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JP3818751B2 - Supercritical fluid cleaning equipment - Google Patents
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JP3818751B2 - Supercritical fluid cleaning equipment - Google Patents

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JP3818751B2
JP3818751B2 JP25825497A JP25825497A JP3818751B2 JP 3818751 B2 JP3818751 B2 JP 3818751B2 JP 25825497 A JP25825497 A JP 25825497A JP 25825497 A JP25825497 A JP 25825497A JP 3818751 B2 JP3818751 B2 JP 3818751B2
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cleaning
tank
pressure
supercritical fluid
solvent
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JPH1190362A (en
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洋一 古川
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Sharp Corp
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Sharp Corp
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Description

【0001】
【発明の属する技術分野】
本発明は、半導体・液晶ディスプレイなどの微細加工部品や一般的な金属加工等の洗浄で超臨界流体を利用した洗浄装置に関する。
【0002】
【従来の技術】
近年、電子部品等の洗浄における脱フロン化の流れに伴い、超臨界流体を用いた洗浄方式が注目されている。
【0003】
超臨界流体とは、物質固有の臨界圧力・臨界温度を越えた一領域に有る流体のことを指し、気体や液体とは異なる特性を有している。つまり、気体と液体の中間粘度・拡散係数・密度・溶解力を持っており、それらの数値が圧力と温度のバランスによって大きく変動する。また、元来気体を圧縮することで生成するため、圧力を通常圧に戻すと気体として振る舞う。
【0004】
超臨界流体による洗浄は、従来から用いられてきた超臨界抽出・超臨界流体クロマトグラフィーと同様な機構を有する。これらの装置は、超臨界流体にするべき洗浄媒質を保持する容器と流体を圧縮し超臨界流体に変換するポンプとワークを入れる耐圧洗浄槽・耐圧配管・洗浄後のワークからでた汚れを分離する分離槽及び排気部分からなる。
【0005】
そして、洗浄動作は以下のようにして行う。つまり、まず、耐圧洗浄槽内に洗浄しようとするワークを入れ、続いて、高圧ポンプと温度制御装置により温度と圧力を適度に制御された超臨界流体を上記耐圧洗浄槽内に送液する。そして、送液された超臨界流体とワークを接触させることで、超臨界流体の特性である高い溶解度と高い拡散係数を利用し洗浄を行う。
【0006】
尚、超臨界流体の洗浄媒質として主に使用される材料は、炭酸ガス、亜硫酸ガス、亜酸化窒素、エタン、プロパン、CFC13等である。
【0007】
【発明が解決しようとする課題】
上記したように、超臨界流体は極めて高い洗浄性能を有しているが、現状では短時間での洗浄処理が非常に困難であるという問題を有している。この原因としては、超臨界流体生成のために洗浄溶媒(二酸化炭素等)を高温,高圧状態とするのに時間がかかることが挙げられる。
【0008】
また、電子部品や液晶パネル等のワークを洗浄する場合、除去したい汚染物質にもよるが、通常、ワークと超臨界流体との接触を複数回行う。この場合、ワークに接触させている超臨界流体を置換する際に時間がかかると、1枚のワークの洗浄に多大な時間を要することとなり、生産性の点で大きな問題となる。
【0009】
この問題を解決する方法として、洗浄槽の他にバッファタンクを設けておき、洗浄槽における被洗浄物質の洗浄中にバッファタンク内に高温,高圧の流体を生成貯蔵すること、つまり、バッファタンクを利用することで洗浄と、高温,高圧流体の生成を同時に行うことが考えられる。
【0010】
図6は、バッファタンクを備えた洗浄装置の一例を示す図である。この洗浄装置では、以下のようにして被洗浄物質の洗浄を行う。
【0011】
(1)まず、汚れが付着したワークが、洗浄槽4内に搬送される。
【0012】
(2)次に、洗浄溶媒(炭酸ガスCO2)を貯蔵したタンク1からバルブV1を通して、洗浄溶媒が供給される。
【0013】
(3)洗浄溶媒は、圧縮ポンプ8により加圧されるとともに、ヒータ7により昇温されて、洗浄槽4に供給される。ここで、洗浄溶媒は超臨界状態となっている。
【0014】
(4)バルブV3が閉とされる。これにより、圧縮ポンプ8を含む供給系統と洗浄槽4との接続が解除される。
【0015】
(5)洗浄槽4において、超臨界流体とワークとの接触が所定時間行われると、バルブV4が開とされ、洗浄槽4内の超臨界流体の一部が膨張タンク3に導入される。これにより、洗浄槽4内の圧力が低下し超臨界流体は液体状態へと遷移させられる。このとき、汚染物質は液体中に溶け込んでいる。
【0016】
(6)この後、バルブV5が開とされ、圧力差や高低差により、洗浄槽4内の液体状態の洗浄溶媒が分離槽5に移送される。移送完了後バルブV5が閉とされる。この工程により、汚染物質の溶け込んだ液体が洗浄槽4から排出されたこととなる。
