JP4412705B2 - Photosensitive resin composition and film having cured film thereof - Google Patents
Photosensitive resin composition and film having cured film thereof Download PDFInfo
- Publication number
- JP4412705B2 JP4412705B2 JP2003180703A JP2003180703A JP4412705B2 JP 4412705 B2 JP4412705 B2 JP 4412705B2 JP 2003180703 A JP2003180703 A JP 2003180703A JP 2003180703 A JP2003180703 A JP 2003180703A JP 4412705 B2 JP4412705 B2 JP 4412705B2
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- JP
- Japan
- Prior art keywords
- film
- group
- photosensitive resin
- resin composition
- compound
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000011342 resin composition Substances 0.000 title claims description 26
- 150000001875 compounds Chemical class 0.000 claims description 26
- 125000004432 carbon atom Chemical group C* 0.000 claims description 16
- 150000003377 silicon compounds Chemical class 0.000 claims description 16
- 125000000217 alkyl group Chemical group 0.000 claims description 14
- 125000003700 epoxy group Chemical group 0.000 claims description 13
- 239000011248 coating agent Substances 0.000 claims description 11
- 239000003054 catalyst Substances 0.000 claims description 6
- 125000001424 substituent group Chemical group 0.000 claims description 6
- 238000000576 coating method Methods 0.000 claims description 5
- 239000000203 mixture Substances 0.000 claims description 5
- 239000003505 polymerization initiator Substances 0.000 claims description 5
- 125000000753 cycloalkyl group Chemical group 0.000 claims description 4
- 239000003085 diluting agent Substances 0.000 claims description 4
- 125000000466 oxiranyl group Chemical group 0.000 claims description 4
- 125000005417 glycidoxyalkyl group Chemical group 0.000 claims description 3
- 229920005989 resin Polymers 0.000 claims description 3
- 239000011347 resin Substances 0.000 claims description 3
- -1 alkoxy silicon compounds Chemical class 0.000 description 29
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 24
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 19
- 239000002904 solvent Substances 0.000 description 16
- 239000008119 colloidal silica Substances 0.000 description 13
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 12
- 238000000034 method Methods 0.000 description 11
- 238000006243 chemical reaction Methods 0.000 description 10
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 9
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 8
- 239000003795 chemical substances by application Substances 0.000 description 7
- 230000000052 comparative effect Effects 0.000 description 7
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 6
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 6
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 6
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 description 6
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 6
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 6
- 229920006267 polyester film Polymers 0.000 description 6
- 239000000047 product Substances 0.000 description 6
- 230000005855 radiation Effects 0.000 description 6
- 238000003786 synthesis reaction Methods 0.000 description 6
- 238000005406 washing Methods 0.000 description 6
- 239000004593 Epoxy Substances 0.000 description 5
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 5
- 238000011156 evaluation Methods 0.000 description 5
- 150000002989 phenols Chemical class 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- INXWLSDYDXPENO-UHFFFAOYSA-N [2-(hydroxymethyl)-3-prop-2-enoyloxy-2-[[3-prop-2-enoyloxy-2,2-bis(prop-2-enoyloxymethyl)propoxy]methyl]propyl] prop-2-enoate Chemical compound C=CC(=O)OCC(COC(=O)C=C)(CO)COCC(COC(=O)C=C)(COC(=O)C=C)COC(=O)C=C INXWLSDYDXPENO-UHFFFAOYSA-N 0.000 description 4
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 description 4
- 125000003118 aryl group Chemical group 0.000 description 4
- 238000012663 cationic photopolymerization Methods 0.000 description 4
- 238000006482 condensation reaction Methods 0.000 description 4
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 4
- 239000003822 epoxy resin Substances 0.000 description 4
- 239000003999 initiator Substances 0.000 description 4
- 229920000647 polyepoxide Polymers 0.000 description 4
- 229920002284 Cellulose triacetate Polymers 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- WMFOQBRAJBCJND-UHFFFAOYSA-M Lithium hydroxide Chemical compound [Li+].[OH-] WMFOQBRAJBCJND-UHFFFAOYSA-M 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 3
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 3
- 239000004695 Polyether sulfone Substances 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- NNLVGZFZQQXQNW-ADJNRHBOSA-N [(2r,3r,4s,5r,6s)-4,5-diacetyloxy-3-[(2s,3r,4s,5r,6r)-3,4,5-triacetyloxy-6-(acetyloxymethyl)oxan-2-yl]oxy-6-[(2r,3r,4s,5r,6s)-4,5,6-triacetyloxy-2-(acetyloxymethyl)oxan-3-yl]oxyoxan-2-yl]methyl acetate Chemical compound O([C@@H]1O[C@@H]([C@H]([C@H](OC(C)=O)[C@H]1OC(C)=O)O[C@H]1[C@@H]([C@@H](OC(C)=O)[C@H](OC(C)=O)[C@@H](COC(C)=O)O1)OC(C)=O)COC(=O)C)[C@@H]1[C@@H](COC(C)=O)O[C@@H](OC(C)=O)[C@H](OC(C)=O)[C@H]1OC(C)=O NNLVGZFZQQXQNW-ADJNRHBOSA-N 0.000 description 3
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 3
- 238000013329 compounding Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- RTZKZFJDLAIYFH-UHFFFAOYSA-N ether Substances CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 3
- 239000010410 layer Substances 0.000 description 3
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 3
- 229910052753 mercury Inorganic materials 0.000 description 3
- 150000004780 naphthols Chemical class 0.000 description 3
- 230000007935 neutral effect Effects 0.000 description 3
- 239000003973 paint Substances 0.000 description 3
- 239000003208 petroleum Substances 0.000 description 3
- 239000004033 plastic Substances 0.000 description 3
- 229920003023 plastic Polymers 0.000 description 3
- 229920000728 polyester Polymers 0.000 description 3
- 229920006393 polyether sulfone Polymers 0.000 description 3
- 239000011164 primary particle Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 3
