JP4354828B2 - Connected device - Google Patents

Description

  The present invention relates to a connection device in an inspection socket on which an electronic component such as a semiconductor is mounted, and in particular, the electrical connection between the connection terminal on the electronic component side and the connection terminal of the inspection socket is stably performed. It is related with the connection apparatus made to become.

  The semiconductor inspection apparatus described in Patent Document 1 electrically temporarily connects a semiconductor to an external circuit board or the like. A large number of spherical contacts arranged in a lattice shape or a matrix shape are provided on the back side of the semiconductor, and a large number of recesses are provided on an insulating substrate facing the contact, and spiral contacts are provided in the recesses. Opposed.

When the back side of the semiconductor is pressed toward the insulating substrate, the spiral contact comes into contact with the outer surface of the spherical contact so that the spiral contact is spirally wound. The electrical connection between the two is ensured.
JP 2002-175859 A

  By the way, in the semiconductor inspection apparatus as described above, it is necessary to measure the characteristics of the semiconductor with high accuracy. For this purpose, electrical connection between individual spiral contacts on the semiconductor inspection apparatus side and individual spherical contacts on the semiconductor side is required. It is necessary to ensure that stable connections are made stably.

  However, for example, plastic deformation may occur in individual spiral contacts, or partially different pressure may occur due to restrictions such as the shape of the semiconductor. In such a case, for example, between a certain spherical contact An electrical contact is formed near the base end of the spiral contact, and an electrical contact is formed near the tip of the spiral contact with a certain spherical contact. There is a problem in that it is difficult to secure an electrically stable connection because the location of the contact differs for each set of spiral contacts.

  On the other hand, it is likely that stable electrical connection can be obtained by increasing the contact pressure between the spherical contact and the spiral contact by increasing the pressure of the semiconductor itself.

  However, there is a limit to the pressure that can be applied to semiconductors. Rather, considering the damage of the semiconductor, it is preferable to use less pressure, and as the number of contacts increases, one contact pressure decreases accordingly. However, the method of increasing the pressure applied to the semiconductor is not necessarily a good measure because there is a limit to giving a sufficient contact pressure to each contact.

  The present invention is for solving the above-described conventional problems, and in the state in which the contact pressure between each spiral contact on the inspection apparatus side and each spherical contact on the electronic component side such as a semiconductor is reduced, It is an object of the present invention to provide a connection device that can stabilize the electrical connection.

The present invention provides a connecting device for have a spiral contactor in direct contact with the spherical contacts mounted in the electronic component,
The contact piece has a spiral shape having a winding start end portion positioned on the outer peripheral side and a winding end portion positioned on the inner peripheral side of the winding start end portion and having a circumferential length of one or more rounds. It is formed with a constant width dimension over the winding end part, or is formed with a width dimension that changes corresponding to the length from the winding start end part,
Between the winding start end portion and the winding end portion of the contact piece, it protrudes from the winding start end portion toward the central portion surrounded by the contact piece for one turn and directly to the spherical contactor. The convex part which contacts is formed integrally.

In connection apparatus of the present invention, the convex portion provided in a spiral-shaped contact piece, in order to preferentially contact the ball contacts, to make the electrical characteristics between the contact piece and the ball contacts constant it can. That is, it is possible to prevent the electrical characteristics generated between the plurality of arranged contact pieces and the plurality of arranged spherical terminals from being greatly different for each contact. Therefore, when used as a semiconductor inspection socket, the semiconductor can be inspected with high reliability.

In the above, it is preferable that the convex portion is provided in the vicinity of the winding end portion of the contact piece.

In addition, when the contact piece is divided into two regions, a region including the winding start end and a region not including the winding start end , the convex portion is provided in a region not including the winding start end. Alternatively, it is preferable that the convex portion is provided at a position opposite to the winding start end portion across the center of the spiral contact piece .

  In the connection device of the present invention, the convex portion, which is a discontinuous contact formed on the spiral contact on the connection device side, locally contacts the spherical contact on the semiconductor side, thereby making electrical connection between them. Can be secured. In particular, since the connection between the spiral contact and the spherical contact is made through the convex portion, the electrical connection between them can be stabilized.

  FIG. 1 is a perspective view showing an inspection socket used in a test for confirming the operation of an electronic component, and FIG. 2 is a cross-sectional view taken along line 2-2 of FIG. 1, in which the electronic component is mounted inside the inspection socket. It is sectional drawing which shows the state.

