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JP4126607B2 - Method for producing and using sputtering target - Google Patents
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JP4126607B2 - Method for producing and using sputtering target - Google Patents

Method for producing and using sputtering target Download PDF

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JP4126607B2
JP4126607B2 JP2003279343A JP2003279343A JP4126607B2 JP 4126607 B2 JP4126607 B2 JP 4126607B2 JP 2003279343 A JP2003279343 A JP 2003279343A JP 2003279343 A JP2003279343 A JP 2003279343A JP 4126607 B2 JP4126607 B2 JP 4126607B2
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sputtering
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crucible
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英顕 只野
有道 守田
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Fuji Electric Co Ltd
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Fuji Electric Systems Co Ltd
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Description

この発明は、ハードディスクメディア、光磁気ディスク、スピンバルブヘッドを始めとする磁気ヘッドなどの媒体の製造に用いるスパッタリングターゲットに関し、特に超高密度磁気記録に対応可能な薄膜の成膜を可能にするターゲットの製造方法に関する。     The present invention relates to a sputtering target used for manufacturing a medium such as a hard disk medium, a magneto-optical disk, a magnetic head such as a spin valve head, and in particular, a target capable of forming a thin film compatible with ultrahigh density magnetic recording. It relates to the manufacturing method.

磁気記録媒体において、超高密度記録を実現するためには高保持力を持つ薄膜材料が必要であるが、従来の薄膜材料は材料自身は高い保持力を有するものの、ターゲットが高純度でないため薄膜材料自身が持つ保持力を十分に出しきれていない。その対策として、現状はPtなどの添加元素を加えて材料の持つポテンシャル場を引き上げることで対応している。しかし、この方法では、極薄膜の微細構造制御が不可欠となる超高密度磁気媒体においては、材料自身の不純物量が大きく影響するため対応できないと考えられる。   In magnetic recording media, a thin film material with a high holding force is required to achieve ultra-high density recording, but the conventional thin film material itself has a high holding force, but the target is not highly pure, so a thin film material is required. The holding power of the material itself is not fully exerted. As a countermeasure, the current situation is dealt with by increasing the potential field of the material by adding an additive element such as Pt. However, it is considered that this method cannot be applied to an ultra-high density magnetic medium in which the fine structure control of the ultrathin film is indispensable because the impurity amount of the material itself is greatly affected.

更に、超高密度のスピンバルブヘッドにおいては、狭い領域での再生ギャップに対応するため、スピンバルブ薄膜の膜厚を20nm未満に極薄化することが必要であるが、それらの材料中にはMnやCrなどの活性金属をベースとした反磁性材料が含まれている場合があり、その場合には薄膜中に溶存する不純物が所望の薄膜組織の形成を妨げる。従って、良好な薄膜組織を得るためには、超高真空雰囲気中でのスパッタリング時における放出ガスがきわめて少なく、不純物量がガス不純物を含めて数ppm以下に抑えられた超高純度のスパッタリングターゲットを製造することが必要である。   Furthermore, in an ultra-high density spin valve head, it is necessary to make the film thickness of the spin valve thin film less than 20 nm in order to cope with a reproduction gap in a narrow region. In some cases, diamagnetic materials based on active metals such as Mn and Cr are included, and in this case, impurities dissolved in the thin film prevent formation of a desired thin film structure. Therefore, in order to obtain a good thin film structure, an ultra-high-purity sputtering target in which the amount of released gas during sputtering in an ultra-high vacuum atmosphere is extremely small and the amount of impurities including gas impurities is suppressed to several ppm or less is used. It is necessary to manufacture.

