JP3927064B2 - Non-contact displacement meter - Google Patents
Non-contact displacement meter Download PDFInfo
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- JP3927064B2 JP3927064B2 JP2002112059A JP2002112059A JP3927064B2 JP 3927064 B2 JP3927064 B2 JP 3927064B2 JP 2002112059 A JP2002112059 A JP 2002112059A JP 2002112059 A JP2002112059 A JP 2002112059A JP 3927064 B2 JP3927064 B2 JP 3927064B2
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- light
- light source
- wave
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- displacement meter
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Description
【0001】
【発明の属する技術分野】
本発明は、光学的に測定対象物の変位量を測定する非接触式の変位計、特に拡散反射面の長期的な変位量測定に有効な非接触式変位計に関するものである。
【0002】
【従来の技術】
光学的に測定対象物の変位量を測定する変位計として、主に三角測量方式を原理としたものが提案されている。この変位計は、例えばレーザ光を投光レンズを通して測定対象物に照射し、該測定対象物で反射した光を受光レンズを通して検出素子の受光部上にスポット光として結ばせるものであり、検出素子の受光部の受光位置から上記測定対象物までの変位量を演算するものである。
【0003】
すなわち、測定対象物までの距離に応じてレーザ光の反射角度が異なり、それに応じて上記スポット光の受光位置が変わるので、その変化位置から測定対象物の変位量を検出することができる。
【0004】
【発明が解決しようとする課題】
ところで、上記のような従来の光学式の変位計にあっては、短時間に測定する場合や、一定時間間隔でイニシャライズ(定点補正)をかけて使用する場合は精度の良い測定ができるが、長時間渡って連続的に変位量を測定する場合には、周囲温度の変動や光源自体の出力変動などにより測定出力が変化するため、測定値の信頼性が得られない。
【0005】
また、測定分解能は光学配置で固定されるため、測定用途に合わせるには数種類の分解能毎に別個の製品を使用する必要がある。
【0006】
本発明は、上記のような問題点に鑑みてなされたもので、光源の出力変動や周囲温度の変動による出力変化を少なくすることができ、測定値の安定性及び信頼性が得られ、また、一台のセンサ(変位計)で様々な分解能に対応することができる非接触式変位計を提供することを目的としている。
【0007】
【課題を解決するための手段】
本発明に係る非接触式変位計は、光学的に測定対象物の変位量を測定する非接触式の変位計であって、光源と、該光源の投光光量を制御する光源制御回路と、前記光源から投光されて前記測定対象物で反射した反射光をP波とS波の偏光毎に分割する偏光ビームスプリッタと、該偏光ビームスプリッタによりP波とS波に分割された偏光光をそれぞれ受光する受光素子と、該受光素子の少なくとも何れかの位置を調整する位置調整手段とを有し、前記各受光素子の出力の差または比から前記測定対象物の変位量を演算すると共に、前記受光素子の少なくとも何れかの位置を調整し、分解能の任意設定を行う位置調整手段を有するようにしたものである。
【0009】
また、上記の構成において、光源からの投光光をP波とS波の偏光毎に分割する偏光ビームスプリッタと、分割された偏光光を受光する受光素子を有し、光源制御回路は該受光素子の出力に基づいて光源の投光光量を制御するようにしたものである。
【0010】
また、上記の構成において、測定対象物からの反射光を偏光ビームスプリッタにより分割した偏光光を受光する受光素子の少なくとも何れかの出力を増幅する増幅器を有し、該増幅器の増幅率を調整して各受光素子出力の差の演算出力が基準電位となるようにしたものである。
【0011】
【発明の実施の形態】
以下、本発明の実施例を図面について説明する。
【0012】
図1は本発明の実施例によるLED変位計の構成を模式的に示す図である。同図において、1は光源であるLED(発光ダイオード)、2はLED1からの投光光をP波とS波の各偏光毎に分割する偏光ビームスプリッタ(以下PBSという)、3はLED1から投光されて測定対象物4で反射した反射光をP波とS波の各偏光毎に分割するPBSである。
【0013】
また図1中、5,6はPBS3によりP波とS波に分割された偏光光をそれぞれ受光する受光素子であるPD(ホトダイオード)で、図示していないがP波用のPD5とS波用のPD6の少なくとも何れかのPD(図の例ではPD5)には図の矢印A,Bの方向に位置を調整する位置調整手段が設けられている。7はPBS2により分割された偏光光を受光する受光素子であるPDで、投光光量を制御するためのモニター用として設けられている。
