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JP4432779B2 - Semiconductor package lead alignment apparatus and semiconductor package lead alignment method - Google Patents
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JP4432779B2 - Semiconductor package lead alignment apparatus and semiconductor package lead alignment method - Google Patents

Semiconductor package lead alignment apparatus and semiconductor package lead alignment method Download PDF

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JP4432779B2
JP4432779B2 JP2005001727A JP2005001727A JP4432779B2 JP 4432779 B2 JP4432779 B2 JP 4432779B2 JP 2005001727 A JP2005001727 A JP 2005001727A JP 2005001727 A JP2005001727 A JP 2005001727A JP 4432779 B2 JP4432779 B2 JP 4432779B2
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semiconductor package
jig
balls
bent
lead
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JP2006190833A (en
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勝史 大野
悟 山下
靖 貝梅
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Fuji Electric Co Ltd
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Fuji Electric Systems Co Ltd
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16Inspection; Monitoring; Aligning
    • H05K2203/167Using mechanical means for positioning, alignment or registration, e.g. using rod-in-hole alignment

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  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Wire Bonding (AREA)

Description

本発明は、FPC(フレキシブルサーキット基板)を半導体チップに組み合わせて形成したBGA(Ball Grid Array)型の半導体パッケージの各リードの位置合わせを行い、特に各リードに溶着された多数の半田ボールの相互位置を高精度に合わせる半導体パッケージリード位置合わせ装置及び半導体パッケージリード位置合わせ方法に関する。   The present invention performs alignment of each lead of a BGA (Ball Grid Array) type semiconductor package formed by combining an FPC (flexible circuit board) with a semiconductor chip, and in particular, a plurality of solder balls welded to each lead. The present invention relates to a semiconductor package lead alignment apparatus and a semiconductor package lead alignment method for aligning positions with high accuracy.

FPC(フレキシブルサーキット基板)は、柔軟性のある回路基板であり、薄く、軽く、自由に曲がるという特性を有することから、エレクトロニクス機器のデザインの多様化、形状の複雑化に対応すると共に、設計時の自由度を高める材料として多用されている。
図4に示すように、FPC1を、ベアチップや小型パッケージ(CSP)等の半導体チップ2を包括する状態に折り曲げながら電気的に接続してBGA型の半導体パッケージを構成することが実施されている。
FPC (Flexible Circuit Board) is a flexible circuit board that has the characteristics of being thin, light, and freely bent. It is widely used as a material that increases the degree of freedom.
As shown in FIG. 4, a BGA type semiconductor package is configured by electrically connecting the FPC 1 while bending it so as to include a semiconductor chip 2 such as a bare chip or a small package (CSP).

この際、FPC1の折り曲げられた両側のリード部3に溶着される半田ボール4間の距離L1を所定寸法に高精度に合わせなければならない。これは、BGAを図示せぬプリント基板に実装する際に所定位置に正確に配置しなければ、電気的な接続が適正に行われないからである。
半導体パッケージリード部の位置合わせを行う従来の装置として特許文献1に記載のものがある。この特許文献1の装置は、図5に示すように、U字状にえぐられた形状の凹部11を有する冶具12を2つ用いたものである。図示するように、一方の冶具12の凹部11にFPC13の一方のリード部13aを差し込みながら徐々に折り曲げ、この折り曲げ部分が半導体チップ14の片側を包み込む状態とする。つまり、一方のリード部13aが半導体チップ14の図示上の上面半分位に当した状態となる。
At this time, the distance L1 between the solder balls 4 welded to the lead portions 3 on both sides of the FPC 1 that is bent must be adjusted to a predetermined dimension with high accuracy. This is because if the BGA is mounted on a printed circuit board (not shown), the electrical connection is not properly performed unless the BGA is accurately arranged at a predetermined position.
As a conventional apparatus for aligning semiconductor package lead parts, there is one described in Patent Document 1. As shown in FIG. 5, the apparatus of Patent Document 1 uses two jigs 12 each having a U-shaped recessed portion 11. As shown in the figure, the one lead portion 13a of the FPC 13 is gradually bent while being inserted into the concave portion 11 of one jig 12, and the bent portion wraps one side of the semiconductor chip 14. In other words, a state where one of the lead portion 13a is abutted against the upper surface half position on the illustrated semiconductor chip 14.

