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JP4213133B2 - Manufacturing method of processing apparatus, manufacturing method of quartz product in processing apparatus, and measuring jig - Google Patents
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JP4213133B2 - Manufacturing method of processing apparatus, manufacturing method of quartz product in processing apparatus, and measuring jig - Google Patents

Manufacturing method of processing apparatus, manufacturing method of quartz product in processing apparatus, and measuring jig Download PDF

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JP4213133B2
JP4213133B2 JP2005114339A JP2005114339A JP4213133B2 JP 4213133 B2 JP4213133 B2 JP 4213133B2 JP 2005114339 A JP2005114339 A JP 2005114339A JP 2005114339 A JP2005114339 A JP 2005114339A JP 4213133 B2 JP4213133 B2 JP 4213133B2
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sealing surface
quartz product
quartz
processing apparatus
mirror
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JP2006294900A (en
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真実 高橋
学 本間
勝彦 小山
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Tokyo Electron Ltd
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本発明は、処理装置の製造方法、処理装置における石英製品の製造方法及び測定治具に係り、特に石英製品における鏡面加工のシール面の平面度を測定する技術に関する。 The present invention relates to a method of manufacturing a processing device, relates relates to the manufacturing method and the measurement jig quartz products in the processing unit, in particular measures the flatness of the sealing surface of the mirror-finished in the quartz product technology.

半導体デバイスの製造においては、被処理体例えば半導体ウエハに、酸化、拡散、CVD(Chemical Vapor Deposition)などの処理を施すために、各種の処理装置(半導体製造装置)が用いられている。そして、その一つとして、一度に多数枚の被処理体の処理例えば熱処理が可能なバッチ式の処理装置例えば縦型熱処理装置が知られている。   In the manufacture of semiconductor devices, various types of processing apparatuses (semiconductor manufacturing apparatuses) are used to perform processes such as oxidation, diffusion, and CVD (Chemical Vapor Deposition) on an object to be processed such as a semiconductor wafer. As one of them, a batch type processing apparatus such as a vertical heat processing apparatus capable of processing a large number of objects to be processed at a time, for example, heat processing is known.

この縦型熱処理装置は、下端が開口された石英製の処理容器内に多数枚の被処理体を保持した保持具を収容して開口を蓋体で密閉し、処理容器の周囲に設けたヒータにより被処理体を加熱して所定の処理ガス雰囲気下で所定の熱処理を行うようになっている(例えば、特開2003−257958号公報参照)。処理容器2、下端に開口(炉口)を有すると共に、下端側の外周にフランジ部を有し、該フランジ部が金属製のフランジ押えによって支持されている。前記処理容器の開口端には蓋体が当接されて閉塞される。前記蓋体は金属製例えばステンレス製であり、蓋体には処理容器の開口端との間をシールするための気密材として耐熱樹脂製のOリングが取付溝を介して取付けられている。   This vertical heat treatment apparatus accommodates a holder that holds a number of objects to be processed in a quartz processing container having an open lower end, hermetically closes the opening with a lid, and a heater provided around the processing container Thus, the object to be processed is heated to perform a predetermined heat treatment in a predetermined processing gas atmosphere (see, for example, Japanese Patent Application Laid-Open No. 2003-257958). The processing vessel 2 has an opening (furnace port) at the lower end and a flange portion on the outer periphery on the lower end side, and the flange portion is supported by a metal flange presser. A lid is brought into contact with the open end of the processing container to close it. The lid is made of metal, for example, stainless steel, and an O-ring made of heat-resistant resin is attached to the lid via a mounting groove as an airtight material for sealing between the opening end of the processing container.

しかしながら、このような縦型熱処理装置においては、金属製の蓋体の内面(上面)が処理容器内に暴露されているため、蓋体の内面が腐食性を有する処理ガスによって腐食する可能性や、被処理体への金属汚染の可能性がある。また、前記処理容器の開口端と蓋体との間にOリングが挟まれているため、処理容器内の真空引き時にOリングからアウトガスが発生して処理容器内に吸い込まれ、被処理体への汚染源になる可能性をある。   However, in such a vertical heat treatment apparatus, since the inner surface (upper surface) of the metal lid is exposed in the processing container, the inner surface of the lid may be corroded by the processing gas having corrosiveness. There is a possibility of metal contamination of the workpiece. Further, since the O-ring is sandwiched between the open end of the processing container and the lid, outgas is generated from the O-ring when the processing container is evacuated, and is sucked into the processing container to be processed. May be a source of pollution.

そこで、本出願人は、これらの課題を解決するために、蓋体を石英製にした(例えば処理容器の開口端に当接する内側蓋部を石英製にした)縦型熱処理装置を先に出願した(特願2004−46729号、未公開)。この場合、図13に示すように、処理容器2と蓋体7の当接面(接合面)16,17間をシール(封止)するために、当接面(シール面ともいう)16,17に鏡面加工を施し、該鏡面加工のシール面同士を密着させてシール部(これを鏡面シール部という。)を形成する鏡面シール構造を採用する。この鏡面シール部のシール性を高めるためにはシール面16,17に高い平面度が要求される。   Therefore, in order to solve these problems, the applicant of the present application has first filed a vertical heat treatment apparatus in which the lid body is made of quartz (for example, the inner lid portion contacting the opening end of the processing vessel is made of quartz). (Japanese Patent Application No. 2004-46729, unpublished). In this case, as shown in FIG. 13, in order to seal between the contact surfaces (joint surfaces) 16 and 17 of the processing container 2 and the lid body 7, contact surfaces (also referred to as seal surfaces) 16, A mirror surface sealing structure is employed in which a mirror surface processing is applied to 17 and the sealing surfaces of the mirror processing are brought into close contact with each other to form a sealing portion (this is referred to as a mirror surface sealing portion). In order to improve the sealing performance of the mirror surface sealing portion, high flatness is required for the sealing surfaces 16 and 17.

特開2003−257958号公報JP 2003-257958 A

ところで、鏡面加工において、被加工面(シール面)をガス焼きにより滑らかに仕上げる場合、バーナーの火を勢いよく当てすぎてシール面16,17のエッジ側に突出部分(盛上り部)70が発生することが考えられる。一方、平面度を測定する手段としては、例えば表面粗さ計や三次元測定器などがある。   By the way, in the case of mirror finishing, when the surface to be processed (seal surface) is smoothly finished by gas baking, the burner fire is applied too vigorously and a protruding portion (swelling portion) 70 is generated on the edge side of the seal surfaces 16 and 17. It is possible to do. On the other hand, examples of means for measuring flatness include a surface roughness meter and a three-dimensional measuring instrument.

しかしながら、これらの測定器は部分的な測定には適するが、前述したような処理装置における処理容器や蓋体のシール面の測定ではシール面が比較的大径の環状であることから、シール面全周を一度に測定することは難しい。そのため、シール面全周において基準面から突出している突出部分を検出して削除することが難しいため、処理容器と蓋体の鏡面シール部において突出部分に起因するシール性のバラツキが発生し、被処理体の処理の均一性例えば膜厚の均一性を悪化させる可能性がある。また、前記突出部分により傷、欠け、ひび、割れなどが発生し、パーティクルの発生源になる可能性がある。   However, these measuring instruments are suitable for partial measurement. However, in the measurement of the sealing surface of the processing container or lid in the processing apparatus as described above, the sealing surface is a relatively large-diameter ring. It is difficult to measure the entire circumference at once. Therefore, it is difficult to detect and delete the protruding portion protruding from the reference surface in the entire circumference of the sealing surface.Therefore, variations in the sealing property due to the protruding portion occur in the mirror surface sealing portion of the processing container and the lid, and There is a possibility that the uniformity of processing of the processing body, for example, the uniformity of the film thickness may be deteriorated. Further, the protruding portion may cause scratches, chips, cracks, cracks, and the like, and may become a particle generation source.

本発明は、上記事情を考慮してなされたものであり、鏡面シール部のシール面の平面度をシール面全周にわたり一度に容易に測定することができ、鏡面シール部のシール性の向上及び処理の均一性の向上が図れ、パーティクルの発生源になる可能性を排除できる処理装置、処理装置の製造方法、処理装置における石英製品の製造方法及び測定治具を提供することを目的とする。   The present invention has been made in consideration of the above circumstances, and the flatness of the seal surface of the mirror surface seal portion can be easily measured at once over the entire circumference of the seal surface, improving the sealing performance of the mirror surface seal portion and It is an object of the present invention to provide a processing apparatus, a processing apparatus manufacturing method, a quartz product manufacturing method and a measuring jig capable of improving the uniformity of processing and eliminating the possibility of becoming a particle generation source.