  As shown in FIG. 1, the inspection socket 10 includes a base 11 and a lid 12 that is rotatably supported via a hinge 13 provided on one edge of the base 11. Has been. The base 11 and the lid body 12 are formed of an insulating resin material or the like, and a loading region 11A that is concave in the Z2 direction is formed at the center of the base 11. An electronic component 1 such as a semiconductor can be mounted in the loading area 11A. A locked portion 14 is formed on the other edge portion of the base 11, and a lock portion 15 that engages with the locked portion 14 is provided on the lid 12.

  As shown in FIG. 2, this inspection socket 10 inspects an electronic component 1 in which a large number of spherical contacts (external connection terminals) 1a are arranged on a lower surface in a matrix (also referred to as a grid or grid pattern). It is intended.

  As shown in FIG. 2, the loading area 11 </ b> A has a predetermined diameter, and a plurality of recesses (through holes) 11 a penetrating from the front surface of the loading area 11 </ b> A to the back surface of the base 11 have a spherical shape of the electronic component 1. It is provided corresponding to the contact 1a. On the upper surface of the recess 11a (the surface of the loading region 11A), a spiral contact (connection terminal) 20 is provided in which the contact is formed in a spiral shape.

  A conductive portion 17 that is plated is formed on the inner wall surface of the recess 11a (see FIG. 4B). In addition, the upper end of the conduction | electrical_connection part 17 and the said base 21 of the said spiral contactor 20 are connected, for example with the electroconductive adhesive material. The opening end below the recess 11 a is closed by a connection terminal 18 connected to the conduction portion 17.

  As shown in FIG. 2, a printed board 30 having a plurality of wiring patterns and other circuit components is provided below the base 11, and the base 11 is fixed on the printed board 30. . The surface of the printed circuit board 30 is provided with a counter electrode 31 facing the connection terminal 18 provided on the bottom surface of the base 11, and the connection terminals 18 are in contact with the counter electrodes 31, respectively. The electronic component 1 and the printed circuit board 30 are electrically connected via the inspection socket 10.

  On the other hand, at the center position of the inner surface of the lid 12 of the inspection socket 10, a convex pressing portion 12a that presses the electronic component 1 downward in the figure is provided so as to face the loading region 11A. Further, a lock portion 15 is formed at a position on the opposite side to the hinge portion 13.

  Between the inner surface of the lid body 12 and the pressing portion 12a, a biasing member made of a coil spring or the like that biases the pressing portion 12a away from the inner surface of the lid body 12 is provided (not shown). . Therefore, when the electronic component 1 is mounted in the concave portion 11a, the lid 12 is closed, and the lock portion 15 is engaged with the lock portion 15 and locked, the electronic component 1 approaches the surface of the loading region 11A. It can be elastically pressed in the (Z2 direction).

  The size of the loading area 11A of the base 11 is substantially the same as the outer shape of the electronic component 1, and when the electronic component 1 is mounted on the loading area 11A and the lid 12 is locked, the electronic component 1 side Each spherical contact 1a and each spiral contact 20 on the side of the inspection socket 10 can be accurately positioned in correspondence with each other.

  FIG. 3 is a plan view showing a first embodiment of a spiral contact as a main part of the present invention, and FIG. 4 is a partially enlarged view showing a space between the spiral contact and the spherical contact. It is a sectional view taken on line a, A shows a state before connection, and B shows a state after connection.

  As shown in FIG. 3, a base 21 is provided on the outer side of the spiral contact 20A to surround and support the spiral contact 20A in a square shape. And the said base 21 is being fixed to the edge of the opening end above the said recessed part 11a.

  As shown in FIG. 3, the spiral contact 20 </ b> A has a winding start end portion 22 provided on the base 21 side, and a winding end portion 23 on the tip end side of a contact piece 22 a that extends spirally from the winding start end portion 22. It is located at the center O of the spiral contact 20A. The spiral contactor 20A is formed in the same planar shape as shown by a solid line in FIG. 4A or a three-dimensional shape in which a winding end portion 23 at the center as shown by a dotted line in FIG. 4A protrudes in a convex shape.

