JP4201130B2 - Board block attachment and board fixing unit for pin block - Google Patents

Description

  The present invention provides a large number of probes that are freely planted for individual contact with a large number of inspection points that are set with a certain rule, such as being set in a lattice pattern at a certain pitch on a substrate to be inspected. And a substrate fixing unit that is used in relation to a pin block that constitutes a substrate inspection apparatus.

  A substrate inspection apparatus such as an in-circuit tester includes a pin block as a test head that is formed so as to freely make electrical contact with each inspection point of a substrate to be inspected via an individual probe.

  In this case, the pin block is actually provided as a dedicated type manufactured so that the position of each probe corresponds to the position of each inspection point of a specific inspection target substrate to be inspected. .

  However, when using such a non-generic pin block, it is necessary to redesign and manufacture each time a board to be inspected of a different model is to be inspected. There were problems such as inviting an increase.

For this reason, the proposal of the versatile board | substrate inspection jig | tool which can respond | correspond flexibly also to the test object board | substrate from which a model differs is also made | formed conventionally (for example, refer patent document 1).
Japanese Patent Laid-Open No. 56-54096 (2nd page, FIG. 2)

  By the way, according to the printed circuit board inspection apparatus disclosed in Patent Document 1, a conductive elastic body and a position conversion body are interposed between inspection points of a substrate to be inspected, and a probe is placed at a predetermined position of the position conversion body. By making contact, it is possible to form a conduction path from the position conversion body → conductive elastic body → inspection point of the substrate to be inspected, so the same probe (substrate inspection jig) can be applied to the inspected substrate with a different print pattern. It is said that versatility that can be inspected by using can be obtained.

  On the other hand, FIG. 5 shows an example of a substrate fixing unit that can be used for inspection target substrates of different models using the same pin block, and (a) of them shows a non-contact state ( (B) shows the arrangement relationship in the contact state (during inspection). Moreover, FIG. 6 is explanatory drawing which expands and shows the circular surrounding site | part by the dashed-dotted line of FIG.5 (b).

  According to these drawings, the substrate fixing unit 101 includes a plurality of probes 4 in which individual contacts to a large number of inspection points provided on the inspection target substrate P at a constant pitch are freely installed. A positioning frame 102 having an opening 103 of a required size at an appropriate position and a probe 4 for each of the probes 4 to correspond to the pin block 1 constituting the substrate inspection apparatus (not shown). It has a large number of guide holes 113 that can be inserted freely, and a plurality of types of abutment portions 112 of the same surface size that are prepared in order to be fixed to the opening 103. In addition, the code | symbol 7 in a figure shows the guide board used in order to suppress the deflection | deviation of a probe or to regulate the reference | standard height of a probe stroke.

  In this case, the positioning frame body 102 is formed by providing a receiving shelf portion 105 at which the position of the abutment portion 112 can be freely fixed on the inner peripheral edge portion 104 of the opening portion 103. In addition, the abutment portion 112 is formed with a recessed portion 114 that can be fixed in position according to the surface size of each inspection target substrate P of different types, and can be exchanged for each type of inspection target substrate P of different surface size. Can be used. For this reason, the substrate fixing unit 101 performs inspection by selectively using the abutment portion 112 including the recessed portion 114 corresponding to the surface size of the inspection target substrate P without changing the pin block 1 side. It can be used with versatility that can flexibly correspond to the type of target substrate P.

  However, in the case of the printed circuit board inspection apparatus disclosed in Patent Document 1, it is necessary to interpose a conductive elastic body and a position conversion body separately prepared as a custom-made product between the inspection points of the inspection target board. The incorporation of the conductive elastic body and the position changing body not only complicates the overall apparatus configuration, but also has the disadvantage that it takes time and cost more than necessary to manufacture the position changing body.

  Further, in the case of using the substrate fixing unit 101 shown in FIG. 5, it is necessary to individually manufacture the abutment portion 112 as a dedicated jig matched with the type of the substrate P to be inspected, and replace and use it each time. In addition to the increase in the inspection cost, there were also problems that the setup in advance was complicated.