これと同様に、他方の冶具12の凹部11にFPC13の他方のリード部13bを差し込みながら徐々に折り曲げ、この折り曲げ部分が半導体チップ14の他方の片側を包み込む状態とする。この際、双方の冶具12を動かしながら各リード部13a,13b間の距離を所定寸法に合わせる。
WO 2004/023546号公報
Similarly, the other lead portion 13b of the FPC 13 is gradually bent into the recess 11 of the other jig 12, and the bent portion wraps the other side of the semiconductor chip 14. At this time, the distance between the lead portions 13a and 13b is adjusted to a predetermined dimension while moving both jigs 12.
WO 2004/023546

上記のように特許文献1においては、冶具12の凹部11にFPC13のリード部13a(又は13b)を入れながらリード部13aを凹部11に沿った形状に折り曲げなければならないが、FPC13は柔らかいが原型は板状で弾力性があるため、その折り曲げ作業が困難であり、各リード部13a,13b間の距離を高精度に所定寸法に合わせる作業は、より困難を伴うという問題がある。   As described above, in Patent Document 1, it is necessary to bend the lead portion 13a into a shape along the concave portion 11 while inserting the lead portion 13a (or 13b) of the FPC 13 into the concave portion 11 of the jig 12, but the FPC 13 is soft but is a prototype. Since it is plate-like and elastic, the bending work is difficult, and there is a problem that the work of adjusting the distance between the lead portions 13a and 13b to a predetermined dimension with high accuracy is more difficult.

本発明は、このような課題に鑑みてなされたものであり、半導体チップにFPCを組み合わせてBGAを形成する際に、半導体チップに沿って折り曲げられたFPCの両側リード部間の距離を容易且つ高精度に所定寸法に合わせることができる半導体パッケージリード位置合わせ装置及び半導体パッケージリード位置合わせ方法を提供することを目的としている。   The present invention has been made in view of such problems. When a BGA is formed by combining an FPC with a semiconductor chip, the distance between both side lead portions of the FPC bent along the semiconductor chip can be easily and An object of the present invention is to provide a semiconductor package lead alignment apparatus and a semiconductor package lead alignment method that can be adjusted to a predetermined dimension with high accuracy.

上記目的を達成するために、本発明の請求項1による半導体パッケージリード位置合わせ装置は、フレキシブルサーキット基板を複数箇所で折り曲げ、各折り曲がり部の表面にリードが接続される複数の溶融金属製のボールを溶着してなる半導体パッケージを対象とし、この半導体パッケージの各折り曲がり部間のボール距離を所定寸法に合わせる半導体パッケージリード位置合わせ装置において、蓋部に所定間隔で且つ前記ボールが嵌合される径の複数の貫通孔を形成した箱型の冶具と、前記冶具にパイプで接続された吸引手段と、前記吸引手段での吸引時に、前記治具内の圧力を計測する圧力計測手段と、前記圧力計測手段の計測値に基づいて前記ボールが前記貫通孔に嵌合されたかを判定する判定手段とを備えたことを特徴とする。 In order to achieve the above object, a semiconductor package lead aligning device according to claim 1 of the present invention is made of a plurality of molten metal substrates in which a flexible circuit board is bent at a plurality of locations, and the leads are connected to the surface of each bent portion. In a semiconductor package lead alignment apparatus that targets a semiconductor package formed by welding balls and adjusts the ball distance between each bent portion of the semiconductor package to a predetermined dimension, the balls are fitted to the lid at predetermined intervals. A box-shaped jig having a plurality of through-holes having a diameter, a suction means connected to the jig by a pipe, a pressure measuring means for measuring the pressure in the jig at the time of suction by the suction means, wherein the ball based on the measurement values of the pressure measuring means and a determining means for determining fitted into the through-hole.

