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JP4377641B2 - Wiring board manufacturing method - Google Patents
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JP4377641B2 - Wiring board manufacturing method - Google Patents

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JP4377641B2
JP4377641B2 JP2003333474A JP2003333474A JP4377641B2 JP 4377641 B2 JP4377641 B2 JP 4377641B2 JP 2003333474 A JP2003333474 A JP 2003333474A JP 2003333474 A JP2003333474 A JP 2003333474A JP 4377641 B2 JP4377641 B2 JP 4377641B2
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wiring board
layer
manufacturing
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JP2005101304A (en
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英敏 湯川
桂 林
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Kyocera Corp
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Description

本発明は、有機材料系の配線基板の製造方法に関し、特に、レーザー光を用いて貫通孔を形成する工程を具備するものに関するものである。   The present invention relates to a method for manufacturing an organic material-based wiring substrate, and more particularly to a method including a step of forming a through hole using a laser beam.

従来、半導体素子等の電子部品を搭載するための有機材料系の配線基板として、例えば、ガラス−エポキシ板から成る絶縁層の上下両面に銅箔が被着された両面銅張板を準備するとともに、この両面銅張板を上下に貫通する貫通孔をドリル加工により穿孔し、次に前記上下両面の銅箔上および貫通孔内面に銅から成るめっき層を無電解めっき法および電解めっき法により析出させて前記上下両面の銅箔の上にめっき層を被着するとともに貫通孔の内面にめっき層から成る貫通導体を形成し、次に、前記絶縁層の上下両面に被着された銅箔およびその銅箔に被着しためっき層をフォトリソグラフィー技術を採用して部分的にエッチングして配線導体を形成することによって製作されている。   Conventionally, as an organic material-based wiring board for mounting electronic components such as semiconductor elements, for example, a double-sided copper-clad plate in which copper foils are deposited on both upper and lower surfaces of an insulating layer made of a glass-epoxy plate is prepared. The through-hole penetrating up and down this double-sided copper-clad plate is drilled, and then a copper plating layer is deposited on the upper and lower copper foils and on the inner surface of the through-hole by electroless plating and electrolytic plating. And depositing plating layers on the upper and lower copper foils and forming through conductors made of plating layers on the inner surfaces of the through holes, and then applying the copper foils deposited on the upper and lower surfaces of the insulating layer; The plating layer deposited on the copper foil is manufactured by partially etching the plating layer using a photolithography technique to form a wiring conductor.

また、この配線基板の両面にビルドアップ樹脂層およびビルドアップ配線層を形成することによりビルドアップ配線基板が製作される。なお、このような配線基板においては、貫通導体が被着された貫通孔は通常、エポキシ樹脂等の穴埋め樹脂により充填されている。   Moreover, a buildup wiring board is manufactured by forming a buildup resin layer and a buildup wiring layer on both surfaces of the wiring board. In such a wiring board, the through hole to which the through conductor is attached is usually filled with a filling resin such as an epoxy resin.

ところで、このような有機材料系の配線基板においては、電子装置の小型・薄型化の要求に対応してその配線密度を高めるために、例えば絶縁樹脂板の厚みを0.2〜1mm程度、貫通孔の直径を75〜130μm程度の小さなものとする試みがなされている。また、このような直径が75〜130μm程度の小さな貫通孔を形成するためには、例えば炭酸ガスレーザによる穿孔方法が採用される(特許文献1参照)。
特開2000−91750号公報
By the way, in such an organic material-based wiring board, in order to increase the wiring density in response to the demand for reduction in size and thickness of the electronic device, for example, the insulating resin plate has a thickness of about 0.2 to 1 mm. Attempts have been made to make the hole diameter as small as 75 to 130 μm. Moreover, in order to form such a small through-hole with a diameter of about 75 to 130 μm, for example, a drilling method using a carbon dioxide gas laser is employed (see Patent Document 1).
JP 2000-91750 A

しかしながら、炭酸ガスレーザで穿孔した場合には貫通孔の内面に絶縁層を構成する有機材料のもろい炭化層が形成され、貫通孔の内壁に銅めっき層からなる貫通導体を被着させた後、貫通孔の壁面の炭化層を起点にして貫通導体が剥離してしまい、それにより貫通導体と配線導体との間にクラックが発生して導通不良を起こしてしまうという問題があった。   However, when drilling with a carbon dioxide laser, a brittle carbonized layer of an organic material that forms an insulating layer is formed on the inner surface of the through hole, and a through conductor made of a copper plating layer is deposited on the inner wall of the through hole. There is a problem that the through conductor is peeled off from the carbonized layer on the wall surface of the hole, which causes a crack between the through conductor and the wiring conductor, resulting in poor conduction.

また、貫通導体と穴埋め樹脂との間で剥離が生じ、この配線基板を用いてビルドアップ配線基板を製作した場合、この剥離が起点となりビルドアップ樹脂層にクラックが生じビルドアップ配線層が断線してしまうという問題点も有していた。   In addition, peeling occurs between the through conductor and the hole-filling resin, and when a build-up wiring board is manufactured using this wiring board, the build-up wiring layer is broken due to cracks in the build-up resin layer. It also had the problem of end up.

また、従来行われている一般的な水洗工程は水槽中に浸漬するもの、あるいは対象物全体に水圧が0.1MPa程度のシャワーによる噴きつけを行うものであり、基板の表面に付着した異物を除去することが目的であった。そのため貫通孔内壁にレーザ加工により形成された炭化層を除去することはできなかった。   In addition, a general water washing process that has been performed in the past is to immerse in a water tank, or to spray the entire object with a shower having a water pressure of about 0.1 MPa, and remove foreign matter adhering to the surface of the substrate. The purpose was to remove. Therefore, the carbonized layer formed on the inner wall of the through hole by laser processing could not be removed.

本発明は、かかる従来の問題点に鑑み案出されたものであり、その目的は、レーザー光を用いて穿孔された貫通孔から炭化層を容易に除去することのできる配線基板の製造方法を提供することにある。   The present invention has been devised in view of such conventional problems, and an object of the present invention is to provide a method for manufacturing a wiring board capable of easily removing a carbonized layer from a through hole drilled using a laser beam. It is to provide.

本発明の配線基板の製造方法は、金属箔と、樹脂を含有する絶縁層とを積層した絶縁樹脂板をレーザ加工して、前記金属箔及び前記絶縁層とを貫通する貫通孔を穿孔する工程と、前記貫通孔の軸長方向に10〜60MPaの圧力で交互に異なる向きに液体を流、レーザ加工した際に発生した前記貫通孔の内壁の炭化層を除去する工程とを具備することを特徴とする。 The method of manufacturing a wiring board according to the present invention includes a step of laser processing an insulating resin plate in which a metal foil and an insulating layer containing a resin are laminated, and drilling a through hole penetrating the metal foil and the insulating layer. When, by comprising a step of removing the carbonized layer of the inner wall of the in the axial direction of the through hole at a pressure of 10~60MPa to flow the liquid in different directions alternately, the through holes that occurred when the laser processing It is characterized by.

また、本発明の配線基板の製造方法では、前記液体のそれぞれの向きでの流れを断続的なものとすることが望ましい。 In the wired board manufacturing method of the present invention, intermittent ones and to Rukoto flow at each orientation of the liquid it is desired.

また、本発明の配線基板の製造方法では、前記液体に気泡を含有させることが望ましい。 In the wired board manufacturing method of the present invention, it is desirable to include bubbles in the liquid.

また、本発明の配線基板の製造方法では、前記液体を超音波振動させながら流すことが望ましい。 In the wired board manufacturing method of the present invention, it is desirable to flow the length al is ultrasonically vibrating the liquid.

また、本発明の配線基板の製造方法では、前記液体無機フィラーおよび有機フィラーのうちの少なくとも一方からなる砥粒を含有させることが望ましい。 Moreover, in the manufacturing method of the wiring board of this invention, it is desirable to make the said liquid contain the abrasive grain which consists of at least one of an inorganic filler and an organic filler .

また、本発明の配線基板の製造方法では、前記液体が水を主成分とすることが望ましい。 In the wired board manufacturing method of the present invention, it is desirable that the liquid is mainly composed of water.

また、本発明の配線基板の製造方法では、前記液体防錆剤を含有させることが望ましい。 In the wired board manufacturing method of the present invention, Rukoto contain a rust inhibitor in the liquid is desired.

このような配線基板の製造方法を用いることで、貫通孔に形成された炭化層を容易に除去することができる。また、炭化層のみならず、貫通孔内に付着した塵なども併せて除去することができる。   By using such a method of manufacturing a wiring board, the carbonized layer formed in the through hole can be easily removed. Further, not only the carbonized layer but also dust attached to the through holes can be removed together.

本発明の配線基板の製造方法によれば、絶縁樹脂板にレーザ加工を施すことにより、金属箔および絶縁樹脂板を貫通する貫通孔を設けることができるが、熱により絶縁樹脂板の樹脂が変質して、貫通孔の内壁には炭化層が形成される。この炭化層は絶縁樹脂板のレーザ加工に伴う熱変質層であり、機械強度が絶縁樹脂板の樹脂部に比較して極端に弱く、信頼性テストでクラックの起点となる可能性が高いため、除去する必要がある。   According to the method for manufacturing a wiring board of the present invention, by performing laser processing on the insulating resin plate, a through-hole penetrating the metal foil and the insulating resin plate can be provided, but the resin of the insulating resin plate is altered by heat. Thus, a carbonized layer is formed on the inner wall of the through hole. This carbonized layer is a heat-affected layer that accompanies laser processing of the insulating resin plate, and its mechanical strength is extremely weak compared to the resin part of the insulating resin plate, and is likely to be the starting point of cracks in the reliability test. Need to be removed.

本発明では貫通孔の軸長方向に液体を流ことにより、貫通孔の内壁に形成された炭化層を除去することができる。 In the present invention by to flow the liquid in the axial direction of the through hole, it is possible to remove the char layer formed on the inner wall of the penetrations holes.

また、前記体の圧力を10〜60MPaとすることでレーザ加工に伴う熱変質層である炭化層を確実に除去でき、また、液圧が強すぎて配線基板の銅箔がはがれてしまうなどして歩留まりを低下させることもない。 Further, the liquid material pressure can reliably remove the carbide layer is a heat affected layer due to laser processing by the 10 ~60MPa of, also, such as a copper foil of the wiring board fluid pressure too strong peels off Thus, the yield is not reduced.

