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JP4521494B2 - BGA type semiconductor package mounting structure and reinforcing resin filling method - Google Patents
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JP4521494B2 - BGA type semiconductor package mounting structure and reinforcing resin filling method - Google Patents

BGA type semiconductor package mounting structure and reinforcing resin filling method Download PDF

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JP4521494B2
JP4521494B2 JP2005284710A JP2005284710A JP4521494B2 JP 4521494 B2 JP4521494 B2 JP 4521494B2 JP 2005284710 A JP2005284710 A JP 2005284710A JP 2005284710 A JP2005284710 A JP 2005284710A JP 4521494 B2 JP4521494 B2 JP 4521494B2
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semiconductor package
type semiconductor
bga type
reinforcing resin
wiring board
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JP2007096068A (en
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武伯 塚田
高司 石川
隆 弥富
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株式会社カシオ日立モバイルコミュニケーションズ
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Description

本発明は、底面に複数の電極がマトリックス状に配置されたBGA(Ball Grid Array)型半導体パッケージをプリント配線基板上に実装する構造、特に、BGA型半導体パッケージの下面とプリント配線基板の上面との隙間に、BGA型半導体パッケージとプリント配線基板との接着強度を補強する樹脂を介在させてなるBGA型半導体パッケージの実装構造と、BGA型半導体パッケージ下面とプリント配線基板の上面との隙間に前記補強用樹脂を充填する方法に関する。   The present invention has a structure in which a BGA (Ball Grid Array) type semiconductor package having a plurality of electrodes arranged in a matrix on the bottom surface is mounted on a printed wiring board, and in particular, a lower surface of the BGA type semiconductor package and an upper surface of the printed wiring board. And a gap between the bottom surface of the BGA type semiconductor package and the top surface of the printed wiring board, and a gap between the bottom surface of the BGA type semiconductor package and the top surface of the printed wiring board. The present invention relates to a method of filling a reinforcing resin.

BGA型半導体パッケージは、その底面の各電極部に取り付けられた半田ボールのみによってプリント配線基板に固定される実装構造のため、外部からの衝撃に弱い。たとえば、これが組み込まれた携帯型電子機器に落下等による強い衝撃が加わると、半田付け部が剥離したり半田付け部にクラックが発生し、BGA型半導体パッケージがプリント配線基板から脱落したりBGA型半導体パッケージとプリント配線基板との電気的な接続が不良になったりして使用不可能となってしまう。
従って、BGA型半導体パッケージの実装に当たっては、外部からの衝撃によってBGA型半導体パッケージがプリント配線基板から脱落したり接続不良になったりしないようにすることが重要である。また、これと同時に、BGA型半導体パッケージの不良が発見された際にはBGA型半導体パッケージを容易に取り外せるようにすることも重要である。
Since the BGA type semiconductor package is a mounting structure that is fixed to the printed wiring board only by the solder balls attached to the respective electrode portions on the bottom surface thereof, it is vulnerable to external impacts. For example, when a strong impact due to dropping or the like is applied to a portable electronic device in which this is incorporated, the soldering part is peeled off or a crack is generated in the soldering part, and the BGA type semiconductor package is dropped from the printed wiring board. The electrical connection between the semiconductor package and the printed wiring board becomes defective and cannot be used.
Therefore, when mounting the BGA type semiconductor package, it is important to prevent the BGA type semiconductor package from dropping off the printed wiring board or causing poor connection due to external impact. At the same time, it is also important that the BGA type semiconductor package can be easily removed when a defect of the BGA type semiconductor package is found.

このような要望を満たす技術として、特許文献1では、BGA型半導体パッケージと当該半導体パッケージが実装される基板(プリント配線基板)との間隙の全面ではなく、一部にのみ補強樹脂を介在させる構成が提案されている。その実施の形態1として、図面中の符号を併記すれば、BGA型半導体パッケージ1を実装基板2に搭載した後、BGA型半導体パッケージ1及び実装基板2の外側から、ディスペンサーを用いて、BGA型半導体パッケージ1及び実装基板2の間隙における各コーナー部に、一定量の補強用樹脂4を注入する構成が記載されている(特許文献1の段落[0042]参照。)   As a technique that satisfies such a demand, Patent Document 1 discloses a configuration in which a reinforcing resin is interposed only in a part of the gap between a BGA type semiconductor package and a substrate (printed wiring board) on which the semiconductor package is mounted. Has been proposed. As the first embodiment, if the reference numerals in the drawings are also written, after the BGA type semiconductor package 1 is mounted on the mounting substrate 2, the BGA type semiconductor package 1 and the mounting substrate 2 are used from outside the BGA type semiconductor package 1 and the mounting substrate 2 by using a dispenser. A configuration is described in which a certain amount of reinforcing resin 4 is injected into each corner portion in the gap between the semiconductor package 1 and the mounting substrate 2 (see paragraph [0042] of Patent Document 1).

また、特許文献2では、BGA型ICパッケージが実装されたマザーボード(プリント配線基板)に、BGA型ICパッケージの側面周囲を囲む側面部を備えた枠状の補強フレームを取り付け、この補強フレーム内にICパッケージ補強用の樹脂を充填する構成が提案されている。その実施の形態1として、図面中の符号を併記すれば、補強フレーム10の側面に形成された切欠き11aにディスペンサーのノズル51を挿入してBGA型ICパッケージ1とマザーボード6との隙間に直接補強用樹脂50を注入するとともに、補強フレーム10の上面四隅に形成された切欠き12aにディスペンサーのノズル51を挿入してBGA型ICパッケージ1の四隅付近に補強用樹脂50を注入する構成が記載されている(特許文献2の段落[0050]〜[0055]、図2及び図3参照)。
特開2000−299356号公報 特開2000−151083号公報
In Patent Document 2, a frame-shaped reinforcing frame having a side surface surrounding the side surface of the BGA type IC package is attached to a motherboard (printed wiring board) on which the BGA type IC package is mounted. A configuration in which a resin for reinforcing an IC package is filled has been proposed. As the first embodiment, if the reference numerals in the drawings are also written, the nozzle 51 of the dispenser is inserted into the notch 11a formed on the side surface of the reinforcing frame 10 and directly into the gap between the BGA type IC package 1 and the mother board 6. A configuration is described in which the reinforcing resin 50 is injected, and the nozzles 51 of the dispenser are inserted into the notches 12a formed at the four corners of the upper surface of the reinforcing frame 10 to inject the reinforcing resin 50 near the four corners of the BGA type IC package 1. (See paragraphs [0050] to [0055] of Patent Document 2 and FIGS. 2 and 3).
JP 2000-299356 A JP 2000-151083 A