- 230000002087 whitening effect Effects 0.000 description 3
- 239000008096 xylene Substances 0.000 description 3
- QPFMBZIOSGYJDE-UHFFFAOYSA-N 1,1,2,2-tetrachloroethane Chemical compound ClC(Cl)C(Cl)Cl QPFMBZIOSGYJDE-UHFFFAOYSA-N 0.000 description 2
- KVNYFPKFSJIPBJ-UHFFFAOYSA-N 1,2-diethylbenzene Chemical compound CCC1=CC=CC=C1CC KVNYFPKFSJIPBJ-UHFFFAOYSA-N 0.000 description 2
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 2
- VPWNQTHUCYMVMZ-UHFFFAOYSA-N 4,4'-sulfonyldiphenol Chemical class C1=CC(O)=CC=C1S(=O)(=O)C1=CC=C(O)C=C1 VPWNQTHUCYMVMZ-UHFFFAOYSA-N 0.000 description 2
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 2
- DEXFNLNNUZKHNO-UHFFFAOYSA-N 6-[3-[4-[2-(2,3-dihydro-1H-inden-2-ylamino)pyrimidin-5-yl]piperidin-1-yl]-3-oxopropyl]-3H-1,3-benzoxazol-2-one Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)C1CCN(CC1)C(CCC1=CC2=C(NC(O2)=O)C=C1)=O DEXFNLNNUZKHNO-UHFFFAOYSA-N 0.000 description 2
- KWOLFJPFCHCOCG-UHFFFAOYSA-N Acetophenone Chemical compound CC(=O)C1=CC=CC=C1 KWOLFJPFCHCOCG-UHFFFAOYSA-N 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 229930185605 Bisphenol Natural products 0.000 description 2
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 2
- VLSVVMPLPMNWBH-UHFFFAOYSA-N Dihydro-5-propyl-2(3H)-furanone Chemical compound CCCC1CCC(=O)O1 VLSVVMPLPMNWBH-UHFFFAOYSA-N 0.000 description 2
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical compound OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- AFCARXCZXQIEQB-UHFFFAOYSA-N N-[3-oxo-3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propyl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C(CCNC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)N1CC2=C(CC1)NN=N2 AFCARXCZXQIEQB-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 description 2
- 125000003545 alkoxy group Chemical group 0.000 description 2
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 2
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- YCIMNLLNPGFGHC-UHFFFAOYSA-N catechol Chemical compound OC1=CC=CC=C1O YCIMNLLNPGFGHC-UHFFFAOYSA-N 0.000 description 2
- 238000009833 condensation Methods 0.000 description 2
- 230000005494 condensation Effects 0.000 description 2
- 239000002612 dispersion medium Substances 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- JBFHTYHTHYHCDJ-UHFFFAOYSA-N gamma-caprolactone Chemical compound CCC1CCC(=O)O1 JBFHTYHTHYHCDJ-UHFFFAOYSA-N 0.000 description 2
- GAEKPEKOJKCEMS-UHFFFAOYSA-N gamma-valerolactone Chemical compound CC1CCC(=O)O1 GAEKPEKOJKCEMS-UHFFFAOYSA-N 0.000 description 2
- 238000005227 gel permeation chromatography Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000007756 gravure coating Methods 0.000 description 2
- FUZZWVXGSFPDMH-UHFFFAOYSA-M hexanoate Chemical compound CCCCCC([O-])=O FUZZWVXGSFPDMH-UHFFFAOYSA-M 0.000 description 2
- 150000007529 inorganic bases Chemical class 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 150000002576 ketones Chemical class 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- BFXIKLCIZHOAAZ-UHFFFAOYSA-N methyltrimethoxysilane Chemical compound CO[Si](C)(OC)OC BFXIKLCIZHOAAZ-UHFFFAOYSA-N 0.000 description 2
- NXPPAOGUKPJVDI-UHFFFAOYSA-N naphthalene-1,2-diol Chemical compound C1=CC=CC2=C(O)C(O)=CC=C21 NXPPAOGUKPJVDI-UHFFFAOYSA-N 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 229920006255 plastic film Polymers 0.000 description 2
- 239000002985 plastic film Substances 0.000 description 2
- 229920000058 polyacrylate Polymers 0.000 description 2
- 229920000515 polycarbonate Polymers 0.000 description 2
- 239000004417 polycarbonate Substances 0.000 description 2
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Chemical compound [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 2
- 238000007639 printing Methods 0.000 description 2
- BBEAQIROQSPTKN-UHFFFAOYSA-N pyrene Chemical compound C1=CC=C2C=CC3=CC=CC4=CC=C1C2=C43 BBEAQIROQSPTKN-UHFFFAOYSA-N 0.000 description 2
- GHMLBKRAJCXXBS-UHFFFAOYSA-N resorcinol Chemical compound OC1=CC=CC(O)=C1 GHMLBKRAJCXXBS-UHFFFAOYSA-N 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- ZUHZGEOKBKGPSW-UHFFFAOYSA-N tetraglyme Chemical compound COCCOCCOCCOCCOC ZUHZGEOKBKGPSW-UHFFFAOYSA-N 0.000 description 2
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 2
- CNHDIAIOKMXOLK-UHFFFAOYSA-N toluquinol Chemical compound CC1=CC(O)=CC=C1O CNHDIAIOKMXOLK-UHFFFAOYSA-N 0.000 description 2
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 2
- QNODIIQQMGDSEF-UHFFFAOYSA-N (1-hydroxycyclohexyl)-phenylmethanone Chemical compound C=1C=CC=CC=1C(=O)C1(O)CCCCC1 QNODIIQQMGDSEF-UHFFFAOYSA-N 0.000 description 1
- UOCLXMDMGBRAIB-UHFFFAOYSA-N 1,1,1-trichloroethane Chemical compound CC(Cl)(Cl)Cl UOCLXMDMGBRAIB-UHFFFAOYSA-N 0.000 description 1
- 150000005206 1,2-dihydroxybenzenes Chemical class 0.000 description 1
- 150000005207 1,3-dihydroxybenzenes Chemical class 0.000 description 1
- OHBQPCCCRFSCAX-UHFFFAOYSA-N 1,4-Dimethoxybenzene Chemical compound COC1=CC=C(OC)C=C1 OHBQPCCCRFSCAX-UHFFFAOYSA-N 0.000 description 1
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 1
- 150000005208 1,4-dihydroxybenzenes Chemical class 0.000 description 1
- MODAACUAXYPNJH-UHFFFAOYSA-N 1-(methoxymethyl)-4-[4-(methoxymethyl)phenyl]benzene Chemical group C1=CC(COC)=CC=C1C1=CC=C(COC)C=C1 MODAACUAXYPNJH-UHFFFAOYSA-N 0.000 description 1
- RRQYJINTUHWNHW-UHFFFAOYSA-N 1-ethoxy-2-(2-ethoxyethoxy)ethane Chemical compound CCOCCOCCOCC RRQYJINTUHWNHW-UHFFFAOYSA-N 0.000 description 1
- KIAMPLQEZAMORJ-UHFFFAOYSA-N 1-ethoxy-2-[2-(2-ethoxyethoxy)ethoxy]ethane Chemical compound CCOCCOCCOCCOCC KIAMPLQEZAMORJ-UHFFFAOYSA-N 0.000 description 1
- JOLQKTGDSGKSKJ-UHFFFAOYSA-N 1-ethoxypropan-2-ol Chemical compound CCOCC(C)O JOLQKTGDSGKSKJ-UHFFFAOYSA-N 0.000 description 1
- GDYAUGXOIOIFLD-UHFFFAOYSA-N 1-methylnaphthalene-2,3-diol Chemical compound C1=CC=C2C(C)=C(O)C(O)=CC2=C1 GDYAUGXOIOIFLD-UHFFFAOYSA-N 0.000 description 1
- HECLRDQVFMWTQS-RGOKHQFPSA-N 1755-01-7 Chemical compound C1[C@H]2[C@@H]3CC=C[C@@H]3[C@@H]1C=C2 HECLRDQVFMWTQS-RGOKHQFPSA-N 0.000 description 1
- AUFZRCJENRSRLY-UHFFFAOYSA-N 2,3,5-trimethylhydroquinone Chemical compound CC1=CC(O)=C(C)C(C)=C1O AUFZRCJENRSRLY-UHFFFAOYSA-N 0.000 description 1
