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JP4006967B2 - Single crystal production equipment - Google Patents
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JP4006967B2 - Single crystal production equipment - Google Patents

Single crystal production equipment Download PDF

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Publication number
JP4006967B2
JP4006967B2 JP2001280149A JP2001280149A JP4006967B2 JP 4006967 B2 JP4006967 B2 JP 4006967B2 JP 2001280149 A JP2001280149 A JP 2001280149A JP 2001280149 A JP2001280149 A JP 2001280149A JP 4006967 B2 JP4006967 B2 JP 4006967B2
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Prior art keywords
pulling
furnaces
horizontal
furnace
single crystal
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JP2001280149A
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Japanese (ja)
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JP2003089593A (en
Inventor
義弘 明石
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Sumco Corp
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Sumco Corp
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Description

【0001】
【発明の属する技術分野】
本発明は、CZ法による単結晶製造設備に関し、特に、水平対向型磁石を装備した複数の引上げ炉が引上げ室内に設置配列した単結晶製造設備に関する。
【0002】
【従来の技術】
集積回路用半導体素子基板には、高純度シリコン単結晶が多用されているが、このシリコン単結晶の製造には、通常、CZ法と略称されるチョクラルスキー法が用いられる。
【0003】
CZ法によるシリコン単結晶の製造では、図1に示すような引上げ炉10が使用される。ここに示された引上げ炉10は、炉体として大径のメインチャンバ11と、その上に重ねられる小径のプルチャンバ12とを備えている。メインチャンバ11内の中心部にはルツボ13が配置されている。ルツボ13は内側の石英ルツボ13aと黒鉛からなる外側の支持ルツボ13bとを組み合わせた二重構造であり、ペディスタルと呼ばれる支持軸14の上にルツボ受け15を介して支持されている。支持軸14は軸方向及び周方向に駆動され、これによりルツボ13の昇降及び回転を行う。
【0004】
ルツボ13の外側には環状のヒータ16が配置され、その外側には図示されない断熱材がメインチャンバ11の内面に沿って設置されている。一方、ルツボ13の上方には、ルツボ13内の原料融液20から引上げられるシリコン単結晶21を包囲する筒状の熱遮蔽体17が設置されている。熱遮蔽体17は、下方に向かって直径が漸減する逆錐部を有し、該逆錐部により、ヒータ16や原料融液20からの輻射熱を遮断して、シリコン単結晶21の冷却を促進する。
【0005】
操業では、炉体内が所定雰囲気に調整され、ルツボ13内に原料融液20が形成される。プルチャンバ12内を通してメインチャンバ11内に垂下された引上げ軸の下端に装着された種結晶22が原料融液20に浸漬され、この状態からルツボ及び引上げ軸を回転させながら引上げ軸を上昇させることにより、種結晶22の下方にシリコン単結晶21を育成し、プルチャンバ12内に引上げる。
【0006】
このような引上げ炉10は、通常、引上げ室内に複数基が作業スペースに面して配列される。その配置例を図2に示す。引上げ炉10を挟んで作業スペースの反対側はメンテナンススペースである。
【0007】
一方、各引上げ炉10に関しては、要求される結晶品質や生産性に応じて、水平横型磁石が装備されることがある。水平横型磁石を装備した引上げ炉を図3に示す。引上げ炉10のメインチャンバ11を挟んで1組の電磁石30,30が設置される。電磁石30,30は、水平方向の磁束線を形成し、これをルツボ13内の原料融液20に作用させることにより、原料融液20の対流を抑制するなどの機能を奏する。図3中、18はゲートバルブ、19は引上げ軸の昇降・回転機構である。
【0008】
