JP4008445B2 - Test fixture - Google Patents

Description

  The present invention relates to a test fixture that holds an electronic device in a state in which a conductor is in contact with each lead in order to measure electrical characteristics of the electronic device from which a plurality of leads are derived.

  In order to measure the electrical characteristics of an electronic device, a signal generator that provides a measurement signal to the electronic device and a signal processing unit that measures the signal output from the electronic device are stabilized on the leads that are external terminals of the electronic device. Must be in contact. For this reason, the test fixture (inspection) is used to hold the electronic device in place, and press the conductor (conductor pattern) of the measurement board connected to the signal generator or signal processor against the lead of the electronic device to make it conductive. Jig) is used.

For example, as disclosed in Patent Document 1 below, in the case of an electronic device in which a plurality of leads are arranged in two rows, the electronic device is placed on an insulating device support, and a pair of device supports A plurality of leads in two rows are held in a plurality of grooves respectively formed on the side surfaces. Then, the two measurement boards are arranged outside the leads so that the lead of the electronic device and the conductor pattern of the measurement board are parallel, and the two blocks are arranged movably outside the measurement board. The conductor pattern of the measurement board was pressed against the lead to achieve conduction.
JP 2004-198303 A

However, in the conventional test fixture described above, two measurement boards are arranged outside the leads, and the two blocks are pressed from the outside of the measurement board to conduct, so the leads are arranged out of the parallel rows. It was not possible to establish electrical continuity with the electronic device. For this reason, measurement is not possible for an electronic device having five leads in which leads are arranged in each diagonal of the pentagon, and an electronic device having six leads in which hexagonal leads are arranged in each diagonal. Since it could not be performed and the total number could not be evaluated, there were problems such as a decrease in yield during mass production.
In addition, in a structure in which a plurality of elongated rod-shaped leads protrude from the electronic device side by side, it is necessary to reliably bring each lead into contact with a plurality of conductor patterns formed on the measurement substrate. In particular, in such a lead-type electronic device, in order to perform measurement without breaking the impedance matching from the root of the lead to the tip, it is required that the entire length of the lead is correctly brought into contact with the conductor pattern of the measurement substrate.

  The present invention has been made in view of the above situation, and can provide a test fixture that can be contacted even with leads arranged out of parallel rows, and that can be measured without breaking impedance matching, Therefore, it is aimed to shorten the development period, improve the yield, and reduce the cost by 100% evaluation.

Next, means for solving the above problems will be described with reference to the drawings corresponding to the embodiments.
The test fixture according to claim 1 of the present invention is a test fixture 1 in which a conductor P is brought into contact with each lead R in order to measure electrical characteristics of an electronic device 14 in which a plurality of leads R are derived from one end face 14a. Because
A spacer plate 4 formed between the leads R and having grooves M formed on both sides along the lead R, into which a portion of each lead R in the diameter direction is inserted;
First and second measurement substrates 5 and 6, which are arranged with the lead R in between and on which one of the conductors P contacting the lead R is formed,
A slit 7 provided on at least one of the first and second measurement substrates 5 and 6 and notched corresponding to the predetermined lead R2;
A part of the measurement substrate 5 provided with the slit 7, that is, the surface opposite to the surface on which the conductor P is formed, is brought into close contact with the measurement substrate 5 so that a part of the measurement substrate 5 is inflated. A conductive sheet 8 to be taken out;
A pressing means T that presses the first and second measurement substrates 5 and 6 toward the spacer plate 4 to bring the conductor P into contact with the leads R;
It is characterized by comprising.