従来のターゲットは、例えば円板形状の場合、直径が100〜200mm、厚さが2.5〜7.0mm、角板形状の場合は100〜200角、厚さが2.5〜7.0mmのものが使用される。これらのターゲットの製造方法は、溶解鋳造法と粉末燒結法に分けられる。溶解鋳造法の場合、マグネシアなどの耐火るつぼを用い、溶解鋳造雰囲気の真空度を10〜0.1Paとした真空溶解炉が主流で、溶解後、傾動出湯などにより耐火物製の鋳型に鋳込み、長さ200〜300mm程度のインゴットを製造する。ターゲットは、円柱形や角柱形のインゴットからスライス状に切り出し、その両面及び側面を研磨仕上げして得ている。しかしながら、この方法によって得られるターゲットは、溶解鋳造時に耐火物が混入することによって、通常で50ppm、高純度品でも30ppm程度の不純物が含まれている。   For example, in the case of a disk shape, a conventional target has a diameter of 100 to 200 mm and a thickness of 2.5 to 7.0 mm, and in the case of a square plate shape, a 100 to 200 square and a thickness of 2.5 to 7.0 mm. Is used. The manufacturing method of these targets is divided into a melt casting method and a powder sintering method. In the case of the melting casting method, a refractory crucible such as magnesia is used, and a vacuum melting furnace having a melting casting atmosphere with a vacuum degree of 10 to 0.1 Pa is mainly used, and after melting, it is cast into a refractory mold with tilted hot water, An ingot having a length of about 200 to 300 mm is manufactured. The target is obtained by cutting a cylindrical or prismatic ingot into a slice shape and polishing and polishing both sides and side surfaces thereof. However, the target obtained by this method contains impurities of about 50 ppm in general and about 30 ppm even in high purity products due to the inclusion of refractories during melt casting.

一方、粉末燒結法では、ターゲットディスク材1枚単位で製造できるため、ターゲットの製造に要する加工が溶解鋳造法と比較して大幅に省略可能である。また、材料組成に耐火材の耐熱温度を超える高融点金属が含まれるなど、溶解鋳造法が採用できない場合や、ターゲット材組成を均質に揃えたい場合に多く採用されている。しかしながら、粉末燒結法は素材となる粉末の表面に酸化被膜等が付着するため、製造されるターゲット材の純度は概して溶解鋳造法より悪くなり、不純物量は50〜数100ppm程度である。特に、使用する粉末粒径が小さくなると、材料容量に対する材料表面積の割合が大きくなり不純物量が大きくなる傾向がある。   On the other hand, in the powder sintering method, since it can be manufactured in units of one target disk material, the processing required for manufacturing the target can be largely omitted as compared with the melt casting method. Further, it is often used when the melting casting method cannot be employed, for example, when the material composition contains a refractory metal exceeding the heat resistance temperature of the refractory material, or when it is desired to make the target material composition uniform. However, in the powder sintering method, since an oxide film or the like adheres to the surface of the powder as a raw material, the purity of the target material to be manufactured is generally worse than that of the melt casting method, and the amount of impurities is about 50 to several hundred ppm. In particular, when the powder particle size to be used is small, the ratio of the material surface area to the material capacity tends to increase and the amount of impurities tends to increase.

そのため、これらのターゲットを用いて10-6〜10-8Pa台の超高真空雰囲気で成膜すると、スパッタリング時にターゲットから不純物ガスが放出されるため成膜条件が悪化し、所望の成膜が行えなくなる問題が生じる。ガス放出低減のためには、不純物量がガス量を含めて数Wt.ppm(例えば、3Wt.ppm)以下のターゲットにする必要がある。 For this reason, if these targets are used to form a film in an ultrahigh vacuum atmosphere of the order of 10 −6 to 10 −8 Pa, impurity gas is released from the target during sputtering, so that the film forming conditions deteriorate, and the desired film formation is achieved. The problem that cannot be done arises. In order to reduce gas emission, it is necessary to set the target so that the amount of impurities including the amount of gas is several Wt.ppm (for example, 3 Wt.ppm) or less.

