JP4298637B2 - Gas sensor and gas sensing device using the same - Google Patents
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本発明は、周囲気体の流れを遮断したチャンバ内に設置し、基板から熱分離した薄膜に、形成したヒータと温度センサとを個別に備え、温度計測、温度制御を高感度かつ高精度で実現する気体センサと、これを用いて、チャンバ内の真空度や気体の成分の分析が出来るようにした気体センシング装置に関するものである。 The present invention is installed in a chamber that shuts off the flow of ambient gas, and is provided with a heater and a temperature sensor that are individually formed on a thin film that is thermally separated from the substrate, realizing temperature measurement and temperature control with high sensitivity and high accuracy. The present invention relates to a gas sensor and a gas sensing device that can analyze the degree of vacuum and gas components in a chamber using the gas sensor.
気体センサを熱伝導型の真空センサとして使用する従来の真空センサには、ピラニー真空計と熱電対真空計がある。ピラニー真空計では、ヒータである金属細線(以下細線ヒータ)に電流を流すと発熱し、その熱は気体分子の熱伝導や細線ヒータを伝わる固体伝導、輻射によって放熱され、気体分子が奪う熱量が圧力に依存することを利用している。この気体センサは、金属円筒の内部に金属細線ヒータを張り、細線ヒータの温度を一定に保つために、細線ヒータに流す電流を制御する。気体分子が奪う熱量で細線ヒータに流れる電流が変化し、この変化量を利用して圧力を表示する。 Conventional vacuum sensors that use a gas sensor as a heat conduction type vacuum sensor include a Pirani vacuum gauge and a thermocouple vacuum gauge. In the Pirani gauge, heat is generated when an electric current is passed through a thin metal wire (hereinafter referred to as a thin wire heater), and the heat is dissipated by heat conduction of gas molecules, solid conduction and radiation transmitted through the fine wire heater, and the amount of heat taken by the gas molecules is reduced. Utilizes the dependence on pressure. This gas sensor stretches a thin metal wire heater inside a metal cylinder, and controls the current flowing through the thin wire heater in order to keep the temperature of the thin wire heater constant. The current flowing through the thin wire heater changes depending on the amount of heat taken by the gas molecules, and the pressure is displayed using this amount of change.
また、熱電対真空計においては、細線ヒータと熱電対が熱的に分離した気体センサと、細線ヒータと熱電対が密着した気体センサがある。細線ヒータと熱電対が熱的に分離した気体センサは、周囲気体分子の熱伝導を利用し、細線ヒータに一定の電流を流し、熱的に分離した細線ヒータと熱電対間の熱伝導が圧力に対して依存することを利用した気体センサである。この細線ヒータと熱電対が熱的に分離した気体センサの装置は、熱電対の起電力を利用して圧力を表示した装置である。 Thermocouple vacuum gauges include a gas sensor in which a thin wire heater and a thermocouple are thermally separated, and a gas sensor in which a thin wire heater and a thermocouple are in close contact. A gas sensor in which a thin wire heater and a thermocouple are thermally separated uses the heat conduction of surrounding gas molecules, a constant current is passed through the thin wire heater, and the heat conduction between the thin wire heater and the thermocouple is pressurized. It is a gas sensor using the dependence on. The gas sensor device in which the thin wire heater and the thermocouple are thermally separated is a device that displays the pressure using the electromotive force of the thermocouple.
一方、細線ヒータと熱電対が密着した気体センサは、細線ヒータから気体分子が奪う熱量を利用し、熱電対が密着した細線ヒータに一定の電流を流し、圧力に対して熱電対の起電力が依存することを利用した気体センサであり、熱電対の起電力を利用して圧力を表示した装置である。 On the other hand, a gas sensor in which a thin wire heater and a thermocouple are in close contact uses the amount of heat taken by gas molecules from the thin wire heater, and a constant current is passed through the thin wire heater in close contact with the thermocouple, so that the electromotive force of the thermocouple against the pressure is It is a gas sensor that utilizes the dependence, and a device that displays pressure using the electromotive force of a thermocouple.
ピラニー真空装置においては、金属の抵抗値が温度に対してほぼ比例して増加することを利用するので、抵抗値の変化を検出する回路は、交流ブリッジ回路或は、直流ブリッジ回路が用いられ、細線ヒータの所要の温度を一定に保つために、負帰還回路で、細線ヒータに流す電流を制御して、抵抗値が一定値になるように制御している。ブリッジ回路の出力を圧力に換算し表示している。
熱電対真空装置においては、細線ヒータと熱電対が熱的に分離した真空センサと、細線ヒータと熱電対が密着した真空センサがあるが、両真空センサ共に、細線ヒータに定電流回路で所要の一定電流を流し、気体分子が奪う熱量が圧力に対して依存した温度変化を熱電対で検知し、その起電力を電圧変換し、圧力に換算し表示している。
In the Pirani vacuum apparatus, the fact that the resistance value of the metal increases in proportion to the temperature is utilized, so the circuit for detecting the change in the resistance value is an AC bridge circuit or a DC bridge circuit. In order to keep the required temperature of the thin wire heater constant, the current fed to the thin wire heater is controlled by a negative feedback circuit so that the resistance value becomes a constant value. The output of the bridge circuit is converted into pressure and displayed.
