JP4296252B2 - 光検出素子 - Google Patents
光検出素子 Download PDFInfo
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- JP4296252B2 JP4296252B2 JP2005511902A JP2005511902A JP4296252B2 JP 4296252 B2 JP4296252 B2 JP 4296252B2 JP 2005511902 A JP2005511902 A JP 2005511902A JP 2005511902 A JP2005511902 A JP 2005511902A JP 4296252 B2 JP4296252 B2 JP 4296252B2
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K39/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic radiation-sensitive element covered by group H10K30/00
- H10K39/30—Devices controlled by radiation
- H10K39/32—Organic image sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/10—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices being sensitive to infrared radiation, visible or ultraviolet radiation, and having no potential barriers, e.g. photoresistors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/28—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/28—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
- H10F30/2823—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors the devices being conductor-insulator-semiconductor devices, e.g. diodes or charge-coupled devices [CCD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/407—Optical elements or arrangements indirectly associated with the devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/50—Encapsulations or containers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/20—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation comprising organic-organic junctions, e.g. donor-acceptor junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/60—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation in which radiation controls flow of current through the devices, e.g. photoresistors
- H10K30/65—Light-sensitive field-effect devices, e.g. phototransistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/20—Carbon compounds, e.g. carbon nanotubes or fullerenes
- H10K85/221—Carbon nanotubes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/615—Polycyclic condensed aromatic hydrocarbons, e.g. anthracene
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/953—Detector using nanostructure
- Y10S977/954—Of radiant energy
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Electromagnetism (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Light Receiving Elements (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Description
2:カーボンナノチューブ、
3:光あるいは電磁波、
4:キャリア、
5:電束線、
6:絶縁層、
7:電極、
8:多層構造、
9:ゲート電極、
10:導電性ペースト、
11:ステム、
12a〜12c:リード電極、
13:絶縁碍子、
14:リード線、
15:窓、
16:接着剤、
17:キャップ、
18:レンズ体、
19:光検出素子、
20:電導線、
21:発光素子、
22:電源、
23:光入力、
24:光出力、
25:イメージセンサ、
26:ディスプレイ。
Claims (10)
- 光または電磁波の照射により内部にキャリアを発生する光伝導性物質と、カーボンナノチューブとを有し、光または電磁波の照射により前記光伝導性物質内にキャリアが発生し、そのキャリアが発する電束線を前記カーボンナノチューブの電気伝導の変化により検出することを特徴とする光検出素子。
- 請求項1記載の光検出素子において、前記光伝導性物質として、異なった波長範囲に光伝導性を有する複数種類の光伝導性物質による単層構造または多層構造を有することを特徴とする光検出素子。
- 請求項2記載の光検出素子において、前記多層構造が、光または電磁波の照射を受ける側にエネルギーギャップのより広い光伝導性物質からなる膜を形成するようになっていることを特徴とする光検出素子。
- 請求項1ないし3のいずれか1項記載の光検出素子において、前記光伝導性物質とカーボンナノチューブの間に透明または半透明の絶縁膜が形成されていることを特徴とする光検出素子。
- 請求項1ないし4のいずれか1項記載の光検出素子において、その光検出素子が電界効果トランジスタ構造または単電子トランジスタ構造を有することを特徴とする光検出素子。
- 請求項5記載の光検出素子において、前記電界効果トランジスタ構造が、前記光伝導性物質の下部にゲート電極を設けた構造であることを特徴とする光検出素子。
- 請求項5記載の光検出素子において、前記電界効果トランジスタ構造が、前記カーボンナノチューブの上部にゲート電極を設けた構造であることを特徴とする光検出素子。
- 請求項5記載の光検出素子において、前記電界効果トランジスタ構造が、前記カーボンナノチューブの近傍にゲート電極を設けた構造であることを特徴とする光検出素子。
- 請求項1ないし8のいずれか1項記載の光検出素子において、前記カーボンナノチューブの両端に接続される電極を有し、その両電極が櫛形で互いに対向するように配置されて、その両電極間に前記カーボンナノチューブが多数並列に接続されていることを特徴とする光検出素子。
- 請求項1ないし9のいずれか1項記載の光検出素子において、前記光または電磁波が照射される側上に集光レンズが配置されていることを特徴とする光検出素子。
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003199225 | 2003-07-18 | ||
| JP2003199225 | 2003-07-18 | ||
| JP2004208456 | 2004-07-15 | ||
| JP2004208456 | 2004-07-15 | ||
| PCT/JP2004/010428 WO2005008787A1 (ja) | 2003-07-18 | 2004-07-15 | 光検出素子 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2005008787A1 JPWO2005008787A1 (ja) | 2006-11-09 |
| JP4296252B2 true JP4296252B2 (ja) | 2009-07-15 |
Family
ID=34082326
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005511902A Expired - Fee Related JP4296252B2 (ja) | 2003-07-18 | 2004-07-15 | 光検出素子 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7750285B2 (ja) |
| JP (1) | JP4296252B2 (ja) |
