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JP3837276B2 - Film thickness measuring device - Google Patents
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JP3837276B2 - Film thickness measuring device - Google Patents

Film thickness measuring device Download PDF

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Publication number
JP3837276B2
JP3837276B2 JP2000181808A JP2000181808A JP3837276B2 JP 3837276 B2 JP3837276 B2 JP 3837276B2 JP 2000181808 A JP2000181808 A JP 2000181808A JP 2000181808 A JP2000181808 A JP 2000181808A JP 3837276 B2 JP3837276 B2 JP 3837276B2
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Japan
Prior art keywords
light
plate
sample
translucent plate
oil film
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JP2000181808A
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Japanese (ja)
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JP2002005628A (en
Inventor
黎明 楼
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JTEKT Corp
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JTEKT Corp
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Description

【0001】
【発明の属する技術分野】
この発明は、油膜の厚さを光干渉法により測定する膜厚測定装置に関する。
【0002】
【従来の技術】
転動面や摺動面には、潤滑のために油膜が塗布される。従来、油膜の厚さの測定方法として、光干渉法が広く使用されている。この種の測定方法では、油膜に裏面が接する例えば平板の透光板を介して、転動部材や摺動部材の試料の表面に光照射手段により光を照射し、油膜の表面および試料の表面からの反射光により発生する干渉光を受光手段を介して受光し、この干渉光の位相差に基づいて油膜の厚さを測定する。
【0003】
表面の光反射率が比較的大きい鋼球からなる軸受用の玉などを試料として用いる場合、受光手段により受光した光のうち、上記干渉光が約90%を占めるのに対して、透光板の表面からの反射光は5%程度で、誤差として無視できる。
【0004】
【発明が解決しようとする課題】
しかしながら、表面の光反射率が比較的小さい、摺動部材としてのゴム製のオイルシールのリップやOリングなどの試料を用いる場合、受光手段により受光した光のうち、上記干渉光の占める割合が小さくなり、透光板の表面からの反射光を誤差として無視できなくなって、油膜の厚さを正確に測定できない。
この発明は、上記課題に鑑みて、油膜の厚さを正確に測定できる膜厚測定装置を提供することを目的とする。
【0005】
【課題を解決するための手段および発明の効果】
上記目的を達成するため、本発明は、試料の表面に塗布された油膜に裏面が接する透光板と、上記透光板を介して試料の表面に光を照射する光照射手段とを備え、油膜の表面および試料の表面からの反射光を受光手段を介して受光し、両反射光の干渉光に基づいて油膜の厚さを測定する膜厚測定装置において、上記透光板を回転させる回転機構を備え、上記透光板は平坦な裏面を含み、上記透光板は、上記回転機構によって、透光板の裏面と直交する軸線の回りに回転され、その回転に伴って、試料が透光板の裏面に対して摺動または転がり接触し、上記透光板の表面からの反射光が受光手段によって受光されないように、透光板の表面が裏面に対して傾斜しており、上記透光板の表面は、球面または円錐状テーパ面を含むことを特徴とする膜厚測定装置である。
【0006】
この場合、受光手段が透光板の表面からの反射光を受光しないで、油膜の表面および試料の表面からの反射光を主に受光するので、きれいな干渉縞を得ることができる。したがって、試料の表面の反射率の大小に関わらず、油膜の厚さをより正確に測定することができる。
上記透光板の表面は、球面または円錐状テーパ面を含むことが好ましい。というのは、試料が軸受用の玉であるときに、玉と透光板を転がり接触させても、透光板の表面からの反射光の向きが変わらないからである。
【0007】
また、本発明は、試料の表面に塗布された油膜に裏面が接する透光板と、上記透光板を介して試料の表面に光を照射する光照射手段とを備え、油膜の表面および試料の表面からの反射光を受光手段を介して受光し、両反射光の干渉光に基づいて油膜の厚さを測定する膜厚測定装置において、上記透光板を回転させる回転機構を備え、上記透光板は、表面と裏面が平行な平板からなり、上記透光板は、上記回転機構によって、透光板の裏面と直交する軸線の回りに回転され、その回転に伴って、試料が透光板の裏面に対して摺動または転がり接触し、上記光照射手段は、透光板の表面に対して斜めから光を照射し、上記受光手段は、油膜の表面および試料の表面からの反射光を受光し、且つ透光板の表面からの反射光を受光しないように、透光板の板厚を設定してあり、上記光照射手段から透光板の表面への光の入射角をA、透光板の板厚をt、光照射手段の照射口の径をd1として、下記式が満たされ、
