JP4065004B2 - Electrolytic copper foil, surface-treated electrolytic copper foil obtained using the electrolytic copper foil, copper-clad laminate and printed wiring board using the surface-treated electrolytic copper foil - Google Patents
Electrolytic copper foil, surface-treated electrolytic copper foil obtained using the electrolytic copper foil, copper-clad laminate and printed wiring board using the surface-treated electrolytic copper foil Download PDFInfo
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本件発明は、電解銅箔、表面処理電解銅箔、該表面処理電解銅箔を用いた銅張積層板及びプリント配線板に関する。特に、その電解銅箔の絶縁層構成材料との張合わせ面が低プロファイルで高光沢を有している電解銅箔に関する。 The present invention relates to an electrolytic copper foil, a surface-treated electrolytic copper foil, a copper-clad laminate using the surface-treated electrolytic copper foil, and a printed wiring board. In particular, the present invention relates to an electrolytic copper foil having a low profile and high gloss on the surface of the electrolytic copper foil bonded to the insulating layer constituting material.
金属銅は電気の良導体であり比較的安価で取り扱いも容易であることから、電解銅箔はプリント配線板の基礎材料として広く使用されている。そして、プリント配線板が多用される電子及び電気機器には、小型化、軽量化等の所謂軽薄短小化が求められている。従来、このような電子及び電気機器の軽薄短小化を実現するためには、信号回路を可能な限りファインピッチ化した配線にする必要があり、製造者等はより薄い銅箔を採用してエッチングによって配線を形成する際のオーバーエッチングの設定時間を短縮し、形成する配線のエッチングファクターを向上させることで対応してきた。 Since copper metal is a good electrical conductor, is relatively inexpensive and easy to handle, electrolytic copper foil is widely used as a basic material for printed wiring boards. In addition, electronic and electrical devices in which printed wiring boards are frequently used are required to be so-called light and thin, such as miniaturization and weight reduction. Conventionally, in order to realize such a light, thin and small electronic and electrical device, it is necessary to make the signal circuit a wiring with a fine pitch as much as possible, and manufacturers etc. adopt etching using thinner copper foil. In order to cope with this problem, the setting time of over-etching when forming the wiring is shortened and the etching factor of the wiring to be formed is improved.
そして、小型化、軽量化される電子及び電気機器には、高機能化の要求も同時に行われている。従って、表面実装方式の普及によって限られた基板面積の中に可能な限り大きな部品実装面積を確保するためには、プリント配線板の配線のエッチングファクターを良好にする対応が必要とされてきた。その目的で、特にICチップ等の直接搭載を行う所謂インターポーザー基板であるテープ オートメーティド ボンディング(TAB)基板、チップ オン フィルム(COF)基板には、通常のプリント配線板用途以上の低プロファイル電解銅箔が求められてきた。なお、プロファイルとはプリント配線板用銅箔に関する規格において絶縁層形成材料との張合わせ界面である接着面(本件出願では以降「張合わせ界面」を用いず「接着面」に呼称を統一する)の表面粗さRzjisをJIS B 0601−2001に準拠してTD方向に測定した値で規定されるものであり、低プロファイルとは接着面の表面粗さRzjisが小さなことを意味している。 In addition, electronic and electrical devices that are reduced in size and weight are also demanded to be highly functional. Therefore, in order to secure a component mounting area as large as possible within a limited board area due to the spread of the surface mounting method, it has been necessary to take measures to improve the etching factor of the wiring of the printed wiring board. For this purpose, tape automated bonding (TAB) substrates and chip-on-film (COF) substrates, which are so-called interposer substrates that directly mount IC chips and the like, have low profile electrolysis that is more than the usual printed wiring board applications. Copper foil has been sought. Note that the profile is the adhesive surface that is the bonding interface with the insulating layer forming material in the standard for copper foil for printed wiring boards (in the present application, the term “bonding surface” will be unified without using the “bonding interface”) The surface roughness Rzjis is defined by a value measured in the TD direction in accordance with JIS B 0601-2001, and the low profile means that the surface roughness Rzjis of the bonded surface is small.
このような問題を解決すべく、特許文献1には未処理電解銅箔の析出面の表面粗度Rzが該未処理電解銅箔の光沢面の表面粗度Rzと同じか、それより小さい箔の析出面上に粗化処理を施して接着面とすることを特徴とする表面処理電解銅箔が開示されている。そして、前記未処理電解銅箔の製造には、メルカプト基を持つ化合物、塩化物イオン、分子量10000以下の低分子量膠及び高分子多糖類を添加した電解液を用いている。具体的にはメルカプト基を持つ化合物は3−メルカプト1−プロパンスルホン酸塩、低分子量膠の分子量は3000以下、そして高分子多糖類はヒドロキシエチルセルロースである。 In order to solve such a problem, Patent Document 1 discloses that the surface roughness Rz of the deposited surface of the untreated electrolytic copper foil is equal to or smaller than the surface roughness Rz of the glossy surface of the untreated electrolytic copper foil. A surface-treated electrolytic copper foil is disclosed in which a roughening treatment is performed on the deposited surface to form an adhesive surface. For the production of the untreated electrolytic copper foil, an electrolytic solution to which a compound having a mercapto group, chloride ions, a low molecular weight glue having a molecular weight of 10,000 or less and a high molecular weight polysaccharide are added is used. Specifically, the compound having a mercapto group is 3-mercapto 1-propanesulfonate, the molecular weight of the low molecular weight glue is 3000 or less, and the high molecular polysaccharide is hydroxyethyl cellulose.
また、特許文献2には、硫酸酸性銅めっき液の電気分解による電解銅箔の製造方法において、ジアリルジアルキルアンモニウム塩と二酸化硫黄との共重合体を含有する硫酸酸性銅めっき液を用いることを特徴とする電解銅箔の製造方法が開示されている。当該硫酸酸性銅めっき液には、ポリエチレングリコールと塩素と3−メルカプト−1−スルホン酸とを含有することが好ましいとされている。そして、絶縁基材との接着面とする析出面粗さが小さく、厚さ10μmの電解銅箔では十点平均粗さRzが1.0μm±0.5μm程度の低プロファイルが得られるとしている。 Moreover, in patent document 2, in the manufacturing method of the electrolytic copper foil by electrolysis of a sulfuric acid acidic copper plating solution, the sulfuric acid copper plating solution containing the copolymer of a diallyl dialkyl ammonium salt and sulfur dioxide is used. A method for producing an electrolytic copper foil is disclosed. The sulfuric acid copper plating solution preferably contains polyethylene glycol, chlorine and 3-mercapto-1-sulfonic acid. And the precipitation surface roughness used as an adhesive surface with an insulation base material is small, and it is supposed that the low profile whose 10-point average roughness Rz is about 1.0 micrometer +/- 0.5 micrometer will be obtained in the 10-micrometer-thick electrolytic copper foil.
そして、これらの製造方法を用いて電解銅箔を製造すると確かに低プロファイルの析出面が形成され、従来の低プロファイル電解銅箔としては良好な特性は有している。 And when an electrolytic copper foil is manufactured using these manufacturing methods, a low profile precipitation surface is surely formed, and the conventional low profile electrolytic copper foil has good characteristics.
一方、電子又は電気機器の代表であるパーソナルコンピュータのクロック周波数は上昇し、演算速度が飛躍的に速くなっている。そして、従来はコンピュータとしての本来の役割である単なるデータ処理に止まらず、コンピュータ自体をAV機器と同様に使用する機能も付加されている。すなわち、音楽再生機能だけではなく、DVDの録画再生機能、TV受像録画機能、テレビ電話機能等が次々に付加されている。 On the other hand, the clock frequency of a personal computer, which is representative of electronic or electric equipment, has increased, and the calculation speed has been dramatically increased. Conventionally, it is not limited to mere data processing, which is the original role as a computer, and a function of using the computer itself in the same manner as an AV device is added. That is, not only a music playback function but also a DVD recording / playback function, a TV image recording function, a videophone function, and the like are added one after another.
すなわち、パーソナルコンピュータのモニタは単なるデータモニタ機能を満足するだけでは不十分となっており、映画等の画像を表示しても長時間の視聴に耐えるだけの画質が要求されている。そして、このような品質のモニタを安価に且つ大量に供給することが求められている。現在の当該モニタには液晶モニタが多用されており、この液晶パネルのドライバ素子を搭載するには、前記テープ オートメーティド ボンディング(TAB)基板やチップ オン フィルム(COF)基板を用いるのが一般的である。そして、モニタのハイビジョン化を図るためには、走査線数の増加に見合うよう前記ドライバ基板にもよりファインな回路の形成が求められるようになる。そして、パネルサイズの大型化に伴って外縁部の幅を可能な限り狭くして製品寸法を抑える取り組みが為されている。ドライバを背面に配置するためにはTAB基板又はCOF基板を折り曲げて設置する必要があり、当初から屈曲性が良好であることも求められていた。そして、COFではTABと違ってファイン化されたボンディング用リード部分がフィルムで裏打ちされている。そのためにフィルムが無いTABに比べて屈曲性の点で不利となっており、従来以上に屈曲性の良好な材料を用いることが断線の防止に有効なのである。 That is, it is not sufficient for a monitor of a personal computer to satisfy a simple data monitoring function, and an image quality that can withstand long-time viewing is required even if an image such as a movie is displayed. And it is demanded to supply such quality monitors at low cost and in large quantities. A liquid crystal monitor is often used for the current monitor, and the tape automated bonding (TAB) substrate or the chip on film (COF) substrate is generally used to mount the driver element of the liquid crystal panel. It is. In order to achieve a high-definition monitor, it is required to form a finer circuit on the driver board to meet the increase in the number of scanning lines. As the panel size increases, efforts have been made to reduce the product dimensions by reducing the width of the outer edge as much as possible. In order to dispose the driver on the back surface, it is necessary to fold and install the TAB substrate or the COF substrate, and from the beginning, the flexibility is also required to be good. In the COF, unlike the TAB, a finer bonding lead portion is lined with a film. Therefore, it is disadvantageous in terms of flexibility compared to TAB without a film, and it is effective to prevent disconnection by using a material having better flexibility than before.
一方、車載用の電子回路ではハイブリッド化の普及と燃料電池車の開発に伴って大電流に対応せざるを得なくなってきている。車載用では必要とされる導体厚さが将来的にも200μmを超えると推測されているにもかかわらず、省スペースの観点からフレキシブル配線板として用いられる。このような厚い銅箔をフレキシブル基板に適用するためには当該銅箔の接着面粗さが小さいことが必須になり、従来の電解銅箔では対応できないとして圧延銅箔も検討されているのである。すなわち、従来の電解銅箔の場合には、厚さが厚くなるほど基材との接着面粗さが大きくなっていたからである。 On the other hand, in-vehicle electronic circuits have to cope with large currents due to the spread of hybridization and the development of fuel cell vehicles. Although it is estimated that the conductor thickness required for in-vehicle use will exceed 200 μm in the future, it is used as a flexible wiring board from the viewpoint of space saving. In order to apply such a thick copper foil to a flexible substrate, it is essential that the adhesive surface roughness of the copper foil is small, and rolled copper foil is also being considered as it cannot be handled by conventional electrolytic copper foil. . That is, in the case of the conventional electrolytic copper foil, the roughness of the adhesive surface with the base material increases as the thickness increases.
また、リチウムイオン電池用の負極集電体として使用する際にも表面が平滑な銅箔を用いることが好ましい。すなわち、銅箔上に活物質を塗工する際に、活物質含有スラリーを均一な塗膜厚で銅箔上に塗工するためには表面が平滑な銅箔を集電体として使用することが有利なのである。そして、当該負極活物質は、充放電時に膨張収縮を繰り返すため集電材としての銅箔の寸法変化も大きく、その膨張収縮に銅箔膨張収縮挙動が追随できず破断する現象が発生する。従って、集電材である銅箔の機械的な特性は、繰り返しの膨張収縮挙動に耐えるため、引張り強さと伸び率との良好なバランスが求められる。更に、銅箔上にキャパシタ用誘電体層をゾル−ゲル法で形成させる際にも、表面が平滑な銅箔を用いることは同様に有利である。 Moreover, when using as a negative electrode electrical power collector for lithium ion batteries, it is preferable to use copper foil with a smooth surface. That is, when applying an active material on a copper foil, a copper foil with a smooth surface should be used as a current collector in order to apply the active material-containing slurry onto the copper foil with a uniform coating thickness. Is advantageous. And since the said negative electrode active material repeats expansion and contraction at the time of charging / discharging, the dimensional change of the copper foil as a current collection material is also large, and the phenomenon that copper foil expansion and contraction behavior cannot follow the expansion and contraction occurs. Therefore, the mechanical properties of the copper foil as a current collector are required to have a good balance between tensile strength and elongation rate in order to withstand repeated expansion and contraction behavior. Further, when a capacitor dielectric layer is formed on a copper foil by a sol-gel method, it is also advantageous to use a copper foil having a smooth surface.
以上のように電解銅箔に対してはプリント配線板用途から市場の拡大が図られてきている。その結果、従来市場に供給されてきたプリント配線板用途の低プロファイル電解銅箔と比べて、450μm以下の厚さにおいて更に低プロファイルであり、屈曲性も良好な電解銅箔に対する要求の存在が明らかであった。 As described above, the market for electrolytic copper foil has been expanded from the use of printed wiring boards. As a result, it is clear that there is a need for an electrolytic copper foil that has a lower profile at a thickness of 450 μm or less and a good bendability compared to the low profile electrolytic copper foil for printed wiring boards that has been supplied to the market. Met.
上記背景から、本件発明者らは鋭意研究の結果、従来の電解銅箔生産技術と遜色のない生産性を持ち、且つ対応可能な厚さの上限も450μmを超える低プロファイル電解銅箔に想到したのである。 From the above background, as a result of earnest research, the present inventors have come up with a low profile electrolytic copper foil that has productivity comparable to that of conventional electrolytic copper foil production technology and the upper limit of the thickness that can be handled exceeds 450 μm. It is.
本件発明に係る電解銅箔: 本件発明に係る電解銅箔は、銅電解液を用いて電解法により得られるものであり、当該電解銅箔の析出面は、その表面粗さ(Rzjis)が1.0μm未満、光沢度[Gs(20°)]>光沢度[Gs(60°)]の関係を備え且つ光沢度[Gs(60°)]が400以上、及び幅方向で測定したTD光沢度[Gs(60°)]と流れ方向で測定したMD光沢度[Gs(60°)]との比([TD光沢度]/[MD光沢度])が0.9〜1.1の諸特性を備え、当該電解銅箔の光沢面は、その表面粗さ(Rzjis)が2.0μm未満であり、且つ、光沢度[Gs(60°)]が70以上であることを特徴とするものである。 Electrolytic copper foil according to the present invention: The electrolytic copper foil according to the present invention is obtained by an electrolytic method using a copper electrolyte, and the surface of the deposited copper foil has a surface roughness (Rzjis) of 1. Less than 0.0 μm, gloss [Gs (20 °)]> gloss [Gs (60 °)] and gloss [Gs (60 °)] of 400 or more , and TD gloss measured in the width direction [Gs (60 °)] and MD gloss measured at flow direction [Gs (60 °)] ratio of ([TD gloss] / [MD gloss]) is characteristics of 0.9 to 1.1 The glossy surface of the electrolytic copper foil has a surface roughness (Rzjis) of less than 2.0 μm and a glossiness [Gs (60 °)] of 70 or more. is there.
また、本件発明に係る電解銅箔の機械的特性の観点から見ると、前記電解銅箔は常態における引張り強さが33kgf/mm2以上、伸び率が5%以上の機械的特性を示す。 Further, from the viewpoint of the mechanical properties of the electrolytic copper foil according to the present invention, the electrolytic copper foil exhibits mechanical properties in which the tensile strength in a normal state is 33 kgf / mm 2 or more and the elongation is 5% or more.
更に、本件発明に係る電解銅箔は、加熱後(180℃×60分、大気雰囲気)の引張り強さが30kgf/mm2以上、加熱後(180℃×60分、大気雰囲気)の伸び率が8%以上の機械的特性を示す。 Furthermore, the electrolytic copper foil according to the present invention has a tensile strength of 30 kgf / mm 2 or more after heating (180 ° C. × 60 minutes, air atmosphere) and an elongation rate after heating (180 ° C. × 60 minutes, air atmosphere). It exhibits a mechanical property of 8% or more.
本件発明に係る表面処理電解銅箔: 本件発明に係る表面処理電解銅箔は、上述した電解銅箔の表面に防錆処理、シランカップリング剤処理のいずれか一種以上を行ったものである。 Surface-treated electrolytic copper foil according to the present invention: The surface-treated electrolytic copper foil according to the present invention is obtained by performing at least one of rust prevention treatment and silane coupling agent treatment on the surface of the above-described electrolytic copper foil.
そして、本件発明に係る表面処理電解銅箔の絶縁層構成材料との接着面の表面粗さ(Rzjis)は1.5μm以下であることが好ましい。 And it is preferable that the surface roughness (Rzjis) of an adhesive surface with the insulating-layer constituent material of the surface treatment electrolytic copper foil which concerns on this invention is 1.5 micrometers or less.
また、本件発明に係る表面処理電解銅箔の絶縁層構成材料との接着面として、光沢度[Gs(60°)]が250以上のものを用いることが好ましい。 Moreover, it is preferable to use a surface with the glossiness [Gs (60 °)] of 250 or more as an adhesive surface with the insulating layer constituting material of the surface-treated electrolytic copper foil according to the present invention.
