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JP3833809B2 - Electronic component inspection equipment - Google Patents
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JP3833809B2 - Electronic component inspection equipment - Google Patents

Electronic component inspection equipment Download PDF

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Publication number
JP3833809B2
JP3833809B2 JP04407998A JP4407998A JP3833809B2 JP 3833809 B2 JP3833809 B2 JP 3833809B2 JP 04407998 A JP04407998 A JP 04407998A JP 4407998 A JP4407998 A JP 4407998A JP 3833809 B2 JP3833809 B2 JP 3833809B2
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Prior art keywords
electronic component
defective product
guide portion
insertion guide
index table
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JP04407998A
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Japanese (ja)
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JPH11239764A (en
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宏樹 有松
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Rohm Co Ltd
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Rohm Co Ltd
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Description

【0001】
【発明の属する技術分野】
この発明は、電子部品検査装置に関する。
【0002】
【従来の技術】
従来、製造工程が終了したチップ型の電子部品を、個別的に外形及び電気的な規格等に適合しているか否かの良否判別を行い、不良品を排除し、良品のみを次の包装工程に送る電子部品検査装置があり、同電子部品検査装置は、多数の切欠溝を形成したインデックステーブルと、同切欠溝に電子部品を一個づつ挿入する挿入ガイド部とを具備して、同切欠溝に挿入された電子部品を、外形及び電気的な規格等に適合しているか否かの良否判別を個別的に行い、不良品を排除し、良品のみを包装工程に送るようにしている。また、外形的な良否判別は上記挿入ガイド部と切欠溝とに設けたセンサによって行うようにしており、同センサが不良品を検出すると、挿入ガイド部の間隔を広げて当該不良品をフリーにし、真空装置に吸引して挿入ガイド部と切欠溝とから除去するようにしている。
【0003】
【発明が解決しようとする課題】
ところが、上記電子部品が微細であるため、上記真空の影響下にある複数の電子部品、即ち、当該不良品に後続する20〜30個の未判別電子部品が、挿入ガイド部のスライドによって排出口が開いている間に除去され、間隔を狭めるために挿入ガイド部が復帰する間に、除去途中の電子部品の姿勢が横向きになったり(図4参照)、斜めなったりすると、挿入ガイド部が正常な間隔に復帰できず、電子部品が詰まって切欠溝に挿入できなくなり、作業を中止せざるを得なくなる。このような不具合を解消するには、手作業で障害となる電子部品を排除する必要があり、生産性が低下するばかりでなく、多くの人手を要するという問題があった。
【0004】
【課題を解決するための手段】
この発明では、電子部品を一個づつ収納可能の切欠溝を多数形成したインデックステーブルと、多数の電子部品を一列に整列させて搬送する搬送溝と、この搬送溝の終端に設けて電子部品を前記切欠溝に挿入する挿入動作を行う挿入ガイド部とを具備し、前記インデックステーブルの回転により、前記切欠溝に収納した前記電子部品を搬送しながら、この前記電子部品が規格に適合しているか否かを判別して、不良品を前記切欠溝から除去するようにし、前記挿入ガイド部では、横方向にスライド可能とした終端ガイド壁によって搬送溝を形成しているとともに、前記終端ガイド壁をスライドさせることにより前記挿入ガイド部の底壁に設けた不良品吸入孔を開口して前記挿入ガイド部部分の前記電子部品を吸引除去するようにした電子部品検査装置を提供せんとするものである。
【0005】
特に、前記挿入ガイド部で前記切欠溝への前記電子部品の挿入に障害が生じることにより前記インデックステーブルが回転不能になった場合には、前記インデックステーブルの回転を停止させるとともに前記終端ガイド壁をスライドさせて前記不良品吸入孔を開口することにより、前記不良品吸入孔から前記挿入ガイド部部分の前記電子部品を吸引して排除し、その後、前記終端ガイド壁を復帰させた際に、前記終端ガイド壁が正常なガイド位置に復帰しないときには、前記終端ガイド壁をもう一度スライドさせて前記不良品吸入孔を開口し、前記不良品吸入孔から前記挿入ガイド部部分の前記電子部品を吸引して排除することに特徴を有するものである。
【0006】
【発明の実施の形態】