  In the present invention, in view of the above-mentioned problems seen in the conventional method, when inspecting a board to be inspected for each model in which an inspection point is set under a certain rule, some parts that do not cost much are selected. It is an object to provide a board block attachment and a board fixing unit for a pin block that can reduce the inspection cost by providing versatility that can flexibly correspond to the type of board to be inspected by simply replacing it. .

The present invention has been made to achieve the above object, and the first invention (a substrate-compatible attachment) of the present invention freely implants individual contacts to a large number of inspection points set on the inspection target substrate. An attachment main body interposed between the inspection target substrate and a pin block constituting a substrate inspection apparatus having a plurality of probes, and the inspection target substrate at an appropriate position of the attachment main body It consists of a stationary part that is freely formed to allow stationary and insertion of a predetermined probe of the probes, each attachment body is formed with the same surface size, and the stationary part of each attachment body is It is characterized in that it is formed as a concave portion for each surface size that can be freely adapted to the above-mentioned substrate to be inspected according to the model with different surface sizes.

Further, the second invention (substrate fixing unit) comprises a substrate inspection apparatus having a large number of probes that can be individually contacted to a large number of inspection points set on a substrate to be inspected. A positioning frame provided with an opening of a required size at an appropriate position, a plurality of guide holes through which the probe can be inserted , and the opening of the opening. and abutment portion to be positionally fixed via the receiving ledge provided on the inner periphery, are exchanged freely fixed in position said supporting base portion of the concave portion provided on a predetermined surface area, and the recess A substrate-compatible attachment provided with a through-hole that is face-to-face matched to allow selective insertion of the probe in relation to the guide hole located inside, and the substrate-compatible attachment is set on a substrate to be inspected Many inspection points An attachment main body interposed between the pin block having a plurality of probes planted for individual contact with the probe and constituting a substrate inspection apparatus and the substrate to be inspected, and the attachment main body Each of the attachment main bodies is formed by giving the same surface size to each other. The attachment portion of each attachment main body is characterized in that it is formed as a concave portion for each surface size that can be easily adapted to the substrate to be inspected according to the type of the device having a different surface size .

According to the present invention, when inspecting a board to be inspected for each model in which inspection points are set under a certain rule, the side of the pin block as a test head having a large number of probes is not replaced. In addition, by providing versatility that allows necessary inspections to be performed by exchanging only the board-compatible attachments that make up the board fixing unit, the inspection cost is reduced and the preliminary setup is simplified. Work efficiency can be increased.
In other words, according to the first invention (substrate-compatible attachment), the same interposing arrangement is provided between the pin block having a large number of probes that are brought into individual contact with each inspection point of the inspection target substrate and the inspection target substrate. To each type of inspection target board with different surface sizes, allowing attachment of the inspection target board to appropriate positions of these attachment main bodies and insertion of a predetermined probe among the probes. In other words, the substrate to be inspected for the current inspection can be easily placed through the placement portion.
Further, according to the second invention (substrate fixing unit), the substrate frame attachment and the abutment portion are left as they are, and the substrate-compatible attachment prepared in advance in relation to the inspection target substrate for this inspection is selected. After positioning this correctly in the recessed part of the abutment part and placing the inspection target substrate for the current inspection in the concave part of the substrate-compatible attachment, Each contact pin portion can be accurately brought into contact with a predetermined inspection point on the inspection target substrate for the current inspection through the guide hole of the recessed portion and the through hole of the recessed portion.

  FIG. 1 is a main part explanatory view showing an example of a substrate fixing unit according to a second invention constructed by incorporating a substrate-compatible attachment according to the first invention of the present invention, of which (a) is The arrangement relationship with the pin block side in the non-contact state (non-inspection), and (b) shows the arrangement relationship with the pin block side in the contact state (during inspection), respectively. FIG. 2 is an explanatory diagram showing, in an enlarged manner, a circular surrounding portion indicated by a one-dot chain line in FIG. The inspection target board P to which the present invention is applied includes not only a normal printed circuit board but also an IC package such as a BGA (Ball Grid Array) type or a PGA (Pin Grid Array) type. The illustrated pin block 1 used as a test head includes a base 2 made of an insulating material, and a large number of spring probes or the like implanted on the upper surface 3 of the base 2 in a positional relationship orthogonal to the surface direction. The probe 4 is provided at least, and is formed so as to be freely in electrical contact with each inspection point of the inspection target substrate P placed downward with the horizontal direction as the plane direction. Note that reference numeral 40 in the drawing denotes a guide board used for suppressing the deflection of the probe 4 or regulating the reference height of the stroke of the probe 4.