In the thermocouple vacuum device, there are a vacuum sensor in which the fine wire heater and the thermocouple are thermally separated, and a vacuum sensor in which the fine wire heater and the thermocouple are in close contact, but both vacuum sensors require a constant current circuit for the fine wire heater. A constant current is passed, and a temperature change in which the amount of heat taken by gas molecules depends on pressure is detected by a thermocouple, and the electromotive force is converted into voltage, converted into pressure, and displayed.
しかしながら、金属円筒の内部に細線ヒータを張った真空センサは、細線ヒータである金属の小さな抵抗温度係数を利用するので、温度変化に対する出力変化が小さく、感度が小さい。また、細線ヒータと熱電対が一定の距離をおいて配置した真空センサは、細線ヒータと熱電対を均一に接近させているので熱輻射も寄与し、精度が劣り、気体の熱伝導を主に利用したいが、細線ヒータの表面積は小さいので、温度変化が小さく感度が劣る。細線ヒータと熱電対が接着した真空センサは、細線ヒータの接触している表面積が小さく、細線ヒータの一部に熱電対を接着し、固体熱伝導をも利用するので細線ヒータ全体の温度変化の一点を熱電対で検出するので感度が劣る。細線ヒータの部材には主に、白金あるいはタングステンの細線ヒータが用いられ、所要の抵抗値を得るのに細線ヒータを直線、あるいは蛇行させて配置し、所要の温度を得ているので形状が大きくなるという問題があった。 However, a vacuum sensor in which a thin wire heater is stretched inside a metal cylinder uses a small resistance temperature coefficient of the metal that is the thin wire heater, and therefore, the output change with respect to the temperature change is small and the sensitivity is small. In addition, the vacuum sensor in which the thin wire heater and the thermocouple are arranged at a certain distance has the thin wire heater and the thermocouple uniformly approached, so thermal radiation also contributes, and the accuracy is inferior. Although it is desired to use, the surface area of the thin wire heater is small, so the temperature change is small and the sensitivity is poor. The vacuum sensor where the thin wire heater and thermocouple are bonded has a small surface area in contact with the thin wire heater, and the thermocouple is bonded to a part of the thin wire heater and also uses solid heat conduction. Sensitivity is poor because one point is detected by a thermocouple. The thin wire heater is mainly a platinum or tungsten thin wire heater. To obtain the required resistance, the thin wire heater is arranged in a straight line or meandering to obtain the required temperature. There was a problem of becoming.
上記の問題を解決するために本発明の請求項1に係わる気体センサのセンサチップを図1に示した。基板1から熱分離した2個の薄膜(4a,4b)を空隙300を介して対向させる構造とした。薄膜4aにはヒータ6とこのヒータの近傍に温度センサTSaを個別に設けている。薄膜4aと対向している薄膜4bには測定用の温度センサTSbが設置してある。薄膜4a上のヒータ6によって上げられた温度を温度センサTSaで測定し、一定の温度に制御する。この熱が空隙300を介して熱伝導により薄膜4bに伝えられ、この温度を温度センサTSbで測定して、空隙を満たしている気体の種類や密度の情報を得る構造とした。周囲気体の流れを遮断したチャンバ内に設置して、基板から熱分離した薄膜にヒータと薄膜状の温度センサを、個別に形成した。 In order to solve the above problem, a sensor chip of a gas sensor according to claim 1 of the present invention is shown in FIG. Two thin films (4a, 4b) thermally separated from the substrate 1 are opposed to each other through a gap 300. The thin film 4a is individually provided with a heater 6 and a temperature sensor TSa in the vicinity of the heater. A temperature sensor TSb for measurement is installed on the thin film 4b facing the thin film 4a. The temperature raised by the heater 6 on the thin film 4a is measured by the temperature sensor TSa and controlled to a constant temperature. This heat is transmitted to the thin film 4b by heat conduction through the gap 300, and this temperature is measured by the temperature sensor TSb to obtain information on the type and density of the gas filling the gap. A heater and a thin film temperature sensor were individually formed on a thin film that was installed in a chamber where the flow of ambient gas was cut off and thermally separated from the substrate.