更に、本件発明に係る表面処理電解銅箔において、前記表面処理電解銅箔の絶縁層構成材料との接着面側に粗化処理を施すことも好ましい。 Furthermore, in the surface-treated electrolytic copper foil according to the present invention, it is also preferable to subject the surface-treated electrolytic copper foil to a bonding surface side with the insulating layer constituting material.
そして、本件発明に係る表面処理電解銅箔の絶縁層構成材料との接着面には、上記電解銅箔の析出面を用いるのが好ましい。 And it is preferable to use the deposition surface of the said electrolytic copper foil for the adhesive surface with the insulating-layer constituent material of the surface treatment electrolytic copper foil which concerns on this invention.
本件発明に係る銅張積層板: 本件発明に係る銅張積層板は、前記表面処理電解銅箔と絶縁層構成材料とを張合わせて得られるものである。そして、本件発明に係る銅張積層板を構成する前記絶縁層構成材料が、骨格材を含有する場合にはリジッド銅張積層板となる。一方、本件発明に係る銅張積層板を構成する前記絶縁層構成材料が、可撓性を有するフレキシブル素材である場合にはフレキシブル銅張積層板となる。 Copper-clad laminate according to the present invention: The copper-clad laminate according to the present invention is obtained by bonding the surface-treated electrolytic copper foil and the insulating layer constituting material. And when the said insulating-layer constituent material which comprises the copper clad laminated board which concerns on this invention contains frame | skeleton material, it becomes a rigid copper clad laminated board. On the other hand, when the insulating layer constituting material constituting the copper clad laminate according to the present invention is a flexible material having flexibility, it becomes a flexible copper clad laminate.
本件発明に係るプリント配線板: 本件発明に係る表面処理電解銅箔を用いて、銅張積層板を得ることができ、この銅張積層板にエッチング加工を施すことにより、本件発明に係るプリント配線板が得られる。即ち、上述のリジッド銅張積層板を用いることでリジッドプリント配線板が得られる。そして、上述のフレキシブル銅張積層板を用いることでフレキシブルプリント配線板が得られる。 Printed wiring board according to the present invention: By using the surface-treated electrolytic copper foil according to the present invention, a copper-clad laminate can be obtained, and by etching the copper-clad laminate, the printed wiring according to the present invention is obtained. A board is obtained. That is, a rigid printed wiring board can be obtained by using the above-mentioned rigid copper clad laminate. And a flexible printed wiring board is obtained by using the above-mentioned flexible copper clad laminated board.
本件発明に係る電解銅箔は、従来市場に供給されてきた低プロファイル電解銅箔に比べ、更に良好な低プロファイル特性を備えている。この結果、本件発明に係る電解銅箔は、従来の低プロファイル電解銅箔を超える優れた光沢を有している。しかも、本件発明に係る電解銅箔は、電解銅箔としての厚さが増加するほど低プロファイル化が顕著となる。この傾向は、厚さが増加するほど高プロファイル化してしまう従来の電解銅箔とは正反対の性質である。 The electrolytic copper foil according to the present invention has better low profile characteristics than the low profile electrolytic copper foil that has been supplied to the market. As a result, the electrolytic copper foil according to the present invention has an excellent gloss exceeding that of the conventional low profile electrolytic copper foil. Moreover, in the electrolytic copper foil according to the present invention, as the thickness of the electrolytic copper foil increases, the profile reduction becomes more prominent. This tendency is a property opposite to that of a conventional electrolytic copper foil that has a higher profile as the thickness increases.
また、この電解銅箔が、現実に市場に供給される場合には、大気雰囲気による酸化防止、基材との密着性向上のために種々の表面処理が施され、一般的には表面処理電解銅箔として供給される。本件発明に係る電解銅箔を用いることで、このような表面処理が適正に施される限り、表面処理が施されてもなお、市場に流通する表面処理の施された低プロファイル電解銅箔を超える低プロファイル化が可能となる。 In addition, when this electrolytic copper foil is actually supplied to the market, various surface treatments are applied to prevent oxidation by the air atmosphere and to improve the adhesion to the base material. Supplied as copper foil. By using the electrolytic copper foil according to the present invention, as long as such a surface treatment is appropriately performed, even if the surface treatment is performed, the low profile electrolytic copper foil subjected to the surface treatment distributed in the market is used. Low profile exceeding can be achieved.
従って、本件発明に係る表面処理電解銅箔を銅張積層板に用いると、本件発明に係る表面処理電解銅箔で構成した導体層間に位置する絶縁層の厚さ均一性に優れ、薄い絶縁層を用いても短絡を起こすことなく層間の絶縁信頼性が飛躍的に向上する。特に、均一な粗化処理が行われれば、高周波対応の銅張積層板に好適となる。 Therefore, when the surface-treated electrolytic copper foil according to the present invention is used for a copper-clad laminate, the insulating layer located between the conductor layers composed of the surface-treated electrolytic copper foil according to the present invention has excellent thickness uniformity, and a thin insulating layer Even if the layer is used, the insulation reliability between layers is dramatically improved without causing a short circuit. In particular, if a uniform roughening treatment is performed, it is suitable for a copper clad laminate for high frequency.
更に、本件発明に係る銅張積層板を用いて、これをエッチング加工して得られるプリント配線板は、銅張積層板に用いた本件発明に係る表面処理電解銅箔の低プロファイル化が可能であるため、ファインピッチ回路の形成に好適である。 Furthermore, the printed wiring board obtained by etching the copper-clad laminate according to the present invention can reduce the profile of the surface-treated electrolytic copper foil according to the present invention used for the copper-clad laminate. Therefore, it is suitable for forming a fine pitch circuit.
[本件発明に係る電解銅箔の形態]
本件発明に係る電解銅箔の説明を行う前に、説明の理解が容易となるように、一般的な電解銅箔の製造方法に関して述べる。本件発明に係る「電解銅箔」とは、何ら表面処理を行っていない状態のものであり「未処理銅箔」、「析離箔」等と称されることがある。本件明細書では、これを単に「電解銅箔」と称する。この電解銅箔の製造には一般的に連続生産法が採用されており、ドラム形状をした回転陰極と、その回転陰極の形状に沿って対向配置された鉛系陽極又は寸法安定性陽極(DSA)との間に硫酸系銅電解液を流し、電解反応を利用して銅を回転陰極の表面に析出させ、この析出した銅を箔状態として回転陰極から連続して引き剥がして巻き取っている。このようにして得られた電解銅箔は、一定幅で巻き取られたロール状となるため、特性の測定などに際して方向を示すには回転陰極の回転方向(ウェブの長さ方向)をMD(Machine Direction)、MDに対して直角方向である幅方向をTD(Transverse Direction)と称する。
[Form of electrolytic copper foil according to the present invention]
Before explaining the electrolytic copper foil according to the present invention, a general method for producing an electrolytic copper foil will be described so that the explanation can be easily understood. The “electrolytic copper foil” according to the present invention is a state in which no surface treatment is performed, and is sometimes referred to as “untreated copper foil”, “deposited foil” or the like. In the present specification, this is simply referred to as “electrolytic copper foil”. In general, a continuous production method is adopted for the production of the electrolytic copper foil, and a drum-shaped rotating cathode and a lead-based anode or a dimensionally stable anode (DSA) arranged opposite to each other along the shape of the rotating cathode. ) With a sulfuric acid-based copper electrolyte solution between them, and using an electrolytic reaction, copper is deposited on the surface of the rotating cathode, and the deposited copper is continuously peeled off from the rotating cathode as a foil. . The electrolytic copper foil obtained in this way is in the form of a roll wound up with a constant width. Therefore, the direction of rotation of the rotating cathode (the length direction of the web) is set to MD ( Machine Direction), the width direction perpendicular to MD is referred to as TD (Transverse Direction).
この電解銅箔の回転陰極と接触した状態から引き剥がされた側の表面形状は研磨処理された回転陰極表面の形状が転写したものとなり、光沢を有することからこの面を「光沢面」と称してきた。これに対し、析出サイドであった側の表面形状は、通常は析出する銅の結晶成長速度が結晶面ごとに異なるために山形の凹凸形状を示しており、こちら側を「析出面」と称する。そして、一般的には、析出面の粗度が光沢面の粗度より大きく、電解銅箔に表面処理を施す際には析出面側に粗化処理を施すことが多く、この析出面側が銅張積層板を製造する際の絶縁層構成材料との張合わせ面となる。従って、この接着面の表面粗さが小さいほど優れた低プロファイルの表面処理電解銅箔となる。 The surface shape of the electrolytic copper foil that has been peeled off from the state in contact with the rotating cathode is a transfer of the shape of the polished rotating cathode surface, and this surface is called a “glossy surface” because it has gloss. I have done it. On the other hand, the surface shape on the side that was the precipitation side usually shows a mountain-shaped uneven shape because the crystal growth rate of precipitated copper differs for each crystal surface, and this side is referred to as a “deposition surface”. . In general, the roughness of the precipitation surface is greater than the roughness of the glossy surface, and when the electrolytic copper foil is subjected to surface treatment, the precipitation surface side is often subjected to a roughening treatment. It becomes a bonding surface with the insulating layer constituting material when the tension laminate is manufactured. Accordingly, the smaller the surface roughness of the bonded surface, the better the low profile surface-treated electrolytic copper foil.
このように電解銅箔には絶縁層構成材料との接着力を機械的なアンカー効果で補強するための粗化処理や酸化防止などの表面処理が施されて、市場を流通する電解銅箔が完成するのであるが、用途によっては粗化処理を施さずに使用する場合もある。次いで、以下に本件発明に係る電解銅箔について説明する。 In this way, the electrolytic copper foil is subjected to surface treatments such as roughening treatment and oxidation prevention to reinforce the adhesive strength with the insulating layer constituent material by mechanical anchor effect, and the electrolytic copper foil that circulates in the market is Although it is completed, it may be used without roughening depending on the application. Next, the electrolytic copper foil according to the present invention will be described below.
本件発明に係る電解銅箔は、その析出面側及び光沢面側それぞれの面の表面粗さ及び光沢度に特徴を有する。その析出面側には、(1)その析出面の表面粗さ(Rzjis)が1.0μm未満であること、(2)その析出面が光沢度[Gs(20°)]>光沢度[Gs(60°)]の関係を備え且つ光沢度[Gs(60°)]が400以上であること、(3)その析出面の幅方向で測定したTD光沢度[Gs(60°)]と流れ方向で測定したMD光沢度[Gs(60°)]との比([TD光沢度]/[MD光沢度])が0.9〜1.1の範囲にあること、以上3つの特徴を兼ね備える。そして、その光沢面側には、(A)その光沢面の表面粗さ(Rzjis)が2.0μm未満であること、(B)その光沢面の光沢度[Gs(60°)]が70以上であること、以上2つの特徴を兼ね備える。以下、これらの各特性に関して説明する。 The electrolytic copper foil according to the present invention is characterized by the surface roughness and the glossiness of the respective surfaces of the precipitation surface and the gloss surface. On the deposition surface side, (1) the surface roughness (Rzjis) of the deposition surface is less than 1.0 μm, and (2) the deposition surface is glossy [Gs (20 °)]> glossiness [Gs (60 °)] and the glossiness [Gs (60 °)] is 400 or more, (3) TD glossiness [Gs (60 °)] measured in the width direction of the precipitation surface and flow The ratio ([TD glossiness] / [MD glossiness]) to the MD glossiness [Gs (60 °)] measured in the direction is in the range of 0.9 to 1.1, and has the above three characteristics. . On the glossy surface side, (A) the surface roughness (Rzjis) of the glossy surface is less than 2.0 μm, and (B) the glossiness [Gs (60 °)] of the glossy surface is 70 or more. It has the above two characteristics. Hereinafter, each of these characteristics will be described.
析出面側の表面特性: 本件発明に係る電解銅箔の析出面は、表面粗さ(Rzjis)が1.0μm未満、より好ましくは、表面粗さ(Rzjis)は0.6μm未満という特性を備えることが好ましい。当該析出面の表面粗さ(Rzjis)が1.0μm未満になると、表面粗さ1.0μm以上の析出面と比べて、微細回路の形成能が飛躍的に高くなる。そして、当該表面粗さ(Rzjis)が0.6μm未満となると、微細回路のエッチングファクターが飛躍的に高くなる。ここでは析出面側の表面粗さ(Rzjis)の下限値を限定していない。しかし、測定器の感度にもよるが、経験的に表面粗さの下限値は0.1μm程度である。但し、実際の測定においては、バラツキが見られ、保証できる測定値としての下限は0.2μm程度であると考える。 Surface characteristics on the deposition surface side: The deposition surface of the electrolytic copper foil according to the present invention has a characteristic that the surface roughness (Rzjis) is less than 1.0 μm, more preferably, the surface roughness (Rzjis) is less than 0.6 μm. It is preferable. When the surface roughness (Rzjis) of the deposition surface is less than 1.0 μm, the ability to form a fine circuit is remarkably increased as compared with a deposition surface having a surface roughness of 1.0 μm or more. When the surface roughness (Rzjis) is less than 0.6 μm, the etching factor of the fine circuit is remarkably increased. Here, the lower limit value of the surface roughness (Rzjis) on the precipitation surface side is not limited. However, although depending on the sensitivity of the measuring instrument, the lower limit of the surface roughness is empirically about 0.1 μm. However, in actual measurement, variation is seen, and the lower limit of the measurement value that can be guaranteed is about 0.2 μm.
一般的に、電解銅箔の析出面の平滑性の評価には表面粗さRzjisの値が、粗さの指標として用いられてきた。しかしながら、Rzjisだけでは高さ方向の凹凸情報しか得られず、凹凸の周期やうねりと言った情報を得ることができない。これに対して、光沢度は、両者の情報を反映したパラメータであり、Rzjisと併用することで表面の粗さ周期、うねり、それらの面内での均一性等の種々のパラメータを総合して判断することができると考えた。 In general, the value of the surface roughness Rzjis has been used as an index of roughness for evaluating the smoothness of the deposited surface of the electrolytic copper foil. However, with Rzjis alone, only the unevenness information in the height direction can be obtained, and information such as the unevenness period and waviness cannot be obtained. On the other hand, the glossiness is a parameter reflecting both information. By using it together with Rzjis, various parameters such as the roughness cycle of the surface, the undulation, and the uniformity within the surface are combined. I thought it was possible to judge.
従って、本件発明に係る電解銅箔の析出面は、光沢度[Gs(60°)]が400以上という特性を備えることが好ましい。そして、光沢度[Gs(60°)]は600以上であることがより好ましい。上記表面粗さの範囲にあり、当該光沢度[Gs(60°)]が400以上あれば、表面のうねりが極めて小さい電解銅箔と言え、微細回路の形成に有利となる。また、当該光沢度[Gs(60°)]は600以上になれば、微細回路の形成能が飛躍的に安定する。ここでは、光沢度の上限値を定めていないが、経験的に判断して[Gs(60°)]で780程度が上限となる。ここで、[Gs(60°)]の光沢度とは、電解銅箔の表面に入射角60°で測定光を照射し、反射角60°で跳ね返った光の強度を測定したものである。ここで言う入射角は、光の照射面に対する垂直方向を0°としている。そして、JIS Z 8741−1997によれば、入射角の異なる5つの鏡面光沢度測定方法が記載されており、試料の光沢度に応じて最適な入射角を選択すべきとされている。中でも、入射角を60°とすることで低光沢度の試料から高光沢度の試料まで幅広く測定可能であるとされている。従って、本件発明に係る電解銅箔の光沢度測定に、主として60°を採用した。なお、本件発明における光沢度は、日本電色工業株式会社製光沢計VG−2000型を用い、光沢度の測定方法であるJIS Z 8741−1997に準拠して測定した。 Therefore, it is preferable that the precipitation surface of the electrolytic copper foil according to the present invention has a glossiness [Gs (60 °)] of 400 or more. The glossiness [Gs (60 °)] is more preferably 600 or more. If the glossiness [Gs (60 °)] is 400 or more within the surface roughness range, it can be said to be an electrolytic copper foil with extremely small surface waviness, which is advantageous for forming a fine circuit. If the glossiness [Gs (60 °)] is 600 or more, the ability to form a fine circuit is dramatically stabilized. Here, the upper limit value of the glossiness is not defined, but an upper limit is about 780 in [Gs (60 °)] judging from experience. Here, the glossiness of [Gs (60 °)] is obtained by measuring the intensity of light bounced at a reflection angle of 60 ° by irradiating the surface of the electrolytic copper foil with measurement light at an incident angle of 60 °. The incident angle referred to here is 0 ° in the direction perpendicular to the light irradiation surface. According to JIS Z 8741-1997, five specular gloss measurement methods having different incident angles are described, and an optimal incident angle should be selected according to the gloss of the sample. In particular, it is said that by setting the incident angle to 60 °, it is possible to measure a wide range of samples from low gloss samples to high gloss samples. Therefore, 60 ° was mainly adopted for the glossiness measurement of the electrolytic copper foil according to the present invention. In addition, the glossiness in this invention was measured based on JIS Z8741-1997 which is a measuring method of glossiness using the Nippon Denshoku Industries Co., Ltd. gloss meter VG-2000 type.