また、前記液体を貫通孔に交互に異なる向きにことにより、炭化層に異なる向きから力が加えられるために、炭化層があたかも振動するかのような挙動を示すため、低い液圧で炭化層を除去することが可能となる。また、同じ液圧の場合には、処理時間を短縮することができる。 Further, by to flow the liquid to alternately different directions in the through hole, because a force is applied from a different direction to the carbide layer, to show the behavior as if carbide layer though vibrates at a lower hydraulic pressure It is possible to remove the carbonized layer. Further, in the case of the same hydraulic pressure, the processing time can be shortened.

また、前記液体を断続的に流ことにより、最も衝撃の強い液体が炭化層にぶつかる瞬間が繰り返されるため、低い液圧で炭化層を除去することが可能となる。また、同じ液圧の場合には、処理時間を短縮することができる。 Further, by to flow the liquid intermittently, the most since the impact strong liquid is repeated instantaneously striking the carbide layer, it becomes possible to remove the carbonized layer at a low hydraulic pressure. Further, when the hydraulic pressure is the same, the processing time can be shortened.

また、前記液体を貫通孔に流際の圧力を変化させ、脈動するように強弱をつけることで処理時間を短縮することできる。 Further, the liquid is varied the pressure at which to flow into the through hole, it is also possible to shorten the processing time by giving the strength to pulsations.

また、前記液体に気泡を含有させることで、気泡が目標物にぶつかった際に気泡がはじけるバブリング効果により、炭化層の除去効果を増大させることができる。 Further, in Rukoto contain a bubble in the liquid, the bubbling effect popping bubbles when the bubbles hit the target, it is possible to increase the removing effect of the carbide layer.

また、前記液体を超音波振動させながら流すことにより物理的な除去効果がさらに向上する。 Also, physical removal effect is further improved by flowing the liquid while ultrasonic vibration.

また、液体に砥粒を含有させることで液体の衝撃力、摩擦力が向上するため液体の炭化層除去能力をあげることができ、処理時間を短縮することができる。   Further, by adding abrasive grains to the liquid, the impact force and frictional force of the liquid are improved, so that the ability of removing the carbonized layer of the liquid can be increased, and the processing time can be shortened.

また、前記液体に一般的に液体よりも比重が重く、硬い無機フィラーを含有させることにより、無機フィラーを含む液体が目標物に衝突した際の衝撃が大きくなり、処理時間を短縮することができる。 Moreover, the generally heavy specific gravity than the liquid in the liquid, by containing a hard inorganic filler, impact when the liquid containing the inorganic filler has collided with the target increases, it is possible to shorten the processing time .

また、有機フィラーは柔軟性を有するため、有機フィラーが対象に衝突する際の衝撃は比較的小さいため、炭化層の除去効果を向上させるとともに、絶縁樹脂板へのダメージを緩和することができる。   In addition, since the organic filler has flexibility, the impact when the organic filler collides with the target is relatively small, so that the effect of removing the carbonized layer can be improved and damage to the insulating resin plate can be reduced.

また、洗浄に使用する液体に無機フィラーと有機フィラーの双方を含有させることにより炭化層に十分な衝撃をあたえることができるとともに、絶縁樹脂板へのダメージを低減することが可能となる。   Further, by adding both the inorganic filler and the organic filler to the liquid used for cleaning, it is possible to give a sufficient impact to the carbonized layer and reduce damage to the insulating resin plate.

また、液体の主成分を水とすることで絶縁樹脂板に不必要な成分を残存させることなく、また、原料コスト面でも有利であり、装置の価格も安価なものとすることができる。   In addition, by using water as the main component of the liquid, unnecessary components do not remain on the insulating resin plate, which is advantageous in terms of raw material costs, and the price of the apparatus can be reduced.

また、前記液体に防錆剤を含有させることで、貫通孔に液体を流た後に絶縁樹脂板表面の銅の酸化を防止することができる。 Further, in Rukoto it contains a rust inhibitor to the liquid, after the flow of liquid into the through hole can prevent oxidation of the copper of the insulating resin sheet surface.

本発明の製造方法によって製造される配線基板は、例えば、図1に示すように絶縁層1に貫通孔3が設けられており、この貫通孔3には、絶縁層1の両面を電気的に接続する貫通導体5が設けられている。そして、貫通導体5が取り囲んで形成する空間には埋め込み樹脂7が充填されている。また、絶縁層1の両面には、金属箔9とめっき層11とからなる配線導体13が形成されている。   The wiring board manufactured by the manufacturing method of the present invention is provided with through holes 3 in the insulating layer 1 as shown in FIG. 1, for example, and both sides of the insulating layer 1 are electrically connected to the through holes 3. A connecting through conductor 5 is provided. A space formed by surrounding the through conductor 5 is filled with an embedded resin 7. In addition, wiring conductors 13 made of a metal foil 9 and a plating layer 11 are formed on both surfaces of the insulating layer 1.

絶縁層1は、例えば、ガラスクロスにエポキシ樹脂やビスマレイミドトリアジン樹脂・ポリフェニレンエーテル樹脂等の樹脂を含浸させた厚みが0.2〜0.8mmの平板である。   The insulating layer 1 is, for example, a flat plate having a thickness of 0.2 to 0.8 mm in which glass cloth is impregnated with a resin such as an epoxy resin, a bismaleimide triazine resin, or a polyphenylene ether resin.

この絶縁層1は、その厚みを0.2mm以上とすることで、絶縁層1および金属箔9を貫通して複数の貫通孔3を形成したり、あるいは絶縁層1の上下両面に配線導体13を形成したり、さらには穴埋め樹脂7を形成する際等に印加される熱や外力等の影響により、発生する配線基板の反り、変形を抑制することができ、配線基板に要求される平坦度を確保することができる。また、絶縁基板1の厚みを0.8mm以下とすることで、貫通孔3の内部に貫通導体5を形成するときに、貫通孔3の内壁にめっき液を浸入させやすくなり、貫通導体5を良好に形成することできる。したがって、絶縁層1の厚みは0.2〜0.8mmの範囲が好ましい。   The insulating layer 1 has a thickness of 0.2 mm or more, thereby forming a plurality of through holes 3 penetrating the insulating layer 1 and the metal foil 9, or wiring conductors 13 on both upper and lower surfaces of the insulating layer 1. Can be prevented from being warped or deformed due to the influence of heat or external force applied when forming the hole filling resin 7 or the like, and the flatness required for the wiring board Can be secured. Further, by setting the thickness of the insulating substrate 1 to 0.8 mm or less, when the through conductor 5 is formed inside the through hole 3, the plating solution can easily enter the inner wall of the through hole 3. It can be formed satisfactorily. Therefore, the thickness of the insulating layer 1 is preferably in the range of 0.2 to 0.8 mm.

なお、絶縁層1は、ガラスクロスに含浸させるエポキシ樹脂やビスマレイミドトリアジン樹脂・ポリフェニレンエーテル樹脂等の樹脂中にシリカやアルミナあるいはアラミド樹脂等から成るフィラーをガラスクロス部分と樹脂部分とでレーザ光の透過度が略同等となる程度に含有させておけば、絶縁層1と金属箔9との積層体である絶縁樹脂板にレーザ光で貫通孔3を穿孔する際に、貫通孔3を略均一な大きさで良好に形成することが可能となる。したがって、絶縁層1のガラスクロスに含浸させるエポキシ樹脂やビスマレイミドトリアジン樹脂・ポリフェニレンエーテル樹脂等の樹脂中にはシリカやアルミナあるいはアラミド樹脂等から成るフィラーをガラスクロス部分と樹脂部分とでレーザ光の透過度が略同等となるように含有させておくことが好ましい。   The insulating layer 1 is made of a resin material such as epoxy resin, bismaleimide triazine resin, polyphenylene ether resin or the like impregnated into a glass cloth. If it is contained so as to have substantially the same transmittance, the through-holes 3 are made substantially uniform when the through-holes 3 are drilled with a laser beam in an insulating resin plate that is a laminate of the insulating layer 1 and the metal foil 9. It is possible to form a favorable size. Therefore, in the resin such as epoxy resin, bismaleimide triazine resin, and polyphenylene ether resin impregnated into the glass cloth of the insulating layer 1, a filler made of silica, alumina, aramid resin, or the like is irradiated with laser light between the glass cloth portion and the resin portion. It is preferable to make it contain so that the transmittance | permeability may become substantially equivalent.

また、ガラスクロスを含まない絶縁層1であってもよく、また、液晶ポリマーからなる絶縁層1を用いて熱膨張係数を適宜調整することもできる。また、あるいは、これらの絶縁層1を複数の種類用いて、熱膨張係数や強度などの特性を調整することも可能である。   Moreover, the insulating layer 1 which does not contain a glass cloth may be sufficient, and a thermal expansion coefficient can also be adjusted suitably using the insulating layer 1 which consists of a liquid crystal polymer. Alternatively, it is also possible to adjust characteristics such as a coefficient of thermal expansion and strength by using a plurality of types of these insulating layers 1.

また、絶縁層1の上下両面に被着された配線導体13は、例えば、厚みが3〜18μmの銅箔9に銅めっき等のめっき層11を被着させてなり、配線基板に搭載される電子部品(図示せず)の電極を外部電気回路基板の配線導体(図示せず)に電気的に接続するための導電路の一部として機能し、上面側の配線導体層13には、電子部品の電極が半田等の導電性接合部材を介して接続される電子部品接続パッドおよびこの電子部品接続パッドから引き回される配線パターン等が形成されており、下面側の配線導体層13には、外部電気回路基板の配線導体に半田等の導電性接合部材を介して接続される外部接続パッド等が形成されている。   Further, the wiring conductor 13 deposited on the upper and lower surfaces of the insulating layer 1 is mounted on a wiring board, for example, by depositing a plating layer 11 such as copper plating on a copper foil 9 having a thickness of 3 to 18 μm. It functions as a part of a conductive path for electrically connecting an electrode of an electronic component (not shown) to a wiring conductor (not shown) of an external electric circuit board. An electronic component connection pad to which the electrode of the component is connected through a conductive bonding member such as solder and a wiring pattern drawn from the electronic component connection pad are formed. In addition, an external connection pad connected to the wiring conductor of the external electric circuit board via a conductive bonding member such as solder is formed.

