Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JP3849953B2 - Automatic alignment mechanism of particle size distribution analyzer - Google Patents
[go: Go Back, main page]

JP3849953B2 - Automatic alignment mechanism of particle size distribution analyzer - Google Patents

Automatic alignment mechanism of particle size distribution analyzer Download PDF

Info

Publication number
JP3849953B2
JP3849953B2 JP24182797A JP24182797A JP3849953B2 JP 3849953 B2 JP3849953 B2 JP 3849953B2 JP 24182797 A JP24182797 A JP 24182797A JP 24182797 A JP24182797 A JP 24182797A JP 3849953 B2 JP3849953 B2 JP 3849953B2
Authority
JP
Japan
Prior art keywords
light
lens system
light source
optical axis
photodetector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP24182797A
Other languages
Japanese (ja)
Other versions
JPH1164205A (en
Inventor
俊哉 伊東
寿一郎 右近
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP24182797A priority Critical patent/JP3849953B2/en
Publication of JPH1164205A publication Critical patent/JPH1164205A/en
Application granted granted Critical
Publication of JP3849953B2 publication Critical patent/JP3849953B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【0001】
【発明の属する技術分野】
本発明は光源からの光を試料に照射することによって得られる散乱光を光検出器で検出し、その散乱光強度パターンに基づいて試料中の粒度分布を測定するようにした粒度分布測定装置におけるオートアライメント機構に関する。
【0002】
【従来の技術】
散乱式の粒度分布測定装置の構成は、例えば図9に示され、同図において、符号aはレーザ光bを発生させるレーザ管、cはレーザ光を拡大して平行光束とするビーム拡大器、dは試料eを収容するセル、fはセルdの後方に配置される集光レンズ、gは集光レンズfから出射される散乱光を検出するためのフォトダイオードよりなる光検出器、hは光検出器gからの信号を取り込むマルチプレクサ、iはマルチプレクサhからの信号が入力され、散乱光強度パターンに基づいて演算をおこない粒度分布を求めるCPUである。
【0003】
このような粒度分布測定装置では、レーザ管aと光検出器gの光軸が精度よく一致していなければならないが、レーザ管aが熱歪みを起こしたり、セルd,集光レンズf,光検出器g等を設けたベンチ(図示省略)が熱で歪んだり、また、セルdを交換したりする場合、その取付位置が変化するなどにより、光軸にずれが生じることがあり、測定の度毎に光軸の調整がおこなわれる。
【0004】
そのために、光検出器gの光軸中心部に、図示は省略するが、例えばフォトダイオードよりなる4分割の光軸調整用受光部を設け、その光軸調整用受光部を構成する4つの受光素子からそれぞれ出力される強度信号の大きさが等しくなるように、光検出器gをXY軸方向に移動させることにより、測定に先立って光軸合わせがおこなわれていた。
【0005】
【発明が解決しようとする課題】
上述の光検出器gをXY軸方向に移動させるために、通常、図9に示すように、圧電素子やステッピングモータ等の2つのアクチュエータm,nが用いられ、かつ、その光検出器gはリングディテクタとも称されるように円弧状に形成した複数個のフォトダイオードよりなる受光素子を板面に扇形状に配列して大きな板状体に形成されていた。従って、光軸調整のために必要とされる移動量(またはステップ数)を確保するためには装置内に比較的大きなスペースを要し、また、構成も複雑になるという難点があった。
【0006】
本発明はこのような実情に鑑みてなされ、光検出器を移動させることなく光軸の自動調整をおこなうことのできる構成が簡易でコンパクトな、粒度分布測定装置のオートアライメント機構を提供することを目的としている。
【0007】
【課題を解決するための手段】
本発明は上述の課題を解決するための手段を以下のように構成している。
すなわち、請求項1に記載の発明では、光源と、第1レンズ系と、光束を集光させるための第2レンズ系と、光検出器とを具備し、試料に光を照射させて発生した散乱光を前記光検出器で検出することにより得られる散乱光強度パターンに基づいて試料の粒度分布を測定するようにした散乱式の粒度分布測定装置のオートアライメント機構であって、前記光検出器の受光面に、複数の受光素子よりなる、光軸調整用の透過光検出用測定部としてのチェックパターンを設けると共に、前記光源を前記光検出器の受光面に対してXY軸方向に揺動操作するための一対のアクチュエータを球面でなるその先端部が互いに直交し合う方向に設け、これら一対のアクチュエータに対向させて戻しばねを設け、更に、光源の基部を中心として前記XY軸方向に揺動自在となるように前記基部が支持部材で支持されると共に、光源の先端部が前記一対のアクチュエータの前記先端部と戻しばねとの間に挟持される一方、予め設定・記憶させた光軸調整プログラムに従い、前記チェックパターンからの検出信号に基づいて、前記チェックパターンの前記複数の受光素子における各受光強度が全て等しくなるように前記光軸を調整するために前記光源を揺動させるための制御信号を前記アクチュエータに送出する光軸調整処理部を設けてなることを特徴としている。
【0008】
請求項2に記載の発明では、光源と、第1レンズ系と、光束を集光させるための第2レンズ系と、光検出器とを具備し、試料に光を照射させて発生した散乱光を前記光検出器で検出することにより得られる散乱光強度パターンに基づいて試料の粒度分布を測定するようにした散乱式の粒度分布測定装置のオートアライメント機構であって、前記光検出器の受光面に、複数の受光素子よりなる、光軸調整用の透過光検出用測定部としてのチェックパターンを設けると共に、前記光源を前記第1レンズ系、または、第1レンズ系及び第2レンズ系と一体化させ、その光源と第1レンズ系、または、第1レンズ系及び第2レンズ系を前記光検出器の受光面に対してXY軸方向に揺動操作するための一対のアクチュエータを球面でなるその先端部が互いに直交し合う方向に設け、これら一対のアクチュエータに対向させて戻しばねを設け、更に、前記光源と前記第1レンズ系、または、第1レンズ系及び第2レンズ系をケース体内に固定状態に収納し、前記ケース体の一端側を支持部材で支持させ、前記ケース体の他端側前記XY軸方向に揺動操作できるように前記ケース体の他端側が前記一対のアクチュエータの前記先端部と戻しばねとの間に挟持される一方、予め設定・記憶させた光軸調整プログラムに従い、前記チェックパターンからの検出信号に基づいて、前記チェックパターンの前記複数の受光素子における各受光強度が全て等しくなるように前記光軸を調整するために前記光源とレンズ系とを揺動させるための制御信号を前記アクチュエータに送出する光軸調整処理部を設けてなることを特徴としている。
【0009】
【発明の実施の形態】
以下に本発明の散乱式の粒度分布装置のオートアライメント機構の実施形態を図面に基づいて詳細に説明する。
図1は装置の構成を示し、符号1はレーザ光を発生する光源(レーザ管)、2はレーザ光を適宜に拡大して平行光束とするビーム拡大器(本発明でいう第1レンズ系)で、例えば2つの凸レンズ21,22(図4(A)参照)よりなる。上述の光源1はその基部を中心として紙面に垂直な面内におけるXY軸方向に揺動自在となるようにその基部が支持部材3で支持されると共に、球面でなるその先端部が互いに直交し合う方向に設けられる一対のアクチュエータ4,5とこれらアクチュエータ4,5に対向して設けた戻しばね41,51(図示省略)によって支持され、その光源1の揺動操作によって光軸11をXY軸方向に移動調整できるようになっている(図2参照)。
【0010】
上述のアクチュエータ4,5は例えばステップモータよりなり、その回転によりその回転軸と連係させた作動軸が進退動作するものであり、上述のように、この作動軸の前記球面でなる先端部と戻しばね41,51との間に光源1の先端部を挟持させることによってその光源1を揺動させることができるが、スプッテモータに代えて圧電抵抗素子(PZT)を用いてもよい。
【0011】
6はフローセル、7は凸レンズよりなる集光レンズ(本発明でいう第2レンズ系)、9はフォトダイオードよりなる受光素子を配列した光検出器(図3参照)で、4つの受光素子よりなる光軸調整用の透過光検出用測定部(チェックパターン)91と、その透過光検出用測定部91を含む一つの検出平面(受光面)に設けられる散乱光検出用測定部92よりなる。10は光検出器9からの検出信号を取り込むマルチプレクサ、12はCPUであり、マルチプレクサ10からの信号が入力され、予め設定・記憶されている所定の制御プログラムに従い、散乱光強度パターンに基づいて粒度分布の測定をおこなうと共に、その測定に先立ち、光軸11を調整するためにアクチュエータ4,5に制御信号を送出する光軸調整処理部を含むものである。
【0012】
このような構成により、フローセル6内の試料にレーザ光を照射すると、レーザ光の一部が試料中の粒子を照射して散乱光となり、残りの光は粒子と粒子との間を通過して透過光となり、共に光検出器9に至る。
【0013】