- JZODKRWQWUWGCD-UHFFFAOYSA-N 2,5-di-tert-butylbenzene-1,4-diol Chemical compound CC(C)(C)C1=CC(O)=C(C(C)(C)C)C=C1O JZODKRWQWUWGCD-UHFFFAOYSA-N 0.000 description 1
- VXQBJTKSVGFQOL-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethyl acetate Chemical compound CCCCOCCOCCOC(C)=O VXQBJTKSVGFQOL-UHFFFAOYSA-N 0.000 description 1
- FPZWZCWUIYYYBU-UHFFFAOYSA-N 2-(2-ethoxyethoxy)ethyl acetate Chemical compound CCOCCOCCOC(C)=O FPZWZCWUIYYYBU-UHFFFAOYSA-N 0.000 description 1
- CZAZXHQSSWRBHT-UHFFFAOYSA-N 2-(2-hydroxyphenyl)-3,4,5,6-tetramethylphenol Chemical compound OC1=C(C)C(C)=C(C)C(C)=C1C1=CC=CC=C1O CZAZXHQSSWRBHT-UHFFFAOYSA-N 0.000 description 1
- MFGOFGRYDNHJTA-UHFFFAOYSA-N 2-amino-1-(2-fluorophenyl)ethanol Chemical compound NCC(O)C1=CC=CC=C1F MFGOFGRYDNHJTA-UHFFFAOYSA-N 0.000 description 1
- NQBXSWAWVZHKBZ-UHFFFAOYSA-N 2-butoxyethyl acetate Chemical compound CCCCOCCOC(C)=O NQBXSWAWVZHKBZ-UHFFFAOYSA-N 0.000 description 1
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 1
- SVONRAPFKPVNKG-UHFFFAOYSA-N 2-ethoxyethyl acetate Chemical compound CCOCCOC(C)=O SVONRAPFKPVNKG-UHFFFAOYSA-N 0.000 description 1
- AWXNQMZKFHUXKD-UHFFFAOYSA-N 2-ethyl-9,10-bis(2-methoxyethoxy)anthracene Chemical compound C1=CC=CC2=C(OCCOC)C3=CC(CC)=CC=C3C(OCCOC)=C21 AWXNQMZKFHUXKD-UHFFFAOYSA-N 0.000 description 1
- SURWYRGVICLUBJ-UHFFFAOYSA-N 2-ethyl-9,10-dimethoxyanthracene Chemical compound C1=CC=CC2=C(OC)C3=CC(CC)=CC=C3C(OC)=C21 SURWYRGVICLUBJ-UHFFFAOYSA-N 0.000 description 1
- BDPJILVXUVJWBF-UHFFFAOYSA-N 2-ethyl-9,10-dipropoxyanthracene Chemical compound CCC1=CC=C2C(OCCC)=C(C=CC=C3)C3=C(OCCC)C2=C1 BDPJILVXUVJWBF-UHFFFAOYSA-N 0.000 description 1
- CRWNQZTZTZWPOF-UHFFFAOYSA-N 2-methyl-4-phenylpyridine Chemical compound C1=NC(C)=CC(C=2C=CC=CC=2)=C1 CRWNQZTZTZWPOF-UHFFFAOYSA-N 0.000 description 1
- ZTMADXFOCUXMJE-UHFFFAOYSA-N 2-methylbenzene-1,3-diol Chemical compound CC1=C(O)C=CC=C1O ZTMADXFOCUXMJE-UHFFFAOYSA-N 0.000 description 1
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 1
- VEORPZCZECFIRK-UHFFFAOYSA-N 3,3',5,5'-tetrabromobisphenol A Chemical compound C=1C(Br)=C(O)C(Br)=CC=1C(C)(C)C1=CC(Br)=C(O)C(Br)=C1 VEORPZCZECFIRK-UHFFFAOYSA-N 0.000 description 1
- ALNBMSFIZFUDMD-UHFFFAOYSA-N 3,4-dimethylnaphthalene-1,2-diol Chemical compound C1=CC=C2C(O)=C(O)C(C)=C(C)C2=C1 ALNBMSFIZFUDMD-UHFFFAOYSA-N 0.000 description 1
- OMQHDIHZSDEIFH-UHFFFAOYSA-N 3-Acetyldihydro-2(3H)-furanone Chemical compound CC(=O)C1CCOC1=O OMQHDIHZSDEIFH-UHFFFAOYSA-N 0.000 description 1
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Landscapes
- Compositions Of Macromolecular Compounds (AREA)
- Epoxy Resins (AREA)
- Silicon Polymers (AREA)
- Coating Of Shaped Articles Made Of Macromolecular Substances (AREA)
Description
【0001】
【発明の属する技術分野】
本発明は、新規なケイ素化合物を含有する感光性樹脂組成物及びこれを用いたフィルムに関する。更に詳しくは、ポリエステル、アクリル、ポリカーボネート、ポリエーテルスルフォン、トリアセチルセルロースなどのプラスチックフィルムの耐擦傷性、鉛筆硬度を向上させ、フィルムの反りを少なくする効果に優れた感光性樹脂組成物及びその硬化皮膜を有するハードコートフィルムに関する。
【0002】
【従来の技術】
現在、プラスチックは自動車業界、家電業界、電気電子業界を初めとして種々の産業界で大量に使われている。このようにプラスチックが大量に使われている理由は、その加工性、透明性に加えて軽量、安価、光学特性などの理由による。しかしながら、ガラスなどに比べて柔らかく、表面に傷が付きやすいなどの欠点を有している。これらの欠点を改良するために、表面にハードコート剤をコーティングする事が一般的な手段として行われている。このハードコート剤としては、シリコン系塗料、アクリル系塗料、メラミン系塗料などの熱硬化型のハードコート剤が用いられている。これらの中でも特に、シリコン系ハードコート剤は、ハードネスが高く、品質が優れているため多く用いられている。しかしながら、硬化時間が長く、高価であり、連続的に加工するフィルムのハードコートに適しているとは言えない。
【0003】
近年、感光性のアクリル系ハードコート剤が開発され、利用されるようになった。感光性ハードコート剤は、紫外線などの放射線を照射することにより、直ちに硬化して硬い皮膜を形成するため、加工処理スピードが速く、またハードネス、耐擦傷性などに優れた性能を持ち、トータルコスト的に安価になるため、今やハードコート分野の主流になっている。特に、ポリエステルなどのフィルムの連続加工に適している。プラスチックのフィルムとしては、ポリエステルフィルム、ポリアクリレートフィルム、アクリルフィルム、ポリカーボネートフィルム、塩化ビニルフィルム、トリアセチルセルロースフィルム、ポリエーテルスルフォンフィルムなどがあるが、ポリエステルフィルムが種々の優れた特性から最も広く使用されている。このポリエステルフィルムは、ガラスの飛散防止フィルム、あるいは、自動車の遮光フィルム、ホワイトボード用表面フィルム、システムキッチン表面防汚フィルム、電子材料的には、タッチパネル、液晶ディスプレイ、CRTフラットテレビなどの機能性フィルムとして広く用いられている。これらはいずれもその表面に傷が付かないようにするためにハードコートを塗工している。
【0004】
更に近年、ハードコート剤をコーティングしたフィルムを設けたCRT、LCDなどの表示体では、反射により表示体画面が見難くなり、目が疲れやすいと言う問題が生ずるため、用途によっては、表面反射防止能のあるハードコート処理が必要となっている。表面反射防止の方法としては、感光性樹脂中に無機フィラーや有機系微粒子を分散させたものをフィルム上にコーティングし、表面に凹凸をつけて反射防止する方法(AG処理)、フィルム上に高屈折率層、低屈折率層の順に多層構造を設け、屈折率の差による光の干渉により映り込み、反射を防止する方法(AR処理)、または上記2つの方法を合わせたAG/AR処理の方法などがある。特許文献1には、分子中に少なくとも2個以上の(メタ)アクリロイル基と活性水素を有する放射線硬化型多官能(メタ)アクリレ−トとポリイソシアネートとを反応させた多官能ウレタン(メタ)アクリレート、分子中に2個の(メタ)アクリロイル基を有する放射線硬化型2官能(メタ)アクリレ−ト及び一次粒径が1〜200ナノメートルのコロイダルシリカを含有することを特徴とする放射線硬化型樹脂組成物の硬化皮膜層を有するフィルムが記載されており、このフィルムでは、鉛筆硬度、カ−ル、基材への密着性が良好であるという効果が見出されている。特許文献1に記載のフィルムには、本発明で使用するエポキシ基を有するケイ素化合物(A)を含むことについて記載がない。
【0005】
【特許文献1】
特開2002−69333号公報
【0006】
【発明が解決しようとする課題】
アクリル系の感光性ハードコート剤は、紫外線等の照射により直ちに硬化して硬い皮膜を形成するため、加工処理スピードが速く、またハードネス、耐擦傷性などに優れた性能を持ち、トータルコスト的に安価になるため、今やハードコート分野の主流になっている。しかしながら、アクリル基のラジカル重合による架橋のため、硬化収縮が大きく、フィルムが反ってしまうという問題がある。逆に、フィルムの反りを抑えるためにアクリル樹脂の官能基数を減らすと、硬度、耐擦傷性が劣るという問題が生じ、満足できるものがない。このような状況の中で、近年、硬度、耐擦傷性を維持しつつ、硬化収縮によるフィルムの反りの少ないハードコート剤が求められている。
本発明は、硬化収縮によるフィルムの反りが少なく、更に耐擦傷性に優れ、ポリエステルフィルム上で鉛筆硬度3Hを上回る感光性樹脂組成物及びその硬化皮膜を有するハ−ドコ−トフィルムを提供することを目的とする。
【0007】
【課題を解決するための手段】
本発明者らは前記課題を解決するため、鋭意研究を行った結果、特定の構造を有するケイ素化合物(A)と光カチオン重合開始剤(B)を含有する感光性樹脂組成物が前記課題を解決するものであることを見いだし、本発明を完成させるに至った。
【0008】
すなわち、本発明は、
(1)下記式(1a)
RaSi(OR2)3 (1a)
(式中Raは、エポキシ基を有する置換基を示す。R2は炭素数4以下のアルキル基を示す。)
で表されるアルコキシケイ素化合物同士またはこれと下記式(1b)
RbSi(OR3)3 (1b)
(式中Rbは、炭素数10以下のアルキル基又はアリール基を示す。R3は炭素数4以下のアルキル基を示す。)
で表されるアルコキシケイ素化合物を塩基性触媒の存在下に縮合させて得られるエポキシ基を有するケイ素化合物(A)と光カチオン重合開始剤(B)を含有することを特徴とする感光性樹脂組成物、
(2)(1)において、式(1a)の化合物が、Raとして炭素数3以下のグリシドキシアルキル基および/又はオキシラン基を持った炭素数5〜8のシクロアルキル基で置換されたアルキル基を有する化合物であり、式(1b)の化合物が、Rbとして炭素数6以下のアルキル基又はアリール基を有する化合物であることを特徴とする(1)記載の感光性樹脂組成物、
(3)一次粒径が1〜200ナノメートルのコロイダルシリカ(C)を含有することを特徴とする(1)又は(2)に記載の感光性樹脂組成物、
(4)希釈剤(D)を含有することを特徴とする(1)ないし(3)のいずれか一項に記載の感光性樹脂組成物、
(5)(1)ないし(4)のいずれか一項に記載の感光性樹脂組成物をフィルム上に塗工・硬化させたハードコートフィルム、
に関する。
【0009】
【発明の実施の形態】
本発明で使用する式(1a)で表されるアルコキシケイ素化合物中のエポキシ基を有する置換基Raとしては、エポキシ基を有する置換基であれば特に制限はないが、β−グリシドキシエチル基、γ−グリシドキシプロピル基、γ−グリシドキシブチル基等の炭素数4以下、好ましくは3以下のグリシドキシアルキル基、グリシジル基、β−(3,4−エポキシシクロヘキシル)エチル基、γ−(3,4−エポキシシクロヘキシル)プロピル基、β−(3,4−エポキシシクロヘプチル)エチル基、β−(3,4−エポキシシクロヘキシル)プロピル基、β−(3,4−エポキシシクロヘキシル)ブチル基、β−(3,4−エポキシシクロヘキシル)ペンチル基等のオキシラン基を持った炭素数5〜8のシクロアルキル基で置換されたアルキル基、好ましくはオキシラン基を持った炭素数5〜8のシクロアルキル基で置換された炭素数3以下のアルキル基等が挙げられる。これらの中でβ−グリシドキシエチル基、γ−グリシドキシプロピル基、β−(3,4−エポキシシクロヘキシル)エチル基が好ましい。R2は炭素数4以下のアルキル基を示し、炭素数4以下のアルキル基としては、例えばメチル基、エチル基、プロピル基、イソプロピル基、ブチル基等が挙げられる。これらの置換基Ra、R2を有する式(1a)の化合物として用いる事のできる化合物の好ましい具体例としては、β−グリシドキシエチルトリメトキシシラン、β−グリシドキシエチルトリエトキシシラン、γ−グリシドキシプロピルトリメトキシシラン、γ−グリシドキシプロピルトリエトキシシラン、β−(3,4−エポキシシクロヘキシル)エチルトリメトキシシラン、β−(3,4−エポキシシクロヘキシル)エチルトリエトキシシラン等が挙げられる。
