JP4366972B2 - Epoxy resin molding material for sealing and electronic component device - Google Patents
Epoxy resin molding material for sealing and electronic component device Download PDFInfo
- Publication number
- JP4366972B2 JP4366972B2 JP2003094484A JP2003094484A JP4366972B2 JP 4366972 B2 JP4366972 B2 JP 4366972B2 JP 2003094484 A JP2003094484 A JP 2003094484A JP 2003094484 A JP2003094484 A JP 2003094484A JP 4366972 B2 JP4366972 B2 JP 4366972B2
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- JP
- Japan
- Prior art keywords
- group
- epoxy resin
- phenol
- resin
- carbon atoms
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 229920000647 polyepoxide Polymers 0.000 title claims description 176
- 239000003822 epoxy resin Substances 0.000 title claims description 174
- 239000012778 molding material Substances 0.000 title claims description 52
- 238000007789 sealing Methods 0.000 title claims description 51
- 125000004432 carbon atom Chemical group C* 0.000 claims description 58
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 50
- 239000005011 phenolic resin Substances 0.000 claims description 48
- 229920005989 resin Polymers 0.000 claims description 43
- 239000011347 resin Substances 0.000 claims description 43
- 150000002430 hydrocarbons Chemical group 0.000 claims description 38
- 125000000217 alkyl group Chemical group 0.000 claims description 33
- 239000003795 chemical substances by application Substances 0.000 claims description 32
- 125000003710 aryl alkyl group Chemical group 0.000 claims description 31
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 claims description 26
- 229920003986 novolac Polymers 0.000 claims description 21
- 150000001875 compounds Chemical class 0.000 claims description 20
- 125000002529 biphenylenyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3C12)* 0.000 claims description 16
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 claims description 16
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical compound C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 claims description 16
- 239000004593 Epoxy Substances 0.000 claims description 14
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 claims description 14
- HECLRDQVFMWTQS-RGOKHQFPSA-N 1755-01-7 Chemical compound C1[C@H]2[C@@H]3CC=C[C@@H]3[C@@H]1C=C2 HECLRDQVFMWTQS-RGOKHQFPSA-N 0.000 claims description 13
- 125000004429 atom Chemical group 0.000 claims description 11
- AAAQKTZKLRYKHR-UHFFFAOYSA-N triphenylmethane Chemical compound C1=CC=CC=C1C(C=1C=CC=CC=1)C1=CC=CC=C1 AAAQKTZKLRYKHR-UHFFFAOYSA-N 0.000 claims description 11
- PJANXHGTPQOBST-VAWYXSNFSA-N Stilbene Natural products C=1C=CC=CC=1/C=C/C1=CC=CC=C1 PJANXHGTPQOBST-VAWYXSNFSA-N 0.000 claims description 9
- PJANXHGTPQOBST-UHFFFAOYSA-N stilbene Chemical compound C=1C=CC=CC=1C=CC1=CC=CC=C1 PJANXHGTPQOBST-UHFFFAOYSA-N 0.000 claims description 9
- 235000021286 stilbenes Nutrition 0.000 claims description 9
- 239000004305 biphenyl Substances 0.000 claims description 8
- 235000010290 biphenyl Nutrition 0.000 claims description 8
- 239000011256 inorganic filler Substances 0.000 claims description 8
- 229910003475 inorganic filler Inorganic materials 0.000 claims description 8
- 125000000962 organic group Chemical group 0.000 claims description 8
- 125000004434 sulfur atom Chemical group 0.000 claims description 7
- 229910052717 sulfur Inorganic materials 0.000 claims description 6
- 125000004122 cyclic group Chemical group 0.000 claims description 2
- -1 silane compound Chemical class 0.000 description 70
- 238000002156 mixing Methods 0.000 description 26
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 25
- 229910000077 silane Inorganic materials 0.000 description 21
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 18
- AZQWKYJCGOJGHM-UHFFFAOYSA-N 1,4-benzoquinone Chemical compound O=C1C=CC(=O)C=C1 AZQWKYJCGOJGHM-UHFFFAOYSA-N 0.000 description 17
- 238000000034 method Methods 0.000 description 17
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 14
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 14
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 14
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 13
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 13
- 125000002947 alkylene group Chemical group 0.000 description 12
- 239000000126 substance Substances 0.000 description 12
- KJCVRFUGPWSIIH-UHFFFAOYSA-N 1-naphthol Chemical compound C1=CC=C2C(O)=CC=CC2=C1 KJCVRFUGPWSIIH-UHFFFAOYSA-N 0.000 description 11
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 11
- 229910000679 solder Inorganic materials 0.000 description 11
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 11
- 125000003118 aryl group Chemical group 0.000 description 9
- 150000002989 phenols Chemical class 0.000 description 9
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 8
- 238000010521 absorption reaction Methods 0.000 description 8
- 125000004054 acenaphthylenyl group Chemical group C1(=CC2=CC=CC3=CC=CC1=C23)* 0.000 description 8
- HXGDTGSAIMULJN-UHFFFAOYSA-N acetnaphthylene Natural products C1=CC(C=C2)=C3C2=CC=CC3=C1 HXGDTGSAIMULJN-UHFFFAOYSA-N 0.000 description 8
- 125000003342 alkenyl group Chemical group 0.000 description 8
- 125000003545 alkoxy group Chemical group 0.000 description 8
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 8
- 125000004369 butenyl group Chemical group C(=CCC)* 0.000 description 8
- QWVGKYWNOKOFNN-UHFFFAOYSA-N o-cresol Chemical compound CC1=CC=CC=C1O QWVGKYWNOKOFNN-UHFFFAOYSA-N 0.000 description 8
- 125000000843 phenylene group Chemical group C1(=C(C=CC=C1)*)* 0.000 description 8
- XYFCBTPGUUZFHI-UHFFFAOYSA-N phosphine group Chemical group P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 8
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 8
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 8
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 8
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 7
- 229910052782 aluminium Inorganic materials 0.000 description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 7
- 125000000732 arylene group Chemical group 0.000 description 7
- 239000000203 mixture Substances 0.000 description 7
- 238000000465 moulding Methods 0.000 description 7
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 6
- SMQUZDBALVYZAC-UHFFFAOYSA-N salicylaldehyde Chemical compound OC1=CC=CC=C1C=O SMQUZDBALVYZAC-UHFFFAOYSA-N 0.000 description 6
- 125000000547 substituted alkyl group Chemical group 0.000 description 6
- 238000012360 testing method Methods 0.000 description 6
- BRLQWZUYTZBJKN-UHFFFAOYSA-N Epichlorohydrin Chemical compound ClCC1CO1 BRLQWZUYTZBJKN-UHFFFAOYSA-N 0.000 description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 5
- 229910000831 Steel Inorganic materials 0.000 description 5
- 150000001450 anions Chemical class 0.000 description 5
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 5
- 238000004898 kneading Methods 0.000 description 5
- 238000002844 melting Methods 0.000 description 5
- 230000008018 melting Effects 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 150000004780 naphthols Chemical class 0.000 description 5
- 239000010959 steel Substances 0.000 description 5
- WYTZZXDRDKSJID-UHFFFAOYSA-N (3-aminopropyl)triethoxysilane Chemical compound CCO[Si](OCC)(OCC)CCCN WYTZZXDRDKSJID-UHFFFAOYSA-N 0.000 description 4
- FRASJONUBLZVQX-UHFFFAOYSA-N 1,4-naphthoquinone Chemical compound C1=CC=C2C(=O)C=CC(=O)C2=C1 FRASJONUBLZVQX-UHFFFAOYSA-N 0.000 description 4
- JWAZRIHNYRIHIV-UHFFFAOYSA-N 2-naphthol Chemical compound C1=CC=CC2=CC(O)=CC=C21 JWAZRIHNYRIHIV-UHFFFAOYSA-N 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 4
- ADCOVFLJGNWWNZ-UHFFFAOYSA-N antimony trioxide Chemical compound O=[Sb]O[Sb]=O ADCOVFLJGNWWNZ-UHFFFAOYSA-N 0.000 description 4
- HUMNYLRZRPPJDN-UHFFFAOYSA-N benzaldehyde Chemical compound O=CC1=CC=CC=C1 HUMNYLRZRPPJDN-UHFFFAOYSA-N 0.000 description 4
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- YCIMNLLNPGFGHC-UHFFFAOYSA-N catechol Chemical compound OC1=CC=CC=C1O YCIMNLLNPGFGHC-UHFFFAOYSA-N 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- KWIUHFFTVRNATP-UHFFFAOYSA-N glycine betaine Chemical compound C[N+](C)(C)CC([O-])=O KWIUHFFTVRNATP-UHFFFAOYSA-N 0.000 description 4
- 239000011777 magnesium Substances 0.000 description 4
- 125000004433 nitrogen atom Chemical group N* 0.000 description 4
- 125000004430 oxygen atom Chemical group O* 0.000 description 4
- 229920001568 phenolic resin Polymers 0.000 description 4
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 4
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 4
- 238000003786 synthesis reaction Methods 0.000 description 4
- 125000003396 thiol group Chemical group [H]S* 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- KWKAKUADMBZCLK-UHFFFAOYSA-N 1-octene Chemical group CCCCCCC=C KWKAKUADMBZCLK-UHFFFAOYSA-N 0.000 description 3
- RNFJDJUURJAICM-UHFFFAOYSA-N 2,2,4,4,6,6-hexaphenoxy-1,3,5-triaza-2$l^{5},4$l^{5},6$l^{5}-triphosphacyclohexa-1,3,5-triene Chemical compound N=1P(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP=1(OC=1C=CC=CC=1)OC1=CC=CC=C1 RNFJDJUURJAICM-UHFFFAOYSA-N 0.000 description 3
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 description 3
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 3
- 125000000094 2-phenylethyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])C([H])([H])* 0.000 description 3
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 3
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 3
- SJRJJKPEHAURKC-UHFFFAOYSA-N N-Methylmorpholine Chemical compound CN1CCOCC1 SJRJJKPEHAURKC-UHFFFAOYSA-N 0.000 description 3
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 3
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 3
- UMHKOAYRTRADAT-UHFFFAOYSA-N [hydroxy(octoxy)phosphoryl] octyl hydrogen phosphate Chemical compound CCCCCCCCOP(O)(=O)OP(O)(=O)OCCCCCCCC UMHKOAYRTRADAT-UHFFFAOYSA-N 0.000 description 3
- 125000004414 alkyl thio group Chemical group 0.000 description 3
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 125000004106 butoxy group Chemical group [*]OC([H])([H])C([H])([H])C(C([H])([H])[H])([H])[H] 0.000 description 3
- 229940125782 compound 2 Drugs 0.000 description 3
- 238000009833 condensation Methods 0.000 description 3
- 229920001577 copolymer Polymers 0.000 description 3
- 239000007822 coupling agent Substances 0.000 description 3
- 229930003836 cresol Natural products 0.000 description 3
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 3
- 125000000816 ethylene group Chemical group [H]C([H])([*:1])C([H])([H])[*:2] 0.000 description 3
- 239000003063 flame retardant Substances 0.000 description 3
- 239000005350 fused silica glass Substances 0.000 description 3
- 125000004836 hexamethylene group Chemical group [H]C([H])([*:2])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[*:1] 0.000 description 3
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 3
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 3
- 229910052742 iron Inorganic materials 0.000 description 3
- 229910052749 magnesium Inorganic materials 0.000 description 3
- VTHJTEIRLNZDEV-UHFFFAOYSA-L magnesium dihydroxide Chemical compound [OH-].[OH-].[Mg+2] VTHJTEIRLNZDEV-UHFFFAOYSA-L 0.000 description 3
- 239000000347 magnesium hydroxide Substances 0.000 description 3