また、請求項2に係わるセンシングデバイスとしては、熱伝導型の温度センサであり、前記の薄膜4a,薄膜4bとこれらの間の空隙300との関係では、薄膜4aのヒータ6は所要の温度に設定し、温度センサTSaでヒータ6の温度を測定と同時に、負帰還の回路により、所要の温度で一定に制御する。この熱が空隙300の幅を薄膜4aと薄膜4bの幅のいずれよりも小さくすることにより、熱が空隙300を介しての熱伝達がよくなり、薄膜4bに伝えられる。この温度を温度センサTSbで測定して、空隙を満たしている気体の種類や密度の情報を得る構造とした。消費電力が小さく高速応答、小型でより高感度の真空センサを可能にした。そして、これを用いた気体センシング装置を提供することができるようにした。 Further, the sensing device according to claim 2 is a heat conduction type temperature sensor, and the heater 6 of the thin film 4a has a required temperature in the relationship between the thin films 4a and 4b and the gap 300 between them. At the same time, the temperature of the heater 6 is measured by the temperature sensor TSa, and at the same time, the temperature is controlled at a required temperature by a negative feedback circuit. This heat makes the width of the gap 300 smaller than both the width of the thin film 4a and the thickness of the thin film 4b, so that heat is transferred through the gap 300 and is transmitted to the thin film 4b. This temperature was measured by the temperature sensor TSb to obtain information on the type and density of the gas filling the gap. A vacuum sensor with low power consumption, high-speed response, small size and higher sensitivity has been made possible. And the gas sensing apparatus using this was able to be provided.
また、請求項3に係わるセンシングデバイスとしては、請求項1と請求項2の気体センサのおいて、温度センサTSaと温度センサTSbとの出力を利用して、前記チャンバ内の周囲気体の気圧もしくはその成分を計測できるようにした気体センサおいて、周囲気体温度の変化により、温度センサTSaと温度センサTSbの温度出力に影響を与える。これを小さくするために周囲気体温度Tcを検出する温度センサTScを、基板1に設けた。これにより、温度センサTSaと温度センサTSbの温度出力に補正を行うことで影響を小さくした。これにより、消費電力が小さく高速応答、小型でより高感度と高精度の真空センサを可能にした。また、これを用いた気体センシング装置を提供することができるようにした。 Further, as a sensing device according to claim 3, in the gas sensor according to claim 1 and claim 2, by using the outputs of the temperature sensor TSa and the temperature sensor TSb, the atmospheric pressure of the surrounding gas in the chamber or In the gas sensor capable of measuring the component, the temperature output of the temperature sensor TSa and the temperature sensor TSb is affected by the change in the ambient gas temperature. In order to reduce this, a temperature sensor TSc for detecting the ambient gas temperature Tc is provided on the substrate 1. Thus, the influence is reduced by correcting the temperature outputs of the temperature sensor TSa and the temperature sensor TSb. As a result, a vacuum sensor with low power consumption, high-speed response, small size, higher sensitivity, and high accuracy has become possible. In addition, a gas sensing device using this can be provided.
また、請求項4に係わるセンシングデバイスとしては、請求項1から請求項3の気体センサのおいて、温度センサTSaおよび温度センサTSb、温度センサTScをバイポーラトランジスタもしくは半導体ダイオードとし、半導体ダイオードの主に順方向特性を一定電圧駆動を行い、温度に対する電流変化を電圧変換後、温度に換算する。半導体ダイオードを一定電圧駆動するので電流変化が温度変化に対して大きい変化する。バイポーラトランジスタはベース、エミッタのダイオード特性を使用することにより、半導体ダイオードと同等の特性を得ることができる。これにより、消費電力が小さく高速応答、小型でより高感度と高精度の真空センサを可能にした。また、これを用いた気体センシング装置を提供することができるようにした。 According to a fourth aspect of the present invention, there is provided a sensing device according to any one of the first to third aspects, wherein the temperature sensor TSa, the temperature sensor TSb, and the temperature sensor TSc are bipolar transistors or semiconductor diodes. The forward characteristic is driven at a constant voltage, and the current change with respect to the temperature is converted into a voltage after voltage conversion. Since the semiconductor diode is driven at a constant voltage, the current change greatly changes with respect to the temperature change. Bipolar transistors can obtain the same characteristics as semiconductor diodes by using the base and emitter diode characteristics. As a result, a vacuum sensor with low power consumption, high-speed response, small size, higher sensitivity, and high accuracy has become possible. In addition, a gas sensing device using this can be provided.
また、請求項5に係わる気体センシング装置としては、請求項1から請求項4のいずれかに記載の気体センサを使用して、温度センサTSaと温度センサTSb、温度センサTScの温度を信号増幅回路、駆動電源回路で制御出力し、この温度信号を、演算回路、メモリ回路、表示部で信号処理を行い、前記チャンバ内の周囲気体の気圧もしくはその成分を計測できるようにした。これにより、高速応答で、小型でより高感度と高精度の気体センシング装置を提供することができるようにした。 Further, as a gas sensing device according to claim 5, by using the gas sensor according to any one of claims 1 to 4, the temperature of the temperature sensor TSa, the temperature sensor TSb, and the temperature sensor TSc is changed to a signal amplification circuit. Then, the temperature is controlled by a drive power supply circuit, and this temperature signal is processed by an arithmetic circuit, a memory circuit, and a display unit so that the atmospheric pressure of the ambient gas in the chamber or its component can be measured. As a result, it is possible to provide a gas sensing device that has a high-speed response, is small, and has higher sensitivity and accuracy.