しかしながら、特許文献1及び特許文献2のように、BGA型半導体パッケージ(BGA型ICパッケージ)とプリント配線基板(実装基板、マザーボード)との隙間に直接補強用樹脂を充填する方法では、ディスペンサーのノズルの位置合わせを高精度で行う必要があり、高価なディスペンサーを使用しなければならないという不都合がある。   However, as in Patent Document 1 and Patent Document 2, in the method of directly filling the reinforcing resin in the gap between the BGA type semiconductor package (BGA type IC package) and the printed wiring board (mounting board, motherboard), the nozzle of the dispenser There is a disadvantage in that it is necessary to perform the positioning of the lens with high accuracy and to use an expensive dispenser.

なお、特許文献2には明記されていないが、補強フレーム10の上面四隅に形成された切欠き12aにディスペンサーのノズル51を挿入してBGA型ICパッケージ1の四隅付近に補強用樹脂50を注入した際にも、補強用樹脂50はBGA型ICパッケージ1とマザーボード6との隙間に浸透し得るので、この方法を用いてBGA型ICパッケージ1とマザーボード6との隙間に補強用樹脂50を充填する方法も考えられる。   Although not specified in Patent Document 2, the dispenser nozzles 51 are inserted into the notches 12 a formed at the four corners of the upper surface of the reinforcing frame 10, and the reinforcing resin 50 is injected near the four corners of the BGA type IC package 1. In this case, the reinforcing resin 50 can permeate into the gap between the BGA type IC package 1 and the mother board 6, so that the reinforcing resin 50 is filled into the gap between the BGA type IC package 1 and the mother board 6 by using this method. A way to do this is also conceivable.

しかし、この方法では、BGA型ICパッケージ1近傍のマザーボード6上面に射出された補強用樹脂50が自然拡散でBGA型ICパッケージ1の下面とマザーボード6の上面との間に浸透していく構成となるので、浸透領域は補強用樹脂50の粘性(流動性)によって異なる。
補強用樹脂の粘性(流動性)は温度の影響を受け易いので、製造ラインの温度制御を高精度で制御していない限り、補強用樹脂自体の特性が同一であっても、季節が何時であるのか、或いは製造拠点がどこであるのか(製造ラインが何処の県にあるのか)などによって補強用樹脂の浸透度に誤差が生じ、強度品質を一定に保つことができない、という不都合がある。
また、補強用樹脂の浸透度は、その補強用樹脂の射出から補強用樹脂を硬化させる加熱処理を行うまでの時間によっても異なる。
However, in this method, the reinforcing resin 50 injected on the upper surface of the mother board 6 near the BGA IC package 1 penetrates between the lower surface of the BGA IC package 1 and the upper surface of the mother board 6 by natural diffusion. Therefore, the permeation region varies depending on the viscosity (fluidity) of the reinforcing resin 50.
The viscosity (fluidity) of the reinforcing resin is easily affected by temperature, so unless the temperature control of the production line is controlled with high accuracy, even if the characteristics of the reinforcing resin itself are the same, what time is the season? There is an inconvenience that the strength quality cannot be kept constant due to an error in the penetration degree of the reinforcing resin depending on where the production base is located (where the production line is located).
Further, the penetration degree of the reinforcing resin varies depending on the time from the injection of the reinforcing resin to the heat treatment for curing the reinforcing resin.

本発明の課題は、プリント配線基板上へのBGA型半導体パッケージの実装時の環境温度が大きく異なっていても、すなわち製造時期(季節)や製造拠点が異なっていても、BGA型半導体パッケージの下面とプリント配線基板の上面との隙間に充填される補強用樹脂の浸透度を略同一にすることを可能として、補強用樹脂の充填範囲が略一定となり、強度品質は略一定となることを可能とする実装構造を提供することである。
また、本発明の課題は、プリント配線基板上へのBGA型半導体パッケージの実装に際し、環境温度が大きく異なっていても、すなわち製造時期(季節)や製造拠点が異なっていても、簡単な方法によりBGA型半導体パッケージの下面とプリント配線基板の上面との隙間への補強用樹脂の浸透度を略同一にすることができて、強度品質を一定にすることができる補強用樹脂の充填方法を提供することである。
The problem of the present invention is that the bottom surface of the BGA type semiconductor package can be obtained even when the environmental temperature at the time of mounting the BGA type semiconductor package on the printed wiring board is greatly different, that is, even when the manufacturing time (season) or manufacturing base is different. It is possible to make the penetration degree of the reinforcing resin filled in the gap between the PCB and the upper surface of the printed circuit board substantially the same, the filling range of the reinforcing resin becomes substantially constant, and the strength quality can be made substantially constant. It is to provide a mounting structure.
Further, the problem of the present invention is that when mounting a BGA type semiconductor package on a printed wiring board, even if the environmental temperature is greatly different, that is, even if the manufacturing time (season) or manufacturing base is different, a simple method is used. Provided a method of filling a reinforcing resin that can make the penetration degree of the reinforcing resin into the gap between the lower surface of the BGA type semiconductor package and the upper surface of the printed wiring board substantially the same, and can make the strength quality constant. It is to be.