【0017】
(7)ワークを複数回洗浄する場合には、上記(5),(6)と平行して、バルブV2を介してタンク1からバッファタンク2へと洗浄溶媒が供給される。このとき、洗浄溶媒は圧縮ポンプ8により洗浄時点における約2倍の圧力まで加圧される(洗浄槽4とバッファタンク2が略同一の大きさである場合)。そして、(6)の工程後に、バッファタンク2から洗浄槽4の洗浄溶媒の供給が行われ、新たな超臨界流体によるワークの洗浄がなされる。
【0018】
(8)洗浄回数に応じて(5)〜(7)の工程が繰り返される。
【0019】
(9)続いて、減圧工程に移行する。ここでは、圧力調整弁C2が閉の状態で、V4が開とされる。洗浄槽4内の洗浄溶媒は膨張タンク3の容量分膨張しこれにより減圧させられる。
【0020】
(10)圧力平衡状態になればV4が閉、圧力調整弁C3が開とされ、膨張タンク3が大気圧まで減圧させられる。減圧完了後、再度圧力調整弁C2が閉とされる。
【0021】
(11)ここで、耐圧洗浄槽4内と膨張タンク3内の圧力平衡状態が規定圧力以下になるまで(9),(10)の処理が複数回繰り返される。そして、耐圧洗浄槽4内と膨張タンク3が規定圧力以下になると、バルブ4及び圧力調整弁C2が開とされ、耐圧洗浄槽4内及び膨張タンク3内の圧力が大気圧まで減圧させられる。
【0022】
(12)耐圧洗浄槽4内よりワークが取り出され、洗浄動作が終了となる。
【0023】
このような洗浄動作では、ワークの洗浄と平行してバッファタンク2内に洗浄溶媒が加圧貯蔵されるため、洗浄時(5)においては、超臨界流体は圧力制御なされない。このため、洗浄時に圧力変動が生じ、洗浄動作を正確に制御することができず、場合によっては、不十分な洗浄しかできないこともある。
【0024】
本発明は、上記課題を解決するものであって、精密な洗浄動作と洗浄工程時間の減少を実現することのできる超臨界流体洗浄装置を提供することを目的とする。
【0025】
【課題を解決するための手段】
請求項1に記載の超臨界流体洗浄装置は、超臨界状態の洗浄溶媒(超臨界流体)に被洗浄物を接触させることで、被洗浄物の洗浄を行う超臨界流体洗浄装置において、
内部に被洗浄物を載置する洗浄槽と、
該洗浄槽と少なくともバルブを介して接続され、前記洗浄槽内に導入する洗浄溶媒を貯蔵するバッファタンクと、
洗浄溶媒を供給する供給部から前記洗浄槽及び前記バッファタンクへの供給ライン中に設けられ、洗浄溶媒を前記バッファタンク内に加圧導入するとともに、前記被洗浄物の洗浄時に前記洗浄槽内の圧力が一定圧となるよう洗浄溶媒を加圧する昇圧器と、
該昇圧器による昇圧条件を、前記バッファタンク内に洗浄溶媒を導入する場合と、前記洗浄槽内で前記被洗浄物を洗浄する場合と、で異ならせる昇圧制御器と、
前記洗浄槽及び前記バッファタンクと前記供給部とを接続するとともに前記供給ラインとで循環経路を形成する循環ライン中に設けられた圧力調整器と、
該圧力調整器による調圧条件を、前記バッファタンク内に洗浄溶媒を導入する場合と、前記洗浄槽内で前記被洗浄物を洗浄する場合と、で異ならせる調圧制御器と、を有してなるものである。
【0029】
【発明の実施の形態】
図1は、本発明の超臨界流体洗浄装置の構成の一例を示す図である。
【0030】
図1の装置は、液化CO2供給タンク1、昇圧した液化CO2を一時貯蔵するバッファタンク2、超臨界状態に強制的な断熱膨張を起こさせる膨張タンク3、ワークを入れる耐圧洗浄槽4、汚れを分離する分離槽5、冷却器6、温度を上昇する加熱器7、圧力を上昇させる昇圧ポンプ8、バルブV1〜5、圧力調整弁C1〜3を有している。なお、耐圧洗浄槽4には槽内の圧力、温度を検知するためのセンサが取り付けられている。
【0031】
また、昇圧ポンプ8はインバータ15に、調整バルブC1,C2,C3はバルブコントローラ16,17,18に基づき動作する。また、インバータ15,バルブコントーラ16,17,18は主制御部19に指示されて動作する。
【0032】
以上のような構成の本発明の超臨界流体洗浄装置では、主制御部19を用いて、洗浄時において、昇圧ポンプ8と圧力調整弁C1を2通りのモード(粗洗浄モード,精密洗浄モード)で制御する。図2は粗洗浄モードにおける制御フローを、図3は精密洗浄モードにおける制御フローを示す図3である。
【0033】
以下に、図1に示した超臨界流体による洗浄動作を、図2,3のフロー図及び図4の洗浄動作フロー図を用いて説明する。なお、ここではワークを2回洗浄(粗洗浄及び精密洗浄)する例について説明する。
【0034】
(A)まず、汚れが付着したワークを、洗浄槽4内に搬送する。図5は、洗浄槽4へワークを搭載する様子を説明する図である。この図に示すとおり、ワーク13は洗浄槽4の蓋11に取り付けられたワーク固定治具兼加熱器12に汚染物質が付着したワーク13を搭載している。
【0035】
(B)次に、まず以下の手順により洗浄槽4内に超臨界流体を送液する。
B−1:バルブV1を開け、液化CO2供給タンク1より液化CO2を供給する。なお、圧力調整弁C1を全閉とする。
B−2:冷却器6により液化CO2を冷却するとともに、昇圧ポンプ8によりその昇圧を行う。そして、フィルタF1により濾過し、バルブV3,加熱器7を介して、洗浄槽4内部に貯蔵する。このとき、昇圧ポンプ8,圧力調整弁C1は後述する図2のD−1のフローで制御して、CO2ガスを昇圧する。なお、洗浄槽4内の圧力は圧力センサにより検知する。
【0036】
(C)続いて、事前登録されたワークの洗浄条件に基づきワークの洗浄を行うが、本実施の形態では、まず、ワークの粗洗浄を以下の手順で行う。
C−1:上記圧力センサの検知結果を受けて、バルブV3を閉じる。ここにおいて、洗浄槽4内のCO2は、昇圧ポンプ8及び加熱器7による加圧昇温(例えば、圧力75〜76kgf/cm2,温度31℃)により超臨界流体となっており、ワークの洗浄が開始される。