本発明は、以上説明したように構成されているので、以下に記載されるような効果を奏する。それぞれの基板から熱分離された薄膜4aと薄膜4bが、互いに空隙と周囲気体を介して、面として熱伝達を行うために、感度が上がるようにできる。さらに、小型で固体熱伝導や輻射による放熱量が少なくできるので、消費電力が小さく高速応答、小型で高感度の真空センサを可能にした。ヒータと温度センサを個別に形成することによりそれぞれの最良なものを使うことが可能であり、また、互いの影響がないように性能を上げて測定できる。
基板から熱分離した薄膜4aと薄膜4b、空隙300に薄膜のヒータ6と温度センサが集中して集積化されているので、薄膜のヒータ6の熱容量が小さくてすみ、低消費電力で、小型の気体センサを用いた計測装置が形成できる。また、薄膜を4aと薄膜4bに分割したので、ヒータからの熱が、周囲気体を通じてのみ熱伝達されるから高感度の真空センサ等の熱型の気体センサが提供できる。周囲気体の温度を検出する温度センサを設けているので周囲温度の影響を補正でき、より精度の高い計測装置を提供できる。
Since the present invention is configured as described above, the following effects can be obtained. Since the thin film 4a and the thin film 4b thermally separated from the respective substrates perform heat transfer as surfaces through the gap and the surrounding gas, the sensitivity can be increased. In addition, it is small in size and can reduce the amount of heat dissipated by solid heat conduction and radiation, enabling low-power consumption, high-speed response, compact and highly sensitive vacuum sensors. By forming the heater and the temperature sensor individually, it is possible to use the best one of them, and it is possible to measure with improved performance so that there is no mutual influence.
The thin film heater 6 and the temperature sensor are concentrated and integrated in the thin film 4a and the thin film 4b thermally separated from the substrate, and the gap 300, so that the heat capacity of the thin film heater 6 can be small, low power consumption and small size. A measuring device using a gas sensor can be formed. Further, since the thin film is divided into the thin film 4a and the thin film 4b, the heat from the heater is transferred only through the surrounding gas, so that a thermal gas sensor such as a highly sensitive vacuum sensor can be provided. Since the temperature sensor for detecting the temperature of the surrounding gas is provided, the influence of the ambient temperature can be corrected, and a more accurate measuring device can be provided.
上記の目的を達成する為に本発明の請求項1に係わる気体センサは、周囲気体の流れを遮断したチャンバ内に設置した基板1と、この基板1から熱分離した2個の薄膜4a、薄膜4bを空隙300を介して配置し、一方の薄膜4aには、少なくとも1個のヒータ6とこのヒータ6の場所Aの温度Taを検出する温度センサTSaとを個別に設けてあり、他方の薄膜4bには、温度Tbを検出する温度センサTSbとを備え、薄膜4bに接する周囲気体の熱伝導により、場所Bの温度が上昇するように構成し、温度センサTSaと温度センサTSbとの出力を利用して、前記チャンバ内の周囲気体の気圧もしくはその成分を計測するようにしたものと、周囲気体の流れを遮断した円筒または、多角形筒の中に気体センサを配置し周囲気体の気圧もしくはその成分を周囲気体の流れに影響されないで計測するようにしたものもある。また、周囲気体の流れを遮断した円筒または、多角形筒に気体センサ検知面上に周囲気体雰囲気と同じになるように小さな穴をあけ、高感度で計測するようにしたものもある。 In order to achieve the above object, a gas sensor according to claim 1 of the present invention includes a substrate 1 installed in a chamber in which the flow of ambient gas is blocked, two thin films 4a thermally separated from the substrate 1, and a thin film 4b is disposed through a gap 300, and one thin film 4a is provided with at least one heater 6 and a temperature sensor TSa for detecting the temperature Ta at the location A of the heater 6, and the other thin film 4a. 4b includes a temperature sensor TSb that detects the temperature Tb, and is configured such that the temperature of the location B rises due to the heat conduction of the surrounding gas in contact with the thin film 4b. The outputs of the temperature sensor TSa and the temperature sensor TSb are Utilizing the sensor to measure the atmospheric pressure or its components in the chamber and the cylinder or polygonal cylinder that blocks the flow of the ambient gas, In some cases, the component is measured without being influenced by the flow of the surrounding gas. In addition, there is a cylinder or polygonal cylinder in which the flow of ambient gas is blocked, and a small hole is formed on the gas sensor detection surface so as to be the same as the ambient gas atmosphere, and measurement is performed with high sensitivity.