このような構成の粒度分布測定装置では、測定に先立ち、測定対象となる試料をフローセル6内に注入した状態にて、まず、光軸調整処理部からの指令によってオートアライメント(光軸自動調整)がおこなわれる。すなわち、透過光検出用測定部91の4つの受光素子911〜914における各受光強度が全て等しくなるように両アクチュエータ4,5に対して制御信号が送出され、光源1が光検出器9の受光面に対してXY軸方向に揺動されることにより光軸11が自動調整される(図2参照)。
【0014】
この場合、第1レンズ系2から嵩高い光検出器9に至るまでの構成は固定状態として、寸法形状の比較的小さな光源1をわずかに揺動させるのみでよく、余分なスペースを別途要することなく、また、その光源1のわずかな揺動によって光軸11の調整量を大きくとれるので、従来よりも迅速にオートアライメントが可能となり、また、装置をコンパクトに形成することも可能となる。
【0015】
上述のオートアライメントが完了した後に、散乱光検出用測定部92により粒度分布の測定がおこなわれる。その散乱光検出用測定部92は、図3に示されるように、円弧状に形成した複数個の受光素子列92(921〜925)を扇形状に配列したものである。
【0016】
なお、本発明は光検出器9における受光素子の配列を図3に示すものに限定するものではなく、少なくとも受光面にチェックパターンと散乱光検出用測定部とが適宜な受光素子の配列で形成されていればよい。
【0017】
一方、上述のフローセル6の位置は図1に示す位置に限られることなく、集光レンズ7と光検出器9との間に配置してもよい。また、ビーム拡大器を構成する第1レンズ系2のレンズの組み合わせは、例えば図4(A)〜(C)および図5(A)〜(C)に示される中から適宜に選択されてよい。なお、図4(A)は凸レンズ21,22の組み合わせであり、図4(B)は凹レンズ23と凸レンズ24、図4(C)は凹レンズ23と合わせレンズ(凹レンズ24と凸レンズ25)、図5(A)は凸レンズ26と27、図5(B)は合わせレンズ(凸レンズ26と凹レンズ23)、(凹レンズ24と凸レンズ25)同士、図5(C)は合わせレンズ(凸レンズ26と凹レンズ23)、(凹レンズ24と凸レンズ25)同士の組み合わせである。
【0018】
図6,図7は異なる実施形態を示し、この場合、光源1と第1レンズ系2を一体化すると共に、ケース体8内にその第1レンズ系2とフローセル6および集光レンズ7を固定状態に収納し、そのケース体8の一端側を支持部材3で揺動自在に支持させる一方、その他端側を互いに直交し合う方向に設けた一対のアクチュエータ4,5の球面でなる先端部と戻しばね41,51(図示省略)によって支持させ、そのケース体8の他端側を紙面に垂直な面内のXY軸方向に揺動操作できるように構成されている。このような構成によっても、嵩高い光検出器9を動かすことなく、光軸11の自動調整を迅速に済ませることができ、かつ、装置をコンパクトに形成することができる。この場合もフローセル6が集光レンズ7と光検出器9との間にあってもよい。
【0019】
図8は別の実施形態を示し、この場合、ケース体8内には光源1と一体化された第1レンズ系2と集光レンズ7を固定状態に収納し、フローセル6はそのケース体8と光検出器9の間に固定状態に配置し、両アクチュエータ4,5によって光源1と第1レンズ系2および集光レンズ7を一体的にXY軸方向に揺動させることにより光軸11の自動調整ができる。
【0020】
この場合においても、その自動調整を迅速におこなうことができ、かつ、装置をコンパクトに形成することもできる。また、図示は省略するが、ケース体8内に光源1と一体化させた第1レンズ系2を固定状態に収納し、この光源1と第1レンズ系2を揺動させるようにしてもよい。
【0021】
【発明の効果】
以上説明したように、本発明では、光源と、第1レンズ系と、光束を集光させるための第2レンズ系と、光検出器とを具備し、試料に光を照射させて発生した散乱光を前記光検出器で検出することにより得られる散乱光強度パターンに基づいて試料の粒度分布を測定するようにした散乱式の粒度分布測定装置のオートアライメント機構であって、前記光検出器の受光面に、複数の受光素子よりなる、光軸調整用の透過光検出用測定部としてのチェックパターンを設けると共に、前記光源を前記光検出器の受光面に対してXY軸方向に揺動操作するための一対のアクチュエータを球面でなるその先端部が互いに直交し合う方向に設け、これら一対のアクチュエータに対向させて戻しばねを設け、更に、光源の基部を中心として前記XY軸方向に揺動自在となるように前記基部が支持部材で支持されると共に、光源の先端部が前記一対のアクチュエータの前記先端部と戻しばねとの間に挟持される一方、予め設定・記憶させた光軸調整プログラムに従い、前記チェックパターンからの検出信号に基づいて、前記チェックパターンの前記複数の受光素子における各受光強度が全て等しくなるように前記光軸を調整するために前記光源を揺動させるための制御信号を前記アクチュエータに送出する光軸調整処理部を設けることにより、アクチュエータの駆動量を少なくしてより迅速に光軸の調整が可能となり、装置の構成が簡易なものとなり、コンパクト化も可能となる。
また、本発明では、光源と、第1レンズ系と、光束を集光させるための第2レンズ系と、光検出器とを具備し、試料に光を照射させて発生した散乱光を前記光検出器で検出することにより得られる散乱光強度パターンに基づいて試料の粒度分布を測定するようにした散乱式の粒度分布測定装置のオートアライメント機構であって、前記光検出器の受光面に、複数の受光素子よりなる、光軸調整用の透過光検出用測定部としてのチェックパターンを設けると共に、前記光源を前記第1レンズ系、または、第1レンズ系及び第2レンズ系と一体化させ、その光源と第1レンズ系、または、第1レンズ系及び第2レンズ系を前記光検出器の受光面に対してXY軸方向に揺動操作するための一対のアクチュエータを球面でなるその先端部が互いに直交し合う方向に設け、これら一対のアクチュエータに対向させて戻しばねを設け、更に、前記光源と前記第1レンズ系、または、第1レンズ系及び第2レンズ系をケース体内に固定状態に収納し、前記ケース体の一端側を支持部材で支持させ、前記ケース体の他端側前記XY軸方向に揺動操作できるように前記ケース体の他端側が前記一対のアクチュエータの前記先端部と戻しばねとの間に挟持される一方、予め設定・記憶させた光軸調整プログラムに従い、前記チェックパターンからの検出信号に基づいて、前記チェックパターンの前記複数の受光素子における各受光強度が全て等しくなるように前記光軸を調整するために前記光源とレンズ系とを揺動させるための制御信号を前記アクチュエータに送出する光軸調整処理部を設けることにより、迅速に光軸の調整が可能となり、装置の構成が簡易なものとなり、コンパクト化も可能となる。
【図面の簡単な説明】
【図1】 本発明の粒度分布測定装置のオートアライメント機構の一実施形態を示す構成図である。
【図2】 同光軸調整時の説明図である。
【図3】 同光検出器の受光素子の配列の一例を示す正面図である。
【図4】 (A)〜(C)は同第1レンズ系のレンズの組み合わせの例を示す図面である。
【図5】 (A)〜(C)は同第1レンズ系のレンズの組み合わせの例を示す図面である。
【図6】 同異なる実施形態を示す構成図である。
【図7】 同光軸調整時の説明図である。
【図8】 同別の実施形態を示す構成図である。
【図9】 従来の粒度分布測定装置の一例を示す構成図である。
【符号の説明】
1…光源、2…第1レンズ系、3…支持部材、4,5…アクチュエータ、7…第2レンズ系、9…光検出器、91…チェックパターン、11…光軸、12…光軸調整処理部(CPU)、41,51…戻しばね、911〜914…受光素子。
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a particle size distribution measuring apparatus in which scattered light obtained by irradiating a sample with light from a light source is detected by a photodetector and the particle size distribution in the sample is measured based on the scattered light intensity pattern. The present invention relates to an automatic alignment mechanism.
[0002]
[Prior art]
The configuration of the scattering type particle size distribution measuring apparatus is shown in FIG. 9, for example, in which the symbol a is a laser tube that generates laser light b, c is a beam expander that expands the laser light into a parallel beam, d is a cell containing the sample e, f is a condensing lens arranged behind the cell d, g is a photodetector comprising a photodiode for detecting scattered light emitted from the condensing lens f, and h is A multiplexer that takes in a signal from the light detector g, i is a CPU that receives the signal from the multiplexer h and performs a calculation based on the scattered light intensity pattern to obtain a particle size distribution.
[0003]