なお、配線導体13を構成する銅箔9は、その厚みを5μm以上とすることで、配線導体13に貫通孔3を形成した後に無電解銅めっきの前処理として行なわれるマイクロエッチング時に銅箔9がエッチングされて銅箔9のピンホールまたは銅箔9の欠損を生じず、銅箔9への銅めっき11の付き周り性や密着力が十分確保できる。他方、20μm以下とすることで、銅箔9に銅めっき等のめっき層11を良好に形成することができる。したがって配線導体13を構成する銅箔9の厚みは5〜20μm、最適には10〜15μmの範囲とすることが望ましい。   The copper foil 9 constituting the wiring conductor 13 has a thickness of 5 μm or more, so that the copper foil 9 is formed during microetching performed as a pretreatment for electroless copper plating after the through hole 3 is formed in the wiring conductor 13. Is not etched to cause pinholes in the copper foil 9 or defects in the copper foil 9, and sufficient adhesion and adhesion of the copper plating 11 to the copper foil 9 can be secured. On the other hand, the plating layer 11 such as copper plating can be satisfactorily formed on the copper foil 9 by setting the thickness to 20 μm or less. Therefore, the thickness of the copper foil 9 constituting the wiring conductor 13 is desirably in the range of 5 to 20 μm, and optimally in the range of 10 to 15 μm.

また、配線導体13は、これらを構成する銅箔9とそれに被着しためっき層11との合計の厚みが8μm未満であると、配線導体13の電気抵抗が高いものとなり、他方、30μmを超えると、配線導体13を高密度の配線パターンに形成することが困難となる。したがって、配線導体13を構成する銅箔9とこの銅箔9に被着しためっき層11との合計の厚みは、8〜30μmの範囲が好ましい。   In addition, when the total thickness of the copper foil 9 constituting the wiring conductor 13 and the plating layer 11 deposited thereon is less than 8 μm, the wiring conductor 13 has high electrical resistance, and on the other hand, exceeds 30 μm. It becomes difficult to form the wiring conductor 13 in a high-density wiring pattern. Therefore, the total thickness of the copper foil 9 constituting the wiring conductor 13 and the plating layer 11 deposited on the copper foil 9 is preferably in the range of 8 to 30 μm.

また、絶縁樹脂板を貫通して直径が75〜130μmの貫通孔3が形成されることが望ましく、この貫通孔3の内壁に金属メッキを施すことにより貫通導体5が形成される。貫通孔3は、貫通導体5を絶縁層1の上面から下面にかけて導出させるための導出路を提供するためのものであり、レーザ加工により穿孔されている。   Further, it is desirable that the through hole 3 having a diameter of 75 to 130 μm is formed through the insulating resin plate, and the through conductor 5 is formed by performing metal plating on the inner wall of the through hole 3. The through hole 3 is provided to provide a lead-out path for leading the through conductor 5 from the upper surface to the lower surface of the insulating layer 1 and is drilled by laser processing.

この貫通孔3は、その直径が絶縁層1の断面の略中央部においては75〜115μmで略同じ大きさであり、絶縁層1の開口部で90〜130μmとなるように外側に向かって拡径させておくことが好ましい。   The through-hole 3 has a diameter of 75 to 115 μm at the substantially central portion of the cross section of the insulating layer 1 and substantially the same size, and expands outward so as to be 90 to 130 μm at the opening of the insulating layer 1. It is preferable to keep the diameter.

そして、このように貫通孔3の孔径を75〜130μmと微細にした場合には、貫通孔3の大きさが小さくなるため、貫通導体5を高密度で配置することができ、極めて高密度な配線を有する配線基板を得ることができる。   And when the hole diameter of the through-hole 3 is made as fine as 75 to 130 μm in this way, the size of the through-hole 3 becomes small, so that the through conductors 5 can be arranged at high density, and the extremely high density A wiring board having wiring can be obtained.

また、貫通孔3は、その直径が外側に向かって広がっていることにより、貫通孔3の内部にめっき金属を被着させて貫通導体5を形成する際に、貫通導体5を形成するためのめっき液が貫通孔3の内部に良好に入り込み、その結果、貫通孔3内に貫通導体5を良好に被着・形成することができる。なお、貫通孔3の直径が75μm以上の場合、貫通孔3の内部にめっき金属を充填して貫通導体5を形成する際に、貫通導体5を形成するためのめっき液が貫通孔3の内部に良好に入り込み貫通孔3の内部にめっき金属を被着させて貫通導体5を良好に形成することが可能となり、他方、130μm以下の場合、貫通導体5および配線導体13を高密度で配置することが可能となる。したがって、貫通孔3の直径は、75〜130μmの範囲が好ましい。   Moreover, when the through-hole 3 forms the through-conductor 5 when depositing a plating metal inside the through-hole 3 and forming the through-conductor 5 due to the diameter expanding toward the outside, The plating solution enters the inside of the through hole 3 favorably, and as a result, the through conductor 5 can be satisfactorily deposited and formed in the through hole 3. In addition, when the diameter of the through hole 3 is 75 μm or more, when forming the through conductor 5 by filling the inside of the through hole 3 with a plating metal, a plating solution for forming the through conductor 5 is formed inside the through hole 3. The through conductor 5 can be satisfactorily formed by depositing the plated metal inside the through hole 3, and when the thickness is 130 μm or less, the through conductor 5 and the wiring conductor 13 are arranged at high density. It becomes possible. Therefore, the diameter of the through hole 3 is preferably in the range of 75 to 130 μm.

さらに、貫通孔3の開口部における直径が絶縁層1の厚み方向の略中央部における直径よりも10μm以上大きい場合には、貫通孔3の内部にめっき金属を充填して貫通導体5を形成する際に、貫通導体5を形成するためのめっき液が貫通孔3の内部に良好に入り込み、貫通孔3内に貫通導体5を良好に被着・形成することが可能となり、また、貫通孔3の開口部における直径が絶縁樹脂板の厚み方向の略中央部における直径よりも大きく、その差が50μm以下の場合には、そのような形状を有する貫通孔3を安定して形成することが可能となる。したがって、貫通孔3の開口部における直径は、絶縁層1の厚み方向の略中央部における直径よりも10〜50μm大きいことが好ましい。   Furthermore, when the diameter at the opening of the through hole 3 is 10 μm or more larger than the diameter at the substantially central portion in the thickness direction of the insulating layer 1, the through conductor 3 is formed by filling the inside of the through hole 3 with a plating metal. At this time, the plating solution for forming the through conductor 5 enters the inside of the through hole 3 favorably, so that the through conductor 5 can be satisfactorily deposited and formed in the through hole 3. When the diameter of the opening is larger than the diameter at the substantially central portion in the thickness direction of the insulating resin plate and the difference is 50 μm or less, the through-hole 3 having such a shape can be stably formed. It becomes. Therefore, it is preferable that the diameter at the opening of the through hole 3 is 10 to 50 μm larger than the diameter at the substantially central portion in the thickness direction of the insulating layer 1.

また、貫通孔3内に被着・形成された貫通導体5は銅めっき等のめっき金属から成り、絶縁層1を挟んで上下に位置する配線導体13同士を互いに電気的に接続する接続導体として機能する。そして、貫通孔3が上述したように外側に向けて拡径する形状となっていることから、貫通孔3内にめっき層5を被着させることにより良好に被着・形成されている。   Further, the through conductor 5 deposited and formed in the through hole 3 is made of a plating metal such as copper plating, and serves as a connection conductor for electrically connecting the wiring conductors 13 positioned above and below the insulating layer 1 with each other. Function. Since the through hole 3 has a shape that expands toward the outside as described above, the plated layer 5 is deposited and formed satisfactorily by depositing the plating layer 5 in the through hole 3.

次に、図1に示した配線基板を製造する本発明の配線基板の製造方法について、図2(a)〜図5(g)を用いて詳細に説明する。なお、本実施例においても、直径が75〜130μmと微細な貫通孔3を有するとともに、厚みが0.2〜0.8mmの薄型の配線基板を製造する場合の例を示している。   Next, a method for manufacturing the wiring board of the present invention for manufacturing the wiring board shown in FIG. 1 will be described in detail with reference to FIGS. 2 (a) to 5 (g). In this embodiment as well, an example is shown in which a thin wiring board having a diameter of 75 to 130 μm and a fine through hole 3 and a thickness of 0.2 to 0.8 mm is manufactured.

まず、図2(a)に示すように、例えばガラスクロスにエポキシ樹脂やビスマレイミドトリアジン樹脂・ポリフェニレンエーテル樹脂等の樹脂を含浸させた厚みが0.2〜0.8mmの絶縁層1の両面に厚みが5〜20μmの金属箔9である銅箔9が被着形成された両面銅張板である絶縁樹脂板15を準備する。   First, as shown in FIG. 2 (a), for example, glass cloth is impregnated with an epoxy resin, a resin such as a bismaleimide triazine resin or a polyphenylene ether resin, on both surfaces of the insulating layer 1 having a thickness of 0.2 to 0.8 mm. An insulating resin plate 15 which is a double-sided copper-clad plate on which a copper foil 9 which is a metal foil 9 having a thickness of 5 to 20 μm is deposited is prepared.

なお、絶縁層1は、その厚みを0.2mm以上とすることで、絶縁層1および銅箔9を貫通して複数の貫通孔3を形成したり、さらには穴埋め樹脂7を形成する際等に印加される熱や外力等の影響で配線基板に反りや変形が発生して配線基板に要求される平坦度を確保できなくなってしまう危険性を小さくすることができ、また、その厚みを0.8mm以下とすることで、後述するように貫通孔3の内壁にめっきを被着して貫通導体5を形成するとき、貫通孔3内にめっき液が浸入しにくくなり、貫通導体5に断線が発生しやすくなるということがない。したがって、厚みが0.2〜0.8mmの絶縁樹脂板15を用いることが好ましい。   Note that the insulating layer 1 has a thickness of 0.2 mm or more, so that a plurality of through holes 3 are formed through the insulating layer 1 and the copper foil 9, and further, when the hole filling resin 7 is formed. The risk of warping or deformation of the wiring board due to the influence of heat or external force applied to the wiring board to prevent the flatness required of the wiring board from being ensured can be reduced, and the thickness can be reduced to 0. By setting the thickness to .8 mm or less, when the through conductor 5 is formed by depositing the plating on the inner wall of the through hole 3 as will be described later, it is difficult for the plating solution to enter the through hole 3 and the through conductor 5 is broken. Is not likely to occur. Therefore, it is preferable to use the insulating resin plate 15 having a thickness of 0.2 to 0.8 mm.