- 229910001862 magnesium hydroxide Inorganic materials 0.000 description 3
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 description 3
- 125000001570 methylene group Chemical group [H]C([H])([*:1])[*:2] 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- 125000004817 pentamethylene group Chemical group [H]C([H])([*:2])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[*:1] 0.000 description 3
- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 3
- 229920000098 polyolefin Polymers 0.000 description 3
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 3
- 238000005476 soldering Methods 0.000 description 3
- 125000003698 tetramethyl group Chemical group [H]C([H])([H])* 0.000 description 3
- 125000000383 tetramethylene group Chemical group [H]C([H])([*:1])C([H])([H])C([H])([H])C([H])([H])[*:2] 0.000 description 3
- 125000003944 tolyl group Chemical group 0.000 description 3
- 229910052725 zinc Inorganic materials 0.000 description 3
- 239000011701 zinc Substances 0.000 description 3
- JYEUMXHLPRZUAT-UHFFFAOYSA-N 1,2,3-triazine Chemical compound C1=CN=NN=C1 JYEUMXHLPRZUAT-UHFFFAOYSA-N 0.000 description 2
- 229940005561 1,4-benzoquinone Drugs 0.000 description 2
- MODAACUAXYPNJH-UHFFFAOYSA-N 1-(methoxymethyl)-4-[4-(methoxymethyl)phenyl]benzene Chemical group C1=CC(COC)=CC=C1C1=CC=C(COC)C=C1 MODAACUAXYPNJH-UHFFFAOYSA-N 0.000 description 2
- BLBVJHVRECUXKP-UHFFFAOYSA-N 2,3-dimethoxy-1,4-dimethylbenzene Chemical group COC1=C(C)C=CC(C)=C1OC BLBVJHVRECUXKP-UHFFFAOYSA-N 0.000 description 2
- CDAWCLOXVUBKRW-UHFFFAOYSA-N 2-aminophenol Chemical compound NC1=CC=CC=C1O CDAWCLOXVUBKRW-UHFFFAOYSA-N 0.000 description 2
- QIRPHBPKRGXMJD-UHFFFAOYSA-N 4-[2-(3-tert-butyl-4-hydroxy-5-methylphenyl)ethenyl]-2,6-dimethylphenol Chemical compound CC1=C(O)C(C)=CC(C=CC=2C=C(C(O)=C(C)C=2)C(C)(C)C)=C1 QIRPHBPKRGXMJD-UHFFFAOYSA-N 0.000 description 2
- WTWMJYNGYCJIGR-UHFFFAOYSA-N 4-[2-(4-hydroxy-3,5-dimethylphenyl)ethenyl]-2,6-dimethylphenol Chemical compound CC1=C(O)C(C)=CC(C=CC=2C=C(C)C(O)=C(C)C=2)=C1 WTWMJYNGYCJIGR-UHFFFAOYSA-N 0.000 description 2
- IKHGUXGNUITLKF-UHFFFAOYSA-N Acetaldehyde Chemical compound CC=O IKHGUXGNUITLKF-UHFFFAOYSA-N 0.000 description 2
- LTPBRCUWZOMYOC-UHFFFAOYSA-N Beryllium oxide Chemical compound O=[Be] LTPBRCUWZOMYOC-UHFFFAOYSA-N 0.000 description 2
- 229930185605 Bisphenol Natural products 0.000 description 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical compound OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 description 2
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 description 2
- KFSLWBXXFJQRDL-UHFFFAOYSA-N Peracetic acid Chemical compound CC(=O)OO KFSLWBXXFJQRDL-UHFFFAOYSA-N 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 2
- NBBJYMSMWIIQGU-UHFFFAOYSA-N Propionic aldehyde Chemical compound CCC=O NBBJYMSMWIIQGU-UHFFFAOYSA-N 0.000 description 2
- SMWDFEZZVXVKRB-UHFFFAOYSA-N Quinoline Chemical compound N1=CC=CC2=CC=CC=C21 SMWDFEZZVXVKRB-UHFFFAOYSA-N 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 230000002378 acidificating effect Effects 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 239000002318 adhesion promoter Substances 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 125000003172 aldehyde group Chemical group 0.000 description 2
- RWZYAGGXGHYGMB-UHFFFAOYSA-N anthranilic acid Chemical compound NC1=CC=CC=C1C(O)=O RWZYAGGXGHYGMB-UHFFFAOYSA-N 0.000 description 2
- 229960003237 betaine Drugs 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 239000006229 carbon black Substances 0.000 description 2
- 239000004203 carnauba wax Substances 0.000 description 2
- 235000013869 carnauba wax Nutrition 0.000 description 2
- 239000003054 catalyst Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 229910017052 cobalt Inorganic materials 0.000 description 2
- 239000010941 cobalt Substances 0.000 description 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 2
- 229940125904 compound 1 Drugs 0.000 description 2
- 238000013329 compounding Methods 0.000 description 2
- 238000000748 compression moulding Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 150000007973 cyanuric acids Chemical class 0.000 description 2
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 2
- CRGRWBQSZSQVIE-UHFFFAOYSA-N diazomethylbenzene Chemical class [N-]=[N+]=CC1=CC=CC=C1 CRGRWBQSZSQVIE-UHFFFAOYSA-N 0.000 description 2
- 125000001664 diethylamino group Chemical group [H]C([H])([H])C([H])([H])N(*)C([H])([H])C([H])([H])[H] 0.000 description 2
- 125000002147 dimethylamino group Chemical group [H]C([H])([H])N(*)C([H])([H])[H] 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 125000003700 epoxy group Chemical group 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- LNTHITQWFMADLM-UHFFFAOYSA-N gallic acid Chemical compound OC(=O)C1=CC(O)=C(O)C(O)=C1 LNTHITQWFMADLM-UHFFFAOYSA-N 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000009477 glass transition Effects 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- ZFSLODLOARCGLH-UHFFFAOYSA-N isocyanuric acid Chemical compound OC1=NC(O)=NC(O)=N1 ZFSLODLOARCGLH-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 230000014759 maintenance of location Effects 0.000 description 2
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 2
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- 150000004692 metal hydroxides Chemical class 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical group C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- UJNZOIKQAUQOCN-UHFFFAOYSA-N methyl(diphenyl)phosphane Chemical compound C=1C=CC=CC=1P(C)C1=CC=CC=C1 UJNZOIKQAUQOCN-UHFFFAOYSA-N 0.000 description 1
- BFXIKLCIZHOAAZ-UHFFFAOYSA-N methyltrimethoxysilane Chemical compound CO[Si](C)(OC)OC BFXIKLCIZHOAAZ-UHFFFAOYSA-N 0.000 description 1
- 229910000476 molybdenum oxide Inorganic materials 0.000 description 1
- 235000013872 montan acid ester Nutrition 0.000 description 1
- PHQOGHDTIVQXHL-UHFFFAOYSA-N n'-(3-trimethoxysilylpropyl)ethane-1,2-diamine Chemical compound CO[Si](OC)(OC)CCCNCCN PHQOGHDTIVQXHL-UHFFFAOYSA-N 0.000 description 1
- 229940088644 n,n-dimethylacrylamide Drugs 0.000 description 1
- YLGYACDQVQQZSW-UHFFFAOYSA-N n,n-dimethylprop-2-enamide Chemical compound CN(C)C(=O)C=C YLGYACDQVQQZSW-UHFFFAOYSA-N 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004957 naphthylene group Chemical group 0.000 description 1
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 1
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 239000012860 organic pigment Substances 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- PQQKPALAQIIWST-UHFFFAOYSA-N oxomolybdenum Chemical compound [Mo]=O PQQKPALAQIIWST-UHFFFAOYSA-N 0.000 description 1
- NRNFFDZCBYOZJY-UHFFFAOYSA-N p-quinodimethane Chemical group C=C1C=CC(=C)C=C1 NRNFFDZCBYOZJY-UHFFFAOYSA-N 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 150000004965 peroxy acids Chemical class 0.000 description 1
- 125000000286 phenylethyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])C([H])([H])* 0.000 description 1
- 150000004714 phosphonium salts Chemical class 0.000 description 1
- 150000003014 phosphoric acid esters Chemical class 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 150000003018 phosphorus compounds Chemical class 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 229920000768 polyamine Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 238000011417 postcuring Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 125000004368 propenyl group Chemical group C(=CC)* 0.000 description 1
- 150000004053 quinones Chemical class 0.000 description 1
- 229920005604 random copolymer Polymers 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000011342 resin composition Substances 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 125000000467 secondary amino group Chemical group [H]N([*:1])[*:2] 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229920002545 silicone oil Polymers 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 239000004945 silicone rubber Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000008117 stearic acid Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- 125000001302 tertiary amino group Chemical group 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 150000003536 tetrazoles Chemical class 0.000 description 1
- 230000000930 thermomechanical effect Effects 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 150000004867 thiadiazoles Chemical class 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 125000005628 tolylene group Chemical group 0.000 description 1
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003852 triazoles Chemical class 0.000 description 1
- GQIUQDDJKHLHTB-UHFFFAOYSA-N trichloro(ethenyl)silane Chemical compound Cl[Si](Cl)(Cl)C=C GQIUQDDJKHLHTB-UHFFFAOYSA-N 0.000 description 1
- CPUDPFPXCZDNGI-UHFFFAOYSA-N triethoxy(methyl)silane Chemical compound CCO[Si](C)(OCC)OCC CPUDPFPXCZDNGI-UHFFFAOYSA-N 0.000 description 1
- JCVQKRGIASEUKR-UHFFFAOYSA-N triethoxy(phenyl)silane Chemical compound CCO[Si](OCC)(OCC)C1=CC=CC=C1 JCVQKRGIASEUKR-UHFFFAOYSA-N 0.000 description 1
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 1
- IDXDWPWXHTXJMZ-UHFFFAOYSA-N tris(2,4,6-trimethylphenyl)phosphane Chemical compound CC1=CC(C)=CC(C)=C1P(C=1C(=CC(C)=CC=1C)C)C1=C(C)C=C(C)C=C1C IDXDWPWXHTXJMZ-UHFFFAOYSA-N 0.000 description 1
- XDHRVAHAGMMFMC-UHFFFAOYSA-N tris(2,4-dimethylphenyl)phosphane Chemical compound CC1=CC(C)=CC=C1P(C=1C(=CC(C)=CC=1)C)C1=CC=C(C)C=C1C XDHRVAHAGMMFMC-UHFFFAOYSA-N 0.000 description 1
- RERMPCBBVZEPBS-UHFFFAOYSA-N tris(2,6-dimethylphenyl)phosphane Chemical compound CC1=CC=CC(C)=C1P(C=1C(=CC=CC=1C)C)C1=C(C)C=CC=C1C RERMPCBBVZEPBS-UHFFFAOYSA-N 0.000 description 1
- CKKFLUXMIUUGAW-UHFFFAOYSA-N tris(2-propan-2-ylphenyl)phosphane Chemical compound CC(C)C1=CC=CC=C1P(C=1C(=CC=CC=1)C(C)C)C1=CC=CC=C1C(C)C CKKFLUXMIUUGAW-UHFFFAOYSA-N 0.000 description 1
- GDKAFTKCUOBEDW-UHFFFAOYSA-N tris(2-tert-butylphenyl)phosphane Chemical compound CC(C)(C)C1=CC=CC=C1P(C=1C(=CC=CC=1)C(C)(C)C)C1=CC=CC=C1C(C)(C)C GDKAFTKCUOBEDW-UHFFFAOYSA-N 0.000 description 1
- RYXYUARTMQUYKV-UHFFFAOYSA-N tris(4-butylphenyl)phosphane Chemical compound C1=CC(CCCC)=CC=C1P(C=1C=CC(CCCC)=CC=1)C1=CC=C(CCCC)C=C1 RYXYUARTMQUYKV-UHFFFAOYSA-N 0.000 description 1
- SPNVODOGUAUMCA-UHFFFAOYSA-N tris(4-ethoxy-2,6-dimethylphenyl)phosphane Chemical compound CC1=CC(OCC)=CC(C)=C1P(C=1C(=CC(OCC)=CC=1C)C)C1=C(C)C=C(OCC)C=C1C SPNVODOGUAUMCA-UHFFFAOYSA-N 0.000 description 1
- LQEKTSMTEYLBLJ-UHFFFAOYSA-N tris(4-ethoxyphenyl)phosphane Chemical compound C1=CC(OCC)=CC=C1P(C=1C=CC(OCC)=CC=1)C1=CC=C(OCC)C=C1 LQEKTSMTEYLBLJ-UHFFFAOYSA-N 0.000 description 1
- PCCAGZSOGFNURV-UHFFFAOYSA-N tris(4-ethylphenyl)phosphane Chemical compound C1=CC(CC)=CC=C1P(C=1C=CC(CC)=CC=1)C1=CC=C(CC)C=C1 PCCAGZSOGFNURV-UHFFFAOYSA-N 0.000 description 1
- UYUUAUOYLFIRJG-UHFFFAOYSA-N tris(4-methoxyphenyl)phosphane Chemical compound C1=CC(OC)=CC=C1P(C=1C=CC(OC)=CC=1)C1=CC=C(OC)C=C1 UYUUAUOYLFIRJG-UHFFFAOYSA-N 0.000 description 1
- JTOQWGJGVSYTTN-UHFFFAOYSA-N tris(4-propylphenyl)phosphane Chemical compound C1=CC(CCC)=CC=C1P(C=1C=CC(CCC)=CC=1)C1=CC=C(CCC)C=C1 JTOQWGJGVSYTTN-UHFFFAOYSA-N 0.000 description 1
- 239000005050 vinyl trichlorosilane Substances 0.000 description 1
- 150000003739 xylenols Chemical class 0.000 description 1