t≧(d1/2)sinA
透光板の裏面と油膜の表面との接触領域の幅をC、受光手段の最大受光幅をd2、上記光照射手段から透光板の表面への光の入射角をAとして、下記式が満たされるように、試料が透光板の裏面に対して押し付けられていることを特徴とする膜厚測定装置である。
C=d2/cosA
【0008】
この場合、受光手段が透光板の表面からの反射光を受光しないで、油膜の表面および試料の表面からの反射光を主に受光するので、きれいな干渉縞を得ることができる。したがって、試料の表面の反射率の大小に関わらず、油膜の厚さをより正確に測定することができる。
また、本願発明者は、上記光照射手段から透光板の表面への光の入射角A、透光板の板厚t、光照射手段の照射口の径d1が下記式を満たすように設定されていることが好ましいという知見を得た。
【0009】
t≧d1/2sinA
特に、透光板の板厚を、上記範囲内においてできるだけ薄くする。すなわち、透光板の板厚を、
t=d1/2sinA
としたとき、光のエネルギー損失が最も小さく、油膜の厚さを最も正確に測定することができる。
【0010】
【発明の実施の形態】
以下には、図面を参照して、この発明の実施形態について具体的に説明する。図1は、この発明の一実施形態にかかる膜厚測定装置1の構成を示す図解図である。図1では、膜厚測定装置1は、試料2の表面に塗布された油膜3の厚さを光干渉法により測定する装置であり、油膜3の表面に裏面4aが接するように配置された透光板4と、この透光板4および油膜3を介して試料2の表面に光を照射する光照射手段5と、油膜3の表面からの反射光6および試料2の表面からの反射光7により発生する干渉光8を受光する受光手段9とを有する。
【0011】
試料2は、例えば摺動部材としてのゴム製のOリングである場合があり、この場合、弾性を有し、且つ表面の光反射率が比較的小さい。試料2は、図示しない試料台により保持され、透光板4に抗して所定の荷重がかけられる。したがって、試料2は、透光板4の裏面4aに押しへこめられ、透光板4の裏面4a対して平行な平行面2aを形成している。
透光板4は、例えばガラスにより形成された裏面4aが平坦な円板で、その表面4bは例えば球面をなしている。また、透光板4の裏面4aは、その中心で回転軸10に連結されていて、膜厚測定装置1が運転されると、サーボモータなどにより回転軸10が回転され、例えばOリングからなる試料2に対して、透光板4が摺動しながら回転する。一方、鋼球からなる試料2を用いる場合は、透光板4の回転に伴って、試料2が転動するようになっている。ここで、透光板4の形状は上記の形状に限らず、透光板4が回転することにより透光板4の表面4bからの反射光の向きが変わらないような形状であれば、例えばその表面4bが円錐状テーパ面であってもよいし、外形が円板ではなく楕円板や四角板であってもよい。また、透光板4の材質は、ガラスに限らず、例えばアクリルであってもよい。
【0012】
光照射手段5は、その一端に例えば断面円形形状の照射口5aを有していて、この照射口5aから、試料2の平行面2aに対して例えば斜めにレーザなどの光を照射する。照射された光は、透光板4の表面4bを透過する1次透過光11と、透光板4の表面4bで反射する1次反射光12とに分かれる。1次反射光12は、例えば透光板4の表面4bに垂直な方向に対して、入射した角度と同じ角度で反射する。透光板4の表面4bは球面をなしているので、1次反射光12は受光手段9から十分離れた方向に反射する。
【0013】
1次透過光11は、油膜3の表面に接する透光板4の裏面4aに達すると、油膜3内を透過する2次透過光13と、油膜3の表面で反射する2次反射光6とに分かれる。2次反射光6は、油膜3の表面に対して入射した角度と同じ角度で反射する。また、2次透過光13は、試料2の平行面2aの表面において、この平行面2aに対して入射した角度と同じ角度で3次反射光7として反射する。両反射光6、7は互いに干渉し、干渉光8が発生する。
【0014】
受光手段9は、その一端に例えば断面円形形状の受光口9aを有していて、この受光口9aは、2次反射光6および3次反射光7により発生する干渉光8を受光し、1次反射光12を受光しないように配置されている。そして、受光手段9により受光された上記干渉光8の位相差に基づいて油膜3の厚さが測定される。この実施形態では、受光手段9が1次反射光12を受光しないで、2次反射光6および3次反射光7を主に受光するので、きれいな干渉縞を得ることができる。したがって、油膜3の厚さをより正確に測定することができる。特に、反射率の低い試料2の表面の油膜3の厚さも正確に測定できる点で非常に有効である。また、既存の膜厚測定装置の透光板を変更するのみで、コストを安価に膜厚測定装置の性能を向上させることができる。ただし、光照射手段5は、1次反射光12を受光手段9が受光しなければ、試料2の平行面2aに対して略垂直に光を照射してもよい。
【0015】
図2は、この発明の他の実施形態にかかる膜厚測定装置1aの構成を示す図解図である。図2を参照して、本実施形態が図1の実施形態と主に異なるのは、透光板4の裏面4aと表面4bが互いに平行な平板からなる透光板15を用いている点にある。他の構成については、図1の実施例と同様であるので、図に同一符号を付してその説明を省略する。
透光板15の板厚tは、上記光照射手段5から透光板15の表面15bへ照射した光が透光板15に垂直な方向に対してなす入射角A、光照射手段5の照射口5aの径d1、および受光手段9の受光口9aの径d2により構成される下記式を満たしている。
【0016】
t≧d1/2sinA ・・・(1)