In such a particle size distribution measuring apparatus, the optical axes of the laser tube a and the light detector g must coincide with each other with high precision. However, the laser tube a is subject to thermal distortion, cell d, condenser lens f, light When the bench (not shown) provided with the detector g or the like is distorted by heat, or when the cell d is replaced, the optical axis may be displaced due to a change in the mounting position. The optical axis is adjusted every degree.
[0004]
For this purpose, although not shown in the figure, a four-part optical axis adjustment light-receiving unit made of a photodiode is provided at the center of the optical axis of the photodetector g, and the four light-receiving components constituting the optical axis adjustment light-receiving unit are provided. Optical axis alignment was performed prior to measurement by moving the photodetector g in the XY axis directions so that the magnitudes of the intensity signals output from the elements were equal.
[0005]
[Problems to be solved by the invention]
In order to move the above-described photodetector g in the XY axis direction, normally, as shown in FIG. 9, two actuators m and n such as a piezoelectric element and a stepping motor are used, and the photodetector g is A light receiving element made up of a plurality of photodiodes formed in an arc shape so as to be called a ring detector is arranged in a fan shape on the plate surface to form a large plate. Therefore, in order to secure the amount of movement (or the number of steps) required for adjusting the optical axis, a relatively large space is required in the apparatus, and the configuration is complicated.
[0006]
The present invention has been made in view of such circumstances, and provides an automatic alignment mechanism of a particle size distribution measuring apparatus that has a simple and compact configuration that can automatically adjust an optical axis without moving a photodetector. It is aimed.
[0007]
[Means for Solving the Problems]
In the present invention, means for solving the above-described problems are configured as follows.
That is, in the first aspect of the present invention, the light source, the first lens system, the second lens system for condensing the light beam, and the photodetector are provided, and the light is emitted by irradiating the sample. An auto alignment mechanism of a scattering type particle size distribution measuring apparatus for measuring a particle size distribution of a sample on the basis of a scattered light intensity pattern obtained by detecting scattered light with the light detector, wherein the light detector A check pattern as a measurement unit for detecting transmitted light for adjusting the optical axis is provided on the light receiving surface, and the light source is swung in the XY-axis direction with respect to the light receiving surface of the photodetector. a pair of actuators for manipulating the direction in which the tip made of a spherical mutually orthogonal to each other, is opposed to the pair of actuator spring disposed back, further, the XY-axis direction of the base of the light source as the center Together with the base portion is supported by the support member so as to be swingable, while the distal end portion of the light source is sandwiched between the return spring and the distal end portion of said pair of actuators, were pre-set and stored According to the optical axis adjustment program, based on the detection signal from the check pattern, the light source is oscillated to adjust the optical axis so that the received light intensities of the plurality of light receiving elements of the check pattern are all equal. An optical axis adjustment processing unit for sending a control signal to the actuator is provided.
[0008]
The invention according to claim 2 includes a light source, a first lens system, a second lens system for condensing a light beam, and a photodetector, and scattered light generated by irradiating the sample with light. Is an auto-alignment mechanism of a scattering-type particle size distribution measuring apparatus that measures the particle size distribution of a sample based on a scattered light intensity pattern obtained by detecting the light by the light detector. A check pattern as a measurement unit for detecting transmitted light for adjusting the optical axis is provided on the surface, and the light source is connected to the first lens system or the first lens system and the second lens system. A pair of actuators for integrating the light source and the first lens system or the first lens system and the second lens system with