C−2:所定時間の洗浄を行った後、洗浄溶媒(CO2)の一部を排出することで、洗浄溶媒中に溶け込んだ汚染物質を除去する。具体的には、バルブV4を開け、超臨界流体の一部を膨張タンク3に導入する。超臨界流体は断熱膨張を起こし、洗浄槽4内の超臨界流体は液化CO2に相変化する。
C−3:その後、バルブV5を開き、圧力差や高低差を用いて分離槽に液化CO2を移送する。移送完了後バルブV5を閉じる。この段階で、洗浄槽4には気体のCO2のみが残ることになる。1回目の洗浄時に除去された汚染物質は、上記C−2の工程により、液体状態のCO2に溶け込むため、本工程により汚染物質は洗浄槽4の外に排出されることとなる。
【0037】
(D)上記(C)の工程と平行して、バッファタンク2に、加圧されたCO2ガスを以下の手順で貯蔵する。
D−1:液化CO2供給タンク1からの液化CO2を冷却器6を用いて冷却するとともに、昇圧ポンプ8によりその昇圧を行う。そして、フィルタF1により濾過し、バルブV2を介して、バッファタンク2内部に貯蔵する。
このとき、昇圧ポンプ8及び圧力調整弁C1は、図2のD−1に示すように制御する。すなわち、主制御部19からインバータ15,バルブコントローラ16に昇圧指令を送り、圧力調整バルブC1は全閉状態とし、インバータ15を高効率状態(ポンプの送りモータを高効率状態とする)として、昇圧ポンプ8により設定圧力(洗浄槽4の規定圧力の約2倍の圧力(バッファタンク2が洗浄槽4とほぼ同一の大きさである場合))まで昇圧する。
D−2:バッファタンク2内が初期昇圧の設定圧力近傍の圧力となったことを圧力センサが検知すると、主制御部19が昇圧ポンプ8の回転数を下げるようインバータ15に指示する。同時に、圧力調整弁C1のコントロールを開始し、バッファタンク2を圧力が設定圧力に保てるところまで開ける(図2のD−2参照)。
D−3:バッファタンク2内が規定圧力になったところでV2のバルブを閉め、バッファタンク2に貯蔵する。これにより、配管内の昇圧されたCO2は、昇圧ポンプ8,フィルターF1,圧力調整弁C1,冷却器6からなる循環ライン中を、バッファタンク2内部と同等の圧力を保持したまま、循環することになる。
【0038】
(E)次に、2回目の洗浄(精密洗浄)を行うために、バルブV2,V3を開け、バッファタンク2に貯蔵したCO2を加熱器7で設定温度(臨界温度31.06℃以上)に加熱して、超臨界流体に変化させ、洗浄槽4に供給する。ここで、バッファタンク2の設定圧力が洗浄槽4の設定圧力の約2倍であるため、バルブ解放によって瞬時に圧力平衡が生じ、洗浄槽4内には設定圧力の超臨界流体が得られる。
【0039】
(F)2回目の洗浄(精密洗浄)を以下の手順で行う。
F−1:バルブV2を閉じる。ここにおいて、洗浄槽4内のCO2は、昇圧ポンプ8及び加熱器7による加圧昇温により超臨界流体となっており、ワークの洗浄が開始される。そして、本精密洗浄の際には、バルブV3が開いており、主制御部19からの指令を受けたインバータ15,バルブコントローラ16の指示に基づき、圧力調整弁C1の設定は洗浄槽4の設定圧に変更され、昇圧ポンプ8のストロークもしくは速度も変更される(図3のフロー図参照)。これにより洗浄槽4内部の圧力が一定となり、温度も安定化される(例えば、圧力75〜76kgf/cm2,温度40℃)。
F−2:所定時間の洗浄を行った後、洗浄溶媒(CO2)の一部を排出することで、洗浄溶媒中に溶け込んだ汚染物質を除去する。具体的には、バルブV3を閉じ、バルブV4を開け、超臨界流体の一部を膨張タンク3に導入する。超臨界流体は断熱膨張を起こし、洗浄槽4内の超臨界流体は液化CO2に相変化する。
F−3:その後、バルブV5を開き、圧力差や高低差を用いて分離槽6に液化CO2を移送する。移送完了後バルブV5を閉じる。この段階で、洗浄槽4には気体のCO2のみが残ることになる。1回目の洗浄時に除去された汚染物質は、上記C−2の工程により、液体状態のCO2に溶け込むため、本工程により汚染物質は洗浄槽4の外に排出されることとなる。
【0040】
(G)次に、減圧工程に入る。
G−1:圧力調整弁C2を閉じ、バルブV4を開ける。耐圧洗浄槽4内のガスは膨張タンク3の容量分膨張し圧力は減少する。
G−2:圧力平衡状態になればV4を閉じ圧力調整弁C3を開けて膨張タンク3を大気圧まで減圧させる。減圧が完了すると再度C2の圧力調整弁を閉める。
G−3:耐圧洗浄槽4内と膨張タンク3内の圧力平衡状態が規定圧力以下になるまでG−1,G−2の処理を複数回繰り返す。
【0041】
(H)耐圧洗浄槽4内と膨張タンク3が規定圧力以下になると、バルブV4及び圧力調整弁C2を開け、耐圧洗浄槽4内及び膨張タンク3内の圧力を大気圧まで減圧させる。そのとき、治具固定具兼ヒータに通電する。それにより、断熱膨張による冷却されたワークの温度回復を促す。
【0042】
(I)耐圧洗浄槽4内よりワークを取り出して洗浄を終了する。
【0043】
本実施の形態の超臨界流体洗浄方法では、上記の(A)〜(I)の工程により、洗浄槽内の圧力を制御しない粗洗浄と、洗浄槽内の圧力を制御する精密洗浄の2回洗浄を行う。従って、粗洗浄時に、昇圧ポンプを使用してバッファタンクに高圧ガスを貯蔵することができる、。また、精密洗浄時には、昇圧ポンプを使用して圧力の精密制御を行い、ワークをより一層清浄化することができる。
【0044】
また、圧力調整弁を、CO2を昇圧するラインと循環経路をなすライン中に配しているため、洗浄中に炭酸供給タンクから新たに洗浄溶媒(CO2)を供給しなくても、圧力を一定に保つことができ、洗浄溶媒の消費量を低くすることができる。また、上記したD−3の工程のように、待機時に配管内で洗浄溶媒を循環させ配管内を高圧に保つことが可能であり、次回の洗浄時において配管内の洗浄溶媒を昇圧するために要する時間を短縮できる。
【0045】
なお、上記工程では、粗洗浄と精密洗浄を1回ずつ連続して行ったが、本発明の超臨界流体洗浄方法はこれに限るものではなく、少なくとも粗洗浄と精密洗浄を1回ずつ行えば良い。ただし、精密洗浄時にはバッファタンク内に高圧ガスを貯蔵することができないため、精密洗浄は最後の1回だけにしておくことが、高速洗浄を実現するうえでは望ましい。