水平方向の磁束線をルツボ13内の原料融液20に作用させることにより、300mmといった大径ウエーハで問題となるウエーハ面内の酸素濃度均一性(ROG)及びウエーハ面内の比抵抗均一性(RRG)の低下が回避される。また、300mm結晶の引上げでは高速成長も課題の一つであるが、水平方向の磁界印加は、この高速化の有効な対策になる。このようなことから、近時量産が開始された300mm結晶の引上げでは、水平横型磁石の装備による磁界印加が必須になりつつある。
【0009】
【発明が解決しようとする課題】
しかしながら、水平横型磁石を装備した引上げ炉では、漏れ磁界が問題になる。図4は、一般的な磁石能力である炉内中心部で4000ガウスを示す水平横型磁石を装備した引上げ炉からの漏れ磁界の強度分布を示した平面図である。図4から分かるように、炉から2m離れてた位置でも、漏れ磁界強度は100ガウスを超える。
【0010】
この漏れ磁界に関し、磁気効率の低下の観点から、漏れ磁界を抑える対策は例えば特開平8−333190号公報に記載されている。しかしながら、漏れ磁界を抑える対策は、設備の大型化や高コスト化を招く。加えて、漏れ磁界は、磁気効率を低下させる原因になるだけでなく、隣接する引上げ炉間で漏れ磁界が干渉することによる炉内磁界分布への悪影響の問題や、作業者に対する安全面での問題を生じるおそれがある。作業者に対する安全面での問題とは、人体への磁界の悪影響、及び磁性体が引上げ炉に吸着されることによる機械的な事故の発生である。
【0011】
漏れ磁界を弱めれば、これらの問題は解決されるが、その対策が設備の大型化や高コスト化を招くことは前述したとおりである。
【0012】
本発明の目的は、引上げ炉からの漏れ磁界を弱めずとも、隣接する引上げ炉間での磁界干渉や安全上の問題を回避できる単結晶製造設備を提供することにある。
【0013】
【課題を解決するための手段】
上記目的を達成するために、本発明の単結晶製造設備は、水平横型磁石が装備された複数の引上げ炉を引上げ室内に作業スペースに臨んで設置し、各引上げ炉の作業スペースに対向する面を正面として、磁束線方向が前記正面に対して水平面内で0度超、90度未満、好ましくは30〜60度傾斜するように、各引上げ炉に前記磁石を装備させたものであり、更に好ましくは、一方向又は二方向に整列して配置された複数の引上げ炉における磁束線の方向をぼほ同一とする。
【0014】
本発明の単結晶製造設備においては、引上げ室内に配置された複数の引上げ炉における磁束線方向が正面に対して水平面内で傾斜することにより、引上げ炉の前後方向及び横方向の両方向で漏れ磁界の広がりが抑制される。その結果、隣接する引上げ炉間での漏れ磁界の干渉を回避できる。また、作業スペースにおける漏れ磁界強度を低減でき、作業者の安全を確保できる。
【0015】
【発明の実施の形態】
以下に本発明の実施形態を図面に基づいて説明する。図5は本発明の一実施形態を示す単結晶製造設備のレイアウト図である。
【0016】
本実施形態の単結晶製造設備は、引上げ室内に配置された複数の引上げ炉10,10・・を備えている。複数の引上げ炉10,10・・は、作業スペースの両側に2列に配列されている。即ち、作業スペースを挟んで縦2列、横数列に配置されている。各引上げ炉10は、図3に示した水平横型磁石30,30を装備したものであり、作業スペースに向けるべき設計された正面は、そのまま作業スペースに向け、水平横型磁石30,30が形成する磁束線の方向は、全ての炉で正面から45度水平方向に傾斜している。即ち、全ての炉で磁束線の方向が正面から45度水平方向に傾斜するように、水平横型磁石30,30が炉体に取り付けられており、全ての炉で磁束線の方向が平行である。
【0017】
なお、引上げ炉10自体の構造は、図1を参照して説明したとおりである。
【0018】
図6及び図7は比較例を示す単結晶製造設備のレイアウト図である。図6に示した比較例1では、全ての炉で磁束線の方向が正面を通るように、水平横型磁石30,30が炉体に取り付けられている。即ち、全ての炉で磁束線方向の正面からの傾斜角が0度である。また、図7に示した比較例2では、全ての炉で磁束線の方向の、正面からの傾斜角が90度となるように、水平横型磁石30,30が炉体に取り付けられている。
【0019】
以下に、図5に示した本実施形態の単結晶製造設備の機能を、図6及び図7に示した比較例1,2と対比して説明する。
【0020】
図6に示した比較例1では、全ての引上げ炉10,10・・で磁束線方向の正面からの傾斜角が0度であるため、各炉で磁束線は前後に広がる。このため、作業スペースにおける漏れ磁界強度が大きくなり、作業者が強い磁界に曝されることになる。一方、磁束線の横方向の広がりは小さくなる。このため、横方向で隣接する引上げ炉10,10間における漏れ磁界の干渉の回避が容易となる。その結果、引上げ炉10,10・・を横方向で接近させることが可能となる。
【0021】
図7に示した比較例2では、全ての引上げ炉10,10・・で磁束線方向の正面からの傾斜角が90度に設定されているため漏れ磁界の前後方向の広がりは小さくなり、作業者が強い磁界に曝される危険性は低減するが、磁束線の横方向の広がりが大きくなり、横方向で隣接する引上げ炉10,10間における漏れ磁界の干渉のために、引上げ炉10,10・・を横方向で離反させることが必要になる。その結果、広い設置スペース(引き上げ室)が必要になる。
【0022】