【0010】
また、式(1b)で表されるアルコキシケイ素化合物としては、置換基Rbが、炭素数10以下のアルキル基又はアリール基、好ましくは、組成物の相溶性、硬化物の物性の点から炭素数6以下のアルキル基又はアリール基であり、R3が、炭素数4以下のアルキル基である組み合わせの化合物が好ましい。具体的にはメチルトリメトキシシラン、メチルトリエトキシシラン、メチルトリプロポキシシラン、メチルトリブトキシシラン、エチルトリメトキシシラン、エチルトリエトキシシラン、イソブチルトリメトキシシラン、イソブチルトリエトキシシラン、n−プロピルトリメトキシシラン、n−プロピルトリエトキシシラン、イソプロピルトリメトキシシラン、イソプロピルトリエトキシシラン、デシルトリメトキシシラン、デシルトリエトキシシラン等のアルキルトリアルコキシシラン類、フェニルトリメトキシシラン、フェニルトリエトキシシラン等のアリールトリアルコキシシラン類等が挙げられる。
なお、前記式(1a)又は式(1b)中のアルコキシ基(OR2、OR3)としては、反応条件の点でメトキシ基又はエトキシ基が好ましい。
【0011】
本発明で使用するエポキシ基を有するケイ素化合物(A)を得る前記縮合反応においては、式(1a)で表されるアルコキシケイ素化合物を必須成分とし、式(1a)で表されるアルコキシケイ素化合物単独又は式(1a)で表されるアルコキシケイ素化合物と式(1b)で表されるアルコキシケイ素化合物とを塩基性触媒の存在下、(共)縮合させることにより得る事が出来る。また、(共)縮合を促進するため、必要に応じ水を添加することができる。添加する水は、(共)縮合反応に影響を与えない水であれば用いることができる。水の添加量は、反応混合物全体のアルコキシ基1モルに対し通常0.05〜1.5モル、好ましくは0.07〜1.2モルである。なお、本発明においては、式(1a)同士を縮合するのが好ましい。
【0012】
上記縮合反応に使用する触媒は塩基性であれば特に限定されないが、水酸化ナトリウム、水酸化カリウム、水酸化リチウム、水酸化セシウム、炭酸ナトリウム、炭酸カリウム、炭酸水素ナトリウム、炭酸水素カリウム、アンモニアなどの無機塩基、トリエチルアミン、ジエチレントリアミン、n−ブチルアミン、ジメチルアミノエタノール、トリエタノールアミン、テトラメチルアンモニウムハイドロオキサイドなどの有機塩基を使用することが出来る。これらの中でも、生成物からの触媒除去が容易である点で特に無機塩基が好ましい。触媒の添加量としては、式(1a)のアルコキシケイ素化合物と式(1b)のアルコキシケイ素化合物の合計(重量)に対し、通常5×10−4〜7.5重量%、好ましくは1×10−3〜5重量%である。
【0013】
上記縮合反応は、無溶剤または溶剤中で行うことができる。溶剤としては、式(1a)のアルコキシケイ素化合物及び式(1b)のアルコキシケイ素化合物を溶解する溶剤であれば特に制限はない。このような溶剤としては、例えばジメチルホルムアミド、ジメチルアセトアミド、テトラヒドロフラン、メチルエチルケトン(MEK)、メチルイソブチルケトンなどの非プロトン性極性溶媒、トルエン、キシレン等の芳香族炭化水素系の溶媒等が例示できる。溶剤を使用する場合、溶剤の量は、エポキシ基を有するケイ素化合物(A)の重量に対し、好ましくは0.5〜5倍、より好ましくは0.5〜2倍の重量の溶剤を用いる。
【0014】
本発明では、光カチオン重合開始剤(B)を使用する。光カチオン重合開始剤(B)は、紫外線等を照射することでルイス酸などのカチオン重合触媒を生成するものを用いることができる。例えば、ジアゾニウム塩、スルホニウム塩、ヨードニウム塩等が挙げられる。具体的には、ベンゼンジアゾニウムヘキサフルオロアンチモネート、ベンゼンジアゾニウムヘキサフルオロフォスフェート、ベンゼンジアゾニウムヘキサフルオロボーレート、トリフェニルスルホニウムヘキサフルオロアンチモネート、トリフェニルスルホニウムヘキサフルオロフォスフェート{UVI−6990(商品名:ユニオンカーバイド製)}、トリフェニルスルホニウムヘキサフルオロボーレート、4,4'−ビス[ビス(2−ヒドロキシエトキシフェニル)スルフォニオ]フェニルスルフィドビスヘキサフルオロフォスフェート、ジフェニルヨードニウムヘキサフルオロアンチモネート、ジフェニルヨードニウムヘキサフルオロフォスフェート、ジフェニル−4−チオフェノキシフェニルスルフォニウムヘキサフルオロフォスフェート等が挙げられる。これらは、単独又は2種以上を混合して使用しても良い。
【0015】
光カチオン重合開始剤(B)は、例えば、UVI−6990(商品名:ユニオンカーバイド製)、アデカオプトマーSP−150、アデカオプトマーSP−170(商品名:いずれも旭電化製)、CIT−1370、CIT−1682、CIP−1866S、CIP−2048S、CIP−2064S(商品名:いずれも日本曹達製)、DPI−101、DPI−102、DPI−103、DPI−105、MPI−103、MPI−105、BBI−101、BBI−102、BBI−103、BBI−105、TPS−101、TPS−102、TPS−103、TPS−105、MDS−103、MDS−105、DTS−102、DTS−103(商品名:いずれも、みどり化学製)等として市販されている。光カチオン重合開始剤(B)の使用量は、感光性樹脂組成物の固形分を100重量部とした時、0.5〜20重量部が好ましく、特に好ましくは、1〜15重量部である。
【0016】
本発明の感光性樹脂組成物は、さらに必要に応じて、増感剤を併用することができる。使用しうる増感剤としては、光カチオン重合を促進するものであれば良い。具体的には、アントラセン、9,10−ジメトキシアントラセン、9,10−ジエトキシアントラセン、9,10−ジプロポキシアントラセン、2−エチル−9,10−ジメトキシアントラセン、2−エチル−9,10−ジエトキシアントラセン、2−エチル−9,10−ジプロポキシアントラセン、2−エチル−9,10−ジ(メトキシエトキシ)アントラセン、フルオレン、ピレン、スチルベン、4'−ニトロベンジル−9,10−ジメトキシアントラセン−2−スルホネート、4'−ニトロベンジル−9,10−ジエトキシアントラセン−2−スルホネート、4'−ニトロベンジル−9,10−ジプロポキシアントラセン−2−スルホネート等が挙げられるが、感光性樹脂組成物への溶解性及び相溶性の点で特に2−エチル−9,10−ジ(メトキシエトキシ)アントラセンが好ましい。これら増感剤の使用量は、光カチオン重合開始剤の重量に対し、1〜200重量%が好ましく、より好ましくは、5〜150重量%である。
【0017】
本発明では、一次粒径が1〜200ナノメ−トルのコロイダルシリカ(C)を使用することができる。使用しうるコロイダルシリカ(C)としては、例えば、溶媒にコロイダルシリカを分散させたコロイド溶液、又は分散溶媒を含有しない微粉末のコロイダルシリカがある。溶媒にコロイダルシリカを分散させたコロイド溶液として、例えばメチルエチルケトンに分散したコロイダルシリカ{MEK−ST(商品名:日産化学工業(株)製)}が挙げられる。溶媒にコロイダルシリカを分散させたコロイド溶液の分散媒としては、例えば、水、メタノール、エタノール、イソプロパノール、n−ブタノールなどのアルコール類、エチレングリコール、エチレングリコールモノエチルエーテル、プロピレングリコールモノメチルエーテル、プロピレングリコールモノメチルエーテルアセテートなどの多価アルコール類及びその誘導体、メチルエチルケトン、メチルイソブチルケトン、シクロヘキサノン、ジメチルアセトアミドなどのケトン類、酢酸エチル、酢酸ブチルなどのエステル類、トルエン、キシレンなどの非極性溶媒、2−ヒドロキシブチル(メタ)アクリレート、2−ヒドロキシプロピル(メタ)アクリレート、4−ヒドロキシブチル(メタ)アクリレート等の(メタ)アクリレート類及びその他一般有機溶剤類が使用できる。分散媒の量は、通常コロイダルシリカ100重量部に対し100〜900重量部である。
【0018】
これらのコロイダルシリカ(C)は、周知の方法で製造され市販されているものを使用できる。粒径は、通常、1〜200ナノメートルのものを使用し、好ましくは、5〜100ナノメートル、より好ましくは10〜80ナノメートルである。また、コロイダルシリカ(C)は、本発明においてはpH=2〜6のものを使用することが好ましい。また、コロイダルシリカ(C)の表面をシランカップリング剤等で処理しても良い。
【0019】
本発明では、希釈剤(D)を使用することができる。希釈剤(D)としては、例えば、γ−ブチロラクトン、γ−バレロラクトン、γ−カプロラクトン、γ−ヘプタラクトン、α−アセチル−γ−ブチロラクトン、ε−カプロラクトン等のラクトン類;ジオキサン、1,2−ジメトキシメタン、ジエチレングリコールジメチルエーテル、ジエチレングリコールジエチルエーテル、ジエチレングリコールジブチルエーテル、プロピレングリコールモノメチルエーテル、プロピレングリコールモノエチルエーテル、トリエチレングリコールジメチルエーテル、トリエチレングリコールジエチルエーテル、テトラエチレングリコールジメチルエーテル、テトラエチレングリコールジエチルエーテル等のエーテル類;エチレンカーボネート、プロピレンカーボネート等のカーボネート類;メチルエチルケトン(MEK)、メチルイソブチルケトン、シクロヘキサノン、アセトフェノン等のケトン類;フェノール、クレゾール、キシレノール等のフェノール類;酢酸エチル、酢酸ブチル、エチルセロソルブアセテート、ブチルセロソルブアセテート、カルビトールアセテート、ブチルカルビトールアセテート、プロピレングリコールモノメチルエーテルアセテート等のエステル類;トルエン、キシレン、ジエチルベンゼン、シクロヘキサン等の炭化水素類;トリクロロエタン、テトラクロロエタン、モノクロロベンゼン等のハロゲン化炭化水素類等、石油エーテル、石油ナフサ等の石油系溶剤等の有機溶剤類などが挙げられる。これらは、単独又は2種以上を混合して使用しても良い。
【0020】
本発明の感光性樹脂組成物には、エポキシ基を有するケイ素化合物(A)の他に、これ以外のエポキシ樹脂(E)を添加することができる。エポキシ樹脂(E)としては、光カチオン重合可能なエポキシ樹脂であれば特に制限はなく、通常フェノール性水酸基を2個以上有する化合物をグリシジル化して得ることができる。用いうるエポキシ樹脂の具体例としては、テトラブロモビスフェノールA、テトラブロモビスフェノールF、ビスフェノールA、テトラメチルビスフェノールF、ビスフェノールF、ビスフェノールS若しくはビスフェノールK等のビスフェノール類、又はビフェノール若しくはテトラメチルビフェノール等のビフェノール類、又はハイドロキノン、メチルハイドロキノン、ジメチルハイドロキノン、トリメチルハイドロキノン若しくはジ−tert−ブチルハイドロキノン等のハイドロキノン類、又はレゾルシノール若しくはメチルレゾルシノール等のレゾルシノール類、又はカテコール若しくはメチルカテコール等のカテコール類、又はジヒドロキシナフタレン、ジヒドロキシメチルナフタレン若しくはジヒドロキシジメチルナフタレン等のジヒドロキシナフタレン類のグリシジル化物やフェノール類若しくはナフトール類とアルデヒド類との縮合物、又はフェノール類若しくはナフトール類とキシリレングリコールとの縮合物又はフェノール類とイソプロペニルアセトフェノンとの縮合物又はフェノール類とジシクロペンタジエンとの反応物又はビスメトキシメチルビフェニルとナフトール類若しくはフェノール類との縮合物のグリシジル化物等が挙げられる。これらは、市販若しくは公知の方法により得ることが出来る。これらは単独で用いてもよく、2種以上を用いても良い。
【0021】
更に、本発明の感光性樹脂組成物には、必要に応じてシリカ、アルミナ、ガラスファイバー、タルク等の充填材や離型剤、顔料、表面処理剤、粘度調整剤、可塑剤、安定剤、カップリング剤等、種々の配合剤を添加することができる。
【0022】
本発明の感光性樹脂組成物は、上記(A)成分、(B)成分並びに必要に応じて(C)成分、(D)成分、(E)成分及びその他の成分を任意の順序で混合することにより得ることができる。(A)成分、(B)成分、(C)成分を含有する場合、使用量は、(A)成分2〜80.5重量%、(B)成分0.5〜20重量%、(C)成分1〜50重量%が好ましい。(A)成分、(B)成分、(D)成分を含有する場合、使用量は、(A)成分2〜80.5重量%、(B)成分0.5〜20重量%、(D)成分1〜95重量%が好ましく、更に(D)成分は10〜90重量%がより好ましい。(A)成分、(B)成分、(C)成分、(D)成分、(E)成分を含有する場合、使用量は、(A)成分2〜80.5重量%、(B)成分0.5〜20重量%、(C)成分1〜50重量%、(D)成分1〜95重量%、(E)成分1〜30重量%が好ましく、更に(D)成分は10〜90重量%がより好ましい。こうして得られた本発明の感光性樹脂組成物は、経時的に安定であり、ハードコート剤として好ましく使用できる。また、本発明の感光性樹脂組成物では、上記(A)成分と(B)成分の配合比率は、重量比で(A):(B)=2〜80.5:0.5〜20であることが好ましい。
【0023】