【0046】
また、なお、上記工程では、1番最初の洗浄槽への超臨界流体の貯蔵を、炭酸供給タンクから直接行ったが、もちろん、一旦バッファタンク内に高圧ガスを貯蔵してから洗浄槽に移送しても良い。
【0047】
さらに、洗浄溶媒はCO2に限らないことは言うまでもない。
【0048】
【発明の効果】
本発明では、ワークを少なくとも粗洗浄と精密洗浄とで洗浄を行うため、ワークをより一層清浄化することができる。また、粗洗浄時にバッファタンクに高圧の洗浄溶媒を貯蔵することで、洗浄時間の短縮を実現できる。
【0049】
また、昇圧ポンプを含む供給ラインとで循環経路をなすライン中に圧力調整弁を設けておくことで、精密洗浄時に新たな洗浄溶媒を供給する必要がなくなり、洗浄溶媒の消費量を低減することができる。
【図面の簡単な説明】
【図1】本発明の超臨界流体洗浄装置の一例を示す図である。
【図2】粗洗浄時の制御方法を説明するフロー図である。
【図3】精密洗浄時の制御方法を説明するフロー図である。
【図4】洗浄動作の流れを説明するフロー図である。
【図5】図1における洗浄槽4の詳細を示す図である。
【図6】バッファタンクを有する超臨界流体洗浄装置の一例を示す図である。
【符号の説明】
1 炭酸供給タンク(供給部)
2 バッファタンク
4 洗浄槽
8 昇圧ポンプ(昇圧器)
15 インバータ
16 バルブコントローラ
19 主制御部(制御器)
C1 圧力調整弁(圧力調整器)
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a washing KiyoshiSo location using supercritical fluids in micromachined components and general metalworking such cleaning of semiconductors, liquid crystal displays.
[0002]
[Prior art]
In recent years, a cleaning method using a supercritical fluid has attracted attention with the flow of defluorination in cleaning electronic parts and the like.
[0003]
A supercritical fluid refers to a fluid in a single- phase region that exceeds the critical pressure / critical temperature inherent to a substance, and has characteristics different from those of gases and liquids. In other words, it has the intermediate viscosity, diffusion coefficient, density, and dissolving power of gas and liquid, and these values vary greatly depending on the balance between pressure and temperature. Moreover, since it is generated by compressing the gas originally, it behaves as a gas when the pressure is returned to the normal pressure.
[0004]
Washing with a supercritical fluid has the same mechanism as conventional supercritical extraction / supercritical fluid chromatography. These devices separate containers that hold cleaning media to be made into supercritical fluid, pumps that compress the fluid and convert it to supercritical fluid, and pressure-resistant washing tanks, pressure-resistant piping, and workpieces after washing. It consists of a separation tank and an exhaust part.
[0005]
The cleaning operation is performed as follows. That is, first, a workpiece to be cleaned is placed in the pressure-resistant cleaning tank, and then a supercritical fluid whose temperature and pressure are appropriately controlled by a high-pressure pump and a temperature control device is fed into the pressure-resistant cleaning tank. Then, by bringing the supercritical fluid sent into contact with the workpiece, cleaning is performed using the high solubility and high diffusion coefficient that are the characteristics of the supercritical fluid.