【0014】
図2は本実施例の回路構成を示すブロック図である。同図中、11,12,13は各々のPD5,6,7の出力を増幅する増幅器、14は各PD5,6の出力の差または比から測定対象物4の変位量を演算して出力する演算回路で、少なくとも何れかの増幅器11,12の増幅率を調整して各受光素子の感度ばらつき補正および測定対象物の反射特性に合わせた受光出力のバランス調整をする。15はPD7の出力に基づいてLED1の投光光量を制御する光源制御回路、16は各PD5,6,7に定電圧を与える定電圧回路、17は調整用の可変抵抗である。
【0015】
上記のように構成された非接触式のLED変位計においては、測定対象物4にLED1からの単一偏光光がPBS2を通して投光される。この投光光は、測定対象物4の表面で反射してPBS3に導かれ、PD5,6に検出光として入力される。そして、PD5,6の出力が増幅器11,12を通して演算回路14に入力され、ここで対象物4の変位量が演算されて出力される。
【0016】
その際、測定対象物4の反射特性に従い、検出光としてはP波とS波の各成分が生じるが、各成分の偏光光の演算結果のセンサ出力(出力比)は、受光素子である各PD5,6が光学設計中心位置に対してずれのない場合には、測定対象物4までの距離変化に対して変化は小さい。そして、P波あるいはS波の受光位置が中心からずれる量が増えるに従って、上記センサ出力の変化の度合いが大きくなる。
【0017】
つまり、PD5とPD6の相対的な位置関係をコントロールすることによって、測定対象物4までの距離変位に対するセンサ出力の変化率を任意に選定して、測定対象物4までの距離変位を検出することが可能となる。したがって、センサ分解能の任意設定が可能な変位計を実現することができる。
【0018】
図3は上記P波,S波を受光するPD5,6の中心からの素子位置(mm)に対するセンサ出力の変化率を示す図である。図中の実線は変位量が±1.0mmのとき、破線は変位量が±0.5mmのときのデータをそれぞれ示している。
【0019】
また、PD7のモニター受光出力によってLED1の投光光量を安定化できるような光源制御回路15を内蔵しているため、センサ出力の安定性が高く、周囲温度の変化や光源であるLED1自身の発熱による出力変動も極めて小さなものに抑えることができる。
【0020】
更に、出力演算をP波とS波の出力差とした場合でも、測定対象物4が拡散反射の強いものの場合にはPD5あるいはPD6の出力の増幅率を調整し、センサ出力が基準電位V1となるように設定することで、光源出力の変動による影響を受けることのないセンサ出力を得ることもできる。
【0021】
また、測定対象物が鏡面反射成分の多い反射特性の場合には、出力差の演算では光源出力の変動による影響を受けるが、PD5またはPD6の出力が一定となるよう光量補正を行うことでその影響をなくすこともできる。
【0022】
図4は上記センサ出力の時間経過に伴う変化を示す図であり、一週間連続通電したときのセンサ出力Vout(V)のデータを従来例と比較して示している。同図の(a)が本実施例のデータ、(b)が前述の従来例のデータである。
【0023】
このように、本実施例では、光源の投光光量を制御する光源制御回路15を設けており、光源であるLED1の出力変動や周囲温度の変動によるセンサ出力の変化を少なくすることができ、測定値の安定性及び信頼性が得られる。また、P波用の受光素子であるPD5あるいはS波用の受光素子であるPD6の位置を可変することで、測定対象物4の変位量に対する出力変化幅を可変することが可能となり、一台のセンサ(変位計)で様々な分解能に対応することができる。
【0024】
【発明の効果】
以上説明したように、本発明によれば、光源の出力変動や周囲温度の変動による出力変化を少なくすることができ、測定値の安定性及び信頼性が得られる。また、一台のセンサ(変位計)で様々な分解能に対応することができるという効果がある。
【図面の簡単な説明】
【図1】 本発明の実施例の構成を示す説明図
【図2】 実施例の回路構成を示すブロック図
【図3】 素子位置と出力変化率の関係を示す図
【図4】 出力の時間経過に伴う変化を示す図
【符号の説明】
1 LED(光源)
2 偏光ビームスプリッタ
3 偏光ビームスプリッタ
4 測定対象物
5 PD(受光素子)
6 PD(受光素子)
7 PD(受光素子)[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a non-contact type displacement meter that optically measures the amount of displacement of a measurement object, and more particularly to a non-contact type displacement meter effective for long-term displacement measurement of a diffuse reflection surface.