この構成によれば、吸引手段で冶具内の空気を吸引しながら、半導体パッケージの各リード部に溶着された個々のボールを冶具の蓋部の個々の所定貫通孔に合わせ、半導体パッケージ自体を揺する。すると、冶具内が吸引されているので、各ボールが各貫通孔に入って嵌合状態となる。この状態で圧力計測手段の計測値が予め定められた値となれば、ボールが適正に嵌合固定されていることが判定される。 According to this configuration, while sucking the air in the jig with the suction means, the individual balls are welded to the lead portion of the semiconductor package suit individual predetermined through holes of the cover portion of the jig, shaking semiconductor package itself . Then, since the inside of the jig is sucked, each ball enters each through hole and is in a fitted state. If the measured value of the pressure measuring means becomes a predetermined value in this state, it is determined that the ball is properly fitted and fixed.

のように、各リード部を半導体チップに装着する。これによって、各リード部間の距離が所定寸法に高精度に合った状態で各リード部が接着固定される。換言すれば、各リード部に溶着された多数の半田ボールの相互距離が所定寸法に高精度に合った状態で接着固定される。このように、吸引手段で冶具内を吸引させながら各リード部のボールを冶具の蓋部の所定貫通孔に合わせるだけで、各リード部のボール間の距離を所定寸法に高精度に合わせることができる。 As of this, attaching the respective lead portions to the semiconductor chip. As a result, the lead portions are bonded and fixed in a state where the distance between the lead portions matches the predetermined dimension with high accuracy. In other words, the plurality of solder balls welded to the respective lead portions are bonded and fixed in a state where the mutual distance matches a predetermined dimension with high accuracy. In this way, the distance between the balls of each lead portion can be adjusted to a predetermined dimension with high accuracy by simply aligning the balls of each lead portion with the predetermined through holes of the lid portion of the jig while sucking the inside of the jig with the suction means. it can.

更に、本発明の請求項による半導体パッケージリード位置合わせ方法は、フレキシブルサーキット基板の中央部分に枠形状あるいは離隔平行状に配置した棒形状の補強部材を接着し、フレキシブルサーキット基板を複数箇所で折り曲げ、各折り曲がり部の裏面を前記補強部材に接着し、表面にリードが接続される複数の溶融金属製のボールを溶着してなる半導体パッケージを対象とし、この半導体パッケージの各折り曲がり部間のボール距離を所定寸法に合わせる半導体パッケージリード位置合わせ方法において、箱型の治具の蓋部に所定間隔で且つ前記ボールが嵌合される径となるように形成された複数の貫通孔に、前記半導体パッケージの個々のボールを合わせる第1のステップと、前記治具に接続された吸引手段により、冶具内の空気を吸引する第2のステップと、前記第2のステップでの吸引時に、前記治具内の圧力が所定値となった際に、前記折り曲がり部を前記補強部材に接着し、前記半導体パッケージの各折り曲がり部間のボール距離を所定寸法に合わせる第3のステップとを含むことを特徴とする。 Furthermore, the semiconductor package leads alignment method according to claim 2 of the present invention, by bonding a reinforcing member of rod-shaped disposed in a frame shape or spaced parallel shape in the central portion of the flexible circuit board, bending the flexible circuit board at a plurality of locations In addition, a semiconductor package formed by adhering the back surface of each bent portion to the reinforcing member and welding a plurality of molten metal balls to which leads are connected to the front surface is provided between the bent portions of the semiconductor package. In the semiconductor package lead alignment method for adjusting the ball distance to a predetermined dimension, a plurality of through holes formed so as to have a diameter at which the ball is fitted at a predetermined interval on the lid of a box-shaped jig, The first step of aligning the individual balls of the semiconductor package and the suction means connected to the jig allow emptying in the jig. And when the pressure in the jig reaches a predetermined value during suction in the second step, the bent portion is bonded to the reinforcing member, and the semiconductor package And a third step of adjusting a ball distance between the bent portions to a predetermined dimension.

