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JP4094596B2 - Temperature control device - Google Patents
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JP4094596B2 - Temperature control device - Google Patents

Temperature control device Download PDF

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JP4094596B2
JP4094596B2 JP2004257536A JP2004257536A JP4094596B2 JP 4094596 B2 JP4094596 B2 JP 4094596B2 JP 2004257536 A JP2004257536 A JP 2004257536A JP 2004257536 A JP2004257536 A JP 2004257536A JP 4094596 B2 JP4094596 B2 JP 4094596B2
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sample
temperature control
lid
heat transfer
control device
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JP2006071556A (en
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宏敬 地天
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Espec Corp
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Espec Corp
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Description

本発明は、試料の温度を制御する温度制御装置に関するものである。   The present invention relates to a temperature control device that controls the temperature of a sample.

図15は、特許文献1に開示されている環境試験装置51の構成図である。環境試験装置51は、温度制御機構54により温度制御された空気を、断熱箱52で形成した試験槽53内に供給し、試験槽53内に配置したワーク載置台56上の被試験品55を冷却あるいは加熱する。被試験品55と熱交換した空気は、試験槽53内から空気流通口58を介して排出される。また、ワーク載置台56には蓄熱部57が設けてあり、被試験品55は、ワーク載置台56からも熱伝達されて温度制御されるようになっている。   FIG. 15 is a configuration diagram of the environmental test apparatus 51 disclosed in Patent Document 1. The environmental test apparatus 51 supplies the air whose temperature is controlled by the temperature control mechanism 54 into the test tank 53 formed by the heat insulating box 52, and the test object 55 on the workpiece mounting table 56 arranged in the test tank 53 is supplied. Cool or heat. The air exchanged heat with the device under test 55 is discharged from the inside of the test tank 53 through the air circulation port 58. In addition, the work mounting table 56 is provided with a heat storage unit 57, and the product under test 55 is also subjected to heat transfer from the work mounting table 56 and temperature controlled.

ところで、この環境試験装置51は、被試験品55を収容した試験槽53内に温風又は冷風を供給して被試験品55の温度を制御するため、装置が大型化してしまう。また、一定温度の空気を被試験品55に接触させて、被試験品55の温度を制御することはできるが、ワーク載置台56上に複数の被試験品55を配置した場合、被試験品55がLEDやフォトダイオードなどの高周波用途のものであれば、隣接する他の被試験品55の発する電磁波がノイズとなる。そのため、このような環境試験装置51では、被試験品55を一品ずつ試験する必要があり、多数の被試験品55を同時に試験することができなかった。
特開2003−294797公報
By the way, since this environmental test apparatus 51 controls the temperature of the DUT 55 by supplying hot air or cold air into the test tank 53 that houses the DUT 55, the apparatus becomes large. Further, the temperature of the DUT 55 can be controlled by bringing air at a constant temperature into contact with the DUT 55. However, when a plurality of DUTs 55 are arranged on the workpiece mounting table 56, the DUT If 55 is for high-frequency applications such as LEDs and photodiodes, the electromagnetic waves emitted by other adjacent products under test 55 become noise. Therefore, in such an environmental test apparatus 51, it is necessary to test the products under test 55 one by one, and it was not possible to test a large number of products under test 55 at the same time.
JP 2003-294797 A

そこで本発明は、熱伝導性が極めて良好で、且つ、同時に多数の試料を試験することができる温度制御装置を提供することを課題としている。   Therefore, an object of the present invention is to provide a temperature control apparatus that has extremely good thermal conductivity and can simultaneously test a large number of samples.

上記課題を解決するため、請求項1の発明では、加熱装置又は冷却装置で所定の温度まで加熱又は冷却される熱伝達プレート上に試料載置部を設け、前記試料載置部に配置した試料の温度制御を行う温度制御装置において、前記試料載置部に配置した試料を覆う蓋を設けて試料の上方に停止した空気層を形成し、前記蓋は、前記熱伝達プレートから熱伝達され、熱伝達プレートと蓋とで形成した室内の前記空気層の空気が、熱伝達プレートと蓋とから熱伝達され、試料の温度を、前記熱伝達プレートと前記空気とで制御するようにした。   In order to solve the above-mentioned problem, in the invention of claim 1, a sample placing portion is provided on a heat transfer plate heated or cooled to a predetermined temperature by a heating device or a cooling device, and the sample is placed on the sample placing portion. In the temperature control device that performs temperature control of the above, a lid that covers the sample placed on the sample mounting portion is provided to form an air layer stopped above the sample, and the lid is thermally transferred from the heat transfer plate, The air in the air layer in the room formed by the heat transfer plate and the lid is heat-transferred from the heat transfer plate and the lid, and the temperature of the sample is controlled by the heat transfer plate and the air.