以上に述べてきた表面粗さと光沢度とは、一定の関連性があるため、両者を同時に管理して考えることが、低プロファイル銅箔の低プロファイル化品質を表す上で有用である。このように考えれば、本件発明に係る電解銅箔の場合、析出面側の表面粗さ(Rzjis)が1.0μm未満であり、且つ、当該析出面の光沢度[Gs(60°)]が400以上であるという条件を同時に満たす電解銅箔として把握することが好ましい。この表面粗さと光沢度とのみに着目してみても、このレベルの表面粗さと光沢度とを兼ね備えた電解銅箔は、市場に存在しなかった。そして、より高品質の微細回路の形成を容易にするためには、表面粗さ(Rzjis)が0.6μm未満であり、且つ、光沢度[Gs(60°)]は700以上の析出面を備える電解銅箔を採用することが好ましい。
の提供も可能となる。
Since the surface roughness and the glossiness described above have a certain relation, it is useful to manage both at the same time to express the low profile quality of the low profile copper foil. In view of this, in the case of the electrolytic copper foil according to the present invention, the surface roughness (Rzjis) on the deposition surface side is less than 1.0 μm, and the glossiness [Gs (60 °)] of the deposition surface is It is preferable to grasp as an electrolytic copper foil that simultaneously satisfies the condition of 400 or more. Even if attention is paid only to the surface roughness and the glossiness, there is no electrolytic copper foil on the market that has this level of surface roughness and the glossiness. In order to facilitate the formation of higher quality fine circuits, the surface roughness (Rzjis) is less than 0.6 μm and the gloss [Gs (60 °)] is 700 or more. It is preferable to employ the electrolytic copper foil provided.
Can also be provided.
また、本件発明に係る電解銅箔は、前記析出面側の光沢度[Gs(60°)]を、幅方向で測定したTD光沢度と、流れ方向で測定したMD光沢度とに分けて捉えた。電解銅箔は、陰極である回転ドラムの表面にある研磨スジ等の影響により、幅方向(TD)と流れ方向(MD)との機械的特性が異なるというのが一般通念である。しかし、本件発明に係る電解銅箔は、[TD光沢度]/[MD光沢度]の値が、0.9〜1.1の範囲、変化幅として10%以内となる。即ち、幅方向と流れ方向との光沢度の差が非常に小さいことは、TD方向とMD方向との表面形状のバラツキが極めて小さな事を意味している。そのため、電解銅箔を用いて銅張積層板として、エッチング加工して、TD方向に走る回路とMD方向に走る回路とを製造してもエッチング特性に変化が無いため、エッチング特性の方向依存性を考慮する必要が無くなる。 In the electrolytic copper foil according to the present invention, the glossiness [Gs (60 °)] on the deposition surface side is divided into TD glossiness measured in the width direction and MD glossiness measured in the flow direction. It was. It is a general idea that the electrolytic copper foil has different mechanical properties in the width direction (TD) and the flow direction (MD) due to the influence of polishing stripes on the surface of the rotating drum as the cathode. However, in the electrolytic copper foil according to the present invention, the value of [TD glossiness] / [MD glossiness] is in the range of 0.9 to 1.1, and the variation range is within 10%. That is, the very small difference in glossiness between the width direction and the flow direction means that the variation in the surface shape between the TD direction and the MD direction is extremely small. Therefore, even if a circuit that runs in the TD direction and a circuit that runs in the MD direction is manufactured as a copper-clad laminate using electrolytic copper foil, etching characteristics do not change, so the direction dependency of the etching characteristics Need not be considered.
更に言えば、外観上の差異がTD方向及びMD方向に無いと言うことは、均一な電解が出来ており、結晶組織的に見ても均一であることを意味している。即ち、TD方向及びMD方向による引張り強さ及び伸び率等の機械的特性差も小さくなることを意味している。このように電解銅箔のTD方向とMD方向とで、機械特性の差が小さいと、プリント配線板を製造する際の銅箔の方向性の影響を受ける基板の寸法変化率や回路の直線性等に与える影響が小さくなるため好ましい。ちなみに、表面が平滑である銅箔の代表ともいえる圧延銅箔の場合には、その加工方法に起因してTD方向とMD方向との機械的特性が異なることが広く知られている。その結果、本件発明が想定している用途であるフィルムキャリアテープ市場、薄物リジッドプリント配線板等において寸法変化率が大きく、ファインパターン用途には不適であるとの評価がほぼ定着している。 Furthermore, the fact that there is no difference in appearance in the TD direction and the MD direction means that uniform electrolysis has been performed and that the crystal structure is uniform. That is, it means that mechanical property differences such as tensile strength and elongation in the TD direction and MD direction are also reduced. Thus, if the difference in mechanical properties between the TD direction and the MD direction of the electrolytic copper foil is small, the dimensional change rate of the substrate and the linearity of the circuit affected by the directivity of the copper foil when manufacturing a printed wiring board. This is preferable because the influence on the above is reduced. Incidentally, in the case of a rolled copper foil that can be said to be a representative copper foil with a smooth surface, it is widely known that the mechanical properties in the TD direction and the MD direction differ due to the processing method. As a result, the rate of dimensional change is large in the film carrier tape market, thin rigid printed wiring boards, and the like, which are the applications envisaged by the present invention, and the evaluation of being unsuitable for fine pattern applications is almost firmly established.
また、本件発明に係る電解銅箔の場合、光沢度として[Gs(20°)]と[Gs(60°)]とを用いることにより、従来の低プロファイル電解銅箔との差異を、より明瞭に捉えることが出来る。本件発明に係る電解銅箔は、前記析出面側が、光沢度[Gs(20°)]>光沢度[Gs(60°)]の関係を備えている。通常は、同じ物質であれば、一つの入射角度を選択して光沢度を評価すれば十分と考えられる。しかし、同じ物質であっても入射角に応じて反射率が異なる場合がある。例えば、被測定表面に凹凸がある場合に、入射角を変化させれば、この凹凸のレベルに応じて、反射光の空間分布が変化して、光沢度に差が生じる。このような考え方を基に、本件発明者等が電解銅箔の表面の光沢度測定を行い検討した結果、次の傾向があることを、経験則として見いだした。即ち、高光沢且つ低表面粗さの電解銅箔の場合には、光沢度[Gs(20°)]>光沢度[Gs(60°)]>光沢度[Gs(85°)]の関係が成立する。そして、低光沢且つ低表面粗さの電解銅箔の場合には、光沢度[Gs(60°)]>光沢度[Gs(20°)]>光沢度[Gs(85°)]の関係が成立する。更に、無光沢且つ低表面粗さの電解銅箔の場合には、光沢度[Gs(85°)]>光沢度[Gs(60°)]>光沢度[Gs(20°)]の関係が成立する。従って、一定の入射角による光沢度の値の他に、異なる入射角での光沢度の値との関係をもって、電解銅箔の平滑性の指標とすることが有用と判断できる。 Moreover, in the case of the electrolytic copper foil which concerns on this invention, the difference with the conventional low profile electrolytic copper foil is clearer by using [Gs (20 degrees)] and [Gs (60 degrees)] as glossiness. Can be caught. As for the electrolytic copper foil which concerns on this invention, the said precipitation surface side is equipped with the relationship of glossiness [Gs (20 degrees)]> glossiness [Gs (60 degrees)]. Usually, for the same material, it is considered sufficient to select one incident angle and evaluate the glossiness. However, even with the same material, the reflectance may vary depending on the incident angle. For example, when the surface to be measured has irregularities, if the incident angle is changed, the spatial distribution of reflected light changes according to the level of the irregularities, resulting in a difference in glossiness. Based on this concept, the inventors of the present invention measured the glossiness of the surface of the electrolytic copper foil and examined it. As a result, they found that the following tendencies exist. That is, in the case of an electrolytic copper foil having high gloss and low surface roughness, there is a relationship of gloss [Gs (20 °)]> gloss [Gs (60 °)]> gloss [Gs (85 °)]. To establish. In the case of an electrolytic copper foil having low gloss and low surface roughness, there is a relationship of gloss [Gs (60 °)]> gloss [Gs (20 °)]> gloss [Gs (85 °)]. To establish. Further, in the case of an electrolytic copper foil having a dull and low surface roughness, there is a relationship of gloss [Gs (85 °)]> gloss [Gs (60 °)]> gloss [Gs (20 °)]. To establish. Therefore, it can be judged that it is useful to use as an index of the smoothness of the electrolytic copper foil in relation to the glossiness value at different incident angles in addition to the glossiness value at a constant incident angle.
光沢面側の表面特性: そして、本件発明に係る電解銅箔の場合、その光沢面の表面状態も重要となる。この光沢面には、本件発明に係る電解銅箔の析出面に近いレベルの表面粗さ(Rzjis)及び光沢度[Gs(60°)]が求められる。即ち、本件発明に係る電解銅箔の場合、その光沢面は、その表面粗さ(Rzjis)が2.0μm未満であり、且つ、光沢度[Gs(60°)]が70以上であることが好ましい。そして、より好ましくは、表面粗さ(Rzjis)が1.7μm未満、光沢度[Gs(60°)]が100以上であることが望ましい。当該光沢面の光沢度[Gs(60°)]の上限値は規定していないが、経験的に言えば500位である。以上に述べてきた析出面の表面状態を表す各特性を得るためには、光沢面がここで言う表面状態を備えるものとして製造する事が好ましい。この条件を外れると、TD方向及びMD方向での表面状態に差が生じやすく、TD方向及びMD方向での引張り強さ及び伸び率等の機械的特性差も生じやすくなる。この光沢面の表面状態は、その電析面である陰極の表面状態の転写であり、陰極の表面状態により定まる。従って、特に薄い電解銅箔を製造するときは、陰極表面に表面粗さ(Rzjis)が2.0μm未満という特性が求められる。 Surface characteristics on the glossy surface side : In the case of the electrolytic copper foil according to the present invention, the surface state of the glossy surface is also important. The glossy surface is required to have a level of surface roughness (Rzjis) and glossiness [Gs (60 °)] close to the deposited surface of the electrolytic copper foil according to the present invention. That is, in the case of the electrolytic copper foil according to the present invention, the glossy surface thereof has a surface roughness (Rzjis) of less than 2.0 μm and a glossiness [Gs (60 °)] of 70 or more. preferable. More preferably, the surface roughness (Rzjis) is less than 1.7 μm and the glossiness [Gs (60 °)] is 100 or more. Although the upper limit of the glossiness [Gs (60 °)] of the glossy surface is not specified, it is empirically about 500. In order to obtain each characteristic representing the surface state of the precipitation surface described above, it is preferable to manufacture the glossy surface as having the surface state referred to herein. If this condition is not satisfied, a difference in the surface state in the TD direction and the MD direction tends to occur, and mechanical characteristics such as tensile strength and elongation in the TD direction and MD direction also tend to occur. The surface state of the glossy surface is a transfer of the surface state of the cathode, which is the electrodeposited surface, and is determined by the surface state of the cathode. Therefore, when manufacturing a thin electrolytic copper foil, the cathode surface is required to have a surface roughness (Rzjis) of less than 2.0 μm.
電解銅箔の機械的特性: 本件発明に係る電解銅箔の機械的特性は、常態における引張り強さが33kgf/mm2以上、伸び率が5%以上となる。そして、加熱後(180℃×60分、大気雰囲気)では引張り強さが30kgf/mm2以上、伸び率が8%以上であることが好ましい。 Mechanical properties of the electrolytic copper foil: As for the mechanical properties of the electrolytic copper foil according to the present invention, the tensile strength in a normal state is 33 kgf / mm 2 or more and the elongation is 5% or more. And after heating (180 degreeC x 60 minutes, air atmosphere), it is preferable that tensile strength is 30 kgf / mm < 2 > or more and elongation rate is 8% or more.
そして、本件発明においては、製造条件を最適化することにより、常態の引張り強さが38kgf/mm2以上、加熱後(180℃×60分、大気雰囲気)の引張り強さが33kgf/mm2以上という、より優れた機械的特性を備えるものとできる。従って、この良好な機械的特性は、フレキシブルプリント配線板の折り曲げ使用にも十分に耐えうるものであり、膨張収縮挙動を受けるリチウムイオン二次電池等の負極を構成する集電材用途にも好適である。 And in this invention, by optimizing manufacturing conditions, normal tensile strength is 38 kgf / mm 2 or more, and tensile strength after heating (180 ° C. × 60 minutes, air atmosphere) is 33 kgf / mm 2 or more. It can be said to have more excellent mechanical properties. Therefore, this good mechanical property can sufficiently withstand bending use of a flexible printed wiring board, and is also suitable for a current collector material constituting a negative electrode such as a lithium ion secondary battery that undergoes expansion and contraction behavior. is there.
以上に述べてきた本件発明に係る電解銅箔に関して、厚さの限定は行っていない。何故なら、後述する製造方法を用いる限り、電解銅箔の厚さを厚く製造するほど、当該析出面の粗度が小さく、光沢度も上昇すると言う傾向があるからである。この傾向が発揮される電解銅箔の上限の限界厚さを敢えて述べるとすれば、工業的に電解銅箔の製造において経済性を損なわない限度である450μm程度であると考える。従って、一般的な電解銅箔の厚さ概念として、3μm〜450μmの範囲と理解すれば足りる。なお、3μm未満の場合は、キャリア箔付電解銅箔として市場に供給することが好ましい。 The thickness of the electrolytic copper foil according to the present invention described above is not limited. This is because, as long as the manufacturing method described later is used, as the thickness of the electrolytic copper foil is increased, the roughness of the deposited surface tends to decrease and the glossiness tends to increase. If the limit thickness of the upper limit of the electrolytic copper foil in which this tendency is exhibited is dared to be described, it is considered to be about 450 μm, which is a limit that does not impair the economical efficiency in the production of electrolytic copper foil industrially. Therefore, it is sufficient to understand that the thickness of the general electrolytic copper foil is in the range of 3 μm to 450 μm. In addition, when it is less than 3 μm, it is preferable to supply it to the market as an electrolytic copper foil with a carrier foil.
[本件発明に係る表面処理電解銅箔の形態]
本件発明に係る表面処理電解銅箔は、上述した電解銅箔の表面に防錆処理、シランカップリング剤処理のいずれか一種以上を行った表面処理電解銅箔である。この防錆処理は、銅張積層板及びプリント配線板の製造過程で支障をきたすことの無いよう、電解銅箔の表面が酸化腐食することを防止するためのものである。そして、絶縁層構成材料との密着性を阻害せず、可能であれば当該密着性を向上させるものであれば、より好ましい。防錆処理に用いられる方法は、ベンゾトリアゾール、イミダゾール等を用いる有機防錆、若しくは亜鉛、クロメート、亜鉛合金等を用いる無機防錆のいずれか又は両者を、使用目的によって任意に組み合わせて用いる。
[Form of surface-treated electrolytic copper foil according to the present invention]
The surface-treated electrolytic copper foil according to the present invention is a surface-treated electrolytic copper foil obtained by performing at least one of rust prevention treatment and silane coupling agent treatment on the surface of the above-described electrolytic copper foil. This rust prevention treatment is for preventing the surface of the electrolytic copper foil from being oxidatively corroded so as not to hinder the manufacturing process of the copper clad laminate and the printed wiring board. And it is more preferable if the adhesiveness with an insulating layer constituent material is not inhibited and the adhesiveness is improved if possible. As the method used for the rust prevention treatment, either organic rust prevention using benzotriazole, imidazole or the like, or inorganic rust prevention using zinc, chromate, zinc alloy or the like, or any combination thereof is used depending on the purpose of use.
次に、防錆処理層を形成する方法に関して説明する。有機防錆の場合は、有機防錆剤の溶液を浸漬塗布、シャワーリング塗布、電着法等の手法を採用して形成することが可能となる。無機防錆の場合は、防錆元素を電解銅箔の表面上に電解析出させる方法、その他いわゆる置換析出法等を用いることが可能である。例えば、亜鉛防錆処理を行うときには、ピロ燐酸亜鉛めっき浴、シアン化亜鉛めっき浴、硫酸亜鉛めっき浴等を用いることが可能である。例えば、ピロ燐酸亜鉛めっき浴であれば、濃度は亜鉛5g/l〜30g/l、ピロ燐酸カリウム50g/l〜500g/l、液温20℃〜50℃、pH9〜12、電流密度0.3A/dm2〜10A/dm2の条件とする等である。 Next, a method for forming a rust prevention treatment layer will be described. In the case of organic rust prevention, it becomes possible to form a solution of an organic rust prevention agent by employing techniques such as dip coating, showering coating, and electrodeposition. In the case of inorganic rust prevention, a method of electrolytically depositing a rust-preventive element on the surface of the electrolytic copper foil, other so-called substitution deposition methods, and the like can be used. For example, when the zinc rust prevention treatment is performed, a zinc pyrophosphate plating bath, a zinc cyanide plating bath, a zinc sulfate plating bath, or the like can be used. For example, in the case of a zinc pyrophosphate plating bath, the concentrations are 5 g / l to 30 g / l zinc, 50 g / l to 500 g / l potassium pyrophosphate, liquid temperature 20 ° C. to 50 ° C., pH 9 to 12, and current density 0.3A. / Dm 2 to 10 A / dm 2 .
そして、シランカップリング剤処理とは、防錆処理が終了した後に、絶縁層構成材料との密着性を化学的に向上させるための処理である。このシランカップリング剤処理に用いるシランカップリング剤は、特に限定を要するものではなく、使用する絶縁層構成材料、プリント配線板製造工程で使用するめっき液等の性状を考慮して、任意に選択使用する。例えば、エポキシ系シランカップリング剤、アミノ系シランカップリング剤、メルカプト系シランカップリング剤等から任意に選択使用することが可能である。そして、シランカップリング剤処理は、シランカップリング剤の溶液を浸漬塗布、シャワーリング塗布、電着法等の手法を採用して実施することができる。 And a silane coupling agent process is a process for improving the adhesiveness with an insulating-layer constituent material chemically after a rust prevention process is complete | finished. The silane coupling agent used in this silane coupling agent treatment is not particularly limited, and is arbitrarily selected in consideration of the properties of the insulating layer constituent material to be used, the plating solution used in the printed wiring board manufacturing process, etc. use. For example, it can be arbitrarily selected from an epoxy silane coupling agent, an amino silane coupling agent, a mercapto silane coupling agent, and the like. And a silane coupling agent process can employ | adopt methods, such as dip coating, showering application | coating, and an electrodeposition method, for the solution of a silane coupling agent.