respect to the light receiving surface of the photodetector in the XY axis direction are spherical. consisting of the tip each other Provided in a direction mutually perpendicular to the spring provided back to face the pair of actuators, further, said light source and said first lens system or, in a fixed state of the first lens system and the second lens system to the case body The one end side of the case body is supported by a support member, and the other end side of the case body is swingable in the XY axis direction so that the other end side of the case body is the tip of the pair of actuators. In accordance with an optical axis adjustment program set and stored in advance, all received light intensities of the plurality of light receiving elements of the check pattern are all based on detection signals from the check pattern. An optical axis adjustment processing unit is provided that sends a control signal for swinging the light source and the lens system to the actuator to adjust the optical axes to be equal. It is characterized in that it comprises.
[0009]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of an auto-alignment mechanism of a scattering type particle size distribution apparatus of the present invention will be described in detail below with reference to the drawings.
FIG. 1 shows the configuration of the apparatus. Reference numeral 1 is a light source (laser tube) for generating laser light, and 2 is a beam expander (first lens system referred to in the present invention) that appropriately expands the laser light into a parallel beam. Thus, for example, it consists of two convex lenses 21 and 22 (see FIG. 4A). The light source 1 is supported by the support member 3 so as to be swingable in the XY-axis direction in a plane perpendicular to the paper surface with the base as a center, and the tip portions made of spherical surfaces are orthogonal to each other. A pair of actuators 4, 5 provided in a matching direction and return springs 41, 51 (not shown) provided facing these actuators 4, 5 are supported, and the optical axis 11 is moved to the XY axis by swinging the light source 1. The movement can be adjusted in the direction (see FIG. 2).
[0010]
The actuators 4 and 5 are composed of, for example, step motors, and the operating shaft linked to the rotating shaft advances and retreats by the rotation thereof. As described above, the tip end portion of the spherical surface of the operating shaft and the return portion are returned. The light source 1 can be swung by sandwiching the tip of the light source 1 between the springs 41 and 51, but a piezoresistive element (PZT) may be used instead of the sputter motor.
[0011]
6 is a flow cell, 7 is a condensing lens (second lens system in the present invention) made of a convex lens, and 9 is a photodetector (see FIG. 3) in which light receiving elements made of photodiodes are arranged. transmitted light detection measurement unit for adjusting the optical axis (check pattern) 91 and, by one of the detection plane scattered light detection measurement section 9 2 provided (light receiving surface) including the transmitted light detecting measuring unit 91 Li Cheng . Reference numeral 10 denotes a multiplexer that takes in a detection signal from the light detector 9, and reference numeral 12 denotes a CPU. The signal from the multiplexer 10 is input, and the granularity is determined based on the scattered light intensity pattern according to a predetermined control program that is set and stored in advance. In addition to measuring the distribution, an optical axis adjustment processing unit for sending a control signal to the actuators 4 and 5 to adjust the optical axis 11 prior to the measurement is included.
[0012]
With such a configuration, when the sample in the flow cell 6 is irradiated with laser light, part of the laser light irradiates particles in the sample to become scattered light, and the remaining light passes between the particles. Both are transmitted light and reach the photodetector 9 together.
[0013]
In the particle size distribution measuring apparatus having such a configuration, in a state where a sample to be measured is injected into the flow cell 6 prior to measurement, first, auto alignment (automatic optical axis adjustment) is performed according to a command from the optical axis adjustment processing unit. Is done. That is, a control signal is sent to both actuators 4 and 5 so that the light receiving intensities of the four light receiving elements 911 to 914 of the transmitted light detecting measurement unit 91 are all equal, and the light source 1 receives light from the light detector 9. The optical axis 11 is automatically adjusted by swinging in the XY axis direction with respect to the surface (see FIG. 2).