[0006]
Note that materials mainly used as the cleaning medium for the supercritical fluid are carbon dioxide gas, sulfurous acid gas, nitrous oxide, ethane, propane, CFC13, and the like.
[0007]
[Problems to be solved by the invention]
As described above, the supercritical fluid has extremely high cleaning performance, but currently has a problem that cleaning in a short time is very difficult. This is because it takes time to bring the cleaning solvent (carbon dioxide or the like) to a high temperature and high pressure state in order to generate a supercritical fluid.
[0008]
Also, when cleaning a workpiece such as an electronic component or a liquid crystal panel, the workpiece and the supercritical fluid are usually contacted multiple times, depending on the contaminant to be removed. In this case, if it takes time to replace the supercritical fluid in contact with the workpiece, it takes a lot of time to clean one workpiece, which is a big problem in terms of productivity.
[0009]
As a method for solving this problem, a buffer tank is provided in addition to the cleaning tank, and a high-temperature and high-pressure fluid is generated and stored in the buffer tank during cleaning of the material to be cleaned in the cleaning tank. It can be considered that cleaning and generation of high-temperature and high-pressure fluid are performed simultaneously.
[0010]
FIG. 6 is a diagram illustrating an example of a cleaning device including a buffer tank. In this cleaning apparatus, the material to be cleaned is cleaned as follows.
[0011]
(1) First, the workpiece with the dirt attached is conveyed into the cleaning tank 4.
[0012]
(2) Next, the cleaning solvent is supplied from the tank 1 storing the cleaning solvent (carbon dioxide CO 2 ) through the valve V1.
[0013]
(3) The cleaning solvent is pressurized by the compression pump 8, heated by the heater 7, and supplied to the cleaning tank 4. Here, the cleaning solvent is in a supercritical state.
[0014]
(4) The valve V3 is closed. Thereby, the connection between the supply system including the compression pump 8 and the cleaning tank 4 is released.
[0015]
(5) In the cleaning tank 4, when contact between the supercritical fluid and the workpiece is performed for a predetermined time, the valve V <b> 4 is opened and a part of the supercritical fluid in the cleaning tank 4 is introduced into the expansion tank 3. Thereby, the pressure in the cleaning tank 4 is lowered, and the supercritical fluid is changed to a liquid state. At this time, the pollutant is dissolved in the liquid.
[0016]
(6) Thereafter, the valve V5 is opened, and the cleaning solvent in the liquid state in the cleaning tank 4 is transferred to the separation tank 5 due to a pressure difference or a height difference. After the transfer is completed, the valve V5 is closed. By this step, the liquid in which the pollutant is dissolved is discharged from the cleaning tank 4.
[0017]
(7) When the workpiece is washed a plurality of times, the washing solvent is supplied from the tank 1 to the buffer tank 2 via the valve V2 in parallel with the above (5) and (6). At this time, the cleaning solvent is pressurized to about twice the pressure at the time of cleaning by the compression pump 8 (when the cleaning tank 4 and the buffer tank 2 have substantially the same size). Then, after the step (6), the cleaning solvent is supplied from the buffer tank 2 to the cleaning tank 4, and the workpiece is cleaned with a new supercritical fluid.
[0018]
(8) The steps (5) to (7) are repeated according to the number of times of cleaning.
[0019]
(9) Subsequently, the process proceeds to a pressure reduction process. Here, V4 is opened while the pressure regulating valve C2 is closed. The cleaning solvent in the cleaning tank 4 expands by the volume of the expansion tank 3 and is decompressed thereby.
[0020]
(10) When the pressure equilibrium state is reached, V4 is closed, the pressure regulating valve C3 is opened, and the expansion tank 3 is depressurized to atmospheric pressure. After the decompression is completed, the pressure regulating valve C2 is closed again.
[0021]
(11) Here, the processes of (9) and (10) are repeated a plurality of times until the pressure equilibrium state in the pressure-resistant cleaning tank 4 and the expansion tank 3 becomes equal to or lower than the specified pressure. When the inside of the pressure-resistant washing tank 4 and the expansion tank 3 become below the specified pressure, the valve 4 and the pressure regulating valve C2 are opened, and the pressure inside the pressure-resistant washing tank 4 and the expansion tank 3 is reduced to atmospheric pressure.
[0022]
(12) The workpiece is taken out from the pressure-resistant cleaning tank 4 and the cleaning operation is completed.
[0023]
In such a cleaning operation, since the cleaning solvent is stored under pressure in the buffer tank 2 in parallel with the cleaning of the workpiece, the pressure of the supercritical fluid is not controlled during the cleaning (5). For this reason, pressure fluctuation occurs at the time of cleaning, the cleaning operation cannot be accurately controlled, and in some cases, only insufficient cleaning can be performed.
[0024]
The present invention has been made to solve the above problems, and an object thereof is to provide a can that supercritical fluid cleaning apparatus to realize a reduction in precision cleaning operation the cleaning process time.
[0025]
[Means for Solving the Problems]
The supercritical fluid cleaning apparatus according to claim 1, wherein the cleaning object is cleaned by bringing the cleaning object into contact with a cleaning solvent (supercritical fluid) in a supercritical state.