この方法によれば、圧力計測手段の計測値の所定値を、ボールが適正に嵌合固定された状態と予め対応付けておけば、計測値が所定値となった際にボールが適正に嵌合固定されていることがわかる。この状態で、各リード部を半導体チップに接着すれば、各リード部間の距離が所定寸法に高精度に合った状態で各リード部が接着固定されることになる。このように、吸引手段で冶具内を吸引させながら各リード部のボールを冶具の蓋部の所定貫通孔に合わせるだけで、各リード部間の距離を所定寸法に高精度に合わせることができる。   According to this method, if the predetermined value of the measurement value of the pressure measuring means is associated in advance with the state where the ball is properly fitted and fixed, the ball is properly fitted when the measured value reaches the predetermined value. It can be seen that they are fixed together. If each lead part is bonded to the semiconductor chip in this state, each lead part is bonded and fixed in a state in which the distance between the lead parts matches a predetermined dimension with high accuracy. In this way, the distance between the lead portions can be adjusted to a predetermined dimension with high accuracy by simply matching the ball of each lead portion with the predetermined through hole of the lid portion of the jig while sucking the inside of the jig with the suction means.

以上説明したように本発明によれば、半導体チップにFPCを組み合わせてBGAを形成する際に、折り曲げられたFPCの両側リード部間の距離を容易且つ高精度に所定寸法に合わせることができるという効果がある。   As described above, according to the present invention, when a BGA is formed by combining an FPC with a semiconductor chip, the distance between the lead portions on both sides of the folded FPC can be easily and accurately adjusted to a predetermined dimension. effective.

以下、本発明の実施の形態を、図面を参照して説明する。
図1は、本発明の実施の形態に係る半導体パッケージリード位置合わせ装置の構成を示す図である。
図1に示す半導体パッケージリード位置合わせ装置50は、半導体パッケージ20の各リード部25a,25bの相互位置を合わせる位置合わせ冶具51と、真空計52と、真空ポンプ53とを備えて構成されている。
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 is a diagram showing a configuration of a semiconductor package lead alignment apparatus according to an embodiment of the present invention.
A semiconductor package lead alignment apparatus 50 shown in FIG. 1 includes an alignment jig 51 that aligns the mutual positions of the lead portions 25 a and 25 b of the semiconductor package 20, a vacuum gauge 52, and a vacuum pump 53. .

ここで、半導体パッケージ20について図2(a)〜(c)を参照して説明しておく。
半導体パッケージ20は、(a)に示すように、BGA形状を成し、所定の配線回路が形成されたシリコン基板21と、このシリコン基板21の配線回路にバンプ22、パッド22a,22bを介したフリップチップ接続により実装された半導体チップ23と、後述で説明するように折り曲げられ、シリコン基板21の配線回路にバンプ24、シリコン基板実装用パッド34、半導体チップ実装用パッド37を介したフリップチップ接続によって接続されたFPC25とを備えて構成されている。但し、半導体チップ23は、半田ボールを持ったパッケージ又は半田ボールの無いむき出しのベアチップそのもの等である。
Here, the semiconductor package 20 will be described with reference to FIGS.
As shown in FIG. 2A, the semiconductor package 20 has a BGA shape and a predetermined wiring circuit formed thereon, and the wiring circuit of the silicon substrate 21 is provided with bumps 22 and pads 22a and 22b. The semiconductor chip 23 mounted by the flip chip connection and the flip chip connection which is bent as described later and is connected to the wiring circuit of the silicon substrate 21 via the bump 24, the silicon substrate mounting pad 34 and the semiconductor chip mounting pad 37. And an FPC 25 connected to each other. However, the semiconductor chip 23 is a package having a solder ball or an exposed bare chip itself without a solder ball.

FPC25は、(b)のFPC表面図及び(c)の裏面図に示すように、中央部分に積層される半導体チップが通過できる大きさの開口部38が設けられた長方形の柔軟なシート状を成し、この長方形両側の所定幅領域に多数の半田ボール実装用パッド31を形成したリード部25a,25bの裏面に、当該リード部25a,25bと略同じ長方形の板状補強部材33を貼り付け、また、FPC25の開口部38の周囲に形成されたシリコン基板実装用パッド34の裏面に、四角枠形状の中央補強部材35を貼り付けて構成されている。   As shown in the FPC front view in (b) and the back view in (c), the FPC 25 has a rectangular flexible sheet shape provided with an opening 38 that is large enough to allow a semiconductor chip stacked in the center portion to pass therethrough. And a plate-like reinforcing member 33 having the same rectangular shape as that of the lead portions 25a and 25b is attached to the back surface of the lead portions 25a and 25b in which a large number of solder ball mounting pads 31 are formed in a predetermined width region on both sides of the rectangle. In addition, a square frame-shaped central reinforcing member 35 is attached to the back surface of the silicon substrate mounting pad 34 formed around the opening 38 of the FPC 25.