また、銅箔9は、その厚みを5μm以上とすることで、貫通孔3形成後のめっきの前処理として行なわれるマイクロエッチング時に銅箔9がエッチングされて銅箔9にピンホールまたは欠損を生じず、銅箔9へのめっきの付き周り性や密着力を強くすることができる。   Further, by setting the thickness of the copper foil 9 to 5 μm or more, the copper foil 9 is etched at the time of microetching performed as a pretreatment for plating after the formation of the through hole 3, thereby causing pinholes or defects in the copper foil 9. Therefore, it is possible to enhance the adhesion and adhesion of the plating on the copper foil 9.

また、銅箔9の厚みを20μm以下とすることで、貫通孔3をレーザ加工により穿孔する場合に、直径が75〜130μmの貫通孔3を安定して形成することが可能となる。したがって、5〜20μmの厚みの銅箔9を用いることが望ましい。   Moreover, when the thickness of the copper foil 9 is 20 μm or less, when the through hole 3 is drilled by laser processing, the through hole 3 having a diameter of 75 to 130 μm can be stably formed. Therefore, it is desirable to use a copper foil 9 having a thickness of 5 to 20 μm.

このような銅箔9は、例えば、絶縁層1の上下全面に厚みが8〜40μm程度の銅箔9を貼着するとともに、この銅箔9を硫酸−過酸化水素水などの銅エッチング液で膜厚が均一となるようにエッチングし、厚みが5〜20μmとなるように加工して形成される。   For example, such a copper foil 9 is affixed to the upper and lower surfaces of the insulating layer 1 with a copper foil 9 having a thickness of about 8 to 40 μm, and the copper foil 9 is made of a copper etching solution such as sulfuric acid-hydrogen peroxide solution. It is formed by etching so that the film thickness becomes uniform and processing so that the thickness becomes 5 to 20 μm.

次に、図2(b)に示すように、レーザ加工により絶縁樹脂板15を貫通する直径が75〜130μmで、絶縁層1の表層において外側に向けて拡径する貫通孔3を穿孔する。   Next, as shown in FIG. 2 (b), a through hole 3 having a diameter of 75 to 130 μm penetrating the insulating resin plate 15 and expanding toward the outside in the surface layer of the insulating layer 1 is drilled by laser processing.

なお、この場合、貫通孔3の内壁にはレーザ加工に伴なって厚みが数μm以下程度の炭化層17が形成される。   In this case, a carbonized layer 17 having a thickness of about several μm or less is formed on the inner wall of the through hole 3 along with the laser processing.

このように、貫通孔3の直径を75〜130μmと微細とした場合には、貫通導体5および配線導体13を形成する際に貫通導体5および配線導体13を高密度で配置することができ、それにより高密度な配線基板を得ることができる。また、貫通孔3の孔径が外側に向かって広がっていることから、貫通孔3の内部にめっき金属を充填して貫通導体5を形成する際に、貫通導体5を形成するためのめっき液が貫通孔3の内部に良好に入り込み、その結果、貫通孔3内に貫通導体5を良好に形成することができる。   Thus, when the diameter of the through hole 3 is as fine as 75 to 130 μm, the through conductor 5 and the wiring conductor 13 can be arranged with high density when the through conductor 5 and the wiring conductor 13 are formed. Thereby, a high-density wiring board can be obtained. Moreover, since the hole diameter of the through-hole 3 is expanding outward, when the through-conductor 5 is formed by filling the inside of the through-hole 3 with a plating metal, a plating solution for forming the through-conductor 5 is used. As a result, the through conductor 5 can be satisfactorily formed in the through hole 3.

なお、貫通孔3の孔径が75μm以上の場合、貫通孔3の内層にめっき金属を被着して貫通導体5を形成する際に、貫通導体5を形成するためのめっき液が貫通孔3の内部に良好に入り込み、貫通孔3の内部に貫通導体5を良好に形成することが可能となり、他方、130μm以下では、貫通導体5および配線導体13を高密度で配置することが可能となる。したがって、貫通孔3の直径は、75〜130μmの範囲が好ましい。   In addition, when the hole diameter of the through hole 3 is 75 μm or more, when forming the through conductor 5 by depositing a plating metal on the inner layer of the through hole 3, a plating solution for forming the through conductor 5 is used in the through hole 3. The inside of the through hole 3 can be satisfactorily formed, and the through conductor 5 can be satisfactorily formed inside the through hole 3. On the other hand, when the thickness is 130 μm or less, the through conductor 5 and the wiring conductor 13 can be arranged with high density. Therefore, the diameter of the through hole 3 is preferably in the range of 75 to 130 μm.

また、貫通孔3の開口部における直径が、絶縁層1の厚み方向の略中央部における直径よりも10μm以上大きい場合には、貫通孔3の内層にめっき金属を被着して貫通導体5を形成する際に、貫通導体5を形成するためのめっき液が貫通孔3の内部に良好に入り込み貫通孔3の内部に貫通導体5を良好に形成することが可能となり、また、貫通孔3の開口部における直径が絶縁層1の厚み方向の略中央部における直径よりも50μmを超えない範囲で大きい場合には、そのような形状を有する貫通孔3を安定して形成することが可能となる。したがって、貫通孔3の開口部における直径は、絶縁層1の略中央部における直径よりも10〜50μm程度大きくしておくことが好ましい。   Further, when the diameter of the opening of the through hole 3 is 10 μm or more larger than the diameter at the substantially central portion in the thickness direction of the insulating layer 1, a plated metal is deposited on the inner layer of the through hole 3 to form the through conductor 5. At the time of forming, the plating solution for forming the through conductor 5 can enter the inside of the through hole 3 well and form the through conductor 5 inside the through hole 3. When the diameter at the opening is larger than the diameter at the substantially central portion in the thickness direction of the insulating layer 1 in a range not exceeding 50 μm, the through hole 3 having such a shape can be stably formed. . Therefore, it is preferable that the diameter of the opening of the through hole 3 is about 10 to 50 μm larger than the diameter of the substantially central portion of the insulating layer 1.

なお、絶縁層1および銅箔9に貫通孔3を形成するには、銅箔9上に例えばレーザ光のエネルギーを良好に吸収する黒色もしくは黒色に近い色を有する樹脂から成るレーザ加工用シートを貼着し、このレーザ加工用シートの上から炭酸ガスレーザ光を照射する方法、もしくは銅箔9の表面を算術平均粗さRaで0.2〜2μmの範囲で表面を粗化した後、その銅箔9に酸化雰囲気150℃で30分程度の熱処理を施し、その表面をレーザ光のエネルギーを良好に吸収する黒色もしくは黒色に近い色を有する色として炭酸ガスレーザ光を照射する方法のどちらかの方法を使用し、8〜30mJの出力の炭酸ガスレーザ光を40〜240μ秒のパルス幅で所定の位置に照射して貫通孔3を穿孔する方法が採用される。   In order to form the through hole 3 in the insulating layer 1 and the copper foil 9, a laser processing sheet made of a resin having a black color or a color close to black, for example, which absorbs laser beam energy satisfactorily on the copper foil 9 is used. A method of attaching and irradiating the laser processing sheet with a carbon dioxide laser beam, or roughening the surface of the copper foil 9 with an arithmetic average roughness Ra in the range of 0.2 to 2 μm, and then the copper Either a method of performing a heat treatment for about 30 minutes at 150 ° C. in an oxidizing atmosphere on the foil 9 and irradiating the surface thereof with carbon dioxide laser light as a color having a black color or a color close to black that absorbs laser light energy well Is used to irradiate a predetermined position with a carbon dioxide laser beam with an output of 8 to 30 mJ at a pulse width of 40 to 240 [mu] sec to perforate the through-hole 3.

このとき、炭酸ガスレーザ光の出力を8mJ以上とすることで、貫通孔3を十分な大きさに穿孔することが可能となる。また、30mJ以下とすることで絶縁層1における貫通孔3の孔径を精度よく形成することができる。したがって、照射する炭酸ガスレーザ光は、その出力が8〜30mJでパルス幅が40〜240μ秒の範囲ですることが好ましい。   At this time, by setting the output of the carbon dioxide laser beam to 8 mJ or more, the through hole 3 can be drilled to a sufficient size. Moreover, the hole diameter of the through-hole 3 in the insulating layer 1 can be accurately formed by setting it as 30 mJ or less. Therefore, it is preferable that the carbon dioxide laser beam to be irradiated has an output of 8 to 30 mJ and a pulse width of 40 to 240 μsec.

なお、貫通孔3を上下両面側に向けて拡径する形状とするには、レーザ加工により穿孔する場合、レーザ光の1パルス当たりのエネルギーやショット数を調整すればよい。   In addition, in order to make the through-hole 3 have a shape that expands toward both the upper and lower surfaces, when drilling by laser processing, the energy per laser beam and the number of shots may be adjusted.

例えば、まず、図6(a)に要部拡大断面図で示すように、出力が8〜30mJでパルス幅が40〜500μ秒の数パルスのレーザ光を照射して銅箔9および絶縁層1を貫通し、絶縁層1の上面側で上下両面側に向けて拡径する形状の貫通孔3を形成する。このとき絶縁層1の上面側ではレーザ光のエネルギーが下面側より多く印加されるので、貫通孔3は絶縁層1の上面側で外側に向けて拡径する形状となる。また、銅箔9は絶縁層1よりも穿孔されにくいので、貫通孔3はその直径が銅箔9の部位において絶縁層1の部位よりも小さく、銅箔9が貫通孔3の内側に突き出た形状となる。   For example, first, as shown in an enlarged cross-sectional view of the main part in FIG. 6A, the copper foil 9 and the insulating layer 1 are irradiated by irradiating several pulses of laser light having an output of 8 to 30 mJ and a pulse width of 40 to 500 μsec. The through-hole 3 having a shape that expands toward the upper and lower surfaces on the upper surface side of the insulating layer 1 is formed. At this time, since the energy of the laser beam is applied more on the upper surface side of the insulating layer 1 than on the lower surface side, the through hole 3 has a shape that expands outward on the upper surface side of the insulating layer 1. Further, since the copper foil 9 is less likely to be perforated than the insulating layer 1, the diameter of the through hole 3 is smaller than that of the insulating layer 1 at the portion of the copper foil 9, and the copper foil 9 protrudes inside the through hole 3. It becomes a shape.

次に、図6(b)に要部拡大断面図に示すように、さらに数パルスのレーザ光を照射する。それにより照射されたレーザ光の一部が絶縁層1の下面側において貫通孔3の内側に突き出た銅箔9で反射されて絶縁層1の下面側をえぐるので、貫通孔3は絶縁層1の上下で上下両面側に向けて拡径する形状となる。   Next, as shown in the enlarged cross-sectional view of the main part in FIG. A part of the irradiated laser beam is reflected by the copper foil 9 protruding inside the through-hole 3 on the lower surface side of the insulating layer 1 and passes through the lower surface side of the insulating layer 1. It becomes a shape which expands in diameter toward the upper and lower both sides.