本発明の請求項2に係わる気体センサは、請求項1において薄膜4aの場所Aの温度センサTSaから、距離を隔てた空隙300の幅を、薄膜4aと薄膜4bの幅のいずれよりも小さくなるようにしたものであり、薄膜4aと薄膜4bが近接するから被測定周囲気体を通して薄膜4aから薄膜4bに熱伝達しやすいので高感度である。 A gas sensor according to a second aspect of the present invention is the gas sensor according to the first aspect of the present invention, wherein the width of the gap 300 spaced apart from the temperature sensor TSa at the location A of the thin film 4a is smaller than either of the widths of the thin film 4a and the thin film 4b. Since the thin film 4a and the thin film 4b are close to each other, heat is easily transferred from the thin film 4a to the thin film 4b through the ambient gas to be measured, so that the sensitivity is high.
本発明の請求項3に係わる気体センサは請求項1と請求項2において周囲気体の温度Tcを検出する温度センサTScを、基板1に設けた場合で、計測により周囲気体の温度Tcよりも所定の温度を数十度温度が高くなるようにヒータを制御するとよい。 The gas sensor according to claim 3 of the present invention is the case where the temperature sensor TSc for detecting the temperature Tc of the surrounding gas in the first and second aspects is provided on the substrate 1, and is measured more than the temperature Tc of the surrounding gas by measurement. It is preferable to control the heater so that the temperature becomes several tens of degrees.
本発明の請求項4に係わる気体センサは、請求項1から請求項3の気体センサの構造において、そこに用いる温度センサとして高感度、高精度であり、かつ単純で集積可能な温度センサとして、バイポーラトランジスタもしくは半導体ダイオードとした場合である。 The gas sensor according to claim 4 of the present invention is a gas sensor structure according to claims 1 to 3, as a temperature sensor that is highly sensitive and accurate as a temperature sensor used therefor, and that can be simply integrated. This is the case when a bipolar transistor or a semiconductor diode is used.
本発明の請求項5に係わる気体センシング装置は、請求項1から請求項5のいずれかに記載の気体センサと、該気体センサの温度センサTSaと温度センサTSbとの出力を利用し、信号増幅回路、演算回路、メモリ回路、駆動電源回路、表示部を必要に応じて設け、前記チャンバ内の周囲気体の気圧もしくはその成分を計測できるようにした気体センシング装置である。 A gas sensing device according to claim 5 of the present invention uses the gas sensor according to any one of claims 1 to 5 and outputs of the temperature sensor TSa and the temperature sensor TSb of the gas sensor to perform signal amplification. The gas sensing device is provided with a circuit, an arithmetic circuit, a memory circuit, a drive power supply circuit, and a display unit as necessary, and can measure the atmospheric pressure of the ambient gas in the chamber or its component.
以下、本発明の気体センサとこれを用いた気体センシング装置の実施例について図面を参照して詳しく説明する。
図1の(a)は気体センサの気体センシング部であるセンサチップの平面概略図で、図1の(b)は図1の(a)におけるX−X‘から見た断面形状図で、図2は気体センサを含めた気体センシング装置の系統図を示す。
Hereinafter, embodiments of a gas sensor of the present invention and a gas sensing device using the same will be described in detail with reference to the drawings.
FIG. 1A is a schematic plan view of a sensor chip that is a gas sensing unit of a gas sensor, and FIG. 1B is a cross-sectional view taken along line XX ′ in FIG. 2 shows a system diagram of a gas sensing device including a gas sensor.
図1の(a)は気体センサの気体センシング部であるセンサチップの平面概略図で、図1の(b)は図1の(a)におけるX−X‘から見た断面形状図で、図2は気体センサを含めた気体センシング装置の系統図を示す。
このセンサチップはシリコンSOI基板である基板1を用いた場合の実施例で下地基板2には空洞3が形成されてあり、空洞3の上部には、基板1から熱分離するのに、溝40を設け、このためために残された薄膜4a、薄膜4bは、4箇所にある梁5aで支えられた薄膜4aと、空隙300を介して3箇所にある梁5bで支えられた薄膜4bで形成されてあり、この薄膜4a、薄膜4bとこれらの梁5a、梁5bはSOI基板のBOX層10と単結晶シリコン薄膜20とを主構成材料としている。このため薄膜4a、薄膜4bは、宙に浮いた構造で、基板から熱分離された構造になっている。
FIG. 1A is a schematic plan view of a sensor chip that is a gas sensing unit of a gas sensor, and FIG. 1B is a cross-sectional view taken along line XX ′ in FIG. 2 shows a system diagram of a gas sensing device including a gas sensor.
This sensor chip is an embodiment in which a substrate 1 which is a silicon SOI substrate is used. A cavity 3 is formed in the base substrate 2, and a groove 40 is formed above the cavity 3 for thermal separation from the substrate 1. The thin film 4a and the thin film 4b left for this purpose are formed of a thin film 4a supported by four beams 5a and a thin film 4b supported by three beams 5b via a gap 300. The thin films 4a and 4b and the beams 5a and 5b are mainly composed of the BOX layer 10 and the single crystal silicon thin film 20 of the SOI substrate. For this reason, the thin film 4a and the thin film 4b are structures that are suspended in the air and are thermally separated from the substrate.
