JP4258188B2 - Manufacturing method of composite structure and composite structure - Google Patents
Manufacturing method of composite structure and composite structure Download PDFInfo
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- JP4258188B2 JP4258188B2 JP2002254024A JP2002254024A JP4258188B2 JP 4258188 B2 JP4258188 B2 JP 4258188B2 JP 2002254024 A JP2002254024 A JP 2002254024A JP 2002254024 A JP2002254024 A JP 2002254024A JP 4258188 B2 JP4258188 B2 JP 4258188B2
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Description
【0001】
【発明の属する技術分野】
本発明は、樹脂基材表面にセラミックスや半金属などの脆性材料からなる構造物を一体的に形成した複合構造物の製造方法と当該方法にて得られる複合構造物に関する。
【0002】
【従来の技術】
本発明者らは、従来のゾルゲル法、PVDやCVDなどの蒸着法、溶射法或いは特開平8−81774号公報、特開平10−202171号公報、特開平11−21677号公報、特開平11−330577号公報或いは特開2000−212766号公報に開示されるガスデポジション法や静電微粒子コーティング法に代わる被膜形成方法として、特願2002−108800号等にエアロゾルデポジション法を提案している。
【0003】
ガスデポジション法は、主として金属粒子をガス攪拌にてエアロゾル化し、このエアロゾルを微小なノズルを通して加速せしめて基材に衝突させ、この衝突の際の運動エネルギーの一部を熱エネルギーに変換し、微粒子間あるいは微粒子と基材間を焼結することを基本原理としている。また、静電微粒子コーティング法はガスデポジション法と同様の基本原理で被膜形成を行う方法で、微粒子を帯電させ電場勾配を用いて加速せしめる方法である。
【0004】
これに対し、エアロゾルデポジション法はセラミック粒子などの脆性材料粒子をエアロゾル化して基材に衝突させて、基材表面に脆性材料構造物(膜など)を形成するようにしている。
従来のガスデポジション法と上記エアロゾルデポジション法との大きな違いは、前者が熱を利用して微粒子を焼結させているのに対し、後者のエアロゾルデポジション法は、粒子径、衝突速度、雰囲気、更には必要に応じて微粒子に内部歪を予め付与するなどの条件下で行うことで、室温にて脆性材料構造物の形成を可能とした点である。そして、形成された脆性材料構造物も、多結晶で結晶同士の界面にはガラス層からなる粒界層が実質的に存在しないという特異性を有している。
【0005】
【発明が解決しようとする課題】
上記エアロゾルデポジション法は、当初金属やセラミックなどの高硬度の基材に脆性材料微粒子を衝突させていた。
これは、エアロゾルデポジション法の原理が以下のように考えられているからである。即ち、衝突によって結晶子同士の界面などの劈開面に沿って結晶格子のずれを生じさせたり、あるいは破砕を生じさせ、これによってもともと内部に存在し別の原子と結合していた原子が剥き出しの状態となった新生面が形成され、この新生面の原子一層の部分は、もともと安定した原子結合状態から外力により強制的に不安定な表面状態に晒され、表面エネルギーが高い状態となる。この活性面が隣接した脆性材料表面や同じく隣接した脆性材料の新生面あるいは基板表面と接合して安定状態に移行する。この現象を継続的に発生させ、微粒子の変形、破砕などの繰り返しにより接合の進展、緻密化が行われ、脆性材料構造物が形成されるというものである。
【0006】
事実、基材の硬度を金属よりも低いエポキシ樹脂にエアロゾルデポジション法を適用した場合には、エポキシ樹脂は削れてしまい脆性材料構造物は形成できず、またエポキシ樹脂よりも軟らかいポリプロピレンに適用した場合にも脆性材料構造物は形成できなかった。
【0007】
しかしながら、更に軟らかいABSに適用した場合には、予想に反して脆性材料構造物を形成することができた。特願2002−108800号の出願当時、この現象は把握できていたが、脆性材料構造物を形成できるか否かの明確な基準が不明であった。
【0008】