A cleaning tank for placing an object to be cleaned inside;
A buffer tank that is connected to the cleaning tank through at least a valve and stores a cleaning solvent introduced into the cleaning tank;
Provided in a supply line from a supply unit for supplying a cleaning solvent to the cleaning tank and the buffer tank, and pressurizing and introducing the cleaning solvent into the buffer tank, and at the time of cleaning the object to be cleaned, A booster that pressurizes the cleaning solvent so that the pressure is constant;
A step-up controller that makes the pressure increase condition by the pressure booster different between when the cleaning solvent is introduced into the buffer tank and when the object to be cleaned is cleaned in the cleaning tank;
A pressure regulator provided in a circulation line that connects the cleaning tank and the buffer tank and the supply unit and forms a circulation path with the supply line;
A pressure regulator that varies the pressure regulation conditions by the pressure regulator between when the washing solvent is introduced into the buffer tank and when the object to be washed is washed in the washing tank. It will be.
[0029]
DETAILED DESCRIPTION OF THE INVENTION
FIG. 1 is a diagram showing an example of the configuration of the supercritical fluid cleaning apparatus of the present invention.
[0030]
1 includes a liquefied CO 2 supply tank 1, a buffer tank 2 for temporarily storing pressurized liquefied CO 2 , an expansion tank 3 for causing forced adiabatic expansion in a supercritical state, a pressure-resistant washing tank 4 for containing a workpiece, It has a separation tank 5 for separating dirt, a cooler 6, a heater 7 for raising the temperature, a booster pump 8 for raising the pressure, valves V1-5, and pressure regulating valves C1-3. A sensor for detecting the pressure and temperature in the tank is attached to the pressure-resistant cleaning tank 4.
[0031]
Further, the booster pump 8 operates based on the inverter 15, and the adjustment valves C 1, C 2, C 3 operate based on the valve controllers 16, 17, 18. Further, the inverter 15 and the valve controllers 16, 17, and 18 operate as instructed by the main control unit 19.
[0032]
In the supercritical fluid cleaning apparatus of the present invention configured as described above, the main controller 19 is used to perform two modes (coarse cleaning mode and precision cleaning mode) of the booster pump 8 and the pressure regulating valve C1 during cleaning. To control. FIG. 2 shows a control flow in the rough cleaning mode, and FIG. 3 shows a control flow in the fine cleaning mode.
[0033]
Hereinafter, the cleaning operation using the supercritical fluid shown in FIG. 1 will be described with reference to the flowcharts of FIGS. 2 and 3 and the cleaning operation flowchart of FIG. Here, an example in which the workpiece is cleaned twice (rough cleaning and precision cleaning) will be described.
[0034]
(A) First, the workpiece with the dirt attached is conveyed into the cleaning tank 4. FIG. 5 is a diagram for explaining how the work is mounted on the cleaning tank 4. As shown in this figure, the workpiece 13 is mounted with a workpiece 13 having a contaminant attached to a workpiece fixing jig / heater 12 attached to the lid 11 of the cleaning tank 4.
[0035]
(B) Next, a supercritical fluid is first fed into the cleaning tank 4 by the following procedure.
B-1: The valve V1 is opened and liquefied CO 2 is supplied from the liquefied CO 2 supply tank 1. The pressure adjustment valve C1 is fully closed.
B-2: The liquefied CO 2 is cooled by the cooler 6, and the pressure is raised by the booster pump 8. And it filters by the filter F1 and stores in the washing tank 4 inside via the valve | bulb V3 and the heater 7. FIG. At this time, the booster pump 8 and the pressure regulating valve C1 are controlled by the flow of D-1 in FIG. 2 described later to boost the CO 2 gas. The pressure in the cleaning tank 4 is detected by a pressure sensor.
[0036]
(C) Subsequently, the workpiece is cleaned on the basis of the pre-registered workpiece cleaning conditions. In this embodiment, first, rough cleaning of the workpiece is performed in the following procedure.
C-1: In response to the detection result of the pressure sensor, the valve V3 is closed. Here, the CO 2 in the cleaning tank 4 becomes a supercritical fluid due to the pressurization temperature rise (for example, pressure 75 to 76 kgf / cm 2 , temperature 31 ° C.) by the booster pump 8 and the heater 7. Cleaning is started.
C-2: After cleaning for a predetermined time, a part of the cleaning solvent (CO 2 ) is discharged to remove contaminants dissolved in the cleaning solvent. Specifically, the valve V4 is opened, and a part of the supercritical fluid is introduced into the expansion tank 3. The supercritical fluid undergoes adiabatic expansion, and the supercritical fluid in the cleaning tank 4 changes to liquefied CO 2 .
C-3: Thereafter, the valve V5 is opened, and liquefied CO 2 is transferred to the separation tank 5 using a pressure difference or a height difference. After the transfer is completed, the valve V5 is closed. At this stage, only gaseous CO 2 remains in the cleaning tank 4. The contaminant removed at the time of the first cleaning is dissolved in the CO 2 in the liquid state by the process C-2, so that the contaminant is discharged out of the cleaning tank 4 by this process.
[0037]
(D) In parallel with the step (C), the pressurized CO 2 gas is stored in the buffer tank 2 in the following procedure.
D-1: with liquefied CO 2 from liquefaction CO 2 supply tank 1 is cooled using a cooler 6 performs the boosting by the booster pump 8. And it filters with the filter F1 and stores it in the buffer tank 2 through the valve | bulb V2.