これらに対し、図5に示した本実施形態の単結晶製造設備では、全ての引上げ炉10,10・・で磁束線方向の正面からの傾斜角が45度に設定されている。このため、漏れ磁界の前後方向の広がりも横方向の広がりも共に小さく抑制される。具体的には、前後方向の等位置における漏れ磁界は、比較例1と比べて1/1.33に低減し、横方向の等位置における漏れ磁界は、比較例2と比べて1/1.33に低減する。このため、作業スペースで作業者が強い磁界に曝される危険性が低減すると共に、横方向で隣接する引上げ炉10,10間における漏れ磁界の干渉の回避が容易になり、引上げ炉10,10・・を横方向で接近させることが可能となる。
【0023】
このように、本実施形態の単結晶製造設備では、引上げ室内に配置された複数の引上げ炉10,10・・における磁束線方向が正面に対して水平面内で45度傾斜することにより、引上げ炉10の前後方向及び横方向の両方向で漏れ磁界の広がりが抑制される。その結果、隣接する引上げ炉10,10間での漏れ磁界の干渉を回避でき、その間隔を詰めることができる。また、作業スペースにおける漏れ磁界強度を低減でき、作業者の安全を確保できる。
【0024】
なお、上記実施形態では、引上げ室内に配置された複数の引上げ炉10,10・・における磁束線方向の正面からの傾斜角度が45度とされているが、30〜60度の範囲内であれば、45度の場合とほぼ同等を効果を得ることができ、横方向の磁束線の広がりをより抑制する場合は30度に近い方が好ましく、前後方向の磁束線の広がりをより抑制する場合は60度に近い方が好ましい。
【0025】
【発明の効果】
以上に説明したとおり、本発明の単結晶製造設備は、引上げ室内に配置された複数の引上げ炉における磁束線の方向を水平面内で正面から傾斜させることにより、引上げ炉からの漏れ磁界を弱めずとも、隣接する引上げ炉間での磁界干渉や安全上の問題を回避できる。従って、引上げ炉からの漏れ磁界を弱める対策を省略でき、設備規模及び設備コストの点で非常に有利となる。
【図面の簡単な説明】
【図1】引上げ炉の構造を示す縦断面図である。
【図2】引上げ炉の配置例を示すレイアウト図である。
【図3】水平横型磁石を装備した引上げ炉の構造を示す立面図である。
【図4】水平横型磁石を装備した引上げ炉からの漏れ磁界の強度分布を示す平面図である。
【図5】本発明の一実施形態を示す単結晶製造設備のレイアウト図である。
【図6】比較例1の単結晶製造設備のレイアウト図である。
【図7】比較例2の単結晶製造設備のレイアウト図である。
【符号の説明】
10 引上げ炉
11 メインチャンバ
12 プルチャンバ
13 ルツボ
14 支持軸
15 ルツボ受け
16 ヒータ
17 熱遮蔽体
20 原料融液
21 シリコン単結晶
22 種結晶
30 水平横型磁石
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a single crystal production facility by the CZ method, and more particularly to a single crystal production facility in which a plurality of pulling furnaces equipped with horizontally opposed magnets are installed and arranged in a pulling chamber.
[0002]
[Prior art]
High-purity silicon single crystals are often used for semiconductor element substrates for integrated circuits, and the Czochralski method, abbreviated as CZ method, is usually used for the production of silicon single crystals.
[0003]
In the production of a silicon single crystal by the CZ method, a pulling furnace 10 as shown in FIG. 1 is used. The pulling furnace 10 shown here includes a large-diameter main chamber 11 as a furnace body, and a small-diameter pull chamber 12 overlaid thereon. A crucible 13 is disposed in the center of the main chamber 11. The crucible 13 has a double structure in which an inner quartz crucible 13a and an outer support crucible 13b made of graphite are combined, and is supported on a support shaft 14 called a pedestal via a crucible receiver 15. The support shaft 14 is driven in the axial direction and the circumferential direction, whereby the crucible 13 is moved up and down and rotated.