上記目的を達成するために、本発明のうち、請求項記載の処理装置の製造方法は、被処理体を収容して所定の処理を行う処理部が石英製品からなり、該石英製品が鏡面加工のシール面同士を密着させる鏡面シール部を有する処理装置の製造方法であって、前記石英製品のシール面の平面度を感圧紙を用いて測定する測定工程と、その測定結果が予め定められた範囲内の石英製品を選択して組立てる組立工程とを備えたことを特徴とする。 To achieve the above object, out of the present invention, a manufacturing method of the processing apparatus according to claim 1 is made processing unit that performs predetermined processing by accommodating the object to be processed is of quartz products, quartz products mirror A manufacturing method of a processing apparatus having a mirror surface seal portion for closely contacting processing seal surfaces, wherein a measurement step for measuring the flatness of the seal surface of the quartz product using pressure-sensitive paper and the measurement result are predetermined. And an assembling process for selecting and assembling quartz products within the specified range.

請求項記載の処理装置の製造方法は、請求項記載の処理装置の製造方法において、前記測定結果が予め定められた範囲を超えた石英製品である場合、該石英製品のシール面を再度鏡面加工することを特徴とする。 The processing apparatus manufacturing method according to claim 2 is the processing apparatus manufacturing method according to claim 1 , wherein when the measurement result is a quartz product exceeding a predetermined range, the sealing surface of the quartz product is set again. It is characterized by mirror finishing.

請求項記載の処理装置の製造方法は、請求項又は記載の処理装置の製造方法において、前記鏡面加工が、石英製品のシール面を研磨する研磨工程と、研磨されたシール面をガス焼きにより仕上げする仕上工程とを有することを特徴とする。 Method for manufacturing a processing apparatus according to claim 3 is a method of manufacturing a processing apparatus according to claim 1 or 2, wherein the mirror-polishing, gas and polishing step of polishing the sealing surface of the quartz product, a polished seal surface And a finishing step of finishing by baking.

請求項記載の処理装置における石英製品の製造方法は、被処理体を収容して所定の処理を行う処理装置に使用される鏡面加工のシール面を有する石英製品を製造する方法であって、石英製品のシール面を研磨する研磨工程と、研磨されたシール面をガス焼きにより仕上げる仕上工程と、仕上げられたシール面に感圧紙を平面で押圧してシール面の平面度を測定する工程と、その測定結果が予め定められた範囲内か否かにより石英製品が良品か否かを判定する工程とを備えたことを特徴とする。 The method for producing a quartz product in the processing apparatus according to claim 4 is a method for producing a quartz product having a mirror-finished sealing surface used in a processing apparatus that accommodates an object to be processed and performs a predetermined process. A polishing step for polishing the sealing surface of the quartz product, a finishing step for finishing the polished sealing surface by gas baking, and a step for measuring the flatness of the sealing surface by pressing a pressure-sensitive paper with a flat surface against the finished sealing surface. And a step of determining whether or not the quartz product is a non-defective product based on whether or not the measurement result is within a predetermined range.

請求項記載の処理装置における石英製品の製造方法は、請求項記載の処理装置における石英製品の製造方法において、前記測定結果が予め定められた範囲を超えた石英製品である場合、該石英製品のシール面を再度鏡面加工することを特徴とする。 The method for producing a quartz product in the processing apparatus according to claim 5 is the method for producing a quartz product in the processing apparatus according to claim 4 , wherein the quartz product has a measurement result exceeding a predetermined range. The sealing surface of the product is mirror-finished again.

請求項記載の処理装置における石英製品の製造方法は、請求項又は記載の処理装置における石英製品の製造方法において、前記鏡面加工が、石英製品のシール面を研磨する研磨工程と、研磨されたシール面をガス焼きにより仕上げる仕上工程とを有することを特徴とする。 The method for producing a quartz product in the processing apparatus according to claim 6 is the method for producing a quartz product in the processing apparatus according to claim 4 or 5 , wherein the mirror surface processing comprises: a polishing step for polishing a sealing surface of the quartz product; And a finishing step of finishing the sealed surface by gas baking.

請求項記載の測定治具は、被処理体を収容して所定の処理を行う処理装置の処理部を構成する石英製品の鏡面シール部のシール面の平面度を感圧紙を用いて測定する測定治具であって、前記石英製品をそのシール面を露出させた状態で固定する固定台と、前記石英製品のシール面に感圧紙を位置させる感圧紙案内部と、前記石英製品のシール面に感圧紙を所定の圧力で当接させる平らな当接体を有する押圧機構とを備えたことを特徴とする。 The measuring jig according to claim 7 measures the flatness of the sealing surface of the mirror surface sealing portion of the quartz product that constitutes the processing portion of the processing apparatus that accommodates the object to be processed and performs predetermined processing, using pressure sensitive paper. A measuring jig, a fixing base for fixing the quartz product with its sealing surface exposed, a pressure-sensitive paper guide for positioning pressure-sensitive paper on the sealing surface of the quartz product, and a sealing surface of the quartz product And a pressing mechanism having a flat abutting body for abutting the pressure sensitive paper with a predetermined pressure.

請求項記載の処理装置の製造方法によれば、被処理体を収容して所定の処理を行う処理部が石英製品からなり、該石英製品が鏡面シール部を有する処理装置の製造方法であって、前記石英製品の鏡面シール部のシール面の平面度を感圧紙を用いて測定する測定工程と、その測定結果が予め定められた範囲内の石英製品を選択して組立てる組立工程とを備えているため、鏡面シール部のシール面の平面度をシール面全周にわたり一度に容易に測定することができ、鏡面シール部のシール性の向上及び処理の均一性の向上が図れ、パーティクルの発生源になる可能性を排除できる。 According to the method for manufacturing a processing apparatus according to claim 1, the processing unit that accommodates an object to be processed and performs a predetermined process is made of a quartz product, and the quartz product has a mirror seal part. A measuring step of measuring the flatness of the sealing surface of the mirror seal portion of the quartz product using pressure-sensitive paper, and an assembling step of selecting and assembling a quartz product whose measurement result is within a predetermined range. Therefore, the flatness of the sealing surface of the mirror surface sealing part can be easily measured at once over the entire circumference of the sealing surface, improving the sealing property of the mirror surface sealing part and the uniformity of processing, and generating particles. The possibility of becoming a source can be eliminated.

請求項記載の処理装置の製造方法によれば、前記測定結果が予め定められた範囲を超えた石英製品である場合、該石英製品のシール面を再度鏡面加工するため、シール面の突出部分を容易に検出して削除することができ、鏡面シール部のシール性の向上及び処理の均一性の向上が図れ、突出部分に起因する傷や欠け等を防止でき、パーティクルの発生源になる可能性を排除できる。 According to the method for manufacturing a processing apparatus according to claim 2 , when the measurement result is a quartz product exceeding a predetermined range, the sealing surface of the quartz product is mirror-finished again, so that the protruding portion of the sealing surface Can be detected and deleted easily, the sealing performance of the mirror surface seal part and the uniformity of processing can be improved, scratches and chipping caused by the protruding part can be prevented, and it can be a source of particles Sex can be excluded.

請求項記載の処理装置の製造方法によれば、前記鏡面加工が、石英製品のシール面を研磨する研磨工程と、研磨されたシール面をガス焼きにより仕上げする仕上工程とを有するため、石英製品のシール面を容易に鏡面加工することができ、鏡面シール部のシール性の向上が図れる。 According to the method for manufacturing a processing apparatus according to claim 3 , since the mirror surface processing includes a polishing step of polishing a sealing surface of a quartz product and a finishing step of finishing the polished sealing surface by gas baking. The sealing surface of the product can be easily mirror-finished, and the sealing performance of the mirror surface sealing portion can be improved.

請求項記載の処理装置における石英製品の製造方法によれば、被処理体を収容して所定の処理を行う処理装置に使用される鏡面加工のシール面を有する石英製品を製造する方法であって、石英製品のシール面を研磨する研磨工程と、研磨されたシール面をガス焼きにより仕上げる仕上工程と、仕上げられたシール面に感圧紙を平面で押圧してシール面の平面度を測定する工程と、その測定結果が予め定められた範囲内か否かにより石英製品が良品か否かを判定する工程とを備えているため、シール面の平面度の高い石英製品が容易に得られる。 According to the method for manufacturing a quartz product in the processing apparatus according to claim 4, the method for manufacturing a quartz product having a mirror-finished sealing surface used in a processing apparatus that accommodates an object to be processed and performs a predetermined process. The polishing process for polishing the sealing surface of the quartz product, the finishing process for finishing the polished sealing surface by gas baking, and the flatness of the sealing surface is measured by pressing the pressure-sensitive paper with a flat surface against the finished sealing surface. Since the method includes a step and a step of determining whether or not the quartz product is a non-defective product based on whether or not the measurement result is within a predetermined range, a quartz product with a high flatness of the sealing surface can be easily obtained.