本発明のハードコートフィルムは、上記の感光性樹脂組成物を基材フィルム(ベースフィルム)上に該感光性樹脂組成物の乾燥後重量が0.5〜30g/m2、好ましくは1〜20g/m2(膜厚にすると約0.5〜30μm、好ましくは1〜20μm)になるように塗布し、乾燥後放射線を照射して硬化皮膜を形成させることにより得ることができる。その後、80〜120℃の温度で10〜60分間加熱処理をしても良い。基材フィルムとしては、例えば、ポリエステル、ポリプロピレン、ポリエチレン、ポリアクリレート、ポリカーボネート、トリアセチルセルロース、ポリエーテルスルフォン、シクロオレフィン系ポリマーなどから得られたフィルムが挙げられる。フィルムはある程度厚いシート状のものであっても良い。使用するフィルムは、柄や易接着層を設けたもの、コロナ処理等の表面処理をしたものであっても良い。
【0024】
上記の感光性樹脂組成物の塗布方法としては、例えば、バーコーター塗工、メイヤーバー塗工、エアナイフ塗工、グラビア塗工、リバースグラビア塗工、ダイコーター塗工、オフセット印刷、フレキソ印刷、スクリーン印刷などが挙げられる。
照射する放射線としては、例えば、紫外線、電子線などが挙げられる。紫外線により硬化させる場合、光源としては、キセノンランプ、高圧水銀灯、メタルハライドランプなどを有する紫外線照射装置が使用され、必要に応じて光量、光源の配置などが調整される。高圧水銀灯を使用する場合、80〜120W/cmのエネルギーを有するランプ1灯に対して搬送速度5〜60m/分で硬化させるのが好ましい。
【0025】
【実施例】
以下、本発明を実施例により更に詳細に説明する。尚、本発明はこれら実施例に限定されるものではない。また、実施例中特に断りがない限り、部は重量部を示す。なお、実施例中の各物性値は以下の方法で測定した。
(1)重量平均分子量:GPC(ゲルパーミエーションクロマトグラフィー)法により測定。
(2)エポキシ当量:JIS K−7236に準じた方法で測定。
【0026】
合成例1
γ−グリシドキシプロピルトリメトキシシラン94.4部、メチルイソブチルケトン94.4部、を反応容器に仕込み、80℃に昇温した。昇温後、0.1重量%水酸化カリウム水溶液21.6部を30分間かけて連続的に滴下した。滴下終了後、生成するメタノールを除去しながら80℃にて5時間反応させた。反応終了後、洗浄液が中性になるまで水洗を繰り返した。次いで減圧下で溶媒を除去することにより本発明で使用するエポキシ基を有するケイ素化合物(A−1)67部を得た。得られた化合物のエポキシ当量は166g/eq、重量平均分子量は3700であった。
【0027】
合成例2
β−(3,4−エポキシシクロヘキシル)エチルトリメトキシシラン100部、メチルイソブチルケトン100部を反応容器に仕込み、80℃に昇温した。昇温後、0.1重量%水酸化カリウム水溶液21.6部を30分間かけて連続的に滴下した。滴下終了後、生成するメタノールを除去しながら80℃にて5時間反応させた。反応終了後、洗浄液が中性になるまで水洗を繰り返した。次いで減圧下で溶媒を除去することにより本発明で使用するエポキシ基を有するケイ素化合物(A−2)72部を得た。得られた化合物のエポキシ当量は179g/eq、重量平均分子量は5600であった。
【0028】
合成例3
γ−グリシドキシプロピルトリメトキシシラン70.89部、メチルトリメトキシシラン10.43部、メチルイソブチルケトン81.32部を反応容器に仕込み、80℃に昇温した。昇温後、0.1重量%の水酸化カリウム水溶液21.6部を30分間かけて連続的に滴下した。滴下終了後、生成するメタノールを除去しながら80℃にて5時間反応させた。反応終了後、洗浄液が中性になるまで水洗を繰り返した。次いで減圧下で溶媒を除去することにより本発明で使用するエポキシ基を有するケイ素化合物(A−3)57部を得た。得られた化合物のエポキシ当量は、193g/eq、重量平均分子量2600であった。
【0029】
実施例1〜2、4〜5、参考例3、及び比較例1〜2
表1に示す材料を配合して得た本発明及び比較用の感光性樹脂組成物をバーコーター(No.20)をそれぞれ用いて易接着処理ポリエステルフィルム(東洋紡績(株)製:A−4300、膜厚188μm)に塗布し、80℃の乾燥炉中に1分間放置後、空気雰囲気下で120W/cmの高圧水銀灯、ランプ高さ10cmの距離から5m/分の搬送速度で紫外線を照射し、硬化皮膜(10〜15μm)を有するハ−ドコ−トフィルムを得た。
【0030】
表1
配合量(重量部)
実施例 参考例 実施例 比較例
1 2 3 4 5 1 2
合成例1の化合物(A−1) 50 28.6
合成例2の化合物(A−2) 50 28.6
合成例3の化合物(A−3) 50
DPHA*1 50 28.6
MEK−ST*2 71.4 71.4 71.4
UVI−6990*3 2 2 2 2 2
Irg.184*4 3 3
MEK 50 50 50 50
【0031】
注)
*1:DPHA;日本化薬(株)製、KAYARAD DPHA(ジペンタエリスリトールペンタ/ヘキサアクリレート)
*2:MEK−ST;日産化学工業(株)製、オルガノシリカゾルMEK−ST(固形分30%)
*3:UVI−6990;トリフェニルスルホニウムヘキサフルオロフォスフェート、ユニオンカーバイド社製
*4:Irg.184;チバ・スペシャリティ・ケミカルズ社製、イルガキュアー184(1−ヒドロキシシクロヘキシルフェニルケトン)
*5:MEK;メチルエチルケトン
【0032】
得られた硬化皮膜を有するハ−ドコ−トフィルムにつき、下記項目を評価しその結果を表2に示した。
(鉛筆硬度)
JIS K 5400に従い、鉛筆引っかき試験機を用いて、上記ハ−ドコ−トフィルムの鉛筆硬度を測定した。詳しくは、測定する硬化皮膜を有するポリエステルフィルム上に、鉛筆を45度の角度で、上から1kgの荷重を掛け5mm程度引っかき、傷の付き具合を確認した。5回測定を行った。
評価 5/5:5回中5回とも傷なし
0/5:5回中全て傷発生
【0033】
(耐擦傷性試験)
スチールウール#0000上に200g/cm2の荷重を掛けて10往復させ、傷の状況を目視で判定した。
評価 ○:傷なし
×:傷発生
【0034】
(密着性)
JIS K 5400に従い、ハ−ドコ−トフィルムの表面に1mm間隔で縦、横11本の切れ目を入れて100個の碁盤目を作る。セロハンテープをその表面に密着させた後、一気に剥がしたときに剥離せず残存したマス目の個数を示した。
【0035】
(カール)
ハ−ドコ−トフィルムを5cm×5cmにカットし、80℃の乾燥炉中に1時間放置した後、室温まで戻した。水平な台上で、浮き上がった4辺それぞれの高さを測定し、平均値を測定値(単位:mm)とした。この時、基材自身のカールはいずれも0mmであった。
【0036】
(外観)
表面のクラック、白化、曇りなどの状態を目視で判定した。
評価 ○:良好
△:微少のクラック、白化、曇りなどの発生
×:著しいクラック、白化、曇りなどの発生
【0037】
上記評価結果を表2に示した。
表2
評価結果
鉛筆硬度3H 擦傷性 密着性 カール 外観
実施例1 5/5 ○ 100 0.8 ○
実施例2 5/5 ○ 100 1.0 ○
参考例3 5/5 ○ 100 0.7 ○
実施例4 5/5 ○ 100 0.5 ○
実施例5 5/5 ○ 100 0.7 ○
比較例1 5/5 ○ 84 11.0 ×
比較例2 5/5 ○ 100 8.5 △
実施例1〜2、4〜5、及び参考例3のハ−ドコ−トフィルムは、鉛筆硬度3H、擦傷性、密着性、カール、外観のいずれにも優れた効果を示したが、比較例1〜2のフィルムは、低カ−ルでなく、外観が良くなかった。また、比較例1のフィルムは、密着性についても良くなかった。
【0038】
【発明の効果】
エポキシ基を有する特定のケイ素化合物(A)及び光カチオン重合開始剤(B)を含有する本発明の感光性樹脂組成物の硬化皮膜を有するフィルムは、高硬度、低カール、基材への密着性、擦傷性、外観が良好であり、特にプラスチック光学部品、タッチパネル、フラットパネルディスプレイ、フィルム液晶素子など高硬度を必要とする分野に好適である。[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a photosensitive resin composition containing a novel silicon compound and a film using the same. More specifically, a photosensitive resin composition excellent in the effect of improving the scratch resistance and pencil hardness of a plastic film such as polyester, acrylic, polycarbonate, polyethersulfone, triacetyl cellulose, and reducing the warpage of the film, and its curing. The present invention relates to a hard coat film having a film.
[0002]
[Prior art]
At present, plastics are used in large quantities in various industries including the automobile industry, the home appliance industry, and the electrical and electronic industry. The reason why a large amount of plastic is used in this way is due to reasons such as lightness, low cost, and optical characteristics in addition to its processability and transparency. However, it has disadvantages such as being softer than glass and being easily scratched on the surface. In order to improve these drawbacks, it is a common means to coat the surface with a hard coating agent. As the hard coat agent, thermosetting hard coat agents such as silicon paint, acrylic paint, and melamine paint are used. Among these, silicon hard coat agents are often used because of their high hardness and excellent quality. However, it has a long curing time, is expensive, and cannot be said to be suitable for a hard coat of a continuously processed film.
[0003]
In recent years, photosensitive acrylic hard coating agents have been developed and used. The photosensitive hard coat agent is cured immediately upon irradiation with radiation such as ultraviolet rays to form a hard film, so the processing speed is fast, and it has excellent performance in terms of hardness and scratch resistance. Now it has become the mainstream in the hard coat field because it is cheaper. It is particularly suitable for continuous processing of films such as polyester. Examples of plastic films include polyester films, polyacrylate films, acrylic films, polycarbonate films, vinyl chloride films, triacetyl cellulose films, and polyether sulfone films. Polyester films are the most widely used because of their excellent properties. ing. This polyester film is a glass anti-scattering film, or a car light-shielding film, a whiteboard surface film, a system kitchen surface antifouling film, and functional films such as touch panels, liquid crystal displays, and CRT flat TVs in terms of electronic materials. Is widely used. All of these are coated with a hard coat so as not to scratch the surface.