[0014]
In this case, the configuration from the first lens system 2 to the bulky photodetector 9 is fixed, and the light source 1 having a relatively small size and shape may be slightly swung, and extra space is required. In addition, since the adjustment amount of the optical axis 11 can be increased by a slight swing of the light source 1, auto-alignment can be performed more quickly than in the past, and the apparatus can be made compact.
[0015]
After the above-described auto alignment is completed, the particle size distribution is measured by the measurement unit 92 for detecting scattered light. As shown in FIG. 3, the scattered light detection measuring unit 92 is configured by arranging a plurality of light receiving element arrays 92 (921 to 925) formed in an arc shape in a fan shape.
[0016]
In the present invention, the arrangement of the light receiving elements in the photodetector 9 is not limited to that shown in FIG. 3, and at least the check pattern and the scattered light detection measuring unit are formed in an appropriate arrangement of the light receiving elements on the light receiving surface. It only has to be done.
[0017]
On the other hand, the position of the above-described flow cell 6 is not limited to the position shown in FIG. 1 and may be disposed between the condenser lens 7 and the photodetector 9. Moreover, the combination of the lenses of the first lens system 2 constituting the beam expander may be appropriately selected from the combinations shown in FIGS. 4A to 4C and FIGS. 5A to 5C, for example. . 4A shows a combination of convex lenses 21 and 22, FIG. 4B shows a concave lens 23 and a convex lens 24, FIG. 4C shows a concave lens 23 and a combined lens (concave lens 24 and convex lens 25), and FIG. (A) is convex lenses 26 and 27, FIG. 5 (B) is a matched lens (convex lens 26 and concave lens 23), (concave lens 24 and convex lens 25), FIG. 5 (C) is a matched lens (convex lens 26 and concave lens 23), This is a combination of (concave lens 24 and convex lens 25).
[0018]
6 and 7 show different embodiments. In this case, the light source 1 and the first lens system 2 are integrated, and the first lens system 2, the flow cell 6 and the condenser lens 7 are fixed in the case body 8. And a tip end portion made of a spherical surface of a pair of actuators 4 and 5 provided such that one end side of the case body 8 is swingably supported by the support member 3 and the other end side is provided in a direction perpendicular to each other. The case body 8 is supported by return springs 41 and 51 (not shown), and the other end side of the case body 8 can be swung in the XY axis direction in a plane perpendicular to the paper surface. Even with such a configuration, the automatic adjustment of the optical axis 11 can be quickly completed without moving the bulky photodetector 9, and the apparatus can be made compact. Also in this case, the flow cell 6 may be provided between the condenser lens 7 and the photodetector 9.
[0019]
FIG. 8 shows another embodiment, in which case the first lens system 2 integrated with the light source 1 and the condensing lens 7 are housed in a fixed state in the case body 8, and the flow cell 6 has the case body 8. The light source 1, the first lens system 2, and the condenser lens 7 are integrally swung in the XY axis directions by the actuators 4 and 5. Automatic adjustment is possible.
[0020]
Even in this case, the automatic adjustment can be performed quickly, and the apparatus can be compactly formed. Although not shown, the first lens system 2 integrated with the light source 1 may be housed in a fixed state in the case body 8, and the light source 1 and the first lens system 2 may be swung. .
[0021]
【The invention's effect】