また、単結晶シリコン薄膜20はp型層210の場合であり、ここにn型の不純物拡散により形成したn型層220を薄膜のヒータ6として利用できるようにしている。このn型層220の薄膜のヒータ6は、周囲のp型層210に対して異なる導電型なので、これらの間にpn接合が形成されており、このヒータ6を周囲のp型層210から電気的に絶縁分離されている構造である。従って、ヒータ電極140に電流を流した時、ヒータ6だけに電流が流れるようにすることができ、ヒータ6だけをジュール加熱できる。 The single crystal silicon thin film 20 is a p-type layer 210, and an n-type layer 220 formed by n-type impurity diffusion can be used as the thin film heater 6 here. Since the heater 6 which is a thin film of the n-type layer 220 has a conductivity type different from that of the surrounding p-type layer 210, a pn junction is formed between them, and the heater 6 is electrically connected to the surrounding p-type layer 210. It is a structure that is electrically isolated. Therefore, when a current is passed through the heater electrode 140, the current can flow only in the heater 6, and only the heater 6 can be Joule-heated.
また、薄膜のヒータ6と同時にn型層220が、薄膜4a、薄膜4bに形成さたpn接合ダイオードが存在し、場所Aにあるヒータ6の温度Taを検出する温度センサTSaとし、場所Bの温度Tbを検出する温度センサTSbとして用いている。また、周囲気体の温度Tcを検出する温度センサTScも薄膜のヒータ6と同時に形成されたn型層220領域が存在し、pn接合ダイオードが形成されている。 In addition, the n-type layer 220 at the same time as the thin film heater 6 includes a pn junction diode formed on the thin film 4a and the thin film 4b, and the temperature sensor TSa for detecting the temperature Ta of the heater 6 at the location A is used. It is used as a temperature sensor TSb for detecting the temperature Tb. The temperature sensor TSc for detecting the temperature Tc of the surrounding gas also has an n-type layer 220 region formed simultaneously with the thin film heater 6, and a pn junction diode is formed.
また、配線150やpn接合ダイオードのp型電極120とpn接合ダイオードのn型電極130に電流を印加するので、配線150やpn接合ダイオードのp型電極120とpn接合ダイオードのn型電極130と単結晶シリコン薄膜20の間にシリコン酸化膜51を形成して絶縁している。 In addition, since current is applied to the wiring 150 and the p-type electrode 120 of the pn junction diode and the n-type electrode 130 of the pn junction diode, the wiring 150 and the p-type electrode 120 of the pn junction diode and the n-type electrode 130 of the pn junction diode A silicon oxide film 51 is formed and insulated between the single crystal silicon thin films 20.
上述では、pn接合ダイオード7aを温度センサTSa、pn接合ダイオード7bを温度センサTSb、pn接合ダイオード7cを温度センサTScとして、pn接合ダイオードを用いた場合であるが、これをバイポーラトランジスタのベースとエミッタのpn接合を用いてもよい。また、温度係数を持つ素子を用いてもよい。 In the above description, the pn junction diode 7a is used as the temperature sensor TSa, the pn junction diode 7b is used as the temperature sensor TSb, and the pn junction diode 7c is used as the temperature sensor TSc. Alternatively, a pn junction of may be used. An element having a temperature coefficient may be used.
図1のa、図1のbに示すセンサチップは、単結晶シリコンの公知の半導体微細加工技術、異法性エッチング技術を用いて形成でき、不純物拡散工程、熱酸化工程などを用いことで、配線150やpn接合ダイオードのp型電極120、pn接合ダイオードのn型電極130の形成なども既成技術で容易に形成できる。また、電極などの金属化は基板1にある空洞3の形成時に用いる異方性エッチングであるアルカリエッチング溶液に対して耐性のある金属を用いるのがよい。しかし、アルミニウムなどの耐性の無い金属を使用するときは、アルミニウムとシリコンの合金として、耐性を持たせるか、または、その上に保護膜を形成しておいてから異法性エッチングを行う必要がある。ここでは、シリコン酸化膜52を用いている。 The sensor chip shown in FIG. 1a and FIG. 1b can be formed by using a known semiconductor microfabrication technique of single crystal silicon, an illegal etching technique, and by using an impurity diffusion process, a thermal oxidation process, etc. The formation of the wiring 150, the p-type electrode 120 of the pn junction diode, the n-type electrode 130 of the pn junction diode, and the like can be easily formed by an existing technology. For metallization of the electrodes and the like, it is preferable to use a metal that is resistant to an alkaline etching solution which is anisotropic etching used when forming the cavity 3 in the substrate 1. However, when using a non-resistant metal such as aluminum, it is necessary to make it resistant as an alloy of aluminum and silicon, or to perform an illegal etching after forming a protective film on it. is there. Here, a silicon oxide film 52 is used.