上記式を導出するに至った過程を図3(a)および図3(b)を用いて説明する。図3(a)に示すように、透光板15の表面15bからの1次反射光12と、透光板15の裏面15aに接する油膜3の表面からの2次反射光6(干渉光に相当)とが少なくとも一部重複すると、受光手段9が両反射光12、6を受光してしまう。
【0017】
逆にいうと、受光手段9が1次反射光12を受光せず、2次反射光6を受光するためには、図3(b)に示すように、両反射光12、6が重複しないことが必要である。
ビーム径d1(照射口5aの径d1に相当)を持つ光照射手段5からの照射光の1次反射光12に対して、2次反射光6は、透光板15の表面15bに平行な方向に2t・tanAだけオフセットすることになり、これを両反射光12、6に直交する方向に見ると、オフセット量Bは
B=2t・tanA・cosA=2tsinA ・・・(2)
となる。
【0018】
ここで、両反射光12、6が重複しないためには、
B≧d1 ・・・(3)
式(2)および(3)より、上記式(1)が導出される。
この実施形態では、透光板15の板厚tを上記式(1)を満たす値にすることで、受光手段9が1次反射光12を受光しないで、2次反射光6および3次反射光7を受光するので、きれいな干渉縞を得ることができる。したがって、油膜3の厚さをより正確に測定することができる。特に、透光板15の板厚を、
t=d1/2sinA
としたとき、光のエネルギー損失が最も小さく、油膜3の厚さを最も正確に測定することができる。
【0019】
また、図4を参照して、受光手段9の最大受光幅d2に対応する、透光板15の裏面15aと油膜3の表面との接触領域17の幅Cは下記式により算出される。
C=d2/cosA
例えば、d1=5mm、d2=5mm、A=20°の場合、透光板15の板厚tおよび接触領域17の幅Cは、それぞれ次のような値になる。
【0020】
t≧6.9mm
C=5.3mm
この場合、透光板15の板厚tは6.9mm以上で検討した値とすればよく、接触領域17の幅Cが、5.3mmになるように試料2に荷重を加えればよい。ただし、透光板4の形状は上記の形状に限らず、外形が円板ではなく楕円板や四角板であってもよい。また、透光板4の材質は、ガラスに限らず、例えばアクリルであってもよい。
【0021】
この発明は、以上の実施形態の内容に限定されるものではなく、請求項記載の範囲内において種々の変更が可能である。
【図面の簡単な説明】
【図1】この発明の一実施形態にかかる膜厚測定装置の構成を示す図解図である。
【図2】この発明の他の実施形態にかかる膜厚測定装置の構成を示す図解図である。
【図3】透光板の板厚の最小値を導出するための模式図である。
【図4】接触領域の幅を導出するための模式図である。
【符号の説明】
1 膜厚測定装置
1a 膜厚測定装置
2 試料
3 油膜
4 透光板
4a 裏面
4b 表面
5 光照射手段
6 2次反射光
7 3次反射光
8 干渉光
9 受光手段
12 1次反射光
15 透光板
15a 裏面
15b 表面
A 入射角
t 板厚
d1 照射口の径
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a film thickness measuring device that measures the thickness of an oil film by an optical interference method.
[0002]
[Prior art]
An oil film is applied to the rolling and sliding surfaces for lubrication. Conventionally, the optical interference method has been widely used as a method for measuring the thickness of an oil film. In this type of measurement method, the surface of the oil film and the surface of the sample are irradiated by light irradiating means on the surface of the sample of the rolling member or the sliding member via, for example, a flat translucent plate whose back surface is in contact with the oil film. The interference light generated by the reflected light from the light is received through the light receiving means, and the thickness of the oil film is measured based on the phase difference of the interference light.
[0003]
When a bearing ball made of a steel ball having a relatively high light reflectance on the surface is used as a sample, the interference light accounts for about 90% of the light received by the light receiving means, whereas the light transmitting plate The reflected light from the surface is about 5% and can be ignored as an error.
[0004]
[Problems to be solved by the invention]