そこで、るつぼからの不純物の混入のない溶解法として、水冷るつぼ高周波誘導溶解法を用いることが考えられ、その一種である浮揚溶解法を用いた高純度スパッタリングターゲットの製造方法が、特許文献1に記載されている。水冷るつぼを用いた高周波誘導溶解法は、水冷された銅などの金属性るつぼの周囲に高周波誘導コイルを巻いた装置で材料を溶解する。この装置はるつぼ内の溶解状態の違いから浮揚溶解装置とスカル溶解装置とがあるが、両者ともるつぼ材からの不純物の混入がない点で共通している。浮揚溶解装置は例えば特許文献2に、スカル溶解装置は例えば特許文献3に記載されている。   Therefore, it is conceivable to use a water-cooled crucible high-frequency induction melting method as a melting method without mixing impurities from the crucible. Are listed. In the high-frequency induction melting method using a water-cooled crucible, the material is melted with an apparatus in which a high-frequency induction coil is wound around a metal crucible such as water-cooled copper. This device has a floating melting device and a skull melting device due to the difference in the melting state in the crucible, but both are common in that impurities from the crucible are not mixed. A floating dissolution apparatus is described in, for example, Patent Document 2, and a skull dissolution apparatus is described in, for example, Patent Document 3.

水冷るつぼ高周波誘導溶解法は、スリットの入ったるつぼの内部に金属を入れ、その外側のコイルに高周波電流を流すもので、るつぼのスリットから浸入した磁界が金属に渦電流を誘起し、金属は加熱されて溶解する。金属は非磁性体はもちろん、磁性体でも加熱されてキュリー点以上になると非磁性体となり、るつぼに誘導された渦電流と金属に誘導される渦電流は対向する表面部分では向きが反対なので、金属にはるつぼから反発力が作用する。   In the water-cooled crucible induction melting method, a metal is placed inside a crucible containing a slit and a high-frequency current is passed through the outer coil of the crucible. A magnetic field that has entered through the slit of the crucible induces an eddy current in the metal. Dissolves when heated. The metal is not only a non-magnetic material, but also the magnetic material is heated to the Curie point and becomes a non-magnetic material, and the eddy current induced in the crucible and the eddy current induced in the metal are opposite in the opposite surface part, A repulsive force acts on the metal from the crucible.

スカル溶解では金属上部がるつぼ側面から離れて溶解し、下部側面及び底部はるつぼと接触しているが、るつぼが水冷されているためるつぼ接触面ではスカルと呼ばれる溶解金属と同組成の凝固層が形成され、その内側で金属が溶解している状態となり、るつぼ材からの不純物の混入がない。浮揚溶解では、金属がるつぼ低部の一部に接触している場合と全体が非接触の場合とがあるが、スカル溶解と比較してスカル形成量が少ないため、るつぼ材からの不純物の混入が少ないことに加えて、高融点金属が含まれる合金の組成均一化の点でより優れている。   In skull melting, the top of the metal melts away from the crucible side, and the bottom side and bottom are in contact with the crucible, but the crucible is water-cooled, so there is a solidified layer of the same composition as the molten metal called skull on the crucible contact surface. It is formed and the metal is in the melted state, and no impurities are mixed from the crucible material. In levitation melting, there are cases where the metal is in contact with a part of the lower part of the crucible and when the whole is non-contact, but because the amount of skull formation is small compared to skull melting, the inclusion of impurities from the crucible material In addition to being less, the alloy is more excellent in terms of uniform composition of an alloy containing a refractory metal.

特開平11−293453号公報JP 11-293453 A 特開2000−88467号公報JP 2000-88467 A 特開平10−246578号公報JP 10-246578 A

この発明の課題は、不純物の混入の少ない水冷るつぼ高周波誘導溶解法を用いて金属を溶解する一方、その後の工程をより適切に行うことにより、超高純度のターゲットを得ることにある。   An object of the present invention is to obtain an ultra-high purity target by performing a subsequent process more appropriately while dissolving a metal by using a water-cooled crucible high-frequency induction melting method with little contamination of impurities.