The test fixture according to claim 2 is a test fixture 1 in which a conductor P is brought into contact with each lead in order to measure electrical characteristics of the electronic device 14 in which a plurality of leads R are derived from one end surface 14a.
A main body 2 having a first pressing surface 11;
A lid 3 having a second pressing surface 13 attached to the main body 2 and facing the first pressing surface 11;
A groove M that is inserted between the leads R and into which a part of each lead R in the diametrical direction is inserted is formed on both surfaces along the lead R, and is positioned by positioning means 17, 18 to be positioned by the main body 2 and the lid 3. A spacer plate 4 sandwiched in parallel with the pressing surfaces 11 and 13;
First and second measurement substrates 5 provided between the main body 2 and the spacer plate 4 and between the lid 3 and the spacer plate 4 and having the conductor P in contact with the lead R formed thereon. 6 and
A slit 7 provided on at least one of the first and second measurement substrates 5 and 6 and notched corresponding to the predetermined lead R2;
A conductive sheet 8 provided between the measurement substrate 5 provided with the slit 7 and the pressing surface 11 facing the measurement substrate 5;
A contact means U for bringing the measurement substrate 5 provided with the slits 7 into close contact with the pressing surface 11 facing, and causing a part of the conductive sheet 8 to bulge into the slits 7;
And the lid 3 and the main body 2 bring the conductor P and the leads R into contact with each other by pressing the first and second measurement substrates 5 and 6 toward the spacer plate 4. It is characterized by that.

  According to such a configuration, the lead R2 arranged out of the parallel row is in contact with the conductive sheet 8 arranged in the slit 7 and bulging in the slit 7, and the other lead R is a conductor of the measurement substrate 5. The lid 3 and the main body 2 which are in contact with P and constitute the pressing means T press the first and second measurement substrates 5 and 6 toward the spacer plate 4 so that these contacts are reliable. It becomes. Further, the lead R is in contact with the conductor P over the entire length, and impedance matching is not lost.

The test fixture according to claim 3 is the test fixture 1 according to claim 1 or 2, which measures electrical characteristics of the electronic device 14 from which the five leads R1, R2, R3, R4, R5 are derived. There,
The two grooves M2, M3 formed on one surface of the spacer plate 4,
Two grooves M4, M5 formed on the other surface of the spacer plate 4,
One groove M2 formed on one surface of the spacer plate 4 along the slit 7 and projecting from two grooves M2 and M3 formed on the one surface;
It is characterized by comprising.

  According to such a configuration, even if the one lead M2 arranged on one surface of the spacer plate 4 is the electronic device 14 that comes outside from the other two leads M1 and M3, it comes outside the outside. The lead M <b> 2 is disposed in the slit 7 of the measurement substrate 5 and can be contacted via the conductive sheet 8.

The test fixture according to claim 4 measures the electrical characteristics of the electronic device 14A from which the six leads R1, R2, R3, R4, R5, R6 are derived. 1 and
The two grooves M1, M3 formed on one surface of the spacer plate 4A;
Two grooves M4 and M6 formed on the other surface of the spacer plate 4A;
One groove M2 formed on one surface of the spacer plate 4A along the slit 7 and disposed so as to protrude from the two grooves M1, M3 formed on the one surface;
One groove M5 formed on the other surface of the spacer plate 4A along the slit 7 and disposed so as to protrude from the two grooves M4 and M6 formed on the other surface;
It is characterized by comprising.

  According to such a configuration, even if the one lead R2 and R5 arranged on both surfaces of the spacer plate 4A is the electronic device 14A that comes outside from the other two leads R, the lead R2 that goes outside. , R5 are arranged in slits 7 and 7 provided in the first and second measurement substrates 5 and 6, respectively, and contact through the conductive sheets 8 and 8 is possible.