なお、半田ボール実装用パッド31とシリコン基板実装用パッド34は、所定の配線回路によりそれぞれ接続されている。また、シリコン基板21でなく、半導体チップの上に半導体チップ23を積層するようにして良いことは勿論である。
次に、位置合わせ冶具51は、内部が空洞の箱型を成しており、蓋部51aには、多数の半田ボール36を個々に嵌合するための多数の貫通孔51bが形成されている。この多数の貫通孔51bの相互間隔は、半導体パッケージ20を図示せぬプリント基板に正確に実装する際に必要な寸法とされており、例えば±100μmといった高精度に形成されている。
The solder ball mounting pad 31 and the silicon substrate mounting pad 34 are connected to each other by a predetermined wiring circuit. Of course, the semiconductor chip 23 may be laminated on the semiconductor chip instead of the silicon substrate 21.
Next, the positioning jig 51 has a hollow box shape inside, and a large number of through-holes 51b for individually fitting a large number of solder balls 36 are formed in the lid portion 51a. . The interval between the plurality of through holes 51b is a dimension necessary for accurately mounting the semiconductor package 20 on a printed circuit board (not shown), and is formed with high accuracy of ± 100 μm, for example.

また、それら貫通孔51bの相互間隔は、半導体パッケージ20の各リード部25a,25bに溶着された多数の半田ボール36の間隔に対応しており、後述で詳細に説明するように、全ての半田ボール36を所定の貫通孔51bに嵌合することによって各リード部25a,25b間の距離L2が所定寸法に高精度に合うようになっている。つまり、各リード部25a,25bに溶着された多数の半田ボール36の相互距離が所定寸法に高精度に合うようになっている。   Further, the mutual interval between the through holes 51b corresponds to the interval between a large number of solder balls 36 welded to the respective lead portions 25a and 25b of the semiconductor package 20, and as will be described in detail later, By fitting the ball 36 into the predetermined through hole 51b, the distance L2 between the lead portions 25a and 25b can be adjusted to a predetermined dimension with high accuracy. In other words, the mutual distance between the numerous solder balls 36 welded to the respective lead portions 25a and 25b matches the predetermined dimension with high accuracy.

また、位置合わせ冶具51の一側面には貫通穴が開口されており、この貫通穴にパイプを介して真空ポンプ53が接続されており、この接続パイプの途中に真空計52が接続されている。
真空計52は、真空ポンプ53によって位置合わせ冶具51の内部を吸引した状態において、蓋部51aの各貫通孔51bに各半田ボール36が適正に嵌合された際に、真空度が所定値を示すようになっている。半田ボール36が適正に嵌合されていなければ貫通孔51bの隙間から空気が入って所定の真空度とならない。
Further, a through hole is opened on one side of the alignment jig 51, and a vacuum pump 53 is connected to the through hole through a pipe, and a vacuum gauge 52 is connected to the connection pipe. .
The vacuum gauge 52 has a predetermined degree of vacuum when the solder balls 36 are properly fitted in the through holes 51b of the lid 51a in a state where the interior of the alignment jig 51 is sucked by the vacuum pump 53. As shown. If the solder balls 36 are not properly fitted, air enters through the gaps in the through holes 51b and does not reach a predetermined degree of vacuum.

このような構成の半導体パッケージリード位置合わせ装置50によって、多数の半田ボール36の相互距離を高精度に合わせる際の動作を説明する。
但し、半導体パッケージ20の各リード部25a,25bに溶着された多数の半田ボール36は、基本的に所定位置に溶着されている。また、半導体パッケージ20のFPC25は中央補強部材35に沿って折り曲げられているが、この両側の板状補強部材33を中央補強部材35に接着されていない状態としておく。つまり、各リード部25a,25bが固定されていない状態としておく。
An operation when the mutual distances of a large number of solder balls 36 are adjusted with high accuracy by the semiconductor package lead alignment apparatus 50 having such a configuration will be described.
However, a large number of solder balls 36 welded to the lead portions 25a and 25b of the semiconductor package 20 are basically welded at predetermined positions. The FPC 25 of the semiconductor package 20 is bent along the central reinforcing member 35, but the plate-like reinforcing members 33 on both sides are not bonded to the central reinforcing member 35. That is, the lead portions 25a and 25b are not fixed.