請求項記載の処理装置における石英製品の製造方法によれば、前記測定結果が予め定められた範囲を超えた石英製品である場合、該石英製品のシール面を再度鏡面加工するため、シール面の突出部分を容易に検出して削除することができ、鏡面シール部のシール性の向上及び処理の均一性の向上が図れ、突出部分に起因する傷や欠け等を防止でき、パーティクルの発生源になる可能性を排除できる。 According to the method for manufacturing a quartz product in the processing apparatus according to claim 5 , when the measurement result is a quartz product exceeding a predetermined range, the sealing surface of the quartz product is again mirror-finished. Can easily detect and remove the protruding portion of the mirror, improve the sealing performance of the mirror surface seal portion and improve the uniformity of processing, prevent scratches and chipping caused by the protruding portion, and generate particles The possibility of becoming.

請求項記載の処理装置における石英製品の製造方法によれば、前記鏡面加工が、石英製品のシール面を研磨する研磨工程と、研磨されたシール面をガス焼きにより仕上げる仕上工程とを有するため、石英製品のシール面を容易に鏡面加工することができ、鏡面シール部のシール性の向上が図れる。 According to the method for manufacturing a quartz product in the processing apparatus according to claim 6 , the mirror surface processing includes a polishing step for polishing the sealing surface of the quartz product and a finishing step for finishing the polished sealing surface by gas baking. The sealing surface of the quartz product can be easily mirror-finished, and the sealing performance of the mirror surface sealing portion can be improved.

請求項記載の測定治具によれば、被処理体を収容して所定の処理を行う処理装置の処理部を構成する石英製品の鏡面シール部のシール面の平面度を感圧紙を用いて測定する測定治具であって、前記石英製品をそのシール面を露出させた状態で固定する固定台と、前記石英製品のシール面に感圧紙を位置させる感圧紙案内部と、前記石英製品のシール面に感圧紙を所定の圧力で当接させる平らな当接体を有する押圧機構とを備えているため、鏡面シール部のシール面の平面度をシール面全周にわたり一度に容易に測定することができ、鏡面シール部のシール性の向上及び処理の均一性の向上が図れ、パーティクルの発生源になる可能性を排除できる。 According to the measurement jig of claim 7, the flatness of the sealing surface of the mirror surface sealing portion of the quartz product constituting the processing portion of the processing apparatus that accommodates the object to be processed and performs the predetermined processing is determined using the pressure sensitive paper. A measuring jig for measuring, a fixing base for fixing the quartz product with its sealing surface exposed, a pressure sensitive paper guide for positioning pressure sensitive paper on the sealing surface of the quartz product, Since it has a pressing mechanism with a flat contact body that makes the pressure sensitive paper contact the sealing surface with a predetermined pressure, the flatness of the sealing surface of the mirror surface sealing portion can be easily measured all around the sealing surface. It is possible to improve the sealing performance of the mirror surface sealing portion and the uniformity of processing, and eliminate the possibility of becoming a particle generation source.

以下に、本発明を実施するための最良の形態について、添付図面を基に詳述する。図1は本発明の実施の形態に係る処理装置の概略構成を示す縦断面図である。   The best mode for carrying out the present invention will be described below in detail with reference to the accompanying drawings. FIG. 1 is a longitudinal sectional view showing a schematic configuration of a processing apparatus according to an embodiment of the present invention.

図1において、1は処理装置として例示した縦型熱処理装置で、この縦型熱処理装置1は被処理体を収容して所定の処理を行う処理部として多数枚の被処理体例えば半導体ウエハwを収容して所定の熱処理を行う処理容器2を備えている。この処理容器2は、耐熱性及び耐食性を有する石英(石英ガラス)により形成されている。処理容器2は、上端がドーム状、具体的には逆漏斗状に形成されており、下端が炉口3として開口している。前記処理容器2の開口端側外周部にはフランジ部4が設けられ、該フランジ部4がフランジ押え5を介して図示しないベースプレートに固定されている。   In FIG. 1, reference numeral 1 denotes a vertical heat treatment apparatus exemplified as a processing apparatus. This vertical heat treatment apparatus 1 accommodates a plurality of objects to be processed, for example, semiconductor wafers w, as a processing unit that accommodates the object to be processed and performs a predetermined process. A processing container 2 that accommodates and performs a predetermined heat treatment is provided. The processing container 2 is formed of quartz (quartz glass) having heat resistance and corrosion resistance. The processing container 2 has an upper end formed in a dome shape, specifically, a reverse funnel shape, and a lower end opened as a furnace port 3. A flange portion 4 is provided on the outer peripheral portion on the opening end side of the processing container 2, and the flange portion 4 is fixed to a base plate (not shown) via a flange presser 5.

処理容器2の頂部中央にはL字状の排気管部6が形成され、この排気管部6には処理容器2内を所定の圧力例えば133Pa程度に減圧可能な排気系の排気管が接続されている。前記処理容器2の周囲には処理容器2内を所定の温度例えば300〜1200℃に加熱制御可能な円筒状のヒーター(図示省略)が設けられている。   An L-shaped exhaust pipe portion 6 is formed at the center of the top of the processing container 2, and an exhaust system exhaust pipe capable of reducing the inside of the processing container 2 to a predetermined pressure, for example, about 133 Pa, is connected to the exhaust pipe portion 6. ing. A cylindrical heater (not shown) capable of controlling the inside of the processing container 2 to a predetermined temperature, for example, 300 to 1200 ° C., is provided around the processing container 2.

処理容器2の下方には、処理容器2の炉口(下端開口)3を開閉する蓋体7が図示しない昇降機構により昇降可能に設けられている。該蓋体7の上方には複数例えば25〜100枚程度のウエハwを上下方向に所定の間隔で多段に保持する保持具としての石英製のボート8が設けられている。このボート8は下部中央部に支柱9を有し、該支柱9が蓋体7の中央部に設けられた回転導入機構10の回転軸部11に接続されている。前記蓋体7の中央部には炉口3からの放熱を抑制する断熱手段としてサーモプラグ12が前記支柱9と干渉しない状態で設けられている。このサーモプラグ12は蓋体7上に立設される複数本の脚柱13と、これら脚柱13の上端部に略水平に設けられた面状発熱体からなる下部ヒーター14と脚柱13に高さ方向に所定間隔で配設された複数枚の遮熱板15とから主に構成されている。   Below the processing container 2, a lid body 7 that opens and closes the furnace port (lower end opening) 3 of the processing container 2 is provided so as to be moved up and down by a lifting mechanism (not shown). Above the lid body 7, a quartz boat 8 is provided as a holder for holding a plurality of, for example, about 25 to 100 wafers w at a predetermined interval in the vertical direction. The boat 8 has a support column 9 at the lower center portion, and the support column 9 is connected to a rotation shaft portion 11 of a rotation introducing mechanism 10 provided at the center portion of the lid body 7. A thermo plug 12 is provided at a central portion of the lid 7 as a heat insulating means for suppressing heat radiation from the furnace port 3 so as not to interfere with the support column 9. The thermo plug 12 is provided with a plurality of leg posts 13 erected on the lid body 7, and a lower heater 14 and a leg post 13 each formed of a planar heating element provided substantially horizontally at the upper end of the leg posts 13. It is mainly composed of a plurality of heat shield plates 15 arranged at predetermined intervals in the height direction.

前記蓋体7は、石英製である。具体的には、蓋体7は、前記処理容器2の開口端である当接面(シール面)16に当接される石英製の内側蓋部7aと、該内側蓋部7aの外面を覆う金属製の外側蓋部7bとからなっている。前記内側蓋部7aの上端外周部は前記処理容器2の開口端外周部よりも内側に形成されている。前記内側蓋部7aの中央部には前記回転軸部11を挿通するボス部18が下向きに形成されている。内側蓋部7aの周縁部には、前記処理容器2の開口端である当接面(シール面)16に当接する環状の当接面(シール面)17が上方に突出して形成されている。また、内側蓋部7aの外周下側にはフランジ部19が形成されている。   The lid body 7 is made of quartz. Specifically, the lid body 7 covers an inner lid portion 7a made of quartz that is in contact with a contact surface (seal surface) 16 that is an open end of the processing container 2, and an outer surface of the inner lid portion 7a. It consists of a metal outer lid 7b. An upper end outer peripheral portion of the inner lid portion 7 a is formed inside an opening end outer peripheral portion of the processing container 2. A boss 18 that passes through the rotating shaft 11 is formed downward in the center of the inner lid 7a. An annular contact surface (seal surface) 17 that contacts the contact surface (seal surface) 16 that is the open end of the processing container 2 is formed on the peripheral edge of the inner lid portion 7a so as to protrude upward. Further, a flange portion 19 is formed on the outer peripheral lower side of the inner lid portion 7a.