However, when using a sample such as a lip or O-ring of a rubber oil seal as a sliding member whose surface light reflectance is relatively small, the proportion of the interference light in the light received by the light receiving means is It becomes smaller and the reflected light from the surface of the light transmitting plate cannot be ignored as an error, and the thickness of the oil film cannot be measured accurately.
This invention aims at providing the film thickness measuring apparatus which can measure the thickness of an oil film correctly in view of the said subject.
[0005]
[Means for Solving the Problems and Effects of the Invention]
In order to achieve the above object, the present invention comprises a translucent plate whose back surface is in contact with an oil film applied to the surface of the sample, and a light irradiation means for irradiating the surface of the sample through the translucent plate, Rotation that rotates the translucent plate in a film thickness measuring device that receives reflected light from the surface of the oil film and the surface of the sample through a light receiving means and measures the thickness of the oil film based on the interference light of both reflected lights. The translucent plate includes a flat rear surface, and the translucent plate is rotated around an axis perpendicular to the rear surface of the translucent plate by the rotation mechanism, and the sample is transmitted through the rotation. sliding or rolling the rear surface of the light plate contact, as reflected light from the surface of the transparent plate is not received by the light receiving means, the surface of the transparent plate is inclined with respect to the rear surface, the magnetic surface of the light plate, characterized in that it comprises a spherical or conical tapered surface A thickness measuring device.
[0006]
In this case, since the light receiving means mainly receives the reflected light from the surface of the oil film and the surface of the sample without receiving the reflected light from the surface of the translucent plate, a clean interference fringe can be obtained. Therefore, the thickness of the oil film can be measured more accurately regardless of the reflectance of the surface of the sample.
The surface of the translucent plate preferably includes a spherical surface or a conical tapered surface. This is because when the sample is a ball for a bearing, the direction of reflected light from the surface of the translucent plate does not change even if the ball and the translucent plate are brought into rolling contact.
