal particles in the composite is transmissive. The composite is characterized in that the area ratio of the crystallization region of the intermediate phase obtained from an electron microscopic image is 20% or more, preferably, the porous ceramic structure is made of silicon carbide having a porosity of 20 to 50%. The composite as described above, which is a ceramic structure having a main component.
[0009]
The present invention also provides a heat sink for a circuit board, characterized by using the above composite.
[0010]
In addition, the present invention is a method for producing a composite, wherein the porous ceramic structure is impregnated with an aluminum-based metal containing magnesium and then heat-treated at 700 ° C. to 1000 ° C.
[0011]
DETAILED DESCRIPTION OF THE INVENTION
In general, the coefficient of thermal expansion and thermal conductivity of a metal-ceramic composite depend largely on the type of metal and ceramic constituting the metal and the mixing ratio thereof, and can be obtained by determining the type of metal and ceramic. The thermal conductivity of the resulting composite is almost determined.
[0012]
However, as a result of extensive studies by the present inventors, regarding the thermal conductivity of the composite, an intermediate phase exists at the boundary between the metal and the ceramic constituting the composite, and the crystallization state of the intermediate phase is composite. The present inventors have obtained the knowledge that a metal-ceramic composite having a higher thermal conductivity than the conventional one can be obtained by largely controlling the thermal conductivity of the body, and by proceeding with the crystallization of the intermediate phase. is there.
[0013]
That is, a scanning electron microscope (SEM) was used for a metal-ceramic composite obtained by high-pressure impregnation by die casting at a temperature of 800 ° C. using silicon carbide (SiC) as ceramics and aluminum-based alloy (AC4C) as metals. The structure observed in 1 has a microstructure in which ceramic particles are scattered in an island shape in a metal matrix.
[0014]
FIG. 2 is a schematic diagram of a transmission electron microscopic photographic image obtained when the boundary between the metal and ceramic particles is photographed with a transmission electron microscope (TEM: JEOL Ltd. JEM2010; acceleration voltage 200 KV). This shows that an intermediate phase exists at the boundary between metal (aluminum) and ceramics (SiC). With respect to this intermediate phase, elemental analysis of the local portion was performed by characteristic X-rays generated from the intermediate phase by narrowing the electron beam. As a result, oxygen was detected in addition to elements such as Al, Si, and a small amount of Mg. It was found that the metal oxide was composed of the metal oxide. Furthermore, it was also found by the electron beam diffraction method performed at the same time that fine crystal particles were slightly scattered inside the intermediate layer, and the portions other than the crystal particles were amorphous.
[0015]
Based on the knowledge obtained by the above analysis, the present inventors can further improve the thermal conductivity of the metal-ceramic composite by advancing crystallization of the intermediate phase existing at the boundary between the metal and the ceramic. As a result of considering and experimentally examining, when using an aluminum-based metal containing magnesium, it was found that the crystallization of the intermediate phase can be enhanced by positively presenting the Mg component in the intermediate phase, The present invention has been achieved.
[0016]
That is, the present invention is a composite formed by impregnating a porous ceramic structure with an aluminum-based metal containing magnesium, and the intermediate phase present at the boundary between the ceramic particles and the metal particles in the composite, The composite is characterized in that the area ratio of the crystallization region of the intermediate phase obtained from a transmission electron microscope image is 20% or more.
[0017]
In the present invention, examples of the aluminum-based metal containing magnesium include AC1B, AC4A, AC4C, AC4CH, AC4D, and AC5A. Aluminum or an aluminum alloy and magnesium or an alloy thereof can be appropriately mixed at the time of impregnation. . If the amount of magnesium at this time is 0.15 wt% to 6 wt% above, the object of the present invention can be sufficiently achieved. On the other hand, from the viewpoint of ease of casting, it is desirable to use an aluminum alloy having a Si content of 4 to 10%, that is, an alloy such as AC2A, AC2B, AC4A, AC4B, AC4C, AC4D, AC8B, and AC8C. AC4A, AC4C, AC4CH and AC4D containing both Mg and Si are preferred and selected.