前記外側蓋部7bの中央部には前記ボート8を回転するための回転導入機構10が設けられている。この回転導入機構10は前記外側蓋部7bの下面に固定されるフランジ部20と、該フランジ部20の中央から上方に突出した回転軸部11とを有している。前記内側蓋部7aのボス部18の下端部と前記回転導入機構10のフランジ部20との間には、これらの間をシールするOリング21が設けられている。   A rotation introducing mechanism 10 for rotating the boat 8 is provided at the center of the outer lid portion 7b. The rotation introducing mechanism 10 has a flange portion 20 fixed to the lower surface of the outer lid portion 7b, and a rotating shaft portion 11 protruding upward from the center of the flange portion 20. Between the lower end part of the boss | hub part 18 of the said inner side cover part 7a, and the flange part 20 of the said rotation introduction mechanism 10, the O-ring 21 which seals between these is provided.

外側蓋7bの周縁部には環状の立ち上がり部22が形成され、この立ち上がり部22の上面に前記内側蓋部7aのフランジ部19が耐熱樹脂製のシートを介して載置されている。また、前記立ち上がり部22には内側蓋部7aのフランジ部19を固定するための環状のフランジ押え23がネジにより着脱自在に取付けられている。このフランジ押え23の上端部には、処理容器2の開口端下面とに接してこれらの間をシールする耐熱樹脂製例えばテフロン(登録商標)製Oリング24が設けられている。フランジ押え23にはOリング24を冷却する冷媒通路(例えば冷却水通路)25が設けられている。   An annular rising portion 22 is formed at the peripheral edge of the outer lid 7b, and the flange portion 19 of the inner lid portion 7a is placed on the upper surface of the rising portion 22 via a heat-resistant resin sheet. Further, an annular flange retainer 23 for fixing the flange portion 19 of the inner lid portion 7a is detachably attached to the rising portion 22 with a screw. At the upper end of the flange retainer 23, an O-ring 24 made of a heat resistant resin, for example, Teflon (registered trademark) is provided to contact and seal the lower surface of the open end of the processing container 2. The flange retainer 23 is provided with a refrigerant passage (for example, a cooling water passage) 25 for cooling the O-ring 24.

前記内側蓋部7aと前記外側蓋部7bの間には環状の中空室26が形成され、この中空室26内には内側蓋部7aを加温する面状のヒーター27が設けられている。外側蓋部7bの前記ヒーター27と対応する部分には冷媒通路28が設けられている。なお、処理容器2の下側壁部又はフランジ部4には処理容器内に処理ガスや不活性ガス(例えばN)を導入するガス導入ポート(図示省略)が設けられている。 An annular hollow chamber 26 is formed between the inner lid portion 7 a and the outer lid portion 7 b, and a planar heater 27 for heating the inner lid portion 7 a is provided in the hollow chamber 26. A refrigerant passage 28 is provided in a portion corresponding to the heater 27 of the outer lid portion 7b. Note that a gas introduction port (not shown) for introducing a processing gas or an inert gas (for example, N 2 ) into the processing container is provided on the lower side wall portion or the flange portion 4 of the processing container 2 .

前記処理容器2と蓋体7の石英製品同士の当接面(接合面)16,17間をシール(封止)するために、当接面(シール面ともいう)16,17に鏡面加工が施され、鏡面加工のシール面同士を密着させてシールする鏡面シール部30が構成されている。   In order to seal (seal) the contact surfaces (joint surfaces) 16 and 17 between the quartz products of the processing container 2 and the lid body 7, the contact surfaces (also referred to as seal surfaces) 16 and 17 are mirror-finished. The mirror surface seal | sticker part 30 which is given and seals the sealing surfaces of mirror surface processing closely_contact | adhering is comprised.

前記縦型熱処理装置1においては、前記石英製品である処理用容器2と蓋体7(実施例の場合内側蓋部7a、以下同様。)のシール面16,17の平面度を感圧紙31を用いて測定し、その測定結果が予め定められた範囲内の石英製品2,7aを選択的に使用して構成されている。換言すれば、前記縦型熱処理装置1の製造方法においては、石英製品である処理用容器2と蓋体7のシール面16,17の平面度を感圧紙31を用いて測定する測定工程と、その測定結果が予め定められた範囲内の石英製品2,7aを選択して組立てる組立工程とを備えている。また、縦型熱処理装置1における石英製品2,7aの製造方法においては、石英製品2,7aのシール面16,17を研磨する研磨工程と、研磨されたシール面をガス焼きにより仕上げる仕上工程と、仕上げられたシール面に感圧紙31を平面で押圧してシール面の平面度を測定する工程と、その測定結果が予め定められた範囲内か否かにより石英製品2,7aが良品か否かを判定する工程とを備えている。   In the vertical heat treatment apparatus 1, the pressure sensitive paper 31 is used to determine the flatness of the sealing surfaces 16 and 17 of the processing container 2 and the lid 7 (in the embodiment, the inner lid portion 7a, the same applies hereinafter), which is the quartz product. The quartz products 2 and 7a within the range in which the measurement result is determined in advance are selectively used. In other words, in the manufacturing method of the vertical heat treatment apparatus 1, a measuring step of measuring the flatness of the sealing surfaces 16 and 17 of the processing container 2 and the lid body 7 which are quartz products using the pressure sensitive paper 31, And an assembling process for selecting and assembling the quartz products 2 and 7a whose measurement results are within a predetermined range. Moreover, in the manufacturing method of the quartz products 2 and 7a in the vertical heat treatment apparatus 1, a polishing process for polishing the seal surfaces 16 and 17 of the quartz products 2 and 7a, and a finishing process for finishing the polished seal surfaces by gas baking, Whether the quartz products 2 and 7a are non-defective products depending on the step of measuring the flatness of the sealing surface by pressing the pressure-sensitive paper 31 with a flat surface on the finished sealing surface and whether or not the measurement result is within a predetermined range. A step of determining whether or not.

シール面16,17の平面度を感圧紙31を用いて測定する方法を概念的に説明すると、図2に示すように、上面が平坦な定盤32と処理容器2の開口端であるシール面16との間に感圧紙31を挟み込み、処理容器2の開口端すなわちシール面16を感圧紙31を介して定盤32に所定の圧力(押圧力)で押し付けることにより圧力分布すなわち平面度を測定する。蓋体7のシール面17の平面度を測定する場合には、前記処理容器2を蓋体7に置き換えればよい。   The method for measuring the flatness of the seal surfaces 16 and 17 using the pressure sensitive paper 31 will be conceptually described. As shown in FIG. 2, the surface plate 32 having a flat upper surface and the seal surface which is the open end of the processing container 2 are used. A pressure-sensitive paper 31 is sandwiched between the pressure-sensitive paper 31 and the open end of the processing container 2, that is, the sealing surface 16 is pressed against the surface plate 32 through the pressure-sensitive paper 31 with a predetermined pressure (pressing force), thereby measuring pressure distribution, that is, flatness. To do. When measuring the flatness of the sealing surface 17 of the lid 7, the processing container 2 may be replaced with the lid 7.

感圧紙31としては、図3に示すように、重ね合わされた2枚のシート31a,31bからなり、一方のシート(Aフイルム)31aの内面にはマイクロカプセルに詰めた発色剤を塗布した発色剤層33が設けられ、他方のシート(Bフイルム)31bの内面には顕色剤を塗布した顕色剤層34が設けられている、圧力測定フイルム(富士写真フイルム社製 富士プレスケール)であることが好ましい。圧力測定フイルムの種類としては、測定可能圧力ないし押圧力が例えば2〜6kgf/cm程度の極低圧用が好ましい。 As shown in FIG. 3, the pressure sensitive paper 31 is composed of two sheets 31a and 31b that are overlapped, and a color former in which a color former packed in microcapsules is applied to the inner surface of one sheet (A film) 31a. This is a pressure measurement film (Fuji Photo Film, Fuji Prescale) in which a layer 33 is provided and a developer layer 34 coated with a developer is provided on the inner surface of the other sheet (B film) 31b. It is preferable. As the type of the pressure measurement film, it is preferable to use an extremely low pressure whose measurable pressure or pressing force is about 2 to 6 kgf / cm 2, for example.

