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JP4134356B2 - Infrared light source - Google Patents
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JP4134356B2 - Infrared light source - Google Patents

Infrared light source Download PDF

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Publication number
JP4134356B2
JP4134356B2 JP10123397A JP10123397A JP4134356B2 JP 4134356 B2 JP4134356 B2 JP 4134356B2 JP 10123397 A JP10123397 A JP 10123397A JP 10123397 A JP10123397 A JP 10123397A JP 4134356 B2 JP4134356 B2 JP 4134356B2
Authority
JP
Japan
Prior art keywords
filament
light source
silicon substrate
infrared light
infrared
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP10123397A
Other languages
Japanese (ja)
Other versions
JPH10294092A (en
Inventor
由明 本多
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP10123397A priority Critical patent/JP4134356B2/en
Publication of JPH10294092A publication Critical patent/JPH10294092A/en
Application granted granted Critical
Publication of JP4134356B2 publication Critical patent/JP4134356B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【0001】
【発明の属する技術分野】
本発明は、シリコン基板上にマイクロブリッジ形状のフィラメントを有する赤外線光源に関するものである。
【0002】
【従来の技術】
従来の赤外線光源の上面図及びA−A断面図を図3に示す。1はシリコン基板であり、基板面上にフィラメント2と、フィラメント2を設置する台座3と、フィラメント2に電流を流すための電極4と、掘込み孔5とが形成されている。台座3の形成には、シリコン基板1表面もしくは裏面からウエットエッチングにより台座3を選択的に残すようにして掘抜き形成する。なお、台座3に形成されたフィラメント2は、シリコン単結晶、ポリシリコン及び金属膜などの抵抗体が考えられる。
【0003】
従来の赤外線光源では、2つの電極4間に電流を流し、フィラメント2を発熱させることにより赤外線を放射させる。
【0004】
【発明が解決しようとする課題】
ところが、上述のような構成の赤外線光源では、放射される赤外線の指向性を制御できないという問題があった。
【0005】
本発明は、上記の点に鑑みて成されたものであり、その目的とするところは、指向性を有する赤外線出力が得られる赤外線光源を提供することにある。
【0006】
【課題を解決するための手段】
請求項1記載の発明は、シリコン基板と、該シリコン基板にマイクロブリッジにより形成されるフィラメントと、該フィラメントに電流を流すための電極とを備えた赤外線光源において、前記フィラメント下方で前記シリコン基板のエッチングにより施された掘込み孔の下方、前記シリコン基板側が平坦でその反対面が凸となる平凸形状で赤外線の直進性や指向性を制御するレンズを付加するようにしたことを特徴とするものである。
【0007】
請求項2記載の発明は、請求項1記載の赤外線光源において、前記フィラメント上部に赤外線を反射する反射膜を設けるようにしたことを特徴とするものである。
【0008】
【発明の実施の形態】
以下、本発明の一実施形態について図面に基づき説明する。図1は、本発明の一実施形態に係る赤外線光源の断面図である。
【0009】
1はシリコン基板であり、基板面上にフィラメント2と、フィラメント2を設置する台座3と、フィラメント2に電流を流すための電極4と、掘込み孔5とが形成されている。台座3の形成には、シリコン基板1表面もしくは裏面からウエットエッチングにより台座3を選択的に残すようにして掘抜き形成する。なお、台座3に形成されたフィラメント2には、シリコン単結晶、ポリシリコン及び金属膜などの抵抗体を用いる。
【0010】
エッチングにより施された掘込み孔5の下方には レンズ6が付加されており、赤外線光源の下部から放射される赤外線出力の直進性や指向性を制御する。なお、レンズ6にフレネルレンズを用いることでレンズ6の厚みを薄くでき、赤外線光源のサイズをコンパクトにすることができる。
【0011】
次に、本実施形態の動作を説明する。電極4間に電流が流れるとフィラメント2が加熱され、フィラメント2の温度に対応した赤外線が放射される。ここで、フィラメント2からは、ほぼ全方位に赤外線が放出されることになるが、フィラメント2下方に設けたレンズ6により、シリコン基板1の下方に放射される赤外線を偏光することで、直進性を向上させ平行光を出力させたり、集光することで高出力の赤外線を得ることができる。
【0012】
本実施形態によれば、レンズ6により焦点距離が制御できるので、シリコン基板1下面に放射される赤外線を平行光としてシリコン基板1表面から放射したり、集光させたりすることが可能となる。
【0013】
なお、図2に示すように、フィラメント2上部に赤外線を反射する金等から成る反射膜7を付加することで、フィラメント2上部に放射していた赤外線をフィラメント2下方に反射することができるので、レンズ6に入射する光量を増加させることが可能となる。
【0014】
【発明の効果】
以上のように、請求項1記載の発明にあっては、シリコン基板と、シリコン基板にマイクロブリッジにより形成されるフィラメントと、フィラメントに電流を流すための電極とを備えた赤外線光源において、フィラメント下方で前記シリコン基板のエッチングにより施された掘込み孔の下方、前記シリコン基板側が平坦でその反対面が凸となる平凸形状で赤外線の直進性や指向性を制御するレンズを付加するようにしたので、レンズにより焦点距離が制御できるため、指向性を有する赤外線出力が得られる赤外線光源を提供することができた。
【0015】
請求項2記載の発明にあっては、請求項1記載の発明において、フィラメント上部に赤外線を反射する反射膜を設けるようにしたので、フィラメント上部に放射していた赤外線をフィラメント下方に反射することができるので、レンズに入射する光量を増加させることが可能となる。
【図面の簡単な説明】
【図1】本発明の一実施形態に係る赤外線光源の断面図である。
【図2】本発明の他の実施形態に係る赤外線光源の断面図である。
【図3】従来の赤外線光源に係る上面図及びA−A断面図である。
【符号の説明】
1 シリコン基板
2 フィラメント
3 台座
4 電極
5 掘込み孔
6 レンズ
7 反射膜
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an infrared light source having a microbridge-shaped filament on a silicon substrate.
[0002]
[Prior art]
The top view and AA sectional drawing of the conventional infrared light source are shown in FIG. Reference numeral 1 denotes a silicon substrate, on which a filament 2, a pedestal 3 on which the filament 2 is installed, an electrode 4 for passing a current through the filament 2, and a dug hole 5 are formed. The pedestal 3 is formed by excavating the pedestal 3 from the front or back surface of the silicon substrate 1 so as to selectively leave the pedestal 3 by wet etching. The filament 2 formed on the pedestal 3 may be a resistor such as a silicon single crystal, polysilicon, or a metal film.
[0003]
In the conventional infrared light source, a current is passed between the two electrodes 4 to heat the filament 2 to emit infrared rays.
[0004]
[Problems to be solved by the invention]
However, the infrared light source configured as described above has a problem that the directivity of the emitted infrared light cannot be controlled.
[0005]
The present invention has been made in view of the above points, and an object of the present invention is to provide an infrared light source capable of obtaining an infrared output having directivity.