  According to the test fixture according to the present invention, the spacer plate having a groove along the lead, the first and second measurement substrates that sandwich the spacer plate from both sides and contact the conductor with the lead, and the slit are provided. Since the measurement board is in close contact with the pressing surface facing this measurement board, it is equipped with a conductive sheet that partially swells in the slit, so even if the lead is placed outside the parallel row, it is inserted into the slit And can be brought into contact with the conductor. And a contact is ensured by pressing the 1st, 2nd measurement board | substrate toward a spacer board with the main body which comprises the press means, and a cover body. In addition, the lead is held in the groove, and the lead is pressed by the first and second measurement boards to establish conduction, so that the lead is securely held at a predetermined position and brought into contact with the conductor of the measurement board in an ideal state. Can make accurate measurements. Furthermore, since it can be made to contact the conductor of a measurement board over the full length from the root of a lead to the tip, it can measure without destroying impedance matching. As a result, it is possible to make stable contact even with electronic devices that cannot be touched by simply pressing two measurement substrates, and to evaluate the total number of electronic devices, thereby shortening the development period and reducing costs by improving yield. Become.

  Also, three leads are arranged on one side of the spacer plate, two leads are arranged on the other side of the spacer plate, and one lead arranged on one side of the spacer plate is the other Even in the case of an electronic device that detaches outward from the two leads, by placing the lead that detaches outward in the slit of the measurement substrate, the electronic device is brought into contact with the conductive sheet bulging in a slit different from the conductor of the measurement substrate. be able to. As a result, it is possible to make contact with the electronic device in which the five leads are arranged at the diagonals of the pentagon.

  Further, three leads are arranged on one side of the spacer plate, three leads are arranged on the other side of the spacer plate, and one lead arranged on both sides of the spacer plate is the other two. Even if the electronic device comes out of the lead of the measurement board, the lead coming out of the lead is arranged in a slit provided in each of the first and second measurement boards, so that it swells in a slit different from the conductor of the measurement board. It can be brought into contact with the exposed conductive sheet. As a result, it is possible to make contact with an electronic device in which the six leads are arranged at each diagonal of the hexagon.

DESCRIPTION OF EMBODIMENTS Hereinafter, a preferred embodiment of a test fixture according to the present invention will be described in detail with reference to the drawings.
1 is a side view showing a test fixture according to the present invention, FIG. 2 is a plan view thereof, FIG. 3 is a view taken along the line A-A showing a state in which the lid in FIG. 1 is opened, and FIG. 4 is a lid in FIG. FIG. 5A is a perspective view showing the spacer plate viewed from the upper side, FIG. 5B is a perspective view showing the spacer plate viewed from the lower side, and FIG. FIG. 7 is a cross-sectional view illustrating a lead inserted between the leads and sandwiched between the measurement substrate and FIG. 7 is a cross-sectional view illustrating the lead inserted with the spacer plate interposed between the main body and the lid body.

  The test fixture 1 according to the present embodiment is used to hold an electronic device by bringing a conductor into contact with each lead for the purpose of measuring electrical characteristics of the electronic device in which a plurality of leads are led out substantially vertically from one end surface. Used. The test fixture 1 includes a main body 2, a lid 3, a spacer plate 4, first and second measurement substrates 5 and 6, a slit 7, and a conductive sheet 8 as main components. .

  The main body 2 is screwed onto a base base 10 having handles 9, 9 on both sides. A first pressing surface 11 (see FIG. 7) is formed on the upper portion of the main body 2. The first pressing surface 11 is formed with a recess in which a conductive sheet 8 described later is provided. A lid 3 is attached to the upper portion of the main body 2 via a hinge 12 so as to be freely opened and closed. The lid 3 is formed with a second pressing surface 13 (see FIG. 7) that faces the first pressing surface 11. The lid 3 is closed and held on the main body 2 by a catch clip 15 with a predetermined closing force. As a result, a predetermined pressing force is applied between the main body 2 and the lid 3. The main body 2, the lid body 3, and the catch clip 15 constitute a pressing means T of the test fixture 1.

  An electronic device is sandwiched between the main body 2 and the lid 3. In the present embodiment, for example, a laser diode 14 shown in FIG. 6 is used as a measurement target. Here, the laser diode 14 will be further described. From the one end surface 14a of the laser diode 14, five leads R (R1, R2, R3, R4, R5) are led out substantially perpendicularly, and the leads R1, R2, R3. , R4, R5 are arranged at the diagonals of the pentagon. These leads R correspond to a transmission-side power source, a transmission-side ground, an optical monitor, a reception-side power source, and light blocking.