上記課題を解決するために、この発明は、ターゲット材料を水冷るつぼを用いた高周波誘導溶解装置により真空中で溶解した後、真空中で鋳型に鋳込んで円柱材を鋳造するとともに、この円柱材の一端面を研磨加工し、この研磨端面をスパッタリング装置への取付面とし、反対側の非研磨端面をスパッタリング面とするターゲットを形成するものである(請求項1)。スパッタリング装置に密着されるターゲットの取付面は平坦性が求められるので研磨加工を施すが、スパッタリング面は加工を行うと、加工時の雰囲気から不純物が混入して純度の低下を招く可能性があるため、請求項1の発明ではスパッタリング面は加工を行わずに鋳造時の鋳肌面をそのまま残した状態とする。   In order to solve the above-described problems, the present invention is a method for melting a target material in a vacuum using a high-frequency induction melting apparatus using a water-cooled crucible, casting the column material in a mold in a vacuum, One end surface of the substrate is polished, and a target having the polished end surface as a mounting surface for a sputtering apparatus and the opposite non-polished end surface as a sputtering surface is formed. Since the mounting surface of the target that is in close contact with the sputtering apparatus is required to be flat, polishing is performed. However, if the sputtering surface is processed, impurities may enter from the atmosphere during processing, leading to a decrease in purity. Therefore, in the first aspect of the invention, the sputtering surface is not processed, and the cast surface during casting is left as it is.

請求項1の発明において、前記ターゲット材料は浮揚溶解法又はスカル溶解法により溶解することができる(請求項2)。   In the invention of claim 1, the target material can be dissolved by a flotation dissolution method or a skull dissolution method (invention 2).

請求項1の発明において、前記円柱材を軸方向に2つに切断し、この切断面を研磨加工して2枚のターゲットを製造するようにすれば、鋳造材からターゲットを2枚取りすることができ効率的である(請求項3)。円柱材の切断加工は、加工時の雰囲気からの反応を避けるために、不活性雰囲気中で行うのがよい。   In the invention of claim 1, if the cylindrical member is cut into two in the axial direction and the cut surface is polished to produce two targets, two targets are taken from the cast material. And it is efficient (Claim 3). In order to avoid a reaction from the atmosphere during processing, the cylindrical material is preferably cut in an inert atmosphere.

請求項1の発明において、前記ターゲット材料の溶解及び鋳造雰囲気の真空度は、10-6Pa以下とするのがよい(請求項4)。 In the invention of claim 1, the melting degree of the target material and the degree of vacuum of the casting atmosphere are preferably 10 −6 Pa or less (invention 4).

請求項1の発明において、前記円柱材は遠心鋳造法により鋳造するのがよい(請求項5)。   In the invention of claim 1, the columnar material is preferably cast by a centrifugal casting method (invention 5).

請求項1記載の方法により製造したターゲットを使用する際は、前記ターゲットをスパッタリング装置に取り付けた後、前記非研磨端面の表層を初期空焼き運転により除去してから成膜を開始するのがよい(請求項6)。ターゲットの非研磨端面(鋳肌面)の表層を空焼き運転、つまりスパッタリングの空打ちで洗浄することにより、超高真空雰囲気中のスパッタリングにおいても、放出ガスをきわめて少なくし、不純物量がガス不純物を含めて数Wt.ppm以下の超高純度材の成膜が可能になる。   When using the target manufactured by the method according to claim 1, it is preferable to start film formation after removing the surface layer of the non-polished end surface by an initial baking operation after attaching the target to a sputtering apparatus. (Claim 6). By cleaning the surface layer of the non-polished end surface (cast surface) of the target with an empty baking operation, that is, sputtering blanking, even in sputtering in an ultra-high vacuum atmosphere, the emitted gas is extremely reduced and the amount of impurities is a gas impurity. It is possible to form an ultrahigh purity material of several Wt.ppm or less including