At this time, the booster pump 8 and the pressure regulating valve C1 are controlled as indicated by D-1 in FIG. That is, a boost command is sent from the main control unit 19 to the inverter 15 and the valve controller 16, the pressure regulating valve C1 is fully closed, and the inverter 15 is in a high efficiency state (pump feed motor is in a high efficiency state). The pump 8 raises the pressure to a set pressure (about twice the specified pressure of the cleaning tank 4 (when the buffer tank 2 is approximately the same size as the cleaning tank 4)).
D-2: When the pressure sensor detects that the pressure in the buffer tank 2 is near the set pressure for initial boosting, the main control unit 19 instructs the inverter 15 to reduce the rotational speed of the boosting pump 8. At the same time, the control of the pressure regulating valve C1 is started, and the buffer tank 2 is opened until the pressure can be maintained at the set pressure (see D-2 in FIG. 2).
D-3: When the inside of the buffer tank 2 reaches the specified pressure, the V2 valve is closed and stored in the buffer tank 2. Thus, the pressurized CO 2 in the pipe circulates in the circulation line composed of the booster pump 8, the filter F1, the pressure regulating valve C1, and the cooler 6 while maintaining the same pressure as the inside of the buffer tank 2. It will be.
[0038]
(E) Next, in order to perform the second cleaning (precision cleaning), the valves V2 and V3 are opened, and the CO 2 stored in the buffer tank 2 is set at the set temperature (critical temperature of 31.06 ° C. or higher) with the heater 7 To a supercritical fluid, which is supplied to the cleaning tank 4. Here, since the set pressure of the buffer tank 2 is about twice the set pressure of the cleaning tank 4, a pressure equilibrium is instantaneously generated by releasing the valve, and a supercritical fluid of the set pressure is obtained in the cleaning tank 4.
[0039]
(F) The second cleaning (precision cleaning) is performed according to the following procedure.
F-1: The valve V2 is closed. Here, the CO 2 in the cleaning tank 4 becomes a supercritical fluid by pressurization and temperature rise by the booster pump 8 and the heater 7, and the cleaning of the workpiece is started. At the time of this precision cleaning, the valve V3 is open, and the pressure control valve C1 is set in the cleaning tank 4 based on the instructions of the inverter 15 and the valve controller 16 that have received a command from the main control unit 19. The pressure or the stroke or speed of the booster pump 8 is also changed (refer to the flowchart of FIG. 3). As a result, the pressure inside the cleaning tank 4 becomes constant and the temperature is stabilized (for example, pressure 75 to 76 kgf / cm 2 , temperature 40 ° C.).
F-2: After cleaning for a predetermined time, a part of the cleaning solvent (CO 2 ) is discharged to remove contaminants dissolved in the cleaning solvent. Specifically, the valve V3 is closed, the valve V4 is opened, and a part of the supercritical fluid is introduced into the expansion tank 3. The supercritical fluid undergoes adiabatic expansion, and the supercritical fluid in the cleaning tank 4 changes to liquefied CO 2 .
F-3: Thereafter, the valve V5 is opened, and liquefied CO 2 is transferred to the separation tank 6 using a pressure difference or a height difference. After the transfer is completed, the valve V5 is closed. At this stage, only gaseous CO 2 remains in the cleaning tank 4. The contaminant removed at the time of the first cleaning is dissolved in the CO 2 in the liquid state by the process C-2, so that the contaminant is discharged out of the cleaning tank 4 by this process.
[0040]
(G) Next, the pressure reduction process is started.
G-1: The pressure regulating valve C2 is closed and the valve V4 is opened. The gas in the pressure-resistant cleaning tank 4 expands by the capacity of the expansion tank 3 and the pressure decreases.
G-2: When the pressure equilibrium state is reached, V4 is closed and the pressure regulating valve C3 is opened to depressurize the expansion tank 3 to atmospheric pressure. When the pressure reduction is completed, the C2 pressure regulating valve is closed again.
G-3: The processes of G-1 and G-2 are repeated a plurality of times until the pressure equilibrium state in the pressure-resistant washing tank 4 and the expansion tank 3 becomes equal to or lower than the specified pressure.
[0041]
(H) When the inside of the pressure-resistant washing tank 4 and the expansion tank 3 become below the specified pressure, the valve V4 and the pressure regulating valve C2 are opened, and the pressure inside the pressure-resistant washing tank 4 and the expansion tank 3 is reduced to atmospheric pressure. At that time, the jig fixture / heater is energized. Thereby, the temperature recovery of the cooled workpiece by adiabatic expansion is promoted.
[0042]
(I) The work is taken out from the pressure-resistant cleaning tank 4 and cleaning is completed.
[0043]
In the supercritical fluid cleaning method of the present embodiment, the above-described steps (A) to (I) are performed twice: rough cleaning that does not control the pressure in the cleaning tank and fine cleaning that controls the pressure in the cleaning tank. Wash. Therefore, the high pressure gas can be stored in the buffer tank using the booster pump during the rough cleaning. Further, during precision cleaning, the pressure can be precisely controlled using a booster pump, and the workpiece can be further cleaned.
[0044]
In addition, since the pressure regulating valve is arranged in the line that increases the pressure of CO 2 and the line that forms a circulation path, the pressure can be adjusted even if no cleaning solvent (CO 2 ) is supplied from the carbonic acid supply tank during cleaning. Can be kept constant, and the consumption of the washing solvent can be reduced. In addition, as in the above-mentioned step D-3, it is possible to circulate the cleaning solvent in the pipe during standby and keep the inside of the pipe at a high pressure. In order to increase the pressure of the cleaning solvent in the pipe at the next cleaning, The time required can be shortened.