発色の原理は、発色剤層33のマイクロフイルムが圧力によって破壊され、その中の発色剤が顕色材層34の顕色材に吸着され、化学反応で赤く発色する。前記圧力測定フイルム31によれば、他方のシート31bの内面に圧力に応じた濃度で発色する。シール面16,17の平面度が高い場合には、圧力分布が均一であるため、シート31bの内面にシール面と同じ範囲で均一に薄く発色するか全く発色しない(この状態を予め定められた範囲内とする)。シール面16,17の平面度が低い場合、すなわちシール面16,17に突出部分とかうねりがある場合には、圧力分布が不均一であるため、シート31bの内面に突出部分と対応して部分的に濃く発色したり或いは斑に発色する(この状態を予め定められた範囲を超えた場合とする)。換言すれば、シート31bの発色度合ないし圧力分布を見るだけでシール面16,17の平面度を測定ないし評価することができる。   The principle of color development is that the microfilm of the color former layer 33 is destroyed by pressure, and the color former therein is adsorbed by the color developer of the color developer layer 34 and develops red color by a chemical reaction. According to the pressure measuring film 31, color is developed on the inner surface of the other sheet 31b at a density corresponding to the pressure. When the flatness of the seal surfaces 16 and 17 is high, the pressure distribution is uniform, so that the inner surface of the sheet 31b is uniformly thinly colored within the same range as the seal surface or not colored at all (this state is determined in advance). Within range). When the flatness of the seal surfaces 16 and 17 is low, that is, when there are protrusions and undulations on the seal surfaces 16 and 17, the pressure distribution is non-uniform, so the inner surface of the sheet 31 b corresponds to the protrusions. The color develops deeply or develops in spots (this state is assumed to exceed a predetermined range). In other words, the flatness of the sealing surfaces 16 and 17 can be measured or evaluated only by looking at the degree of color development or the pressure distribution of the sheet 31b.

前記測定結果が予め定められた範囲を超えた石英製品である場合、該石英製品(処理容器又は蓋体)のシール面16又は17を再度鏡面加工する。この鏡面加工は、石英製品のシール面16又は17を研磨する研磨工程と、研磨されたシール面をガス焼きにより仕上げする仕上工程とからなる。研磨工程では、定磐の上に研磨剤を振り掛け、石英製品のシール面を定磐上で摺動させて研磨すればよい。   When the measurement result is a quartz product exceeding a predetermined range, the sealing surface 16 or 17 of the quartz product (processing vessel or lid) is mirror-finished again. This mirror processing includes a polishing step for polishing the sealing surface 16 or 17 of the quartz product and a finishing step for finishing the polished sealing surface by gas baking. In the polishing process, polishing may be performed by sprinkling an abrasive on the surface of the fixed plate and sliding the sealing surface of the quartz product on the fixed plate.

このように構成された縦型熱処理装置1によれば、被処理体wを収容して所定の処理を行う処理部が石英製品からなり、該石英製品が鏡面シール部30を有する縦型熱処理装置であって、前記石英製品の鏡面シール部30のシール面16,17の平面度を感圧紙31を用いて測定し、その測定結果が予め定められた範囲内の石英製品を選択的に使用してなるため、鏡面シール部30のシール面16,17の平面度をシール面全周にわたり一度に容易に測定することができ、鏡面シール部30のシール性の向上及び処理の均一性の向上が図れ、突出部分による傷や欠け等を防止できるのでパーティクルの発生源になる可能性を排除できる。   According to the vertical heat treatment apparatus 1 configured as described above, the vertical heat treatment apparatus in which the processing unit that accommodates the object to be processed w and performs a predetermined process is made of a quartz product, and the quartz product has the mirror seal portion 30. The flatness of the sealing surfaces 16 and 17 of the mirror seal portion 30 of the quartz product is measured using the pressure sensitive paper 31, and the quartz product whose measurement result is within a predetermined range is selectively used. Therefore, the flatness of the sealing surfaces 16 and 17 of the mirror surface sealing portion 30 can be easily measured at once over the entire circumference of the sealing surface, and the sealing performance of the mirror surface sealing portion 30 and the uniformity of processing can be improved. As a result, it is possible to prevent scratches and chippings caused by the protruding portion, so that the possibility of becoming a particle generation source can be eliminated.

前記石英製品が、下端が開口された処理容器2と、該処理容器2の開口端に当接される蓋体7であるため、これら処理容器2と蓋体7のシール面16,17の平面度をシール面全周にわたり一度に容易に測定することができ、鏡面シール部30のシール性の向上及び処理の均一性の向上が図れ、パーティクルの発生源になる可能性を排除できる。   Since the quartz product is the processing container 2 whose lower end is opened and the lid 7 that is in contact with the open end of the processing container 2, the flat surfaces of the sealing surfaces 16 and 17 of the processing container 2 and the lid 7 are used. The degree can be easily measured at once on the entire circumference of the sealing surface, the sealing property of the mirror surface sealing portion 30 and the uniformity of processing can be improved, and the possibility of becoming a particle generation source can be eliminated.

前記感圧紙31が、重ね合わされた2枚のシート31a,31bからなり、一方のシートの内面にはマイクロカプセルに詰めた発色剤を塗布した発色剤層33が設けられ、他方のシート31bの内面には顕色剤を塗布した顕色剤層34が設けられている圧力測定フイルムであるため、石英製品のシール面16,17の平面度を容易に測定することができ、また、石英製品である処理容器2や蓋体7のシール面16,17に発色剤が付着して被処理体wへの汚染源になるのを防止できる。   The pressure sensitive paper 31 is composed of two sheets 31a and 31b that are superposed on each other, and a color former layer 33 coated with a color former packed in microcapsules is provided on the inner surface of one sheet, and the inner surface of the other sheet 31b. Is a pressure measuring film provided with a developer layer 34 coated with a developer, so that the flatness of the sealing surfaces 16 and 17 of the quartz product can be easily measured. It is possible to prevent the coloring agent from adhering to the sealing surfaces 16 and 17 of a certain processing container 2 or lid 7 to become a contamination source to the object to be processed w.

また、縦型熱処理装置1の製造方法によれば、被処理体wを収容して所定の処理を行う処理部が石英製品からなり、該石英製品が鏡面シール部30を有する縦型熱処理装置1の製造方法であって、前記石英製品の鏡面シール部30のシール面16,17の平面度を感圧紙31を用いて測定する測定工程と、その測定結果が予め定められた範囲内の石英製品を選択して組立てる組立工程とを備えているため、鏡面シール部30のシール面16,17の平面度をシール面全周にわたり一度に容易に測定することができ、鏡面シール部30のシール性の向上及び処理の均一性の向上が図れ、パーティクルの発生源になる可能性を排除できる。   Further, according to the method for manufacturing the vertical heat treatment apparatus 1, the vertical heat treatment apparatus 1 in which the processing unit that accommodates the object to be processed w and performs a predetermined process is made of a quartz product, and the quartz product has the mirror seal portion 30. A measuring step of measuring the flatness of the sealing surfaces 16 and 17 of the mirror seal portion 30 of the quartz product using the pressure sensitive paper 31, and a quartz product whose measurement result is within a predetermined range. Therefore, the flatness of the sealing surfaces 16 and 17 of the mirror surface seal portion 30 can be easily measured at once over the entire circumference of the seal surface, and the sealing performance of the mirror surface seal portion 30 can be measured. And the uniformity of processing can be improved, and the possibility of becoming a generation source of particles can be eliminated.

前記測定結果が予め定められた範囲を超えた石英製品である場合、該石英製品のシール面16,17を再度鏡面加工するため、シール面16,17の突出部分70(図13参照)を容易に検出して再鏡面加工により削除することができ、鏡面シール部30のシール性の向上及び処理の均一性の向上が図れ、突出部分に起因する傷や欠け等を防止でき、パーティクルの発生源になる可能性を排除できる。   When the measurement result is a quartz product that exceeds a predetermined range, the sealing surfaces 16 and 17 of the quartz product are mirror-finished again, so that the protruding portion 70 (see FIG. 13) of the sealing surfaces 16 and 17 is easy. Can be detected and removed by re-mirror surface processing, the sealing property of the mirror surface seal portion 30 can be improved and the uniformity of processing can be improved, scratches and chips caused by protruding portions can be prevented, and the generation source of particles The possibility of becoming.

前記鏡面加工が、石英製品のシール面16,17を研磨する研磨工程と、研磨されたシール面16,17をガス焼きにより仕上げする仕上工程とを有するため、石英製品のシール面16,17を容易に鏡面加工することができ、鏡面シール部30のシール性の向上が図れる。   Since the mirror surface processing includes a polishing step for polishing the sealing surfaces 16 and 17 of the quartz product and a finishing step for finishing the polished sealing surfaces 16 and 17 by gas baking, the sealing surfaces 16 and 17 of the quartz product are formed. Mirror surface processing can be easily performed, and the sealing performance of the mirror surface seal portion 30 can be improved.

石英製品2,7の製造方法によれば、石英製品2,7のシール面16,17を研磨する研磨工程と、研磨されたシール面をガス焼きにより仕上げる仕上工程と、仕上げられたシール面に感圧紙31を平面で押圧してシール面の平面度を測定する工程と、その測定結果が予め定められた範囲内か否かにより石英製品2,7が良品か否かを判定する工程とを備えているため、シール面の平面度の高い石英製品を容易に得ることができる。   According to the manufacturing method of the quartz products 2 and 7, the polishing step of polishing the seal surfaces 16 and 17 of the quartz products 2 and 7, the finishing step of finishing the polished seal surfaces by gas baking, and the finished seal surfaces A step of measuring the flatness of the sealing surface by pressing the pressure-sensitive paper 31 with a flat surface, and a step of determining whether or not the quartz products 2 and 7 are non-defective products depending on whether or not the measurement result is within a predetermined range. Since it is provided, a quartz product with a high flatness of the sealing surface can be easily obtained.