請求項2の発明では請求項1の発明において、前記熱伝達プレート上にくぼみを形成し、前記くぼみ内に試料載置部を設けた。
くぼみの深さの寸法は、試料の高さの寸法より大きくても小さくてもよい。試料がくぼみ内に完全に収容されると、くぼみの内側壁から熱伝達され易くなる。
According to a second aspect of the present invention, in the first aspect of the present invention, a recess is formed on the heat transfer plate, and a sample mounting portion is provided in the recess.
The depth of the recess may be larger or smaller than the height of the sample. When the sample is completely contained in the recess, heat transfer from the inner wall of the recess is facilitated.

請求項3の発明では請求項1又は2の発明において、複数個の試料を、間隔を置いて配置し、各試料を各々別の蓋で覆った。
一つの広域の試料載置部に、複数個の試料を配置してもよいし、複数の試料載置部を設け、各試料載置部に、各々試料を配置するようにしてもよい。
In the invention of claim 3, in the invention of claim 1 or 2, a plurality of samples are arranged at intervals, and each sample is covered with a separate lid.
A plurality of samples may be arranged on one wide sample mounting section, or a plurality of sample mounting sections may be provided, and the samples may be arranged on each sample mounting section.

請求項4の発明では請求項3の発明において、前記蓋に磁気シールド材を備えた。   In the invention of claim 4, in the invention of claim 3, the lid is provided with a magnetic shield material.

請求項5の発明では請求項1〜4のうちのいずれかの発明において、試料載置部に熱伝導シートを備え、前記熱伝導シート上に試料を配置した。
吸着性を有する熱伝導シートを採用すると、試料載置部に試料を固定する作業が不要になり、作業時間を大幅に短縮することができる。
According to a fifth aspect of the present invention, in any one of the first to fourth aspects of the present invention, the sample mounting portion is provided with a heat conductive sheet, and the sample is disposed on the heat conductive sheet.
When the heat conductive sheet having adsorptivity is employed, the work of fixing the sample to the sample mounting portion becomes unnecessary, and the working time can be greatly shortened.

請求項6の発明では、請求項1〜5のうちのいずれかの発明において、前記蓋に、発光部を備えた試料を観察可能にする透明な部材が嵌め込まれた孔を設けた。 According to a sixth aspect of the present invention, in the invention according to any one of the first to fifth aspects, the lid is provided with a hole into which a transparent member that allows observation of a sample having a light emitting portion is fitted .

請求項1の発明では、加熱装置又は冷却装置で所定の温度まで加熱又は冷却される熱伝達プレート上に試料載置部を設け、この試料載置部に配置した試料を覆う蓋を設けた。この蓋は熱伝達プレートから熱伝達されるので、熱伝達プレートと蓋とで形成した室内の停止した空気層の空気が、熱伝達プレートと蓋とで加熱されて昇温し、この空気と熱伝達プレートとで試料を周囲から加熱することができるので、試料の温度を部分的に偏ることなく一様に上昇させることができる。   According to the first aspect of the present invention, the sample mounting portion is provided on the heat transfer plate heated or cooled to a predetermined temperature by the heating device or the cooling device, and the cover for covering the sample placed on the sample mounting portion is provided. Since the lid transfers heat from the heat transfer plate, the air in the stopped air layer formed by the heat transfer plate and the lid is heated by the heat transfer plate and the lid, and the temperature rises. Since the sample can be heated from the surroundings with the transmission plate, the temperature of the sample can be raised uniformly without partial deviation.

請求項2の発明では、熱伝達プレート上にくぼみを形成し、このくぼみ内に試料載置部を設けたので、空気が、くぼみの内側壁から加熱されて昇温し易くなり、試料の温度を速やかに調整することができる。   In the invention of claim 2, since the recess is formed on the heat transfer plate and the sample mounting portion is provided in the recess, the temperature of the sample is easily increased by heating air from the inner wall of the recess. Can be adjusted quickly.

請求項3の発明を実施すると、複数個の試料を、同時に、同じ環境下で試験することができる。そのため、多数の試料を短時間で試験することができる。   When the invention of claim 3 is carried out, a plurality of samples can be simultaneously tested under the same environment. Therefore, many samples can be tested in a short time.

請求項4の発明では、蓋に磁気シールド材を備えたので、試料が高周波用途の部品であっても、隣接する他の試料の影響を受けることなく、複数個の試料を同時に試験することができる。従って、試験の信頼性が向上し、試料の性能の均一化が図り易くなる。   In the invention of claim 4, since the lid is provided with a magnetic shield material, a plurality of samples can be tested at the same time without being influenced by other adjacent samples even if the sample is a component for high frequency applications. it can. Therefore, the reliability of the test is improved, and the performance of the sample is easily made uniform.

請求項5の発明では、試料載置部に熱伝導シートを備え、この熱伝導シート上に試料を配置するようにしたので、試料への熱伝達を、より良好にすることができる。   According to the fifth aspect of the present invention, since the sample mounting portion is provided with the heat conductive sheet and the sample is disposed on the heat conductive sheet, the heat transfer to the sample can be further improved.