  As shown in FIG. 6, the spacer plate 4 is inserted between the leads R, and the grooves M (M1, M2, M3, M4, M5) shown in FIG. It is formed on both sides along R. The length of the groove M is slightly longer than the length of the lead R. When the lead R of the laser diode 14 is inserted along the groove M, the entire length of the lead R is held along the groove M. The cross-sectional shape of the groove M is V-shaped, and the depth and shape of the groove M are such that when a lead R having a round cross section is held here, a part of the lead R in the diameter direction protrudes from the surface of the spacer plate 4. It is formed as follows. However, the cross-sectional shape of the groove M is not necessarily V-shaped.

  Leg portions 16 and 16 along the groove M are provided on both sides of the spacer plate 4, and the leg portions 16 and 16 are used as knobs when the spacer plate 4 is attached to and detached from the main body 2.

  The spacer plate 4 is provided with positioning holes 17 and 17 which are positioning means, and positioning pins 18 and 18 which are positioning means shown in FIG. The The spacer plate 4 is positioned by the positioning holes 17 and 17 and the positioning pins 18 and 18 and is sandwiched between the main body 2 and the lid 3 in parallel with the first pressing surface 11 and the second pressing surface 13. For example, Teflon (registered trademark), PPO (polyphenylene oxide), or the like is preferably used as the material of the spacer plate 4.

  First and second measurement substrates 5 and 6 are provided between the main body 2 and the spacer plate 4 and between the lid 3 and the spacer plate 4. As shown in FIG. 6, the first measurement substrate 5 is formed with conductors P (P1, P2) that contact the leads R1, R3. Conductors P (P3, P4) that contact the leads R4, R5 are formed on the second measurement substrate 6. This conductor P is extended to the edge of the 1st, 2nd measurement board | substrates 5 and 6, and is connected to the electrical contact part which is not shown in figure. That is, the conductors P1 and P2 of the first measurement board 5 attached to the main body 2 side are electrically connected to the terminals 20 and 21 provided on the side surface of the main body 2 shown in FIG. The conductors P3 and P4 of the substrate 5 are electrically connected to terminals 23 and 24 provided on the upper surface of the lid 3.

  As shown in FIG. 6, when the spacer plate 4 is inserted, the lead R is in a state where the full length is held by the groove M, and the first and second measurement substrates 5 and 6 extend over the entire length from the root to the tip. The conductors P1 and P2 and the conductors P3 and P4 are in contact with each other.

  At least one of the first and second measurement substrates 5 and 6 (first measurement substrate 5) has a slit 7 cut out corresponding to a predetermined lead. In the present embodiment, a slit 7 is provided corresponding to the lead R2. The lead R2 is, for example, a transmission side ground (GND).

  By the way, three grooves M1, M2, M3 are formed on the surface of the spacer plate 4 facing the measurement substrate (first measurement substrate 5) provided with the slit 7, and as shown in FIG. Is formed so as to protrude from the other two grooves M1 and M3.

  As shown in FIGS. 6 and 7, a screw 25 as a close contact means U is attached in the vicinity of the end of the first measurement substrate 5 provided with the slit 7, and the first measurement substrate 5 faces this. The first pressing surface 11 to be brought into close contact with.

  The conductive sheet 8 described above is provided between the first measurement substrate 5 provided with the slit 7 and the first pressing surface 11 facing the first measurement substrate 5. The conductive sheet 8 has a conductive material inside the rubber sheet and is an elastic conductor. In the present embodiment, a thin rod-shaped conductive material is embedded in the entire surface of the sheet, and can be conducted from one surface to the other surface of the sheet. The conductive sheet 8 is disposed between the first measurement substrate 5 and the first pressing surface 11, so that the lid 3 and the main body 2 are closed by the catch clip 15, and the first measurement substrate 5. And the second measurement substrate 6 are pressed toward the spacer plate 4 to come into contact with the lead R2 that has entered the groove M2.