以上の課題を解決するため、請求項1に記載の発明は、プリント配線基板上にBGA型半導体パッケージを搭載し、且つBGA型半導体パッケージの下面とプリント配線基板の上面との隙間に補強用樹脂を介在させてなるBGA型半導体パッケージの実装構造であって、例えば図1、図3、図4に示すように、プリント配線基板11上には、BGA型半導体パッケージ1の少なくとも角部を囲う壁部材22と、この壁部材22の内壁面とBGA型半導体パッケージ1の側面との間で、前記BGA型半導体パッケージ1の少なくとも角部に沿って突出する複数の突起部13とが設けられ、補強用樹脂は当該樹脂の供給点となる前記壁部材と前記複数の突起部との間から拡散して前記隙間の内部に広がっていることを特徴とする。 In order to solve the above-described problems, the invention described in claim 1 includes mounting a BGA type semiconductor package on a printed wiring board, and reinforcing resin in a gap between the lower surface of the BGA type semiconductor package and the upper surface of the printed wiring board. A BGA type semiconductor package mounting structure with an intervening wall, for example, as shown in FIGS. 1, 3, and 4, a wall surrounding at least a corner of the BGA type semiconductor package 1 on a printed wiring board 11 Between the member 22 and the inner wall surface of the wall member 22 and the side surface of the BGA type semiconductor package 1, a plurality of protrusions 13 protruding along at least the corners of the BGA type semiconductor package 1 are provided and reinforced. The resin for resin diffuses from between the wall member serving as a supply point of the resin and the plurality of protrusions and spreads into the gap.

請求項1に記載の発明によれば、プリント配線基板上に、BGA型半導体パッケージの少なくとも角部を囲う壁部材と、この壁部材の内壁面とBGA型半導体パッケージの側面との間で、BGA型半導体パッケージの少なくとも角部に沿って突出する複数の突起部とが設けられ、BGA型半導体パッケージの下面とプリント配線基板の上面との隙間に介在する補強用樹脂は、前記壁部材と前記突起部との間に供給された補強用樹脂が拡散して前記隙間の内部に広がったものであるので、BGA型半導体パッケージの角部に沿って突出する複数の突起部が拡散時の補強用樹脂の流れに対して抵抗となり、補強用樹脂の拡散範囲は突起部の配置間隔(及び個数)によって変わる。
従って、突起部のBGA型半導体パッケージの側面に沿った方向の間隔(及び個数)を変えることにより、プリント配線基板とBGA型半導体パッケージとの隙間への補強用樹脂の浸透速度の制御が可能となる。
このため、季節による温度差や製造拠点が複数ある場合における各製造拠点間の温度差、補強用樹脂の射出部から加熱処理部までの生産ライン長の差(補強用樹脂の射出から加熱処理を行うまでの時間差)などに係らず、プリント配線基板とBGA型半導体パッケージとの隙間への補強用樹脂の浸透度を略同一にすることが可能となり、その結果、プリント配線基板上に実装したBGA型半導体パッケージの強度品質を一定にすることが可能となる。
According to the first aspect of the present invention, on the printed wiring board, the wall member that surrounds at least the corner of the BGA type semiconductor package, and between the inner wall surface of the wall member and the side surface of the BGA type semiconductor package , A plurality of protrusions protruding along at least corners of the semiconductor package, and the reinforcing resin interposed in the gap between the lower surface of the BGA semiconductor package and the upper surface of the printed wiring board includes the wall member and the protrusion Since the reinforcing resin supplied to the gap diffuses and spreads into the gap, the plurality of protrusions protruding along the corners of the BGA type semiconductor package are the reinforcing resin at the time of diffusion. The diffusion range of the reinforcing resin varies depending on the arrangement interval (and the number) of the protrusions.
Therefore, by changing the interval (and the number) of the protrusions in the direction along the side surface of the BGA type semiconductor package, it is possible to control the penetration rate of the reinforcing resin into the gap between the printed wiring board and the BGA type semiconductor package. Become.
For this reason, there are temperature differences between seasons, temperature differences between manufacturing bases when there are multiple manufacturing bases, and differences in production line length from the injection part of the reinforcing resin to the heat treatment part (from the injection of the reinforcing resin to the heat treatment). Regardless of the time difference between the steps, the penetration of the reinforcing resin into the gap between the printed wiring board and the BGA type semiconductor package can be made substantially the same. As a result, the BGA mounted on the printed wiring board The strength quality of the type semiconductor package can be made constant.

請求項2に記載の発明は、プリント配線基板上に搭載したBGA型半導体パッケージの下面とプリント配線基板の上面との隙間に補強用樹脂を充填する方法であって、例えば図1から図5に示すように、プリント配線基板11上に、BGA型半導体パッケージ1の少なくとも角部を囲う壁部材22と、この壁部材22の内壁面とBGA型半導体パッケージ1の側面との間で、前記BGA型半導体パッケージ1の少なくとも角部に沿って突出する複数の突起部13とを設け、前記壁部材22の内壁面と前記複数の突起部13との間のプリント配線基板上に補強用樹脂32を供給し、当該補強用樹脂の拡散で当該補強用樹脂が前記複数の突起部の間から前記隙間に充填されるようにしたことを特徴とする。 The invention according to claim 2 is a method of filling a reinforcing resin in the gap between the lower surface of the BGA type semiconductor package mounted on the printed wiring board and the upper surface of the printed wiring board. as shown, on the printed wiring board 11, a wall member 22 surrounding at least a corner portion of the BGA type semiconductor package 1, between the inner wall and the side surface of the BGA type semiconductor package 1 of the wall member 22, the BGA type A plurality of protrusions 13 projecting along at least the corners of the semiconductor package 1 are provided, and the reinforcing resin 32 is supplied onto the printed wiring board between the inner wall surface of the wall member 22 and the plurality of protrusions 13. The reinforcing resin is filled in the gaps between the plurality of protrusions by diffusion of the reinforcing resin.