次にヒータ6で熱せられた薄膜4aと、場所Aのpn接合ダイオード7aからなる温度センサTSaの温度Taと、場所Aから離れ、空隙300を介して、薄膜4bの場所Bが、空隙300の熱伝導により熱せられた薄膜4bの場所Bのpn接合ダイオード7bからなる温度センサTSbの温度Tbによる周囲気体の気圧計測、及び装置について説明する。 Next, the thin film 4 a heated by the heater 6, the temperature Ta of the temperature sensor TSa composed of the pn junction diode 7 a at the location A, and the location B of the thin film 4 b away from the location A through the air gap 300, A description will be given of the atmospheric gas pressure measurement and apparatus by the temperature Tb of the temperature sensor TSb composed of the pn junction diode 7b at the location B of the thin film 4b heated by heat conduction.
基板1であるシリコンSOI基板のSOI薄膜部分の薄膜4a、4b(単結晶シリコン薄膜20を含む)の厚みを6μm、溝40で囲まれた薄膜の大きさは(薄膜4a、4b合わせた)400μm×1500μm、BOX層10の厚みを1μmとし、n型層220の形成のためn型の不純物拡散をした場合、不純物拡散温度やその時間にも依るが、薄膜のヒータ6の抵抗値はほぼ60Ωであった。ヒータ電極140に直流電流を数十mA流した時200℃以上に温度上昇した。ヒータ6は基板1から熱分離した薄膜4aの場所Aの近傍にヒータ6と温度センサTSaとを個別に設けて配置されており、場所Aの周囲気体への熱伝導による放熱も合わせて、温度センサTSa(pn接合ダイオード7a)で検出した温度Taと、場所Aから離れ、空隙300を介しての熱伝導と周囲気体の熱伝導により熱せられた薄膜4bの場所Bの温度センサTSb(pn接合ダイオード7b)で検出した温度Tbの温度とは、熱伝導による放熱と空隙300を介しての熱伝導で温度勾配ができ、必ず、温度Taより温度Tbが低くなる。 The thickness of the thin film 4a, 4b (including the single crystal silicon thin film 20) of the SOI thin film portion of the silicon SOI substrate which is the substrate 1 is 6 μm, and the size of the thin film surrounded by the groove 40 is 400 μm (including the thin films 4a, 4b). When the thickness of the BOX layer 10 is 1 μm and n-type impurity diffusion is performed to form the n-type layer 220, the resistance value of the thin film heater 6 is approximately 60Ω, depending on the impurity diffusion temperature and time. Met. When a direct current was passed through the heater electrode 140 by several tens of mA, the temperature rose to 200 ° C. or higher. The heater 6 is disposed in the vicinity of the location A of the thin film 4a thermally separated from the substrate 1 by providing the heater 6 and the temperature sensor TSa separately. The temperature sensor TSb (pn junction) of the thin film 4b heated by the temperature Ta detected by the sensor TSa (pn junction diode 7a) and the heat conduction through the air gap 300 and the surrounding gas away from the place A. The temperature Tb detected by the diode 7b) has a temperature gradient due to heat radiation by heat conduction and heat conduction through the air gap 300, and the temperature Tb is always lower than the temperature Ta.
本実施例を図2の系統図を含めた実施例は、温度Taを計測する「温度センサTSa」に「信号増幅回路」から、温度センサTSaを動作させるために所要のバイアス電圧を供給し、「信号増幅回路」で所定の温度に相当する電圧に変換し、場所A点の温度Taを所定の温度になるように「信号増幅回路」から「ヒータ6」へ電力供給し、所定の温度を維持するようにする。 The embodiment including the system diagram of FIG. 2 supplies a bias voltage required to operate the temperature sensor TSa from the “signal amplifier circuit” to the “temperature sensor TSa” for measuring the temperature Ta, The “signal amplifier circuit” converts the voltage to a voltage corresponding to a predetermined temperature, and supplies power from the “signal amplifier circuit” to the “heater 6” so that the temperature Ta at the point A becomes a predetermined temperature. To maintain.
場所Bの温度Tbを計測する「温度センサTSb」に「信号増幅回路」から温度センサTSbを動作させるための所要のバイアス電圧を供給し、周囲気体の気圧が大気圧から、周囲気体の気圧が低くなると、場所A点の温度Ta及び場所Bの温度Tbにおける周囲気体の熱伝導率が低下して放熱が悪くなり、場所A及び場所Bの冷却効果が低下するので、場所Aの温度Taを所定の温度に維持させるためには、「ヒータ6」の供給電力を下げなければならない。場所A点の温度Taは所定温度に維持しているので、ヒータ6から主に薄膜4aと空隙300の熱伝導により、薄膜4bの場所Bが熱せらるが、周囲気体の熱伝導率が大きいほど、ヒータ6の場所A点の温度Taと場所Bの温度Tbとの温度差大きくなる。 A necessary bias voltage for operating the temperature sensor TSb is supplied from the “signal amplifying circuit” to the “temperature sensor TSb” for measuring the temperature Tb of the place B, and the ambient gas pressure is changed from the atmospheric pressure to the ambient gas pressure. If the temperature is lowered, the thermal conductivity of the surrounding gas at the temperature Ta at the location A and the temperature Tb at the location B is lowered and the heat radiation is deteriorated, and the cooling effect at the location A and the location B is lowered. In order to maintain the temperature at a predetermined temperature, the power supplied to the “heater 6” must be lowered. Since the temperature Ta at the location A is maintained at a predetermined temperature, the location B of the thin film 4b is heated by the heat conduction of the thin film 4a and the gap 300 from the heater 6, but the thermal conductivity of the surrounding gas is large. The temperature difference between the temperature Ta at the location A of the heater 6 and the temperature Tb at the location B increases.