より具体的には、使用可能なシランカップリング剤を列挙すると、プリント配線板製造用のプリプレグのガラスクロスに用いられると同様のカップリング剤を中心に、ビニルトリメトキシシラン、ビニルフェニルトリメトキシラン、γ−メタクリロキシプロピルトリメトキシシラン、γ−グリシドキシプロピルトリメトキシシラン、4−グリシジルブチルトリメトキシシラン、γ−アミノプロピルトリエトキシシラン、N−β(アミノエチル)γ−アミノプロピルトリメトキシシラン、N−3−(4−(3−アミノプロポキシ)プトキシ)プロピル−3−アミノプロピルトリメトキシシラン、イミダゾールシラン、トリアジンシラン、γ−メルカプトプロピルトリメトキシシラン等を用いることが可能である。 More specifically, silane coupling agents that can be used are enumerated, and vinyl trimethoxysilane, vinylphenyltrimethoxysilane are mainly used for coupling agents similar to those used for prepreg glass cloth for manufacturing printed wiring boards. , Γ-methacryloxypropyltrimethoxysilane, γ-glycidoxypropyltrimethoxysilane, 4-glycidylbutyltrimethoxysilane, γ-aminopropyltriethoxysilane, N-β (aminoethyl) γ-aminopropyltrimethoxysilane N-3- (4- (3-aminopropoxy) ptoxy) propyl-3-aminopropyltrimethoxysilane, imidazolesilane, triazinesilane, γ-mercaptopropyltrimethoxysilane, and the like can be used.
そして、前記表面処理電解銅箔の絶縁層構成材料との接着面の表面粗さ(Rzjis)は1.5μm以下の低プロファイルであることが好ましい。当該接着面の表面粗さが、この範囲に調整されていることにより、ファインピッチ回路形成に適した表面処理銅箔となる。 And it is preferable that the surface roughness (Rzjis) of the adhesive surface with the insulating-layer constituent material of the said surface treatment electrolytic copper foil is a low profile of 1.5 micrometers or less. By adjusting the surface roughness of the adhesion surface within this range, a surface-treated copper foil suitable for fine pitch circuit formation is obtained.
また、前記表面処理電解銅箔は、絶縁層構成材料との接着面の光沢度[Gs(60°)]が250以上であることが好ましい。表面処理の前後で、表面粗さの変化が検出されないレベルの表面処理を施しても、防錆被膜やシランカップリング剤被膜が形成されるため、光の反射率としては変化するのが通常である。このとき、電解銅箔を表面処理して得られる表面処理電解銅箔の接着面で得られる光沢度[Gs(60°)]が250以上であれば、表面処理により形成した防錆層等の各被膜が適正な厚さで形成されていると判断できるのである。 Moreover, it is preferable that the surface treatment electrolytic copper foil has a glossiness [Gs (60 °)] of an adhesion surface with the insulating layer constituting material of 250 or more. Even if a surface treatment is applied at a level where no change in surface roughness is detected before and after the surface treatment, an anticorrosive film or silane coupling agent film is formed, so the light reflectance usually changes. is there. At this time, if the glossiness [Gs (60 °)] obtained on the adhesive surface of the surface-treated electrolytic copper foil obtained by surface-treating the electrolytic copper foil is 250 or more, such as a rust preventive layer formed by the surface treatment It can be determined that each coating is formed with an appropriate thickness.
そして、前記表面処理電解銅箔の絶縁層構成材料との接着面は、粗化処理を施してあることも好ましい。粗化処理は公知技術を適用できるものであって、その粗化処理手段に関して、特段の限定はない。粗化処理を施す方法を例示すると、電解銅箔の表面に微細金属粒を付着形成させるか、エッチング法で粗化表面を形成するか、いずれかの方法が採用される。 And it is also preferable that the adhesion surface with the insulating-layer constituent material of the said surface treatment electrolytic copper foil has performed the roughening process. A known technique can be applied to the roughening treatment, and the roughening treatment means is not particularly limited. As an example of a method for performing the roughening treatment, either a method in which fine metal particles are adhered to the surface of the electrolytic copper foil or a roughened surface is formed by an etching method is employed.
ここで、前者の微細金属粒を付着形成する方法として、銅微細粒を表面に付着形成する方法に関して例示しておく。この粗化処理工程は、電解銅箔の表面上に微細銅粒を析出付着させる工程と、この微細銅粒の脱落を防止するための被せめっき工程とで構成される。 Here, as the former method of depositing and forming fine metal particles, a method of depositing and forming copper fine particles on the surface will be exemplified. This roughening treatment step includes a step of depositing and adhering fine copper particles on the surface of the electrolytic copper foil, and a covering plating step for preventing the fine copper particles from falling off.
電解銅箔の表面上に微細銅粒を析出付着させる工程では、電解条件にヤケめっきの条件が採用される。従って、一般的に微細銅粒を析出付着させる工程で用いる溶液濃度は、ヤケめっき条件を作り出しやすいよう、低い濃度とする。このヤケめっき条件は、特に限定されるものではなく、生産ラインの特質等を考慮して定める。例えば、硫酸銅系溶液を用いるのであれば、銅濃度が5〜20g/l、フリー硫酸濃度が50〜200g/l、その他必要に応じた添加剤(α−ナフトキノリン、デキストリン、膠、チオ尿素等)、液温15〜40℃、電流密度10〜50A/dm2の条件とする等である。 In the step of depositing and adhering fine copper particles on the surface of the electrolytic copper foil, the condition of burnt plating is adopted as the electrolysis condition. Therefore, the solution concentration used in the step of depositing and attaching fine copper particles is generally set to a low concentration so that the burn plating conditions can be easily created. The burn plating conditions are not particularly limited, and are determined in consideration of the characteristics of the production line. For example, if a copper sulfate solution is used, the copper concentration is 5 to 20 g / l, the free sulfuric acid concentration is 50 to 200 g / l, and other additives (α-naphthoquinoline, dextrin, glue, thiourea, etc.) ), Liquid temperature of 15 to 40 ° C., current density of 10 to 50 A / dm 2 , and the like.
そして、微細銅粒の脱落を防止するための被せめっき工程は、平滑めっき条件を用いて、微細銅粒を被覆するように銅を均一析出させるための工程である。従って、電解銅箔の製造工程で用いると同様の銅電解液を銅イオンの供給源とできる。この平滑めっき条件は、特に限定されるものではなく、生産ラインの特質を考慮して定める。例えば、硫酸銅系溶液を用いるのであれば、濃度が銅50〜80g/l、フリー硫酸50〜150g/l、液温40〜50℃、電流密度10〜50A/dm2の条件とする等である。 The covering plating step for preventing the fine copper particles from falling off is a step for uniformly depositing copper so as to cover the fine copper particles using smooth plating conditions. Therefore, when it is used in the manufacturing process of the electrolytic copper foil, the same copper electrolyte can be used as a source of copper ions. The smooth plating conditions are not particularly limited and are determined in consideration of the characteristics of the production line. For example, if a copper sulfate-based solution is used, the concentration is 50 to 80 g / l copper, free sulfuric acid 50 to 150 g / l, liquid temperature 40 to 50 ° C., and current density 10 to 50 A / dm 2. is there.
以上に述べた粗化処理による粗化レベルは、防錆層の種類との組み合わせ、張り合わせる基材樹脂組成等を考慮して、必要最低限の粗化処理を実施することが好ましい。しかし、本件発明に係る表面処理電解銅箔を用いて、25μmピッチを超える微細なファインピッチ回路を形成する場合には、粗化処理を施していないことが好ましい。オーバーエッチング時間の短縮化が容易になるからである。 As for the roughening level by the roughening treatment described above, it is preferable to carry out the minimum roughening treatment in consideration of the combination with the type of the anticorrosive layer, the base resin composition to be bonded, and the like. However, when a fine fine pitch circuit exceeding 25 μm pitch is formed using the surface-treated electrolytic copper foil according to the present invention, it is preferable that no roughening treatment is performed. This is because it is easy to shorten the over-etching time.
そして、前記表面処理電解銅箔は、絶縁層構成材料との接着面として、電解銅箔としての析出面側を用いることが好ましい。上述のように、光沢面側は、陰極ドラムの表面形状が転写した形状であるため、TD方向とMD方向とで表面形状の違いを無くすることは困難であり、これに表面処理及び粗化処理を施しても、TD方向とMD方向との形状的な差異は消失しない。これに対し、本件発明に係る電解銅箔の場合、その析出面のTD方向とMD方向との表面形状及び状態に差が小さいため、表面処理した後の接着面の表面形状及び状態も、TD方向とMD方向との表面形状及び状態の差が小さくなる。従って、電解銅箔の析出面に、各種表面処理及び粗化処理を施して、基材樹脂への接着面として用いることで、TD方向とMD方向との表面形状の方向性が小さくなり、形成する回路のエッチングの方向依存性が小さくなり好ましい。 And as for the said surface treatment electrolytic copper foil, it is preferable to use the deposition surface side as electrolytic copper foil as an adhesive surface with an insulating-layer constituent material. As described above, since the surface shape of the cathode drum is a transferred shape on the glossy surface side, it is difficult to eliminate the difference in the surface shape between the TD direction and the MD direction. Even if processing is performed, the difference in shape between the TD direction and the MD direction does not disappear. On the other hand, in the case of the electrolytic copper foil according to the present invention, since the difference in the surface shape and state between the TD direction and the MD direction of the deposited surface is small, the surface shape and state of the adhesive surface after the surface treatment is also TD. The difference in surface shape and state between the direction and the MD direction is reduced. Therefore, the surface of the electrolytic copper foil is subjected to various surface treatments and roughening treatments and used as an adhesive surface to the base resin, thereby reducing the directionality of the surface shape between the TD direction and the MD direction. This is preferable because the etching direction dependency of the circuit to be reduced is reduced.
以下、本件発明に係る電解銅箔の製造方法に関して述べておく。本件発明に係る電解銅箔は、硫酸系銅電解液を用いた電解法により陰極表面に析出させた銅を剥取って電解銅箔を製造する方法であって、当該硫酸系銅電解液は3−メルカプト−1−プロパンスルホン酸(本件出願では以降「MPS」と称する)又はビス(3−スルホプロピル)ジスルフィド(本件出願では以降「SPS」と称する)から選択された少なくとも一種と環状構造を持つ4級アンモニウム塩重合体と塩素とを含むものであることを特徴とするものである。この組成の硫酸系銅電解液を用いることで、本件発明に係る低プロファイルの電解銅箔を安定して製造することが可能となる。さらに、電解条件を最適化することにより、光沢度[Gs(60°)]が700を超える電解銅箔を得ることができる。そして、この硫酸系銅電解液中の銅濃度は40g/l〜120g/l、より好ましい範囲は50g/l〜80g/lである。そして、当該硫酸系銅電解液中のフリー硫酸濃度は60g/l〜220g/l、より好ましい範囲は80g/l〜150g/lである。 Hereinafter, the manufacturing method of the electrolytic copper foil according to the present invention will be described. The electrolytic copper foil according to the present invention is a method for producing an electrolytic copper foil by stripping copper deposited on the cathode surface by an electrolytic method using a sulfuric acid-based copper electrolyte, wherein the sulfuric acid-based copper electrolyte is 3 A cyclic structure with at least one selected from mercapto-1-propanesulfonic acid (hereinafter referred to as “MPS” in the present application) or bis (3-sulfopropyl) disulfide (hereinafter referred to as “SPS” in the present application); It contains a quaternary ammonium salt polymer and chlorine. By using the sulfuric acid-based copper electrolytic solution having this composition, the low profile electrolytic copper foil according to the present invention can be stably produced. Furthermore, by optimizing the electrolysis conditions, an electrolytic copper foil having a gloss [Gs (60 °)] exceeding 700 can be obtained. And the copper concentration in this sulfuric acid system copper electrolytic solution is 40 g / l-120 g / l, and a more preferred range is 50 g / l-80 g / l. And the free sulfuric acid density | concentration in the said sulfuric acid type copper electrolyte solution is 60 g / l-220 g / l, and a more preferable range is 80 g / l-150 g / l.
本件発明に係る硫酸系銅電解液中のMPS及び/又はSPSの合算濃度は0.5ppm〜100ppmである事が好ましく、より好ましくは0.5ppm〜50ppm、更に好ましくは1ppm〜30ppmである。このMPS又はSPSの濃度が0.5ppm未満の場合には、電解銅箔の析出面が粗くなり、低プロファイル電解銅箔を得ることが困難となる。一方、MPS及び/又はSPSの濃度が100ppmを越えても、得られる電解銅箔の析出面が平滑化する効果は向上せず、廃液処理のコスト増加を招くだけである。なお、本件発明で言うMPS及び/又はSPSとは、それぞれの塩をも含む意味で使用しており、濃度の記載値は、ナトリウム塩としての3−メルカプト−1−プロパンスルホン酸ナトリウム(本件出願では以降「MPS−Na」と称する)としての換算値である。そしてMPSは本件発明に係る硫酸系銅電解液中では2量体化することでSPS構造をとるものである。従って、MPS又はSPSの濃度とは、3−メルカプト−1−プロパンスルホン酸単体やMPS−Na等塩類の他、SPSとして添加されたもの及びMPSとして電解液中に添加された後にSPS等に重合化した変性物をも含む濃度である。MPSの構造式を化1として、SPSの構造式を化2として以下に示す。これら構造式の比較から、SPS構造体は、MPSの2量体であることがわかる。 The combined concentration of MPS and / or SPS in the sulfuric acid-based copper electrolyte according to the present invention is preferably 0.5 ppm to 100 ppm, more preferably 0.5 ppm to 50 ppm, and still more preferably 1 ppm to 30 ppm. When the concentration of MPS or SPS is less than 0.5 ppm, the deposited surface of the electrolytic copper foil becomes rough, making it difficult to obtain a low profile electrolytic copper foil. On the other hand, even if the concentration of MPS and / or SPS exceeds 100 ppm, the effect of smoothing the deposited surface of the obtained electrolytic copper foil is not improved, and only the cost of waste liquid treatment is increased. In addition, MPS and / or SPS referred to in the present invention are used in the meaning including each salt, and the stated value of concentration is sodium 3-mercapto-1-propanesulfonate as a sodium salt (the present application) (Hereinafter referred to as “MPS-Na”). And MPS takes SPS structure by dimerizing in the sulfuric acid system copper electrolyte concerning the present invention. Therefore, the concentration of MPS or SPS means that 3-mercapto-1-propanesulfonic acid alone or salts such as MPS-Na, as well as those added as SPS and MPS as polymerized into SPS after being added to the electrolyte. The concentration also includes the modified product. The structural formula of MPS is shown as chemical formula 1, and the structural formula of SPS is shown as chemical formula 2 below. From comparison of these structural formulas, it can be seen that the SPS structure is a dimer of MPS.
そして、本件発明に係る硫酸系銅電解液中の環状構造を持つ4級アンモニウム塩重合体は、濃度が1ppm〜150ppmである事が好ましく、より好ましくは10ppm〜120ppm、更に好ましくは15ppm〜40ppmである。ここで、環状構造を持つ4級アンモニウム塩重合体として、種々のものを用いることが可能である。しかし、低プロファイルの析出面を形成する効果を考えると、DDAC重合体を用いることが最も好ましい。DDACは、重合体構造を取る際に環状構造を成すものであり、環状構造の一部が4級アンモニウムの窒素原子で構成されることになる。そして、DDAC重合体は、前記環状構造が4員環〜7員環のいずれか又はそれらの混合物であると考えられ、これら重合体の内、5員環構造を取っている化合物を、代表的に化3として以下に示した。このDDAC重合体は、化3から明らかに理解できるように、DDACが2量体以上の重合体構造を取っているものである。 The quaternary ammonium salt polymer having a cyclic structure in the sulfuric acid-based copper electrolyte according to the present invention preferably has a concentration of 1 ppm to 150 ppm, more preferably 10 ppm to 120 ppm, and still more preferably 15 ppm to 40 ppm. is there. Here, various quaternary ammonium salt polymers having a cyclic structure can be used. However, considering the effect of forming a low profile precipitation surface, it is most preferable to use a DDAC polymer. DDAC forms a cyclic structure when taking a polymer structure, and a part of the cyclic structure is composed of a quaternary ammonium nitrogen atom. The DDAC polymer is considered to be a compound in which the cyclic structure is a 4-membered ring to a 7-membered ring or a mixture thereof, and among these polymers, a compound having a 5-membered ring structure is representative. The following is shown as chemical formula 3. As can be clearly understood from the chemical formula 3, the DDAC polymer has a polymer structure of a dimer or higher.