- 125000005023 xylyl group Chemical group 0.000 description 1
- 125000006839 xylylene group Chemical group 0.000 description 1
- XAEWLETZEZXLHR-UHFFFAOYSA-N zinc;dioxido(dioxo)molybdenum Chemical compound [Zn+2].[O-][Mo]([O-])(=O)=O XAEWLETZEZXLHR-UHFFFAOYSA-N 0.000 description 1
- BNEMLSQAJOPTGK-UHFFFAOYSA-N zinc;dioxido(oxo)tin Chemical compound [Zn+2].[O-][Sn]([O-])=O BNEMLSQAJOPTGK-UHFFFAOYSA-N 0.000 description 1
- 229910052845 zircon Inorganic materials 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
- 150000003755 zirconium compounds Chemical class 0.000 description 1
- GFQYVLUOOAAOGM-UHFFFAOYSA-N zirconium(iv) silicate Chemical compound [Zr+4].[O-][Si]([O-])([O-])[O-] GFQYVLUOOAAOGM-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Compositions Of Macromolecular Compounds (AREA)
- Epoxy Resins (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Description
【0001】
【発明の属する技術分野】
本発明は、信頼性に優れた封止用エポキシ樹脂成形材料、及びこの成形材料で封止した素子を備えた電子部品装置に関する。
【0002】
【従来の技術】
従来から、トランジスタ、IC等の電子部品封止の分野ではエポキシ樹脂成形材料が広く用いられている。この理由としては、エポキシ樹脂が電気特性、耐湿性、耐熱性、機械特性、インサート品との接着性等のバランスがとれているためである。特に、オルソクレゾールノボラック型エポキシ樹脂とノボラック型フェノール硬化剤の組合せはこれらのバランスに優れており、封止用成形材料のベース樹脂の主流になっている。
近年の電子機器の小型化、軽量化、高性能化に伴い、実装の高密度化が進み、電子部品装置は従来のピン挿入型から、表面実装型のパッケージがなされるようになってきている。半導体装置を配線板に取り付ける場合、従来のピン挿入型パッケージはピンを配線板に挿入した後、配線板裏面から半田付けを行うため、パッケージが直接高温にさらされることはなかった。しかし、表面実装型パッケージでは半導体装置全体が半田バスやリフロー装置などで処理されるため、直接半田付け温度にさらされる。この結果、パッケージが吸湿した場合、半田付け時に吸湿水分が急激に膨張し、接着界面の剥離やパッケージクラックが発生し、実装時のパッケージの信頼性を低下させるという問題があった。
【0003】
上記の問題を解決するために封止用エポキシ樹脂成形材料とリードフレームとの密着性を高め、耐リフロー性を向上させる方法として、たとえば、シラン化合物としてアミン系シラン化合物を添加する方法が提案されている(特許文献1及び2参照。)。しかし、この方法では耐半田リフロー性及び接着性の改善には充分な効果が得られていない他、流動性の低下を引き起こしてしまう問題があった。また、封止用エポキシ樹脂成形材料の流動性が低いと成形時に金線流れ、ボイド、ピンホール等の発生といった新たな問題も生じてしまう(非特許文献1参照。)。
また、ICの防湿梱包や、配線板へ実装する前に予めICを十分乾燥して使用するなどの方法もとられているが、これらの方法は手間がかかり、コストも高くなる(非特許文献2参照。)。
【0004】
【特許文献1】
特開平11−147939号公報
【特許文献2】
特開2001−213939号公報
【非特許文献1】
(株)技術情報協会編「半導体封止樹脂の高信頼性化」技術情報協会1990年1月31日、172−176頁
【非特許文献2】
(株)日立製作所半導体事業部編「表面実装形LSIパッケージの実装技術とその信頼性向上」応用技術出版1988年11月16日、254−256頁
【0005】
【発明が解決しようとする課題】
本発明はかかる状況に鑑みなされたもので、硬化性を低下させることなく流動性、接着性、耐半田リフロー性に優れる封止用エポキシ樹脂成形材料、及びこれにより封止した素子を備えた電子部品装置を提供しようとするものである。
【0006】
【課題を解決するための手段】
発明者らは、上記の課題を解決するために鋭意検討を重ねた結果、封止用エポキシ樹脂成形材料に特定の構造を有するシラン化合物を配合することにより、上記の目的を達成しうることを見い出し、本発明を完成するに至った。
【0007】
すなわち、本発明は、
(1)(A)エポキシ樹脂、(B)硬化剤、(C)骨格中に2級アミノ基と3級アミノ基を含有するシラン化合物及び(D)無機充填剤を含有する封止用エポキシ樹脂成形材料。
(2)(C)成分が、骨格中にカルボニル基をさらに含有するシラン化合物を含有する上記1記載の封止用エポキシ樹脂成形材料。
(3)(C)成分が下記一般式(I)で示される化合物を含有する上記1又は上記2記載の封止用エポキシ樹脂成形材料。
【0008】
【化2】
(ここで、R1、R2は置換又は非置換の炭素数1〜18の炭化水素基を示し、R1、R2が結合して環状となっていても良く、二価又は三価の原子を介して結合されていても良い。R3は置換又は非置換の炭素数1〜10の炭化水素基及び二価又は三価の原子を介して結合された有機基。R4は置換又は非置換の炭素数1〜10の炭化水素基及び二価又は三価の原子を介して結合された有機基、R5は炭素数1〜10の炭化水素基、R6は炭素数1〜6の炭化水素基、R7は水素原子又は炭素数1〜6の炭化水素基を示し、mは0又は1を示し、nは1〜3の整数を示す。)
(4)(A)エポキシ樹脂がビフェニル型エポキシ樹脂、スチルベン型エポキシ樹脂、硫黄原子含有エポキシ樹脂、ノボラック型エポキシ樹脂、ジシクロペンタジエン型エポキシ樹脂、ナフタレン型エポキシ樹脂、トリフェニルメタン型エポキシ樹脂、ビスフェノールF型エポキシ樹脂及びビフェニレン骨格含有フェノール・アラルキル型エポキシ樹脂の少なくとも1種を含有する上記1〜3のいずれかに記載の封止用エポキシ樹脂成形材料。
(5)(B)硬化剤がビフェニレン骨格含有フェノール・アラルキル樹脂、フェノール・アラルキル樹脂、ナフトール・アラルキル樹脂、ジシクロペンタジエン型フェノール樹脂、トリフェニルメタン型フェノール樹脂、ノボラック型フェノール樹脂及び共重合型フェノール・アラルキル樹脂の少なくとも1種を含有する上記1〜4のいずれかに記載の封止用エポキシ樹脂成形材料。
(6)上記1〜5のいずれかに記載の封止用エポキシ樹脂成形材料により封止された素子を備える電子部品装置に関する。
【0009】
【発明の実施の形態】
本発明において用いられる(A)エポキシ樹脂は、封止用エポキシ樹脂成形材料に一般に使用されているもので特に制限はないが、たとえば、フェノールノボラック型エポキシ樹脂、オルソクレゾールノボラック型エポキシ樹脂、トリフェニルメタン骨格を有するエポキシ樹脂をはじめとするフェノール、クレゾール、キシレノール、レゾルシン、カテコール、ビスフェノールA、ビスフェノールF等のフェノール類及び/又はα−ナフトール、β−ナフトール、ジヒドロキシナフタレン等のナフトール類とホルムアルデヒド、アセトアルデヒド、プロピオンアルデヒド、ベンズアルデヒド、サリチルアルデヒド等のアルデヒド基を有する化合物とを酸性触媒下で縮合又は共縮合させて得られるノボラック樹脂をエポキシ化したもの、ビスフェノールA、ビスフェノールF、ビスフェノールS、アルキル置換又は非置換のビフェノール等のジグリシジルエーテル、スチルベン型エポキシ樹脂、ハイドロキノン型エポキシ樹脂、フタル酸、ダイマー酸等の多塩基酸とエピクロルヒドリンの反応により得られるグリシジルエステル型エポキシ樹脂、ジアミノジフェニルメタン、イソシアヌル酸等のポリアミンとエピクロルヒドリンの反応により得られるグリシジルアミン型エポキシ樹脂、ジシクロペンタジエンとフェノ−ル類の共縮合樹脂のエポキシ化物、ナフタレン環を有するエポキシ樹脂、フェノール類及び/又はナフトール類とジメトキシパラキシレン又はビス(メトキシメチル)ビフェニルから合成されるアラルキル型フェノール樹脂、ナフトール・アラルキル樹脂等のアラルキル型フェノール樹脂のエポキシ化物、トリメチロールプロパン型エポキシ樹脂、テルペン変性エポキシ樹脂、オレフィン結合を過酢酸等の過酸で酸化して得られる線状脂肪族エポキシ樹脂、脂環族エポキシ樹脂、硫黄原子含有エポキシ樹脂などが挙げられ、これらを単独で用いても2種以上を組合わせて用いてもよい。
【0010】
なかでも、耐半田リフロー性の観点からはビフェニル型エポキシ樹脂、スチルベン型エポキシ樹脂、硫黄原子含有エポキシ樹脂、ビスフェノールF型エポキシ樹脂が好ましく、硬化性の観点からはノボラック型エポキシ樹脂が好ましく、低吸湿性の観点からはジシクロペンタジエン型エポキシ樹脂が好ましく、耐熱性及び低反り性の観点からはナフタレン型エポキシ樹脂及びトリフェニルメタン型エポキシ樹脂が好ましく、難燃性の観点からはビフェニレン骨格含有フェノール・アラルキル型エポキシ樹脂が好ましく、これらのエポキシ樹脂の少なくとも1種を含有していることが好ましい。
【0011】
ビフェニル型エポキシ樹脂としてはたとえば下記一般式(II)で示されるエポキシ樹脂等が挙げられ、スチルベン型エポキシ樹脂としてはたとえば下記一般式(III)で示されるエポキシ樹脂等が挙げられ、硫黄原子含有エポキシ樹脂としてはたとえば下記一般式(IV)で示されるエポキシ樹脂等が挙げられ、ビスフェノールF型エポキシ樹脂としてはたとえば下記一般式(V)が挙げられる。
【0012】
【化3】
(ここで、R1〜R8は水素原子及び炭素数1〜10の置換又は非置換の一価の炭化水素基から選ばれ、これらは全てが同一でも異なっていてもよい。nは0〜3の整数を示す。)
【0013】
【化4】
(ここで、R1〜R8は水素原子及び炭素数1〜10の置換又は非置換の一価の炭化水素基から選ばれ、これらは全てが同一でも異なっていてもよい。nは0〜3の整数を示す。)
【0014】
【化5】
(ここで、R1〜R8は水素原子、置換又は非置換の炭素数1〜10の一価の炭化水素基から選ばれ、これらは全てが同一でも異なっていてもよい。nは0〜3の整数を示す。)
【0015】
【化6】
(ここで、R1〜R8は水素原子及び炭素数1〜10の置換又は非置換の一価の炭化水素基から選ばれ、これらは全てが同一でも異なっていてもよい。nは0〜3の整数を示す。)
【0016】
上記一般式(II)で示されるビフェニル型エポキシ樹脂としては、たとえば、4,4’−ビス(2,3−エポキシプロポキシ)ビフェニル又は4,4’−ビス(2,3−エポキシプロポキシ)−3,3’,5,5’−テトラメチルビフェニルを主成分とするエポキシ樹脂、エピクロルヒドリンと4,4’−ビフェノール又は4,4’−(3,3’,5,5’−テトラメチル)ビフェノールとを反応させて得られるエポキシ樹脂等が挙げられる。なかでも4,4’−ビス(2,3−エポキシプロポキシ)−3,3’,5,5’−テトラメチルビフェニルを主成分とするエポキシ樹脂が好ましい。
上記一般式(III)で示されるスチルベン型エポキシ樹脂は、原料であるスチルベン系フェノール類とエピクロルヒドリンとを塩基性物質存在下で反応させて得ることができる。この原料であるスチルベン系フェノール類としては、たとえば3−t−ブチル−4,4’−ジヒドロキシ−3’,5,5’−トリメチルスチルベン、3−t−ブチル−4,4’−ジヒドロキシ−3’,5’,6−トリメチルスチルベン、4,4’−ジヒドロキシ−3,3’,5,5’−テトラメチルスチルベン、4,4’−ジヒドロキシ−3,3’−ジ−t−ブチル−5,5’−ジメチルスチルベン、4,4’−ジヒドロキシ−3,3’−ジ−t−ブチル−6,6’−ジメチルスチルベン等が挙げられ、なかでも3−t−ブチル−4,4’−ジヒドロキシ−3’,5,5’−トリメチルスチルベン、及び4,4’−ジヒドロキシ−3,3’,5,5’−テトラメチルスチルベンが好ましい。これらのスチルベン型フェノール類は単独で用いても2種以上を組合わせて用いてもよい。
【0017】
上記一般式(IV)で示される硫黄原子含有エポキシ樹脂のなかでも、R1〜R8が水素原子、置換又は非置換の炭素数1〜10のアルキル基及び置換又は非置換の炭素数1〜10のアルコキシ基から選ばれるエポキシ樹脂が好ましく、R1、R4、R5及びR8が水素原子で、R2、R3、R6及びR7がアルキル基であるエポキシ樹脂がより好ましく、R1、R4、R5及びR8が水素原子で、R2及びR7がメチル基で、R3及びR6がt−ブチル基であるエポキシ樹脂がさらに好ましい。このような化合物としては、YSLV−120TE(新日鐵化学社製)等が市販品として入手可能である。
上記一般式(V)で示されるビスフェノールF型エポキシ樹脂はとしては、例えば、R1、R3、R6及びR8がメチル基で、R2、R4、R5及びR7が水素原子であり、n=0を主成分とするYSLV−80XY(新日鉄化学株式会社製商品名)が市販品として入手可能である。
これらのエポキシ樹脂はいずれか1種を単独で用いても2種以上を組合わせて用いてもよいが、その配合量は、その性能を発揮するためにエポキシ樹脂全量に対して合わせて20重量%以上とすることが好ましく、30重量%以上がより好ましく、50重量%以上とすることがさらに好ましい。
【0018】
ノボラック型エポキシ樹脂としては、たとえば下記一般式(VI)で示されるエポキシ樹脂等が挙げられる。
【0019】
【化7】
(ここで、Rは水素原子及び炭素数1〜10の置換又は非置換の一価の炭化水素基から選ばれ、nは0〜10の整数を示す。)
上記一般式(VI)で示されるノボラック型エポキシ樹脂は、ノボラック型フェノール樹脂にエピクロルヒドリンを反応させることによって容易に得られる。なかでも、上記一般式(VI)中のRとしては、メチル基、エチル基、プロピル基、ブチル基、イソプロピル基、イソブチル基等の炭素数1〜10のアルキル基、メトキシ基、エトキシ基、プロポキシ基、ブトキシ基等の炭素数1〜10のアルコキシル基が好ましく、水素原子又はメチル基がより好ましい。nは0〜3の整数が好ましい。上記一般式(VI)で示されるノボラック型エポキシ樹脂のなかでも、オルソクレゾールノボラック型エポキシ樹脂が好ましい。
ノボラック型エポキシ樹脂を使用する場合、その配合量は、その性能を発揮するためにエポキシ樹脂全量に対して20重量%以上とすることが好ましく、30重量%以上がより好ましい。
【0020】
ジシクロペンタジエン型エポキシ樹脂としては、たとえば下記一般式(VII)で示されるエポキシ樹脂等が挙げられる。
【0021】
【化8】
(ここで、R1及びR2は水素原子及び炭素数1〜10の置換又は非置換の一価の炭化水素基からそれぞれ独立して選ばれ、nは0〜10の整数を示し、mは0〜6の整数を示す。)
上記式(VII)中のR1としては、たとえば、水素原子、メチル基、エチル基、プロピル基、ブチル基、イソプロピル基、t−ブチル基等のアルキル基、ビニル基、アリル基、ブテニル基等のアルケニル基、ハロゲン化アルキル基、アミノ基置換アルキル基、メルカプト基置換アルキル基などの炭素数1〜10の置換又は非置換の一価の炭化水素基が挙げられ、なかでもメチル基、エチル基等のアルキル基及び水素原子が好ましく、メチル基及び水素原子がより好ましい。R2としては、たとえば、水素原子、メチル基、エチル基、プロピル基、ブチル基、イソプロピル基、t−ブチル基等のアルキル基、ビニル基、アリル基、ブテニル基等のアルケニル基、ハロゲン化アルキル基、アミノ基置換アルキル基、メルカプト基置換アルキル基などの炭素数1〜10の置換又は非置換の一価の炭化水素基が挙げられ、なかでも水素原子が好ましい。
ジシクロペンタジエン型エポキシ樹脂を使用する場合、その配合量は、その性能を発揮するためにエポキシ樹脂全量に対して20重量%以上とすることが好ましく、30重量%以上がより好ましい。
【0022】
ナフタレン型エポキシ樹脂としてはたとえば下記一般式(VIII)で示されるエポキシ樹脂等が挙げられ、トリフェニルメタン型エポキシ樹脂としてはたとえば下記一般式(IX)で示されるエポキシ樹脂等が挙げられる。
下記一般式(VIII)で示されるナフタレン型エポキシ樹脂としては、m個の構成単位及びn個の構成単位をランダムに含むランダム共重合体、交互に含む交互共重合体、規則的に含む共重合体、ブロック状に含むブロック共重合体が挙げられ、これらのいずれか1種を単独で用いても、2種以上を組合わせて用いてもよい。また、下記一般式(IX)で示されるトリフェニルメタン型エポキシ樹脂としては特に制限はないが、サリチルアルデヒド型エポキシ樹脂が好ましい。
【0023】
【化9】
(ここで、R1〜R3は水素原子及び置換又は非置換の炭素数1〜12の一価の炭化水素基から選ばれ、これらは全てが同一でも異なっていてもよい。pは1又は0で、m、nはそれぞれ0〜11の整数であって、(m+n)が1〜11の整数でかつ(m+p)が1〜12の整数となるよう選ばれる。iは0〜3の整数、jは0〜2の整数、kは0〜4の整数を示す。)
【0024】
【化10】
(ここで、Rは水素原子及び炭素数1〜10の置換又は非置換の一価の炭化水素基から選ばれ、nは1〜10の整数を示す。)
これらのエポキシ樹脂はいずれか1種を単独で用いても両者を組合わせて用いてもよいが、その配合量は、その性能を発揮するためにエポキシ樹脂全量に対して合わせて20重量%以上とすることが好ましく、30重量%以上がより好ましく、50重量%以上とすることがさらに好ましい。
【0025】
ビフェニレン骨格含有フェノール・アラルキル型エポキシ樹脂としては下記一般式(XI)で示されるエポキシ樹脂が挙げられ、難燃性及び耐リフロー性の観点からは下記一般式(X)のR1〜R8が水素原子である樹脂を含有していることが好ましく、このような化合物としては、NC−3000(日本化薬社製)等が市販品として入手可能である。
また難燃性及び耐リフロー性及び流動性の両立の観点からは上記一般式(III)で示されるエポキシ樹脂及び下記一般式(X)で示されるエポキシ樹脂を含有していることが好ましく、なかでも下記一般式(X)のR1〜R8が水素原子で上記一般式(III)のR1〜R8が水素原子でn=0であることがより好ましい。また特にその配合重量比は、(III)/(X)=50/50〜5/95であることが好ましく、40/60〜10/90がより好ましく、30/70〜15/85がさらに好ましい。このような配合重量比を満足する化合物としては、CER−3000L(日本化薬社製)等が市販品として入手可能である。
【0026】
【化11】
(ここで、R1〜R9は水素原子、置換又は非置換の炭素数1〜10のアルキル基、炭素数1〜10のアルコキシ基、炭素数6〜10のアリール基及び炭素数6〜10のアラルキル基から選ばれ、全てが同一でも異なっていてもよい。iは0〜3の整数を示し、nは0〜10の整数を示す。)
【0027】
上記のビフェニル型エポキシ樹脂、スチルベン型エポキシ樹脂、硫黄原子含有エポキシ樹脂、ビスフェノールF型エポキシ樹脂、ノボラック型エポキシ樹脂、ジシクロペンタジエン型エポキシ樹脂、ナフタレン型エポキシ樹脂、トリフェニルメタン型エポキシ樹脂及びビフェニレン骨格含有フェノール・アラルキル型エポキシ樹脂は、いずれか1種を単独で用いても2種以上を組合わせて用いてもよいが、その配合量はエポキシ樹脂全量に対して合わせて50重量%以上とすることが好ましく、60重量%以上がより好ましく、80重量%以上がさらに好ましい。
【0028】
本発明において用いられる(B)硬化剤は、封止用エポキシ樹脂成形材料に一般に使用されているもので特に制限はないが、たとえば、フェノール、クレゾール、レゾルシン、カテコール、ビスフェノールA、ビスフェノールF、フェニルフェノール、アミノフェノール等のフェノール類及び/又はα−ナフトール、β−ナフトール、ジヒドロキシナフタレン等のナフトール類とホルムアルデヒド、ベンズアルデヒド、サリチルアルデヒド等のアルデヒド基を有する化合物とを酸性触媒下で縮合又は共縮合させて得られるノボラック型フェノール樹脂、フェノール類及び/又はナフトール類とジメトキシパラキシレン又はビス(メトキシメチル)ビフェニルから合成されるフェノール・アラルキル樹脂、ナフトール・アラルキル樹脂等のアラルキル型フェノール樹脂、フェノール・ノボラック構造とフェノール・アラルキル構造がランダム、ブロック又は交互に繰り返された共重合型フェノール・アラルキル樹脂、パラキシリレン及び/又はメタキシリレン変性フェノール樹脂、メラミン変性フェノール樹脂、テルペン変性フェノール樹脂、ジシクロペンタジエン変性フェノール樹脂、シクロペンタジエン変性フェノール樹脂、多環芳香環変性フェノール樹脂などが挙げられ、これらを単独で用いても2種以上を組合わせて用いてもよい。
なかでも、難燃性の観点からはビフェニレン骨格含有フェノール・アラルキル樹脂及び共重合型フェノール・アラルキル樹脂が好ましく、耐半田リフロー性及び硬化性の観点からはフェノール・アラルキル樹脂及びナフトール・アラルキル樹脂が好ましく、低吸湿性の観点からはジシクロペンタジエン型フェノール樹脂が好ましく、耐熱性、低膨張率及び低そり性の観点からはトリフェニルメタン型フェノール樹脂が好ましく、硬化性の観点からはノボラック型フェノール樹脂が好ましく、これらのフェノール樹脂の少なくとも1種を含有していることが好ましい。
【0029】
ビフェニレン骨格含有フェノール・アラルキル樹脂としては、たとえば下記一般式(XI)で示されるフェノール樹脂が挙げられる。
【0030】
【化12】
(ここで、R1〜R9は水素原子、置換又は非置換の炭素数1〜10のアルキル基、炭素数1〜10のアルコキシ基、炭素数6〜10のアリール基及び炭素数6〜10のアラルキル基から選ばれ、全てが同一でも異なっていてもよい。nは0〜10の整数を示す。)
上記式(XI)中のR1〜R9としては、水素原子、メチル基、エチル基、プロピル基、ブチル基、イソプロピル基、イソブチル基等の炭素数1〜10のアルキル基、メトキシ基、エトキシ基、プロポキシ基、ブトキシ基等の炭素数1〜10のアルコキシ基、フェニル基、トリル基、キシリル基等の炭素数6〜10のアリール基及びベンジル基、フェネチル基等の炭素数6〜10のアラルキル基から選ばれ、なかでも水素原子とメチル基が好ましい。nは0〜10の整数を示す。上記一般式(XI)で示されるビフェニレン骨格含有フェノール・アラルキル樹脂としては、たとえばR1〜R9が全て水素原子である化合物等が挙げられ、なかでも溶融粘度の観点から、nが1以上の縮合体を50重量%以上含む縮合体の混合物が好ましい。
ビフェニレン骨格含有フェノール・アラルキル樹脂を使用する場合、その配合量はその性能を発揮するために硬化剤全量に対して30重量%以上とすることが好ましく、50重量%以上がより好ましく、60重量%以上がさらに好ましい。
【0031】
フェノール・アラルキル樹脂としては、たとえば下記一般式(XII)で示されるフェノール・アラルキル樹脂等が挙げられる。
【0032】
【化13】
(ここで、Rは水素原子及び置換又は非置換の炭素数1〜10の一価の炭化水素基から選ばれ、nは0〜10の整数を示す。)
上記式(XII)中のRとしては、たとえば、水素原子、メチル基、エチル基、プロピル基、ブチル基、イソプロピル基、t−ブチル基等のアルキル基、ビニル基、アリル基、ブテニル基等のアルケニル基、ハロゲン化アルキル基、アミノ基置換アルキル基、メルカプト基置換アルキル基などの炭素数1〜10の置換又は非置換の一価の炭化水素基が挙げられ、なかでも、Rが水素原子で、nの平均値が0〜8であるフェノール・アラルキル樹脂が好ましく、具体例としては、p−キシリレン型ザイロック、m−キシリレン型ザイロック等が挙げられる。このフェノール・アラルキル樹脂を用いる場合、その配合量はその性能を発揮するために硬化剤全量に対して30重量%以上とすることが好ましく、50重量%以上がより好ましく、60重量%以上がさらに好ましい。
【0033】
ナフトール・アラルキル樹脂としては、たとえば下記一般式(XIII)で示されるナフトール・アラルキル樹脂等が挙げられる。
【0034】
【化14】
(ここで、R1〜R3は全てが同一でも異なっていてもよく、水素原子及び炭素数1〜6のアルキル基を示す。nは0〜10の整数、jは0〜2の整数、kは0〜4の整数、rは0〜4の整数を示す。)
上記式(XIII)中のR1〜R3としてはたとえば水素原子、メチル基、エチル基、プロピル基、ブチル基、ペンチル基、ヘキシル基、イソプロピル基、イソブチル基等の炭素数1〜6のアルキル基から選ばれ、なかでもR1〜R3水素原子で1分子中の平均nが0〜4の範囲に設定されることが好ましい。
ナフトール・アラルキル樹脂を用いる場合、その配合量はその性能を発揮するために硬化剤全量に対して30重量%以上とすることが好ましく、50重量%以上がより好ましい。
【0035】