さらに、絶縁層1の下面側の銅箔9をレーザーにより除去することで、図6(c)に示すように絶縁樹脂板15に絶縁層1の上下で上下両面側に向けて拡径し、上下の穴経が略同じとなる貫通孔3を形成することができる。   Furthermore, by removing the copper foil 9 on the lower surface side of the insulating layer 1 with a laser, the diameter of the insulating resin plate 15 is increased toward the upper and lower surfaces on the upper and lower sides of the insulating layer 1 as shown in FIG. The through-hole 3 in which the upper and lower hole diameters are substantially the same can be formed.

例えば、厚みが0.4mmのガラス−エポキシ板から成る絶縁層1の上下面に厚みが10μmの銅箔9が被着された絶縁樹脂板15に炭酸ガスレーザを用いて貫通孔3を形成する場合には、レーザの1パルス当たりのパルス幅を40〜240μ秒、エネルギー値を8〜30mJ、ショット数3〜10にすればよい。このとき、レーザ光照射のショット数が少なすぎると貫通孔3の下面側を外側に向けて良好に拡径することができなくなり、ショット数が多すぎると貫通孔3の下面側の径が大きくなりすぎてしまう。   For example, when the through-hole 3 is formed using a carbon dioxide laser on the insulating resin plate 15 in which the copper foil 9 having a thickness of 10 μm is deposited on the upper and lower surfaces of the insulating layer 1 made of a glass-epoxy plate having a thickness of 0.4 mm. For this, the pulse width per pulse of the laser may be 40 to 240 μsec, the energy value may be 8 to 30 mJ, and the number of shots may be 3 to 10. At this time, if the number of shots of laser light irradiation is too small, the diameter of the lower surface side of the through-hole 3 cannot be increased well toward the outside, and if the number of shots is too large, the diameter of the lower surface side of the through-hole 3 is increased. It becomes too much.

また、このレーザ条件とすることで後述する貫通孔3に突出した金属箔9の突出幅を30μm以内に抑えることができる。   Moreover, by setting it as this laser condition, the protrusion width | variety of the metal foil 9 protruded to the through-hole 3 mentioned later can be suppressed within 30 micrometers.

また、炭酸ガスレーザを用いて、レーザ加工の条件をパルス幅40〜240μs、出力8〜30mJ、ショット数3〜10ショットとすることにより、貫通孔3に突出した金属箔9の突出幅を30μm以内に抑えるとともに絶縁樹脂板15に貫通孔3を安定して形成することが可能となる。   Further, by using a carbon dioxide laser, the laser processing conditions are a pulse width of 40 to 240 μs, an output of 8 to 30 mJ, and a shot number of 3 to 10 shots, so that the protruding width of the metal foil 9 protruding into the through hole 3 is within 30 μm. In addition, the through hole 3 can be stably formed in the insulating resin plate 15.

すなわち、パルス幅を240μs以下とすることで銅箔9を安定して開口できるのである。また、出力を8mJ以上とすることで、絶縁樹脂板15の裏面まで安定して穿孔することができる。また、ショット数を3ショット以上とすることで、レーザ光が絶縁樹脂板15の裏面まで届くため、絶縁樹脂板15の裏面まで安定して穿孔することができる。また、10ショット以下の場合も同様に良好に開口でき、10ショットを超える場合のようにエネルギーが大きすぎて絶縁樹脂板15に形成した貫通孔3が大きくなりすぎてしまい微細な配線の形成ができないということがない。   That is, the copper foil 9 can be stably opened by setting the pulse width to 240 μs or less. Further, by setting the output to 8 mJ or more, it is possible to stably perforate up to the back surface of the insulating resin plate 15. Further, by setting the number of shots to 3 shots or more, since the laser light reaches the back surface of the insulating resin plate 15, it is possible to stably perforate the back surface of the insulating resin plate 15. Also, when the number of shots is 10 shots or less, the opening can be made similarly, and the energy is too large as in the case of exceeding 10 shots, and the through holes 3 formed in the insulating resin plate 15 become too large, thereby forming fine wiring. There is no such thing as impossible.

なお、図6では、炭化層17は省略した。   In FIG. 6, the carbonized layer 17 is omitted.

そして、図3(c)に示すように、以上のようにして作製した貫通孔3を設けた絶縁樹脂板15の、貫通孔3に突き出た銅箔9をマイクロエッチングして、その内側に突き出た部位を除去することにより、上下両面側に向けて拡径し、銅箔9の突出のない貫通孔3を形成することができる。なお、このマイクロエッチングには、硫酸と過酸化水素水との混合溶液または塩化第二銅水溶液または塩化第二鉄水溶液からなるエッチング液が好適に用いられる。   And as shown in FIG.3 (c), the copper foil 9 which protruded to the through-hole 3 of the insulating resin board 15 which provided the through-hole 3 produced as mentioned above was micro-etched, and it protruded inside it. By removing the part, the diameter of the through hole 3 can be increased and the copper foil 9 can be formed without protruding. In this microetching, a mixed solution of sulfuric acid and hydrogen peroxide solution, or an etching solution made of a cupric chloride aqueous solution or a ferric chloride aqueous solution is suitably used.

次に、貫通孔3の軸長方向に液体を流て貫通孔3の内壁に形成された炭化層17を除去することにより、図3(d)に示す炭化層17が除去された絶縁樹脂板15が得られる。 Then, by removing the carbonized layer 17 in the axial direction to the flow of liquid formed on the inner wall of the through-hole 3 of the through-hole 3, the insulating resin carbide layer 17 have been removed shown in FIG. 3 (d) A plate 15 is obtained.

なお、具体的に貫通孔3に液体を流方法としては、例えば、図7(a)に示すように、絶縁樹脂板15の貫通孔3が略垂直となるように絶縁樹脂板15を洗浄装置20に固定し、絶縁樹脂板15の上方に液体19を供給して、貫通孔3に液体19を流方法を例示できる。 As the to how the flow of liquid to the specifically through-hole 3, for example, as shown in FIG. 7 (a), an insulating resin sheet 15 so that the through-hole 3 of the insulating resin plate 15 is substantially perpendicular washed fixed to the apparatus 20, by supplying the liquid 19 above the insulating resin sheet 15, the liquid 19 flow can be illustrated to how the through-hole 3.

また、他の方法として、例えば、図7(b)に示すように、洗浄装置20内に固定した絶縁樹脂板15に対して、液体19を吐出する吐出口21を有するノズル23aを配置し、絶縁樹脂板15の貫通孔3に向けて液体19を吐出して、貫通孔3に液体19を流方法を例示できる。なお、図7(b)では液体19は省略した。 As another method, for example, as shown in FIG. 7B, a nozzle 23 a having a discharge port 21 for discharging the liquid 19 is disposed on the insulating resin plate 15 fixed in the cleaning device 20. ejecting liquid 19 toward the through-hole 3 of the insulating resin sheet 15, can be illustrated to a method flow of liquid 19 into the through-hole 3. In FIG. 7B, the liquid 19 is omitted.

また、図7(a)、(b)では、液体19の供給管、排出管、並びに循環装置については図示しなかったが、これらを適宜用いてもよいことは当然である。また、液体19の循環流路にフィルターを配置し、炭化層17に起因する塵を除去し、液体19を浄化しながら処理を行うことが望ましい。   7 (a) and 7 (b), the supply pipe, the discharge pipe, and the circulation device for the liquid 19 are not shown, but it is natural that these may be used as appropriate. Further, it is desirable to dispose the filter in the circulation channel of the liquid 19, remove dust caused by the carbonized layer 17, and perform the treatment while purifying the liquid 19.

また、絶縁樹脂板15を固定せず、洗浄装置20内を連続して移動させることが、生産性、コストの面で望ましい。また、あるいはノズル23を絶縁樹脂板15に対して移動させるなどしてもよい。   In addition, it is desirable in terms of productivity and cost that the insulating resin plate 15 is not fixed and is continuously moved in the cleaning device 20. Alternatively, the nozzle 23 may be moved with respect to the insulating resin plate 15.

また、液体19を貫通孔3に流際は、10〜60MPaの圧力とすることが重要であり、この範囲の圧力はレーザ加工に伴う熱変質層である炭化層17を除去するのに十分な圧力であり、液圧が強すぎて絶縁樹脂板15の銅箔9がはがれてしまうなどして絶縁樹脂板15を破壊してしまうことがない。さらに圧力を20〜60MPaの範囲とすることで、短時間で洗浄処理を行うことができる。 Also, when you flow the liquid 19 in the through-hole 3, it is important that a pressure of 10 ~60MPa, pressure in the range sufficient to remove the carbide layer 17 is a heat affected layer due to the laser processing Therefore, the insulating resin plate 15 is not destroyed because the copper pressure 9 of the insulating resin plate 15 is peeled off. Furthermore , a cleaning process can be performed in a short time by making a pressure into the range of 20-60 MPa.

なお、このときの液圧はポンプ(図示せず)とノズル23の間に設置された液圧計(図示せず)を用いて測定する。ポンプとノズル23の間に設置された液圧計で測定することによりノズル23より噴出する液体19の圧力を測定することができ、液圧計の測定値をもとにポンプの設定値を調整することで液圧の調整を行う。   The fluid pressure at this time is measured using a fluid pressure meter (not shown) installed between a pump (not shown) and the nozzle 23. The pressure of the liquid 19 ejected from the nozzle 23 can be measured by measuring with a hydraulic pressure meter installed between the pump and the nozzle 23, and the set value of the pump is adjusted based on the measured value of the hydraulic pressure meter Adjust the hydraulic pressure with.