[0007]
The present invention also includes a translucent plate whose back surface is in contact with an oil film applied to the surface of the sample, and a light irradiation means for irradiating the surface of the sample through the translucent plate, the surface of the oil film and the sample In the film thickness measuring device that receives the reflected light from the surface of the light through the light receiving means and measures the thickness of the oil film based on the interference light of the both reflected light, the rotating mechanism that rotates the translucent plate, The translucent plate is a flat plate whose front surface and back surface are parallel , and the translucent plate is rotated around an axis perpendicular to the back surface of the translucent plate by the rotation mechanism, and the sample is transmitted through the rotation. sliding or rolling the rear surface of the light plate contact, said light irradiation means irradiates light from obliquely with respect to the surface of the transparent plate, said light receiving means, reflected from the surface and the surface of the sample oil film Translucent so that it receives light and does not receive reflected light from the surface of the translucent plate Have set the thickness of the incident angle of the light from the light irradiation means to the surface of the translucent plate A, the thickness of the transparent plate t, a diameter of the irradiation opening of the light irradiation means as d1, the following The expression is satisfied,
t ≧ (d1 / 2) sinA
Assuming that the width of the contact area between the back surface of the light transmitting plate and the surface of the oil film is C, the maximum light receiving width of the light receiving means is d2, and the incident angle of light from the light emitting means to the surface of the light transmitting plate is A, The film thickness measuring apparatus is characterized in that the sample is pressed against the back surface of the translucent plate so as to be satisfied .
C = d2 / cosA
[0008]
In this case, since the light receiving means mainly receives the reflected light from the surface of the oil film and the surface of the sample without receiving the reflected light from the surface of the translucent plate, a clean interference fringe can be obtained. Therefore, the thickness of the oil film can be measured more accurately regardless of the reflectance of the surface of the sample.
Further, the inventor of the present application sets the incident angle A of light from the light irradiation means to the surface of the light transmission plate, the thickness t of the light transmission plate, and the diameter d1 of the irradiation port of the light irradiation means to satisfy the following formula. The knowledge that it is preferable to have been obtained was acquired.
[0009]
t ≧ d1 / 2sinA
In particular, the thickness of the translucent plate is made as thin as possible within the above range. That is, the thickness of the translucent plate is
t = d1 / 2sinA
The energy loss of light is the smallest, and the thickness of the oil film can be measured most accurately.
[0010]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of the present invention will be specifically described below with reference to the drawings. FIG. 1 is an illustrative view showing a configuration of a film thickness measuring apparatus 1 according to an embodiment of the present invention. In FIG. 1, a film thickness measuring device 1 is a device that measures the thickness of an oil film 3 applied to the surface of a sample 2 by optical interferometry, and is arranged so that a back surface 4 a is in contact with the surface of the oil film 3. Light plate 4, light irradiating means 5 for irradiating the surface of sample 2 through light transmitting plate 4 and oil film 3, reflected light 6 from the surface of oil film 3, and reflected light 7 from the surface of sample 2 And a light receiving means 9 for receiving the interference light 8 generated by.
[0011]
The sample 2 may be, for example, a rubber O-ring as a sliding member. In this case, the sample 2 has elasticity and has a relatively low surface light reflectance. The sample 2 is held by a sample table (not shown), and a predetermined load is applied against the translucent plate 4. Therefore, the sample 2 is pressed into the back surface 4 a of the light transmitting plate 4 to form a parallel surface 2 a parallel to the back surface 4 a of the light transmitting plate 4.
The translucent plate 4 is a circular plate having a flat back surface 4a made of, for example, glass, and its front surface 4b has, for example, a spherical surface. Further, the back surface 4a of the translucent plate 4 is connected to the rotating shaft 10 at the center thereof, and when the film thickness measuring device 1 is operated, the rotating shaft 10 is rotated by a servo motor or the like, and is composed of, for example, an O-ring. The translucent plate 4 rotates relative to the sample 2 while sliding. On the other hand, when using the sample 2 made of a steel ball, the sample 2 rolls as the light transmitting plate 4 rotates. Here, the shape of the translucent plate 4 is not limited to the above-described shape. For example, if the direction of the reflected light from the surface 4b of the translucent plate 4 is not changed by the rotation of the translucent plate 4, for example, The surface 4b may be a conical tapered surface, and the outer shape may be an elliptical plate or a square plate instead of a circular plate. Moreover, the material of the translucent plate 4 is not limited to glass, but may be acrylic, for example.