請求項6の発明では、発光部を備えた試料を観察可能にする透明な部材が嵌め込まれた孔を設けたので、温度制御を行いながら試料の発光状態を確認することができる。 According to the sixth aspect of the present invention, since the hole fitted with a transparent member that enables observation of the sample having the light emitting portion is provided, the light emission state of the sample can be confirmed while performing temperature control.

図1は、請求項1の発明を実施した温度制御装置1の斜視図である。図1に示すように温度制御装置1は、上面に試料載置部3を備えた熱伝達プレート2と、蓋4とで構成されている。熱伝達プレート2は、アルミ合金等の熱伝達率の良好な金属で構成されており、図示しない加熱装置又は冷却装置で加熱又は冷却が可能となっている。蓋4も熱伝達プレート2と同様にアルミ合金等の熱伝達率の良好な金属で構成されている。   FIG. 1 is a perspective view of a temperature control apparatus 1 embodying the invention of claim 1. As shown in FIG. 1, the temperature control device 1 includes a heat transfer plate 2 having a sample placement unit 3 on the upper surface, and a lid 4. The heat transfer plate 2 is made of a metal having a good heat transfer coefficient such as an aluminum alloy, and can be heated or cooled by a heating device or a cooling device (not shown). Similarly to the heat transfer plate 2, the lid 4 is also made of a metal having a good heat transfer coefficient such as an aluminum alloy.

図1に示す熱伝達プレート2には、2つの試料載置部3が設けてあり、そのうちの一方の試料載置部3のみに、蓋4が設置してある。試料載置部3上には、試料10が設置されている。図示していないが、試料10は、例えばねじ、吸着性又は接着性を有するシート材、板ばね等で試料載置部3に固定される。   The heat transfer plate 2 shown in FIG. 1 is provided with two sample placement units 3, and a lid 4 is provided only on one of the sample placement units 3. A sample 10 is installed on the sample placement unit 3. Although not shown, the sample 10 is fixed to the sample mounting portion 3 with, for example, a screw, an adsorbing or adhesive sheet material, a leaf spring, or the like.

試料載置部3に試料10を固定した後、蓋4を被せる。その後、熱伝達プレート2が所定の温度まで加熱又は冷却される。蓋4は、熱伝達プレート2と同様に熱伝達率が良好なので、熱伝達プレート2から速やかに熱伝達(加熱又は冷却)されて、熱伝達プレート2と蓋4は均一の温度になる。   After fixing the sample 10 to the sample mounting portion 3, the lid 4 is put on. Thereafter, the heat transfer plate 2 is heated or cooled to a predetermined temperature. Since the cover 4 has a good heat transfer coefficient as with the heat transfer plate 2, the heat transfer plate 2 is quickly transferred (heated or cooled), and the heat transfer plate 2 and the cover 4 have a uniform temperature.

さらに、試料10が収容された内部空間25内(後述する図4に示す)の空気が、熱伝達プレート2と蓋4から熱伝達(加熱又は冷却)され、試料10は、この空気と熱伝達プレート2により、周囲から熱伝達されて、温度分布を生じさせることなく、一様に加熱又は冷却される。   Furthermore, the air in the internal space 25 (shown in FIG. 4 described later) in which the sample 10 is accommodated is heat transferred (heated or cooled) from the heat transfer plate 2 and the lid 4, and the sample 10 transfers heat with this air. Heat is transferred from the surroundings by the plate 2 and uniformly heated or cooled without causing a temperature distribution.

図2は、請求項2の発明を実施した温度制御装置11の斜視図である。温度制御装置11の構成は、熱伝達プレート2上にくぼみ5を形成し、このくぼみ5内に試料載置部3を設けた点のみが図1の温度制御装置1の構成と異なっており、その他の構成は温度制御装置1と同じである。   FIG. 2 is a perspective view of the temperature control device 11 embodying the invention of claim 2. The configuration of the temperature control device 11 is different from the configuration of the temperature control device 1 of FIG. 1 only in that a recess 5 is formed on the heat transfer plate 2 and the sample placement portion 3 is provided in the recess 5. Other configurations are the same as those of the temperature control apparatus 1.

図2に示すように、蓋4は、くぼみ5にちょうど嵌合可能な大きさであり、蓋4の下部側面は、熱伝達プレート2と接触しており、図1の温度制御装置1のように、単に熱伝達プレート2上に設置した場合と比較して、蓋4と熱伝達プレート2との接触面積が大きく、より効率的な熱伝達が可能となっている。   As shown in FIG. 2, the lid 4 has a size that can be fitted into the recess 5, and the lower side surface of the lid 4 is in contact with the heat transfer plate 2, as in the temperature control device 1 of FIG. 1. Furthermore, compared with the case where it installs on the heat transfer plate 2 simply, the contact area of the lid | cover 4 and the heat transfer plate 2 is large, and more efficient heat transfer is possible.