この発明では、製造工程を経た電子部品は、まずパーツフィーダに投入され、同パーツフィーダで一列に整列させ、挿入ガイド部を介してインデックステーブルの外周に形成した切欠溝に一個づつ挿入する。この際、割れやメッキカス付着や寸法不揃い等の外形的な不良品があると、挿入ガイド部の間隔を広げて不良品をフリーにし、挿入ガイド部のスライドによって開閉する排出口に連通した真空式の吸引装置によって、この不良品を挿入ガイド部と切欠溝とから除去して、爾後の作業に支障のないようにしている。
【0007】
しかし、上記電子部品が微細であるため、上記真空の影響下にある複数の電子部品、即ち、当該不良品に後続する20〜30個の未判別電子部品が、挿入ガイド部のスライドによって排出口が開いている間に除去され、間隔を狭めるために挿入ガイド部がスライドする間に、除去途中の電子部品の姿勢が、横向きや斜めになって、挿入ガイド部が正常な間隔に復帰できなくなる状態が、ある程度の確率で発生し、挿入ガイド部に電子部品が詰まったり、ガイドが不正確になったりして、電子部品を切欠溝に挿入できなくなり、作業を中止せざるを得なくなることがある。
【0008】
本実施例では、上述した挿入ガイド部の復帰不可能状態を検出して、前述した不良品排出動作と全く同一手順の障害除去動作を2回繰り返す間に復帰の障害となる電子部品を挿入ガイド部から除去されて、挿入ガイド部が復帰可能になると作業を再開し、障害除去動作を2回繰り返しても、挿入ガイド部が復帰不可能であるときは、装置を停止し、警報を発してオペレータにこの旨を報知するようにしている。
【0009】
【実施例】
この発明の実施例を図面にもとづき詳説する。
【0010】
図1において、Aは製造工程から搬送されてきた電子部品Tをテーピングするテーピング包装装置である。Bは電子部品Tを包装したテープの編集を行う編集装置である。Dは電子部品検査装置であって、テーピング包装装置A中に組込まれており、上記完成電子部品をテーピング包装する前に、予め不良部品を除去して、不良品が出荷されないようにしておくものである。Cは上記各装置A,D の作動を制御するためのコンピュータを内蔵した制御装置であり、機台の内部に収納・配設されている。
【0011】
テーピング包装装置Aは、図1〜図3で示すように、パーツフィーダ1と、電子部品検査装置Dとテーピング包装部2とに接続しており、パーツフィーダ1は中央部に配設したターンテーブル11の周縁に沿ってギャラリ12を配置し、同ギャラリ12の終端に、搬送溝31を形成した搬送樋30の始端を接続して、ターンテーブル11上に投入された多数の電子部品Tを一定姿勢で一列に整列させて、次工程の電子部品検査装置Dに搬送するようにしている。図1中、13はターンテーブル11に電子部品Tを供給するためのホッパである。
【0012】
搬送樋30の終端には挿入ガイド部32を連設して、上記搬送溝31の終端を後述するインデックステーブル40の周縁に臨ませている。
【0013】
インデックステーブル40は、図2及び図3で示すように、間欠回転するテーブル本体41の周縁部に電子部品Tを1個だけ収納できる切欠溝42を多数形成し、同切欠溝42の奥部に真空発生装置(図示せず)に連通した吸着孔43を開口させて、負圧により切欠溝42中の電子部品Tを吸着保持するようにしており、インデックステーブル40の回転休止時に、同切欠溝42の開口部を前記搬送溝31に正対させ、搬送溝31からの電子部品Tを切欠溝42中に収納して、インデックステーブル40の間欠回転により、同インデックステーブル40の周縁に沿って配設した各良否判別部50,51 に搬送するようにしている。
【0014】
また、上記挿入ガイド部32の搬送溝31を形成する終端ガイド壁33の一方を横方向にスライド可能とし、挿入ガイド部32の底壁に、終端ガイド壁33のスライドにより開閉する不良品吸入孔63を設け、同不良品吸入孔63を吸入ホース64を介して真空式の不良品回収装置に接続している。
【0015】
そして、インデックステーブル40の切欠溝42に、割れ、寸法不揃い、メッキカス付着等の外形的不良品T1が供給されると、該外形的不良品T1や後続の電子部品Tなどが、終端ガイド壁33とインデックステーブル40との間に挟まって、インデックステーブル40が回転不能になることがあり、このような場合には、インデックステーブル40の回転を停止させ、吸着孔43の負圧を解除し、終端ガイド壁33をスライドさせて電子部品Tの挟持を緩め、不良品吸入孔63を開口し、真空の風圧によって、インデックステーブル40回転の障害となる電子部品Tを上記切欠溝42と挿入ガイド部32とから除去するという不良品除去動作を行うようにしている。
【0016】
このように、外形的不良品T1の排除が真空の風圧によって行われるので、ある程度の確率で不良品除去動作が完璧に行われないことがあり、図4で示すように、電子部品Tが横向きなる等の原因で、終端ガイド壁33とインデックステーブル40との間に挟まり、終端ガイド壁33が正常なガイド位置に復帰できなくなって作業が中断することがあり、このような場合、前述した不良品除去動作と全く同一の障害除去動作を行うだけで、終端ガイド壁33の復帰阻止状態が、高い確率で解消されることが知られている。
【0017】
そこで、本実施例では、制御装置C中のコンピュータに、図5のフローチャートで示す障害除去サブルーチンを設定して、電子部品検査装置Dの作動を制御するようにしている。
【0018】
即ち、電子部品検査装置Dの作動を制御するメインルーチン中に、終端ガイド壁33の復帰状態を監視して、終端ガイド壁33の復帰が阻止された場合に、下記のサブルーチンに移行する条件分岐を設け、復帰阻止が発生すると(101) 、カウンタをリセットし(102) 、電子部品検査装置Dの作動を一時停止し(103) 、障害となる電子部品T排出のための終端ガイド壁33の開閉を行い(104) 、終端ガイド壁33の復帰状態を監視して(105) 、復帰阻止されていれば(105Y)、カウンタをインクリメントして(106) 、カウント数が3以下であれば(107Y)、ステップ(104) に戻って終端ガイド壁33を開閉させる。
【0019】
また、(105)のステップで、終端ガイド壁33の復帰が阻止されていなければ(105N)、電子部品検査装置Dを起動して(108) 、メインルーチンにリターンする。
【0020】