上記一般式(XII)で示されるフェノール・アラルキル樹脂及び上記一般式(XIII)で示されるナフトール・アラルキル樹脂は、難燃性の観点からその一部又は全部がアセナフチレンと予備混合されていてもよい。アセナフチレンはアセナフテンを脱水素して得ることができるが、市販品を用いてもよい。また、アセナフチレンの重合物又はアセナフチレンと他の芳香族オレフィンとの重合物として用いることもできる。(B)硬化剤の一部又は全部とアセナフチレンとの予備混合の方法としては、(B)硬化剤及びアセナフチレンをそれぞれ微細に粉砕し固体状態のままミキサー等で混合する方法、両成分を溶解する溶媒に均一に溶解させた後溶媒を除去する方法、(B)硬化剤及び/又はアセナフチレンの軟化点以上の温度で両者を溶融混合する方法等で行うことができるが、均一な混合物が得られて不純物の混入が少ない溶融混合法が好ましい。その際、混合中にアセナフチレンが重合もしくは(B)硬化剤と反応しても構わない。
【0036】
ジシクロペンタジエン型フェノール樹脂としては、たとえば下記一般式(XIV)で示されるフェノール樹脂等が挙げられる。
【0037】
【化15】
(ここで、R1及びR2は水素原子、置換又は非置換の炭素数1〜10の一価の炭化水素基からそれぞれ独立して選ばれ、nは0〜10の整数を示し、mは0〜6の整数を示す。)
上記式(XIV)中のR1としては、たとえば、水素原子、メチル基、エチル基、プロピル基、ブチル基、イソプロピル基、t−ブチル基等のアルキル基、ビニル基、アリル基、ブテニル基等のアルケニル基、ハロゲン化アルキル基、アミノ基置換アルキル基、メルカプト基置換アルキル基などの炭素数1〜10の置換又は非置換の一価の炭化水素基が挙げられ、なかでもメチル基、エチル基等のアルキル基及び水素原子が好ましく、メチル基及び水素原子がより好ましい。R2としては、たとえば、水素原子、メチル基、エチル基、プロピル基、ブチル基、イソプロピル基、t−ブチル基等のアルキル基、ビニル基、アリル基、ブテニル基等のアルケニル基、ハロゲン化アルキル基、アミノ基置換アルキル基、メルカプト基置換アルキル基などの炭素数1〜10の置換又は非置換の一価の炭化水素基が挙げられ、なかでも水素原子が好ましい。また1分子中の平均nが0〜4の範囲に設定されることが好ましい。
ジシクロペンタジエン型フェノール樹脂を用いる場合、その配合量はその性能を発揮するために硬化剤全量に対して30重量%以上とすることが好ましく、50重量%以上がより好ましい。
【0038】
トリフェニルメタン型フェノール樹脂としては、たとえば下記一般式(XV)で示されるフェノール樹脂等が挙げられる。
【0039】
【化16】
(ここで、Rは水素原子及び置換又は非置換の炭素数1〜10の一価の炭化水素基から選ばれ、nは0〜10の整数を示す。)
上記式(XV)中のRとしては、たとえば、水素原子、メチル基、エチル基、プロピル基、ブチル基、イソプロピル基、t−ブチル基等のアルキル基、ビニル基、アリル基、ブテニル基等のアルケニル基、ハロゲン化アルキル基、アミノ基置換アルキル基、メルカプト基置換アルキル基などの炭素数1〜10の置換又は非置換の一価の炭化水素基が挙げられ、なかでもメチル基、エチル基等のアルキル基及び水素原子が好ましく、メチル基及び水素原子がより好ましい。
トリフェニルメタン型フェノール樹脂を用いる場合、その配合量はその性能を発揮するために硬化剤全量に対して30重量%以上とすることが好ましく、50重量%以上がより好ましい。
【0040】
ノボラック型フェノール樹脂としては、たとえば下記一般式(XVI)で示されるフェノール樹脂等のノボラック型フェノール樹脂、クレゾールノボラック樹脂等が挙げられ、なかでも下記一般式(XVI)で示されるノボラック型フェノール樹脂が好ましい。
【0041】
【化17】
(ここで、Rは水素原子及び置換又は非置換の炭素数1〜10の一価の炭化水素基から選ばれ、iは0〜3の整数を示し、nは0〜10の整数を示す。)
上記式(XVI)中のRとしては、たとえば、水素原子、メチル基、エチル基、プロピル基、ブチル基、イソプロピル基、t−ブチル基等のアルキル基、ビニル基、アリル基、ブテニル基等のアルケニル基、ハロゲン化アルキル基、アミノ基置換アルキル基、メルカプト基置換アルキル基などの炭素数1〜10の置換又は非置換の一価の炭化水素基が挙げられ、なかでもメチル基、エチル基等のアルキル基及び水素原子が好ましく、水素原子がより好ましく、nの平均値が0〜8であることが好ましい。
ノボラック型フェノール樹脂を用いる場合、その配合量はその性能を発揮するために硬化剤全量に対して30重量%以上とすることが好ましく、50重量%以上がより好ましい。
【0042】
共重合型フェノール・アラルキル樹脂としては、たとえば下記一般式(XVII)で示されるフェノール樹脂が挙げられる。
【0043】
【化18】
(ここで、Rは水素原子、炭素数1〜12の置換又は非置換の一価の炭化水素基及び水酸基から選ばれ、すべてが同一でも異なっていてもよい。またXは芳香環を含む基を示す。n及びmは0又は1〜10の整数を示す。)
上記一般式(XVII)中のRとしては、たとえば、メチル基、エチル基、プロピル基、イソプロピル基、n−ブチル基、sec−ブチル基、t−ブチル基、ペンチル基、ヘキシル基、オクチル基、デシル基、ドデシル基等の鎖状アルキル基、シクロペンチル基、シクロヘキシル基、シクロヘプチル基、シクロペンテニル基、シクロヘキセニル基等の環状アルキル基、ベンジル基、フェネチル基等のアリール基置換アルキル基、メトキシ基置換アルキル基、エトキシ基置換アルキル基、ブトキシ基置換アルキル基等のアルコキシ基置換アルキル基、ジメチルアミノ基、ジエチルアミノ基等のアミノ基置換アルキル基、水酸基置換アルキル基、フェニル基、ナフチル基、ビフェニル基等の無置換アリール基、トリル基、ジメチルフェニル基、エチルフェニル基、ブチルフェニル基、t−ブチルフェニル基、ジメチルナフチル基等のアルキル基置換アリール基、メトキシフェニル基、エトキシフェニル基、ブトキシフェニル基、t−ブトキシフェニル基、メトキシナフチル基等のアルコキシ基置換アリール基、ジメチルアミノ基、ジエチルアミノ基等のアミノ基置換アリール基、水酸基置換アリール基などが挙げられ、なかでも水素原子又はメチル基が好ましく、またn及びmは0又は1〜10の整数を示し、平均で6以下がより好ましい。
一般式(XVII)中のXとしては、たとえばフェニレン基、ビフェニレン基、ナフチレン基等のアリーレン基、トリレン基、キシリレン基等のアルキル基置換アリーレン基、アルコキシル基置換アリーレン基、ベンジル基、フェネチル基等のアラルキル基、アラルキル基置換アリーレン基などが挙げられ、なかでも、置換又は非置換のフェニレン基及びビフェニレン基が好ましい。このような化合物としては、HE−510住金エア・ウォーター・ケミカル株式会社製)等が市販品として入手可能である。
【0044】
上記のビフェニレン骨格含有フェノール・アラルキル樹脂、フェノール・アラルキル樹脂、ナフトール・アラルキル樹脂、ジシクロペンタジエン型フェノール樹脂、トリフェニルメタン型フェノール樹脂、ノボラック型フェノール樹脂及び共重合型フェノール・アラルキル樹脂は、いずれか1種を単独で用いても2種以上を組合わせて用いてもよいが、その配合量はフェノール樹脂全量に対して合わせて50重量%以上とすることが好ましく、60重量%以上がより好ましく、80重量%以上がさらに好ましい。
【0045】
本発明において、(A)エポキシ樹脂と(B)硬化剤との当量比、すなわちエポキシ基に対する硬化剤中の水酸基数の比(硬化剤中の水酸基数/エポキシ樹脂中のエポキシ基数)は、特に制限はないが、それぞれの未反応分を少なく抑えるために0.5〜2の範囲に設定されることが好ましく、0.6〜1.3がより好ましい。成形性、耐半田リフロー性に優れる封止用エポキシ樹脂成形材料を得るためには0.8〜1.2の範囲に設定されることがさらに好ましい。
【0046】
本発明で用いられる(C)シラン化合物は、骨格中に下記一般式(I)で示される化合物であれば特に制限はないが、下記一般式(I)中のR1、R2としてはメチル基、エチル基、プロピル基、ブチル基、ペンチル基、ヘキシル基、シクロヘキシル基、イソプロピル基、イソブチル基、t−ブチル基などのアルキル基、フェニル基、トリル基などのアリール基、ベンジル基、フェニルエチル基等が挙げられ、またR1、R2が直接あるいは二価又は三価の原子を介して結合して環状構造を形成してもよい。これらの基は水素原子の一部又は全部をハロゲン原子で置換されていてもよいが、なかでもR1、R2が炭素数1〜4のアルキル基、フェニル基等が好ましく、二価の原子としては酸素原子が好ましく、三価の原子としては窒素原子が好ましい。R3としてはメチレン基、エチレン基、プロピレン基、ブチレン基、ペンチレン基、へキシレン基、ヘプチレン基、オクチレン基、ノニレン基、デシレン基等のアルキレン基、フェニレン基、メチルフェニレン基、トリメチルフェニレン基、テトラメチルフェニレン基、エチルフェニレン基、ジエチルフェニレン基等のアリーレン基やアルキレンアリーレン基、窒素原子又は酸素原子を介して結合されたアルキレン基等の炭素数1〜10の二価の有機基が挙げられ、成形性の観点からは炭素数2〜6のアルキレン基又は窒素原子又は酸素原子を介して結合された炭素数2〜6のアルキレン基が好ましい。R4としてはメチレン基、エチレン基、プロピレン基、ブチレン基、ペンチレン基、へキシレン基、ヘプチレン基、オクチレン基、ノニレン基、デシレン基等のアルキレン基、フェニレン基、メチルフェニレン基、トリメチルフェニレン基、テトラメチルフェニレン基、エチルフェニレン基、ジエチルフェニレン基等のアリーレン基やアルキレンアリーレン基、窒素原子又は酸素原子を介して結合されたアルキレン基等の炭素数1〜10の二価の有機基が挙げられ、成形性の観点からは炭素数2〜6のアルキレン基が好ましい。R5としてはメチレン基、エチレン基、プロピレン基、ブチレン基、ペンチレン基、へキシレン基、ヘプチレン基、オクチレン基、ノニレン基、デシレン基等のアルキレン基、フェニレン基、メチルフェニレン基、トリメチルフェニレン基、テトラメチルフェニレン基、エチルフェニレン基、ジエチルフェニレン基等のアリーレン基やアルキレンアリーレン基が挙げられ、成形性の観点からは炭素数2〜6のアルキレン基が好ましい。R6、R7としてはメチル基、エチル基、プロピル基、ブチル基、イソプロピル基、イソブチル基、t−ブチル基などのアルキル基、ビニル基、アリル基、プロペニル基、ブテニル基等のアルケニル基などの炭素数1〜6の炭化水素基が挙げられ、なかでも炭素数1〜6のアルキル基が好ましく、成形性又は接着性の観点からはメチル基、エチル基、プロピル基、ブチル基、等の炭素数1〜4のアルキル基がより好ましい。また、mは0又は1の整数を示すが流動性の観点からは0であるものが好ましい。nは1〜3の整数を示すが、接着性の観点からは2又は3であるものが好ましく、3であるものがより好ましい。
【0047】
【化19】
(ここで、R1、R2は置換又は非置換の炭素数1〜18の炭化水素基を示し、R1とR2が結合して環状となっていても良く、二価又は三価の原子を介して結合されていてもよい。R3は置換又は非置換の炭素数1〜10の炭化水素基及び二価又は三価の原子を介して結合された有機基。R4は置換又は非置換の炭素数1〜10の炭化水素基及び二価又は三価の原子を介して結合された有機基、R5は炭素数1〜10の炭化水素基、R6は炭素数1〜6の炭化水素基、R7は水素原子又は炭素数1〜6の炭化水素基を示し、mは0又は1を示し、nは1〜3の整数を示す。)
【0048】
上記一般式(I)で示される化合物としては、たとえば、下記一般式(XVIII)〜(XXXXV)で示される化合物等が挙げられる。接着性、流動性、成形性の観点からは下記一般式(XXXVI)、(XXXXIV)で示される化合物の1種又は2種以上含有するシラン化合物を用いることが好ましい。
【0049】
【化20】
【0050】
【化21】
【0051】
【化22】
【0052】
【化23】
【0053】
本発明の封止用エポキシ樹脂成形材料には、上記(C)シラン化合物以外に従来公知のカップリング剤を併用してもよい。たとえば、ビニルトリクロロシラン、ビニルトリエトキシシラン、ビニルトリス(β−メトキシエトキシ)シラン、β−(3,4−エポキシシクロヘキシル)エチルトリメトキシシラン、γ−グリシドキシプロピルトリメトキシシラン、ビニルトリアセトキシシラン、γ−メルカプトプロピルトリメトキシシラン、γ−アミノプロピルトリエトキシシラン、γ−[ビス(β−ヒドロキシエチル)]アミノプロピルトリエトキシシラン、N−β−(アミノエチル)−γ−アミノプロピルトリエトキシシラン、N−(トリメトキシシリルプロピル)エチレンジアミン、メチルトリメトキシシラン、メチルトリエトキシシラン、フェニルトリメトキシシラン、フェニルトリエトキシシラン、N−β−(N−ビニルベンジルアミノエチル)−γ−アミノプロピルトリメトキシシラン、γ−クロロプロピルトリメトキシシラン、ヘキサメチルジシラン、γ−アニリノプロピルトリメトキシシラン、ビニルトリメトキシシラン等のシラン系のカップリング剤、あるいはイソプロピルトリイソステアロイルチタネート、イソプロピルトリス(ジオクチルパイロホスフェート)チタネート、イソプロピルトリ(N−アミノエチル−アミノエチル)チタネート、テトラオクチルビス(ジトリデシルホスファイト)チタネート、テトラ(2,2−ジアリルオキシメチル−1−ブチル)ビス(ジトリデシル)ホスファイトチタネート、ビス(ジオクチルパイロホスフェート)オキシアセテートチタネート、ビス(ジオクチルパイロホスフェート)エチレンチタネート、イソプロピルトリオクタノイルチタネート、イソプロピルジメタクリルイソステアロイルチタネート、イソプロピルイソステアロイルジアクリルチタネート、イソプロピルトリ(ジオクチルホスフェート)チタネート、イソプロピルトリクミルフェニルチタネート、テトライソプロピルビス(ジオクチルホスファイト)チタネート等のチタネート系カップリング剤、アルミニウムキレート類、アルミニウム/ジルコニウム系化合物等の公知のカップリング剤を1種以上併用することができる。
【0054】
(C)シラン化合物の全配合量は特に制限はないが無機充填剤に対して0.01〜2.0重量%配合されることが好ましく、0.1〜1.6重量%がより好ましい。0.01重量%未満では発明の効果が小さくなる傾向があり、2.0重量%を超えると成形性が低下する傾向がある。
【0055】
本発明で用いられる(D)無機充填剤としては、特に制限はないが、溶融シリカ、結晶シリカ、アルミナ、ジルコン、珪酸カルシウム、炭酸カルシウム、炭化珪素、窒化アルミ、窒化ホウ素、ベリリア、ジルコニア等の粉体、又はこれらを求形化したビーズ、チタン酸カリウム、炭化珪素、窒化珪素、アルミナ等の単結晶繊維、ガラス繊維等を1種以上配合して用いることができる。さらに、難燃効果のある無機充填剤としては水酸化アルミニウム、水酸化マグネシウム、硼酸亜鉛などが挙げられ、これらを単独又は併用して用いることもできる。上記の無機充填剤の中で、線膨張係数低減の観点からは溶融シリカが、高熱伝導性の観点からはアルミナが好ましい。充填剤形状は成形時の流動性及び金型磨耗性の点から球形もしくは球状に近い形が好ましい。
無機充填剤の配合量は、成形性、吸湿性、線膨張係数の低減及び強度向上の観点から封止用エポキシ樹脂成形材料に対して60重量%以上が好ましく、70〜95重量%がより好ましく、75〜92重量%がさらに好ましい。60重量%未満では耐半田リフロー性が低下する傾向があり、95重量%を超える場合には流動性が不十分となる傾向がある。
【0056】
本発明のエポキシ樹脂成形材料には、必要に応じて硬化促進剤を用いることができる。硬化促進剤としては、封止用エポキシ樹脂成形材料で一般に使用されているもので特に限定はないが、たとえば、1,8−ジアザビシクロ[5.4.0]ウンデセン−7、1,5−ジアザビシクロ[4.3.0]ノネン−5、5,6−ジブチルアミノ−1,8−ジアザビシクロ[5.4.0]ウンデセン−7等のシクロアミジン化合物及びこれらの化合物に無水マレイン酸、1,4−ベンゾキノン、2,5−トルキノン、1,4−ナフトキノン、2,3−ジメチルベンゾキノン、2,6−ジメチルベンゾキノン、2,3−ジメトキシ−5−メチル−1,4ベンゾキノン、2,3−ジメトキシ−1,4−ベンゾキノン、フェニル−1,4−ベンゾキノン等のキノン化合物、ジアゾフェニルメタン、フェノール樹脂等のπ結合をもつ化合物を付加してなる分子内分極を有する化合物、ベンジルジメチルアミン、トリエタノールアミン、ジメチルアミノエタノール、トリス(ジメチルアミノメチル)フェノール等の三級アミン類及びこれらの誘導体、2−メチルイミダゾール、2−フェニルイミダゾール、2―フェニル−4−メチルイミダゾール、2−ヘプタデシルイミダゾール等のイミダゾール類及びこれらの誘導体、トリブチルホスフィン、メチルジフェニルホスフィン、トリフェニルホスフィン、トリス(4−メチルフェニル)ホスフィン、ジフェニルホスフィン、フェニルホスフィン等の有機ホスフィン類及びこれらのホスフィン類に無水マレイン酸、上記キノン化合物、ジアゾフェニルメタン、フェノール樹脂等のπ結合をもつ化合物を付加してなる分子内分極を有するリン化合物、テトラフェニルホスホニウムテトラフェニルボレート、テトラフェニルホスホニウムエチルトリフェニルボレート、テトラブチルホスホニウムテトラブチルボレート等のテトラ置換ホスホニウム・テトラ置換ボレート、2−エチル−4−メチルイミダゾール・テトラフェニルボレート、N−メチルモルホリン・テトラフェニルボレート等のテトラフェニルボロン塩及びこれらの誘導体などが挙げられ、これらの1種を単独で用いても2種以上組み合わせて用いてもよい。
なかでも、硬化性及び流動性の観点からは第三ホスフィンとキノン化合物との付加物が好ましく、保存安定性の観点からはシクロアミジン化合物とフェノール樹脂との付加物が好ましく、ジアザビシクロウンデセンのノボラック型フェノール樹脂塩がより好ましい。これらの硬化促進剤の配合量は硬化促進剤全量に対して合わせて60重量%以上が好ましく、80重量%以上がより好ましい。
【0057】
第三ホスフィンとキノン化合物との付加物に用いられる第三ホスフィンとしては特に制限はないが、たとえば、ジブチルフェニルホスフィン、ブチルジフェニルホスフィン、エチルジフェニルホスフィン、トリフェニルホスフィン、トリス(4−メチルフェニル)ホスフィン、トリス(4−エチルフェニル)ホスフィン、トリス(4−プロピルフェニル)ホスフィン、トリス(4−ブチルフェニル)ホスフィン、トリス(イソプロピルフェニル)ホスフィン、トリス(t−ブチルフェニル)ホスフィン、トリス(2,4−ジメチルフェニル)ホスフィン、トリス(2,6−ジメチルフェニル)ホスフィン、トリス(2,4,6−トリメチルフェニル)ホスフィン、トリス(2,6−ジメチル−4−エトキシフェニル)ホスフィン、トリス(4−メトキシフェニル)ホスフィン、トリス(4−エトキシフェニル)ホスフィン等のアリール基を有する第三ホスフィンが挙げられ、成形性の点からはトリフェニルホスフィンが好ましい。
また、第三ホスフィンとキノン化合物との付加物に用いられるキノン化合物としては特に制限はないが、たとえば、o−ベンゾキノン、p−ベンゾキノン、ジフェノキノン、1,4−ナフトキノン、アントラキノン等が挙げられ、耐湿性又は保存安定性の観点からはp−ベンゾキノンが好ましい。
【0058】
硬化促進剤の配合量は、硬化促進効果が達成される量であれば特に限定されるものではないが、(A)エポキシ樹脂と(B)硬化剤の合計量100重量部に対して0.1〜10重量部が好ましく、0.3〜5重量部がより好ましい。0.1重量部未満では短時間で硬化させることが困難となり、10重量部を超えると硬化速度が早すぎて良好な成形品が得られない傾向がある。
【0059】
また、本発明の封止用エポキシ樹脂成形材料には、ICの耐湿性、高温放置特性を向上させる目的で陰イオン交換体を必要に応じて配合することができる。陰イオン交換体としては特に制限はなく、従来公知のものを用いることができるが、たとえば、ハイドロタルサイト類や、マグネシウム、アルミニウム、チタン、ジルコニウム、ビスマスから選ばれる元素の含水酸化物等が挙げられ、これらを単独で用いても2種類以上を組み合わせて用いてもよい。なかでも、下記組成式(XXXXVI)で示されるハイドロタルサイトが好ましい。
【0060】
【化24】
Mg1−XAlX(OH)2(CO3)X/2・mH2O……(XXXXVI)
(0<x≦0.5、mは正の数)
陰イオン交換体の配合量は、ハロゲンイオンなどの陰イオンを捕捉できる十分量であれば特に限定されるものではないが、(A)エポキシ樹脂100重量部に対して、0.1〜30重量部が好ましく、1〜5重量部がより好ましい。
【0061】
本発明の封止用エポキシ樹脂成形材料には、接着性をより向上させるために、必要に応じて接着促進剤を用いることができる。接着促進剤としては、たとえば、イミダゾール、トリアゾール、テトラゾール、トリアジン等の誘導体、アントラニル酸、没食子酸、マロン酸、リンゴ酸、マレイン酸、アミノフェノール、キノリン等及びこれらの誘導体、脂肪族酸アミド化合物、ジチオカルバミン酸塩、チアジアゾール誘導体などが挙げられ、これらの1種を単独で用いても2種類以上を組み合わせて用いてもよい。
【0062】
本発明の封止用エポキシ樹脂成形材料には、必要に応じて離型剤を用いてもよい。離型剤としては、酸化型又は非酸化型のポリオレフィンを(A)エポキシ樹脂100重量部に対して0.01〜10重量部用いることが好ましく、0.1〜5重量部用いることがより好ましい。0.01重量部未満では離型性が不十分となる傾向があり、10重量部を超えると接着性が低下する傾向がある。酸化型又は非酸化型のポリオレフィンとしては、ヘキスト株式会社製H4やPE、PEDシリーズ等の数平均分子量が500〜10000程度の低分子量ポリエチレンなどが挙げられる。また、これ以外の離型剤としては、たとえばカルナバワックス、モンタン酸エステル、モンタン酸、ステアリン酸等が挙げられ、これらの1種を単独で用いても2種以上組み合わせて用いてもよい。酸化型又は非酸化型のポリオレフィンに加えてこれら他の離型剤を併用する場合、その配合量は合わせて(A)エポキシ樹脂100重量部に対して0.l〜10重量部が好ましく、0.5〜3重量部がより好ましい。
【0063】
本発明の封止用エポキシ樹脂成形材料には従来公知の難燃剤を必要に応じて配合することができる。たとえば、ブロム化エポキシ樹脂、三酸化アンチモン、赤リン、水酸化アルミニウム、水酸化マグネシウム、酸化亜鉛等の無機物及び/又はフェノール樹脂等の熱硬化性樹脂等で被覆された赤リン、リン酸エステル等のリン化合物、メラミン、メラミン誘導体、メラミン変性フェノール樹脂、トリアジン環を有する化合物、シアヌル酸誘導体、イソシアヌル酸誘導体等の窒素含有化合物、シクロホスファゼン等のリン及び窒素含有化合物、水酸化アルミニウム、水酸化マグネシウム及び下記組成式(XXXXVII)で示される複合金属水酸化物などが挙げられる。
【0064】
【化25】
p(M1aOb)・q(M2cOd)・r(M3cOd)・mH2O (XXXXVII)
(ここで、M1、M2及びM3は互いに異なる金属元素を示し、a、b、c、d、p、q及びmは正の数、rは0又は正の数を示す。)
上記組成式(XXXXVII)中のM1、M2及びM3は互いに異なる金属元素であれば特に制限はないが、難燃性の観点からは、M1が第3周期の金属元素、IIA族のアルカリ土類金属元素、IVB族、IIB族、VIII族、IB族、IIIA族及びIVA族に属する金属元素から選ばれ、M2がIIIB〜IIB族の遷移金属元素から選ばれることが好ましく、M1がマグネシウム、カルシウム、アルミニウム、スズ、チタン、鉄、コバルト、ニッケル、銅及び亜鉛から選ばれ、M2が鉄、コバルト、ニッケル、銅及び亜鉛から選ばれることがより好ましい。流動性の観点からは、M1がマグネシウム、M2が亜鉛又はニッケルで、r=0のものが好ましい。p、q及びrのモル比は特に制限はないが、r=0で、p/qが1/99〜1/1であることが好ましい。なお、金属元素の分類は、典型元素をA亜族、遷移元素をB亜族とする長周期型の周期率表(出典:共立出版株式会社発行「化学大辞典4」1987年2月15日縮刷版第30刷)に基づいて行った。また、酸化亜鉛、錫酸亜鉛、硼酸亜鉛、酸化鉄、酸化モリブデン、モリブデン酸亜鉛、ジシクロペンタジエニル鉄等の金属元素を含む化合物などが挙げられ、これらの1種を単独で用いても2種以上を組合わせて用いてもよい。難燃剤の配合量は特に制限はないが、(A)エポキシ樹脂100重量部に対して1〜30重量部が好ましく、2〜15重量部がより好ましい。
また、本発明の封止用エポキシ樹脂成形材料には、カーボンブラック、有機染料、有機顔料、酸化チタン、鉛丹、ベンガラ等の着色剤を用いても良い。
さらに、その他の添加剤として、シリコーンオイルやシリコーンゴム粉末等の応力緩和剤等を必要に応じて配合することができる。
【0065】
本発明の封止用エポキシ樹脂成形材料は、各種成分を均一に分散混合できるのであれば、いかなる手法を用いても調製できるが、一般的な手法として、所定の配合量の成分をミキサー等によって十分混合した後、ミキシングロール、押出機等によって溶融混練した後、冷却、粉砕する方法を挙げることができる。たとえば、上述した成分の所定量を均一に撹拌、混合し、予め70〜140℃に加熱してあるニーダー、ロール、エクストルーダーなどで混練、冷却し、粉砕するなどの方法で得ることができる。成形条件に合うような寸法及び重量でタブレット化すると使いやすい。
【0066】