そして、このDDAC重合体の硫酸系銅電解液中の濃度は、1ppm〜150ppmである事が好ましく、より好ましくは10ppm〜120ppm、更に好ましくは15ppm〜40ppmである。DDAC重合体の硫酸系銅電解液中の濃度が1ppm未満の場合には、MPS又はSPSの濃度を如何に高めても電析銅の析出面が粗くなり、低プロファイル電解銅箔を得ることが困難となる。一方、DDAC重合体の硫酸系銅電解液中の濃度が150ppmを超えると、銅の析出状態が不安定になり、低プロファイル電解銅箔を得ることが困難となる。 And it is preferable that the density | concentration in this sulfuric acid type | system | group copper electrolyte solution of this DDAC polymer is 1 ppm-150 ppm, More preferably, it is 10 ppm-120 ppm, More preferably, it is 15 ppm-40 ppm. When the concentration of the DDAC polymer in the sulfuric acid-based copper electrolyte is less than 1 ppm, the deposition surface of electrodeposited copper becomes rough no matter how high the MPS or SPS concentration is, and a low profile electrolytic copper foil can be obtained. It becomes difficult. On the other hand, if the concentration of the DDAC polymer in the sulfuric acid-based copper electrolyte exceeds 150 ppm, the copper deposition state becomes unstable, and it becomes difficult to obtain a low profile electrolytic copper foil.
更に、前記硫酸系銅電解液中の塩素濃度は、5ppm〜120ppmである事が好ましく、更に好ましくは10ppm〜60ppmである。この塩素濃度が5ppm未満の場合には、電解銅箔の析出面が粗くなり、低プロファイルを維持できなくなる。一方、塩素濃度が120ppmを超えても、電解銅箔の析出面が粗くなり、電析状態が安定せず、低プロファイルの析出面を形成出来なくなる。 Furthermore, the chlorine concentration in the sulfuric acid-based copper electrolyte is preferably 5 ppm to 120 ppm, more preferably 10 ppm to 60 ppm. When the chlorine concentration is less than 5 ppm, the deposited surface of the electrolytic copper foil becomes rough and the low profile cannot be maintained. On the other hand, even if the chlorine concentration exceeds 120 ppm, the deposited surface of the electrolytic copper foil becomes rough, the electrodeposition state is not stable, and a low profile deposited surface cannot be formed.
以上のように、前記硫酸系銅電解液中のMPS及び/又はSPSとDDAC重合体と塩素との成分バランスが最も重要であり、これらの量的バランスが上記範囲を逸脱すると、結果として電解銅箔の析出面が粗くなり、低プロファイルを維持できなくなる。 As described above, the component balance of MPS and / or SPS, DDAC polymer and chlorine in the sulfuric acid-based copper electrolytic solution is the most important, and if these quantitative balances deviate from the above range, as a result, electrolytic copper The deposited surface of the foil becomes rough and the low profile cannot be maintained.
そして、前記硫酸系銅電解液を用いて電解銅箔を製造する場合には、表面粗さが所定の範囲に調整された陰極と不溶性陽極とを用いて電解する。このとき液温は20℃〜60℃、より好ましくは40℃〜55℃とし、電流密度は15A/dm2〜90A/dm2、より好ましくは50A/dm2〜70A/dm2とすることが好ましい。 And when manufacturing an electrolytic copper foil using the said sulfuric acid system copper electrolyte solution, it electrolyzes using the cathode and insoluble anode whose surface roughness was adjusted to the predetermined range. At this time, the liquid temperature is 20 ° C. to 60 ° C., more preferably 40 ° C. to 55 ° C., and the current density is 15 A / dm 2 to 90 A / dm 2 , more preferably 50 A / dm 2 to 70 A / dm 2. preferable.
そして、この電解銅箔の製造方法を用いる場合、上記電解銅箔に求められる特性を安定的に得るため、その製造を行う場合の陰極表面状態を管理すべきである。特に、上述したように、光沢面側の表面状態を左右するからである。プリント配線板用電解銅箔の規格であるJIS C 6515を参照すると、電解銅箔に求める光沢面の表面粗さ(Rzjis)は、最大2.4μmであると規定している。この電解銅箔の製造用の陰極として、チタン(Ti)材質の回転陰極ドラムを用いる場合には、連続使用している間に表面酸化による外観変化及び金属相の変化が起こる。従って、定期的な表面研磨、状態に応じて研磨又は切削という機械的なメンテナンス作業が必要となる。そして、このような陰極表面の機械的加工は、陰極を回転しつつ実施するため円周方向に筋状の加工模様が不可避的に発生する。このため、光沢面の表面粗さ(Rzjis)を、小さいままに定常状態に維持することが困難であり、コストの観点とプリント配線板製造上の支障を生じないことを前提とした前記規格値が許容される。 And when using the manufacturing method of this electrolytic copper foil, in order to acquire the characteristic calculated | required by the said electrolytic copper foil stably, the cathode surface state in the case of manufacturing should be managed. In particular, as described above, it affects the surface state on the glossy surface side. Referring to JIS C 6515, which is a standard for electrolytic copper foil for printed wiring boards, the surface roughness (Rzjis) of the glossy surface required for the electrolytic copper foil is specified to be a maximum of 2.4 μm. When a rotating cathode drum made of titanium (Ti) is used as a cathode for producing this electrolytic copper foil, the appearance change and the metal phase change due to surface oxidation occur during continuous use. Therefore, mechanical maintenance work such as periodic surface polishing and polishing or cutting is required depending on the state. Such mechanical machining of the cathode surface is carried out while rotating the cathode, so that a streak pattern is inevitably generated in the circumferential direction. For this reason, it is difficult to maintain the surface roughness (Rzjis) of the glossy surface in a small state, and the standard value is based on the premise that there is no problem in terms of cost and printed wiring board manufacture. Is acceptable.
従来の電解銅箔の場合には、厚さが厚くなるほど、析出面粗さが大きくなる傾向を示す。そして、その他の要因として、前記規格値の上限レベル又はそれ以上の表面粗さを備える陰極ドラムを使用すると、陰極の表面形状の影響を受けて、得られる電解銅箔の析出面の粗さが大きくなる傾向がある。これに対し、上記硫酸銅系電解液を用いると、陰極表面の凹凸を埋めつつ膜厚が成長していく過程で、陰極面形状の影響を受けにくくなり、平坦な析出表面の形成が可能となる。即ち、従来の電解銅箔の製造に用いた銅電解液に比べ、上記硫酸銅系電解液を用いて電解銅箔を製造すると、陰極表面の形状の影響を受けにくく、表面が粗らい陰極の使用も可能となる。 In the case of the conventional electrolytic copper foil, the precipitation surface roughness tends to increase as the thickness increases. As another factor, when a cathode drum having a surface roughness higher than the upper limit level of the standard value is used, the roughness of the deposited surface of the obtained electrolytic copper foil is affected by the surface shape of the cathode. There is a tendency to grow. On the other hand, when the above copper sulfate electrolyte is used, it becomes difficult to be influenced by the shape of the cathode surface in the process of growing the film thickness while filling the unevenness of the cathode surface, and a flat deposition surface can be formed. Become. That is, when the electrolytic copper foil is manufactured using the above-described copper sulfate-based electrolytic solution as compared with the copper electrolytic solution used in the manufacture of the conventional electrolytic copper foil, it is less affected by the shape of the cathode surface, and the cathode surface is rough. Use is also possible.
この陰極の表面の状態に関して更に述べる。例えば、20μm未満の厚さの電解銅箔を製造する場合において、得られる電解銅箔の析出面粗さ(Rzjis)を1.0μm未満とする場合には、その電解銅箔の光沢面の表面粗さ(Rzjis)は、2.0μm未満で光沢度[Gs(60°)]が70以上となるように、陰極表面の状態を管理することが好ましい。そして、より好ましくは、電解銅箔の光沢面の表面粗さ(Rzjis)は、1.7μm未満で光沢度[Gs(60°)]が100以上となるように、陰極表面の状態を管理することが好ましい。陰極表面の状態が、光沢面の形状のみならず、析出面の形状にも影響を与えるからである。 The state of the surface of the cathode will be further described. For example, in the case of producing an electrolytic copper foil having a thickness of less than 20 μm, when the precipitation surface roughness (Rzjis) of the obtained electrolytic copper foil is less than 1.0 μm, the surface of the glossy surface of the electrolytic copper foil It is preferable to manage the state of the cathode surface so that the roughness (Rzjis) is less than 2.0 μm and the glossiness [Gs (60 °)] is 70 or more. More preferably, the surface state of the cathode is controlled so that the surface roughness (Rzjis) of the glossy surface of the electrolytic copper foil is less than 1.7 μm and the glossiness [Gs (60 °)] is 100 or more. It is preferable. This is because the state of the cathode surface affects not only the shape of the glossy surface but also the shape of the deposition surface.
[本件発明に係る銅張積層板の形態]
本件発明は、前記表面処理電解銅箔を絶縁層構成材料と張合わせてなる銅張積層板を提供する。これら銅張積層板の製造方法に関して、簡単に述べることとする。フレキシブル銅張積層板であれば、従来のロールラミネート方式やキャスティング方式を用いることが可能である。そして、リジッド銅張積層板であれば、ホットプレス方式や連続ラミネート方式を用いて製造することが可能である。なお、本件発明に言うフレキシブル銅張積層板及びリジッド銅張積層板は、片面銅張積層板、両面銅張積層板、多層銅張積層板の全てを含む概念である。ここで、多層銅張積層板の場合には、外層に本件発明に係る表面処理銅箔を用い、その内層には内層回路を備える内層コア材が含まれた構成のものである。以下の銅張積層板の説明上は、これらを区別しての説明は省略する。
[Form of copper clad laminate according to the present invention]
The present invention provides a copper clad laminate obtained by laminating the surface-treated electrolytic copper foil with an insulating layer constituting material. The method for manufacturing these copper clad laminates will be briefly described. If it is a flexible copper clad laminated board, it is possible to use the conventional roll laminating system and the casting system. And if it is a rigid copper clad laminated board, it can be manufactured using a hot press system or a continuous laminating system. The flexible copper-clad laminate and the rigid copper-clad laminate referred to in the present invention are concepts including all of a single-sided copper-clad laminate, a double-sided copper-clad laminate, and a multilayer copper-clad laminate. Here, in the case of a multilayer copper-clad laminate, the surface-treated copper foil according to the present invention is used for the outer layer, and the inner layer includes an inner layer core material having an inner layer circuit. In the description of the copper-clad laminate below, the description distinguishing these will be omitted.
本件発明は、前記絶縁層構成材料に骨格材を含有するリジッド銅張積層板を提供する。従来のリジッド銅張積層板で用いられていた骨格材は、ガラス織布又はガラス不織布が大半を占めており、銅箔接着面の粗さが影響するのは10μm超レベルでは層間絶縁性に影響を与え、10μm以下でも骨格材であるガラス繊維と回路とが直接接触することによる耐マイグレーション性が問題になりうる。そして、5μmレベルであれば、これらの問題は生じないと言われてきた。しかしながら、近年では、電子部品が直接搭載されるパッケージ基板、例えばBGAやCSPにたいしても、従来のレベルを超えるファインパターンが要求されるようになっている。これに対応するため、骨格材としてガラス繊維よりも細いアラミド繊維を不織布として用いるなどして、銅張積層板の表面の平坦化を図っている。そして、高いクロック周波数を必要とする部品などを搭載する場合、回路の直線性、断面形状が、理想状態から乖離していると、高周波域における信号の伝送特性が劣ることになる。従って、本件発明に係る銅張積層板は、ファインパターン形成に適すると同時に、高周波信号の伝送回路を有するプリント配線板の製造用途に好適である。 This invention provides the rigid copper clad laminated board which contains a frame material in the said insulating-layer constituent material. Most of the skeletal materials used in conventional rigid copper-clad laminates are glass woven fabrics or glass nonwoven fabrics, and the roughness of the copper foil adhesion surface affects the interlayer insulation at levels exceeding 10 μm. Even when the thickness is 10 μm or less, the migration resistance due to the direct contact between the glass fiber as the skeleton material and the circuit can be a problem. It has been said that these problems do not occur at the 5 μm level. However, in recent years, fine patterns exceeding the conventional level have been required even for package substrates on which electronic components are directly mounted, such as BGA and CSP. In order to cope with this, the surface of the copper-clad laminate is flattened by using, as a nonwoven fabric, aramid fibers thinner than glass fibers as a skeleton material. When components that require a high clock frequency are mounted, if the linearity and cross-sectional shape of the circuit deviate from the ideal state, the signal transmission characteristics in the high frequency range will be inferior. Therefore, the copper clad laminate according to the present invention is suitable for the production of a printed wiring board having a high-frequency signal transmission circuit as well as being suitable for fine pattern formation.
また、本件発明に係る表面処理銅箔と絶縁層構成材料として可撓性を有するフレキシブル素材とで構成したフレキシブル銅張積層板を提供する。フレキシブル銅張積層板は、前述のリジッド銅張積層板との相違点としてみれば、その屈曲性と軽量性とに大きな差異があり、その用途分野が異なっている。近年のフレキシブル銅張積層板は、その絶縁層構成材料の軽量化と高屈曲性達成のために薄層化が図られている。そして、同時に導体層にも薄い銅箔の使用が求められ、電解銅箔が主要な材料となっている。そして、薄い多層フレキシブル基板の絶縁信頼性を確保するため、接着面に対しては絶縁層厚みの1/10以下の低プロファイルが要求される。従来品であれば、上記表面粗さRzjis=5μm程度が使用上限であった。しかしながら、本件発明に係る電解銅箔を用いたフレキシブル銅張積層板は、更にフィルム厚さを減じても絶縁信頼性が確保できるものになる。そして、従来の低プロファイル電解銅箔を用いたフレキシブル銅張積層板に比べ、屈曲性においても優れており、この点においても信頼性が向上したフレキシブル銅張積層板と言える。 Moreover, the flexible copper clad laminated board comprised by the surface-treated copper foil which concerns on this invention, and the flexible raw material which has flexibility as an insulating-layer constituent material is provided. The flexible copper-clad laminate has a great difference in flexibility and lightness when viewed from the above-mentioned rigid copper-clad laminate, and its application fields are different. In recent years, flexible copper clad laminates have been made thinner in order to reduce the weight of the insulating layer constituting material and achieve high flexibility. At the same time, it is required to use a thin copper foil for the conductor layer, and electrolytic copper foil is a main material. And in order to ensure the insulation reliability of a thin multilayer flexible substrate, a low profile of 1/10 or less of the insulating layer thickness is required for the bonding surface. In the case of a conventional product, the surface roughness Rzjis = about 5 μm was the upper limit of use. However, the flexible copper clad laminate using the electrolytic copper foil according to the present invention can ensure insulation reliability even if the film thickness is further reduced. And it is excellent also in the flexibility compared with the flexible copper clad laminated board using the conventional low profile electrolytic copper foil, and it can be said that it is the flexible copper clad laminated board which improved the reliability also in this point.
ここで、リジッド銅張積層板及びフレキシブル銅張積層板の製造方法を、簡潔且つ具体的に例示しておく。リジッド銅張積層板又はフレキシブル銅張積層板を製造する場合には、本件発明に係る表面処理電解銅箔、FR−4クラスのプリプレグ等のリジッド絶縁層形成材又はポリイミド樹脂フィルム等のフレキシブル絶縁層形成材、鏡板等を用いて、所望のレイアップ状態を形成し、170℃〜200℃の熱間でプレス成形する。 Here, the manufacturing method of a rigid copper clad laminated board and a flexible copper clad laminated board is illustrated simply and concretely. When manufacturing rigid copper clad laminates or flexible copper clad laminates, surface treatment electrolytic copper foil according to the present invention, rigid insulation layer forming material such as FR-4 class prepreg, or flexible insulation layer such as polyimide resin film A desired lay-up state is formed using a forming material, an end plate, and the like, and press-molded at 170 ° C. to 200 ° C. hot.
一方、フレキシブル銅張積層板の場合には、上述のようなロールラミネート方式やキャスティング方式の採用も可能である。このロールラミネート方式とは、本件発明に係る表面処理銅箔のロールと、ポリイミド樹脂フィルムやPETフィルム等の樹脂フィルムロールとを用いて、Roll to Roll方式で加熱ロールの圧力で熱圧着させる方法である。そして、キャスティング方式とは、本件発明に係る表面処理銅箔の表面に、ポリアミック酸等の加熱によりポリイミド樹脂化する樹脂組成膜を形成し、加熱し縮合反応を起こさせることで、表面処理銅箔の表面にポリイミド樹脂皮膜を直接形成するものである。 On the other hand, in the case of a flexible copper-clad laminate, it is possible to adopt the roll laminating method or the casting method as described above. This roll laminating method is a method in which a roll of surface-treated copper foil according to the present invention and a resin film roll such as a polyimide resin film or a PET film are thermocompression-bonded by the pressure of a heating roll in the Roll to Roll method. is there. And the casting method means that the surface-treated copper foil is formed by forming a resin composition film that is converted into a polyimide resin by heating such as polyamic acid on the surface of the surface-treated copper foil according to the present invention, and causing a condensation reaction by heating. A polyimide resin film is directly formed on the surface of the film.