また、(107) のステップで、カウント数が3以下でなければ(107N)、電子部品検査装置Dを起動せず、警報を作動させる(109)
このように、終端ガイド壁33の復帰阻止を常時監視し、復帰阻止が発生した場合は、終端ガイド壁33復帰の障害となる電子部品を除去し、終端ガイド壁33の復帰を確認して、正常であれば、自動的に作業を再開させるようにしているので、生産性を大幅に高めることができ、しかも、手作業による点検・修復作業を大幅に省力化できる。
【0021】
しかも、予め設定した回数(本実施例では3回)だけ障害除去動作を繰り返しても、挿入ガイド部32の終端ガイド壁33が復帰できないときは、警報を発して装置を停止させるので、前記以外の原因で終端ガイド壁33が復帰不可能になった場合に、徒に障害除去動作を繰り返して不具合が拡大するのを防止できる。
【0022】
また、図3で示すように、インデックステーブル40の周縁には、インデックステーブル40の回転方向に従って、第1・第2電気的良否判別部50,51 と、第1不良品排出部60と、確認部52と、第2不良品排出部61と、テーピング包装部2の良品排出部21とを配置しており、第1・第2電気的良否判別部50,51 で検出した電気的不良品T2を第1不良品排出部60から排出し、更に確認部52で検出した電気的不良品T2を第2不良品排出部61から排出して、良品のみを良品排出部21を介し、テーピング包装部2中を走行するテープ22上に落下させ、テーピング包装して編集装置Bに送るようにしている。
【0023】
第1・第2不良品排出部60,61 は、図6及び図7で示すように、下方向に延出した不良品排出孔65と、上方の外気に連通した給気孔66とを設けて、同不良品排出孔65を真空発生装置(図示せず)に連通しており、電気的不良品T2が第1・第2不良品排出部60,61 にさしかかった際に、吸着孔43の負圧を解除すると共に、不良品排出孔65に負圧を作用させ、給気孔66から流入する気流に乗せて、不良品排出孔65を介し、電気的不良品T2を切欠溝42から下方に排出するという不良品除去動作を行うようにしている。
【0024】
【発明の効果】
本発明によれば次のような効果を得ることができる。
【0025】
発明では、挿入ガイド部で切欠溝への電子部品の挿入に障害が生じることによりインデックステーブルが回転不能になった場合には、インデックステーブルの回転を停止させるとともに終端ガイド壁をスライドさせて不良品吸入孔を開口することにより、不良品吸入孔から挿入ガイド部部分の電子部品を吸引して排除し、その後、終端ガイド壁を復帰させた際に、終端ガイド壁が正常なガイド位置に復帰しないときには、終端ガイド壁をもう一度スライドさせて不良品吸入孔を開口し、不良品吸入孔から挿入ガイド部部分の電子部品を吸引して排除することによって、障害の除去に人手を要せず、また、短時間の休止時間で作業を再開できるので、生産性と省力かを大幅に向上することができる。
【図面の簡単な説明】
【図1】本発明に係る電子部品検査装置を具備するテーピング包装及び編集装置の全体図。
【図2】電子部品供給装置の構成を示す斜視説明図。
【図3】インデックステーブル回りの配置を示す平面説明図。
【図4】終端ガイド壁の復帰阻止状態を示す平面説明図。
【図5】障害除去動作のフローチャート。
【図6】インデックステーブル及び第1・第2排出部の構成を示す一部断面側面図。
【図7】インデックステーブル及び第1・第2排出部の構成を示す一部断面平面図。
【符号の説明】
T 電子部品
D 電子部品検査装置
40 インデックステーブル
42 切欠溝
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an electronic component inspection apparatus.
[0002]
[Prior art]
Conventionally, chip-type electronic components that have completed the manufacturing process are individually judged as to whether or not they conform to the external shape and electrical standards, etc., and defective products are eliminated. The electronic component inspection apparatus includes an index table in which a large number of cutout grooves are formed, and an insertion guide portion for inserting electronic components one by one into the cutout groove. Whether or not the electronic components inserted in the product conform to the external shape and electrical standards is determined individually to eliminate defective products and send only good products to the packaging process. In addition, the external quality is determined by a sensor provided in the insertion guide part and the notch groove. When the sensor detects a defective product, the interval between the insertion guide parts is increased to make the defective product free. Then, it is sucked into a vacuum device and removed from the insertion guide part and the cutout groove.