【課題を解決するための手段】
上記課題を解決すべく本発明は、脆性材料構造物を形成できるか否かの樹脂基板の基準として、DHv2(材料の塑性変形分を考慮したダイナミック硬さ)を選定し、脆性材料構造物を形成する時点でのDHv2が7以上33以下であるようにした。
樹脂の硬さを示す指標として、DHv1(材料の塑性変形分を考慮しないダイナミック硬さと、DHv2(材料の塑性変形分を考慮したダイナミック硬さ)があるが、前者の指標では脆性材料構造物を形成できるか否かの判断はできない。
【0010】
また、本発明に係る複合構造物は、DHv2が脆性材料構造物形成時において7以上33以下である基材を選定し、これにエアロゾルデポジション法を適用して得られ、得られる脆性材料構造物の特徴は、多結晶で配向性がなく結晶同士の界面にはガラス層からなる粒界層が実質的に存在していない。
ここで、本明細書では多結晶、結晶配向性、界面及び粒界層については以下の通り定義する。
(多結晶)
結晶子が接合・集積してなる構造体を指す。結晶子は実質的にそれひとつで結晶を構成しその径は通常5nm以上である。ただし、微粒子が破砕されずに脆性材料構造物中に取り込まれるなどの場合がまれに生じるが、実質的には多結晶である。
(結晶配向性)
多結晶である脆性材料構造物中での結晶軸の配向具合を指し、配向性があるかないかは、一般には実質的に配向性のないと考えられる粉末X線回折などによって標準データとされたJCPDS(ASTM)データを指標として判断する。
脆性材料構造物中の結晶を構成する物質をあげたこの指標における主要な回折3ピークのピーク強度を100%として、脆性材料構造物の同物質測定データ中、最も主要なピークのピーク強度をこれに揃えた場合に、他の2ピークのピーク強度が指標の値と比較して30%以内にそのずれが収まっている状態を、本件では実質的に配向性がないとする。
(界面)
結晶子同士の境界を構成する領域を指す。
(粒界層)
界面あるいは焼結体でいう粒界に位置するある厚み(通常数nm〜数μm)を持つ層で、通常結晶粒内の結晶構造とは異なるアモルファス構造をとり、また場合によっては不純物の偏析を伴う。
【0011】
ここで、室温でDHv2が7以上33以下の樹脂としては、ABS(アクリロニトリルブタジエンスチレン共重合体)、PET(ポリエチレンテレフタレート)、PTFE(ポリテトラフルオロエチレン)およびポリイミドなどが挙げられる。また、上記の硬度範囲に入るものであればFRPやFRMなどの樹脂に繊維を混ぜたものでも室温で使用できる。
【0012】
また、基材に衝突させる脆性材料粒子は特に限定させるものではないが、例えば、Al2O3,SiO2,NiO,TiO2,CuO,ZnO,ZrO2,SnO2,MgOなどの酸化物、WC,ダイヤモンド,SiC,B4C等の炭化物,AlN,Si3N4等の窒化物、Ca2F,ZrF等のフッ化物、BaTiO3、PZT等が挙げられる。
【0013】
【発明の実施の態様】
図1は本発明に係る複合構造物の製造装置(エアロゾルデポジション装置)の一例を示す図であり、製造装置10は窒素ガスボンベ101がガス搬送管102を通じて、酸化アルミニウム微粒子を内蔵するエアロゾル発生器103に接続され、エアロゾル搬送管104を介して形成室105内に設置された縦0.4mm横17mmの開口を持つノズル106に接続されている。ノズル106の先にはXYステージ107に設置された各種プラスチック基材108が配置され、前記形成室105は真空ポンプ109に接続されている。
【0014】
(実施例1)
脆性材料微粒子として酸化アルミニウム微粒子を選定した。具体的には、純度99%以上、平均粒子径0.2μmのα−アルミナを用いた。また、プラスチック基材には、厚みが1〜2mm程度のABS(アクリロニトリルブタジエンスチレン共重合体)、PET(ポリエチレンテレフタレート)、PE(ポリエチレン)、PMMA(ポリメチルメタクリレート)、PP(ポリプロピレン)、PC(ポリカーボネート)、ポリスチレン、PTFE(ポリテトラフルオロエチレン)、エポキシ樹脂ARALDITE XD911、およびステンレス鋼上に厚み数十μmで形成したポリイミド膜、電子回路基板として良く用いられるガラス−エポキシ基板の11種類を用いた。
【0015】
前記構造物形成装置10を用いた酸化アルミニウム構造物の形成手順を次に述べる。窒素ガスボンベ101を開栓し、高純度窒素ガスをガス搬送管102を通じてエアロゾル発生器103に導入させ、酸化アルミニウム微粒子と高純度窒素ガスとを混合したエアロゾルを発生させる。エアロゾルはエアロゾル搬送管104を通じてノズル106へと送られ、ノズル106の開口より高速で噴出される。高純度窒素ガスの流量は7L/minとした。ノズル106より噴射したエアロゾルはプラスチック基材108に衝突し、この部位に脆性材料構造物の形成を試みた。そして、XYステージ107を稼動させて、プラスチック基材108を揺動させることにより17mm×5mmの面積へ形成を行った。形成時間は10分とした。形成環境は室温で行った。このようにして得られた構造物の形成結果を表1に示す。