As described above, in the present invention, the light source, the first lens system, the second lens system for condensing the light beam, and the photodetector, and the scattering generated by irradiating the sample with light. An auto-alignment mechanism of a scattering-type particle size distribution measuring apparatus configured to measure a particle size distribution of a sample based on a scattered light intensity pattern obtained by detecting light with the light detector. The light receiving surface is provided with a check pattern as a measurement unit for detecting transmitted light for adjusting the optical axis, which includes a plurality of light receiving elements, and the light source is operated to swing in the XY axis direction with respect to the light receiving surface of the photodetector. a pair of actuators for the direction in which the tip made of a spherical mutually orthogonal to each other, is opposed to the pair of actuator spring disposed back, further, the XY-axis direction about the base of the light source Together with the base portion is supported by the support member so as to be freely moving, whereas the tip of the light source is sandwiched between the tip and the return spring of the pair of actuators, the optical axis is preliminarily set and stored In accordance with an adjustment program, based on a detection signal from the check pattern, the light source is oscillated to adjust the optical axis so that the light receiving intensities of the plurality of light receiving elements of the check pattern are all equal. By providing an optical axis adjustment processing unit that sends control signals to the actuator, it is possible to adjust the optical axis more quickly by reducing the drive amount of the actuator, making the device configuration simple and compact. It becomes.
In the present invention, the light source, the first lens system, the second lens system for condensing the light beam, and the photodetector are provided, and the scattered light generated by irradiating the sample with the light is the light. An auto-alignment mechanism of a scattering-type particle size distribution measuring apparatus that measures a particle size distribution of a sample based on a scattered light intensity pattern obtained by detecting with a detector, on the light receiving surface of the light detector, A check pattern is provided as a transmitted light detecting measurement unit for adjusting the optical axis, and includes a plurality of light receiving elements, and the light source is integrated with the first lens system or the first lens system and the second lens system. A tip of a spherical surface that is a pair of actuators for swinging the light source and the first lens system or the first lens system and the second lens system in the XY-axis direction with respect to the light receiving surface of the photodetector. part is orthogonal to each other Fit provided in a direction, are opposed to the pair of actuator spring disposed back, further, the light source and the first lens system, or housed in a fixed state of the first lens system and the second lens system to the case body, The one end side of the case body is supported by a support member, and the other end side of the case body is swingable in the XY axis direction so that the other end side of the case body is the tip of the pair of actuators and the return spring. In accordance with an optical axis adjustment program set and stored in advance, the received light intensities of the plurality of light receiving elements of the check pattern are all equal based on detection signals from the check pattern. Providing an optical axis adjustment processing unit for sending a control signal for swinging the light source and the lens system to the actuator to adjust the optical axis. Ri, quickly becomes possible to adjust the optical axis, the configuration of the device becomes as simple, it becomes possible compactness.
[Brief description of the drawings]
FIG. 1 is a configuration diagram showing an embodiment of an automatic alignment mechanism of a particle size distribution measuring apparatus of the present invention.
FIG. 2 is an explanatory diagram when adjusting the optical axis.
FIG. 3 is a front view showing an example of an array of light receiving elements of the photodetector.
4A to 4C are diagrams showing examples of lens combinations of the first lens system. FIG.
FIGS. 5A to 5C are drawings showing examples of lens combinations of the first lens system. FIGS.
FIG. 6 is a block diagram showing the same different embodiment.
FIG. 7 is an explanatory diagram when adjusting the optical axis.
FIG. 8 is a configuration diagram showing another embodiment.
FIG. 9 is a block diagram showing an example of a conventional particle size distribution measuring apparatus.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 ... Light source, 2 ... 1st lens system, 3 ... Support member, 4, 5 ... Actuator, 7 ... 2nd lens system, 9 ... Photodetector, 91 ... Check pattern, 11 ... Optical axis, 12 ... Optical axis adjustment Processing part (CPU), 41 , 51 ... return spring, 911-914 ... light receiving element.