まず、真空ポンプ53を起動させて位置合わせ冶具51の内部の空気を吸引する状態とする。次に、半導体パッケージ20の各リード部25a,25bの多数の半田ボール36を、蓋部51aの多数の貫通孔51bに合わせながら載せ、半導体パッケージ20自体を前後左右に揺らしながら各貫通孔51bに各半田ボール36を入れる。
この際、位置合わせ冶具51の内部は吸引状態となっているので、半田ボール36は貫通孔51bに入った瞬間吸い込まれて嵌合される。この状態で真空計52の真空度が予め定められた値となれば、半田ボール36が適正に嵌合固定されていることが分かる。この状態で、各リード部25a,25bの板状補強部材33を、中央補強部材35に接着する。
First, the vacuum pump 53 is activated so that the air inside the alignment jig 51 is sucked. Next, a large number of solder balls 36 of each lead portion 25a, 25b of the semiconductor package 20 are placed in alignment with the large number of through holes 51b of the lid portion 51a, and the semiconductor package 20 itself is shaken back and forth and left and right to each through hole 51b. Each solder ball 36 is inserted.
At this time, since the inside of the alignment jig 51 is in a suction state, the solder ball 36 is sucked and fitted into the through hole 51b at the moment. If the degree of vacuum of the vacuum gauge 52 becomes a predetermined value in this state, it is understood that the solder ball 36 is properly fitted and fixed. In this state, the plate-like reinforcing members 33 of the lead portions 25 a and 25 b are bonded to the central reinforcing member 35.

これによって、各リード部25a,25b間の距離L2が所定寸法に高精度に合った状態で各リード部25a,25bが接着固定されることになる。換言すれば、各リード部25a,25bに溶着された多数の半田ボール36の相互距離が所定寸法に高精度に合った状態で接着固定されることになる。
以上説明したように本実施の形態の半導体パッケージリード位置合わせ装置50によれば、真空ポンプ53で位置合わせ冶具51内の空気を吸引しながら、半導体パッケージ20の各リード部25a,25bに溶着された個々の半田ボール36を冶具51の蓋部51aの個々の所定貫通孔51bに合わせ、半導体パッケージ20自体を揺する。すると、冶具51内が吸引されているので各半田ボール36が各貫通孔51bに入って嵌合状態となる。
As a result, the lead portions 25a and 25b are bonded and fixed in a state where the distance L2 between the lead portions 25a and 25b matches the predetermined dimension with high accuracy. In other words, the plurality of solder balls 36 welded to the respective lead portions 25a and 25b are bonded and fixed in a state where the mutual distances meet a predetermined dimension with high accuracy.
As described above, according to the semiconductor package lead alignment apparatus 50 of the present embodiment, the vacuum pump 53 is welded to the lead portions 25a and 25b of the semiconductor package 20 while sucking the air in the alignment jig 51. The individual solder balls 36 are aligned with the respective predetermined through holes 51b of the lid portion 51a of the jig 51, and the semiconductor package 20 itself is shaken. Then, since the inside of the jig 51 is sucked, each solder ball 36 enters each through hole 51b and is in a fitted state.

この状態で真空計52の真空度が予め定められた値となれば、半田ボール36が適正に嵌合固定されていることが分かる。この状態で、中央補強部材35に板状補強部材33を接着することによって各リード部25a,25bを接着固定する。
これによって、各リード部25a,25b間の距離L2が所定寸法に高精度に合った状態で各リード部25a,25bが接着固定される。このように、真空ポンプ53で冶具51内を吸引させながら各リード部25a,25bの半田ボール36を冶具51の蓋部51aの所定貫通孔51bに合わせるだけで、各リード部25a,25b間の距離L2を所定寸法に高精度に合わせることができる。
If the degree of vacuum of the vacuum gauge 52 becomes a predetermined value in this state, it is understood that the solder ball 36 is properly fitted and fixed. In this state, the lead reinforcing members 33 are bonded to the central reinforcing member 35 to bond and fix the lead portions 25a and 25b.
As a result, the lead portions 25a and 25b are bonded and fixed in a state where the distance L2 between the lead portions 25a and 25b matches a predetermined dimension with high accuracy. As described above, the vacuum balls 53 are used to suck the inside of the jig 51 and align the solder balls 36 of the lead portions 25a and 25b with the predetermined through holes 51b of the lid portion 51a of the jig 51. The distance L2 can be adjusted to a predetermined dimension with high accuracy.