図4は測定治具を用いた処理容器の測定状況を示す概略的側面図、図5は同概略的正面図、図6は同概略的平面図、図7は測定治具の押圧機構の押圧力を解除したときの状態を示す概略的側面図、図8は測定治具を用いた蓋体の測定状況を示す概略的側面図である。   4 is a schematic side view showing a measurement state of a processing container using a measuring jig, FIG. 5 is a schematic front view of the processing container, FIG. 6 is a schematic plan view of the processing container, and FIG. FIG. 8 is a schematic side view showing a state of measurement of the lid using the measuring jig, and shows a state when the pressure is released.

この測定治具35は、処理装置1の処理部を構成する石英製品例えば処理容器2、蓋体7の鏡面シール部30のシール面16,17の平面度を感圧紙30を用いて測定するための測定装置で、前記石英製品をそのシール面16,17を露出させた状態で固定する固定台36と、前記石英製品のシール面に感圧紙31を位置させる感圧紙案内部37と、前記石英製品のシール面16,17に感圧紙31を所定の圧力で当接させる平らな当接体38を有する押圧機構39とを備えている。固定台36は、ベース部である底板40と、該底板40の上部に4本の支柱41を介して所定高さ位置に水平に支持固定された台板42とからなる。底板40には移動用のキャスター43と、固定用のジャッキ44が設けられていることが好ましい。   This measuring jig 35 is used to measure the flatness of the sealing surfaces 16 and 17 of the quartz product constituting the processing unit of the processing apparatus 1, such as the processing container 2 and the mirror surface sealing unit 30 of the lid 7, using the pressure sensitive paper 30. In this measuring apparatus, a fixing base 36 for fixing the quartz product with the sealing surfaces 16 and 17 exposed, a pressure sensitive paper guide 37 for positioning the pressure sensitive paper 31 on the sealing surface of the quartz product, and the quartz A pressing mechanism 39 having a flat abutting body 38 that abuts the pressure sensitive paper 31 on the product seal surfaces 16 and 17 with a predetermined pressure is provided. The fixed base 36 includes a bottom plate 40 that is a base portion, and a base plate 42 that is horizontally supported and fixed at a predetermined height position on the top of the bottom plate 40 via four columns 41. The bottom plate 40 is preferably provided with a moving caster 43 and a fixing jack 44.

台板42には、例えば処理容器2のシール面16を下に向けて露出させ得る円形の開口部45と、処理容器2のフランジ部4を支持可能な環状の支持受け部46とが形成されている。台板42上における支持受け部46の周りには処理容器2のフランジ部4を上方から押えて支持受け部46との間でクランプ可能な手動式のクランプ機構47が適宜例えば4つ配設されている。また、台板42上における支持受け部46の周りには処理容器2のフランジ部4を四方から規制する処理容器ガイド48が配設されている。   The base plate 42 is formed with, for example, a circular opening 45 that can expose the sealing surface 16 of the processing container 2 downward, and an annular support receiving part 46 that can support the flange portion 4 of the processing container 2. ing. Around the support receiving portion 46 on the base plate 42, for example, four manual clamping mechanisms 47 that can be clamped between the support receiving portion 46 by pressing the flange portion 4 of the processing container 2 from above are disposed as appropriate. ing. A processing container guide 48 for restricting the flange portion 4 of the processing container 2 from four directions is disposed around the support receiving portion 46 on the base plate 42.

感圧紙案内部37は、台板42の下部に感圧紙(圧力測定フイルム)31を挿入し得る所定の隙間を存して配置された水平のガイド板からなり、前記台板42の開口部45と対応する円形の開口部(図示省略)有している。感圧紙案内部37により感圧紙31を図4の左方から右方へ水平に挿入して処理容器2のシール面16の下部にセットすることができる。   The pressure sensitive paper guide portion 37 is composed of a horizontal guide plate disposed with a predetermined gap into which the pressure sensitive paper (pressure measuring film) 31 can be inserted below the base plate 42, and the opening 45 of the base plate 42. And corresponding circular openings (not shown). The pressure sensitive paper 31 can be inserted horizontally from the left to the right in FIG. 4 by the pressure sensitive paper guide 37 and set at the lower part of the seal surface 16 of the processing container 2.

押圧機構39は、本実施の形態では手動式に構成されている。この押圧機構39は、前記底板40上の中央部に支持台49を介して設けられた軸受(ボールスプライン軸受)50に昇降自在に支持された出力軸51と、底板40上に軸受52を介して回動自在に設けられた水平の回動軸53と、該回動軸53の一端に設けられて回動軸53を手動で回動操作するためのハンドルレバー54と、回動軸53の他端と出力軸51の間に連設され回動軸53の回動力を垂直上方向の押圧力に変換する第1リンク55a及び第2リンク55bからなるリンク機構55とを有している。   In this embodiment, the pressing mechanism 39 is configured manually. The pressing mechanism 39 includes an output shaft 51 supported by a bearing (ball spline bearing) 50 provided at a center portion on the bottom plate 40 via a support base 49 so as to be movable up and down, and a bearing 52 on the bottom plate 40. A horizontal rotation shaft 53 provided rotatably, a handle lever 54 provided at one end of the rotation shaft 53 for manually rotating the rotation shaft 53, and the rotation shaft 53. A link mechanism 55 is provided which is connected between the other end and the output shaft 51 and includes a first link 55a and a second link 55b which converts the rotational force of the rotating shaft 53 into a vertical upward pressing force.

前記出力軸51から前記当接体38に押圧力を均一に伝えるために、出力軸51の上端部には出力板56がボールジョイント57を介して揺動自在に設けられ、該出力板56には複数例えば4本のガイドロッド58及びスプリング59を介して当接体38が揺動自在に設けられている。該当接体38は、処理容器2のシール面16に対応して環状に形成されている。当接体38の当接面の幅はシール面16と同じ幅か若干大きい幅とされている。図4において、60,61は第1リンク55aの回動範囲を規制する規制部材(ストッパー)であり、ハンドルレバー54を作動位置に操作したときに第1リンク55aが思案点を越えた位置で規制部材61に係止されることにより作動位置に保持され、勝手に待機位置側に戻らないようになっている。   In order to transmit the pressing force uniformly from the output shaft 51 to the contact body 38, an output plate 56 is provided at the upper end portion of the output shaft 51 through a ball joint 57 so as to be swingable. The abutting body 38 is swingably provided via a plurality of, for example, four guide rods 58 and springs 59. The contact body 38 is formed in an annular shape corresponding to the sealing surface 16 of the processing container 2. The width of the contact surface of the contact body 38 is the same as or slightly larger than the seal surface 16. In FIG. 4, reference numerals 60 and 61 denote restricting members (stoppers) for restricting the rotation range of the first link 55a, and when the handle lever 54 is operated to the operating position, the first link 55a is in a position beyond the thought point. By being locked by the restricting member 61, it is held at the operating position and is not allowed to return to the standby position side without permission.

シール面16の面圧測定を行う場合には、先ず処理容器2を持ち上げて固定台36上にセットする。その場合、処理容器2のフランジ部4を台板42の支持受け部46に載置し、フランジ部4をクランプ機構47によりクランプして固定する。次に、感圧紙案内部37により感圧紙31を挿入してセットする。この時、図7に示すように、ハンドルレバー54は待機位置にあり、当接体38は処理容器2のシール面16から離れた退避位置にある。前記ハンドルレバー54を図4に示すように作動位置に回動操作すると、回動軸53、リンク機構55、出力軸51、ボールジョイント57、出力板56及びスプリング59を介して当接板38に押圧力が伝わり、当接板38が感圧紙31を介して処理容器2のシール面16に対して均一に押圧される。押圧力は、ハンドル54の操作力にハンドルレバー54と第1リンク55aのレバー比(ハンドルレバーの長さ/第1リンクの長さ)を乗じたものとなって作用する。   When measuring the surface pressure of the seal surface 16, the processing container 2 is first lifted and set on the fixed base 36. In that case, the flange portion 4 of the processing container 2 is placed on the support receiving portion 46 of the base plate 42, and the flange portion 4 is clamped and fixed by the clamp mechanism 47. Next, the pressure sensitive paper 31 is inserted and set by the pressure sensitive paper guide 37. At this time, as shown in FIG. 7, the handle lever 54 is in the standby position, and the contact body 38 is in the retracted position away from the sealing surface 16 of the processing container 2. When the handle lever 54 is rotated to the operating position as shown in FIG. 4, the handle lever 54 is brought into contact with the contact plate 38 via the rotation shaft 53, the link mechanism 55, the output shaft 51, the ball joint 57, the output plate 56 and the spring 59. The pressing force is transmitted, and the contact plate 38 is uniformly pressed against the sealing surface 16 of the processing container 2 through the pressure sensitive paper 31. The pressing force acts by multiplying the operating force of the handle 54 by the lever ratio of the handle lever 54 and the first link 55a (the length of the handle lever / the length of the first link).