[0003]
[Problems to be solved by the invention]
However, since the electronic component is fine, a plurality of electronic components under the influence of the vacuum, that is, 20 to 30 unidentified electronic components following the defective product are discharged by the slide of the insertion guide portion. Is removed while the insertion guide is being opened, and the posture of the electronic component being removed becomes horizontal (see FIG. 4) or is inclined while the insertion guide is returned to reduce the interval. The normal interval cannot be restored, the electronic components are clogged and cannot be inserted into the cutout groove, and the work must be stopped. In order to solve such a problem, it is necessary to eliminate electronic components that are obstructed by manual work, which not only reduces productivity, but also requires a lot of manpower.
[0004]
[Means for Solving the Problems]
In this invention, an index table in which a large number of cutout grooves capable of storing electronic components one by one are formed, a conveyance groove that conveys a large number of electronic components in a line, and an electronic component that is provided at the end of the conveyance groove. comprising an insertion guide portion for inserting operation of inserting the cut-out groove, by rotation of the index table, while conveying the electronic component housed in the slit, whether the said electronic part is in compliance with standards or to determine a defective products so as to remove from the slit, in the insertion guide portion, together form a conveying groove laterally by slidable and the end guide walls, sliding the end guide wall electronic components so as to aspirate the electronic component of the insertion guide portion opened a defective suction hole provided in the bottom wall of the insertion guide portion by There is provided cents 査 device.
[0005]
In particular, when the index table becomes non-rotatable due to a failure in the insertion of the electronic component into the notch groove at the insertion guide portion, the index table stops rotating and the end guide wall is By sliding and opening the defective product suction hole, the electronic component of the insertion guide portion portion is sucked and removed from the defective product suction hole, and then when the terminal guide wall is returned, When the terminal guide wall does not return to the normal guide position, the terminal guide wall is slid once again to open the defective product suction hole, and the electronic parts in the insertion guide portion are sucked from the defective product suction hole. It is characterized by being excluded.