図3は、請求項5の発明を実施した温度制御装置12の斜視図である。温度制御装置12の構成は、熱伝達プレート2上に熱伝導シート6を貼付し、この熱伝導シート6上に試料載置部3を形成し、試料10を設置するようにした点のみが、図1の温度制御装置1の構成と異なっている。   FIG. 3 is a perspective view of the temperature control device 12 embodying the invention of claim 5. The configuration of the temperature control device 12 is only that the heat conduction sheet 6 is pasted on the heat transfer plate 2, the sample placement portion 3 is formed on the heat conduction sheet 6, and the sample 10 is placed. It differs from the structure of the temperature control apparatus 1 of FIG.

熱伝導シート6は、熱伝達プレート2、蓋4及び試料10との密着性を向上させるので、熱伝達効果が高くなる。その分だけ温度制御装置12は、図1の温度制御装置1よりも効率的に試料10の温度を制御することができる。   Since the heat conductive sheet 6 improves the adhesion between the heat transfer plate 2, the lid 4 and the sample 10, the heat transfer effect is enhanced. Accordingly, the temperature control device 12 can control the temperature of the sample 10 more efficiently than the temperature control device 1 of FIG.

図4は、請求項4の発明を実施した温度制御装置13の断面図である。温度制御装置13の構成は、蓋4の内面に電磁波を吸収する磁気シールド材7を備えた点のみが、図1の温度制御装置1の構成と異なっている。   FIG. 4 is a cross-sectional view of the temperature control device 13 in which the invention of claim 4 is implemented. The configuration of the temperature control device 13 is different from the configuration of the temperature control device 1 of FIG. 1 only in that a magnetic shield material 7 that absorbs electromagnetic waves is provided on the inner surface of the lid 4.

蓋4に磁気シールド材7を設けることにより、試料10が、LEDやフォトダイオード等の高周波用途の光関係デバイスである場合に、隣接する他の試料10が発する電磁波のノイズの影響を受けることがない。なお、図4の例では、磁気シールド材7は、蓋4の内面に設けているが、蓋4の外面に設ける、又は、内蔵しても差し支えない。   By providing the magnetic shield material 7 on the lid 4, when the sample 10 is an optical device for high frequency applications such as an LED or a photodiode, it may be affected by the noise of electromagnetic waves emitted by other adjacent samples 10. Absent. In the example of FIG. 4, the magnetic shield material 7 is provided on the inner surface of the lid 4, but it may be provided on the outer surface of the lid 4 or built in.

図5〜図9は、さらに別の構成を備えた温度制御装置14〜18の断面図である。図5に示す温度制御装置14には、熱伝達プレート2にくぼみ5が設けてあり、又、蓋4の内面には磁気シールド材7が設けてある。蓋4は、くぼみ5と嵌合している。   5-9 is sectional drawing of the temperature control apparatuses 14-18 provided with another structure. In the temperature control device 14 shown in FIG. 5, the recess 5 is provided in the heat transfer plate 2, and the magnetic shield material 7 is provided on the inner surface of the lid 4. The lid 4 is fitted with the recess 5.

図6に示す温度制御装置15では、くぼみ5(試料載置部3)に試料10が嵌合しており、磁気シールド材7を備えた蓋4が、熱伝達プレート2上に配置されている。温度制御装置15の例では、試料10が、底面のみならず側面も熱伝達プレート2と接触しているので、極めて良好に温度制御することができる。   In the temperature control device 15 shown in FIG. 6, the sample 10 is fitted in the recess 5 (sample mounting portion 3), and the lid 4 provided with the magnetic shield material 7 is disposed on the heat transfer plate 2. . In the example of the temperature control device 15, since the sample 10 is in contact with the heat transfer plate 2 not only at the bottom but also at the side, the temperature can be controlled very well.

図7に示す温度制御装置16では、熱伝達プレート2上に熱伝導シート6が貼付してあり、さらに蓋4に磁気シールド材7を備えている例を示している。温度制御装置16の構成は、温度制御装置14、15の構成よりも簡素であり、製造し易く、熱伝達率は良好で、且つ、隣接する試料10の発する電磁波の影響を受けない。   In the temperature control device 16 shown in FIG. 7, an example is shown in which a heat conductive sheet 6 is affixed on the heat transfer plate 2 and the magnetic shield material 7 is provided on the lid 4. The configuration of the temperature control device 16 is simpler than the configuration of the temperature control devices 14 and 15, is easy to manufacture, has a good heat transfer rate, and is not affected by the electromagnetic waves emitted from the adjacent sample 10.

図8に示す温度制御装置17は、図5に示す温度制御装置14において、くぼみ5(試料載置部3)の底面に熱伝導シート6を貼付した構成を備えている。従って、温度制御装置17は、温度制御装置14よりも、熱伝導シート6を設けた分だけ良好に試料10を温度制御することができる。   The temperature control device 17 shown in FIG. 8 has a configuration in which the heat conductive sheet 6 is attached to the bottom surface of the recess 5 (sample mounting portion 3) in the temperature control device 14 shown in FIG. Therefore, the temperature control device 17 can control the temperature of the sample 10 better than the temperature control device 14 by the amount provided with the heat conductive sheet 6.