  Accordingly, even if one lead R2 arranged on one surface of the spacer plate 4 is a laser diode 14 that moves outward from the other two leads R1 and R3 as in the present embodiment, the outer side A lead R <b> 2 that is detached from the lead is disposed in the slit 7 of the first measurement substrate 5, and can be contacted via the conductive sheet 8.

  The conductive sheet 8 is connected to an electrical contact portion (not shown) provided on the main body 2. A cable support 26 facing the main body 2 is erected on the base base 10, and a contact plate 28 is rotatably provided above the cable support 26 via a hinge 27. An optical fiber cable 29 is held on the contact plate 28, and the optical fiber cable 29 is connected to the laser diode 14 when the contact plate 28 is biased by a spring 30.

  The terminals 20 and 21 and the terminals 23 and 24 of the test fixture 1 are connected to a measurement system that measures the electrical characteristics of the laser diode 14. The measurement system includes a signal generation unit (pulse pattern generator), a signal measurement unit, and a processing unit. The signal generation unit generates a measurement signal necessary for measuring the function of the laser diode 14 and outputs the measurement signal to the laser diode 14.

  The laser diode 14 attached to the test fixture 1 receives a measurement signal from the signal generator, and the signal output from the laser diode 14 is output to the outside. The signal measurement unit is a unit for measuring the signal output from the laser diode 14, and the signal measured by the signal measurement unit is processed by a processing unit such as a personal computer and displayed on the display unit.

Next, the operation of the test fixture 1 according to the present embodiment will be described.
In order to hold the laser diode 14 to be measured on the test fixture 1, first, as shown in FIGS. 3 and 4, the lid 3 is raised to open the first pressing surface 11 and the second pressing surface 13. First and second measurement substrates 5 and 6 are attached to the first pressing surface 11 and the second pressing surface 13 in advance. Further, a conductive sheet 8 is sandwiched between the first measurement substrate 5 and the first pressing surface 11 in advance. A part of the conductive sheet 8 bulges into the slit 7 by bringing the first measurement substrate 5 into close contact with the first pressing surface 11.

  Next, as shown in FIG. 7A, the spacer plate 4 is slid and inserted from the tip of the lead R between the leads R1, R2, and R3 of the laser diode 14 and the leads R4 and R5. R is arranged in each groove M. As a result, the lead R is held along the groove M over the entire length from the root to the tip.

  Next, the spacer plate 4 on which the laser diode 14 is mounted is placed on the first measurement substrate 5 of the main body 2 with the positioning holes 17 and 17 aligned with the positioning pins 18 and 18.

  Next, the lid 3 is closed while being pressed against the main body 2, and is closed to the main body 2 side by the catch clip 15. In the laser diode 14, the lead R is held in the groove M, the spacer plate 4 is positioned, and is held while receiving a pressing force between the main body 2 and the lid body 3. It contacts the conductors P1 and P2 and the conductors P3 and P4 of the second measurement substrates 5 and 6.

  The lead R contacts the corresponding conductors P of the first and second measurement substrates 5 and 6 in an ideal state over the entire length from the base to the tip. The lead R2 is disposed so as to enter the slit 7, and the main body 2 and the lid 3 bulge into the slit 7 by pressing the first and second measurement substrates 5 and 6 toward the spacer plate 4. The conductive sheet 8 is contacted. As a result, all the leads R are securely fixed and electrically connected to the external terminals 20 and 21 and the terminals 23 and 24.

  As a result, the leads R of the laser diode 14 are in contact with the conductors P of the first and second measurement substrates 5 and 6 without breaking the impedance matching, so that the electrical characteristics of the laser diode 14 can be accurately determined. It becomes possible to measure.