請求項2に記載の発明によれば、プリント配線基板上に、BGA型半導体パッケージの少なくとも角部を囲う壁部材と、この壁部材の内壁面とBGA型半導体パッケージの側面との間で、BGA型半導体パッケージの少なくとも角部に沿って突出する複数の突起部とを設けておいて、そのBGA型半導体パッケージの角部に沿って突出する複数の突起部と壁部材との間に、BGA型半導体パッケージの下面とプリント配線基板の上面との隙間に充填する補強用樹脂を供給するので、補強用樹脂の流れに対し突起部が抵抗となる。従って、突起部のBGA型半導体パッケージの側面に沿った方向の間隔(及び個数)を変えることにより、プリント配線基板とBGA型半導体パッケージとの隙間への補強用樹脂の浸透速度を制御することができる。
このため、季節による温度差や製造拠点が複数ある場合における各製造拠点間の温度差、補強用樹脂の射出部から加熱処理部までの生産ライン長の差(補強用樹脂の射出から加熱処理を行うまでの時間差)などに係らず、プリント配線基板とBGA型半導体パッケージとの隙間への補強用樹脂の浸透度を略同一にして、プリント配線基板上に実装したBGA型半導体パッケージの強度品質を一定にできるものとなる。
According to the second aspect of the present invention, on the printed wiring board, the wall member that surrounds at least the corner of the BGA type semiconductor package, and between the inner wall surface of the wall member and the side surface of the BGA type semiconductor package , A plurality of protrusions projecting along at least the corners of the BGA type semiconductor package, and the BGA type between the plurality of protrusions projecting along the corners of the BGA type semiconductor package and the wall member Since the reinforcing resin that fills the gap between the lower surface of the semiconductor package and the upper surface of the printed wiring board is supplied, the protrusions become resistant to the flow of the reinforcing resin. Therefore, the penetration rate of the reinforcing resin into the gap between the printed wiring board and the BGA type semiconductor package can be controlled by changing the interval (and the number) of the protrusions in the direction along the side surface of the BGA type semiconductor package. it can.
For this reason, there are temperature differences between seasons, temperature differences between manufacturing bases when there are multiple manufacturing bases, and differences in production line length from the injection part of the reinforcing resin to the heat treatment part (from the injection of the reinforcing resin to the heat treatment). The strength of the BGA type semiconductor package mounted on the printed circuit board can be improved by making the penetration degree of the reinforcing resin into the gap between the printed circuit board and the BGA type semiconductor package substantially the same regardless of the time difference) It can be made constant.

請求項3に記載の発明は、請求項2に記載のBGA型半導体パッケージの補強用樹脂充填方法であって、例えば図1、図3、図4、図6、図7に示すように、前記複数の突起部13をBGA型半導体パッケージの角部からBGA型半導体パッケージ1の側面に沿って配置することを特徴とする。   A third aspect of the present invention is a method of filling a reinforcing resin for a BGA type semiconductor package according to the second aspect of the present invention, for example, as shown in FIG. 1, FIG. 3, FIG. 4, FIG. The plurality of protrusions 13 are arranged along the side surface of the BGA type semiconductor package 1 from the corners of the BGA type semiconductor package.

請求項4に記載の発明は、請求項3に記載のBGA型半導体パッケージの補強用樹脂充填方法であってBGA型半導体パッケージ1の側面に沿って配置する突起部の個数及びその配置間隔は、温度に応じて設定することを特徴とする。   The invention described in claim 4 is a method of filling a resin for reinforcing a BGA type semiconductor package according to claim 3, wherein the number of protrusions arranged along the side surface of the BGA type semiconductor package 1 and the arrangement interval thereof are: It is characterized by being set according to the temperature.

本発明によれば、プリント配線基板上に、BGA型半導体パッケージの少なくとも角部を囲う壁部材と、この壁部材の内壁面とBGA型半導体パッケージの側面との間で、BGA型半導体パッケージの少なくとも角部に沿って突出する複数の突起部を設けるという簡単な構造で、また、そのBGA型半導体パッケージの角部に沿って突出する複数の突起部と壁部材との間から補強用樹脂を充填するという簡単な方法により、突起部のBGA型半導体パッケージの側面に沿った方向の間隔及び個数を変えることで、プリント配線基板とBGA型半導体パッケージとの隙間への補強用樹脂の浸透速度を制御できる。
従って、季節による温度差や製造拠点が複数ある場合における各製造拠点間の温度差、補強用樹脂の射出部から加熱処理部までの生産ライン長の差(補強用樹脂の射出から加熱処理を行うまでの時間差)などに係らず、プリント配線基板とBGA型半導体パッケージとの隙間への補強用樹脂の浸透度を略同一にすることができ、その結果、プリント配線基板上に実装したBGA型半導体パッケージの強度品質を一定にすることができるといった利点が得られる。
According to the present invention, on the printed wiring board, at least the BGA type semiconductor package between the wall member surrounding at least the corner of the BGA type semiconductor package and the inner wall surface of the wall member and the side surface of the BGA type semiconductor package. With a simple structure of providing a plurality of protrusions protruding along the corners, and filling the reinforcing resin from between the plurality of protrusions protruding along the corners of the BGA type semiconductor package and the wall member The penetration rate of the reinforcing resin into the gap between the printed wiring board and the BGA type semiconductor package is controlled by changing the distance and number of protrusions along the side surface of the BGA type semiconductor package by a simple method. it can.
Therefore, the temperature difference between seasons, the temperature difference between each manufacturing base when there are multiple manufacturing bases, the difference in the production line length from the injection portion of the reinforcing resin to the heat treatment portion (from the injection of the reinforcing resin to the heat treatment) Regardless of the time difference), the penetration degree of the reinforcing resin into the gap between the printed wiring board and the BGA type semiconductor package can be made substantially the same. As a result, the BGA type semiconductor mounted on the printed wiring board There is an advantage that the strength and quality of the package can be made constant.