[0006]
[Means for Solving the Problems]
The invention according to claim 1 is an infrared light source comprising a silicon substrate , a filament formed by a microbridge on the silicon substrate, and an electrode for passing an electric current through the filament . A lens for controlling the straightness and directivity of infrared rays with a plano-convex shape in which the silicon substrate side is flat and the opposite surface is convex is added below a dug hole made by etching. To do.
[0007]
According to a second aspect of the present invention, in the infrared light source according to the first aspect, a reflective film for reflecting infrared light is provided on the filament.
[0008]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, an embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a cross-sectional view of an infrared light source according to an embodiment of the present invention.
[0009]
Reference numeral 1 denotes a silicon substrate, on which a filament 2, a pedestal 3 on which the filament 2 is installed, an electrode 4 for passing a current through the filament 2, and a dug hole 5 are formed. The pedestal 3 is formed by excavating the pedestal 3 from the front or back surface of the silicon substrate 1 so as to selectively leave the pedestal 3 by wet etching. For the filament 2 formed on the pedestal 3, a resistor such as a silicon single crystal, polysilicon, or a metal film is used.
[0010]
A lens 6 is added below the dug hole 5 formed by etching, and controls the straightness and directivity of the infrared output emitted from the lower part of the infrared light source. In addition, the thickness of the lens 6 can be made thin by using a Fresnel lens for the lens 6, and the size of the infrared light source can be made compact.
[0011]
Next, the operation of this embodiment will be described. When a current flows between the electrodes 4, the filament 2 is heated, and infrared rays corresponding to the temperature of the filament 2 are emitted. Here, the filament 2 emits infrared rays in almost all directions, but the lens 6 provided below the filament 2 polarizes the infrared rays radiated below the silicon substrate 1, so that straightness is achieved. It is possible to obtain high-output infrared rays by improving parallel light and outputting parallel light or collecting light.
[0012]
According to the present embodiment, since the focal length can be controlled by the lens 6, it is possible to radiate or condense infrared rays radiated from the lower surface of the silicon substrate 1 as parallel light from the surface of the silicon substrate 1.
[0013]
As shown in FIG. 2, by adding a reflective film 7 made of gold or the like that reflects infrared rays to the upper part of the filament 2, infrared rays radiated to the upper part of the filament 2 can be reflected downward of the filament 2. The amount of light incident on the lens 6 can be increased.
[0014]
【The invention's effect】
As described above, according to the first aspect of the present invention, in an infrared light source including a silicon substrate, a filament formed by a microbridge on the silicon substrate, and an electrode for passing a current through the filament, Then, a lens for controlling the straightness and directivity of infrared rays is added below the digging hole made by etching the silicon substrate with a plano-convex shape in which the silicon substrate side is flat and the opposite surface is convex. Therefore, since the focal length can be controlled by the lens, an infrared light source capable of obtaining an infrared output having directivity can be provided.
[0015]
In the invention described in claim 2, in the invention described in claim 1, since the reflective film for reflecting infrared rays is provided on the upper part of the filament, the infrared radiation radiated on the upper part of the filament is reflected downward of the filament. Therefore, the amount of light incident on the lens can be increased.
[Brief description of the drawings]
FIG. 1 is a cross-sectional view of an infrared light source according to an embodiment of the present invention.
FIG. 2 is a cross-sectional view of an infrared light source according to another embodiment of the present invention.
FIGS. 3A and 3B are a top view and a cross-sectional view taken along line AA of a conventional infrared light source. FIGS.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Silicon substrate 2 Filament 3 Base 4 Electrode 5 Excavation hole 6 Lens 7 Reflective film