図9に示す温度制御装置18は、図6の温度制御装置15において、くぼみ5の底面に熱伝導シート6を貼付した構成を備えている。従って、温度制御装置18は、温度制御装置15よりも、熱伝導シート6を設けた分だけ良好に試料10を温度制御することができる。   The temperature control device 18 shown in FIG. 9 has a configuration in which the heat conductive sheet 6 is attached to the bottom surface of the recess 5 in the temperature control device 15 of FIG. Therefore, the temperature control device 18 can control the temperature of the sample 10 better than the temperature control device 15 by the amount of the heat conductive sheet 6 provided.

図10は、複数の試料10を同時に温度制御することができる温度制御装置19の平面図である。図10では、説明の都合上、蓋4を図示しておらず、又、右下の一つの試料載置部3にだけ、試料10を設置していない。   FIG. 10 is a plan view of a temperature control device 19 that can control the temperature of a plurality of samples 10 simultaneously. In FIG. 10, for convenience of explanation, the lid 4 is not shown, and the sample 10 is not installed only on the one sample mounting unit 3 in the lower right.

試料載置部3には、くぼみ5が設けてあり、図示していないが、くぼみ5内には熱伝導シート6が貼付してある。また、試料10は、通電しながら試験を行うので、電源ケーブル10aが設けてある。熱伝達プレート2には、この電源ケーブル10aを通すための溝2aが設けてある。   The sample placement section 3 is provided with a recess 5, and although not shown, a heat conductive sheet 6 is stuck in the recess 5. Further, since the sample 10 is tested while being energized, a power cable 10a is provided. The heat transfer plate 2 is provided with a groove 2a for passing the power cable 10a.

さらに、図10には示していないが、磁気シールド材7を備えた蓋4で、各々の試料10を個別に覆うことにより、隣接する他の試料10が発する電磁波の影響を遮断する。温度制御装置19では、多数の試料10を同時に温度制御することができるので、例えば、高周波用途のLEDやフォトダイオード等の光関係デバイスを、試料10として試験する際に有用である。   Furthermore, although not shown in FIG. 10, the influence of electromagnetic waves emitted from other adjacent samples 10 is blocked by individually covering each sample 10 with the lid 4 provided with the magnetic shield material 7. Since the temperature control device 19 can simultaneously control the temperature of a large number of samples 10, it is useful when testing an optical device such as an LED or a photodiode for high frequency applications as the sample 10.

図11は、図10の温度制御装置19の変形例である温度制御装置20の斜視図である。温度制御装置20では、熱伝達プレート2の内部に試料取付基板8が設置してある。試料取付基板8上には、多数(図11では15個)の試料取付部9が設けてある。   FIG. 11 is a perspective view of a temperature control device 20 which is a modification of the temperature control device 19 of FIG. In the temperature control device 20, the sample mounting substrate 8 is installed inside the heat transfer plate 2. On the sample mounting substrate 8, a large number (15 in FIG. 11) of sample mounting portions 9 are provided.

この試料取付部9には、試料10(LED)が設置される。図11では、二つの試料10が設置されている状態を示している。蓋4には、試料取付部9に対応する位置に観測孔4aが設けてある。蓋4のボルト孔4bと熱伝達プレート2のボルト孔2bとを位置合わせして、両者をボルト・ナットで固着すると、試料10(LED)の発光状態を観測孔4aから観察することができるようになっている。図11の温度制御装置20では、試料10(LED)を、真上から輝度計で観測することができる。   The sample mounting portion 9 is provided with a sample 10 (LED). FIG. 11 shows a state in which two samples 10 are installed. The lid 4 is provided with an observation hole 4 a at a position corresponding to the sample mounting portion 9. When the bolt hole 4b of the lid 4 and the bolt hole 2b of the heat transfer plate 2 are aligned and fixed with bolts and nuts, the light emission state of the sample 10 (LED) can be observed from the observation hole 4a. It has become. In the temperature control device 20 of FIG. 11, the sample 10 (LED) can be observed with a luminance meter from directly above.

図12は、試料10としてLEDを温度制御する場合の温度制御装置21の断面図である。図12に示すように温度制御装置21の蓋4には、孔26が設けてある。温度制御装置21のその他の構成は、図8の温度制御装置17の構成と同じである。温度制御装置21では、試料10が、各々別の蓋4の中に収容されており、また、孔26を介して試料10の発光状態を確認することができるようになっている。孔26に透明な部材を嵌め込み、内部空間25が完全に外気と遮断されるようにしてもよい。   FIG. 12 is a cross-sectional view of the temperature control device 21 when the temperature of the LED as the sample 10 is controlled. As shown in FIG. 12, a hole 26 is provided in the lid 4 of the temperature control device 21. The other configuration of the temperature control device 21 is the same as the configuration of the temperature control device 17 of FIG. In the temperature control device 21, the samples 10 are accommodated in separate lids 4, and the light emission state of the sample 10 can be confirmed through the holes 26. A transparent member may be fitted into the hole 26 so that the internal space 25 is completely blocked from outside air.