[0002]
[Prior art]
As a displacement meter for optically measuring the amount of displacement of a measurement object, one based on the principle of a triangulation method has been proposed. This displacement meter, for example, irradiates a measurement object with a laser beam through a light projecting lens, and connects the light reflected by the measurement object as a spot light on a light receiving portion of the detection element through a light receiving lens. The amount of displacement from the light receiving position of the light receiving unit to the measurement object is calculated.
[0003]
That is, the reflection angle of the laser beam varies depending on the distance to the measurement object, and the spot light receiving position changes accordingly, so that the amount of displacement of the measurement object can be detected from the change position.
[0004]
[Problems to be solved by the invention]
By the way, in the conventional optical displacement meter as described above, when measuring in a short time, or when using it with initialization (fixed point correction) at regular time intervals, it is possible to measure with high accuracy. When the displacement amount is measured continuously over a long period of time, the measurement output changes due to changes in the ambient temperature, the output fluctuation of the light source itself, etc., and thus the reliability of the measurement value cannot be obtained.
[0005]
In addition, since the measurement resolution is fixed by the optical arrangement, it is necessary to use a separate product for each of several types of resolution in order to match the measurement application.
[0006]
The present invention has been made in view of the above-described problems, and can reduce output changes due to fluctuations in the output of the light source and fluctuations in the ambient temperature, so that the stability and reliability of the measured value can be obtained. An object of the present invention is to provide a non-contact displacement meter that can cope with various resolutions with a single sensor (displacement meter).
[0007]
[Means for Solving the Problems]
A non-contact displacement meter according to the present invention is a non-contact displacement meter that optically measures the amount of displacement of a measurement object, and includes a light source, a light source control circuit that controls the amount of light emitted from the light source, A polarization beam splitter that divides the reflected light projected from the light source and reflected by the measurement object into P-wave and S-wave polarizations, and polarized light that has been split into P-waves and S-waves by the polarization beam splitter. Each having a light receiving element that receives light, and a position adjusting unit that adjusts the position of at least one of the light receiving elements, and calculating a displacement amount of the measurement object from a difference or ratio of outputs of the light receiving elements, A position adjusting means for adjusting the position of at least one of the light receiving elements and arbitrarily setting the resolution is provided.
[0009]
In the above-described configuration, the light source control circuit includes a polarization beam splitter that divides the light emitted from the light source for each polarization of P wave and S wave, and a light receiving element that receives the divided polarized light. The amount of light emitted from the light source is controlled based on the output of the element.
[0010]
Further, in the above configuration, an amplifier that amplifies the output of at least one of the light receiving elements that receive the polarized light obtained by dividing the reflected light from the measurement object by the polarization beam splitter, and adjusts the amplification factor of the amplifier. Thus, the calculation output of the difference between the respective light receiving element outputs becomes the reference potential.
[0011]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of the present invention will be described below with reference to the drawings.
[0012]
FIG. 1 is a diagram schematically showing the configuration of an LED displacement meter according to an embodiment of the present invention. In the figure, 1 is an LED (light emitting diode) as a light source, 2 is a polarization beam splitter (hereinafter referred to as PBS) that divides the light projected from the LED 1 into P-wave and S-wave polarized light, and 3 is projected from the LED 1. It is PBS which divides | segments the reflected light reflected by the measuring object 4 for every polarization of P wave and S wave.
[0013]
In FIG. 1, reference numerals 5 and 6 denote PDs (photodiodes), which are light receiving elements that receive the polarized light divided into the P wave and the S wave by the PBS 3, respectively. Position adjustment means for adjusting the position in the directions of arrows A and B in the figure is provided in at least one PD (PD5 in the figure) of PD6. Reference numeral 7 denotes a PD, which is a light receiving element that receives polarized light divided by the PBS 2, and is provided for monitoring to control the amount of light emitted.