【0016】
【表1】
【0017】
表1において、構造物形成状況については、上述の操作によって構造物の形成が見られた場合(形成可能)、形成が見られず目視では基材に何の変化も無かった場合(形成されず)、形成が見られず基材がエッチングされて表面から削り取られていた場合(形成されず・基板削れ)で分けられ、構造物の形成が見られた場合は、その構造物の最大形成厚さを日本真空技術株式会社触針式表面形状測定器Dektak3030を用いて測定した。
【0018】
また基材の硬さを島津製作所製ダイナミック超微小硬度計DUH−W201を用いて、ビッカース圧子、試験力10gf、負荷速度1.350gf/sec、保持時間15秒、測定環境室温の条件で負荷−除荷試験を行い、材料の塑性変形分を考慮しないダイナミック硬さDHv1と、材料の塑性変形分を考慮したダイナミック硬さDHv2の値のそれぞれを示した。
【0019】
この結果より、基材のダイナミック硬さDHv2の値が構造物の形成に大きく影響を及ぼしている様子がわかる。即ち、PP(ポリプロピレン)に着目すると、DHv1=7.423であり、この値はPET(DHv1=9.959)とPTFE(DHv1=2.784)の中間となっている。したがって、DHv1の値から判断すれば、脆性材料構造物が形成されるはずであるが実際は形成できない。一方、PP(ポリプロピレン)のDHv2=47.615であり、DHv2から判断すればPET(DHv2=32.766)やPTFE(DHv2=7.971)よりも高く、DHv2の値が構造物の形成の指標になることが分る。同様に、ガラスエポキシの値もDHv2の値が構造物の形成の指標になることを示している。
【0020】
図2にはその状況をわかりやすく示したもので、基材のDHv2を縦軸にとって並べた場合に「形成」、「形成されず」、「形成されず・基板削れ」の3水準で数値的に区分けできる。この結果よりDHv2が5以上40以下更に詳細には7以上33以下のプラスチック基材(有機物材料)を用いた場合において、エアロゾルデポジション法を利用しての脆性材料の構造物が形成が行われると言える。
【0021】
(実施例2)
図1と同等の装置を使って、脆性材料微粒子に純度99%以上、平均粒径0.8μmの酸化珪素を、プラスチック基材に実施例1と同じABS素材を用いて、酸化珪素の構造物の形成を試みた。このとき縦0.4mm横10mmの開口を持つノズルを用い、高純度窒素ガスの流量は3L/min、形成面積は10mm×10mmとし、形成時間を20分とした。この結果、構造物の形成が観察され、最大形成厚さは30μmであった。
【0022】
【発明の効果】
以上に説明したように本発明によれば、樹脂基材にエアロデポジション法にて脆性構造物を形成するに当たり、脆性構造物形成時の樹脂基材のDHv2が7以上33以下となるようにしたことで、特別な処理、例えば樹脂基材表面に下地層を予め形成するなどの処理を行うことなく、直接樹脂基材表面に脆性構造物を形成することができる。
【0023】
したがって、本発明は回路基板、コンデンサ、静電チャックなどの各種複合構造物の製造法に適用できる。
【図面の簡単な説明】
【図1】本発明に係る複合構造物の製造装置の一例を示す図
【図2】各種樹脂の硬度(DHv1およびDHv2)と成膜の可否との関係を示すグラフ
【符号の説明】
10…複合構造物の製造装置、101…窒素ガスボンベ、102…ガス搬送管、103…エアロゾル発生器、104…エアロゾル搬送管、105…複合構造物形成室、106…ノズル、107…XYステージ、108…各種プラスチック基材、109…真空ポンプ。[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a method for manufacturing a composite structure in which a structure made of a brittle material such as ceramics or a semimetal is integrally formed on the surface of a resin substrate, and a composite structure obtained by the method.