これらの温度差の検出を「信号増幅回路」で行い、この温度差情報と、周囲気体の温度Tcの情報(温度Tcを計測する系統は、温度Ta及び温度Tbと同様である)を利用して、温度差に相当する電圧を真空度に換算した真空度計として、また温度Tcの情報をチャンバ内の温度情報として、「演算回路」、「メモリ回路」で信号処理を行い「表示回路」で表示させることができる。 These temperature differences are detected by a “signal amplification circuit”, and the temperature difference information and the ambient gas temperature Tc information (the system for measuring the temperature Tc is the same as the temperature Ta and the temperature Tb). As a vacuum gauge that converts the voltage corresponding to the temperature difference into a vacuum degree, and information on the temperature Tc as temperature information in the chamber, signal processing is performed in the “arithmetic circuit” and “memory circuit”, and the “display circuit”. Can be displayed.
また、ヒータ6に短形波で電圧を印加されるように、温度設定を短形波で設定し、少消費電力の真空計にすることもできる。「信号増幅回路」の出力電圧を、「演算回路」でデジタル化し、「メモリ回路」で所要のデータを記憶しておき、所要の信号処理などを行い「表示回路」表示することができる。「駆動電源回路」は各回路に動作に必要な電力を供給する回路である。 Further, the temperature can be set with a short wave so that a voltage is applied to the heater 6 with a short wave, and a vacuum gauge with low power consumption can be obtained. The output voltage of the “signal amplifier circuit” can be digitized by the “arithmetic circuit”, required data can be stored in the “memory circuit”, and required signal processing can be performed to display the “display circuit”. The “drive power supply circuit” is a circuit that supplies power necessary for operation to each circuit.
また、単結晶シリコン薄膜20はp型層210の場合であり、ここにn型の不純物拡散により形成したn型層220を薄膜のヒータ6として利用できるようにしている。このn型層220の薄膜のヒータ6は、周囲のp型層210に対して異なる導電型なので、これらの間にpn接合が形成されており、このヒータ6を周囲のp型層210から電気的に絶縁分離されている構造である。従って、ヒータ電極140に電流を流した時、ヒータ6だけに電流が流れるようにすことができ、ヒータ6だけをジュール加熱できる。 The single crystal silicon thin film 20 is a p-type layer 210, and an n-type layer 220 formed by n-type impurity diffusion can be used as the thin film heater 6 here. Since the heater 6 which is a thin film of the n-type layer 220 has a conductivity type different from that of the surrounding p-type layer 210, a pn junction is formed between them, and the heater 6 is electrically connected to the surrounding p-type layer 210. It is a structure that is electrically isolated. Therefore, when a current is passed through the heater electrode 140, the current can flow only in the heater 6, and only the heater 6 can be joule-heated.
基板1をシリコン半導体基板に形成できるので、気体センシングシステムに必要な回路、及び計測装置の一部として必要な回路を集積化できるので、きわめて小型で電力消費が微小で、信頼性の高い計測装置が提供できる。 Since the substrate 1 can be formed on a silicon semiconductor substrate, the circuit necessary for the gas sensing system and the circuit necessary as a part of the measuring device can be integrated, so that the measuring device is extremely small, consumes little power, and has high reliability. Can be provided.
1 基板
2 下地基板
3 空洞
4a、4b 薄膜
5a、5b 梁
6 ヒータ
7a、7b、7c pn接合ダイオード(温度センサ)
10 BOX層
20 単結晶シリコン薄膜
40 溝
51、52 シリコン酸化膜
120 pn接合ダイオードのp型電極
130 pn接合ダイオードのn型電極
140 ヒータ電極
150 配線
210 p型層
220 n型層
300 空隙
1 Substrate 2 Base substrate 3 Cavity 4a, 4b Thin film
5a, 5b Beam 6 Heater 7a, 7b, 7c pn junction diode (temperature sensor)
10 BOX layer 20 single crystal silicon thin film 40 groove 51, 52 silicon oxide film
120 p-type electrode of pn junction diode 130 n-type electrode of pn junction diode
140 heater electrode 150 wiring 210 p-type layer
220 n-type layer
300 gap
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