[0012]
The light irradiation means 5 has, for example, an irradiation port 5a having a circular cross section at one end, and irradiates light, such as a laser, on the parallel surface 2a of the sample 2 obliquely from the irradiation port 5a. The irradiated light is divided into primary transmitted light 11 that is transmitted through the surface 4 b of the translucent plate 4 and primary reflected light 12 that is reflected from the surface 4 b of the translucent plate 4. For example, the primary reflected light 12 is reflected at the same angle as the incident angle with respect to the direction perpendicular to the surface 4 b of the translucent plate 4. Since the surface 4 b of the light transmitting plate 4 is spherical, the primary reflected light 12 is reflected in a direction sufficiently away from the light receiving means 9.
[0013]
When the primary transmitted light 11 reaches the back surface 4 a of the translucent plate 4 in contact with the surface of the oil film 3, the secondary transmitted light 13 that passes through the oil film 3 and the secondary reflected light 6 that reflects on the surface of the oil film 3 Divided into The secondary reflected light 6 is reflected at the same angle as the incident angle with respect to the surface of the oil film 3. Further, the secondary transmitted light 13 is reflected as the tertiary reflected light 7 on the surface of the parallel surface 2 a of the sample 2 at the same angle as the incident angle with respect to the parallel surface 2 a. Both reflected lights 6 and 7 interfere with each other, and interference light 8 is generated.
[0014]
The light receiving means 9 has, for example, a light receiving hole 9a having a circular cross section at one end. The light receiving hole 9a receives the interference light 8 generated by the secondary reflected light 6 and the tertiary reflected light 7, and 1 It arrange | positions so that the next reflected light 12 may not be received. Then, the thickness of the oil film 3 is measured based on the phase difference of the interference light 8 received by the light receiving means 9. In this embodiment, since the light receiving means 9 mainly receives the secondary reflected light 6 and the tertiary reflected light 7 without receiving the primary reflected light 12, a clean interference fringe can be obtained. Therefore, the thickness of the oil film 3 can be measured more accurately. In particular, it is very effective in that the thickness of the oil film 3 on the surface of the sample 2 having a low reflectance can be accurately measured. Moreover, the performance of the film thickness measuring apparatus can be improved at low cost only by changing the light transmitting plate of the existing film thickness measuring apparatus. However, the light irradiation means 5 may irradiate light substantially perpendicularly to the parallel surface 2a of the sample 2 if the light receiving means 9 does not receive the primary reflected light 12.
[0015]
FIG. 2 is an illustrative view showing a configuration of a film thickness measuring apparatus 1a according to another embodiment of the present invention. Referring to FIG. 2, this embodiment is mainly different from the embodiment of FIG. 1 in that a light-transmitting plate 15 made of flat plates whose back surface 4a and surface 4b are parallel to each other is used. is there. Since other configurations are the same as those of the embodiment of FIG. 1, the same reference numerals are given to the drawings and the description thereof is omitted.
The thickness t of the translucent plate 15 is the incident angle A formed by the light irradiated from the light irradiating means 5 onto the surface 15b of the translucent plate 15 with respect to the direction perpendicular to the translucent plate 15, and the irradiation of the light irradiating means 5. The following expression constituted by the diameter d1 of the port 5a and the diameter d2 of the light receiving port 9a of the light receiving means 9 is satisfied.
[0016]
t ≧ d1 / 2sinA (1)
The process that led to the derivation of the above equation will be described with reference to FIGS. 3 (a) and 3 (b). As shown in FIG. 3A, the primary reflected light 12 from the surface 15b of the translucent plate 15 and the secondary reflected light 6 from the surface of the oil film 3 in contact with the back surface 15a of the translucent plate 15 (into interference light). The light receiving means 9 receives both the reflected lights 12 and 6.