[0002]
[Prior art]
The present inventors can use conventional sol-gel methods, vapor deposition methods such as PVD and CVD, thermal spraying methods, or JP-A-8-81774, JP-A-10-202171, JP-A-11-21677, JP-A-11-11. Japanese Patent Application No. 2002-108800 proposes an aerosol deposition method as a film forming method that replaces the gas deposition method and electrostatic fine particle coating method disclosed in Japanese Patent No. 330577 or Japanese Patent Application Laid-Open No. 2000-212766.
[0003]
In the gas deposition method, metal particles are mainly aerosolized by gas stirring, the aerosol is accelerated through a minute nozzle and collided with a substrate, and a part of the kinetic energy at the time of the collision is converted into thermal energy, The basic principle is to sinter between fine particles or between fine particles and a substrate. The electrostatic fine particle coating method is a method of forming a film on the same basic principle as the gas deposition method, and is a method of charging fine particles and accelerating them using an electric field gradient.
[0004]
On the other hand, in the aerosol deposition method, brittle material particles such as ceramic particles are aerosolized and collide with the base material to form a brittle material structure (film or the like) on the surface of the base material.
The major difference between the conventional gas deposition method and the aerosol deposition method is that the former uses heat to sinter the fine particles, whereas the latter aerosol deposition method uses the particle diameter, collision speed, It is a point that the brittle material structure can be formed at room temperature by carrying out under conditions such as pre-applying internal strain to the fine particles in advance, if necessary, in the atmosphere. The formed brittle material structure is also polycrystalline, and has a peculiarity that a grain boundary layer composed of a glass layer does not substantially exist at the interface between crystals.
[0005]
[Problems to be solved by the invention]
In the aerosol deposition method, brittle material fine particles were initially collided with a hard substrate such as metal or ceramic.
This is because the principle of the aerosol deposition method is considered as follows. That is, the collision causes the crystal lattice to shift along the cleaved surface such as the interface between crystallites, or crushes, and this causes the atoms originally present inside and bonded to other atoms to be exposed. A newly formed surface is formed, and the atomic layer portion of this newly formed surface is exposed to an unstable surface state by an external force from an originally stable atomic bond state, and the surface energy becomes high. The active surface joins the adjacent brittle material surface, the newly formed brittle material surface, or the substrate surface, and shifts to a stable state. This phenomenon is continuously generated, and joining is progressed and densified by repeated deformation and crushing of fine particles, thereby forming a brittle material structure.
[0006]
In fact, when the aerosol deposition method was applied to an epoxy resin whose substrate hardness was lower than that of a metal, the epoxy resin was scraped and a brittle material structure could not be formed, and it was applied to polypropylene which was softer than the epoxy resin. In some cases, a brittle material structure could not be formed.
[0007]
However, when applied to a softer ABS, a brittle material structure could be formed unexpectedly. At the time of filing of Japanese Patent Application No. 2002-108800, this phenomenon could be grasped, but a clear standard as to whether or not a brittle material structure could be formed was unknown.
[0008]
[Means for Solving the Problems]
In order to solve the above-mentioned problems, the present invention selects DHv2 (dynamic hardness considering the plastic deformation of the material) as a reference for the resin substrate as to whether or not a brittle material structure can be formed. DHv2 at the time of formation was 7 or more and 33 or less.
As an index indicating the hardness of the resin, there are DHv1 (dynamic hardness not considering the plastic deformation of the material and DHv2 (dynamic hardness considering the plastic deformation of the material), but the former index indicates the brittle material structure. It cannot be judged whether or not it can be formed.