本発明で得られる封止用エポキシ樹脂成形材料により封止した素子を備えた電子部品装置としては、リードフレーム、配線済みのテープキャリア、配線板、ガラス、シリコンウエハ等の支持部材に、半導体チップ、トランジスタ、ダイオード、サイリスタ等の能動素子、コンデンサ、抵抗体、コイル等の受動素子等の素子を搭載し、必要な部分を本発明の封止用エポキシ樹脂成形材料で封止した、電子部品装置などが挙げられる。このような電子部品装置としては、たとえば、リードフレーム上に半導体素子を固定し、ボンディングパッド等の素子の端子部とリード部をワイヤボンディングやバンプで接続した後、本発明の封止用エポキシ樹脂成形材料を用いてトランスファ成形等により封止してなる、DIP(Dual Inline Package)、PLCC(Plastic Leaded Chip Carrier)、QFP(Quad Flat Package)、SOP(Small Outline Package)、SOJ(Small Outline J−lead package)、TSOP(Thin Small Outline Package)、TQFP(Thin Quad Flat Package)等の一般的な樹脂封止型IC、テープキャリアにバンプで接続した半導体チップを、本発明の封止用エポキシ樹脂成形材料で封止したTCP(Tape Carrier Package)、配線板やガラス上に形成した配線に、ワイヤボンディング、フリップチップボンディング、はんだ等で接続した半導体チップ、トランジスタ、ダイオード、サイリスタ等の能動素子及び/又はコンデンサ、抵抗体、コイル等の受動素子を、本発明の封止用エポキシ樹脂成形材料で封止したCOB(Chip On Board)モジュール、ハイブリッドIC、マルチチップモジュール、裏面に配線板接続用の端子を形成した有機基板の表面に素子を搭載し、バンプ又はワイヤボンディングにより素子と有機基板に形成された配線を接続した後、本発明の封止用エポキシ樹脂成形材料で素子を封止したBGA(Ball Grid Array)、CSP(Chip Size Package)などが挙げられる。また、プリント回路板にも本発明の封止用エポキシ樹脂成形材料は有効に使用できる。
【0067】
本発明の封止用エポキシ樹脂成形材料を用いて素子を封止する方法としては、低圧トランスファ成形法が最も一般的であるが、インジェクション成形法、圧縮成形法等を用いてもよい。
【0068】
【実施例】
次に実施例により本発明を説明するが、本発明の範囲はこれらの実施例に限定されるものではない。
【0069】
合成例1:シラン化合物1の合成
温度計、撹拌機、冷却器を備えた4つ口フラスコに、γ−アミノプロピルトリエトキシシラン約156.7gを仕込み、窒素雰囲気下、70℃まで昇温した。次にN、N−ジメチルアクリルアミド約77.2gを30分かけて滴下し、さらに100℃で8時間加熱撹拌した。そしてこの反応混合物を減圧蒸留(138℃/1.3hPa)することにより下記一般式(XXXVI)で示されるシラン化合物1(無色透明液体、収量170.2g、収率70.5%)を得た。
【0070】
合成例2:シラン化合物2の合成
温度計、撹拌機、冷却器を備えた4つ口フラスコに、γ−アミノプロピルトリエトキシシラン約33.2gを仕込み、窒素雰囲気下、70℃まで昇温した。次にN−アクリロイルモルフォリン約23.3gを10分かけて滴下し、さらに100℃で3時間加熱撹拌した。そしてこの反応混合物を加熱減圧(130℃/1.3hPa)により低沸点成分を除去することにより下記一般式(XXXXIV)で示されるシラン化合物2(淡黄色透明液体、収量53.7g、収率95%)を得た。
【0071】
【化26】
【0072】
実施例1〜86、比較例1〜47
エポキシ樹脂としてはエポキシ当量200、軟化点67℃のオルソクレゾールノボラック型エポキシ樹脂(エポキシ樹脂1、住友化学工業株式会社製商品名ESCN−190)、エポキシ当量210、融点120℃のスチルベン型エポキシ樹脂(エポキシ樹脂2、住友化学工業株式会社製商品名ESLV−210)、エポキシ当量196、融点106℃のビフェニル型エポキシ樹脂(エポキシ樹脂3、ジャパンエポキシレジン株式会社製商品名YX−4000H)、エポキシ当量176、融点111℃のビフェニル型エポキシ樹脂(エポキシ樹脂4、ジャパンエポキシレジン株式会社製商品名YL−6121H)、エポキシ当量242、融点118℃の硫黄原子含有エポキシ樹脂(エポキシ樹脂5、新日本製鐵化学株式会社製商品名YSLV−120TE)、エポキシ当量264、軟化点64℃のジシクロペンタジエン型エポキシ樹脂(エポキシ樹脂6、大日本インキ化学工業株式会社製商品名HP−7200)、エポキシ当量217、軟化点72℃のナフタレン型エポキシ樹脂(エポキシ樹脂7、日本化薬株式会社製商品名NC−7300)、エポキシ当量170、軟化点65℃のトリフェニルメタン型エポキシ樹脂(エポキシ樹脂8、日本化薬株式会社製商品名EPPN−502H)、エポキシ当量192、融点79℃のビスフェノールF型エポキシ樹脂(エポキシ樹脂9、新日本製鐵化学株式会社製商品名YSLV−80XY)、エポキシ当量241、軟化点96℃のビフェニレン骨格含有フェノール・アラルキル型エポキシ樹脂(エポキシ樹脂10、日本化薬株式会社製商品名CER−3000L)、エポキシ当量375、軟化点80℃、臭素含有量48重量%のビスフェノールA型ブロム化エポキシ樹脂(エポキシ樹脂11)、硬化剤としては水酸基当量199、軟化点89℃のビフェニレン骨格型フェノール樹脂(硬化剤1、明和化成株式会社製商品名MEH−7851)、水酸基当量176、軟化点70℃のフェノール・アラルキル樹脂(硬化剤2、三井化学株式会社製商品名ミレックスXLC)、水酸基当量183、軟化点79℃のナフトールアラルキル樹脂(硬化剤3、新日本製鐵化学株式会社製商品名SN−170)、水酸基当量170、軟化点93℃のジシクロペンタジエン型フェノール樹脂(硬化剤4、日本石油化学株式会社製商品名DPP)、水酸基当量104、軟化点83℃のトリフェニルメタン型フェノール樹脂(硬化剤5、明和化成株式会社製商品名MEH−7500)、水酸基当量106、軟化点64℃のノボラック型フェノール樹脂(硬化剤6、明和化成株式会社製商品名H−4)、水酸基当量156、軟化点 ℃のフェノール樹脂(硬化剤7、住金エア・ウォーター・ケミカル株式会社製商品名HE−510)、シラン化合物としては上記一般式(XXXVI)で示されるシラン化合物(シラン化合物1)、上記一般式(XXXXIV)で示されるシラン化合物(シラン化合物2)、γ−グリシドキシプロピルトリメトキシシラン(シラン化合物3)、γ−アミノプロピルトリエトキシシラン(シラン化合物4)、N−フェニル−γ−アミノプロピルトリメトキシシラン(シラン化合物5)、フェニルトリメトキシシラン(シラン化合物6)、硬化促進剤としてはトリフェニルホスフィンとp−ベンゾキノンとのベタイン型付加物(硬化促進剤1)、トリブチルホスフィンとp−ベンゾキノンとのベタイン型付加物(硬化促進剤2)、無機充填剤としては平均粒径17.5μm、比表面積3.8m2/gの球状溶融シリカ、その他の添加成分としてはカルナバワックス、三酸化アンチモン、カーボンブラックを、表1〜13に示す重量比で配合し、混練温度80〜90℃、混練時間15分の条件でロール混練を行い、実施例1〜86及び比較例1〜47の封止用エポキシ樹脂成形材料を作製した。
【0073】
【表1】
【0074】
【表2】
【0075】
【表3】
【0076】
【表4】
【0077】
【表5】
【0078】
【表6】
【0079】
【表7】
【0080】
【表8】
【0081】
【表9】
【0082】
【表10】
【0083】
【表11】
【0084】
【表12】
【0085】
【表13】
【0086】
実施例及び比較例の封止用エポキシ樹脂成形材料を、次の(1)〜(8)の各種特性試験により評価した。評価結果を表14〜26に示す。なお、封止用エポキシ樹脂成形材料の成形は、トランスファ成形機により、金型温度180℃、成形圧力6.9MPa、硬化時間90秒の条件で行った。また、後硬化は180℃で5時間行った。
(1)スパイラルフロー
EMMI−1−66に準じたスパイラルフロー測定用金型を用いて、封止用エポキシ成形材料を上記条件で成形し、流動距離(cm)を求めた。
(2)円板フロー
200mm(W)×200mm(D)×25mm(H)の上型と200mm(W)×200mm(D)×15mm(H)の下型を有する円板フロー測定用平板金型を用いて、上皿天秤にて秤量した封止用エポキシ樹脂成形材料5gを180℃に加熱した下型の中心部にのせ、5秒後に180℃に加熱した上型を閉じて、荷重78N、硬化時間90秒の条件で圧縮成形し、ノギスで成形品の長径(mm)及び短径(mm)を測定して、その平均値(mm)を円板フローとした。
(3)熱時硬度
封止用エポキシ樹脂成形材料を上記条件で直径50mm×厚さ3mmの円板に成形し、成形後直ちにショアD型硬度計を用いて測定した。
【0087】
(4)接着保持率
上記条件で30μmのアルミ箔上に封止用エポキシ樹脂成形材料を成形、後硬化して試験片を作製し、PCT処理(121℃、0.2MPa、100時間)前後で試験片の90度方向のピール強度(N/m)を測定し、接着保持率(%)=PCT処理後アルミピール強度/PCT処理前アルミピール強度×100で評価した。
(5)耐半田リフロー性
42アロイリードフレーム上に8×10mmのシリコーンチップを搭載した外形寸法20×14×2mmの80ピンフラットパッケージを、封止用エポキシ樹脂成形材料を用いて上記条件で成形、後硬化して作製し、85℃、85%RHの条件で加湿して所定時間ごとに240℃、10秒の条件でリフロー処理を行い、クラックの発生の有無を観察し、試験パッケージ数(10)に対するクラック発生パッケージ数で評価した。
(6)吸水率
上記(3)で成形した円板を上記条件で後硬化し、85℃、85%RHの条件下で72時間放置し、放置前後の重量変化を測定して、吸水率(重量%)=(放置後の円板重量−放置前の円板重量)/放置前の円板重量×100で評価した。
(7)ガラス転移温度(Tg)
上記条件で19mm×3mm×3mmの形状に封止用エポキシ樹脂成形材料を成形、後硬化して試験片を作製し、理学電気株式会社製の熱機械分析装置(TMA−8140、TAS−100)により、昇温速度5℃/minの条件で測定を行い、線膨張曲線の屈曲点からガラス転移温度(Tg、単位:℃)を求めた。
(8)難燃性
厚さ1/16インチの試験片を成形する金型を用いて、封止用エポキシ樹脂成形材料を上記条件で成形して後硬化を行い、UL−94試験法に従って難燃性を評価した。
【0088】
【表14】
【0089】
【表15】
【0090】
【表16】
【0091】
【表17】
【0092】
【表18】
【0093】
【表19】
【0094】
【表20】
【0095】
【表21】
【0096】
【表22】
【0097】
【表23】
【0098】
【表24】
【0099】
【表25】
【0100】
【表26】
【0101】
表14〜21に見られるように実施例1〜86では同一樹脂組成の比較例と比べて、硬化性を低下させることなく、スパイラルフロー、円板フロー及び接着性において良好な特性を示している。また72時間吸湿後のリフロー処理においてほぼ不良は無く、また48時間吸湿後のリフロー処理においてもパッケージクラックが無く耐半田リフロー性に優れている。一方、本発明の(C)シラン化合物を含まない比較例では本発明の目的を満足しない。すなわち表22〜26に示される比較例1〜47では、流動性が低く、72時間吸湿後のリフロー処理において50%以上ものパッケージクラックが発生し、さらに48時間吸湿後のリフロー処理においてもパッケージクラックが発生しており耐半田リフロー性に劣る。
【0102】
【発明の効果】
本発明によって得られる封止用エポキシ樹脂成形材料は、スパイラルフロー、円板フロー及び接着性において良好な特性を示し、硬化性を低下させることなく、優れた耐半田リフロー性が得られたことから、信頼性の高い電子部品装置を得ることができ、その工業的価値は大である。[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an epoxy resin molding material for sealing excellent in reliability and an electronic component device including an element sealed with the molding material.
[0002]
[Prior art]
Conventionally, epoxy resin molding materials have been widely used in the field of sealing electronic components such as transistors and ICs. This is because the epoxy resin has a good balance of electrical properties, moisture resistance, heat resistance, mechanical properties, adhesiveness with inserts, and the like. In particular, the combination of an ortho-cresol novolac type epoxy resin and a novolac type phenol curing agent has an excellent balance between these, and has become the mainstream of the base resin of the molding material for sealing.
As electronic devices have become smaller, lighter, and higher performance in recent years, mounting density has been increasing, and electronic component devices have come to be made surface mount packages from conventional pin insertion types. . When a semiconductor device is attached to a wiring board, the conventional pin insertion type package is soldered from the back side of the wiring board after the pins are inserted into the wiring board, so that the package is not directly exposed to high temperatures. However, in the surface mount type package, the entire semiconductor device is processed by a solder bath, a reflow device or the like, so that it is directly exposed to the soldering temperature. As a result, when the package absorbs moisture, the moisture absorption moisture rapidly expands during soldering, causing peeling of the adhesive interface and package cracks, resulting in a decrease in package reliability during mounting.
[0003]
In order to solve the above problems, for example, a method of adding an amine-based silane compound as a silane compound has been proposed as a method for improving the adhesion between the sealing epoxy resin molding material and the lead frame and improving the reflow resistance. (See Patent Documents 1 and 2). However, this method is not effective for improving the solder reflow resistance and adhesiveness, and also has a problem of causing a decrease in fluidity. Moreover, if the fluidity of the epoxy resin molding material for sealing is low, new problems such as the occurrence of gold wire flow, voids, pinholes, etc. will occur during molding (see Non-Patent Document 1).
Further, methods such as moisture-proof packaging of ICs and methods of sufficiently drying ICs in advance before mounting on a wiring board have been used, but these methods are time-consuming and costly (Non-Patent Documents) 2).
[0004]
[Patent Document 1]
JP-A-11-147939
[Patent Document 2]
JP 2001-213939 A
[Non-Patent Document 1]
Technical Information Association, Inc. “High Reliability of Semiconductor Encapsulation Resin” Technical Information Association, January 31, 1990, pages 172-176
[Non-Patent Document 2]
Hitachi, Ltd. Semiconductor Division, "Surface Mounted LSI Package Mounting Technology and its Reliability Improvement" Applied Technology Publishing, November 16, 1988, pages 254-256
[0005]
[Problems to be solved by the invention]
The present invention has been made in view of such a situation, and an epoxy resin molding material for sealing that is excellent in fluidity, adhesion, and solder reflow resistance without lowering curability, and an electron equipped with an element sealed thereby A component device is to be provided.
[0006]
[Means for Solving the Problems]
As a result of intensive studies in order to solve the above-mentioned problems, the inventors have found that the above object can be achieved by blending a silane compound having a specific structure into an epoxy resin molding material for sealing. As a result, the present invention has been completed.
[0007]
That is, the present invention
(1) (A) epoxy resin, (B) curing agent, (C) a silane compound containing a secondary amino group and a tertiary amino group in the skeleton, and (D) an epoxy resin for sealing containing an inorganic filler Molding material.
(2) The epoxy resin molding material for sealing according to 1 above, wherein the component (C) contains a silane compound further containing a carbonyl group in the skeleton.
(3) The epoxy resin molding material for sealing according to 1 or 2 above, wherein the component (C) contains a compound represented by the following general formula (I).
[0008]
[Chemical formula 2]
(Where R 1 , R 2 Represents a substituted or unsubstituted hydrocarbon group having 1 to 18 carbon atoms, R 1 , R 2 May be bonded to form a ring, or may be bonded via a divalent or trivalent atom. R 3 Is a substituted or unsubstituted hydrocarbon group having 1 to 10 carbon atoms and an organic group bonded via a divalent or trivalent atom. R 4 Is a substituted or unsubstituted hydrocarbon group having 1 to 10 carbon atoms and an organic group bonded via a divalent or trivalent atom, R 5 Is a hydrocarbon group having 1 to 10 carbon atoms, R 6 Is a hydrocarbon group having 1 to 6 carbon atoms, R 7 Represents a hydrogen atom or a hydrocarbon group having 1 to 6 carbon atoms, m represents 0 or 1, and n represents an integer of 1 to 3. )
(4) (A) Epoxy resin is biphenyl type epoxy resin, stilbene type epoxy resin, sulfur atom-containing epoxy resin, novolac type epoxy resin, dicyclopentadiene type epoxy resin, naphthalene type epoxy resin, triphenylmethane type epoxy resin, bisphenol 4. The epoxy resin molding material for sealing according to any one of the above 1 to 3, containing at least one of an F type epoxy resin and a biphenylene skeleton-containing phenol / aralkyl type epoxy resin.
(5) (B) The curing agent is a biphenylene skeleton-containing phenol-aralkyl resin, phenol-aralkyl resin, naphthol-aralkyl resin, dicyclopentadiene-type phenol resin, triphenylmethane-type phenol resin, novolac-type phenol resin, and copolymer-type phenol -The epoxy resin molding material for sealing in any one of said 1-4 containing at least 1 sort (s) of aralkyl resin.
(6) It is related with an electronic component apparatus provided with the element sealed with the epoxy resin molding material for sealing in any one of said 1-5.