[0017]
In other words, in order for the light receiving means 9 not to receive the primary reflected light 12 but to receive the secondary reflected light 6, as shown in FIG. 3 (b), the both reflected lights 12 and 6 do not overlap. It is necessary.
The secondary reflected light 6 is parallel to the surface 15b of the translucent plate 15 with respect to the primary reflected light 12 of the irradiated light from the light irradiation means 5 having the beam diameter d1 (corresponding to the diameter d1 of the irradiation port 5a). The offset amount B is offset by 2t · tanA in the direction, and when viewed in the direction orthogonal to the two reflected lights 12 and 6, the offset amount B is B = 2t · tanA · cosA = 2tsinA (2)
It becomes.
[0018]
Here, in order that the reflected lights 12 and 6 do not overlap,
B ≧ d1 (3)
From the equations (2) and (3), the above equation (1) is derived.
In this embodiment, by setting the thickness t of the translucent plate 15 to a value satisfying the above formula (1), the light receiving means 9 does not receive the primary reflected light 12 and the secondary reflected light 6 and the tertiary reflected light. Since the light 7 is received, a clean interference fringe can be obtained. Therefore, the thickness of the oil film 3 can be measured more accurately. In particular, the thickness of the translucent plate 15 is
t = d1 / 2sinA
In this case, the energy loss of light is the smallest and the thickness of the oil film 3 can be measured most accurately.
[0019]
Referring to FIG. 4, the width C of the contact region 17 between the back surface 15 a of the translucent plate 15 and the surface of the oil film 3 corresponding to the maximum light receiving width d <b> 2 of the light receiving means 9 is calculated by the following equation.
C = d2 / cosA
For example, when d1 = 5 mm, d2 = 5 mm, and A = 20 °, the thickness t of the translucent plate 15 and the width C of the contact region 17 are as follows.
[0020]
t ≧ 6.9mm
C = 5.3mm
In this case, the thickness t of the translucent plate 15 may be a value studied at 6.9 mm or more, and a load may be applied to the sample 2 so that the width C of the contact region 17 is 5.3 mm. However, the shape of the translucent plate 4 is not limited to the above shape, and the outer shape may be an elliptical plate or a square plate instead of a circular plate. Moreover, the material of the translucent plate 4 is not limited to glass, but may be acrylic, for example.
[0021]
The present invention is not limited to the contents of the above embodiments, and various modifications can be made within the scope of the claims.
[Brief description of the drawings]
FIG. 1 is an illustrative view showing a configuration of a film thickness measuring apparatus according to an embodiment of the present invention.
FIG. 2 is an illustrative view showing a configuration of a film thickness measuring apparatus according to another embodiment of the present invention.
FIG. 3 is a schematic diagram for deriving a minimum value of the thickness of a light-transmitting plate.
FIG. 4 is a schematic diagram for deriving a width of a contact area.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Film thickness measuring apparatus 1a Film thickness measuring apparatus 2 Sample 3 Oil film 4 Translucent plate 4a Back surface 4b Front surface 5 Light irradiation means 6 Secondary reflected light 7 Tertiary reflected light 8 Interference light 9 Light receiving means 12 Primary reflected light 15 Translucent Plate 15a Back surface 15b Front surface A Incident angle t Plate thickness d1 Diameter of irradiation port

Claims (2)

試料の表面に塗布された油膜に裏面が接する透光板と、
上記透光板を介して試料の表面に光を照射する光照射手段とを備え、
油膜の表面および試料の表面からの反射光を受光手段を介して受光し、両反射光の干渉光に基づいて油膜の厚さを測定する膜厚測定装置において、
上記透光板を回転させる回転機構を備え、
上記透光板は平坦な裏面を含み、
上記透光板は、上記回転機構によって、透光板の裏面と直交する軸線の回りに回転され、その回転に伴って、試料が透光板の裏面に対して摺動または転がり接触し、
上記透光板の表面からの反射光が受光手段によって受光されないように、透光板の表面が裏面に対して傾斜しており、
上記透光板の表面は、球面または円錐状テーパ面を含むことを特徴とする膜厚測定装置。
A translucent plate whose back surface is in contact with an oil film applied to the surface of the sample;
A light irradiation means for irradiating the surface of the sample with light through the translucent plate,
In the film thickness measuring device that receives the reflected light from the surface of the oil film and the surface of the sample through the light receiving means, and measures the thickness of the oil film based on the interference light of both reflected lights,
A rotation mechanism for rotating the light transmitting plate;
The translucent plate includes a flat back surface,
The translucent plate is rotated around an axis perpendicular to the back surface of the translucent plate by the rotating mechanism, and with the rotation, the sample slides or rolls against the back surface of the translucent plate,
The surface of the light transmitting plate is inclined with respect to the back surface so that the reflected light from the surface of the light transmitting plate is not received by the light receiving means ,
The film thickness measuring device , wherein the surface of the light transmitting plate includes a spherical surface or a conical tapered surface .