[0010]
Further, the composite structure according to the present invention is obtained by selecting a base material having a DHv2 of 7 or more and 33 or less at the time of formation of the brittle material structure, and applying the aerosol deposition method to the base material, thereby obtaining the brittle material structure The feature of the product is that it is polycrystalline and has no orientation, and there is substantially no grain boundary layer composed of a glass layer at the interface between the crystals.
Here, in this specification, a polycrystal, crystal orientation, an interface, and a grain boundary layer are defined as follows.
(Polycrystalline)
A structure in which crystallites are joined and accumulated. The crystallite is essentially one crystal, and its diameter is usually 5 nm or more. However, the case where the fine particles are taken into the brittle material structure without being crushed rarely occurs, but is substantially polycrystalline.
(Crystal orientation)
This refers to the degree of orientation of crystal axes in a brittle material structure that is polycrystalline. Whether or not there is orientation is standard data by powder X-ray diffraction, which is generally considered to have substantially no orientation. JCPDS (ASTM) data is used as an index.
The peak intensity of the three major diffraction peaks in this index, which lists the substances constituting the crystals in the brittle material structure, is defined as 100%. In the present case, it is assumed that there is substantially no orientation in a state where the deviation of the peak intensity of the other two peaks is within 30% of the index value.
(interface)
It refers to the region that forms the boundary between crystallites.
(Grain boundary layer)
It is a layer with a certain thickness (usually several nm to several μm) located at the grain boundary in the interface or sintered body. It usually has an amorphous structure different from the crystal structure in the crystal grain, and in some cases, segregates impurities. Accompany.
[0011]
Here, examples of the resin having a DHv2 of 7 or more and 33 or less at room temperature include ABS (acrylonitrile butadiene styrene copolymer), PET (polyethylene terephthalate), PTFE (polytetrafluoroethylene), and polyimide. Moreover, what mixed the fiber in resin, such as FRP and FRM, can be used at room temperature, if it falls in said hardness range.
[0012]
In addition, the brittle material particles that collide with the base material are not particularly limited. For example, oxides such as Al 2 O 3 , SiO 2 , NiO, TiO 2 , CuO, ZnO, ZrO 2 , SnO 2 , MgO, Examples thereof include carbides such as WC, diamond, SiC, and B 4 C, nitrides such as AlN and Si 3 N 4 , fluorides such as Ca 2 F and ZrF, BaTiO 3 , and PZT.
[0013]
BEST MODE FOR CARRYING OUT THE INVENTION
FIG. 1 is a view showing an example of a composite structure manufacturing apparatus (aerosol deposition apparatus) according to the present invention. A
[0014]
Example 1
Aluminum oxide fine particles were selected as the brittle material fine particles. Specifically, α-alumina having a purity of 99% or more and an average particle diameter of 0.2 μm was used. Also, the plastic substrate has ABS (acrylonitrile butadiene styrene copolymer), PET (polyethylene terephthalate), PE (polyethylene), PMMA (polymethyl methacrylate), PP (polypropylene), PC (with a thickness of about 1 to 2 mm. Polycarbonate), polystyrene, PTFE (polytetrafluoroethylene), epoxy resin ARALDITE XD911, polyimide film formed on stainless steel with a thickness of several tens of μm, and 11 types of glass-epoxy substrates often used as electronic circuit boards were used. .
[0015]
A procedure for forming an aluminum oxide structure using the
[0016]
[Table 1]
[0017]
In Table 1, regarding the structure formation status, when formation of the structure was observed by the above-described operation (formation possible), formation was not observed, and there was no change in the base material visually (not formed) ), When formation is not seen, and the substrate is etched and scraped from the surface (not formed / substrate scraped), and when formation of the structure is seen, the maximum formation thickness of the structure The thickness was measured using a stylus type surface shape measuring device Dektak 3030 of Japan Vacuum Technology Co., Ltd.
[0018]
Also, the hardness of the substrate was loaded using a dynamic ultra-micro hardness meter DUH-W201 manufactured by Shimadzu Corporation under the conditions of a Vickers indenter, a test force of 10 gf, a load speed of 1.350 gf / sec, a holding time of 15 seconds, and a measurement environment at room temperature -An unloading test was conducted to show the values of dynamic hardness DHv1 not considering the plastic deformation of the material and dynamic hardness DHv2 considering the plastic deformation of the material.