  According to FIG. 1 and FIG. 2, the substrate fixing unit 11 can freely plant individual contacts to a large number of inspection points set in, for example, a lattice at a required pitch on the inspection target substrate P as in FIG. It is used in relation to a pin block 1 having a plurality of probes 4 provided and constituting a substrate inspection apparatus (not shown).

  A board fixing unit 11 made of an insulating material such as a synthetic resin has a positioning frame 12 provided with an opening 13 of a required size at an appropriate position and a probe 4 inserted through the probe 4 in order to correspond to the pin block 1. A support portion 22 having a plurality of guide holes 24 that can be freely positioned and fixed to the opening 13 side; and a fixed surface region 25 of the support portion 22 that is replaceably fixed; and At least a substrate corresponding attachment 32 provided with a through hole 36 which is face-to-face matched to allow selective insertion of the probe 4 in relation to the guide hole 24 located in the surface region 25 is formed.

  Among them, the positioning frame 12 is disposed and fixed on the side of a substrate inspection apparatus (not shown), and the abutment 22 is provided at the inner peripheral edge 14 of the opening 13. A bowl-shaped receiving shelf portion 15 is formed so as to be recessed so as to be placed through the side. The receiving shelf portion 15 is formed with a depth that allows it to be flush and stably accommodated under a state that substantially matches the outer peripheral shape of the abutment portion 22.

  Further, the abutment portion 22 is formed by providing a concave portion 26 as a surface region 25 in which the position of the substrate corresponding attachment 32 can be fixed freely. In this case, the recessed portion 26 is formed to have a depth and a flat inner bottom surface that can be stably accommodated in a uniform manner that substantially matches the outer peripheral shape of the attachment main body 33 in the substrate-compatible attachment 32. Has been.

  In this case, each substrate-corresponding attachment 32 according to the first aspect of the invention has a large number of probes 4 that are freely planted for individual contact with a large number of inspection points set on the inspection target substrate P. An attachment main body 33 interposed between the pin block 1 and the inspection target substrate P constituting the non-inspected substrate inspection apparatus, the placement of the inspection target substrate P at an appropriate position of the attachment main body 33 and the probe 4 And a fixed portion 34 that can be freely inserted into the selected predetermined probe 4. Among these, each attachment main body 33 is formed with the same surface size, and the stationary portion 34 of each attachment main body 33 is free to cope with different types of inspection target substrates P having different surface sizes. It is formed according to various surface sizes.

That is, each substrate-corresponding attachment 32 has the same outer peripheral shape, that is, is given the same surface size so that any of the attachments 32 can be fixed in position while sharing the recessed portion 26 of the abutment portion 22. The attachment main body 33 is formed, and a placement portion 34 that allows the inspection target substrate P to be placed at an appropriate position of the attachment main body 33. Further, the substrate corresponding attachment 32 is prepared for each surface size of the inspection target substrate P of a different model. For example, the substrate corresponding attachment 32 is made to correspond to the _first inspection target substrate P ₁ as the inspection target substrate P having a large surface size. Therefore, it is formed by making the recessed part 35 provided with the inner periphery shape and depth which can be fixed this flush | planar with the fixed part 34. FIG.

  On the other hand, FIG. 3 is a main part explanatory view showing another example of the substrate fixing unit according to the present invention, in which (a) is an arrangement relationship with the pin block side in a non-contact state (when not inspected). (B) shows the arrangement relationship with the pin block side in the contact state (during inspection), respectively. Moreover, FIG. 4 is explanatory drawing which expands and shows the circular surrounding site | part by the dashed-dotted line of FIG.3 (b).