  In the spiral contact 20A shown in FIG. 3 as the first embodiment, the width dimension of the winding start end portion 22 is W0, and the width dimension of the winding end portion 23 is slightly narrower than the width dimension W0. It is formed with a width dimension W1 (W0> W1). The width dimension of the contact piece 22a of the spiral contact 20A is proportional to the length of the contact piece 22a from the width dimension W0 of the winding start end portion 22 toward the width dimension W1 of the winding end portion 23 as a whole. It is formed continuously so as to gradually narrow.

  Note that the total length of the contact piece 22a between the winding start end portion 22 and the winding end portion 23 of the spiral contactor 20 is L, up to an arbitrary position on the contact piece 22a from the winding start end portion 22 toward the winding end portion 23. Assuming that the length is X (where 0 ≦ X ≦ L), the width dimension W of the spiral contact 20 at the arbitrary position X is expressed by the following equation (1).

  However, in the spiral contactor 20A shown in the first embodiment, the width dimension is different from the width dimension formed between the winding start end portion 22 and the winding end portion 23 based on the formula 1 at a certain ratio. A discontinuous contact portion 24 having a width dimension is provided in the vicinity of the winding end portion 23. That is, the discontinuous contact portion 24 is formed as a convex portion protruding in the center direction from the side portion of the contact piece 22a of the spiral contact 20A (inner peripheral convex structure).

  The width dimension W of the contact piece 22a of the spiral contactor 20 may be as described above. However, the present invention is not limited to this, and the width dimension W0 of the winding start end 22 and the winding end point are not limited thereto. The width dimension W1 of the part 23 may be formed with a constant width dimension (W0 = W1) as a whole. Furthermore, if it is possible to maintain the elastic strength in the Z direction, the spiral contact having the contact piece 22a formed as W0 <W1 as a whole is not excluded.

  As shown in FIG. 4B, when the lock portion 15 of the lid 12 is locked to the locked portion 14 of the base 11, the electronic component 1 is pressed downward by the pressing portion 12a. 1 a pushes down each spiral contact 20 </ b> A toward the inside of the recess 11 a (downward in the drawing). At the same time, the outer shape of the contact piece 22a is deformed so as to be expanded from the winding end portion 23 in the direction of the winding start end portion 22 (from the center of the spiral to the outer circumferential direction) so as to embrace the outer surface of the spherical contact 1a. The spherical contactors 1a and the contact pieces 22a of the spiral contactors 20A are electrically connected.

  That is, the spherical contacts 1 a and the spiral contacts 20 constitute a connection device that electrically connects the electronic component 1 and other electronic circuits on the printed circuit board 30.

  At this time, since the discontinuous contact portion 24 of the spiral contact 20A protrudes in the width direction, the corner of the tip of the discontinuous contact 24 is preferentially brought into contact with the surface of the spherical contact 1a. be able to. That is, the contact piece 22a of the spiral contact 20A and the spherical contact 1a are always electrically connected via the contact P between the corner of the tip of the discontinuous contact 24 and the surface of the spherical contact 1a. The distance between the winding start end portion 22 and the contact point P can be made constant. Therefore, since it becomes possible to suppress the fluctuation | variation of electrical characteristics, such as contact resistance which is easy to differ for every combination of the spiral contactor 20A and the spherical contactor 1a, each spiral contactor 20A and each spherical contactor 1a can be suppressed. The electrical connection between them can be stabilized.

  In this case, the size of the contact portion of the contact P is preferably 100 μm or less in diameter.

  The discontinuous contact portion 24 is preferably formed in the vicinity of the winding end portion 23, and more preferably within the last one turn as viewed from the winding end portion 23 of the spiral contact 20A. However, it is not excluded that the discontinuous contact portion 24 is formed on a portion other than the vicinity of the winding end portion 23, that is, on the peripheral side near the winding start end portion 22.

  Further, the left half of the spiral contact 20 including the winding start end 22 by a virtual line a2-a2 orthogonal to a virtual line a1-a1 connecting the winding start end 22 and the center O of the spiral contact 20A and passing through the center O. The region 20L and the right half region 20R not including the winding start end portion 22 are divided into two regions, the discontinuous contact portion 24 being formed in the right half region 20R not including the winding start end portion 22. Preferably it is. More preferably, the discontinuous contact portion 24 is formed at a position opposite to the winding start end portion 22 across the center O.