[0006]
DETAILED DESCRIPTION OF THE INVENTION
In this invention, the electronic parts that have undergone the manufacturing process are first put into the parts feeder, aligned in a row by the parts feeder, and inserted one by one into the notch groove formed on the outer periphery of the index table via the insertion guide portion. At this time, if there are externally defective products such as cracks, plating residue and irregular dimensions, the gap between the insertion guides is widened to free the defective products and communicated with the discharge port that opens and closes by sliding the insertion guides. With this suction device, the defective product is removed from the insertion guide portion and the cutout groove so that the work after the operation is not hindered.
[0007]
However, since the electronic components are fine, a plurality of electronic components under the influence of the vacuum, that is, 20 to 30 unidentified electronic components following the defective product are discharged by the slide of the insertion guide portion. Is removed while the insertion guide is open, and while the insertion guide part slides to narrow the interval, the posture of the electronic component being removed becomes horizontal or oblique, and the insertion guide part cannot return to the normal interval. The situation occurs with a certain probability, the electronic guide is clogged in the insertion guide, or the guide becomes inaccurate, and it becomes impossible to insert the electronic component into the notch groove, and the work must be stopped. is there.
[0008]
In the present embodiment, the above-described unrecoverable state of the insertion guide portion is detected, and an electronic component that becomes a failure of return is inserted while repeating the failure removal operation of the same procedure as the defective product discharge operation described above twice. When the insertion guide part can be restored, the operation is resumed. If the insertion guide part cannot be restored even after repeating the fault removal operation twice, the device is stopped and an alarm is issued. This is notified to the operator.
[0009]
【Example】
An embodiment of the present invention will be described in detail with reference to the drawings.
[0010]
In FIG. 1, A is a taping packaging apparatus that taps an electronic component T conveyed from a manufacturing process. B is an editing device for editing a tape in which the electronic component T is packaged. D is an electronic component inspection device, which is incorporated in the taping packaging device A, and removes defective parts in advance so that defective products are not shipped before taping and packaging the finished electronic components. It is. C is a control device with a built-in computer for controlling the operation of each of the devices A and D, and is housed and arranged inside the machine base.
[0011]
1-3, the taping packaging apparatus A is connected to the parts feeder 1, the electronic component inspection apparatus D, and the taping packaging part 2, and the parts feeder 1 is a turntable disposed in the center. A gallery 12 is arranged along the peripheral edge of 11, and the start end of a conveyance rod 30 having a conveyance groove 31 is connected to the end of the gallery 12, and a large number of electronic components T placed on the turntable 11 are fixed. It is arranged in a line in the posture and conveyed to the electronic component inspection apparatus D in the next process. In FIG. 1, reference numeral 13 denotes a hopper for supplying the electronic component T to the turntable 11.
[0012]
An insertion guide portion 32 is provided at the end of the transport rod 30 so that the end of the transport groove 31 faces the periphery of an index table 40 described later.
[0013]
As shown in FIGS. 2 and 3, the index table 40 is formed with a large number of notch grooves 42 in which only one electronic component T can be accommodated at the periphery of the table body 41 that rotates intermittently, and at the back of the notch groove 42. A suction hole 43 communicating with a vacuum generator (not shown) is opened so that the electronic component T in the notch groove 42 is sucked and held by a negative pressure. The opening of 42 is directly opposed to the conveying groove 31, the electronic component T from the conveying groove 31 is accommodated in the notch groove 42, and is arranged along the periphery of the index table 40 by intermittent rotation of the index table 40. It is made to convey to each pass / fail judgment part 50,51 provided.
[0014]
In addition, a defective product suction hole that allows one side of the end guide wall 33 that forms the conveying groove 31 of the insertion guide portion 32 to be slidable in the lateral direction and opens and closes by sliding the end guide wall 33 on the bottom wall of the insertion guide portion 32. 63 is provided, and the defective product suction hole 63 is connected to a vacuum-type defective product recovery device via a suction hose 64.
[0015]
When an externally defective product T1 such as cracks, uneven dimensions, or adhesion of plating residue is supplied to the notch groove 42 of the index table 40, the externally defective product T1 and the subsequent electronic component T are transferred to the end guide wall 33. The index table 40 may become unrotatable due to being sandwiched between the index table 40 and the index table 40. In such a case, the rotation of the index table 40 is stopped, the negative pressure of the suction hole 43 is released, and the end The guide wall 33 is slid to loosen the electronic component T, the defective product suction hole 63 is opened, and the electronic component T obstructing the rotation of the index table 40 by the vacuum wind pressure is inserted into the notch groove 42 and the insertion guide portion 32. Defective product removal operation is performed so as to be removed.