このようにしてシール面16の面圧測定が行われ、面圧測定が終わったら、ハンドルレバー54を待機位置に戻して当接体38をシール面16から下方に退避させ(図7参照)、感圧紙31を抜き取り、クランプ機構47を解除して処理容器2を測定治具35から取り外す。なお、測定治具35においては処理容器2と感圧紙31が所定の方向に位置決めされ、感圧紙31の発色面と処理容器2のシール面16の周方向の位置が対応し、例えば感圧紙で濃度の濃いポイントを検出した場合、その位置で処理容器2のシール面16上の対応する位置に突出部分があることが判る。測定の結果、感圧紙31にリング状の薄い均一の発色が現れているか全く発色していなければ、予め定められた範囲内であり、シール面16が高い平面度であるという評価が得られる。一方、感圧紙に濃度の濃いポイントや斑模様ないし不均一な発色が現れていれば、予め定められた範囲を逸脱しており、シール面16に突出部分があったり、凹凸やうねりがあったりしてシール面16が低い平面度であるという評価(測定結果)が得られる。   Thus, the surface pressure measurement of the seal surface 16 is performed, and when the surface pressure measurement is completed, the handle lever 54 is returned to the standby position, and the contact body 38 is retracted downward from the seal surface 16 (see FIG. 7). The pressure sensitive paper 31 is extracted, the clamp mechanism 47 is released, and the processing container 2 is removed from the measurement jig 35. In the measurement jig 35, the processing container 2 and the pressure sensitive paper 31 are positioned in a predetermined direction, and the color development surface of the pressure sensitive paper 31 and the circumferential position of the seal surface 16 of the processing container 2 correspond to each other. When a point with a high concentration is detected, it can be seen that there is a protruding portion at the corresponding position on the seal surface 16 of the processing container 2. As a result of the measurement, if a ring-shaped thin uniform color appears on the pressure sensitive paper 31 or no color develops at all, an evaluation that it is within a predetermined range and the sealing surface 16 has high flatness is obtained. On the other hand, if a high-density point, a spotted pattern, or uneven color development appears on the pressure-sensitive paper, it deviates from the predetermined range, and there is a protruding portion on the seal surface 16 or irregularities and undulations. Thus, an evaluation (measurement result) that the sealing surface 16 has low flatness is obtained.

図8に示すように前記測定治具35で蓋体7すなわち内側蓋部7aのシール面17の面圧測定を行う場合には、内側蓋部7aをシール面17を下にしてセットする。この場合、内側蓋部7aの外径が台板42の開口部45の内径よりも小さくて支持受け部46に直接支持できないため、支持受け部46に内側蓋部7aの周縁下面部を支持する第1補助リング62を取付け、更に内側蓋部7aの周縁上面部に第2補助リング63を取付けて、該第2補助リング63をクランプ機構47で押え付けるようになっている。なお、測定前に予め内側蓋部7aに第1補助リング62及び第2補助リング63を取付けておいても良い。この場合、第1補助リング62と第2補助リング63の間にスぺーサ64を挟み、第1補助リング62と第2補助リング63を互いにねじで連結しておくことが好ましい。   As shown in FIG. 8, when the surface pressure of the sealing surface 17 of the lid body 7, that is, the inner lid portion 7a is measured with the measuring jig 35, the inner lid portion 7a is set with the sealing surface 17 facing downward. In this case, since the outer diameter of the inner lid portion 7a is smaller than the inner diameter of the opening 45 of the base plate 42 and cannot be directly supported by the support receiving portion 46, the peripheral lower surface portion of the inner lid portion 7a is supported by the support receiving portion 46. A first auxiliary ring 62 is attached, and a second auxiliary ring 63 is attached to the upper surface of the peripheral edge of the inner lid portion 7 a, and the second auxiliary ring 63 is pressed by the clamp mechanism 47. Note that the first auxiliary ring 62 and the second auxiliary ring 63 may be attached to the inner lid portion 7a in advance before measurement. In this case, it is preferable that the spacer 64 is sandwiched between the first auxiliary ring 62 and the second auxiliary ring 63, and the first auxiliary ring 62 and the second auxiliary ring 63 are connected to each other with screws.

このように測定治具35によれば、被処理体wを収容して所定の処理を行う処理装置1の処理部を構成する石英製品2,7の鏡面シール部30のシール面16,17の平面度を感圧紙31を用いて測定する測定治具であって、前記石英製品をそのシール面16,17を露出させた状態で固定する固定台36と、前記石英製品のシール面に感圧紙31を位置させる感圧紙案内部37と、前記石英製品のシール面に感圧紙31を所定の圧力で当接させる平らな当接体38を有する押圧機構39とを備えているため、鏡面シール部30のシール面16,17の平面度をシール面全周にわたり一度に容易に測定することができ、鏡面シール部30のシール性の向上及び処理の均一性の向上が図れ、パーティクルの発生源になる可能性を排除できる。   As described above, according to the measuring jig 35, the sealing surfaces 16 and 17 of the mirror surface sealing portion 30 of the quartz products 2 and 7 constituting the processing portion of the processing apparatus 1 that accommodates the object to be processed w and performs a predetermined processing. A measuring jig for measuring flatness using pressure-sensitive paper 31, and a fixing base 36 for fixing the quartz product with the sealing surfaces 16 and 17 exposed, and a pressure-sensitive paper on the sealing surface of the quartz product. Since the pressure sensitive paper guide portion 37 for positioning the pressure sensitive paper 31 and the pressing mechanism 39 having the flat contact body 38 for bringing the pressure sensitive paper 31 into contact with the sealing surface of the quartz product with a predetermined pressure are provided. The flatness of 30 seal surfaces 16 and 17 can be easily measured at once over the entire circumference of the seal surface, so that the sealing property of the mirror surface seal portion 30 and the uniformity of processing can be improved. Can eliminate the possibility.

測定治具35を用いて面圧の測定を行った結果、判定ないし評価が微妙な場合には、図9ないし図10に示すように表面粗さ計65を用いてシール面16,17の断面形状を測定する。表面粗さ計65は重力方向に臨んだ接触子65aを有し、該接触子65aをシール面16,17に接触させた状態で半径方向に移動させることによりシール面16,17の断面形状を測定できる。   As a result of measuring the surface pressure using the measuring jig 35, if the judgment or evaluation is delicate, the cross-sections of the seal surfaces 16 and 17 using a surface roughness meter 65 as shown in FIGS. Measure the shape. The surface roughness meter 65 has a contact 65a facing in the direction of gravity, and the cross-sectional shape of the seal surfaces 16 and 17 is changed by moving the contact 65a in the radial direction in contact with the seal surfaces 16 and 17. It can be measured.

処理容器2のシール面16の測定を行う場合には、図9に示すように、上下を逆にした処理容器2のフランジ部4にベースプレート66を載置し、該ベースプレート66上に平面粗さ計65をセットして測定を行う。内側蓋部7aのシール面17の測定を行う場合には、図10に示すように、第1べースプレート67上に内側蓋部7aをシール面17を上にして載置し、更に第1ベースプレート67上に第2ベースプレート68を載置し、該第2ベースプレート68上に平面粗さ計65をセットして測定を行う。   When measuring the sealing surface 16 of the processing container 2, as shown in FIG. 9, a base plate 66 is placed on the flange portion 4 of the processing container 2 upside down, and the planar roughness is placed on the base plate 66. A total of 65 is set for measurement. When measuring the sealing surface 17 of the inner lid portion 7a, the inner lid portion 7a is placed on the first base plate 67 with the sealing surface 17 facing upward as shown in FIG. A second base plate 68 is placed on the surface 67, and a surface roughness meter 65 is set on the second base plate 68 to perform measurement.

表面粗さ計65による測定は、シール面16,17の周方向の複数個所例えば8箇所で行うことが好ましい。また、前記感熱紙31を用いた測定で平面度が疑われる箇所を表面粗さ計65で測定する。これによりシール面16,17における突出部分やうねり等を測定することができる。また、測定結果により予め定められた範囲内であれば、その石英製品を選択して処理装置を組立てる。このように石英製品のシール面の精度管理を行うようにしたので、従来の処理装置では図12の(a)に示すようにキャップのシール面や、同図の(b)に示すように処理容器のシール面に、突出部分がある場合があり、シール性のばらつきが生じる可能性があるのに対し、本実施の形態によれば、図11の(a)に示すようにキャップのシール面や、同図の(b)に示すように処理容器のシール面に、突出部分がなくなり、シール性のばらつきが生じなくなり、処理の均一性の向上が図れる。   The measurement with the surface roughness meter 65 is preferably performed at a plurality of, for example, eight locations in the circumferential direction of the seal surfaces 16 and 17. Further, a surface roughness meter 65 is used to measure a portion where flatness is suspected in the measurement using the thermal paper 31. Thereby, the protrusion part in the sealing surfaces 16 and 17, a wave | undulation, etc. can be measured. If the measurement result is within a predetermined range, the quartz product is selected and the processing apparatus is assembled. Since the accuracy control of the sealing surface of the quartz product is performed in this way, the conventional processing apparatus performs processing as shown in FIG. 12 (a) and the sealing surface of the cap, as shown in FIG. 12 (b). In some cases, the sealing surface of the container has a protruding portion, which may cause variations in sealing performance. According to the present embodiment, the sealing surface of the cap as shown in FIG. In addition, as shown in (b) of the same figure, there is no protruding portion on the sealing surface of the processing container, the variation in sealing performance does not occur, and the uniformity of processing can be improved.