以下、図を参照して本発明を実施するための最良の形態を詳細に説明する。
図1乃至図5は、本発明を適用した一実施形態の構成を示したもので、図中、1はBGA型半導体パッケージ、11はプリント配線基板、21はプリント配線基板11に搭載されたBGA型半導体パッケージ1を覆う箱型のフレームである。
Hereinafter, the best mode for carrying out the present invention will be described in detail with reference to the drawings.
1 to 5 show a configuration of an embodiment to which the present invention is applied. In the figure, 1 is a BGA type semiconductor package, 11 is a printed wiring board, and 21 is a BGA mounted on the printed wiring board 11. 2 is a box-shaped frame that covers the semiconductor package 1.

BGA型半導体パッケージ1は、半導体チップ2が上面に実装された基板3の下面に、マトリックス状に配置された複数の電極を有し、且つ、図5に示すように、各電極部には半田ボール4が取り付けられている。基板3上は、半導体チップ2と、その図示しない電極パッドと基板2の図示しない電極パッドを接続する図示しないボンディングワイヤを含めてモールド樹脂5により覆われている。   The BGA type semiconductor package 1 has a plurality of electrodes arranged in a matrix on the lower surface of the substrate 3 on which the semiconductor chip 2 is mounted on the upper surface. As shown in FIG. A ball 4 is attached. The substrate 3 is covered with a mold resin 5 including a semiconductor chip 2 and an unillustrated bonding pad for connecting the unillustrated electrode pad and the unillustrated electrode pad of the substrate 2.

プリント配線基板11は、BGA型半導体パッケージ1の電極に対応する複数の電極を有するとともに、図1に示すように、フレーム21の四隅部に備える脚部23が挿入して係止される位置決め孔12を有している。
フレーム21は、板金製で、図1に示すように、BGA型半導体パッケージ1の側面の周囲四面を囲む側壁部(壁部材)22には、下方に突出する脚部23が両端部に形成されるとともに、中間部の下部を開放した切欠き24が形成されており、また、BGA型半導体パッケージ1の上面を覆う天板部25には、四隅部に切欠き26が形成されている。
フレーム21の側壁部の切欠き24は、BGA型半導体パッケージ1で発生する熱の放熱対策として、空気の対流をし易くするために設けているものであるが、BGA型半導体パッケージ1からのノイズ輻射を防止したり、BGA型半導体パッケージ1を他の電子部品からの輻射ノイズから保護するためには、フレーム21の側壁部の切欠き24は無い方が良く、また、フレーム21の天板部の切欠き26も小さい方がよい。
The printed wiring board 11 has a plurality of electrodes corresponding to the electrodes of the BGA type semiconductor package 1 and, as shown in FIG. 1, positioning holes into which the leg portions 23 provided at the four corners of the frame 21 are inserted and locked. 12.
The frame 21 is made of sheet metal, and as shown in FIG. 1, leg portions 23 projecting downward are formed at both ends of a side wall portion (wall member) 22 that surrounds the four sides of the side surface of the BGA type semiconductor package 1. In addition, a notch 24 is formed in which the lower part of the middle part is opened, and a notch 26 is formed at the four corners of the top plate part 25 that covers the upper surface of the BGA type semiconductor package 1.
The cutout 24 on the side wall of the frame 21 is provided to facilitate the convection of air as a heat dissipation measure for heat generated in the BGA type semiconductor package 1, but noise from the BGA type semiconductor package 1 is provided. In order to prevent radiation or to protect the BGA type semiconductor package 1 from radiation noise from other electronic components, it is better not to have the notch 24 on the side wall portion of the frame 21, and the top plate portion of the frame 21. The smaller notch 26 should be smaller.

次に、BGA型半導体パッケージ1のプリント配線基板11への実装について説明する。
先ず最初に、底面の各電極部に半田ボールが取り付けられたBGA型半導体パッケージ1をプリント配線基板11の所定位置に搭載し、その後、周知のリフロー処理によって、BGA型半導体パッケージ1の底部の半田ボール4をプリント配線基板11上の電極に溶着させて接続する。
Next, mounting of the BGA type semiconductor package 1 on the printed wiring board 11 will be described.
First, the BGA type semiconductor package 1 in which solder balls are attached to the respective electrode portions on the bottom surface is mounted at a predetermined position on the printed wiring board 11, and then the solder on the bottom portion of the BGA type semiconductor package 1 is subjected to a known reflow process. The ball 4 is welded and connected to the electrode on the printed wiring board 11.

こうしてBGA型半導体パッケージ1をプリント配線基板11に半田付けした後、フレーム21を取り付ける前に、BGA型半導体パッケージ1の角部(四隅)近傍のプリント配線基板11上に突起部13を形成する。
このプリント配線基板11上への突起部13の形成は、後述する補強用樹脂32を塗布するためのディスペンサーとは異なるディスペンサーで接着剤を塗布(滴下)することにより行う。
After the BGA type semiconductor package 1 is soldered to the printed wiring board 11 in this way and before the frame 21 is attached, the protrusions 13 are formed on the printed wiring board 11 near the corners (four corners) of the BGA type semiconductor package 1.
The protrusion 13 is formed on the printed wiring board 11 by applying (dropping) an adhesive with a dispenser different from a dispenser for applying a reinforcing resin 32 described later.

すなわち、プリント配線基板11上には、BGA型半導体パッケージ1の四隅の角部に対応させて、図示しないディスペンサーで接着剤を塗布(滴下)することにより、BGA型半導体パッケージ1の側面に沿って複数の突起部13を形成する。
この突起部13は、図3や図4に示すように、BGA型半導体パッケージ1の側面に沿って等間隔に形成する。
That is, an adhesive is applied (dropped) with a dispenser (not shown) on the printed circuit board 11 so as to correspond to the four corners of the BGA type semiconductor package 1, thereby along the side surface of the BGA type semiconductor package 1. A plurality of protrusions 13 are formed.
As shown in FIGS. 3 and 4, the protrusions 13 are formed at equal intervals along the side surface of the BGA type semiconductor package 1.