[0014]
FIG. 2 is a block diagram showing a circuit configuration of this embodiment. In the figure, 11, 12, 13 are amplifiers that amplify the outputs of the
[0015]
In the non-contact type LED displacement meter configured as described above, single polarized light from the LED 1 is projected onto the measurement object 4 through the PBS 2. This projection light is reflected on the surface of the measurement object 4 and guided to the PBS 3 and input to the PDs 5 and 6 as detection light. Then, the outputs of the PDs 5 and 6 are input to the
[0016]
At that time, P wave and S wave components are generated as detection light according to the reflection characteristics of the measurement object 4, and the sensor output (output ratio) of the calculation result of the polarized light of each component is the light receiving element. When the PDs 5 and 6 are not deviated from the optical design center position, the change is small with respect to the distance change to the measurement object 4. The degree of change in the sensor output increases as the amount of deviation of the light receiving position of the P wave or S wave from the center increases.
[0017]
That is, by controlling the relative positional relationship between PD5 and PD6, the change rate of the sensor output with respect to the distance displacement to the measurement object 4 is arbitrarily selected, and the distance displacement to the measurement object 4 is detected. Is possible. Therefore, a displacement meter capable of arbitrarily setting the sensor resolution can be realized.
[0018]
FIG. 3 is a diagram showing the rate of change in sensor output with respect to the element position (mm) from the center of the PDs 5 and 6 that receive the P wave and S wave. The solid line in the figure indicates data when the displacement amount is ± 1.0 mm, and the broken line indicates data when the displacement amount is ± 0.5 mm.
[0019]
In addition, since the light
[0020]
Furthermore, even when the output calculation is the output difference between the P wave and the S wave, if the measurement object 4 has a strong diffuse reflection, the amplification factor of the output of the PD 5 or PD 6 is adjusted, and the sensor output becomes the reference potential V 1. By setting so as to be, it is possible to obtain a sensor output that is not affected by fluctuations in the light source output.
[0021]
Also, when the measurement object has a reflection characteristic with many specular reflection components, the output difference calculation is affected by fluctuations in the light source output, but by correcting the light amount so that the output of PD5 or PD6 is constant The effect can be eliminated.
[0022]
FIG. 4 is a diagram showing the change of the sensor output with time, and shows data of the sensor output Vout (V) when energized continuously for one week as compared with the conventional example. (A) of the same figure is the data of a present Example, (b) is the data of the prior art example mentioned above.
[0023]
Thus, in the present embodiment, the light
[0024]
【The invention's effect】
As described above, according to the present invention, it is possible to reduce the output change due to the output fluctuation of the light source and the fluctuation of the ambient temperature, and the stability and reliability of the measurement value can be obtained. In addition, there is an effect that it is possible to cope with various resolutions with a single sensor (displacement meter).
[Brief description of the drawings]
FIG. 1 is an explanatory diagram showing a configuration of an embodiment of the present invention. FIG. 2 is a block diagram showing a circuit configuration of the embodiment. FIG. 3 is a diagram showing a relationship between an element position and an output change rate. Figure showing changes over time 【Explanation of symbols】
1 LED (light source)
2 Polarizing beam splitter 3 Polarizing beam splitter 4 Measurement object 5 PD (light receiving element)
6 PD (light receiving element)
7 PD (light receiving element)
Claims (4)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002112059A JP3927064B2 (en) | 2002-04-15 | 2002-04-15 | Non-contact displacement meter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002112059A JP3927064B2 (en) | 2002-04-15 | 2002-04-15 | Non-contact displacement meter |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2003307406A JP2003307406A (en) | 2003-10-31 |
| JP2003307406A5 JP2003307406A5 (en) | 2005-08-18 |
| JP3927064B2 true JP3927064B2 (en) | 2007-06-06 |
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|---|---|---|---|
| JP2002112059A Expired - Fee Related JP3927064B2 (en) | 2002-04-15 | 2002-04-15 | Non-contact displacement meter |
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| JP (1) | JP3927064B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102812414A (en) * | 2011-03-29 | 2012-12-05 | 三洋电机株式会社 | Object detecting device and information acquiring device |
| JP6444207B2 (en) * | 2015-02-17 | 2018-12-26 | 株式会社ディスコ | Inspection method and inspection apparatus for hexagonal single crystal substrate |
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2002
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| Publication number | Publication date |
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| JP2003307406A (en) | 2003-10-31 |
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