Claims (2)

シリコン基板と、該シリコン基板にマイクロブリッジにより形成されるフィラメントと、該フィラメントに電流を流すための電極とを備えた赤外線光源において、前記フィラメント下方で前記シリコン基板のエッチングにより施された掘込み孔の下方、前記シリコン基板側が平坦でその反対面が凸となる平凸形状で赤外線の直進性や指向性を制御するレンズを付加するようにしたことを特徴とする赤外線光源。In an infrared light source comprising a silicon substrate , a filament formed by a microbridge on the silicon substrate, and an electrode for passing an electric current through the filament, a dug hole made by etching the silicon substrate below the filament the downward, infrared source, characterized in that so as to add a lens in which the silicon substrate side is controlled straightness and directivity of the infrared flat-convex opposite surface thereof has a convex shape flat. 前記フィラメント上部に赤外線を反射する反射膜を設けるようにしたことを特徴とする請求項1記載の赤外線光源。  2. The infrared light source according to claim 1, wherein a reflective film for reflecting infrared rays is provided on the filament.
JP10123397A 1997-04-18 1997-04-18 Infrared light source Expired - Fee Related JP4134356B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10123397A JP4134356B2 (en) 1997-04-18 1997-04-18 Infrared light source

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10123397A JP4134356B2 (en) 1997-04-18 1997-04-18 Infrared light source

Publications (2)

Publication Number Publication Date
JPH10294092A JPH10294092A (en) 1998-11-04
JP4134356B2 true JP4134356B2 (en) 2008-08-20

Family

ID=14295191

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10123397A Expired - Fee Related JP4134356B2 (en) 1997-04-18 1997-04-18 Infrared light source

Country Status (1)

Country Link
JP (1) JP4134356B2 (en)

Also Published As

Publication number Publication date
JPH10294092A (en) 1998-11-04

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