次に、BGA型半導体パッケージ1の補強について説明する。
まず、BGA型半導体パッケージ1が実装されたプリント配線基板11上にさらにフレーム21を実装する。図示例では、プリント配線基板11の位置決め孔12にフレーム21の脚部23を挿入して係止し、その脚部23を位置決め孔12に半田付けする。これによりプリント配線基板11上にフレーム21が固定される。
Next, reinforcement of the BGA type semiconductor package 1 will be described.
First, a frame 21 is further mounted on the printed wiring board 11 on which the BGA type semiconductor package 1 is mounted. In the illustrated example, the leg portion 23 of the frame 21 is inserted and locked in the positioning hole 12 of the printed wiring board 11, and the leg portion 23 is soldered to the positioning hole 12. As a result, the frame 21 is fixed on the printed wiring board 11.

こうしてフレーム21をプリント配線基板11に装着した後、図2に示すように、フレーム21の天板部の四隅に形成した切欠き26からディスペンサーのノズル31を挿入し、側壁部22の内壁面と突起部13との間から補強用樹脂32を注入する(図3及び図4の樹脂塗布(滴下)ポイントP参照)。この補強用樹脂32は熱硬化性樹脂である。
注入された補強用樹脂32は、プリント配線基板11上を側壁部22の内壁面により規制されて突起部13側に流れ、その補強用樹脂32の流れに対し突起部13が抵抗となる。この突起部13での抵抗が付与されて補強用樹脂32は、突起部13間の隙間に流れ込むとともに、突起部13を乗り越えてBGA型半導体パッケージ1の角部側へ流れ込む。
After mounting the frame 21 on the printed wiring board 11 in this way, as shown in FIG. 2, the nozzles 31 of the dispenser are inserted from the notches 26 formed at the four corners of the top plate portion of the frame 21, and the inner wall surface of the side wall portion 22 is inserted. The reinforcing resin 32 is injected from between the protrusions 13 (see the resin application (dropping) point P in FIGS. 3 and 4). The reinforcing resin 32 is a thermosetting resin.
The injected reinforcing resin 32 is regulated by the inner wall surface of the side wall portion 22 on the printed wiring board 11 and flows toward the protruding portion 13, and the protruding portion 13 becomes a resistance against the flow of the reinforcing resin 32. The resistance at the projections 13 is applied, and the reinforcing resin 32 flows into the gaps between the projections 13 and also flows over the projections 13 to the corners of the BGA type semiconductor package 1.

そして、補強用樹脂32は、図3及び図4に矢印で示すように、プリント配線基板11とBGA型半導体パッケージ1の角部との隙間に流れ込み、図5に示したように、BGA型半導体パッケージ1底部の半田ボール4の周囲に浸透して充填される。
その後、加熱処理を行って、補強用樹脂32硬化させる。これにより、BGA型半導体パッケージ1は、その下面が、半田ボール4の周囲に充填された補強用樹脂32によりプリント配線基板11により接着されるとともに、その側面が、プリント配線基板11上に残っている補強用樹脂32によりプリント配線基板11及びフレーム21の側壁部22に接着されるので、外部衝撃に十分耐え得る強度でプリント配線基板11に固定されることになる。
Then, the reinforcing resin 32 flows into the gap between the printed wiring board 11 and the corner of the BGA type semiconductor package 1 as shown by arrows in FIGS. 3 and 4, and as shown in FIG. It penetrates and fills the periphery of the solder balls 4 at the bottom of the package 1.
Thereafter, heat treatment is performed to cure the reinforcing resin 32. As a result, the lower surface of the BGA type semiconductor package 1 is bonded to the printed wiring board 11 by the reinforcing resin 32 filled around the solder balls 4, and the side surface remains on the printed wiring board 11. Since the reinforcing resin 32 is adhered to the printed wiring board 11 and the side wall portion 22 of the frame 21, the reinforcing resin 32 is fixed to the printed wiring board 11 with sufficient strength to withstand external impacts.

なお、プリント配線基板11とBGA型半導体パッケージ1との隙間への補強用樹脂32の浸透速度は、図3に示すように、突起部13の間隔を小さくした場合(個数は多くする)と、図4に示すように、突起部13の間隔を大きくした場合(個数は少なくする)とでは異なり、間隔を大きくした場合の方が速くなる。つまり、プリント配線基板11とBGA型半導体パッケージ1との隙間への補強用樹脂32の浸透速度は、突起部13のBGA型半導体パッケージ1の側面に沿った方向の間隔及び個数を変えることにより制御できる。
従って、季節や製造拠点に応じて、突起部13のBGA型半導体パッケージ1の側面に沿った方向の間隔及び個数を適切に設定することにより、季節による温度差や製造拠点が複数ある場合における各製造拠点間の温度差、補強用樹脂の射出部から加熱処理部までの生産ライン長の差(補強用樹脂の射出から加熱処理を行うまでの時間差)などに係らず、プリント配線基板11とBGA型半導体パッケージ1との隙間への補強用樹脂32の浸透度を略同一にすることができ、プリント配線基板11上に実装したBGA型半導体パッケージ1の強度品質を一定にすることができる。
The penetration speed of the reinforcing resin 32 into the gap between the printed wiring board 11 and the BGA type semiconductor package 1 is as shown in FIG. 3 when the interval between the protrusions 13 is reduced (the number is increased), As shown in FIG. 4, unlike the case where the interval between the protrusions 13 is increased (the number is reduced), the case where the interval is increased is faster. That is, the penetration speed of the reinforcing resin 32 into the gap between the printed wiring board 11 and the BGA type semiconductor package 1 is controlled by changing the interval and the number of protrusions 13 along the side surface of the BGA type semiconductor package 1. it can.
Therefore, by appropriately setting the interval and the number of protrusions 13 in the direction along the side surface of the BGA type semiconductor package 1 according to the season and the manufacturing base, Regardless of the temperature difference between the manufacturing bases, the difference in production line length from the injection part of the reinforcing resin to the heat treatment part (the time difference from the injection of the reinforcing resin to the heat treatment), etc., the printed wiring board 11 and the BGA The penetration degree of the reinforcing resin 32 into the gap with the type semiconductor package 1 can be made substantially the same, and the strength quality of the BGA type semiconductor package 1 mounted on the printed wiring board 11 can be made constant.