図11、図12の例では、試料10そのものがLEDである場合を示したが、試料10の一部にLEDが使用される場合には、そのLEDの発光状態が外部から観察できるように蓋4に孔を設ける。   11 and 12 show the case where the sample 10 itself is an LED, but when an LED is used as a part of the sample 10, a lid is provided so that the light emission state of the LED can be observed from the outside. 4 is provided with a hole.

図13は、図11や図12における蓋4の代わりに、筒状部材27を設けた温度制御装置22の斜視図である。温度制御装置22には、複数の試料10(LED)を取り付ける試料取付部8が設けてある。この試料取付部8に取り付けた個々の試料10を内部に収容するように、筒状部材27が、試料取付部8に設置される。   FIG. 13 is a perspective view of a temperature control device 22 provided with a tubular member 27 instead of the lid 4 in FIGS. 11 and 12. The temperature control device 22 is provided with a sample mounting portion 8 for mounting a plurality of samples 10 (LEDs). A cylindrical member 27 is installed in the sample mounting portion 8 so that the individual samples 10 attached to the sample mounting portion 8 are accommodated therein.

図示していないが、筒状部材27の内周壁には、シート状の磁気シールド材が貼付してある。また、筒状部材27の下部にフランジ部を設け、このフランジ部に貫通孔を設け、試料取付部8にねじ穴を設けることにより、ボルトで筒状部材27を試料取付部8に固着するようにしてもよい。   Although not shown, a sheet-like magnetic shield material is affixed to the inner peripheral wall of the cylindrical member 27. Further, a flange portion is provided at the lower portion of the cylindrical member 27, a through hole is provided in the flange portion, and a screw hole is provided in the sample mounting portion 8, so that the cylindrical member 27 is fixed to the sample mounting portion 8 with a bolt. It may be.

図14は、試料10を押さえ付ける板ばね28を備えた温度制御装置23の斜視図である。図14に示すように温度制御装置23には、熱伝達プレート2上に複数のくぼみ5が設けてある。くぼみ5は、くぼみ5よりも深さが浅い溝2aと連通している。溝2aは、熱伝達プレート2の側面に至っている。   FIG. 14 is a perspective view of the temperature control device 23 provided with a leaf spring 28 for pressing the sample 10. As shown in FIG. 14, the temperature control device 23 is provided with a plurality of recesses 5 on the heat transfer plate 2. The recess 5 communicates with the groove 2 a having a shallower depth than the recess 5. The groove 2 a reaches the side surface of the heat transfer plate 2.

くぼみ5の近傍には軸28aを中心に回動可能な板ばね28が設けてある。板ばね28は、弾性を有する材料(金属、プラスチック等)で形成されており、下方に突出する突出部28bが設けてある。板ばね28は、試料10をくぼみ5内に配置する前に、予め90度回動させてくぼみ5上から退避させておく。板ばね28は、熱伝導性の良好な金属で構成するのが好ましい。   A leaf spring 28 is provided in the vicinity of the recess 5 so as to be rotatable about a shaft 28a. The leaf spring 28 is made of an elastic material (metal, plastic, etc.), and is provided with a protruding portion 28b protruding downward. The leaf spring 28 is rotated 90 degrees in advance and retracted from above the recess 5 before the sample 10 is placed in the recess 5. The leaf spring 28 is preferably made of a metal having good thermal conductivity.

くぼみ5に試料10を配置した後、板ばね28を回動させ、板ばね28の突出部28bで試料10をくぼみ5の底部に押さえ付ける。このような板ばね28を設けると、試料10と熱伝達プレート2との密着性が良好となり、熱伝達が良好に行われる。さらに、試料10は、板ばね28を介して熱伝達される。   After placing the sample 10 in the recess 5, the leaf spring 28 is rotated, and the sample 10 is pressed against the bottom of the recess 5 by the protruding portion 28 b of the leaf spring 28. When such a leaf spring 28 is provided, the adhesion between the sample 10 and the heat transfer plate 2 becomes good, and heat transfer is performed well. Furthermore, the sample 10 is heat-transferred through the leaf spring 28.

さらに、試料10を覆う蓋(図示せず)を設けることにより、試料10の上方に停止した空気層を形成し、この空気層を介しても熱伝達されるようにすると、試料10を、より良好に温度制御することができる。   Furthermore, by providing a lid (not shown) that covers the sample 10 to form a stopped air layer above the sample 10 so that heat can be transferred through the air layer, the sample 10 The temperature can be controlled well.