  Specifically, when a high frequency signal is input to the laser diode 14 and the optical output is measured, the frequency and amplitude pattern are set by the signal generator, and the terminal 20 is connected to the laser diode 14 mounted on the test fixture 1. , 21 to input a high frequency signal. The light output from the optical transmitter / receiver is measured for various items such as optical output, wavelength, Tr, Tf, and jitter extinction ratio, processed by a personal computer or the like, and displayed on a monitor or the like as necessary.

  As an electronic device, a photodiode is mounted instead of a laser diode, and when the photodiode 14 is measured by optical input and high-frequency signal output, light whose level is adjusted is input from the optical transceiver, A high-frequency signal is output from the terminals 20 and 21 of the test fixture 1 holding the diode 14, each item such as Tr, Tf, jitter extinction ratio, bit error rate is measured, and data is processed by a personal computer or the like. Displayed on a monitor or the like accordingly.

  According to the test fixture 1 according to this embodiment, the spacer plate 4 having the groove M along the lead R, and the first and second measurements in which the conductor P is brought into contact with the lead R with the spacer plate 4 sandwiched from both sides. Since the substrates 5 and 6 and the conductive sheet 8 partially swelled in the slit 7 by attaching the first measurement substrate 5 to the first pressing surface 11 are provided, they are arranged out of parallel rows. Even the lead R2 can be inserted into the slit 7 and brought into contact with the conductor (conductive sheet 8). Then, the first and second measurement substrates 5 and 6 are pressed against the spacer plate 4 by the main body 2 and the lid 3, thereby ensuring contact. Further, since the lead R is held in the groove M and the lead R is pressed by the first and second measurement substrates 5 and 6 to establish conduction, the lead R is securely held at a predetermined position and the conductor of the measurement substrate. It is possible to make an accurate measurement by contacting P in an ideal state.

  Furthermore, since it can be made to contact with the conductor P of the 1st, 2nd measurement board | substrates 5 and 6 over the full length from the base of the lead | read | reed R to a front-end | tip, it can measure without destroying impedance matching. As a result, it is possible to make stable contact even with electronic devices that cannot be touched by simply pressing two measurement substrates, and to evaluate the total number of electronic devices, thereby shortening the development period and reducing costs by improving yield. Become.

  In addition, in this embodiment, three leads R are arranged on one surface of the spacer plate 4, two leads R are arranged on the other surface of the spacer plate 4, and one of the spacer plates 4 is arranged. Even if one lead R2 arranged on the surface of the laser diode 14 is out of the other two leads R1 and R3, the lead R2 out of the outside is replaced with the spacer plate 4 of the first measurement substrate 5. By disposing, the conductor (conductive sheet 8) bulging in the slit 7 different from the conductor P of the measurement substrate can be brought into contact. As a result, it is possible to make contact with the laser diode 14 in which the five leads R are arranged at the diagonals of the pentagon.

  According to the above-described embodiment, the screw 25 is used as the contact means U for bringing the first measurement substrate 5 into close contact with the first pressing surface 11. However, the present invention is not limited to this. As shown in FIG. 8, the spacer plate 4 may have a configuration in which a protrusion 35 is formed on one surface facing the first measurement substrate 5. As a result, when the lid 3 and the main body 2 press the first and second measurement substrates 5 and 6 toward the spacer plate 4, the protrusion 35 presses the first measurement substrate 5, thereby The first measurement substrate 5 is brought into close contact with the first pressing surface 11. A plurality of the projecting portions 35 may be formed along the groove M, or may be formed as ridges.

  According to the above-described embodiment, the slit 7 is provided in the first and second measurement substrates 5 and 6 in the first measurement substrate 5 located on the main body 2 side. It is good also as a structure by which the slit 7 was provided in the 2nd measurement board | substrate 6 located in 3 side. In that case, the conductive sheet 8 is provided between the second measurement substrate 6 and the second pressing surface 13.