この発明によれば、ターゲット材料を水冷るつぼを用いた高周波誘導溶解装置により真空中で溶解した後、真空中で鋳型に鋳込んで円柱材を鋳造し、この円柱材の研磨端面をスパッタリング装置への取付面とする一方で、円柱材の非研磨端面(鋳肌面)をスパッタリング面とするターゲットを形成することにより、不純物混入の機会を極力少なくしてきわめて純度の高いターゲットを得ることができる。その結果、10-6〜10-8Pa台の超高真空雰囲気におけるスパッタリングにおいても、ターゲットからの不純物ガス放出による成膜条件の阻害がなく、不純物量がガス不純物を含めて数ppm以下の薄膜の形成が可能になる。 According to the present invention, the target material is melted in a vacuum by a high-frequency induction melting device using a water-cooled crucible, and then cast into a mold in a vacuum to cast a cylindrical material, and the polished end surface of this cylindrical material is transferred to a sputtering device. On the other hand, by forming a target having a non-polished end surface (cast surface) of a cylindrical material as a sputtering surface, an extremely high purity target can be obtained by minimizing the chance of mixing impurities. . As a result, even in sputtering in an ultrahigh vacuum atmosphere on the order of 10 −6 to 10 −8 Pa, a thin film having an impurity amount of several ppm or less including gas impurities is not hindered by film formation conditions due to impurity gas emission from the target. Can be formed.

以下、図1〜図12に基づいて、この発明の実施の形態を説明する。まず図11は、この発明の実施に使用するターゲット材溶解・鋳造装置の原理図で、この装置はスカル溶解と遠心鋳造とを組み合わせたものである。図11において、真空容器1内に遠心鋳造鋳型2とスカル溶解炉3が設置され、真空容器1は10-6Paよりも小さい高真空雰囲気に保たれている。遠心鋳造鋳型2は容器4で密閉された駆動機構5により矢印で示すように回転駆動され、駆動機構5は昇降リフタ6上でモータ7によりベルト8を介して駆動される駆動軸9を有している。軸受10により回転支持された駆動軸9は、シール装置11を通して密閉容器外に気密に突出し、遠心鋳造鋳型2は駆動軸9に直結されたターンテーブル12に取り付けられている。 Embodiments of the present invention will be described below with reference to FIGS. First, FIG. 11 is a principle diagram of a target material melting / casting apparatus used in the practice of the present invention. This apparatus combines skull melting and centrifugal casting. In FIG. 11, a centrifugal casting mold 2 and a skull melting furnace 3 are installed in a vacuum vessel 1, and the vacuum vessel 1 is kept in a high vacuum atmosphere smaller than 10 −6 Pa. The centrifugal casting mold 2 is rotationally driven as indicated by an arrow by a drive mechanism 5 sealed with a container 4, and the drive mechanism 5 has a drive shaft 9 driven by a motor 7 on a lifter lifter 6 via a belt 8. ing. The drive shaft 9 rotatably supported by the bearing 10 protrudes out of the hermetic container through the seal device 11, and the centrifugal casting mold 2 is attached to a turntable 12 directly connected to the drive shaft 9.

一方、図11において、スカル溶解炉3の水冷るつぼ13は図示の通り傾動可能に支持され、溶湯14は水冷るつぼ13の傾動により遠心鋳造鋳鋳型2に鋳込まれる。図12は、浮揚溶解と遠心鋳造とを組み合わせたターゲット材溶解・鋳造装置の原理図で、水冷るつぼ高周波誘導溶解装置として浮揚溶解炉15が用いられている点を除けば図11の装置と同じである。水冷るつぼ16内の溶湯14は、出湯駆動機構17による水冷るつぼ16の開栓により、るつぼ底部の出湯高8から遠心鋳造鋳鋳型2に鋳込まれる。   On the other hand, in FIG. 11, the water-cooled crucible 13 of the skull melting furnace 3 is supported to be tiltable as shown, and the molten metal 14 is cast into the centrifugal casting mold 2 by the tilt of the water-cooled crucible 13. FIG. 12 is a principle diagram of a target material melting / casting apparatus combining flotation melting and centrifugal casting, and is the same as the apparatus of FIG. 11 except that a flotation melting furnace 15 is used as a water-cooled crucible high frequency induction melting apparatus. It is. The molten metal 14 in the water-cooled crucible 16 is cast into the centrifugal casting mold 2 from the tapping height 8 at the bottom of the crucible by opening the water-cooled crucible 16 by the tapping drive mechanism 17.