As shown in FIGS. 3 and 4, the board fixing unit 11 includes the positioning frame 12, the abutment 22, and the board corresponding attachment 32 as in the example shown in FIG. 1. in order to correspond to the substrate corresponding attachment 32 second test Nomigamen a small inspection target board P sizes target substrate P ₂ of this, the concave portion 35 of the surface size which can be placed the inspection target board P ₂ The provided one is used. That is, at least two or more types of substrate-corresponding attachments 32 are prepared that have the recessed portion 35 formed as a stationary portion 34 in relation to the inspection target substrate P of a different model while having the same outer peripheral shape. Will be.

Next, the operation and effect of the present invention (substrate attachment and substrate fixing unit) having the above-described configuration will be described. As shown in FIG. Then, the substrate corresponding attachment 32 prepared in advance in relation to the _first inspection target substrate P ₁ for the current inspection is selected, and this is correctly positioned and arranged in the recessed portion 26 of the abutment portion 22. Thereafter, the position fixing its entirety on which is placed a first inspection target board P ₁ in the recess 35 of the substrate corresponding attachment 32.

In this way, after completion of the first set of inspection target board P ₁ to the position fixing unit 11 side, such as to raise the side of the pin block 1, by position movement both in the relative direction, the probe 4 the side to approach to the first test point side of the inspection target board P _1.

At this time, the guide hole 24 is formed in the recessed portion 26 of the abutment portion 22 and the through hole 36 is formed in the recessed portion 35 of the substrate corresponding attachment 32 under a positional relationship in which they communicate with each other. each probe 4 in the positional relationship facing can be accurately contacted each contact pin portion 5 to a predetermined test points in the inspection target board P ₁ of the first is allowed its insertion.

However, although the probe 4 which is not necessary in relation to the first inspection target substrate P ₁ is inserted into the guide hole 24 of the abutment portion 22, a through hole 36 is provided on the substrate corresponding attachment 32 side. Therefore, the contact pin portion 5 comes into contact with the lower bottom surface 37 and the movement is forcibly blocked. That is, only the necessary probes 4 can contact the corresponding inspection points in relation to the inspection points of the _first inspection target substrate P1.

On the other hand, when inspecting a _second inspection target board P ₂ of a different model using the same pin block 1, a board-compatible attachment 32 prepared in advance in relation to the _second inspection target board P ₂ is selected. Then, as shown in FIG. 3 (a), this is correctly positioned and arranged in the recessed portion 26 of the abutment portion 22. Thereafter, the position fixing its entirety on which the second inspection target board is P ₁₂ positioned within the recess 35 of the substrate corresponding attachment 32.

In this way, after completion of the second set of inspection target board P ₂ to the position fixing unit 11 side, the test point to test the substrate P ₂ side of the second probe 4 in the same manner as in FIG. 1 Approach to the side.

At this time, the guide hole 24 is formed in the recessed portion 26 of the abutment portion 22 and the through hole 36 is formed in the recessed portion 35 of the substrate corresponding attachment 32 under a positional relationship in which they communicate with each other. each probe 4 in the positional relationship facing can be accurately contacted each contact pin portion 5 to a predetermined test points in the second inspection target board P ₂ is allowed its insertion.

However, although the probe 4 which is not necessary in relation to the second inspection target substrate P ₂ is inserted into the guide hole 24 of the abutment portion 22, a through hole 36 is provided on the substrate corresponding attachment 32 side. Therefore, the contact pin portion 5 comes into contact with the lower bottom surface 37 and the movement is forcibly blocked. That is, only the necessary spring probe 4 can contact each corresponding inspection point in relation to the inspection point of the _second inspection target substrate P2.

For this reason, according to the present invention, when inspecting the type of inspection target substrate P (P ₁ , P ₂ ) for which the inspection point is set based on a certain rule, a plurality of probes 4 are provided. By exchanging only the substrate-compatible attachment 32 on the substrate fixing unit 11 side without replacing the pin block 1 side as a test head, it is possible to perform inspection by giving versatility to perform necessary inspection. Cost reduction and simplification of preliminary setup can be achieved.