[0016]
As described above, since the external defective product T1 is eliminated by the wind pressure of the vacuum, the defective product removal operation may not be performed with a certain degree of probability. As shown in FIG. For example, the end guide wall 33 and the index table 40 may be sandwiched between the end guide wall 33 and the end guide wall 33 may not return to the normal guide position, and the operation may be interrupted. It is known that the return blocking state of the terminal guide wall 33 can be eliminated with a high probability by performing exactly the same fault removal operation as the non-defective product removal operation.
[0017]
Therefore, in this embodiment, the failure removal subroutine shown in the flowchart of FIG. 5 is set in the computer in the control device C to control the operation of the electronic component inspection device D.
[0018]
That is, during the main routine for controlling the operation of the electronic component inspection apparatus D, the return state of the end guide wall 33 is monitored, and when the return of the end guide wall 33 is prevented, the conditional branch that moves to the following subroutine When the return prevention occurs (101), the counter is reset (102), the operation of the electronic component inspection apparatus D is temporarily stopped (103), and the termination guide wall 33 for discharging the electronic component T which becomes an obstacle is removed. Opening and closing (104), monitoring the return state of the terminal guide wall 33 (105), if the return is prevented (105Y), incrementing the counter (106), if the count number is 3 or less (105) 107Y), returning to step (104), the end guide wall 33 is opened and closed.
[0019]
If the return of the end guide wall 33 is not prevented at step (105) (105N), the electronic component inspection apparatus D is activated (108) and the process returns to the main routine.
[0020]
In step (107), if the count is not 3 or less (107N), the electronic component inspection apparatus D is not activated and an alarm is activated (109).
In this way, the return prevention of the end guide wall 33 is constantly monitored, and when the return prevention occurs, the electronic components that are an obstacle to the return of the end guide wall 33 are removed, and the return of the end guide wall 33 is confirmed, If it is normal, the operation is automatically resumed, so that the productivity can be greatly increased, and the manual inspection and repair work can be greatly saved.
[0021]
Moreover, if the terminal guide wall 33 of the insertion guide portion 32 cannot be restored even after repeating the failure removal operation a preset number of times (three times in this embodiment), an alarm is issued and the device is stopped. When the end guide wall 33 cannot be restored due to the above, it is possible to prevent the trouble from expanding by repeating the fault removing operation.
[0022]
In addition, as shown in FIG. 3, on the periphery of the index table 40, according to the rotation direction of the index table 40, the first and second electrical pass / fail judgment units 50 and 51 and the first defective product discharge unit 60 are confirmed. Portion 52, second defective product discharge portion 61, and non-defective product discharge portion 21 of taping packaging portion 2 are arranged, and electrical defective product T2 detected by first and second electrical pass / fail discriminating portions 50 and 51 is arranged. Is discharged from the first defective product discharge unit 60, and further, the electrical defective product T2 detected by the confirmation unit 52 is discharged from the second defective product discharge unit 61, and only the non-defective product is passed through the non-defective product discharge unit 21 and the taping packaging unit 2 is dropped on a tape 22 that travels through the tape 2 and taped and wrapped to be sent to the editing apparatus B.
[0023]
As shown in FIGS. 6 and 7, the first and second defective product discharge portions 60 and 61 are provided with a defective product discharge hole 65 extending downward and an air supply hole 66 communicating with the outside air above. The defective product discharge hole 65 communicates with a vacuum generator (not shown), and when the electrically defective product T2 reaches the first and second defective product discharge parts 60 and 61, The negative pressure is released, negative pressure is applied to the defective product discharge hole 65, and it is placed on the airflow flowing from the air supply hole 66, and the defective electrical product T2 is moved downward from the notch groove 42 through the defective product discharge hole 65. The defective product removal operation of discharging is performed.
[0024]
【The invention's effect】
According to the present invention, the following effects can be obtained.
[0025]
In the present invention, when the index table becomes unable to rotate due to an obstacle in inserting the electronic component into the notch groove at the insertion guide portion, the index table stops rotating and the terminal guide wall is slid. By opening the non-defective product suction hole, the electronic parts in the insertion guide section are sucked out from the defective product suction hole, and then the terminal guide wall returns to the normal guide position when the terminal guide wall is returned. If not, slide the end guide wall once more to open the defective product suction hole, and suck and remove the electronic parts of the insertion guide part from the defective product suction hole, eliminating the need for manpower to remove the obstacle, In addition, since the work can be resumed with a short downtime, productivity and labor saving can be greatly improved.