[0004]
An annular heater 16 is disposed outside the crucible 13, and a heat insulating material (not shown) is disposed along the inner surface of the main chamber 11. On the other hand, a cylindrical heat shield 17 surrounding the silicon single crystal 21 pulled from the raw material melt 20 in the crucible 13 is installed above the crucible 13. The heat shield 17 has a reverse cone part whose diameter gradually decreases downward, and the reverse cone part cuts off radiant heat from the heater 16 and the raw material melt 20 to promote cooling of the silicon single crystal 21. To do.
[0005]
In operation, the furnace body is adjusted to a predetermined atmosphere, and the raw material melt 20 is formed in the crucible 13. The seed crystal 22 attached to the lower end of the pulling shaft suspended in the main chamber 11 through the pull chamber 12 is immersed in the raw material melt 20, and the pulling shaft is raised while rotating the crucible and the pulling shaft from this state. The silicon single crystal 21 is grown below the seed crystal 22 and pulled into the pull chamber 12.
[0006]
Such a pulling furnace 10 is usually arranged in plural in the pulling chamber so as to face the work space. An example of the arrangement is shown in FIG. The opposite side of the work space across the pulling furnace 10 is a maintenance space.
[0007]
On the other hand, each pulling furnace 10 may be equipped with a horizontal horizontal magnet according to the required crystal quality and productivity. A pulling furnace equipped with a horizontal horizontal magnet is shown in FIG. A pair of electromagnets 30, 30 are installed across the main chamber 11 of the pulling furnace 10. The electromagnets 30 and 30 have a function of suppressing convection of the raw material melt 20 by forming a horizontal magnetic flux line and applying it to the raw material melt 20 in the crucible 13. In FIG. 3, 18 is a gate valve, and 19 is a lifting / lowering / rotating mechanism of a pulling shaft.
[0008]
By causing the magnetic flux lines in the horizontal direction to act on the raw material melt 20 in the crucible 13, the oxygen concentration uniformity (ROG) in the wafer surface and the specific resistance uniformity in the wafer surface (which are problems in a large diameter wafer of 300 mm) ( A reduction in RRG) is avoided. Further, in the pulling of 300 mm crystal, high-speed growth is one of the problems, but horizontal magnetic field application is an effective measure for this high speed. For this reason, in the pulling up of the 300 mm crystal, which has recently been mass-produced, it is becoming essential to apply a magnetic field using a horizontal horizontal magnet.
[0009]
[Problems to be solved by the invention]
However, in a pulling furnace equipped with a horizontal horizontal magnet, a leakage magnetic field becomes a problem. FIG. 4 is a plan view showing the intensity distribution of the leakage magnetic field from a pulling furnace equipped with a horizontal horizontal magnet showing 4000 gauss in the center of the furnace, which is a general magnet capacity. As can be seen from FIG. 4, the leakage magnetic field strength exceeds 100 gauss even at a position 2 m away from the furnace.
[0010]
With respect to this leakage magnetic field, measures for suppressing the leakage magnetic field are described in, for example, Japanese Patent Laid-Open No. 8-333190 from the viewpoint of lowering the magnetic efficiency. However, measures to suppress the leakage magnetic field lead to an increase in the size and cost of the equipment. In addition, the leakage magnetic field not only causes a decrease in magnetic efficiency, but also adversely affects the magnetic field distribution in the furnace due to the interference of the leakage magnetic field between adjacent pulling furnaces, as well as safety for workers. May cause problems. Safety issues for workers include the adverse effects of magnetic fields on the human body and the occurrence of mechanical accidents due to the magnetic material being attracted to the pulling furnace.
[0011]
If the leakage magnetic field is weakened, these problems can be solved. However, as described above, the countermeasures increase the size and cost of the equipment.
[0012]
An object of the present invention is to provide a single crystal production facility that can avoid magnetic field interference and safety problems between adjacent pulling furnaces without weakening the leakage magnetic field from the pulling furnace.
[0013]
[Means for Solving the Problems]
In order to achieve the above object, the single crystal production facility of the present invention has a plurality of pulling furnaces equipped with horizontal horizontal magnets installed in the pulling chamber facing the work space, and faces the work spaces of the respective pulling furnaces. , Each pulling furnace is equipped with the magnet so that the direction of the magnetic flux line is inclined more than 0 degree and less than 90 degrees, preferably 30 to 60 degrees in the horizontal plane with respect to the front face. Preferably, the directions of the magnetic flux lines in the plurality of pulling furnaces arranged in one or two directions are substantially the same.