試料の表面に塗布された油膜に裏面が接する透光板と、
上記透光板を介して試料の表面に光を照射する光照射手段とを備え、
油膜の表面および試料の表面からの反射光を受光手段を介して受光し、両反射光の干渉光に基づいて油膜の厚さを測定する膜厚測定装置において、
上記透光板を回転させる回転機構を備え、
上記透光板は、表面と裏面が平行な平板からなり、
上記透光板は、上記回転機構によって、透光板の裏面と直交する軸線の回りに回転され、その回転に伴って、試料が透光板の裏面に対して摺動または転がり接触し、
上記光照射手段は、透光板の表面に対して斜めから光を照射し、
上記受光手段は、油膜の表面および試料の表面からの反射光を受光し、且つ透光板の表面からの反射光を受光しないように、透光板の板厚を設定してあり、
上記光照射手段から透光板の表面への光の入射角をA、透光板の板厚をt、光照射手段の照射口の径をd1として、下記式が満たされ、
t≧(d1/2)sinA
透光板の裏面と油膜の表面との接触領域の幅をC、受光手段の最大受光幅をd2、上記光照射手段から透光板の表面への光の入射角をAとして、下記式が満たされるように、試料が透光板の裏面に対して押し付けられていることを特徴とする膜厚測定装置。
C=d2/cosA
A translucent plate whose back surface is in contact with an oil film applied to the surface of the sample;
A light irradiation means for irradiating the surface of the sample with light through the translucent plate,
In the film thickness measuring device that receives the reflected light from the surface of the oil film and the surface of the sample through the light receiving means, and measures the thickness of the oil film based on the interference light of both reflected lights,
A rotation mechanism for rotating the light transmitting plate;
The translucent plate is a flat plate whose front and back are parallel ,
The translucent plate is rotated around an axis perpendicular to the back surface of the translucent plate by the rotating mechanism, and with the rotation, the sample slides or rolls against the back surface of the translucent plate,
The light irradiation means irradiates light obliquely with respect to the surface of the translucent plate,
The light receiving means receives the reflected light from the surface of the oil film and the surface of the sample, and sets the plate thickness of the light transmitting plate so as not to receive the reflected light from the surface of the light transmitting plate,
When the incident angle of light from the light irradiation means to the surface of the light transmission plate is A, the thickness of the light transmission plate is t, and the diameter of the irradiation port of the light irradiation means is d1, the following equation is satisfied:
t ≧ (d1 / 2) sinA
Assuming that the width of the contact area between the back surface of the light transmitting plate and the surface of the oil film is C, the maximum light receiving width of the light receiving means is d2, and the incident angle of light from the light emitting means to the surface of the light transmitting plate is A, The film thickness measuring apparatus, wherein the sample is pressed against the back surface of the light-transmitting plate so as to be satisfied.
C = d2 / cosA
JP2000181808A 2000-06-16 2000-06-16 Film thickness measuring device Expired - Fee Related JP3837276B2 (en)

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