JP4333070B2 - Waveform measuring device - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a waveform measuring apparatus that converts a waveform to be measured into a digital signal and performs waveform analysis of the waveform to be measured by using the converted digital signal. The present invention relates to a waveform measuring apparatus that can immediately and easily determine the above.
[0002]
[Prior art]
The waveform measuring device converts the measured waveform, which is an electrical input signal, into a digital signal consisting of a series of digital waveform values that are temporally continuous by sampling, and the time when the digital signal and the measured waveform are converted into a digital signal. Is stored in the storage unit. Then, the waveform data stored in the storage unit is subjected to waveform analysis in the waveform analysis unit, and at least one of the waveform data or the waveform analysis result is displayed on the display unit via the display processing unit, It is used as a means to measure waveforms in research and development in various fields, production lines, quality control, maintenance work, etc.
[0003]
FIG. 8 is a diagram showing a block configuration example in a conventional waveform measuring apparatus. In FIG. 8, the measurement unit 10 receives a waveform to be measured. The acquired waveform storage unit 20 has an input side connected to an output side of the measurement unit 10. The input side of the waveform analysis unit 30 is connected to the output side of the acquired waveform storage unit 20.
[0004]
The display processing unit 40 is connected to the output side of the acquired waveform storage unit 20 and the output side of the waveform analysis unit 30 on the input side. The display unit 50 is connected to the output side of the display processing unit 40. The transfer unit 60 is connected to the output side of the acquired waveform storage unit 20 and the output side of the waveform analysis unit 30 on the input side. The analysis result storage unit 70 is connected to the output side of the transfer unit 60 on the input side, and is, for example, a floppy disk (registered trademark) or a hard disk, and can be removed from the apparatus and read by an external apparatus (not shown).
[0005]
Here, the function of the waveform analysis unit 30 performing the waveform analysis of the waveform data includes, for example, the following four items as typical functions.
[0006]
(1) Cursor measurement. A time difference, a voltage difference, or the like between vertical or horizontal cursors displayed on the display unit 50 is measured as a physical quantity.
[0007]
(2) Waveform parameter measurement. The entire acquired waveform or the amplitude, maximum voltage, minimum voltage, frequency, and the like of the waveform data displayed on the display unit 50 are measured.
[0008]
(3) Waveform calculation. When measurement is performed on multiple channels, calculations such as addition and subtraction between channels are performed.
[0009]
(4) Go / NoGo determination. Whether the waveform zone or waveform parameter range is set for the entire acquired waveform or the waveform data displayed on the display unit 50, and whether the acquired waveform is within the set range (Go determination) or not (NoGo determination) is determined. In the case of NoGo determination, an alarm signal is output. Thereby, it can be used for signal inspection of production lines of electronic devices, tracking of abnormal phenomena such as research and development, and the like. An apparatus (not shown) to which an alarm signal at the time of NoGo determination is input includes, for example, a buzzer sound, storage of abnormal waveform data in a storage unit, printing of screen image data with a printer, output to a designated medium, Internet Sending e-mails via the Internet.
[0010]
FIG. 9 shows an example in which the waveform data and the analysis result of the waveform parameter measurement are displayed on the display unit 50 in the apparatus shown in FIG. In FIG. 9, the horizontal axis represents time, and the vertical axis represents voltage. The waveform data 100 and the analysis result (the amplitude 101, the maximum voltage 102, and the minimum voltage 103 of the waveform data 100 displayed on the display unit 50) are displayed.
[0011]
The operation of the apparatus shown in FIG. 8 will be described using the flowchart shown in FIG. The measurement unit 10 converts the waveform to be measured input to the measurement unit 10 into a digital signal, and outputs the time at the time of conversion (for example, date, time, etc.) as waveform data together with the digital signal ( S10). And the acquisition waveform memory | storage part 20 stores the waveform data output from the measurement part 10 (S11). The waveform analysis unit 30 reads the waveform data in the acquired waveform storage unit 20 and performs waveform analysis of the waveform data (S12). The transfer unit 60 reads the waveform data from the acquired waveform storage unit 20 and receives an analysis result (including time) from the waveform analysis unit 30, and at least one of these waveform data or the analysis result is input to the analysis result storage unit 70. Store (S13).
[0012]
The display processing unit 40 reads the waveform data from the acquired waveform storage unit 20 and receives the analysis result from the waveform analysis unit 30 so that the waveform data and the analysis result are set to display conditions set by a setting unit (not shown). Is displayed on the display unit 50 in a desired format (S14).
[0013]
If the measurement is not completed, the waveform measuring apparatus again converts the waveform to be measured input to the measurement unit 10 into waveform data, and performs a series of operations from waveform analysis to display (S15, S10 to S14). If the measurement is completed, the waveform measuring apparatus ends the measurement (S15).