  The embodiment of the present invention has been described with reference to the illustrated example, and the specific embodiment is not limited to this. For example, the arrangement of the abutment portion 22 with respect to the positioning frame body 12 may be configured such that a collar portion is formed on the abutment portion 22 side and placed on the positioning frame body 12 side. Further, three or more types of substrate-compatible attachments 32 can be prepared in correspondence with the number of types of substrates P to be inspected. Furthermore, the positional relationship between the pin block 1 and the substrate fixing unit 11 is such that the substrate fixing unit 11 is placed facing the upper side of the pin block 1 as shown in the example, and the vertical relationship between the two is reversed, Alternatively, the board fixing unit 11 may be positioned sideways and the surface direction of the board fixing unit 11 may be vertical.

It is principal part explanatory drawing which shows an example of the unit for board | substrate fixation which concerns on 2nd invention comprised incorporating the attachment corresponding to the board | substrate which concerns on 1st invention in relation to a pin block, (a) is non- The arrangement relationship in the contact state (during non-inspection) and (b) shows the arrangement relationship in the contact state (during inspection), respectively. Explanatory drawing which expands and shows the circular go part of FIG.1 (b). It is principal part explanatory drawing which shows the other example of the board | substrate fixing unit which concerns on this invention by the relationship with a pin block, (a) of them is the arrangement | positioning relationship in a non-contact state (at the time of non-inspection), (b) Indicates the arrangement relationship in the contact state (during inspection), respectively. Explanatory drawing which expands and shows the circular go part of FIG.3 (b). It is principal part explanatory drawing which shows the conventional example of the unit for board | substrate fixation by the relationship with a pin block, of which (a) is the arrangement | positioning relationship in a non-contact state (at the time of non-inspection), (b) is a contact state The arrangement relationship at the time of (inspection) is shown respectively. Explanatory drawing which expands and shows the circular surrounding site | part of FIG.5 (b).

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Pin block 2 Base 3 Upper surface 4 Probe 5 Contact pin part 7 Guide board 11 Substrate fixing unit 12 Positioning frame 13 Opening part 14 Inner peripheral edge part 15 Receptacle part 22 Abutment part 23 Outer peripheral part 24 Guide hole 25 Surface Area 26 Recessed portion 32 Attachment for substrate 33 Attachment body 34 Stationary portion 35 Recessed portion 36 Through hole 37 Lower bottom surface 40 Guide board P Substrate to be inspected

Claims (2)

Between the inspection target substrate and the pin block that constitutes the substrate inspection apparatus having a large number of probes that are freely planted for individual contact with a large number of inspection points set on the inspection target substrate. An attachment body that is interposed, and a placement portion that is freely formed to place the inspection target substrate at an appropriate position of the attachment body and to insert a predetermined probe among the probes,
Each attachment body is formed with the same surface size,
The attachment for a board according to claim 1, wherein the stationary part of each attachment body is formed as a concave part for each surface size that can be easily adapted to the substrate to be inspected depending on the type of the machine having a different surface size. In order to correspond to the pin block constituting the board inspection apparatus having a large number of probes planted freely for individual contact with a large number of inspection points set on the inspection target board,
A positioning frame provided with an opening of a required size at an appropriate position;
A support part that has a large number of guide holes through which each of the probes can be freely inserted , and that is fixed in position via a receiving shelf provided at the inner peripheral edge of the opening ,
Exchanged freely fixed in position said supporting base portion of the concave portion provided on a predetermined surface area, and is opposed matched to allow sorting insertion of the probe in relation to the guide hole located in said recess And a board-compatible attachment provided with through holes,
The substrate-corresponding attachment includes a pin block that constitutes a substrate inspection apparatus having a large number of probes that are freely planted for individual contact with a large number of inspection points set on a substrate to be inspected, and the inspection An attachment main body interposed between the target substrate, and a stationary portion formed to freely place the inspection target substrate at an appropriate position of the attachment main body and insertion of a predetermined probe among the probes. Become
Each attachment body is formed with the same surface size,
The board fixing unit according to claim 1, wherein the stationary part of each attachment body is formed as a concave part for each surface size that can be easily adapted to the substrate to be inspected according to the type of the different surface size .

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