[0019]
From this result, it can be seen that the value of the dynamic hardness DHv2 of the substrate greatly affects the formation of the structure. That is, paying attention to PP (polypropylene), DHv1 = 7.423, and this value is intermediate between PET (DHv1 = 9.959) and PTFE (DHv1 = 2.784). Therefore, if judged from the value of DHv1, a brittle material structure should be formed, but it cannot actually be formed. On the other hand, DHv2 of PP (polypropylene) is 47.615, and judging from DHv2, it is higher than PET (DHv2 = 32.766) and PTFE (DHv2 = 7.971), and the value of DHv2 It turns out that it becomes an indicator. Similarly, the value of glass epoxy also indicates that the value of DHv2 serves as an index for formation of a structure.
[0020]
FIG. 2 shows the situation in an easy-to-understand manner. When the DHv2 of the base material is arranged on the vertical axis, it is numerically expressed in three levels: “formed”, “not formed”, and “not formed / substrate scraped”. Can be divided into As a result, when a plastic substrate (organic material) having a DHv2 of 5 to 40 and more specifically 7 to 33 is used, a structure of a brittle material is formed using the aerosol deposition method. It can be said.
[0021]
(Example 2)
Using a device equivalent to that shown in FIG. 1, a silicon oxide structure using brittle material fine particles with a purity of 99% or more and an average particle size of 0.8 μm, and a plastic substrate with the same ABS material as in Example 1. Tried to form. At this time, a nozzle having an opening of 0.4 mm in length and 10 mm in width was used, the flow rate of high purity nitrogen gas was 3 L / min, the formation area was 10 mm × 10 mm, and the formation time was 20 minutes. As a result, formation of a structure was observed, and the maximum formation thickness was 30 μm.
[0022]
【The invention's effect】
As described above, according to the present invention, when the brittle structure is formed on the resin base material by the aerodeposition method, the DHv2 of the resin base material at the time of forming the brittle structure is 7 or more and 33 or less. As a result, the brittle structure can be directly formed on the surface of the resin base material without performing a special process, for example, a process of previously forming a base layer on the surface of the resin base material.
[0023]
Therefore, the present invention can be applied to a method for manufacturing various composite structures such as a circuit board, a capacitor, and an electrostatic chuck.
[Brief description of the drawings]
FIG. 1 is a diagram showing an example of an apparatus for producing a composite structure according to the present invention. FIG. 2 is a graph showing the relationship between the hardness (DHv1 and DHv2) of various resins and the possibility of film formation.
DESCRIPTION OF
Claims (6)
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| JP2007260886A (en) * | 2006-03-30 | 2007-10-11 | Mitsubishi Materials Corp | CMP conditioner and method of manufacturing the same |
| JP2014058721A (en) * | 2012-09-18 | 2014-04-03 | Sekisui Chem Co Ltd | Thin film deposition method |
| KR101573010B1 (en) | 2014-01-08 | 2015-11-30 | 안동대학교 산학협력단 | MANUFACTURING METHOD AND APPARATUS OF SiC COATING LAYERS |
| TW201825292A (en) * | 2016-09-14 | 2018-07-16 | 日商Toto股份有限公司 | Composite structure |
| TWI678282B (en) * | 2017-04-21 | 2019-12-01 | 國立研究開發法人產業技術綜合研究所 | Laminate and method of producing same |
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| JP3357586B2 (en) * | 1997-10-31 | 2002-12-16 | 株式会社不二機販 | Abrasion-resistant film molding of sliding part and film molding method |
| JP3265481B2 (en) * | 1999-04-23 | 2002-03-11 | 独立行政法人産業技術総合研究所 | Low temperature molding of brittle material ultrafine particles |
| JP2002235181A (en) * | 1999-10-12 | 2002-08-23 | National Institute Of Advanced Industrial & Technology | Composite structure, method of manufacturing the same, and manufacturing apparatus |
| JP4118589B2 (en) * | 2001-04-12 | 2008-07-16 | 独立行政法人産業技術総合研究所 | Composite structure of resin and brittle material and manufacturing method thereof |
| TWI330672B (en) * | 2002-05-28 | 2010-09-21 | Nat Inst Of Advanced Ind Scien | Method for forming ultrafine particle brittle material at low temperature |
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