図4及び図5は、ターゲット材料の円柱材を鋳造する遠心鋳造鋳鋳型2の一例を示すもので、図4は斜視図、図5はその縦断面図である。図4及び図5において、鋳型2は不純物の混入防止のために鋳造金属との反応性が低い材料が用いられ、底付き円筒状の外型19と、その内側に配置された円柱状の中子20とからなっている。外型19の内空部は下部が上部よりも大径になっており、小径部に中子20により形成された環状の湯口21から注入される溶湯により、大径部でターゲット材が鋳造される。この場合、鋳型中心軸が回転中心軸で、この回転中心軸から出湯中心軸までの距離をa、鋳造される円柱材22の半径をbとして、0<a<bに設定されている。   4 and 5 show an example of a centrifugal casting mold 2 for casting a columnar material as a target material. FIG. 4 is a perspective view and FIG. 5 is a longitudinal sectional view thereof. 4 and 5, the mold 2 is made of a material having low reactivity with the cast metal in order to prevent impurities from being mixed, and has a cylindrical outer die 19 with a bottom and a cylindrical inner portion arranged on the inside thereof. It consists of a child 20. The lower part of the inner cavity of the outer mold 19 has a larger diameter than the upper part, and the target material is cast at the larger diameter part by the molten metal injected from the annular gate 21 formed by the core 20 in the smaller diameter part. The In this case, 0 <a <b is set, where the mold center axis is the rotation center axis, where a is the distance from the rotation center axis to the tapping center axis, and b is the radius of the cast cylindrical material 22.

図1は、図4,図5の鋳型で鋳造されたターゲット材(円柱材)から所望のターゲットを形成する工程を示すものである。図1において、まず円柱材22の一端面の環状の湯口部22aを平面23に沿って切除し、次いでこの切断面22b及び側面22cを研磨加工して、ターゲット24を形成する。このターゲット24は研磨端面24aをスパッタリング装置への取付面とし、反対側の非研磨端面(鋳肌面)24bをスパッタリング面として使用する。   FIG. 1 shows a process of forming a desired target from a target material (cylindrical material) cast with the molds of FIGS. In FIG. 1, an annular gate 22 a on one end surface of a cylindrical member 22 is first cut along a plane 23, and then the cut surface 22 b and the side surface 22 c are polished to form a target 24. This target 24 uses the polishing end surface 24a as a mounting surface for a sputtering apparatus, and uses the opposite non-polishing end surface (cast surface) 24b as a sputtering surface.

図6は遠心鋳造鋳鋳型2の別の例を示す斜視図、図7はその縦断面図である。この例では鋳型2はシェル状の中空体で鋳型中心軸から偏心した位置に管状の湯口21が設けられ、湯口中心軸が回転中心軸になっている。回転中心軸から鋳型中心軸までの距離をa、回転中心軸から円柱材22の外周面までの最大距離をb、円柱材22の直径をcとして、b>c/2>a>0に設定されている。図2は、図6,図7の鋳型で鋳造されたターゲット材(円柱材)22を示すものである。円柱材22の一端面の柱状の湯口部22aを平面23に沿って切除した後、この切断面22b及び側面22cを研磨加工してターゲット24を形成する。   FIG. 6 is a perspective view showing another example of the centrifugal casting mold 2, and FIG. 7 is a longitudinal sectional view thereof. In this example, the mold 2 is a shell-like hollow body, and a tubular gate 21 is provided at a position eccentric from the center axis of the mold, and the center axis of the gate is a rotation center axis. The distance from the rotation center axis to the mold center axis is a, the maximum distance from the rotation center axis to the outer peripheral surface of the cylindrical member 22 is b, and the diameter of the cylindrical member 22 is c, and b> c / 2> a> 0 is set. Has been. FIG. 2 shows a target material (cylindrical material) 22 cast with the mold of FIGS. After the columnar gate portion 22a on one end surface of the cylindrical member 22 is cut along the plane 23, the cut surface 22b and the side surface 22c are polished to form the target 24.