また、図7(b)に示すように絶縁樹脂板15の両面に液体19を供給可能なノズル23a、23bを配置するなどして、異なる向きに交互に液体19を貫通孔3に流ことが重要である。このように交互に液体19を流通させることにより、短時間で小さい液圧で炭化層17をむら無く除去することが可能となる。また、液体19を貫通孔3に交互に流仕様としては1分以上の一定時間1方向から流した後、反対面側より流方法のほか、所定の時間をおいて、例えば、1秒から10秒の短時間の間隔で流す向きを変える方法がある。貫通孔3内のレーザ加工に伴う熱変質層である炭化層17を除去するためには1秒から10秒の短時間の間隔で流す向きを変える方法のほうがより短時間で炭化層17を除去することができることから好ましい。 Further, and FIG. 7 (b) the liquid 19 on both surfaces of the insulating resin sheet 15 as shown can be supplied nozzle 23a, such as by placing 23b, alternately different directions to be flow of liquid 19 into the through-hole 3 Is important . By alternately circulating the liquid 19 in this way, the carbonized layer 17 can be uniformly removed with a small hydraulic pressure in a short time. Also, after the flow from a certain time in one direction for more than one minute as to specification flow alternately liquid 19 in the through hole 3, in addition to the flow to process than the opposite side, at a predetermined time, for example, 1 second a method of changing the flow to orientation in a short time interval of 10 seconds. The carbide layer 17 should have a shorter time of method of changing the flow to orientation in a short time interval 1 to 10 seconds in order to remove the heat-affected layer in which carbide layer 17 with the laser processing in the through-hole 3 It is preferable because it can be removed.

また、液体19を流す向きを変更する方法に組み合わせて、それぞれの向きでの流れを断続的なものとすることが望ましく、連続的なものとするよりも炭化層17をはく離除去しやすくなる。液体19を貫通孔3に断続的に流仕様としては、例えば、1秒から10秒の一定の時間液体19を流た後、0.1秒から2秒の液体19すのを止める期間を設け、その後に1秒から10秒の一定の時間液体19を流仕様が例示できる Further, by combining the method of changing the direction of flow of liquid 19, that the flow in each direction and intermittent ones Desirably, easily peeled removed carbide layer 17 rather than a continuous one. The intermittent flow to specifications of the liquid 19 in the through-hole 3, for example, after the flow a certain time the liquid 19 in 1 to 10 seconds, from to flow the liquid 19 in 2 seconds 0.1 seconds the time to stop provided to specifications then the flow a certain time the liquid 19 in 1 to 10 seconds can be exemplified.

また、さらに液体19を貫通孔3に流際は、液圧を変化させることが望ましく、液圧を経時的に変化させ、強弱をつけることで炭化層17のはく離除去性をあげることができる。液体19を貫通孔3に流際の液圧を変化させる仕様としては1秒から10秒の一定の時間、液体19を1〜40MPaの圧力で流た後に0.1秒から2秒の間0.05〜0.1MPaの比較的弱い圧力で流方法を例示できる。この時、比較的弱い液圧時間を強い液圧時間より短くしたり、強い液圧の値を20〜40MPaの範囲としたりするとより効果的である。この時の液圧変化についてはポンプの制御システムのプログラミングを行うことにより設定する。なお、液圧を連続して変化させてもよいことはいうまでもない。また、この液圧は液体19の流量と言い換えてもよく、液体19の流量を変化させて洗浄を行っても同様の効果が得られることはいうまでもない。 Still when to flow the liquid 19 in the through-hole 3 may be it is desirable to vary the hydraulic pressure, over time changing the hydraulic pressure, increasing the peeling removal of the carbide layer 17 by attaching a strength . Certain time from 1 second to 10 seconds as a specification for changing the hydraulic pressure when to flow the liquid 19 in the through-hole 3, from 0.1 second liquid 19 after the flow at a pressure of 1~40MPa of 2 seconds the to method can be illustrated flow at a relatively low pressure between 0.05~0.1MPa. At this time, or shorter than the time to flow a time to flow a relatively weak hydraulic strong hydraulic pressure, it is forced to the value of the hydraulic pressure in the range of 20~40MPa or result more effective. The hydraulic pressure change at this time is set by programming the pump control system. Needless to say, the hydraulic pressure may be changed continuously. In addition, this hydraulic pressure may be rephrased as the flow rate of the liquid 19, and it goes without saying that the same effect can be obtained even when cleaning is performed by changing the flow rate of the liquid 19.

また、液体19を貫通孔3に流際に液体19に気泡を含有させることが望ましい。液体19に気泡を含有させることで、液体19中の気泡が貫通孔3の炭化層17に接触する際に気泡がはじけるバブリング効果により、炭化層17の除去効果がさらに高くなる。液体19中に含有させる気泡の大きさは120μm以下にすることが望ましく、さらに70μm以下であれば、効果的である。 It is also desirable to incorporate bubbles into the liquid 19 in to the flow of liquid 19 into the through-hole 3. By including bubbles in the liquid 19, the removal effect of the carbonized layer 17 is further enhanced by a bubbling effect that bubbles are repelled when the bubbles in the liquid 19 come into contact with the carbonized layer 17 of the through-hole 3. The size of the bubbles contained in the liquid 19 is desirably 120 μm or less, and if it is 70 μm or less, it is effective.

また、液体19を貫通孔3に流ている間、液体19に超音波振動をかけることが望ましく、さらに、炭化層17の除去効果を向上させることができる。 Also, while the flow of liquid 19 into the through-hole 3, it is desirable to apply the ultrasonic vibration to the liquid 19 can further improve the effect of removing carbonized layer 17.

また、液体19に砥粒を含有させることが望ましく、砥粒を含有させることに液体19の炭化層17除去能力を向上させることができる。砥粒として無機フィラーを用いると、一般的に水などからなる液体19よりも比重が大きいために、より強い衝撃を与えることができるため、洗浄時間を短縮できる。特に、アルミナやシリカは硬度が高いため、さらに効果的である。   In addition, it is desirable that the liquid 19 contains abrasive grains, and the inclusion of abrasive grains can improve the ability of the liquid 19 to remove the carbonized layer 17. When an inorganic filler is used as the abrasive grains, since the specific gravity is generally larger than that of the liquid 19 made of water or the like, a stronger impact can be applied, so that the cleaning time can be shortened. In particular, alumina and silica are more effective because of their high hardness.

また、無機フィラーと比較して柔らかな有機フィラーを砥粒として用いた場合には、目標物にぶつかった際の衝撃は与えるものの、その衝撃を有機フィラー自体が吸収するため、絶縁樹脂板15への衝突の際のダメージを抑えることができる。   In addition, when an organic filler softer than an inorganic filler is used as abrasive grains, an impact when hitting a target is given, but the impact is absorbed by the organic filler itself, so that the insulating resin plate 15 The damage at the time of collision can be suppressed.

また、さらに、無機フィラーと有機フィラーの混合物を砥粒として用いることで、炭化層17に十分な衝撃を与えることができるとともに、絶縁樹脂板15へのダメージを低減することが可能となる。また、これらの配合比率を適宜調整することで、対象となる絶縁樹脂板15の性質や貫通孔3の大きさに応じた液体19を調製することができる。   Furthermore, by using a mixture of an inorganic filler and an organic filler as abrasive grains, it is possible to give a sufficient impact to the carbonized layer 17 and reduce damage to the insulating resin plate 15. Moreover, the liquid 19 according to the property of the target insulating resin plate 15 and the size of the through hole 3 can be prepared by appropriately adjusting the blending ratio.

なお、液体19の流動性を維持するためにこれらの砥粒の配合比率は10体積%以下とすることが望ましい。なお、所望により、界面活性剤などの砥粒の分散性を向上させるものを用いてもよい。   In order to maintain the fluidity of the liquid 19, the blending ratio of these abrasive grains is preferably 10% by volume or less. If desired, a surfactant or the like that improves the dispersibility of the abrasive grains may be used.

また、砥粒が小さすぎると2次凝集がおきやすく、大きすぎると、衝撃が大きくなりすぎたり、貫通孔3を塞ぐおそれがあるため、砥粒の大きさはその最大粒径が0.5〜50μmであることが望ましい。   Further, if the abrasive grains are too small, secondary agglomeration tends to occur. If the abrasive grains are too large, the impact may be too large or the through holes 3 may be blocked. It is desirable that it is ˜50 μm.

また、液体19は安価で取り扱いの容易な水を主成分とすることが望ましく、さらに、防錆剤を含有させて、絶縁樹脂板15の金属の酸化を防止することが望ましい。この防錆剤としてはイミダゾール系化合物を用いた表面処理剤を使用することが望ましい。   Further, it is desirable that the liquid 19 is mainly composed of water that is inexpensive and easy to handle, and further, it is desirable to contain a rust preventive agent to prevent the metal of the insulating resin plate 15 from being oxidized. As this rust preventive agent, it is desirable to use a surface treatment agent using an imidazole compound.

以上説明した方法を適宜選択、組み合わせるなどして、絶縁樹脂板15を洗浄した後、図4(e)に示すように、炭化層17が除去された貫通孔3の内部に無電解めっき銅めっき11a(図示せず)および電解銅めっき11b(図示せず)を順次析出させて貫通孔3に貫通導体5を形成するとともに、銅箔9の表面に厚みが1〜3μmの無電解銅めっき11aおよび厚みが20〜30μmの電解銅めっき11bを順次析出させて、めっき層11を形成する。このとき、貫通孔3の内壁から炭化層17が除去されていることから貫通孔3の内壁で炭化層17を起点にして貫通導体5が剥離するようなことが無く、貫通孔3の内壁に対し、貫通導体5を強固に被着することができる。   After the insulating resin plate 15 is cleaned by appropriately selecting and combining the methods described above, as shown in FIG. 4E, the electroless plated copper plating is formed inside the through hole 3 from which the carbonized layer 17 has been removed. 11a (not shown) and electrolytic copper plating 11b (not shown) are sequentially deposited to form the through conductor 5 in the through hole 3, and the electroless copper plating 11a having a thickness of 1 to 3 μm on the surface of the copper foil 9 And the electrolytic copper plating 11b whose thickness is 20-30 micrometers is deposited sequentially, and the plating layer 11 is formed. At this time, since the carbonized layer 17 is removed from the inner wall of the through hole 3, the through conductor 5 does not peel off from the carbonized layer 17 on the inner wall of the through hole 3, and the inner wall of the through hole 3 does not peel off. On the other hand, the through conductor 5 can be firmly attached.

なお、無電解銅めっき11aを析出させるには、例えば、塩化アンモニウム系酢酸パラジウムを含有するパラジウム活性液を使用して貫通孔3内面および銅箔9の表面にパラジウム触媒を付着させるとともに、その上に硫酸銅系の無電解銅めっき液を用いて無電解銅めっき11aを被着させればよい。このとき、貫通孔3は、絶縁樹脂板15の開口部において外側に向けて拡径していることから、貫通孔3内に無電解銅めっき液が良好に浸入し、その結果、貫通孔3内面および銅箔9の表面に無電解銅めっきを略均一な厚みに良好に被着させることができる。   In order to deposit the electroless copper plating 11a, for example, a palladium active solution containing ammonium chloride-based palladium acetate is used to attach a palladium catalyst to the inner surface of the through-hole 3 and the surface of the copper foil 9, The electroless copper plating 11a may be deposited using a copper sulfate-based electroless copper plating solution. At this time, since the diameter of the through hole 3 is increased toward the outside at the opening of the insulating resin plate 15, the electroless copper plating solution satisfactorily enters the through hole 3, and as a result, the through hole 3. Electroless copper plating can be satisfactorily applied to the inner surface and the surface of the copper foil 9 to a substantially uniform thickness.