Next, a second embodiment of the test fixture according to the present invention will be described.
FIG. 9 is a cross-sectional view of a main part of a test fixture according to the second embodiment provided with a spacer plate corresponding to an electronic device having six leads. In the following embodiments, members that are the same as those shown in FIGS. 1 to 8 are given the same reference numerals, and redundant descriptions are omitted.
This test fixture holds a laser diode 14A from which six leads R (leads R1, R2, R3, R4, R5, R6) are derived and measures its electrical characteristics. Therefore, two grooves M1, M3 formed on one surface of the spacer plate 4A, two grooves M4, M6 formed on the other surface of the spacer plate 4A, and one surface of the spacer plate 4A One groove M2 formed along the slit 7 and projecting from the two grooves M1, M3 formed on one surface, and the other surface formed along the slit 7 on the other surface of the spacer plate 4A And a single groove M5 disposed so as to protrude from the two grooves M4 and M6.

  According to this test fixture, even if each of the leads R2 and R5 arranged on both sides of the spacer plate 4A is a laser diode 14A that is detached outward from the other two leads M, the lead that is detached outwardly. R2 and R5 are arranged in the slits 7 and 7 provided in the first and second measurement substrates 5 and 6, respectively, and contact through the conductive sheets 8 and 8 is possible. As a result, the six leads R can be brought into contact with the laser diode 14 </ b> A arranged at each diagonal of the hexagon.

Next, a third embodiment of the test fixture according to the present invention will be described.
FIG. 10 is a perspective view of an essential part of a test fixture according to a third embodiment in which a divided measurement board is used.
In this test fixture, the first measurement boards 5A and 5A are divided into two. Accordingly, the lead R2 is disposed in the gap 31 formed between the first measurement substrates 5A and 5A and is in contact with the conductive sheet 8.

  According to this test fixture, the width of the gap 31 can be set arbitrarily.

Next, a fourth embodiment of the test fixture according to the present invention will be described.
FIG. 11 is a cross-sectional view of a main part of a test fixture according to the fourth embodiment in which the slit is formed in a V-shaped cross section.
In this test fixture, a slit 7A formed in the first measurement substrate 5B is formed in a V-shaped cross section. On the other hand, the spacer plate 4B is not formed with the groove M2 for holding the lead R2, but is provided with a ridge 32 instead. Therefore, the lead R2 is pressed by the ridge 32 and pushed into the slit 7A having a V-shaped cross section.

  According to this test fixture, the contact between the lead R2 and the conductive sheet 8 can be improved.

Next, a fifth embodiment of the test fixture according to the present invention will be described.
FIG. 12 is a cross-sectional view of a main part of a test fixture according to the fifth embodiment in which a convex portion is provided on the pressing surface facing the slit.
In this test fixture, a convex portion 33 is formed on the first pressing surface 11 facing the slit 7. Plural protrusions 33 may be formed along the slits 7 or may be formed as protrusions. By providing this convex portion 33, the back surface of the conductive sheet 8 is pressed against the convex portion 33 even in a normal state so that the conductive sheet 8 bulges into the slit 7.

  According to this test fixture, the conductive sheet 8 reliably protrudes into the slit 7, and the contact between the lead R2 and the conductive sheet 8 can be further improved.