[0009]
DETAILED DESCRIPTION OF THE INVENTION
The epoxy resin (A) used in the present invention is generally used for an epoxy resin molding material for sealing and is not particularly limited. For example, a phenol novolac epoxy resin, an orthocresol novolac epoxy resin, triphenyl Phenols such as epoxy resins having a methane skeleton, phenols such as phenol, cresol, xylenol, resorcin, catechol, bisphenol A, bisphenol F and / or naphthols such as α-naphthol, β-naphthol, dihydroxynaphthalene and formaldehyde, acetaldehyde Epoxidized novolak resin obtained by condensation or co-condensation with a compound having an aldehyde group such as propionaldehyde, benzaldehyde, salicylaldehyde in the presence of an acidic catalyst, Glycidyl obtained by reaction of polychlorobasic acid such as diol A, bisphenol F, bisphenol S, diglycidyl ether such as alkyl-substituted or unsubstituted biphenol, stilbene type epoxy resin, hydroquinone type epoxy resin, phthalic acid, dimer acid and epichlorohydrin Ester-type epoxy resin, diaminodiphenylmethane, isocyanuric acid and other polyamines obtained by reaction of epichlorohydrin, glycidylamine-type epoxy resin, epoxidized product of dicyclopentadiene and phenol co-condensation resin, epoxy resin having naphthalene ring, phenol Aralkyl type phenolic resin, naphthol aralkyl resin, etc. synthesized from naphthols and / or naphthols and dimethoxyparaxylene or bis (methoxymethyl) biphenyl Epoxy resin epoxide, trimethylolpropane epoxy resin, terpene-modified epoxy resin, linear aliphatic epoxy resin obtained by oxidizing olefinic bonds with peracid such as peracetic acid, alicyclic epoxy resin, containing sulfur atoms An epoxy resin etc. are mentioned, These may be used independently or may be used in combination of 2 or more type.
[0010]
Among them, biphenyl type epoxy resins, stilbene type epoxy resins, sulfur atom-containing epoxy resins and bisphenol F type epoxy resins are preferable from the viewpoint of solder reflow resistance, and novolak type epoxy resins are preferable from the viewpoint of curability, and low moisture absorption. Dicyclopentadiene type epoxy resin is preferable from the viewpoint of heat resistance, naphthalene type epoxy resin and triphenylmethane type epoxy resin are preferable from the viewpoint of heat resistance and low warpage, and biphenylene skeleton-containing phenol Aralkyl-type epoxy resins are preferable, and it is preferable to contain at least one of these epoxy resins.
[0011]
Examples of the biphenyl type epoxy resin include an epoxy resin represented by the following general formula (II). Examples of the stilbene type epoxy resin include an epoxy resin represented by the following general formula (III). Examples of the resin include an epoxy resin represented by the following general formula (IV), and examples of the bisphenol F-type epoxy resin include the following general formula (V).
[0012]
[Chemical 3]
(Where R 1 ~ R 8 Is selected from a hydrogen atom and a substituted or unsubstituted monovalent hydrocarbon group having 1 to 10 carbon atoms, all of which may be the same or different. n represents an integer of 0 to 3. )
[0013]
[Formula 4]
(Where R 1 ~ R 8 Is selected from a hydrogen atom and a substituted or unsubstituted monovalent hydrocarbon group having 1 to 10 carbon atoms, all of which may be the same or different. n represents an integer of 0 to 3. )
[0014]
[Chemical formula 5]
(Where R 1 ~ R 8 Is selected from a hydrogen atom, a substituted or unsubstituted monovalent hydrocarbon group having 1 to 10 carbon atoms, and these may be all the same or different. n represents an integer of 0 to 3. )
[0015]
[Chemical 6]
(Where R 1 ~ R 8 Is selected from a hydrogen atom and a substituted or unsubstituted monovalent hydrocarbon group having 1 to 10 carbon atoms, all of which may be the same or different. n represents an integer of 0 to 3. )
[0016]
Examples of the biphenyl type epoxy resin represented by the general formula (II) include 4,4′-bis (2,3-epoxypropoxy) biphenyl or 4,4′-bis (2,3-epoxypropoxy) -3. , 3 ′, 5,5′-tetramethylbiphenyl as the main component, epichlorohydrin and 4,4′-biphenol or 4,4 ′-(3,3 ′, 5,5′-tetramethyl) biphenol An epoxy resin obtained by reacting is used. Among these, an epoxy resin mainly composed of 4,4′-bis (2,3-epoxypropoxy) -3,3 ′, 5,5′-tetramethylbiphenyl is preferable.
The stilbene type epoxy resin represented by the above general formula (III) can be obtained by reacting a raw material stilbene phenol and epichlorohydrin in the presence of a basic substance. Examples of the raw material stilbene phenols include 3-t-butyl-4,4′-dihydroxy-3 ′, 5,5′-trimethylstilbene, 3-t-butyl-4,4′-dihydroxy-3. ', 5', 6-trimethylstilbene, 4,4'-dihydroxy-3,3 ', 5,5'-tetramethylstilbene, 4,4'-dihydroxy-3,3'-di-t-butyl-5 , 5'-dimethylstilbene, 4,4'-dihydroxy-3,3'-di-t-butyl-6,6'-dimethylstilbene and the like, among others, 3-t-butyl-4,4'- Dihydroxy-3 ′, 5,5′-trimethylstilbene and 4,4′-dihydroxy-3,3 ′, 5,5′-tetramethylstilbene are preferred. These stilbene type phenols may be used alone or in combination of two or more.
[0017]
Among the sulfur atom-containing epoxy resins represented by the general formula (IV), R 1 ~ R 8 Is preferably an epoxy resin selected from a hydrogen atom, a substituted or unsubstituted alkyl group having 1 to 10 carbon atoms and a substituted or unsubstituted alkoxy group having 1 to 10 carbon atoms, R 1 , R 4 , R 5 And R 8 Is a hydrogen atom and R 2 , R 3 , R 6 And R 7 Is more preferably an epoxy resin in which R is an alkyl group, R 1 , R 4 , R 5 And R 8 Is a hydrogen atom and R 2 And R 7 Is a methyl group and R 3 And R 6 An epoxy resin in which is a t-butyl group is more preferable. As such a compound, YSLV-120TE (manufactured by Nippon Steel Chemical Co., Ltd.) and the like are commercially available.
Examples of the bisphenol F type epoxy resin represented by the general formula (V) include R 1 , R 3 , R 6 And R 8 Is a methyl group and R 2 , R 4 , R 5 And R 7 Is a hydrogen atom and YSLV-80XY (trade name, manufactured by Nippon Steel Chemical Co., Ltd.) having n = 0 as a main component is commercially available.
Any one of these epoxy resins may be used alone or in combination of two or more, but the blending amount thereof is 20% in total with respect to the total amount of the epoxy resin in order to exhibit its performance. % Or more, preferably 30% by weight or more, and more preferably 50% by weight or more.
[0018]
Examples of the novolac type epoxy resin include an epoxy resin represented by the following general formula (VI).
[0019]
[Chemical 7]
(Here, R is selected from a hydrogen atom and a substituted or unsubstituted monovalent hydrocarbon group having 1 to 10 carbon atoms, and n represents an integer of 0 to 10.)
The novolak type epoxy resin represented by the general formula (VI) can be easily obtained by reacting a novolak type phenol resin with epichlorohydrin. Among them, R in the general formula (VI) may be an alkyl group having 1 to 10 carbon atoms such as a methyl group, an ethyl group, a propyl group, a butyl group, an isopropyl group, or an isobutyl group, a methoxy group, an ethoxy group, or a propoxy group. C1-C10 alkoxyl groups, such as a group and a butoxy group, are preferable, and a hydrogen atom or a methyl group is more preferable. n is preferably an integer of 0 to 3. Among the novolac type epoxy resins represented by the general formula (VI), orthocresol novolac type epoxy resins are preferable.
In the case of using a novolac type epoxy resin, its blending amount is preferably 20% by weight or more, more preferably 30% by weight or more, based on the total amount of the epoxy resin in order to exhibit its performance.
[0020]
Examples of the dicyclopentadiene type epoxy resin include an epoxy resin represented by the following general formula (VII).
[0021]
[Chemical 8]
(Where R 1 And R 2 Are independently selected from a hydrogen atom and a substituted or unsubstituted monovalent hydrocarbon group having 1 to 10 carbon atoms, n represents an integer of 0 to 10, and m represents an integer of 0 to 6. )
R in the above formula (VII) 1 As, for example, a hydrogen atom, an alkyl group such as a methyl group, an ethyl group, a propyl group, a butyl group, an isopropyl group or a t-butyl group, an alkenyl group such as a vinyl group, an allyl group or a butenyl group, a halogenated alkyl group, Examples thereof include substituted or unsubstituted monovalent hydrocarbon groups having 1 to 10 carbon atoms such as amino group-substituted alkyl groups and mercapto group-substituted alkyl groups. Among them, alkyl groups such as methyl groups and ethyl groups and hydrogen atoms are preferable. More preferred are a methyl group and a hydrogen atom. R 2 As, for example, a hydrogen atom, an alkyl group such as a methyl group, an ethyl group, a propyl group, a butyl group, an isopropyl group or a t-butyl group, an alkenyl group such as a vinyl group, an allyl group or a butenyl group, a halogenated alkyl group, Examples thereof include substituted or unsubstituted monovalent hydrocarbon groups having 1 to 10 carbon atoms such as an amino group-substituted alkyl group and a mercapto group-substituted alkyl group. Among them, a hydrogen atom is preferable.
When a dicyclopentadiene type epoxy resin is used, its blending amount is preferably 20% by weight or more, more preferably 30% by weight or more based on the total amount of the epoxy resin in order to exhibit its performance.
[0022]
Examples of the naphthalene type epoxy resin include an epoxy resin represented by the following general formula (VIII), and examples of the triphenylmethane type epoxy resin include an epoxy resin represented by the following general formula (IX).
The naphthalene type epoxy resin represented by the following general formula (VIII) includes a random copolymer randomly containing m structural units and n structural units, an alternating copolymer alternately containing, and a copolymer containing regularly. Examples thereof include block copolymers including a block and a block, and any one of these may be used alone, or two or more may be used in combination. The triphenylmethane type epoxy resin represented by the following general formula (IX) is not particularly limited, but a salicylaldehyde type epoxy resin is preferable.
[0023]
[Chemical 9]
(Where R 1 ~ R 3 Is selected from a hydrogen atom and a substituted or unsubstituted monovalent hydrocarbon group having 1 to 12 carbon atoms, all of which may be the same or different. p is 1 or 0, m and n are each an integer of 0 to 11, and (m + n) is an integer of 1 to 11 and (m + p) is an integer of 1 to 12. i represents an integer of 0 to 3, j represents an integer of 0 to 2, and k represents an integer of 0 to 4. )
[0024]
Embedded image
(Here, R is selected from a hydrogen atom and a substituted or unsubstituted monovalent hydrocarbon group having 1 to 10 carbon atoms, and n represents an integer of 1 to 10.)
These epoxy resins may be used alone or in combination of both, but the blending amount is 20% by weight or more in total with respect to the total amount of the epoxy resin in order to exhibit its performance. Preferably, it is 30% by weight or more, more preferably 50% by weight or more.
[0025]
Examples of the biphenylene skeleton-containing phenol / aralkyl type epoxy resin include an epoxy resin represented by the following general formula (XI). From the viewpoint of flame retardancy and reflow resistance, R of the following general formula (X) 1 ~ R 8 Is preferably a hydrogen atom, and as such a compound, NC-3000 (manufactured by Nippon Kayaku Co., Ltd.) or the like is commercially available.
Further, from the viewpoint of achieving both flame retardancy, reflow resistance and fluidity, it is preferable to contain an epoxy resin represented by the above general formula (III) and an epoxy resin represented by the following general formula (X). However, R in the following general formula (X) 1 ~ R 8 Is a hydrogen atom and R in the above general formula (III) 1 ~ R 8 Is more preferably a hydrogen atom and n = 0. In particular, the blending weight ratio is preferably (III) / (X) = 50/50 to 5/95, more preferably 40/60 to 10/90, and further preferably 30/70 to 15/85. . As a compound satisfying such a blending weight ratio, CER-3000L (manufactured by Nippon Kayaku Co., Ltd.) and the like are commercially available.
[0026]
Embedded image
(Where R 1 ~ R 9 Is selected from a hydrogen atom, a substituted or unsubstituted alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 10 carbon atoms, an aryl group having 6 to 10 carbon atoms, and an aralkyl group having 6 to 10 carbon atoms, all It may be the same or different. i represents an integer of 0 to 3, and n represents an integer of 0 to 10. )
[0027]
Biphenyl type epoxy resin, stilbene type epoxy resin, sulfur atom-containing epoxy resin, bisphenol F type epoxy resin, novolac type epoxy resin, dicyclopentadiene type epoxy resin, naphthalene type epoxy resin, triphenylmethane type epoxy resin and biphenylene skeleton The contained phenol-aralkyl epoxy resin may be used alone or in combination of two or more, but the blending amount is 50% by weight or more based on the total amount of the epoxy resin. It is preferably 60% by weight or more, more preferably 80% by weight or more.
[0028]
The (B) curing agent used in the present invention is generally used for an epoxy resin molding material for sealing and is not particularly limited. For example, phenol, cresol, resorcin, catechol, bisphenol A, bisphenol F, phenyl Phenols such as phenol and aminophenol and / or naphthols such as α-naphthol, β-naphthol and dihydroxynaphthalene and compounds having an aldehyde group such as formaldehyde, benzaldehyde and salicylaldehyde are condensed or co-condensed in an acidic catalyst. Aralkyls such as phenol / aralkyl resins and naphthol / aralkyl resins synthesized from novolak-type phenolic resins, phenols and / or naphthols and dimethoxyparaxylene or bis (methoxymethyl) biphenyl Kill-type phenol resin, copolymer-type phenol-aralkyl resin in which phenol / novolak structure and phenol-aralkyl structure are random, block or alternately repeated, paraxylylene and / or metaxylylene-modified phenol resin, melamine-modified phenol resin, terpene-modified phenol resin , Dicyclopentadiene-modified phenol resin, cyclopentadiene-modified phenol resin, polycyclic aromatic ring-modified phenol resin, and the like. These may be used alone or in combination of two or more.
Among them, biphenylene skeleton-containing phenol / aralkyl resins and copolymeric phenol / aralkyl resins are preferable from the viewpoint of flame retardancy, and phenol / aralkyl resins and naphthol / aralkyl resins are preferable from the viewpoint of solder reflow resistance and curability. From the viewpoint of low hygroscopicity, dicyclopentadiene type phenol resin is preferable, from the viewpoint of heat resistance, low expansion coefficient and low warpage, triphenylmethane type phenol resin is preferable, and from the viewpoint of curability, novolac type phenol resin It is preferable that it contains at least one of these phenol resins.
[0029]
Examples of the biphenylene skeleton-containing phenol / aralkyl resin include phenol resins represented by the following general formula (XI).
[0030]
Embedded image
(Where R 1 ~ R 9 Is selected from a hydrogen atom, a substituted or unsubstituted alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 10 carbon atoms, an aryl group having 6 to 10 carbon atoms, and an aralkyl group having 6 to 10 carbon atoms, all It may be the same or different. n represents an integer of 0 to 10. )
R in the above formula (XI) 1 ~ R 9 As a C 1-10 alkyl group such as a hydrogen atom, methyl group, ethyl group, propyl group, butyl group, isopropyl group, isobutyl group, etc., and a carbon number of 1 such as a methoxy group, ethoxy group, propoxy group, butoxy group, etc. Selected from an aryl group having 6 to 10 carbon atoms such as an alkoxy group having 10 to 10 carbon atoms, a phenyl group, a tolyl group, and a xylyl group, and an aralkyl group having 6 to 10 carbon atoms such as a benzyl group and a phenethyl group. Groups are preferred. n represents an integer of 0 to 10. Examples of the biphenylene skeleton-containing phenol / aralkyl resin represented by the general formula (XI) include R 1 ~ R 9 In particular, from the viewpoint of melt viscosity, a mixture of condensates containing 50% by weight or more of a condensate having n of 1 or more is preferable.
When the biphenylene skeleton-containing phenol / aralkyl resin is used, its blending amount is preferably 30% by weight or more, more preferably 50% by weight or more, more preferably 60% by weight in order to exhibit its performance. The above is more preferable.
[0031]
Examples of the phenol / aralkyl resin include a phenol / aralkyl resin represented by the following general formula (XII).
[0032]
Embedded image
(Here, R is selected from a hydrogen atom and a substituted or unsubstituted monovalent hydrocarbon group having 1 to 10 carbon atoms, and n represents an integer of 0 to 10)
Examples of R in the above formula (XII) include a hydrogen atom, an alkyl group such as a methyl group, an ethyl group, a propyl group, a butyl group, an isopropyl group, and a t-butyl group, a vinyl group, an allyl group, and a butenyl group. Examples thereof include substituted or unsubstituted monovalent hydrocarbon groups having 1 to 10 carbon atoms such as alkenyl groups, halogenated alkyl groups, amino group-substituted alkyl groups, and mercapto group-substituted alkyl groups. Among them, R is a hydrogen atom. The phenol / aralkyl resin having an average value of n of 0 to 8 is preferable, and specific examples thereof include p-xylylene type zylock and m-xylylene type zylock. When this phenol-aralkyl resin is used, its blending amount is preferably 30% by weight or more, more preferably 50% by weight or more, and more preferably 60% by weight or more based on the total amount of the curing agent in order to exhibit its performance. preferable.
[0033]
Examples of the naphthol / aralkyl resin include naphthol / aralkyl resins represented by the following general formula (XIII).
[0034]
Embedded image
(Where R 1 ~ R 3 All may be the same or different and each represents a hydrogen atom or an alkyl group having 1 to 6 carbon atoms. n is an integer of 0 to 10, j is an integer of 0 to 2, k is an integer of 0 to 4, and r is an integer of 0 to 4. )
R in the above formula (XIII) 1 ~ R 3 Is selected from, for example, a hydrogen atom, a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, an isopropyl group, an isobutyl group, etc. 1 ~ R 3 It is preferable that the average n in one molecule is set in the range of 0 to 4 with hydrogen atoms.
When a naphthol / aralkyl resin is used, its blending amount is preferably 30% by weight or more, more preferably 50% by weight or more based on the total amount of the curing agent in order to exhibit its performance.
[0035]
The phenol / aralkyl resin represented by the general formula (XII) and the naphthol / aralkyl resin represented by the general formula (XIII) may be partially or fully mixed with acenaphthylene from the viewpoint of flame retardancy. . Although acenaphthylene can be obtained by dehydrogenating acenaphthene, a commercially available product may be used. Further, it can be used as a polymer of acenaphthylene or a polymer of acenaphthylene and other aromatic olefins. (B) As a method of pre-mixing part or all of the curing agent with acenaphthylene, (B) a method of finely grinding the curing agent and acenaphthylene, respectively, and mixing them with a mixer or the like in a solid state, dissolving both components A method of removing the solvent after being uniformly dissolved in the solvent, (B) a method of melt-mixing both at a temperature equal to or higher than the softening point of the curing agent and / or acenaphthylene, etc. Therefore, a melt mixing method with less contamination of impurities is preferable. In that case, acenaphthylene may superpose | polymerize or may react with a (B) hardening | curing agent during mixing.
[0036]
Examples of the dicyclopentadiene type phenol resin include a phenol resin represented by the following general formula (XIV).