また、電解銅めっき11bを被着させるための電解銅めっき液としては、例えば、硫酸銅系の電解銅めっき液を用いればよい。このとき、貫通孔3は、絶縁樹脂板15の開口部において外側に向けて拡径していることから、貫通孔3内に電解銅めっき液が良好に浸入し、その結果、貫通孔3内を電解銅めっきで良好に充填することができる。   Moreover, as an electrolytic copper plating solution for depositing the electrolytic copper plating 11b, for example, a copper sulfate-based electrolytic copper plating solution may be used. At this time, since the diameter of the through-hole 3 is increased toward the outside at the opening of the insulating resin plate 15, the electrolytic copper plating solution satisfactorily enters the through-hole 3, and as a result, the inside of the through-hole 3. Can be satisfactorily filled with electrolytic copper plating.

次に、図4(f)に示すように貫通孔3の内部に穴埋め樹脂7を埋め込みし、硬化させた後に銅箔9および穴埋め樹脂7表面を研磨し平坦化する。   Next, as shown in FIG. 4 (f), the filling resin 7 is buried in the inside of the through-hole 3 and cured, and then the surfaces of the copper foil 9 and the filling resin 7 are polished and flattened.

最後に、図5(g)に示すように、従来周知のサブトラクト法、セミアディティブ法などにより配線導体13を形成する。かくして、本発明の配線基板の製造方法によれば、貫通孔3内の炭化層17を容易に除去することができるため、貫通導体5に断線が発生することなく、極めて高密度な配線が可能な配線基板を得ることができる。またその上にビルドアップ樹脂層およびビルドアップ配線層を積層してビルドアップ配線基板を製作したとしてもビルドアップ樹脂層に貫通孔3内からのクラックが発生することのない配線基板を得ることができる。   Finally, as shown in FIG. 5G, the wiring conductor 13 is formed by a conventionally known subtracting method, semi-additive method, or the like. Thus, according to the method for manufacturing a wiring board of the present invention, the carbonized layer 17 in the through-hole 3 can be easily removed, so that extremely high-density wiring is possible without disconnection of the through-conductor 5. Can be obtained. Moreover, even if a buildup resin layer and a buildup wiring layer are laminated thereon to manufacture a buildup wiring board, a wiring board in which cracks from the through holes 3 do not occur in the buildup resin layer can be obtained. it can.

また、貫通孔3内の付着物や塵なども同様に除去できることは当然である。   Of course, the deposits and dust in the through-hole 3 can be removed as well.

なお、上述の実施例では貫通孔3の直径が75〜130μm、厚みが0.2〜0.8mmの配線基板を例にとって示したが、本発明は上述の実施例に限定されるものではなく、本発明の要旨を逸脱しない範囲であれば、種々の変更が可能であることはいうまでもない。   In the above-mentioned embodiment, the through-hole 3 has a diameter of 75 to 130 μm and a thickness of 0.2 to 0.8 mm as an example. However, the present invention is not limited to the above-described embodiment. Needless to say, various modifications can be made without departing from the scope of the present invention.

線基板の製造方法を評価するために、サンプルを作製し、次の評価を行なった。 In order to evaluate the manufacturing method of wiring board, to prepare a sample was subjected to the following evaluation.

主面に厚み10μmの銅箔9を具備する全体の厚みが0.4mmの絶縁樹脂板15に炭酸ガスレーザにより貫通孔3を形成した。なお、炭酸ガスレーザの穿孔条件はパルス幅が160μsで出力が20mJでショット数を6ショットとした。   The through-hole 3 was formed in the insulating resin board 15 which comprises the copper foil 9 with a thickness of 10 micrometers on the main surface, and whose thickness is 0.4 mm with the carbon dioxide laser. Carbon dioxide laser drilling conditions were such that the pulse width was 160 μs, the output was 20 mJ, and the number of shots was six.

なお、作製した貫通孔3の直径は90μmとした。   The diameter of the produced through hole 3 was 90 μm.

このようにして作製した貫通孔3を有する絶縁樹脂板15を、図5(b)に示す洗浄装置20にセットし、表1に示す条件で、液体19の組成や、液圧、流す向き(液体吐出方向、気泡の有無などを変化させ、5分間洗浄した。 An insulating resin sheet 15 having a through-hole 3 fabricated in this manner was set in the cleaning device 20 shown in FIG. 5 (b), under the conditions shown in Table 1, the composition or the liquid 19, the fluid pressure, flow to Fare (Liquid discharge direction ) The presence or absence of bubbles was changed, and washing was performed for 5 minutes.

そして、液体19流通後の外観確認、めっき前の銅箔9表面の酸化の状態およびめっき後の外観の状態を確認した。   And the external appearance confirmation after the liquid 19 distribution | circulation, the oxidation state of the copper foil 9 surface before plating, and the external appearance state after plating were confirmed.

なお、ここで記載した液圧とは、ポンプ(図示せず)とノズル23との間に設置された液圧計により測定したものである。このようにポンプとノズルの間に設置された液圧計で液圧を測定することによりノズルより噴出する液体19の圧力を測定することができ、液圧計の測定値をもとにポンプの設定値を調整することで液圧の調整を行うことができる。   The fluid pressure described here is measured by a fluid pressure meter installed between a pump (not shown) and the nozzle 23. Thus, the pressure of the liquid 19 ejected from the nozzle can be measured by measuring the hydraulic pressure with the hydraulic pressure meter installed between the pump and the nozzle, and the set value of the pump based on the measured value of the hydraulic pressure meter. The hydraulic pressure can be adjusted by adjusting.

表1に洗浄条件と上記した絶縁樹脂板15の評価結果を示す。

Figure 0004377641
Table 1 shows the cleaning conditions and the evaluation results of the insulating resin plate 15 described above.
Figure 0004377641

縁樹脂板15の両面から同時に液体19を吹き付けた従来の絶縁樹脂板15の洗浄方法を用いた試料No.1、2では、液圧を0.1、1MPaと変化させたが液圧にかかわらず、無電解めっき後の外観に、炭化層17の残存に起因するめっき異常が認められた。 Using the cleaning method of the conventional insulating resin plate 15 spraying simultaneously liquid 19 from both sides of the insulation resin sheet 15 Sample No. In Nos. 1 and 2, the hydraulic pressure was changed to 0.1 and 1 MPa, but an abnormality in plating due to the remaining carbonized layer 17 was observed in the appearance after electroless plating regardless of the hydraulic pressure.

一方、試料No.3〜37では、一部の試料にめっき後の外観検査において若干の銅粒が認められたものの、実用上問題のないレベルであり、配線基板の歩留まりを格段に向上させられることが判った。 On the other hand, specimen No. In Nos. 3 to 37, although some copper particles were observed in the appearance inspection after plating in some of the samples, it was found that the level was practically no problem and the yield of the wiring board was remarkably improved.

以下に、実施例の製造方法で作製した試料について詳細に説明する。 Below, the sample produced with the manufacturing method of an Example is demonstrated in detail.

メック社製の防錆剤CA−5330Aを0.1質量%含有する液体19液圧を変化させて、一方向から流た試料No.3〜10のうち、液圧が5MPa未満で、1、3MPaの試料No.3、4では、実用上問題はないものの、無電解めっき後に貫通孔3に3μm以下の大きさの銅粒が確認された。 Mec Co. rust agent CA-5330A by changing the hydraulic pressure of the liquid 19 containing 0.1 wt% were flow from one sample No. 3 to 10, the hydraulic pressure is less than 5 MPa, and sample Nos. 1 and 3 MPa are used. In Nos. 3 and 4, copper particles having a size of 3 μm or less were confirmed in the through hole 3 after electroless plating, although there was no practical problem.

また、液圧が60MPaを超えて70MPaである試料No.10では、実用上問題はないものの、一部の試料で若干の銅箔の剥離が発生した。   In addition, sample No. having a hydraulic pressure of more than 60 MPa and 70 MPa. In No. 10, although there was no problem in practical use, some copper foil peeled off in some samples.

一方、液圧が5〜60MPaの範囲の試料No.5〜9では、全ての項目において全く異常が認められなかった。   On the other hand, sample Nos. With a hydraulic pressure in the range of 5 to 60 MPa. In 5-9, no abnormality was recognized in all items.

また、液圧を1MPaとし、一方向のみから液体19を流た試料No.3では、微細ながら銅粒が確認されたのに対して、同じく液圧を1MPaとし、液体19の流す向きを交互に変化させた試料No.11では、いずれの項目においても全く異常が認められず、液体19の流す向きを交互に変化させることで、貫通孔3内の炭化層17除去効果が高くなることが判った。 Further, the fluid pressure and 1 MPa, and the flow of liquid 19 from one direction only Sample No. In 3, whereas the copper particles is confirmed with a fine, well to the hydraulic and 1 MPa, changing the flow to orientation of the liquid 19 to alternately sample No. In 11, not observed at all abnormal in any of the items, the flow to orientation of the liquid 19 by changing alternately, it was found that the carbide layer 17 is removed the effect of the through-hole 3 is increased.

また、液圧を1MPaとし、5秒の停止時間を設けて、断続的に一方向のみから液体19を流た試料No.12でも、いずれの項目においても全く異常が認められず、液体19を断続的に流ことで、貫通孔3内の炭化層17除去効果が高くなることが判った。 Further, the fluid pressure and 1 MPa, provided 5 seconds downtime, intermittently sample was flow of liquid 19 from only one direction No. Even 12 not observed at all abnormal in any of the items, by to flow the liquid 19 intermittently, it was found that the carbide layer 17 is removed the effect of the through-hole 3 is increased.

また、5秒間で液圧を1から40MPaまで経時的に変化させ、さらに40MPaから1MPaまで経時的に変化させるサイクルを繰り返して液体19を流た試料No.13でも、いずれの項目においても全く異常が認められず、液体19の液圧を変化させて流ことで、貫通孔3内の炭化層17除去効果が高くなることが判った。 Further, the hydraulic pressure over time is changed from 1 to 40MPa for 5 seconds and further flow of the liquid 19 by repeating the cycle which varies over time to 1MPa from 40MPa Sample No. Even 13 not observed at all abnormal in any of the items, that to flow by varying the fluid pressure of the liquid 19, it was found that the carbide layer 17 is removed the effect of the through-hole 3 is increased.