[0018]
The porous ceramic structure used in the present invention may be anything as long as it does not cause problems such as reaction or breakage when impregnated with the aluminum-based metal. However, since the coefficient of thermal expansion of the resulting structure needs to be as low as that of ceramic circuit boards such as alumina, aluminum nitride, silicon nitride, silicon carbide, etc., the materials having similar characteristics to the ceramic circuit boards such as alumina and nitride Aluminum, silicon nitride, silicon carbide, silicon oxide and the like are preferable. Among these, silicon carbide having a high thermal conductivity and a low thermal expansion coefficient is preferable. In addition, a ceramic structure containing a large amount of magnesium, such as magnesium oxide or silicon nitride using magnesium oxide as a sintering aid, is selected as the ceramic structure. Even when an alloy is selected, there are cases where the effects of the present invention can be obtained. However, in these methods, a composite having a stable and low thermal expansion coefficient and high thermal conductivity may not be obtained.
[0019]
The aluminum-silicon carbide composite is an excellent combination in terms of thermal expansion compatibility with the ceramic circuit board and heat dissipation. However, if the silicon carbide content in the aluminum-silicon carbide composite is less than 50% by volume, the coefficient of thermal expansion is high, resulting from the occurrence of residual stress due to the difference in thermal expansion between the ceramic circuit board and the composite. Problems such as destruction of the ceramic circuit board are likely to occur. In addition, since the thermal conductivity of ceramics decreases at a high temperature, when the silicon carbide content in the composite exceeds 80% by volume, the thermal conductivity decreases at a high temperature. Therefore, the silicon carbide content in the aluminum-silicon carbide composite is preferably in the range of 50 to 80% by volume.
[0020]
Next, as a method for producing the composite of the present invention, first, a conventionally known method, that is, a spontaneous permeation method using a high-pressure casting method or a chemical reaction is applied, and magnesium is applied to the porous ceramic structure. Impregnated aluminum-based metal contained. In this case, a high pressure casting method such as a die casting method is desirable from the viewpoint of not selecting a metal or a ceramic porous body to be used.
[0021]
In the present invention, after the impregnation operation, the intermediate phase existing at the boundary between the metal and the ceramic is crystallized by heat treatment at 700 ° C. or more and 1000 ° C. or less. By this operation, 20% or more of the intermediate phase is crystallized by area ratio, and high thermal conductivity of the composite is achieved. If the heat treatment temperature is less than 700 ° C., it takes time for crystallization, which is not preferable in terms of productivity. If it exceeds 1000 ° C., the evaporation of aluminum becomes large and a pressurized atmosphere is required, so excessive equipment is required. As a result, the cost increases. 700 to 1000 ° C. is a preferred range.
[0022]
The composite of the present invention has a coefficient of thermal expansion as small as that of a ceramic circuit board such as alumina, aluminum nitride, silicon nitride and the like, and has a high thermal conductivity. Therefore, when the composite is mounted as a heat sink for the ceramic circuit board In addition, a highly reliable module can be configured without causing damage or the like of the circuit board even by a thermal shock received under actual use.
[0023]
Hereinafter, the present invention will be described in more detail with reference to Examples and Comparative Examples.
[0024]
【Example】
[Examples 1 to 5, comparative example]
4 wt% of colloidal silica (Nissan Chemical; Snowtex) is added to SiC powder (Yakushima Electric Works; GC1000F), mixed, press-molded, dried at 150 ° C., and solidified. Next, it heated at 800 degreeC in air | atmosphere for 1 hour, and obtained the SiC porous structure with a porosity of 35%.