図1〜図11に示す各温度制御装置において、蓋4は、単に内部空間25(図4〜図9に表示)と外気とを遮断するだけではなく、熱伝達プレート2から蓋4に熱伝達させ、蓋4を介して内部空間25内の空気を加熱又は冷却し、熱伝達プレート2の温度を安定させる効果を有している。   In each temperature control device shown in FIGS. 1 to 11, the lid 4 not only blocks the internal space 25 (shown in FIGS. 4 to 9) and the outside air but also transfers heat from the heat transfer plate 2 to the lid 4. The air in the internal space 25 is heated or cooled via the lid 4 and the temperature of the heat transfer plate 2 is stabilized.

試料10の形状によって、蓋4の形状は、任意に変更することができる。くぼみ5は、必要に応じて(経済性や、試料10の種類等を勘案して)設置するか否かを適宜選定することができる。   Depending on the shape of the sample 10, the shape of the lid 4 can be arbitrarily changed. It is possible to appropriately select whether or not the recess 5 is installed as necessary (in consideration of economic efficiency, the type of the sample 10, and the like).

試料10の底面(裏面)には、配線や種々の部品が配置されていることが多く、熱伝達プレート2と密着させることは容易ではないが、絶縁された熱伝導シート6上に試料10を載置し、さらに蓋4で試料10を覆うことにより、試料10への熱伝達は極めて良好になる。また、熱伝達プレート2と、蓋4及び試料10との熱伝達を良好にするため、両者の密着性を高めるように、蓋4及び試料10を熱伝達プレート2に押し付けるようにしてもよい。   In many cases, wiring and various parts are arranged on the bottom surface (back surface) of the sample 10, and it is not easy to closely contact the heat transfer plate 2, but the sample 10 is placed on the insulated heat conductive sheet 6. By placing and covering the sample 10 with the lid 4, heat transfer to the sample 10 becomes extremely good. Further, in order to improve heat transfer between the heat transfer plate 2 and the lid 4 and the sample 10, the lid 4 and the sample 10 may be pressed against the heat transfer plate 2 so as to improve the adhesion between them.

熱伝達プレート2と蓋4とは、広範囲に渡って接触しているのが好ましい。又、試料10は、通常はねじ等で試料載置部3に固定しなければならないが、吸着性を有する熱伝導シート6を使用することにより、固定作業は不要になる。
さらに、試料10のサイズが小さくなるほど固定作業は煩雑となるが、熱伝導シート6を使用すると、固定作業が不要になり、作業能率の改善効果が高くなる。
The heat transfer plate 2 and the lid 4 are preferably in contact with each other over a wide range. Further, the sample 10 usually has to be fixed to the sample mounting portion 3 with screws or the like, but the fixing work is not necessary by using the heat conductive sheet 6 having adsorptivity.
Further, the fixing work becomes more complicated as the size of the sample 10 becomes smaller. However, if the heat conductive sheet 6 is used, the fixing work becomes unnecessary, and the effect of improving the work efficiency is increased.

蓋4及び内部空間25(図4)の形状は、試料10の形状に合わせて、任意に選定することができる。例えば、試料10が円柱状であれば、蓋4(内部空間25)は円筒状に構成すると、試料10は均一に周囲から加熱されるので好ましい。   The shapes of the lid 4 and the internal space 25 (FIG. 4) can be arbitrarily selected according to the shape of the sample 10. For example, if the sample 10 is cylindrical, it is preferable that the lid 4 (internal space 25) is formed in a cylindrical shape because the sample 10 is uniformly heated from the surroundings.

試料10の高さが高い場合には、蓋4と熱伝達プレート2の間にスペーサを設けることにより、高さ方向に内部空間25の容積を増やし、試料10を収容するようにしてもよい。その際に使用するスペーサは、熱伝達プレート2から蓋4へ熱を良好に伝えることができる熱伝達率の良好な材質(アルミ合金等)のものを選定する。   When the height of the sample 10 is high, a spacer may be provided between the lid 4 and the heat transfer plate 2 to increase the volume of the internal space 25 in the height direction and accommodate the sample 10. The spacer used at that time is selected from a material (aluminum alloy or the like) having a good heat transfer coefficient that can transfer heat from the heat transfer plate 2 to the lid 4 satisfactorily.