なお、以上の実施例では、突起部13を形成した後にフレーム21を取り付けたが、フレーム21の天板部の切欠き26を、突起部13を形成する全領域まで広げた場合には、フレーム21を取り付けた後でも突起部13の形成は可能である。
また、フレーム21のプリント配線基板11への半田付けは、BGA型半導体パッケージ1をプリント配線基板11に半田付けした後に行うようにしたが、フレーム21のプリント配線基板11への半田付けにクリーム半田などを使用すれば、フレーム21のプリント配線基板11への半田付けとBGA型半導体パッケージ1のプリント配線基板11への半田付けとを、1回のリフロー処理により同時に行うことができる。この場合、本実施例における補強用樹脂32は、前述したように熱硬化性樹脂であり、BGA型半導体パッケージ1とフレーム21とをプリント配線基板11に半田付けする際のリフロー処理時の熱で硬化させることができるので、リフロー処理を行う前に、補強用樹脂32を塗布するためのディスペンサーを用いて補強用樹脂をBGA型半導体パッケージ1の側面に沿って所定の間隔で塗布(滴下)することにより、突起部13を補強用樹脂32と同一の樹脂で形成することも可能である。
In the above embodiment, the frame 21 is attached after the projection 13 is formed. However, when the notch 26 in the top plate portion of the frame 21 is extended to the entire area where the projection 13 is formed, the frame 21 Even after 21 is attached, the protrusion 13 can be formed.
The soldering of the frame 21 to the printed wiring board 11 is performed after the BGA type semiconductor package 1 is soldered to the printed wiring board 11. However, the soldering of the frame 21 to the printed wiring board 11 is cream solder. Etc., the soldering of the frame 21 to the printed wiring board 11 and the soldering of the BGA type semiconductor package 1 to the printed wiring board 11 can be simultaneously performed by a single reflow process. In this case, the reinforcing resin 32 in the present embodiment is a thermosetting resin as described above, and the heat during the reflow process when the BGA type semiconductor package 1 and the frame 21 are soldered to the printed wiring board 11 is used. Since it can be hardened, the reinforcing resin is applied (dropped) along the side surface of the BGA type semiconductor package 1 at a predetermined interval using a dispenser for applying the reinforcing resin 32 before performing the reflow process. Thus, the protrusion 13 can be formed of the same resin as the reinforcing resin 32.

[変形例]
図6は突起部13を設ける間隔の変形例である。すなわち、図示のように、樹脂塗布(滴下)ポイントPから離れるほど突起部13の間隔を広くしたものである。
[Modification]
FIG. 6 shows a modified example of the interval at which the protrusion 13 is provided. That is, as shown in the figure, the distance between the protrusions 13 is increased as the distance from the resin application (dropping) point P increases.

図7は補強用樹脂32がフレーム21の側壁部22に沿って必要以上に流れるのを防止するための突起部14を設けた変形例である。すなわち、図示のように、BGA型半導体パッケージ1の側面に沿った方向の両端部の突起部13と側壁部22との間において、補強用樹脂32の流れを止める複数の突起部14を設けたものである。   FIG. 7 shows a modified example in which the protrusion 14 is provided to prevent the reinforcing resin 32 from flowing more than necessary along the side wall portion 22 of the frame 21. That is, as shown in the drawing, a plurality of protrusions 14 for stopping the flow of the reinforcing resin 32 are provided between the protrusions 13 at both ends in the direction along the side surface of the BGA type semiconductor package 1 and the side walls 22. Is.

[フレームの変形例]
図8はフレーム21の変形例である。すなわち、フレーム21は、図示のように、BGA型半導体パッケージ1の側面の周囲四面を囲む側壁部22から構成され、上面を開放したものである。側壁部22には、下方に突出する脚部23が両端部に形成されるとともに、中間部の上部を開放した側面切欠き24が形成されている。
[Modification of frame]
FIG. 8 shows a modified example of the frame 21. That is, the frame 21 is composed of side wall portions 22 surrounding the four peripheral sides of the side surface of the BGA type semiconductor package 1 as shown in the figure, and the upper surface is opened. The side wall portion 22 is formed with leg portions 23 projecting downward at both end portions, and is formed with side cutouts 24 that open the upper portion of the intermediate portion.

なお、本発明においては、実施例のフレームの主たる目的は、補強用樹脂がプリント配線基板上に流れ出すのを防止することであるので、フレームになっている必要は無い。補強用樹脂をBGA型半導体パッケージの四隅から浸透させるのであれは、4つの壁部材(衝立)をBGA型半導体パッケージの四隅にそれぞれ独立して設ければよい。フレームや壁部材(衝立)は金属である必要はない。
また、突起部の個数や形状等も任意であり、その他、具体的な細部構造等についても適宜に変更可能であることは勿論である。
In the present invention, the main purpose of the frame of the embodiment is to prevent the reinforcing resin from flowing out onto the printed circuit board, and therefore it is not necessary to be a frame. If the reinforcing resin is permeated from the four corners of the BGA type semiconductor package, four wall members (partitions) may be provided independently at the four corners of the BGA type semiconductor package. The frame and wall member (screen) need not be metal.
Further, the number and shape of the protrusions are arbitrary, and it is needless to say that other specific detailed structures can be appropriately changed.