[0025]
The SiC porous structure was impregnated with an AC4C alloy at 800 ° C. by a die casting method to produce an aluminum-silicon carbide composite. The thermal conductivity of this composite was measured by a laser flash method (Rigaku Corporation; FA8510B), then ground and polished using a diamond grindstone, and the area ratio of the crystallization region of the intermediate phase using a transmission electron microscope Was 12%, and the thermal conductivity was 132 W / (m · K).
[0026]
The aluminum-SiC composite was held in a nitrogen atmosphere at 750 ° C. for 0 to 60 minutes, heat treated, and the relationship between the ratio of the crystallized region of the intermediate layer and the thermal conductivity was examined. The results are shown in Table 1. It was confirmed that the thermal conductivity improved as the heat treatment time increased and the area ratio of the crystallization region of the intermediate layer increased. In Example 5, it was confirmed that most of the intermediate layer was composed of crystallized fine particles (see FIG. 1).
[0027]
[Table 1]
[0028]
The area ratio of the crystallization region of the intermediate phase was measured by randomly selecting at least five locations for the specimen obtained by grinding and polishing the composite using a diamond grindstone. Take a photo at a magnification of 50,000 to 100,000 with a dark field method using a microscope. The total area of the intermediate phase (including the area of crystalline particles in the intermediate phase) and crystals in the intermediate phase The area occupied by the crystallization region (the part that looks bright) was measured with an area meter, the ratio was calculated, and the average value was taken as the crystallization ratio in the intermediate phase.
[0029]
【The invention's effect】
Since the composite material of the present invention has a high degree of crystallinity of the intermediate phase present at the boundary between ceramics and metal (aluminum), it has a low thermal expansion coefficient as high as that of a ceramic circuit board, and also has high thermal conductivity. Therefore, a highly reliable module can be provided by using it as a heat sink for a ceramic circuit board, which is useful.
In addition, the composite material of the present invention can be used by joining with various ceramics, and can be applied to various heat dissipation parts. Since the composite material of the present invention is lightweight, it is a lightweight structure such as electricity, vehicle, and airplane. Can also be used.
[Brief description of the drawings]
FIG. 1 is a schematic diagram showing a state of crystallization of an intermediate phase existing at a boundary between aluminum and silicon carbide of a metal-ceramic composite according to Example 5 of the present invention.
FIG. 2 is a schematic view showing a fine structure of a conventionally known metal (aluminum) -ceramic (silicon carbide composite) under observation with a transmission microscope.
Claims (4)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP30563797A JP3813007B2 (en) | 1997-11-07 | 1997-11-07 | Composite, heat sink using the same, and method of manufacturing composite |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP30563797A JP3813007B2 (en) | 1997-11-07 | 1997-11-07 | Composite, heat sink using the same, and method of manufacturing composite |
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| Publication Number | Publication Date |
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| JPH11139889A JPH11139889A (en) | 1999-05-25 |
| JP3813007B2 true JP3813007B2 (en) | 2006-08-23 |
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Cited By (1)
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| CN106048368A (en) * | 2016-06-22 | 2016-10-26 | 陆志强 | High-heat-resisting silicide base metal ceramic die and preparing method thereof |
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| JP6839981B2 (en) * | 2014-07-24 | 2021-03-10 | デンカ株式会社 | Complex and its manufacturing method |
| JP6443727B2 (en) * | 2014-09-30 | 2018-12-26 | 日立金属株式会社 | Aluminum alloy-ceramic composite |
| CN104405101B (en) * | 2014-10-11 | 2018-10-26 | 杭州诺贝尔陶瓷有限公司 | A kind of transmutation Antique Imitation Tiles and its production method |
| JP2022013968A (en) * | 2018-11-14 | 2022-01-19 | デンカ株式会社 | Package and packing box for receiving heat radiation substrate |
| JP6703635B1 (en) * | 2019-06-05 | 2020-06-03 | デンカ株式会社 | Package and packing box for housing the heat dissipation board |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106048368A (en) * | 2016-06-22 | 2016-10-26 | 陆志强 | High-heat-resisting silicide base metal ceramic die and preparing method thereof |
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