請求項1の発明を実施した温度制御装置の斜視図である。It is a perspective view of the temperature control apparatus which implemented invention of Claim 1. 請求項2の発明を実施した温度制御装置の斜視図である。It is a perspective view of the temperature control apparatus which implemented invention of Claim 2. 請求項5の発明を実施した温度制御装置の斜視図である。It is a perspective view of the temperature control apparatus which implemented invention of Claim 5. 請求項4の発明を実施した温度制御装置の断面図である。It is sectional drawing of the temperature control apparatus which implemented invention of Claim 4. さらに別の構成を備えた温度制御装置の断面図である。It is sectional drawing of the temperature control apparatus provided with another structure. さらに別の構成を備えた温度制御装置の断面図である。It is sectional drawing of the temperature control apparatus provided with another structure. さらに別の構成を備えた温度制御装置の断面図である。It is sectional drawing of the temperature control apparatus provided with another structure. さらに別の構成を備えた温度制御装置の断面図である。It is sectional drawing of the temperature control apparatus provided with another structure. さらに別の構成を備えた温度制御装置の断面図である。It is sectional drawing of the temperature control apparatus provided with another structure. 複数の試料を同時に温度制御することができる温度制御装置の平面図である。It is a top view of the temperature control apparatus which can carry out temperature control of the some sample simultaneously. 図10の温度制御装置の変形例である温度制御装置の斜視図である。It is a perspective view of the temperature control apparatus which is a modification of the temperature control apparatus of FIG. 試料としてLEDを温度制御する場合の温度制御装置の断面図である。It is sectional drawing of the temperature control apparatus in the case of controlling temperature of LED as a sample. 蓋の代わりに筒状部材を採用した温度制御装置の斜視図である。It is a perspective view of the temperature control apparatus which employ | adopted the cylindrical member instead of the cover. 試料を押さえる板ばねを備えた温度制御装置の斜視図である。It is a perspective view of the temperature control apparatus provided with the leaf | plate spring which hold | suppresses a sample. 特許文献1に開示されている環境試験装置の構成図である。1 is a configuration diagram of an environmental test apparatus disclosed in Patent Document 1. FIG.

符号の説明Explanation of symbols

1 温度制御装置
2 熱伝達プレート
3 試料載置部
4 蓋
5 くぼみ
6 熱伝導シート
7 磁気シールド材
8 試料取付基板
9 試料取付部
10 試料
11〜21 温度制御装置
25 試料が収容される内部空間(室)
26 孔(蓋に設けた観察孔)
27 筒状部材
28 板ばね
DESCRIPTION OF SYMBOLS 1 Temperature control apparatus 2 Heat transfer plate 3 Sample mounting part 4 Lid 5 Indentation 6 Thermal conductive sheet 7 Magnetic shield material 8 Sample mounting substrate 9 Sample mounting part 10 Samples 11-21 Temperature control apparatus 25 Internal space in which a sample is accommodated ( Room)
26 holes (observation holes on the lid)
27 Cylindrical member 28 Leaf spring

Claims (6)

加熱装置又は冷却装置で所定の温度まで加熱又は冷却される熱伝達プレート上に試料載置部を設け、前記試料載置部に配置した試料の温度制御を行う温度制御装置において、
前記試料載置部に配置した試料を覆う蓋を設けて試料の上方に停止した空気層を形成し、
前記蓋は、前記熱伝達プレートから熱伝達され、
熱伝達プレートと蓋とで形成した室内の前記空気層の空気が、熱伝達プレートと蓋とから熱伝達され、試料の温度を、前記熱伝達プレートと前記空気とで制御するようにしたことを特徴とする温度制御装置。
In the temperature control device for providing a sample mounting portion on a heat transfer plate heated or cooled to a predetermined temperature by a heating device or a cooling device, and controlling the temperature of the sample placed on the sample mounting portion,
Providing a lid that covers the sample placed on the sample mounting portion to form an air layer stopped above the sample;
The lid receives heat from the heat transfer plate,
The air in the air layer formed by the heat transfer plate and the lid is transferred from the heat transfer plate and the lid, and the temperature of the sample is controlled by the heat transfer plate and the air. A characteristic temperature control device.
前記熱伝達プレート上にくぼみを形成し、前記くぼみ内に試料載置部を設けた請求項1に記載の温度制御装置。   The temperature control apparatus according to claim 1, wherein a depression is formed on the heat transfer plate, and a sample placement portion is provided in the depression. 複数個の試料を、間隔を置いて配置し、各試料を各々別の蓋で覆った請求項1又は2に記載の温度制御装置。   The temperature control device according to claim 1 or 2, wherein a plurality of samples are arranged at intervals, and each sample is covered with a separate lid. 前記蓋に磁気シールド材を備えた請求項3に記載の温度制御装置。   The temperature control device according to claim 3, wherein the lid is provided with a magnetic shield material. 試料載置部に熱伝導シートを備え、前記熱伝導シート上に試料を配置した請求項1〜4のうちのいずれかに記載の温度制御装置。   The temperature control apparatus in any one of Claims 1-4 which provided the heat conductive sheet in the sample mounting part, and arrange | positioned the sample on the said heat conductive sheet. 前記蓋に、発光部を備えた試料を観察可能にする透明な部材が嵌め込まれた孔を設けた請求項1〜5のうちのいずれかに記載の温度制御装置。 The temperature control device according to any one of claims 1 to 5, wherein the lid is provided with a hole into which a transparent member that enables observation of a sample including a light emitting unit is fitted .
JP2004257536A 2004-09-03 2004-09-03 Temperature control device Expired - Lifetime JP4094596B2 (en)

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