[Brief description of the drawings]
FIG. 1 is an overall view of a taping packaging and editing apparatus provided with an electronic component inspection apparatus according to the present invention.
FIG. 2 is a perspective explanatory view showing a configuration of an electronic component supply apparatus.
FIG. 3 is an explanatory plan view showing the arrangement around the index table.
FIG. 4 is an explanatory plan view showing a return blocking state of the terminal guide wall.
FIG. 5 is a flowchart of a fault removal operation.
FIG. 6 is a partial cross-sectional side view showing a configuration of an index table and first and second discharge portions.
FIG. 7 is a partial cross-sectional plan view showing configurations of an index table and first and second discharge units.
[Explanation of symbols]
T Electronic component D Electronic component inspection device
40 Index table
42 Notch

Claims (1)

電子部品を一個づつ収納可能の切欠溝を多数形成したインデックステーブルと、多数の電子部品を一列に整列させて搬送する搬送溝と、この搬送溝の終端に設けて電子部品を前記切欠溝に挿入する挿入動作を行う挿入ガイド部とを具備し、前記インデックステーブルの回転により、前記切欠溝に収納した前記電子部品を搬送しながら、この前記電子部品が規格に適合しているか否かを判別して、不良品を前記切欠溝から除去するようにし
前記挿入ガイド部では、横方向にスライド可能とした終端ガイド壁によって搬送溝を形成しているとともに、前記終端ガイド壁をスライドさせることにより前記挿入ガイド部の底壁に設けた不良品吸入孔を開口して前記挿入ガイド部部分の前記電子部品を吸引除去するようにした電子部品検査装置において、
前記挿入ガイド部で前記切欠溝への前記電子部品の挿入に障害が生じることにより前記インデックステーブルが回転不能になった場合には、前記インデックステーブルの回転を停止させるとともに前記終端ガイド壁をスライドさせて前記不良品吸入孔を開口することにより、前記不良品吸入孔から前記挿入ガイド部部分の前記電子部品を吸引して排除し、
その後、前記終端ガイド壁を復帰させた際に、前記終端ガイド壁が正常なガイド位置に復帰しないときには、前記終端ガイド壁をもう一度スライドさせて前記不良品吸入孔を開口し、前記不良品吸入孔から前記挿入ガイド部部分の前記電子部品を吸引して排除することを特徴とする電子部品検査装置。
An index table formed with a large number of notch grooves that can store electronic components one by one, a conveyance groove that conveys a large number of electronic components aligned in a row, and an electronic component that is provided at the end of the conveyance groove and inserted into the notch groove comprising an insertion guide portion for inserting operation for, by the rotation of the index table, while conveying the electronic component housed in the slit, it is determined whether or not this the electronic component meets the standards Te, and defective products to be removed from the slit,
In the insertion guide portion, a conveyance groove is formed by a terminal guide wall that is slidable in a lateral direction, and a defective product suction hole provided in a bottom wall of the insertion guide portion by sliding the terminal guide wall. In the electronic component inspection apparatus that opens and sucks and removes the electronic component of the insertion guide portion ,
If the index table becomes unable to rotate due to a failure in the insertion of the electronic component into the notch groove at the insertion guide portion, the index table stops rotating and the terminal guide wall is slid. By opening the defective product suction hole, the electronic parts of the insertion guide portion are sucked and removed from the defective product suction hole,
Thereafter, when the terminal guide wall is returned to the normal guide position when the terminal guide wall is returned, the terminal guide wall is slid again to open the defective product suction hole, and the defective product suction hole is opened. The electronic component inspection apparatus according to claim 1 , wherein the electronic component in the insertion guide portion is sucked and removed .
JP04407998A 1998-02-25 1998-02-25 Electronic component inspection equipment Expired - Fee Related JP3833809B2 (en)

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CN108267662B (en) * 2018-01-30 2019-10-11 蚌埠市金盾电子有限公司 A kind of charging device of no lead resistance overload detection
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CN111632862A (en) * 2020-06-12 2020-09-08 郑州航空工业管理学院 A kind of testing equipment for intelligent manufacturing

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