[0014]
In the single crystal production facility of the present invention, the magnetic flux line direction in a plurality of pulling furnaces arranged in the pulling chamber is inclined in a horizontal plane with respect to the front surface, so that a leakage magnetic field is generated in both the front-rear direction and the lateral direction of the pulling furnace. The spread of is suppressed. As a result, interference of the leakage magnetic field between adjacent pulling furnaces can be avoided. Moreover, the leakage magnetic field strength in the work space can be reduced, and the safety of the worker can be ensured.
[0015]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of the present invention will be described below with reference to the drawings. FIG. 5 is a layout diagram of a single crystal manufacturing facility showing an embodiment of the present invention.
[0016]
The single crystal manufacturing facility of the present embodiment includes a plurality of pulling furnaces 10, 10... Arranged in a pulling chamber. The plurality of pulling furnaces 10, 10,... Are arranged in two rows on both sides of the work space. That is, they are arranged in two vertical rows and several horizontal rows across the work space. Each pulling furnace 10 is equipped with the horizontal horizontal magnets 30, 30 shown in FIG. 3, and the designed front to be directed to the work space is directly directed to the work space, and the horizontal horizontal magnets 30, 30 are formed. The direction of the magnetic flux lines is inclined 45 degrees horizontally from the front in all furnaces. That is, the horizontal horizontal magnets 30 and 30 are attached to the furnace body so that the direction of the magnetic flux lines in each furnace is inclined 45 degrees horizontally from the front, and the directions of the magnetic flux lines are parallel in all the furnaces. .
[0017]
The structure of the pulling furnace 10 itself is as described with reference to FIG.
[0018]
6 and 7 are layout diagrams of a single crystal manufacturing facility showing a comparative example. In Comparative Example 1 shown in FIG. 6, horizontal horizontal magnets 30 and 30 are attached to the furnace body so that the direction of the magnetic flux lines passes through the front in all furnaces. That is, the inclination angle from the front in the direction of the magnetic flux line is 0 degree in all the furnaces. Moreover, in the comparative example 2 shown in FIG. 7, the horizontal horizontal magnets 30 and 30 are attached to the furnace body so that the inclination angle from the front in the direction of the magnetic flux line is 90 degrees in all furnaces.
[0019]
In the following, the function of the single crystal manufacturing facility of the present embodiment shown in FIG. 5 will be described in comparison with Comparative Examples 1 and 2 shown in FIGS.
[0020]
In Comparative Example 1 shown in FIG. 6, since the tilt angle from the front in the direction of the magnetic flux lines is 0 degrees in all the pulling furnaces 10, 10,..., The magnetic flux lines spread back and forth in each furnace. For this reason, the leakage magnetic field strength in the work space is increased, and the worker is exposed to a strong magnetic field. On the other hand, the lateral spread of the magnetic flux lines is reduced. For this reason, it is easy to avoid interference of leakage magnetic fields between the pulling furnaces 10 and 10 adjacent in the lateral direction. As a result, the pulling furnaces 10, 10,.
[0021]
In Comparative Example 2 shown in FIG. 7, since the tilt angle from the front in the direction of the magnetic flux line is set to 90 degrees in all the pulling furnaces 10, 10,... The risk of exposure to a strong magnetic field is reduced, but the lateral spread of the magnetic flux lines is increased, and due to the interference of the leakage magnetic field between the adjacent adjacent lifting furnaces 10, 10, the lifting furnace 10, It is necessary to separate 10 ·· in the lateral direction. As a result, a large installation space (lifting room) is required.
[0022]
On the other hand, in the single crystal manufacturing facility of the present embodiment shown in FIG. 5, the inclination angle from the front in the direction of the magnetic flux lines is set to 45 degrees in all the pulling furnaces 10, 10,. For this reason, both the spread in the front-rear direction and the lateral spread of the leakage magnetic field are suppressed to be small. Specifically, the leakage magnetic field at the equal position in the front-rear direction is reduced to 1 / 1.33 compared to Comparative Example 1, and the leakage magnetic field at the equal position in the horizontal direction is 1/1. Reduce to 33. For this reason, the risk of the operator being exposed to a strong magnetic field in the work space is reduced, and it becomes easy to avoid interference of leakage magnetic fields between the pulling furnaces 10 and 10 adjacent in the lateral direction. .. can be approached laterally.
[0023]
As described above, in the single crystal manufacturing facility of the present embodiment, the direction of the magnetic flux lines in the plurality of pulling furnaces 10, 10... Arranged in the pulling chamber is inclined 45 degrees in the horizontal plane with respect to the front surface. The spread of the leakage magnetic field is suppressed in both the front-rear direction and the lateral direction. As a result, interference of the leakage magnetic field between the adjacent pulling furnaces 10 and 10 can be avoided, and the interval can be reduced. Moreover, the leakage magnetic field strength in the work space can be reduced, and the safety of the worker can be ensured.