[0014]
[Problems to be solved by the invention]
In such an apparatus, the analysis result of the waveform analysis unit 30 is updated and displayed on the display unit 50 every time the measured waveform is acquired and analyzed, as shown in FIG. When the measurer generates a desired analysis result (for example, the maximum voltage 102 exceeds a specific value in waveform parameter measurement or becomes NoGo determination in Go / NoGo determination, etc.) When the number of times that a desired analysis result is generated or the number of times that a desired analysis result is generated in an arbitrary time zone is required, the analysis result must be confirmed every time the display unit 50 is visually updated.
[0015]
Therefore, an object of the present invention is to realize a waveform measuring apparatus that can immediately and easily measure the tendency of the frequency of occurrence of a desired analysis result.
[0016]
[Means for Solving the Problems]
The invention described in claim 1
In the waveform measurement device that analyzes the waveform data of the measured waveform,
In a waveform measuring apparatus that measures a measured waveform and repeatedly acquires and analyzes one screen of waveform data ,
A frequency calculation unit for obtaining the temporal frequency of the analysis result is provided,
This frequency calculator is
A discriminating means for discriminating whether the analysis result with the waveform data for one screen as a unit is an analysis of the waveform data for one screen as abnormal;
From the time of the determination means analysis is the determination result, determine the abnormal one screen time interval waveform data is generated in, is characterized in that it has a calculating means for calculating the frequency of occurrence of the time interval.
[0017]
The invention according to claim 2 is the invention according to claim 1,
A display processing unit for displaying the occurrence frequency of the frequency calculation unit on the display unit is provided.
[0020]
The invention according to claim 3 is the invention according to claim 1 or 2,
It has a storage unit for storing the calculation result of the calculation means.
[0021]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of the present invention will be described below with reference to the drawings.
FIG. 1 is a block diagram showing a first embodiment of the present invention. Here, the same components as those in FIG. In FIG. 1, a frequency calculation unit 80 is newly provided. The frequency calculation unit 80 receives the analysis result of the waveform analysis unit 30, calculates the temporal frequency of occurrence of the desired analysis result, and outputs the calculation result.
[0022]
The frequency calculation unit 80 includes a determination unit 81 and a calculation unit 82. The discriminating means 81 receives the analysis result (including time) of the waveform analysis unit 30 and discriminates whether it is a desired analysis result. The calculation means 82 calculates the number of times that a desired analysis result occurs at an arbitrary time interval from the time of the analysis result.
[0023]
The display processing unit 90 is provided in place of the display processing unit 40, reads waveform data from the acquired waveform storage unit 20, and receives the analysis result of the waveform analysis unit 30 and the calculation result of the frequency calculation unit 80. At least one of the waveform data and the calculation result is displayed on the display unit 50 in a desired format.
[0024]
Next, the operation of the apparatus shown in FIG. 1 will be described using the flowchart shown in FIG. The measurement unit 10 converts the waveform to be measured input to the measurement unit 10 into a digital signal, and outputs the time at the time of conversion (for example, date, time, etc.) as waveform data together with the digital signal ( S20). Then, the acquired waveform storage unit 20 stores the waveform data output from the measurement unit 10 (S21). The waveform analysis unit 30 reads the waveform data in the acquired waveform storage unit 20 and performs waveform analysis of the waveform data (S22). The transfer unit 60 reads the waveform data of the acquired waveform storage unit 20 and receives the analysis result of the waveform analysis unit 30 and stores at least one of these waveform data and the analysis result in the analysis result storage unit 70 (S23). .
[0025]
The discriminating means 81 discriminates whether or not the analysis result of the waveform analysis unit 30 is inputted and a desired analysis result is obtained (S24). When the determination unit 81 determines that the desired analysis result is obtained, the calculation unit 82 obtains a time interval at which the desired analysis result occurs from the time of the analysis result, and further generates the desired analysis result at an arbitrary time interval. The number of times is obtained, and the obtained time interval and number of occurrences are output to the display processing unit 90 as calculation results (S25).
[0026]
When the determination unit 81 does not determine the desired analysis result (S24), or after the calculation unit 82 outputs the calculation result to the display processing unit 90, the display processing unit 90 stores the waveform data in the acquired waveform storage unit 20 In addition to reading, the analysis result of the waveform analysis unit 30 and the calculation result of the frequency calculation unit 80 are respectively input, and at least one of the waveform data, the analysis result, and the calculation result is set to display conditions set by a setting unit (not shown). Is displayed on the display unit 50 in a desired format (S26).
[0027]
If the measurement is not completed, the waveform measuring apparatus again converts the waveform to be measured input to the measurement unit 10 into waveform data, and performs a series of operations from waveform analysis and measurement of temporal occurrence frequency to display ( S27, S20 to S26). If the measurement is completed, the waveform measuring apparatus ends the measurement (S27).