Claims (2)

光源と、第1レンズ系と、光束を集光させるための第2レンズ系と、光検出器とを具備し、試料に光を照射させて発生した散乱光を前記光検出器で検出することにより得られる散乱光強度パターンに基づいて試料の粒度分布を測定するようにした散乱式の粒度分布測定装置のオートアライメント機構であって、前記光検出器の受光面に、複数の受光素子よりなる、光軸調整用の透過光検出用測定部としてのチェックパターンを設けると共に、前記光源を前記光検出器の受光面に対してXY軸方向に揺動操作するための一対のアクチュエータを球面でなるその先端部が互いに直交し合う方向に設け、これら一対のアクチュエータに対向させて戻しばねを設け、更に、光源の基部を中心として前記XY軸方向に揺動自在となるように前記基部が支持部材で支持されると共に、光源の先端部が前記一対のアクチュエータの前記先端部と戻しばねとの間に挟持される一方、予め設定・記憶させた光軸調整プログラムに従い、前記チェックパターンからの検出信号に基づいて、前記チェックパターンの前記複数の受光素子における各受光強度が全て等しくなるように前記光軸を調整するために前記光源を揺動させるための制御信号を前記アクチュエータに送出する光軸調整処理部を設けてなることを特徴とする粒度分布測定装置のオートアライメント機構。A light source, a first lens system, a second lens system for condensing a light beam, and a photodetector, and detecting the scattered light generated by irradiating the sample with light. An auto-alignment mechanism of a scattering-type particle size distribution measuring apparatus that measures a particle size distribution of a sample based on a scattered light intensity pattern obtained by the method, comprising a plurality of light receiving elements on a light receiving surface of the photodetector A check pattern is provided as a transmitted light detection measurement unit for adjusting the optical axis, and a pair of actuators for swinging the light source in the XY-axis direction with respect to the light receiving surface of the photodetector is a spherical surface. provided in a direction in which the tip mutually orthogonal to each other, is opposed to the pair of actuator spring disposed back, further, the base in the XY-axis direction about the base of the light source so as to be swingable is supported While being supported by the member, while the distal end portion of the light source is sandwiched between the tip and the return spring of the pair of actuators, in accordance with the optical axis adjustment program was previously set and stored, detecting from the check pattern An optical axis that sends a control signal for swinging the light source to the actuator so as to adjust the optical axis so that the received light intensities of the plurality of light receiving elements of the check pattern are all equal based on the signal An auto-alignment mechanism of a particle size distribution measuring apparatus, comprising an adjustment processing unit. 光源と、第1レンズ系と、光束を集光させるための第2レンズ系と、光検出器とを具備し、試料に光を照射させて発生した散乱光を前記光検出器で検出することにより得られる散乱光強度パターンに基づいて試料の粒度分布を測定するようにした散乱式の粒度分布測定装置のオートアライメント機構であって、前記光検出器の受光面に、複数の受光素子よりなる、光軸調整用の透過光検出用測定部としてのチェックパターンを設けると共に、前記光源を前記第1レンズ系、または、第1レンズ系及び第2レンズ系と一体化させ、その光源と第1レンズ系、または、第1レンズ系及び第2レンズ系を前記光検出器の受光面に対してXY軸方向に揺動操作するための一対のアクチュエータを球面でなるその先端部が互いに直交し合う方向に設け、これら一対のアクチュエータに対向させて戻しばねを設け、更に、前記光源と前記第1レンズ系、または、第1レンズ系及び第2レンズ系をケース体内に固定状態に収納し、前記ケース体の一端側を支持部材で支持させ、前記ケース体の他端側前記XY軸方向に揺動操作できるように前記ケース体の他端側前記一対のアクチュエータの前記先端部と戻しばねとの間に挟持される一方、予め設定・記憶させた光軸調整プログラムに従い、前記チェックパターンからの検出信号に基づいて、前記チェックパターンの前記複数の受光素子における各受光強度が全て等しくなるように前記光軸を調整するために前記光源とレンズ系とを揺動させるための制御信号を前記アクチュエータに送出する光軸調整処理部を設けてなることを特徴とする粒度分布測定装置のオートアライメント機構。A light source, a first lens system, a second lens system for condensing a light beam, and a photodetector, and detecting scattered light generated by irradiating a sample with light by the photodetector. An auto-alignment mechanism of a scattering-type particle size distribution measuring apparatus that measures a particle size distribution of a sample based on a scattered light intensity pattern obtained by the method, comprising a plurality of light receiving elements on a light receiving surface of the photodetector And a check pattern as a measurement unit for detecting transmitted light for adjusting the optical axis, and integrating the light source with the first lens system or the first lens system and the second lens system . lens system, or, the distal end comprising a pair of actuators for swung to the XY-axis direction by a spherical surface is mutually orthogonal to each other the first lens system and the second lens system with respect to the light-receiving surface of the photodetector provided in a direction, The spring is provided back to face the these pair of actuators, further the light source and the first lens system, or, the first lens system and the second lens system accommodated in a fixed state to the case body, said case body It is supported at one end side supporting member, between the other end of the case body so as to be swung to the other end of the case body in the XY-axis direction between the tip and the return spring of the pair of actuators one sandwiched accordance optical axis adjustment program was previously set and stored, based on the detection signal from the check pattern, the so each received light intensity is equal for all of the plurality of light receiving elements of the check pattern light A particle size comprising an optical axis adjustment processing section for sending a control signal for swinging the light source and the lens system to adjust the axis to the actuator. Automatic alignment mechanism of cloth measuring device.
JP24182797A 1997-08-21 1997-08-21 Automatic alignment mechanism of particle size distribution analyzer Expired - Fee Related JP3849953B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24182797A JP3849953B2 (en) 1997-08-21 1997-08-21 Automatic alignment mechanism of particle size distribution analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24182797A JP3849953B2 (en) 1997-08-21 1997-08-21 Automatic alignment mechanism of particle size distribution analyzer