| WO (1) | WO2005008787A1 (ja) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7521719B2 (en) * | 2004-08-13 | 2009-04-21 | Paul Steven Schranz | Light emitting and image sensing device and apparatus |
| WO2006089724A1 (en) * | 2005-02-28 | 2006-08-31 | Carl Zeiss Smt Ag | Spatially resolving radiation detector and fabricating and operating methods |
| JP2007043150A (ja) * | 2005-07-29 | 2007-02-15 | Interuniv Micro Electronica Centrum Vzw | 細長いナノ構造体を有する波長センシティブ検出器 |
| JP2007081185A (ja) * | 2005-09-15 | 2007-03-29 | Fujifilm Corp | 光検出素子 |
| KR100837397B1 (ko) * | 2006-01-05 | 2008-06-17 | 삼성전자주식회사 | 탄소나노튜브를 이용한 개스 센서 및 그 측정방법 |
| GB2437768A (en) * | 2006-05-03 | 2007-11-07 | Seiko Epson Corp | Photosensing TFT |
| US8044866B2 (en) * | 2007-11-06 | 2011-10-25 | The Boeing Company | Optically reconfigurable radio frequency antennas |
| KR100976865B1 (ko) * | 2008-04-28 | 2010-08-23 | 한국기계연구원 | 파장 검출 장치 및 이의 제조 방법 |
| JP4798254B2 (ja) * | 2009-05-13 | 2011-10-19 | 株式会社デンソー | 受光デバイス及びその制御方法 |
| US8217331B2 (en) * | 2010-01-19 | 2012-07-10 | The Boeing Company | Electromagnetic interference-resistant control device |
| KR101688523B1 (ko) * | 2010-02-24 | 2016-12-21 | 삼성전자주식회사 | 적층형 이미지 센서 |
| KR101135137B1 (ko) | 2010-05-03 | 2012-04-19 | 한국기계연구원 | 광 검출 장치 |
| US9786848B2 (en) | 2010-10-14 | 2017-10-10 | University Of Utah Research Foundation | Nanofiber-based heterojunction approach for high photoconductivity on organic materials |
| CN102270673A (zh) * | 2011-07-22 | 2011-12-07 | 重庆科技学院 | 多波段光电探测器 |
| KR101629881B1 (ko) | 2012-03-16 | 2016-06-13 | 엠파이어 테크놀로지 디벨롭먼트 엘엘씨 | 저광 적응형 촬상 장치 |
| JP6024755B2 (ja) | 2012-09-18 | 2016-11-16 | 富士通株式会社 | 半導体受光素子及びその製造方法 |
| US10468450B2 (en) * | 2014-04-04 | 2019-11-05 | Dose Smart Imaging | Apparatus for radiation detection in a radiography imaging system |
| RU2576353C1 (ru) * | 2014-11-05 | 2016-02-27 | Федеральное государственное бюджетное учреждение науки Институт нанотехнологий микроэлектроники Российской академии наук | Чувствительный элемент оптического датчика |
| CN106996829B (zh) * | 2016-01-22 | 2018-11-30 | 清华大学 | 图像传感器 |
| CN107293561B (zh) * | 2016-04-13 | 2020-05-19 | 中国科学院苏州纳米技术与纳米仿生研究所 | 同时制作pmos管和nmos管的方法、cmos及其制作方法、振荡器 |
| FR3076082B1 (fr) * | 2017-12-21 | 2020-01-24 | Isorg | Capteur d'image |
| JP6991330B2 (ja) | 2018-06-26 | 2022-02-03 | 三菱電機株式会社 | 電磁波検出器および電磁波検出器アレイ |
| CN109896500B (zh) * | 2019-03-05 | 2021-01-15 | 西安交通大学 | 一种网格型声学传感结构的制造工艺及声波检测方法 |
| TWI757122B (zh) * | 2021-03-18 | 2022-03-01 | 國立成功大學 | 場效二極體光感測半導體元件 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6362482B1 (en) * | 1997-09-16 | 2002-03-26 | Advanced Scientific Concepts, Inc. | High data rate smart sensor technology |
| WO2001044796A1 (en) * | 1999-12-15 | 2001-06-21 | Board Of Trustees Of The Leland Stanford Junior University | Carbon nanotube devices |
| US6423583B1 (en) | 2001-01-03 | 2002-07-23 | International Business Machines Corporation | Methodology for electrically induced selective breakdown of nanotubes |
| JP2003179234A (ja) | 2001-09-05 | 2003-06-27 | Konica Corp | 有機半導体素子およびその製造方法 |
| EP1291932A3 (en) * | 2001-09-05 | 2006-10-18 | Konica Corporation | Organic thin-film semiconductor element and manufacturing method for the same |
| JP4006727B2 (ja) | 2002-03-25 | 2007-11-14 | 富士通株式会社 | 光検知器及びその製造方法 |
| JP4051988B2 (ja) * | 2002-04-09 | 2008-02-27 | 富士ゼロックス株式会社 | 光電変換素子および光電変換装置 |
| US6713775B2 (en) | 2002-06-21 | 2004-03-30 | Lexmark International, Inc. | Method to correct for sensitivity variation of media sensors |
| JP3933664B2 (ja) * | 2002-08-01 | 2007-06-20 | 三洋電機株式会社 | 光センサ、光センサの製造方法および駆動方法、ならびに光強度検出方法 |
-
2004
- 2004-07-15 WO PCT/JP2004/010428 patent/WO2005008787A1/ja not_active Ceased
- 2004-07-15 US US10/564,936 patent/US7750285B2/en not_active Expired - Fee Related
- 2004-07-15 JP JP2005511902A patent/JP4296252B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US7750285B2 (en) | 2010-07-06 |
| JPWO2005008787A1 (ja) | 2006-11-09 |
| WO2005008787A1 (ja) | 2005-01-27 |
| US20070108484A1 (en) | 2007-05-17 |
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| Date | Code | Title | Description |
|---|---|---|---|
| AA64 | Notification of invalidation of claim of internal priority (with term) |
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