  Alternatively, as shown in FIG. 3, the left half region 20L including the winding start end 22 facing the discontinuous contact portion 24 via the center O or the winding start end 22 across the center O The width dimension of the normal contact piece 22a of the spiral contact 20A (based on the above equation 1) at a position on the contact piece 22a on the opposite side and on the outer peripheral side by a half turn from the discontinuous contact portion 24. It is preferable to form a narrow width region S having a width dimension smaller than the width dimension W formed at a certain ratio or the constant width dimension).

  As described above, the discontinuous contact portion 24 is placed in the right half region 20R not including the winding start end portion 22, or the discontinuous contact portion 24 is placed at a position opposite to the winding start end portion 22 or If the narrow-width region S is formed, when the spherical contact 1a comes into contact with the surface of the spiral contact 20A, the contact located first in the left half region 20L including the winding start end 22 as shown in FIG. 4B. The piece 22a, or the contact piece 22a located on the winding start end 22 side, or the narrow width region S is set to an inclined posture in which the inner peripheral side is inclined by being pushed down in the Z2 direction in the drawing from the outer peripheral side. At this time, a torsional moment M in the clockwise direction is applied to the contact piece 22a located in the left half region 20L, the contact piece 22a located on the winding start end 22 side, or the narrow-width region S. Since the same torsional moment M is generated in the counterclockwise direction in the figure also at the portion facing the center O with respect to them, the contact piece 22a having the discontinuous contact portion 24 is also the inner periphery in the same manner as described above. It can be set to an inclined posture with the side down.

  Therefore, as shown in FIG. 4B, the discontinuous contact portion 24 has a tip corner easily contacting the surface of the spherical contact 1 a, and the tip contact of the discontinuous contact portion 24 and the spherical contact. It is possible to form a contact P between the surface of the child 1a. Therefore, when the contact pressure between the contact piece 22a of the spiral contact 20A and the spherical contact 1a is small, that is, a large number of spherical contact portions provided in the electronic component 1 and a large number of spirals provided in the inspection socket 10. Even when a connection is made with the contact 20A, the individual spherical contacts 1a and the individual spiral contacts 20A come into contact with each other through the contacts P formed between them. The electrical connection between them can be stabilized.

The Embodiment of the above you facilities, ball contacts the socket side of the contacts for inspection; have been described with reference to (BGA Ball Grid Array), the present invention is not limited thereto, for example, LGA (Land Grid Array), or an ellipsoidal, conical or polygonal pyramidal contact.

The perspective view which shows the socket for a test | inspection used for the test for confirming operation | movement of an electronic component, FIG. 2 is a cross-sectional view taken along the line 2-2 of FIG. The top view which shows 1st Embodiment of a spiral contactor as the principal part of this invention, FIG. 4 is a cross-sectional view taken along the line aa in FIG. 3, showing a partially enlarged view between a spiral contact and a spherical contact, where A is a state before connection, B is a state after connection,

Explanation of symbols

1 Electronic component 1a Spherical contact (external connection terminal)
10 Inspection Socket 11 Base 11A Loading Area 11a Recess (Through Hole)
12 Lid 13 Hinge part 20, 20A Spiral contact 21 Base 22 Winding start end 22a Contact piece 23 Winding end 24 Discontinuous contact part ( convex part )
O Spiral contact center P Contact S Narrow area

Claims (6)

The connecting device which have a spiral contactor in direct contact with the spherical contacts mounted in the electronic component,
The contact piece has a spiral shape having a winding start end portion positioned on the outer peripheral side and a winding end portion positioned on the inner peripheral side of the winding start end portion and having a circumferential length of one or more rounds. It is formed with a constant width dimension over the winding end part, or is formed with a width dimension that changes corresponding to the length from the winding start end part,
Between the winding start end portion and the winding end portion of the contact piece, it protrudes from the winding start end portion toward the central portion surrounded by the contact piece for one turn and directly to the spherical contactor. The connecting device, wherein the contacting convex portions are integrally formed. The connecting device according to claim 1, wherein the convex portion has a corner portion facing the central portion . The connection device according to claim 1, wherein the convex portion is provided in the vicinity of the winding end portion of the contact piece. When the contact piece is divided into two regions, a region including the winding start end portion and a region not including the winding start end portion, the convex portion is provided in a region not including the winding start end portion. The connection device according to any one of 1 to 3. The connection device according to claim 4, wherein the convex portion is provided at a position opposite to the winding start end portion across the center of the spiral contact piece . The connection device according to any one of claims 1 to 5, wherein when the spherical contactor is installed on the contact piece, the convex portion contacts a surface of the spherical contactor .

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