It is a side view which shows the test fixture by this invention. It is the same top view. It is an AA arrow line view which shows the state which open | released the cover body in FIG. It is a BB arrow line view which shows the state which open | released the cover body in FIG. (A) It is a perspective view which shows the spacer board seen from the upper side. (B) It is a perspective view which shows the spacer board seen from the lower side. FIG. 6 is a perspective view of an electronic device in which a spacer plate is inserted between leads and is sandwiched between measurement substrates. It is sectional drawing of the lead | read | reed inserted | pinched between the main body and the cover body through the measurement board | substrate with the spacer board inserted. It is sectional drawing of the lead | read | reed pinched | interposed into the main body and the cover body through the measurement board | substrate which the spacer board provided with the projection part as an adhesion means was inserted. It is principal part sectional drawing of the test fixture which concerns on 2nd Embodiment. It is a principal part perspective view of the test fixture which concerns on 3rd Embodiment. It is principal part sectional drawing of the test fixture which concerns on 4th Embodiment. It is principal part sectional drawing of the test fixture which concerns on 5th Embodiment.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... Test fixture 2 ... Main body 3 ... Cover body 4 ... Spacer plate 5, 6 ... 1st, 2nd measurement board 7 ... Slit 8 ... Conductive sheet 11 ... 1st press surface 13 ... 2nd press surface 14 ... Laser Diode (electronic device)
14a ... one end surface 17 ... positioning hole (positioning means)
18 ... Positioning pin (positioning means)
M1, M2, M3, M4, M5 ... groove P ... conductor R1, R2, R3, R4, R5 ... lead T ... pressing means U ... adhesion means

Claims (4)

A test fixture (1) for bringing a conductor (P) into contact with each lead in order to measure electrical characteristics of an electronic device (14) having a plurality of leads (R) derived from one end face (14a),
A spacer plate (4) inserted between the leads, into which grooves (M) for inserting a portion of each lead in the diameter direction are formed on both sides along the lead; and
First and second measurement substrates (5, 6), which are arranged with the leads interposed therebetween and in which the conductors contacting each lead are formed on one surface,
A slit (7) provided on at least one of the first and second measurement substrates and cut away corresponding to the predetermined lead;
A conductive sheet (8) that is provided on the other surface side of the measurement substrate provided with the slit, and a portion of the conductive sheet bulges into the slit by closely contacting the measurement substrate;
Pressing means (T) for pressing the first and second measurement substrates toward the spacer plate to bring the conductor and each lead into contact with each other;
A test fixture characterized by comprising: A test fixture (1) for bringing a conductor (P) into contact with each lead in order to measure electrical characteristics of an electronic device (14) having a plurality of leads (R) derived from one end face (14a),
A body (2) having a first pressing surface (11);
A lid (3) having a second pressing surface (13) attached to the main body and facing the first pressing surface;
A groove (M) that is inserted between the leads and into which a part of each lead in the diameter direction is inserted is formed on both surfaces along the lead, and is positioned by positioning means (17, 18). A spacer plate (4) sandwiched in parallel with the pressing surface between,
First and second measurement substrates (5, 6) provided between the main body and the spacer plate and between the lid and the spacer plate and formed with the conductor contacting the lead;
A slit (7) provided on at least one of the first and second measurement substrates and cut away corresponding to the predetermined lead;
A conductive sheet (8) provided between the measurement substrate provided with the slit and a pressing surface facing the measurement substrate;
A contact means (U) for closely attaching the measurement substrate provided with the slit to the facing pressing surface and causing a part of the conductive sheet to bulge into the slit;
And the lid and the main body contact the conductor and each lead by pressing the first and second measurement substrates against the spacer plate. . The test fixture according to claim 1 or 2, wherein the electrical characteristics of the electronic device from which the five leads (R1, R2, R3, R4, R5) are derived are measured.
Two grooves (M2, M3) formed on one surface of the spacer plate;
The two grooves (M4, M5) formed on the other surface of the spacer plate;
One groove (M2) formed on one surface of the spacer plate along the slit and disposed so as to protrude from the two grooves formed on the one surface;
A test fixture characterized by comprising: The test fixture according to claim 1 or 2, wherein electrical characteristics of the electronic device from which the six leads (R1, R2, R3, R4, R5, R6) are derived are measured.
Two grooves (M1, M3) formed on one surface of the spacer plate;
Two grooves (M4, M6) formed on the other surface of the spacer plate;
One groove (M2) formed on one surface of the spacer plate along the slit and disposed so as to protrude from the two grooves formed on the one surface;
One groove (M5) formed along the slit on the other surface of the spacer plate and disposed so as to protrude from the two grooves formed on the other surface;
A test fixture characterized by comprising:

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