[0045]
In the above process, the rough cleaning and the fine cleaning are successively performed once. However, the supercritical fluid cleaning method of the present invention is not limited to this, and at least the rough cleaning and the fine cleaning are performed once. good. However, since high-pressure gas cannot be stored in the buffer tank at the time of precision cleaning, it is desirable to perform precision cleaning only once in order to realize high-speed cleaning.
[0046]
In the above process, the supercritical fluid was stored directly in the first washing tank from the carbonic acid supply tank. Of course, the high pressure gas was once stored in the buffer tank and then transferred to the washing tank. You may do it.
[0047]
Furthermore, it goes without saying that the cleaning solvent is not limited to CO 2 .
[0048]
【The invention's effect】
In the present invention, since the workpiece is cleaned by at least rough cleaning and precision cleaning, the workpiece can be further cleaned. Further, the cleaning time can be shortened by storing a high-pressure cleaning solvent in the buffer tank during rough cleaning.
[0049]
In addition, by providing a pressure regulating valve in the line that forms a circulation path with the supply line including the booster pump, it is not necessary to supply a new cleaning solvent during precision cleaning, thereby reducing the consumption of the cleaning solvent. Can do.
[Brief description of the drawings]
FIG. 1 is a diagram showing an example of a supercritical fluid cleaning apparatus of the present invention.
FIG. 2 is a flowchart illustrating a control method during rough cleaning.
FIG. 3 is a flowchart illustrating a control method during precision cleaning.
FIG. 4 is a flowchart illustrating the flow of a cleaning operation.
FIG. 5 is a diagram showing details of the cleaning tank 4 in FIG. 1;
FIG. 6 is a diagram showing an example of a supercritical fluid cleaning apparatus having a buffer tank.
[Explanation of symbols]
1 Carbonate supply tank (supply section)
2 Buffer tank 4 Washing tank 8 Booster pump (booster)
15 Inverter 16 Valve controller 19 Main controller (controller)
C1 Pressure regulating valve (pressure regulator)

Claims (1)

超臨界状態の洗浄溶媒(超臨界流体)に被洗浄物を接触させることで、被洗浄物の洗浄を行う超臨界流体洗浄装置において、
内部に被洗浄物を載置する洗浄槽と、
該洗浄槽と少なくともバルブを介して接続され、前記洗浄槽内に導入する洗浄溶媒を貯蔵するバッファタンクと、
洗浄溶媒を供給する供給部から前記洗浄槽及び前記バッファタンクへの供給ライン中に設けられ、洗浄溶媒を前記バッファタンク内に加圧導入するとともに、前記被洗浄物の洗浄時に前記洗浄槽内の圧力が一定圧となるよう洗浄溶媒を加圧する昇圧器と、
該昇圧器による昇圧条件を、前記バッファタンク内に洗浄溶媒を導入する場合と、前記洗浄槽内で前記被洗浄物を洗浄する場合と、で異ならせる昇圧制御器と、
前記洗浄槽及び前記バッファタンクと前記供給部とを接続するとともに前記供給ラインとで循環経路を形成する循環ライン中に設けられた圧力調整器と、
該圧力調整器による調圧条件を、前記バッファタンク内に洗浄溶媒を導入する場合と、前記洗浄槽内で前記被洗浄物を洗浄する場合と、で異ならせる調圧制御器と、を有してなることを特徴とする超臨界流体洗浄装置
In a supercritical fluid cleaning device that cleans an object to be cleaned by contacting the object to be cleaned with a supercritical cleaning solvent (supercritical fluid),
A cleaning tank for placing an object to be cleaned inside;
A buffer tank that is connected to the cleaning tank through at least a valve and stores a cleaning solvent introduced into the cleaning tank;
Provided in a supply line from a supply unit for supplying a cleaning solvent to the cleaning tank and the buffer tank, and pressurizing and introducing the cleaning solvent into the buffer tank, and at the time of cleaning the object to be cleaned, A booster that pressurizes the cleaning solvent so that the pressure is constant;
A step-up controller that makes the pressure increase condition by the pressure booster different between when the cleaning solvent is introduced into the buffer tank and when the object to be cleaned is cleaned in the cleaning tank;
A pressure regulator provided in a circulation line that connects the cleaning tank and the buffer tank and the supply unit and forms a circulation path with the supply line;
A pressure regulator that varies the pressure regulation conditions by the pressure regulator between when the washing solvent is introduced into the buffer tank and when the object to be washed is washed in the washing tank. A supercritical fluid cleaning apparatus characterized by comprising:
JP25825497A 1997-09-24 1997-09-24 Supercritical fluid cleaning equipment Expired - Fee Related JP3818751B2 (en)

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US7507297B2 (en) 2002-05-20 2009-03-24 Panasonic Corporation Cleaning method and cleaning apparatus
US6880560B2 (en) 2002-11-18 2005-04-19 Techsonic Substrate processing apparatus for processing substrates using dense phase gas and sonic waves
JP5057193B2 (en) * 2010-02-09 2012-10-24 三菱マテリアル株式会社 Manufacturing method of cubic boron nitride sintered body with high homogeneity, high density and high hardness
CN110340059B (en) * 2019-07-12 2024-10-29 西安石油大学 Double-layer vane type CO2Circulation residue-free dirt removing device
US11710647B2 (en) * 2021-01-28 2023-07-25 Applied Materials, Inc. Hyperbaric clean method and apparatus for cleaning semiconductor chamber components
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