[0028]
Further, the operation of the frequency calculation unit 80 and a display example on the display unit 50 will be specifically described. 3 is a time series example of waveform data converted from the waveform to be measured in the apparatus shown in FIG. 1, and FIG. 4 is an example in which the calculation result obtained by the frequency calculation unit 80 is displayed on the display unit 50. .
[0029]
In FIG. 3, the waveform data is analyzed by the waveform analysis unit 30, and the determination means 81 determines that the determination means 81 is a desired analysis result (for example, when the maximum voltage or the minimum voltage is larger or smaller than a certain value). The waveform data 200 (displayed in a thick frame in FIG. 3) and the waveform data 201 (displayed in a thin frame in FIG. 3) that was not determined as a desired analysis result are irregularly generated. To do.
[0030]
Every time the discriminating means 81 discriminates from the waveform data 200 that is the desired analysis result, the computing means 82 calculates the time intervals T1 to TN (where N is an integer) at which the waveform data 200 is generated from the time of the analysis result. calculate. Further, the calculation means 82 sets the calculated time intervals T1 to TN to an arbitrary time interval, for example, less than 5 minutes, 5 minutes to 10 minutes, 10 to 15 minutes, 15 to 20 minutes, 20 to 25 minutes, 25 to 30 minutes. , Divided into 30 minutes or more, and the number of times that a desired analysis result has occurred is obtained for each time interval. The display processing unit 90 displays the obtained number of times in a desired format on the display unit 50 in a bar graph as shown in FIG.
[0031]
As described above, every time the waveform data 200 and 201 are determined as the desired analysis result by the determination unit 81, the calculation unit 82 obtains the time interval at which the desired analysis result occurs from the time of the analysis result, and obtains the time interval. The number of occurrences of a desired analysis result is obtained from the time interval every arbitrary time interval, and the obtained result is displayed on the display unit 50 via the display processing unit 90. Thus, it is not necessary for the measurer to visually confirm the analysis result every time the screen is updated in order to obtain the temporal frequency of occurrence of the desired analysis result. Therefore, the tendency of the frequency of occurrence of analysis results over time can be easily obtained immediately and without being constrained by the measurer.
[0032]
In addition, since the frequency calculation unit 80 calculates the number of times for each time interval at which a desired analysis result is generated, it is possible to know the time trend of occurrence frequency at which time the desired analysis result is generated. As a result, the feature detection of the waveform under measurement can be performed immediately and easily.
[0033]
FIG. 5 is a block diagram showing the second embodiment of the present invention. The same components as those shown in FIG. 1 are denoted by the same reference numerals, description thereof is omitted, and illustration is also omitted. In FIG. 6, a calculation means 83 is provided instead of the calculation means 82.
[0034]
The calculation means 83 obtains the number of times that a desired analysis result occurs in an arbitrary time zone from the time of the analysis result.
[0035]
The operation of the apparatus shown in FIG. 5 will be described. In S25 of the flowchart shown in FIG. 2, when the determination unit 81 determines that the desired analysis result is obtained, the calculation unit 83 obtains the number of times the desired analysis result is generated in an arbitrary time zone from the time of the analysis result. .
[0036]
Further, since the operation means 83 is the same as the apparatus shown in FIG. 1 except for obtaining the number of times the desired analysis result is generated in an arbitrary time zone depending on the time of the analysis result, the description thereof is omitted.
[0037]
Further, the operation of the frequency calculation unit 80 and a display example on the display unit 50 will be specifically described. 6 is a time series example of waveform data converted from the waveform to be measured in the apparatus shown in FIG. 5, and FIG. 7 is an example in which the calculation result obtained by the frequency calculation unit 80 is displayed on the display unit 50. .
[0038]
In FIG. 6, the same components as those in FIG. The calculation means 83 is desired for the waveform data 200 every arbitrary time zone from the time of the analysis result, for example, every 3 hours from 0 o'clock to 3 o'clock, 3 o'clock to 6 o'clock, and thereafter from 21 o'clock to 24 o'clock. The number of times that the analysis result of is generated is obtained. The display processing unit 90 displays the obtained frequency for each time period on the display unit 50 in a desired format in a bar graph as shown in FIG.
[0039]
Thus, every time the waveform data 200, 201 is determined as a desired analysis result by the determination unit 81, the calculation unit 83 obtains the number of times for each time zone in which the desired analysis result occurs from the time of the analysis result, The obtained result is displayed on the display unit 50 via the display processing unit 90. Thus, it is not necessary for the measurer to visually confirm the analysis result every time the screen is updated in order to obtain the temporal frequency of occurrence of the desired analysis result. Therefore, the tendency of the frequency of occurrence of analysis results over time can be easily obtained immediately and without being constrained by the measurer.