以上、本発明の実施の形態ないし実施例を図面により詳述してきたが、本発明は前記実施の形態ないし実施例に限定されるものではなく、本発明の要旨を逸脱しない範囲での種々の設計変更等が可能である。例えば、測定治具における押圧機構は手動式が簡易で好ましいが、電動式や油圧式ないし空圧式であっても良い。処理装置としては、多数枚の被処理体を一度に処理するバッチ式に限定されず、被処理体を一枚ずつ処理する枚葉式であっても良い。   As mentioned above, although embodiment thru | or example of this invention has been explained in full detail with drawing, this invention is not limited to the said embodiment thru | or example, Various in the range which does not deviate from the summary of this invention. Design changes can be made. For example, the pressing mechanism in the measuring jig is preferably a manual type, but may be an electric type, a hydraulic type or a pneumatic type. The processing apparatus is not limited to a batch type that processes a large number of objects to be processed at a time, and may be a single wafer type that processes objects to be processed one by one.

本発明の実施の形態に係る処理装置の概略構成を示す縦断面図である。It is a longitudinal cross-sectional view which shows schematic structure of the processing apparatus which concerns on embodiment of this invention. 処理容器の接合面の平面度を感圧紙を用いて測定する方法を概念的に説明するための図である。It is a figure for demonstrating notionally the method of measuring the flatness of the joint surface of a processing container using a pressure sensitive paper. 感圧紙の構造を概略的に示す図である。It is a figure which shows roughly the structure of a pressure sensitive paper. 測定治具を用いた処理容器の測定状況を示す概略的側面図である。It is a schematic side view which shows the measurement condition of the processing container using a measuring jig. 同概略的正面図である。It is the same schematic front view. 同概略的平面図である。It is the same schematic plan view. 測定治具の押圧機構の押圧力を解除したときの状態を示す概略的側面図である。It is a schematic side view which shows a state when the pressing force of the pressing mechanism of a measuring jig is cancelled | released. 測定治具を用いた蓋体の測定状況を示す概略的側面図である。It is a schematic side view which shows the measurement condition of the cover body using a measurement jig. 表面粗さ計を用いた処理容器の測定状況を概略的に示す図である。It is a figure which shows roughly the measurement condition of the processing container using a surface roughness meter. 表面粗さ計を用いた蓋体の測定状況を概略的に示す図である。It is a figure which shows roughly the measurement condition of the cover body using a surface roughness meter. 本実施の形態の測定データを示す図である。It is a figure which shows the measurement data of this Embodiment. 従来の測定データを示す図である。It is a figure which shows the conventional measurement data. 石英製品の接合面における不具合を説明する図である。It is a figure explaining the malfunction in the joint surface of a quartz product.

符号の説明Explanation of symbols

1 縦型熱処理装置
w 半導体ウエハ(被処理体)
2 処理容器
7 蓋体
16,17 シール面
30 鏡面シール部
31 感圧紙
33 発色剤層
34 顕色剤層
35 測定治具
36 固定台
37 感圧紙案内部
39 押圧機構
1 Vertical heat treatment equipment w Semiconductor wafer (object to be processed)
2 Processing container 7 Lid 16, 17 Seal surface 30 Mirror surface seal part 31 Pressure sensitive paper 33 Color developing agent layer 34 Developer layer 35 Measuring jig 36 Fixing base 37 Pressure sensitive paper guide part 39 Pressing mechanism

Claims (7)

被処理体を収容して所定の処理を行う処理部が石英製品からなり、該石英製品が鏡面加工のシール面同士を密着させる鏡面シール部を有する処理装置の製造方法であって、前記石英製品のシール面の平面度を感圧紙を用いて測定する測定工程と、その測定結果が予め定められた範囲内の石英製品を選択して組立てる組立工程とを備えたことを特徴とする処理装置の製造方法Processing unit for performing predetermined processing by accommodating the object to be processed is composed of quartz products, quartz products A manufacturing method of a processing apparatus having a mirror surface seal portion is brought into close contact with the sealing surfaces of the mirror-finished, the quartz product A processing apparatus comprising : a measuring step for measuring the flatness of the sealing surface of the first surface using pressure-sensitive paper; and an assembling step for selecting and assembling a quartz product whose measurement result is within a predetermined range. Manufacturing method . 前記測定結果が予め定められた範囲を超えた石英製品である場合、該石英製品のシール面を再度鏡面加工することを特徴とする請求項1記載の処理装置の製造方法2. The method of manufacturing a processing apparatus according to claim 1, wherein when the measurement result is a quartz product exceeding a predetermined range, the sealing surface of the quartz product is mirror-finished again . 前記鏡面加工が、石英製品のシール面を研磨する研磨工程と、研磨されたシール面をガス焼きにより仕上げる仕上工程とを有することを特徴とする請求項1又は2記載の処理装置の製造方法 3. The method of manufacturing a processing apparatus according to claim 1, wherein the mirror finishing includes a polishing step of polishing a sealing surface of a quartz product and a finishing step of finishing the polished sealing surface by gas baking. 被処理体を収容して所定の処理を行う処理装置に使用される鏡面加工のシール面を有する石英製品を製造する方法であって、石英製品のシール面を研磨する研磨工程と、研磨されたシール面をガス焼きにより仕上げる仕上工程と、仕上げられたシール面に感圧紙を平面で押圧してシール面の平面度を測定する工程と、その測定結果が予め定められた範囲内か否かにより石英製品が良品か否かを判定する工程とを備えたことを特徴とする処理装置における石英製品の製造方法。 A method for manufacturing a quartz product having a mirror-finished sealing surface used in a processing apparatus that accommodates an object to be processed and performs a predetermined processing, a polishing step for polishing the sealing surface of the quartz product, and polishing Depending on the finishing process of finishing the sealing surface by gas firing, the process of measuring the flatness of the sealing surface by pressing the pressure-sensitive paper flat on the finished sealing surface, and whether the measurement result is within a predetermined range method for manufacturing a silica product in the processing apparatus quartz product characterized by comprising a step of determining whether non-defective. 前記測定結果が予め定められた範囲を超えた石英製品である場合、該石英製品のシール面を再度鏡面加工することを特徴とする請求項4記載の処理装置における石英製品の製造方法。 5. The method of manufacturing a quartz product in a processing apparatus according to claim 4, wherein when the measurement result is a quartz product exceeding a predetermined range, the sealing surface of the quartz product is mirror-finished again. 前記鏡面加工が、石英製品のシール面を研磨する研磨工程と、研磨されたシール面をガス焼きにより仕上げる仕上工程とを有することを特徴とする請求項4又は5記載の処理装置における石英製品の製造方法。 The mirror-polishing, a polishing step of polishing the sealing surface of the quartz product, polished sealing surface of the quartz product in the processing apparatus according to claim 4 or 5 further characterized in that a step finishing finish by gas Baked Production method. 被処理体を収容して所定の処理を行う処理装置の処理部を構成する石英製品の鏡面シール部のシール面の平面度を感圧紙を用いて測定する測定治具であって、前記石英製品をそのシール面を露出させた状態で固定する固定台と、前記石英製品のシール面に感圧紙を位置させる感圧紙案内部と、前記石英製品のシール面に感圧紙を所定の圧力で当接させる平らな当接体を有する押圧機構とを備えたことを特徴とする測定治具A measuring jig for measuring the flatness of a sealing surface of a mirror surface sealing portion of a quartz product constituting a processing unit of a processing apparatus that accommodates an object to be processed and uses a pressure sensitive paper, the quartz product A pressure-sensitive paper guide for positioning the pressure-sensitive paper on the sealing surface of the quartz product, and the pressure-sensitive paper abutting at a predetermined pressure on the sealing surface of the quartz product. And a pressing mechanism having a flat contact body to be measured .
JP2005114339A 2005-04-12 2005-04-12 Manufacturing method of processing apparatus, manufacturing method of quartz product in processing apparatus, and measuring jig Expired - Fee Related JP4213133B2 (en)

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