[本件発明に係るプリント配線板の形態]
そして、本件発明は、前記リジッド銅張積層板を用いて得られたことを特徴とするリジッドプリント配線板を提供する。前述のように本件発明に係る電解銅箔を用いた銅張積層板を使用したプリント配線板の製造には、サブトラクティブ法はもちろん、パターンめっき/フラッシュエッチング法も用いることができ、どちらの場合でもオーバーエッチング時間の設定を短くできるために、得られた回路の端面はより直線的で、断面は矩形に近くなる。したがって、ファインパターンでの回路間の絶縁信頼性に優れていると同時に、特に表皮効果により、回路表面近くを流れる高周波領域の信号伝達特性に優れる。また、クロストーク特性に優れ、ノイズも発生しにくいため、総合的にみて信頼性に優れたプリント配線板となる。
[Form of printed wiring board according to the present invention]
And this invention provides the rigid printed wiring board characterized by being obtained using the said rigid copper clad laminated board. As described above, in the production of the printed wiring board using the copper-clad laminate using the electrolytic copper foil according to the present invention, not only the subtractive method but also the pattern plating / flash etching method can be used. However, since the setting of the over-etching time can be shortened, the end face of the obtained circuit is more linear and the cross section is close to a rectangle. Therefore, the insulation reliability between the circuits in the fine pattern is excellent, and at the same time, the signal transmission characteristic in the high frequency region flowing near the circuit surface is excellent due to the skin effect. In addition, since it has excellent crosstalk characteristics and is less likely to generate noise, it is a printed wiring board with excellent overall reliability.
また、本件発明は、前記フレキシブル銅張積層板を用いて得られたことを特徴とするフレキシブルプリント配線板を提供する。当該フレキシブルプリント配線板の製造には、前述のリジッドプリント配線板と同様サブトラクティブ法はもちろん、パターンめっき/フラッシュエッチング法も用いることができ、どちらの場合でもオーバーエッチング時間の設定を短くできるために、得られた回路の端面はより直線性に優れ、断面は矩形に近くなる。従って、高周波領域の信号伝達特性に優れ、またクロストークなどのノイズも発生しにくい、信頼性の優れたフレキシブルプリント配線板であると同時に、絶縁信頼性、屈曲性に優れたものであり、特に部品を直接実装するフィルムキャリアの場合には、最もその優位性を発揮できる。 Moreover, this invention provides the flexible printed wiring board characterized by being obtained using the said flexible copper clad laminated board. In the production of the flexible printed wiring board, not only the subtractive method but also the pattern plating / flash etching method can be used as in the case of the above-mentioned rigid printed wiring board. In either case, the setting of the overetching time can be shortened. The end face of the obtained circuit is more linear and the cross section is close to a rectangle. Therefore, it is a flexible printed wiring board with excellent signal transmission characteristics in the high-frequency region, and is less likely to generate noise such as crosstalk, and at the same time has excellent insulation reliability and flexibility. In the case of a film carrier on which components are directly mounted, the advantage can be exhibited most.
ここで、上記リジッド銅張積層板又はフレキシブル銅張積層板(以下、単に「銅張積層板」と称する。)のいずれかを用いて、プリント配線板に加工する場合の一般的加工方法の一例を、念のために述べておく。最初に、銅張積層板表面へエッチングレジスト層を形成し、エッチング回路パターンを露光し、現像し、エッチングレジストパターンを形成する。このときのエッチングレジスト層は、ドライフィルム、液体レジスト等の感光性樹脂が用いられる。その他、露光はUV露光が一般的であり、定法に基づいたエッチングレジストパターンの形成方法が採用できる。 Here, an example of a general processing method when processing into a printed wiring board using either the above-mentioned rigid copper-clad laminate or flexible copper-clad laminate (hereinafter simply referred to as “copper-clad laminate”). I will just say that. First, an etching resist layer is formed on the surface of the copper clad laminate, and the etching circuit pattern is exposed and developed to form an etching resist pattern. At this time, a photosensitive resin such as a dry film or a liquid resist is used for the etching resist layer. In addition, UV exposure is generally used for exposure, and an etching resist pattern forming method based on a conventional method can be employed.
そして、銅エッチング液を用いて、電解銅箔を回路形状にエッチング加工し、エッチングレジスト剥離を行うことで、リジッド基材又はフレキシブル基材の表面に所望の回路形状を形成する。このときのエッチング液に関しても、酸性銅エッチング液、アルカリ性銅エッチング液等の全ての銅エッチング液の使用が可能である。 Then, the electrolytic copper foil is etched into a circuit shape using a copper etching solution, and the etching resist is removed to form a desired circuit shape on the surface of the rigid base material or the flexible base material. Regarding the etching solution at this time, all copper etching solutions such as an acidic copper etching solution and an alkaline copper etching solution can be used.
上述のように本件発明に言う銅張積層板は、片面銅張積層板、両面銅張積層板、内部に内層回路を備える多層銅張積層板の全てを含む概念として記載している。従って、両面銅張積層板及び多層銅張積層板の場合には、その層間での導通を確保することが必要な場合があり、係る場合には、定法によるスルーホール、ビアホール等の形成を行う。そして、その後層間導通を得るための導通メッキ処理が施される。一般的に、この導通メッキ処理には、パラジウム触媒による活性化処理を行い銅無電解メッキが施され、その後電解銅メッキで膜厚成長を行うものである。 As described above, the copper-clad laminate referred to in the present invention is described as a concept including all of a single-sided copper-clad laminate, a double-sided copper-clad laminate, and a multilayer copper-clad laminate having an internal circuit inside. Therefore, in the case of a double-sided copper-clad laminate and a multilayer copper-clad laminate, it may be necessary to ensure electrical continuity between the layers. In such a case, through holes, via holes, etc. are formed by a regular method. . Then, a conductive plating process is performed to obtain interlayer conduction. In general, this conductive plating treatment is an activation treatment using a palladium catalyst to perform a copper electroless plating, and then a film thickness is grown by electrolytic copper plating.
銅エッチングが終了すると、十分に水洗を行い、乾燥、その他必要に応じて防錆処理等が施されて、リジッドプリント配線板又はフレキシブルプリント配線板となる。以下、実施例を通じて、本件発明に関してより、詳細に説明する。 When the copper etching is completed, the substrate is sufficiently washed with water, dried, and subjected to other rust-proofing treatment as necessary to obtain a rigid printed wiring board or a flexible printed wiring board. Hereinafter, the present invention will be described in more detail through examples.
実施例と比較例では陰極の表面形状の影響が出ないことに配慮し、表面を2000番の研磨紙で研磨を行って表面粗さをRzjisで0.85μmに調整したチタン板電極を用いた。 In consideration of the fact that the surface shape of the cathode is not affected in the examples and the comparative examples, a titanium plate electrode whose surface was polished with No. 2000 polishing paper and the surface roughness was adjusted to 0.85 μm with Rzjis was used. .
[第一実施群]
この第1実施群では、実施例1〜実施例8を行った。この実施例1〜実施例8では、硫酸系銅電解液として、硫酸銅溶液であって銅濃度80g/l、フリー硫酸濃度140g/l、そして表1に記載のMPSの濃度、DDAC重合体(センカ(株)製ユニセンスFPA100L)濃度、塩素濃度に調整した溶液を用いた。そして、実施例9ではMPSの代替品としてMPSの2量体であるSPSを用いた。
[First Implementation Group]
In the first working group, Examples 1 to 8 were performed. In Examples 1 to 8, the sulfuric acid-based copper electrolyte was a copper sulfate solution having a copper concentration of 80 g / l, a free sulfuric acid concentration of 140 g / l, and the MPS concentration and DDAC polymer (Table 1). A solution adjusted to a concentration and a chlorine concentration was used. In Example 9, SPS, which is a dimer of MPS, was used as an alternative to MPS.
電解銅箔の作成は陽極にDSAを用いて、液温50℃、電流密度60A/dm2で電解し、12μm及び210μm厚さの9種の電解銅箔を得た。この中から12μm電解銅箔に限定して銅箔の機械的特性を評価した。結果を表2に示す。 The electrolytic copper foil was prepared by using DSA as an anode and electrolyzing at a liquid temperature of 50 ° C. and a current density of 60 A / dm 2 to obtain nine types of electrolytic copper foils having a thickness of 12 μm and 210 μm. The mechanical properties of the copper foil were evaluated by limiting to the 12 μm electrolytic copper foil. The results are shown in Table 2.
次に当該電解銅箔の両面に防錆処理を施した、ここでは以下に述べる条件の無機防錆を採用した。硫酸亜鉛浴を用い、フリー硫酸濃度70g/l、亜鉛濃度20g/lとし、液温40℃、電流密度15A/dm2とし、亜鉛防錆処理を施した。 Next, the both sides of the electrolytic copper foil were subjected to rust prevention treatment, and here, inorganic rust prevention under the conditions described below was adopted. Using a zinc sulfate bath, a free sulfuric acid concentration of 70 g / l, a zinc concentration of 20 g / l, a liquid temperature of 40 ° C., a current density of 15 A / dm 2 were applied, and a zinc rust prevention treatment was performed.
更に、本実施例の場合、前記亜鉛防錆層の上に、電解でクロメート層を形成した。このときの電解条件は、クロム酸濃度5.0g/l、pH 11.5、液温35℃、電流密度8A/dm2、電解時間5秒とした。 Further, in the case of this example, a chromate layer was formed by electrolysis on the zinc rust preventive layer. The electrolysis conditions at this time were chromic acid concentration 5.0 g / l, pH 11.5, liquid temperature 35 ° C., current density 8 A / dm 2 , and electrolysis time 5 seconds.
以上のように防錆処理が完了すると水洗後、直ちにシランカップリング剤処理槽で、析出面側の防錆処理層の上にシランカップリング剤の吸着を行った。このときの溶液組成は、純水を溶媒として、γ−グリシドキシプロピルトリメトキシシラン濃度を5g/lとした。そして、この溶液をシャワーリングにて吹き付けることにより吸着処理した。 When the rust prevention treatment was completed as described above, the silane coupling agent was adsorbed on the rust prevention treatment layer on the deposition surface side immediately in the silane coupling agent treatment tank after washing with water. The solution composition at this time was such that the concentration of γ-glycidoxypropyltrimethoxysilane was 5 g / l using pure water as a solvent. The solution was adsorbed by spraying with a shower ring.
シランカップリング剤処理が終了すると、最終的に電熱器により水分を気散させ、9種類の表面処理電解銅箔を得た。なお、得られた電解銅箔の結晶構造解析によると、平均結晶粒子径は従来のフィルムキャリアテープに用いられている微細結晶化により低プロファイルとしている電解銅箔が有している平均結晶粒子径よりも大きく、また双晶の存在も確認された。 上記から得られた電解銅箔の析出面の表面粗さ(Rzjis)と光沢度[Gs(20°)]、[Gs(60°)]及び[Gs(85°)]、そして表面処理電解銅箔の析出面の表面粗さ(Rzjis)と光沢度[Gs(60°)]を表3に示す。
[第二実施群]
ここでは実施例10〜実施例14とし、硫酸系銅電解液として銅濃度80g/l、フリー硫酸濃度140g/l、そして表4に記載のSPSの濃度、DDAC重合体(センカ(株)製ユニセンスFPA100L)濃度、塩素濃度に調整した溶液を用いた。
[Second implementation group]
Here, Examples 10 to 14 were used, and as the sulfuric acid-based copper electrolyte, the copper concentration was 80 g / l, the free sulfuric acid concentration was 140 g / l, and the SPS concentrations shown in Table 4, DDAC polymer (Unisense manufactured by Senka Co., Ltd.) FPA100L) A solution adjusted to a concentration and a chlorine concentration was used.
電解銅箔の作成は陽極にDSAを用いて、液温50℃、電流密度60A/dm2で電解し、実施例10では12μm及び70μm厚さの2種の電解銅箔を、実施例11〜実施例14では4種の12μm厚さの電解銅箔を得た。 The electrolytic copper foil was prepared by using DSA as an anode, electrolyzing at a liquid temperature of 50 ° C., and a current density of 60 A / dm 2. In Example 10, two types of electrolytic copper foils having a thickness of 12 μm and 70 μm were used in Examples 11 to 11. In Example 14, four types of electrolytic copper foils having a thickness of 12 μm were obtained.
そして、実施例10で得られた12μm及び70μm電解銅箔の常態及び180℃×60min.加熱後の引張り強さ、伸び率を表5に示す。そして、当該12μm電解銅箔の常態の引張り強さは35.5kgf/mm2、伸び率が11.5%、180℃×60min.加熱後の引張り強さは33.2kgf/mm2、伸び率が11.2%という良好な機械的特性は、フレキシブルプリント配線板の折り曲げ使用にも十分に耐えうるレベルである。 And the normal state of 12 μm and 70 μm electrolytic copper foil obtained in Example 10 and 180 ° C. × 60 min. Table 5 shows the tensile strength and elongation after heating. The normal tensile strength of the 12 μm electrolytic copper foil was 35.5 kgf / mm 2 , the elongation was 11.5%, and 180 ° C. × 60 min. Good mechanical properties such as a tensile strength after heating of 33.2 kgf / mm 2 and an elongation of 11.2% are at a level that can sufficiently withstand bending use of a flexible printed wiring board.
上記12μm電解銅箔単体でのMIT法による耐折性の評価をしてみると常態で1200回〜1350回、加熱後でも800回〜900回の折り曲げ試験に耐えることができている。上記MIT法による耐折試験は、MIT耐折装置として東洋精機製作所製の槽付フィルム耐折疲労試験機(品番:549)を用い、屈曲半径0.8mm、荷重0.5kgfとし、サンプルサイズ15mm×150mmで実施している。この数値は従来フレキシブルプリント配線板用途に使用されてきた汎用電解銅箔を同一条件で評価した場合には常態で600回程度、加熱後では500回程度であることから、従来の汎用品に対して約2倍の耐折性を示すものとなるのである。この違いは、表面が平滑であることによって破断に至るきっかけとなるクラックが生じにくいという効果によっていると推測できる。 When the folding resistance of the 12 μm electrolytic copper foil alone is evaluated by the MIT method, it can withstand a bending test of 1200 to 1350 times in a normal state and 800 to 900 times even after heating. The folding resistance test by the MIT method uses a film folding fatigue tester with tank (product number: 549) manufactured by Toyo Seiki Seisakusho as an MIT folding apparatus, with a bending radius of 0.8 mm, a load of 0.5 kgf, and a sample size of 15 mm. * Implemented at 150 mm. This value is about 600 times in a normal state when a general-purpose electrolytic copper foil that has been used for flexible printed wiring boards is evaluated under the same conditions, and about 500 times after heating. Thus, the folding endurance is approximately doubled. It can be inferred that this difference is due to the fact that the surface is smooth, so that cracks that trigger breakage are less likely to occur.
そして、上記で得られた電解銅箔を濃度150g/l、液温30℃の希硫酸溶液に30秒間浸漬して、付着物や表面酸化被膜の除去を行い、水洗した。実施例10で得られた12μm電解銅箔及び70μm電解銅箔では、それぞれ粗化処理を施した表面処理電解銅箔と粗化処理を施していない2種の表面処理電解銅箔合計4種を作成した。 Then, the electrolytic copper foil obtained above was immersed in a dilute sulfuric acid solution having a concentration of 150 g / l and a liquid temperature of 30 ° C. for 30 seconds to remove deposits and surface oxide film, and washed with water. In the 12 μm electrolytic copper foil and the 70 μm electrolytic copper foil obtained in Example 10, a total of four types of surface-treated electrolytic copper foil subjected to roughening treatment and two types of surface-treated electrolytic copper foil not subjected to roughening treatment were used. Created.
上記のうち粗化処理を施す対象となる12μm電解銅箔及び70μm電解銅箔は酸洗処理が終了すると、電解銅箔の析出面に微細銅粒を形成する工程として、析出面上に微細銅粒を析出付着させる工程と、この微細銅粒の脱落を防止するための被せめっき工程とを施した。前者の微細銅粒を析出付着させる工程では、硫酸銅系溶液であって、銅濃度15g/l、フリー硫酸濃度100g/l、液温25℃、電流密度30A/dm2の条件で、5秒間電解した。 Among the above, the 12 μm electrolytic copper foil and the 70 μm electrolytic copper foil to be subjected to the roughening treatment are subjected to a fine copper particle on the deposition surface as a step of forming fine copper grains on the deposition surface of the electrolytic copper foil when the pickling treatment is completed. A step of depositing and adhering the grains and a covering plating step for preventing the fine copper grains from falling off were performed. In the former process of depositing fine copper particles, a copper sulfate-based solution, which has a copper concentration of 15 g / l, a free sulfuric acid concentration of 100 g / l, a liquid temperature of 25 ° C., and a current density of 30 A / dm 2 for 5 seconds. Electrolyzed.
析出面に微細銅粒を付着形成すると、微細銅粒の脱落を防止するための被せめっき工程として平滑めっき条件で微細銅粒を被覆するように銅を均一析出させた。ここでは平滑めっき条件として、硫酸銅溶液であって、銅濃度60g/l、フリー硫酸濃度100g/l、液温45℃、電流密度45A/dm2の条件とし、5秒間電解した。 When fine copper grains were adhered and formed on the deposition surface, copper was uniformly deposited so as to cover the fine copper grains under smooth plating conditions as a covering plating process for preventing the fine copper grains from falling off. Here, the smooth plating conditions were a copper sulfate solution, a copper concentration of 60 g / l, a free sulfuric acid concentration of 100 g / l, a liquid temperature of 45 ° C., and a current density of 45 A / dm 2 , and electrolysis was performed for 5 seconds.
そして本実施例では得られた全ての電解銅箔の両面に防錆処理を施した、ここでは以下に述べる条件の無機防錆を採用した。硫酸亜鉛浴を用い、フリー硫酸濃度70g/l、亜鉛濃度20g/lとし、液温40℃、電流密度15A/dm2とし、亜鉛防錆処理を施した。 In this example, both surfaces of all the obtained electrolytic copper foils were subjected to rust prevention treatment. Here, inorganic rust prevention under the conditions described below was adopted. Using a zinc sulfate bath, a free sulfuric acid concentration of 70 g / l, a zinc concentration of 20 g / l, a liquid temperature of 40 ° C., a current density of 15 A / dm 2 were applied, and a zinc rust prevention treatment was performed.