Publications (2)

Publication Number Publication Date
JPH1164205A JPH1164205A (en) 1999-03-05
JP3849953B2 true JP3849953B2 (en) 2006-11-22

Family

ID=17080093

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24182797A Expired - Fee Related JP3849953B2 (en) 1997-08-21 1997-08-21 Automatic alignment mechanism of particle size distribution analyzer

Country Status (1)

Country Link
JP (1) JP3849953B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3889920B2 (en) * 2000-09-22 2007-03-07 株式会社堀場製作所 Scattering particle size distribution measuring device
JP5609580B2 (en) * 2010-11-18 2014-10-22 横河電機株式会社 Laser gas analyzer

Also Published As

Publication number Publication date
JPH1164205A (en) 1999-03-05

Similar Documents

Publication Publication Date Title
JP3415475B2 (en) Particle size distribution measuring device
JPH05107035A (en) Sensitivity improvement type optical measuring device
KR20010034412A (en) Aberration measuring instrument and measuring method, projection exposure apparatus provided with the instrument and device-manufacturing method using the measuring method, and exposure method
JP2008528141A (en) Apparatus and method for measuring aberration in eye to be examined
JP2002116133A5 (en)
JPH08233544A (en) Confocal optics
JP3849953B2 (en) Automatic alignment mechanism of particle size distribution analyzer
US7145659B2 (en) Light interference measurement method using computer-generated hologram, and interferometer using this method
JPH083576B2 (en) Optical imaging device and mask pattern imaging device
JPH1183721A (en) Auto alignment mechanism for particle size distribution measurement device
JP4060494B2 (en) Three-dimensional surface shape measuring device
CN119043493B (en) Three-dimensional angle-resolved spectrum imaging device and method
JPH09288041A (en) Measuring apparatus for decentration
CN119064268A (en) A structured light high temporal and spatial resolution off-axis digital holographic three-dimensional tomography system
JP4138506B2 (en) Surface texture measuring instrument, jig for surface texture measuring instrument, and adjustment method
JP3889920B2 (en) Scattering particle size distribution measuring device
US20020018215A1 (en) Surface profile measurement apparatus
JPH1183722A (en) Auto alignment mechanism for particle size distribution measurement device
JP2950004B2 (en) Confocal laser microscope
JP3507431B2 (en) Non-planar mirror adjustment method and apparatus
JP3258904B2 (en) Scattered light detector
JP2002090302A (en) Light intensity measurement device
KR100207684B1 (en) Testing apparatus for the hollographic optical device
JPH11271595A (en) Mirror holder device
JPH0522213B2 (en)

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060721

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20060825

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120908

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120908

Year of fee payment: 6

LAPS Cancellation because of no payment of annual fees