[0040]
In addition, since the number of times that the desired analysis result is generated for each time zone is obtained by the calculation means 83, it is not necessary for the measurer to visually confirm the analysis result every time the screen is updated. Therefore, daily reports can be prepared immediately and easily.
[0041]
In addition, since the number of times that the desired analysis result is generated for each time zone is obtained by the calculation means 83, it is not necessary for the measurer to visually confirm the analysis result every time the screen is updated. Therefore, when the apparatus shown in FIG. 5 is used in a production line, the tendency of the time zone when the desired analysis result has occurred in the production line can be confirmed immediately and easily, and the measurer must perform other work. Can improve productivity.
[0042]
In addition, this invention is not limited to this, The following may be sufficient. In the apparatus shown in FIGS. 1 and 5, the calculation means 82 and 83 are configured to obtain the temporal frequency of occurrence every time a desired analysis result is generated, but the calculation means 82 and 83 only after the measurement of the measured waveform is completed. 83 may be configured to read the analysis result from the analysis result storage unit 70 and obtain the temporal occurrence frequency from the analysis result.
[0043]
In addition, in the apparatus shown in FIGS. 1 and 5, a storage unit that stores the calculation results of the calculation units 82 and 83 may be provided in the frequency calculation unit 80.
[0044]
Moreover, in the apparatus shown in FIGS. 1 and 5, the calculation results of the calculation means 82 and 83 may be stored in the analysis result storage unit 70.
[0045]
In addition, in the apparatus shown in FIGS. 1 and 5, both the calculation means 82 and 83 are provided, and the number of times that a desired analysis result is generated at an arbitrary time interval, or the number of times that a desired analysis result is generated at an arbitrary time zone. Both of them may be calculated.
[0046]
1 and FIG. 5, the analysis result of the waveform analysis unit 30 is displayed on the display unit 50 and stored in the analysis storage unit 70. However, the display on the display unit 50 or the analysis storage is shown. Only one of the storage in the unit 70 may be performed.
[0047]
In the apparatus shown in FIG. 1, the calculation means 82 sets the time interval for generating a desired analysis result every 15 minutes. However, this time interval may be any time, for example, every several hours, every few days, every several months. Or every few years.
[0048]
Further, in the apparatus shown in FIG. 5, the calculation means 83 sets the time zone in which a desired analysis result occurs every 3 hours, but this time zone may be any time, for example, every day, every month, every year, etc. Also good.
[0049]
【The invention's effect】
According to the present invention, the frequency calculation unit obtains the temporal occurrence frequency of the analysis result of the waveform to be measured. Therefore, in order to obtain the temporal occurrence frequency of the analysis result, the displayed analysis result is visually confirmed. There is no need. Therefore, the tendency of the frequency of occurrence of analysis results over time can be obtained immediately and easily.
[Brief description of the drawings]
FIG. 1 is a block diagram showing a first embodiment of the present invention.
FIG. 2 is a flowchart showing an operation in the apparatus shown in FIG.
FIG. 3 is a diagram showing a time-series example of waveform data converted from a waveform to be measured.
4 is a diagram showing a display example of a calculation result obtained by a frequency calculation unit 80 on the display unit 50. FIG.
FIG. 5 is a block diagram showing a second embodiment of the present invention.
FIG. 6 is a diagram illustrating a time series example of waveform data converted from a waveform to be measured.
7 is a diagram showing a display example of the calculation result obtained by the frequency calculation unit 80 on the display unit 50. FIG.
FIG. 8 is a diagram showing a block configuration example of a conventional waveform measuring apparatus.
9 is a diagram showing a display example of waveform data 100 and waveform analysis results 101 to 103 on the display unit 50 in the apparatus shown in FIG.
10 is a flowchart showing the operation of the apparatus shown in FIG.
[Explanation of symbols]
70 Analysis Result Storage Unit 80 Frequency Calculation Unit 81 Discriminating Units 82 and 83 Calculation Unit 90 Display Processing Unit

Claims (3)

In a waveform measuring apparatus that measures a measured waveform and repeatedly acquires and analyzes one screen of waveform data ,
A frequency calculation unit for obtaining the temporal frequency of the analysis result is provided,
This frequency calculator is
A discriminating means for discriminating whether the analysis result with the waveform data for one screen as a unit is an analysis of the waveform data for one screen as abnormal;
A waveform measuring apparatus comprising: a calculation means for calculating a time interval at which waveform data for one abnormal screen has occurred from the time of the analysis result determined by the determination means, and calculating the occurrence frequency of the time interval.   The waveform measuring apparatus according to claim 1, further comprising a display processing unit that displays the occurrence frequency of the frequency calculation unit on the display unit.   The waveform measuring apparatus according to claim 1, further comprising a storage unit that stores a calculation result of the calculation unit.

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