但し、上記では、中央補強部材35及び板状補強部材33を用いた半導体パッケージ20を引用して説明したが、図4に示した構成の半導体パッケージであれば、リード部3を半導体チップ2の周囲に折り曲げて接着していない状態で、上記実施の形態と同様に位置合わせ装置50にて位置合わせを行ってもよい。この場合も同様の効果を得ることができる。   However, in the above description, the semiconductor package 20 using the central reinforcing member 35 and the plate-like reinforcing member 33 has been described. However, if the semiconductor package has the configuration shown in FIG. The alignment may be performed by the alignment device 50 in the same manner as in the above embodiment in a state where the periphery is not bent and bonded. In this case, the same effect can be obtained.

また、以上の実施の形態では、FPCを両端のみを折り曲げて直方体形状に加工する例を説明したが、図3に示すように4方向から折り曲げて直方体形状に加工しても良いことは勿論である。図3(a)はFPCの構成を示しており、中央部分の設けられた開口部38の4辺方向にリード部32が設けられている。これらの4つのリード部32を折り曲げることにより、図3(b)の加工後の上面図に示すように直方体形状に加工されたFPCを構成することができる。
更に、実施の形態では、真空ポンプと真空計を用いた場合について説明したが、必ずしも真空である必要はなく、吸真空ポンプや真空計を含む一般的な吸引ポンプや圧力計を用いても良いことは勿論である。
In the above embodiment, an example has been described in which the FPC is bent at both ends to be processed into a rectangular parallelepiped shape. However, as shown in FIG. is there. FIG. 3A shows the configuration of the FPC, in which lead portions 32 are provided in the directions of the four sides of the opening 38 provided in the central portion. By bending these four lead portions 32, an FPC processed into a rectangular parallelepiped shape can be configured as shown in the top view after processing in FIG.
Furthermore, in the embodiment, the case where a vacuum pump and a vacuum gauge are used has been described. However, it is not always necessary to use a vacuum, and a general suction pump or pressure gauge including a suction vacuum pump or a vacuum gauge may be used. Of course.

本発明の実施の形態に係る半導体パッケージリード位置合わせ装置の構成を示す図である。It is a figure which shows the structure of the semiconductor package lead alignment apparatus which concerns on embodiment of this invention. 半導体パッケージの構成を示し、(a)は半導体パッケージの断面図、(b)はFPCの表面図、(c)はFPCの裏面図である。The structure of a semiconductor package is shown, (a) is sectional drawing of a semiconductor package, (b) is the front view of FPC, (c) is a back view of FPC. 半導体パッケージの他の構成を示し、(a)はFPCの表面図、(b)は加工後の上面図である。2A and 2B show another configuration of a semiconductor package, in which FIG. 1A is a front view of an FPC, and FIG. 従来の半導体パッケージの構成を示す断面図である。It is sectional drawing which shows the structure of the conventional semiconductor package. 従来の半導体パッケージリード部の位置合わせ用の冶具及び半導体チップを示す断面図である。It is sectional drawing which shows the jig for alignment of the conventional semiconductor package lead | read | reed part, and a semiconductor chip.