[0004]
Further, in recent years, display such as CRT and LCD provided with a film coated with a hard coating agent has a problem that the screen of the display is difficult to see due to reflection, and the eyes are likely to get tired. A functional hard coat treatment is required. As a method for preventing surface reflection, a method in which an inorganic filler or organic fine particles dispersed in a photosensitive resin is coated on a film and the surface is made uneven to prevent reflection (AG treatment). A multilayer structure is formed in the order of a refractive index layer and a low refractive index layer, and reflected by light interference due to a difference in refractive index to prevent reflection (AR processing), or AG / AR processing combining the above two methods There are methods. Patent Document 1 discloses a polyfunctional urethane (meth) acrylate obtained by reacting a radiation curable polyfunctional (meth) acrylate having at least two (meth) acryloyl groups and active hydrogen in a molecule with a polyisocyanate. Radiation curable resin comprising radiation curable bifunctional (meth) acrylate having two (meth) acryloyl groups in the molecule and colloidal silica having a primary particle size of 1 to 200 nanometers A film having a cured coating layer of the composition is described, and this film has been found to have good pencil hardness, curl, and good adhesion to the substrate. There is no description in the film of patent document 1 about including the silicon compound (A) which has an epoxy group used by this invention.
[0005]
[Patent Document 1]
JP 2002-69333 A
[0006]
[Problems to be solved by the invention]
Acrylic photosensitive hard coating agent cures immediately upon irradiation with ultraviolet rays and forms a hard film, resulting in high processing speed and excellent performance in terms of hardness and scratch resistance. Due to the low cost, it is now the mainstream in the hard coat field. However, there is a problem that the film is warped due to large shrinkage due to crosslinking by radical polymerization of acrylic groups. On the other hand, if the number of functional groups of the acrylic resin is reduced in order to suppress the warpage of the film, there arises a problem that the hardness and scratch resistance are inferior, and there is nothing satisfactory. Under such circumstances, in recent years, there has been a demand for a hard coating agent that maintains hardness and scratch resistance while causing little warpage of the film due to curing shrinkage.
The present invention provides a photosensitive resin composition having less warpage of a film due to curing shrinkage, excellent scratch resistance, and having a pencil hardness exceeding 3H on a polyester film, and a hard coat film having a cured film thereof. Objective.
[0007]
[Means for Solving the Problems]
In order to solve the above-mentioned problems, the present inventors have conducted intensive research. As a result, a photosensitive resin composition containing a silicon compound (A) having a specific structure and a photocationic polymerization initiator (B) has solved the above problems. It has been found that the problem is solved, and the present invention has been completed.
[0008]
That is, the present invention
(1) The following formula (1a)
R a Si (OR 2 ) 3 (1a)
(Where R a Represents a substituent having an epoxy group. R 2 Represents an alkyl group having 4 or less carbon atoms. )
Or alkoxy silicon compounds represented by the following formula (1b)
R b Si (OR 3 ) 3 (1b)
(Where R b Represents an alkyl group or aryl group having 10 or less carbon atoms. R 3 Represents an alkyl group having 4 or less carbon atoms. )
A photosensitive resin composition comprising a silicon compound (A) having an epoxy group obtained by condensing an alkoxysilicon compound represented by formula (I) in the presence of a basic catalyst and a photocationic polymerization initiator (B). object,
(2) In (1), the compound of formula (1a) is R a As a compound having an alkyl group substituted with a glycidoxyalkyl group having 3 or less carbon atoms and / or a cycloalkyl group having 5 to 8 carbon atoms having an oxirane group, and the compound of the formula (1b) is R b The photosensitive resin composition according to (1), which is a compound having an alkyl group or aryl group having 6 or less carbon atoms as
(3) The photosensitive resin composition according to (1) or (2), which contains colloidal silica (C) having a primary particle size of 1 to 200 nanometers,
(4) The photosensitive resin composition according to any one of (1) to (3), which contains a diluent (D),
(5) A hard coat film obtained by coating and curing the photosensitive resin composition according to any one of (1) to (4) on a film,
About.
[0009]
DETAILED DESCRIPTION OF THE INVENTION
Substituent R having an epoxy group in the alkoxysilicon compound represented by formula (1a) used in the present invention a Is not particularly limited as long as it is a substituent having an epoxy group, but it has 4 or less carbon atoms such as β-glycidoxyethyl group, γ-glycidoxypropyl group, γ-glycidoxybutyl group, preferably 3 or less glycidoxyalkyl group, glycidyl group, β- (3,4-epoxycyclohexyl) ethyl group, γ- (3,4-epoxycyclohexyl) propyl group, β- (3,4-epoxycycloheptyl) ethyl 5 having an oxirane group such as a group, β- (3,4-epoxycyclohexyl) propyl group, β- (3,4-epoxycyclohexyl) butyl group, β- (3,4-epoxycyclohexyl) pentyl group An alkyl group substituted with a cycloalkyl group having 8 to 8 carbon atoms, preferably an alkyl group having 3 or less carbon atoms substituted with a cycloalkyl group having 5 to 8 carbon atoms having an oxirane group. Group, and the like. Among these, β-glycidoxyethyl group, γ-glycidoxypropyl group, and β- (3,4-epoxycyclohexyl) ethyl group are preferable. R 2 Represents an alkyl group having 4 or less carbon atoms, and examples of the alkyl group having 4 or less carbon atoms include a methyl group, an ethyl group, a propyl group, an isopropyl group, and a butyl group. These substituents R a , R 2 Preferable specific examples of the compound that can be used as the compound of formula (1a) having γ-glycidoxyethyltrimethoxysilane, β-glycidoxyethyltriethoxysilane, γ-glycidoxypropyltrimethoxysilane , Γ-glycidoxypropyltriethoxysilane, β- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, β- (3,4-epoxycyclohexyl) ethyltriethoxysilane, and the like.
[0010]
In addition, the alkoxy silicon compound represented by the formula (1b) includes a substituent R b Is an alkyl group or aryl group having 10 or less carbon atoms, preferably an alkyl group or aryl group having 6 or less carbon atoms from the viewpoint of compatibility of the composition and physical properties of the cured product, and R 3 However, the compound of the combination which is a C4 or less alkyl group is preferable. Specifically, methyltrimethoxysilane, methyltriethoxysilane, methyltripropoxysilane, methyltributoxysilane, ethyltrimethoxysilane, ethyltriethoxysilane, isobutyltrimethoxysilane, isobutyltriethoxysilane, n-propyltrimethoxysilane , N-propyltriethoxysilane, isopropyltrimethoxysilane, isopropyltriethoxysilane, decyltrimethoxysilane, decyltriethoxysilane and other alkyltrialkoxysilanes, phenyltrimethoxysilane, phenyltriethoxysilane and other aryltrialkoxysilanes And the like.
In addition, the alkoxy group (OR in the formula (1a) or the formula (1b) 2 , OR 3 ) Is preferably a methoxy group or an ethoxy group in terms of reaction conditions.
[0011]
In the condensation reaction for obtaining the silicon compound (A) having an epoxy group used in the present invention, the alkoxysilicon compound represented by the formula (1a) is an essential component, and the alkoxysilicon compound represented by the formula (1a) alone is used. Alternatively, it can be obtained by (co) condensation of the alkoxysilicon compound represented by the formula (1a) and the alkoxysilicon compound represented by the formula (1b) in the presence of a basic catalyst. Moreover, in order to accelerate | stimulate (co) condensation, water can be added as needed. The water to be added can be any water that does not affect the (co) condensation reaction. The amount of water added is usually 0.05 to 1.5 mol, preferably 0.07 to 1.2 mol, relative to 1 mol of alkoxy groups in the entire reaction mixture. In the present invention, it is preferable to condense the formulas (1a).
[0012]
The catalyst used for the condensation reaction is not particularly limited as long as it is basic, but sodium hydroxide, potassium hydroxide, lithium hydroxide, cesium hydroxide, sodium carbonate, potassium carbonate, sodium bicarbonate, potassium bicarbonate, ammonia, etc. Inorganic bases, organic bases such as triethylamine, diethylenetriamine, n-butylamine, dimethylaminoethanol, triethanolamine, and tetramethylammonium hydroxide can be used. Among these, an inorganic base is particularly preferable because the catalyst can be easily removed from the product. The addition amount of the catalyst is usually 5 × 10 5 with respect to the total (weight) of the alkoxysilicon compound of the formula (1a) and the alkoxysilicon compound of the formula (1b). -4 ~ 7.5% by weight, preferably 1 x 10 -3 ~ 5% by weight.
[0013]
The condensation reaction can be carried out without a solvent or in a solvent. The solvent is not particularly limited as long as it is a solvent that dissolves the alkoxysilicon compound of the formula (1a) and the alkoxysilicon compound of the formula (1b). Examples of such solvents include aprotic polar solvents such as dimethylformamide, dimethylacetamide, tetrahydrofuran, methyl ethyl ketone (MEK), and methyl isobutyl ketone, and aromatic hydrocarbon solvents such as toluene and xylene. When using a solvent, the amount of the solvent is preferably 0.5 to 5 times, more preferably 0.5 to 2 times the weight of the epoxy compound-containing silicon compound (A).
[0014]
In the present invention, the photocationic polymerization initiator (B) is used. As the cationic photopolymerization initiator (B), one that generates a cationic polymerization catalyst such as Lewis acid by irradiating ultraviolet rays or the like can be used. For example, a diazonium salt, a sulfonium salt, an iodonium salt, etc. are mentioned. Specifically, benzenediazonium hexafluoroantimonate, benzenediazonium hexafluorophosphate, benzenediazonium hexafluoroborate, triphenylsulfonium hexafluoroantimonate, triphenylsulfonium hexafluorophosphate {UVI-6990 (trade name: Union Carbide) Manufactured)}, triphenylsulfonium hexafluoroborate, 4,4′-bis [bis (2-hydroxyethoxyphenyl) sulfonio] phenylsulfide bishexafluorophosphate, diphenyliodonium hexafluoroantimonate, diphenyliodonium hexafluorophosphate, Diphenyl-4-thiophenoxyphenylsulfonium hexafluorophosphate Etc. The. You may use these individually or in mixture of 2 or more types.