[0024]
In the above embodiment, the angle of inclination from the front in the direction of the magnetic flux lines in the plurality of pulling furnaces 10, 10... Arranged in the pulling chamber is 45 degrees, but within a range of 30 to 60 degrees. For example, it is possible to obtain substantially the same effect as in the case of 45 degrees, and when suppressing the spread of the magnetic flux lines in the lateral direction, it is preferable to approach 30 degrees, and when spreading the magnetic flux lines in the front-rear direction is further suppressed. Is preferably close to 60 degrees.
[0025]
【The invention's effect】
As described above, the single crystal production facility of the present invention does not weaken the leakage magnetic field from the pulling furnace by inclining the direction of the magnetic flux lines in the plurality of pulling furnaces arranged in the pulling chamber from the front in the horizontal plane. In both cases, magnetic field interference and safety problems between adjacent pulling furnaces can be avoided. Therefore, a measure for weakening the leakage magnetic field from the pulling furnace can be omitted, which is very advantageous in terms of equipment scale and equipment cost.
[Brief description of the drawings]
FIG. 1 is a longitudinal sectional view showing the structure of a pulling furnace.
FIG. 2 is a layout diagram illustrating an arrangement example of a pulling furnace.
FIG. 3 is an elevational view showing the structure of a pulling furnace equipped with a horizontal horizontal magnet.
FIG. 4 is a plan view showing an intensity distribution of a leakage magnetic field from a pulling furnace equipped with a horizontal horizontal magnet.
FIG. 5 is a layout diagram of a single crystal manufacturing facility showing an embodiment of the present invention.
6 is a layout diagram of a single crystal production facility of Comparative Example 1. FIG.
7 is a layout diagram of a single crystal production facility of Comparative Example 2. FIG.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 10 Pulling furnace 11 Main chamber 12 Pull chamber 13 Crucible 14 Support shaft 15 Crucible receptacle 16 Heater 17 Thermal shield 20 Raw material melt 21 Silicon single crystal 22 Seed crystal 30 Horizontal horizontal magnet

Claims (3)

水平横型磁石を装備した複数の引上げ炉が、引上げ室内に作業スペースに臨んで設置されており、各引上げ炉の作業スペースに対向する面を正面として、前記正面に対する磁束線方向の傾斜角度が水平面内で30〜60度となるように、各引上げ炉に前記磁石が装備されていることを特徴とする単結晶製造設備。A plurality of pulling furnaces equipped with horizontal horizontal magnets are installed facing the work space in the pulling chamber. The surface facing the work space of each pulling furnace is the front, and the inclination angle of the magnetic flux lines with respect to the front is a horizontal plane. to Do so that 30 to 60 degrees at the inner, single crystal manufacturing equipment, characterized in that the magnets each pulling furnace is equipped. 複数の引上げ炉が一方向又は二方向に整列して配置されており、これらの引上げ炉における磁束線の方向がぼほ同一である請求項1に記載の単結晶製造設備。The single crystal manufacturing facility according to claim 1, wherein a plurality of pulling furnaces are arranged in one direction or two directions, and directions of magnetic flux lines in these pulling furnaces are substantially the same. 水平横型磁石を装備した複数の引上げ炉が、引上げ室内に作業スペースに臨んで設置されており、複数の引上げ炉が一方向又は二方向に整列して配置されており、これらの引上げ炉における磁束線の方向がぼほ同一であり、各引上げ炉の作業スペースに対向する面を正面として、磁束線方向が前記正面に対して水平面内で0度超、90度未満傾斜するように、各引上げ炉に前記磁石が装備されていることを特徴とする単結晶製造設備。A plurality of pulling furnaces equipped with horizontal horizontal magnets are installed facing the work space in the pulling chamber, and the plurality of pulling furnaces are arranged in one or two directions, and the magnetic flux in these pulling furnaces Each pulling direction is almost the same, and the surface facing the working space of each pulling furnace is the front, and the magnetic flux line direction is inclined more than 0 degree and less than 90 degrees in the horizontal plane with respect to the front. A single crystal manufacturing facility, characterized in that a furnace is equipped with the magnet.
JP2001280149A 2001-09-14 2001-09-14 Single crystal production equipment Expired - Fee Related JP4006967B2 (en)

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