[0037]
Embedded image
(Where R 1 And R 2 Are independently selected from a hydrogen atom and a substituted or unsubstituted monovalent hydrocarbon group having 1 to 10 carbon atoms, n represents an integer of 0 to 10, and m represents an integer of 0 to 6. )
R in the above formula (XIV) 1 As, for example, a hydrogen atom, an alkyl group such as a methyl group, an ethyl group, a propyl group, a butyl group, an isopropyl group or a t-butyl group, an alkenyl group such as a vinyl group, an allyl group or a butenyl group, a halogenated alkyl group, Examples thereof include substituted or unsubstituted monovalent hydrocarbon groups having 1 to 10 carbon atoms such as amino group-substituted alkyl groups and mercapto group-substituted alkyl groups. Among them, alkyl groups such as methyl groups and ethyl groups and hydrogen atoms are preferable. More preferred are a methyl group and a hydrogen atom. R 2 As, for example, a hydrogen atom, an alkyl group such as a methyl group, an ethyl group, a propyl group, a butyl group, an isopropyl group or a t-butyl group, an alkenyl group such as a vinyl group, an allyl group or a butenyl group, a halogenated alkyl group, Examples thereof include substituted or unsubstituted monovalent hydrocarbon groups having 1 to 10 carbon atoms such as an amino group-substituted alkyl group and a mercapto group-substituted alkyl group. Among them, a hydrogen atom is preferable. Moreover, it is preferable that the average n in 1 molecule is set to the range of 0-4.
When a dicyclopentadiene type phenol resin is used, its blending amount is preferably 30% by weight or more, more preferably 50% by weight or more based on the total amount of the curing agent in order to exhibit its performance.
[0038]
Examples of the triphenylmethane type phenol resin include a phenol resin represented by the following general formula (XV).
[0039]
Embedded image
(Here, R is selected from a hydrogen atom and a substituted or unsubstituted monovalent hydrocarbon group having 1 to 10 carbon atoms, and n represents an integer of 0 to 10)
Examples of R in the above formula (XV) include a hydrogen atom, an alkyl group such as a methyl group, an ethyl group, a propyl group, a butyl group, an isopropyl group, and a t-butyl group, a vinyl group, an allyl group, and a butenyl group. Examples thereof include C1-C10 substituted or unsubstituted monovalent hydrocarbon groups such as alkenyl groups, halogenated alkyl groups, amino group-substituted alkyl groups, mercapto group-substituted alkyl groups, among which methyl groups, ethyl groups, etc. Are preferably an alkyl group and a hydrogen atom, more preferably a methyl group and a hydrogen atom.
When a triphenylmethane type phenol resin is used, its blending amount is preferably 30% by weight or more, more preferably 50% by weight or more, based on the total amount of the curing agent in order to exhibit its performance.
[0040]
Examples of the novolak-type phenol resin include novolak-type phenol resins such as a phenol resin represented by the following general formula (XVI), cresol novolak resin, and the like. Among these, novolak-type phenol resins represented by the following general formula (XVI) are exemplified. preferable.
[0041]
Embedded image
Here, R is selected from a hydrogen atom and a substituted or unsubstituted monovalent hydrocarbon group having 1 to 10 carbon atoms, i represents an integer of 0 to 3, and n represents an integer of 0 to 10. )
Examples of R in the above formula (XVI) include a hydrogen atom, an alkyl group such as a methyl group, an ethyl group, a propyl group, a butyl group, an isopropyl group, and a t-butyl group, a vinyl group, an allyl group, and a butenyl group. Examples thereof include C1-C10 substituted or unsubstituted monovalent hydrocarbon groups such as alkenyl groups, halogenated alkyl groups, amino group-substituted alkyl groups, mercapto group-substituted alkyl groups, among which methyl groups, ethyl groups, etc. Alkyl groups and hydrogen atoms are preferred, hydrogen atoms are more preferred, and the average value of n is preferably 0-8.
When a novolac type phenol resin is used, its blending amount is preferably 30% by weight or more, more preferably 50% by weight or more, based on the total amount of the curing agent in order to exhibit its performance.
[0042]
As a copolymerization type phenol aralkyl resin, the phenol resin shown, for example by the following general formula (XVII) is mentioned.
[0043]
Embedded image
Wherein R is selected from a hydrogen atom, a substituted or unsubstituted monovalent hydrocarbon group having 1 to 12 carbon atoms and a hydroxyl group, all of which may be the same or different. X is a group containing an aromatic ring. N and m represent 0 or an integer of 1 to 10.)
As R in the general formula (XVII), for example, methyl group, ethyl group, propyl group, isopropyl group, n-butyl group, sec-butyl group, t-butyl group, pentyl group, hexyl group, octyl group, Decyl group, chain alkyl group such as dodecyl group, cyclopentyl group, cyclohexyl group, cycloheptyl group, cyclopentenyl group, cyclohexenyl group and other cyclic alkyl groups, benzyl group, phenethyl group and other aryl group-substituted alkyl groups, methoxy group Substituted alkyl group, ethoxy group substituted alkyl group, alkoxy group substituted alkyl group such as butoxy group substituted alkyl group, amino group substituted alkyl group such as dimethylamino group, diethylamino group, hydroxyl group substituted alkyl group, phenyl group, naphthyl group, biphenyl group Unsubstituted aryl group such as, tolyl group, dimethylphenyl group, Alkyl group-substituted aryl groups such as ruphenyl group, butylphenyl group, t-butylphenyl group and dimethylnaphthyl group, alkoxy group substitution such as methoxyphenyl group, ethoxyphenyl group, butoxyphenyl group, t-butoxyphenyl group and methoxynaphthyl group Examples include an aryl group, a dimethylamino group, an amino group-substituted aryl group such as a diethylamino group, and a hydroxyl group-substituted aryl group. Among them, a hydrogen atom or a methyl group is preferable, and n and m represent 0 or an integer of 1 to 10. On average, 6 or less is more preferable.
X in the general formula (XVII) is, for example, an arylene group such as a phenylene group, a biphenylene group or a naphthylene group, an alkyl group-substituted arylene group such as a tolylene group or a xylylene group, an alkoxyl group-substituted arylene group, a benzyl group or a phenethyl group. An aralkyl group, an aralkyl group-substituted arylene group, and the like. Among them, a substituted or unsubstituted phenylene group and a biphenylene group are preferable. As such a compound, HE-510 Sumikin Air Water Chemical Co., Ltd.) and the like are commercially available.
[0044]
Any of the above-mentioned biphenylene skeleton-containing phenol / aralkyl resins, phenol / aralkyl resins, naphthol / aralkyl resins, dicyclopentadiene type phenol resins, triphenylmethane type phenol resins, novolac type phenol resins and copolymeric type phenol / aralkyl resins One kind may be used alone or two or more kinds may be used in combination, but the blending amount is preferably 50% by weight or more, more preferably 60% by weight or more, based on the total amount of phenol resin. 80% by weight or more is more preferable.
[0045]
In the present invention, the equivalent ratio of (A) epoxy resin and (B) curing agent, that is, the ratio of the number of hydroxyl groups in the curing agent to the epoxy group (number of hydroxyl groups in the curing agent / number of epoxy groups in the epoxy resin) is particularly Although there is no restriction | limiting, in order to suppress each unreacted part few, it is preferable to set to the range of 0.5-2, and 0.6-1.3 are more preferable. In order to obtain a sealing epoxy resin molding material excellent in moldability and solder reflow resistance, it is more preferably set in the range of 0.8 to 1.2.
[0046]
The (C) silane compound used in the present invention is not particularly limited as long as it is a compound represented by the following general formula (I) in the skeleton, but R in the following general formula (I) 1 , R 2 As alkyl group such as methyl group, ethyl group, propyl group, butyl group, pentyl group, hexyl group, cyclohexyl group, isopropyl group, isobutyl group, t-butyl group, aryl group such as phenyl group, tolyl group, benzyl group , Phenylethyl group, etc., and R 1 , R 2 May be bonded directly or via a divalent or trivalent atom to form a cyclic structure. In these groups, some or all of the hydrogen atoms may be substituted with halogen atoms. 1 , R 2 Are preferably an alkyl group having 1 to 4 carbon atoms, a phenyl group, etc., the divalent atom is preferably an oxygen atom, and the trivalent atom is preferably a nitrogen atom. R 3 As methylene group, ethylene group, propylene group, butylene group, pentylene group, hexylene group, heptylene group, octylene group, nonylene group, decylene group and other alkylene groups, phenylene group, methylphenylene group, trimethylphenylene group, tetramethyl C1-C10 divalent organic groups such as arylene groups such as phenylene group, ethylphenylene group, and diethylphenylene group, alkylene arylene groups, alkylene groups bonded through nitrogen atoms or oxygen atoms, and the like. From the viewpoint of properties, an alkylene group having 2 to 6 carbon atoms or an alkylene group having 2 to 6 carbon atoms bonded via a nitrogen atom or an oxygen atom is preferable. R 4 As methylene group, ethylene group, propylene group, butylene group, pentylene group, hexylene group, heptylene group, octylene group, nonylene group, decylene group and other alkylene groups, phenylene group, methylphenylene group, trimethylphenylene group, tetramethyl C1-C10 divalent organic groups such as arylene groups such as phenylene group, ethylphenylene group, and diethylphenylene group, alkylene arylene groups, alkylene groups bonded through nitrogen atoms or oxygen atoms, and the like. From the viewpoint of properties, an alkylene group having 2 to 6 carbon atoms is preferable. R 5 As methylene group, ethylene group, propylene group, butylene group, pentylene group, hexylene group, heptylene group, octylene group, nonylene group, decylene group and other alkylene groups, phenylene group, methylphenylene group, trimethylphenylene group, tetramethyl Examples include arylene groups such as phenylene group, ethylphenylene group, and diethylphenylene group, and alkylene arylene groups. From the viewpoint of moldability, alkylene groups having 2 to 6 carbon atoms are preferable. R 6 , R 7 As an alkyl group such as a methyl group, an ethyl group, a propyl group, a butyl group, an isopropyl group, an isobutyl group, a t-butyl group, an alkenyl group such as a vinyl group, an allyl group, a propenyl group, and a butenyl group. 6 hydrocarbon groups are preferable, and an alkyl group having 1 to 6 carbon atoms is preferable. From the viewpoint of moldability or adhesiveness, 1 to 4 carbon atoms such as a methyl group, an ethyl group, a propyl group, and a butyl group are used. The alkyl group is more preferable. M represents an integer of 0 or 1, but is preferably 0 from the viewpoint of fluidity. Although n shows the integer of 1-3, what is 2 or 3 is preferable from an adhesive viewpoint, and what is 3 is more preferable.
[0047]
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(Where R 1 , R 2 Represents a substituted or unsubstituted hydrocarbon group having 1 to 18 carbon atoms, R 1 And R 2 May be bonded to form a ring, or may be bonded via a divalent or trivalent atom. R 3 Is a substituted or unsubstituted hydrocarbon group having 1 to 10 carbon atoms and an organic group bonded via a divalent or trivalent atom. R 4 Is a substituted or unsubstituted hydrocarbon group having 1 to 10 carbon atoms and an organic group bonded via a divalent or trivalent atom, R 5 Is a hydrocarbon group having 1 to 10 carbon atoms, R 6 Is a hydrocarbon group having 1 to 6 carbon atoms, R 7 Represents a hydrogen atom or a hydrocarbon group having 1 to 6 carbon atoms, m represents 0 or 1, and n represents an integer of 1 to 3. )
[0048]
Examples of the compound represented by the general formula (I) include compounds represented by the following general formulas (XVIII) to (XXXXV). From the viewpoint of adhesiveness, fluidity and moldability, it is preferable to use a silane compound containing one or more of the compounds represented by the following general formulas (XXXVI) and (XXXXXXIV).
[0049]
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[0050]
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[0051]
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[0052]
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[0053]
In the sealing epoxy resin molding material of the present invention, a conventionally known coupling agent may be used in combination with the (C) silane compound. For example, vinyltrichlorosilane, vinyltriethoxysilane, vinyltris (β-methoxyethoxy) silane, β- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, γ-glycidoxypropyltrimethoxysilane, vinyltriacetoxysilane, γ-mercaptopropyltrimethoxysilane, γ-aminopropyltriethoxysilane, γ- [bis (β-hydroxyethyl)] aminopropyltriethoxysilane, N-β- (aminoethyl) -γ-aminopropyltriethoxysilane, N- (trimethoxysilylpropyl) ethylenediamine, methyltrimethoxysilane, methyltriethoxysilane, phenyltrimethoxysilane, phenyltriethoxysilane, N-β- (N-vinylbenzylaminoethyl) -γ-aminopropi Silane coupling agents such as rutrimethoxysilane, γ-chloropropyltrimethoxysilane, hexamethyldisilane, γ-anilinopropyltrimethoxysilane, vinyltrimethoxysilane, isopropyltriisostearoyl titanate, isopropyltris (dioctylpyro Phosphate) titanate, isopropyltri (N-aminoethyl-aminoethyl) titanate, tetraoctylbis (ditridecylphosphite) titanate, tetra (2,2-diallyloxymethyl-1-butyl) bis (ditridecyl) phosphite titanate, Bis (dioctylpyrophosphate) oxyacetate titanate, bis (dioctylpyrophosphate) ethylene titanate, isopropyltrioctanoyl titanate, iso Titanate coupling agents such as propyl dimethacrylisostearoyl titanate, isopropyl isostearoyl diacryl titanate, isopropyl tri (dioctyl phosphate) titanate, isopropyl tricumyl phenyl titanate, tetraisopropyl bis (dioctyl phosphite) titanate, aluminum chelates, aluminum / One or more known coupling agents such as zirconium compounds can be used in combination.
[0054]
(C) Although the total compounding quantity of a silane compound does not have a restriction | limiting in particular, it is preferable to mix | blend 0.01 to 2.0 weight% with respect to an inorganic filler, and 0.1 to 1.6 weight% is more preferable. If it is less than 0.01% by weight, the effect of the invention tends to be small, and if it exceeds 2.0% by weight, the moldability tends to decrease.
[0055]
The inorganic filler (D) used in the present invention is not particularly limited, but includes fused silica, crystalline silica, alumina, zircon, calcium silicate, calcium carbonate, silicon carbide, aluminum nitride, boron nitride, beryllia, zirconia and the like. One or more kinds of powder, single crystal fibers such as beads, potassium titanate, silicon carbide, silicon nitride, and alumina, glass fibers, and the like obtained by shaping these can be used. Furthermore, examples of the inorganic filler having a flame retardant effect include aluminum hydroxide, magnesium hydroxide, zinc borate and the like, and these can be used alone or in combination. Among the inorganic fillers, fused silica is preferable from the viewpoint of reducing the linear expansion coefficient, and alumina is preferable from the viewpoint of high thermal conductivity. The shape of the filler is preferably a spherical shape or a shape close to a spherical shape from the viewpoint of fluidity during molding and mold wear.
The blending amount of the inorganic filler is preferably 60% by weight or more, more preferably 70 to 95% by weight with respect to the epoxy resin molding material for sealing, from the viewpoints of moldability, hygroscopicity, reduction of linear expansion coefficient and strength improvement. 75 to 92% by weight is more preferable. If it is less than 60% by weight, the solder reflow resistance tends to be lowered, and if it exceeds 95% by weight, the fluidity tends to be insufficient.
[0056]
A curing accelerator can be used in the epoxy resin molding material of the present invention as necessary. The curing accelerator is generally used in an epoxy resin molding material for sealing and is not particularly limited. For example, 1,8-diazabicyclo [5.4.0] undecene-7,1,5-diazabicyclo Cycloamidine compounds such as [4.3.0] nonene-5,5,6-dibutylamino-1,8-diazabicyclo [5.4.0] undecene-7 and maleic anhydride, 1,4 -Benzoquinone, 2,5-toluquinone, 1,4-naphthoquinone, 2,3-dimethylbenzoquinone, 2,6-dimethylbenzoquinone, 2,3-dimethoxy-5-methyl-1,4benzoquinone, 2,3-dimethoxy- Addition of quinone compounds such as 1,4-benzoquinone and phenyl-1,4-benzoquinone, and compounds with π bonds such as diazophenylmethane and phenol resin Compounds having intramolecular polarization, tertiary amines such as benzyldimethylamine, triethanolamine, dimethylaminoethanol, tris (dimethylaminomethyl) phenol and their derivatives, 2-methylimidazole, 2-phenylimidazole, 2 -Imidazoles such as phenyl-4-methylimidazole and 2-heptadecylimidazole and their derivatives, organic compounds such as tributylphosphine, methyldiphenylphosphine, triphenylphosphine, tris (4-methylphenyl) phosphine, diphenylphosphine and phenylphosphine Phosphines and phosphorous compounds having intramolecular polarization formed by adding a compound having a π bond such as maleic anhydride, the above quinone compound, diazophenylmethane, and phenol resin to these phosphines. Tetraphenylphosphonium tetraphenylborate, tetraphenylphosphonium ethyltriphenylborate, tetrabutylphosphonium tetrabutylborate, etc., tetrasubstituted phosphonium tetrasubstituted borate, 2-ethyl-4-methylimidazole tetraphenylborate, N-methylmorpholine, Examples thereof include tetraphenylboron salts such as tetraphenylborate and derivatives thereof. One of these may be used alone, or two or more thereof may be used in combination.
Among these, an adduct of a tertiary phosphine and a quinone compound is preferable from the viewpoint of curability and fluidity, and an adduct of a cycloamidine compound and a phenol resin is preferable from the viewpoint of storage stability, and diazabicycloundecene. The novolac type phenol resin salt is more preferable. The blending amount of these curing accelerators is preferably 60% by weight or more, more preferably 80% by weight or more, based on the total amount of the curing accelerator.
[0057]
The tertiary phosphine used in the adduct of the tertiary phosphine and the quinone compound is not particularly limited, but examples thereof include dibutylphenylphosphine, butyldiphenylphosphine, ethyldiphenylphosphine, triphenylphosphine, and tris (4-methylphenyl) phosphine. , Tris (4-ethylphenyl) phosphine, tris (4-propylphenyl) phosphine, tris (4-butylphenyl) phosphine, tris (isopropylphenyl) phosphine, tris (t-butylphenyl) phosphine, tris (2,4- Dimethylphenyl) phosphine, tris (2,6-dimethylphenyl) phosphine, tris (2,4,6-trimethylphenyl) phosphine, tris (2,6-dimethyl-4-ethoxyphenyl) phosphine, tris (4 Methoxyphenyl) phosphine, tertiary phosphines are exemplified with an aryl group such as tris (4-ethoxyphenyl) phosphine, triphenylphosphine is preferable in view of moldability.
Further, the quinone compound used for the adduct of the tertiary phosphine and the quinone compound is not particularly limited, and examples thereof include o-benzoquinone, p-benzoquinone, diphenoquinone, 1,4-naphthoquinone, anthraquinone, and the like. P-benzoquinone is preferable from the viewpoint of stability or storage stability.
[0058]
The blending amount of the curing accelerator is not particularly limited as long as the curing acceleration effect is achieved. However, the blending amount of the curing accelerator is 0.00 with respect to 100 parts by weight of the total amount of (A) epoxy resin and (B) curing agent. 1-10 weight part is preferable and 0.3-5 weight part is more preferable. If it is less than 0.1 parts by weight, it is difficult to cure in a short time, and if it exceeds 10 parts by weight, the curing rate tends to be too fast and a good molded product tends not to be obtained.
[0059]
Moreover, an anion exchanger can be blended with the epoxy resin molding material for sealing of the present invention, if necessary, for the purpose of improving the moisture resistance and high temperature storage characteristics of the IC. The anion exchanger is not particularly limited, and conventionally known anion exchangers can be used. Examples thereof include hydrotalcites and hydrated oxides of elements selected from magnesium, aluminum, titanium, zirconium, and bismuth. These may be used alone or in combination of two or more. Of these, hydrotalcite represented by the following composition formula (XXXXVI) is preferable.