[0015]
Examples of the cationic photopolymerization initiator (B) include UVI-6990 (trade name: manufactured by Union Carbide), Adeka optomer SP-150, Adeka optomer SP-170 (all trade names: manufactured by Asahi Denka), CIT- 1370, CIT-1682, CIP-1866S, CIP-2048S, CIP-2064S (product names: all manufactured by Nippon Soda), DPI-101, DPI-102, DPI-103, DPI-105, MPI-103, MPI- 105, BBI-101, BBI-102, BBI-103, BBI-105, TPS-101, TPS-102, TPS-103, TPS-105, MDS-103, MDS-105, DTS-102, DTS-103 ( Product name: All are commercially available as Midori Kagaku). The amount of the cationic photopolymerization initiator (B) used is preferably 0.5 to 20 parts by weight, particularly preferably 1 to 15 parts by weight when the solid content of the photosensitive resin composition is 100 parts by weight. .
[0016]
The photosensitive resin composition of the present invention can be used in combination with a sensitizer if necessary. Any sensitizer that can be used may be used as long as it promotes photocationic polymerization. Specifically, anthracene, 9,10-dimethoxyanthracene, 9,10-diethoxyanthracene, 9,10-dipropoxyanthracene, 2-ethyl-9,10-dimethoxyanthracene, 2-ethyl-9,10-di Ethoxyanthracene, 2-ethyl-9,10-dipropoxyanthracene, 2-ethyl-9,10-di (methoxyethoxy) anthracene, fluorene, pyrene, stilbene, 4′-nitrobenzyl-9,10-dimethoxyanthracene-2 -Sulfonate, 4'-nitrobenzyl-9,10-diethoxyanthracene-2-sulfonate, 4'-nitrobenzyl-9,10-dipropoxyanthracene-2-sulfonate and the like can be mentioned, but to the photosensitive resin composition 2-ethyl-9,10-di, especially in terms of solubility and compatibility Methoxyethoxy) anthracene are preferable. The amount of these sensitizers used is preferably 1 to 200% by weight, more preferably 5 to 150% by weight, based on the weight of the photocationic polymerization initiator.
[0017]
In the present invention, colloidal silica (C) having a primary particle size of 1 to 200 nanometers can be used. Examples of the colloidal silica (C) that can be used include a colloidal solution in which colloidal silica is dispersed in a solvent, or fine powdered colloidal silica that does not contain a dispersion solvent. As a colloidal solution in which colloidal silica is dispersed in a solvent, for example, colloidal silica {MEK-ST (trade name: manufactured by Nissan Chemical Industries, Ltd.)} dispersed in methyl ethyl ketone is exemplified. Examples of the dispersion medium for colloidal solution in which colloidal silica is dispersed in a solvent include water, alcohols such as methanol, ethanol, isopropanol, and n-butanol, ethylene glycol, ethylene glycol monoethyl ether, propylene glycol monomethyl ether, and propylene glycol. Polyhydric alcohols such as monomethyl ether acetate and derivatives thereof, ketones such as methyl ethyl ketone, methyl isobutyl ketone, cyclohexanone and dimethylacetamide, esters such as ethyl acetate and butyl acetate, nonpolar solvents such as toluene and xylene, 2-hydroxy (Meth) acrylates such as butyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, 4-hydroxybutyl (meth) acrylate, and Other general organic solvents, can be used for. The amount of the dispersion medium is usually 100 to 900 parts by weight with respect to 100 parts by weight of colloidal silica.
[0018]
These colloidal silica (C) can use what was manufactured by the well-known method and marketed. The particle diameter is usually 1 to 200 nanometers, preferably 5 to 100 nanometers, more preferably 10 to 80 nanometers. Moreover, it is preferable to use a colloidal silica (C) having a pH of 2 to 6 in the present invention. Further, the surface of colloidal silica (C) may be treated with a silane coupling agent or the like.
[0019]
In the present invention, a diluent (D) can be used. Examples of the diluent (D) include lactones such as γ-butyrolactone, γ-valerolactone, γ-caprolactone, γ-heptalactone, α-acetyl-γ-butyrolactone, and ε-caprolactone; dioxane, 1,2- Ethers such as dimethoxymethane, diethylene glycol dimethyl ether, diethylene glycol diethyl ether, diethylene glycol dibutyl ether, propylene glycol monomethyl ether, propylene glycol monoethyl ether, triethylene glycol dimethyl ether, triethylene glycol diethyl ether, tetraethylene glycol dimethyl ether, tetraethylene glycol diethyl ether Carbonates such as ethylene carbonate and propylene carbonate; methyl ethyl ketone ( EK), ketones such as methyl isobutyl ketone, cyclohexanone, acetophenone; phenols such as phenol, cresol, xylenol; ethyl acetate, butyl acetate, ethyl cellosolve acetate, butyl cellosolve acetate, carbitol acetate, butyl carbitol acetate, propylene glycol monomethyl Esters such as ether acetates; Hydrocarbons such as toluene, xylene, diethylbenzene, cyclohexane; Halogenated hydrocarbons such as trichloroethane, tetrachloroethane, and monochlorobenzene; Organic solvents such as petroleum solvents such as petroleum ether and petroleum naphtha And the like. You may use these individually or in mixture of 2 or more types.
[0020]
In addition to the silicon compound (A) having an epoxy group, other epoxy resins (E) can be added to the photosensitive resin composition of the present invention. The epoxy resin (E) is not particularly limited as long as it is an epoxy resin that can be photocationically polymerized, and can usually be obtained by glycidylating a compound having two or more phenolic hydroxyl groups. Specific examples of the epoxy resin that can be used include bisphenols such as tetrabromobisphenol A, tetrabromobisphenol F, bisphenol A, tetramethylbisphenol F, bisphenol F, bisphenol S or bisphenol K, or biphenols such as biphenol or tetramethylbiphenol. Or hydroquinones such as hydroquinone, methylhydroquinone, dimethylhydroquinone, trimethylhydroquinone or di-tert-butylhydroquinone, or resorcinols such as resorcinol or methylresorcinol, or catechols such as catechol or methylcatechol, or dihydroxynaphthalene, dihydroxy Methylnaphthalene or dihydroxydimethylnaphthalene A glycidylated product of dihydroxynaphthalene, a condensate of phenols or naphthols and aldehydes, a condensate of phenols or naphthols and xylylene glycol, a condensate of phenols and isopropenylacetophenone, or a phenol Examples thereof include a reaction product with dicyclopentadiene or a glycidylation product of a condensate of bismethoxymethylbiphenyl with naphthols or phenols. These can be obtained commercially or by known methods. These may be used alone or in combination of two or more.
[0021]
Furthermore, in the photosensitive resin composition of the present invention, if necessary, fillers such as silica, alumina, glass fiber, talc, mold release agents, pigments, surface treatment agents, viscosity modifiers, plasticizers, stabilizers, Various compounding agents such as a coupling agent can be added.
[0022]
In the photosensitive resin composition of the present invention, the component (A), the component (B), and the component (C), the component (D), the component (E), and other components are mixed in any order as necessary. Can be obtained. When the component (A), the component (B), and the component (C) are contained, the amount used is 2-80.5% by weight of the component (A), 0.5-20% by weight of the component (B), (C) Components 1 to 50% by weight are preferred. When the component (A), the component (B), and the component (D) are contained, the amount used is 2-80.5% by weight of the component (A), 0.5-20% by weight of the component (B), (D) The component is preferably 1 to 95% by weight, and the component (D) is more preferably 10 to 90% by weight. When the component (A), the component (B), the component (C), the component (D), and the component (E) are contained, the amount used is 2 to 80.5% by weight of the component (A), component 0 0.5 to 20% by weight, (C) 1 to 50% by weight, (D) 1 to 95% by weight, (E) 1 to 30% by weight, and (D) 10 to 90% by weight. Is more preferable. The photosensitive resin composition of the present invention thus obtained is stable over time and can be preferably used as a hard coating agent. Moreover, in the photosensitive resin composition of this invention, the compounding ratio of the said (A) component and (B) component is (A) :( B) = 2-80.5: 0.5-20 by weight ratio. Preferably there is.
[0023]
The hard coat film of the present invention has the above-mentioned photosensitive resin composition on a base film (base film), and the weight after drying of the photosensitive resin composition is 0.5 to 30 g / m. 2 , Preferably 1 to 20 g / m 2 (It can be obtained by applying a film thickness of about 0.5 to 30 μm, preferably 1 to 20 μm) and irradiating with radiation after drying to form a cured film. Then, you may heat-process for 10 to 60 minutes at the temperature of 80-120 degreeC. Examples of the base film include films obtained from polyester, polypropylene, polyethylene, polyacrylate, polycarbonate, triacetyl cellulose, polyether sulfone, cycloolefin polymer, and the like. The film may be a thick sheet. The film to be used may be one provided with a handle or an easy-adhesion layer, or one subjected to surface treatment such as corona treatment.
[0024]
Examples of the method for applying the photosensitive resin composition include bar coater coating, Mayer bar coating, air knife coating, gravure coating, reverse gravure coating, die coater coating, offset printing, flexographic printing, and screen. For example, printing.
Examples of radiation to be irradiated include ultraviolet rays and electron beams. In the case of curing with ultraviolet rays, an ultraviolet irradiation device having a xenon lamp, a high-pressure mercury lamp, a metal halide lamp or the like is used as a light source, and the light amount, the arrangement of the light source, etc. are adjusted as necessary. When using a high-pressure mercury lamp, it is preferable to cure at a conveying speed of 5 to 60 m / min for one lamp having an energy of 80 to 120 W / cm.
[0025]
【Example】
Hereinafter, the present invention will be described in more detail with reference to examples. The present invention is not limited to these examples. Moreover, unless otherwise indicated in an Example, a part shows a weight part. In addition, each physical property value in an Example was measured with the following method.
(1) Weight average molecular weight: Measured by GPC (gel permeation chromatography) method.
(2) Epoxy equivalent: measured by a method according to JIS K-7236.
[0026]
Synthesis example 1
A reaction vessel was charged with 94.4 parts of γ-glycidoxypropyltrimethoxysilane and 94.4 parts of methyl isobutyl ketone, and the temperature was raised to 80 ° C. After the temperature increase, 21.6 parts of a 0.1 wt% aqueous potassium hydroxide solution was continuously added dropwise over 30 minutes. After completion of the dropping, the reaction was carried out at 80 ° C. for 5 hours while removing the produced methanol. After completion of the reaction, washing with water was repeated until the washing solution became neutral. Subsequently, 67 parts of silicon compounds (A-1) which have an epoxy group used by this invention were obtained by removing a solvent under reduced pressure. The epoxy equivalent of the obtained compound was 166 g / eq, and the weight average molecular weight was 3700.