図8は遠心鋳造鋳鋳型2の更に別の例を示す斜視図、図9はその縦断面図である。この例では、シェル状中空体の鋳型2の側面にL形管状の湯口21が設けられ、湯口中心軸が回転中心軸になっている。回転中心軸から鋳型中心軸までの距離をa、回転中心軸から円柱材22の外周面までの最大距離をb、円柱材22の直径をc、回転中心軸から円柱材22の外周面までの最小距離をdとして、b>c>a>0,d≧0に設定されている。   FIG. 8 is a perspective view showing still another example of the centrifugal casting mold 2, and FIG. 9 is a longitudinal sectional view thereof. In this example, an L-shaped tubular gate 21 is provided on the side surface of the shell-shaped hollow body mold 2, and the central axis of the gate is the rotation center axis. The distance from the rotation center axis to the mold center axis is a, the maximum distance from the rotation center axis to the outer peripheral surface of the cylindrical member 22 is b, the diameter of the cylindrical member 22 is c, and the distance from the rotation central axis to the outer peripheral surface of the cylindrical member 22 is Assuming that the minimum distance is d, b> c> a> 0 and d ≧ 0 are set.

図3は、図8,図9の鋳型で鋳造されたターゲット材(円柱材)22を示すものである。この場合は、湯口部22aが円柱材22の側面にあるため、円柱材22を半割りしてターゲット24を2枚取りすることができる。すなわち、図3において、円柱材22の側面の柱状の湯口部22aを曲面25に沿って切除し、次いで円柱材22を平面26に沿って軸方向に2つに切断し、各々の切断面22b及び側面22cをそれぞれ研磨加工して2枚のターゲット24を形成する。   FIG. 3 shows a target material (cylindrical material) 22 cast with the molds of FIGS. In this case, since the gate part 22a is on the side surface of the columnar member 22, the columnar member 22 can be divided in half so that two targets 24 can be taken. That is, in FIG. 3, the columnar gate 22a on the side surface of the cylindrical member 22 is cut along the curved surface 25, and then the cylindrical member 22 is cut in two along the plane 26 in the axial direction. And the two targets 24 are formed by polishing each of the side surfaces 22c.

図10は、図8,図9の鋳型をツリー状に多数個一体形成した鋳型2を示す縦断面図である。この場合は、回転中心軸が湯口中心軸及び出湯中心軸と一致している。図4〜図10のいずれの鋳型2においても、水冷構造としたり保温構造としたりして、溶解金属材料の凝固速度や湯回りに応じた適切な金型温度に保つことができる。   FIG. 10 is a longitudinal sectional view showing a mold 2 in which a large number of the molds of FIGS. 8 and 9 are integrally formed in a tree shape. In this case, the rotation center axis coincides with the gate center axis and the tapping center axis. In any of the molds 2 of FIGS. 4 to 10, a water cooling structure or a heat retaining structure can be used to maintain an appropriate mold temperature according to the solidification rate of the molten metal material and the temperature of the molten metal.