そして前記亜鉛防錆層の上に更に電解でクロメート層を形成した。このときの電解条件は、クロム酸濃度5.0g/l、pH 11.5、液温35℃、電流密度8A/dm2、電解時間5秒とした。 A chromate layer was further formed on the zinc rust preventive layer by electrolysis. The electrolysis conditions at this time were chromic acid concentration 5.0 g / l, pH 11.5, liquid temperature 35 ° C., current density 8 A / dm 2 , and electrolysis time 5 seconds.
以上のように防錆処理が完了すると水洗後、直ちにシランカップリング剤処理槽で、析出面側の防錆処理層の上にシランカップリング剤の吸着を行った。このときの溶液組成は、純水を溶媒として、γ−グリシドキシプロピルトリメトキシシラン濃度を5g/lとした。そして、この溶液をシャワーリングにて吹き付けることにより吸着処理した。シランカップリング剤処理が終了すると、最終的に電熱器により水分を気散させ、粗化処理箔1種類を含む6種類の表面処理電解銅箔を得た。 When the rust prevention treatment was completed as described above, the silane coupling agent was adsorbed on the rust prevention treatment layer on the deposition surface side immediately in the silane coupling agent treatment tank after washing with water. The solution composition at this time was such that the concentration of γ-glycidoxypropyltrimethoxysilane was 5 g / l using pure water as a solvent. The solution was adsorbed by spraying with a shower ring. When the silane coupling agent treatment was completed, water was finally diffused by an electric heater to obtain six types of surface-treated electrolytic copper foil including one type of roughened foil.
上記実施例10〜実施例14から得られた電解銅箔の光沢面側の表面粗さ(Rzjis)と光沢度[Gs(60°)]、析出面側の表面粗さ(Rzjis)と光沢度[Gs(20°)]、[Gs(60°)]及び[Gs(85°)]、そして実施例10から得られた表面処理箔の析出面の表面粗さ(Rzjis)と光沢度[Gs(60°)]、粗化処理箔の粗化処理面の表面粗さ(Rzjis)を表6に示す。 Surface roughness (Rzjis) and glossiness [Gs (60 °)] on the glossy surface side of the electrolytic copper foils obtained from Examples 10 to 14 above, surface roughness (Rzjis) and glossiness on the deposition surface side [Gs (20 °)], [Gs (60 °)] and [Gs (85 °)], and surface roughness (Rzjis) and glossiness [Gs of the precipitation surface of the surface-treated foil obtained in Example 10 (60 °)], the surface roughness (Rzjis) of the roughened surface of the roughened foil is shown in Table 6.
[比較例1]
この比較例は、特許文献2に記載された実施例1のトレース実験である。硫酸系銅電解液として、基本溶液は硫酸銅(試薬)と硫酸(試薬)とを純水に溶解し、硫酸銅(5水和物換算)濃度280g/l、フリー硫酸濃度90g/lとした。そして、特許文献2の実施例1に記載されたジアリルジアルキルアンモニウム塩と二酸化硫黄との共重合体(日東紡績株式会社製、商品名PAS−A−5、重量平均分子量4000)濃度4ppm、ポリエチレングリコール(平均分子量1000)濃度10ppm、MPS−Na濃度5ppmに調整し、更に塩化ナトリウムを用いて塩素濃度を20ppmに調製した硫酸酸性銅めっき液とした。
[Comparative Example 1]
This comparative example is a trace experiment of Example 1 described in Patent Document 2. As a sulfuric acid-based copper electrolyte, a basic solution was prepared by dissolving copper sulfate (reagent) and sulfuric acid (reagent) in pure water to obtain a copper sulfate (pentahydrate equivalent) concentration of 280 g / l and a free sulfuric acid concentration of 90 g / l. . The copolymer of diallyldialkylammonium salt and sulfur dioxide described in Example 1 of Patent Document 2 (manufactured by Nitto Boseki Co., Ltd., trade name PAS-A-5, weight average molecular weight 4000) concentration 4 ppm, polyethylene glycol (Molecular weight 1000) Adjusted to a concentration of 10 ppm and an MPS-Na concentration of 5 ppm , a sodium sulfate acidic copper plating solution was prepared using sodium chloride to adjust the chlorine concentration to 20 ppm.
そして、陽極には鉛板を用いて上記の電解液を液温40℃、電流密度50A/dm2で電解を行い、12μm及び210μm厚さの電解銅箔を得た。この電解銅箔の機械的特性を表2に、析出面の表面粗さ(Rzjis)及び光沢度[Gs(60°)]を表3に実施例と共に示す。 Then, a lead plate was used for the anode, and the above electrolytic solution was electrolyzed at a liquid temperature of 40 ° C. and a current density of 50 A / dm 2 to obtain electrolytic copper foils having thicknesses of 12 μm and 210 μm. The mechanical properties of this electrolytic copper foil are shown in Table 2, and the surface roughness (Rzjis) and glossiness [Gs (60 °)] of the deposition surface are shown in Table 3 together with examples.
[比較例2]
この比較例では、硫酸系銅電解液として、銅濃度90g/l、フリー硫酸濃度110g/lの溶液を活性炭フィルターに通して清浄処理した。ついで、この溶液にMPS−Na濃度1ppmと、高分子多糖類としてヒドロキシエチルセルロース濃度5ppm及び低分子量膠(数平均分子量1560)濃度4ppmと、塩素濃度30ppmとなるように、それぞれ添加して銅電解液を調製した。このようにして調製した銅電解液を用い、陽極にはDSA電極を用いて、液温58℃、電流密度50A/dm2で電解を行い、12μm及び210μm厚さの電解銅箔を得た。この電解銅箔の機械的特性を表2に、析出面の表面粗さ(Rzjis)及び光沢度等を表3に実施例と共に示す。
[Comparative Example 2]
In this comparative example, as a sulfuric acid-based copper electrolyte, a solution having a copper concentration of 90 g / l and a free sulfuric acid concentration of 110 g / l was passed through an activated carbon filter for cleaning treatment. Subsequently, an MPS-Na concentration of 1 ppm, a hydroxypolysaccharide concentration of 5 ppm as a high molecular polysaccharide, a low molecular weight glue (number average molecular weight 1560) concentration of 4 ppm, and a chlorine concentration of 30 ppm were added to this solution. Was prepared. The copper electrolyte thus prepared was used, and a DSA electrode was used as the anode, and electrolysis was performed at a liquid temperature of 58 ° C. and a current density of 50 A / dm 2 to obtain electrolytic copper foils having thicknesses of 12 μm and 210 μm. Table 2 shows the mechanical properties of this electrolytic copper foil, and Table 3 shows the surface roughness (Rzjis), glossiness, etc. of the deposited surface together with examples.
[比較例3]
この比較例では、硫酸系銅電解液として、銅濃度80g/l、フリー硫酸濃度140g/l、DDAC重合体(センカ(株)製ユニセンスFPA100L)濃度4ppm、塩素濃度15ppmの溶液を用いた。陽極にはDSA電極を用いて液温50℃、電流密度60A/dm2で電解し、12μm厚さの電解銅箔を得た。この電解銅箔の機械的特性を表2に、析出面の表面粗さ(Rzjis)及び光沢度等を表3に実施例と共に示す。
[Comparative Example 3]
In this comparative example, as the sulfuric acid-based copper electrolyte, a solution having a copper concentration of 80 g / l, a free sulfuric acid concentration of 140 g / l, a DDAC polymer (Unica FPA100L manufactured by Senca Co., Ltd.) and a chlorine concentration of 15 ppm was used. The anode was electrolyzed using a DSA electrode at a liquid temperature of 50 ° C. and a current density of 60 A / dm 2 to obtain an electrolytic copper foil having a thickness of 12 μm. Table 2 shows the mechanical properties of this electrolytic copper foil, and Table 3 shows the surface roughness (Rzjis), glossiness, etc. of the deposited surface together with examples.
[比較例4]
この比較例では、硫酸系銅電解液として、銅濃度80g/l、フリー硫酸濃度140g/l、DDAC重合体(センカ(株)製ユニセンスFPA100L)濃度4ppm、低分子量膠(数平均分子量1560)濃度6ppm、塩素濃度15ppmの溶液を用いた。陽極にはDSA電極を用いて液温50℃、電流密度60A/dm2で電解し、12μm厚さの電解銅箔を得た。この電解銅箔の機械的特性を表2に、析出面の表面粗さ(Rzjis)及び光沢度[Gs(60°)]を表3に実施例と共に示す。
[Comparative Example 4]
In this comparative example, as the sulfuric acid-based copper electrolyte, a copper concentration of 80 g / l, a free sulfuric acid concentration of 140 g / l, a DDAC polymer (Unicens FPA100L manufactured by Senka Co., Ltd.) concentration, a low molecular weight glue (number average molecular weight 1560) concentration A solution with 6 ppm and a chlorine concentration of 15 ppm was used. The anode was electrolyzed using a DSA electrode at a liquid temperature of 50 ° C. and a current density of 60 A / dm 2 to obtain an electrolytic copper foil having a thickness of 12 μm. The mechanical properties of this electrolytic copper foil are shown in Table 2, and the surface roughness (Rzjis) and glossiness [Gs (60 °)] of the deposition surface are shown in Table 3 together with examples.
[比較例5]
この比較例は、特許文献2に記載された実施例4のトレース実験である。硫酸系銅電解液の基本溶液は硫酸銅(試薬)と硫酸(試薬)とを純水に溶解し、硫酸銅(5水和物換算)濃度280g/l、フリー硫酸濃度90g/lとした。これをジアリルジアルキルアンモニウム塩と二酸化硫黄との共重合体(日東紡績株式会社製、商品名PAS−A−5、重量平均分子量4000)濃度4ppm、ポリエチレングリコール(平均分子量1000)濃度10ppm、MPS−Na濃度1ppmに調整し、更に塩化ナトリウムを用いて塩素濃度を20ppmに調整した。
[Comparative Example 5]
This comparative example is a trace experiment of Example 4 described in Patent Document 2. The basic solution of the sulfuric acid-based copper electrolyte solution was obtained by dissolving copper sulfate (reagent) and sulfuric acid (reagent) in pure water to have a copper sulfate (pentahydrate equivalent) concentration of 280 g / l and a free sulfuric acid concentration of 90 g / l. This is a copolymer of diallyldialkylammonium salt and sulfur dioxide (manufactured by Nitto Boseki Co., Ltd., trade name PAS-A-5, weight average molecular weight 4000) concentration 4 ppm, polyethylene glycol (average molecular weight 1000) concentration 10 ppm, MPS-Na. The concentration was adjusted to 1 ppm, and the chlorine concentration was further adjusted to 20 ppm using sodium chloride.
そして、陽極には鉛板を用いて上記の電解液を液温40℃、電流密度50A/dm2で電解を行い、12μm及び70μm厚さの電解銅箔を得、その後実施例10と同様にして表面処理電解銅箔2種を得た。この電解銅箔の常態及び180℃×60min.加熱後の機械的特性を表5に、そして、電解銅箔析出面の表面粗さ(Rzjis)、光沢度[Gs(20°)]、[Gs(60°)]及び[Gs(85°)]と表面処理後析出面の表面粗さ(Rzjis)と光沢度〔Gs(60°)〕、粗化処理箔の粗化面の表面粗さ(Rzjis)を表6に示す。 Then, a lead plate is used for the anode, and the above electrolytic solution is electrolyzed at a liquid temperature of 40 ° C. and a current density of 50 A / dm 2 to obtain electrolytic copper foils having thicknesses of 12 μm and 70 μm, and then the same as in Example 10. Thus, two types of surface-treated electrolytic copper foil were obtained. The normal state of this electrolytic copper foil and 180 ° C. × 60 min. Table 5 shows the mechanical properties after heating, and the surface roughness (Rzjis), gloss [Gs (20 °)], [Gs (60 °)] and [Gs (85 °) of the electrolytic copper foil deposition surface. ], Surface roughness (Rzjis) and glossiness [Gs (60 °)] of the precipitation surface after surface treatment, and surface roughness (Rzjis) of the roughened surface of the roughened foil are shown in Table 6.
[実施例と比較例との対比]
以降各比較例と実施例とを対比し、その結果を説明する。なお、実施例で得られた電解銅箔の析出面側は表面粗さ(Rzjis)<1.0μm、光沢度[Gs(60°)]≧400とそのTD/MD比は0.9〜1.1、そして[Gs(20°)]>[Gs(60°)]>[Gs(85°)]という本件発明の各条件を満足しているものである。そして機械的特性も常態の機械的特性は引張り強さが33kgf/mm2以上で伸び率が5%以上、加熱後の機械的特性は引張り強さが30kgf/mm2以上で伸び率が8%以上という本件発明の条件を満足している。
[Contrast between Example and Comparative Example]
Hereinafter, each comparative example and the example will be compared and the results will be described. In addition, as for the precipitation side of the electrolytic copper foil obtained in the Example, the surface roughness (Rzjis) <1.0 μm, the gloss [Gs (60 °)] ≧ 400, and the TD / MD ratio thereof is 0.9 to 1. .1 and [Gs (20 °)]> [Gs (60 °)]> [Gs (85 °)] The conditions of the present invention are satisfied. As for the mechanical properties, the normal mechanical properties are tensile strength of 33 kgf / mm 2 or more and elongation of 5% or more, and the mechanical properties after heating are tensile strength of 30 kgf / mm 2 or more and elongation of 8%. The above conditions of the present invention are satisfied.
実施例と比較例1との対比: 電解銅箔の析出面側の表面粗さ(Rzjis)を対比すると、比較例1の電解銅箔も良好な低プロファイル化が出来ている。しかし、本件発明に係る12μm電解銅箔の析出面の表面粗さ(Rzjis)は0.30μm〜0.41μmに対し比較例1の12μm電解銅箔の析出面の表面粗さ(Rzjis)は0.85μm、本件発明に係る210μm電解銅箔の析出面の表面粗さ(Rzjis)は0.27μm〜0.34μmに対し比較例1の210μm電解銅箔の析出面の表面粗さ(Rzjis)は0.70μmである。よって、銅箔厚みが増すに従ってより平滑な析出面が得られる傾向は共通しているが、平滑性の絶対値では本件発明に係る電解銅箔が優れている。また、光沢度[Gs(60°)]を比較すると、比較例1の光沢度[Gs(60°)]が221〜283の範囲にあるのに対し、各実施例の光沢度[Gs(60°)]は、603〜759という全く異なる範囲を示している。このことから、比較例1の電解銅箔と比べ、実施例の各電解銅箔はより平坦で鏡面に近い析出面を備えているといえる。そして、機械的特性については、比較例1の12μm電解銅箔は常態で引張り強さ36.2kgf/mm2、伸び率4.0%、加熱後は引張り強さ32.4kgf/mm2、伸び率5.6%であり、実施例の電解銅箔と同等と言えるのは常態における引張り強さだけである。 Comparison between Examples and Comparative Example 1: When the surface roughness (Rzjis) on the deposition surface side of the electrolytic copper foil is compared, the electrolytic copper foil of Comparative Example 1 has a good low profile. However, the surface roughness (Rzjis) of the deposited surface of the 12 μm electrolytic copper foil according to the present invention is 0.30 μm to 0.41 μm, whereas the surface roughness (Rzjis) of the deposited surface of the 12 μm electrolytic copper foil of Comparative Example 1 is 0. The surface roughness (Rzjis) of the deposition surface of the 210 μm electrolytic copper foil according to the present invention is .85 μm, while the surface roughness (Rzjis) of the deposition surface of the 210 μm electrolytic copper foil of Comparative Example 1 is 0.27 μm to 0.34 μm. 0.70 μm. Therefore, although the tendency that a smoother precipitation surface is obtained as the copper foil thickness increases is common, the electrolytic copper foil according to the present invention is superior in the absolute value of smoothness. Further, when the glossiness [Gs (60 °)] is compared, the glossiness [Gs (60 °)] of Comparative Example 1 is in the range of 221 to 283, whereas the glossiness [Gs (60 °)] indicates a completely different range of 603 to 759. From this, it can be said that each of the electrolytic copper foils of the examples has a more flat and nearly precipitated surface compared to the electrolytic copper foil of Comparative Example 1. And as for mechanical properties, the 12 μm electrolytic copper foil of Comparative Example 1 is in a normal state with a tensile strength of 36.2 kgf / mm 2 and an elongation of 4.0%, and after heating, a tensile strength of 32.4 kgf / mm 2 and an elongation. The rate is 5.6%, and only the tensile strength in the normal state can be said to be equivalent to the electrolytic copper foil of the example.