[0027]
Synthesis example 2
100 parts of β- (3,4-epoxycyclohexyl) ethyltrimethoxysilane and 100 parts of methyl isobutyl ketone were charged into a reaction vessel and heated to 80 ° C. After the temperature increase, 21.6 parts of a 0.1 wt% aqueous potassium hydroxide solution was continuously added dropwise over 30 minutes. After completion of the dropping, the reaction was carried out at 80 ° C. for 5 hours while removing the produced methanol. After completion of the reaction, washing with water was repeated until the washing solution became neutral. Next, the solvent was removed under reduced pressure to obtain 72 parts of a silicon compound (A-2) having an epoxy group used in the present invention. The epoxy equivalent of the obtained compound was 179 g / eq, and the weight average molecular weight was 5600.
[0028]
Synthesis example 3
The reaction vessel was charged with 70.89 parts of γ-glycidoxypropyltrimethoxysilane, 10.43 parts of methyltrimethoxysilane, and 81.32 parts of methyl isobutyl ketone, and the temperature was raised to 80 ° C. After the temperature increase, 21.6 parts of a 0.1 wt% aqueous potassium hydroxide solution was continuously added dropwise over 30 minutes. After completion of the dropping, the reaction was carried out at 80 ° C. for 5 hours while removing the produced methanol. After completion of the reaction, washing with water was repeated until the washing solution became neutral. Subsequently, 57 parts of silicon compounds (A-3) having an epoxy group used in the present invention were obtained by removing the solvent under reduced pressure. The epoxy equivalent of the obtained compound was 193 g / eq and the weight average molecular weight 2600.
[0029]
Example 1 2, 4 ~ 5, Reference example 3 And Comparative Examples 1-2
The present invention obtained by blending the materials shown in Table 1 and a comparative photosensitive resin composition were each subjected to an easy adhesion treatment polyester film (manufactured by Toyobo Co., Ltd .: A-4300) using a bar coater (No. 20). , And left in an oven at 80 ° C. for 1 minute, and then irradiated with ultraviolet rays at a transfer speed of 5 m / min from a distance of a lamp height of 10 cm and a 120 W / cm high-pressure mercury lamp in an air atmosphere. A hard coat film having a cured film (10 to 15 μm) was obtained.
[0030]
Table 1
Compounding amount (parts by weight)
Example Reference example Examples Comparative examples
1 2 3 4 5 1 2
Compound 1 of Synthesis Example 1 50 28.6
Compound 2 of Synthesis Example 2 50 28.6
Compound (A-3) of Synthesis Example 3 50
DPHA * 1 50 28.6
MEK-ST * 2 71.4 71.4 71.4
UVI-6990 * 3 2 2 2 2 2
Irg. 184 * 4 3 3
MEK 50 50 50 50
[0031]
note)
* 1: DPHA; manufactured by Nippon Kayaku Co., Ltd., KAYARAD DPHA (dipentaerythritol penta / hexaacrylate)
* 2: MEK-ST; manufactured by Nissan Chemical Industries, organosilica sol MEK-ST (solid content 30%)
* 3: UVI-6990; triphenylsulfonium hexafluorophosphate, manufactured by Union Carbide
* 4: Irg. 184; Irgacure 184 (1-hydroxycyclohexyl phenyl ketone) manufactured by Ciba Specialty Chemicals
* 5: MEK; methyl ethyl ketone
[0032]
The following items were evaluated for the resulting hard coat film having a cured film, and the results are shown in Table 2.
(Pencil hardness)
According to JIS K 5400, the pencil hardness of the hard coat film was measured using a pencil scratch tester. Specifically, on the polyester film having the cured film to be measured, a pencil was applied at a 45 degree angle and a 1 kg load was applied from above, and the extent of scratches was confirmed. Five measurements were taken.
Evaluation 5/5: No damage in 5 out of 5
0/5: All wounds occurred during 5 times
[0033]
(Abrasion resistance test)
200g / cm on steel wool # 0000 2 The load was reciprocated 10 times, and the state of the scratch was visually determined.
Evaluation ○: No scratch
×: Scratch occurrence
[0034]
(Adhesion)
In accordance with JIS K 5400, 100 vertical grids are made by making 11 vertical and horizontal cuts at 1 mm intervals on the surface of the hard coat film. After the cellophane tape was brought into close contact with the surface, the number of cells remaining without peeling was shown.
[0035]
(curl)
The hard coat film was cut to 5 cm × 5 cm, left in an oven at 80 ° C. for 1 hour, and then returned to room temperature. The height of each of the four raised sides was measured on a horizontal table, and the average value was taken as the measured value (unit: mm). At this time, the curl of the substrate itself was 0 mm.
[0036]
(appearance)
Surface cracks, whitening, cloudiness, and the like were visually determined.
Evaluation ○: Good
Δ: Generation of minute cracks, whitening, cloudiness, etc.
X: Significant cracks, whitening, cloudiness, etc.
[0037]
The evaluation results are shown in Table 2.
Table 2
Evaluation results
Pencil hardness 3H Scratch adhesion Adhesiveness Curl Appearance
Example 1 5/5 ○ 100 0.8 ○
Example 2 5/5 ○ 100 1.0 ○
Reference example 3 5/5 ○ 100 0.7 ○
Example 4 5/5 ○ 100 0.5 ○
Example 5 5/5 ○ 100 0.7 ○
Comparative Example 1 5/5 ○ 84 11.0 ×
Comparative Example 2 5/5 ○ 100 8.5 Δ
Example 1 2, 4 ~ 5, and Reference example 3 The hard coat film showed excellent effects in all of pencil hardness 3H, scratch resistance, adhesion, curl, and appearance. However, the films of Comparative Examples 1 and 2 were not low curl and had an appearance. Was not good. Moreover, the film of the comparative example 1 was not good also about adhesiveness.
[0038]
【The invention's effect】
A film having a cured film of the photosensitive resin composition of the present invention containing a specific silicon compound having an epoxy group (A) and a cationic photopolymerization initiator (B) has high hardness, low curl, and adhesion to a substrate. It is suitable for fields that require high hardness, such as plastic optical parts, touch panels, flat panel displays, and film liquid crystal elements.
Claims (4)
RaSi(OR2)3 (1a)
(式中Raは、エポキシ基を有する置換基を示す。R2は炭素数4以下のアルキル基を示す。)
で表されるアルコキシケイ素化合物同士を塩基性触媒の存在下に縮合させて得られるエポキシ基を有するケイ素化合物(A)と光カチオン重合開始剤(B)を含有することを特徴とする感光性樹脂組成物。The following formula (1a)
R a Si (OR 2 ) 3 (1a)
(In the formula, R a represents a substituent having an epoxy group. R 2 represents an alkyl group having 4 or less carbon atoms.)
A photosensitive resin comprising a silicon compound (A) having an epoxy group obtained by condensing alkoxysilicon compounds represented by the formulas in the presence of a basic catalyst and a photocationic polymerization initiator (B) Composition.
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| DE60324157D1 (en) | 2003-07-22 | 2008-11-27 | Leibniz Inst Neue Materialien | LIQUID-RESISTANT, ALKALI-RESISTANT COATING COMPOSITION AND COATING PATTERN. |
| WO2005040245A1 (en) * | 2003-10-24 | 2005-05-06 | Nippon Kayaku Kabushiki Kaisha | Photosensitive resin composition and film having cured coat formed therefrom |
| TWI288165B (en) | 2004-11-11 | 2007-10-11 | Ind Tech Res Inst | Anti-reflective coating composition, anti-reflective coating and fabrication method thereof |
| DE102005002960A1 (en) | 2005-01-21 | 2006-08-03 | Leibniz-Institut Für Neue Materialien Gemeinnützige Gmbh | Composite composition for micro-patterned layers with high relaxivity, high chemical resistance and mechanical stability |
| JP2006348061A (en) * | 2005-06-13 | 2006-12-28 | Nippon Kayaku Co Ltd | Photosensitive resin composition and film having its cured film |
| JP2007106798A (en) * | 2005-10-11 | 2007-04-26 | Jsr Corp | Optical semiconductor sealing composition, optical semiconductor sealing material, and method for producing optical semiconductor sealing composition |
| US7723404B2 (en) * | 2006-04-06 | 2010-05-25 | Ppg Industries Ohio, Inc. | Abrasion resistant coating compositions and coated articles |
| DE102006033280A1 (en) | 2006-07-18 | 2008-01-24 | Leibniz-Institut Für Neue Materialien Gemeinnützige Gmbh | Composite composition for microstructured layers |
| JP2011184506A (en) * | 2010-03-05 | 2011-09-22 | Shin-Etsu Chemical Co Ltd | Radiation-curable silicone composition |
| JP6412867B2 (en) * | 2013-06-21 | 2018-10-24 | 株式会社カネカ | Active energy ray-curable composition |
| EP3235845B1 (en) | 2014-12-16 | 2020-07-15 | Kaneka Corporation | Photocurable and thermosetting resin composition, cured product and laminate |
| JP6862183B2 (en) * | 2016-01-18 | 2021-04-21 | リケンテクノス株式会社 | Hard coat laminated film |
| US20170369654A1 (en) * | 2016-06-24 | 2017-12-28 | Dow Global Technologies Llc | Curable resin composition |
| US20190185711A1 (en) * | 2016-08-26 | 2019-06-20 | Jnc Corporation | Epoxy resin composition and cured resin film with low curing shrinkage and excellent adhesion |
| JP7352334B2 (en) * | 2017-09-19 | 2023-09-28 | 三洋化成工業株式会社 | Active energy ray curable composition |
| KR102071946B1 (en) * | 2017-12-19 | 2020-01-31 | 경북대학교 산학협력단 | Modified siloxane resin, modified siloxane resin crosslinked product, and preperation method thereof |
| US11807776B2 (en) | 2017-12-19 | 2023-11-07 | Kyungpook National University Industry-Academic Cooperation Foundation | Modified siloxane resin, modified siloxane resin crosslinked product, and manufacturing method for resin crosslinked product |
| US10858541B2 (en) * | 2017-12-19 | 2020-12-08 | Rohm And Haas Electronic Materials Llc | Curable composition |
| WO2022191328A1 (en) * | 2021-03-12 | 2022-09-15 | 株式会社カネカ | Film and method for producing same, laminated film, and display |
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