この発明の実施の形態を示すターゲット材の加工工程図である。It is a processing process figure of the target material which shows an embodiment of this invention. この発明の異なる実施の形態を示すターゲット材の加工工程図である。It is a processing process figure of the target material which shows different embodiment of this invention. この発明の更に異なる実施の形態を示すターゲット材の加工工程図である。It is a processing process figure of the target material which shows further another embodiment of this invention. 図1のターゲット材の鋳造に用いる遠心鋳造鋳型の斜視図である。It is a perspective view of the centrifugal casting mold used for casting of the target material of FIG. 図4の遠心鋳造鋳型の縦断面図である。It is a longitudinal cross-sectional view of the centrifugal casting mold of FIG. 図2のターゲット材の鋳造に用いる遠心鋳造鋳型の斜視図である。It is a perspective view of the centrifugal casting mold used for casting of the target material of FIG. 図6の遠心鋳造鋳型の縦断面図である。It is a longitudinal cross-sectional view of the centrifugal casting mold of FIG. 図3のターゲット材の鋳造に用いる遠心鋳造鋳型の斜視図である。It is a perspective view of the centrifugal casting mold used for casting of the target material of FIG. 図8の遠心鋳造鋳型の縦断面図である。It is a longitudinal cross-sectional view of the centrifugal casting mold of FIG. 図3のターゲット材の鋳造に用いる遠心鋳造鋳型の異なる実施の形態を示す縦断面図である。It is a longitudinal cross-sectional view which shows different embodiment of the centrifugal casting mold used for casting of the target material of FIG. この発明の実施に使用するターゲット材溶解・鋳造装置の原理図である。It is a principle diagram of a target material melting / casting apparatus used for carrying out the present invention. この発明の実施に使用するターゲット材溶解・鋳造装置の異なる実施の形態を示す原理図である。It is a principle figure which shows different embodiment of the target material melting | dissolving / casting apparatus used for implementation of this invention.

符号の説明Explanation of symbols

1 真空容器
2 遠心鋳造鋳型
3 スカル溶解炉
15 浮揚溶解炉
22 円柱材
24 ターゲット
DESCRIPTION OF SYMBOLS 1 Vacuum container 2 Centrifugal casting mold 3 Skull melting furnace 15 Levitation melting furnace 22 Cylindrical material 24 Target

Claims (6)

ターゲット材料を水冷るつぼを用いた高周波誘導溶解装置により真空中で溶解した後、真空中で鋳型に鋳込んで円柱材を鋳造するとともに、この円柱材の一端面を研磨加工し、この研磨端面をスパッタリング装置への取付面とし、反対側の非研磨端面をスパッタリング面とするターゲットを形成することを特徴とするスパッタリングターゲットの製造方法。   The target material is melted in a vacuum with a high-frequency induction melting apparatus using a water-cooled crucible, cast into a mold in a vacuum to cast a cylindrical material, and one end surface of the cylindrical material is polished, and the polished end surface is A method for producing a sputtering target, comprising forming a target as a surface to be attached to a sputtering apparatus and having a non-polished end surface on the opposite side as a sputtering surface. 浮揚溶解法又はスカル溶解法により前記ターゲット材料を溶解することを特徴とする請求項1記載のスパッタリングターゲットの製造方法。   The method of manufacturing a sputtering target according to claim 1, wherein the target material is dissolved by a levitation dissolution method or a skull dissolution method. 前記円柱材を軸方向に2つに切断し、この切断面を研磨加工して2枚のターゲットを製造することを特徴とする請求項1記載のスパッタリングターゲットの製造方法。   2. The method of manufacturing a sputtering target according to claim 1, wherein the cylindrical member is cut into two in the axial direction, and the cut surface is polished to manufacture two targets. 前記ターゲット材料の溶解及び鋳造雰囲気の真空度を10-6Pa以下とすることを特徴とする請求項1記載のスパッタリングターゲットの製造方法。 The method for producing a sputtering target according to claim 1, wherein the melting of the target material and the degree of vacuum in the casting atmosphere are set to 10 -6 Pa or less. 遠心鋳造法により前記円柱材を鋳造することを特徴とする請求項1記載のスパッタリングターゲットの製造方法。   The method of manufacturing a sputtering target according to claim 1, wherein the cylindrical member is cast by a centrifugal casting method. 前記ターゲットをスパッタリング装置に取り付けた後、前記非研磨端面の表層を初期空焼き運転により除去してから成膜を開始することを特徴とする請求項1記載の方法により製造したターゲットの使用方法。
The method of using a target manufactured by the method according to claim 1, wherein after the target is attached to a sputtering apparatus, the surface layer of the non-polished end surface is removed by an initial empty baking operation, and then film formation is started.
JP2003279343A 2003-07-24 2003-07-24 Method for producing and using sputtering target Expired - Fee Related JP4126607B2 (en)

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