実施例と比較例2との対比: 電解銅箔の析出面側の表面粗さ(Rzjis)を対比すると、比較例2の電解銅箔も良好な低プロファイル化は出来ている。しかし、本件発明に係る12μm電解銅箔の析出面の表面粗さ(Rzjis)は0.30μm〜0.41μmに対し比較例2の12μm電解銅箔の析出面の表面粗さ(Rzjis)は0.83μm、本件発明に係る210μm電解銅箔の析出面の表面粗さ(Rzjis)は0.27μm〜0.34μmに対し比較例2の210μm電解銅箔の析出面の表面粗さ(Rzjis)は1.22μmである。よって、比較例2では銅箔厚みが増すことにより析出面の平滑性が損なわれていることから安定して平滑な電解銅箔を得ることは困難であると考えられる。そして、機械的特性については、比較例2の12μm電解銅箔は常態で引張り強さ31.4kgf/mm2、伸び率3.5%、加熱後は引張り強さ26.8kgf/mm2、伸び率5.8%であり、実施例の各電解銅箔の方が優れている。 Comparison between Example and Comparative Example 2: When the surface roughness (Rzjis) on the deposition surface side of the electrolytic copper foil is compared, the electrolytic copper foil of Comparative Example 2 has a good low profile. However, the surface roughness (Rzjis) of the deposition surface of the 12 μm electrolytic copper foil according to the present invention is 0.30 μm to 0.41 μm, whereas the surface roughness (Rzjis) of the deposition surface of the 12 μm electrolytic copper foil of Comparative Example 2 is 0. The surface roughness (Rzjis) of the deposited surface of the 210 μm electrolytic copper foil according to the present invention is 0.27 μm to 0.34 μm, whereas the surface roughness (Rzjis) of the deposited surface of the 210 μm electrolytic copper foil of Comparative Example 2 is 0.83 μm. 1.22 μm. Therefore, in Comparative Example 2, it is considered that it is difficult to obtain a stable and smooth electrolytic copper foil because the smoothness of the deposited surface is impaired by increasing the copper foil thickness. As for mechanical properties, the 12 μm electrolytic copper foil of Comparative Example 2 is in a normal state with a tensile strength of 31.4 kgf / mm 2 and an elongation of 3.5%, and after heating, a tensile strength of 26.8 kgf / mm 2 and elongation. The rate is 5.8%, and the electrolytic copper foils of the examples are superior.
実施例と比較例3との対比: 比較例3は、銅電解液にMPSやSPSが無い場合の効果を見るためのものである。表3から明らかなように、銅電解液中にMPS等を含ませない比較例3で得られた電解銅箔の析出面の表面粗さ(Rzjis)は3.60μmを示しており、低プロファイル化が達成出来ていない。そして、光沢度[Gs(60°)]に到ってはほぼ艶消し状態となるため0.7と極めて低い値を示している。そして、12μm電解銅箔の機械的特性では引張り強さが40.5kgf/mm2と大きな値を示すものの伸び率が3.6%と低く、加熱による変化が小さいものである。よって、表面粗さ及び伸び率において本件発明に係る電解銅箔の方が優れていると言える。 Comparison between Example and Comparative Example 3 Comparative Example 3 is for observing the effect when MPS or SPS is not present in the copper electrolyte. As is apparent from Table 3, the surface roughness (Rzjis) of the deposited surface of the electrolytic copper foil obtained in Comparative Example 3 in which MPS or the like is not included in the copper electrolyte solution is 3.60 μm, which is a low profile. Has not been achieved. Further, the glossiness [Gs (60 °)] is almost matte and thus shows a very low value of 0.7. The mechanical properties of the 12 μm electrolytic copper foil have a large tensile strength of 40.5 kgf / mm 2 , but the elongation is low at 3.6%, and the change due to heating is small. Therefore, it can be said that the electrolytic copper foil according to the present invention is superior in surface roughness and elongation.
実施例と比較例4との対比: 比較例4は、銅電解液にMPSの代わりに低分子膠を添加した場合の効果を見ている。この結果、表3から明らかに分かるように、銅電解液中にMPSの代わりに低分子膠を含ませても、電解銅箔の析出面の表面粗さ(Rzjis)は3.59μmを示しており、低プロファイル化が達成出来ていない。そして、光沢度[Gs(60°)]に到ってはほぼ艶消し状態となるため1.0と極めて低い値を示している。そして、機械的特性においては、常態の引張り強さが38.6kgf/mm2と実施例と同等の値を示すものの伸び率が4.0%と低く、比較例3同様加熱による変化が小さいものである。よって、表面粗さ及び伸び率において本件発明に係る電解銅箔の方が優れていると言える。 Comparison between Example and Comparative Example 4 Comparative Example 4 shows the effect when low molecular weight glue is added to the copper electrolyte instead of MPS. As a result, as clearly shown in Table 3, even when low molecular weight glue is included in the copper electrolyte instead of MPS, the surface roughness (Rzjis) of the deposited surface of the electrolytic copper foil is 3.59 μm. And low profile is not achieved. Further, since the glossiness [Gs (60 °)] is almost matte, it shows a very low value of 1.0. In the mechanical properties, the normal tensile strength is 38.6 kgf / mm 2, which is the same value as that of the example, but the elongation is as low as 4.0%. It is. Therefore, it can be said that the electrolytic copper foil according to the present invention is superior in surface roughness and elongation.
実施例と比較例5との対比:以降表5及び表6に記載のデータを参照しつつ実施例と比較例5とを12μm電解銅箔同士で対比する。 Comparison between Example and Comparative Example 5: The Example and Comparative Example 5 are compared between 12 μm electrolytic copper foils with reference to the data shown in Table 5 and Table 6 below.
析出面側の表面粗さ(Rzjis)を対比すると、実施例で得られた電解銅箔では0.30μm〜0.41μmであり、比較例5で得られた電解銅箔では析出面の表面粗さ(Rzjis)が1.00μmとその差は明らかである。そして、析出面側の光沢度は[Gs(60°)]だけでみても、比較例5で得られた電解銅箔では324〜383の範囲にあるのに対し、実施例で得られた電解銅箔では、603〜759という全く異なる範囲にある。即ち、比較例5の電解銅箔と比べ、実施例の電解銅箔は、より平坦で鏡面に近い析出面を備えている。そして常態の機械的特性は、比較例5の電解銅箔の引張り強さ37.9kgf/mm2、伸び率8.0%と比べ、実施例10の電解銅箔は引張り強さ35.5kgf/mm2、そして伸び率は11.5%を示しておりやや柔軟性に富むものである。そして180℃×60min.加熱後の機械的特性は、比較例5の電解銅箔の引張り強さ31.6kgf/mm2、伸び率7.5%と比べ、実施例10の電解銅箔は引張り強さ33.2kgf/mm2、そして伸び率は11.2%を示しており本件発明に係る電解銅箔の方が優れている。この結果から、銅張積層板に加工される際の熱履歴を考えると、例えば本件発明に係る電解銅箔を用いたフレキシブルプリント配線板とした場合には優れた耐屈曲性などが期待できる。 When the surface roughness (Rzjis) on the precipitation surface side is compared, it is 0.30 μm to 0.41 μm in the electrolytic copper foil obtained in the example, and the surface roughness of the precipitation surface in the electrolytic copper foil obtained in Comparative Example 5 The difference (Rzjis) is 1.00 μm, which is obvious. And even if only the glossiness of the precipitation surface side is [Gs (60 °)], the electrolytic copper foil obtained in Comparative Example 5 is in the range of 324 to 383, whereas the electrolysis obtained in Examples is used. In copper foil, it exists in the completely different range of 603-759. That is, compared with the electrolytic copper foil of the comparative example 5, the electrolytic copper foil of an Example is provided with the precipitation surface which is flatter and near a mirror surface. The normal mechanical properties were as follows: the tensile strength of the electrolytic copper foil of Comparative Example 5 was 37.9 kgf / mm 2 , and the elongation was 8.0%. The electrolytic copper foil of Example 10 had a tensile strength of 35.5 kgf / mm 2 . mm 2 , and the elongation is 11.5%, which is somewhat flexible. And 180 ° C. × 60 min. The mechanical properties after heating were as follows: the tensile strength of the electrolytic copper foil of Comparative Example 5 was 31.6 kgf / mm 2 and the elongation was 7.5%. The electrolytic copper foil of Example 10 had a tensile strength of 33.2 kgf / mm 2 . mm 2 and the elongation percentage are 11.2%, and the electrolytic copper foil according to the present invention is superior. From this result, considering the thermal history when processed into a copper-clad laminate, for example, a flexible printed wiring board using the electrolytic copper foil according to the present invention can be expected to have excellent bending resistance.
次に、表面の均一性を測る指標として3種類の光沢度を用いることの優位性を確認した。実施例で得られた12μm電解箔の析出面でMDを共通方向として光沢度の違いを見ると、[Gs(20°)]では824〜1206、[Gs(60°)]では649〜759そして[Gs(85°)]では112〜142であり、測定光の入射角度が垂直に近づくほど大きな数値となっている。これに対し、比較例5で得られた12μm電解銅箔の析出面側のMD方向で測定したときの評価結果を見てみると、[Gs(20°)]では126、[Gs(60°)]では383そして[Gs(85°)]では117となっており、[Gs(20°)]と[Gs(85°)]でほぼ同等の値を示している。従って、比較例5で得られた12μm電解銅箔の析出面には何らかの特徴的な形状が備わっているのである。 Next, the superiority of using three kinds of glossiness as an index for measuring the surface uniformity was confirmed. When the difference in glossiness is seen with MD as a common direction on the deposition surface of the 12 μm electrolytic foil obtained in the example, it is 824 to 1206 in [Gs (20 °)], 649 to 759 in [Gs (60 °)], and [Gs (85 °)] is 112 to 142, and becomes larger as the incident angle of the measurement light approaches perpendicularly. On the other hand, when the evaluation result when measured in the MD direction on the deposition surface side of the 12 μm electrolytic copper foil obtained in Comparative Example 5 is 126 in [Gs (20 °)], [Gs (60 °). )] Is 383 and [Gs (85 °)] is 117, and [Gs (20 °)] and [Gs (85 °)] are almost equal. Therefore, the deposition surface of the 12 μm electrolytic copper foil obtained in Comparative Example 5 has some characteristic shape.
そこで、実施例11で得られた12μm電解銅箔析出面のSEM写真を図1に、比較例5で得られた12μm電解銅箔析出面のSEM写真を図2に示す。図2から明らかなように比較例5で得られた電解銅箔表面には小さいながら凹凸が観察されているほかに高倍率で観察しなければ発見できない異常析出部も散見される。すなわち、この凹凸部分での光の乱反射が光沢度[Gs(20°)]の値を小さくし、表面粗さ(Rzjis)を大きくしているのである。そして、本件発明に係る電解銅箔のSEM写真である図1には明らかな凹凸は観察されておらずまた異常析出部も観察されていない。よって本件発明に係る電解銅箔は表面粗さ、光沢度が均一で優れているのである。 Therefore, FIG. 1 shows an SEM photograph of the 12 μm electrolytic copper foil deposited surface obtained in Example 11, and FIG. 2 shows an SEM photograph of the 12 μm electrolytic copper foil deposited surface obtained in Comparative Example 5. As can be seen from FIG. 2, irregularities are observed on the surface of the electrolytic copper foil obtained in Comparative Example 5 although they are small, and there are some abnormal precipitates that cannot be found unless observed at a high magnification. That is, the irregular reflection of light at the uneven portion decreases the glossiness [Gs (20 °)] value and increases the surface roughness (Rzjis). And in FIG. 1 which is the SEM photograph of the electrolytic copper foil which concerns on this invention, clear unevenness | corrugation is not observed and the abnormal precipitation part is not observed. Therefore, the electrolytic copper foil according to the present invention has excellent surface roughness and glossiness.
そして、粗化処理を施した表面処理電解銅箔を比較してみると、実施例10と比較例5との対比において、同一条件で実施した粗化処理による表面粗さ(Rzjis)の値の増加幅は約0.7μmと、ほぼ同程度となっている。これは図2から判るように比較例5で得られた電解銅箔の析出面形状に見られる凹凸は3μm前後のピッチをもっているが扁平であるため、粗化処理で得られた微細粒子がそれぞれの凹凸の形状に沿って付着しているためであると推測できる。しかし、比較例5の電解銅箔ではベースとなる析出面の表面粗さ(Rzjis)が大きいために本件発明の要件としている絶縁層構成材料との接着面の表面粗さ(Rzjis)を1.5μm以下とすることができず、本件発明に係る電解銅箔の優位性は明確である。 Then, comparing the surface-treated electrolytic copper foil subjected to the roughening treatment, in comparison between Example 10 and Comparative Example 5, the value of the surface roughness (Rzjis) by the roughening treatment carried out under the same conditions The increase width is about 0.7 μm, which is almost the same. As can be seen from FIG. 2, the irregularities seen in the shape of the deposited surface of the electrolytic copper foil obtained in Comparative Example 5 have a pitch of about 3 μm but are flat, so that the fine particles obtained by the roughening treatment are respectively It can be assumed that this is because it adheres along the uneven shape. However, since the electrolytic copper foil of Comparative Example 5 has a large surface roughness (Rzjis) of the precipitation surface serving as a base, the surface roughness (Rzjis) of the adhesion surface with the insulating layer constituting material, which is a requirement of the present invention, is 1. It cannot be made 5 μm or less, and the superiority of the electrolytic copper foil according to the present invention is clear.
MPSとSPSとの対比: 実施例9〜実施例14ではMPSの代替としてSPSを用いているが、得られた12μm電解銅箔は析出面の表面粗さ(Rzjis)は0.30μm〜0.41μm、光沢度[Gs(60°)]は603〜759であり、SPSを用いてもMPSと同じ効果が得られることが確認できている。 Comparison of MPS and SPS: In Examples 9 to 14, SPS was used as an alternative to MPS, but the obtained 12 μm electrolytic copper foil had a surface roughness (Rzjis) of the deposited surface of 0.30 μm to 0. 0. 41 [mu] m and glossiness [Gs (60 [deg.])] Are 603 to 759, and it has been confirmed that the same effect as MPS can be obtained even when SPS is used.
なお、上記実施例では本件発明に係る電解銅箔の製造に際しては硫酸系銅電解液の銅濃度を40g/l〜120g/l、フリー硫酸濃度を60g/l〜220g/l程度とした溶液構成にて良好な結果を得ているが、目的とする用途に応じて濃度範囲を変更しても構わないのである。そして、上記実施例に記載の添加剤以外の添加剤類の存在を否定しているものでもなく、上記添加剤類の効果を更に際だたせたり、連続生産時の品質安定化に寄与できること等が確認されているものであれば任意に添加して構わないのである。 In addition, in the said Example, in the manufacture of the electrolytic copper foil which concerns on this invention, the copper structure of sulfuric acid type copper electrolyte solution made 40 g / l-120 g / l, and the free sulfuric acid density | concentration made about 60 g / l-220 g / l. Although good results have been obtained, the concentration range may be changed according to the intended application. And it does not deny the presence of additives other than the additives described in the above examples, it can further emphasize the effects of the additives, can contribute to quality stabilization during continuous production, etc. If it is confirmed, it may be added arbitrarily.
本件発明に係る電解銅箔の析出面は、従来市場に供給されてきた低プロファイル電解銅箔に比べ更に低プロファイルであり、その析出面の粗さが光沢面の粗さ以下となり、両面共に光沢のある平滑面となる。そして電解箔の製造に供される銅電解液は製造条件の変動及び厚みのバリエーションに対する適応力が大きく、生産性に優れたものなのである。よって、テープ オートメーティド ボンディング(TAB)基板やチップ オン フィルム(COF)基板のファインピッチ回路、さらにはプラズマディスプレイパネルの電磁波遮蔽用回路の形成に好適である。そして、この電解銅箔は優れた機械的特性を有することからリチウムイオン二次電池等の負極を構成する集電材としての使用にも適している。 The deposited surface of the electrolytic copper foil according to the present invention has a lower profile than the low profile electrolytic copper foil that has been supplied to the market, and the roughness of the deposited surface is less than that of the glossy surface. It becomes a smooth surface with And the copper electrolyte solution used for manufacture of electrolytic foil has a large adaptability with respect to variations in manufacturing conditions and variations in thickness, and is excellent in productivity. Therefore, it is suitable for forming a fine pitch circuit of a tape automated bonding (TAB) substrate and a chip on film (COF) substrate, and further, an electromagnetic wave shielding circuit of a plasma display panel. And since this electrolytic copper foil has the outstanding mechanical characteristic, it is suitable also for the use as a current collection material which comprises negative electrodes, such as a lithium ion secondary battery.
Claims (12)
当該電解銅箔の析出面は、その表面粗さ(Rzjis)が1.0μm未満、光沢度[Gs(20°)]>光沢度[Gs(60°)]の関係を備え且つ光沢度[Gs(60°)]が400以上、及び幅方向で測定したTD光沢度[Gs(60°)]と流れ方向で測定したMD光沢度[Gs(60°)]との比([TD光沢度]/[MD光沢度])が0.9〜1.1の諸特性を備え、
当該電解銅箔の光沢面は、その表面粗さ(Rzjis)が2.0μm未満であり、且つ、光沢度[Gs(60°)]が70以上であることを特徴とする電解銅箔。 In an electrolytic copper foil obtained by an electrolytic method using a copper electrolyte,
The deposited surface of the electrolytic copper foil has a surface roughness (Rzjis) of less than 1.0 μm, a relationship of gloss [Gs (20 °)]> gloss [Gs (60 °)], and gloss [Gs (60 °)] is 400 or more , and the ratio between the TD glossiness [Gs (60 °)] measured in the width direction and the MD glossiness [Gs (60 °)] measured in the flow direction ([TD glossiness] / [MD glossiness]) has various properties of 0.9 to 1.1,
The electrolytic copper foil is characterized in that the glossy surface of the electrolytic copper foil has a surface roughness (Rzjis) of less than 2.0 μm and a glossiness [Gs (60 °)] of 70 or more.
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| KR20230062105A (en) * | 2021-10-29 | 2023-05-09 | 롯데에너지머티리얼즈 주식회사 | Electrolytic copper foil with high elongation and high strength characteristic |
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2006
- 2006-12-15 JP JP2006338083A patent/JP4065004B2/en not_active Expired - Lifetime
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