[0060]
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Mg 1-X Al X (OH) 2 (CO 3 ) X / 2 ・ MH 2 O ... (XXXXVI)
(0 <x ≦ 0.5, m is a positive number)
The amount of the anion exchanger is not particularly limited as long as it is a sufficient amount capable of capturing anions such as halogen ions, but it is 0.1 to 30 weights with respect to 100 parts by weight of (A) epoxy resin. Part is preferable, and 1 to 5 parts by weight is more preferable.
[0061]
In the sealing epoxy resin molding material of the present invention, an adhesion promoter can be used as necessary in order to further improve the adhesion. Examples of the adhesion promoter include derivatives such as imidazole, triazole, tetrazole and triazine, anthranilic acid, gallic acid, malonic acid, malic acid, maleic acid, aminophenol, quinoline and the like, and derivatives thereof, aliphatic acid amide compounds, Examples thereof include dithiocarbamate and thiadiazole derivatives. One of these may be used alone, or two or more may be used in combination.
[0062]
A release agent may be used in the sealing epoxy resin molding material of the present invention as necessary. As the release agent, it is preferable to use 0.01 to 10 parts by weight, more preferably 0.1 to 5 parts by weight, based on 100 parts by weight of the epoxy resin (A), using an oxidized or non-oxidized polyolefin. . If it is less than 0.01 part by weight, the releasability tends to be insufficient, and if it exceeds 10 parts by weight, the adhesiveness tends to decrease. Examples of the oxidized or non-oxidized polyolefin include low molecular weight polyethylene having a number average molecular weight of about 500 to 10,000, such as H4, PE, and PED series manufactured by Hoechst Corporation. Other examples of the release agent include carnauba wax, montanic acid ester, montanic acid, stearic acid, and the like. These may be used alone or in combination of two or more. When these other release agents are used in combination with the oxidized or non-oxidized polyolefin, the combined amount thereof is 0. 1 to 10 parts by weight is preferable, and 0.5 to 3 parts by weight is more preferable.
[0063]
A conventionally known flame retardant can be blended in the sealing epoxy resin molding material of the present invention as required. For example, red phosphorus coated with inorganic substances such as brominated epoxy resin, antimony trioxide, red phosphorus, aluminum hydroxide, magnesium hydroxide, zinc oxide and / or thermosetting resins such as phenol resin, phosphoric acid ester, etc. Phosphorus compounds, melamine, melamine derivatives, melamine-modified phenol resins, compounds having a triazine ring, nitrogen-containing compounds such as cyanuric acid derivatives and isocyanuric acid derivatives, phosphorus and nitrogen-containing compounds such as cyclophosphazene, aluminum hydroxide, magnesium hydroxide And a composite metal hydroxide represented by the following composition formula (XXXXVII).
[0064]
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p (M 1 aOb) ・ q (M 2 cOd) ・ r (M 3 cOd) ・ mH 2 O (XXXXVII)
(Where M 1 , M 2 And M 3 Represents different metal elements, a, b, c, d, p, q and m are positive numbers, and r is 0 or a positive number. )
M in the above composition formula (XXXXVII) 1 , M 2 And M 3 Are not particularly limited as long as they are different metal elements, but from the viewpoint of flame retardancy, M 1 Is selected from metal elements of the third period, group IIA alkaline earth metal elements, group IVB, group IIB, group VIII, group IB, group IIIA and group IVA, and M 2 Is preferably selected from group IIIB to IIB transition metal elements, 1 Is selected from magnesium, calcium, aluminum, tin, titanium, iron, cobalt, nickel, copper and zinc; 2 Is more preferably selected from iron, cobalt, nickel, copper and zinc. From the viewpoint of fluidity, M 1 Is magnesium, M 2 Is preferably zinc or nickel and r = 0. The molar ratio of p, q and r is not particularly limited, but preferably r = 0 and p / q is 1/99 to 1/1. In addition, the classification of metal elements is a long-period type periodic rate table in which the typical element is the A subgroup and the transition element is the B subgroup (Source: Kyoritsu Shuppan Co., Ltd., “Chemical Dictionary 4”, February 15, 1987) (Reduced plate 30th printing). Further, compounds containing metal elements such as zinc oxide, zinc stannate, zinc borate, iron oxide, molybdenum oxide, zinc molybdate, dicyclopentadienyl iron, etc. may be mentioned, and one of these may be used alone. Two or more kinds may be used in combination. Although the compounding quantity of a flame retardant does not have a restriction | limiting in particular, 1-30 weight part is preferable with respect to 100 weight part of (A) epoxy resins, and 2-15 weight part is more preferable.
Moreover, you may use coloring agents, such as carbon black, an organic dye, an organic pigment, a titanium oxide, a red lead, a bengara, for the epoxy resin molding material for sealing of this invention.
Furthermore, as other additives, stress relaxation agents such as silicone oil and silicone rubber powder can be blended as required.
[0065]
The epoxy resin molding material for sealing of the present invention can be prepared by any method as long as various components can be uniformly dispersed and mixed. A method of cooling and pulverizing after mixing sufficiently, melt kneading with a mixing roll, an extruder or the like can be mentioned. For example, a predetermined amount of the above-described components can be uniformly stirred and mixed, and can be obtained by a method such as kneading, cooling, and pulverizing with a kneader, roll, extruder, or the like that has been heated to 70 to 140 ° C. in advance. It is easy to use if it is tableted with dimensions and weight that match the molding conditions.
[0066]
As an electronic component device provided with an element sealed with an epoxy resin molding material for sealing obtained in the present invention, a semiconductor chip is mounted on a support member such as a lead frame, a wired tape carrier, a wiring board, glass, or a silicon wafer. An electronic component device equipped with active elements such as transistors, diodes and thyristors, and passive elements such as capacitors, resistors and coils, and encapsulated with the epoxy resin molding material for sealing of the present invention Etc. As such an electronic component device, for example, a semiconductor element is fixed on a lead frame, a terminal portion of a device such as a bonding pad and a lead portion are connected by wire bonding or a bump, and then the sealing epoxy resin of the present invention is used. DIP (Dual Inline Package), PLCC (Plastic Leaded Chip Carrier), QFP (Quad Flat Package), SOP (Small Outline Package), SOJ (Small Out Package), which is sealed by molding using a molding material. General resin-encapsulated ICs such as lead package (TSP), TSOP (Thin Small Outline Package), TQFP (Thin Quad Flat Package), and tape key A semiconductor chip connected to the rear by a bump is sealed with a tape carrier package (TCP) sealed with an epoxy resin molding material for sealing of the present invention, wiring formed on a wiring board or glass, wire bonding, flip chip bonding, soldering COB (Chip On Board) in which active elements such as semiconductor chips, transistors, diodes, thyristors, etc. and / or passive elements such as capacitors, resistors, coils, etc. are sealed with the sealing epoxy resin molding material of the present invention. ) After mounting the device on the surface of the module, hybrid IC, multi-chip module, organic substrate on which the wiring board connection terminal is formed on the back surface, connecting the device and the wiring formed on the organic substrate by bump or wire bonding, The device is sealed with the epoxy resin molding material for sealing of the present invention. And BGA (Ball Grid Array), CSP (Chip Size Package) and the like. Moreover, the epoxy resin molding material for sealing of the present invention can also be used effectively for printed circuit boards.
[0067]
As a method for sealing an element using the epoxy resin molding material for sealing of the present invention, a low-pressure transfer molding method is the most common, but an injection molding method, a compression molding method, or the like may be used.
[0068]
【Example】
EXAMPLES Next, although an Example demonstrates this invention, the scope of the present invention is not limited to these Examples.
[0069]
Synthesis Example 1: Synthesis of silane compound 1
About 156.7 g of γ-aminopropyltriethoxysilane was charged into a four-necked flask equipped with a thermometer, a stirrer, and a condenser, and the temperature was raised to 70 ° C. in a nitrogen atmosphere. Next, about 77.2 g of N, N-dimethylacrylamide was added dropwise over 30 minutes, and the mixture was further heated and stirred at 100 ° C. for 8 hours. The reaction mixture was distilled under reduced pressure (138 ° C./1.3 hPa) to obtain a silane compound 1 (colorless transparent liquid, yield 170.2 g, yield 70.5%) represented by the following general formula (XXXVI). .
[0070]
Synthesis Example 2: Synthesis of silane compound 2
About 33.2 g of γ-aminopropyltriethoxysilane was charged into a four-necked flask equipped with a thermometer, a stirrer, and a condenser, and the temperature was raised to 70 ° C. in a nitrogen atmosphere. Next, about 23.3 g of N-acryloylmorpholine was added dropwise over 10 minutes, and the mixture was further heated and stirred at 100 ° C. for 3 hours. Then, this reaction mixture was heated under reduced pressure (130 ° C./1.3 hPa) to remove low-boiling components, whereby the silane compound 2 represented by the following general formula (XXXXIV) (light yellow transparent liquid, yield 53.7 g, yield 95) %).
[0071]
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[0072]
Examples 1 to 86, Comparative Examples 1 to 47
As an epoxy resin, an ortho-cresol novolak type epoxy resin having an epoxy equivalent of 200 and a softening point of 67 ° C. (epoxy resin 1, trade name ESCN-190 manufactured by Sumitomo Chemical Co., Ltd.), an epoxy equivalent of 210 and a stilbene type epoxy resin having a melting point of 120 ° C. Epoxy resin 2, Sumitomo Chemical Co., Ltd. product name ESLV-210), epoxy equivalent 196, biphenyl type epoxy resin having a melting point of 106 ° C. (Epoxy resin 3, Japan Epoxy Resin Co., Ltd. product name YX-4000H), epoxy equivalent 176 , A biphenyl type epoxy resin having a melting point of 111 ° C. (epoxy resin 4, trade name YL-6121H manufactured by Japan Epoxy Resin Co., Ltd.), an epoxy equivalent of 242 and a sulfur atom-containing epoxy resin having a melting point of 118 ° C. (epoxy resin 5, Nippon Steel Corporation Product name YSLV 120TE), dicyclopentadiene type epoxy resin having an epoxy equivalent of 264 and a softening point of 64 ° C. (epoxy resin 6, trade name HP-7200 manufactured by Dainippon Ink & Chemicals, Inc.), naphthalene type epoxy having an epoxy equivalent of 217 and a softening point of 72 ° C. Resin (epoxy resin 7, Nippon Kayaku Co., Ltd., trade name NC-7300), epoxy equivalent 170, softening point 65 ° C. triphenylmethane type epoxy resin (epoxy resin 8, Nippon Kayaku Co., Ltd., trade name EPPN-502H ), Epoxy equivalent 192, bisphenol F type epoxy resin having a melting point of 79 ° C. (epoxy resin 9, trade name YSLV-80XY manufactured by Nippon Steel Chemical Co., Ltd.), epoxy equivalent 241 and biphenylene skeleton-containing phenol aralkyl having a softening point of 96 ° C. Type epoxy resin (Epoxy resin 10, Nippon Kayaku Co., Ltd. Name CER-3000L), epoxy equivalent 375, softening point 80 ° C., bromine content 48% by weight bisphenol A type brominated epoxy resin (epoxy resin 11), as curing agent, hydroxyl equivalent 199, softening point 89 ° C. biphenylene skeleton Type phenolic resin (curing agent 1, trade name MEH-7851 manufactured by Meiwa Kasei Co., Ltd.), hydroxyl equivalent 176, phenol aralkyl resin having a softening point of 70 ° C. (hardening agent 2, trade name Millex XLC manufactured by Mitsui Chemicals, Inc.), hydroxyl group Naphthol aralkyl resin having an equivalent weight of 183 and a softening point of 79 ° C. (curing agent 3, trade name SN-170 manufactured by Nippon Steel Chemical Co., Ltd.), dicyclopentadiene type phenol resin having a hydroxyl equivalent of 170 and a softening point of 93 ° C. (curing agent 4 , Nippon Petrochemical Co., Ltd., trade name DPP), triphenyl group having a hydroxyl equivalent weight of 104 and a softening point of 83 ° C. Tan type phenolic resin (curing agent 5, trade name MEH-7500 manufactured by Meiwa Kasei Co., Ltd.), hydroxyl group equivalent 106, novolac type phenol resin having a softening point of 64 ° C. (hardening agent 6, trade name H-4 manufactured by Meiwa Kasei Co., Ltd.) , Hydroxyl equivalent 156, softening point ° C phenol resin (curing agent 7, trade name HE-510 manufactured by Sumikin Air Water Chemical Co., Ltd.), and silane compound represented by the above general formula (XXXVI) (silane compound) 1), a silane compound (silane compound 2) represented by the above general formula (XXXXIV), γ-glycidoxypropyltrimethoxysilane (silane compound 3), γ-aminopropyltriethoxysilane (silane compound 4), N— Phenyl-γ-aminopropyltrimethoxysilane (silane compound 5), phenyltrimethoxysilane (Si The run compound 6), as the curing accelerator, betaine type adduct of triphenylphosphine and p-benzoquinone (curing accelerator 1), betaine type adduct of tributylphosphine and p-benzoquinone (curing accelerator 2), inorganic The filler has an average particle size of 17.5 μm and a specific surface area of 3.8 m. 2 / G of spherical fused silica, and other additive components such as carnauba wax, antimony trioxide, and carbon black are blended in the weight ratios shown in Tables 1 to 13, under conditions of a kneading temperature of 80 to 90 ° C. and a kneading time of 15 minutes. Roll kneading was performed to produce sealing epoxy resin molding materials of Examples 1 to 86 and Comparative Examples 1 to 47.
[0073]
[Table 1]
[0074]
[Table 2]
[0075]
[Table 3]
[0076]
[Table 4]
[0077]
[Table 5]
[0078]
[Table 6]
[0079]
[Table 7]
[0080]
[Table 8]
[0081]
[Table 9]
[0082]
[Table 10]
[0083]
[Table 11]
[0084]
[Table 12]
[0085]
[Table 13]
[0086]
The epoxy resin molding materials for sealing of Examples and Comparative Examples were evaluated by the following various characteristic tests (1) to (8). The evaluation results are shown in Tables 14 to 26. The epoxy resin molding material for sealing was molded by a transfer molding machine under conditions of a mold temperature of 180 ° C., a molding pressure of 6.9 MPa, and a curing time of 90 seconds. Further, post-curing was performed at 180 ° C. for 5 hours.
(1) Spiral flow
Using a spiral flow measurement mold in accordance with EMMI-1-66, the sealing epoxy molding material was molded under the above conditions, and the flow distance (cm) was determined.
(2) Disc flow
Using a flat plate mold for disk flow measurement having an upper mold of 200 mm (W) × 200 mm (D) × 25 mm (H) and a lower mold of 200 mm (W) × 200 mm (D) × 15 mm (H), 5 g of the sealing epoxy resin molding material weighed with a pan balance is placed on the center of the lower mold heated to 180 ° C., and after 5 seconds, the upper mold heated to 180 ° C. is closed, and the load is 78 N and the curing time is 90 seconds. Compression molding was performed under conditions, the major axis (mm) and minor axis (mm) of the molded product were measured with a caliper, and the average value (mm) was defined as a disc flow.
(3) Heat hardness
The epoxy resin molding material for sealing was molded into a disc having a diameter of 50 mm and a thickness of 3 mm under the above conditions, and was measured immediately after molding using a Shore D type hardness meter.
[0087]
(4) Adhesion retention rate
Under the above conditions, an epoxy resin molding material for sealing is molded on a 30 μm aluminum foil, post-cured to prepare a test piece, and the 90 ° direction of the test piece before and after PCT treatment (121 ° C., 0.2 MPa, 100 hours) The peel strength (N / m) was measured, and the adhesion retention (%) = PCT treated aluminum peel strength / PCT treated aluminum peel strength × 100.
(5) Resistance to solder reflow
An 80-pin flat package with an external dimension of 20 x 14 x 2 mm with an 8 x 10 mm silicone chip mounted on a 42 alloy lead frame is molded and post-cured using the epoxy resin molding material for sealing. , 85 ° C., 85% RH, humidified at 240 ° C. for 10 seconds every 10 hours, and observed for cracks. The number of cracked packages relative to the number of test packages (10) It was evaluated with.
(6) Water absorption rate
The disk molded in the above (3) is post-cured under the above conditions, left for 72 hours under the conditions of 85 ° C. and 85% RH, and the weight change before and after being left is measured to determine the water absorption rate (% by weight) = ( Evaluation was made by the weight of the disc after being left-the weight of the disc before being left) / the weight of the disc before being left x 100.
(7) Glass transition temperature (Tg)
Under the above conditions, an epoxy resin molding material for sealing was molded into a shape of 19 mm × 3 mm × 3 mm and post-cured to prepare a test piece, and a thermomechanical analyzer (TMA-8140, TAS-100) manufactured by Rigaku Denki Co., Ltd. Thus, the glass transition temperature (Tg, unit: ° C) was determined from the inflection point of the linear expansion curve.
(8) Flame resistance
Using a mold for molding a 1/16 inch thick test piece, the epoxy resin molding material for sealing was molded under the above conditions and post-cured, and flame retardancy was evaluated according to the UL-94 test method.
[0088]
[Table 14]
[0089]
[Table 15]
[0090]
[Table 16]
[0091]
[Table 17]
[0092]
[Table 18]
[0093]
[Table 19]
[0094]
[Table 20]
[0095]
[Table 21]
[0096]
[Table 22]
[0097]
[Table 23]
[0098]
[Table 24]
[0099]
[Table 25]
[0100]
[Table 26]
[0101]
As seen in Tables 14-21, Examples 1-86 show better properties in spiral flow, disc flow, and adhesion without reducing curability as compared to Comparative Examples of the same resin composition. . Further, there is almost no defect in the reflow treatment after 72 hours of moisture absorption, and there is no package crack in the reflow treatment after 48 hours of moisture absorption, and the solder reflow resistance is excellent. On the other hand, the comparative example which does not contain the (C) silane compound of the present invention does not satisfy the object of the present invention. That is, in Comparative Examples 1 to 47 shown in Tables 22 to 26, the fluidity is low, 50% or more of package cracks are generated in the reflow treatment after 72 hours of moisture absorption, and the package cracks are also generated in the reflow treatment after 48 hours of moisture absorption. Has occurred and the solder reflow resistance is poor.
[0102]
【The invention's effect】
The epoxy resin molding material for sealing obtained according to the present invention exhibits good characteristics in spiral flow, disc flow and adhesiveness, and excellent solder reflow resistance is obtained without reducing curability. Thus, a highly reliable electronic component device can be obtained, and its industrial value is great.
Claims (4)
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| JP4736406B2 (en) * | 2004-11-18 | 2011-07-27 | 住友ベークライト株式会社 | Epoxy resin composition and semiconductor device |
| JP2007194425A (en) * | 2006-01-19 | 2007-08-02 | Nitto Denko Corp | Tablet-like semiconductor encapsulating material, method for producing the same, and semiconductor device using the same |
| JP5177480B2 (en) * | 2007-06-14 | 2013-04-03 | 日本化薬株式会社 | Epoxy resin composition for semiconductor encapsulation and semiconductor device |
| JP6999335B2 (en) * | 2017-09-01 | 2022-01-18 | Eneos株式会社 | A curable composition, a cured product of the composition, the composition and a method for producing the cured product. |
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