符号の説明Explanation of symbols

20 半導体パッケージ
21 シリコン基板
22 バンプ
23 半導体チップ
24 バンプ
25 FPC
25a,25b リード部
31 半田ボール実装用パッド
33 板状補強部材
34 シリコン基板実装用パッド
35 中央補強部材
36 半田ボール
38 開口部
50 半導体パッケージリード位置合わせ装置
51 位置合わせ冶具
51a 蓋部
51b 貫通孔
52 真空計
53 真空ポンプ
20 Semiconductor Package 21 Silicon Substrate 22 Bump 23 Semiconductor Chip 24 Bump 25 FPC
25a, 25b Lead part 31 Solder ball mounting pad 33 Plate-shaped reinforcing member 34 Silicon substrate mounting pad 35 Central reinforcing member 36 Solder ball 38 Opening 50 Semiconductor package lead alignment device 51 Alignment jig 51a Lid 51b Through hole 52 Vacuum gauge 53 Vacuum pump

Claims (2)

フレキシブルサーキット基板を複数箇所で折り曲げ、各折り曲がり部の表面にリードが接続される複数の溶融金属製のボールを溶着してなる半導体パッケージを対象とし、この半導体パッケージの各折り曲がり部間のボール距離を所定寸法に合わせる半導体パッケージリード位置合わせ装置において、
蓋部に所定間隔で且つ前記ボールが嵌合される径の複数の貫通孔を形成した箱型の冶具と、
前記冶具にパイプで接続された吸引手段と、
前記吸引手段での吸引時に、前記治具内の圧力を計測する圧力計測手段と、
前記圧力計測手段の計測値に基づいて前記ボールが前記貫通孔に嵌合されたかを判定する判定手段と
を備えたことを特徴とする半導体パッケージリード位置合わせ装置。
Targeting a semiconductor package in which a flexible circuit board is bent at a plurality of locations and a plurality of molten metal balls welded with leads connected to the surface of each bent portion, the balls between the bent portions of this semiconductor package In a semiconductor package lead alignment device that adjusts the distance to a predetermined dimension,
A box-shaped jig formed with a plurality of through-holes with a diameter at which the balls are fitted into the lid at a predetermined interval ;
Suction means connected to the jig by a pipe;
Pressure measuring means for measuring the pressure in the jig at the time of suction by the suction means;
Determining means for determining whether the ball is fitted in the through hole based on a measurement value of the pressure measuring means;
Semiconductor package lead positioning device characterized by comprising a.
フレキシブルサーキット基板の中央部分に枠形状あるいは離隔平行状に配置した棒形状の補強部材を接着し、フレキシブルサーキット基板を複数箇所で折り曲げ、各折り曲がり部の裏面を前記補強部材に接着し、表面にリードが接続される複数の溶融金属製のボールを溶着してなる半導体パッケージを対象とし、この半導体パッケージの各折り曲がり部間のボール距離を所定寸法に合わせる半導体パッケージリード位置合わせ方法において、
箱型の治具の蓋部に所定間隔で且つ前記ボールが嵌合される径となるように形成された複数の貫通孔に、前記半導体パッケージの個々のボールを合わせる第1のステップと、
前記治具に接続された吸引手段により、冶具内の空気を吸引する第2のステップと、
前記第2のステップでの吸引時に、前記治具内の圧力が所定値となった際に、前記折り曲がり部を前記補強部材に接着し、前記半導体パッケージの各折り曲がり部間のボール距離を所定寸法に合わせる第3のステップと
を含むことを特徴とする半導体パッケージリード位置合わせ方法
A rod-shaped reinforcing member arranged in a frame shape or spaced apart parallel to the central portion of the flexible circuit board is bonded, the flexible circuit board is bent at a plurality of locations, and the back surface of each bent portion is bonded to the reinforcing member, In a semiconductor package lead alignment method that targets a semiconductor package formed by welding a plurality of molten metal balls to which leads are connected, and matches the ball distance between each bent portion of the semiconductor package to a predetermined dimension.
A first step of aligning the individual balls of the semiconductor package with a plurality of through holes formed at a predetermined interval on the lid portion of the box-shaped jig and having a diameter with which the balls are fitted;
A second step of sucking air in the jig by suction means connected to the jig;
When the pressure in the jig reaches a predetermined value during suction in the second step, the bent portion is bonded to the reinforcing member, and the ball distance between the bent portions of the semiconductor package is set. A third step to fit a predetermined dimension;
Semiconductors package leads aligned way to comprising a.
JP2005001727A 2005-01-06 2005-01-06 Semiconductor package lead alignment apparatus and semiconductor package lead alignment method Expired - Fee Related JP4432779B2 (en)

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