また、吐出口21の形状を気泡が入るようにして、液体19に気泡を導入し、液圧を1MPaとし、一方向のみから液体19を流た試料No.14においても、いずれの項目においても全く異常が認められず、液体19に気泡を導入して流ことで、貫通孔3内の炭化層17除去効果が高くなることが判った。 The shape of the discharge port 21 as the bubble enters the introduced bubbles into the liquid 19, the sample is hydraulic and 1 MPa, and the flow of liquid 19 from only one direction No. Also in 14, not observed at all abnormal in any of the items, that to flow to the liquid 19 is introduced bubbles, it was found that the carbide layer 17 is removed the effect of the through-hole 3 is increased.

また、ノズル23内に超音波振動子を装着し、超音波振動子を振動させながら、液圧を1MPaとし、一方向のみから液体19を流た試料No.15においても、いずれの項目においても全く異常が認められず、液体19に超音波振動を与えながら流ことで、貫通孔3内の炭化層17除去効果が高くなることが判った。 Further, an ultrasonic transducer mounted in the nozzle 23, while vibrating the ultrasonic transducer, the sample fluid pressure and 1 MPa, and the flow of liquid 19 from only one direction No. Also in 15, not observed at all abnormal in any of the items, that to flow while applying ultrasonic vibration to the liquid 19, it was found that the carbide layer 17 is removed the effect of the through-hole 3 is increased.

試料No.16〜22では、無機フィラーとして平均粒径5μm、最大粒径20μmのAl粉末を液体19に10体積%添加して作製した砥粒入り液体19を、液圧を変化させて貫通孔3に一方向から流た。 Sample No. In Nos. 16 to 22, the abrasive-containing liquid 19 produced by adding 10% by volume of Al 2 O 3 powder having an average particle diameter of 5 μm and a maximum particle diameter of 20 μm to the liquid 19 as an inorganic filler is changed to a through-hole. and flow from one direction to the 3.

液圧が5MPa未満の試料No.16、17においても、無機フィラーを液体19に添加することで、炭化層17の残存に起因するめっき異常の発生は無くなった。また、試料No.16、17に加えて、液圧が5〜30MPaの試料No.18、19においても、全ての評価項目において全く異常が認められなかった。   Sample No. with a hydraulic pressure of less than 5 MPa. Also in 16 and 17, the addition of the inorganic filler to the liquid 19 eliminated the occurrence of abnormal plating due to the remaining carbonized layer 17. Sample No. In addition to Samples 16 and 17, Sample No. In 18 and 19, no abnormality was observed in all evaluation items.

しかしながら、無機フィラー入りの液体19では、洗浄効果が高くなった一方で、液圧が50MPa以上の試料No.20〜22で、製品の品質に影響はない程度ではあるものの、一部の銅箔が剥離した。   However, in the liquid 19 containing an inorganic filler, while the cleaning effect was high, the sample No. Although it was a grade which has no influence on the quality of a product at 20-22, some copper foils peeled.

また、エポキシを主成分とする有機フィラーを平均粒径5μmの球状粒子に加工した有機フィラーを砥粒として10体積%、液体19に添加して、液圧を変化させて洗浄処理を行った試料No.23〜29では、液圧が70MPaの試料No.29で、若干の銅箔剥離が確認されたものの、製品には影響がなかった。また、液圧が60MPa以下の試料No.23〜28では、全ての評価項目において全く異常が認められず、有機フィラーを添加しなかった場合に比べ、良好な結果が得られる液圧の範囲が広くなった。   In addition, a sample in which an organic filler obtained by processing an organic filler mainly composed of epoxy into spherical particles having an average particle diameter of 5 μm as abrasive grains is added to 10% by volume of the liquid 19 and the liquid pressure is changed to perform a cleaning process. No. In Nos. 23 to 29, a sample No. with a liquid pressure of 70 MPa was used. In 29, although some copper foil peeling was confirmed, there was no influence on a product. In addition, sample No. with a hydraulic pressure of 60 MPa or less. In Nos. 23 to 28, no abnormality was observed in all the evaluation items, and the range of the hydraulic pressure at which good results were obtained was wider than when no organic filler was added.

また、Al粉末とエポキシを主成分とする有機フィラーをそれぞれ、5体積%、液体19に添加して、液圧を変化させた試料No.30〜36でも、ほぼ、有機フィラーを用いた場合と同様の結果が得られ、砥粒を用いない場合よりも良好な結果が得られる液圧の範囲が広くなった。 In addition, Sample No. 2 was prepared by adding 5% by volume of an organic filler mainly composed of Al 2 O 3 powder and epoxy to the liquid 19 and changing the liquid pressure. Even in 30 to 36, almost the same result as that obtained when the organic filler was used was obtained, and the range of the hydraulic pressure at which better results were obtained than when the abrasive grains were not used was widened.

以上、説明した試料では、液体として水を用い、防錆剤を添加して評価した。これに対して、防錆剤を添加せずに洗浄処理を行った試料No.37では、めっき前の銅箔の表面が若干酸化することが判った。ただし、非常に薄い膜であるために、めっきは正常に形成された。   In the samples described above, water was used as the liquid, and evaluation was performed by adding a rust inhibitor. On the other hand, Sample No. which was washed without adding a rust inhibitor. In No. 37, it was found that the surface of the copper foil before plating was slightly oxidized. However, since it was a very thin film, the plating was formed normally.

本発明の配線基板の製造方法によって製造される配線基板の断面図である。It is sectional drawing of the wiring board manufactured by the manufacturing method of the wiring board of this invention. 本発明の配線基板の製造方法の工程を説明する工程図である。It is process drawing explaining the process of the manufacturing method of the wiring board of this invention. 本発明の配線基板の製造方法の工程を説明する工程図である。It is process drawing explaining the process of the manufacturing method of the wiring board of this invention. 本発明の配線基板の製造方法の工程を説明する工程図である。It is process drawing explaining the process of the manufacturing method of the wiring board of this invention. 本発明の配線基板の製造方法の工程を説明する工程図である。It is process drawing explaining the process of the manufacturing method of the wiring board of this invention. 本発明の配線基板の製造方法のうち、貫通孔を形成する穿孔工程を説明する工程図である。It is process drawing explaining the punching process which forms a through-hole among the manufacturing methods of the wiring board of this invention. 本発明の配線基板の製造方法のうち、炭化層を除去する配線基板の洗浄工程を説明する概略図である。It is the schematic explaining the washing | cleaning process of the wiring board which removes a carbonization layer among the manufacturing methods of the wiring board of this invention.

符号の説明Explanation of symbols

1・・・絶縁層
3・・・貫通孔
5・・・貫通導体
7・・・埋め込み樹脂
9・・・金属箔
11・・・めっき層
15・・・絶縁樹脂板
13・・・配線導体
17・・・炭化層
19・・・液体
DESCRIPTION OF SYMBOLS 1 ... Insulating layer 3 ... Through-hole 5 ... Through-conductor 7 ... Embedded resin 9 ... Metal foil 11 ... Plating layer 15 ... Insulating resin board 13 ... Wiring conductor 17 ... Carbonized layer 19 ... Liquid

Claims (7)

金属箔と、樹脂を含有する絶縁層とを積層した絶縁樹脂板をレーザ加工して、前記金属箔及び前記絶縁層とを貫通する貫通孔を穿孔する工程と、前記貫通孔の軸長方向に10〜60MPaの圧力で交互に異なる向きに液体を流、レーザ加工した際に発生した前記貫通孔の内壁の炭化層を除去する工程とを具備することを特徴とする配線基板の製造方法。 Laser processing an insulating resin plate in which a metal foil and an insulating layer containing a resin are laminated, and drilling a through hole penetrating the metal foil and the insulating layer; and in the axial length direction of the through hole to flow the liquid into different directions alternately at a pressure of 10~60MPa, method of manufacturing a wiring substrate, characterized by comprising the step of removing the carbonized layer of the inner wall of the through hole that occurred when the laser processing. 前記液体のそれぞれの向きでの流れを断続的なものとすることを特徴とする請求項1に記載の配線基板の製造方法。 A method for manufacturing a wiring board according to claim 1, wherein the intermittent ones and to Rukoto flow in each direction of the liquid. 前記液体に気泡を含有させることを特徴とする請求項1又は2に記載の配線基板の製造方法。 A method for manufacturing a wiring board according to claim 1 or 2, characterized in that the inclusion of air bubbles in the liquid. 前記液体を超音波振動させながら流すことを特徴とする請求項1乃至のうちいずれかに記載の配線基板の製造方法。 A method for manufacturing a wiring board according to any one of claims 1 to 3, wherein the flow length al is ultrasonically vibrating the liquid. 前記液体無機フィラーおよび有機フィラーのうちの少なくとも一方からなる砥粒を含有させることを特徴とする請求項1乃至のうちいずれかに記載の配線基板の製造方法。 A method for manufacturing a wiring board according to any one of claims 1 to 4, characterized in that the inclusion of abrasive grains made of at least one of an inorganic filler and organic filler in the liquid. 前記液体が水を主成分とすることを特徴とする請求項1乃至5のうちいずれかに記載の配線基板の製造方法。 A method for manufacturing a wiring board according to any one of claims 1 to 5, characterized in that the liquid is water as a main component. 前記液体防錆剤を含有させることを特徴とする請求項に記載の配線基板の製造方法。 A method for manufacturing a wiring board according to claim 6, characterized in Rukoto contain a rust inhibitor in the liquid.
JP2003333474A 2003-09-25 2003-09-25 Wiring board manufacturing method Expired - Fee Related JP4377641B2 (en)

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FR2932899B1 (en) * 2008-06-23 2010-07-30 Commissariat Energie Atomique METHOD FOR REMOVING THE ETCHING FAULT FROM A METAL LAYER DEPOSITED ON A FLEXIBLE SUPPORT
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JP5552752B2 (en) * 2009-04-15 2014-07-16 セイコーエプソン株式会社 Power receiving device, electronic device and non-contact power transmission system
CN110430669A (en) * 2019-08-13 2019-11-08 福建世卓电子科技有限公司 Circuit board and production technology based on laser drill tungsten carbide/conductive substrate surfaces hole

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