本発明を適用した一実施形態の構成を示すもので、BGA型半導体パッケージを搭載したプリント配線基板にフレームを被せる前の状態を示した分解斜視図である。BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is an exploded perspective view showing a configuration of an embodiment to which the present invention is applied and showing a state before a frame is put on a printed wiring board on which a BGA type semiconductor package is mounted. フレームを被せた後で補強用樹脂の充填を説明する状態を示す斜視図である。It is a perspective view which shows the state explaining filling of the resin for reinforcement after covering a flame | frame. 補強用樹脂の浸透状態を説明する要部平面図である。It is a principal part top view explaining the penetration | invasion state of resin for reinforcement. 突起部の間隔が広い場合の補強用樹脂の浸透状態を説明する要部平面図である。It is a principal part top view explaining the osmosis | permeation state of the reinforcing resin when the space | interval of a projection part is wide. 補強用樹脂充填後の実装状態を示した縦断面図である。It is the longitudinal cross-sectional view which showed the mounting state after resin filling for reinforcement. 突起部を設ける間隔を補強用樹脂塗布ポイントから離れるほど広くした変形例を示す要部平面図である。It is a principal part top view which shows the modification which enlarged the space | interval which provides a projection part, so that it leaves | separates from the resin application point for reinforcement. 補強用樹脂がフレーム(壁部材)に沿って必要以上に流れるのを防止するための突起部を設けた変形例を示す要部平面図である。It is a principal part top view which shows the modification which provided the projection part for preventing the resin for reinforcement to flow more than necessary along a flame | frame (wall member). フレームの変形例を示した分解斜視図である。It is the disassembled perspective view which showed the modification of the flame | frame.

符号の説明Explanation of symbols

1 BGA型半導体パッケージ
2 半導体チップ
3 基板
4 半田ボール
5 モールド樹脂
11 プリント配線基板
13 突起部
21 フレーム
22 側壁部(壁部材)
32 補強用樹脂
DESCRIPTION OF SYMBOLS 1 BGA type semiconductor package 2 Semiconductor chip 3 Board | substrate 4 Solder ball 5 Mold resin 11 Printed wiring board 13 Protrusion part 21 Frame 22 Side wall part (wall member)
32 Resin for reinforcement

Claims (4)

プリント配線基板上にBGA型半導体パッケージを搭載し、且つBGA型半導体パッケージの下面とプリント配線基板の上面との隙間に補強用樹脂を介在させてなるBGA型半導体パッケージの実装構造であって、
前記プリント配線基板上には、BGA型半導体パッケージの少なくとも角部を囲う壁部材と、
この壁部材の内壁面とBGA型半導体パッケージの側面との間で、前記BGA型半導体パッケージの少なくとも角部に沿って突出する複数の突起部とが設けられ、
前記補強用樹脂は当該樹脂の供給点となる前記壁部材と前記複数の突起部との間から拡散して前記隙間の内部に広がっていることを特徴とするBGA型半導体パッケージの実装構造。
A BGA type semiconductor package mounting structure in which a BGA type semiconductor package is mounted on a printed wiring board, and a reinforcing resin is interposed in a gap between the lower surface of the BGA type semiconductor package and the upper surface of the printed wiring board,
On the printed wiring board, a wall member surrounding at least a corner of the BGA type semiconductor package;
Between the inner wall surface of the wall member and the side surface of the BGA type semiconductor package, there are provided a plurality of protrusions protruding along at least corners of the BGA type semiconductor package ,
The BGA type semiconductor package mounting structure, wherein the reinforcing resin diffuses from between the wall member serving as a supply point of the resin and the plurality of protrusions and spreads into the gap.
プリント配線基板上に搭載したBGA型半導体パッケージの下面とプリント配線基板の上面との隙間に補強用樹脂を充填する方法であって、
プリント配線基板上に、BGA型半導体パッケージの少なくとも角部を囲う壁部材と、
この壁部材の内壁面とBGA型半導体パッケージの側面との間で、前記BGA型半導体パッケージの少なくとも角部に沿って突出する複数の突起部とを設け、
前記壁部材の内壁面と前記複数の突起部との間のプリント配線基板上に前記補強用樹脂を供給し、当該補強用樹脂の拡散で当該補強用樹脂が前記複数の突起部の間から前記隙間に充填されるようにしたことを特徴とするBGA型半導体パッケージの補強用樹脂充填方法。
A method of filling a reinforcing resin in a gap between a lower surface of a BGA type semiconductor package mounted on a printed wiring board and an upper surface of the printed wiring board,
A wall member surrounding at least a corner of the BGA type semiconductor package on the printed wiring board;
Between the inner wall surface of the wall member and the side surface of the BGA type semiconductor package, a plurality of protrusions protruding along at least corners of the BGA type semiconductor package are provided.
The reinforcing resin is supplied onto the printed wiring board between the inner wall surface of the wall member and the plurality of protrusions, and the reinforcing resin is diffused between the plurality of protrusions by diffusion of the reinforcing resin. A reinforcing resin filling method for a BGA type semiconductor package, characterized in that the gap is filled.
前記複数の突起部は、BGA型半導体パッケージの角部からBGA型半導体パッケージの側面に沿って配置することを特徴とする請求項2に記載のBGA型半導体パッケージの補強用樹脂充填方法。   3. The method of filling a reinforcing resin for a BGA type semiconductor package according to claim 2, wherein the plurality of projecting portions are arranged along a side surface of the BGA type semiconductor package from a corner portion of the BGA type semiconductor package. BGA型半導体パッケージの側面に沿って配置する突起部の個数及びその配置間隔は、温度に応じて設定することを特徴とする請求項3に記載のBGA型半導体パッケージの補強用樹脂充填方法。   4. The method for filling a reinforcing resin in a BGA type semiconductor package according to claim 3, wherein the number of protrusions arranged along the side surface of the BGA type semiconductor package and the arrangement interval thereof are set according to temperature.
JP2005284710A 2005-09-29 2005-09-29 BGA type semiconductor package mounting structure and reinforcing resin filling method Expired - Fee Related JP4521494B2 (en)

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